SZ060424B02 ET海林 179072 Y 103 Report

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Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Note: This report shall not be reproduced except in full, without the written approval of Compliance Certification Service Inc. .
This document may be altered or revised by Compliance Certification Service Inc. personnel only, and shall be noted in the
revision section of the document.
Page 1 of 39
Rev. 00
EMC COMPLIANCE TEST REPORT
For
USB2.0 IDE/SATA ADAPTER
Trade Name : UNITEK
Model Number : Y-103
Serial Number : N/A
Report Number : SZ060424B02-ET
Date : August 01, 2006
Regulations : See below
Standards Results (Pass/Fail)
EN 55022: 1998+A1: 2000+A2: 2003
EN 61000-3-2: 2000
EN 61000-3-3: 1995+A1:2001
EN 55024: 1998+A1: 2001+A2: 2003
- IEC 61000-4-2: 2001
- IEC 61000-4-3: 2002
- IEC 61000-4-4: 2001
- IEC 61000-4-5: 2001
- IEC 61000-4-6: 2001
- IEC 61000-4-11: 2001
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Prepared for :
TECH-TOP TECHNOLOGY LIMITED
RM 1609/1611, METRO CENTRE II 21 LAM HING STREET, KOWLOON
BAY KOWLOON, HONGKONG
Prepared by :
COMPLIANCE CERTIFICATION SERVICES (SHENZHEN) INC.
NO.5 JINAO INDUSTRIAL PARK, NO.35 JUKENG ROAD,
DASHUIKENG VILLAGE,GUANLAN TOWN,
BAOAN DISTRICT, SHENZHEN, CHINA
TEL: 86-755-28055000
FAX: 86-755-28055221
LAB CODE:200577-0
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 2
Rev. 00
TABLE OF CONTENTS
DESCRIPTION PAGE
TEST RESULT CERTIFICATION 4
GENERAL INFORMATION 5
SYSTEM DESCRIPTION 6
PRODUCT INFORMATION 7
SUPPORT EQUIPMENT 8
TEST FACILITY 9
TEST EQUIPMENT LIST 10
SECTION 1 EN 55022(LINE CONDUCTED & RADIATED
EMISSION) 12
MEASUREMENT PROCEDURE & LIMIT (LINE CONDUCTED
EMISSION TEST
)
12
MEASUREMENT PROCEDURE & LIMIT (RADIATED EMISSION
TEST
)
15
BLOCK DIAGRAM OF TEST SETUP 18
SUMMARY DATA 19
SECTION 2 EN 61000-3-2 & EN 61000-3-3 (POWER HARMONICS
& VOLTAGE FLUCTUATION/FLICKER) 21
RESULT 21
SECTION 3 IEC 61000-4-2
(
ELECTROSTATIC DISCHARGE
)
26
BLOCK DIAG
R
AM OF TEST SETUP 26
TEST PROCEDURE 27
PERFORMANCE & RESULT 28
SECTION 4 IEC 61000-4-3 (RADIATED ELECTROMAGNETIC
FIELD) 29
BLOCK DIAGRAM OF TEST SETUP 29
TEST PROCEDURE 30
PERFORMANCE & RESULT 31
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 3
Rev. 00
DESCRIPTION PAGE
SECTION 5 IEC 61000-4-4 (FAST TRANSIENTS/BURST) 32
BLOCK DIAGRAM OF TEST SETUP 32
TEST PROCEDURE 33
PERFORMANCE & RESULT 33
SECTION 6 IEC 61000-4-5 (SURGE IMMUNITY) 34
BLOCK DIAGRAM OF TEST SETUP 34
TEST PROCEDURE 35
PERFORMANCE & RESULT 35
SECTION 7 IEC 61000-4-6 (CONDUCTED DISTURBANCE/
INDUCED BY RADIO-FREQUENCY FIELD) 36
BLOCK DIAGRAM OF TEST SETUP 36
TEST PROCEDURE 37
PERFORMANCE & RESULT 37
SECTION 8 IEC 61000-4-11 (VOLTAGE DIPS,SHORT
INTERRUPTIONS AND VOLTAGE VARIATIONS) 38
BLOCK DIAGRAM OF TEST SETUP 38
TEST PROCEDURE 39
PERFORMANCE & RESULT 39
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 4
Rev. 00
TEST RESULT CERTIFICATION
Equipment Under Test: USB2.0 IDE/SATA ADAPTER
Trade Name: UNITEK
Model Number: Y-103
Serial Number: N/A
Applicant: TECH-TOP TECHNOLOGY LIMITED
RM 1609/1611, METRO CENTRE II 21 LAM HING STREET,
KOWLOON BAY KOWLOON, HONGKONG
Manufacturer:
OCEAN COMPUTER TECHNOLOGY(SHENZHEN) CO., LTD
3/F, BLOCK 10, CHANG XIN IND. CITY, CHANG ZHEN
VILLAGE, GONG MING TOWN, BAOAN, SHENZHEN
Type of Test: EMC Directive 89/336/EEC for CE Marking
Technical Standards: EN 55022: 1998+A1: 2000+A2: 2003
EN 61000-3-2: 2000
EN 61000-3-3: 1995+A1: 2001
EN 55024: 1998+A1: 2001+A2: 2003
(IEC 61000-4-2: 2001; IEC 61000-4-3: 2002;
IEC 61000-4-4: 2001; IEC 61000-4-5: 2001;
IEC 61000-4-6: 2001; IEC 61000-4-11: 2001)
Report Number: SZ060424B02-ET
Date of test: April 24~August 01, 2006
Deviation: None
Condition of Test Sample: Normal
The above equipment was tested by Compliance Certification Services (Shenzhen) Inc. for
compliance with the requirements set forth in EMC Directive 89/336/EEC amended by 93/68/EEC
and the Technical Standards mentioned above. This said equipment in the configuration described in
this report shows the maximum emission levels emanating from equipment and the level of the
immunity endurance of the equipment are within the compliance requirements.
The test results of this report relate only to the tested sample identified in this report.
Approved By: Tested By: Jason He
Reviewed By:
Harris Lai / General Manager Villian Xu / Assistant manager
COMPLIANCE CERTIFICATION COMPLIANCE CERTIFICATION
SERVICES (SHENZHEN) INC. SERVICES (SHENZHEN) INC.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 5
Rev. 00
GENERAL INFORMATION
Applicant: TECH-TOP TECHNOLOGY LIMITED
RM 1609/1611, METRO CENTRE II 21 LAM HING STREET,
KOWLOON BAY KOWLOON, HONGKONG
Manufacturer:
OCEAN COMPUTER TECHNOLOGY(SHENZHEN) CO., LTD
3/F, BLOCK 10, CHANG XIN IND. CITY, CHANG ZHEN VILLAGE,
GONG MING TOWN, BAOAN, SHENZHEN
Report Number: SZ060424B02-ET
Date of Test: April 24~August 01, 2006
Equipment Under Test: USB2.0 IDE/SATA ADAPTER
Model Number: Y-103
Serial Number: N/A
Type of Test: EMC Directive 89/336/EEC for CE Marking
Technical Standards: EN 55022: 1998+A1: 2000+A2: 2003
EN 61000-3-2: 2000
EN 61000-3-3: 1995+A1: 2001
EN 55024: 1998+A1: 2001+A2: 2003
(IEC 61000-4-2: 2001; IEC 61000-4-3: 2002;
IEC 61000-4-4: 2001; IEC 61000-4-5: 2001;
IEC 61000-4-6: 2001; IEC 61000-4-11: 2001)
Frequency Range
(EN 55022):
150kHz to 30MHz for Line Conducted Test
30MHz to 1000MHz for Radiated Emission Test
Test Site:
Compliance Certification Services (Shenzhen) Inc.
No. 5, Jinao industrial park, No.35 Jukeng Road, Dashuikeng
Village, Guanlan Town, Baoan District, Shenzhen, China
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 6
Rev. 00
SYSTEM DESCRIPTION
EUT Test Program:
1. Set up the EUT with the related support equipments.
2. Run the Copy.bat program of transferring data from PC to hard disk in windows XP.
3. Make sure EUT work normally during the test.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 7
Rev. 00
PRODUCT INFORMATION
Housing Type: Plastic
EUT Power Rating: DC5V supplied by the adapter and PC
Power during Test: DC5V supplied by the adapter and PC
Adapter Manufacturer/Model No: FLYPOWER/ SPP34-12.0/5.0-2000
Cable in: Un-shielded, 1.90m
Cable out: Un-shielded, 0.75m
USB Cable: Shielded, 0.65m (with six cores)
SATA Data Link Cable: Shielded, 0.10m
DC Diffluent Cable: Shielded, 0.10m
I/O Port of EUT:
I/O Port Type Q’TY Tested with
1) AC Input Port (Adapter) 1 1
2) DC Output Port (Adapter) 1 1
3) DC Input Port (EUT) 1 1
4) UNITEK DC Input Port 1 1
5) SATA Input Port 1 1
6) IDE Input Port 1 1
7) ATC Input Port 1 1
8) USB Port 1 1
Difference between model numbers as below:
Model Number Trade Name
1. N/A N/A
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 8
Rev. 00
SUPPORT EQUIPMENT
No. Equipment Model # Serial # Trade Name Data
Cable Power
Cord
1. PC DX6100MT CNG4470CNW HP N/A
Unshielded
1.8m
2. LCD MONITOR VP2016 A21050402549 VIEWSONIC Shielded
1.5 m Unshielded
1.8m
3. PRINTER P310B DLRE217030 EPSON Shielded
1.5 m Unshielded
1.8m
4. MODEM MODEN-1414 9013593 ACEEX Shielded
1.5m Unshielded
1.8m
5. PS/2
KEYBOARD LG1M-K818 LGKL0308856 LG Shielded
1.8 m N/A
6. PS/2 MOUSE M-BE58 LZA24503529 LOGITECH Shielded
1.8 m N/A
7. IDE DISK 6L080PO BAJ41G20 MAXTOR N/A N/A
8. SATA DISK 6V080EO VA131610 MAXTOR N/A N/A
**Note: All the above equipment/cables were placed in worse case positions to maximize emission signals during emission test.
Grounding: Grounding was in accordance with the manufacturer’s requirements and conditions for the intended use.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 9
Rev. 00
TEST FACILITY
Location: No. 5, Jinao industrial park, No.35 Jukeng Road, Dashuikeng Village,
Guanlan Town, Baoan District Shenzhen, China.
Description: There is one 3/10m open area test sites and one line conducted labs for final
test.
The Open Area Test Sites and the Line Conducted labs are constructed and
calibrated to meet the FCC requirements in documents ANSI C63.4 and
CISPR 22/EN 55022 requirements.
Site Filing: A site description is on file with the Federal Communications
Commission, 7435 Oakland Mills Road, Columbia, MD 21046.
Site Accreditation: Accredited by Nemko ( Aut. No.: ELA106), VCCI(Registration No.:
R-1996,C-2150), FCC ( Registration No.: 101879) and NVLAP(Lab
code:200577-0) for EMC.
Instrument Tolerance: All measuring equipment is in accord with ANSI C63.4 and CISPR 22
requirements that meet industry regulatory agency and accreditation agency
requirement.
Ground Plane: Two conductive reference ground planes were used during the Line Conducted
Emission, one in vertical and the other in horizontal. The dimensions of these ground planes are as below.
The vertical ground plane was placed distancing 40 cm to the rear of the wooden test table on where the
EUT and the support equipment were placed during test. The horizontal ground plane projected 50 cm
beyond the footprint of the EUT system and distanced 80 cm to the wooden test table. For Radiated
Emission Test, one horizontal conductive ground plane extended at least 1m beyond the periphery of the
EUT and the largest measuring antenna, and covered the entire area between the EUT and the antenna. It
has no holes or gaps having longitudinal dimensions larger than one-tenth of a wavelength at the highest
frequency of measurement up to 1GHz.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 10
Rev. 00
TEST EQUIPMENT LIST
Instrumentation: The following list contains equipment used at Compliance Certification Services
(Shenzhen) Inc. for testing. The equipment conforms to the CISPR 16-1 / ANSI C63.2 Specifications
for Electromagnetic Interference and Field Strength Instrumentation from 10kHz to 1.0GHz or above.
Equipment used during the tests:
Open Area Test Site: G
Open Area Test Site G
EQUIPMENT
TYPE MFR MODEL
NUMBER SERIAL
NUMBER LAST
CAL. CAL.
DUE
ESCI EMI TEST
RECEIV.ESCI ROHDE&SCH
WARZ 1166.5950 03 100145 02/09/2006 02/08/2007
Amplifier H.P. 8447D 2944A07999 02/09/2006 02/08/2007
Bi-log Antenna EMCO 3142B 9910-1436 06/10/2006 06/09/2007
Cable TIME
MICROWAVE LMR-400 N-TYPE04 06/10/2006 06/09/2007
System-Controller CT SC100 N/A N/A N/A
Turn Table EMCO 2081-1.21 N/A N/A N/A
Antenna Tower CT N/A N/A N/A N/A
DECOUPLING
NETWORK FISCHER
CUSTOM F-201-DCN-5
-6MM 12 06/10/2006 06/09/2007
Note: The measure uncertainty is less than +/-2.5078dB, which is evaluated as per the UKAS LAB34 and CISPR/A/291/CDV.
Conducted Emission Test Site: G
Conducted Emission Test Site G
EQUIPMENT
TYPE MFR MODEL
NUMBER SERIAL
NUMBER LAST
CAL. CAL.
DUE
ESCI EMI TEST
RECEIV.ESCI ROHDE&SCH
WARZ 1166.5950 03 100088 02/09/2006 02/08/2007
LISN EMCO 3825/2 1371 02/09/2006 02/08/2007
LISN EMCO 3825/2 8901-1459 02/09/2006 02/08/2007
Note: The measure uncertainty is less than +/-2.2318dB, which is evaluated as per the UKAS LAB34 and CISPR/A/291/CDV.
The calibrations of the measuring instruments, including any accessories that may effect such calibration,
are checked frequently to assure their accuracy. Adjustments are made and correction factors applied in
accordance with instructions contained in the manual for the measuring instrument.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 11
Rev. 00
TEST EQUIPMENT LIST
Power Harmonic & Voltage Fluctuation/Flicker Measurement (61000-3-2&-3-3)
EQUIPMENT
TYPE MFR MODEL
NUMBER SERIAL
NUMBER LAST
CAL. CAL DUE.
Harmonic & Flicker
Tester SCHAFFNER NSG
1007-5-400 54789 02/09/2006 02/08/2007
Power Source SCHAFFNER NSG1007 54789 02/09/2006 02/08/2007
ESD test (61000-4-2)
EQUIPMENT
TYPE MFR MODEL
NUMBER SERIAL
NUMBER LAST
CAL. CAL DUE.
ESD 30 System EM Test ESD 30C 1202-17 10/18/2006 10/17/2007
Radiated Electromagnetic Field immunity Measurement (61000-4-3)
EQUIPMENT
TYPE MFR MODEL
NUMBER SERIAL
NUMBER LAST
CAL. CAL DUE.
Signal Generator Maconi 2022D 119246/003 06/10/2006 06/09/2007
Power Amplifier M2S A00181-1000 9801-112 06/10/2006 06/09/2007
Power Amplifier M2S AC8113/
800-250A 9801-179 06/10/2006 06/09/2007
Power Antenna SCHAFFNER CBL6140A 1204 06/10/2006 06/09/2007
Fast Transients/Burst test (61000-4-4)/Surge(61000-4-5)/Voltage Dips
&Interruptions(61000-4-11)
EQUIPMENT
TYPE MFR MODEL
NUMBER SERIAL
NUMBER LAST
CAL. CAL DUE.
Fast Transients/Burst
Generator SCHAFFNER BEST EMC
V2.7 200126-012S
C 02/09/2006 02/08/2007
CS test (61000-4-6)
EQUIPMENT
TYPE MFR MODEL
NUMBER SERIAL
NUMBER LAST
CAL. CAL DUE.
Signal Generator Maconi 2022D 119246/003 06/10/2006 06/09/2007
Power Amplifier M2S A00181-1000 9801-112 06/10/2006 06/09/2007
CDN MEB M3-8016 003683 06/10/2006 06/09/2007
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 12
Rev. 00
SECTION 1 EN 55022(LINE CONDUCTED AND
RADIATED EMISSION)
MEASUREMENT PROCEDURE
(PRELIMINARY LINE CONDUCTED EMISSION TEST)
1) The equipment was set up as per the test configuration to simulate typical actual usage per the user’s
manual. When the EUT is a tabletop system, a wooden table with a height of 0.8 meters is used and is
placed on the ground plane as per EN55022 (see Test Facility for the dimensions of the ground plane
used). When the EUT is a floor-standing equipment, it is placed on the ground plane which has a 3-12
mm non-conductive covering to insulate the EUT from the ground plane.
2) Support equipment, if needed, was placed as per EN55022.
3) All I/O cables were positioned to simulate typical actual usage as per EN55022.
4) The EUT received DC5V from the adapter and PC, then the adapter and PC received AC230V/50Hz
power through a Line Impedance Stabilization Network (LISN) which supplied power source and was
grounded to the ground plane.
5) All support equipments received power from a second LISN supplying power of AC 230V/50Hz, if
any.
6) The EUT test program was started. Emissions were measured on each current carrying line of the EUT
using a spectrum Analyzer / Receiver connected to the LISN powering the EUT. The LISN has two
monitoring points: Line 1 (Hot Side) and Line 2 (Neutral Side). Two scans were taken: one with
Line 1 connected to Analyzer / Receiver and Line 2 connected to a 50 ohm load; the second scan had
Line 1 connected to a 50 ohm load and Line 2 connected to the Analyzer / Receiver.
7) Analyzer / Receiver scanned from 150kHz to 30MHz for emissions in each of the test modes.
8) During the above scans, the emissions were maximized by cable manipulation.
9) The following test mode(s) were scanned during the preliminary test:
Preliminary Conducted Emission Test
Frequency Range Investigated 150KHz TO 30 MHz
Mode of operation Date Data Report No. Worst Mode
SATA DISK 2006-07-28 Y-103_0(L, N)
IDE DISK 2006-07-28 Y-103_1(L, N)
Then, the EUT configuration and cable configuration of the above highest emission level were recorded
for reference of final testing.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 13
Rev. 00
MEASUREMENT PROCEDURE
(FINAL LINE CONDUCTED EMISSION TEST)
1) EUT and support equipment was set up on the test bench as per step 9 of the preliminary test.
2) A scan was taken on both power lines, Line 1 and Line 2, recording at least the six highest emissions.
Emission frequency and amplitude were recorded into a computer in which correction factors were used
to calculate the emission level and compare reading to the applicable limit. If EUT emission level was
less –2dB to the A.V. limit in Peak mode, then the emission signal was re-checked using Q.P and
Average detector.
3) The test data of the worst case condition(s) was reported on the Summary Data page.
Data Sample:
Freq.
MHz Peak
Raw
dBuV
Q.P.
Raw
dBuV
Average
Raw
dBuV
Q.P.
Limit
dBuV
Average
Limit
dBuV
Q.P.
Margin
dB
Average
Margin
dB
Note
xx.xxx 43.90 --- --- 56.00 46.00 --- -2.10 L 1
Freq. = Emission frequency in MHz
Raw dBuV = Uncorrected Analyzer/Receiver reading
Limit dBuV = Limit stated in standard
Margin dB = Reading in reference to limit
Note = Current carrying line of reading
“---“ = The emission level complied with the Average limits,
with at least 2 dB margin, so no further recheck.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 14
Rev. 00
LINE CONDUCTED EMISSION LIMIT
Frequency Maximum RF Line Voltage
Q.P.( dBuV) AVERAGE( dBuV)
150kHz-500kHz 66-56 56-46
500kHz-5MHz 56 46
5MHz-30MHz 60 50
**Note: The lower limit shall apply at the transition frequency.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 15
Rev. 00
MEASUREMENT PROCEDURE
(PRELIMINARY RADIATED EMISSION TEST)
1) The equipment was set up as per the test configuration to simulate typical actual usage per the user’s
manual. When the EUT is a tabletop system, a wooden turntable with a height of 0.8 meters is used
which is placed on the ground plane as per EN 55022 (see Test Facility for the dimensions of the
ground plane used).When the EUT is a floor-standing equipment, it is placed on the ground plane which
has a 3-12 mm non-conductive covering to insulate the EUT from the ground plane.
2) Support equipment, if needed, was placed as per EN 55022.
3) All I/O cables were positioned to simulate typical actual usage as per EN 55022.
4) The EUT received DC5V from the adapter and PC, then the adapter and PC received AC230V/50Hz
power through the outlet socket under the turntable. All support equipments received AC230V/50Hz
power from socket under the turntable, if any.
5) The antenna was placed at 10 meter away from the EUT as stated in EN 55022. The antenna connected
to the Analyzer via a cable and at times a pre-amplifier would be used.
6) The Analyzer / Receiver quickly scanned from 30MHz to 1000MHz. The EUT test program was started.
Emissions were scanned and measured rotating the EUT to 360 degrees and positioning the antenna 1 to
4 meters above the ground plane, in both the vertical and the horizontal polarization, to maximize the
emission reading level.
7) The following test mode(s) were scanned during the preliminary test:
Preliminary Radiated Emission Test
Frequency Range Investigated 30 MHz TO 1000 MHz
Mode of operation Date Data Report No. Worst Mode
SATA DISK 2006-07-28 Y-103_0(H, V)
IDE DISK 2006-07-28 Y-103_1(H, V)
Then, the EUT and cable configuration, antenna position, polarization and turntable position of the
above highest emission level were recorded for final testing.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 16
Rev. 00
MEASUREMENT PROCEDURE
(FINAL RADIATED EMISSION TEST)
1) EUT and support equipment were set up on the turntable as per step 7 of the preliminary test.
2) The Analyzer / Receiver scanned from 30MHz to 1000MHz. Emissions were scanned and measured
rotating the EUT to 360 degrees, varying cable placement and positioning the antenna 1 to 4 meters
above the ground plane, in both the vertical and the horizontal polarization, to maximize the emission
reading level.
3) Recorded at least the six highest emissions. Emission frequency, amplitude, antenna position,
polarization and turntable position were recorded into a computer in which correction factors were used
to calculate the emission level and compare reading to the applicable limit and Q.P./Peak reading is
presented.
4) The test data of the worst case condition(s) was reported on the Summary Data page.
Data Sample:
========================================================================
Freq. Raw Corr. Emiss. Limits Margin Reading
Data Factor Level Type
(MHz) (dBuV/m) (dB) ( dBuV/m ) (dB) P/Q
========================================================================
xx.xxx 14.03 12.25 26.28 30.00 -3.72 P
=========================================================================
Freq. = Emission frequency in MHz
Raw Data (dBuV/m) = Uncorrected Analyzer / Receiver reading
Corr. Factor (dB) = Correction factors of antenna factor and cable loss
Emiss. Level = Raw reading converted to dBuV/m and CF added
Limit dBuV/m = Limit stated in standard
Margin dB = Reading in reference to limit
P =Peak Reading
Q =Quasi-peak
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 17
Rev. 00
RADIATED EMISSION LIMIT
Frequency
(MHz) Distance
(m) Maximum Field Strength Limit
(dBuV/m/ Q.P.)
30-230 10 30
230-1000 10 37
**Note: The lower limit shall apply at the transition frequency.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 18
Rev. 00
BLOCK DIAGRAM OF TEST SETUP
System Diagram of Connections between EUT and Simulators
EUT : USB2.0 IDE/SATA ADAPTER
Trade Name : UNITEK
Model Number : Y-103
PC
PS/2 KEYBOARD
LCD MONITOR
USB2.0 IDE/SATA ADAPTER
(
EUT
)
MODEM
PS/2 MOUSE
PRINTER
SATA DISK
ADAPTER
AC POWER IN
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 19
Rev. 00
SUMMARY DATA
(LINE CONDUCTED TEST)
Model Number: Y-103 Location: Site G
Test Mode: SATA DISK
Test Results: Passed
Temperature: 25oC Humidity: 55%RH
(The chart below shows the highest readings taken from the final data)
L1 = Line One (Hot side) / L2 = Line Two (Neutral side)
**NOTE: “---” denotes the emission level was or more than 2dB below the Average limit, so no re-check anymore.
FREQ PEAK Q.P. AVG Q.P. AVG Q.P. AVG NOTE
MHz RAW RAW RAW Limit Limit Margin Margin
dBuV dBuV dBuV dBuV dBuV dB dB
0.209 42.94 --- --- 64.31 54.31 --- -11.37 L1
0.272 40.87 --- --- 62.50 52.50 --- -11.63 L1
0.342 41.88 --- --- 60.49 50.49 --- -8.61 L1
0.483 43.67 --- --- 56.47 46.47 --- -2.80 L1
1.180 39.37 --- --- 56.00 46.00 --- -6.63 L1
4.364 41.20 --- --- 56.00 46.00 --- -4.80 L1
0.346 44.44 --- --- 60.39 50.39 --- -5.95 L2
0.483 45.63 44.78 44.27 56.47 46.47 -11.69 -2.20 L2
1.184 43.25 42.57 41.99 56.00 46.00 -13.43 -4.01 L2
3.955 45.23 43.42 41.60 56.00 46.00 -12.58 -4.40 L2
4.517 46.12 42.52 38.64 56.00 46.00 -13.48 -7.36 L2
5.078 36.16 25.69 18.62 60.00 50.00 -34.31 -31.38 L2
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 20
Rev. 00
SUMMARY DATA
(RADIATED EMISSION TEST)
Model Number: Y-103 Location: Site G
Test Mode: SATA DISK Polar: Vertical / Horizontal
Test Results: Passed Test Distance: 10m
Temperature: 25℃ Humidity: 55%RH
(The chart below shows the highest readings taken from the final data)
Frequency Range Investigated (30 MHz TO 1000 MHz)
Freq
(MHz)
Meter
Reading
(dBuV/m
)
C.F.
(dBuV/m)
Corrected
Reading
(dBuV/m)
Limits
(dBuV/
m)
Margin
(dB)
Reading
Type
P/Q
Pol.
H/V
44.740 42.08 -23.70 18.38 30.00 -11.62 Q V
150.021 44.71 -21.39 23.32 30.00 -6.68 Q V
180.000 43.91 -18.41 25.50 30.00 -4.50 Q V
210.030 36.42 -18.24 18.18 30.00 -11.82 Q V
602.784 32.76 -6.26 26.50 37.00 -10.50 Q V
659.053 31.67 -7.58 24.09 37.00 -12.91 Q V
119.104 44.61 -19.29 25.32 30.00 -4.68 P H
180.037 39.29 -20.49 18.80 30.00 -11.20 Q H
210.222 45.62 -20.25 25.37 30.00 -4.63 P H
225.012 44.61 -16.72 27.89 30.00 -2.11 P H
240.006 47.92 -19.80 28.12 37.00 -8.88 P H
658.980 38.72 -6.09 32.63 37.00 -4.37 P H
C.F.(Correction Factor)=Antenna Factor + Cable Loss - Amplifier Gain ( + Attenuator 6dB)
Corrected Reading = Metering Reading + C.F.
Margin=Corrected Reading - Limits
P=Peak Reading H=Horizontal Polarization/Antenna
Q=Quasi-peak V=Vertical Polarization/Antenna
Comments: N/A
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 21
Rev. 00
SECTION 2 EN 61000-3-2 & EN 61000-3-3 (POWER HARMONICS &
VOLTAGE FLUCTUATION / FLICKER)
POWER HARMONICS MEASUREMENT
Port : AC mains
Basic Standard : EN 61000-3-2 :2000
Limits : V CLASS A ; CLASS D
Temperature : 25oC
Humidity : 55%
VOLTAGE FLUCTUATION/FLICKER MEASUREMENT
Port : AC mains
Basic Standard : EN 61000-3-3 : 1995+A1:2001
Limits : §5 of EN 61000-3-3
Temperature : 25oC
Humidity : 55%
Block Diagram of Test Setup:
Result:
Please see the attached test data
Harmonics & Flicker
Analyzer
+
Power Source
EUT
Support Units
Power cord
0.8m
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 22
Rev. 00
Harmonics – Class-A per A-14(Run time)
EUT: USB2.0 IDE/SATA ADAPTER Tested by: Veason
Test category: Class-A per A-14 (European limits) Test Margin: 100
Test date: 06-7-27 Start time: 15:43:25 End time: 15:46:07
Test duration (min): 2.5 Data file name: H-002430.cts_data
Comment: Y-103
Customer: TECH-TOP TECHNOLOGY LIMITED
Test Result: Pass Source qualification: Normal
Current & voltage waveforms
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
-300
-200
-100
0
100
200
300
Current (Amps)
Voltage (Volts)
Harmonics and Class A limit line European Limits
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
Current RMS(Amps)
Harmonic #
4 8 12 16 20 24 28 32 36 40
Test result: Pass Worst harmonic was #19 with 6.90 % of the limit.
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 23
Rev. 00
Current Test Result Summary (Run time)
EUT: USB2.0 IDE/SATA ADAPTER Tested by: Veason
Test category: Class-A per A-14 (European limits) Test Margin: 100
Test date: 06-7-27 Start time: 15:43:25 End time: 15:46:07
Test duration (min): 2.5 Data file name: H-002430.cts_data
Comment: Y-103
Customer: TECH-TOP TECHNOLOGY LIMITED
Test Result: Pass Source qualification: Normal
Highest parameter values during test:
V_RMS (Volts): 230.22
I_Peak (Amps): 0.350 I_RMS (Amps): 0.065
I_Fund (Amps): 0.032 Crest Factor: 5.435
Power (Watts): 5 Power Factor: 0.345
Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status
2 0.001 1.080 0.1 0.002 1.620 0.13 Pass
3 0.020 2.300 0.9 0.021 3.450 0.62 Pass
4 0.001 0.430 0.3 0.002 0.645 0.37 Pass
5 0.019 1.140 1.7 0.020 1.710 1.16 Pass
6 0.001 0.300 0.3 0.002 0.450 0.41 Pass
7 0.019 0.770 2.4 0.019 1.155 1.66 Pass
8 0.001 0.230 0.5 0.002 0.345 0.53 Pass
9 0.018 0.400 4.5 0.018 0.600 3.04 Pass
10 0.001 0.184 0.6 0.002 0.276 0.66 Pass
11 0.017 0.330 5.2 0.017 0.495 3.50 Pass
12 0.001 0.153 0.6 0.002 0.230 0.72 Pass
13 0.016 0.210 7.6 0.016 0.315 5.14 Pass
14 0.001 0.131 0.7 0.002 0.197 0.80 Pass
15 0.015 0.150 9.9 0.015 0.225 6.66 Pass
16 0.001 0.115 0.8 0.001 0.173 0.86 Pass
17 0.014 0.132 10.2 0.014 0.199 6.87 Pass
18 0.001 0.102 0.8 0.001 0.153 0.88 Pass
19 0.012 0.118 10.3 0.012 0.178 6.90 Pass
20 0.001 0.092 0.8 0.001 0.138 0.90 Pass
21 0.011 0.107 10.0 0.011 0.161 6.77 Pass
22 0.001 0.084 0.8 0.001 0.125 0.90 Pass
23 0.009 0.098 9.6 0.009 0.147 6.46 Pass
24 0.001 0.077 0.8 0.001 0.115 0.87 Pass
25 0.008 0.090 8.9 0.008 0.135 5.99 Pass
26 0.000 0.071 0.8 0.001 0.106 0.84 Pass
27 0.007 0.083 8.0 0.007 0.125 5.41 Pass
28 0.000 0.066 0.7 0.001 0.099 0.76 Pass
29 0.005 0.078 6.9 0.005 0.116 4.72 Pass
30 0.000 0.061 0.7 0.001 0.092 0.74 Pass
31 0.004 0.073 5.8 0.004 0.109 3.94 Pass
32 0.000 0.058 0.6 0.001 0.086 0.65 Pass
33 0.003 0.068 4.6 0.003 0.102 3.15 Pass
34 0.000 0.054 0.5 0.000 0.081 0.61 Pass
35 0.002 0.064 3.5 0.002 0.096 2.37 Pass
36 0.000 0.051 0.4 0.000 0.077 0.53 Pass
37 0.001 0.061 2.3 0.001 0.091 1.61 Pass
38 0.000 0.048 0.4 0.000 0.073 0.50 Pass
39 0.001 0.058 1.5 0.001 0.087 1.03 Pass
40 0.000 0.046 0.4 0.000 0.069 0.46 Pass
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 24
Rev. 00
Voltage Source Verification Data (Run time)
EUT: USB2.0 IDE/SATA ADAPTER Tested by: Veason
Test category: Class-A per A-14 (European limits) Test Margin: 100
Test date: 06-7-27 Start time: 15:43:25 End time: 15:46:07
Test duration (min): 2.5 Data file name: H-002430.cts_data
Comment: Y-103
Customer: TECH-TOP TECHNOLOGY LIMITED
Test Result: Pass Source qualification: Normal
Highest parameter values during test:
Voltage (Vrms): 230.22
I_Peak (Amps): 0.350 I_RMS (Amps): 0.065
I_Fund (Amps): 0.032 Crest Factor: 5.435
Power (Watts): 5 Power Factor: 0.345
Harm# Harmonics V-rms Limit V-rms % of Limit Status
2 0.184 0.460 39.93 OK
3 0.481 2.072 23.21 OK
4 0.093 0.460 20.26 OK
5 0.043 0.921 4.66 OK
6 0.046 0.460 9.90 OK
7 0.030 0.690 4.40 OK
8 0.031 0.460 6.63 OK
9 0.012 0.460 2.55 OK
10 0.029 0.460 6.27 OK
11 0.021 0.230 9.30 OK
12 0.019 0.230 8.41 OK
13 0.017 0.230 7.47 OK
14 0.010 0.230 4.42 OK
15 0.015 0.230 6.63 OK
16 0.016 0.230 7.10 OK
17 0.021 0.230 9.27 OK
18 0.017 0.230 7.58 OK
19 0.016 0.230 6.74 OK
20 0.012 0.230 5.28 OK
21 0.016 0.230 6.96 OK
22 0.010 0.230 4.36 OK
23 0.015 0.230 6.60 OK
24 0.008 0.230 3.56 OK
25 0.012 0.230 5.33 OK
26 0.012 0.230 5.30 OK
27 0.012 0.230 5.38 OK
28 0.011 0.230 4.64 OK
29 0.007 0.230 3.14 OK
30 0.010 0.230 4.47 OK
31 0.009 0.230 3.87 OK
32 0.007 0.230 3.06 OK
33 0.008 0.230 3.50 OK
34 0.006 0.230 2.53 OK
35 0.007 0.230 2.91 OK
36 0.004 0.230 1.78 OK
37 0.002 0.230 0.90 OK
38 0.004 0.230 1.67 OK
39 0.006 0.230 2.45 OK
40 0.005 0.230 2.05 OK
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 25
Rev. 00
Flicker Test Summary (Run time)
EUT: USB2.0 IDE/SATA ADAPTER Tested by: Veason
Test category: All parameters (European limits) Test Margin: 100
Test date: 06-7-27 Start time: 15:48:35 End time: 15:58:48
Test duration (min): 10 Data file name: F-002431.cts_data
Comment: Y-103
Customer: TECH-TOP TECHNOLOGY LIMITED
Test Result: Pass Status: Test Completed
Psti and limit line European Limits
0.00
0.25
0.50
0.75
1.00
Pst
15:58:47
Time is too short for Plt plot
Parameter values recorded during the test:
Vrms at the end of test (Volt): 230.16
Highest dt (%): 0.00 Test limit (%): 3.30 Pass
Highest dc (%): 0.00 Test limit (%): 3.30 Pass
Highest dmax (%): 0.00 Test limit (%): 4.00 Pass
Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass
Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 26
Rev. 00
SECTION 3 IEC 61000-4-2 (ELECTROSTATIC DISCHARGE)
ELECTROSTATIC DISCHARGE (ESD) IMMUNITY TEST
Port : Enclosure
Basic Standard : IEC 61000-4-2: 2001
Test Level : ± 8 kV (Air Discharge)
± 4 kV (Contact Discharge)
Performance Criteria : B ( Standard require )
Temperature/Humidity : 25oC/55%
Block Diagram of Test Setup:
( The 470 k
ohm
resistors
are installed per standard requirement )
Ground Reference Plane
Wooden Table
Support units
EUT
&
Su
pp
ort Units
VCP
HCP
>1m
0.8m
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 27
Rev. 00
Test Procedure:
1. The EUT was located 0.1 m minimum from all side of the HCP.
2. The support units were located 1 m minimum away from the EUT.
3. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from
PC to hard disk in windows XP; Make sure EUT work normally during the test.
4. Active the communication function if the EUT with such port(s).
5. As per the requirement of EN 55024; applying direct contact discharge at the sides other than front of
EUT at minimum 50 discharges (25 positive and 25 negative) if applicable, can’t be applied direct
contact discharge side of EUT then the indirect discharge shall be applied. One of the test points shall be
subjected to at least 50 indirect discharge (contact) to the front edge of horizontal coupling plane.
6. Other parts of EUT where it is not possible to perform contact discharge then selecting appropriate points
of EUT for air discharge, a minimum of 10 single air discharges shall be applied.
7. The application of ESD to the contact of open connectors is not required.
8. Putting a mark on EUT to show tested points. The following test condition was followed during the tests.
Note: As per the A2 to IEC 61000-4-2, a bleed resistor cable is connected between the EUT and HCP
during the test.
The electrostatic discharges were applied as follows:
Amount of
Discharges Voltage Coupling Result (Pass/Fail)
Mini 25 /Point ±2kV; ±4kV Contact Discharge No discharge point
Mini 25 /Point ±2kV; ±4kV Indirect Discharge HCP (Front) Pass
Mini 25 /Point ±2kV; ±4kV Indirect Discharge VCP (Left) Pass
Mini 25 /Point ±2kV; ±4kV Indirect Discharge VCP (Back) Pass
Mini 25 /Point ±2kV; ±4kV Indirect Discharge VCP (Right) Pass
Mini 10 /Point ±2kV; ±4kV; ±8kV Air Discharge No discharge point
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 28
Rev. 00
Performance & Result:
V Criterion A: The apparatus continues to operate as intended. No degradation of performance or
loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may be
replaced by a permissible loss of performance.
Criterion B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the performance
level may be replaced by a permissible loss of performance. During the test,
degradation of performance is however allowed.
Criterion C: Temporary loss of function is allowed, provided the functions self-recoverable or can
be restored by the operation of controls.
V PASS FAILED
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 29
Rev. 00
SECTION 4 IEC 61000-4-3 (RADIATED ELECTROMAGNETIC FIELD )
RADIATED ELECTROMAGNETIC FIELD IMMUNITY TEST
Port : Enclosure
Basic Standard : IEC 61000-4-3:2002
Requirements : 3 V/m with 80% AM. 1kHz Modulation.
Performance Criteria : A ( Standard require )
Temperature : 25oC
Humidity : 55%
Block Diagram of Test Setup:
3 meter
1.5 meter
Power Amp Signal
Generator
EUT Monitoring by
using a camera
0.8m
Control Room
7X4X3 Chamber
EUT &
Support Units
PC Controller to control
S.G. & PA as well as
forward power
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 30
Rev. 00
Test Procedure:
1. The EUT was located at the edge of supporting table keep 3 meter away from transmitting antenna, it
just the calibrated square area of field uniformity. The support units were located outside of the
uniformity area, but the cable(s) connected with EUT were exposed to the calibrated field as per IEC
61000-4-3.
2. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from
PC to hard disk in windows XP; Make sure EUT work normally during the test.
3. Setting the testing parameters of RS test software per IEC 61000-4-3.
4. Performing the pre-test at each side of with double specified level (3V/m) at 1% steps.
5. From the result of pre-test in step 5, choose the worst side of EUT for final test from 80 MHz to 1000
MHz at 1% steps.
6. Recording the test result in following table.
7. It is not necessary to perform test as per annex A of EN 55024 if the EUT doesn’t belong to TTE product.
IEC 61000-4-3 test conditions:
Test level : 3V/m
Steps : 1 % of fundamental
Dwell Time : 1 sec
Range (MHz) Field Modulation Polarity Position (°) Result (Pass/Fail)
80-1000 3V/m Yes H Front Pass
80-1000 3V/m Yes V Front Pass
80-1000 3V/m Yes H Right Pass
80-1000 3V/m Yes V Right Pass
80-1000 3V/m Yes H Back Pass
80-1000 3V/m Yes V Back Pass
80-1000 3V/m Yes H Left Pass
80-1000 3V/m Yes V Left Pass
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 31
Rev. 00
Performance & Result:
V Criterion A: The apparatus continues to operate as intended. No degradation of performance or
loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may be
replaced by a permissible loss of performance.
Criterion B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the performance
level may be replaced by a permissible loss of performance. During the test,
degradation of performance is however allowed.
Criterion C: Temporary loss of function is allowed, provided the functions self-recoverable or can
be restored by the operation of controls.
V PASS FAILED
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 32
Rev. 00
SECTION 5 IEC 61000-4-4 (FAST TRANSIENTS/BURST)
FAST TRANSIENTS/BURST IMMUNITY TEST
Port : On Power Supply Lines
Basic Standard : IEC 61000-4-4: 2001
Requirements :+/-1KV for Power Supply Lines
Performance Criteria : B ( Standard require )
Temperature : 25oC
Humidity : 55%
Block Diagram of Test Setup:
Controller Computer
EFT/Burst/Surge
Generator
EUT
Support Units
AC
80cm Non-Conductive Table
Line
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 33
Rev. 00
Test Procedure:
1. The EUT and support units were located on a wooden table 0.8 m away from ground reference plane.
2. A 1.0 meter long power cord was attached to EUT during the test.
3. The length of communication cable between communication port and clamp was keeping within 1 meter.
4. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from
PC to hard disk in windows XP; Make sure EUT work normally during the test.
5 .Related peripherals work during the test.
6. Recording the test result as shown in following table.
Test conditions:
Impulse Frequency: 5kHz
Tr/Th: 5/50ns
Burst Duration: 15ms
Burst Period: 300ms
Inject Line Voltage kV Inject Method Result (Pass/Fail)
L +/- 1 Direct Pass
N +/- 1 Direct Pass
L+N +/- 1 Direct Pass
Performance & Result:
V Criterion A: The apparatus continues to operate as intended. No degradation of performance or
loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may be
replaced by a permissible loss of performance.
Criterion B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the
performance level may be replaced by a permissible loss of performance. During the
test, degradation of performance is however allowed.
Criterion C: Temporary loss of function is allowed, provided the functions self recoverable or can
be restored by the operation of controls.
V PASS FAILED
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 34
Rev. 00
SECTION 6 IEC 61000-4-5 ( SURGE IMMUNITY )
SURGE IMMUNITY TEST
Port : On Power Supply Lines
Basic Standard : IEC 61000-4-5: 2001
Requirements : +/- 1kV (Line to Line)
: +/- 2kV (Line to Ground)
Performance Criteria :B ( Standard require )
Temperature : 25oC
Humidity : 55%
Block Diagram of Test Setup:
Surge Immunity
Test
Controller Computer
EUT
&
Support Units
80 cm
To AC
Source
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 35
Rev. 00
Test Procedure:
1. The EUT and support units were located on a wooden table 0.8 m away from ground floor.
2. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data
from PC to hard disk in windows XP; Make sure EUT work normally during the test.
3. Recording the test result as shown in following table.
Test conditions:
Voltage Waveform : 1.2/50 us
Current Waveform : 8/20 us
Polarity : Positive/Negative
Phase angle : 0o, 90o, 270o
Number of Test : 5
Coupling Line Voltage (kV) Polarity Coupling Method Result (Pass/Fail)
L1-L2 1 Positive Capacitive Pass
L1-L2 1 Negative Capacitive Pass
Performance & Result:
V Criterion A: The apparatus continues to operate as intended. No degradation of performance or
loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may be
replaced by a permissible loss of performance.
Criterion B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the
performance level may be replaced by a permissible loss of performance. During the
test, degradation of performance is however allowed.
Criterion C: Temporary loss of function is allowed, provided the functions self recoverable or can
be restored by the operation of controls.
V PASS FAILED
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 36
Rev. 00
SECTION 7 IEC 61000-4-6(CONDUCTED DISTURBANCE/INDUCED BY
RADIO-FREQUENCY FIELD)
Port : On Power Supply Lines
Basic Standard : IEC 61000-4-6: 2001
Requirements : 3V with 80% AM. 1kHz Modulation
Injection Method : CDN
Performance Criteria : A (Standard require)
Temperature : 25oC
Humidity : 55%
Block Diagram of Test Setup:
0.1m< L <0.3m
CDN
EUT and
Support units
Power
Amplifier
PC
Controller
10 cm isolation
supporter
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 37
Rev. 00
Test Procedure:
1. The EUT and support units were located at a ground reference plane with the interposition of a 0.1 m
thickness insulating support and the CDN was located on GRP directly.
2. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data
from PC to hard disk in windows XP; Make sure EUT work normally during the test.
3. Related peripherals work during the test.
4. Setting the testing parameters of CS test software per IEC 61000-4-6.
5. Recording the test result in following table.
Test conditions:
Frequency Range : 0.15MHz-80MHz
Frequency Step : 1% of fundamental
Dwell Time : 1 sec
Range (MHz) Field Modulation Result (Pass/Fail)
0.15-80 3V Yes Pass
Performance & Result:
V Criterion A: The apparatus continues to operate as intended. No degradation of performance or loss
of function is allowed below a performance level specified by the manufacturer, when
the apparatus is used as intended. In some cases the performance level may be replaced
by a permissible loss of performance.
Criterion B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the performance
level may be replaced by a permissible loss of performance. During the test,
degradation of performance is however allowed.
Criterion C: Temporary loss of function is allowed, provided the functions self-recoverable or can be
restored by the operation of controls.
V PASS FAILED
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 38
Rev. 00
SECTION 8 IEC 61000-4-11 (VOLTAGE DIPS, SHORT INTERRUPTIONS
AND VOLTAGE VARIATIONS )
VOLTAGE DIPS / SHORT INTERRUPTIONS
Port : On Power Supply Lines
Basic Standard : IEC 61000-4-11: 2001
Requirement : PHASE ANGLE 0, 45, 90, 135, 180, 225, 270, 315 degrees
Test Level
% UT Reduction
(%) Duration
( periods ) Performance
Criteria
<5 >95 0.5 B
Voltage
Dips 70 30 25 C
Test Level
% UT Reduction
(%) Duration
( periods ) Performance
Criteria
Voltage
Interceptions <5 >95 250 C
Test Interval : Min. 10 sec.
Temperature : 25oC
Humidity : 55%
Block Diagram of Test Setup:
Dips/Interruption and
Variations Simulator
Controller Computer
EUT
&
Support Units
80 cm
To AC
Source
Compliance Certification Services(ShenZhen) Inc.
Report No.: SZ060424B02-ET Date of Issue: August 01, 2006
Page 39
Rev. 00
Test Procedure:
1. The EUT and support units were located on a wooden table, 0.8 m away from ground floor.
2. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data
from PC to hard disk in windows XP; Make sure EUT work normally during the test.
3. Setting the parameter of tests and then Perform the test software of test simulator.
4. Conditions changes to occur at 0 degree crossover point of the voltage waveform.
5. Recording the test result in test record form.
Test conditions:
The duration with a sequence of three dips/interruptions with interval of 10 s minimum
( Between each test event )
Voltage Dips:
Test Level
% UT Reduction
(%) Duration
( periods) Observation Meet Performance
Criteria
0 100 0.5
EUT shut down, but can
recover by itself B
70 30 25
EUT shut down, but can
recover by itself B
Voltage Interruptions:
Test Level
% UT Reduction
(%) Duration
( periods) Observation Meet Performance
Criteria
0 100 250
EUT shut down, but can
recover by itself B
Performance & Result:
Criterion A: The apparatus continues to operate as intended. No degradation of performance or loss of
function is allowed below a performance level specified by the manufacturer, when the
apparatus is used as intended. In some cases the performance level may be replaced by a
permissible loss of performance.
Criterion B: The apparatus continues to operate as intended after the test. No degradation of performance
or loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may be
replaced by a permissible loss of performance. During the test, degradation of performance
is however allowed.
Criterion C: Temporary loss of function is allowed, provided the functions self recoverable or can be
restored by the operation of controls.
V PASS FAILED

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