Intel Agilex™ Device Data Sheet

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Intel Agilex™ Device Data Sheet

The Intel Agilex device data sheet covers the electrical characteristics, switching characteristics, configuration specifications, and timing specifications for Intel Agilex devices.

specifications, electrical, switching, configuration, I/O timing, data sheet, Intel Agilex

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Intel� AgilexTM Device Data Sheet

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DS-1060 | 2021.10.26 Latest document on the web: PDF | HTML

Contents
Contents
Intel� AgilexTM Device Data Sheet............................................................................................................................................... 3 Electrical Characteristics...................................................................................................................................................... 5 Operating Conditions.................................................................................................................................................. 5 Switching Characteristics....................................................................................................................................................27 Core Performance Specifications.................................................................................................................................28 Periphery Performance Specifications.......................................................................................................................... 38 E-Tile Transceiver Performance Specifications...............................................................................................................46 P-Tile Transceiver Performance Specifications............................................................................................................... 50 R-Tile Transceiver Performance Specifications...............................................................................................................55 F-Tile Transceiver Performance Specifications............................................................................................................... 62 HPS Performance Specifications................................................................................................................................. 77 Configuration Specifications.............................................................................................................................................. 112 General Configuration Timing Specifications............................................................................................................... 112 POR Specifications..................................................................................................................................................113 External Configuration Clock Source Requirements......................................................................................................114 JTAG Configuration Timing.......................................................................................................................................114 AS Configuration Timing.......................................................................................................................................... 116 Avalon Streaming (Avalon-ST) Configuration Timing....................................................................................................118 Configuration Bit Stream Sizes................................................................................................................................. 120 I/O Timing......................................................................................................................................................................120 Programmable IOE Delay..................................................................................................................................................121 Glossary.........................................................................................................................................................................121 Document Revision History for the Intel Agilex Device Data Sheet..........................................................................................125

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Intel� AgilexTM Device Data Sheet

This data sheet describes the electrical characteristics, switching characteristics, configuration specifications, and timing for Intel� AgilexTM devices.

Until the data sheet status for a device reaches Final, the specifications are subject to change at any time and at Intel's discretion.

Table 1.

Data Sheet Status for Intel Agilex Devices (F-Series)

Device

AGF 012/014

E-Tile & P-Tile

AGF 012/014

E-Tile & P-Tile

AGF 022/027

E-Tile & P-Tile

AGF 019/023

E-Tile & P-Tile

AGF 006/008

F-Tile

AGF 006/008/012/014/019/022/023/027 F-Tile

AGF 019/022/023/027

F-Tile

Tile

R24A R24B R25A R25A R16A R24C R31C

Package

Final Final Final Preliminary Advance Advance Advance

Status

Table 2.

Data Sheet Status for Intel Agilex Devices (I-Series)

Device

Tile

AGI 019/023

R-Tile & F-Tile

R18A

AGI 022/027

R-Tile & F-Tile

R29A

AGI 022/027

R-Tile & F-Tile

R31A

AGI 019/022/023/027

F-Tile

R31B

Package

Advance Advance Advance Advance

Status

Intel Corporation. All rights reserved. Intel, the Intel logo, and other Intel marks are trademarks of Intel Corporation or its subsidiaries. Intel warrants performance of its FPGA and semiconductor products to current specifications in accordance with Intel's standard warranty, but reserves the right to make changes to any products and services at any time without notice. Intel assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by Intel. Intel customers are advised to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. *Other names and brands may be claimed as the property of others.

ISO 9001:2015 Registered

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

The following descriptors designate the status level currently applicable to the relevant variant: � Advance: These are target specifications based on simulation. � Preliminary: These specifications are based on simulation, early validation, and/or early characterization data. � Final: These are production specifications based on silicon validation and/or characterization.

Table 3.

Intel Agilex Device Grades, Core Speed Grades, and Power Options Supported
For specification status, see the Data Sheet Status table

Device Grade

Speed Grade and Power Option Supported

Extended

�E1V (fastest)

�E2V

�E3V

�E3E

�E4X

�E4F

Industrial

�I1V

�I2V

�I3V

�I3E

The suffix after the speed grade denotes the power options offered in Intel Agilex devices. � V--standard power (VID) � E--lower power (VID) � X--lowest power (VID) � F--fixed voltage
Related Information Package and Thermal Resistance website

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Electrical Characteristics
The following sections describe the operating conditions and power consumption of Intel Agilex devices.

Operating Conditions
Intel Agilex devices are rated according to a set of defined parameters. To maintain the highest possible performance and reliability of the Intel Agilex devices, you must consider the operating requirements described in this section.

Absolute Maximum Ratings

This section defines the maximum operating conditions for Intel Agilex devices. The values are based on experiments conducted with the devices and theoretical modeling of breakdown and damage mechanisms. The functional operation of the device is not implied for these conditions.

Caution:

Conditions outside the range listed in the following table may cause permanent damage to the device. Additionally, device operation at the absolute maximum ratings for extended periods of time may have adverse effects on the device.

Table 4.

Absolute Maximum Rating for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Condition

VCC VCCP

Core voltage power supply --
Periphery circuitry power -- supply

VCCPT

Power supply for I/O PLL -- and I/O pre-driver

VCCR_CORE VCCH

CRAM power supply
Transceiver digital power supply

-- E-tile and P-tile devices

VCCH_SDM

SDM block transceiver digital power sense

E-tile and P-tile devices

VCCIO_PIO_SDM

SDM block I/O bank power -- sense of bank 3A

Minimum �0.5 �0.5
�0.5
�0.5 �0.5
�0.5
�0.5

Maximum 1.14 1.14
2.08
1.64 1.21
1.21
2.01

Unit V V
V
V V
V
V continued...

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Intel� AgilexTM Device Data Sheet 5

Symbol VCCIO_SDM VCCL_SDM VCCFUSEWR_SDM VCCPLLDIG_SDM VCCPLL_SDM VCCBAT
VCCADC VCCIO_PIO VCCA_PLL VCCRT_GXE VCC_HSSI_GXE VCCRTPLL_GXE VCCH_GXE VCCCLK_GXE VCCRT_GXP VCC_HSSI_GXP VCCFUSE_GXP

Description

Condition

SDM block configuration

--

pins power supply

SDM block core voltage

--

power supply

SDM block fuse writing

--

power supply

SDM block PLL digital

--

power supply

SDM block PLL analog

--

power supply

Battery back-up power

--

supply (For design security

volatile key register)

ADC voltage sensor power -- supply

I/O bank power supply

--

I/O clock network power -- supply

Transceiver power supply E-tile devices

E-tile digital signal power supply

E-tile devices

Transceiver PLL power supply

E-tile devices

Analog power supply

E-tile devices

LVPECL REFCLK power supply

E-tile devices

Transceiver power supply P-tile devices

P-tile digital signal power supply

P-tile devices

P-tile efuse power supply P-tile devices

Intel� AgilexTM Device Data Sheet 6

Minimum �0.5 �0.5 �0.5 �0.5 �0.5 �0.5
�0.5 �0.5 �0.5 �0.5 �0.5 �0.5 �0.5 �0.5 �0.5 �0.5 �0.5

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Maximum 2.08 1.07 2.4 1.07 2.08 2.08
2.08 2.01 1.64 1.21 1.21 1.21 1.47 3.41 1.21 1.21 1.21

Unit V V V V V V
V V V V V V V V V V V continued...

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Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Symbol VCCCLK_GXP VCCH_GXP VCCEHT_GXR VCCERT_GXR VCCED_GXR VCCE_PLL_GXR VCCE_DTS_GXR VCCCLK_GXR VCCHFUSE_GXR VCC_HSSI_GXR VCCERT1_FHT_GXF VCCERT2_FHT_GXF VCCEHT_FHT_GXF VCCERT_FGT_GXF VCCH_FGT_GXF VCCERT_GXF_COMBINE VCCL_HPS
VCCPLLDIG_HPS

Description

Condition

P-tile I/O buffer power supply

P-tile devices

High voltage power for transceiver

P-tile devices

Transceiver analog high voltage power

R-tile devices

Transceiver analog power supply

R-tile devices

Transceiver digital power supply

R-tile devices

PLLs power supply

R-tile devices

DTS power supply

R-tile devices

Reference clock power supply

R-tile devices

R-tile efuse power supply R-tile devices

Digital signal power supply R-tile devices

FHT analog core supply 1 F-tile devices

FHT analog core supply 2 F-tile devices

FHT high voltage power supply for analog circuit

F-tile devices

FGT analog core supply

F-tile devices

FGT analog I/O power supply

F-tile devices

Combined analog core supply

F-tile devices

HPS core voltage and

--

periphery circuitry power

supply

HPS PLL digital power

--

supply

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Minimum �0.5 �0.5 1.75 0.97 0.87 0.98 0.98 0.97 0.97 0.87 0.975 0.975 1.47 0.97 1.746 0.975 �0.5
�0.5

Maximum 2.46 2.46 1.85 1.03 0.93 1.02 1.02 1.03 1.03 0.93 1.33 1.33 1.99 1.34 2.41 1.33 1.21
1.21

Unit V V V V V V V V V V V V V V V V V
V continued...

Intel� AgilexTM Device Data Sheet 7

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Symbol VCCPLL_HPS VCCIO_HPS VI
IOUT (1) (2)

Description HPS PLL analog power supply HPS I/O buffers power supply DC input voltage
DC output current per pin

Condition --
--
VCCIO_PIO = 1.2 V VCCIO_PIO = 1.5 V VCCIO_SDM, VCCIO_HPS = 1.8 V VCCIO_PIO = 1.2 V, 1.5 V (3)

Minimum �0.5
�0.5
�0.3 0
�0.3
�15

Maximum 2.08
2.08
1.56 1.7 2.19
15

Unit V
V
V V V
mA

VCCIO_SDM, VCCIO_HPS = 1.8

�20

20

mA

V (4)

TJ

Absolute junction

--

temperature

�55

125

�C

TSTG

Storage temperature

--

�55

150

�C

Maximum Allowed Overshoot and Undershoot Voltage
During transitions, input signals may overshoot to the voltage listed in the following tables and undershoot to �1.1 V when using VCCIO_HPS/ VCCIO_SDM of 1.8 V and �0.3 V when using VCCIO_PIO of 1.2 V for input currents less than 100 mA and periods shorter than 20 ns.

(1) Total current per I/O bank must not exceed 100 mA.
(2) Applies to all I/O standards and settings supported by I/O banks, including single-ended and differential I/Os.
(3) The maximum current allowed through any GPIO bank pin when the device is not turned on or during power-up/power-down conditions is 10 mA. Pin voltage during these conditions should not exceed 1.2 V or the VCCIO_PIO supply rail of the bank where the I/O pin resides in, whichever is the lower voltage.
(4) The maximum current allowed through any HPS/SDM pin when the device is not turned on or during power-up/power-down conditions is 10 mA. Pin voltage during these conditions should not exceed VCCIO_HPS or VCCIO_SDM supply rail of the bank where the I/O pin resides in.

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Table 5.
Vi (AC)
Table 6.
Vi (AC)

No overshooting beyond 1.7 V and undershooting below 0 V is allowed when using VCCIO_PIO = 1.5 V.
The maximum allowed overshoot duration is specified as a percentage of high time (calculated as ([delta T]/T) � 100) over the lifetime of the device. A DC signal is equivalent to 100% duty cycle.

Maximum Allowed Overshoot During Transitions for Intel Agilex Devices (for 1.2 V I/O in GPIO Bank)

This table lists the maximum allowed input overshoot voltage and the duration of the overshoot voltage as a percentage of device lifetime.

For specification status, see the Data Sheet Status table

Symbol

Description

Condition (V)

AC input voltage

VCCIO_PIO + 0.30 VCCIO_PIO + 0.35 VCCIO_PIO + 0.40 VCCIO_PIO + 0.45 VCCIO_PIO + 0.50 > VCCIO_PIO + 0.50

Overshoot Duration as % at TJ = 100�C 100 37 9 3 1
No overshoot allowed

Unit
% % % % % %

Maximum Allowed Overshoot During Transitions for Intel Agilex Devices (for 1.8 V I/O in HPS and SDM I/O Banks)

This table lists the maximum allowed input overshoot voltage and the duration of the overshoot voltage as a percentage of device lifetime.

For specification status, see the Data Sheet Status table

Symbol

Description

Condition (V)

AC input voltage

VCCIO_SDM + 0.30, VCCIO_HPS + 0.30
VCCIO_SDM + 0.35, VCCIO_HPS + 0.35
VCCIO_SDM + 0.40, VCCIO_HPS + 0.40
VCCIO_SDM + 0.45, VCCIO_HPS + 0.45

Overshoot Duration as % at TJ = 100�C 100
60
30
20

Unit % % % % continued...

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Intel� AgilexTM Device Data Sheet 9

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Symbol

Description

Condition (V)
VCCIO_SDM + 0.50, VCCIO_HPS + 0.50
VCCIO_SDM + 0.55, VCCIO_HPS + 0.55
>VCCIO_SDM + 0.55, >VCCIO_HPS + 0.55

Overshoot Duration as % at TJ = 100�C 10
6
No overshoot allowed

Unit % % %

Figure 1.

For example, when using 1.2 V I/O standard with 1.26 V VCCIO_PIO, a signal that overshoots to 1.71 V can only be at 1.71 V for ~3% over the lifetime of the device. For an overshoot of 1.56 V, the percentage of high time for the overshoot can be as high as 100% over the lifetime of the device.
Intel Agilex Devices Overshoot Duration Example (for 1.2 V GPIO Bank at VCCIO_PIO = 1.26 V)

1.76 V 1.56 V 1.2 V

DT T
Recommended Operating Conditions This section lists the functional operation limits for the AC and DC parameters for Intel Agilex devices.

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Recommended Operating Conditions

Table 7.

Recommended Operating Conditions for Intel Agilex Devices

This table lists the steady-state voltage values expected for Intel Agilex devices. Power supply ramps must all be strictly monotonic, without plateaus.

For specification status, see the Data Sheet Status table

Symbol VCC

Description
Core voltage power supply

Condition
SmartVID(6) : �1V, � 2V, �3V, �3E, �4X

VCCP

Periphery circuitry power supply

Fixed voltage: �4F
SmartVID(6): �1V, � 2V, �3V, �3E, �4X

Fixed voltage: �4F

VCCPT

Power supply for I/O -- PLL and I/O pre-driver

VCCR_CORE VCCH

CRAM power supply
Advanced interface bus (AIB) power supply

--
E-tile and P-tile devices
R-tile and F-tile devices

VCCH_SDM VCCIO_PIO_SDM (8)

SDM block transceiver -- digital power sense

SDM block I/O bank power sense of Bank 3A

1.5 V

Minimum(5) (Typical) � 3%
0.776 (Typical) � 3%
0.776 1.71 1.14 0.87 0.776 0.87 1.455

Typical 0.70 � 0.90(7)
0.8 0.70 � 0.90(7)
0.8 1.8
1.2 0.9
0.8
0.9
1.5

Maximum(5) (Typical) + 3%
0.824 (Typical) + 3%
0.824 1.89 1.26 0.93 0.824 0.93 1.545

Unit V V V V V V V V V V
continued...

(5) This value describes the required voltage measured between the PCB power and ground ball during normal device operation. The voltage ripple includes both regulator DC ripple and the dynamic noise.
(6) The use of Power Management Bus (PMBus*) voltage regulator dedicated to Intel Agilex SmartVID devices is mandatory. The PMBus voltage regulator and Intel Agilex SmartVID devices are connected via PMBus.
(7) The typical value is based on the SmartVID programmed value.

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Intel� AgilexTM Device Data Sheet 11

Symbol
VCCIO_SDM VCCL_SDM VCCFUSEWR_SDM VCCPLLDIG_SDM VCCPLL_SDM VCCBAT (9)
IBAT (10)
VCCADC

Description

Condition 1.2 V

SDM block

--

configuration pins

power supply

SDM block core

--

voltage power supply

SDM block fuse writing -- power supply

SDM block PLL digital -- power supply

SDM block PLL analog -- power supply

Battery back-up power -- supply (For design security volatile key register)

Battery back-up power supply (For design security volatile key register)

VCCBAT = 1.2 V

ADC voltage sensor

--

power supply

Minimum(5) 1.14 1.71 0.776 1.75 0.776 1.71 1
--
1.71

Typical 1.2 1.8 0.8 1.8 0.8 1.8 --
--
1.8

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Maximum(5) 1.26 1.89
0.824 1.85 0.824 1.89 1.8

Unit V V
V V V V V

200

nA

1.89

V continued...

(5) This value describes the required voltage measured between the PCB power and ground ball during normal device operation. The voltage ripple includes both regulator DC ripple and the dynamic noise.
(8) Must be powered up with the same voltage level as VCCIO_PIO_3A. Must be supplied at 1.2 V when using Avalon�-ST �16/�32 configuration schemes.
(9) You need to always power up VCCBAT. If you do not use the design security feature in Intel Agilex devices, connect VCCBAT to a 1.8 V power supply.
(10) At 25 �C. This supply current specification does not apply to �E4F speed grade and power option device.

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Symbol VCCIO_PIO VCCA_PLL VI (11)
VO
TJ tRAMP (13) (14)

Description

Condition

I/O bank power supply 1.5 V

1.2 V

I/O clock network

--

power supply

DC input voltage Output voltage

VCCIO_PIO = 1.2 V VCCIO_PIO = 1.5 V VCCIO_SDM = 1.8 V VCCIO_HPS = 1.8 V VCCIO_PIO = 1.2 V, 1.5 V

Operating junction temperature

VCCIO_SDM = 1.8 V VCCIO_HPS = 1.8 V Extended Industrial

Power supply ramp time

Standard POR

Minimum(5) 1.455 1.14 1.14
�0.3 0
�0.3 �0.3
0
0 0 0 �40(12) 200 s

Typical 1.5 1.2 1.2
-- -- -- -- --
-- -- -- -- --

Maximum(5) 1.545 1.26 1.26
VCCIO_PIO + 0.3 1.7
VCCIO_SDM + 0.3 VCCIO_HPS + 0.3
VCCIO_PIO
VCCIO_SDM VCCIO_HPS
100 100 100 ms

Unit V V V
V V V V V
V V �C �C --

(5) This value describes the required voltage measured between the PCB power and ground ball during normal device operation. The voltage ripple includes both regulator DC ripple and the dynamic noise.
(11) This value applies to both input and tri-stated output configuration. Pin voltage should not be externally pulled higher than the maximum value.
(12) E-tile supports an operating temperature range of �40�C to 100�C. However, the E-tile transceivers may experience a higher error rate from �40�C to �20�C because of the calibration procedure when starting at a low temperature. Therefore, the recommended operating temperature range for E-tile protocol-compliant transceiver links is �20�C to 100�C. The maximum temperature ramp rate is 2�C per minute.
(13) tRAMP is the ramp time of each individual power supply, not the ramp time of all combined power supplies.
(14) To support AS fast mode, all power supplies to the Intel Agilex device must be fully ramped-up within 10 ms to the recommended operating conditions.

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Transceiver Power Supply Operating Conditions

Table 8.

E-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol VCCRT_GXE (15)

Description
Transceiver power supply

Typical DC Level (V)
0.9

Recommended DC Setpoint (% of Vnominal)

Recommended VR Ripple (% of Vnominal)

Recommended AC Transient (% of Vnominal)

Maximum (DC Setpoint + Ripple + AC Transient)
(% of Vnominal)

� 0.5%

� 2.5%

� 3%

VCC_HSSI_GXE

E-tile digital signal

0.9

power supply

VCCRTPLL_GXE (15)

Transceiver PLL

0.9

power supply

� 0.5% � 0.5%

� 2.5% � 2.5%

� 3% � 3%

VCCH_GXE

Analog power

1.1

� 0.5%

� 0.5%

� 2%

� 3%

supply

VCCCLK_GXE

LVPECL REFCLK

2.5

power supply

� 0.5%

� 0.5%

� 3.5%

� 5%

Unit
V V V V V

Table 9.

P-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices

The specifications below should be met at the board vias directly connected to the package power balls. Place the VR sense point in the FPGA pinfield (in the package shadow), as close as possible to the corresponding package power balls. For these rails, measure the output voltage at this remote sense location.

For specification status, see the Data Sheet Status table

Symbol VCCRT_GXP

Description
Transceiver power supply

Typical DC Level (V)
0.9

Recommended DC Setpoint (% of Vnominal)

Recommended VR Ripple (% of Vnominal)

Recommended AC Transient (% of Vnominal)

Maximum (DC Setpoint + Ripple + AC Transient)
(% of Vnominal)

� 0.5%

� 2.5%

� 3%

VCC_HSSI_GXP

P-tile digital signal

0.9

power supply

� 0.5%

� 2.5%

� 3%

Unit
V V continued...

(15) The difference between VCCRT/VCCRTPLL and VCCH should be no less than 200 mV.
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Symbol
VCCFUSE_GXP VCCCLK_GXP (16) VCCH_GXP (16)

Description
P-tile efuse power supply

Typical DC Level (V)
0.9

Recommended DC Recommended VR

Setpoint (% of

Ripple (% of

Vnominal)

Vnominal)

Recommended AC Transient (% of Vnominal)

Maximum (DC Setpoint + Ripple + AC Transient)
(% of Vnominal)

� 0.5%

� 2.5%

� 3%

P-tile I/O buffer

1.8

power supply

� 0.5%

� 0.5%

� 2%

� 3%

High voltage power

1.8

for transceiver

� 0.5%

� 0.5%

� 2%

� 3%

Table 10.

R-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol VCCH_GXR[L,R] (17)

Description
Transceiver analog high voltage power

Typical DC Level (V)

Recommended DC Recommended VR

Setpoint (% of

Ripple (% of

Vnominal)

Vnominal)

Recommended AC Transient (% of Vnominal)

Maximum (DC Setpoint + Ripple + AC Transient) (% of Vnominal)

1.8

�0.8%

�2%

�2.8%

VCCRT_GXR[L,R]

Transceiver analog

1

power supply

�0.5%

�2.5%

�3%

VCCED_GXR[L,R]

Transceiver digital

0.9

power supply

�0.8%

�2.5%

�3.3%

VCCE_PLL_GXR[L,R]

PLLs power supply

1

VCCE_DTS_GXR[L,R]

DTS power supply

1

VCCCLK_GXR[L,R] (17) Reference clock

1

power supply

�0.5% �0.5% �0.5%

�1.5% �1.5% �2.5%

�2% �2% �3%

VCCHFUSE_GXR

R-tile efuse power

1

supply

�0.5%

�2.5%

�3%

VCC_HSSI_GXR

Digital signal power

0.9

supply

�0.8%

�2.5%

�3.3%

(16) Follow the more stringent tolerance range for the voltage rails connecting multiple power supplies. (17) Follow the more stringent tolerance range for the voltage rails connecting multiple power supplies.

Unit
V V V
Unit
V V V V V V V V

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Table 11.

F-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Typical DC Level (V)

Recommended DC Recommended VR

Setpoint (% of

Ripple (% of

Vnominal)

Vnominal)

Recommended AC Transient (% of Vnominal)

Maximum (DC Setpoint + Ripple + AC Transient) (% of Vnominal)

VCC_HSSI_GXF

F-tile digital signal

0.8

power supply

�0.5%

�0.5%

�2.5%

�3%

VCCFUSECORE_GXF

F-tile fuse writing

1

power supply

�0.5%

�4.5%

�5%

VCCFUSEWR_GXF

F-tile efuse power

1

supply

�0.5%

�4.5%

�5%

VCCCLK_GXF

Reference clock

1.8

power supply

VCCERT1_FHT_GXF (18) FHT analog core

1

supply 1

VCCERT2_FHT_GXF (19) FHT analog core

1

supply 2

VCCEHT_FHT_GXF (20)

FHT high voltage

1.5

power supply for

analog circuit

VCCERT_FGT_GXF (21)

FGT analog core

1

supply alone

�0.5% �0.5% �0.5% �0.5%
�0.5%

�0.5% �0.5% �0.5% �0.5%
�0.5%

�2% �1.5% �1.5% +1%/�1.5%
�1.5%

�3% �2.5% �2.5% +2%/�2.5%
�3%

FGT analog core

1

supply when

combined with

�0.5%

�0.5%

�1.5%

�2.5%

Unit
V V V V V V V
V V continued...

(18) HF noise requires AC 10 mVpp above 1 MHz; switching regulator ripple switching frequency: <500 kHz, ripple: 5 mVpp. (19) HF noise requires AC 30 mVpp above 1 MHz; switching regulator ripple switching frequency: <500 kHz, ripple: 5 mVpp. (20) HF noise requires AC 30 mVpp above 1 MHz; switching regulator ripple switching frequency: <500 kHz, ripple: 7 mVpp. (21) HF noise requires AC 30 mVpp above 1 MHz; switching regulator ripple: 5mVpp.

Intel� AgilexTM Device Data Sheet 16

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Symbol VCCH_FGT_GXF (21)

Description
VCCERT1_FHT_GX and VCCERT2_FHT_GXF 1 V supply FGT analog I/O power supply

Typical DC Level (V)

Recommended DC Recommended VR

Setpoint (% of

Ripple (% of

Vnominal)

Vnominal)

Recommended AC Transient (% of Vnominal)

Maximum (DC Setpoint + Ripple + AC Transient) (% of Vnominal)

1.8

�0.5%

5 mV

�1.5%

�3%

Unit V

Related Information
AN 910: Intel Agilex Power Distribution Network Design Guidelines Provides the PCB design guidelines.

HPS Power Supply Operating Conditions

Table 12. HPS Power Supply Operating Conditions for Intel Agilex Devices

This table lists the steady-state voltage and current values expected for Intel Agilex system-on-a-chip (SoC) devices with ARM-based hard processor system (HPS). Power supply ramps must all be strictly monotonic, without plateaus. Refer to the Recommended Operating Conditions for Intel Agilex Devices table for the steady-state voltage values expected from the FPGA portion of the Intel Agilex SoC devices.

For specification status, see the Data Sheet Status table

Symbol VCCL_HPS
VCCPLLDIG_HPS

Description

Condition

HPS core voltage and periphery circuitry power supply

Performance boost, fixed voltage: �1V
SmartVID: �1V, �2V, � 3V, �3E (22)

Fixed voltage: �4F, � 4X

HPS PLL digital power supply (can be connected to VCCL_HPS)

Performance boost, fixed voltage: �1V

Minimum (Typical) � 3% (Typical) � 3%
0.776 (Typical) � 3%

Typical 0.95
0.70 � 0.90 0.8 0.95

Maximum (Typical) + 3% (Typical) + 3%
0.824 (Typical) + 3%

Unit V V V V
continued...

(22) The use of Power Management Bus (PMBus) voltage regulator dedicated to Intel Agilex SmartVID devices is mandatory. The PMBus voltage regulator and Intel Agilex SmartVID devices are connected via PMBus.

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Symbol
VCCPLL_HPS VCCIO_HPS

Description

Condition

SmartVID: �1V, �2V, � 3V, �3E (22)

Fixed voltage: �4F, � 4X

HPS PLL analog power 1.8 V supply

HPS I/O buffers power 1.8 V supply

Minimum (Typical) � 3%
0.776 1.71 1.71

Typical 0.70 � 0.90
0.8 1.8 1.8

Maximum (Typical) + 3%
0.824 1.89 1.89

Unit V V V V

Related Information
� Recommended Operating Conditions on page 11 Provides the steady-state voltage values for the FPGA portion of the device.
� HPS Clock Performance on page 78

DC Characteristics

Supply Current and Power Consumption
Intel offers two ways to estimate power for your design--the Intel FPGA Power and Thermal Calculator (PTC) and the Intel Quartus� Prime Power Analyzer feature.
Use the PTC before you start your design to estimate the supply current for your design. The PTC provides a magnitude estimate of the device power because these currents vary greatly with the usage of the resources.
The Intel Quartus Prime Power Analyzer provides better quality estimates based on the specifics of the design after you complete place-and-route. The Power Analyzer can apply a combination of user-entered, simulation-derived, and estimated signal activities that, when combined with detailed circuit models, yield very accurate power estimates.

Intel� AgilexTM Device Data Sheet 18

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I/O Pin Leakage Current

Table 13.

I/O Pin Leakage Current for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

Symbol

Description

Condition

Min

II

Input pin

VI = 0 V to VCCIO_PIO (MAX)

�360

IOZ

Tri-stated I/O pin

VO = 0 V to VCCIO_PIO (MAX)

�360

Max 360 360

Table 14.

I/O Pin Leakage Current for Intel Agilex Devices (for HPS and SDM I/O Banks)
For specification status, see the Data Sheet Status table

Symbol

Description

Condition

Min

Max

II

Input or tri-stated I/O pin VI, VO = 0 V

0.015

6

VI, VO = VCCIO_HPS (MAX),

0.01

1

VCCIO_SDM (MAX)

Bus Hold Specifications

The bus-hold trip points are based on calculated input voltages from the JEDEC* standard.

Table 15.

Bus Hold Parameters for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

Parameter

Symbol

Condition

Bus-hold, low, sustaining current
Bus-hold, high, sustaining current

ISUSL ISUSH

VIN > VIL (max) VIN < VIH (min)

Min 50
�50

VCCIO_PIO (V) 1.2

Max --
--

Unit �A �A
Unit �A �A
Unit
�A �A continued...

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Parameter

Symbol

Condition

Bus-hold, low, overdrive current
Bus-hold, high, overdrive current
Bus-hold trip point

IODL IODH VTRIP

0 V < VIN < VCCIO_PIO 0 V < VIN < VCCIO_PIO --

Min --

VCCIO_PIO (V) 1.2

Max 1,400

--

�1,400

0.33 � VCCIO_PIO

0.67 � VCCIO_PIO

Unit
�A �A V

OCT Calibration Accuracy Specifications

If you enable on-chip termination (OCT) calibration, calibration is automatically performed at power up for I/Os connected to the calibration block.

Table 16. OCT Calibration Accuracy Specifications for Intel Agilex Devices (for GPIO Bank)

Calibration accuracy for the calibrated on-chip series termination (RS OCT) and on-chip parallel termination (RT OCT) are applicable at the moment of calibration. When process, voltage, and temperature (PVT) conditions change after calibration, the tolerance may change.

These specifications require RZQ reference accuracy of 240  �1%.

For specification status, see the Data Sheet Status table

Symbol 34- and 40- RS
50- and 60- RT

Description

Condition (V)

Internal series termination with calibration (34- and 40- setting)

VCCIO_PIO = 1.2

Internal parallel termination with calibration (50- and 60- setting)

SSTL-12 and HSTL-12 I/O standards
POD12 I/O standard

Calibration Accuracy �20
�10 to +60 �15

Unit %
% %

Intel� AgilexTM Device Data Sheet 20

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OCT Without Calibration Resistance Tolerance Specifications

Table 17. OCT Without Calibration Resistance Tolerance Specifications for Intel Agilex Devices (for GPIO Bank)

This table lists the Intel Agilex GPIO OCT without calibration resistance tolerance to PVT changes.

For specification status, see the Data Sheet Status table

Symbol 34- and 40- RS
100- RD

Description
Internal series termination without calibration (34- and 40- setting)
Internal differential termination (100- setting)

Condition (V) VCCIO_PIO = 1.2
VCCIO_PIO = 1.5 VCCIO_PIO = 1.2

Calibration Accuracy �30 to +60
�40 �40

Unit %
% %

Pin Capacitance

Table 18.
CIO

Pin Capacitance for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

Symbol

Description

Input/output capacitance of I/O pins

Maximum 2.6(23)

Unit pF

Internal Weak Pull-Up Resistor

All I/O pins in GPIO bank have an option to enable weak pull-up when using 1.2 V LVCMOS I/O standard. For SDM and HPS, the configuration I/O and peripheral I/O are supported with weak pull-up and weak pull-down options.

Table 19.

Internal Weak Pull-Up Resistor Values for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

Symbol

Description

Condition (V)

Min

Typ

RPU

Value of the I/O pin

VCCIO_PIO = 1.2 �5%

0.5

2.5

pull-up resistor before

and during

configuration, as well

Max 15

Unit k

(23) This value refers to die-level pin capacitance without the device package.

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Symbol

Description
as user mode if you have enabled the programmable pull-up resistor option.

Condition (V)

Min

Typ

Max

Unit

Table 20.

Internal Weak Pull-Up and Weak Pull-Down Resistor Values for Intel Agilex Devices (for HPS and SDM I/O Banks)
For specification status, see the Data Sheet Status table

Symbol

Description

Condition (V)

Min

Typ

Max

Unit

20 k RPU, 20 k RPD Value of the I/O pin

VCCIO_SDM = 1.8 �5%,

15

20

25

k

pull-up and pull-down VCCIO_HPS = 1.8 �5%

resistor during user

mode if you have

enabled the

programmable pull-up

or pull-down resistor

option.

50 k RPU, 50 k RPD Value of the I/O pin

VCCIO_SDM = 1.8 �5%,

37.5

50

62.5

k

pull-up and pull-down VCCIO_HPS = 1.8 �5%

resistor during user

mode if you have

enabled the

programmable pull-up

or pull-down resistor

option.

80 k RPU, 80 k RPD Value of the I/O pin

VCCIO_SDM = 1.8 �5%,

60

pull-up and pull-down VCCIO_HPS = 1.8 �5%

resistor during user

mode if you have

enabled the

programmable pull-up

or pull-down resistor

option.

80

100

k

Related Information
Intel Agilex Device Family Pin Connection Guidelines Provides more information about the pins that support internal weak pull-up and internal weak pull-down features.

Intel� AgilexTM Device Data Sheet 22

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Hysteresis Specifications for Schmitt Trigger Input

Table 21. Hysteresis Specifications for Schmitt Trigger Input for Intel Agilex Devices (for HPS I/O Bank)

Intel Agilex devices support Schmitt trigger input on HPS I/O bank. A Schmitt trigger feature introduces hysteresis to the input signal for improved noise immunity, especially for signal with slow edge rate.

For specification status, see the Data Sheet Status table

Symbol VHYS

Description

Condition

Hysteresis for Schmitt VCCIO_HPS = 1.8 V trigger input

Min 180

Typ 250

Max 350

Unit mV

I/O Standard Specifications

Tables in this section list the input voltage (VIH and VIL), output voltage (VOH and VOL), and current drive characteristics (IOH and IOL) for various I/O standards supported by Intel Agilex devices.
For minimum voltage values, use the minimum VCCIO_PIO values. For maximum voltage values, use the maximum VCCIO_PIO values.
You must perform timing closure analysis to determine the maximum achievable frequency for general purpose I/O standards.

Related Information Recommended Operating Conditions on page 11

Single-Ended I/O Standards Specifications

Table 22.

Single-Ended I/O Standards Specifications for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

I/O Standard

Min

VCCIO_PIO (V) Typ

Max

Min

VIL (V)

Max

Min

VIH (V)

Max

1.2 V LVCMOS

1.14

1.2

1.26

�0.3

0.35 �

0.65 �

VCCIO_PIO + 0.3

VCCIO_PIO

VCCIO_PIO

VOL (V)(24)
Max
0.25 � VCCIO_PIO

VOH (V)(24)
Min
0.75 � VCCIO_PIO

(24) Applicable to test condition of IOH and IOL at 2 mA.
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Table 23.

Single-Ended I/O Standards Specifications for Intel Agilex Devices (for HPS and SDM I/O Banks)
For specification status, see the Data Sheet Status table

I/O Standard

VCCIO_HPS, VCCIO_SDM (V)

VIL (V)

VIH (V)

VOL (V)

VOH (V)

IOL (mA)(25)

Min

Typ

Max

Min

Max

Min

Max

Max

Min

Max

1.8 V

1.71

1.8

1.89

�0.3

0.35 �

0.65 �

VCCIO_HPS +

0.4

VCCIO_HPS �

8

LVCMOS

VCCIO_HPS,

VCCIO_HPS,

0.3,

0.4,

0.35 �

0.65 �

VCCIO_SDM +

VCCIO_SDM �

VCCIO_SDM

VCCIO_SDM

0.3

0.4

IOH (mA)(25)
Min �8

Single-Ended SSTL, HSTL, HSUL, and POD I/O Reference Voltage Specifications

Table 24.

Single-Ended SSTL, HSTL, HSUL, and POD I/O Reference Voltage Specifications for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

I/O Standard

Min

VCCIO_PIO (V) Typ

Max

Min

VREF (V) Typ

Max

Min

VTT (V) Typ

Max

SSTL-12 HSTL-12 HSUL-12 POD12

1.14

1.2

1.26

0.49 �

0.5 � VCCIO_PIO

0.51 �

0.475 �

0.5 � VCCIO_PIO

0.525 �

VCCIO_PIO

VCCIO_PIO

VCCIO_PIO

VCCIO_PIO

1.14

1.2

1.26

0.47 �

0.5 � VCCIO_PIO

0.53 �

0.475 �

0.5 � VCCIO_PIO

0.525 �

VCCIO_PIO

VCCIO_PIO

VCCIO_PIO

VCCIO_PIO

1.14

1.2

1.26

0.49 �

0.5 � VCCIO_PIO

0.51 �

--

--

--

VCCIO_PIO

VCCIO_PIO

1.14

1.2

1.26

--

Internally

--

calibrated

--

VCCIO_PIO

--

(25) To meet the IOH and IOL specifications, you must set the current strength settings accordingly. For example, to meet the 1.8 V LVCMOS specification (8 mA), you should set the current strength settings to 8 mA. Setting at lower current strength may not meet
the IOH and IOL specifications in the data sheet.

Intel� AgilexTM Device Data Sheet 24

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Single-Ended SSTL, HSTL, HSUL, and POD I/O Standards Signal Specifications

Table 25.

Single-Ended SSTL, HSTL, HSUL, and POD I/O Standards Signal Specifications for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

I/O Standard

VIL(DC) (V) Max

VIH(DC) (V) Min

VIL(AC) (V) Max

VIH(AC) (V) Min

SSTL-12 HSTL-12 HSUL-12 POD12(26)

VREF � 0.075 VREF � 0.080 VREF � 0.100 VREF � 0.055

VREF + 0.075 VREF + 0.080 VREF + 0.100 VREF + 0.055

VREF � 0.100 VREF � 0.150 VREF � 0.135 VREF � 0.070

VREF + 0.100 VREF + 0.150 VREF + 0.135 VREF + 0.070

Note:

For output voltage swing calculation example, refer to the Intel Agilex General Purpose I/O and LVDS SERDES User Guide.

Related Information
1.2 V I/O Interface Voltage Level Compatibility section, Intel Agilex General Purpose I/O and LVDS SERDES User Guide Provides output voltage swing calculation examples.

(26) This specification is defined over internal Vref range from 0.6 � VCCIO_PIO to 0.92 � VCCIO_PIO.
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Differential SSTL, HSTL, and HSUL I/O Standards Specifications

Table 26.

Differential SSTL, HSTL, and HSUL I/O Standards Specifications for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

I/O Standard

VCCIO_PIO (V)

VILdiff(DC) VIHdiff(DC) VILdiff(AC) VIHdiff(AC)

(V)

(V)

(V)

(V)

VIX(AC) (V)

VOX(AC) (V)

Min

Typ

Max

Max

Min

Max

Min

Min

Typ

Max

Min

Typ

Max

SSTL-12

1.14

1.2

1.26

�0.15

0.15

�0.2

0.2

0.5 �

0.5 �

0.5 �

0.5 �

0.5 �

0.5 �

VCCIO_PIO � 0.12

VCCIO_PIO

VCCIO_PIO + 0.12

VCCIO_PIO � 0.12

VCCIO_PIO

VCCIO_PIO + 0.12

HSTL-12

1.14

1.2

1.26

�0.16

0.16

�0.3

0.3

0.5 �

0.5 �

0.5 �

0.5 �

0.5 �

0.5 �

VCCIO_PIO � 0.12

VCCIO_PIO

VCCIO_PIO + 0.12

VCCIO_PIO � 0.12

VCCIO_PIO

VCCIO_PIO + 0.12

HSUL-12

1.14

1.2

1.26

�0.2

0.2

�0.27

0.27

0.5 �

0.5 �

0.5 �

0.5 �

0.5 �

0.5 �

VCCIO_PIO � 0.12

VCCIO_PIO

VCCIO_PIO + 0.12

VCCIO_PIO � 0.12

VCCIO_PIO

VCCIO_PIO + 0.12

Differential POD I/O Standards Specifications

Table 27.

Differential POD I/O Standards Specifications for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

I/O Standard

Min

VCCIO_PIO (V) Typ

Max

VILdiff(DC) (V) Max

VIHdiff(DC) (V) Min

VILdiff(AC) (V) Max

VIHdiff(AC) (V) Min

POD12

1.14

1.2

1.26

�0.11

0.11

�0.14

0.14

VIX(AC) (%)(27) Max 25

(27) Percentage of P-leg and N-leg crossing relative to the midpoint of P-leg and N-leg signal swings.
Intel� AgilexTM Device Data Sheet 26

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Differential I/O Standards Specifications

Table 28.
I/O Standard
True Differenti al Signaling (Transmi tter & Receiver)
(30)

Differential I/O Standards Specifications for Intel Agilex Devices (for GPIO Bank)
For specification status, see the Data Sheet Status table

VCCIO_PIO (V)

Min

Typ

Max

VID (mV)

Min

Max

Min

VICM(DC) (V)
Conditio n

Max

VOD (V)(28) (29)

Min

Typ

Max

1.455

1.5

1.545

200

600

0.3

Data rate <0.9

0.247

--

0.454

700

100

600

0.9

Mbps

1.4

100

600

0.9

Data rate

1.4

>700

Mbps

True

1.14

1.2

1.26

200

600

0.3

Data rate <0.9

--

--

--

Differenti

700

al

100

600

0.9

Mbps

1.1

Signaling

(Receiver

100

600

0.9

Data rate

1.1

only)(30)

>700

Mbps

Switching Characteristics
This section provides the performance characteristics of Intel Agilex core and periphery blocks.

Min

VOCM (V)(28) Typ

Max

0.99

1.1

1.21

--

--

--

(28) RL range: 90  RL  110 .
(29) The specification is only applicable to default VOD and pre-emphasis setting.
(30) The True Differential Signaling input buffer is supported on 1.2 V and 1.5 V VCCIO_PIO bank. The maximum input voltage driven into the True Differential Signaling input buffer must not exceed VICM(max) + VID(max)/2.

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Core Performance Specifications

Clock Tree Specifications

Table 29.

Clock Tree Performance for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Parameter

Performance

�1V, �2V

Programmable clock routing

1,000

�3V, �3E, �4F, �4X 780

I/O PLL Specifications

Table 30.

I/O PLL Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Parameter

Condition

Min

Typ

fIN

Input clock frequency �1V

�2V

10

--

10

--

�3V, �3E

10

--

�4F, �4X

10

--

fINPFD

Input clock frequency -- to the PFD

10

--

fVCO

I/O PLL VCO operating �1V
range �2V

600

--

600

--

�3V, �3E

600

--

�4F, �4X

600

--

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Unit MHz

Max 1,100(31)
900(31) 750(31) 650(31)
325
1,600 1,434 1,250 1,067

Unit MHz MHz MHz MHz MHz
MHz MHz MHz MHz continued...

(31) This specification is limited by the I/O maximum frequency. The maximum achievable I/O frequency is different for each I/O standard and is dependent on design and system specific factors. Ensure proper timing closure in your design and perform HSPICE/IBIS simulations based on your specific design and system setup to determine the maximum achievable frequency in your system.

Intel� AgilexTM Device Data Sheet 28

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Symbol fCLBW tEINDUTY fOUT
fOUT_EXT
tOUTDUTY tFCOMP (33) fDYCONFIGCLK tLOCK

Parameter

Condition

I/O PLL closed-loop bandwidth

I/O bank I/O PLL Fabric-feeding I/O PLL

Input clock or external -- feedback clock input duty cycle

Output frequency for internal clock (C counter)

�1V �2V �3V, �3E

�4F, �4X

Output frequency for �1V
external clock output �2V

�3V, �3E

�4F, �4X

Duty cycle for dedicated external clock output (when set to 50%)

fOUT_EXT < 300 MHz fOUT_EXT  300 MHz

External feedback

--

clock compensation

time

Dynamic configuration -- clock for mgmt_clk

Time required to lock -- from end-of-device configuration or deassertion of areset

Min 0.5 1 40
-- -- -- -- -- -- -- -- 45 40/45 (32)
--
--
--

Typ -- -- --
-- -- -- -- -- -- -- -- 50 50
--
--
--

Max 10 10 60
1,100 900 750 650 800 717 625 500 55 55 (32)/60
5
100
1

Unit MHz MHz
%
MHz MHz MHz MHz MHz MHz MHz MHz
% %
ns
MHz
ms
continued...

(32) To achieve 5% duty cycle for fOUT_EXT  300 MHz, you only can use tx_outclk port from the LVDS SERDES Intel FPGA IP. Refer to the Intel Agilex Clocking and PLL User Guide for the detail design guidelines.
(33) Not applicable for fabric-feeding I/O PLL.

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Symbol tDLOCK
tPLL_PSERR tARESET tINCCJ tREFPJ
tREFPN

Parameter

Condition

Time required to lock -- dynamically (after switchover or reconfiguring any nonpost-scale counters/ delays)

Accuracy of PLL phase -- shift

Minimum pulse width -- on the areset signal

Input clock cycle-tocyle jitter
Reference phase jitter (rms)(35)

fREF < 100 MHz (34)
fREF  100 MHz (34)
Carrier frequency: 100 MHz with integrated bandwidth of 10 kHz to 50 MHz

Reference phase noise(36) (35)

10 Hz 100 Hz

1 kHz

10 kHz

100 kHz

1 MHz

10 MHz

Min --
-- 10 -- -- --
-- -- -- -- -- -- --

Typ --
-- -- -- -- --
-- -- -- -- -- -- --

Max 1
�50 -- 750
0.15 1.42
�90 �100 �110 �120 �130 �138 �142

Unit ms
ps ns ps (p-p) UI (p-p) ps
dBc/Hz dBc/Hz dBc/Hz dBc/Hz dBc/Hz dBc/Hz dBc/Hz continued...

(34) fREF is fIN/N, specification applies when N = 1.
(35) Requirement for Advanced Interface Bus (AIB), High Bandwidth Memory (HBM) Interface, Mobile Industry Processor Interface (MIPI), DDR4 protocol, and LVDS applications only.
(36) The phase noise numbers in the table above are the maximum acceptable phase noise values measured at a carrier frequency of 100 MHz. To calculate the phase noise requirement at any other frequency, use the formula: REFCLK phase noise at f (MHz) = REFCLK phase noise at 100 MHz + (20 � log10 (f/100)).

Intel� AgilexTM Device Data Sheet 30

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Symbol tOUTPJ_DC (33) (37) tOUTCCJ_DC (33) (37) tOUTPJ_IO (38) (37) tOUTCCJ_IO (38) (37) tCASC_OUTPJ_DC (33)

Parameter

Condition

100 MHz

Period jitter for dedicated clock output

fOUT < 100 MHz (34) fOUT  100 MHz (34)

Cycle-to-cycle jitter for dedicated clock output

fOUT < 100 MHz (34) fOUT  100 MHz (34)

Period jitter for clock output on the regular I/O

fOUT < 100 MHz (34) fOUT  100 MHz (34)

Cycle-to-cycle jitter for clock output on the regular I/O

fOUT < 100 MHz (34) fOUT  100 MHz (34)

Period jitter for dedicated clock output in cascaded PLLs

fOUT < 100 MHz (34) fOUT  100 MHz (34)

Min -- -- -- -- -- -- -- -- -- -- --

Typ -- -- -- -- -- -- -- -- -- -- --

Max �144 17.5 175 17.5 175
60 600 60 600 17.5 175

Unit dBc/Hz mUI (p-p) ps (p-p) mUI (p-p) ps (p-p) mUI (p-p) ps (p-p) mUI (p-p) ps (p-p) mUI (p-p) ps (p-p)

Related Information
� Memory Output Clock Jitter Specifications on page 46 Provides more information about the external memory interface clock output jitter specifications.
� Intel Agilex Clocking and PLL User Guide Provides the recommended spread-spectrum clock profile and design guidelines to achieve 5% duty cycle using the LVDS SERDES Intel FPGA IP.

(37) This jitter specification does not include the effect of spread-spectrum clock. The magnitude of jitter deterioration is largely depend on the spread-spectrum clock profile used. Refer to the Intel Agilex Clocking and PLL User Guide for the recommended spreadspectrum clock profile.
(38) External memory interface clock output jitter specifications use a different measurement method, which are available in the Memory Output Clock Jitter Specifications for Intel Agilex Devices table.

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DSP Block Specifications

Table 31.

DSP Block Performance Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Mode

Performance

�1V

�2V

�3V, �3E

Fixed-point 18 � 19

900

771

676

multiplication mode

Fixed-point 27 � 27

900

771

676

multiplication mode(39)

Fixed-point 18 � 19

900

771

676

multiplier adder mode(39)

Fixed-point 18 � 19

900

771

676

multiplier adder summed

with 36-bit input mode(39)

Fixed-point four 9 � 9

900

771

676

multiplier adder mode(39)

Fixed-point 18 � 19

900

771

676

systolic mode

Fixed-point 18 � 19

900

771

676

complex multiplication

mode

FP32 floating-point

750

579

507

multiplication mode

FP32 floating-point adder

750

579

507

or subtract mode

�4F, �4X 600 600 600 600
600 600 600
475 475

Unit
MHz MHz MHz MHz
MHz MHz MHz
MHz MHz
continued...

(39) When Chainout is enabled but systolic registers are not used, the performance specifications for the following speed grades are as follows: � �1V: 675 MHz � �2V: 578 MHz � �3V and �3E: 507 MHz � �4F and �4X: 450 MHz

Intel� AgilexTM Device Data Sheet 32

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Mode
FP32 floating-point multiplier adder or subtract mode
FP32 floating-point multiplier accumulate mode
Addition or subtraction of two FP16 floating-point multiplication mode
Sum/sub of two FP16 multiplications with FP32 (addition/subtraction)
Sum/sub of two FP16 multiplications with accumulation (addition/ subtraction)
FP32 floating-point complex multiplication
FP32 floating-point vector dot product
FP16 floating-point complex multiplication
FP16 floating-point vector dot product

�1V 750 750 750 750 750
750 750 750 750

�2V 579

Performance �3V, �3E 507

579

507

579

507

579

507

579

507

579

507

579

507

579

507

579

507

�4F, �4X 475 475 475 475 475
475 475 475 475

Unit MHz MHz MHz MHz MHz
MHz MHz MHz MHz

Memory Block Specifications
To achieve the maximum memory block performance, use a memory block clock that comes through global clock routing from an on-chip PLL and set to 50% output duty cycle. Use the Intel Quartus Prime software to report timing for the memory block clocking schemes.
When you use the error detection cyclical redundancy check (CRC) feature, there is no degradation in fMAX.

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Intel� AgilexTM Device Data Sheet 33

Table 32.

Memory Block Performance Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Memory

Mode

Performance

�1V

�2V

�3V, �3E

MLAB

Single-port RAM/ROM

1,000

782

667

Simple dual-port RAM

M20K Block(40)

Simple dual-port RAM with read-during-write option
Single-port RAM/ROM Simple dual-port RAM

630
1,000 (HS) 850 (LP)

510
782 (HS) 664 (LP)

460
667 (HS) 567 (LP)

Simple dual-port RAM, coherent read enabled

1,000 (HS) 850 (LP)

782 (HS) 664 (LP)

667 (HS) 567 (LP)

Single-port RAM with the read-during-write option set to Old Data
Simple dual-port RAM with the read-duringwrite option set to Old Data

800 (HS) 680 (LP)

640 (HS) 540 (LP)

560 (HS) 476 (LP)

Simple dual-port RAM with ECC enabled, 512 � 32

600 (HS) 500 (LP)

480 (HS) 400 (LP)

420 (HS) 357 (LP)

Simple dual-port RAM with ECC, optional pipeline registers enabled, 512 � 32

1,000 (HS) 850 (LP)

782 (HS) 664 (LP)

667 (HS) 567 (LP)

Dual-port ROM True dual-port RAM

600 (HS)

500 (HS)

420 (HS)

Simple quad-port RAM

600 (HS)

480 (HS)

420 (HS)

eSRAM

Simple dual-port

750

640

500

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

�4F, �4X 600
330
600 (HS) 510 (LP) 600 (HS) 510 (LP) 480 (HS) 410 (LP)
360 (HS) 300 (LP) 600 (HS) 510 (LP)
360 (HS)
360 (HS) 500

Unit MHz MHz MHz MHz MHz
MHz MHz
MHz MHz MHz

(40) For M20K block, timing/power optimization feature is available. The available options are High Speed (HS) and Low Power (LP). For details on this timing/power optimization feature, refer to the Agilex Embedded Memory User Guide.

Intel� AgilexTM Device Data Sheet 34

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Local Temperature Sensor Specifications

Table 33.

Local Temperature Sensor Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Description Local Temperature Sensor

Temperature Range �40 to 125�C(42)

Accuracy �5�C

Sampling Rate(41) 1 KSPS

Conversion Time < 1 ms

Remote Temperature Diode Specifications

Note the following for the remote temperature diode specifications:
� The temperature diode characteristics in this table target for three-currents temperature sensing chip implementation. The characteristics can also apply to two-currents temperature sensing chip implementation.
� Absolute accuracy is dependent on third-party external diode ADC and integration specifics.

Table 34.

Remote Temperature Diode Specifications for Intel Agilex Devices (Core Fabric TSD)
For specification status, see the Data Sheet Status table

Description

Min

Typ

Max

Ibias, diode source current Vbias, voltage across diode Series resistance Diode ideality factor

10 0.43
-- --

-- -- -- 1.006(43)

170 0.75 <3
--

Unit A V  --

(41) The read out is subject to the SDM mailbox activity status. (42) Temperature range refers to junction temperature. (43) When using lower injection current (two-currents) implementation, the ideality factor is 1.009.
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Table 35.

Remote Temperature Diode Specifications for Intel Agilex Devices (E-Tile TSD)
For specification status, see the Data Sheet Status table

Description

Min

Typ

Max

Ibias, diode source current

10

--

170

Vbias, voltage across diode

0.56

--

0.82

Series resistance

--

--

<2

Diode ideality factor

--

1.005

--

Table 36.

Remote Temperature Diode Specifications for Intel Agilex Devices (P-Tile TSD)
For specification status, see the Data Sheet Status table

Description

Min

Typ

Max

Ibias, diode source current Vbias, voltage across diode Series resistance Diode ideality factor

10 0.56
-- --

-- -- -- 1.0108(44)

170 0.87 <10
--

Table 37.

Remote Temperature Diode Specifications for Intel Agilex Devices (R-Tile TSD)
For specification status, see the Data Sheet Status table

Description

Min

Typ

Max

Ibias, diode source current

20

Vbias, voltage across diode

0.5

Series resistance

--

Diode ideality factor

--

-- -- -- 1.000(45)

170 0.78 <10
--

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
Unit A V  --
Unit A V  --
Unit A V  --

(44) When using lower injection current (two-currents) implementation, the ideality factor is 1.03. (45) When using lower injection current (two-currents) implementation, the ideality factor is 1.008.
Intel� AgilexTM Device Data Sheet 36

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Table 38.

Remote Temperature Diode Specifications for Intel Agilex Devices (F-Tile TSD)
For specification status, see the Data Sheet Status table

Description

Min

Typ

Max

Ibias, diode source current

20

Vbias, voltage across diode

0.5

Series resistance

--

Diode ideality factor

--

-- -- -- 1.002(46)

170 0.78 <10
--

Voltage Sensor Specifications

Table 39.

Voltage Sensor Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Parameter

Minimum

Resolution

--

Sampling rate(47)

--

Input capacitance

--

Voltage sensor accuracy, Vin range: 0 V to 1.1 V(48)

--

Unipolar Input Mode

Input signal range for

--

Vsigp

Common mode voltage on

--

Vsign

Input signal range for

--

Vsigp � Vsign

Typical 7 -- -- -- --
--
--

Maximum -- 1 40
�3.5 1.35
0.25
1.1

Unit A V  --
Unit Bit
KSPS pF % V V V

(46) When using lower injection current (two-currents) implementation, the ideality factor is 1.016. (47) The read out is subject to the SDM mailbox activity status. (48) For 1.8 V channel 3, 4, 5, and 9, the accuracy is �4.5%.
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Periphery Performance Specifications
This section describes the periphery performance, LVDS SERDES, and external memory interface.
Actual achievable frequency depends on design and system specific factors. Ensure proper timing closure in your design and perform HSPICE/IBIS simulations based on your specific design and system setup to determine the maximum achievable frequency in your system.

LVDS SERDES Specifications

Table 40. LVDS SERDES Specifications for Intel Agilex Devices

LVDS serializer/deserializer (SERDES) block supports SERDES factor J = 3 to 10.

DDR registers support SERDES factor J = 1 to 2.

You must calculate the leftover timing margin in the receiver by performing link timing closure analysis. You must consider the board skew margin, transmitter channel-to-channel skew, and receiver sampling margin to determine the leftover timing margin.

For specification status, see the Data Sheet Status table

Paramet Symbol Conditio

er

n

�1 Speed Grade

Min

Typ

Max

�2 Speed Grade

Min

Typ

Max

Clock

fHSCLK_in Clock

10

frequen (input boost

cy

clock

factor W

frequen = 1 to

cy) True 40(49)

Differen

tial I/O

Standar

ds

--

800

10

--

700

fHSCLK_in Clock

10

(input boost

clock

factor W

frequen = 1 to

cy)

40(49)

Single-

Ended

--

625

10

--

625

�3 Speed Grade

Min

Typ

Max

10

--

625

10

--

525

�4 Speed Grade

Min

Typ

Max

10

--

625

Unit MHz

10

--

525

MHz

continued...

(49) Clock Boost Factor (W) is the ratio between the input data rate and the input clock rate.

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Paramet Symbol Conditio

er

n

I/O Standar ds

fHSCLK_O --
UT
(output clock frequen cy)

Transmit ter

True Differen tial I/O Standar ds fHSDR (data rate)(51)

SERDES factor J = 4 to 10(52)
(53) (54)
SERDES factor J = 3(52)
(53) (54)

�1 Speed Grade

Min

Typ

Max

--

--

800(50)

150

--

1,600

150

--

1,200

�2 Speed Grade

Min

Typ

Max

--

--

700(50)

150

--

1,434

150

--

1,076

�3 Speed Grade

Min

Typ

Max

--

--

625(50)

150

--

1,250

150

--

938

�4 Speed Grade

Min

Typ

Max

Unit

--

--

625(50)

MHz

150

--

1,000

Mbps

150

--

600

Mbps

continued...

(50) This is achieved by using the PHY clock network.
(51) Requires package skew compensation with PCB trace length.
(52) The Fmax specification is based on the fast clock used for serial data. The interface Fmax is also dependent on the parallel clock domain which is design dependent and requires timing analysis.
(53) The VCC and VCCP must be on a combined power layer and a maximum load of 5 pF for chip-to-chip interface. (54) The minimum specification depends on the clock source (for example, the PLL and clock pin) and the clock routing resource that you
use. The I/O differential buffer and serializer do not have a minimum toggle rate.

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Paramet Symbol Conditio

er

n

SERDES factor J = 2, uses DDR register s

SERDES factor J = 1, uses DDR register s

tx Jitter True Differen tial I/O Standar ds

Total jitter for data rate, 600 Mbps � 1.6 Gbps

Total jitter for data rate, < 600 Mbps

tDUTY
(56)

TX output clock duty cycle for

�1 Speed Grade

Min

Typ

Max

150

--

840(55)

150

--

420(55)

1,600 Mbps: 160 1,434 Mbps: 200 1,250 Mbps: 250 1,000 Mbps: 300 800 Mbps: 320
600 Mbps: 340

--

--

0.21

45

50

55

�2 Speed Grade

Min

Typ

Max

150

--

(55)

150

--

(55)

1,434 Mbps: 200 1,250 Mbps: 250 1,000 Mbps: 300 800 Mbps: 320
600 Mbps: 340

--

--

0.21

45

50

55

�3 Speed Grade

Min

Typ

Max

150

--

(55)

150

--

(55)

1,250 Mbps: 250 1,000 Mbps: 300 800 Mbps: 320
600 Mbps: 340

--

--

0.21

45

50

55

�4 Speed Grade

Min

Typ

Max

150

--

(55)

Unit Mbps

150

--

(55)

Mbps

1,000 Mbps: 300

ps

800 Mbps: 320

600 Mbps: 340

--

--

0.21

UI

45

50

55

%

continued...

(55) The maximum ideal data rate is the SERDES factor (J) � the PLL maximum output frequency (fOUT) provided you can close the design timing and the signal integrity meets the interface requirements.
(56) Not applicable for DIVCLK = 1.

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Paramet Symbol Conditio

er

n

Differen tial I/O Standar ds

tRISE & tFALL (53)
(57)

True Differen tial I/O Standar ds

TCCS (51)
(56)

True Differen tial I/O Standar ds

Receiver

True Differen tial I/O Standar ds fHSDRDPA (data rate)

SERDES factor J = 4 to 10(52)
(53) (54)
SERDES factor J = 3(52)
(53) (54)

fHSDR (data
rate)
(without DPA)(51)

SERDES factor J = 3 to 10
SERDES factor J = 2, uses

�1 Speed Grade

Min

Typ

Max

--

--

160

--

--

330

150

--

1,600

150

--

1,200

(54)

--

(58)

(54)

--

(55)

�2 Speed Grade

Min

Typ

Max

--

--

180

--

--

330

150

--

1,434

150

--

1,076

(54)

--

(58)

(54)

--

(55)

�3 Speed Grade

Min

Typ

Max

--

--

200

--

--

330

150

--

1,250

150

--

938

(54)

--

(58)

(54)

--

(55)

�4 Speed Grade

Min

Typ

Max

Unit

--

--

220

ps

--

--

330

ps

150

--

1,000

Mbps

150

--

600

Mbps

(54)

--

(58)

Mbps

(54)

--

(55)

Mbps

continued...

(57) This applies to default pre-emphasis and VOD settings only.
(58) You can estimate the achievable maximum data rate for non-DPA mode by performing link timing closure analysis. You must consider the board skew margin, transmitter delay margin, and receiver sampling margin to determine the maximum data rate supported.

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Paramet Symbol Conditio

er

n

DPA (FIFO mode)
DPA (soft CDR mode)

DDR register s
SERDES factor J = 1, uses DDR register s
DPA run -- length

DPA run length

SGMII/ GbE protocol

All other protocol s

Soft CDR mode
Non DPA mode

Soft-

--

CDR

ppm

toleranc

e

Samplin -- g Window

�1 Speed Grade

Min

Typ

Max

(54)

--

(55)

--

--

10,000

--

--

5

-- �300

--

50 data

transitio

n per

208 UI

--

300

--

--

330

�2 Speed Grade

Min

Typ

Max

(54)

--

(55)

--

--

10,000

--

--

5

-- �300

--

50 data

transitio

n per

208 UI

--

300

--

--

330

�3 Speed Grade

Min

Typ

Max

(54)

--

(55)

--

--

10,000

--

--

5

-- �300

--

50 data

transitio

n per

208 UI

--

300

--

--

330

�4 Speed Grade

Min

Typ

Max

(54)

--

(55)

--

--

10,000

--

--

5

-- �300

--

50 data

transitio

n per

208 UI

--

300

--

--

330

Unit
Mbps
UI UI -- ppm ps

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DPA Lock Time Specifications

Table 41. DPA Lock Time Specifications for Intel Agilex Devices

The DPA lock time is for one channel. One data transition is defined as a 0-to-1 or 1- to-0 transition.

For specification status, see the Data Sheet Status table

Standard

Training Pattern

Number of Data Transitions in One Repetition of the Training
Pattern

SPI-4

00000000001111111111

2

Parallel Rapid I/O

00001111

2

10010000

4

Miscellaneous

10101010

8

01010101

8

Number of Repetitions per 256 Data Transitions(59)
128 128 64 32 32

Maximum Data Transition
768 768 768 768 768

(59) This is the number of repetitions for the stated training pattern to achieve the 256 data transitions.
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LVDS SERDES Soft-CDR Sinusoidal Jitter Tolerance Specifications Figure 2. LVDS SERDES Soft-CDR Sinusoidal Jitter Tolerance Specifications for a Data Rate Equal to 1.6 Gbps
25 8.5

Jitter Amplitude(UI)

0.22 0.1

Table 42.
F1 F2 F3 F4

F1 F2

F3

F4

Jitter Frequency (Hz)

LVDS SERDES Soft-CDR Sinusoidal Jitter Mask Values for a Data Rate Equal to 1.6 Gbps
For specification status, see the Data Sheet Status table

Parameter

Jitter Frequency (Hz)

Sinusoidal Jitter (UI)

10,000

25

17,565

25

1,493,000

0.22

50,000,000

0.22

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Figure 3.

LVDS SERDES Soft-CDR Sinusoidal Jitter Tolerance Specifications for a Data Rate Less than 1.6 Gbps
Sinusoidal Jitter Amplitude

20db/dec

0.1 UI P-P

baud/1667

20 MHz

Frequency

Memory Standards Supported

Table 43. Memory Standards Supported by Intel Agilex Devices

This table lists the overall capability of External Memory Interface supported by Intel Agilex Devices. For specific details, refer to the External Memory Interface Spec Estimator.

For specification status, see the Data Sheet Status table

DDR4 SDRAM QDR IV SRAM DDR4 SDRAM

Memory Standard

Controller Type Hard memory controller Soft memory controller HPS hard memory controller

1,600 1,066 1,600

Maximum Frequency (MHz)

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Related Information
External Memory Interface Spec Estimator Provides the specific details of the memory standards supported.

DLL Range Specifications

Table 44.

DLL Frequency Range Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Parameter

Performance (for All Speed Grades)

DLL operating frequency range

600 � 1,600

DLL reference clock input

Minimum 600

Unit MHz MHz

Memory Output Clock Jitter Specifications
The clock jitter specification applies to the memory output clock pins clocked by an I/O PLL, or generated using differential signal-splitter and double data I/O circuits clocked by a PLL output routed on a PHY clock network as specified. Intel recommends using PHY clock networks for better jitter performance.
The memory clock output jitter is within the JEDEC specifications when the phase jitter (integration bandwidth 10 kHz to 50 MHz) of the input clock is not more than 20 ps peak-to-peak, or 1.42 ps RMS at 1e-12 BER and 1.22 ps at 1e-16 BER.

E-Tile Transceiver Performance Specifications
This section provides E-tile transceiver specifications and timing for Intel Agilex devices.

E-Tile Transceiver Performance

Table 45.

E-Tile Transmitter and Receiver Data Rate Performance Specifications
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Transceiver Speed Grade

Supported data rate(60)

NRZ PAM4

�1 28.9 57.8(61)

�2 28.3 56

�3 17.4 32

Unit
Gbps Gbps

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E-Tile Transceiver Reference Clock Specifications

Table 46.

E-Tile Reference Clock LVPECL DC Electrical Characteristics
For specification status, see the Data Sheet Status table

Symbol

Refclk Parameter

Min

Typ

VTT

Termination voltage (2.5 V

0.4

0.5

compliant)

Termination voltage (3.3 V

1.04

1.3

compliant)

RTT

Termination resistor

40

50

VDIFF

Differential voltage

0.4

0.8

VCM

Input common mode

VDIFF/2

--

voltage (2.5 V compliant,

no internal termination

resistor)

Input common mode voltage (2.5 V compliant, internal termination resistor)

VCCCLK_GXE � 1.6

VCCCLK_GXE � 1.3

Input common mode

VDIFF/2

--

voltage (3.3 V compliant,

no internal termination

resistor)

Input common mode

1.4

2

voltage (3.3 V compliant,

internal termination

resistor)

Max 0.6 1.56 60 1.2 VCCCLK_GXE � VDIFF/2
VCCCLK_GXE � 1.0
VCCCLK_GXE � VDIFF/2
2.6

Unit V V  V V
V
V
V

(60) The supported data rate is for chip-to-chip and backplane links. (61) Two channels are combined to support up to 57.8 Gbps.
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Table 47.

E-Tile Reference Clock Electrical and Jitter Requirements
For specification status, see the Data Sheet Status table

Parameter

Condition

Min

Frequency

--

125

Frequency tolerance

--

�100

Clock duty cycle

--

45

Rise/Fall times

20% to 80%

40

Phase jitter

12 kHz to 20 MHz

--

Phase noise(62)

10 kHz

--

100 kHz

--

500 kHz

--

3 MHz

--

10 MHz

--

20 MHz

--

Typ 156.25
-- 50 -- 0.375 -- -- -- -- -- --

E-Tile Transmitter Specifications

Table 48.

E-Tile Transmitter Specifications
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Min

Transmitter differential

No precursor/postcursor

--

output voltage peak-to-

de-emphasis

peak

Transmitter common mode -- voltage

Typ 0.965
VCCRT_GXE/2

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Max 700 100 55 300 0.5 �130 �138 �138 �140 �144 �146

Unit MHz ppm
% ps ps rms dBc/Hz dBc/Hz dBc/Hz dBc/Hz dBc/Hz dBc/Hz

Max --

Unit V
V

(62) The phase noise numbers in this table are the maximum acceptable phase noise values measured at a carrier frequency of 156.25 MHz. To calculate the phase noise requirement at any other frequency, use the formula: REFCLK phase noise at f (MHz) = REFCLK phase noise at 156.25 MHz + 20*log10(f/156.25).

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E-Tile Receiver Specifications

Table 49.

E-Tile Receiver Specifications
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Min

Absolute VMAX for a

NRZ

--

receiver pin

PAM4

--

Maximum peak-to-peak

--

differential input voltage

VID (diff p-p) before/after device configuration

VCM (Internal AC coupled)(63) Receiver run length(64)

NRZ PAM4 --

GND GND + 0.3
--

DC input impedance

--

40

DC differential input

--

80

impedance

Powered down DC input impedance

Receiver pin impedance when the receiver termination is powered down

100k

Differential termination

From DC to 100 MHz

80

PPM tolerance

Allowed frequency

--

mismatch between

REFCLK and RX data

Typ VCCH_GXE + 0.3
VCCH_GXE 1.2
-- -- -- -- 100 --
100 --

Max -- --
VCCH_GXE VCCH_GXE � 0.3
100(65) 60 120 --
120 750

Unit V V V
V V symbols   
 ppm

(63) This value uses internal AC coupling. External coupling capacitors are required beyond the range mentioned in this table. (64) No additional transition density requirements apply. (65) The incoming data must be statistically DC-balanced.

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P-Tile Transceiver Performance Specifications
This section provides P-tile transceiver specifications and timing for Intel Agilex devices.

P-Tile Transceiver Performance

Table 50.

P-Tile Transmitter and Receiver Data Rate Performance
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Gen 1

Gen 2

Supported data rate

PCIe*

2.5

5

Gen 3 8

Gen 4 16

Table 51.

P-Tile PLLA Performance
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Min

VCO frequency

--

--

PLL bandwidth (BWTX-

PCIe 2.5 GT/s

1.5

PKG_PLL1)(66)

PCIe 5.0 GT/s

8

PLL bandwidth (BWTX-

PCIe 5.0 GT/s

5

PKG_PLL2)(66)

PLL peaking (PKGTX-PLL1) PCIe 2.5 GT/s

--

PCIe 5.0 GT/s

--

PLL peaking (PKGTX-

PCIe 5.0 GT/s

1

PLL2)(66)

Transceiver Speed Grade Typ 5 -- -- --
-- -- --

Max -- 22 16 16
3 3 --

Unit Gbps
Unit
GHz MHz MHz MHz dB dB dB

(66) The Tx PLL bandwidth must lie between the minimum and maximum ranges given in this table. PLL peaking must lie below the value in this table. Note that the PLL bandwidth extends from zero up to the values specified in this table. The PLL bandwidth is defined at the point where its transfer function crosses the �3 dB point.

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Table 52.

P-Tile PLLB Performance
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Min

VCO frequency

--

--

PLL bandwidth (BWTX-

PCIe 8.0 GT/s

2

PKG_PLL1)(67)

PCIe 16.0 GT/s

2

PLL bandwidth (BWTX-

PCIe 8.0 GT/s

2

PKG_PLL2)(67)

PCIe 16.0 GT/s

2

PLL peaking (PKGTX-

PCIe 8.0 GT/s

--

PLL1)(67)

PCIe 16.0 GT/s

--

PLL peaking (PKGTX-

PCIe 8.0 GT/s

--

PLL2)(67)

PCIe 16.0 GT/s

--

P-Tile Transceiver Reference Clock Specifications

Table 53.

P-Tile Reference Clock Specifications
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Min

Supported I/O standards --

Input reference clock

--

frequency(68)

99.97

Transceiver Speed Grade Typ 8 -- -- -- -- -- -- -- --
All Transceiver Speed Grades Typ HCSL 100

Max -- 4 4 5 5 2 2 1 1
Max
100.03

Unit
GHz MHz MHz MHz MHz dB dB dB dB
Unit
-- MHz
continued...

(67) The Tx PLL bandwidth must lie between the minimum and maximum ranges given in this table. PLL peaking must lie below the value in this table. Note that the PLL bandwidth extends from zero up to the values specified in this table. The PLL bandwidth is defined at the point where its transfer function crosses the �3 dB point.

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Symbol/Description

Condition

Rising edge rate(69) Falling edge rate(69)
Duty cycle
Spread-spectrum modulating clock frequency
Spread-spectrum downspread
Absolute VMAX Absolute VMIN Peak-to-peak differential input voltage
VICM (DC coupled)
Cycle to cycle jitter (TCCJITTER)(70)
TSSC-MAX-PERIOD-SLEW

PCIe PCIe PCIe --
--
-- -- --
HCSL I/O standard for PCIe reference clock PCIe
Max SSC df/dt

Min 0.6 0.6 40 30
�0.5
-- -- 300
250
--
--

Related Information � PCI Express Base Specification Revision 3.0 � PCI Express Base Specification Revision 4.0

All Transceiver Speed Grades Typ -- -- -- --
--
-- -- --
--
--
--

Max 4 4 60 33
0
1.15 �0.3 1,500
550
150
1,250

Unit
V/ns V/ns
% kHz
% V V mV mV ps ppm/s

(68) This number is with spread spectrum clocking (SSC) turned off. For systems with spread spectrum clocking, follow the specifications in Section 8.6.3 Data Rate Independent Refclk Parameters in the PCI Express* Base Specification Revision 4.0.
(69) Measured from �150 mV to +150 mV on the differential waveform. The 300 mV measurement window is centered on the differential zero crossing.
(70) For common reference clock architecture, follow the jitter limit specified in the PCI Express* Card Electromechanical Specification for 2.5 GT/s, Section 4.3.7 Refclk Specifications for 5.0 GT/s and Section 4.3.8 Refclk Specifications for 8.0 GT/s in the PCI Express Base Specification Revision 3.0, and Section 8.6 Refclk Specifications for 16.0 GT/s in the PCI Express Base Specification Revision 4.0.

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P-Tile Transmitter Specifications

Table 54.

P-Tile Transmitter Specifications
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Min

Supported I/O standards PCIe

Differential on-chip

PCIe

80

termination resistors

Differential peak-to-peak PCIe 2.5 GT/s

800

voltage for full swing

PCIe 5.0 GT/s

800

PCIe 8.0 GT/s

800

PCIe 16.0 GT/s

800

Differential peak-to-peak PCIe 8.0 GT/s and 16.0

250

voltage during EIEOS

GT/s

Lane-to-lane output skew PCIe 2.5 GT/s

--

PCIe 5.0 GT/s

--

PCIe 8.0 GT/s

--

PCIe 16.0 GT/s

--

P-Tile Receiver Specifications

Table 55.

P-Tile Receiver Specifications
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Min

Supported I/O standards PCIe

Peak-to-peak differential input voltage VID (diff p-p)

PCIe 2.5 GT/s(71) PCIe 5.0 GT/s(71)

175(72) 100(72)

All Transceiver Speed Grades Typ
High Speed Differential I/O --
-- -- -- -- --
-- -- -- --
All Transceiver Speed Grades Typ
High Speed Differential I/O -- --

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Max
120
1,100 1,100 1,100 1,100
--
2.5 2 1.5
1.25

Unit
-- 
mV mV mV mV mV
ns ns ns ns

Max
1,200 1,200

Unit
-- mV mV
continued...

Intel� AgilexTM Device Data Sheet 53

Symbol/Description

Condition

Differential on-chip termination resistors
RESREF(74)
RREF

PCIe 8.0 GT/s PCIe 16.0 GT/s --
-- --

Min 25(72) 15(72)
80
167.3 2.772

Related Information PCI Express Base Specification Revision 4.0

All Transceiver Speed Grades Typ -- -- --
169 2.8

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Max --(73) --(73)
120
170.7 2.828

Unit
mV mV 
 k

(71) Voltage shown for PCIe 2.5 GT/s and 5.0 GT/s are at the package pins (TP2).
(72) For PCIe at 2.5 GT/s and 5 GT/s, the VID is measured at TP2, which is the accessible test point at the device under test. For PCIe 8.0 GT/s and 16.0 GT/s, the VID is measured at TP2P. TP2P defines a reference point that comprehends the effects of the behavioral Rx package plus Rx equalization and represents the only location where a meaningful eye height and eye width limits can be defined.
(73) The maximum eye height value depends on the transmitter launch voltage maximum value. Refer to the PCIe Express Base Specification Rev. 4.0 for the generator (TX) launch voltage value.
(74) Connecting RESREF at 169  calibrates PCIe channel on-chip termination to 85 .

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R-Tile Transceiver Performance Specifications

R-Tile Transceiver Performance

Table 56.

R-Tile Transmitter and Receiver Data Rate Performance for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol/ Condition Descriptio
n

Transceiver Speed Grade

�1

�2

Gen1

Gen2

Gen3

Gen4

Gen5

Gen1

Gen2

Gen3

Supported data rate

PCIe CXL

2.5

5

8

16

32

2.5

5

8

--

--

8

16

32

--

--

--

Gen4 16 --

Table 57.

R-Tile Slow PLL Performance for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

All Transceiver Speed Grades

Min

Typ

VCO frequency

PCIe

--

10

CXL

--

--

PLL bandwidth (BWTXPKG_PLL1)(75)

PCIe 2.5 GT/s PCIe 5.0 GT/s

1.5

--

8

--

CXL 2.5 GT/s

--

--

CXL 5.0 GT/s

--

--

PLL bandwidth BWTXPKG_PLL2)(75)

PCIe 2.5 GT/s PCIe 5.0 GT/s

--

--

5

--

Max -- -- 22 16 -- -- -- 16

Gen5 32 --

Unit
Gbps Gbps

Unit
GHz GHz MHz MHz MHz MHz MHz MHz
continued...

(75) The Tx PLL bandwidth must lie between the minimum and maximum ranges given in this table. PLL peaking must lie below the value in this table. Note that the PLL bandwidth extends from zero up to the values specified in this table. The PLL bandwidth is defined at the point where its transfer function crosses the �3 dB point.

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Symbol/Description

Condition

PLL peaking (PKGTXPLL1)(75)
PLL peaking (PKGTXPLL2)(75)

CXL 2.5 GT/s CXL 5.0 GT/s PCIe 2.5 GT/s PCIe 5.0 GT/s CXL 2.5 GT/s CXL 5.0 GT/s PCIe 2.5 GT/s PCIe 5.0 GT/s CXL 2.5 GT/s CXL 5.0 GT/s

Min -- -- -- -- -- -- -- 1 -- --

All Transceiver Speed Grades Typ -- -- -- -- -- -- -- -- -- --

Table 58.

R-Tile Fast PLL Performance for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

All Transceiver Speed Grades

Min

Typ

VCO frequency

PCIe

--

16

CXL

--

16

PLL bandwidth (BWTX-

PCIe 8.0 GT/s

0.5

--

PKG_PLL1)(76)

PCIe 16.0 GT/s

0.5

--

PCIe 32.0 GT/s

0.5

--

CXL 8.0 GT/s

0.5

--

Max -- -- 3 3 -- -- -- -- -- --
Max -- -- 4 4 1.8 4

Unit
MHz MHz dB dB dB dB dB dB dB dB
Unit
GHz GHz MHz MHz MHz MHz
continued...

(76) The Tx PLL bandwidth must lie between the minimum and maximum ranges given in this table. PLL peaking must lie below the value in this table. Note that the PLL bandwidth extends from zero up to the values specified in this table. The PLL bandwidth is defined at the point where its transfer function crosses the �3 dB point.

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Symbol/Description

Condition

PLL bandwidth (BWTXPKG_PLL2)(76)
PLL peaking (PKGTXPLL1)(76)
PLL peaking (PKGTXPLL2)(76)

CXL 16.0 GT/s CXL 32.0 GT/s PCIe 8.0 GT/s PCIe 16.0 GT/s PCIe 32.0 GT/s CXL 8.0 GT/s CXL 16.0 GT/s CXL 32.0 GT/s PCIe 8.0 GT/s PCIe 16.0 GT/s PCIe 32.0 GT/s CXL 8.0 GT/s CXL 16.0 GT/s CXL 32.0 GT/s PCIe 8.0 GT/s PCIe 16.0 GT/s PCIe 32.0 GT/s CXL 8.0 GT/s CXL 16.0 GT/s CXL 32.0 GT/s

Min 0.5 0.5 0.5 0.5 -- 0.5 0.5 -- -- -- -- -- -- -- -- -- -- -- -- --

All Transceiver Speed Grades Typ -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- --

Max 4 1.8 5 5 -- 5 5 -- 2 2 2 2 2 2 1 1 -- 1 1 --

Unit
MHz MHz MHz MHz
-- MHz MHz
-- dB dB dB dB dB dB dB dB -- dB dB --

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R-Tile Transceiver Reference Clock Specifications

Table 59.

R-Tile Reference Clock Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

All Transceiver Speed Grades

Min

Typ

Supported I/O standards PCIe

HCSL

CXL

HCSL

Refclk frequency for devices that support 32.0 GT/s(77)
Rising edge rate(78)

PCIe CXL PCIe

99.99

100

99.99

100

0.6

--

Falling edge rate(78)

CXL PCIe

0.6

--

0.6

--

CXL

0.6

--

Duty cycle

PCIe

40

--

CXL

40

--

Absolute VMAX

PCIe CXL

--

--

--

--

Absolute VMIN

PCIe CXL

--

--

--

--

Peak-to-peak differential input voltage

PCIe CXL

300

--

300

--

Max
100.01 100.01
4 4 4 4 60 60 1.15 1.15 �0.3 �0.3 1,450 1,450

Unit
-- -- MHz MHz V/ns V/ns V/ns V/ns % % V V V V mV mV continued...

(77) This number is with spread-spectrum clocking (SSC) turned off. For systems with spread spectrum clocking, follow the specifications in Section 8.6 Refclk Specifications of PCI Express Base Specification Revision 5.0 Version 1.0.
(78) Measured from �150 mV to +150 mV on the differential waveform. The 300 mV measurement window is centered on the differential zero crossing.

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Symbol/Description

Condition

Vcross

PCIe

CXL

Cycle-to-cycle jitter (TCCJITTER)(79)

PCIe CXL

Spread-spectrum modulating clock frequency

PCIe CXL

SSC deviation for devices that support 32.0 GT/s and SRIS when operating in SRIS mode at all speeds

PCIe CXL

TSSC-MAX-PERIOD-SLEW

Max SSC df/dt for PCIe Max SSC df/dt for CXL

Min 250 250 -- -- 30 30 �0.3 �0.3
-- --

All Transceiver Speed Grades Typ -- -- -- -- -- -- -- --
-- --

Related Information PCI Express Base Specification Revision 5.0

R-Tile Transmitter Specifications

Table 60.

R-Tile Transmitter Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

All Transceiver Speed Grades

Min

Typ

Supported I/O standards PCIe

High-Speed Differential I/O

CXL

High-Speed Differential I/O

Max 550 550 150 150 33 33
0 0 1,250 1,250
Max

Unit
mV mV ps ps kHz kHz % % ppm/�s ppm/�s
Unit
-- -- continued...

(79) For common reference clock architecture, you must meet the jitter limit specified in Section 8.6 Refclk Specifications of PCI Express Base Specification Revision 5.0 Version 1.0.

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Symbol/Description

Condition

Differential on-chip termination resistors Differential peak-to-peak voltage for full swing
Differential peak-to-peak voltage during EIEOS Lane-to-lane output skew

PCIe CXL PCIe 2.5 GT/s PCIe 5.0 GT/s PCIe 8.0 GT/s PCIe 16.0 GT/s PCIe 32.0 GT/s CXL 8.0 GT/s CXL 16.0 GT/s CXL 32.0 GT/s PCIe 8.0 GT/s, 16.0 GT/s, and 32.0 GT/s CXL 8.0 GT/s, 16.0 GT/s, and 32.0 GT/s PCIe 2.5 GT/s PCIe 5.0 GT/s PCIe 8.0 GT/s PCIe 16.0 GT/s PCIe 32.0 GT/s CXL 8.0 GT/s CXL 16.0 GT/s CXL 32.0 GT/s

Min 80 80 800 800 800 800 800 800 800 800 250
250
-- -- -- -- -- -- -- --

All Transceiver Speed Grades Typ 100 100 -- -- -- -- -- -- -- -- --
--
-- -- -- -- -- -- -- --

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Max 120 120 1,200 1,200 1,300 1,300 1,300 1,300 1,300 1,300 --
--
2.5 2 1.5 1.25 1.25 1.5 1.25 1.25

Unit
  mV mV mV mV mV mV mV mV mV
mV
ns ns ns ns ns ns ns ns

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R-Tile Receiver Specifications

Table 61.

R-Tile Receiver Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

All Transceiver Speed Grades

Min

Typ

Supported I/O standards PCIe

High-Speed Differential I/O

CXL

Peak-to-peak differential input voltage VID (diff p-p)

PCIe 2.5 GT/s(80) PCIe 5.0 GT/s(80)

PCIe 8.0 GT/s(80)

PCIe 16.0 GT/s(80)

PCIe 32.0 GT/s(80)

CXL 8.0 GT/s(80)

CXL 16.0 GT/s(80)

CXL 32.0 GT/s(80)

High-Speed Differential I/O

175

--

100

--

25

--

15

--

15

--

25

--

15

--

15

--

Differential on-chip termination resistors
RCOMP

PCIe CXL PCIe (81) CXL(81)

80

100

80

100

148.5

150

148.5

150

Max
1,200 1,200 1,200 800
800 1,200
800 800 120 120 151.5 151.5

Unit
-- -- mVPP mVPP mVPP mVPP mVPP mVPP mVPP mVPP    

(80) For PCIe at 2.5 GT/s and 5 GT/s, VID is measured at TP2, which is the accessible test point at the device under test. For PCIe and CXL 8.0 GT/s, 16.0 GT/s and 32.0 GT/s, VID is measured at TP2P. TP2P defines a reference point that comprehends the effects of the behavioral Rx package plus Rx equalization and represents the only location where a meaningful eye height and eye width limits can be defined.
(81) Connecting RCOMP at 150  calibrates PCIe and CXL channel on-chip termination to 100 .

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F-Tile Transceiver Performance Specifications

F-Tile Transceiver Performance

Table 62.

F-Tile FHT Transmitter and Receiver Data Rate Performance for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Transceiver Speed Grade

�1

�2

�3

Supported data rate

NRZ

24�29, 48�58

24�29

24�29

PAM4

48�58, 96�116

48�58

48�58

Table 63.

F-Tile FGT Transmitter and Receiver Data Rate Performance for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol/Description

Condition

Transceiver Speed Grade

�1

�2

�3

Supported data rate

NRZ

1�32

1�32

1�17.4

PAM4

20�58.125

20�58.125

20�32

F-Tile Transceiver Reference Clock Specifications

Table 64.

F-Tile FHT Reference Clock Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Parameter

Description

Condition

Min

Typical

Frequency

Reference clock

--

frequency

100

100

156.25

Frequency accuracy

Frequency accuracy of -- the reference clock, including temperature variability, aging, and initial variation

--

--

Max 200
�100

Unit Gbps Gbps
Unit Gbps Gbps
Unit MHz ppm
continued...

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Parameter

Description

Condition

Single sideband phase noise

Measured SSB phase
noise must be smaller
than phase noise mask(82)

10 kHz 100 kHz 500 kHz

3 MHz

10 MHz

20 MHz

1 GHz

Integrated RMS jitter

Integrated over 10

--

kHz � 20 MHz, include

spurious

Min -- -- -- -- -- -- -- --

Typical �130 �138 �138 �140 �144 �146
�146 (83) --

Table 65.

F-Tile FHT Reference Clocks Input Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Parameter

Description

Condition

Min

Typical

TREF-DUTY TREF-RISE/FALL

Duty cycle

--

Rising and falling edge 20% � 80% rate

45

50

40

--

TREF-SINGLEEND-SKEW

Skew between

--

REFCLKP and

REFCLKN

--

--

ZREF-SINGLEEND-DC

Reference clock input -- impedance � terminated mode

40

50

VREFIN-SE-PP

Input reference clock -- single-ended peak-topeak voltage

200

--

Max -- -- -- -- -- -- -- 522
Max 55 300 5
60
510

Unit dB dB dB dB dB dB dB fs
Unit % ps ps

mV
continued...

(82) Add an offset of 20 � log10(Fclk/156.25 MHz) dB to mask values, where Fclk is reference clock frequency. (83) The phase noise mask requirement between 20 MHz and 1 GHz excludes any harmonics power of the fundamental clock.

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Parameter VREFIN-CM-AC
VREFIN-IL-DC
VREFIN-IH-DC

Description

Condition

Input reference clock -- common-mode voltage when ACcoupled on board

Input reference clock -- input low voltage when DC-coupled on board

Input reference clock -- input high voltage when DC-coupled on board

Min 0.1 --

Typical Set on-chip
--
--

Table 66.

F-Tile FGT Reference Clock Input Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Parameter FREF

Description
Reference clock operating frequency

Condition --

Min 100(84)

Typical --

TREF-DUTY TREF-RISE/FALL

Duty cycle

--

Rising and falling edge 20% � 80% rate

45

50

--

--

TREF-SINGLEEND-SKEW

Skew between

--

REFCLKP and

REFCLKN

--

--

ZREF-DIFF-DC

Reference clock

--

differential input

impedance �

terminated mode

80

100

VREFIN-DIFF-AC

Input reference clock -- differential peak-topeak voltage when AC-coupled on board

0.6

1.2

Max
-- 0.9
Max 380 55 0.15 50 120 1.7

Unit --
V
V
Unit MHz
% TREF ps

Vpp-diff continued...

(84) This value is 100 MHz for down SSC (Spread Spectrum Clocking) clocking. This value can also be 25 MHz for HDMI rate of less than 1 Gbps.

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Parameter VREFIN-IL-DC VREFIN-IH-DC PNREF-SSB
VREFIN-RJ-RMS VREFIN-PPM-ERROR

Description

Condition

Input reference clock -- input low voltage when DC-coupled on board

Input reference clock -- input high voltage when DC-coupled on board

Reference clock measured single sideband phase noise mask including spurs must be smaller than phase noise mask(85)

10 kHz 100 kHz 500 kHz 3 MHz

10 MHz

20 MHz

1 GHz

RMS jitter integrated -- from 10 kHz � 20 MHz including spurs

Reference clock

--

frequency error

Min �0.15
0.66
-- -- -- -- -- -- -- --
�350 + SSC

Typical 0
0.7
�130 �138 �138 �140 �144 �146 �146
--
--

Max 0.15
0.85
-- -- -- -- -- -- -- 522
+350 + SSC

Table 67.

F-Tile FGT Reference Clock Output Driver Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Parameter

Description

Condition

Min

Typical

FREF_OUT

Reference clock

--

operating frequency

25

--

TREF-DUTY_OUT TREF-RISE_OUT/FALL_OUT

Duty cycle

--

Rising and falling edge 20% � 80% rate

45

50

--

--

Max 800
55 0.15

(85) Add an offset of 20 � log10(Fcc/Hzlk/156.25 MHz) dB to mask values, where Fclk is reference clock frequency.

Unit V
V
dBc/Hz dBc/Hz dBc/Hz dBc/Hz dBc/Hz dBc/Hz dBc/Hz
fs
ppm
Unit MHz
% TREF continued...

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Parameter TREF-SINGLEEND-SKEW ZREF-DIFF-DC_OUT
VREFIN-DIFF-AC_OUT
VREFIN-CM-OUT

Description

Skew between

--

REFCLKP and

REFCLKN

Reference clock

--

differential output

impedance �

terminated mode

Output reference clock -- differential peak to peak voltage when AC-coupled on board

Output reference clock -- common-mode

Condition

Min -- 80
0.9
0.45

F-Tile Transmitter Specifications

Table 68.

F-Tile FHT Transmitter Electrical Specifications
For specification status, see the Data Sheet Status table

Parameter

Symbol

Description

Output eye specifications

VTX-DIFF-PKPK

Transmit amplitude (low frequency)

VTX-DEEMP_STEP

Transmit tap resolution for c(0), c(1), and c(�1)

Transmit tap resolution for c(�2)

TTX-SLEW TTX-DJ TTX-RJ

Rise/fall time Even-odd jitter J3u(86) JRMS(86)

Min 800
0.5
0.5
8 -- -- --

(86) CDR bandwidth is at 4 MHz.
Intel� AgilexTM Device Data Sheet 66

Typical -- 100
1
0.5
Typical -- -- -- -- -- -- --

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Max 50
120

Unit ps


1.1

Vpp-diff

0.55

V

Max 1,200
5
2.5
-- 0.025 0.106 0.023

Unit mVdiff-pkpk
%
%
ps UIpkpk UIpkpk UIRMS continued...

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Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Parameter
Transmitter DC impedance

Symbol ZTX-DIFF-DC

ZTX-CM-DC

Transmitter return loss ZRL-DIFF-DC ZRL-DIFF-NYQ

ZRL-CMN

Electrical idle

VTX-IDLE VCM-DELTA-SQUELCH

TTX-IDLE-LATENCY

Description
Transmitter output differential DC impedance 100 W mode while configured
Transmitter output common-mode DC impedance
Transmitter differential DC return loss
Transmitter differential return loss at Nyquist frequency (FBAUD/2)
Transmitter commonmode return loss below 10 GHz
Idle output voltage
Maximum commonmode step entering/ exiting squelch mode
Latency entering/ exiting idle (cold boot)
Power state cycle (reestablish CM)

Table 69.

F-Tile FGT Transmitter Electrical Specifications
For specification status, see the Data Sheet Status table

Parameter

Symbol

Description

Output eye specifications

VTX-DIFF-PKPK

Back-porch transmit amplitude

VTX-EYE-PKPK

Transmit eye voltage opening

VTX-DEEMP_STEP

Transmit tap resolution

Min 80
20 -- -- -- -- -- -- --
Min 300 300
--

Send Feedback

Typical 100
25 -- -- -- -- -- -- --
Typical -- -- --

Max 120
30 �14.5
�8 �6 50 100 28 5

Unit W
W dB dB dB mVpkpk mV ms �s

Max 1,050 1,051
2

Unit mVdiff-pkpk mVdiff-pkpk
% continued...

Intel� AgilexTM Device Data Sheet 67

Parameter

Symbol DTX-N+2-DEEMP DTX-N+1-DEEMP DTX-N-1-DEEMP TTX-SLEW TTX-DJ TTX-RJ TTX-TJ

Transmitter DC impedance

ZTX-DIFF-DC

ZTX-CM-DC Transmitter return loss ZRL-DIFF-DC
ZRL-DIFF-NYQ

Description
N+2 precursor tap deemphasis
N+1 precursor tap deemphasis
N-1 postcursor tap deemphasis
Rise/fall time at 20%� 80%
Transmit deterministic jitter at 25 Gbps
Transmit total peakpeak random jitter(87)
Transmit total peakpeak jitter (TTX-TJ = TTX-DDJ + TTX-PJ + TTXRJ)(87)
Transmitter output differential DC impedance 100 W mode while configured(88)
Transmitter output common-mode DC impedance
Transmitter differential DC return loss
Transmitter differential return loss at Nyquist frequency (FBAUD/2)

Min 0 0 0 10 -- -- --
80
20 -- --

Typical -- -- -- -- -- -- --
100
25 -- --

(87) Assume a 1st order high-pass jitter measurement filter with a cutoff of Fbaud/Fgpll = Ngpll. (88) TX pins are driven to 0 V before mode configuration.
Intel� AgilexTM Device Data Sheet 68

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Max 2.5 4.5 6.5 20 0.15 0.15 0.28

Unit dB dB dB ps
UIpkpk UIpkpk UIpkpk

120

W

30

W

12

dB

�6

dB

continued...

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Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Parameter Electrical idle

Symbol ZRL-CMN
VTX-IDLE VCM-DELTA-SQUELCH
TTX-IDLE-LATENCY

Receiver detect

VTX-RCV-DETECT

Lane-to-lane output

--

skew

--

Description
Transmitter commonmode return loss below 10 GHz
Idle output voltage
Maximum commonmode step entering/ exiting squelch mode
Latency entering/ exiting idle (cold boot), power state cycle (re-establish CM)
Voltage change allowed during receiver detection
Lane count  8
Lane count = 16

F-Tile Receiver Specifications

Table 70.

F-Tile FHT Receiver Electrical Specifications
For specification status, see the Data Sheet Status table

Parameter

Symbol

Description

Receiver input eye specifications

VRX-DIFF-PKPK

Receiver input differential peak-topeak voltage

VRX-CM-DC

Receiver input DC
common-mode voltage(89)

VRX-MAX

Receiver input maximum voltage

Min -- -- -- --
-- -- --
Min Closed eye
100 --

Typical -- -- -- --
-- -- --
Typical -- 750 --

(89) Referenced to RX GND. This specification is also supported before mode configuration.
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Max �6 20 100 8
600 2 UI + 200 ps 2 UI + 300 ps

Unit dB
mVpkpk mV �s
mV ps ps

Max 1,200
900
1,200

Unit mVdiff-pkpk
mV
mV continued...

Intel� AgilexTM Device Data Sheet 69

Parameter

Symbol VRX-MIN
TRX-DDJ

TRX-RJ TRX-PJ

Equalizer specifications
Receiver return loss

TRX-TJ FPPM-OFFSET ZRL-DIFF-DC ZRL-DIFF-NYQ

ZRL-CM

Receiver DC impedance

RDIFF-DC RCM-DC

Description
Receiver input minimum voltage
Receive input signal data dependent jitter (inter-symbol interference)
Receive input random jitter
Receive input periodic jitter (at high frequency)
Receive input total jitter (DDJ + RJ + PJ)
Tolerable data frequency offset
Receiver differential DC return loss
Receiver differential return loss at Nyquist frequency (FBAUD/2)
Receiver commonmode return loss below 10 GHz
DC differential receive impedance
DC common-mode receive impedance

Min �200
--
-- --
-- �200
-- --
--
80 20

Typical -- --
-- --
-- -- -- --
--
100 25

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Max --
1

Unit mV
UIpkpk

0.15 0.05
1 200 �10 �6
�6
120 30

UIpkpk UIpkpk UIpkpk ppm
dB dB
dB
W W

Intel� AgilexTM Device Data Sheet 70

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Table 71.

F-Tile FGT Receiver Electrical Specifications
For specification status, see the Data Sheet Status table

Parameter

Symbol

Description

Receiver input eye specifications

VRX-DIFF-PKPK

Receiver input differential peak-topeak voltage

VRX-MAX

Receiver input maximum voltage(90)

VRX-MIN

Receiver input minimum voltage(90)

VRX-CM-DC

Receiver input DC
common-mode voltage(91)

TRX-RJ

Receive input random jitter

TRX-PJ

Receive input periodic jitter (at high frequency)

Insertion loss specifications

IINS-LOSS-56Gb/s

Insertion loss at 56
Gbps PAM42/BER <10�4

IINS-LOSS-53Gb/s

Insertion loss at 53
Gbps PAM42/BER <10�4

IINS-LOSS-30Gb/s

Insertion loss at 32 Gbps NRZ(93) /BER <10�12

Min -- --
�0.3 0 -- -- --
5(92) --

Typical -- -- -- -- -- -- -- -- --

Max 1,200
1 -- 700 0.15 0.05 30 -- 30

Unit mVdiff-pkpk
V V mV UIpkpk UIpkpk dB dB dB continued...

(90) VRX_MAX and VRX_MIN are before and after configuration.
(91) The specified common-mode range is supported when the receiver is powered and configured, powered and unconfigured, or unpowered. This specification is also supported before mode configuration. If squelch detect is used, receiver DC input common-mode voltage should be within 200 mV to 300 mV. Otherwise, use AC coupling capacitors on board.
(92) The minimum insertion loss specification assumes a PAM4 transmitter with 800 mVppd. For transmitters with output amplitude adjustment capabilities and can reduce output amplitude to below 800 mVppd, this minimum insertion loss can be further relaxed.

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Intel� AgilexTM Device Data Sheet 71

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Parameter

Symbol IINS-LOSS-25Gb/s

Receiver return loss

ZRL-DIFF-DC ZRL-DIFF-NYQ

ZRL-CM

Receiver DC impedance
Receiver signal detection(94)

RDIFF-DC RCM-DC VIDLE-THRESH

Description
Insertion loss at 25.78125 Gbps NRZ(93)/ BER <10�12
Receiver differential DC return loss
Receiver differential return loss at Nyquist frequency (FBAUD/2)
Receiver commonmode return loss below 10 GHz
DC differential receive impedance
DC common-mode receive impedance
Receiver signal detect input voltage threshold

F-Tile Electrical Compliance

Table 72.

F-Tile FHT Electrical Compliance List
For specification status, see the Data Sheet Status table

Specification/Clause

Protocol

IEEE 802.3bs 120D/120E

400GAUI-4

200GAUI-2

200GAUI-4

Min --
-- --
--
80 20 75

Typical --
-- --
--
100 25 120

PAM4 PAM4 PAM4

Encoding

Max 30
�12 �6
�6
120 30 175

Unit dB
dB dB
dB
W W mVdiff-pkpk

106.25 106.25 53.125

Lane Rate (Gbps) continued...

(93) 2COM compliant package and channel.
(94) Receiver signal detection values in this table are applicable to PCIe and similar standards, such as SATA, where a clock pattern like PCIe EIEOS 500 MHz clock pattern is used.

Intel� AgilexTM Device Data Sheet 72

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Specification/Clause IEEE 802.3cd 135G/135F
IEEE 802.3cd 109A/109B IEEE 802.3ck 163/162 CEI 4.0/5.0

Protocol 100GAUI-1 100GAUI-2 100GAUI-4 50GAUI-1 50GAUI-2 25GAUI-1 400GBASE-KR4/CR4 200GBASE-KR2/CR2 100GBASE-KR/CR OIF-CEI-112G XSR/VSR/MR/LR OIF-CEI-56G VSR/MR OIF-CEI-28G VSR/SR/MR OIF-25G

Table 73.

F-Tile FGT Electrical Compliance List
For specification status, see the Data Sheet Status table

Specification/Clause

Protocol

IEEE 802.3bs 120D/120E

400GAUI-8

400GAUI-16

200GAUI-4

200GAUI-8

IEEE 802.3cd 135G/135F

100GAUI-2

100GAUI-4

50GAUI-1

50GAUI-2

PAM4 PAM4 NRZ PAM4 NRZ NRZ PAM4 PAM4 PAM4 PAM4 PAM4 NRZ NRZ

Encoding

PAM4 NRZ PAM4 NRZ PAM4 NRZ PAM4 NRZ

Encoding

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Lane Rate (Gbps) 106.25 53.125 25.78125 53.125 25.78125 25.78125 106.25 106.25 106.25 96 � 116 48 � 58 24 � 29 24 � 29

Lane Rate (Gbps)

53.125

26.5625

53.125

26.5625

53.125

25.78125

53.125

26.5625

continued...

Intel� AgilexTM Device Data Sheet 73

Specification/Clause IEEE 802.3cd 109A/109B IEEE 802.3cd 137/136
IEEE 802.3bj/bm 93 IEEE 802.3bj/bm 92 IEEE 802.3bj/ba 85 IEEE 802.3bj/ba 84 IEEE 802.3ap 2007 IEEE 802.3ap 2008 IEEE 802.3by 111/110 CEI 4.0
G.709 G.sup56 G.sup43 G.sup58

Protocol 25GAUI-1 200GBASE-KR4/CR4 100GBASE-KR2/CR2 50GBASE-KR/CR 100GBASE-KR4 100GBASE-CR4 40GBASE-KR4 40GBASE-CR4 10GBASE-KR/CR 10GBASE-KX4 25GBASE-KR/CR CEI-56G VSR/MR/LR CEI-28G VSR/SR/MR IOF-CEI-25G LR CEI-11G SR/MR/LR CEI-6G SR/LR OTU0 OTU1 OTU1e OTU2/2e OTU2f OTU2r OTU3 OTU4(OTL4.4) OTU4(OTL4.10)

Intel� AgilexTM Device Data Sheet 74

NRZ PAM4 PAM4 PAM4 NRZ NRZ NRZ NRZ NRZ NRZ NRZ PAM4 NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ

Encoding

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Lane Rate (Gbps)

25.78125

53.125

53.125

53.125

25.78125

25.78125

10.3125

10.3125

10.3125

10.3125

25.78125

36 � 58

19.9 � 28.1

19.9 � 28.1

9.95 � 11.2

4.976 � 6.375

1.327451

2.666057

11.049107

10.709225/11.095728

11.317642

12.639086

4x10.754603

4x27.952493

10x11.180997

continued...

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Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
Specification/Clause G.709.1
G.709, G.709.4
PCIE BASE 4.0 SMPTE 259M SMPTE 292M SMPTE 372M SMPTE ST 2081 SMPTE ST 2082 CPRI V7.0

Protocol 100G FlexO-SR (FOIC1.4) 100G FlexO-SR (FOIC1.2) 100G FlexO-SR (FOIC2.4) 100G FlexO-SR (FOIC4.8) OTU25u OTU25 OTU50u (OTU50u.2-RS) OTU50u (OTU50u.1-RS) OTU50 (OTU50.2-RS) OTU50 PCIE SDI
CPRI

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NRZ PAM4 PAM4 PAM4 NRZ NRZ NRZ PAM4 NRZ PAM4 NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ

Encoding

Lane Rate (Gbps)

4x27.952369

2x55.904737

4x55.904737

8x55.904737

25.781651

27.952.493

2x26.562.914

53.125827

2x27.952493

55.904987

2.5, 5, 8, 16

0.27

1.485/1.483516484

2.97/2.967032967

5.94/5.934065934

11.88/11.868131868

1.2288

2.4576

3.072

4.9152

6.144

8.11008

9.8304

10.1376

12.16512

continued...

Intel� AgilexTM Device Data Sheet 75

Specification/Clause
JESD204A JESD204B JESD204C DP 2.0

Protocol
JESD204A JESD204B JESD204C DisplayPort 2.0

FC-PI-2
FC-PI-5
10GFC FC-PI-5 FC-PI-6 FC-PI-7 Serial ATA revision 3.0 T10/BSR INCITS 519 IEEE 802.3av IEEE 802.3ah

Fiber Channel
Sata Gen 1, 2, 3 SAS 1, 2, 3, 4 10G-EPON 1G-EPON

(95) JESD204B supports up to 19 Gbps.
Intel� AgilexTM Device Data Sheet 76

NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ NRZ PAM4 NRZ NRZ NRZ NRZ

Encoding

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
Lane Rate (Gbps) 24.33024 3.125 12.5(95) 28.9 1.62 2.7 5.4 8.1 10 13.5 20 1.0625 2.125 4.25 8.5 10.52 14.025 28.05 57.8 1, 3, 6 3, 6, 12, 22.5 10 1
continued...

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Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Specification/Clause G.984 CEI-6G-SR CEI-11G-SR CEI-11G-SR+ OIF-28G MR (OIF-CEI3.0) OIF-CEI 56G PAM4-MR JESD204C HDMI1.0-1.2a HDMI1.3-1.3a HDMI2.0-2.0b SFF8431 ITU-T G.8261 and G.8262 InfiniBandTM Architecture Specification RapidIOTM Interconnect Specification

GPON Interlaken

Protocol

SerialLite IV HDMI
SFP+ SyncE InfiniBand SRIO

NRZ NRZ NRZ NRZ NRZ PAM4 NRZ NRZ NRZ NRZ NRZ NRZ/PAM4 NRZ NRZ

Encoding

Lane Rate (Gbps) 1.25, 2.5, 10.3 6.25 10.3125 12.5 25.78125 53.125 32 4.95 10.2 18 9.8304 � 12.5 10, 25, 50 5, 10, 14.062, 25.78125 1.25, 2.5, 3.125, 6.25, 10.3125

HPS Performance Specifications
This section provides hard processor system (HPS) specifications and timing for Intel Agilex devices.

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HPS Clock Performance

Table 74.

Maximum HPS Clock Frequencies for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Performance

VCCL_HPS (V)

MPU Frequency (MHz)

L3 Frequency (MHz)
(l3_main_free_clk )

MPFE Frequency (MHz)

�1 speed grade

Fixed: 0.95

1,500

400

400

667

SmartVID

1,350

400

400

667

�2 speed grade

SmartVID

1,200

400

334

600

�3 speed grade

SmartVID

1,000

400

300

534

�4 speed grade

Fixed: 0.8

1,000

400

267

467

Rate
Quarter Half
Quarter Half
Quarter Half
Quarter Half
Quarter Half

Related Information
External Memory Interface Spec Estimator Provides the specific details of the maximum allowed SDRAM operating frequency.

HPS Internal Oscillator Frequency

Table 75.

HPS Internal Oscillator Frequency for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Description

Min

Typ

Internal oscillator frequency

150

300

Max 400

DDR Clock (MHz)

DDR (Mb/s per pin)

1,600 1,333 1,600 1,333 1,333 1,200 1,200 1,067 1,067
933

3,200 2,666 3,200 2,666 2,666 2,400 2,400 2,133 2,133 1,866

Unit MHz

Intel� AgilexTM Device Data Sheet 78

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HPS PLL Specifications

Table 76. HPS PLL Input Requirements for Intel Agilex Devices

The main HPS PLL receives its clock signals from the HPS_OSC_CLK pin. Refer to the Intel Agilex Device Family Pin Connection Guidelines for information about assigning this pin.

For specification status, see the Data Sheet Status table

Description Clock input range Clock input accuracy Clock input duty cycle

Min 25 -- 45

Typ -- -- 50

Max 125 50 55

Unit MHz ppm
%

Table 77.

HPS PLL Performance for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Description

Min

Main PLL VCO output

--

Peripheral PLL VCO output

--

h2f_user0_clk(96)

--

h2f_user1_clk(96)

--

Max 3,000 3,000 500 500

Unit MHz MHz MHz MHz

Related Information
Intel Agilex Device Family Pin Connection Guidelines Provides more information about the HPS_OSC_CLK pin assignment.

(96) The HPS PLL provides this clock to the FPGA fabric.
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Intel� AgilexTM Device Data Sheet 79

HPS Cold Reset

Table 78.

HPS Cold Reset for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

tRST0

Minimum time for

3

HPS_COLD_nRESET asserted(97)

HPS SPI Timing Characteristics

Table 79. SPI Master Timing Requirements for Intel Agilex Devices

You can adjust the input delay timing by programming the rx_sample_dly register.

For specification status, see the Data Sheet Status table

Symbol Tspi_ref_clk

Description
The period of the SPI internal reference clock, sourced from l4_main_clk

Min 2.5

Typ --

Tclk

SPIM_CLK clock period

16.67

--

Tdutycycle

SPIM_CLK duty cycle

45

50

Tck_jitter

SPIM_CLK output jitter

--

--

Tdio

Master-out slave-in

�3

--

(MOSI) output skew

Tdssfrst (98)

SPI_SS_N asserted to first

(1.5 � Tclk) � 2

--

SPIM_CLK edge

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Max --

Unit ms

Max --
-- 55 2 2 --

Unit ns
ns % % ns ns continued...

(97) HPS_COLD_nRESET may be ignored if HPS is not running or if the device is being configured. (98) SPI_SS_N behavior differs depending on Motorola SPI, TI SSP, or Microwire operational mode.
Intel� AgilexTM Device Data Sheet 80

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Symbol Tdsslst (98) Tsu (99)
Th (99)

Description
Last SPIM_CLK edge to SPI_SS_N deasserted
SPIM_MISO setup time with respect to SPIM_CLK capture edge
Input hold in respect to SPIM_CLK capture edge

Min Tclk � 2
5.0 � (rx_sample_dly � Tspi_ref_clk)(100)
1.3 + (rx_sample_dly � Tspi_ref_clk)

Typ -- --
--

Max -- --
--

Unit ns ns
ns

(99) The capture edge differs depending on the operational mode. For Motorola SPI, the capture edge can be the rising or falling edge depending on the scpol register bit; for TI SSP, the capture edge is the falling edge; for Microwire, the capture edge is the rising edge.
(100) Valid values of rx_sample_dly range from 1 to 64 (units are in Tspi_ref_clk steps).

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Intel� AgilexTM Device Data Sheet 81

Figure 4.

SPI Master Output Timing Diagram
scph* = 0
Tdssfrst SPI_SS

SPI_CLK (scpol = 0) SPI_CLK (scpol = 1)

SPI_MOSI

OUT0

SPI_MISO

Tdio (max) Tdio (min)
OUT1

scph* = 1
Tdssfrst SPI_SS

SPI_CLK (scpol = 0) SPI_CLK (scpol = 1)

SPI_MOSI

OUT0

SPI_MISO

Tdio (max) Tdio (min) OUT1

*Serial clock phase configuration bit, in the SPI controller's CTRLR0 register

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
Tdsslst OUTn
Tdsslst OUTn

Intel� AgilexTM Device Data Sheet 82

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Figure 5.

SPI Master Input Timing Diagram
scph* = 0

SPI_SS SPI_CLK (scpol = 0) SPI_CLK (scpol = 1)
SPI_MOSI

SPI_MISO

IN0

IN1

Tsu

Th

INn

scph* = 1

SPI_SS SPI_CLK (scpol = 0) SPI_CLK (scpol = 1)
SPI_MOSI
SPI_MISO

IN0

IN1

Tsu

Th

INn

*Serial clock phase configuration bit, in the SPI controller's CTRLR0 register

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Intel� AgilexTM Device Data Sheet 83

Table 80.

SPI Slave Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

Tspi_ref_clk

The period of the SPI

2.5

internal reference clock,

sourced from

l4_main_clk

Tclk Tdutycycle Td

SPIM_CLK clock period
SPIM_CLK duty cycle
Master-in slave-out (MISO) output skew

30 45 (2 � Tspi_ref_clk) + 3

Tsu

Master-out slave-in

4

(MOSI) setup time

Th

Master-out slave-in

9

(MOSI) hold time

Tsuss

SPI_SS_N asserted to first SPIM_CLK edge

Tspi_ref_clk + 4.2

Thss

Last SPIM_CLK edge to SPI_SS_N deasserted

Tspi_ref_clk + 4.2

Typ --
-- 50 -- -- -- -- --

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Max --
-- 55 (3 � Tspi_ref_clk) + 11 -- -- -- --

Unit ns
ns % ns ns ns ns ns

Intel� AgilexTM Device Data Sheet 84

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Figure 6.

SPI Slave Output Timing Diagram
scph* = 0

SPI_SS
SPI_CLK (scpol = 0) SPI_CLK (scpol = 1)

Td (max) Td (min)

SPI_MISO

OUT0

OUT1

OUTn

SPI_MOSI

scph* = 1

SPI_SS SPI_CLK (scpol = 0) SPI_CLK (scpol = 1)

Td (max) Td (min)

SPI_MISO

OUT0

OUT1

OUTn

SPI_MOSI

*Serial clock phase configuration bit, in the SPI controller's CTRLR0 register

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Figure 7.

SPI Slave Input Timing Diagram
scph* = 0

Tsuss SPI_SS

Thss

SPI_CLK (scpol = 0) SPI_CLK (scpol = 1)
SPI_MISO
SPI_MOSI

IN0

IN1

Ts

Th

INn

scph* = 1

Tsuss

SPI_SS

Thss

SPI_CLK (scpol = 0) SPI_CLK (scpol = 1)

SPI_MISO SPI_MOSI

IN0

IN1

Ts

Th

INn

*Serial clock phase configuration bit, in the SPI controller's CTRLR0 register

Intel� AgilexTM Device Data Sheet 86

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HPS SD/MMC Timing Characteristics

Table 81. HPS Secure Digital (SD)/MultiMediaCard (MMC) Timing Requirements for Intel Agilex Devices

These timings apply to SD, MMC, and embedded MMC (eMMC) cards operating at 1.8 V.

For specification status, see the Data Sheet Status table

Symbol

Description

Min

Tsdmmc_cclk

SDMMC_CCLK clock period (Identification mode)

2,500

SDMMC_CCLK clock period

40

(SDR12)

SDMMC_CCLK clock period

20

(SDR25)

Tdutycycle

SDMMC_CCLK duty cycle

45

Tsdmmc_cclk_jitter

SDMMC_CCLK output jitter

--

Tsdmmc_clk

Internal reference clock

5

before division by 4

Td

SDMMC_CMD/

�0.5 + Tsdmmc_clk �

SDMMC_DATA[7:0] output

drvsel/2

delay(101)

Tsu

SDMMC_CMD/

6 � (Tsdmmc_clk �

SDMMC_DATA[7:0] input

smplsel/2)

setup(102)

Th

SDMMC_CMD/

0.5 + (Tsdmmc_clk �

SDMMC_DATA[7:0] input

smplsel/2)

hold(102)

Typ -- -- -- 50 -- -- --
--
--

Max -- -- -- 55 2 --
2.5 + (Tsdmmc_clk � drvsel/2) --
--

Unit ns ns ns % % ns ns
ns
ns

None of the HPS I/Os supports 3 V mode, while SD/MMC cards must operate at 3 V at power on. eMMC devices can operate at 1.8 V at power on.

(101) When the drvsel bitfield in the sdmmc register is set to 3 (in the system manager) and the reference clock (sdmmc_clk) is 200 MHz for example, the output delay time is 7.5 to 10.5 ns.
(102) When the smplsel bitfield in the sdmmc register is set to 2 (in the system manager) and the reference clock (sdmmc_clk) is 200 MHz for example, the setup time is 1 ns and the hold time is 5.5 ns.

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Note: Figure 8.

SD cards power up at 3 V. To support SD, your design must include a level shifter between the SD card and the HPS SD/MMC interface.

SD/MMC Timing Diagram

SDMMC_CCLK SDMMC_CMD and SDMMC_DATA (Out) SDMMC_CMD and SDMMC_DATA (In)

Td
Command/Data Out

TSU Th
Command/Data In

HPS USB UPLI Timing Characteristics

Table 82.

HPS USB 2.0 Transceiver Macrocell Interface Plus (UTMI+) Low Pin Interface (ULPI) Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

Typ

Max

Unit

Tusb_clk

USB_CLK clock period

--

16.667

--

ns

Td

Clock to USB_STP/

2

--

7

ns

USB_DATA[7:0] output

delay

Tsu

Setup time for USB_DIR/

4

--

--

ns

USB_NXT/USB_DATA[7:0]

Th

Hold time for USB_DIR/

4

--

--

ns

USB_NXT/USB_DATA[7:0]

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Figure 9.

USB ULPI Timing Diagram
USB_CLK USB_STP

USB_DATA[7:0]

USB_DIR and USB_NXT

Td
To PHY

From PHY
TSU Th

Note:

The USB interface supports single data rate (SDR) timing only.

HPS Ethernet Media Access Controller (EMAC) Timing Characteristics

Table 83.

Reduced Gigabit Media Independent Interface (RGMII) TX Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

Typ

Max

Unit

Tclk (1000Base-T)

TX_CLK clock period

--

8

--

ns

Tclk (100Base-T)

TX_CLK clock period

--

40

--

ns

Tclk (10Base-T)

TX_CLK clock period

--

400

--

ns

Tdutycycle (1000Base-T)

TX_CLK duty cycle

45

50

55

%

Tdutycycle (10/100Base-T)

TX_CLK duty cycle

40

50

60

%

Td (103) (104)

TXD/TX_CTL to TX_CLK

�0.5

--

0.5

ns

output skew

(103) Rise and fall times depend on the I/O standard, drive strength, and loading. Intel recommends simulating your configuration.
(104) If you connect a PHY that does not implement clock-to-data skew, you can delay TX_CLK by 1.5--2.0 ns with the HPS I/O programmable delay, to meet the PHY's 1-ns data-to-clock skew requirement.

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Intel� AgilexTM Device Data Sheet 89

Figure 10.

RGMII TX Timing Diagram
TX_CLK TX_D[3:0]

TX_CTL

D0
Td

Table 84.

RGMII RX Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

Tclk (1000Base-T)

RX_CLK clock period

--

Tclk (100Base-T)

RX_CLK clock period

--

Tclk (10Base-T)

RX_CLK clock period

--

Tdutycycle (1000Base-T)

RX_CLK duty cycle

45

Tdutycycle (10/100Base-T)

RX_CLK duty cycle

40

Tsu

RX_D/RX_CTL to RX_CLK

1

setup time

Th (105)

RX_CLK to RX_D/RX_CTL

1

hold time

Typ 8 40
400 50 50 --
--

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
D1

Max -- -- -- 55 60 --
--

Unit ns ns ns % % ns
ns

(105) If you connect a PHY that does not implement clock-to-data skew, you can meet the HPS EMAC's 1 ns setup time by delaying RX_CLK by 1.5-2 ns, using the HPS I/O programmable delay.

Intel� AgilexTM Device Data Sheet 90

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Figure 11.

RGMII RX Timing Diagram
RX_CLK

RX_D[3:0] RX_CTL

TSU

Th

D0

D1

Table 85.

Reduced Media Independent Interface (RMII) Clock Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

Typ

Max

Tclk

REF_CLK clock period,

--

20

--

sourced by HPS TX_CLK

REF_CLK clock period,

--

20

--

sourced by external clock

source

Tdutycycle_int

Clock duty cycle, REF_CLK

35

50

65

sourced by TX_CLK

Tdutycycle_ext

Clock duty cycle, REF_CLK

35

50

65

sourced by external clock

source

Table 86.

RMII TX Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

Typ

Td

TX_CLK to TXD/TX_CTL

2

--

output data delay

Max 10

Unit ns ns % %
Unit ns

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Figure 12. RMII TX Timing Diagram

Reference Clock (RX_CLK) (1)

TX_D[1:0]

D0

D1

Td
TX_CTL
Note: 1. For RMII mode, RX_CLK is always used as the reference clock. Refer to the HPS-to-PHY Interface Diagram in the Intel Agilex Hard
Processor System Technical Reference Manual for example system-level topologies.

Table 87.

RMII RX Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

Typ

Tsu

RX_D/RX_CTL setup time

2

--

Th

RX_D/RX_CTL hold time

1

--

Figure 13.

RMII RX Timing Diagram
Reference Clock (RX_CLK) (1)

Max -- --

Unit ns ns

TSU

Th

RX_D[1:0]

D0

D1

RX_CTL
Note: 1. For RMII mode, RX_CLK is always used as the reference clock. Refer to the HPS-to-PHY Interface Diagram in the Intel Agilex Hard
Processor System Technical Reference Manual for example system-level topologies.

Intel� AgilexTM Device Data Sheet 92

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Table 88.

Management Data Input/Output (MDIO) Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

Typ

Max

Tclk

MDC clock period

400

--

--

Td

MDC to MDIO output data

10

--

300

delay

Tsu

Setup time for MDIO data

10

--

--

Th

Hold time for MDIO data

0

--

--

Figure 14.

MDIO Timing Diagram
MDC

MDIO_OUT

Td
Dout0

Dout1

MDIO_IN

TSU

Th

Din0

Related Information
HPS-to-PHY Interface Diagrams section, Intel Agilex Hard Processor System Technical Reference Manual Provides the example system-level topologies.

Unit ns ns
ns ns

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HPS I2C Timing Characteristics

Table 89.

HPS I2C Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Standard Mode

Min

Max

Tclk
Tclk_jitter THIGH (106) TLOW (109) TSU;DAT
THD;DAT (112)

Serial clock (SCL) clock period
I2C clock output jitter
SCL high period
SCL low period
Setup time for serial data line (SDA) data to SCL
Hold time for SCL to SDA data

10
-- 4(107) 4.7(110) 0.25
0

-- 2 -- -- --
3.15

Min 2.5

Fast Mode

Max --

--

2

0.6(108)

--

1.3(111)

--

0.1

--

0

0.6

Unit
s % s s s
s continued...

(106) You can adjust Thigh using the ic_ss_scl_hcnt or ic_fs_scl_hcnt register.
(107) The recommended minimum setting for ic_ss_scl_hcnt is 428. Refer to the SCL_High_time equation in the Intel Agilex Hard Processor System Technical Reference Manual.
(108) The recommended minimum setting for ic_fs_scl_hcnt is 75. Refer to the SCL_High_time equation in the Intel Agilex Hard Processor System Technical Reference Manual.
(109) You can adjust Tlow using the ic_ss_scl_lcnt or ic_fs_scl_lcnt register.
(110) The recommended minimum setting for ic_ss_scl_lcnt is 464. Refer to the SCL_Low_time equation in the Intel Agilex Hard Processor System Technical Reference Manual.
(111) The recommended minimum setting for ic_fs_scl_lcnt is 163. Refer to the SCL_Low_time equation in the Intel Agilex Hard Processor System Technical Reference Manual.
(112) THD;DAT is affected by the rise and fall time.

Intel� AgilexTM Device Data Sheet 94

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Symbol

Description

TVD;DAT and TVD;ACK
(113)
TSU;STA
THD;STA
TSU;STO TBUF
Tscl:r (116) Tscl:f (116) Tsda:r (116) Tsda:f (116)

SCL to SDA output data delay
Setup time for a repeated start condition
Hold time for a repeated start condition
Setup time for a stop condition
SDA high pulse duration between STOP and START
SCL rise time
SCL fall time
SDA rise time
SDA fall time

Standard Mode

Min

Max

--

3.45(114)

4.7

--

4

--

4

--

4.7

--

--

1,000

--

300

--

1,000

--

300

Min --

Fast Mode Max
0.9(115)

0.6

--

0.6

--

0.6

--

1.3

--

20

300

6.54

300

20

300

6.54

300

Unit
s s
s
s s
ns ns ns ns

(113) TVD;DAT and TVD;ACK are affected by the rise and fall time, as well as the SDA hold time (set by adjusting the ic_sda_hold register). (114) Use maximum SDA_HOLD = 240 to be within the specification.
(115) Use maximum SDA_HOLD = 60 to be within the specification.
(116) Rise and fall time parameters vary depending on external factors such as the characteristics of the I/O driver, pull-up resistor value, and total capacitance on the transmission line.

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Figure 15. I2C Timing Diagram

tf

tr

tSU;DAT

SDA

70% 30%

tf

tHD;DAT

tr

tHIGH

tVD;DAT

SCL

70% 30%

tHD;STA

Tclk

tLOW

SDA tSU;STA
SCL

tHD;STA

tBUF

70% 30%

tVD;ACK

tSU;STO

70% 30%

Related Information
Clock Synchronization section, Intel Agilex Hard Processor System Technical Reference Manual Provides the SCL high and low time equations.

Intel� AgilexTM Device Data Sheet 96

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HPS NAND Timing Characteristics

Table 90.

HPS NAND ONFI 1.0 Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol TWP (117) TWH (117) TRP (117) TREH (117) TCLS (117)
TCLH (117)
TCS (117)
TCH (117)
TALS (117)
TALH (117)
TDS (117) TDH (117) TWB (117) TCEA

Description
Write enable pulse width
Write enable hold time
Read enable pulse width
Read enable hold time
Command latch enable to write enable setup time
Command latch enable to write enable hold time
Chip enable to write enable setup time
Chip enable to write enable hold time
Address latch enable to write enable setup time
Address latch enable to write enable hold time
Data to write enable setup time
Data to write enable hold time
Write enable high to R/B low
Chip enable to data access time

Min 10 7 10 7 10
5
15
5
10
5
7 5 -- --

Max -- -- -- -- --
--
--
--
--
--
-- -- 200 100

Unit ns ns ns ns ns
ns
ns
ns
ns
ns
ns ns ns ns
continued...

(117) This timing is software programmable. Refer to the NAND Flash Controller chapter in the Intel Agilex Hard Processor System Technical Reference Manual for more information about software-programmable timing in the NAND flash controller.

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Intel� AgilexTM Device Data Sheet 97

TREA TRHZ
TRR

Symbol

Description
Read enable to data access time
Read enable to data high impedance
Ready to read enable low

Figure 16. NAND Command Latch Timing Diagram

CLE

CE

WE ALE

IO0-7 R/B

Min -- --
20

Max 40 200
--

tCLS

tCLH

tCS

tCH

tWP

tALS

tALH

tDS

tDH

Command

tWB

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
Unit ns ns ns

Intel� AgilexTM Device Data Sheet 98

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Figure 17. NAND Address Latch Timing Diagram
CLE
CE WE
ALE IO0-7

tCLS

tCS

tWP tWH

tALS

tALH

tDS

tDH

Address

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Intel� AgilexTM Device Data Sheet 99

Figure 18. NAND Data Output Cycle Timing Diagram
CLE

CE

tWP

tWP

WE

tWH

ALE

tALS

tDS tDH

IOx

DOUT 0

Figure 19. NAND Data Input Cycle Timing Diagram

tCEA CE

tRP

RE

tREH

tRR

R/B

tREA

tRHZ

IOx

DIN 0

tDS tDH DOUT 1

tRP

tREA

tRHZ

DIN 1

Intel� AgilexTM Device Data Sheet 100

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
tCLH tCH tWP
tDS tDH DOUT n

tRP

tREA

tRHZ

DIN n

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Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
Figure 20. NAND Data Input Timing Diagram for Extended Data Output (EDO) Cycle

CE

tRP

RE

tREH

tRR

R/B

tREA

tREA

IOx

DIN 0

DIN 1

tCEA

tRHZ DIN n

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Intel� AgilexTM Device Data Sheet 101

Figure 21. NAND Read Status Timing Diagram

CLE

tCLS

tCLH

tCS

tCH

CE

WE

tWP

RE

tDS

tDH

IO0-7

70h

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
tCEA
tRHZ Status tREA

Intel� AgilexTM Device Data Sheet 102

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Figure 22.

NAND Read Status Enhanced Timing Diagram

CLE

tCLS

tCLH

tCS CE

tWP

WE

tALH

tALtSWP

tWH

ALE

RE tDS tDH

IO0-7

78h

R1

R2

tCH tALH
R3

tCEA

tREA

tRHZ

Status

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HPS Trace Timing Characteristics

Table 91. Trace Timing Requirements for Intel Agilex Devices

To increase the trace bandwidth, Intel recommends routing the trace interface to the FPGA in the HPS Platform Designer component. The FPGA trace interface offers a 64-bit single data rate path that can be converted to double data rate to minimize FPGA I/O usage.

Depending on the trace module that you connect to the HPS trace interface, you may need to include board termination to achieve the maximum sampling speed possible. Refer to your trace module data sheet for termination recommendations.

Most trace modules implement programmable clock and data skew, to improve trace data timing margins. Alternatively, you can change the clock-to-data timing relationship with the HPS programmable I/O delay.

For specification status, see the Data Sheet Status table

Symbol

Description

Min

Tclk Tclk_jitter Tdutycycle

Trace clock period
Trace clock output jitter
Trace clock maximum duty cycle

6.667 -- 45

Td

Tclk to D0�D15 output data

�0.5

delay

Typ -- -- 50
--

Max -- 2 55
1.3

Unit ns % %
ns

Figure 23. Trace Timing Diagram

Clock (DDR)

Trace Data (DDR) Td

Intel� AgilexTM Device Data Sheet 104

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HPS GPIO Interface
The general-purpose I/O (GPIO) interface has debounce circuitry included to remove signal glitches. The debounce clock frequency ranges from 125 Hz to 32 kHz. The minimum pulse width is 1 debounce clock cycle and the minimum detectable GPIO pulse width is 62.5 �s (at 32 kHz).
If the external signal is driven into the GPIO for less than one clock cycle, the external signal is filtered. If the external signal is between one and two clock cycles, the external signal may or may not be filtered depending on the phase of the signal. If the external signal is more than two clock cycles, the external signal is not filtered.

HPS JTAG Timing Characteristics

Table 92.

HPS JTAG Timing Requirements for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Min

tJCP tJCH tJCL tJPSU (TDI) tJPSU (TMS) tJPH tJPCO tJPZX

TCK clock period TCK clock high time TCK clock low time TDI JTAG port setup time TMS JTAG port setup time JTAG port hold time JTAG port clock to output JTAG port high impedance to valid output

41.66 20 20 5 5 0.5 0 --

tJPXZ

JTAG port valid output to

--

high impedance

Typ -- -- -- -- -- -- -- --
--

Max -- -- -- -- -- -- 8 10
10

Unit ns ns ns ns ns ns ns ns
ns

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Intel� AgilexTM Device Data Sheet 105

Figure 24. HPS JTAG Timing Diagram

TMS

TDI

tJCP

tJCH

tJCL

TCK tJPZX

TDO

tJPSU

tJPH

tJPCO

tJPXZ

HPS Programmable I/O Timing Characteristics

Table 93.

HPS Programmable I/O Delay (Output Path) for Intel Agilex Device
For specification status, see the Data Sheet Status table

Name

output_val_en

output_val

Description

Min

ZERO_CHAIN_DEL 0

0

Intrinsic I/O delay.

--

AY

Bypasses the delay

chain

CHAIN_DELAY

1

0

Intrinsic I/O delay

--

+ Minimum + 0 �

Chain Delay

ONE_CHAIN_DELA 1

1

Intrinsic I/O delay

--

Y

+ Minimum + 1 �

Chain Delay

TWO_CHAIN_DELA 1

2

Intrinsic I/O delay

--

Y

+ Minimum + 2 �

Chain Delay

THREE_CHAIN_DEL 1

3

Intrinsic I/O delay

--

AY

+ Minimum + 3 �

Chain Delay

FOUR_CHAIN_DEL 1

4

Intrinsic I/O delay

--

AY

+ Minimum + 4 �

Chain Delay

Typ 0 0
422 518 607 705

Intel� AgilexTM Device Data Sheet 106

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Max -- -- -- -- -- --

Unit ps ps ps ps ps ps
continued...
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Name

output_val_en

FIVE_CHAIN_DELA 1 Y

output_val 5

SIX_CHAIN_DELAY 1

6

SEVEN_CHAIN_DEL 1

7

AY

EIGHT_CHAIN_DEL 1

8

AY

NINE_CHAIN_DELA 1

9

Y

TEN_CHAIN_DELAY 1

10

ELEVEN_CHAIN_DE 1 LAY

TWELVE_CHAIN_D 1 ELAY

THIRTEEN_CHAIN_ 1 DELAY

FOURTEEN_CHAIN 1 _DELAY

FIFTEEN_CHAIN_D 1 ELAY

--

1

--

2

11 12 13 14 15 [16:30] --

Description
Intrinsic I/O delay + Minimum + 5 � Chain Delay
Intrinsic I/O delay + Minimum + 6 � Chain Delay
Intrinsic I/O delay + Minimum + 7 � Chain Delay
Intrinsic I/O delay + Minimum + 8 � Chain Delay
Intrinsic I/O delay + Minimum + 9 � Chain Delay
Intrinsic I/O delay + Minimum + 10 � Chain Delay
Intrinsic I/O delay + Minimum + 11 � Chain Delay
Intrinsic I/O delay + Minimum + 12 � Chain Delay
Intrinsic I/O delay + Minimum + 13 � Chain Delay
Intrinsic I/O delay + Minimum + 14 � Chain Delay
Intrinsic I/O delay + Minimum + 15 � Chain Delay
INVALID
INVALID

Min -- -- -- -- -- -- -- -- -- -- -- -- --

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Typ 786 874 955 1,042 1,126 1,214 1,296 1,382 1,462 1,552 1,626 -- --

Max -- -- -- -- -- -- -- -- -- -- -- -- --

Unit ps ps ps ps ps ps ps ps ps ps ps -- --
continued...

Intel� AgilexTM Device Data Sheet 107

Name

output_val_en

--

3

SIXTEEN_CHAIN_D 3 ELAY

output_val [0:15] 16

SEVENTEEN_CHAIN 3

17

_DELAY

EIGHTEEN_CHAIN_ 3

18

DELAY

NINETEEN_CHAIN_ 3

19

DELAY

TWENTY_CHAIN_D 3

20

ELAY

TWENTYONE_CHAI 3

21

N_DELAY

TWENTYTWO_CHAI 3

22

N_DELAY

TWENTYTHREE_CH 3

23

AIN_DELAY

TWENTYFOUR_CHA 3

24

IN_DELAY

TWENTYFIVE_CHAI 3

25

N_DELAY

TWENTYSIX_CHAIN 3

26

_DELAY

Description
INVALID
Intrinsic I/O delay + Minimum + 16 � Chain Delay
Intrinsic I/O delay + Minimum + 17 � Chain Delay
Intrinsic I/O delay + Minimum + 18 � Chain Delay
Intrinsic I/O delay + Minimum + 19 � Chain Delay
Intrinsic I/O delay + Minimum + 20 � Chain Delay
Intrinsic I/O delay + Minimum + 21 � Chain Delay
Intrinsic I/O delay + Minimum + 22 � Chain Delay
Intrinsic I/O delay + Minimum + 23 � Chain Delay
Intrinsic I/O delay + Minimum + 24 � Chain Delay
Intrinsic I/O delay + Minimum + 25 � Chain Delay
Intrinsic I/O delay + Minimum + 26 � Chain Delay

Min -- -- -- -- -- -- -- -- -- -- -- --

Intel� AgilexTM Device Data Sheet 108

Typ --
1,798 1,885 1,967 2,054 2,137 2,222 2,305 2,395 2,475 2,564 2,644

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Max -- -- -- -- -- -- -- -- -- -- -- --

Unit -- ps ps ps ps ps ps ps ps ps ps ps
continued...

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Name

output_val_en

TWENTYSEVEN_CH 3 AIN_DELAY

output_val 27

TWENTYEIGHT_CH 3

28

AIN_DELAY

TWENTYNINE_CHA 3

29

IN_DELAY

THIRTY_CHAIN_DE 3

30

LAY

Description
Intrinsic I/O delay + Minimum + 27 � Chain Delay
Intrinsic I/O delay + Minimum + 28 � Chain Delay
Intrinsic I/O delay + Minimum + 29 � Chain Delay
Intrinsic I/O delay + Minimum + 30 � Chain Delay

Min -- -- -- --

Table 94.

HPS Programmable I/O Delay (Input Path) for Intel Agilex Device
For specification status, see the Data Sheet Status table

Name

input_val_en

input_val

Description

Min

ZERO_CHAIN_DEL 0

0

Intrinsic I/O delay.

--

AY

Bypasses the delay

chain

CHAIN_DELAY

1

0

Intrinsic I/O delay

--

+ Minimum + 0 �

Chain Delay

ONE_CHAIN_DELA 1

1

Intrinsic I/O delay

--

Y

+ Minimum + 1 �

Chain Delay

TWO_CHAIN_DELA 1

2

Intrinsic I/O delay

--

Y

+ Minimum + 2 �

Chain Delay

THREE_CHAIN_DEL 1

3

Intrinsic I/O delay

--

AY

+ Minimum + 3 �

Chain Delay

FOUR_CHAIN_DEL 1

4

Intrinsic I/O delay

--

AY

+ Minimum + 4 �

Chain Delay

Typ 2,732 2,808 2,901 2,979
Typ 0 0
422 518 607 705

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Max -- -- -- --

Unit ps ps ps ps

Max -- -- -- -- -- --

Unit ps ps ps ps ps ps
continued...

Intel� AgilexTM Device Data Sheet 109

Name

input_val_en

FIVE_CHAIN_DELA 1 Y

input_val 5

SIX_CHAIN_DELAY 1

6

SEVEN_CHAIN_DEL 1

7

AY

EIGHT_CHAIN_DEL 1

8

AY

NINE_CHAIN_DELA 1

9

Y

TEN_CHAIN_DELAY 1

10

ELEVEN_CHAIN_DE 1 LAY

TWELVE_CHAIN_D 1 ELAY

THIRTEEN_CHAIN_ 1 DELAY

FOURTEEN_CHAIN 1 _DELAY

FIFTEEN_CHAIN_D 1 ELAY

--

1

--

2

11 12 13 14 15 [16:30] --

Description
Intrinsic I/O delay + Minimum + 5 � Chain Delay
Intrinsic I/O delay + Minimum + 6 � Chain Delay
Intrinsic I/O delay + Minimum + 7 � Chain Delay
Intrinsic I/O delay + Minimum + 8 � Chain Delay
Intrinsic I/O delay + Minimum + 9 � Chain Delay
Intrinsic I/O delay + Minimum + 10 � Chain Delay
Intrinsic I/O delay + Minimum + 11 � Chain Delay
Intrinsic I/O delay + Minimum + 12 � Chain Delay
Intrinsic I/O delay + Minimum + 13 � Chain Delay
Intrinsic I/O delay + Minimum + 14 � Chain Delay
Intrinsic I/O delay + Minimum + 15 � Chain Delay
INVALID
INVALID

Min -- -- -- -- -- -- -- -- -- -- -- -- --

Intel� AgilexTM Device Data Sheet 110

Typ 786 874 955 1,042 1,126 1,214 1,296 1,382 1,462 1,552 1,626 -- --

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Max -- -- -- -- -- -- -- -- -- -- -- -- --

Unit ps ps ps ps ps ps ps ps ps ps ps -- --
continued...

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Name

input_val_en

--

3

SIXTEEN_CHAIN_D 3 ELAY

input_val [0:15] 16

SEVENTEEN_CHAIN 3

17

_DELAY

EIGHTEEN_CHAIN_ 3

18

DELAY

NINETEEN_CHAIN_ 3

19

DELAY

TWENTY_CHAIN_D 3

20

ELAY

TWENTYONE_CHAI 3

21

N_DELAY

TWENTYTWO_CHAI 3

22

N_DELAY

TWENTYTHREE_CH 3

23

AIN_DELAY

TWENTYFOUR_CHA 3

24

IN_DELAY

TWENTYFIVE_CHAI 3

25

N_DELAY

TWENTYSIX_CHAIN 3

26

_DELAY

Description
INVALID
Intrinsic I/O delay + Minimum + 16 � Chain Delay
Intrinsic I/O delay + Minimum + 17 � Chain Delay
Intrinsic I/O delay + Minimum + 18 � Chain Delay
Intrinsic I/O delay + Minimum + 19 � Chain Delay
Intrinsic I/O delay + Minimum + 20 � Chain Delay
Intrinsic I/O delay + Minimum + 21 � Chain Delay
Intrinsic I/O delay + Minimum + 22 � Chain Delay
Intrinsic I/O delay + Minimum + 23 � Chain Delay
Intrinsic I/O delay + Minimum + 24 � Chain Delay
Intrinsic I/O delay + Minimum + 25 � Chain Delay
Intrinsic I/O delay + Minimum + 26 � Chain Delay

Min -- -- -- -- -- -- -- -- -- -- -- --

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Typ --
1,798 1,885 1,967 2,054 2,137 2,222 2,305 2,395 2,475 2,564 2,644

Max -- -- -- -- -- -- -- -- -- -- -- --

Unit -- ps ps ps ps ps ps ps ps ps ps ps
continued...

Intel� AgilexTM Device Data Sheet 111

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Name

input_val_en

TWENTYSEVEN_CH 3 AIN_DELAY

input_val 27

TWENTYEIGHT_CH 3

28

AIN_DELAY

TWENTYNINE_CHA 3

29

IN_DELAY

THIRTY_CHAIN_DE 3

30

LAY

Description
Intrinsic I/O delay + Minimum + 27 � Chain Delay
Intrinsic I/O delay + Minimum + 28 � Chain Delay
Intrinsic I/O delay + Minimum + 29 � Chain Delay
Intrinsic I/O delay + Minimum + 30 � Chain Delay

Min -- -- -- --

Typ 2,732 2,808 2,901 2,979

Max -- -- -- --

Unit ps ps ps ps

You can program the number of delay steps by adjusting the I/O Delay register (io0_delay through io47_delay for I/Os 0 through 47).

Configuration Specifications

General Configuration Timing Specifications

Table 95.
tCF12ST1 tCF02ST0

General Configuration Timing Specifications for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Requirement

Min

nCONFIG high to nSTATUS high

--

nCONFIG low to nSTATUS low

--

(security features not enabled)

nCONFIG low to nSTATUS low

--

(security features enabled)

Max 20 400
TBD(118)

Unit
ms ms ms
continued...

(118) The maximum time is longer if you enable the security features. The security features and specification will be available in a future release.

Intel� AgilexTM Device Data Sheet 112

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Symbol

Description

tST0 tCD2UM (119) tST12CF0
tST02CF1

nSTATUS low pulse during configuration error
CONF_DONE high to user mode
Minimum time to drive nCONFIG from high to low after nSTATUS transitions from low to high
Minimum time to drive nCONFIG from low to high after nSTATUS transitions from high to low

Figure 25. General Configuration Timing Diagram

Reconfiguration Triggered

tST02CF1
Reconfiguration

nCONFIG nSTATUS CONF_DONE INIT_DONE Configuration_State User Mode Device Clean Idle

tCF12ST1
Configuration

Min 0.5 -- 0
0

Requirement

Max 10 5 --
--

Unit ms ms ms
ms

tST0

tST12CF0

tCF02ST0

Configuration Error

tCD2UM
Recovered Reconfiguration

Err Configuration Fail Device Clean Idle Configuration Initialization User Mode

POR Specifications
Power-on reset (POR) delay is defined as the delay between the time when all the power supplies monitored by the POR circuitry reach the minimum recommended operating voltage to the time when the nSTATUS is released high and your device is ready to begin configuration.

(119) This specification is the initialization time that indicates the time from CONF_DONE signal goes high to INIT_DONE signal goes high.

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Table 96.

POR Delay Specification for Intel Agilex Devices
For specification status, see the Data Sheet Status table

POR Delay

Minimum

AS (Normal mode), AVST �8, AVST �16, AVST �32

11.5

AS (Fast mode)

1.5

Maximum 20.2
7.6

External Configuration Clock Source Requirements

Table 97.

External Configuration Clock Source (OSC_CLK_1) Clock Input Requirements
For specification status, see the Data Sheet Status table

Description
Clock input frequency(120)
Clock input peak-to-peak period jitter tolerance

External Clock Source Powered by VCCIO_SDM

Min --

Typ 25/100/125
--

Clock input duty cycle

45

50

Max 2 55

JTAG Configuration Timing

Table 98.
tJCP tJCH

JTAG Timing Parameters and Values for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Requirement

Minimum

TCK clock period

30

TCK clock high time

14

Maximum -- --

Unit ms ms
Unit MHz
% %
Unit ns ns continued...

(120) The acceptable clock frequencies are 25 MHz, 100 MHz, and 125 MHz only. You must match the external configuration clock frequency on the OSC_CLK_1 pin to the configuration clock source assignment in the Intel Quartus Prime software. Other frequencies in the range are not supported.

Intel� AgilexTM Device Data Sheet 114

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Symbol
tJCL tJPSU (TDI) (121) tJPSU (TMS) (121) tJPH (121) tJPCO tJPZX
tJPXZ

Description
TCK clock low time TDI JTAG port setup time TMS JTAG port setup time JTAG port hold time JTAG port clock to output JTAG port high impedance to valid output JTAG port valid output to high impedance

Minimum 14 2 3 5 -- --

Requirement

Maximum -- -- -- --
7(122) 14

--

14

Figure 26. JTAG Timing Diagram
TMS

TDI

tJCP

tJCH

tJCL

TCK tJPZX

TDO

tJPSU

tJPH

tJPCO

tJPXZ

Unit
ns ns ns ns ns ns
ns

(121) For boundary-scan testing, the TMS and TDI JTAG ports minimum setup time and hold time are 7 ns. (122) Capacitance loading at 10 pF.
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AS Configuration Timing

Table 99. AS Timing Parameters for Intel Agilex Devices

Intel recommends performing trace length matching for nCSO and AS_DATA pins to AS_CLK to minimize the skew. The maximum tolerance for skew between nCSO and AS_CLK is recommended to be less than 200 ps. The tolerance for skew between AS_CLK to AS_DATA must be within �200 ps.

For specification status, see the Data Sheet Status table

Symbol Tclk (123) Tdutycycle Tdcsfrs
Tdcslst

Description
AS_CLK clock period
AS_CLK duty cycle
AS_nCSO[3:0] asserted to first AS_CLK edge
Last AS_CLK edge to AS_nCSO[3:0] deasserted

Minimum -- 45
8.5(124)
6.8(124)

Typical 6.02 50 --
--

Maximum -- 55 --
--

Unit ns % ns
ns
continued...

(123) AS_CLK fMAX has dependency on the maximum board loading. For AS single device configuration or AS using multiple serial flash devices configuration, use the equations in Tdo and Text_delay notes to ensure your board has sufficient timing margin to meet flash setup/hold time specifications and Intel Agilex AS timing specifications in the Intel Agilex Device Datasheet. For AS using multiple serial flash devices, refer to the Intel Agilex Configuration User Guide for the recommended AS_CLK frequency and maximum board loading.
(124) AS operating at maximum clock frequency = 166 MHz. The delay is larger when operating at AS clock frequency lower than 166 MHz.

Intel� AgilexTM Device Data Sheet 116

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Symbol Tdo (125) Text_delay (126) (127) Tdcsb2b

Description
AS_DATA[3:0] output delay
Total external propagation delay on AS signals
Minimum delay of slave select deassertion between two back-to-back transfers

Minimum �0.6 0 62

Figure 27.

AS Configuration Serial Output Timing Diagram

nCSO

T T dcsfrs do (min)

Tdo (max)

AS_CLK

AS_DATA

OUT0

Typical -- -- --
OUT1

Maximum 0.6 13.5 --
Tdcslst
OUTn

Unit ns ns ns

(125) Load capacitance for DCLK = 12 pF and AS_DATA = 27 pF. Intel recommends obtaining the Tdo for a given link (including receiver, transmission lines, connectors, termination resistors, and other components) through IBIS or HSPIC simulation. To analyze flash setup time, � Tsu = Tclk/2 - Tdo(max) + Tbd_clk � Tbd_data(max) � Tho = Tclk/2 + Tdo(min) � Tbd_clk + Tbd_data(min)
(126) Text_delay = Tbd_clk + Tco + Tbd_data + Tadd
� Tbd_clk: Propagation delay for AS_CLK between FPGA and flash device. � Tco: Output hold time and clock low to output valid of flash device. This delay must be used to ensure Text_delay is within the
minimum and maximum specification values. � Tbd_data: Propagation delay for AS_DATA bus between FPGA and flash device. � Tadd: Propagation delay for active/passive components on AS_DATA interfaces.
(127) Text_delay specification is based on AS_CLK = 166 MHz. The value can be larger at lower AS_CLK frequency. For more details, refer to the Intel Agilex Configuration User Guide.

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Figure 28. AS Configuration Serial Input Timing Diagram

nCSO AS_CLK
AS_DATA

Text_delay

IN0

IN1

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
Tdcsb2b
INn

Related Information
Intel Agilex Configuration User Guide Provides more information about AS_CLK.

Avalon Streaming (Avalon-ST) Configuration Timing

Table 100. Avalon-ST Timing Parameters for x8, �16, and �32 Configurations in Intel Agilex Devices
For specification status, see the Data Sheet Status table

Symbol

Description

Minimum

tACLKH tACLKL tACLKP tADSU (128)

AVST_CLK high time

3.6

AVST_CLK low time

3.6

AVST_CLK period

8

AVST_DATA setup time before rising

2.1

edge of AVST_CLK

Unit ns ns ns ns
continued...

(128) Data sampled by the FPGA (sink) at the next rising clock edge.
Intel� AgilexTM Device Data Sheet 118

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tADH (128) tAVSU tAVDH

Symbol

Description
AVST_DATA hold time after rising edge of AVST_CLK
AVST_VALID setup time before rising edge of AVST_CLK
AVST_VALID hold time after rising edge of AVST_CLK

Figure 29.

Avalon-ST Configuration Timing Diagram

tACLKP

tACLKH

tACLKL

AVSTx8_CLK or AVST_CLK

AVST_READY or AVSTx8_READY

tAVSU

tAVDH

AVSTx8_VALID or AVST_VALID
AVSTx8_DATA[7:0] AVST_DATA[15:0] AVST_data[31:0]]

tADSU

tADH

data0 data1 data2 data3

Minimum 0.1 2.1 0
must deassert within 6 cycles

Unit ns ns ns

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Configuration Bit Stream Sizes

Table 101. Configuration Bit Stream Sizes for Intel Agilex Devices

Configuration bit stream sizes shown in this table are based on worst-case scenarios. The sizes are typically substantially smaller because of the use of the Intel bit stream compression. The Intel bit stream compression efficiency has dependency on your design complexity.

For specification status, see the Data Sheet Status table Variant
AGF 006, AGF 008 AGF 012, AGF 014 AGF 019, AGF 023, AGI 019, AGI 023 AGF 022, AGF 027, AGI 022, AGI 027

Compressed Configuration Bit Stream Size (Mbits) 238 511 628 928

I/O Timing
I/O timing data is typically used prior to designing the FPGA to get an estimate of the timing budget as part of the timing analysis. You may generate the I/O timing report manually using the Timing Analyzer.
The Intel Quartus Prime Timing Analyzer provides a more accurate and precise I/O timing data based on the specifics of the design after you complete place-and-route.
Related Information AN 775: I/O Timing Information Generation Guidelines
Provides the techniques to generate I/O timing information using the Intel Quartus Prime software.

Intel� AgilexTM Device Data Sheet 120

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Programmable IOE Delay

Table 102. Programmable IOE Delay for Intel Agilex Devices
For specification status, see the Data Sheet Status table

Parameter

Maximum Offset Minimum Offset

Fast Model

Extended, Industrial

Input Delay Chain

63

(INPUT_DELAY_CH

AIN)

0

1.474

Output Delay Chain

15

(OUTPUT_DELAY_C

HAIN)

0

0.356

Glossary
Table 103. Glossary
Term Differential I/O Standards

Receiver Input Waveforms Single-Ended Waveform
VID VCM

Differential Waveform VID
Transmitter Output Waveforms

�E1, �I1 2.324 0.552

Slow Model �E2, �I2 2.631
0.629

Definition
Positive Channel (p) = VIH Negative Channel (n) = VIL Ground
p - n = 0 V VID

�E3, �I3V 3.343 0.808

Unit ns ns
continued...

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Intel� AgilexTM Device Data Sheet 121

Term
fHSCLK fHSDR fHSDRDPA J (SERDES factor) JTAG Timing Specifications
Intel� AgilexTM Device Data Sheet 122

Single-Ended Waveform
VOD VCM

Definition
Positive Channel (p) = VOH Negative Channel (n) = VOL Ground

Differential Waveform VOD

p - n = 0 V VOD

I/O PLL input clock frequency.
LVDS SERDES block--maximum/minimum LVDS data transfer rate (fHSDR = 1/TUI), non-DPA.
LVDS SERDES block--maximum/minimum LVDS data transfer rate (fHSDRDPA = 1/TUI), DPA.
LVDS SERDES block--deserialization factor (width of parallel data bus).
JTAG Timing Specifications:
TMS

TDI

tJCP

t JCH

t JCL

tJPSU

TCK

tJPZX

tJPCO

TDO

tJPH tJPXZ

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Term RL Sampling window (SW)

Definition
Receiver differential input discrete resistor (external to the Intel Agilex device).
Timing Diagram--the period of time during which the data must be valid in order to capture it correctly. The setup and hold times determine the ideal strobe position in the sampling window, as shown:
Bit Time

Single-ended voltage referenced I/O standard
tC TCCS (channel-to-channel-skew) tDUTY tFALL tINCCJ tOUTPJ_IO

0.5 x TCCS

RSKM

Sampling Window

RSKM

0.5 x TCCS

(SW)

The JEDEC standard for the SSTL and HSTL I/O defines both the AC and DC input signal values. The AC values indicate the voltage levels at which the receiver must meet its timing specifications. The DC values indicate the voltage levels at which the final logic state of the receiver is unambiguously defined. After the receiver input has crossed the AC value, the receiver changes to the new logic state.
The new logic state is then maintained as long as the input stays beyond the DC threshold. This approach is intended to provide predictable receiver timing in the presence of input waveform ringing.
Single-Ended Voltage Referenced I/O Standard
V CCIO

V OH

V IH(AC)

V IH(DC)

V REF

V IL(DC)

V IL(AC)

V OL
V SS

High-speed receiver/transmitter input and output clock period.

The timing difference between the fastest and slowest output edges, including the tCO variation and clock skew, across channels driven by the same PLL. The clock is included in the TCCS measurement (refer to the Timing Diagram figure
under SW in this table).

LVDS SERDES block--duty cycle on high-speed transmitter output clock.

Signal high-to-low transition time (80�20%).

Cycle-to-cycle jitter tolerance on the PLL clock input.

Period jitter on the GPIO driven by a PLL.

continued...

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Intel� AgilexTM Device Data Sheet 123

Term tOUTPJ_DC tRISE Timing Unit Interval (TUI)
VCM(DC) VICM VICM(DC) VID
VDIF(AC) VDIF(DC) VIH VIH(AC) VIH(DC) VIL VIL(AC) VIL(DC) VOCM VOD
VSWING VOX VIX(AC) W

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26
Definition Period jitter on the dedicated clock output driven by a PLL. Signal low-to-high transition time (20�80%). The timing budget allowed for skew, propagation delays, and the data sampling window. (TUI = 1/(Receiver Input Clock Frequency Multiplication Factor) = tC/w). DC Common mode input voltage. Input Common mode voltage--the common mode of the differential signal at the receiver. VCM(DC) DC Common mode input voltage. Input differential voltage swing--the difference in voltage between the positive and complementary conductors of a differential transmission at the receiver. AC differential input voltage--minimum AC input differential voltage required for switching. DC differential input voltage--minimum DC input differential voltage required for switching. Voltage input high--the minimum positive voltage applied to the input which is accepted by the device as a logic high. High-level AC input voltage. High-level DC input voltage. Voltage input low--the maximum positive voltage applied to the input which is accepted by the device as a logic low. Low-level AC input voltage. Low-level DC input voltage. Output Common mode voltage--the common mode of the differential signal at the transmitter. Output differential voltage swing--the difference in voltage between the positive and complementary conductors of a differential transmission line at the transmitter. Differential input voltage. Output differential cross point voltage. VIX Input differential cross point voltage. LVDS SERDES block--Clock Boost Factor.

Intel� AgilexTM Device Data Sheet 124

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Document Revision History for the Intel Agilex Device Data Sheet

Document Version
2021.10.26

Changes
� Updated the Data Sheet Status for Intel Agilex Devices (F-Series) table. -- Updated status for AGF 012/014 R24A package. -- Updated status for AGF 022/027 R25A package. -- Added AGF 012/014 R24B package. -- Added AGF 019/023 R25A, R24C, and R31C packages.
� Added AGI 019/023 R18A and R31B packages in the Data Sheet Status for Intel Agilex Devices (I-Series) table. � Updated the Absolute Maximum Rating for Intel Agilex Devices table.
-- Updated footnotes for IOUT condition. -- Changed symbol from VCCEH_FGT_GXF to VCCH_FGT_GXF. � Updated the Recommended Operating Conditions for Intel Agilex Devices table. -- Added IBAT specifications. -- Updated VI and VO specifications. � Added footnote to VCCCLK_GXP and VCCH_GXP in the P-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices table. � Updated the R-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices table. -- Updated symbol from VCCEHT_GXR[L,R] to VCCH_GXR[L,R]. -- Updated symbol from VCCERT_GXR[L,R] to VCCRT_GXR[L,R]. -- Updated specifications for VCCH_GXR[L,R], VCCED_GXR[L,R], VCCCLK_GXR[L,R], and VCC_HSSI_GXR. -- Added footnote to VCCH_GXR[L,R] and VCCCLK_GXR[L,R]. � Updated descriptions in the Internal Weak Pull-Up Resistor section. � Added VIL (min) and VIH (max) in the Single-Ended I/O Standards Specifications for Intel Agilex Devices (for HPS and SDM I/O Banks) table. � Added footnotes to tREFPJ and tREFPN in the I/O PLL Specifications for Intel Agilex Devices table. � Updated descriptions in the Remote Temperature Diode Specifications section. � Added the following tables: -- Remote Temperature Diode Specifications for Intel Agilex Devices (R-Tile TSD) -- Remote Temperature Diode Specifications for Intel Agilex Devices (F-Tile TSD) � Removed the reference to rate support and combined the following tables into one table: Memory Standards Supported by Intel Agilex Devices -- Memory Standards Supported by the Hard Memory Controller for Intel Agilex Devices -- Memory Standards Supported by the Soft Memory Controller for Intel Agilex Devices -- Memory Standards Supported by the HPS Hard Memory Controller for Intel Agilex Devices � Added footnote to FREF in the F-Tile FGT Reference Clock Input Specifications for Intel Agilex Devices table. � Updated ZREF-DIFF-DC_OUT and VREFIN-DIFF-AC_OUT descriptions in the F-Tile FGT Reference Clock Output Driver Specifications for Intel Agilex Devices table.
continued...

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Document Version

Changes
� Updated the F-Tile FHT Transmitter Electrical Specifications table. -- Updated TTX-DJ specification. -- Removed NGPLL specification.
� Updated the F-Tile FGT Transmitter Electrical Specifications table. -- Updated VTX-DIFF-PKPK description. -- Added VTX-EYE-PKPK specifications. -- Removed NGPLL-PAM and NGPLL-NRZ specifications.
� Updated the F-Tile FHT Receiver Electrical Specifications table. -- Added VRX-MAX and VRX-MIN specifications. -- Removed NGPLL specification.
� Updated the F-Tile FGT Receiver Electrical Specifications table. -- Added VRX-MIN specifications. -- Updated footnote to VRX-MAX, VRX-CM-DC, and VIDLE-THRESH. -- Removed NGPLL-PAM and NGPLL-NRZ specifications.
� Updated the F-Tile FHT Electrical Compliance List table. -- Removed IEEE 802.3cd 137/136, IEEE 802.3bj/bm 93, IEEE 802.3bj/bm 92, and IEEE 802.3by 111/110 specifications. -- Updated the protocols for CEI 4.0/5.0 specification.
� Updated the F-Tile FGT Electrical Compliance List table. -- Updated specifications for SDI, JESD204A, JESD204B, JESD204C, Fiber Channel, Interlaken, and HDMI protocols. -- Added specifications for GPON protocol.
� Updated tCF02ST0 to add specifications when security features enabled in the General Configuration Timing Specifications for Intel Agilex Devices table. continued...

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Document Version
2021.06.02

Changes
� Updated the description for Tdo in the AS Timing Parameters for Intel Agilex Devices table. � Updated the Configuration Bit Stream Sizes for Intel Agilex Devices table.
-- Added table description. -- Added specifications for AGF 019, AGF 023, AGI 019, and AGI 023 devices. -- Updated specifications for AGF 012, AGF 014, AGF 022, AGF 027, AGI 022, and AGI 027 devices. � Updated the Programmable IOE Delay for Intel Agilex Devices table. -- Added Industrial grade and updated the fast model specifications. -- Added �E1, �I1, �I2, and �I3V speed grades, and updated the slow model specifications.
� Updated the Data Sheet Status for Intel Agilex Devices (F-Series) table. -- Removed R17A and R20A packages. -- Added AGF 006 and AGF 008 devices for R24C package.
� Added support for �E4X speed grade in the Intel Agilex Device Grades, Core Speed Grades, and Power Options Supported table. � Updated the Absolute Maximum Rating for Intel Agilex Devices table.
-- Updated the maximum specifications for VCCR_CORE and VCCA_PLL. -- Removed VCCIO3V_GXB, VI (for VCCIO3V_GXB), VCC_HSSI_GXB, VCCH_GXB, VCCT_GXB, and VCCR_GXB specifications. -- Added R-tile specifications: VCCEHT_GXR, VCCERT_GXR, VCCED_GXR, VCCE_PLL_GXR, VCCE_DTS_GXR, VCCCLK_GXR, VCCHFUSE_GXR, and VCC_HSSI_GXR. -- Added F-tile specifications: VCCERT1_FHT_GXF, VCCERT2_FHT_GXF, VCCEHT_FHT_GXF, VCCERT_FGT_GXF, VCCEH_FGT_GXF, and VCCERT_GXF_COMBINE. � Updated the Recommended Operating Conditions for Intel Agilex Devices table. -- Added specifications for �4X speed grade for VCC and VCCP. -- Removed VCCH and VCCH_SDM specifications for H-tile and P-tile devices. -- Removed VCCIO3V_GXB and VI (for VCCIO3V_GXB) specifications. -- Added VCCH specifications for R-tile and F-tile devices. -- Removed condition for VCCH_SDM. � Updated the HPS Power Supply Operating Conditions for Intel Agilex Devices table. -- Added specifications for �4X speed grade for VCCL_HPS and VCCPLLDIG_HPS. -- Added footnote for VCCL_HPS and VCCPLLDIG_HPS. � Updated specifications for 34- and 40- RS in the OCT Calibration Accuracy Specifications for Intel Agilex Devices (for GPIO Bank) table. � Updated VID and VICM(DC) specifications in the Differential I/O Standards Specifications for Intel Agilex Devices (for GPIO Bank) table. � Added specifications for �4X speed grade in the Clock Tree Performance for Intel Agilex Devices table. � Updated the I/O PLL Specifications for Intel Agilex Devices table. -- Added specifications for �4X speed grade for fIN, fVCO, fOUT, and fOUT_EXT. -- Updated tOUTDUTY specifications. -- Updated footnote for tOUTPJ_DC, tOUTCCJ_DC, tOUTPJ_IO, and tOUTCCJ_IO.
continued...

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Document Version

Changes
� Updated the DSP Block Performance Specifications for Intel Agilex Devices table. -- Added specifications for �4X speed grade. -- Added footnote for Fixed-point 18 � 19 multiplier adder summed with 36-bit input mode -- Updated the modes as FP32 floating-point vector dot product and FP16 floating-point vector dot product. -- Added the following modes: � Sum/sub of two FP16 multiplications with FP32 (addition/subtraction) � Sum/sub of two FP16 multiplications with accumulation (addition/subtraction)
� Added specifications for �4X speed grade in the Memory Block Performance Specifications for Intel Agilex Devices table. � Added footnote to Sampling Rate in the Local Temperature Sensor Specifications for Intel Agilex Devices table. � Removed description on H-tile in the Remote Temperature Diode Specifications section. � Updated the Voltage Sensor Specifications for Intel Agilex Devices table.
-- Added footnote to Sampling Rate and Voltage sensor accuracy. -- Removed Differential non-linearity (DNL) and Integral non-linearity (INL) specifications. � Updated the description for the Memory Standards Supported by the Soft Memory Controller for Intel Agilex Devices table. � Updated MPU frequency specifications in the Maximum HPS Clock Frequencies for Intel Agilex Devices table. � Added the HPS Cold Reset for Intel Agilex Devices table. � Updated Tsu specification in the SPI Master Timing Requirements for Intel Agilex Devices table. � Updated Tsuss and Thss specifications in the SPI Slave Timing Requirements for Intel Agilex Devices table. � Updated Td specifications in the HPS Secure Digital (SD)/MultiMediaCard (MMC) Timing Requirements for Intel Agilex Devices table. � Updated Th specification in the HPS USB 2.0 Transceiver Macrocell Interface Plus (UTMI+) Low Pin Interface (ULPI) Timing Requirements for Intel Agilex Devices table. � Updated footnotes for THIGH and TLOW specifications in the HPS I2C Timing Requirements for Intel Agilex Devices table. � Updated Td specifications in the Trace Timing Requirements for Intel Agilex Devices table. � Updated tJPH specification in the HPS JTAG Timing Requirements for Intel Agilex Devices table. � Updated typical specifications in the HPS Programmable I/O Delay (Output Path) for Intel Agilex Device and HPS Programmable I/O Delay (Input Path) for Intel Agilex Device tables. � Added tST12CF0 and tST02CF1 specifications in the General Configuration Timing Specifications for Intel Agilex Devices table. � Added General Configuration Timing Diagram. � Updated the AS Timing Parameters for Intel Agilex Devices table. -- Updated table description. -- Updated Tclk, Tdcsfrs, Tdcslst, Tdo, Text_delay, and Tdcsb2b specifications. -- Updated footnote for Text_delay. � Updated tADH specification in the Avalon-ST Timing Parameters for x8, �16, and �32 Configurations in Intel Agilex Devices table. � Updated the Configuration Bit Stream Sizes for Intel Agilex Devices table. -- Removed AGF 004 device. -- Updated specifications for AGF 006 device.
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Intel� AgilexTM Device Data Sheet 128

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Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Document Version
2021.01.07

Changes
� Added R-tile and F-tile specifications. Added the following tables/sections: -- R-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices table -- F-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices table -- R-Tile Transceiver Performance Specifications section -- F-Tile Transceiver Performance Specifications section
� Removed H-Tile specifications. The following tables/section are removed: -- H-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices -- Remote Temperature Diode Specifications for Intel Agilex Devices (H-Tile TSD) -- H-Tile Transceiver Performance Specifications
� Removed the following tables for 3 V I/O banks: -- Maximum Allowed Overshoot During Transitions for Intel Agilex Devices (for 3 V I/O Bank) -- I/O Pin Leakage Current for Intel Agilex Devices (for 3 V I/O Bank) -- Bus Hold Parameters for Intel Agilex Devices (for 3 V I/O Bank) -- OCT Without Calibration Resistance Tolerance Specifications for Intel Agilex Devices (for 3 V I/O Bank) -- Pin Capacitance for Intel Agilex Devices (for 3 V I/O Bank) -- Internal Weak Pull-Up Resistor Values for Intel Agilex Devices (for 3 V I/O Bank) -- Single-Ended I/O Standards Specifications for Intel Agilex Devices (for 3 V I/O Bank)
� Updated the Data Sheet Status for Intel Agilex Devices tables. � Updated table title from Intel Agilex Device Grades and Speed Grades Supported to Intel Agilex Device Grades, Core Speed Grades, and Power
Options Supported. � Added VCCIO3V_GXB, VI (for VCCIO3V_GXB), VCC_HSSI_GXB, VCCH_GXB, VCCT_GXB, and VCCR_GXB specifications in the Absolute Maximum Rating for Intel Agilex
Devices table. � Updated the description in the Maximum Allowed Overshoot and Undershoot Voltage section. � Updated the figure title to Intel Agilex Devices Overshoot Duration Example (for 1.2 V GPIO Bank at VCCIO_PIO = 1.26 V). � Updated the Recommended Operating Conditions for Intel Agilex Devices table.
-- Updated VCC and VCCP specifications. -- Updated description for VCCH. -- Added VCCH and VCCH_SDM specifications for H-tile and P-tile devices. -- Updated note to VCCBAT. -- Added VCCIO3V_GXB and VI (for VCCIO3V_GXB) specifications. -- Updated the minimum specification for tRAMP. � Added the H-Tile Transceiver Power Supply Operating Conditions for Intel Agilex Devices table. � Updated VCCL_HPS and VCCPLLDIG_HPS specifications in the HPS Power Supply Operating Conditions for Intel Agilex Devices table. � Updated the specifications in the I/O Pin Leakage Current for Intel Agilex Devices (For GPIO Bank) table. � Updated the specifications in the Bus Hold Parameters for Intel Agilex Devices (For GPIO Bank) table.
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Intel� AgilexTM Device Data Sheet 129

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Changes
� Added specifications for 100- RD for VCCIO_PIO = 1.2 V in the OCT Without Calibration Resistance Tolerance Specifications for Intel Agilex Devices (For GPIO Bank) table.
� Updated the specifications in the Pin Capacitance for Intel Agilex Devices table. � Updated the specifications in the Internal Weak Pull-Up Resistor Values for Intel Agilex Devices (For GPIO Bank) table. � Updated the Single-Ended I/O Standards Specifications for Intel Agilex Devices (For GPIO Bank) table.
-- Removed note to 1.2 V LVCMOS in the Single-Ended I/O Standards Specifications for Intel Agilex Devices (for GPIO Bank) table. -- Added VOL and VOH specifications. � Added the following tables for HPS, SDM, and 3 V I/O banks: -- Maximum Allowed Overshoot During Transitions for Intel Agilex Devices (for 3 V I/O Bank) -- I/O Pin Leakage Current for Intel Agilex Devices (for HPS and SDM I/O Bank) -- I/O Pin Leakage Current for Intel Agilex Devices (for 3 V I/O Bank) -- Bus Hold Parameters for Intel Agilex Devices (for 3 V I/O Bank) -- OCT Without Calibration Resistance Tolerance Specifications for Intel Agilex Devices (for 3 V I/O Bank) -- Pin Capacitance for Intel Agilex Devices (for 3 V I/O Bank) -- Internal Weak Pull-Up and Weak Pull-Down Resistor Values for Intel Agilex Devices (for HPS and SDM I/O Banks) -- Internal Weak Pull-Up Resistor Values for Intel Agilex Devices (for 3 V I/O Bank) -- Hysteresis Specifications for Schmitt Trigger Input for Intel Agilex Devices (for HPS I/O Bank) -- Single-Ended I/O Standards Specifications for Intel Agilex Devices (for HPS and SDM I/O Banks) -- Single-Ended I/O Standards Specifications for Intel Agilex Devices (for 3 V I/O Bank) � Updated specification for �1 speed grade in the Clock Tree Performance for Intel Agilex Devices table. � Updated the I/O PLL Specifications for Intel Agilex Devices table. -- Updated fIN, fVCO, and fOUT specifications for �4F speed grade. -- Updated fOUT_EXT specifications for �2, �3, and �4 speed grades. -- Added tINCCJ specifications. -- Added note to tOUTPJ_DC, tOUTCCJ_DC, tOUTPJ_IO, and tOUTCCJ_IO. -- Updated condition for tOUTPJ_DC, tOUTCCJ_DC, tOUTPJ_IO, tOUTCCJ_IO, and tCASC_OUTPJ_DC. � Updated the description in the Remote Temperature Diode Specifications section. � Updated Ibias, Vbias, and diode ideality factor specifications in the Remote Temperature Diode Specifications for Intel Agilex Devices (E-Tile TSD) table. � Added the Remote Temperature Diode Specifications for Intel Agilex Devices (H-Tile TSD) table. � Updated the Voltage Sensor Specifications for Intel Agilex Devices table. -- Updated voltage sensor accuracy Vin range and specifications. -- Updated Unipolar Input Mode specifications. � Updated tx Jitter for data rate 600 Mbps � 1.6 Gbps in the LVDS SERDES Specifications for Intel Agilex Devices table. � Updated the jitter amplitude in the LVDS SERDES Soft-CDR Sinusoidal Jitter Tolerance Specifications for a Data Rate Equal to 1.6 Gbps diagram. � Updated the sinusoidal jitter for F3 and F4 in the LVDS SERDES Soft-CDR Sinusoidal Jitter Mask Values for a Data Rate Equal to 1.6 Gbps table. � Removed RLDRAM 3 specifications from the Memory Standards Supported by the Soft Memory Controller for Intel Agilex Devices table.
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Intel� AgilexTM Device Data Sheet 130

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Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

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Changes
� Updated the E-Tile Receiver Specifications table. -- Updated absolute VMAX for a receiver pin specifications. -- Changed from VICM (AC coupled) to VCM (Internal AC coupled) and updated the specifications.
� Updated the P-Tile PLLA Performance table. -- Added PLL bandwidth (BWTX-PKG_PLL1) and PLL peaking (PKGTX-PLL1) specifications for PCIe 5.0 GT/s. -- Updated PLL peaking (PKGTX-PLL2) specifications. -- Added note on PLL bandwidth and PLL peaking.
� Updated the P-Tile PLLB Performance table. -- Added PLL bandwidth (BWTX-PKG_PLL2) and PLL peaking (PKGTX-PLL2) specifications. -- Added note on PLL bandwidth and PLL peaking.
� Updated the P-Tile Reference Clock Specifications table. -- Updated notes to Input reference clock frequency and TCCJITTER. -- Added conditions for Rising edge rate, Falling edge rate, Duty cycle, VICM, TCCJITTER, and TSSC-MAX-PERIOD-SLEW parameters. -- Updated spread-spectrum downspread, absolute VMAX, and absolute VMIN specifications.
� Added condition for differential on-chip termination resistors parameter in the P-Tile Transmitter Specifications table. � Updated the P-Tile Receiver Specifications table.
-- Updated VID (diff p-p) specifications for PCIe 16.0 GT/s. -- Removed VICM (AC coupled) specifications. -- Added RREF specifications. � Added H-Tile Transceiver Performance Specifications section. � Updated fixed VCCL_HPS and MPU frequency for �1 speed grade in the Maximum HPS Clock Frequencies for Intel Agilex Devices table. � Updated the internal oscillator frequency in the HPS Internal Oscillator Frequency for Intel Agilex Devices table. � Added the HPS JTAG Timing Diagram. � Updated the HPS Programmable I/O Delay (Output Path) for Intel Agilex Device and HPS Programmable I/O Delay (Input Path) for Intel Agilex Device tables. � Removed note to tCF12ST1 in the General Configuration Timing Specifications for Intel Agilex Devices table. � Updated the POR Delay Specification for Intel Agilex Devices table. � Updated the description for clock input peak-to-peak period jitter tolerance parameter in the External Configuration Clock Source (OSC_CLK_1) Clock Input Requirements table. � Added notes to tJPSU (TDI), tJPSU (TMS), tJPH, and tJPCO in the JTAG Timing Parameters and Values for Intel Agilex Devices table. � Updated the AS Timing Parameters for Intel Agilex Devices table. -- Updated the note to Tdo. -- Updated Tdcsb2b specification. � Updated the AS Configuration Serial Input Timing Diagram to include Tdcsb2b. � Removed Maximum Configuration Time Estimation specifications.
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Intel� AgilexTM Device Data Sheet 131

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Document Version
2020.06.30
2020.05.14 2020.03.18

Changes
� Updated the Recommended Operating Conditions for Intel Agilex Devices table. -- Added note to VCCIO_PIO_SDM. -- Removed the note on HPS_PORSEL from tRAMP. HPS_PORSEL pin is not available for Intel Agilex devices.
� Added note to Text_delay in the AS Timing Parameters for Intel Agilex Devices table. � Removed SD/MMC configuration mode specifications in the following tables:
-- POR Delay Specification for Intel Agilex Devices -- Maximum Configuration Time Estimation for Intel Agilex Devices
Updated VCCFUSEWR_SDM specifications in the Recommended Operating Conditions for Intel Agilex Devices table.
� Added the Absolute Maximum Rating for Intel Agilex Devices table. � Added Maximum Allowed Overshoot and Undershoot Voltage section. � Updated the Recommended Operating Conditions for Intel Agilex Devices table.
-- Updated the typical values for VCC and VCCP. -- Added VCCR_CORE specifications. -- Updated description for VCCPT and VCCIO_PIO_SDM. -- Updated VCCFUSEWR_SDM and VI specifications. -- Updated VCCA_PLL specifications and description. -- Added a note for TJ minimum specifications for Industrial. -- Updated tRAMP minimum specification. � Updated the E-Tile Transceiver Power Supply Operating Conditions table. -- Updated VCCCLK_GXE for maximum DC level. -- Updated VCCCLK_GXE for recommended AC transient level. -- Updated wording for all recommended DC values from % of DC level to % of Vnominal. � Updated wording for all recommended DC values from % of DC level to % of Vnominal in the P-Tile Transceiver Power Supply Operating Conditions. � Updated the E-Tile Transmitter and Receiver Data Rate Performance Specifications table with the transceiver speed grades for the NRZ and PAM4 supported data rates. � Updated the transmitter differential output voltage peak-to-peak typical value in the E-Tile Transmitter Specifications table. � Updated the E-tile Receiver Specifications table: -- Added the absolute Vmax for a receiver pin specification -- Added the maximum peak-to-peak differential input voltage VID (diff p-p) before/after device configuration specification -- Added VICM (AC coupled) specification -- Removed the electrical idle detection voltage specification � Updated P-Tile Transceiver Performance: -- Added supported data rate for Gen1, Gen 2, Gen 3, and Gen 4 in the P-Tile Transmitter and Receiver Data Rate Performance table. -- Removed the maximum VCO frequency value and replaced it with a typical value in the P-Tile PLLA Performance table. -- Removed the maximum VCO frequency value and replaced it with a typical value in the P-Tile PLLB Performance table.
continued...

Intel� AgilexTM Device Data Sheet 132

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Changes
� Updated P-Tile Transmitter Specifications: -- Added PCIe condition for Supported I/O Standards. -- Removed VOCM (AC Coupled).
� Updated P-Tile Receiver Specifications: -- Added PCIe condition for Supported I/O Standards. -- Added PCIe 8.0 GT/s and 16.0 GT/s specifications for the peak-to-peak differential input voltage VID (diff p-p) and added corresponding notes. -- Updated RESREF specification. Added a note to the RESREF specification.
� Updated VCCL_HPS and VCCPLLDIG_HPS specifications for SmartVID in the HPS Power Supply Operating Conditions for Intel Agilex Devices table. � Changed Early Power Estimator (EPE) to Intel FPGA Power and Thermal Calculator. � Added a note to 1.2 V LVCMOS in the Single-Ended I/O Standards Specifications for Intel Agilex Devices table. � Added a note in the Single-Ended SSTL, HSTL, HSUL, and POD I/O Standards Signal Specifications for Intel Agilex Devices table. � Updated the Differential I/O Standards Specifications for Intel Agilex Devices table.
-- Updated I/O standard name from "1.5 V True Differential Signaling" to "True Differential Signaling (Transmitter & Receiver)". -- Added specifications for True Differential Signaling (Receiver only). -- Updated note to True Differential Signaling. � Updated the I/O PLL Specifications for Intel Agilex Devices table. -- Added notes for tFCOMP, tOUTPJ_DC, and tOUTCCJ_DC. -- Removed tINCCJ specifications. -- Added tREFPJ and tREFPN specifications. -- Updated tOUTPJ_DC, tOUTCCJ_DC, tOUTPJ_IO, tOUTCCJ_IO, and tCASC_OUTPJ_DC specifications. � Added a note for fixed-point 27 � 27 multiplication mode in the DSP Block Performance Specifications for Intel Agilex Devices table. � Updated the Memory Block Performance Specifications for Intel Agilex Devices table. -- Updated the specifications for MLAB memory. -- Updated the specifications for M20K block and added low power (LP) specifications. � Updated the specifications in the Remote Temperature Diode Specifications for Intel Agilex Devices (Core Fabric TSD) table. � Added the Remote Temperature Diode Specifications for Intel Agilex Devices (P-Tile TSD) table. � Updated the LVDS SERDES Specifications for Intel Agilex Devices table. -- Updated the tx Jitter - True Differential I/O Standards specifications for �4 speed grade. -- Removed global, regional, or local in clock routing resource. � Updated the DPA Lock Time Specifications for Intel Agilex Devices table. -- Updated the description of the table. -- Updated the maximum data transition from 960 to 768. � Updated the jitter requirements in the Memory Output Clock Jitter Specifications section. � Updated the specifications in the Maximum HPS Clock Frequencies for Intel Agilex Devices table. � Updated the HPS Programmable I/O Delay (Output Path) for Intel Agilex Device and HPS Programmable I/O Delay (Input Path) for Intel Agilex Device tables.
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Intel� AgilexTM Device Data Sheet 133

Intel� AgilexTM Device Data Sheet DS-1060 | 2021.10.26

Document Version
2019.12.18 2019.04.02

Changes
� Updated the following diagrams: -- USB ULPI Timing Diagram -- RGMII TX Timing Diagram -- RMII TX Timing Diagram -- RMII RX Timing Diagram
� Updated tST0 and tCD2UM specifications in the General Configuration Timing Specifications for Intel Agilex Devices table. � Added notes to Tclk and Tdo specifications in the AS Timing Parameters for Intel Agilex Devices table. � Updated tADSU and tAVSU specifications in the Avalon-ST Timing Parameters for �8, �16, and �32 Configurations in Intel Agilex Devices table. � Added the following tables:
-- Configuration Bit Stream Sizes for Intel Agilex Devices -- Maximum Configuration Time Estimation for Intel Agilex Devices -- Programmable IOE Delay for Intel Agilex Devices
Updated the I/O PLL Specifications for Intel Agilex Devices table. � Removed scanclk from fDYCONFIGCLK parameter. � Corrected the maximum specification for fDYCONFIGCLK from 200 MHz to 100 MHz.
Initial release.

Intel� AgilexTM Device Data Sheet 134

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