KLA Tencor 482-22-0800 Bluetooth Test and Calibration Device User Manual TMAP 3 Cover

KLA-Tencor Corporation Bluetooth Test and Calibration Device TMAP 3 Cover

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Accura°C
User Manual
°SensArray
47451 Fremont Blvd.
Fremont, CA 94538
510-360-5600
Fax 510-360-5601
info@sensarray.com
www.sensarray.com
Copyright © 2003 by °SensArray® Corporation. All rights reserved.
UM-ACC-A 2003.02
This manual applies to the 3.0.6 version of Thermal MAP software.
°SensArray reserves the right to modify, change, or improve any or all specifications
published in this document without notice.
Important Notices
Warranty
Thermal MAP Software
SensArray Corporation warrants that (a) Thermal MAP software (Software) will perform
substantially in accordance with the accompanying written materials for a period of 12 months after
shipment, and (b) the medium on which the Software is recorded will be free from defects in
materials and workmanship under normal use and service for a period of 12 months after shipment.
Faults caused by unauthorized modification, misuse or abuse of products, or problems due to
software not supplied by SensArray, are not covered by this Warranty. During the Warranty Period,
the purchaser may return failed Software to SensArray for repair or replacement, at SensArray’s
option. SensArray does not warrant that the operation of the Software shall be uninterrupted or
error free. The purchaser will first notify SensArray of the nature of the problem and obtain a
Returned Materials Authorization [RMA] number. The purchaser will pay the costs of shipping
returned Software to SensArray; SensArray will pay the cost of shipping repaired/replaced
Software to the purchaser. No other warranty is expressed or implied. SensArray specifically
disclaims the implied warranty of merchantability and fitness for a specific application.
The Thermal MAP Software Documentation Materials (“Documentation”) are subject to revision
and change without notice. SensArray agrees to make a best effort attempt to keep the purchaser
advised of changes to the Documentation.
Accura°C System Hardware
SensArray Corporation warrants that the Accura°C Systems (“Products”) sold will be free from
defects in material and workmanship, and perform to SensArray’s applicable published
specifications for a period of 12 months after shipment. The liability of SensArray hereunder shall
be limited to replacing or repairing, at its option, any defective Products that are returned F.O.B. to
SensArray’s plant in Fremont, CA. In no case are Products to be returned without the purchaser
first obtaining SensArray’s permission and Returned Materials Authorization [RMA] number. In no
event shall SensArray be liable for any consequential or incidental damages. Products that have
been subject to abuse, misuse, accident, alteration, neglect, or unauthorized repair or installation are
not covered by this warranty. SensArray will make the final determination as to the existence and
cause of any alleged defect. SensArray is not responsible for maintaining or supplying any
consumable materials used in conjunction with this hardware and SensArray is not liable for
expendable items such as fuses, lamps, paper, ink, etc. No warranty is made with respect to any
customized equipment or Products supplied with Accura°C systems where produced to Purchaser’s
specifications except as specifically stated in writing by SensArray in the contract for such
Products. The purchaser will pay the shipping costs of returned materials to SensArray; SensArray
will pay the cost of shipping repaired/replaced material to Purchaser. This Warranty is the only
warranty made by SensArray with respect to the Product delivered hereunder and may be modified
only by a written instrument that is signed by a duly authorized officer of SensArray and accepted
by Purchaser. Except as provided above, SensArray makes no warrantees, expressed or implied,
including any warranty of merchantability for a particular purpose.
Software License Agreement
The Software is owned by SensArray Corporation and is protected by United States copyright laws
and international treaty provisions. Therefore, you must treat the Software like any other
copyrighted material. Under the Copyright Laws, the Thermal MAP Software, or accompanying
written materials, may not be copied, photo-copied, reproduced, translated, in whole or in part,
without the prior written permission of SensArray.
You may make one copy of the Software solely for backup or archival purposes.
You may make 10 copies of the written materials accompanying the SensArray Corporationproduced Software provided that such copies are solely for use by personnel using Thermal MAP.
All rights not expressly granted to you in this Agreement are reserved to SensArray Corporation.
Third-Party Software
Licenses for any software which was provided but not produced by SensArray Corporation are
granted solely and only by the original supplier or manufacturer and solely and only with the
supplier’s limitations and rights. Copying restrictions for such software are governed solely and
only by the original supplier or manufacturer’s license or any other supplier-approved agreements,
as applicable.
Trademarks
°SensArray®, Thermal MAP®, and Accura°C are trademarks of SensArray Corporation.
Windows and Excel are trademarks or trade names of Microsoft Corporation.
Any other terms mentioned in this document that are known to be trademarks or service marks have
been appropriately capitalized. Use of a term in this document should not be regarded as affecting
the validity of any trademark or service mark.
FCC Compliance Statement:
This device complies with part 15 of the FCC Rules. Operation is subject to the following two
conditions: (1) This device may not cause harmful interference, and (2) this device must accept any
interference received, including interference that may cause undesired operation.
CAUTION: Changes or modifications not expressly approved by the manufacturer
responsible for compliance could void the user’s authority to operate the equipment.
Important Note: To comply with FCC RF exposure compliance requirements, the antenna
used for this transmitter must be installed to provide a separation distance of at least 20cm from al
persons and must not be co-located or operating in conjunction with any other antenna or
transmitter.
European Union Notice
This system has been tested for conformance with CE radio spectral, EMC and safety requirements.
Chapter 1
Overview
The Accura°C system is a unique robot loadable temperature measurement system
designed for advanced track systems with two or more robot arms. The Accura°C system
consists of a Process Probe 1880 thin film RTD hybrid wafer in combination with an
advanced battery powered, disk-shaped, intelligent sensor interface system (DISIS),
which is the same diameter and weight of a process wafer. The data collected by the
system is sent to a laptop computer running Thermal MAP software via a Bluetooth
wireless connection for later analysis.
The Accura°C User Manual is designed as a quick reference document to setup and use
the Accura°C system in conjunction with the Thermal MAP software. For more detailed
information on using the Thermal MAP software, please refer to the Thermal MAP 3
User Manual or the help file. A PDF version of the manual may be found in the
C:\Sensarray\Documents folder on the laptop hard drive.
This chapter discusses the features of the Accura°C system.
The Accura°C System
The wafer and the DISIS are connected using two specially developed polyimide flat
cables and placed on the lower and upper robot arms respectively. The robot arm holding
the Process Probe 1880 wafer extends at half the normal speed to place the instrumented
wafer on the hotplate. The system is now ready to make measurements. The Accura°C
system can be setup to follow the exact movement of a product wafer to measure the
transient temperature conditions on the wafer during both transportation and thermal heat
up and cool down.
Figure 1. Accura°C System on Retracted Robot Pincers
Measurements taken by the sensors are converted from analog to digital signals within
the DISIS module, which are then exported via Bluetooth RF link and received by the
Bluetooth antenna at the laptop computer. The Thermal MAP software on the computer is
triggered to collect data from the antenna, which is then processed, analyzed and
displayed.
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Acquiring Data
The Thermal MAP software acquires and logs the data collected by the Accura°C system.
With the Thermal MAP data acquisition features, you can simultaneously view and log
wafer temperature sensor data. The data is observed on the strip charts and digital
readouts during the acquisition.
The software allows the user to determine how often and for how long the data points
will be collected. The user may chose which temperature scale the data will be calculated
in, or display the direct resistance output of each sensor on the wafer.
Thermal MAP measures the uncorrected sensor signals, applies corrections for sensor and
data acquisition system calibration offsets, then converts the readings to temperature. The
data is saved to the laptop hard disk for later analysis.
Analyzing Data
Previously logged data files may be analyzed using a powerful graphic interface to view
XY graphs, contour maps, surface maps, animations, and data tables. The logged data is
stored in a data table. Thermal MAP Analysis graphics can be viewed directly without
opening the data table. Or the data can be viewed and evaluated in table form, if desired.
A row in the table is called a sample or a single-timed sampling of all of the sensors on
the wafer and system inputs. You use the sample number to identify the table row of
measurements collected at the sample time.
The first column in the table is the sample number. The second column is the elapsed
time at which the sample was acquired. For example, as shown in Figure 2, Sample# 0
has a time of zero. The remaining columns in the table are the temperatures of the
individual RTD sensors within the wafer. Additional columns of data can be present if
system sensors, digital, and/or calculated values have been logged.
In addition to the data within the table, the data file stores other pertinent information—
including run date and time, operator’s name, and a description of the test—which you
enter before acquisition.
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Figure 2. Sample Data Table
During acquisition, Thermal MAP performs computations on acquired data, such as
determining the minimum, maximum, mean, range (max-min), and standard deviation of
all wafer sensor values for the sample, and logs the results in columns. These computed
values are referred to as calculated values.
After acquiring, linearizing, and storing the sensor data, you can display or print the data
as a line plot graph, as shown in Figure 3. In addition, you can display data in a table or
as a wafer map.
Figure 3. Displaying Data on a Line Plot Graph
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You can also display a 2-dimensional color contour map as shown in Figure 4 or a 3dimensional surface map as shown in Figure 5.
Figure 4. Two-Dimensional Color Contour Map
Figure 5. Three-Dimensional Surface Map
With the Animation feature, an animation of the acquired data can be created. The
animation can be set for a particular range of the acquired data, saved to a standard AVI
file, and replayed at any time. The AVI file can be sent to other computers not running
the Thermal MAP software and played using the Windows Media Player
With the Derived Files Feature, statistical data can be generated for selected periods of an
acquisition run. In addition, the differences in selected sensor readings between two
different acquisition runs may be compared.
Data may also be exported to a spreadsheet program, edited in the spreadsheet, and
loaded back to Thermal MAP for further analysis.
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Chapter 2
System Setup and Operation
Before you can begin working with the Accura°C system, you need to unpack the system
components, prepare the equipment for transfer to the cleanroom, and connect the system
cables.
Connecting the System
Before shipping, SensArray assembles and tests the Accura°C system. The Thermal MAP
software is preinstalled and configured. To setup the system, you only need to connect
the cable from the wafer to the DISIS unit and install the Bluetooth module to the laptop.
Do not load any additional software on the system hard drive. All required
software is loaded and tested prior to shipping.
Connecting the Wafer to the DISIS
To connect wafer and DISIS unit, complete the following instructions.
1. Slide the locking tab on the wafer connector forward to unlock the connector.
Figure 1. Connector Board Components
2. Place the DISIS unit and the wafer so that the twin cable and connector face each
other as shown in Figure 2.
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Figure 2. Wafer DISIS Connection
3. Place the wafer connector over the guide pins of the DISIS connector and press down
to firmly seat the connector. Slide the locking tab back to lock the connection.
Turning the System On
After all the component connections are completed, the system is turned on to verify
proper operation.
1. Locate the power switch on the laptop and turn the power ON. If the system turns on
successfully, Windows 2000 logon screen will appear.
2. Logon to Windows 2000. The system is shipped with the password field blank (no
password) and you only have to hit  to log on to the system.
3. Plug the Bluetooth adapter into a USB port.
4. Verify that the DISIS unit is turned on. The green LED next to the connector should
be flashing. If not, press and hold the Power button on the DISIS for at least one
second. (To turn the power off, just press the power button a second time.)
Figure 3. DISIS Component Locations
5. Open My Bluetooth Places from the desktop.
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6. Open Entire Bluetooth Neighborhood and read the list of Bluetooth items available.
If there is more than one DISIS unit assigned to the system, locate the DISIS with the
same serial number as the DISIS unit you are using for the test. Double-click on the
ISIS unit icon.
7. Check that the serial port shows Connected. If not, right-click on the icon and select
Connect Serial Port. Note the number of the COM port displayed in the right-hand
column.
8. Launch the Thermal MAP Software by clicking on the Thermal MAP icon on the
desktop.
9. Click on Acquisition. If the DISIS is not found, click on Select Serial Port and set
the serial port to the number noted above. Then click Retry.
10. Once the DISIS unit is recognized, acquire data normally.
Loading the System on the Robot Arms
To place the system on the robot arms, complete the following instructions.
1. Have the operator extend the bottom robot arm. The robot should be moving at no
more than 50% speed.
2. Carefully remove the wafer from the wafer carrier with one hand. With the other
hand, pick up the DISIS unit. Keep the DISIS unit above the wafer.
3. Carefully place the wafer on the lower robot arm.
4. Keep the DISIS unit clear of the robot extension area and have the operator extend
the upper robot arm. Place the DISIS unit on the upper arm.
5. Align the wafer and DISIS unit so that the two cables are parallel with the robot
extension.
6. Have the operator retract both robot arms.
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Charging the DISIS Unit
The DISIS unit is charged by placing the entire unit on a charging station. To charge the
DISIS, perform the following steps:
1. If the wafer is still connected to the DISIS, place the wafer in the wafer carrier. Slide
the locking tab forward and disconnect the cables from the DISIS unit.
2. Plug the power supply into the charging station. Plug the other end of the power
supply into an AC outlet. Verify that the red Power LED on the charging station is lit.
3. Place the DISIS unit face up on the charging station so that the power connector posts
on the charging station go through the matching holes in the DISIS. Press down to
seat the DISIS unit.
4. When the DISIS unit is fully charged, the green Charge LED on the charging station
will light. You can now remove the DISIS from the charging station. The charging
process should take less than 2.5 hours. (Note: leaving the DISIS in place will not
harm anything, the charging current drops to a trickle to maintain the charge.)
* The DISIS unit will run for at least 10 hours without recharging.
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Chapter 3
Acquiring Data
This chapter discusses Thermal MAP® 3 Acquisition, including a thorough explanation of the
following areas.
•
Acquisition Setup—Setting acquisition options
•
Additional Acquisition Features—Configuring hardware and calculated channels, and
setting triggers
•
Acquisition Display—Setting channel attributes and viewing wafer configurations
Acquisition Setup
Before acquiring data, you need to set options for the data acquisition run. After starting a
run, you can use a graphical stripchart display to view data as it is acquired.
This section discusses operating the configuration editors and setting up the system input and
calculated channel configuration files. These files store information on how to acquire and log
data for a particular hardware configuration.
In addition, this chapter discusses the following topics.
•
Using Acquisition Setup window options
•
Configuring system input and calculated channels for specific process systems, chamber
modules and test parameters
•
Starting data acquisition
Using the Acquisition Setup Window
You can begin acquisition by choosing Acquisition when you log onto Thermal MAP 3. If
you are analyzing a previously recorded file, you can begin acquisition by choosing
Acquisition»Acquire from the menu bar.
If the system is unable to initialize the serial port, please refer to the Thermal MAP 3 User
Manual or the help file for troubleshooting information. A PDF version of the manual may be
found in the C:\Sensarray\Documents folder on the laptop hard drive.
If all the connections are correct, a message briefly appears identifying the DISIS unit and
then the Acquisition window shown in Figure 3-1 opens.
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Figure 3-1. Basic Acquisition Setup Window
The following table describes fields on the Acquisition Setup window.
Field
Description or Result
Operator’s or equipment logon name. The name of the user or equipment from the
logon is the default name in the box. The name can be changed by highlighting the
current operator name and typing a new name in the box.
This field allows you to enter information regarding the test. You can use the scroll
bar to access any information that overflows the window.
Update automatically from the system calendar and clock. When the Setup ISIS
Wait For Trigger button is pressed, the date and time displays freeze and become
the start of acquisition date and time recorded with the data.
Name of the file that logs data. The field defaults to the filename for the previous
acquisition. The default data directory is C:\Sensarray\Data. The default
file type is .MAP. To change the name of a new file, highlight the current file
name and enter a new name.
You can leave the Data File field blank and acquire data without writing the data
to a file. When you start the acquisition, a prompt confirms that you do not wish
to log data. To clear the Data File field, highlight the text and use the 
key to remove the name.
To change location of the data file, click on the Browse button to open the Save
As dialog box. If you do not want to overwrite an existing file, assign a unique
name to the file in the File name field on the Save As dialog box.
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Field
Acquiring Data
Description or Result
This specifies the time interval between samples. To set the units, click on the units
field and use the popup menu.
To change the resolution for sec (seconds) or min (minutes), you must type in a
value. The equivalent rate in Hertz is shown on the right. Alternatively, you can
specify a rate in Hertz and the closest sample interval is selected automatically.
Specifies the time period to acquire samples. Dividing the period by the scan interval
gives the total number of sets of samples. This number is only an upper limit—you
can stop the acquisition manually at any time before the limit is reached.
Note:
After you trigger the acquisition, you cannot modify the Acquire For field.
Figure 3-2. Sample Rate Controls
The controls shown in Figure 3-2, perform the following functions:
• Use the left control to specify the length of time for acquisitions. This value
must be higher than Scan Every period. If you put in a value that is lower,
the software will automatically adjust the Acquire For period to equal one
sample.
• Use the center control to specify the unit. Select seconds, minutes or hours
from the popup menu.
• The indicator on the right of the = (equal sign) shows the total number of
samples of the acquisition unless stopped prematurely. The indicator
updates automatically if you change the Acquire For or Scan Every
period. Alternatively, you can enter the number of samples into this field
and the time values in the Acquire For period update accordingly.
Specifies the unit of measure for the logged data. When you click on Scale, a popup
menu appears. From this menu, select the temperature scale you wish to use:
For RTD-instrumented wafers, you can also select resistance. By selecting
resistance, Thermal MAP logs sensor resistance without converting the readings to
temperature.
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Field
Acquiring Data
Description or Result
Displays the type and serial number of the wafer that will be used. If the system
detects the correct wafer, it displays the wafer number in the window. If the correct
wafer is not displayed, ensure the calibration file included with your wafer was
installed. Select Auto from the popup menu to detect automatically the installed
wafer (default). Or you can select other installed wafer configurations from the
popup menu.
For the Auto command to function properly, a wafer with an ID chip in its connector
must be connected to the ISIS unit. From the popup menu, you can access all valid
wafer configurations that are currently stored in the Configs folder. However,
selecting an incorrect wafer yields invalid readings, graphs and maps.
A message that displays the current status of acquisition, such as Acquisition Setup,
Waiting For Trigger, or Acquiring Data.
Once acquisition has begun, this indicator displays the total number of samples that
are currently acquired, as well as the total number that the acquisition run will
acquire before completion.
Once acquisition has begun, these indicators show the time remaining and the time
elapsed.
Using Acquisition Setup Buttons
You can use the following buttons on the bottom of the Acquisition Setup window.
Button
Description
Expands the window to include options for hardware and calculated channel
configuration. In addition, you can setup triggering. See the
Additional Acquisition Features section of this chapter for more information.
Multi-purpose button used to start or trigger an acquisition, depending on current
state. When you complete the acquisition setup, you must press this button to
configure the ISIS. Acquisition does not start until the trigger condition is met. If set
for manual trigger, this button must be pressed again.
Multi-purpose button used to stop an acquisition, or exit the acquisition module,
depending on current state.
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Additional Acquisition Features
With the additional acquisition features, you can define hardware, calculated channel
configurations, and set triggering. Press the More Options» button to expand the
Acquisition Setup window and open the right-hand pane, as shown in Figure 3-3.
Figure 3-3. Expanded Acquisition Setup Window
For detailed information on using the additional acquisition features, such as hardware
configurations or setting system and module information, please refer to the Thermal MAP 3
User Manual located in the C:\SensArray\Documentation folder on your hard disk or use the
help file.
Setting Calculated Channel Configurations
With Thermal MAP, you can perform computations on the wafer or substrate sensor
data and log the results as separate data columns. The Calculated Configuration field
on the expanded portion of the Acquisition Setup window displays the configuration
selected for the next acquisition. You can select a different configuration from the
pull-down menu, as shown below.
If you select New Configuration from the menu, the Calculated Configuration
Editor opens. See the next section, Creating and Modifying Calculated
Configurations, for more information.
To edit the selected configuration, press the Edit button to open Calculated
Configuration Editor. See the next section, Creating and Modifying Calculated
Configurations, for more information.
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Creating and Modifying Calculated Configurations
By selecting the New Configuration option or pressing the Edit button under the Calculated
Configuration field, you open the Calculated Configuration Editor, as shown in Figure 3-4.
With the editor, you have the option of logging specific calculations. The calculations are
performed on a sample-by-sample basis. The calculated data is logged for each set of readings
at a given time.
Figure 3-4. Calculated Configuration Editor
The following table describes fields, checkboxes, and buttons on the Calculated
Configuration Editor window.
Fields/Buttons/ Checkboxes
Definition or Result
Includes the minimum sensor reading in the list of calculated channels.
Includes the maximum sensor reading in the list of calculated channels.
Includes the range (maximum–minimum) of the sensor readings in the list of
calculated channels.
Includes the arithmetic mean (or average) of the sensor readings in the list of
calculated channels.
Includes the standard deviation of the sensor readings in the list of calculated
channels.
Includes the wafer rotation position displayed on the Acquisition Display
window in the list of calculated channels.
Name you assign to the configuration that you are creating or editing. A new
name may be entered or the existing name changed by clicking in the text box
and editing or entering the desired name.
Description of the hardware configuration. For example, Standard Wafer
Calculated Configuration.
Saves modifications to the configuration.
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Fields/Buttons/ Checkboxes
Acquiring Data
Definition or Result
You use this option to save a new configuration for the first time. If the
configuration name exists, press this button to create a duplicate configuration
of the same name. If you save a duplicate copy, the original version remains
displayed.
You can view duplicate configurations from the pop-up menu of the
Hardware Configuration field on the expanded Acquisition Setup window.
The configurations appear in the order of creation.
Opens the help file for this window.
Deletes the currently displayed configuration. The default configuration loads
after a deletion.
Cancels any changes you made to a configuration and ends the editing
session.
Acquisition Display
From strip charts and diagrams on the Acquisition Display window, you can observe data as
it is acquired. This section discusses using the Acquisition Display window, setting channel
attributes, and viewing wafer or substrate configurations.
If a filename was specified in the Acquisition Setup, the Line Plot Display window from the
Analysis program will automatically display after acquisition is complete and you exit
Acquisition Setup. To display a strip chart as the acquisition is occurring, select
Displays»Stripchart Display (or press +) from the Acquisition Setup window to
open the Acquisition Display window as shown Figure 3-5.
Figure 3-5. Acquisition Display Window
The following table describes the features of the window that you can manipulate to control
the display of data.
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Item
Acquiring Data
Description
Strip Chart On the left portion of the window are two strip-charts that display readings and
Displays calculated data during acquisition. The upper chart displays readings in units of
temperature. The lower chart displays values in units other than temperature. If the
display range obscures the plots, you can change the range of the temperature scales
to the right by editing the text in the top or bottom label of each scale.
From the popup menu, you can set the number of samples (from 10 to 2000)
displayed at one time in the chart.
Changes the background color of the strip chart and map display. The button toggles
between a white and black background.
Press the Setup ISIS Wait For Trigger button to command the ISIS to perform a
self-calibration and wait for the trigger to start the acquisition.
After setup, the text in this button changes to Trigger. You can start data
acquisition by pressing the Trigger button. The functionality of this button is
identical to the Setup ISIS Wait For Trigger button on the Acquisition window.
Exits the Acquisition windows, unless an acquisition is running. If an acquisition is
running, this button is used to Stop Acquisition. Pressing the Stop Acquisition
button stops the acquisition manually. The functionality of this button is identical to
the Exit Acquisition button on the Acquisition window.
Numeric Display The Numeric Display shows the name or the temperature of each sensor on the
substrate or wafer map. In addition, the calculated data displays in separate numeric
readout on the bottom of the map.
Popup Settings
If you click anywhere on the right-hand side of the Strip Chart Display, except on a
sensor position, a popup menu appears.
This allows you to set the view of the data in the strip chart display for temperature
and system inputs.
Press the binocular icon to autorange the charts to show the minimum and
maximum readings that correspond to the time or sample range specified at the
bottom of the graph. This is the default condition.
To turn the autorange option off, click the binocular icon again.
A manual control to note the wafer position in the chamber. This is not used with
the Accura°C since the wafer cannot be rotated.
Click to produce a black and white display.
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Item
Acquiring Data
Description
Sets the number of decimal places to represent data. You can select from the
following formats in the Display Format pull-down menu.
The decimal formats apply to the map displays, strip charts, and the calculated data
readings. If you select a decimal format and then select Name from the pull-down
menu, the strip chart and calculated data readings remain at the last selected decimal
format.
Setting Channel Attributes
This section describes options on the Numeric Display pop-up menu. By clicking directly
on a value or label in the Numeric Display, the sensor channel pop-up menu appears, as
shown in Figure 3-6. In the menu, you can set attributes for a specific sensor or system
input channel. If you click in an area between sensor indicators, you can set attributes for
all sensor channels. See the Setting Attributes for All Channels section of this chapter for
more information.
Figure 3-6. Channel Pop-up Menu
on the Numeric Display
As shown in Figure 3-6, if you click on a particular sensor, you access the pop-up menu
for that sensor.
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Hiding a Channel
To hide the line plot of a channel from the strip chart display, select Hide. When a
channel is hidden, it is not disabled but its values are acquired and logged. Hidden
channels have a value or label that is dimmed (gray).
To display the channel, select Show.
You can also toggle the display state of the sensor by clicking quickly on the sensor value
or label. Holding the mouse button down will cause the menu to appear.
Scaling to a Particular Channel
Select the Scale To option to scale the strip chart that the channel is displayed to the
minimum and maximum values for the channel.
Highlighting a Channel
To add markers to a strip chart plot for easier identification of a channel, select
Highlight, choosing either dots or a thick line.
To restore the channel to the normal line appearance, select Highlight again to un-check
it.
Disabling a Channel
Select Disable to disable a sensor channel. If a sensor is not reading correctly, you can
disable the channel so it does not affect statistical channels such as max or mean.
Disabling removes the channel from the strip chart display and logs the values as NaN
(not-a-number). This value distinguishes the disabled channel data from accurate data and
is not included in the calculated channel values.
NOTE:
Disable channels with care. Disabling a sensor during acquisition is not the same
as hiding it. Disabling a sensor means that Thermal MAP will NOT acquire data for
the sensor.
Information about which channels are disabled is stored with the wafer configuration file
for the wafer. A disabled channel remains disabled until you re-enable the channel.
To enable a disabled channel, select Enable.
Setting Attributes for All Channels
If you click on an area of the Numeric Display that is not associated with a specific
sensor channel label, a pop-up menu appears in which you can hide, show, highlight, or
unhighlight all wafer or system channels simultaneously.
For example, if you want to show only one sensor channel, select Hide for all channels
and select Show for the specific channel.
Returning to the Acquisition Setup Window
To return to the Acquisition Setup window, select Displays»Acquisition Setup on the
Acquisition Display window.
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Acquiring Data
Viewing Wafer Configurations
To view the wafer configuration that you are using for acquisition—or any other one in
your Configs directory—select Displays» View Wafer Config on the Acquisition Setup
window. This action opens the Wafer Configuration Viewer, as shown in Figure 3-7.
Figure 3-7. Wafer Configuration Viewer
The Wafer field is the only field you can change to view a configuration. The Wafer field
defaults to the configuration selected in the Acquisition Setup window. By clicking on the
up/down arrows, you can move through a list of wafer configurations files in the
Sensarray\Configs directory on your hard drive. By clicking in the Wafer display box,
the entire list of wafer configurations available pops up and you can select a file from the list.
If the Acquisition Setup window is open and you change the selected wafer configuration in
the Wafer Config Viewer to a type of configuration compatible with connected ISIS unit, the
wafer that is currently selected in the Setup window changes as well.
By placing the mouse cursor over a sensor on the sensor map in the upper right-hand corner
of the viewer, the line for that sensor is highlighted in the table.
In addition, you can display the Wafer Configuration Viewer from the Analysis Window or
the Data File Info window. You access the Date File Info window by selecting
Displays»Info.
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Analyzing Data
After acquiring and storing the sensor data to a file, you can use Thermal MAP Analysis
to interpret the thermal characteristics of the wafer parameters. You can use the analysis
display to zoom in on segments of the data for closer examination, highlight individual
sensor readings, view a diagram of the wafer that demonstrates spatial relationships of
temperature data, or view data in a spreadsheet form.
Opening Data Files
To use Thermal MAP Analysis, at least one data file must be open. To view a saved file,
press the Open File button, or if another window is already open, select Open from the
File menu. The file dialog box appears with the list of available file names. In
Thermal MAP 3, all data files by default are created with a .map extension.
Double-click on the file to analyze, or highlight it and press Open. The Thermal MAP
analysis window appears, as shown in Figure 4-1.
In the Analysis window, you can open additional data files at any time by selecting
File»Open or pressing  + O. You can open and view up to six data files at one
time.
Using the Analysis Window
The Analysis window opens and the graph displays data from the file you selected. Note
that large data sets take longer to load. The following sections explain the display options
of the resizable Analysis window.
Figure 4-1. Analysis Window
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When selecting a data file to view, a time vs. temperature graph of the saved data appears
when the file is opened.
Using Analysis Menus
The analysis window has the following menus: File, Edit, Displays, Animation,
Acquisition, Windows, and Help.
This section contains brief descriptions of using menu items on the Analysis window.
File
Item
Result
Open
Opens a data set in a new analysis window. You can open a file in either
Thermal MAP format or spreadsheet format. The menu item is grayed-out
if you have the maximum number of data sets open.
Close
Closes the analysis window.
Save
Saves the data file under the same name in the same format and location as
previously saved. Enabled only if the data file has been changed, such as if
comments were added or changed on the Info window.
Save As
Saves a copy of the data file. Either Thermal MAP or spreadsheetcompatible text format may be saved. The name and/or location of the file
may also be changed.
Print Window
Prints a hard copy of the window.
Print Report
Prints a hard copy of the line plot graph, legends, and file information for
the current data file.
Print to File
Saves the current window to a graphic file. The files may be viewed at a
later time and pasted into other documents.
Convert Data
Files
Opens the batch converter that enables conversion of older file types to
Thermal MAP 3 files. Also converts Thermal MAP files to and from
spreadsheet files.
Change
Current User
Opens a dialog box to change the user name currently using the program,
and thereby change the preferences settings to those of that user.
Exit
Thermal MAP
Closes all files and exits Thermal MAP.
Edit
Item
Result
Cut
Cuts selected text to the clipboard
Copy
Copies selected text to the clipboard
Paste
Pastes cut or copied text from the clipboard
Preferences
Allows user to define preferred program settings. Preferences are saved for
each user.
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Displays
Item
Result
Contour
Opens a Contour display window for the data file and maps the sample at the
left-hand selection bar’s position on the graph.
Surface
Opens the Surface display window for the data file and maps the sample at the
left-hand selection bar’s position on the graph.
Numeric
Opens the Numeric display window for the data file and shows the data for the
sample at the left-hand selection bar’s position. Data updates when the
selection bar is moved.
Table
Opens the Data Table window for the data file.
Info
Opens the File Info window for the data file. This window displays information
about the data file and allows entry of comments.
View Wafer
Config
Displays a table showing the configuration of the wafer used to acquire data,
including sensor locations and status.
Derived File Accesses the Derived File Wizard.
Wizard
Animation
The Animation function creates a movie of the data between two time points of your data
set. The data can be displayed in contour maps, surface maps, or both.
Item
Result
Create
Opens dialog box to create an animated sequence of the data between the
selection bars on the graph.
Play
Open created animation file for playback.
Acquisition
Item
Result
Acquire
Starts the Thermal MAP Acquisition module and opens the Thermal MAP
Acquisition window.
Windows
The Windows menu includes a list of all Thermal MAP windows that are open.
Selecting an item on the list brings that window to the front.
Help
Item
Line Plot
Display
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Opens the online help to information about the XY graph.
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Item
Result
Contents
Opens the table of contents for the online help.
About
Thermal MAP
Opens the Thermal MAP logo screen. This screen contains information about
the Thermal MAP version and how to contact SensArray Corporation.
Displaying Data on Line Plots
The line plot graph displays colored line plots of wafer temperature data, calculated data,
and system input data.
The line plot graph includes the following features.
•
You can view sample time that corresponds to the beginning and end of the selected
sample range in the selection bar controls below the graph.
•
The graph axes automatically scale to fit the data being plotted, or you can set the
axes manually.
•
For system and calculated channels measured in units of temperature, the data is
plotted relative to the left-hand scale.
For system and calculated data channels with units other than temperature, the data is
plotted relative to a separate scale that is drawn along the right-hand side of the line plot
graph. The Hardware Configuration and Calculated Configuration files define the default
range of these scales.
You can identify corresponding wafer sensors for system and calculated channels using
the line plot legends on the left of the graph.
Each colored line on the graph corresponds to a wafer sensor or calculated data. Readings
and calculations (y-axis) display against the sample number or elapsed time (x-axis). You
can use the line plot graph to visualize the temperature for one or more areas on the wafer
over a period of time. You can display any combination of wafer sensors and calculated
values.
The line plot legends, located on the left portion of the graph, have the
following features.
The Sensor Map contains dots that represent the position of each sensor
on the wafer. The color of the sensor dot corresponds to the color of the
line on the line plot graph.
Sensor Map
The System Inputs and Calculated Channel legend associates calculated
values by name. For example, the color of the MEAN legend
corresponds to the color of the mean temperature plot.
System Input
and Calculated
Channel Legend
Controlling the Line Plot Display
This section describes features on the line plot graph, including changing the line plot
mode and manipulating the scale, shown in Figure 4-2.
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Figure 4-2. Line Plot Graph Scale
Changing the Line Plot X-Axis Units
You have the option of setting units for the x-axis as time (minutes or seconds) or sample
number. By clicking on the x-axis legend, you can select the option from a pop-up menu,
as shown below. .
You can change the x-axis to represent sample numbers or time.
Changing Line Plot Graph Scales
You can change the scale of the line plot data for easier viewing. For example, you can
change the scales to view a subset of the data at a higher resolution.
To change the scale at which the data is viewed, perform the following steps.
•
Select the x- or y-axis values by double clicking on the value.
•
Enter a new value into the scale label and press the  key.
Using Legends and Controls
This section discusses using legends and controls on the Analysis window.
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Figure 4-3. Elements of the Analysis Window
Using Legends
The Analysis window contains the following legends: Sensor Map, and System and
Calculated Channels.
Sensor Map
The Sensor Map, located on the top left of the Analysis window, shows where
sensors are positioned on the wafer. Each sensor, representing an individual line
plot, displays as a large, colored dot. Sensors not selected for plotting appear as
small gray dots. You can display the sensor identification, by passing the cursor
over the specific sensor.
On the Sensor Map, you can click on a sensor dot to access a pop-up menu. From
the menu, you can select the following.
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Analyzing Data
Disable Sensor—Excludes the data of a sensor from the line plot display and
from computation in surface fits. The disabled sensors are indicated with a
small gray dot.
You can also toggle this state of the sensor by clicking quickly on the sensor
value or label. Holding the mouse button down will cause the menu to appear.
•
Highlight Sensor – dots – Highlights the trace in the graph by plotting a
filled circle at each sample interval.
•
Highlight Sensor – thick —Enlarges the trace in the graph for easier
location on the line plot.
If you click on an area of the Sensor Map that is not associated with a specific
sensor, a pop-up menu appears in which you can enable, disable, highlight, or
unhighlight all wafer sensors simultaneously.
Using the Graph Display Controls
Graph display controls consist of menus and tools for manipulating the display of data.
The following table describes the Graph Display controls.
Control
Description
With the Crosshair icon, you can manually move any selection bar or crosshair to
the nearest sample interval. To use the tool, first click on the icon, then click on a
selection bar or crosshair and drag to move it. For finer motion control, see the
Using Crosshairs section of this chapter.
The Hand Tool allows you to pan the XY graph within the window.
You use the magnifying glass menu to adjust the view of the data (zoom) in the
graphic display. Click on this icon to display the zoom options pop-up, as shown
below.
For in-depth descriptions of the zoom modes, see the Using the Zoom Mode
section on the next page.
The Binocular icon zooms out the display to the full data set.
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