1986_TI_2 Um_CMOS_Standard_Cell_Data_Book 1986 TI 2 Um CMOS Standard Cell Data Book
User Manual: 1986_TI_2-um_CMOS_Standard_Cell_Data_Book
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SRSDOOl ~ t CMOS g Standard Cell Data Book 2-p,tn 1986 • • TEXAS INSTRUMENTS General Information L . . - . . - - ._ _ _ Definitions, Ratings, and Glossary Product Guide Data Sheets Military IEEE Symbols Design Considerations Mechanical Data II 2-/Lm CMOS Standard Cell Data Book SystemCellTM Series TEXAS INSTRUMENTS IMPORTANT NOTICE Texas Instruments (Til reserves the right to make changes in the devices or the device specifications identified in this publication without notice. TI advises its customers to obtain the latest version of device specifications to verify, before placing orders, that the information being relied upon by the customer is current. TI warrants performance of its semiconductor products, including SNJ and SMJ devices, to current specifications in accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent TI deems such testing necessary to support this warranty. Unless mandated by government requirements, specific testing of all parameters of each device is not necessarily performed. In the absence of written agreement to the contrary, TI assumes no liability for TI applications assistance, customer's product design, or infringement of patents or copyrights of third parties by or arising from use of semiconductor devices described herein. Nor does TI warrant or represent that any license, either express or implied, is granted under any patent right, copyright, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor devices might be or are used. Specifications contained in this data book supersede all data for these products published by TI in the United States before September 1986. ISBN 0-89512-198-0 Copyright © 1986, Texas Instruments Incorporated PREFACE This data book contains a wealth of information to assist you in designing an Application-Specific IC (ASIC) using TI's new, 2-flm CMOS standard cell family - called SystemCell"'. Included are; a selection guide, a crossreference guide, a definition of symbols and glossary of common terms, a section on design guidelines, detailed mechanical data on the extensive range of SystemCell'" package options and, comprehensive, detailed data sheets covering more than 320 cell types including: • SSI logic functions ("gates") • MSI logic functions ("macros") • I/O cells • Boolean functions • CompilerCell'" functions (SRAM, ROM, PLA and Pipeline Test Register) Fabricated in TI's advanced 2-l-'m (1.6-flm effective), double-level metal (DLM), twin-well, silicon-gate CMOS technology, ICs designed with the SystemCell'· family can offer many significant benefits. • Lower system ,cost • Increased functionality • Unique, secure product designs • Shorter "product-to-market" times • Reduced package count and board space • Improved reliability The advanced CMOS technology and high-volume production processes developed to support TI' s high-density memory products provide the "driving force" behind the significant performance and density advances embodied in the new SystemCell'" family. Using this approach, minimum feature sizes, an inverse indicator of performance and complexity, have been successfully reduced from 3-flm used in the CircuitCeW" family to 2-flm in the SystemCell'· family, with a 1-flm family already on the horizon! In designing the SystemCell'" family, TI's ASIC development team was directed by the people who made TTL an industry standard and who then went on to invent Low Power Schottkyt (LS-TTL). They were determined that TI's standard cell products should be easier to design with, and as well specified as conventional standard logic circuits. Designers familiar with the industry standard SN54/74 TTL functions will immediately appreciate the easy transition to standard cell deSign. These same popular logic functions are replicated in TI's standard cell libraries. Wherever possible, the same function number as the standard product has been used. For example, if the 'LS244 is the function you need, simply select the' ASC244-it's the same function! The similarity with industry standard logic functions does not end with type numbers. Each individual SystemCell'" data sheet presents the cell data in a format similar to the corresponding standard device data sheet and contains comprehensive, solid specifications (min's and max's over the full temperature range, not just typical values). In fact, just like TTL and LS-TTL, TI's SystemCell'" family provides data you can depend on! From design concept to a completed design, TI's Regional Technology Centers offer a worldwide network of customer and design support services. Local design support capabilities also are available through TI's authorized ASIC distributors across North America. In addition, SystemCell'" is supported on many of the popular engineering workstations to allow maximum utilization of existing in-house design tools for those wishing to complete the design themselves. To learn more about TI's SystemCell'" family, the most comprehensively specified, fastest growing cell library in the industry, please read on. t Integrated Schottky-Barrier diode-clamped transistor is patented by Texas Instruments, U.S. Patent Number 3,463,975 v vi ALPHANUMERIC INDEX ALPHANUMERIC INDEX PAGE SN54ASCOO SN54ASC02 SN54ASC04 SN54ASC08 SN54ASC10 SN54ASC11 SN54ASC20 SN54ASC21 SN54ASC27 SN54ASC30 SN54ASC32 SN54ASC74 SN54ASC75 SN54ASC85 SN54ASC86 SN54ASC109 SN54ASC137 SN54ASC138 SN54ASC139 SN54ASC151 SN54ASC153 SN54ASC155 SN54ASC157 SN54ASC158 SN54ASC161A SN54ASC163A SN54ASC164 SN54ASC165 SN54ASC166 SN54ASC173 SN54ASC174 SN54ASC175 SN54ASC177 SN54ASC181 SN54ASC191 SN54ASC193 SN54ASC194A SN54ASC195A SN54ASC244 SN54ASC245 SN54ASC251 SN54ASC257A SN54ASC258A SN54ASC259 SN54ASC260 SN54ASC266 SN54ASC273 SN54ASC279 SN54ASC280 SN54ASC283 SN54ASC298 SN54ASC299 SN54ASC299X SN54ASC373 SN54ASC374 SN54ASC375 SN54ASC393 SN54ASC398 SN54ASC399 SN74ASCOO ..... ... ...... SN74ASC02 ... .... ..... " .. SN74ASC04 ..... , ......... SN74ASC08 SN74ASC10 SN74ASC11 SN74ASC20 .. , ..... , ...... SN74ASC21 SN74ASC27 SN74ASC30 SN74ASC32 SN74ASC74 ........... SN74ASC75 ..... ........ SN74ASC85 ............ SN74ASC86 ............... SN74ASC109 .............. SN74ASC137 ......... .... SN74ASC138 .............. SN74ASC139 .. ' , .......... ............ SN74ASC151 SN74ASC153 .............. SN74ASC155 .............. , SN74ASC157 ......... SN74ASC158 .............. SN74ASC161A ............. SN74ASC163A ............. SN74ASC164 .............. SN74ASC165 .............. SN74ASC166 .............. SN74ASC173 .............. SN74ASC174 ...... ........ SN74ASC175 ........... ... SN74ASC177 ....... , ...... SN74ASC181 .... " ......... SN74ASC191 SN74ASC193 .... " ......... SN74ASC194A ....... ...... SN74ASC195A ......... .... SN74ASC244 . . . . . . . . . . . . . . SN74ASC245 .............. SN74ASC251 .............. SN74ASC257A ............. SN74ASC258A ............. SN74ASC259 .... ....... SN74ASC260 ....... ....... SN74ASC266 ...... ........ SN74ASC273 ..... . . . . . . . . . SN74ASC279 .............. SN74ASC280 .............. SN74ASC283 . . . . ....... SN74ASC298 ...... .... .... SN74ASC299 ............ SN74ASC299X ............. SN74ASC373 .............. SN74ASC374 .............. SN74ASC375 .............. SN74ASC393 .... ........ SN74ASC398 ............ .. SN74ASC399 ..... ......... " " " " " 4-3 4-7 4-11 4-15 4-19 4-23 4-27 4-31 4-35 4-37 4-39 4-43 4-55 4-59 4-65 4-67 4-71 4-77 4-81 4-85 4-89 4-93 4-97 4-101 4-105 4-113 4-121 4-127 4-133 4-141 4-147 4-151 4-155 4-161 4-169 4-177 4-185 4-191 4-197 4-201 4-207 4-211 4-215 4-219 4-225 4-227 4-229 4-233 4-235 4-239 4-245 4-251 4-257 4-263 4-267 4-271 4-277 4-281 4-285 SN54ASC590 SN54ASC593X SN54ASC595 SN54ASC598X SN54ASC651 SN54ASC652 SN54ASC669 SN54ASC686 SN54ASC688 SN54ASC888 SN54ASC890 SN54ASC2022 SN54ASC2024 SN54ASC2102 SN54ASC2108 SN54ASC2310 SN54ASC2311 SN54ASC2320 SN54ASC2321 SN54ASC2322 SN54ASC2325 SN54ASC2330 SN54ASC2331 SN54ASC2340 SN54ASC2341 SN54ASC2342 SN54ASC2350 SN54ASC2370 SN54ASC2371 SN54ASC2372 SN54ASC2373 SN54ASC2374 SN54ASC2401 SN54ASC2402 SN54ASC2403 SN54ASC2404 SN54ASC2405 SN54ASC2406 SN54ASC2407 SN54ASC2408 SN54ASC2500 SN54ASC2502 SN54ASC2503 SN54ASC2507 SN54ASC2508 SN54ASC2519 SN54ASC2901 SN54ASC2902 SN54ASC2904 SN54ASC2910 SN54ASC3003 SN54ASC3004 SN54ASC3005 SN54ASC3006 SN54ASC3010 SN54ASC3011 SN54ASC3103 SN54ASC3200 SN54ASC3430 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN74ASC590 ..... SN74ASC593X .... 'SN74ASC595 . . . . . . . . . SN74ASC598X SN74ASC651 SN74ASC652 SN74ASC669 SN74ASC686 SN74ASC688 .......... SN74ASC888 ......... SN74ASC890 SN74ASC2022 SN74ASC2024 SN74ASC2102 SN74ASC2108 SN74ASC2310 SN74ASC2311 SN74ASC2320 SN74ASC2321 SN74ASC2322 SN74ASC2325 . ............ SN74ASC2330 SN74ASC2331 SN74ASC2340 SN74ASC2341 SN74ASC2342 ............ , . .... , ..... SN74ASC2350 SN74ASC2370 . .... " ' ...... SN74ASC2371 . ........ SN74ASC2372 SN74ASC2373 ...... " ..... SN74ASC2374 ............. SN74ASC2401 ............. SN74ASC2402 . ... , ........ SN74ASC2403 ............. .......... SN74ASC2404 ......... SN74ASC2405 .......... SN74ASC2406 SN74ASC2407 SN74ASC2408 SN74ASC2500 SN74ASC2502 ............. SN74ASC2503 ............. SN74ASC2507 ............. SN74ASC2508 ............. SN74ASC2519 ............. SN74ASC2901 . ............ SN74ASC2902 . ............ SN74ASC2904 . ............ SN74ASC2910 ............. SN74ASC3003 ............. SN74ASC3004 · ............ SN74ASC3005 · ............ SN74ASC3006 . ............ SN74ASC3010 · ............ SN74ASC3011 SN74ASC3103 ............. SN74ASC3200 ....... .... SN74ASC3430 ............. " PAGE 4-289 4-295 4-303 4-307 4-315 4-315 4-327 4-333 4-339 4-343 4-347 4-349 4-351 4-353 4-359 4-363 4-367 4-371 4-373 4-377 4-381 4-383 4-385 4-387 4-389 4-391 4-393 4-397 4-399 4-401 4-403 4-405 4-407 4-407 4-407 4-407 4-413 4-413 4-413 4-419 4-423 4-425 4-427 4-429 4-431 4-433 4-435 4-437 4-439 4-441 4-443 4-443 4-443 4-443 4-451 4-453 4-455 4-461 4-463 vii 'ALPHANUMERIC INDEX PAGE SN54ASC3800 SN54ASC4002 SN54ASC4072 SN54ASC4075 SN54ASC4078 SN54ASC5000 SN54ASC5001 SN54ASC5002 SN54ASC5003 SN54ASC5004 SN54ASC5005 SN54ASC5006 SN54ASC5007 SN54ASC5010 SN54ASC5013 SN54ASC5100 SN54ASC5103 SN54ASC5104 SN54ASC5105 SN54ASC5106 SN54ASC5107 SN54ASC5108 SN54ASC5109 SN54ASC5110 SN54ASC5111 SN54ASC5120 SN54ASC5121 SN54ASC5123 SN54ASC5124 SN54ASC5125 SN54ASC5200 SN54ASC5201 SN54ASC5202 SN54ASC5203 SN54ASC5206 SN54ASC5207 SN54ASC5217 SN54ASC5220 SN54ASC5221 SN54ASC5226 SN54ASC5227 SN54ASC5239 SN54ASC5246 SN54ASC5250 SN54ASC6002 SN54ASC6003 SN54ASC6004 SN54ASC6005 SN54ASC6006 SN54ASC6007 SN54ASC6008 SN54ASC6009 SN54ASC6012 SN54ASC6013 SN54ASC6014 SN54ASC6017 SN54ASC6018 SN54ASC6019 viii SN74ASC3800 SN74ASC4002 SN74ASC4072 SN74ASC4075 SN74ASC4078 SN74ASC5000 SN74ASC5001 SN74ASC5002 SN74ASC5003 SN74ASC5004 SN74ASC5005 SN74ASC5006 SN74ASC5007 SN74ASC5010 SN74ASC5013 SN74ASC5100 SN74ASC5103 SN74ASC5104 SN74ASC5105 SN74ASC5106 SN74ASC5107 SN74ASC5108 SN74ASC5109 SN74ASC5110 SN74ASC5111 SN74ASC5120 SN74ASC5121 SN74ASC5123 SN74ASC5124 SN74ASC5125 SN74ASC5200 SN74ASC5201 SN74ASC5202 SN74ASC5203 SN74ASC5206 SN74ASC5207 SN74ASC5217 SN74ASC5220 SN74ASC5221 SN74ASC5226 SN74ASC5227 SN74ASC5239 SN74ASC5246 SN74ASC5250 SN74ASC6002 SN74ASC6003 SN74ASC6004 SN74ASC6005 SN74ASC6P06 SN74ASC6007 SN74ASC6008 SN74ASC6009 SN74ASC6012 SN74ASC6013 SN74ASC6014 SN74ASC6017 SN74ASC6018 SN74ASC6019 ...... ....... ... ...... .... ... ...... .... .......... , .. ............ ............. ........ ..... ' ........ , , ... ...... ...... ............. · ............ · ............ ' ............. ...... .... ... .... ......... ............. ·............ ............. · . .- . . . . . . . . . .... ......... .... ... ...... ·.... . . ..... .. ...... ..... · ............ . ............. ............. ............. ... ...... .... .... ... ...... ......... .... ............. ............. · ............ ............. ... ... .... ... .... ... ... ....... ... ... '" · ............ ............. · . . . . . . . . . . -. ....... ... ... .. ..... ...... .... .... ..... ......... .... ............. ............. ............. ............. · ............ ........ ..... · ............ ............. ............. ... ...... .... ............. ..... ....... ...... ....... · ............ 4-465 4-467 4-469 4-473 4-477 4-479 4-481 4-483 4-485 4-487 4-489 4-491 4-493 4-495 4-497 4-499 4-503 4-507 4-511 4-513 4-517 4-521 4-523 4-525 4-529 4-533 4-537 4-541 4-543 4-547 4-551 4-555 4-559 4-563 4-567 4-571 4-575 4-579 4-583 4-587 4-591 4-595 4-599 4-603 4-607 4-609 4-611 4-613 4-615 4-617 4-619 4-621 4-623 4-625 4-627 4-629 4-631 4-633 SN54ASC6022 SN54ASC6023 SN54ASC6024 SN54ASC6025 SN54ASC6026 SN54ASC6027 SN54ASC6028 SN54ASC6029 SN54ASC6032 SN54ASC6034 SN54ASC6035 SN54ASC6048 SN54ASC6049 SN54ASC6052 SN54ASC6053 SN54ASC6054 SN54ASC6055 SN54ASC6056 SN54ASC6057 SN54ASC6058 SN54ASC6059 SN54ASC6062 SN54ASC6063 SN54ASC6064 SN54ASC6065 SN54ASC6066 SN54ASC6067 SN54ASC6068 SN54ASC6069 SN54ASC6072 SN54ASC6073 SN54ASC6074 SN54ASC6075 SN54ASC6082 SN54ASC6083 SN54ASC6084 SN54ASC6088 SN54ASC6100 SN54ASC6101 SN54ASC6102 SN54ASC6103 SN54ASC6105 SN54ASC6106 SN54ASC6108 SN54ASC6110 SN54ASC6111 SN54ASC6112 SN54ASC6113 SN54ASC6115 SN54ASC6116 SN54ASC6118 SN54ASC6120 SN54ASC6121 SN54ASC6122 SN54ASC6125 SN54ASC6130 SN54ASC6131 SN54ASC6132 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN74ASC6022 SN74ASC6023 SN74ASC6024 SN74ASC6025 SN74ASC6026 SN74ASC6027 SN74ASC6028 SN74ASC6029 SN74ASC6032 SN74ASC6034 SN74ASC6035 SN74ASC6048 SN74ASC6049 SN74ASC6052 SN74ASC6053 SN74ASC6054 SN74ASC6055 SN74ASC6056 SN74ASC6057 SN74ASC6058 SN74ASC6059 SN74ASC6062 SN74ASC6063 SN74ASC6064 SN74ASC6065 SN74ASC6066 SN74ASC6067 SN74ASC6068 SN74ASC6069 SN74ASC6072 SN74ASC6073 SN74ASC6074 SN74ASC6075 SN74ASC6082 SN74ASC6083 SN74ASC6084 SN74ASC6088 SN74ASC6100 SN74ASC6101 SN74ASC6102 SN74ASC6103 SN74ASC6105 SN74ASC6106 SN74ASC6108 SN74ASC6110 SN74ASC6111 SN74ASC6112 SN74ASC6113 SN74ASC6115 SN74ASC6116 SN74ASC6118 SN74ASC6120 SN74ASC6121 SN74ASC6122 SN74ASC6125 SN74ASC6130 SN74ASC6131 SN74ASC6132 · ............ ............. ............. ............. ............. . ......... ' " ............. ............. . ........... ' . .... , ....... . ............ . ............ ............. ............. ............ ' ............. . ............ ..... , ....... ...... , ...... ............. ............. ............. ·....... .... . ............ . . ............ . ............ ............. ............. ............. . ............ . ............ . ............ . ............ ............. ............. ............. . ............ ............. · .- ........... ............. ............. ............. . ............ . ............ · ........... . ............ ............. ............. ~- ............. . ............ . ............ ............. . ............ ............. ............. ............. PAGE 4-635 4-637 4-639 4-641 4-643 4-645 4-647 4-649 4-651 4-653 4-655 4-657 4-659 4-661 4-663 4-665 4-667 4-669 4-671 4-673 4-675 4-677 4-679 4-681 4-683 4-685 4-687 4-689 4-691 4-693 4-695 4-697 4-699 4-701 4-703 4-705 4-707 4-709 4-711 4-713 4-715 4-717 4-719 4-721 4-725 4-727 4-731 4-733 4-737 4-739 4-741 4-745 4-747 4-749 4-751 4-755 4-757 4-759 CROSS· REFERENCE INDEX CELL CROSS·REFERENCE CELL NAME AMC12LH AN210LH AN220LH AN240LH AN260LH AN310LH AN320LH AN340LH AN360LH AN410LH AN420LH AN440LH AN460LH AN510LH AN810LH A0220LH A0221LH 8F001LH BF002LH BF003LH 8F004LH BF005LH 8F006LH BF007LH BF008LH BF009LH BF010LH BFOllLH BF012LH BF013LH BF014LH BF015LH BF016LH BF017LH BF020LH BF022LH BF025LH 8F027LH BF028LH BF030LH BF034LH BF035LH BF051LH BF052LH BF053LH BF054LH BF055LH BF056LH BF057LH BF058LH BF059LH BF060LH BF062LH BF063LH BF064LH BF065LH BF066LH BF067LH BF068LH BF069LH DEVICE PAGE ASC2519 ................... . ASCO~ ..................... . ASC08 ..................... . ASC08 ........... . ASC08 .. ASCII .............. . ASCII ..................... . ASCII ........ . ASCII ..................... . ASC21 ............. . ASC21 ................. . ASC21 ..................... . ASC21 ..................... . ASC2024 ................... . ASC6132 ................... . ASC2331 ................... . ASC2330 .. . ............. . ASC6017 .............. . ASC6002 .............. . ASC6003 . . . ............. . ASC6004 ................... . ASC6005 ........... . ASC6006 ........... . ASC6007 ........... . ASC6008 ............ . ASC6009 ............ . ASC6018 ................... . ASC6019 ................... . ASC6012 ................... . ASC6013 ................ . ASC6014 ................... . ASC6023 ................... . ASC6024 ................... . ASC6026 .. .. ... . ....... . ASC6029 ................... . ASC6022 . . . . . . . . . . . . . . . . . . . ASC6025 . . .. . ......... . ASC6027 ................... . ASC6028 ........... . ASC6032 ................ . ASC6034 ................... . ASC6035 ................... . ASC6048 ................... . ASC6052 ........... . ASC6053 ........... . ASC6054 ........ . ASC6055 ................... . ASC6056 ................... . ASC6057 ................... . ASC6058 . . . . . . . . . . . . ASC6059 . . .. . . . . ........ . ASC6049. . ....... . ASC6062 ..... ASC6063 .. ASC6064 ........ . ASC6065 ........ . ASC6066 ........ . ASC6067 . ASC6068 . . . . . . ASC6069 . . . . . . . . . . . . . . . . . . .. 4-433 4-15 4-15 4-15 4-15 4-23 4-23 4-23 4-23 4-31 4-31 4-31 4-31 4-351 4-759 4-385 4-383 4-629 4-607 4-609 4-611 4-613 4-615 4-617 4-619 4-621 4-631 4-633 4-623 4-625 4-627 4-637 4-639 4-643 4-649 4-635 4-641 4-645· 4-647 4-651 4-653 4-655 4-657 4-661 4-663 4-665 4-667 4-669 4-671 4-673 4-675 4-659 4-677 4-679 4-681 4-683 4-685 4-687 4-689 4-691 CELL NAME BF070LH BF071LH BF072LH BF075LH BF080LH BF081LH BF082LH BF088LH BUll0LH BU111LH BUl12:'H BU120LH BU130LH BU221LH BU222LH BU261 LH BU262LH CK4XOLH C0212LH C0213LH COMPILED COMPILED COMPILED COMPILED DE210LH DE212LH DFB20LH DFC20LH DFN20LH DFP20LH DFY20LH DFZ20LH DLC10LH DLE10LH DTB10LH DTC10LH DTN10LH DTP10LH EN210LH EX210LH EX220LH EX240LH GM010LH GMll0LH GM210LH GM310LH GM410LH GM510LH GMS10LH GS010LH GS110LH GS210LH GS310LH GS410LH GS510LH GSS10LH IOEOOLH IOE40LH IOE41LH IOE43LH . TEXAS'" INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 DEVICE ASC6073. . .............. . ASC6074 ...... . ASC6072 ................... . ASC6075 .............. . ASC6083 ................... . ASC6084 ................... . ASC6082 .............. . ASC6088 ................... . ASC2321 ................... . ASC2321 ................... . ASC2321 ................... . ASC6120 ................... . ASC6120 ................... . ASC6121 .................. . ASC6122 ................... . ASC6121 ................... . ASC6122 ................... . ASC3011 ................... . ASC2503 ................... . ASC2503 ................... . ASC3010 ................... . ASC3200 ................... . ASC3430 ................... . ASC3800 .. . ........... . ASC2350 ............... . ASC2350. . ................ . ASC74 ... .. .. . ........... . ASC74 ...................... ASC74 ...................... ASC74 ...................... ASC74 . .. . ... . . . . . ... ASC74 ...................... ASC2508 . . . . . . . . . . . . . . . . . . .. ASC2507 . . . . . . . . . . . . . . . . . . .. ASC74 ...................... ASC74 .. ... .. ...... ..... . . ASC74 .. ... .. ... .. . .. ... .. ASC74 .. . .. . . . ..... ..... . ASC266 . . . . . . . . . . . . . . . . . . . .. ASC86 .. . .. . . . .......... ASC86 ...................... ASC86 ...................... ASC6100 .................... ASC6l01 ... . . . . . . . . . . ASC6103 .................... ASC6l05 .................... ASC6106 .................... ASC6l08 .................... ASC6l02 .................... ASC6ll0 .................... ASC6l11 .................... ASC6113 .................... ASC6115 .................... ASC6116 .................... ASC6118 .................... ASC6112 .................... ASC5220 . . . . . . . . . . . . . . . . . . .. ASC5200 .................... ASC5206 . . . . . . . . . . . . . . . . . . .. ASC5201 .................... PAGE 4-695 4-697 4-693 4-699 4-703 4-705 4-701 4-707 4-373 4-373 4-373 4-745 4-745 4-747 4-749 4-747 4-749 4-453 4-427 4-427 4-451 4-461 4-463 4-465 4-393 4-393 4-43 4-43 4-43 4-43 4-43 4-43 4-431 4-429 4-43 4-43 4-43 4-43 4-227 4-65 4-65 4-65 4-709 4-711 4-715 4-717 4-719 4-721 4-713 4-725 4-727 4-733 4-737 4-739 4-741 4-731 4-579 4-551 4-567 4-555 ix CROSS·REFERENCE INDEX CELL NAME IOE44LH IOFOOLH IOF01LH IOF03LH IOF04LH IOF40LH IOF41LH IOF43LH IOF44LH IOF47LH IOF48LH IOF64LH IOFB8LH IOFDOLH IOFD8LH IPEOOLH IPEOl LH IPE03LH IPE04LH IPE05LH IPE06LH IPEOBLH IPE10LH IPFOOLH IPF01LH IPF02LH IPF03LH IPF04LH IPF05LH IPF06LH IPF08LH IPF10LH IPF12LH IPF13LH IV101LH IVll0LH IV120LH IV130LH IV140LH IV160LH IV180LH IV211LH IV212LH IV221 LH IV222LH IV241LH IV242LH JKB20LH JKB21LH LA810LH LAB20LH LAH10LH LAH20LH LAL20LH MOl MPLH M02CGLH M04SSLH Ml0MCLH M88MPLH M90MCLH x DEVICE ASC5207 .................... ASC5220 ......•............. ASC5226 .................... ASC5221 · ................. , ' ASC5227 .................... ASC5200 .................... ASC5206 .................... ASC5201 · ............. ASC5207 .................. , ' ASC5202 .................... ASC5203 .................... ASC5217 .................... ASC5239 · ................... ASC5250 .................... ASC5246 · ................... ASC5000 .................... ASC5006 .................... ASC5001 · .... ' " ...... , .... ' ASC5007 .................... ASC5005 · ................... ASC5002 .................... ASC5003 ........ , ........... ASC5010 ........ ............ ASC5000 .................... ASC5006 .................... ASC5004 .................... ASC5001 ........ " .......... ASC5007 .................... ASC5005 .. , ..... , ' .......... ASC5002 · , - , . , .... " , ....... ASC5003 .............. ' " ... ASC5010 .................... ASC5007 .................... ASC5013 ... , .............. , . ASC04 ...................... ASC04 ...................... ASC04 ...................... ASC04 ...................... ASC04 ...................... ASC04 ................ ..... ASC04 .... ... ....... .... .... ASC2310 .................... ASC2311 .................... ASC2310 .................... ASC2311 .................... ASC2310 .................... ASC2311 ...... , ............. ASC109 ., ................... ASC2108 .................... ASC279 .... ..... ..... ....... ASC279 ..................... ASC75 .... ... ... ... .... ..... ASC75 ...................... ASC6125 .................... ASC2901 .................... ASC2902 .................... ASC2904 .................... ASC2910 .................... ASC888 ..................... ASC890 ..................... PAGE CELL NAME 4-571 4-579 4-587 4-583 4-591 4-551 4-567 4-555 4-571 4-559 4-563 4-575 4-595 4-603 4-599 4-479 4-491 4-481 4-493 4-489 4-483 4-485 4-495 4-479 4-491 4-487 4-481 4-493 4-489 4-483 4-485 4-495 4-493 4-497 4-11 4-11 4-11 4-11 4-11 4-11 4-11 4-363 4-367 4-363 4-367 4-363 4-367 4-67 4-359 4-233 4-233 4-55 4-55 4-751 4-435 4-437 4-439 4-441 4-343 4-347 MU110LH MU210LH MU310LH MVFOOLH NA210LH NA220LH NA230LH NA240LH NA260LH NA310LH NA320LH NA330LH NA340LH NA410LH NA420LH NA430LH NA510LH NA520LH NA810LH NA820LH N0210LH N0220LH N0230LH N0240LH N0310LH N0320LH N0330LH N0410LH N0420LH N0510LH N0520LH N0810LH N0820LH OPEOOLH OPE01LH OPE03LH OPE40LH OPE41LH OPE42LH OPE43LH OPE60LH OPE61LH OPE63LH OPFOOLH OPF01LH OPF03LH OPF40LH OPF41LH OPF42LH OPF43LH OPF60LH OPF61LH OPF63LH OPFBOLH OPFB3LH OPFD1LH OPFD3LH OPFE1LH OR210LH OR220LH . TEXAS.~ INSTRUMENlS . POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 DEVICE PAGE ASC2340 .................... ASC2341 .................... ASC2342 .................... ASC2322 ................ ' .. , ASCOO ...................... ASCOO ........................ ASCOO ...................... ASCOO ...................... ASCOO ...................... ASC10 ...................... ASC10 ...................... ASC10 ...................... ASC10 .............. : ....... ASC20 ................ " .... ASC20 ...................... ASC20 ...................... ASC2022 .. ' " ' ......... , .. , ' ASC2022 ............... , ' .. , ASC30 ...................... ASC30 ...................... ASC02 ...................... ASC02 ...................... ASC02 ...................... ASC02 . ................ , .... ASC27 ...................... ASC27 ., .................... ASC27 . ..................... ASC4002 · ................. , ' ASC4002 ............... " , .. ASC260 . . . . . . . . . . . . . . . . . . . . , ASC260 . .................... ASC4078 .................... ASC4078 .................... ASC5106 .................. :. ASC5108 .................... ASC5107 ...... .............. ASC5100 .................... ASC5109 · ................... ASC5110 .................... ASC5111 . ................... ASC5103 .................... ASC5105 .................... ASC5104 .................... ASC5106 .................... ASC5108 . ................... ASC5107 .................... ASC5100 .................... ASC5109 · . . . . . . , . . . . . . . . . . . . ASC5110 .. '.' ................ ASC5111 .................... ASC5103 .................... ASC5105 .................... ASC5104 .................... ASC5120 .................... ASC5125 ............ , ....... ASC5121 . ................... ASC5124 ................... ASC5123 .................... ASC32 ...................... ASC32 ...................... ' 4-387 4-389 4-391 4-377 4-3 4-3 4-3 4-3 4-3 4-19 4-19 4-19 4-19 4-27 4-27 4-27 4-349 4-349 4-37 4-37 4-7 4-7 4-7 4-7 4-35 4-35 4-35 4-467 4-467 4-225 4-225 4-477 4-477 4-513 4-521 4-517 4-499 4-523 4-525 4-529 4-503 4-511 4-507 4-513 4-521 4-517 4-499 4-523 4-525 4-529 4-503 4-511 4-507 4-533 4-547 4-537 4-543 4-541 4-39 4-39 CROSS·REFERENCE INDEX C~lL NAME OR240LH OR260LH OR310LH OR320LH OR340LH OR360LH OR410LH OR420LH OR440LH OR460LH OR510LH OR810LH OSEOOLH OSE03LH OSE06LH OSF02LH PD095LH PR005LH PR095LH PR250LH PR400LH PUCOOLH R2401LH R2402LH R2403LH R2404LH R2405LH R2406LH R2407LH R2408LH RA416LH RA608LH RA70BLH RAB04LH RF408LH S085LH S137LH S138LH S139LH S151LH S153LH S155LH S157LH S158LH S161ALH DEVICE ASC32 .............. . ASC32 ............. . ASC4075 ................... . ASC4075 ............ . ASC4075 ................... . ASC4075 ................... . ASC4072 ................... . ASC4072 .............. . ASC4072 ................... . ASC4072 ................... . ASC6130 ................... . ASC6131 ................... . ASC2500 ................... . ASC2502 ................... . ASC2500 ................... . ASC2500 ....... " .......... . ASC2373 '" ................ . ASC2374 ................... . ASC2372 ................... . ASC2371 ............ . ASC2370 ................... . ASC2320 ................... . ASC2401 ................... . ASC2402 ................... . ASC2403 ................... . ASC2404 ................... . ASC2405 ................... . ASC2406 ................... . ASC2407 ................... . ASC2408 ................... . ASC3003 ................... . ASC3004 ................... . ASC3006 ................... . ASC3005 ................... . ASC3103 ................... . ASC85 ............... '" .. . ASC137 .................... . ASC138 .................... . ASC139 .................. '" ASC151 .................... . ASC153 .................... . ASC155 .................... . ASC157 .................... . ASC158 .................. . ASC161A ................... . PAGE CELL NAME 4-39 4-39 4-473 4-473 4-473 4-473 4-469 4-469 4-469 4-469 4-755 4-757 4-423 4-425 4-423 4-423 4-403 4-405 4-401 4-399 4-397 4-371 4-407 4-407 4-407 4-407 4-413 4-413 4-413 4-419 4-443 4-443 4-443 4-443 4-455 4-59 4-71 4-77 4-81 4-85 4-89 4-93 4-97 4-101 4-105 S163ALH S164LH S165LH S166LH S173LH S174LH S175LH S177LH S181LH S191LH S193LH S194ALH S195ALH S244LH S245LH S251LH S257ALH S258ALH S259LH S273LH S280LH S283LH S298LH S299LH S299XLH. S373LH S374LH S375LH S393LH S398LH S399LH S590LH S593XLH S595LH S598XLH S651LH S652LH S669LH S686LH S688LH TA820LH TAC20LH TAP20LH T0010LH TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, .TEXAS 75266 DEVICE ASC163A .................. " ASC164 .............. '" ... . ASC165.... . ....... . ASC166 ................ . ASC173 .......... . ASC174 ................ . ASC175 ................ . ASC177 .. . ....... . ASC181 .................... . ASC191 .................... . ASC193 ................... " ASC194A ................... . ASC195A ................... . ASC244 ................... " ASC245 .................... . ASC251 .................... . ASC257A ................... . ASC258A ................... . ASC259 .................... . ASC273 ............ . ASC280 ...... " ...... '" ... . ASC283 .................... . ASC298 ............... . ASC299 .................... . ASC299X . . . . . . . . . . . . . . . . . . . ASC373 . . . . . . . . . . . . . . . . . . . . ASC374 .................... . ASC375 .................... . ASC393 ................. . ASC398 ................. . ASC399 ............. ' .. ASC590 ................. . ASC593X ................... . ASC595 .................... . ASC598X ................... . ASC651 ......... . ASC652 .................... . ASC669 ............ , ....... . ASC686 ............... . ASC688 .................... . ASC2102 ................... . ASC2102 ................... . ASC2102 ................... . ASC2325 ................... . PAGE 4-113 4-121 4-127 4-133 4-141 4-147 4-151 4-155 4-161 4-169 4-177 4-185 4-191 4-197 4-201 4-207 4-211 4-215 4-219 4-229 4-235 4-239 4-245 4-251 4-257 4-263 4-267 4-271 4-277 4-281 4-285 4-289 4-295 4-303 4-307 4-315 4-315 4-327 4-333 4-339 4-353 4-353 4-353 4-381 xi xii FUNCTIONAL INDEX HDL or cell names that start with an S (i.e., SxxxLH) are SOFTWARE MACROS. INVERTERS AND BUFFERS (Delay at 1-pF Load) TYPICAL DESCRIPTION TYPE Buffers 'ASC2321 Delay Control 'ASC250B Delay Element 'ASC2507 'ASC04 Inverters 'ASC2310 Inverting 3-State Buffers 'ASC2311 'ASC6120 Noninverting Delay 'ASC6121 Buffers 'ASC6122 DELAY (ns) RELATIVE HDL OR DRIVE CELL NAME COMMENTS FACTOR 3.0 BUll0LH lX Noninverting 4.0 BUlllLH lX Inverting 3.0 BUl12LH lX Noninverting DLC10LH 2X DLE10LH lX 3.0 to 12.0 1.7 IVll0LH lX 1.1 IV120LH 2X 0.9 IV130LH 3X O.B IV140LH 4X 0.7 IV160LH 6X 0.6 IV1BOLH BX 2.3 IV101LH lOX 2.6 IV211LH lX 1.7 IV221LH 2X 1.3 IV241LH 4X 2.6 IV212LH lX 1.B IV222LH 2X 1.3 4X 1.7 IV242LH BU120LH 1.7 BU130LH 3X 2.3 BU221LH 2X 2.0 BU261LH 6X 2.3 BU222LH 2X 2.0 BU262LH 6X Noninverting Active-Low Enable Active·High Enable 2X Delay Active-Low Enable Active-High Enable POSITIVE-NAND GATES (Delay at 1-pF Load) TYPICAL DESCRIPTION 2-lnput NAND 3-lnput NAND TYPE 'ASCOO 'ASC10 4-lnput NAND 'ASC20 5-lnput NAND 'ASC2022 B-Input NAND 'ASC30 DELAY (ns) HDL OR CELL NAME RELATIVE DRIVE FACTOR 2.0 NA210LH lX 1.3 NA220LH 2X 3X 1.1 NA230LH 1.0 NA240LH 4X O.B NA260LH 6X 2.2 NA310LH lX 1.5 NA320LH 2X 1.3 1.1 NA330LH 3X NA340LH 4X 2.6 NA410LH lX 1.B NA420LH 2X 3X 1.5 NA430LH 2.7 NA510LH lX 2.1 4.5 NA520LH NAB10LH 2X 3.3 NAB20LH 2X TEXAS ~ INSlRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 lX xiii FUNCTIONAL INDEX POSITIVE-NOR GATES (DeIIlY lit 1-pF LOlld) TYPICAL DESCRIPTION TYPE DELAY (ns) 2-lnput NOR 'ASC02 3-lnput NOR 'ASC27 4-lnput NOR 'ASC4002 5-lnput NOR 'ASC260 8-lnput NOR 'ASC4078 HDLOR RELATIVE DRIVE CELL NAME FACTOR 2.4 N0210LH lX 1.5 N0220LH 2X 1.3 1.1 N0230LH N0240LH 3X 4X 3.2 N0310LH 1X 2.1 N0320LH 2X 3X 1.8 N0330LH '4.1 N0410LH lX 2.6 5.0 N0420LH 2X N0510LH lX 3.2 N0520LH 2X 3.4 N0810LH lX 4.9 N0820LH 2X POSITIVE-AND GATES (DeIIlY at 1-pF Load) TYPICAL DESCRIPTION TYPE DELAY (ns) 2-lnput AND 3-lnput AND 4-lnput AND xiv 'ASC08 'ASC11 'ASC21 HDL OR CELL NAME RELATIVE DRIVE FACTOR 2.1 AN210LH 1X 1.9 AN220LH 2X 2.1 1.7 AN240LH 4X AN260LH 6X 2.4 AN310LH 1X 2.2 AN320LH 2X 2.5 AN340LH 4X 1.9 AN360LH 6X 2.6 2.5 AN410LH AN420LH 2X 2.7 AN440LH 4X 2.3 AN460LH 6X lX 5·lnput AND 'ASC2024 2.9 AN510LH lX 8-lnput AND 'ASC6132 3.4 AN810LH lX TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 FUNCTIONAL INDEX POSITIVE-OR GATES (Delay at 1-pF Load) TYPICAL TYPE DESCRIPTION DELAY (ns) 2-lnput OR 'ASC32 3-lnput OR 'ASC4075 4-lnput OR 'ASC4072 RELATIVE HDL DR CELL NAME DRIVE FACTOR 2.3 OR210LH 1X 2.1 OR220LH 1.8 OR240LH 2X 4X 1.7 OR260LH 6X 2.7 OR310LH 1X 2.7 OR320LH 2X 2.2 OR340LH 4X 2.2 OR360LH 6X 3.1 OR410LH 1X 3.1 OR420LH 2X 2.7 OR440LH 4X 2.7 OR460LH 6X 5-lnput OR 'ASC6130 3.4 OR510LH 1X 8-lnput OR 'ASC6131 3.3 OR810LH 1X EXCLUSIVE-OR. -NOR. -AND-OR GATES (Delay at 1-pF Load) TYPICAL DESCRIPTION TYPE DELAY (ns) RELATIVE HDL OR CELL NAME DRIVE COMMENTS FACTOR 2.3 EX210LH 1X 2.0 EX220LH 2X 2.0 EX240LH 4X 2.4 EN210LH 1X 'ASC2330 2.6 A0221LH 1X 2-Wide, 2-lnput 'ASC2331 2.6 A0220LH 1X 2-Wide, 2-lnput Exclusive-OR 'ASC86 Exclusive-NOR 'ASC266 AND-NOR AND-OR ANALOG FUNCTIONS DESCRIPTION TYPE Crystal-Controlled Oscillator 'ASC2500 RC Oscillator 'ASC2502 Comparator 'ASC2503 Delay Element 'ASC2507 Delay Control 'ASC2508 INPUT OSEOOLH Crystal OSF02LH Crystal OSE06LH RC P-Chan OSE03LH C0212LH N-Chan C0213LH P-Chan N-Chan P-Chan N-Chan Medium-Drive Operational Amplifier 'ASC2519 CELL NAME Crystal Op-Amp DLE10LH DLC10LH AMC12NH TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 xv FUNCTIONAL INDEX BOOLEAN FUNCTIONS (Delay at 1-pF Load) DESCRIPTION AND·NOR OR-AND-NOR AND-OR-ANONOR OR·NANO 'ASC6002 TYPICAL DELAY (nsl 2.7 BF002LH Y - Al +(Bl.B~.B~1 'ASC6003 2.6 BF003LH Y - (Al.A2j+(Bl.B21 'ASC6004 2.8 BF004LH Y 'ASC6005 3.0 BF005LH Y (A 1.A2.A3j + (Bl.B~.B31 'ASC600S 3.2 BF006LH Y Al +A2+(Bl.B21 'ASC6007 3.7 BF007LH Y Al +A2+(Bl·B2·B31 'ASC6008 3.4 BF008LH Y Al +(Bl·B21 +(Cl.C21 'ASCS009 3.7 BF009LH Y 'ASC6012 3.7 BF012LH Y 'ASC6013 4.1 BF013LH Y - (A 1·A21 + (Bl·B2·B3) + (Cl.C2.C3) 'ASCS014 4.3 BF014LH Y - (Al·A2·A3)+(Bl·B2·B3)+(Cl·C2·C3) 'ASC6017 2.5 BF001LH Y - Al +(Bl·B2) 'ASC6018 3.9 BF010LH Y - A 1 + (Bl.B2.B3) + (Cl.C2.C3) 'ASC6019 3.5 BFOllLH Y - (Al.A2)+(Bl.B2)+(Cl.C2) 'ASC6022 3.9 BF022LH Y Al·A2+(Bl·B2.(Cl +C2)] 'ASC6023 3.2 BF015LH Y Al +]Bl.(Cl +C2)] 'ASC6024 3.4 BF016LH Y Al +((Bl +B2)o(Cl +C2)] 'ASC6025 3.5 BF025LH Y Al.A2.A3+(Bl.(Cl +C21] 'ASCS026 3.7 BF017LH Y Al +IB1·B2·(Cl +C2)] 'ASC6027 3.6 BF027LH Y - Al.A2.A3+(Bl.B2.(Cl +C2)] 'ASC6028 3.6 BF028LH Y 'ASC6029 3.4 BF020LH Y - Al·A2+(Bl.(Cl+C21] 'ASC6032 3.9 BF030LH Y - A1+ (B1o[Cl +(01.02)]] 'ASC6034 3.S BF034LH Y - (Al.A2)+(B1o[Cl +(01.02)]) 'ASC6035 3.3 BF035LH Y 'ASC6048 2.4 BF051LH Y -- A1o(B1+B21 'ASC6049 3.8 BF060LH Y - A1o(Bl +B2+B3)O(Cl +C2+C3) 'ASC6052 3.2 BF052LH Y Al.(Bl +B2+B3) 'ASC6053 2.6 BF053LH Y (Al +A2)o(Bl +B2) 'ASC6054 3.0 BF054LH Y - (Al +A2).(Bl +B2+B3) 'ASC6055 3.3 BF055LH Y - (Al +A2+A3).(Bl +B2+B3) 'ASC605S 2.9 BF056LH Y - Al.A2·(Bl+B21 'ASC6057 3.7 BF057LH Y 'ASC6058 3.0 BF058LH Y - AHBl +B2)o(Cl-1'C2j 'ASC6059 3.5 BF059LH Y - Al·(Bl +B2)o(Cl +C2+C3) 'ASC6062 4.1 BF062LH Y 'ASCS063 4.2 BF063LH Y (Al +A2)o(Bl +B2+B3)o(Cl +C2+C3j 'ASC6064 4.1 BFOS4LH Y (Al +A2+A3)o(Bl +B2+B3).(Cl +C2+C31 TYPE HDLOR CELL NAME EQUATION (Al.A21+(Bl.B2.B31 Al +(Bl·B21+(Cl·C2·C3) ~ ~ (Al·A21+(Bl.B21+(Cl·C2·C31 Al·A2·A3+(B1o(Cl +C2)o(Dl +02)] (A 1·A2) + (Bl.((Cl.C2) +101.02)]) ~ Al·A2·(Bl +B2+B3) (Al +A2).(Bl +B2).(Cl +C2+C3) NOTE: All have 1X drive factor. xvi TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 FUNCTIONAL INDEX BOOLEAN FUNCTIONS (Delay at 1-pF Load) (continued) TYPICAL DESCRIPTION TYPE DELAY HDLOR EQUATION CELL NAME (ns) 'ASC6065 2.8 BF065LH Y A 1o[Bl + (Cl.C2)] 'ASC6066 2.9 BF066LH Y A 1.[(61.B2) + (Cl.C2)) 'ASC6067 3.7 BF067LH Y A 1o[Bl + 62 + (Cl.C2)) 'ASC6068 4.0 BF06BLH Y - A 1o[Bl + (Cl·C2l+ (01.02)] 'ASC6069 4.2 BF069LH Y - A1o[(Bl·B21+(Cl.C2)+(Dl.D2)] 'ASC6072 3.B BF072LH Y = (Al +A21·[Bl +B2+(Cl.C2)) 'ASC6073 2.9 BF070LH Y - (Al +A2).[Bl +(Cl.C2)1 'ASC6074 3.1 BF071LH Y - (Al +A21·[(Bl·B21+(Cl·C211 'ASC6075 2.5 BF075LH Y (Al +A2+A31.[Bl +(Cl·C211 'ASC60S2 3.S SFOS2LH Y Al.((Bl.B21+[Cl.(Dl +D2111 OR-AND-OR- 'ASC60S3 3.7 SFOSOLH Y Al.(Bl + [C1o(Dl +D2)]} NAND 'ASC60B4 3.9 BFOS1LH Y Al.(Bl +[(Cl +C2).(Dl +D2)1I 'ASC60SB 4.1 BFOS8LH Y (Al +A2+A3).(Bl +IC1·(Dl +D2)]} AND-DR-NAND NOTE: All have 1 X drive factor. SPECIAL FUNCTIONS DESCRIPTION HDLOR TYPE Power-Up Clear Tie-Off Cell for Buffered Logical I/O 'ASC2320 CELL NAME PUCOOLH 'ASC2325 T0010LH COMMENTS 4X Drive ESD-Protected BUS TRANSCEIVERS DESCRIPTION MACRO OUTPUT TYPICAL DELAY (ns) HDLOR CELL NAME COMMENTS Octal 'ASC245 3-State 5.0 S245LH Bidirectional 'ASC651 3-Stote 10.4 S651LH Inverted Data and Universal 'ASC652 3-State 10.4 S652LH True Data DRIVERS TYPICAL DESCRIPTION MACRO OUTPUT DELAY (ns) Octal 'ASC244 3-Stote 2.4 HDLOR CELL NAME S244LH TEXAS .., INSTRUMENlS POST OFFICE BOX 656012 • DALLAS, TE,XAS 75265 COMMENTS True Data xvii FUNCTIONAL INDEX INPUT BUFFER CELLS (Delay at 1-pF Load) TTL THRESHOLD TYPICAL DESCRIPTION MACRO DELAY (nsl 'ASC5001 'ASC5003 Inverting 'ASC5005 'ASC5010 'ASC5007 Noninverting 'ASC5013 HDLOR CELL NAME 2.1 IPE03LH 2.1 IPF03LH 7.5 IPEOBLH B.l IPFOBLH 2.1 IPE05LH 2.1 IPF05LH 7.5 IPE10LH 7.5 IPF10LH 2.1 IPE04LH 2.1 IPF04LH 1.6 IPF12LH 2.1 IPF13LH RELATIVE DRIVE COMMENTS FACTOR IX IX IX IX IX IX IX IX IX IX IX IX With Hysteresis With Hysteresis With Pull-Up Tap With Pull-Up Tap With. Hysteresis lind Pull-Up Tap With Pull-Up Tap INPUT BUFFER CELLS (Delay at 1-pF Load) CMOS THRESHOLD TYPICAL DESCRIPTION MACRO DELAY (nsl 'ASC5000 Inverting 'ASC5002 'ASC5004 Noninverting NOTE: xviii 'ASC5006 HOi. OR CELL NAME RELATIVE DRIVE COMMENTS FACTOR 1.1 IPEOOLH 1.1 4.B IPFOOLH IPE06LH IX IX IX 4.B IPF06LH IX 1.0 IPF02LH 1.9 IPE01LH 1.1 IPF01LH IX IX IX IPE = Minimum Height; IPF = Minimum Width TEXAS ,., INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 With Hysteresis With Hysteresis and Pull-Up Tap With Pull-Up Tap FUNCTIONAL INDEX NONINVERTING OUTPUT BUFFER CELLS (Delay at 15-pF Load) DESCRIPTION TYPICAL DELAY TYPE (ns) 'ASC5100 'ASC5103 Push-Pull 'ASC5106 'ASC5110 'ASC5120 'ASC5104 'ASC5107 OUTPUT CURRENT IOl(mA) IOH(mA) 74 74 54 54 2.7 OPE40lH 3.4 4.0 -3.4 -4.0 2.7 OPF40lH 3.4 4.0 -3.4 -4.0 2.4 OPE60LH 5.1 6.0 -5.1 -6.0 2.4 OPF60LH 5.1 6.0 -5.1 -6.0 2.0 OPEOOLH 8.5 10.0 -8.5 -10.0 2.0 OPFOOLH 8.5 10.0 -8.5 -10.0 3.4 OPE42LH 3.2 4.0 -3.2 -4.0 3.4 OPF42lH 3.2 4.0 -3.2 -4.0 1.7 OPFBOlH 20.4 24.0 -10.2 -12.0 -6.0 2.7 OPE63LH 5.1 6.0 -5.1 2.7 OPF63LH 5.1 6.0 -5.1 -6.0 2.7 OPE03LH 8.5 10.0 -8.5 -10.0 -10.0 2.7 OPF03LH 8.5 10.0 -8.5 3.5 OPE43LH 3.4 4.0 -3.4 -4.0 3.5 OPF43LH 4.0 'ASC5124 2.5 OPFD3LH 3.4 37.4 44.0 -3.4 -10.2 -4.0 -12.0 'ASC5125 2.8 OPFB3LH 20.4 24.0 -10.2 -12.0 2.0 OPE61LH 5.1 6.0 - 2.0 OPF61LH 5.1 6.0 1.7 OPE01LH 8.5 10.0 1.7 OPF01LH 8.5 10.0 - 2.7 OPE41LH 3.4 3.4 4.0 - - 4.0 37.4 40.8 44.0 - - 48.0 - - 3-State 'ASC5111 'ASC5105 'ASC5108 Open Drain 'ASC5109 NOTE 1. OPE HDlOR CEll NAME 2.7 OPF41LH 'ASC5121 1.7 OPFD1LH 'ASC5123 1.5 OPFE1LH = Minimum Height; OPF = -- Minimum Width TEXAS ..., INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 xix FUNCTIONAL INDEX CLOCK GENERATORS COMMENTS Complementary Outputs D-TYPE FLIP-FLOPS (Delay at 1-pF Load) DESCRIPTION RELATIVE MACRO OR TYPE f max HDLOR (MHzl CELL NAME 55.B DTB10LH IX 'ASC74 46.3 DFB20LH 2X 59.2 DFZ20LH 2X 55.B DTP10LH IX 55.S DFP20LH 69.2 DFY20LH 2X 2X With Preset and Clear Preset Only 'ASC74 Clear Only 'ASC74 Neither Preset 'ASC74 nor Clear DRIVE COMMENTS FACTOR 52.1 DTC10LH IX 52.1 DFC20LH 2X 55.S DTN10LH IX 64.2 DFN20LH 2X D Low D Low D-TYPE FLIP-FLOPS TYPICAL MACRO DESCRIPTION DELAY (nsl OR TYPE HDLOR CELL NAME RELATIVE DRIVE COMMENTS FACTOR Quad with Q Only 'ASC173 S.O S173LH IX 3-State Output Hex Quad with Q, QZ 'ASC174 B.O S174LH 'ASC175 5.5 S175LH IX IX With Clear Octal 'ASC273 5.0 S273LH IX With Clear With Clear TOGGLE FLIP-FLOPS, UNGATED (Delay at 1-pF Load) DESCRIPTION TYPE RELATIVE f max HDL OR (MHz) CELL NAME DRIVE FACTOR Preset and Clear 'ASC2102 54.2 TAB20LH 2X Clear Only 'ASC2102 61.7 TAC20LH 2X Preset Only 'ASC2102 65.S TAP20LH 2X J-K-TYPE DESCRIPTION FLIP-FLOPS (Delay at 1-pF Load) TYPE 'ASC109 HDL OR f max (MHz) CELL NAME 44.2 JKB20LH RELATIVE DRIVE 2X Preset and Clear 'ASC210S xx 44.2 JKB21LH COMMENTS FACTOR 2X TEXAS ." INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Positive-Edge Trigger Negative-Edge Trigger FUNCTIONAL INDEX LATCHES TYPICAL MACRO DESCRIPTION DELAY OR TYPE Ins} 'ASC75 D-Type 'ASC6125 Set-Reset 8-Bit D-Type 8-8it Addressable CELL NAME DRIVE COMMENTS FACTOR 2.4 LAH10LH 1X Active-High Enable 2.0 LAH20LH 2X Active-High Enable 3.9 LAL20LH 2X Active-Low Enable 2.8 LAB10LH 1X 2X 'ASC279 4-Bit Bistable RELATIVE HDL OR 2.7 LA820LH 'ASC375 4.5 S375LH 1X 'ASC373 5.0 S373LH 1X 3-State Output 'ASC374 5.0 S374LH 1X 3-State Output 'ASC259 6.0 S259LH 1X Active-Low- Clear GATED S-R LATCHES (Delay at 1-pF Load) DESCRIPTION TYPICAL MACRO DELAY OR TYPE Ins) RELATIVE HDL OR CELL NAME DRIVE COMMENTS FACTOR 4-lnput 'ASC6100 2.8 GM010LH 5-lnput 'ASC6101 3.6 GM110LH 1X 5-lnput 'ASC6102 3.6 GMS10LH 1X Separate Set 6-lnput 'ASC6103 3.6 GM210LH 1X Separate Set/Reset 1X Separate Reset 6-lnput 'ASC6105 3.0 GM310LH 1X 7-lnput 'ASC6106 4.0 GM410LH 1X Separate Reset 8-lnput 'ASC6108 4.0 GM510LH 1X Separate Set/Reset GATED DESCRIPTION S-R LATCHES MACRO TYPICAL OR TYPE DELAY (ns) (Delay at 1-pF Load) RELATIVE HDLOR CELL NAME DRIVE COMMENTS FACTOR 4-lnput 5-lnput 'ASC6110 'ASC6111 2.7 3.1 GS110LH 1X 1X Separate Reset 5-lnput 'ASC6112 3.1 GSS10LH 1X Separate Set 6-lnput 'ASC6113 3.1 GS210LH 1X Separate Set/Reset 6-lnput 'ASC6115 3.4 GS310LH 1X 7-lnput 'ASC6116 3.8 GS410LH 1X Separate Reset 8-lnput 'ASC6118 4.0 GS510LH 1X Separate Set/Reset GS010LH OSCILLATORS AND MULTIVIBRATORS DESCRIPTION TYPE Crystal-Controlled 'ASC2500 Oscillator HDL OR CELL NAME COMMENTS OSEOOLH 5 MHz OSF02LH 20 MHz OSE06LH 800 kHz CMOS RC Oscillator 'ASC2502 OSE03LH 1 MHz Retriggerable One-Shot 'ASC2322 MVFOOLH With Clear TEXAS ." INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 xxi FUNCTIONAL INDEX 4-BIT EXPANDABLE REGISTERS-POSITIVE-EDGE-TRIGGERED DESCRIPTION Serial Inputl Parallel Output OUTPUT f max (MHz) CELL NAME 'ASC2401. an 59.6 R2401LH MACRO OR TYPE HDL OR COMMENTS Async Clear Serial Input 'ASC2402 an, OnZ 59.6 R2402LH Async Clear Parallel Inputl Parallel Output 'ASC2403 an 59.6 R2403LH Async Clear Parallel Input 'ASC2404 an, OnZ 59.6 R2404LH Async Clear 4-BIT EXPANDABLE REGISTERS-POSITIVE-EDGE-TRIGGERED DESCRIPTION TYPICAL MACRO OUTPUT OR TYPE HDL OR CELL NAME DELAY (ns) C.OMMENTS Async Clear Parallel Access 'ASC195A an 5.5 S195ALH J-K Input First Stage Parallel Inputl Parallel Output Bidirectional 'ASC194A an 5.0 S194ALH Shift Async Clear 8-BIT EXPANDABLE REGISTERS-POSITIVE-EDGE-TRIGGERED DESCRIPTION MACRO OR TYPE TYPICAL OUTPUT DELAY (ns) HDLOR CELL NAME COMMENTS Async Clear Serial Inputl 'ASC164 an 5.0 S164LH Parallel Output 'ASC595 3-State 5.5 S595LH Registered Outputs S598XLH Input Latches Async Load Parallel Inputl Parallel Output Parallel Input! Serial Output 'ASC598X 3-State OH,OHZ 9.8 'ASC165 OH,OHZ 8.0 S165LH 'ASC166 OH 6.0 S166LH 7.1 S299LH Parallel or Serial Input! Serial Output Universal and 'ASC299 Bidirectional 'ASC299X 300State 110 Async Clear Sync Load Async Clear Sync Load Multiplexed 110 Separate 110 5.0 S299XLH Async Clear Sync Load REGISTER FILE TYPICAL DESCRIPTION 16-Word by 8-Bit xxii TYPE ACCESS TIME ins) CELL NAME COMMENTS 'ASC3103 8 RF40BLH Typical Cycle Time - 11 ns TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DAllAS, TeXAS 75265 FUNCTIONAL INDEX 4-BIT COUNTERS-POSITIVE-EDGE-TRIGGERED (RIPPLE COUNT) MACRO DESCRIPTION OUTPUT OR TYPE D-Type Ripple Up f max HDL OR (MHzl CELL NAME COMMENTS 'ASC2405 On 64.2 R2405LH Async Clear 'ASC2406 On,OnZ 64.2 R2406LH Async Clear 'ASC2407 3·State 36.3 R2407LH Async Clear 'ASC2408 On 59.6 R2408LH Async Clear 4-BIT COUNTERS-POSITIVE-EDGE-TRIGGERED (RIPPLE COUNT) TYPICAL MACRO DESCRIPTION OUTPUT OR TYPE Programmable Divide by 2/8 Dual4-Bit DELAY Insl HDLOR CELL NAME COMMENTS 'ASCl77 On 22 Sl77LH Async Clear 'ASC393 Onl,On2 21 S393LH Async Clear SYNCHRONOUS COUNTERS- POSITIVE-EDGE-TRIGGERED DESCRIPTION 4-Bit Binary 4-Bit U p/Down 8-Bit 8inary TYPICAL PARALLEL MACRO DELAY LOAD (ns) HDL OR COMMENTS CELL NAME Async Clear 'ASC161A Sync 12.0 S161ALH 'ASC163A Sync 9.0 S163ALH Sync Clear 'ASC191 Async 11.5 S191LH With Mode ContrQI 'ASC193 Async Sync 11.5 10.0 S193LH Dual Clock 'ASC669 S669LH Internal Look-Ahead/Carry 'ASC590 None 10.4 S590LH Output Registers 'ASC593X Sync 10.0 S593XLH Input Registers DECODERS DESCRIPTION 2- to 4-Line 3- to 8-Line Dual 2- to 4-Line MACRO OR TYPE TYPICAL DELAY Ins) HDL OR CELL NAME RELATIVE DRIVE COMMENTS FACTOR 2.0 DE210LH 2.5 DE212LH 1X Active-Low Enable 'ASC137 12.0 S137LH 1X Latches 'ASC138 7.0 S138LH lX 'ASC139 4.0 S139LH 1X 3 Enables 1 Enable 'ASC2350 1X TEXAS ." INSTRUMENTS POST OFFICE BOX 655012. DALLAS, TEXAS 75265 xxiii FUNCTIONAL INDEX MULTIPLEXERS TYPICAL MACRO DESCRIPTION OUTPUT OR TYPE DELAY (nsl HDLOR COMMENTS CELL NAME 2- to l-Line 'ASC2340 Y 3.7 MUll0LH Active-Low Enable Dual 2- to 4-Line 'ASC155 Yln, Y2n 5.0 S155LH Active-Low Enable 'ASC157 'ASC158 Yn Yn 6.0 S157LH 6.2 S158LH 'ASC257A Yn 5.0 S257ALH 3-State 'ASC258A Yn 5.0 S258ALH 3-State 'ASC298 Qn 6.0 S298LH 'ASC398 Qn, QnZ 5.5 S398LH 'ASC399 Qn 5.0 S399LH Quad 2- to l-Line Storage Latches Storage Latches Storage Latches 4- to l-Line 'ASC2341 Y 2.9 MU210LH No Enable Dual 4- to l-Line 'ASC153 Yn 8.0 S153LH Strobe 'ASC151 Y,W 3-State 8.0 9.7 S151LH Low Enable S251LH Low Enable Y 4.7 MU310LH Active-Low Enable 'ASC251 8- to 1-Line 'ASC2342 NOTE: All have 1X drive factor. PROGRAMMABLE DELAY ELEMENTS TYPICAL DESCRIPTION TYPE Delay Element 'ASC2507 Control Element 'ASC2508 DELAY RANGE 3to12ns CELL NAME DLE10LH DLC10LH OSCILLATORS AND MUL TlVIBRATORS DESCRIPTION HDL OR TYPE Crystal-Controlled CELL NAME 'ASC2500 Oscillator 5 MHz OSF02LH 20 MHz OSE06LH CMOS RC Oscillator Retriggerable One-Shot COMMENTS OSEOOLH 'ASC2502 OSE03LH . 'ASC2322 MVFOOLH 800 kHz 1 MHz With Clear MAGNITUDE COMPARATORS AND ARITHMETIC CIRCUITS xxiv 'ASC181 4 12.0 S181LH 'ASC283 4 8.5 S283LH 'ASC280 11.0 S280LH 'ASC85 9 4 12.0 S85LH P = Q, P 'ASC686 8 9.0 S686LH P-Q,P>Q 'ASC688 8 7.5 S688LH P=Q Binary Full Adder Parity Generator Identity HDLOR CELL NAME ALU Comparator TYPICAL DELAY {nsl MACRO Comparator BIT WIDTH DESCRIPTION TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 COMMENTS < Q, P > Q FUNCTIONAL INDEX BIT-SLICE PROCESSOR ELEMENTS DESCRIPTION TYPE a-Bit Processor Slice 'ASC888 14-Bit Microsequencer 'ASC890 4-Bit Microprocessor Slice 'ASC2901 Look-Ahead Carry Generator 'ASC2902 Status and Shift Controller 'ASC2904 12-Bit Microprogram Controller 'ASC2910 (Microsequencer) STATIC RANDOM ACCESS MEMORIES DESCRIPTION HDL OR ORGANIZATION TYPE 256-8it 16 x 16 'ASC3003 RA416LH 512-8it 64 x 8 'ASC3004 RA608LH 256 x 4 'ASC3005 RA804LH 128 x 8 'ASC3006 RA708LH 1024-8it CELL NAME BIDIRECTIONAL 3-STATE NON INVERTING 110 CELLS (Delay at 15-pF Load) TYPICAL INPUT INV/TRUE TYPE DELAY (ns) CMOS TTL Inverting 'ASC5200 Inverting 'ASC5202 True 'ASC5203 True 'ASC5206 HDLOR CELL NAME OUTPUT CURRENT IOL (mA) 54 74 IOH (rnA) 54 74 -3.4 3.3 IOE40LH 3.4 3.3 IOF40LH 3.4 3.6 IOF47LH 3.4 3.3 IOF48LH 3.4 3.3 IOE41LH 3.4 3.3 IOF41LH 3.4 4.0 4.0 4.0 4.0 4.0 4.0 2.9 IOEOOLH 8.5 10.0 -8.5 2.9 IOFOOLH 8.5 IOF03LH 8.5 10.0 10.0 -8.5 -4.0 -4.0 -4.0 -4.0 -4.0 -4.0 -10.0 -10.0 -10.0 8.5 10.0 8.5 10.0 Inverting 'ASC5220 Inverting 'ASC5221 2.7 True 'ASC5226 2.7 IOF01LH Inverting 'ASC5250 1.7 IOFDOLH 3.5 IOE43LH 3.4 3.5 IOF43LH 3.5 IOE44LH 37.4 -44.0 -3.4 -3.4 -3.4 -3.4 -3.4 -8.5 - - 4.0 -3.4 -4.0 3.4 4.0 -3.4 3.4 -3.4 -3.4 -5.1 -4.0 -4.0 -4.0 -6.0 Inverting 'ASC5201 True 'ASC5207 3.5 IOF44LH 3.4 4.0 4.0 True 'ASC5217 2.7 IOF64LH 5.1 6.0 True 'ASC5227 2.7 IOF04LH 8.5 10.0 -8.5 -10.0 True 'ASC5239 2.7 IOFB8LH 20.4 24.0 -12.0 Inverting 'ASC5246 2.5 IOFD8LH 37.4 44.0 -10.2 -10.2 -12.0 NOTE: IOE = Minimum Height; IOF = Minimum Width TEXAS . " INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 xxv FUNCTIONAL INDEX INPUT/OUTPUT TERMINATING NETWORKS DESCRIPTION SUPPLY HDLOR CURRENT CELL NAME 'ASC2370 400 pA PR400LH 'ASC2371 200 ~A PR250LH Input or ~A PR095LH 1/0 with 5~ PR005LH Tap ~A PD095LH TYPE Active Pull-Up Active Pull-Down 'ASC2372 95 'ASC2374 'ASC2373 95 COMMENTS CompilerCell'· MEMORIES/REGISTERS Static Random Access Memories Read-Only Memories- TOTAL NUMBER WORD LENGTH OF WORDS IN BITS 'ASC3010 4 to 1024 4 to 32 16 to 16384 'ASC3200 8 to 2048 4 to 32 512 to 16384 'ASC3200 8 to 4096 4 to 64 512 to 65536 'ASC3430 - 4 to 32 4- to 32-X-n TYPE DESCRIPTION NUMBER OF BITS Single Array Read-Only Memories- Double Array Pipeline Test Register CompilerCell'" PROGRAMMABLE LOGIC ARRAYS DESCRIPTION Programmable Logic Arrays xxvi TYPE INPUTS 'ASC3800 64 TEXAS PRODUCT TERMS 128 ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 OUTPUTS 32 I General Information II 1-1 II 1-2 GENERAL INFORMATION INTRODUCTION TO STANDARD CELLS Leadership electronic solutions protect the unique value designed into your products. Using Texas Instruments SystemCelFM standard cells, you implement simple custom semiconductor solutions for your specific market opportunities. These custom solutions, also called Application Specific Integrated Circuits (ASICsl. lock in the powerful combination of personalized electronics and increased system efficiency. Some benefits are SystemCelFM FEATURES SYSTEM BENEFITS Custom design Improves your market value by - Reducing cycle time - Reducing product development costs Automated design process Improves your market execution by - Reducing design resources - Enhancing market entry point Selected density and package Simplifies your system design by Providing optimal circuit size Reducing package count Controlling costs Improving reliability Selected performance Enhances your market appeal by Providing timely application solutions Using your specific functions Integrating Tl's custom circuits. c o '';::; IU E ... ....oc ca... Q) C Q) ~ Using TI's standard cells greatly simplifies custom IC implementation. The SystemCeIFM standard-cell family not only includes a number of the familiar TTL and HCMOS logic functions, but it also provides new and higher density standard-cell logic functions. When used in conjunction with computer-based workstations, the custom IC schematic is electronically captured for implementation in an automated chip-layout process. This combination is currently the most cost effective for achieving personalized, high-complexity semiconductor solutions. Electronic workstations are the key to simplified, high-complexity IC design. Typically, the workstations incorporate high-level design tools to simplify component selection, schematic evaluation, and functional verification. Simulation tools, resident on most workstations, perform the equivalent of circuit breadboarding and debugging. Once the circuit design is complete, workstation utility software supplied by TI generates data base files containing both hardware and test descriptions. The data base is used as a source for generating the chip'layout and testing the fabricated devices. Custom ICs can be designed using one of many popular workstations or one of several personal computer systems. Once you decide on a workstation, you need only place one phone call to receive a copy of the TI documentation and software needed to begin a TI SystemCelFM design. If you decide not to invest in or use your own workstation, you can begin your standard-cell design with a sketch, and TI can work with you to complete the rest. Using TI's SystemCelFM family, yqu can decide how many, or how few, standard-cell design tasks you wish to perform. TI has defined a variety of customer support and interface programs structured specifically for the most beneficial application of your resources. A description of these interface points is provided in the standard-cell design overview. TEXAS ." INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 1-3 GENERAL INFORMATION II Customer Support To assist you with a standard-celilC design, TI has seven North American Regional Technology Centers (RTCs) staffed with experienced design personnel. The RTC staff can work with you to coordinate design specification development and implementation. Total system design support is available at the RIC. A number of electronic workstations are available with a direct high-speed computer link to the TI design automation center in Dallas, Tex'as. The RTC also provides assistance in the use of the TI standard-cell library, including installation, training, and library updates. Once you have decided on a standa.rd-cell approach, the RTC designers are available to perform the engineering design and test development. You decide the amount of work the RTC will do and the amount you will do. The more tasks you perform, the fewer charges there will be for nonrecurring engineering (NRE) work associated with IC design. The RTC can perform pre-design support, such as assisting with system analysis and circuit partitioning, as well as schematic capture and test pattern generation, Charges for these services are primarily based on fixed-fee contracts, providing predictable and manageable ,design costs. In addition to RTC assistance, technical sales representatives and ASIC product specialists, located in TI sales offices, can help determine the best standard-cell IC approach. Getting A Head Start: TI Standard-Cell Workshop The RTC offers comprehensive training in standard-cell design using state-of-the-art design tools and software. The RTC-210 ASIC workshop is a three-day course thilt uses numerous lab exercises and concise lectures to introduce all phases of a standard-celilC design. A listing of the RTC-210 course work follows. RTC-210 ASIC Course Work Outline Characteristics and advantages of gate arrays Characteristics and advantages of standard cells Semicustom design technique Schematic capture Packaging and interface considerations Circuit simulation and test-pattern design Generating a design data base using a workstation IC layout and post-layout simulation. Another important objective of the course is to help identify interface points and communication channels that will satisfy your specific requirements for standard-cell IC design. The workshop is available at the nearest RTC. Or, if you have a number of designers who will be designing with standard cells, the workshop can be conducted at your facility. The course is open to anyone interested, and the registration fee is deductible from your first standard-cell IC order. Contact the nearest TI Regional Technology Center (see listing in Table 1) to register f-or the workshop. 1-4 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 GENERAL INFORMATION Table 1. Texas Instruments North American Regional Technology Centers REGION RTC LOCATION West Coast - North PHONE Santa Clara. CA (408) 748·2220 West Coast - South Irvine, CA (714) 660-8140 Mid-West - North Arlington Heights, IL (312) 640-2909 Mid-West - South Dalias. TX (214) 680-5066 East Coast - North Waltham, MA (617) 895-9196 East Coast - South Norcross. GA (404) 662-7945 Canada Nepean, Ontario (613) 726-1970 c o "+' I'CI .. -.. E o c Cii TI SystemCelJTM FAMILY Since the IC was invented, manufacturers of electronic products have used each new advancement in integrated circuit technology to increase functionality, decrease size, enhance performance, and reduce system costs. This trend has led semiconductor producers from small-scale-integration (SSI), with only a few transistors per device, to today's very-Iarge-scale-integration (VLSI), where a circuit consists of hundreds of thousands of transistors. These high levels of integration have required major improvements in the areas of process technology and production and fabrication techniques. CD C CD o TI's SystemCell™ standard-cell product family takes advantage of these technological advancements to bring you high performance and functionality of custom ICs at semi-custom prices. The standard cells also offer added benefits of short design cycle time and reduced product development costs. The TI SystemCelFMstandard-cell library includes basic gates, buffers, I/O drivers, and high-level functions called macros. These macros are supplied in two forms: a hard-wired form and a software form. Software macros of familiar TTL functions can be embedded in your design with a simple label, or they can be custom modified to enhance functionality and cost effectiveness. Hard-wired macros, providing a broad selection of predesigned and fully characterized functions, can also be included in your design with a single label. New standard-cell functions are being added routinely to increase the .effectiveness' of automated design techniques. These new functions are described in the Advance Information and Product Preview sections of this book. A goal, maintained by TI, is to provide total semiconductor solutions to your needs. Requests for new cell designs will be carefully considered. Other benefits available from the SystemCell™ Family are: • • • • • • • CMOS or TTL compatible inputs and outputs Operation over VCC range of 2 V to 6 V Specified parametrically over VCC range of 4.5 V to 5.5 V Specified parametrically over industrial and military temperature ranges Internal gate propagation delays of less than 1 ns Flip-flop toggle frequencies up to 65.8 MHz Latch-up protection up to 400 mA Inputs and outputs designed to withstand up to 4 kV ESD, as tested using method 3015 of MIL-STD-883. Wide variety of package options: DIP, SOIC (D), PGA (GB) and Quad Flat-Pack. SystemCell™ "J:echnology SystemCell™ products are fabricated using a twin-well polysilicon self-aligned CMOS process to produce 2-l'm gate-length versions of CMOS standard cells. In this process, polysilicon is deposited over the gate oxide prior to the source and drain implants. After patterning the polysilicon gates, the source and drain are then implanted, TEXAS . " INSTRUMENlS POST OFFICE SOX 655012 • DALLAS, TEXAS 75265 1-5 GENERAL INFORMATION POLYSILICON GATE ALUMINUM INTERCONNECTS ----------~.... PROTECTIVE OVERCOAT N-WELL ...... P-WELL _------------- P-SUBSTRATE Figure 1. Cross Section of Double-Level Metal. Twin-Well CMOS Process using the gates as the mask. This self-aligning process, illustrated in Figure 1, permits rE1duced junction areas, which are coupled with shallow implants to achieve several performance enhancements. ICs created using Systell1CelFMstandard cells have speeds that meet or exceed HCMOS, Advanced HCMOS, and all but the most advanced bipolar logic characteristics. These improved speeds are due to reduced gate and junction capacitance. Ring oscillator evaluations, shown in Figure 2, compare 2-/Lm CMOS gate propagation delay with 3-/Lm and 5-/Lm CMOS delays. The figure shows the technological improvements associated with high-density CMOS processes. The data are obtained from equivalent ring oscillators in which the gates are adjacent and interconnect capacitance is minimal. The reduced power requirements of CMOS place its speed-power efficiency two orders of magnitude ahead of conventional bipolar logic families. The lower power requirements are achieved because of reduced channel lengths, more shallow junctions, smaller feature size, and lower junction capacitance of the high-density 2-/Lm CMOS technolOgy. Standard cell products from TI are characterized for performance over thl;l full military temperature range of -55°C to 125°C and the industrial temperature range of -40°C to 85°C. Cell Size and Construction Each SystemCelFM is a custom-designed silicon implementation of a partiCular logic function. The SystemCen™ data sheets compare the size of each cell or macro relative to the NA21 OLH two-input NAND gate, shown in Figure 3. This allows you to estimate the equivalent complexity of your design. 1-6 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 GENERAL INFORMATION RING OSCILLATOR DATA - INVERTERS. F.O. = 1 r:::: o '';:: CU E ... ....o .5 ... (ij CD r:::: CD e" 2 3 4 5 6 7 8 9 10 GATE LENGTH - I'm Figure 2. CMOS Performance Within a cell. aluminum Vee and ground lines run horizontally across the cell at the top and bottom as illustrated in Figure 3(A). The polysilicon gates run at right angles to the power buses. providing access to the inputs and outputs at both the top and bottom of the cell. The logic concept of the cell is shown in Figure 3(8). TEXAS ,e, INSTRUMENTS POST OFFICE BOX 655012· DALLAS. TEXAS 75265 1-7 GENERAL INFORMATION INPUTS A OUTPUT B Y ,I C) CD ;mM+t-~-Vcc----+I--':'" ~ v B - - - - -- CD --, ---{ I I "" !!. 5" 0""3 ao· P-CHANNEL FETS ~ POL Slucml"""iF=!--~ ALUMINUM N-CHANNEL FETS --~ ~t1++---GND---+ 1-- I I I L_ (8) I I ____ .JI (b) LOGIC CELL LAYOUT Figure ·3. 2-lnput NAND This cell structure lends itself to automated layout by providing the capability of laying cells end-to-end in a continuous row of cells having a continuous power bus. High-density routing is I'Ichieved through the use of a second level of metal interconnect. . 1-8 TEXAS ..Ij~ 'V INSTRUMENTS POST OFFICE BOX 665012 • DALLAS. TEXAS ')6265 GENERAL INFORMATION THE SystemCell™ LIBRARY Computer-Aided Design with the Library The SystemCelFM library provides full access to the latest technological advances in computer-aided design and state-of-the-art engineering workstations. A workstation employing the TI SystemCeIFM library provides the familiar, simple entry for designing complex custom ICs. The TI library can be installed on many popular workstations such as those available from OaisyTM, HewlettPackard, Mentor Graphics™, and Valid Logic Systems Incorporated™. The library can also be used on PCs that support FutureNet® and P-CAOTM. The engineering workstations provide generic capabilities for schematic capture, simulation, test-vector generation, and netlist/test-vector formatting. The TI library contains five additional software programs implementing graphic, logic, delay, and interconnect capacitance models, along with data base translators. These programs are used to generate the layout and test-pattern files for your design and are then used directly by the TI design-automation system to produce the cmplished as described in the following paragraphs. as· Dllt~base (Phllsl! I) Schemlltic Cllpture Schematic capture consists of cell conveniilion and logic capture. Cell Conversion Each element of the given circuit is replaced with a standard-cell equivalent. This involves selecting the cells and macros that satisfy both functional and timing requirements, including dc sink/source current requirements of the I/O cells. Software maCrQS caniMrease lhe efficiency of cell conversion, and simple modifications can make them custom for your current design. This is usulllly done on a workstation in cOnjunction with logiC capture. Logic Cllpture This is the process of representing logic on the workstlltion by calling and namingeac/,! cell and macro to be used and by naming all input and output interconnections. A hierarchical design process permits the development of higher-level macros composed of cells and lower-order macros. These 'super' macros and their interconnections are also named. Within the liinits'ofthe particular workstation, this hierarchical design process is continued until the standard-cell ic is finplemented; When cQmplet\!l~; the workstation paptures the defined logic in a hierarchical ned,st· databa!i'e. This databasjOl is utilized by the SystemC~IlTM library !i,ute specificatjons on the schematic. Functional lind Timing Simuilitions The workstation utilizes the lie and dC.test vector files to verify pre-layout functionality and timing performance. . . This simulation uses the standard cell's intrinsic characteristics. Test Description LII!19u8ge (TOLl The workstation test vfilctors used in the pre-layout simulation are translatec! into TDL automatically by the SystemCeJITM lil:>rary 'TPl ~ranslator softwarfil. The extracted TDL patt",rns can be ev;:lIuated by prc;>grams that simUlate faults.at every node to see how effectively the test patterns are detecting faults. Test pattern grading is an optional procedure. . . . '. ,-16 TEXAS'''' INSTl~UMENTS POST OFFICE BOX 65~012 ~ DALkAS. '~EXAS 16266 GENERAL INFORMATION Design Specification The blank, generic, standard-cell IC design specification forms, available from TI, can be used as a working guideline to achieve successful pre-layout simulations. If so, most of the design specification data are captured during Phase 0 and 1. A formalized version can then be completed for joint approval by you and TI. Upon approval, both the design specification and data files are given to TI for Phase 2. Successful completion of Phase 0 and Phase 1 yields the following results: A database for the circuit description in HDl A database for a set of test patterns expressed in TDl A design specification. s::::: o "';: as E ... .....o s::::: ... iii Q) Generating the Chip layout (Phase 21 s::::: Q) During this phase of your standard-celilC design, the HDLlTDl database, developed in Phase 1, is converted into an actual device layout. e" Placement and Routing Cells and interconnections are arranged according to your I/O design requirements. Using your HDl, a computerautomated layout is completed. Cells are first placed by the layout software, and then cell interconnections are made using the hierarchical netlist data base. layout Capacitance Extraction Values of the interconnect capacitance for each network are extracted and added to cell capacitance to derive the total capacitive loading on each circuit node. Post-Layout Simulation Similar to the pre-layout functional and timing simulation, post-layout simulation combines the effects of intrinsic and interconnect capacitance and resistance values to simulate the performance based on the cell placement and chip layout . . Review Results of the post-layout simulation are evaluated for conformance to design specification. Beyond conformance, the database results are evaluated for compliance with predictable norms defined for the design-automationsystem process. Design Specification Based on results of the post-layout review, the design specification is confirmed and updated. Confirmation consists of a mutual agreement to proceed to Phase 3. An update is interactive and requires approval by both purchaser and TI. If necessary, options for the update are reviewed with the customer and specification changes, or database changes, that will meet the design requirements are proposed. Design Verification The layout database is checked by the design automation system to ensure that geometric design rules are met. Schematic Verification The schematic verification program uses the layout database and works backward to generate a new HDl, which is then compared to the pre-layout HDl description. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 1-17 GENERAL INFORMATION Merge Internal Cell Structure The post-layout verified database is merged with a tooling-structure database, resident in the design automation system. This merge completes the tooling database. G) CD ::::I CD III Tooling Database ... The tooling database is used to extract the test programs and pattern generator (PG) files. The files are needed to support wafer fabrication and chip testing. ::::I .... o Successful completion of Phase 3 yields the following results: ... A test-program generation (TOL) database A wafer-fabrication tooling database. 3 ...0' III ::::I Chip Fabrication and Testing (Phase 3) Prototypes of your standard-cell IC are fabricated and tested as described in the following paragraphs. Photomask Tooling The PG files are used to execute the photomask designs needed to produce the wafers containing the custom ICs. Wafer Processing CMOS standard-cell wafers are fabricated using a twin-well polysilicon self-aligned process (see Figure 1). Utilization of the 2-l'm process, defined to remain a mainstream technology at TI, is based on long-term product plan commitments for both custom and standard IC products. Probe Test Standard wafer-probe techniques are applied to implement cost-effective utilization of fabrication materials and resources. A probe test ensures the assembled ICs are most likely to yield parametrically good devices. Prototype Assembly and Test Chips passing the probe test are used in the prototype fabrication. Prototypes are packaged in ceramic packs or carriers as an expedient method for completing design evaluations. Class" A" prototypes are typically tested at room temperature for functionality while being exercised at 1 MHz. Electrical characteristics of the input cells, output cells, and static supply current are "go-no-go" tested to the design specification. These class" A" prototypes are expedited to you for use in performing system functional testing. AC Characterization arid Data Log The remaining prototypes (class "B") are tested/data logged by TI in accordance with the design specification. Typically, class "B" is tested for functionality at the rated performance range(s) over operating ranges of supply voltage and temperature. Standard data logging is limited to "go-no-go" conformance to the design specification. These prototypes permit the customer to perform system characterization and system prototype delivery prior to production start-up. Volume Production Acceptance of the characterized "B" prototypes as conforming to the design specification is required prior to the execution of production orders. Production quantities are packaged in accordance with the design specification. 1-18 TEXAS ." INSTRUMENlS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 GENERAL INFORMATION SUMMARY The TI SystemCelFM family provides simple electronic solutions for making your products uniquely innovative. The SystemCelFM family data sheets (see Section 3) and IC design considerations (see Section 7) provide additional information. For assistance beyond the scope of this data book, call the following sources: ASIC product specialist(s) at TI field sales office(s) Design engineer(s) at the TI Regional Technology Center(s) The TI ASIC center in Dallas. • c o ".ij . -.. 1'0 E o c iii CI) C CI) t!' TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 1-19 II C) CD ::I CD III ... -... ::I o 3 III o· ::I 1-20 Definitions, Ratings, and Glossary 2-1 c ....5' CD ;:;: c)' ~ ::0 I» ~ S' cc . til I» ::s c.. G) 0' til til ... I» -< 2-2 EXPLANATION OF FUNCTION TABLES The following symbols are now being used in function tables on TI data sheets: H high level (steady state) L low level (steady state) transition from low to high level transition from high to low level X Z a .. h II irrelevant (any input. including transitions) off (high-impedance) state of a 3-state output the level of steady-state inputs at inputs A through H. respectively 00 level of a before the indicated steady-state input conditions were established 00 complement of an level of a JL = LJ = rOGGLE 00 or level of a before the indicated steady-state input conditions were established before the most recent active transition indicated by t or 1 ~ ca rn rn o G "C C one high-level pulse ca one low-level pulse each output changes to the complement of its previous level on each If. in the input columns. a row contains only the symbols H. L. and/or X. this means the indicated output is valid whenever the input configuration is achieved and regardless ofthe sequence in which it is achieved. The output persists so long as the input configuration is maintained. If. in the input columns. a row contains. H. L. and/or X together with t and/or I. this means the output is valid whenever the input configuration is achieved but the transition(s) must occur following the achievement of the steady-state levels. If the output is shown as illevel (H. L. 00. or it persists so long as the steady-state input levels and the levels that terminate indicated tninsitions are maintained. Unless otherwise indicated. input transitions in the opposite direction to those shown br the pulse follows the indicated input have no effect at the output. (If the output is shown as a pulse. transition and persists for an interval dependent on the circuit.) 00). IL LJ. ,; activ~ transition indicated by t or I. C) C '.j:i ca a: ~ rn C o ~ '2 OJ: CD o TEXAS • INSTRUMENTS POST OFFICE 'BOX 65sch 2 • DAl.lAS. TEXAS 75265 2-3 EXPLANATION OF FUNCTION TABLES Among the most complex function tables in this book are those of the shift registers. These embody most of the symbols used in any of the function tables. plus more. Below is the function table of a 4-bit bidirectional universal shift register. e.g .• SN74ASC194A. . FUNCTION TABLE CLEAR C a> -to S· ;::;: o· ::s en . L H H H H H H H MODE CLOCK I S1 SO X X H L L H H L X X X L H H H L L' , ,t L X t t INPUTS SERIAL LEFT RIGHT X X X X X X H X X L H X L X x X OUTPUTS A X X a X X X X X PARALLEL B C X X X X b c X X X X X X X X X X D X X d X X X X X QA QB QC QD L L L L QAO aBO aco aoo a b c d H aAn aBn aCn L aAn aBn aCn H aBn aCn aOn L aBn Ocn aOn QAn aBn Ocn aOO The first line of the table represents a synchronous clearing of the register and says that if clear is low. all four outputs will be reset low regardless of the other inputs. In the following lines. clear is inactive (highl and so has no effect. The second line shows that so long as the clock input remains low (while clear is highl. no other inpllt has any effect and the outputs maintain the levels they assumed before the steady-state combination of clear high and clock low was established. Since on other lines of the table only the rising transition of the clock is shown to be active. the second line implicitly shows that no further change in the outputs will occur while the clocl<. remains high or on the high-to-Iow transition of the clock. The third line of the table represents synchronous parallel loading of the register ,md says that if S1 and SO are both high then. without regard to the serial input. the data entered at A will be at output QA. data entered at B will be at QB. and so forth. following a low-to-high clock transition. The fourth and fifth lines represent the loading of high- and low-level data. respectively. from the shift-right serial input and the shifting of previously entered data one bit; data previously at QA is now at QB. the' previolJs levels of QB and QC are now at QC and QO respectively. and the data previously at QD is no longer in the register. This entry of serial data and shift takes place on the low-to-high transition of tile clock when S 1 is low and SO is high and the levels at inputs A through 0 have no effect. ' The sixth and seventh lines represent the loading of high- and lOW-level data. respectively. from the shift-left serial input and the shifting of previously entered data one bit; data previously atqB is now at QA. the previous levels of QC and QO are now at QB and QC. respectively. and the dCltCl previously at QA is no Iqnger in tl1e register. This entry of serial data and shift takes place on the low-to-high transition of the clock wh!"n S 1' is high and SO is low and the levels at inputs A through 0 have no effect. The last line shows that as long as both mode inputs are low. no other input has any effect and. as in the second line. the outputs maintain the levels they assumed before the steady-state combination of clear high and both mode inputs low was established. . . . . 2-4 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75~e5 ABSOLUTE MAXIMUM RATINGS RECOMMENDED OPERATING CONDITIONS Table 1. Specifications for Internal Boolean and Macro Cells a'bsolute maximum ratings over operating free-air temperature range (unless otherwise noted) \ Supply voltage range, vee ................................................................ -0.5 V to 7 V Input voltage range ..................................................................... -0.5 V to 7 V Operating free·air temperature range: SN54ASe' ............................................. -55°e to 125°e SN74ASe' .............................................. -40 o e to B5°e Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65°C to 150 0 C recommended operating conditions SN74ASC' SN54ASC' Vee Supply voltage MIN 4.5 TA Operating temperature range -55 NOM 5 MAX 5.5 MIN 4.5 125 -40 NOM '5 MAX 5.5 85 II UNIT V °e Table 2. Specifications for Input Standard Cells absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage range, Vee ................................................................ -0.5 V to 7 V Input clamp current, 11K (VI <0 or VI>Vee) ....................................................... ±20 mA Input voltage range ..................................................................... -0.5 V to 7 V Operating free·air temperature range: SN54ASe' ............................................. -55°e to 125°e SN74ASe' .............................................. -40 o e to B5°e ~ U) Storage temperature range .............................................................. -65 °e to 1 50 0 e '2 SN74ASC' SN54ASC' MIN 4.5 NOM 5 C o '';= recommended operating conditions for TTL-compatible inputs MAX 5.5 MIN 4.5 NOM 5 MAX 5.5 UNIT Vee Supply voltage VIH High-level input voltage VIL Low-level input voltage VI Input voltage 0 Vee 0 Vee V tt Input transition (rise and fall) times 0 200 0 200 ns TA Operating temperature range -55 125 -40 85 °e 2 2 V ~ c V 0.8 0.8 V recommended operating conditions for CMOS-compatible inputs SN54ASC' NOM 5 SN74ASC' MAX 5.5 MIN 4.5 Vee VIH High-level input voltage 3.15 VIL Low~level MAX 5.5 VI Input voltage 0 Vee 0 Vee V tt Input transition (rise and fall) times 0 300 0 300 ns TA Operating temperature range -55 125 -40 85 °e 3.15 0.9 input voltage TEXAS ." INSTRUMENTS POST OFFICE NOM 5 UNIT Supply voltage MIN 4.5 eox 655012 • DALLAS. TEXAS 75265 V V 0.9 V 2-5 ABSOLUTE MAXIMUM RATINGS RECOMMENDED OPERATING CONDITIONS Table 3. Specifications for Output Standard Cells absolute maximum ratings over operating free-air temperature range (unless otherwise noted) •c Supply voltage range; VCC ................................................................ -0.5 V to 7 V Output clamp current. 10K (VO VCC) ............... ; ................................... ±-20 mA Continuous output current (VO=O to VCC) ........................................................ ±25 mA Operating free-air temperature range: SN54ASC· ............................ , ................ -55°C to 1 ~50C SN74ASC' .............................................. -40°C to B5°C Storage temperature range .............................................................. -65°C to 150°C recommended operating conditions CD :i' ;:; 5' ::J til ~ SN74ASC' SN54ASC' Vee Supply voltage MIN 4.5 Vo Output voltage 0 10H High-level output currenH 10L Low-level output current TA Operating temperature range NOM 5 MAX 5.5 MIN 4.5 NOM 5 0 VCC As specified on individual MAX 5.5 VCC 125 I V V mA data sheets -55 UNIT mA -40 85 °C t Applies for all except open- ~ec) . '" Operating free-air temperature range: SN54ASC' ............................................. -55°C to 125°C SN74ASC' .............................................. -40°C to 85°C Storage temperature range .............................................................. -65°C to 150°C recommended operating conditions for TTL-compatible 1I0s SN54ASC' Vce Supply voltage MIN 4.5 Vo Output voltage 0 10H High-level output currentt 10L Low-level output current VIH High-level input voltage VIL Low-level input voltage VI Input voltage 0 tt Input transition (rise and and fall) times TA Operating temperature range t Applies for all except 2-6 open~drain NOM 5 SN74ASC' MAX 5.5 MIN 4.5 0 Vcc As specified on individual NOM 5 MAX 5.5 Vcc 0.8 V 0.8 V ns °e 0 0 Vec 200 0 Vec 200 -55 125 -40 85 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 V mA 2 output pells. V mA data sheets 2 UNIT V ABSOLUTE MAXIMUM RATINGS RECOMMENDED OPERATING CONDITIONS recommended operating conditions for CMOS-compatible II0s SN74ASC' SN54ASC' MIN Vee Supply voltage 4.5 Vo Output voltage 0 IOH High-level output currentt IOL Low-level output current VIH High-level input voltage VIL Low-level input voltage VI Input voltage 0 tt Input transition (rise and and fall) times TA Operating temperature range NOM 5 MAX MIN 5.5 4.5 0 Vee As specified on individual NOM 5 MAX 5.5 Vee V V mA data sheets mA 3.15 3.15 UNIT 0.9 V 0.9 V ns ·e 0 0 Vee 300 0 Vee 300 -55 125 -40 85 V • t Applies for all except open-drain output cells. ~ fI) C o '';:; 'c =t: CD C TEXAS . " INSTRUMENTS POST OFFICE BOX B55012 • DALLAS, TEXAS 75265 2-7 PARAMETER MEASUREMENT INFORMATION FROM OUTPUT UNDER TEST ----1'·. TEST I PARAMETER POINT lCl I I tpd CELLS INTERNAL and INPUT CL t OpFand1pF tpd OUTPUTS 15 pF and 50 pF tel includes probe and test fixture capacitance. lOAD CIRCUIT • FIGURE 1. TOTEM-POLE OUTPUTS - -....- - V C C o .... S· CI) ;::;: FROM OUTPUT _ _ _• TEST UNDER TEST POINT O· lCl- :::J (I) ~ 50 PF t lOAD CIRCUIT t CL includes probe and test fixture capacitance. FIGURE 2. OPEN-DRAIN OUTPUTS TEST FROM OUTPUT _ _ _P..,O.IN_T_-,\R,.,lllr--_'" UNDER TEST LOAD CIRCUIT PARAMETER ten tdis tpd INTERNAL BUFFER RL tpZH 40 kll tpZL 20 kll tpHZ 40 kll tpLZ 20 kll ~ tpHL CL t 1 pF 1 pF o pF - and 1 pF OUTPUT OR 110 RL 1 kll CL t 15 pF and 50 pF 1 kll 50 pF - 15 pF and 50 pF S1 S2 OPEN CLOSED CLOSED OPEN OPEN CLOSED CLOSED OPEN OPEN OPEN tCL includes probe and test fixture capacitance. FIGURE 3. 3-STATE OUTPUTS 2-8 TEXAS " , INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 76265 PARAMETER MEASUREMENT INFORMATION -..I tt!'- .-r:=--~90~%~-1- - INTERNAL OUT-Of-PHASE OUTPUT INTERNAL OUT-Of-PHASE 1 OUTPUT I. I 1 1 44% INTERNAL I IN-PHASE . 44% OUTPUT_ _ _ _"'_ I FIGURE 4. CMOS INPUT CELL ANO CMOS 3-STATE BIDIRECTIONAL INPUT PROPAGATION DELAY TIME VOLTAGE WAVEFORMS -+l tt J4- ""''''''-'''''''9'''''0''''%''';- . - 44% I OUTPUT 44% /.-tPHL...I IN-PHASE OUTPUT ~tPLHr.l1 _ _ _ _J 44% I I 1 VOL , en c: .. 0) " CO ~1_0_%_ _ _ : I . 1 44% tpHL~ INPUT I 0 ~=----o OUT -Of-PHASE OUTPUT L I 44% 1 I -Vee - tPLH~ I I -;_..1. FIGURE 5. TTL INPUT CELL AND TTL 3-STATE BIDIRECTIONAL INPUT PROPAGATION DELAY TIME VOLTAGE WAVEFORMS 1 1 OUT-Of-PHASE o tPLH~)t.----=-'....... - -VOH I ~ I+-tPHL~ -----if-....I. INPUT - -3 V .1 ' -_ _ ~tPHL~ - I - 1 10% 1.3V ~tpHZ - - VOL FIGURE 6. INTERNAL TOTEM-POLE OUTPUT PROPAGATION DELAY TIME VOLTAGE WAVEFORMS IN-PHASE OUTPUT ,n c: o -;: "c. ;;:: 1 ~--VOH !.tPHL+! 90% I -VOL 44 J VOH a: tPLZ~~ ! _ 10% :I ~"'< CI) C 44% ~tPZL-.I VOL FIGURE 7. INTERNAL 3-STATE-OUTPUT BUFFER DISABLE AND ENABLE VOLTAGE WAVEFORMS TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 2-9 PARAMETER MEASUREMENT INFORMATION I!.tr~. I INPUT C CI) 10% CMOS/TTL OUTPUT 5' ~ '--1- I 44% I I !.-CMOS..../ tpLH I ,, Iii tplH I I 1.3 V Ii.- tpLH I VOH 50% 1.3 V ___ I I I -+II It- -VOL CMOS...! tPHL -1-- CMOS - . / CMOS/TTL OUTPUT I -VOH I I I I j.-TTL-tI tPLH 5' CQ !fl 1.3 V VOL FIGURE 8. CMOS/TTL OUTPUT AND 3·STATE BIDIRECTIONAL INPUT/OUTPUT PROPAGATION DELAY TIME VOLTAGE WAVEFORMS I» :::3 ~ G) 0' en • tf 1 1- _ _ _ _ _ en I» 0 \t- TTL tPHL4 r+ . 10% j+-CMOS-..j tPHL . !.-TTL I» 90% I I 90% INPUT -< I I I ---VCC I 44% II ::+ 0' :::3 !! 90% I I •- !t-tf'" 90% I 10% --vcc I 10% 0 ~CMOS-, I.-- TTL--t tpZH I CMOS/TTL OUTPUT I tPHZ~ VOH " 50% 1 I I ~tPLZ~ CMOS/TTL OUTPUT tpZH - ---Hi-Z j.-CMOS...../ tpZL -Hi-Z -1-- I I I I , I VOL FIGURE 9. CMOS/TTL 3·STATE BIDIRECTIONAL INPUT/OUTPUT DISABLE AND ENABLE VOLTAGE WAVEFORMS 2-10 ~ TEXAS INSTRUMENTS POST O.FIOS IlOX 656612 • DALLAS, texAS 76265 GLOSSARY SYMBOLS, TERMS, AND DEFINITIONS INTRODUCTION These symbols, terms, and definitions are in accordance with those currently agreed upon by the JEOEC Council of the Electronic Industries Association (EIA) for use in the USA and by the International Electrotechnical Commission (lEC) for international use. OPERATING CONDITIONS AND CHARACTERISTICS (IN SEQUENCE BY LETTER SYMBOLS) Cpd Power dissipation capacitance Used to determine the no-load dynamic power dissipation per logic function (see individual circuit pages): Po = Cpd VCC 2 f+lee Vee· f max Maximum clock frequency The highest rate at which the clock input of a bistable circuit can be driven through its required sequence while maintaining stable transitions of logic level at the output with input conditions established that should cause changes of output logic level in accord.ance with the specification. ICC Supply current The current into* the Vee supply terminal of an integrated circuit. IIH High-level input current The current into * an input when a high-level voltage is applied to that input. IlL Low-level input current The current into * an input when a low-level voltage is applied to that input. IOH High-level output current The current into * an output with input conditions applied that, according to the product specification. will establish a high level at the output. IOL • ~ co en en o S "0 C CO o C) C "';:: CO a: .. en c o "2 "';:: ~ Low-level output current The current into * an output with input conditions applied that, according to the product specification, wiU establish a low level at the outP4t. IOZ Off-state (high-impedance-state) output current (of a three-state output) The current flowing into* an output having three-state capability with input conditions established that, according to the production specification, will establish the high-impedance state at the output. VIH High-level input voltage An input voltage within the more positive (less negative) of the two ranges of values used to represent the binary variables. NOTE: A minimum is specified that is the least-positive value of high-level input voltage for which operation of the logic element within specification limits is guaranteed. VIL Low-level input voltage An input voltage level within the less positive (more negative) of the two ranges of values used to represent the binary variables. NOTE: A minimum is specified that is the most-positive value of low-level input voltage for which operation of the logic element within specification limits is guaranteed. CD C *Current out of a terminal is given as a negative value. ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 2-" GLOSSARY SYMBOLS, TERMS, AND DEFINITIONS ID' VOH High-level output voltage The voltage at an output terminal with input conditions applied that. according to product specification,. will establish a high level at the output. VOL Low-Ievei output voltage The voltage at an output terminal with input conditions applied that. according to product specification. will establish a low level at the output. VT+ Positive-going threshold level The voltage level at a transition-operated input that causes operation of the logic element according to specification as the input voltage rises from a level below the negative-going threshold voltage. VT _. VT- Negative-going threshold level The voltage level at a transition-operated input that causes operation of the logic element according to specification as the input voltage falls from a level above the positive-going threshold voltage. VT +. ta Access time The time interval between the application of a specified input pulse and the availability of valid signals at an output. tdis Disable time lof a three-state output) The time interval between the specified reference points on the input and output voltage waveforms. ' with the three-state output changing from either of the defined active levels (high or low) to a highimpedance (off) state. (tdis = tPHZ or tPLZ). ten Enable time lof a three-state output) The time interval between the specified reference points on the input and output voltage waveforms. with the three-state output changing from a high-impedance (off) state to either of the defined active levels (high or low). (ten = tpZH or tpzLI. tf Fall time The time interval between two reference points (90% and 10% unless otherwise specified) on a waveform that is changing from the defined high level to the defined low level. th Hold time The time interval during which a signal is retained at a specified input terminal after an active transition occurs at another specified input terminal. NOTES: 1. The hold time is the actual time interval between two signal events and is determined by the system in which the digital circuit operates. A minimum value is specified that is the shortest interval for which correct operation of the digital circuit is guaranteed. C ....5" CD =+ S" ::J .til ::a ...5" m cotil . m ::J CC) S- til til .. m -< 2. The hold time may have a negative value in which case the minimum limit defines the longest interval (between the release of the signal and the active transition) for which correct operation of the digital circuit is guaranteed. tpd 2-12 Propagation delay time The time between ~he specified reference points on the input and output voltage waveforms with the output changing from one defined level (high or low) to the other defined level. (tpd = tPHL or tPLH)· TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 GLOSSARY SYMBOLS. TERMS. AND DEFINTIONS tPHL Propagation delay time. high-to-Iow level output The time between the specified reference points on the input and output voltage waveforms with the output changing from the defined high level to the defined low level. Disable time (of a three-state output) from high level The time interval between the specified reference points on the input and the output voltage waveforms with the three-state output changing from the defined high level to a high-impedance (off) state . Propagation delay time. low-to-high-Ievel output The time between the specified reference points on the input and output voltage waveforms with the output changing from the defined low level to the defined high level. Disable time (of a three-state output) from low level The time interval between the specified reference points on the input and output voltage waveforms with the three-state output changing from the defined low level to a high-impedance (off) state. tpZH Enable time (of a three-state output) to high level The time interval between the specified reference points on the input and output voltage waveforms with the three-state output changing from a high-impedance (off) state to the defined high level. Enable time (of a three-state output) to low level The time interval between the specified reference points on the input and output voltage waveforms with the three-state output changing from a high-impedance (off) state to the defined low level. Rise time The time interval betWeen two reference points (10% and 90% unless otherwise specified) on a waveform that is changing from the defined low level to the defined high level. • ...>- ca II) II) .E o "C C ca oCD C '.jj ca a: oc o '2 '.jj tsr tsu ·Sense recovery time The time interval needed to switch a memory from a write mode to a read mode and to obtain valid data signals at the output. ;;: Setup time The time interval between the application of a signal at a specified input terminal and a subsequent active transition at another specified input terminal. NOTES: 1. The setup time is the actual time interval between two signal events and is determined by the system in which the digital circuit operates. A minimum value is specified that is the shortest interval for which correct operation of the digital circuit is guaranteed. 2. The setup time may have a negative value in which case the minimum limit defines the longest interval (between the active transition and the application of the other signal) for which correct operation of the digital circuit is guaranteed. tt Transition time (general) The time interval between two reference points (10% and 90% unless otherwise specified) on a waveform that is changing from the defined low level to the defined high level (rise time) or from the defined high level to the defined low level (fall time). tw Pulse duration (width) The time interval between specified reference points on the leading and trailing edges of the pulse waveform. TEXAS ~ INSTRUMENTS POST OFFICE BOX 225012 • DALLAS, TEXAS 75265 II) o 2-13 II c CD :::;.'r 0' j ~ 2·14 Product Guide 3-1 II... " o C. I: (') 1+ C) I: is.: CD 3-2 PRODUCT GUIDE 00 2-INPUT POSITIVE-NAND GATES logic symbol :==r=Y--v tpd Ins) CELL NAME Cpd IpF) CL = 0 pF CL=lpF 0.9 0.8 0.7 0.6 0.6 2.0 1.3 1.1 1.0 0.8 NA210LH NA220LH NA230LH NA240LH NA260LH 0.51 1.00 1.51 2.06 2.98 Label: NA2nOLH A,B,Y 02 2-INPUT POSITIVE-NOR GATES logic symbol :=D-v tpd Ins) CELL NAME Cpd IpF) CL = 0 pF CL = 1 pF 0.9 0.8 0.8 0.7 2.4 1.5 1.3 1.1 N0210LH N0220LH N0230LH N0240LH • ....CJ 0.33 0.52 0.80 0.98 :::I .. "C o Label: N02nOLH A,B,Y; ~ 04 INVERTERS logic symbol tpd Ins) CELL NAME Cpd IpF) CL = OpF CL=lpF 2.2 0.9 0.6 0.5 0.5 0.4 0.4 2.3 1.7 1.1 0.9 0.8 0.7 0.6 IV101LH Iv110LH IV120LH IV130LH IV140Lii IV160LH IV'180LH 7.22 0.44 0.80 1.29 1.61 2.39 3.16 Label: IVinOLH A,Y; TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, 'TEXAS 15265 3-3 PRODUCT GUIDE 08 2-INPUT POSITIVE-AND GATES logic symbol :==D- tpd (nsl CELL NAME CL AN210LH AN220LH AN240LH AN260LH =0 pF CL 1.3 1.5 1.9 1.5 = Cpd (pFI 1 pF 2.1 1.9 2.1 1.7 0.90 1.20 2.32 3.0B Label: AN2nOLH A,B,Y; • ..."tI 10 3-INPUT POSITIVE-NAND GATES tpd (nsl o CELL NAME s:::: NA310LH NA320LH NA330LH NA340LH c. .... (') logic symbol CL =0 pF CL O.B 0.9 O.B O.B = Cpd (pFI 1 pF 2.2 1.5 1.3 1.1 0.50 0.94 1.41 1.B6 Label: NA3nOLH A,B,C,Y; 11 3-INPUT POSITIVE-AND GATES logic symbol )-Y tpd (nsl CELL NAME CL AN310LH AN320LH AN340LH AN360LH =0 Cpd (pFI pF CL = 1 pF 1.6 1.7 2.2 1.7 2.4 2.2 2.5 1.9 1.06 1.56 2.59 4.0B Label: AN3nOLH A,B,C,Y; 20 4-INPUT POSITIVE-NAND GATES logic symbol tpd (nsl CELL NAME CL NA410LH NA420LH NA430LH =0 pF O.B 1.0 1.0 CL = Cpd (pFI 1 pF 2.6 1.B 1.5 0.50 0.96 1.46 Label: NA4nOLH A,B,C,D,Y; 3-4 "!} TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 y PRODUCT GUIDE 21 4-INPUT POSITIVE-AND GATES logic symbol tpd (nsl CELL NAME AN410LH AN420LH AN440LH AN460LH Cpd (pFI CL = 0 pF CL = 1 pF 1.8 2.0 2.4 2.1 2.6 2.5 2.7 2.3 1.18 1.72 2.77 4.58 Label: AN4nOLH A,8,C,D,Y; • 27 3-INPUT POSITIVE-NOR GATES logic symbol ~~y tpd (nsl CELL NAME N0310LH N0320LH N0330LH Cpd (pFI CL = 0 pF CL = 1 pF 1.1 1.1 1.0 3.2 2.1 1.8 C~ ... 0.32 0.56 0.85 (J j Label: N03nOLH A,B,C,Y; "C ...o a.. 30 8-INPUT POSITIVE-NAND GATES logic ~ymbol A tpd (ns) CELL NAME NA810LH NA820LH B C - -........_ _ Cpd (pFI CL=OpF CL=lpF 1.9 1.9 4.5 3.3 o 0.61 1.13 E ~"'--- Y F--~ Label: NA8nOLH A,B,C,D,E,F,G,H,Y; G H 32 2-INPUT POSITIVE-OR GATES logic symbol tpd (ns) CELL. NAME OR210LH OR220LH OR240LH OR260LH Cpd (pF) CL = 0 pF CL = 1 pF 1.5 1.7 1.6 1.5 2.3 2.1 1.8 1.7 0.86 1.62 3.09 4.70 Label: OR2nOLH A,B,Y;' TEXAS • INSTRUMENTS POST OFFICE aox 655012 • OAL.LA~, TEXAS 75265 3-5 PRODUCT GUIDE 74 D-TYPE POSITIVE-EDGE-TRIGGERED FLIP-FLOPS logic symbol DFB2PLH, DTB10LH CELL NAME fmax IMHzl Cpd IpFI DFB20LH DTB10LH 46.3 55.8 3.76 2.12 Label: D P ClK R E C1Z f l . a D ClRZ BnOLH CLRZ,PREZ,D,CLK,O,OZ; DFC20LH DTC10Ll-i 52.1 52.1 3.39 2.10 • 64.2 55.8 ClKB=1 a 1D D az ClRZ R 2.71 2.21 Label: D_NnOLH D,CLK,O,OZ; DFP20LH DTP10LH Label: 0 DFN20lH, OTN10lH 55.8 55.8 3.49 2.50 ClK--Fl- a D~ az PnOLH PREZ,D,CLK,O,OZ; DFY20LH 69.2 4.63 OFP20lH, OTP10lH Label: DFY20LH PREZ,CLK,O,OZ; 59.2 DFZ20LH I az DFC20lH, DTC10lH Label: D_CnOLH CLRZ,D,CLK,O,OZ; DFN20LH DTN10LH 1D R PREZEa ClK C1 az 4.94 I Label: DFZ20LH CLRZ,PREZ,CLK,O,OZ; o 10 DFY20LH PREz-n-a ClK~az OFZ20LH PREZEa ClK R az ClRZ R 75 D-TYPE LUCHES WITH ACTIVE-HIGH ENABLE logic symbol tpd Insl CELL NAME LAH10LH LAH20LH Cpd IpFI CL = 0 pF CL = 1 pF 1.6 1.6 2.4 2.0 2.00 2.81 label: LAHnOLH D,C,O,OZ; 3-6 TEXAS ." INSTRUMENTS POST OFFICE BOX 665012 • DALLAS, TEXAS 75265 PRODUCT GUIDE 85 4-BIT MAGNITUDE COMPARATORS logic symbol tpd (nsl CELL NAME = ° pF I 12.0 I CL S85LH Cpdt (pFI = 1 pF CL 13.6 12.5 Label: S85LH P3,P2,P1 ,PO,03,02,01 ,OO,PGT01 ,PLTO 1, PEOO 1,PGTOO,PLTOO,PEQOO; }re~ PO P1 P2 P3 PLTOI < PEOOI PGTOI 00 01 > :}- 02 03 P O PGTOO II 86 2-INPUT EXCLUSIVE-OR GATES logic symbol :=D-- tpd (nsl CELL NAME CL = °pF CL 1.8 2.0 2.4 EX210LH EX220LH EX240LH = 1 pF 2.3 2.0 2.0 Cpd (pFI .po (,) y :::J "C ...o 1.00 1.35 2.55 Q. Label: EX2nOLH A,B,Y; 109 J-K POSITIVE-EDGE-TRIGGERED logic symbol FLIP-FLOPS CELL NAME JKB20LH I I fmax (MHzl 44.2 I I Cod (pFI PREZ Q 4.81 Label: JKB20LH CLRZ,PREZ,J,KZ,CLK,O,OZ; CLK ---;:> C1 KZ oz CLRZ tThe equivalent po~er dissipation capacitance does not include interconnect capacitance. TEXAS . " INSTRUMENlS POST OFFICE BOX 656012 • DALLAS, TEXAS 75266 3-7 PRODUCT GUIDE 137 3-LlNE TO 8-LlNE DECODERS/DEMULTIPLEXERS WITH ADDRESS LATCHES tpd Insl CELL NAME S137LH Cpdt IpFI CL=OpF I CL=lpF 12.0 I 12.7 logic symbol GLZ YO 17.59 Label: S137LH C,B,A,GLZ,G2Z,G1,YO,Y1,Y2,Y3,Y4,Y5, Y6,Y7; A Vl B Y2 C V3 Y4 II... G1 Y5 G2Z V6 "'D V7 o Q. c: ~ 138 C) 3-LlNE TO 8-LINE DECODERS/DEMULTIPLEXERS logic symbol c: c:CD tpd Insl CELL NAME S138LH Cpdt IpFI CL=OpF I CL=lpF 7.0 I 7.7 13.77 Label: S.138LH G 1,G2AZ,G2BZ,A,B,C, YO, Y 1, Y2, Y3, Y 4, Y5,Y6,Y7; DMUX A B C J.~ va Vl V2 Y3 V4 G1 G2AZ G2BZ tThe equivalent power dissipation capacitance does not include interconnect capacitance. 3-8 . TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 V5 Y6 V7 PRODUCT GUIDE 139 DUAL 2-LlNE TO 4-LlNE DECODERS! DEMULTIPLEXERS logic symbol tpd (nsl CELL NAME CL=OpF 5139LH I CL=lpF I 4.0 V11 B1 12.S4 4.S V10 A1 Cpdt (pFI V12 G1Z Label: 5139LH Al,Bl,G1Z,A2,B2,G2Z,Vl0,Yll,Y12, V13,Y20,Y21,Y22,Y23; V13 V20 A2 V21 B2 V22 G2Z V23 Q) "C 151 ·S a-LINE TO 1-LlNE MULTIPLEXERS 5151LH ... (J MUX tpd (nsl CELL NAME 0 logic symbol Cpdt (pFI CL=OpF I CL=1pF 8.0 I 10.S 10.09 GZ A B c Label: 5151 LH GZ.A,B,C,DO,Dl,D2,D3,D4,D5.DS,D7, y,W; DO :::s EN "C ... 0 D. ]GJ} 0 V 01 02 2 03 3 04 4 05 5 06 07 7 W 6 tThe equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS ~ INSfRUMENlS POST OFFICE BOX. 655012 • DALLAS, TEXAS 75265 3-9 PRODUCT GUIDE 153 DUAL 4-lINE TO 1-LINE MULTIPLEXERS logic, symbol tpd (ns) CL=OpF I CL=1pF 8.0 I 8.7 CELL NAME S153LH Cpdt (pF) A B 8.56 label: S153LH G1Z,G2Z,A,B,C1O,C11,C12,C13,C20, C21 ,C22,C23,Y1 ,Y2; G1Z C10 Y1 C11 C12 C13--~~~________~ G2Z C20 Y2 C21 ~ ~ a Q. ~ C 2 155 Ci) C DUAL 2-lINE TO 4-lINE DECODERSI DEMULTIPLEXERS WITH DATA AND ENABLE LINES c: logic symbol (1) tpd (ns) CELL NAME CL = 0 pF S155LH 5.0 I CL=1pF I 5.6 CpdT IpF) A O} G-0 ...,1 3 - B 12.20 DMUX Label: S155lH C1 ,G1Z,C2Z,G2Z,A,B,Y10,Y11 ,Y12,Y13, Y20,Y21,Y22,Y23; G1Z r--. C1 G4 4 G2Z ..... C2Z ........ I" 0 Y10 1t--... V;1 2 V12 3t--. V13 V20 V21 ~ V22 V23 tThe equivalent power dissipation capacitance does not iriclude interconnect capacitance. 3-10 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 PRODUCT GUIDE 157 QUADRUPLE 2-LlNE TO 1-LlNE NONINVERTING MULTIPLEXERS logic symbol Ipd Insl CELL NAME CL=Oj>F S157LH I CL=1pF I 6.0 Cpdt IpFI GZ AZ_B 7.1 9.40 A1 Label: S157LH A 1,A2,A3,A4,B1 ,B2,B3,B4,ALB,GZ, Y1,Y2,Y3,Y4; Y1 B1 A2 V2 B2 A3 B3 A4 B4 V3 V4 II Q) "'0 ·S 158 QUADRUPLE 2-LlNE "to 1-LINE INVERTING MULTIPLEXERS e" ... logic symbol CJ :::s S158LH . "'0 Ipd Insl CELL NAME Cpdt IpFI CL=OpF I CL=1pf 6.2 I 6.6 0 GZ c.. AZ_B 12.16 Label: S151lLH A 1,A2,A3,A4,B1 ,B2,B3,B4,ALB,GZ, Y1,Y2,Y3,Y4; A1 B1 A2 B2 A3 B3 A4 V1 V2 V3 V4 B4 tThe equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 75265 3-11 PROO.,CT GUIDE 161A I SYNCHRONOUS 4-BIT BINARY COUNTERS WITH DIRECT CLEAR logic symbol CLRZ tpd Insl CELL NAME CL=OpF S161ALH I CL=1pF I 12.0 Cpdt IpFI 13.0 31.54 LOADZ RCO ENT ENP Label: S161ALH D,C,B,A,CLK,CLRZ,ENP,ENT,LOADZ, OD,OC,OB,OA,RCO; ClK OA A .--....--_------08 8 [4) [8) C D oc."'D OC QD 163A SYNCHRONOUS 4-BIT BINARY COUNTERS logic symbol C ...n tpd Insl CEll NAME G') Cl=OpF c S163ALH i 9.0 Cpdt IpFI I Cl=1pF I 10.0 . ClRZ lOADZ 29.B1 RCO ENT Label: S163ALH D,C,B,A,CLK,CLRZ,ENP,ENT,LOADZ, OD,OC,OB,OA,RCO; ENP CLK A OA B OB C OC D QD 164 a-BIT PARALLEL-OUT SERIAL SHIFT REGISTERS logic symbol tpd Insl CELL NAME CL=OpF S164LH 5.0 I Cl=1pF I 5.5 Cpdt IpFI CLRZ ClK 23.55 Label: S164LH A,B,CLK,CLRZ,OA,OB,OC,OD,OE,OF,OG, OH; A B OA OB OC OD QE OF QG QH tThe equivalent power dissipation capacitance does not incllJde interconnect capacitance. 3-12 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 PRODUCT GUIDE 165 PARALLEL-LOAD 8-81T SHIFT REGISTERS logic symbol tpd (nsl CELL NAME CL=OpF S165LH I CL=1pF I 8.0 Cpdt (pFI SH_lOZ ClKINH 42.07 8.5 ClK Label: S165LH A.B.C.D.E.F.G.H.CLK.CLKINH.SH_LDZ. SER.QH.QHZ; SER A 10 B 10 C 0 E F G QH H 10 QHZ II Q) "C 's 0 .... 166 (,) PARALLEL-LOAD 8-BIT SHIFT REGISTERS WITH DIRECT CLEAR - CL=OpF S166LH 7.5 I CL=1pF I ...0 Q. SRG8 tpd (nsl CELL NAME :::I "C logic symbol Cpdt {pFI 8.4 Label: S166LH A.B.C.D.E.F.G.H.CLK.CLKINH.SER. SH_LDZ.CLRZ.QH; ClRZ SH_lOZ 33.15 ClKINH ClK SER A B 2.30 C 0 E F G H QH tThe equivalent power dissipation capacitance does not include interconnect capacitance. 3-13 PRODUCT GUIDE 173 4-BIT D-TYPE REGISTERS WITH 3-STATE OUTPUTS . logic symbol ClR tpd (ns) CELL NAME CL=OpF S173lH I 7.1 Cpdt (pF) MZ NZ 24.00 GIZ G2Z I CL=lpF 8.0 label: S173lH 01,02,03,04,ClK,ClR,G1Z,G2Z,MZ,NZ, 01,02,03,04; ::p 8. C ClK 01 02 03 01 02 03 04 04 174 HEX D-TYPE FLIP-FLOPS ...n logic symbol ClRZ tpd (nsj CEll NAME (i) C Cpdt (pF) CL=OpF c: CD S174lH 8.0 ClK I CL = 1 pF I 8.5 01 24.44 02 03 04 label: S174lH 01 ,02,03,04,05,06,CLK,CLRZ,01,Q2, 03,04,05,06; tl 5 06 01 02 03 04 05 06 175 QUADRUPLE 0-TYPE FLIP-FLOPS WITH COMPLEMENTARY OUTPUTS logic symbol ClRZ tpd (ns) CELL NAME CL=OPFI S175lH 6.5 I Cpdt (pF) ClK 13.74 01 Cl=lpF 6.4 Label: S175lH 01,02,03,04,ClK,ClRZ,01.01Z,02, 02Z,Q.3,03Z,04,04Z; 02. 03 04 tThe equivalent power dissipation capacitance does not inc;lude interconnect capacitance. 3-14 TEXAS .., INSTRUMENTS POST OFFICE BOX ,661)012 • DALLAS, TeXAS 75265 01 Q1Z Q2 02Z 03 03Z 04 04Z PRODUCT GUIDE 177 1-BIT AND 3-BIT BINARY RIPPLE COUNTERS logic symbol tpd Ins) CELL NAME CL S177LH =0 pF 22.0 Cpdt IpF) I CL=1pF I 22.5 lOADZ 23.56 ClRZ Label: S1 77LH A.B.C.D.LDADZ.CLRZ.CLK 1Z.CLK2Z.QA. QB.QC.QD; ClK1Z OA A 10 • DIV8 + ClK2Z }cr crt B C 0 OB OC Q) 00 "0 '5 CJ ... 181 ARfTHMETIC LOGIC UNITS/FUNCTION GENERATORS "0 o... S1S1LH D.. AlU tpd Ins) CELL NAME U ::::J logic symbol Cpdt IpF) CL=OpF I CL=1pF 13.0 I 14.6 80 81 46.68 Label: S1 S1LH A3Z.A2Z.A 1Z.AOZ.B3Z.B2Z.B1Z.BOZ. CN.M.S3.S2.S 1.SO.F3Z.F2Z.F 1Z.FOZ.AEQB. GZ.PZ.CNPl4; 82 83 M CN '} 4 PZ M GZ f, AEOB CNPl4 C1 AOZ [11 FOZ [21 F1Z 141 F2Z 181 F3Z BOZ A1Z B1Z A2Z B2Z A3Z B3Z tThe equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS .. " INSTRUMENTS POST OFFltE BOX 655012 • DALLAS, TEXAS 15265 3-15 PRODUCT GUIDE 191 , SYNCHRONOUS UP/DOWN BINARY COUNTERS WITH DOWN/UP MODE CONTROL logic symbol CTRDIV16 tpd (ns) CELL NAME CL=OpF S191LH I CL=1pF I 11.5 12.6 Cpdt (pF) CTENZ D_UZ 2(CT-O)Z6 37.26 Label: S191LH D,C,B,A,CLK,D_UZ,CTENZ,LOADZ,OD, OC,OB,OA,RCOZ,MACMIN; MAX_MIN 3icT-161Z6 CLK RCOZ LOADZ A (11 QA B C [2J [4J QB QC D [8J QD -a (; c. c n ... 193 SYNCHRONOUS 4-BIT UP/DOWN COUNTERS (DUAL CLOCK WITH CLEAR) logic symbol G) c is: tpd (ns) CELL NAME CD S193LH CTRDIV 16 Cpdt (pF) CL = 0 pF I CL=lpF 11.0 I 11.5 CLR UP 34.84 Label: S193LH A,B,C,D,UP,DOWN,LOADZ,CLR,BOZ,COZ, OA,OB,OC,OD; CT-O COZ DOWN BOZ LOADZ A [2J OB C (4J QC D [81 QD tThe equivalent power dissipation capacitance does not include interconnect capacitance. 3-16 TEXAS QA B ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 PRODUCT GUIDE 194A 4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS logic symbol tpd (nsl CEll NAME S194ALH ClRZ Cpdt (pFI Cl=OpF I Cl=1pF 5.0 I 5.9 SO S1 25.45 ClK Label: S194ALH A,B,C,D,SRSER,SLSER,CLK,CLRZ,S1,SO, QA,OB,OC,OD; SRSER A B C 0 SLSER QA 3.40 3.40 3.40 3.40 2.40 OB OC 00 II Q) "'0 ·S 195A 4-BIT PARALLEL-ACCESS SHIFT REGISTERS ~ ... logic symbol (.) tpd (nsl CELL NAME S195ALH ::J "'0 SRG4 Cpdt (pFI Cl=OpF I Cl=1pF 5.5 I 6.4 CLRZ 0~ SH_LOZ a.. 21.95 Label: S195ALH CLRZ,CLK,SH_LDZ,J,KZ,A,B,C,O,OA, OB,OC,OD,ODZ; ClK J KZ A B C 0 QA 2,30 2,30 2,30 OB OC 00 aDZ tThe equivalent power dissipation capacitance does not incluqe interconnect capacitance. TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 / 3-17 PRODUCT GUIDE 244 OCTAL INTERNAL 3-STATE BUS BUFFERS logic symbol G1Z tpd (ns) CELL NAME 5244LH Cpdt (pF) CL=OpF I CL=lpF 2.6 I 4.3 B.B2 Label: 5244LH A 11,A 12,A 13,A 14,G1Z.A21,A22.A23, A24,G2Z,Yll,Y12,Y13,Y14,Y21,Y22,Y23,Y24; Yll All A12 Y12 A13 Y13 A14 Y14 G2Z o:p 245 Q. C OCTAL INTERNAL 3-STATE BUS TRANSCEIVERS ...n A21 Y21 A22 YZZ A23 Y23 AZ4 Y24 logic symbol GZ OIR tpd (ns) C) CELL NAME C s:CD 5245LH Cl = 0 pF I 5.0 I Cpdt (pF) CL=lpF 6.7 81 Al 22.96 Label: 524SLH A l,A2,A3.A4.AS,A6.A 7,AB,B l,B2,B3, B4,BS,B6,B7,BB,GZ,DIR; A2 82 A3' 83 A4 84 A5 8S A6 A7 86 87 A8 88 251 8-LlNE TO 1-LlNE MULTIPLEXERS WITH 3-STATE OUTPUTS logic symbol MUX GZ A tpd (ns) CELL NAME CL=OpF 5251LH' 9.7 8 Cpdf (pF) I CL=lpF I 11.4 C 12.BS Label: 5251 LH GZ,A,B,C,DO,Dl,D2,D3,D4,DS,D6,D7, Y,Wl; DO 01 02 0 1 03 2 3 04 4 05 5 06 07 6 7 tThe equivalent power dissipation capacitance does not include interconnect capacitance. 3-18 :}G¥ TEXAS . " INSTRUMENTS POST OFFICE BOX 656012 • bALLAS, TEXAS 75265 \l \l Y WZ PRODUCT GUIDE 257A QUADRUPLE 2-LlNE TO 1-LlNE MULTIPLEXERS WITH 3-STATE OUTPUTS logic symbol tpd {nsl CEll NAME S257ALH Cl=OpF I 5.0 I Cpdt {pFI Cl = 1 pF 6.7 GZ AZ_B 10.8 Label: S257ALH A 1 ,A2,A3,A4,B1 ,B2,B3,B4,GZ,AZ_B, Y1,Y2,Y3,Y4; A1 B1 A2 B2 A3 B3 A4 ., '\l Y1 Y2 Y3 Y4 B4 258A, QUADRUPLE 2-LINE TO 1-LINE INVERTING MULTIPLEXERS WITH 3-STATE OUTPUTS ...u logic symbol -6o .. tpd {nsl CEll NAME S258ALH Cl = 0 pF I 5.0 I Cpdt {pFI Cl=1pF 6.7 • a.. GZ AZ_B 7.28 Label: S258ALH A 1 ,A2,A3,A4,B1 ,B2,B3,B4,GZ,ALB, Y1,Y2,Y3,Y4; A1 B1 A2 B2 Y1 Y2 A3 B3 Y3 A4 B4 Y4 tThe equivalent power dissipation capacitance does' not include interconnect capacitance. TEXAS . " INSTRUMENTS POST OFFICE BOX 61:Hi012 • DALLAS, TeXAS 76265 3-19 PRODUCT GUIDE 259, 8-BIT ADDRESSABLE LATCHES logic symbol 50 tpd Ins.) CELL NAME S259LH 51 Cpdt IpF) CL=OpF I CL=·1pF 6.0 I 6 ..6 O}SM 2 . 52 GZ 40.59 Label: S259LH CLRZ,D,GZ,SO,S1 ,S2,QO,Q1 ,Q2,Q3,Q4, Q5,Q6,Q7; ~ 0 CLRZ 9,00 'QO 10,OR 9,10 Q1 10,lR 9,20 Q2 10JR 9,30 Q3 10JR ." a 9,40 Q4 10,4R Q, ...c 9,5.0 () 10;iiR C) 10;6R a:CD 9,70 10,7R Q5 9,60 c Q6 Q7 260 5-INPUT POSITIVE-NOR GATES logic symbol A@: ~=y-. B tpd Ins) CELL NAME N0510LH N0520LH Cpd (pF) CL = 0 pF CL = 1 pF 1.7 1.6 5.0 3.2 0.37 0.64 . Label: N05nOLH A,B,C,D,E, Y; 266 2-INPUT EXCLUSIVE-NOR GATES logic symbol tpd Ins) CELL NAME CL = 0 pF EN210LH 1.4 J I Cpd IpF) CL = 1 pF 2.4 A~.y B~ 1.09 Label: EN210LH A,B,Y; tThe equivalent power dissipation capacitance does not include interconnect cap~citance. 3-20 y PRODUCT GUIDE 273 OCTAL D-TYPE FLIP-FLOPS logic symbol ClRZ tpd Ins) CELL NAME S273LH Cpdt IpF) CL=OpF I CL=lpF 5.0 I 5.8 ClK 22.45 Label: S273LH D1,D2,D3,D4,D5,DS,D7,DB,CLK,CLRZ, 01,02,03,04,05,OS,07,08; D1 01 02 02 03 03 04 04 05 05 06 07 06 08 as 07 279 CD S-R LATCHES "C logic symbol '5 CELL NAME Cpd IpF) CL=OpF CL=lpF 2.0 2.2 2.8 2.7 ~: ~~. tpd Insl LAB10LH LAB20lH II RZ R 2.11 3.20 Label: LABnOLH SZ,RZ,O,QZ; CJ ... (J :::J "C 0 ... Q. 280 9-BIT ODD/EVEN PARITY GENERATORS/CHECKERS logic symbol 2k A tpd Ins) CELL NAME S280LH Cpdt IpF) CL=OpF I CL=1pF 11.0 I 11.5 Label: S280LH A,B,C,D,E,G,H,I,EVEN,ODD; 25.80 B C D EVEN E F ODD G H tThe equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS ." INSTRUMENlS /'Otf OFFICi lox 651iOU • bAllAS, nXAS 11!:l1iG 3-21 PRODUCT GUIDE 283 4-BIT BINARY FULL ADDERS WITH FAST CARRY tpd Ins 1 CELL NAME S283LH Cpdt IpFI CL=OpF I CL=1pF 8.5 I 9.1 36.28 Label: S283LH A4,A3,A2,A 1,B4,B3,B2,B1 ,CO,SUM4, SUM3,SUM2,SUM 1,C4; logic symbol A1 A2 A3 A4 B1 B2 B3 1: B4 } { } CO CI CO SUM1 SUM2 SUM3 SUM4 C4 l1li-29-8------------------------------------------------"'0 o"" c. c (") QUADRUPLE 2-INPUT MULTIPLEXERS WITH NEGATIVE-EDGE-TRIGGERED REGISTER logic symbol tpd Insl r+ CELL NAME G) C CL=OpF S298LH s: CD 6.0 I CL=1pF J 6.8 Label: S298LH A 1 ,A2,B1 ,B2,C1.C2,Dl,D2, CLKZ,WS,QA,QB,QC,QD; Cpdt IpFI 18.72 WS ClKZ A1 A2 B1 B2 C1 C2 01 02 tThe equivalent power dissipation capacitance does not include interconnect capacitance. 3-22 ·TEXAS ." INSTRUMENTS POST OFFICE BOX 865012 • DALLAS, TeXAS 15265 QA OB OC 00 PRODUCT GUIDE 299 8-BIT BIDIRECTIONAL UNIVERSAL SHIFT/STORAGE REGISTERS logic symbol SRGS tpd (nsl CELL NAME Cpdt (pFI CL = 0 pF S299LH G1Z 1 CL = 1 pF I 7.1 B.O ClRZ 3ENS G22 60.02 so Label: S299LH SO,S l,G 1Z,G2Z,SL,SR,CLK,CLRZ,QAP, QHP.A_QA,B_QB,C_QC,D_QD,E_QE, F_QF,G_QG,H_QH; 51 elK SR OAP A_OA II B_OB C_QC D_QD CD E_QE "t:S ·S F_OF G_OG ~ H_QH QHP 2.4D Sl ... U :::J "t:S 0 ... 299X Q. 8-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS logiC symbol 5RG8 CLRZ 50 tpd (nsl CELL NAME CL S299XLH =0 5.0 pF I· I. CL = 1 pF 5.9 Cpdt (pFI 4B.89 Label: S299XLH A,B,C,D,E,F,G,H,SO,Sl,SL,SR,CLK, CLRZ,QA,QB,QC,QD,QE,QF,QG,QH; 51 CLK 5R QA A 3,4D 8 3,4D QS C QC D QD E QE F QF QG G H 3,4D 5L 2,4D QH tThe equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS .. " INSTRUMENlS POST OFFICE BOX 856012 • DAllAS. TEXAS 75265 3-23 PRODUCT GUIDE 373 8-BIT O-TYPE LATCHES WITH 3-STATE OUTPUTS logic symbol tpd (nsl CEll NAME Cpdt (pFI Cl = 0 pF S373LH ICl = 1 pF I 5.0 oez e 6.7 D1 02 03 D4 05 06 07 08 17.07 Label: S373LH D1,D2,D3,D4,D5,D6,D7,DS,C,DCZ,Q1, Q2,Q3,Q4,Q5,Q6,Q7,QS; Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 11_..----_ _ _ __ . ." o Q. c a ... 374 8-BIT O-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS logic symbol tpd (nsl OCl CELL NAME S374LH Cpdt (pFI Cl=OpF I Cl=1pF 5.0 I 6.7 ClK 22·S0 Label: S374LH D1,D2,D3,D4,D5,D6,D7,DB,CLK,QCZ, Q1,Q2,Q3,Q4,Q5,Q6,Q7,QS; 01 Q1 02 Q2 03 Q3 04 Q4 05 Q5 06 Q6 07 07 08 08 375 4-BIT BISTABLE LATCHES logic symbol 01 tpd (nsl CEll NAME S375LH Cpdt (pFI Cl=OpF I CL=1pF 4.5 I 6.0 7.32 Label: S375LH D1 ,D2,D3,D4,C1 C2,C3C4,Q1 ,Q 1Z,Q2, Q2Z,Q3,Q3Z,Q4,Q4Z; C1C2 02 03 C3C4 04 tThe equivalent power dissipation capacitance does not include interconnect capacitance. 3-24 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 15265 10 Q1 01l Q2 Q2l Q3 Q3l Q4 Q4Z PRODUCT GUIDE 393 DUAL 4-BIT RIPPLE COUNTERS logic symbol CTROIV16 tpd (ns) CELL NAME S393LH Cpdt (pF) CL=OpF I CL=lpF 21.0 I 21.5 CT-O CLRl 16.92 Al----'==>(> + Label: S393LH A1,CLR1,A2,CLR2,QA1,QB1,QC1,QD1, QA2,QB2,QC2,QD2; { GAl QBl aCl 001 aA2 CLR2 aB2 aC2 A2 002 II G) "C 398 ·S QUADRUPLE 2-INPUT MULTIPLEXERS WITH POSITIVE-EDGE-TRIGGERED COMPLEMENTARY OUTPUT REGISTER S398LH .. "C 0 WS Cpdt (pF) 5.5 ... (,) j tpd (ns) CELL NAME CL = 0 pF ~ logic symbol ClK D.. ICL=lPF I 6.4 Al 19.42 Label: S398LH A l,A2,Bl ,B2,C1 ,C2,Dl ,D2,CLK,WS,QA, QAZ,QB,QBZ,QC,QCZ,QD,QDZ; GA A2 aAZ B1 aB B2 aBZ Cl ac C2 01 acz 00 02 aDZ tThe equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-25 PRODUCT GUIDE 399 QUADRUPLE 2-INPUT MULTIPLEXERS ,WITH POSITIVE-EDGE-TRIGGERED REGISTER logic symbol tpd Ins) CELL NAME S399LH WS Cpdt IpF) CL=OpF I CL=1pF 5.0 I 5.8 ClK 17.92 A1 Label: S399LH A l.A2,B1,B2,C1,C2,D1,D2,CLK,WS,QA, QB,QC,QD; QA A2 B1 B2 QB C1 C2 QC 01 QO 02 . ." oCo 590 C 5l 8-BIT BINARY COUNTERS WITH 3-STATE OUTPUT REGISTERS logic symbol G') GZ C tpd Ins) a:CD CELL NAME S590LH Cpdt IpF) CL=OpF I CL=1pF 10.4 I 12,1 RCK C2 CTR8 58.24 CCKENZ Label: S590LH CCK,CCKENZ,RCK,CCLRZ,GZ,QA,QB,QC, QD,QE,QF,QG,QH,RCOZ; CCK CCLRZ RCOZ QA OB OC GO r-----------~r------[====OE OF OG OH tThe equivalent power dissipation capacitance does not include interconnect capacitance. 3-26 TEXAS . " INSTRUMENTS POST OFFICE BO)( 66601.2. • DALLAS. TeXAS 75265 PRODUCT GUIDE 593X a-BIT BINARY COUNTERS WITH INPUT REGISTERS logic symbol tpd (ns) CELL NAME S593XLH CTR8 G1 Cpdt (pF) CL=OpF I CL=lpF 10.0 I 11.7 85.86 EN5 GZ CCLRZ Label: S593XLH A,B,C,D,E,F,G,H,CCK,CCKEN,CCKENZ, RCK,RCKENZ,CCLRZ,CLOADZ,G 1 ,GZ,OA,OB,OC, OD,OE,OF,OG,OH,RCOZ; CCKEN CCKENZ RCOZ CT-255 CCK CLOADZ RCKENZ RCK II .. CD 2D A 3D 5<;7 QA B QS C D OC QD QE QF QG QH E F G H :2 :::J CJ (,) :::J . "0 0 0.. 595 a-BIT SHIFT REGISTERS WITH OUTPUT REGISTERS logic symbol GZ tpd (ns) CELL NAME CL=OpF S595LH 5.5 I CL=1pF I 7.2 Cpdt (pF) 44.64 Label: S595LH SER,SRCK,SRCLRZ,RCK,GZ,OA,OB,QC, QD,QE,QF,QG,QH,QHP; RCK SRCLRZ SRCK SER QA QS QC QD QE QF QG 2D 3\7 OH QHP tThe equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 3-27 PRODUCT GUIDE 5,98X 8-BIT SHIFT REGISTERS WITH INPUT REGISTERS logic symbol SRGS tpd (ns) CELL NAME CL=OpF S59SXLH I CL=1pF I 9.S 11.5 GZ Cpdf (pF) SCLRZ SCKENZ S2.63 SCK Label: S59SXLH A,S,C,D,E,F,G,H,RCK,SRCK,SRCKEZ, SRLOADZ,SRCLRZ,SERO,SER 1,DS,GZ,QA,QB, QC,QD,QE,QF,QG,QH,QHP; SLDZ RCK DS SERO SERl "tI , a Q. c (") r+ DA 2D 3D DS 2D 3D Q QA Q Q8 DC DD QC DE QE QD DF QF DG QG DH 2D 3D Q QH QHP 651 8-BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS logic symbol GBAZ tpd (ns) CELL NAME S651LH Cpdt (pF) CL=OpF I CL=1pF 10.4 I 11.3 91.06 Label: S651 LH GBAZ,GAB,SBA,SAB,CBA,CAB,A 1,A2,A3, A4,A5,A6,A 7 ,AS,B 1,B2,B3,B4,B5,86,87 ,8S; GAB CBA ENI (BA] EN2 (AB] C4 SBA G6 C6 CAB SAB G7 Bl AI '1 A2 B2 A3 B3 A4 B4 A5 B5 A6 B6 A7 B7 A8 B8 tThe equivalent power dissipation capacitance .does n~t 'inc~ude interconnect capacitance. 3-28 PRODUCT GUIDE 652 8-BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS logic symbol tpd (nsl 'CELL NAME CL=OpF S652LH 10.4 Cpdt (pFI I CL=lpF I 11.3 GBAZ EN1 [BA] GAB EN2 lAB) C4 eBA 104.10 GS SBA Label: S652LH GBAZ,GAB,SBA,SAB,CBA,CAB,A 1,A2,A3, A4,A5,A6,A 7 .A8,B1 ,B2,B3,B4,B5,B6,B7,B8; C6 CAB SAB G7 S A1 B1 Ii 7 7 A2 B2 A3 B3 A4 B4 AS 8S A6 B6 A7 B7 AS BS II .. CD "C 'S C!J CJ ::;, . "C 0 a. 669 SYNCHRONOUS 4-BIT UP/DOWN 81NARY COUNTERS WITH LOOK-AHEAD logic symbol tpd (nsl Cpdt (pF) lOADZ 30.7 U_DZ Label: S669LH D,C,B,A,CLK,U_DZ,ENPZ,ENTZ,LOADZ, QD,QC,QB,QA,RCOZ; ENTZ CELL NAME S669LH CL=OpF I CL=lpF 10.0 I 11.8 CTRDIV16 Ml (lOAD] RCOZ ENPZ ClK 2,3,5,6 + IC7 2,4,5,6- A [1) QA B [2) QB C [4) QC 0 (81 QD tThe equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS .., INSTRUMENTS POST OFFICE BOX 866012 • DAUAS. TeXAS 75266 3-29 PRODUCT GUIDE 686 8-BIT MAGNITUDE COMPARATORS , logic symbol COMP tpd (ns) CELL NAME S6B6LH Cpdt (pF) CL = 0 pF I CL=lpF 9.0 I 9.8 G1Z G2Z 43.30 PO Label: S6B6LH PO,P1 ,P2,P3,~4,P5,P6,P7,QO,Q1 ,Q2, Q3,Q4,Q5,Q6,Q7,G1Z,G2Z,PEQQZ,PGTQZ; 0 PI P2 P3 P4 P P5 • lP-Q PEQaz 2P>0 PGTaz P6 P7 7 QO 0 Ql Q2 "'0 ~. o Q3 Q. C Q Q4 n r+ Q5 Q6 Q7 7 688 8-BIT IDENTITY COMPARATORS logic symbol COMP tpd (ns) CELL NAME S6BBLH Cpdt (pF) CL=OpF I CL=lpF 7.5 I B.2 G1Z PO 15.94 Label: S6BBLH PO,P1 ,P2,P3,P4,P5,P6,P7,QO,Q1 ,Q2, Q3,Q4,Q5,Q6,Q7,G1Z,PEQQZ; EN 0 PI P2 P3 P P4 P5 P6 P7 7 QO 0 PEQaz Ql Q2 Q3 Q Q4 Q5 Q6 Q7 7 tThe equiv~lent power dissipation capacitance does not include interconnect capacitance. 3-30 TEXAS ." INSTRUMENTS POST OFFICE BOX 665012 • DALLAS. TEXAS 76265 PRODUCT GUIDE 888 8-BIT PROCESSOR SLICES • • • • • • • • Parallel a-bit ALU with expansion nodes Signed magnitude to/from two's complement conversion Single- and double-length normalize Signed and unsigned divides with overflow detection; input does not need to. be prescaled Signed, mixed, and unsigned multiples Sign, carry out, overflow and zero-detect status capabilities 3-0perand register files allow an operation and a move instruction to be combined 3 data input/output ports maximize data throughput functional block diagram 4 C3-CO 16 XS REGISTER FilE WEZ 4 A3-AO 4 CK B3-BO r::>-++----t_'T"'____"T"_J-~===!==::=t~:; OEBZ S S OA 7-0AO I!::...~--,L-+--, ___----, II C\) "CI 'S C!' OB7-0BO ... (,) j OEAZ EAzc>~~==~~~~7 EBO EB1 GLN ---i------r---~ SElY C>---------J Y7·YO· TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 3-31 PRODUCT GUIDE 890 MICROSEQUENCES • 14 bits wide-addresses up to 16,384 words of microcode with one megacell • Selects address from one of eight sources • Independent read pointer for aid in microcode diagnostics • Supports read~time interrupts • Two independent loop counters • Supports 64 powerful instructions functional block diagram II... "tI 0 RAOEZ R80EZ OSEl Q. C ... (') G) C c.:CD ZERO 5TACK 14x9 STKWRN/RER STACK POINTER 3 REAO POINTER 3 14 14 t4 CCZ 3 4 INTZ YOEZC>----------~------------------------~~ 3-32 TEXAS • INSTRUMENlS POST OFFICE BOX 665012 • DALLAS, TEXAS 75265 MUX2-MUXO 83-80 --- -V 0.74 0.B3 0.56 BU111LH Label: BU11nLH A,Y; II 2322 RETRIGGERABLE MONOSTABLE MUL TIVIBRATORS logic symbol CD tpd Insl CELL NAME cL=oPFl CL = MVFOOLH I B 1 pF 9 "C Cpd IpFI A 20.5 B 'S Q Label: MVFOOLH A,B,CLRZ,Q,QZ; ~ ... CJ j CLRZ QZ R C,~~~~xt --4---1 CX/RX L -_ _ _......... .. "C 0 D.. 2325 HIGH-LEVEL AND LOW-LEVEL TIE-OFF GATES logic symbol CELL NAME: T0010LH ~HI ~LO • Provides de termination for high- and low-level unused inputs Label: T0010LH LO,HI; 2330 2-WIDE, 2-INPUT AND-NOR GATES logic symbol tpd Ins) CELL NAME CL=O·pF A0221LH 1.2 I 1 Cpd IpFI CL=lpF 2.6 0.59 Label: A0221LH A.B,C,D,Y; TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-35 PRODUCT GUIDE 2331 2-WIDE. 2-INPUT AND-OR GATES logic symbol A-_..r--... tpd (nsl CELL NAME CL A0220lH =0 pF I CL I 1.7 = 1 pF Cpd (pFI 0.90 2.6 label: A0220lH A,B,C,D,Y; B--"'L-_" Y C--...r--... D--",,-_, 2340 • 2-LINE TO 1-LlNE MULTIPLEXERS logic symbol tpd (nsl CELL NAME Cl ... o ." MUll0lH =0 pF I Cl I 2.3 Cpd (pFI = 1 pF GZ 5 3.7 0.92 A label: MUll0lH A,B,S,GZ,Y; Co Y B c: (') r+ C) 2341 c: 4-LlNE TO 1-LlNE MULTIPLEXERS c: (ogic symbol CD tpd (nsl CELL NAME Cl MU210lH =0 pF 2.1 Cpd (pFI I CL = 1 pF I 2.9 A B 1.28 MUX label: MU210lH CO,C 1 ,C2,C3,A,B, Y; co Cl C2 C3 0 V 2 1..3,;...._ _ _-, 2342 8-LlNE TO 1-LlNE MULTIPLEXERS WITH 3-STA TE OUTPUTS logic symbol tpd (nsl CEll NAME Cl MU310lH =0 3.2 pF I I CL = Cpd (pFI 1 pF 4.7 1.68 label: MU310lH A.B,C.DO,Dl.D2.D3,D4.D5,D6,D7.GZ.Y; 3-36 MUX GZ EN A B C DO D1 02 D3 04 05 06 07 O} G-0 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 2 0 1 2 3 4 5 6 7 7 " Y PRODUCT GUIDE 2350 2-LlNE TO 4-LlNE DECODERS/DEMULTIPLEXERS logic symbol DE210LH tpd (ns) CELL NAME I CL;1pF 1.0 I 2.0 2.91 2.5 2.Bl Label: DE210LH A,B,YO,Yl,Y2,Y3; DE212LH 1.0 XIV YO YO Cpd (pF) CL;OpF DE210LH DE212LH XIV I A Yl Yl A 2 B Label: DE212LH A,B,G,YO,Yl,Y2,Y3; Y2 B 2 Y2 Y3 G EN Y3 II 2370 400-J.lA PULL-UP ACTIVE TERMINATORS logic symbol CELL NAME: PR400LH UP400l'A • Provides active termination for inputs or I/0s ~TAP .... Label: PR400LH TAP; (J :::J "C ..o 2371 200-J.lA PULL-UP ACTIVE TERMINATORS logic symbol CELL NAME: PR250LH D.. UP 200 I'A ~TAP • Provides active termination Jor inputs or I/0s Label:PR250LH TAP; 2372 95-J.lA PULL-UP ACTIVE TERMINATORS logic symbol CELL NAME: PR095LH Iup • Provides active termination for inputs or lIas 95 j4A~TAP Label: PR095LH TAP; 2373 95-J.lA PULL-DOWN ACTIVE TERMINATORS logic symbol CELL NAME: PD095LH DIIl951'A • Provides active terminatio~ ~TAP for inputs or II0s Label: PD095LH TAP; TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-37 PRODUCT GUIDE 2374 5-/lA PULL-UP ACTIVE TERMINATORS logic symbol CELL NAME: PR005LH UP5p.A • Provides activ~ termination for inputs or II0s ~TAP Label: PR005LH TAP; 2401 4-BIT SHIFT REGISTERS logic symbol CELL NAME fmax (MHz) Cpd (pF) R2401LH 59.6 10.30 CLRZ CLK---i> Label: R2401 LH CLRZ,SERIN,CLK,QA,QB,QC,QD; ::p o SERIN 10 Q. QA QB c: ... (') QC QD C) c: ~ 2402 4-BIT SHIFT REGISTERS CEll NAME R2402lH I I logic symbol fmax (MHz) 59.6 I I Cpd (pF) ClRZ 12.10 ClK Label: R2402LH CLRZ,SERIN,CLK,QA,QAZ,QB;QBZ,QC, QCZ,QD,QDZ; -----(:> SERIN QA QAZ QB QBZ QC QCZ QD QDZ 3-38 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 PRODUCT GUIDE 2403 4-BIT SHIFT REGISTERS CEll NAME R2403lH label: R2403LH OC,OD; I logic symbol fmax (MHz) I 59.6 I I Cpd (pF) lZ_S 11.10 ClK SERIN.LZ~S.CLK,A,B,C,D,OA,OB, SERIN 2D A 1D B 1D OA QB C QC D QD 2404 Q) 4-BIT SHIFT REGISTERS CELL NAME R2404LH I I III logic symbol fmax (MHz) 59.6 I I :2 :::I (!) Cpd (pF) .... LZ_S 12.10 (.) ClK :::I Label: R2404LH SERIN,LZ_S,CLK,A,B,C,D,OA,OAZ, OB,OBZ,OC,OCZ,OD,ODZ; SERIN QA A QAZ "C 0 C- ... QB B QBZ QC C QCZ QD D QDZ 2405 4-BIT FLIP-FLOPS/REGISTERS CEll NAME R2405LH I I fmax (MHz) 64,2 logic symbol I I CLRZ Cpd (pF) ClK 10.20 Label: R2405LH CLRZ,D1 ,D2,D3,D4,CLK,01 ,02,03,04; TEXAS D1 Q1 D2 Q2 D3 03 D4 04 ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-39 PRODUCT GUIDE 2406 4-BIT FLIP-FLOPS/REGISTERS logic symbol 'ASC2406 CELL NAME R2406LH I I fmax (MHz) 64.2 I CLRZ Cpd (pF) I CLK 11.70 Label: R2406LH CLRZ,D1 ,D2,D3,D4,CLK,01, 01 Z,02,02Z, 03,03Z,04,04Z; 01 01 01Z 02 02 02Z 03 03 03Z 04 04 .. o ." 04Z 2407 4-BIT FLIP-FLOPS/REGISTERS c. r:: (") logic symbol 'A!!C2407 CELL NAME r+ R2407LH Q I I fmax (MHz) 36.3 I CLRZ G Cpd (pF) I 11.00 CLK Label: R2407LH CLRZ,D1 ,D2,D3,D4,CLK,G,01 ,02, 03,04; r:: is: 01 01 02 CD 02 03 03 04 04 2408 4-BIT RIPPLE COUNTERS CELL NAME R240BLH I I logic symbol fmax (MHz) 59.6 I CTRDIV16 Cpd (pF) I 7.22 Label: R240BLH CLRZ,A,OA,OB,OC,OD; + A QA cr{ CLRZ 08 OC 00 2500 CRYSTAL-CONTROLLED OSCILLATORS logic symbol CELL NAME MAXIMUM FREOUENCY Cpd (pF) OSEOOLH OSF02LH OSE06LH 5 MHz 20 MHz BOO MHz B.13 15.30 6.B2 G -.n.JL XI Y XO Label: OSE03LH RC, Y; 3-40 TEXAS .J.i1 INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 PRODUCT GUIDE 2502 RC OSCILLATORS CELL NAME OSE03LH logic symbol I TYPICAL FREQUENCY RANGE I cpd (pF) I 5 to 20 MHz I G JUL 2.44 Y RC Label: OSE03LH RC, Y; 2503 DIFFERENTIAL COMPARATORS logic symbol CELL NAMES: C0212LH, C0213LH o Single 5 volt supply with ± 10% tolerance o Inputs are ESO-protected o Input offset voltage--50 mV max o Common mode input voltage: C0212LH - 0 V to 3.5 V C0213LH - 1.5 V to VCC Q) INZ~ OUT "'0 ·S IN 0 ... CJ ::s P-CHANNEL Label: C0212LH IN,INZ,OUT; N-CHANNEL Label: C0213LH IN,INZ,OUT; "'0 0 ... ~ 2507 DYNAMIC DELAY ELEMENT logic symbol CELL NAME: OLE 1OLH 3 to 12 ns Label: OLE10LH A,PV,NV,Y; I I Y A PV n NV ] DELAY ADJUST 2508 CONTROL ELEMENT FOR DYNAMIC DELAY ELEMENT logic symbol CELL NAME: OLC10LH Label: OLC10LH P,N,R,CAP,PV,NV; R P N n n PV NV CAP TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-41 PRODUCT GUIDE 2519 MEDIUM-DRIVE OPERATIONAL AMPLIFIER logic symbol CELL NAME: AMC12NH • • • • • IN~OUT Single 5-volt supply ± 10% Internally frequency~compensated Inputs are ESD-protect~d Input offset voltage -50 mV typical Output voltage swing -1 V to 4.5 V INZ~ Label: AMC12NH, IN,INZ,OUT; 2901 4-81T MICROPROCESSOR SLICE . ." oQ. C 2. C) e is.: logic symbol CELL NAME: M01 MPLH • • • Offers full system implementation on a single chip, when used with other members of the 2900 family Label: M01MPLH CLK,QEZ,CN,18 ... 10,83., .BO,A3 ... AO, D3 ... DO,Q3,QO,RAM3,RAMO,GZ,PZ,F3, FEQO,OVR,CNPL4,Y3 ... YO; CD 4-BIT MICROPROCESSOR SLICE 'ASC2901 Reduces 2901 4-bit microprocessor to a single cell ClK CLK OEZ OE CN 0 CN 10 11 12 13 14 INSTRUCTION SELECT 15 00 16 17 18 8 AO 0 A1 wvl: Q3 ~vlO RAMO ADDRESS 3 RAM3 A2 A3 BO 0 B1 B2 83 3 DO D1. 0 D2 D3 3-42 P PZ G GZ FEOOQ F3 OVR F3 3 3 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 $ Cn +4 0 r$ FEQO OVR CNPL4 YO Y1 Y2 $v 3 Y3 PRODUCT GUIDE 2902 LOOK-AHEAD CARRY GENERATOR logic symbol CELL NAME: M02CGLH 4> • Designed to accept up to four pairs of carry-propagate and carrygenerate signals, and a carry input • CARRY LOOK-AHEAO GENERATOR 'ASC2902 Provides anticipated carries across four groups of binary ALUs Label: M02CGLH CN,G3Z,P3Z,G2Z,P2Z,G1 Z,P1 Z,GOZ,PQZ, CNPLX,CNPL y ,CNPLZ,GZ,PZ; CN GOZ Cn Cn + x Cn + y Cn + z 0 G1Z 1 G2Z 2 G3Z 3 POZ 0 CNPLX CNPLY CNPLl G G GZ PZ P1Z P P2Z 2 P3Z 3 II CD "C ·S e" ... CJ j .. "C 0 a.. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 3-43 PRODUCT GUIDE 2904 STATUS AND SHIFT CONTROLLER logic symbol CELL NAME: M04SSLH STATUS AND SHIFT CONTROL UNIT • Generates the carry-in signal to the ALU and carry look-ahead • Serves as interconnects for the data path, the auxiliary operations, and the ALU status flags testing • Offers full system implementation on a single chip, when used with other members of the 2900 family eLK eLK CEMZ CEUZ wl~ EZZ Label: M04SSLH CLK,CEMZ,CEUZ,EZZ,ECZ,ENZ,EOVRZ,OEYZ, OECTZ,SEZ,CX,IZ,IC,IN,IOVR,112 ... IO,YZ,YC,YN, YOVR,SIOO,SION,QIOO,QION,CO,CT; 'ASC2904 ECZ ENZ wi: EOVRZ OEYZ 0100 OION 5100 SION OEeTZ ~ul ~ SEZ ..."'tI ex ex IZ Q. C Ie IZ Ie IN IN o n r+ G') C c:CD OVA IOVR IOVR I. 11 12 13 14 "16 INSTRUCTION SELECT 17 18 " 110 111 112 3-44 TEXAS ." INSTRUMENTS POST OFfiCE BOX 655012 • DALLAS, TEXAS 75265 12 co eT V1 ve VN YOVR co eT PRODUCT GUIDE 2910 MICROPROGRAM CONTROLLER logic svmbol CELL NAME: M10MCLH • .. Supports the function of an address sequencer in controlling the execution of microinstructions stored in microprogram memory MICROPROGRAM CONTROLLER 'ASC2910 • Last-in, first-out stack provides for nine levels of nesting microsubroutines ClK Label: M10MCLH CLK,CI,CCZ,CCENZ,RLDZ,OEZ,13 ... 10, 011 ... DO,FULLZ,PLZ,MAPZ,VECTZ,Y11 ... YO; FULL ClK Pl CI FULLZ PlZ MAPZ CCZ VEeT VECTZ CCENZ RLDZ OEZ 10 0 11 0 Vl INSTRUCTION SELECT 12 VO V2 13 V3 II Q) :s! ::J 0 V6 ... 02 V7 ::J 03 D4 VB V4 DO- I 0 01 V5 VDATA) V9 ~ 05 06 07 Vl0 11 V11 (J .. "C 0 ~ 08 09 010 011 11 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-45 PRODUCT GUIDE 3003 STATIC 16W X 16B READ/WRITE RAMs WITH 3-STATE OUTPUTS logic symbol RA416LH RAM 16 x 16 ORGANIZATION CELL NAME RA416LH WORDS 16 I I AO BITS Al 16 A2 Label: RA416LH 00,01,02,03,04,05,06,07,08,09, 010,011 ,012,013,014,P15,AO,A l,A2,A3, EZ,WZ,GZ,OO,O 1,02,03,04,05,06,07,08, 09,010,011,012,013,014,015,TIE; A3 }~ 15 3 TIE EZ WZ GZ DO 00 01 ... 02 01 02 "tJ 03 03 o 04 04 C. 05 05 06 06 I: (') r+ 07 07 08 08 09 09 3-46 TEXAS 010 011 010 012 012 013 013 014 014 015 015 'Ii1 INSTRUM~NTS POST OFFICE ~ox Qll 655012 • DALLAS, TEXAS 75265 PRODUCT GUIDE 3004 STATIC 64W X 88 READ/WRITE RAMs WITH 3-STATE. OUTPUTS logic symbol RA608LH ORGANIZATION CELL NAME RA608LH WORDS 64 I I RAM64x8 BITS AO AI 8 A2 Label: RA608LH 00,01 ,02,03,04,05,06,07,AO,A 1, A2,A3,A4,A5,EZ, WZ,GZ,OO,O 1,02,03,04, 05,06,07,TIE; A3 A4 }~ TIE A EZ WZ GZ DO A,20 A.4Q 00 01 01 02 02 03 03 D4 04 05 05 06 06 07 07 Q) ::2 j e" ... CJ j "C 0 ... Q. 3005 STATIC 256W X 48 READ/WRITE RAMs WITH 3-STATE OUTPUTS logic symbol RA804LH RAM 256 x 4 ORGANIZATION CELL NAME RA804LH WORDS 256 I I AO BITS AI 4 A2 Label: RA804LH 00,01 ,02,03,AO,A 1,A2,A3,A4,A5, A6,A 7,EZ,WZ,GZ,00,01 ,02,03,TIE; 0 A3 A A4 2~5 A5 A6 3 TIE A.4Q 00 A7 EZ WZ GZ DO A,20 01 01 02 02 03 03 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-47 PRODUCT GUlDf 3006 STATIC 128W X 88 READ/WRITE RAMs WITH 3-STATE OUTPUTS logic sym RA708lH RAM 128 x 8 AO ORGANIZATION CEll NAME RA708lH WORDS 128 I I AI BITS A2 8 A3 label: RA708LH DO,Dl,D2,D3,D4,D5,D6,D7,AO,A 1, A2,A3,A4,A5,A6,EZ, WZ,GZ,QO,Q 1,Q2,Q3, Q4,Q5,Q6,Q7,TIE; A4 A5 }.:, 3 TIE A6 EZ WZ GZ 00 AAQ QO ." ""I 01 02 Q2 Q. 03 Q3 o c n P+ G') c D4 Q4 05 Q5 06 Q6 07 Q7 a:CD 3-48 Ql TEXAS ~ INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 PRODUCT GUIDE 3010 CompilerCeWM STATIC RANDOM ACCESS MEMORIES. (SRAM) logic symbol SRAM Array Limits CEll NAME PARAMETERS AZRMLBt Number of words IW;o 2n) Word length IB ~ iI MIN MAX COMMENTS 4 1024 Any even number 4 32 Number of data inputs := number of data outputs Total number of bits IWxB) ROM [WxB) 4> 'ASC3010 AO 2 ~ wordlength W-1 An 16 16384 Label t : AZRMLB DO,Dl,D2 ... Di-l,AO, . . . An,CLK1,CLK2, ENZ,R_WZ,OO, ... 0i-1: AZ: Identifying symbol LB: Wordlength in bits. Topology dependent value. M: Number of columns multiplied into one output. A ~ 1:1. B ~ 2:1, C ~ 4:1, D ~ 8:1Topology dependent value. R: Number of rows. Topology dependent value. ClK1 CLOCKS ClK2 ... (,) j ENZ ..o "'C o DO Oi-1 RAM IDAT~ IDAT~ i-1 Il.. o 00 i -1 Oi-1 3011 2-PHASE CLOCK GENERATOR WITH COMPLEMENTARY OUTPUTS logic syinbol 4> CLOCK GEN CELL NAME: CK4XOLH • ClK---'-"'t:> Generates 2-phase clock for compiler cell functions • Embedded function - requires no external connection • Can be operated from single-phase of system on-chip clock ClK1 ClK1Z ClK2 ClK2Z Label: CK4XOLH,CLK,CLK1,CLK1Z,CLK2,CLK2Z; TEXAS ~ INSTRUMENTS POST OFF!CE BOX 655012 • DALLAS, TEXAS 75265 3-49 PRODUCT GUIDE 3103 16-WORD BY a-BIT EDGE-TRIGGERED 3-PORT REGISTER FILES logic symbol CELL NAME: RF40BLH REG FILE 16 X 8 • Full parallel access with one write and two read ports • Typical access times: Write-then-read cycle time - 11 ns Address access time - 8 ns Label: RF40BLH, CLK,WZ,WO,Wl,W2,W3,RAO,RA1.RA2,RA3, RBO,RB1,RB2,RB3,DO,Dl,D2,D3,D4,D5,D6,D7,QAO, QA1,QA2,QA3,QA4,QA5,QA6,QA 7,QBO,QB1,QB2, QB3,QB4,QB5,QB6,QB7; 4> RAO 'ASCJ10J 0 A READ ADDRESS RAI RA2 RAJ RBO 0 B READ ADDRESS RBI RB2 RBJ ..."'0 CLK o WO .... W2 c. c (') G') C s: CD CLK 0 WI WRITE ADDRESS WJ WZ WRITE ENABLE o QAO QAl QA2 QA3 QA4 DO GA5 01 \lAS D2 QA7 OJ 04 o QAO 05 QAl 06 QA2 07 QAJ QA4 QA5 QAS QA7 3-50 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 PRODUCT GUIDE 3200 CompilerCeWM READ-ONLY MEMORIES (ROM) logic symbol Single Array Parameter Limits PARAMETERS MIN Number of words IW", 2 n l Word length IB ~ il MAX 2048 8 4 32 . ROM [W x B[ COMMENTS Must be multiples of 4 Even or odd Total number of bits IW x BI 512 16384 Number of words IW", 2 n l Word length IB ~ il Total number of bits IW x BI MIN 8 4 512 O} An n CLK1 I CLK2 Double Array Parameter Limits PARAMETERS AO 4096 64 COMMENTS A W - 1 CLOCKS CLK2Z MAX 'A~C3200 EN Must be multiples of 4 II MEM ENABLE POWER DOWN Must be even 0 65536 00 Label: Label and cell name are developed as a function of IDATV cell design. i -1 ... Qi-1 CJ :::l ..o "'C 3430 D. CompilerCel[TM PIPELINE TEST REGISTERS (PTR) logic symbol Typical Modes of Operation: + n-BIT PIPELINE TEST REGISTER 'ASC3430 • Pseudo-Random pattern generation • Signature analysis • Circular shift S1 I I PLD PlO elK1 • Local hold • Serial or parallel load CLK2 Label: Label and cell name are developed as a function of cell design. 80 81 CLOCKS H H SO l H l H MODE HOLD LOAD/HOLD SHIFT TEST SUB-MODES IN MODE 3 PLD SUB-MODE H PAR LOAD l LOCAL HOLD MODE SUB-MODES IN MODE 4 BO B1 DO 00 01 0 01 On 0 On TEXAS • INSTRUMENTS POST OFFICE BOX 655012. DALLAS. TEXAS 75265 3-51 PRODUCT GUIDE 3800 CompilerCell™ PROGRAMMABLE LOGIC ARRAYS (PLA) logic symbol Maximum Parameter Values INPUTS I PRODUCT TERM I OUTPUTS m I p 128 I n 32 64 AND MATRIX INPUT BUFFERS I> INO m 8< 2m X p OR MATRIX OUTO OUT1 Label: Label and cell narne are developed as a function of cell design. OUTn-1 OUTn II... ""0 o C. I: 2 4002 C) I: 4-INPUT POSITIVE-NOR a: ~ATES logic symbol tpd (nsl CD CELL NAME Cpd (pFI CL = 0 pF CL = 1 pF 1.4 1.2 4.1 2:6 N0410LH N0420LH 0.35 0.55 Label: N04nOLH A,B,C,D,Y; 4072 4-INPUT POSITIVE-OR GATES logic symbol tpd (nsl CELL NAME CL OR410LH OR420LH OR440LH OR460LH =0 pF 2.2 2.6 2.4 2.4 CL = 1 pF 3.1 3.1 2.7 2.7 Cpd (pFI 0.92 1.83 3.46 5.48 Label: OR4nOLH A,B,C',D,Y; 3-52 TEXAS ~ INSTRUMENlS POST OFFICE BOX 665012 • DALLAS, TEXAS 75265 PRODUCT GUIDE 4075 3-INPUT POSITIVE-OR GATES logic symbol tpd Insl CELL NAME Cpd IpFI CL = 0 pF CL = 1 pF 1.8 2.2 1.9 2.0 2.7 2.7 2.2 2.2 OR310LH OR320LH OR340LH OR360LH 0.90 1.71 3.51 5.36 Label: OR3nOLH A,B,C,Y; 4078 8-INPUT POSITIVE-NOR GATES II logic symbol Q) tpd Insl CELL NAME Cpd IpFI "'C 1.54 0.65 C'J 'S CL = 0 pF 1CL=1PF N0810LH NOB20LH I 2.6 2.3 3.4 4.9 ... (.) Label: NOBnOLH A,B,C,D,E,F,G,H,Y; j .. "'C o 5000 0.. CMOS-COMPATIBLE INVERTING INPUT BUFFERS logic symbol A~Y tpd Ins I CELL NAME Cpd IpFI CL = 0 pF CL = 1 pF 0.7 0.7 1.1 1.1 IPEOOLH IPFOOLH 2.00 2.00 Label: IPFOOLH A,Y; . 5001 TTL-COMPATIBLE INVERTING INPUT BUFFERS logic symbol tpd Insl CELL NAME Cpd IpFI CL = 0 pF CL = 1 pF 0.9 0.9 2.1 2.1 IPE03LH IPF03LH 16.5 16.5 Label: IPF03LH A,Y; TEXAS ." INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 3-53 PRODUCT GUIDE 5002 CMOS-COMPATIBLE INVERTING SCHMITT-TRIGGER INPUT BUFFERS logic symbol TAP~~ Ipd (nsl CELL NAME IPEOSLH IPFOSLH A-----V- Y Cpd (pFI CL = 0 pF CL = 1 pF 2.B 2.B 4.B 4.B 1.30 1.30 Label: IPFOSLH A,TAP,Y; II 5003 TTL-COMPATIBLE INVERTING SCHMITT-TRIGGER INPUT BUFFERS WITH PULL-UP TAP ." o TAP Ipd (nsl CELL NAME C. C IPEOBLH IPFOBLH ~ CL = 0 pF CL = 1 pF 3.7 4.3 7.5 B.l l ........ "- A~Y Cpd (pFI 19.00 19.00 Label: IPEOBLH A,TAP,Y; G) C s: CD logic symbol 5004 CMOS-COMPATIBLE INVERTING INPUT BUFFERS WITH PULL-UP TAP logic symbol CL=OpF IPF02LH I TAP:--l Cpd (pFI CL = 1 pF I 0.7 1.0 2.00 Label: IPF02LH 'A,TAP,Y; 5005 TTL-COMPATIBLE INVERTING INPUT BUFFERS WITH PULL-UP TAP logic symbol Ipd (nsl CELL NAME IPE05LH IPF05LH Cpd (pFI CL = 0 pF CL = 1 pF 0.9 0.9 2.1 2.1 IS.00 16.00 Label: IPF05LH A,TAP,Y; 3-54 ~ A-v-- Y Ipd (nsl CELL NAME TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 .. PRODUCT GUIDE 5006 CMOS-COMPATIBLE NONINVERTING INPUT BUFFERS logic symbol A--[>----V tpd Ins) CELL NAME Cpd IpFI CL = 0 pF CL = 1 pF 1.7 0.7 1.9 1.1 IPE01LH IPF01LH 3.00 3.00 Label: IPF01LH A,V; 5007 TTL-COMPATIBLE NONINVERTING INPUT BUFFERS logic symbol A--[>----V tpd Ins) CELL NAME Cpd IpF) CL = 0 pF CL = 1 pF 1.8 1.8 2.1 2.1 IPE04LH IPF04Lt-f ... 18.00 18.00 U Label: IPF04LH A, V; 1.6 1.4 IPF12LH II ::::I "'0 ...o 18.00 a. Label: IPF 12LH A, V; 5010 TTL-COMPATIBLE INVERTING SCHMITT-TRIGGER INPUT BUFFERS WITH PULL-UP TAP logic symbol tpd Ins) CELL NAME IPE10LH IPF10LH Cpd IpF) CL = 0 pF CL = 1 pF 3.7 3.7 7.5 7.5 20.00 20.00 Label: IPF10LH A,TAP,V; 5013 TTL-COMPATIBLE NON INVERTING BUFFERS WITH PULL-UP TAP logic symbol TAP~~_ tpd Ins) CELL NAME IPF13LH A~Y Cpd IpF) CL = 0 pF I CL=lpF 1.8 1 2.1 18.00 Label: IPF13LH A,TAP,V; TEXAS .., INSTRUMENTS POST OFFICE BOX 855012 • DALLAS, TEXAS 16265 3-55 PRODUCT GUIDE 5100 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS " tpd (nsl CE~L NAME Cpd (pFI CL = 15 pF CL=50pF 2.7 2.7 4.7 4.7 OPE40LH OPF40LH logic svmbol A-t>-V 9.10 10.90 Label: OPF40LH A,V; 5103 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS logic symbol A---[>--V tpd (nsl ". CELL NAME o Cpd (pFI CL = 15 pF CL=50pF 2.4 2.4 3.5 3.5 OPE60LH OPF60LH Co C ... 15.50 17.30 Label: OPF60LH A,V; () ~ 5104 s: CD TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS logic symbol 'y' tpd (nsl CELL NAME Cpd (pFI CL = 15 pF CL=50pF 2.7 2.7 4.0 4.0 OPE63LH OPF63LH 17.10 19.40 GZ Label: OPF63LH A,GZ,V; . 5105 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS logic symbol A---[>--V tpd (nsl CELL NAME Cpd (pFI CL = 15 pF CL=50pF 2.0 2.0 4.0 4.0 OPE61LH OPF61LH 3.80 4.00 Label: OPF61LH A,V; 3-56 TEXAS ." INSfRUMENTS POST OFFICE BOX· 655012 • DALLAS, TeXAS 75265 PRODUCT GUIDE 5106 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS logic symbol tpd (nsl CELL NAME Cpd (pFI CL = 15 pF CL=50pF 2.0 2.0 2.8 2.8 OPEOOLH OPFOOLH A-{>-V 21.80 20.10 label: OPFOOLH A,V; 5107 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS logic symbol tpd (nsl A---f>-V CELL NAME Cpd (pFI CL = 15 pF CL=50pF 2.7 2.7 3.7 3.7 OPE03LH OPF03LH GZ 19.90 23.20 II ---.-11 label: OPF03LH A,GZ,V; 5108 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS logic symbol tpd (ns) CELL NAME A--t>--V Cpd (pFI CL = 15 pF CL=50pF 1.7 1.7 3.0 3.0 OPE01LH OPF01LH 5.60 5.80 label: OPF01LH A,V; 5109 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS logic symbol tpd (nsl CELL NAME A--t>--V Cpd (pFI CL = 15 pF OPE41LH OPF41LH 2.7 2.7 CL=50pF 6.0 . 6.0 2.40 2.60 label: OPF41LH A,V; TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 76265 3-57 PRODUCT GUIDE 5110 TTL-/CMOS-COMPATIBLE NON INVERTING , 3-STATE.OUTPUT BUFFERS logic symbol tpd (ns) CELL NAME Cpd (pF) CL = 15 pF CL=50pF 3.4 3.4 6.2 6.2 OPE42LH OPF42LH 8.6 10.5 Label: OPF42LH A,G,Y; II .. 5111 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS ." A--f>--V ' tpd (ns) (; CELL NAME C. C Cpd (pF) CL = 15 pF CL=50pF 3,5. 3.5 5,7 5.7 OPE43LH OPF43LH C") GZ~ 10.30 10.90 Label: OPF43LH A,GZ,Y; C) C s: CD logic symbol 5120 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS logic symbol tpd (ns) CELL NAME CL = 15 pF OPFBOLH I CL = 50 pF I 1.7 2.2 A-{>-Y Cpd (pF) 32,80 Label: OPFBOLH A,Y; 5121 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS logic symbol A---[>---V tpd (ns) CELL NAME CL = 15 pF OPFD1LH 1.7 I CL = 50 pF I 2.2 Cpd (pF) 10.40 Label: OPFD1LH A,Y; 3-58 TEXAS -II INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 PRODUCT GUIDE 5123 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS logic symbol A-£>--V tpd (ns) CELL NAME Cpd (pF) CL = 15 pF OPFE1LH I CL = 50 pF I 1.5 16.20 1.9 Label: OPFE1LH A,V; 5124 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFE;RS A---f>--V tpd (ns) CELL NAME Cpd (pF) CL = 15 pF OPFD3LH GZ~ ICL=50PF I 2.5 3.0 • logic symbol 49.00 ... Label: OPFD3LH A,GZ,V; U ::::J ..o 5125 "0 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS logic symbol a.. A---f>--V tpd (ns) CELL NAME Cpd (pF) CL = 15 pF OPFB3LH I 2.8 GZ~ I CL = 50 pF 3.7 29.00 Label: OPFB3LH A,GZ,V; 5200 3-STATE 1/0 BUFFER WITH INVERTING CMOS INPUT AND CMOSITTL OUtPUT . logic symbol tpd (ns) CELL NAME IOE40LH IOF40LH A Cpd (pF) CL = 15 pF CL=50pF 3.:':\ 3.3 5.9 5.9 GZ---...J 12.50 12.70 Vl V2 Label: IOF40LH A,GZ,V2,V1; TEXAS . " INSTRUMENTS POST OFFICE BOX 855012 • DALLAS. TeXAS 76266 3-59 PRODUCT GUIDE 5201 3-STATE I/O BUFFER WITH INVERTING TTL INPUT AND CMOSITTL OUTPUT logic symbol tpd Ins I CELL NAME IOE43LH IOF43LH Cpd (pFI CL = 15 pF CL=50pF 3.5 3.5 5.8 5.8 A;tr-Y1 GZ 13.20 13.40 Y2 Label: IOF43LH A,GZ,Y2,Yl; • 5202 3-STATE 1/0 BUFFERS WITH INVERTING CMOS INPUT AND CMOSITTL OUTPUT logic symbol TAP tpd (nsl CELL NAME CL = 15 pF IOF47LH I CL = 50 pF I 3.6 6.8 Cpd (pFI A 13.10 Label: IOF47LH A,GZ,TAP,Y2,Yl; GZ--_..J Ci) ",--Yl C c: CD Y2--"'""C~ 5203 3-STATE 1/0 BUFFERS WITH INVERTING TTL INPUT AND CMOSITTL OUTPUT logic symbol A tpd (nsl CELL NAME CL = 15 pF IOF48LH I CL = 50 pF I 3.3 3.5 Cpd (pFI GZ--_..J . Yl 14.90 Y2 Label: IOF48LH A,GZ,Y2,Yl; 5206 3-STATE 1/0 BUFFER WITH NON INVERTING CMOS INPUT AND CMOSITTL OUTPUT logic symbol tpd (risl CELL NAME IOE41LH IOF41LH A Cpd (pFI CL = 15 pF CL=50pF 3.3 3.3 5.5 5.5 16.70 14.30 GZ--_..J Y2 Label: IOF41LH A,GZ,Y2,Yl; 3-60 TEXAS . " INSTRUMENTS post OFFICE BOX 665012 • DALI.AS, TeXAS 76266 Yl PRODUCT GUIDE 5207 3-STATE 1/0 BUFFER WITH NONINVERTING TTL INPUT AND CMOSITTL OUTPUT logic symbol A;tt-" tpd Ins) CELL NAME IOE44LH IOF44LH Cpd IpF) CL = 15 pF CL=50pF 3.5 3.5 5.8 5.8 14.50 14.30 GZ Y2 Label: IOF44LH A.GZ.Y2.Yl; 5217 3-STATE 1/0 BUFFER WITH NONINVERTING TTL INPUT AND CMOSITTL OUTPUT logic symbol A;tJ-" tpd Ins) CELL NAME CL = 15 pF IOF64LH I CL = 50 pF I 2.7 4.1 Cpd IpF) GZ 22.40 Y2 Label: IOF64LH A.GZ.Y2.Yl; II CD :2 ::::I ~ ... (,) ::::I "C ... 5220 0 3-STATE 1/0 BUFFER WITH INVERTING CMOS INPUT AND CMOSITTL OUTPUT tpd Ins) A CELL NAME IOEOOLH IOFOOLH Q. logic symbol Cpd IpF) CL = 15 pF CL=50pF 2.9 2.9 3.8 3.8 GZ 31.40 25.80 Yl Y2 Label: IOFOOLH A,GZ,Y2,Yl; 5221 3-STATE 1/0 BUFFER WITH INVERTING TTL INPUT AND CMOSITTL OUTPUT logic symbol tpd Ins) CELL NAME CL = 15 pF IOF03LH 2.7 I CL = 50 pF I 3.8 Cpd IpF) A;tJ-Vl GZ 24.40 V2 Label: IOF03LH A,GZ,Y2,Yl; TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-61 PRODUCT GUIDE 5226 3-STATE I/O BUFFER WITI-4 NONINVE~TING CMOS INPUT AND CMOSITTL OUTPUT logic symbol A~V1 tpd(nsl CELL NAME CL = 15 pF IOF01LH I CL I 2.7 Cpd IpFI = 50 pF GZ 26.60 3.B V2 Label: IOF01LH A,GZ,V2,Vl; 5227 3-STATE I/O BUFFE~ WITH NONINVERTING TTL INPUT AND CMOS/TTL OUTPUT . tpd Insl ." CELL NAME o c. c IOF04LH CL = 15 pF g> I CL = 50 pF I 2.7 Cpd IpFI AtJ-Vl' GZ 25.70 3.B V2 Label: IOF04LH A,GZ,V2;Vl; ~ a:CD logic symbol 5239 3-STATE I/O BUFFER WITH NONIIIIVERTING TTL INPUT AND CMOS/TTL OUTPUT logic symbol A~V1 tpd Insl CELL NAME CL = 15 pF IOFBBLH I CL I 2.7 Cpd IpFI = 50 pF 3.7 GZ 2B.20 V2 Label: IOFBBLH A,GZ,V2,Vl; 5246 3-STATE I/O BUFFER WITH INVERTING TTL INPUT AND TTL/CMOS OUTPUT logic symbol A tpd Insl CELL NAME CL IOFDBLH = 15 pF 2.5 Label: IOFDBLH A,GZ,V2,Vl; 3-62 I CL = 50 pF I 3.0 Cpd IpFI V1 50.BO GZ----' Y2--'""-'!C TEXAS .." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 PRODUCT GUIDE 5250 OPEN-DRAIN 1/0 BUFFER WITH INVERTING CMOS INPUT AND CMOSITTL OUTPUT logic symbol tpd Ins) CELL NAME CL = 15 pF IOFOOLH 1 CL = 50 pF I 1.7 2.3 Cpd IpF) A ---i>--} Yl Y2~ 11.60 Label: IOFOOLH A, Y2, Y 1; 6002 AND-NOR GATES, Y = A1 +(B1-B2-B3) logic symbol tpd Ins) CELL NAME CL=OpF BF002LH 1 CL=1pF I 1.1 2.7 Cpd IpF) 0.42 Bl3b>- II B2 !~ y CD "0 '3 Label: BF002LH A 1 ,B1 ,B2,B3,Y; CJ ~ CJ ::::s 6003 AND-NOR GATES. Y (A1-A2) + (B1-B2) logic symbol "0 2 a. tpd Ins) CELL NAME CL=OpF BF003LH T CL=1pF 1 1.1 2.6 Cpd IpF) 0.51 Label: BF003LH A1,A2,B1,B2,Y; 6004 AND-NOR GATES. Y (A1-A2) + (B1-B2-B3) tpd Ins) CELL NAME CL=OpF BF004LH 1.2 I CL=1pF -r Label: BF004LH A1,A2,B1,B2,B3,Y; 2.B Cpd IpF) 0.53 logic symbol ~~, Al A2 TEXAS . " INSTRUMENTS POST OFFICE BOX 855012 • DALLAS, TEXAS 75265 3-63 PRODUCT GUIDE 6005 AND-NOR GATES, Y = (A1 o A2 o A3)+(B1 o B2 o B3) logic symbol tpd (n5) CELL NAME BF005LH Cpd (pI') CL = 0 pF I CL = 1 pF 1.4 I 3.0 0.64 Label: BF005LH A l,A2,A3,B l,B2,B3, Y; 6006 II... AND-NOR GATES,Y = A1 +A2+(B1 o B2) logic symbol tpd (ns) CELL NAME "0 o BF006LH Co C Cpd (pF), CL = 0 pF I CL = 1 pF 1.3 I 3.2 81 0.36 B2 ~ Label: BF006LH A 1,A2,B1,B2,Y; .... c.: CD . A2 (') G) C Al 6007 AND-NOR GATES, Y = A1 +A2+(B1 o B2 o B3) logic symbol tpd (n5) CELL NAME CL = 0 pF BF007LH I I 1.5 Al------, ~----J ~, Cpd (pF) CL = 1 pF 3.7 0.36 Label: BF007LH A 1,A2,B1,B2,B3,Y; A2-.,..-------' 6008 AND-NOR GATES, Y = A1 +(B1 o B2)+(C1 o C2) logic symbol tpd (ns) CELL NAME CL = 0 pF BFOOBLH 1.4 I CL=lpF I 3.4 Cpd (pF) 0.44 Label: BF008LH A1,B1,B2,C1,C2,Y; 3-64 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012. DALLAS, TEXAS 75265 Y PRODUCT GUIDE 6009 AND-NOR GATES. Y = A1+(B1-B2)+(C1-C2-C3) logic symbol tpd (ns) CELL NAME CL=OpF BF009LH T CL=lpF I 1.6 3.7 Cpd (pFI 0.45 Label: BF009LH A 1.B1.B2.C1.C2.C3.Y; 6012 AND-NOR GATES. Y= (A1-A2)+(B1-B2)+(C1-C2-C3) logic symbol Al tpd (nsl CELL NAME CL=OpF BF012LH I A2 0.56 Cl C2 C3 CL=lpF 1 1.7 Cpd (pFI 3.7 Label: BF012LH A 1.A2.B1.B2.C1.C2.C3.Y; CD "C Y Bl ·S e,:, ... U :::J . B2 6013 • "C 0 Q. logic symbol AND-NOR GATES. Y = (A1-A2)+(B1-B2-B3)+(C1-C2-C3) Bl B2 83 tpd (nsl CELL NAME BF013LH Cpd (pFI CL=OpF I CL = 1 pF 1.9 1 4.1 Cl C2 C3 0.57 Label: BF013LH A 1.A2.B1.B2.B3.C1.C2.C3.Y; Y Al A2 TEXAS ..If INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-65 PRODUCT GUIDE 6014 AND-NOR GATES, V = (A1-A2-A3)+(B1-B2-B3)+(C1-C2-C3) tpd Ins) CELL NAME BF014LH Cpd IpF) CL=OpF I CL=lpF 2.1 I 4.3 0.71 Label: BF014LH A'l ,A2,A3,Bl ,B2,B3,Cl ,C2,C3, Y; logic symbol A l - - . - -.... A2 A3----o.._' B l - - - - r - -... B2 B3----o.._' Y C l - - - - r - -... C2 C 3 - -......_ , 6017 ... o AND-NOR GATES, V = A1 +(B1-B2) • logic symbol ." tpd Ins) c.. CELL NAME c ...n BF001LH C) c is: CD Cpd IpF) CL=OpF I CL=1pF 1.0 I 2.5 :~--~-')~-~-, A1 ~Y 0.38 Label: BF001LH Al,Bl,B2,Y; 6018 AND-NOR GATES, Y = A1 +(B1-B2-B3)+(C1-C2-C3) logic symbol tpd Ins) CELL NAME BF010LH Cpd IpF) CL=OpF I CL=lpF 1.7 I 3.9 0.45 Label: BF010LH A 1,Bl ,B2,B3,Cl ,C2,C3,Y; ij--__~, A1 - - - - - - ..... 6019 AND-NOR GATES, V = (A1-A2)+(B1-B2)+(C1-C2) logic symbol Al tpd Ins) CELL NAME BF011LH Cpd IpF) CL=OpF I CL=lpF 1.5 I 3.5 Label: BF01 1LH Al,A2,Bl,B2,Cl,C2,Y; 0.52 A2 B1 Y B2 C1 C2 3-66 TEXAS ." INSTRUMENTS POST OFFICE BOX 855012 • DALLAS, TEXAS 75265 PRODUCT GUIDE 6022 OR-AND-NOR GATES. V = A1-A2+[B1-B2-(C1 +C2)] logic symbol Cl--...z--.... tpd (ns) CELL NAME BF022LH Cpd (pF) CL=OpF I CL=lpF 1.7 I 3.9 0.54 C2---...._~ B1-------I B2------~~~ Label: BF022LH Al,A2,Bl,B2,Cl,C2,Y; Y A1------~r_~ 6023 OR-AND-NOR GATES. V = A1 +[B1-(C1 +C2)) logic symbol II CI) "C tpd (ns) BF015LH 'S Cpd (pF) CELL NAME CL = 0 pF I CL = 1 pF 1.3 I 3.2 CJ ... 0.36 () Label: BF015LH Al,Bl,Cl,C2,Y; ;:, "C ...o 6024 D.. OR-AND-NOR GATES. V = A1 +[(B1 +B2)-(C1 +C2)) logic symbol tpd (ns) Cpd (pF) CELL NAME CL=OpF BF016LH ICL=1PF I 1.4 3.4 0.42 Label: BF016LH Al,Bl,B2,Cl,C2,Y; 6025 OR-AND-NORGATES. V = A1-A2-A3+[B1-(C1 +C2)) logic symbol tpd Ins) CELL NAME BF025LH Cpd (pF) Cl=OpF I CL=1pF 1.5 I 3.5 0.64 Label: BF025LH A l,A2,A3,Bl ,Cl ,C2,Y; TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-67 PRODUCT GUIDE 6026 OR-ANO-NOR .GATES, y = A1 +[B1.B2·(C1 +C2)] logic symbol 81 tpd Insl CELL NAME Cl BF017LH =0 pF I Cl = 1 pF I 1.5 ~~~82~·r--L?- Cpd IpFI 3.7 0.40 y A1----------------__-J. Label: BF017LH A1,B1,B2,C1,C2,Y; 6027 OR-ANO-NOR GATES, logic symbol y= A1·A2·A3+[B1·B2·(C1 +C2)] • tpd Insl ....""0 CELL NAME Co BF027LH o CL ...c: =0 pF J Cl J 1.8 = Cpd IpFI 1 pF 3.6 0.98 Y B1---------------;--, B2------------~ Label: BF027LH A 1 ,A2,A3,B1 ,B2,C1 ,C2,Y; (') A1----_r_-.... A2 A3--,--_ G) C1 C2 c: c: CD 6028 OR-ANO-NOR GATES, Y = A1.A2·A3+[B1.(C1 +C2)·(01 +02)] logic symbol D1 tpd Insl CEll NAME CL BF028LH =0 pF I Cl .I 1.9 = Cpd IpFI 1 pF 1.11 3.6 D2 B1 C1 Label: BF028LH A 1,A2,A3,B 1 ,C 1,C2,D1 ,D2,Y; C2 A1 A2 A3 Y 6029 OR-ANO-NOR GATES, y.= A1.A2+[B1-(C1 +C2)] logic symbol tpd Ins I CELL NAME Cl BF020LH =0 1.4 pF I CL 1 = Cpd IpFI 1 pF 3.4 0.47 Label: BF020LH A 1,A2,B1 ,C1 ,C2,Y; 3-68 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012. DALLAS, TEXAS 75265 PRODUCT GUIDE 6032 ANO-OR-ANO-NOR GATES, Y = A1+{B1 o [C1+(01 0 02)J} logic symbol 01 tpd Ins) CELL NAME CL BF030LH ~ 0 pF T CL ~ 1 pF I 1.7 Cpd IpF) 02 0.80 C1 3.9 Label: BF030LH A1,B1,C1,01,02,Y; B1 Y A1 II 6034 ANO-OR-ANO-NOR GATES, Y = (A1 oA2)+ {B1 o [C1 +(01 0 02)J) logic symbol CD "C 01 ·S tpd Ins) CELL NAME CL BF034LH ~ 0 pF 1.7 I 1 Cpd IpF) CL ~ 1 pF 02 ~ ... C1 3.6 0.86 (,) B1 y Label: BF034LH A1,A2,B1,Cl,01,02,Y; Al A2 ::::J .. "C 0 Q. 6035 ANO-OR-ANO-NOR GATES, Y = (A1 oA2)+{B1 o[(C1 oC2)+(01 0 02)1) logic symbol tpd Ins) CELL NAME CL~OpF BF035LH 1.7 I 1 02 Cpd IpF) CL ~ 1 pF 3.3 0.96 01 C2 C1 B1 Label: BF035LH A 1,A2,B1 ,C1 ,C2,01 ,02,Y; y A2 A1 6048 OR-NANO GATES, Y = A1o(B1 +B2) logic symbol tpd Ins) CELL NAME CL BF051LH ~ 0 pF 1.0 I CL .1 pF T 2.4 B1~ Cpd IpF) ~ B2 0.57 Al Y Label: BF051LH Al,B1,B2,Y; TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-69 PRODUCT GUIDE 6049 OR-NAND GATES. V = A1-IB1 +B2+B3)-IC1 +C2+C3) logic symbol 81-..J"-.... B2 tpd (nsl CELL NAME CL=OpF BF060LH 1.7 I r 83,-,""",-_" C1-..J"-.... C2 C3;-,""",-_" Cpd (pFI CL=1pF 3.B 0.65 Label: BF060LH A1.Bi,B2,B3,C1,C2,C3,Y; v A1--------' 6052 OR-NAND GATES. V = A1-IB1 +B2+B3) logic symbol tpd (nsl -a CELL NAME c () Label: BF052LH A1,B1,B2,B3,V; ac. BF052LH Cpd (pFI CL=OpF CL=1pF 1.2 3.2 0.57 r+ C) c r! 6053 OR-NAND GATES. V = IA1 +A2)-(B1 +B2) logic symbol CD A1 tpd (nsl CELL NAME BF053LH Cpd (pFI CL=OpF I CL=1pF 1.1 I 2.6 A2 - ........ B1 Label: BF053LH A1,A2,B1,B2,V; 82----..__" 6054 OR-NAND GATES. V = IA1 +A2)-IB1 +B2+B3) logic symbol tpd (nsl CELL NAME Cpd (pFI cL=oPFl CL = 1 pF BF054LH 1.2 I 3.0 0.47 Label:,BF054LH A1,A2,B1,B2,B3,Y; 3-70 _" ~--V 0.49 ,TEXAS .., INSTRUMENTS POST OFFICE BOX 866012 • DALLAS. TEXAS 75265 PRODUCT GUIDE 6055 OR-NAND GATES. Y =(A1 +A2+A3).(B1 +B2+B3) logic symbol tpd Ins) CELL NAME Cpd IpF) CL=OPFT CL = 1 pF BF055LH I 1.3 3.3 0.51 Label: BF055LH A l,A2,A3,B1.B2,B3,Y; 6056 OR-NAND GATES. Y = A1·A2·(B1+B2) • logic symbol tpd Ins) CELL NAME CL = 0 pF BF056LH T CL = I 1.2 Cpd IpF) 1 pF 2.9 0.55 Label: BF056LH Al,A2,Bl,B2,Y; +' CJ j 6057 "CI OR-NAND GATES. Y = A1.A2.(B1 +B2+B3) ~~ A2-~--- , tpd Ins), CELL NAME CL=OpF BF057LH I Cpd IpF) CL = 1 pF 1 1.5 3.7 ...o c.. logic symbol . 0.58 Label: BF057LH A1,A2,Bl,B2,B3,Y; 6058 OR-NAND GATES. Y = A1.(B1 +B2).(C1 +C2) logic symbol B1 tpd Ins) CELL NAME CL=OpF BF058LH 1.3 I -r B2 Cpd IpF) CL = 1 pF 3.0 A1-------I 0.64 FI--Y C1 C2 Label: BF058LH Al,B1,B2,Cl,C2,Y; TEXAS ..II INSTRUMENTS POST OFFICE BOX 666012 • DALLAS. TeXAS 75265 3-71 PRODUCT GUIDE 6059 OR-NAND GATES, Y = A1-(B1+B2)-(C1+C2+C3) tpd (ns) CELL NAME CL=OpF BF059LH I 1.6 Cpd (pF) I CL=1pF logic symbol C1 C2 C3 B1 3.5 0.65 Y B2 Label: BF059LH A1,B1,B2,C1.C2,C3,Y; A1 6062 • OR-NAND GATES, Y = (A1 +A2)-(B1 +B2)-(C1 +C2+C3) logic symbol tpd (ns) ." CELL NAME o Q. BF062LH C Cpd (pF) CL=OpF I CL=1pF 1.9 I 4.1 A1 0.65 Label: BF062LH A1,A2,B1,B2,C1,C2,C3,Y; (') r+ C1 C2 C3 y A2 B1 B2 G') C c:CD 6063 OR-NAND GATES, Y = (A1 +A2)-(B1 +B2+B3)-(C1 +C2+C3) tpd (ns) CELL NAME BF063LH Cpd (pF) CL=OpF I CL=1pF 2.0 I 4.2 0.64 Label: BF063LH A 1,A2,B1,B2,B3,C1 ,C2,C3,Y; logic symbol B1 ---'f"""....... B2 B3 ---.&.--" C 1 - - r -....... C2 >---~ C3 r-~--' y A1 A2---c"--_ 6064 OR-NAND GATES, Y = (A1+A2+A3)-(B1+B2+B3)-(CHC2+C3) logic symbol A1--~""'" tpd (ns) CELL NAME CL=OpF BF064LH 1.9 I CL=1pF I Cpd (pF) 4.1 0.70 Label: BF064LH A 1,A2,A3,B1 ,B2,B3,C 1,C2,C3,Y; A2 A 3 - -_ _ B 1 - - r -....... B2 B 3 - -_ _ C 1 - - _....... C2 C 3 - -_ _ 3-72 TEXAS ." INSTRUMENTS POST OFFICE BOX 656012 • DALLAS, TeXAS 75266 y PRODUCT GUIDE 6065 AND-OR-NAND GATES,Y = A1·[B1+(C1·C2)] tpd Ins) CELL NAME CL BF065LH =0 pF I CL I 1.2 = Cpd (pF) 1 pF 0.58 2.8 logic symbol ::~, A1 _ _ _ _ _ _ _ _ _ _---1 _ Label: BF065LH A1,B1,C1,C2,V; 6066 AND-OR-NAND GATES, Y = A1.[(B1.B2)+(C1.C2)) logic symbol II B1 tpd Ins) CELL NAME CL BF066LH =0 pF I CL I 1.3 = Cpd (pF) B2-""I-_" 0.64 C1--'----, Q) 1 pF 2.9 Label: BF066LH A1,B1,B2,Cl,C2,V; V :2 :::l ~ ... C2-""I-_" A 1-----------------1 (J :::l '"CI ... 6067 0 AND-OR-NAND GATES, Y = A1.[B1+B2+(C1.C2)] c. logic symbol tpd Ins) CELL NAME CL BF067LH =0 pF I CL = 1 pF I 1.5 Cpd (pF) 0.57 3.7 Label: BF067LH A1,B1,B2,C1,C2,V; 6068 AND-OR-NAND GATES, Y = A1.[B1+(C1.C2)+(D1.D2)] logic symbol tpd Ins) CELL NAME CL BF068LH = 0 pF 1.8 I I CL = Cpd (pF) 1 pF 4.0 Label: BF068LH A1,B1,C1,C2,D1,D2,V; 0.61 t-tpp-----J P-v Al-------------~· TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 , 3-73 PRODUCT GUIDE 6069 AND-DR-NAND GATES. Y = A1-[(B1-B21+(C1-C21+(D1-D2)] logic symbol Bl tpd (nsl CELL NAME CL=OpF BF069LH I CL=lpF I 1.9 4.2 Cpd (pFI 0.66 B2 Cl y C2 Label: BF069LH A1,B1,B2,C1,C2,01,02,Y; 01 02 Al .. o 6072 "'a AND-DR-NAND GATES. Y = (A1+A21-[B1+B2+(C1-C211 .. logic symbol Q. s:::: tpd (nsl (') CELL NAME BF072LH Cpd (pFI CL=OpF I CL=lpF 1.8 I 3.B 0.81 Label: BF072LH A1,A2,B1.,B2,C1,C2,Y; "~ ~! C2 y 6073 AND:DR-NAND GATES. Y = (A1 +A21-[B1 +(C1-C2)] logic symbol tpd (nsl CELL NAME BF070LH Cpd (pFI CL=OpF I CL=lpF 1.3 J 2.9 0.53 Label: BF070LH A1.A2,Bl,C1,C2,Y; 6074 AND-DR-NAND GATES. Y = (A1+A21-[(B1-B21+(C1-C2)] logic symbol Bl---Jr--tpd (nsl CELL NAME BF071LH Cpd (pFI CL=OpF I CL=lpF 1.5 I 3.1 Label: BF071LH A1,A2.Bl,B2,C1,C2,Y; 0.64 B2-----.'--_ Cl C2---.L.....~ Al----------~r_~ A2 3-74 -----------1 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 y PRODUCT GUIDE 6075 AND-OR-NAND GATES. y = CA1+A2+A3)-[B1+CC1-C211 logic symbol tpd (nsl CELL NAME BF075LH Cpd (pFI CL=OpF I CL=1pF 1.1 I 2.5 0.77 Label: BF075LH A1,A2,A3,B1,C1,C2,Y; • 6082 OR-AND-OR-NAND GATES. Y = A1-{CB1-B2)+[C1-CD1+D211} logic symbol I CL=OpF BFOS2LH Cpd (pF) CL=1pF 1 1.9 CD 02 tpd (ns) CELL NAME 3.B 0.S7 "C ·S 01 ~ ... C1 B2 Label: BFOB2LH A 1,B1 ,B2,C1.01 ,02,Y; B1 y U :::J "C 0 ... a.. 6083 OR-AND-OR-NAND GATES. Y = A1-{B1+[C1-CD1+D211} logic symbol tpd (nsl CELL NAME Cpd (pFI CL = 0 pFI BFOSOLH CL = 1 pF I 1.6 3.7 0.80 Label: BFOBOLH A 1,B1 ,C1 ,01 ,02,Y; 6084 OR-AND-OR-NAND GATES. Y = A1-{B1+[(C1+C2)-CD1+D211} logic symbol tpd (nsl CELL NAME I CL=1pF CL=OpF BFOS1LH 1.9 I 3.9 Cpd (pFI 0.90 Label: BFOB1LH A1,B1,C1,C2,01,02,Y; TEXAS ." INSTRUMENTS POST OFFICE BOX 656012 • DALLAS. TeXAS 75265 3-75 PRODUCT GUIDE 6088 OR-AND-OR-NANP GATES. Y = (A1+A2+A3)-{B1+[C1-(D1+D2)J) logic symbol 02 01 tpd Ins) CELL NAME CL=OpF BFOBBLH 2.1 j I Cpd IpF) CL=1pF 4.1 C1 0.99 B1 Label: BFOBBLH A1,A2,A3,B1,C1,01,02,Y; y A3 A2 A1 6100 4-INPUT GATj:D S-R LATCHES logic symbol "a a tpd Ins) CELL NAM!, Q. c n P+ CL=OpF GM010LH I CL=1pF I 1.3 2.8 Cpd IpF) RA R1 Q S2 QZ R1 Q S2 QZ RB 0.75 Label: GM010~H RA,RB,SA,S13:Q,QZ; C) c SA a: CD SB 61Q1 5-INPUT GATED S-R LATCHES INCLUDING SEPARATE RESET logic symbol R tpd Ins) CELL NAME GM110LH CL=OpF J CL=1pF 1.3 I 3.6 Cpd IpF) RA 0.80 RB Label: GM110LH RA,RB.SA,SB,R,Q,QZ; SA SB 3-76 TEXAS • INSTRUMENTS POST OFFICE ~ox 655012'" DAUAS •. TEXAS 75265 PRODUCT GUIDE 6102 5-INPUT GATED S-R LATCHES INCLUDING SEPARATE SET logic symbol tpd (nsl CELL NAME GMS10lH Cpd (rFI Cl=OpF I Cl=1pF 1.6 I 3.6 .- 0.7& RA a R1 RB label: GMS10LH RA,RB,SA,SB,S,Q,QZ; SA & S2 SB S 2 az S2 • 6103 6-INPUT GATED S-R LATCH~S INCLUDING SEPARATE SET AND RESET logic symbol ·S R R1 RA &. tpd (nsl CEll NAME GM210LH Cpd (pFI Cl=OpF I Cl = 1 pF 1.6 1 3.6 II) "C ~ a R1 0.81 RB Label: GM210LH RA,RB,SA,SB,R,S,Q,QZ; SA & S2 az R1 a SB S ... (,) ~ .. "C 0 0- S2 6105 6-INPUT GATED S-R.LATCHES logic symbol tpd (nsl CEll NAME CL=OpF GM310LH 1.4 I Cl = 1 pF T 3.0 Cpd (pFI 0.80 Label: GM310lH RA.RB,RC,SA,SB,SC,Q,QZ; RA RB & RC SA SB S2 2 az SC TEXAS ." INSTRUMENTS POST OFfiCE BOX 855012 • DALLAS. TeXAS 75266 3-77 PRODUCT GUIDE 6106 7-INPUT GATED S-R LATCHES INCLUDING SEPARATE RESET logic symbol R tpd Ins) CELL NAME Cpd IpF) CL=OpF GM410LH I CL =lpF I 1.S 4.0 0.S5 RA RB Q RC Label: GM410LH RA,RS,RC,SA,SB,SC,R,Q,QZ; SA & SB S2 2 QZ SC B ------... -0 o ~ ... 6108 8-INPUT GATED S-R LATCHES INCLUDING SEPARATE SET AND RESET logic symbol () R Rl RA & tpd Ins) Ci) C CELL NAME s: CD GM510LH Cpd IpF) CL=OpF I CL=lpF l.S I 4.0 Rl RB 0.S6 Q RC Label: GM510LH RA,RB,RC,SA,SB.SC.R.S.Q,QZ; SA & SB S2 2 QZ SC S S2 6110 4-INPUT GATED S-R LATCHES logic symbol tpd Ins) CELL NAME CL = 0 pF GS010LH 1.3 Cpd IpF) SAZ 0.72 SBZ ICL=lpF I 2.7 Sl Q R2 QZ Label: GS010LH RAZ,RBZ,SAZ,SBZ,Q,QZ; RAZ RBZ 3-78 TEXAS .., INSTRUMENTS POST OFfiCE BOX 655012 • DALLAS: TEXAS 75285 PRODUCT GUIDE 6111 5-INPUT GATED S-R LATCHES INCLUDING SEPARATE RESET logic symbol tpd Ins) CELL NAME GSll0LH Cpd IpF) CL=OpF I CL = 1 pF 1.5 T 3.1 0.84 Label: GSll0LH RAZ,RBZ,SAZ,SBZ,RZ,Q,QZ; 6112 5-INPUT GATED S-R LATCHES INCLUDING SEPARATE SET tpd Ins) CELL NAME CL=OpF GSS10LH 1.4 T CL I Cpd IpF) = 1 pF 3.1 0.84 Label: GSS10LH RAZ,RBZ,SAZ,SBZ,SZ,Q,QZ; 6113 6-INPUT GATED S-R LATCHES INCLUDING SEPARATE SET AND RESET logic symbol SZ SAZ SBZ tpd Ins) CELL NAME Cpd IpF) cL=opFl CL = 1 pF GS210LH 1.5 I 3.1 0.84 S1 Q R2 QZ Label: GS210LH RAZ,RBZ,SAZ,SBZ,RZ,SZ,Q,QZ; RAZ RBZ RZ TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 15265 3-79 . PRODUCT GUIDE 6115 6-INPUT GATED S-R LATCHES logic symbol tpd (nsl CELL NAME CL = 0 pF GS310LH I CL = I 1.5 Cpd (pFI 1 pF 0.75 3.4 Label: GS310LH RAZ,RBZ,RCZ,SAZ,SBZ,SCZ;a,az; SAZ saz a SCZ RAZ az RBZ • ..."'tI o Q. RCZ 6116 7-INPUT GATED S-R LATCHES INCLUDING SEPARATE RESET logic symbol I: (') 1'+ tpd (nsl CELL NAME CL=OpF GS4l0LH J CL=1pF I 1.7 Cpd IpFI 0.85 3.8 Label: GS410LH RAZ,RBZ,RCZ,SAZ,SBZ,SCZ,RZ,a,aZ; SAZ SBZ S1 Q SCZ RAZ RBZ R2 2 QZ RCZ RZ 6118 8-INPUT GATED S-R LATCHES INCLUDING SEPARATE SET AND RESET logic symbol SZ tpd (nsl CELL NAME GS510LH Cpd-(pFI CL=OpF I CL=1pF 1.9 I 4.0 SAZ SBZ 0.89 a SCZ Label: GS510LH RAZ,RBZ,RCZ,SAZ,SBZ;SCZ,RZ,SZ,a,az; RAZ RBZ RCZ RZ 3-80 TEXAS .., INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 R2 2 QZ PRODUCT GUIDE 6120 NONINVERTING OELA Y BUFFERS logic symbol tpd (nsl CELL NAME CL BU120LH BU130LH =0 pF CL 1.1 1.4 = Cpd (pFI A---[>---V 1 pF 1.7 1.7 1.29 1.73 Label: BUlnOLH A,V; 6121 NONINVERTING 3-STATE BUFFERS WITH ACTIVE-LOW ENABLE logic symbol tpd (nsl CELL NAME CL BU221 LH BU261LH =0 pF CL 1.6 1.8 II A--I>-V = Cpd (pFI GZ~ 1 pF 2.3 2.0 1.62 3.29 ... Label: BU2n 1LH A,GZ, V; (J ~ .. "C 6122 o NONINVERTING 3-STATE BUFFERS WITH ACTIVE-HIGH ENABLE :==S>-V tpd (nsl CELL NAME BU222LH BU262LH Cpd (pFI CL = 0 pF CL = 1 pF 1.6 1.8 2.3 2.0 0.. logic symbol 1.62 3.30 Label: BU2n2LH A,G,V; 6125 OoTYPE LATCHES WITH ACTIVE-LOW ENABLE tpd (nsl CELL NAME CL = 0 pF LAL20LH 3.2 1 CL I Cpd (pFI = 1 pF 3.9 4.68 0'10 logic symbol c--t:::.I.._ C_1_ _ _ t-a -'~ az Label: LALnOLH D,C,Q,QZ; TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3-81 PRODUCT GUIDE 6130 5-INPUT POSITIVE-OR GATES logic symbol tpd Ins) CELL NAME OR510LH Cpd IpFI CL=OpF I CL = 1 pF 2.5 I 3.4 1.11 Label: OR510LH A,B,C,D,E,Y; 6131 8-INPUT POSITIVE-OR GATES •. logic symbol tpd Insl CELL NAME "'D ORS10LH oQ. Cpd IpFI CL=OpF I CL=1pF 2.3 I 3.3 1.16 Label: ORS10LH A,B,C,D,E,F,G,H,Y; C ... (") C) C, s: 6132 8-INPUT POSITIVE-AND GATES CD logic symbol A tpd Ins I CELL NAME ANS10LH B Cpd IpF) CL=OpF I CL=1pF 2.1 I 3.4 C 1.22 0 Label: ANS10LH A,B,C,D,E,F,G,H,Y; E F G H 3-82 TEXAS ." INSTRUMENTS posr OFFICE 90)( 666012 • .DALLAS, TEXAS 75265 V Data Sheets 4-1 • 4-2 SN54ASCOO, SN74ASCOO 2·INPUT POSITIVE·NAND GATES 02939. AUGUST 1986 SystemCell™ 2-"m INTERNAL STANDARD CELL logic symbol • Choice of Five Performance Levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability :==D=--V FUNCTION TABLE INPUTS OUTPUT AS V positive logic equation Y=A B=A+B H H L L X H X L H description The SN54ASCOO and SN74ASCOO are 2·input positive·NAND gate CMOS standard-cell functions implementing the equivalent of one-fourth of an SN54LSOO or SN74LSOO. The standard-cell library contains five physical implementations providing the custom IC designer a choice between five performance levels for optimizing design. The five options are designated and called from the engineering workstation input • using the following cell names to develop labels for the design netlist: • FEATURES CELL NAME NETLIST TYPICAL HDL LABEL NA210LH NA220LH NA230LH Label: NA2nOLH A.B.Y; RELATIVE DELAV CELL AREA CL - 1 pF TO NA210LH 2 ns 1 1.3 ns 1.5 1.1 ns 2 2.5 3.5 NA240LH 1 ns NA260LH 0.8 ns fI) ~ CD CD .s::. en CO .CO ~ C The SN54ASCOO is characterized for operation over the full military temperature range of - 55 DC to 125°C. ihe SN74ASCOO is characterized for operation from -40°C to 85 DC. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA do.umants contain infDrmatiDn current as of publication data. Products conform to specifications per the terms of TexIs Instruments =~:~;8[::1~1i ~=::i: 1i~D=:~!O:S not Copyright @ 1986. Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 4-3 SN54ASCOO, SN74ASCOO 2·INPUT POSITIVE·NAND GATES electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current ei TEST CONDITIONS I SN54Aseoo I SN74Aseoo Input capacitance Equivalent power epd dissipation capacitance PARAMETER VT Input threshold voltage lee Supply current ei Input capacitance epd I I SN54Aseoo SN74Aseoo Equivalent power dissipation capacitance PARAMETER VT ...C I» I» en Input threshold voltage lee Supply current ei I SN54Aseoo I SN74Aseoo Input capacitance Equivalent power epd dissipation capacitance Vee = 5 V, vee - 4.5 V to 5.5 V, TA = TA = 25°C VI - Vee orO, NA220LH TYP MAX 131 196 MIN to MAX Vee = 5 V, Vee - 5 V, TA = 25°C Vee = 5 V, Vee - 4.5 V to 5.5 V, TA = MIN to MAX TA = 25°e VI - Vee or 0, Vee = 5 V, Vee - 5 V, TA = 25°C TA = 25°C tr - tf - 3 ns, TA Vee = 5 V, Vee - 5 V, TA = 25°C TA VI = 25°e = Vee or 0, = 25°e tr - tf - 3 ns, CD CD ... (I) TEXAS . " INSTRUMENTS POST OFFICE BOX 865012 • DALLAS, 0.2 pF 0.51 1 pF TYP 2.2 MAX 254 15.2 NA240LH TYP MAX 2.2 316 19 T~XAS 75265 UII!IT V nA 0.39 0.54 pF 1.51 2.06 pF NA26QLH TEST CONDITIONS Vee = 5 V, Vee = 4.5 V to 5.5 V, TA = MIN to MAX 11.7 nA 0.12 NA230LH TEST CONDITIONS UNIT V 2.2 7.84 TA = 25°e tr - tf - 3 ns, ::T 4-4 NA210LH TYP MAX 2.2 TYP 2.2 MAX UNIT V 433 26 nA 0.79 pF 2.98 pF SN54ASCOO, SN74ASCOO 2-INPUT POSITIVE-NAND GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) NA210LH PARAMETERt tpLH FROM TO TEST (lNPUTI (OUTPUT) CONDITIONS A or B tpHL tpLH tpHL ~tpLH ~tpHL A or B A or B Y = CL CL Y = 0 1 pF Y SN54ASCOO SN74ASCOO MIN TYP* MAX MIN TYP* MAX 0.7 0.8 1.4 0.8 0.5 1 1.5 0.7 0.5 1 1.3 1.4 1.2 2 4 1.2 2 3.7 1 2 4.2 1.1 2 3.7 0.5 1.2 2.7 0.5 1.2 2.5 0.5 1 2.7 0.5 1 2.3 TYP* MAX MIN TYP* MAX 0.5 0.8 1.3 0.6 0.8 1.2 0.3 0.7 1.4 0.4 0.7 1.3 0.8 1.3 0.9 0.7 1.3 1.3 2.2 UNIT ns ns ns/pF NA220LH PARAMETERt tpLH tpHL tpLH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A or B Y A or B tpHL ~tpLH ~tpHL A or B = CL Y CL = 0 1 pF y SN74ASCOO SN54ASCOO MIN 0.6 1.3 2.4 2.7 0.3 0.5 1.1 0.3 0.5 1 0.3 0.6 1.3 0.3 0.6 1.1 2.4 UNIT ns ns ns/pF NA230LH PARAMETERt tpLH tpHL tpLH tpHL ~tpLH ~tpHL II ... CI) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A or B Y A or B y A or B Y = CL CL = 0 1 pF SN74ASCOO SN54ASCOO MIN TYP* MAX MIN TYP* MAX 0.4 0.7 1.3 0.5 0.7 1.3 0.2 0.6 1.4 0.3 0.6 1.3 0.7 1.1 2 0.7 1.1 1.9 0.5 1 2.3 0.5 1 2 0.2 0.4 0.4 0.2 0.2 0.4 0.4 0.7 0.3 0.8 0.9 0.8 UNIT Q) Q) .c ns en ns «I «I ... C ns/pF NA240LH PARAMETERt tpLH tpHL tpLH tpHL ~tpLH AtpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A or B Y A or B Y A or B Y = CL CL = 0 1 pF SN74ASCOO SN54ASCOO MIN TYP* MAX MIN TYP* MAX 0.4 0.1 0.7 0.5 1.2 1.2 0.4 0.2 0.7 0.5 1.1 1.1 0.6 1 1.8 0.6 1 1.7 0.4 0.9 1.9 0.4 0.9 1.7 0.2 0.3 0.6 0.2 0.3 0.6 0.3 0.4 0.7 0.2 0.4 0.7 tpropagation delay times are measured from the 44% pOint of VI to the 44% point of Vo with tr tPLH " propagation delay time, low-to-high-Ievel output tpHL " propagation delay time, high-to-Iow-Ievel output ~tpLH " change in tpLH with load capacitance ~tpHL " change in tpHL with load capacitance Typical values are at VCC = 5 V, T A = 25 ·C. = tf = UNIT ns ns ns/pF 3 ns 110% and 90%). * TEXAS ." INSTRUMENTS POST OFf=ICE BOX 655012 • DALLAS, TEXAS 75265 4-5 SN54ASCOO. SN74ASCOO 2·INPUT POSITIVE·NAND GATES NA260LH PARAMETERt tpLH tpHL tpLH tpHL JltpLH JltpHL FROM TO TEST (INPUTI IOUTPUT) CONDITIONS A or B Y A or B Y A or B Y CL = 0 CL = 1 pF SN54ASCOO SN74ASCOO MIN TYP* MAX MIN TYP* MAX 0.4 0.6 0.5 1.2 0.6 1.1 1.2 0.5 0.3 0.5 1.1 0.8 1.6 0.6 0.8 1.5 0.7 1.7 0.4 0.7 1.5 0.2 0.2 0.5 0.1 0.4 0.6 0.1 0.2 0.2 0.1 0.5 0.3 0.1 0.1 tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpLH " propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output JltpLH '" change in tpLH with load capacitance AtpHl :;;;; change in tpHL with load capacitance *Typical values are at VCC = 5 V, TA = 25 DC. = tf = 3 0.5 UNIT ns ns ns/pF ns 110% and 90%1- DESIGN CONSIDERATIONS II Refer to Section 7 All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. ...c C» C» en ::r CD CD ... (I) 4-6 TEXAS .." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC02. SN74ASC02 2·INPUT POSITIVE·NOR GATES 02939. AUGUST 1986 SystemCell™ 2-lAm INTERNAL STANDARD CELL logic symbol • Choice of Four Performance Levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability :=D-v FUNCTION TABLE INPUTS fp;8 positive logic equations Y=A+B = "A.i3 OUTPUT Y H X X H L L L H L description The SN54ASC02 and SN74ASC02 are 2-input positive-NOR gate CMOS standard-cell functions implementing the equivalent of one-fourth of the SN54LS02 or SN74LS02. The standard-cell library contains four physical implementations providing the custom IC designer a choice between four performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: FEATURES CELL NAME NETLIST TYPICAL RELATIVE HDL LABEL DELAY CELL AREA CL - 1 pF TO NA210LH N0210LH 2.4 ns 1 N0220LH 1.5 ns 1.5 Label: N02nOLH A.B.Y; N0230LH N0240LH 1.3 ns 2 1.1 ns 2.5 II ... en CD CD .c til ...caca C The SN54ASC02 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC02 is characterized for operation from -40 DC to 85 DC. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA documents oonllin information current as of publication data. Products conform to specifi..lio.. par Ihe term. of Tu•• Instrumenls ::~:~i~8{::I~li ~:i:;ti:r :.~o=:::~::.s not Copyright @ 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-7 SN54ASC02, SN74ASC02 2·INPUT POSITIVE·NOR GATES electrical characteristics VT lee Supply current ei epd Vee = 5 V, Vee - 4.5 V to 5.5 V, Input threshold voltage I SN54Ase02 I SN 74Ase02 = TA Input capacitance Equivalent power dissipation capacitance TA VT I lee Supply current Input capacitance tr = tf - 3 ns, 25°e SN74Ase02 = MIN to = 5 V, Vee = 5 V, TA = 25°e TA Equivalent power dissipation capacitance V 185 11.1 nA 0.24 pF 0.33 0.52 pF N0240LH N0230LH TYP MAX TYP MAX UNIT = 25°e = Vee or 0, 2.2 = 25°e = tf = 3 ns, 0.36 0.47 pF 0.8 0.98 pF TA VI V 2.2 237 292 14.2 TA tr UNIT 0.11 MAX Vee MAX 2.2 7.71 TA"- 25°e Vee = 5 V, Vee = 4.5 V to 5.5 V, I SN54Ase02 ei epd II Input threshold voltage TYP 128 VI - Vee or 0, TEST CONDITIONS PARAMETER MAX 2.2 25°e MIN to MAX Vee - 5 V, Vee - 5 V, = TYP = TA N0220LH N0210LH TEST CONDITIONS PARAMETER 17.5 nA switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) N0210LH C ....I»I» PARAMETERt en ::r tpHL tPLH tpLH CD CD tPHL ....en AtPLH AtpHL FROM TO TEST (lNPUTI (OUTPUTI CONDITIONS A or B Y A or B Y A or B eL CL =0 = 1 pF Y SN54ASC02 Typt MAX SN74ASC02 TYpt MAX MIN MIN 0.6 0.8 1.6 0.6 0.8 1.5 0.5 1 1.7 0.6 1 1.7 1.5 2.8 6.2 1.6 2.8 5.6 1.1 2 4.6 1.1 2 4.1 0.9 2 4.6 1 2 4.2 0.5 1 2.9 0.5 1 2.5 UNIT ns ns ns/pF N0220LH PARAMETERt tpLH tpHL tpLH tPHL AtpLH AtPHL FROM TO TEST (INPUT) (OUTPUTI CONDITIONS A or B Y A or B Y A or B Y eL =0 eL = 1 pF SN54ASC02 TYP* MAX MIN 0.6 0.8 1.3 0.6 0.8 1.2 0.3 1 0.8 1.7 1.5 3.5 0.3 1.1 0.8 1.7 3.2 0.7 1.3 2.6 0.7 1.3 2.4 0.4 0.9 2.3 0.5 0.9 2 0.3 0.6 1.1 0.4 0.6 1 tPropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tPLH '" propagation delay time, low·to·high-Ievel output tpHL 5!1! propagation delay time, high-to-Iow-Ievel output A tPLH '" change in tPLH with load capacitance AtpHL .. change in tPHL with load capacitance Typical values are at Vee = 5 V, TA = 25°C. * 4-8 SN74ASC02 Typt MAX MIN TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 1.5 UNIT ns ns ns/pF = tf = 3 ns (10% and 90%1- SN54ASC02. SN74ASC02 2·INPUT POSITIVE·NOR GATES switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) (continued) N0230LH PARAMETERt tpLH tpHL FROM (INPUT) TO (OUTPUT) A or B Y TEST SN54ASC02 CONDITIONS CL ~ 0 tPLH tpHL A or B Y dtPLH dtpHL A or B Y FROM (INPUT) TO TEST (OUTPUT) CONDITIONS A or 8 Y CL ~ 1 pF SN74ASC02 MIN TYP* MAX MIN TYP* MAX 0.5 0.8 1.4 0.5 0.8 1.2 0.3 0.7 1.6 0.3 0.7 1.5 0.9 1.4 2.9 0.9 1.4 2.6 0.6 1.2 2.4 0.6 1.2 2.2 0.3 0.6 1.5 0.3 0.6 1.4 0.2 0.5 0.9 0.3 0.5 0.8 UNIT ns ns ns/pF N0240LH .PARAMETERt tPLH tpHL tpLH tpHL dtpLH dtpHL A or B A or B CL Y CL ~ ~ 0 1 pF Y SN54ASC02 SN74ASC02 MIN TYP* MAX MIN TYP* MAX 0.5 0.7 1.3 0.5 0.7 1.2 0.2 0.6 1.4 0.2 0.6 1.3 0.7 0 ..5 1.2 1 2.4 2.1 0.8 1.2 1 0.2 0.5 1.2 0.5 1.1 0.2 0.4 0.7 0.5 0.3 0.2 2.2 1.9 0.4 0.6 UNIT ns ns ns/pF tPropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf ~ 3 ns (10% and 90%). tpLH '" propagation delay time, low-to-high-Ievel output tPHL '" propagation delay time, high-to-Iow-Ievel output d tpLH '" change in tpLH with load capacitance il tpHL ;::: change in tpHL with load capacitance • ... fI) CI) CI) .c en *Typical values are at VCC ~ 5 V, TA ~ 25°C. ... CO CO DESIGN CONSIDERATIONS C Refer to Section 7. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-9 II ...o I» I» en :::r CD CD ... o 4-10 SN54ASC04, SN74ASC04 INVERTERS 02939. AUGUST 1986 SystemCell™ 2-j.lm INTERNAL STANDARD CELL • Choice of Seven Performance Levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation OVllr V CC Rangll of 2Vt06V • Dependable Texas Instruments Quality and Reliability logic symbol A~Y FUNCTION TABLE INPUT OUTPUT A Y positive logic equation H L L H Y=A description The SN54ASC04 and SN74ASC04 are CMOS inverter standard cells implementing the equivalent of onesixth of a SN54LS04 or SN74LS04. The standard-cell library contains seven physical implementations providing the custom IC designer a choice of seven performance levels for optimizing designs. Each of the options are designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: II ... FEATURES NETLIST TYPICAL HDL LABEL DELAY RELATIVE CELL AREA CL - 1 pF TO NA210LH IV110LH 1.7 ns 0.75 IV120LH 1.1 ns IV130LH 0.9 ns 1 1.25 0.8 ns 1.5 CELL NAME IV140LH Label: IV1 nOLH A.Y; 1I(160LH 0.7 ns 2 IV180LH !V101LH 0.6 ns 2.3 ns 2.5 4.5 Label: IV101 LH A.V; U) Q) Q) .c o ca ca ... o The SN54ASC04 is characterized far operation over the full military temperature range of - 55°C to 125°C. The SN74ASC04 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTIOI DATA do......is .ont.in inform.tion CURlnt I. ·at publicldiaD date. PrDducts conform tD specificatio•• par tINt tar....f T.... InstrullllOlS ~~=i~·r:~~; ~~:~i:; :.:o:::::~::.s not TEXAS ~ INSTRUMENTS POST OFF1CE BOX 655012 • DALLAS, TeXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-11 SN54ASC04, SN74ASC04 INVERTERS electrical characteristics PARAMETER VT Input threshold voltage . Vee I SN74Ase04 TA lee Supply current Input capacitance epd Vee - 5 V, I SN54Ase04 ej Equivalent power Vee - 5 V, Vee - 5 V, dissipation capacitance TA = V, VI = ISN74Ase04 TA lee ej Input capacitance Vee - 5 V, TA - 25°e Equivalent power Vee - 5 V, tr - tf - 3 ns, dissipation capacitance TA = = VT TA Supply current Input capacitance epd = Equivalent power dissipation capacitance TA = VT Input threshold voltage ej epd ISN54Ase04 I SN74Ase04 pF 2.2 5 V, Vee - 4.5 V to 5.5 V, TA = MIN to MAX = Input capacitance Vee Equivalent power Vee - 5 V, dissipation capacitance TA = IV180LH TVP 3 ns, 5 V, TA MAX 2.2 247 V 306 18.4 pF 2.39 3.16 pF IV101LH 25°e MAX 2.2 33.2 = 25°e tr - tf - 3 ns, 25°e TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 UNIT V 553 VI - Vee or 0, TA nA 1 TYP = UNIT 0.74 TEST CONDITIONS = MAX 14.8 tf nA pF 25°e 25°e Vee 11.4 1.61 VI - Vee or 0, tr V 190 1.29 IV160LH = UNIT 0.49 TVP TA - 25°e PARAMETER lee Supply current TA MAX 2.2 0.4 MIN to MAX Vee.- 5 V, 5 V. Vee IV140LH TYP 163 VI - Vee or 0, TEST CONDITIONS I SN74Ase04 lee MAX 2.2 25 0 e 25°e Vee = 5 V, Vee - 4.5 V to 5.5 V, ej pF 9.76 I SN54Ase04 Input threshold voltage pF 0.8 MIN to MAX PARAMETER 7.85 nA 0.44 IV130LH = V 131 0.24 TYP Supply current TA UNIT 0.12 TEST CONDITIONS Input threshold voltage MAX 2.2 6.32 25°e ISN54Ase04 IV120LH TVP 105 Vee or 0, TA - 25°e tr - tf - 3 ns, Vee = 5 V, Vee - 4.5 V to 5.5 V, MAX 2.2 VT epd 4-12 TYP TA - 25°e = 4.5 V to 5.5 = MIN to MAX PARAMETER II IVll0LH TEST CONDITIONS nA 0.13 pF 7.22 pF SN54ASC04. SN74ASC04 INVERTERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) IV110LH PARAMETERt tpLH tPHL tpLH tpHL AtPLH AtpHL FROM (INPUT) A A A TO (OUTPUT) TEST CONDITIONS Y CL CL Y ~ ~ 0 1 pF Y SN54ASC04 MIN SN74ASC04 TYP* O.B MAX MIN TYP* MAX 1.1 0.6 O.B 1.1 0.4 1.1 0.9 1.4 3.4 0.5 0.9 1.4 1.2 1.B 3.2 0.9 1.6 3.2 1 1.6 2.9 0.5 1 2.3 0.5 1 2.1 0.5 O.B 1.B 0.5 O.B 1.6 MAX MIN 0.4 TYP* 0.6 1.1 0.4 0.6 1 0.2 0.6 1.2 0.2 0.6 1.1 O.B 1.2 2.1 O.B 1.2 2 0.5 1 2.1 0.6 1 2 0.3 0.5 1.1 0.3 0.5 1 0.3 0.5 0.9 0.3 0.5 0.9 0.6 1.B UNIT ns ns ns/pF IV120LH PARAMETERt tpLH tPHL tPLH tpHL AtPLH AtPHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A A Y CL Y .CL A Y FROM (INPUT) TO (OUTPUT) A Y A Y A Y ~ ~ 0 1 pF SN54ASC04 MIN SN74ASC04 TYP* MAX UNIT ns ns ns/pF IV130LH PARAMETERt tpLH tpHL tPLH tpHL AtPLH AtPHL II .... en TEST CONDITIONS CL CL ~ ~ 0 1 pF SN54ASC04 SN74ASC04 MIN 0.4 TYP* 0.6 MAX 1.1 MIN 0.4 TYP* 0.6 MAX 1 0.03 0.3 0.9 O.OB 0.3 O.B 0.7 1 1.B 0.7 1 1.7 0.2 0.7 1.5 0.3 0.7 1.4 0.2 0.4 O.B 0.2 0.4 0.7 0.2 0.4 0.7 0.2 0.4 0.6 TYP* 0.5 MAX MIN 0.9 0.4 0.9 0.1 0.6 0.4 0.9 1.5 0.3 0.7 1.5 0.2 0.3 0.6 0.2 0.3 0.6 UNIT Q) Q) .c ns ns f/) ....asas C ns/pF IV140LH PARAMETERt tpLH tPHL tpLH tpHL AtpLH AtPHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y A Y A Y CL CL ~ ~ 0 1 pF SN54ASC04 MIN 0.4 0.1 SN74ASC04 TYP* 0.5 MAX 0.6 0.4 0.9 O.B 1.4 0.3 0.7 1.4 0.2 0.3 0.6 0.2 0.3 0.6 0.9 UNIT ns ns ns/pF tpropagation delay ti~es are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf ~ 3 ns (10% and 90%). tpLH :;;;;; propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output AiPLH '" change in tpLH with load capacitance AtPHL '" change in tpHL with load capacitance Typical values are at VCC ~ 5 V, T A ~ 25 ·C. * ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-13 SN54ASC04. SN74ASC04 INVERTERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) IV160LH PARAMETERt tpLH tpHL tpLH tpHL Ll.tpLH Ll.tPHL FROM TO TEST (INPUT) (OUTPUTI CONDITIONS A A Y CL = 0. CL = 1 pF Y A Y FROM (INPUT) TO TEST (OUTPUTI CONDITIONS SN74ASC04 SN54ASC04 MIN TYP* MAX MIN 0..3 0..5 0..8 0..3 0..0.9 0..5 0..3 0..7 0..8 1.3 TYP* 0..5 MAX 0..1 0..3 0..5 0..7 0..8 .1.2 0..8 0..2 0..6 1.3 0..3 0..6 1.2 0..1 0..2 0..5 0..1 0..2 0..5 0..1 0..2 0..5 0..1 0..2 0..5 UNIT ns ns ns/pF IV180LH PARAMETERt tpLH tpHL • C tpLH tPHL Ll.tpLH Ll.tpHL A A Y CL Y CL = = 0. 1 pF A Y FROM (INPUT) TO TEST (OUTPUTI CONDITIONS SN54ASC04 SN74ASC04 MIN TYP* MAX MIN 0..4 0..8 0..3 TYP* 0..4 MAX 0..3 0..0.8 0..3 0..8 0..1 0..3 0..7 0..4 0..6 1.1 0..4 0..6 1.1 0..2 0..1 0..5 1.1 0..2 0..5 1 0..2 0..4 0..1 0..2 0..4 0..1 0..2 0..4 0..1 0..2 0..4 TYP* 2.3 MAX MIN 5 1.3 1 2 4.6 1 2 4.1 1.3 2.4 5.2 1.4 2.4 4.7 0..7 UNIT ns ns ns/pF IV101LH .... CI) CI) PARAMETERt en tpLH ::r tpHL .~ tPLH .... A A Y Y CL CL = 0. = 1 pF SN74ASC04 SN54ASC04 MIN 1.3 TYP* 2.3 MAX 4.5 1 2.1 4.9 1.1 2.1 4.4 60. 120. 230. 60. 120. 20.0. 30. 110. 290. 50. 110. 280. tPropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output Ll.tpLH '" change in tPLH with load capacitance Ll.tpHL '" change in tPHL with load capacitance Typical values are at VCC = 5 V, TA = 25°C. = tf = tpHL (I) Ll.tPLH Ll.tpHL A Y * DESIGN CONSIDERATIONS Refer to Section 7. 4-14 TEXAS ..., INS1RUMENTS POST OFFICE BOX 656012 • DALLAS, TEXAS 75265 UNIT ns ns ps/pF 3 ns (10.% and 90.%1- SN54ASC08. SN74ASC08 2·INPUT POSITIVE·AND GATES D2939. AUGUST 1986 SystemCell™ 2'/lm INTERNAL STANDARD CELL logic symbol • Choice of Four Performance levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability :==O--Y FUNCTION TABLE INPUTS OUTPUT A B Y positive logic equations H H H Y = A.B=A+B L X L X L L description The SN54ASC08 and SN74ASC08 are 2·input positive-AND gate CMOS standard cells each implementing the equivalent of one-fourth of an SN54LS08 or SN74LS08. The standard-cell library contains four physical implementations providing the custom IC designer a choice between four performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: II ... FEATURES NETLIST CELL NAME TYPICAL HDL LABEL DELAY CELL AREA TO NA210LH 2.1 ns Label: AN2nOLH A.B.Y; AN240LH Q) Q) CL - 1 pF AN210LH AN220LH t/) RELATIVE AN260LH ..&: (J) 1.5 1.9 ns 1.75 2.1 ns 2.25 1.7 ns 3 ... CO CO C The SN54ASC08 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC08 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA documents contain information current as of publication date. Products conform to specifications per the terms of Texas Instruments ~~~~::~~i~8t::1~1~ ~!:~:~ti:f :IIO::~:~:t:~s~S not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012. DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-15 SN54ASCOB. SN74ASCOB 2·INPUT POSITIVE·AND GATES electrical characteristics PARAMETER Vee ~ 5 V, TA - 25°e Vee - 4.5 V to 5.5 V, VI - Vee or 0, Input threshold voltage lee Supply current ei Input capacitance Vee - 5 V, TA - 25°e Equivalent power VCC - 5 V, TA ~ 25°C tr - tf - I SN54Ase08 I SN74Ase08 ~ TA dissipation capacitance PARAMETER 3 ns, Vee ~ 5 V, TA Vee - 4.5 V to 5.5 V, VI - Vee or 0, ~ 25°e ei Input capacitance Vce ~ 5 V, TA ~ 25°e Equivalent power Vee - 5 V, t r - tf - 3 ns, dissipation capacitance TA ~ ~ V 228 13.6 pF 0.9 1.2 pF AN260LH MAX 2.2 TYP MAX 2.2 MIN to MAX 381 17.2 UNIT V 286 25°C nA 0.13 AN240LH Supply current UNIT 0.13 TYP Input threshold voltage MAX 2.2 11.6 lec TA TYP 194 TEST CONDITIONS II SN54Ase08 SN74Aseos AN220LH MAX 2.2 MIN to MAX VT epd :.I TYP VT epd III AN210LH TEST CONDITIONS 22.S nA 0.13 0.26 pF 2.32 3.0S pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) AN210LH c PARAMETERt Q) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS r+ Q) tPLH en tPHL CD CD tPHL LltpLH UI LltpHL ::r A or B V A or B V tpLH r+ A or B ~ CL eL ~ a 1 pF Y SN54Aseos Typt MAX SN74ASCOS TYP' MAX 0.6 1.2 2.S 0.6 1.2 2.5 0.8 1.3 2.8 O.S 1.3 2.6 MIN MIN 1.1 2.2 5 1.2 2.2 4.6 1.1 1.9 4.2 1.1 1.9 3.S 0.5 1 2.3 0.5 1 2.1 0.2 0.6 1.5 0.3 0.6 1.3 SN54ASC08 Typt MAX MIN UNIT ns ns ns/pF AN220LH PARAMETERt FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A or B Y MIN 0.7 1.4 3.3 O.S 1.4 3 tpHL O.S 1.5 3.1 0.9 1.5 2.S tpLH 1 2 4.4 1.1 2 4 1 1.8 3.9 1.1 1.8 3.5 0.2 0.5 1.2 0.2 0.5 1.1 0.1 0.3 0.9 0.2 0.3 O.S tpLH A or B Y A or B Y tpHL LltPLH LltpHL ~ eL CL = a 1 pF tPropagation delay times are measured from the 44% point of VI to the 44% point of tpLH == propagation delay time, low-to-high-Ievel output tpHL == propagation delay time, high-to-Iow-Ievel output ~tpLH ~ change in tpLH with load capacitance 8tpHL == change in tpHL with load capacitance 'Typical values are at Vee ~ 5 V, TA ~ 25°e. 4-16 SN74ASC08 Typt MAX TEXAS Vo "'11 INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 UNIT ns ns ns/pF with tr == tf == 3 ns (10% and 90%). SN54ASCOB, SN74ASCOB 2-INPUT POSITIVE-AND GATES AN240LH PARAMETERt FROM (INPUT) TO (OUTPUT) tPLH tpHL A or B Y tPLH tpHL A or B Y AtPLH AtPHL TEST CONDITIONS CL CL =0 = 1 pF A or B Y FROM (INPUT) TO (OUTPUT) CONDITIONS AorB Y CL = 0 SN54ASCOB MIN 0.9 1 SN74ASCOB TYP* 1.9 1.B MAX MIN 4.3 3.7 2.2 2 5 4.4 1 1.1 1.2 TYP* 1.9 1.B 2.2 0.3 0.2 0.7 0.7 1.2 0.1 2 0.3 0.1 0.2 1.1 1.1 0.1 0.1 MAX 3.B 3.4 UNIT ns 4.4 4 ns 0.7 0.6 nsipF AN260LH PARAMETERt tpLH tPHL tPLH tpHL AtPLI;1 AtPHL A or B y A or B Y TEST CL = 1 pF SN54ASCOB TYP* MAX 1.5 3.5 1.5 3 MIN 0.7 0.9 O.B 1 0.1 0.03 SN74ASCOB MIN O.B 1 TYP* 1.5 1.5 MAX 3.1 1.7 1.7 2.9 3.5 3.2 1.7 1.7 3.9 3.4 0.9 1 0.2 0.5 0.5 0.1 0.2 0.4 0.04 0.16 0.4 0.16 UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Va with tr = tf = 3 ns (10% and 90%). tPLH .. propagation delay time, low-to-high-Ievel output tPHL .. propagation delay time, high-to-Iow-Ievel output AtpLH .. change in tpLH with load capacitance AtpHL .. change in tpHL with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. DESIGN CONSIDERATIONS • ... U) CD CD .c en ... Refer to Section 7 All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. TEXAS • INSTRUMENTS POST OFFICE BOX 666012 • DALLAS. TEXAS 75285 CO CO o 4-17 o I» .... I» en :r (1) (1) Cri 4-18 SN54ASC10, SN74ASC10 3·INPUT POSITIVE·NAND GATES 02939. AUGUST 1986 SystemCelrM 2·",m INTERNAL STANDARD CELL logic symbol • Choice of Four Performance Levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • .Dependable Texas Instruments Quality and Reliability FUNCTION TABLE INPUTS B C H H H L L X X H X L X H X X l Ii positive logic equation y = ABC = OUTPUT A A+B+C V description The SN54ASC1 0 and SN74ASC1 0 are 3-input positive-NAND gate CMOS standard cell, each implementing the equivalent of one-third of an SN54LS 10 or SN7 4LS 10. The standard-cell library contains four physical implementations providing the custom IC designer a choice between four performance levels for optimizing design. The four options are designated and called from the engineering workstation input using the following cell names to develop lal:Jels for the design netlist: ...en FEATURES CELL NAME NETLIST TYPICAL RELATIVE HDL LABEL DELAV CELL AREA CL - 1 pF TO NA210LH .c 2.2 ns 1.25 en 1.5 ns 2 2.5 3.5 ...caca C NA310lH NA320lH NA330LH II label: NA3nOlH A.B,C,V; NA340lH 1.3 ns 1.1 ns Q) Q) The SN54ASC10 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC10 is. characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA d••umant••ontain information currant as af publication date. Products conform to specifications par the terms of Texas Instrumel'!ts =~:~~i~ai~:1~1. ~:~::i:r :r~o:::::~:~~s not. Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4·19 SN54ASC10, SN74ASC10 3-INPUT POSITIVE-NAND GATES electrical characteristics PARAMETER VT I SN54ASC10 I SN74ASC10 2.2 VCC = 5 V, TA = 25°C VCC = 4.5 V to 5.5 V, VI = VCC or 0, Supply current Ci Input capacitance . VCC - 5 V, Equivalent power VCC.- 5 V, TA = 25°C dissipation capacitance NA330LH Input threshold voltage ICC . Supply current VCC = 5 V, TA = 25°C VCC = 4.5 V to 5.5 V, . VI = VCC orO, TA = MIN to MAX Ci Input capacitance VCC - 5 V, TA - 25°C Equivalent power VCC = ..5 V, tr = tf = 3 ns, dissipation capacitance TA = 25°C I , 0.5 TYP 15.3 2.2 nA 0.26 pF 0.94 pF NA340LH MAX UNIT V 255 9.78 VT MAX 2.2 0.12 TA - 25°C tr - tf = 3 ns, TEST CONDITIONS ISN54ASC10 SN74ASC10 NA320LH TYP 163 TA = MIN to MAX PARAMETER Cpd • Input threshold voltage ICC Cpd NA3101.!'I TVP MAX TEST CONDITIONS ryp MAX 2.2 344 V 435 20.6 UNIT 26.1 nA 0,39 0.52 pF 1.41 1.86 pF switching characteristics dver recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) NA310LH C PARAMETERt DI r+ tpLH DI (/) tpHL :::r tpLH r+ ~tpLH (1) (1) tPHL en ~tpHL FROM (INPUT) TO (OUTPUT) TEST CONDITIONS A,B,C Y CL = 0 A,B,C Y CL =1 pF A,B,C Y SN54ASC10 SN74ASC10 MIN TYP' MAX MIN 0.8 0.6 0.5 0.7 1.9 2.1 TYP* 0.8 MAX 0.7 0.6 0.7 1.8 1.7 1 2 4.8 1.1 2.4 5.B 1.3 2 2.4 4.4 1.1 0.5 1.2 3.1 0.5 1.2 2.9 0.6 1.4 3.8 0.7 1.4 3.2 5.1 UNIT ns ns ns/pF NA320LH PARAMETERt tpLH tpHL tpLH tpHL ~tpLH ~tpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A,B,C A,B,C A,B,C Y CL = 0 Y CL = 1 pF Y SN54ASC10 SN74ASC10 MIN TYP* MAX MIN TYP* MAX 0.5 0.9 1.5 0.6 0.9 1.5 0.3 0.8 1.7 0.4 0.8 1.6 0.8 0.6 1.4 2.8 0.9 1.4 2.6 1.5 3.4 0.8 1.5 3.1 0.3 0.5 1.3 0.3 0.5 1.1 0.3 0.7 1.B 0.4 0.7 1.5 t Propagation 'de)ay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output AtPLH == change in tpLH with load capacitance AtPHL " change in tpHL with load capacitance tTypical values are at VCC = 5 V, TA = 25°C. 4-20 TEXAS ... INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 =3 UNIT ns ns ns/pF ns (10% and 90%). SN54ASC1D, SN74ASC1D 3·INPUT POSITIVE·NAND GATES NA330LH PARAMETERt tpLH tpHL tpLH tpHL AtPLH AtpHL FROM (INPUT) TO TEST (OUTPUT) CONOITIONS A,B,C Y A,B,C Y A,B,C Y =0 CL CL = 1 pF SN54ASC10 SN74ASC10 MAX MIN 0.8 1.5 1.7 0.7 0.8 1.2 0.6 MIN TYP* 0.5 0.3 TYP* MAX 0.6 0.8 1.5 0.5 0.8 1.6 2.3 0.8 1.2 2.2 1.3 2.9 0.7 1.3 2.6 0.2 0.4 0.8 0.2 0.4 0.8 0.2 0.5 1.2 0.2 0.5 1 MAX 0.5 TYP* 0.8 1.5 MIN 0.5 TYP* 0.8 MAX 1.4 0.3 0.7 1.6 0.3 0.7 1.5 0.6 1.1 2.1 0.7 1.1 2 0.4 1.1 2.5 0.5 1.1 2.2 0.2 0.3 0.7 0.2 0.3 0.6 0.2 0.4 0.9 0.2 0.4 0.8 UNIT ns ns nsipF NA340LH PARAMETERt tpLH tpHL tpLH tpHL AtpLH AtPHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A,B,C Y A,B,C Y A,B,C Y CL CL = = 0 1 pF SN54ASC10 MIN SN74ASC10 tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf tpLH .. propagation delay time, low·to-high-Ievel output tpHL " propagation delay time, high-to-Iow-Ievel output AtPLH " change in tpLH with load capacitance AtpHL '" change in tpHL with load capacitance Typical values are at VCC = 5 V, TA = 25°C. = UNIT ns ns nsipF 3 ns (10% and 90%). * II ... II) CD CD .c til DESIGN CONSIDERATIONS ... ctI ctI C Refer to Section 7 All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-21 c Q) .... Q) en :r (T) (T) .... (II SN54ASC11, SN74ASC11 3-INPUT POSITIVE-AND GATES 02939. AUGUST 1986 SystemCeUTM 2-/Lm INTERNAL STANDARD CELL logic symbol • Choice of Four Performance Levels • Specified for Operation Over Vee Range of 4.5 V to 5.5 V • Functional Operation Over Vee Range of 2Vt06V • }-Y FUNCTION TABLE INPUTS Dependable Texas Instruments Quality and Reliability B C Y H H X H H X X L L X L L L positive logic' equation Y = ABC = X X A+B+C OUTPUT A L description The SN54ASC11 and SN74ASC11 are 3-input positive-AND gate CMOS standard cells implementing the equivalent of one-third of an SN54LS11 or SN74LS11. The standard-cell library contains four physical implementations providing the custom IC designer a choice between four performance levels for optimizing designs. The four options are designated and called from the engineering workstation input using the _ following cell names to develop labels for the design netlist: ... ... FEATURES NETLIST CELL NAME TYPICAL DELAY CELL AREA CL - 1 pF TO NA210LH AN310LH 2.4 ns 1.75 AN320LH 2.2 ns 2 2.5 ns 2.5 1.9 ns 3.5 AN340LH HDL LABEL fI) RELATIVE Label: AN3nOLH A.B,C, Y; AN360LH Q) Q) .c en ...caca o The SN54ASC11 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC11 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. 8. PRODUCTION DATA documonts .ontoin information current of publication data. Products conform to specificatioRs per the terms of Texl. Instruments ::~::~~i~·r::I~'i ~!::i:~:: :1~O:::::t::'· not Copyright @ 1986. Texas Instruments Incorporated TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-23 SN54ASC11. SN74ASC11 3-INPUT POSITIVE-AND GATES electrical characteristics PARAMETER VT I SN54ASC11 SN74ASC11 I Supply current Ci Input capacitance Cpd VCC = 5 V, VCC - 4.5 V to 5.5 V, Input threshold voltage ICC = TA Equivalent power dissipation capacitance TA = TA TYP = I SN54ASC11 I SN74ASe11 t r - tf - 3 ns, 25°C VCC = 5 V, VCC - 4.5 V to 5.5 V, TA = MIN to MAX TA 2.2 V 249 pF 1.06 1.56 pF AN360LH MAX 2.2 25°C Supply current Vee - 5 V, TA - 25°C Equivalent power Vee - 5 V, t r - tf - 3 ns, dissipation capacitance TA TYP 25°C MAX 2.2 311 18.7 VI - VCC or 0, Input capacitance 15 nA 0.12 AN340LH = UNIT 0.12 TYP Ci = MAX 13.3 TA - 25°C ICC epd TYP 221 TEST CONDITIONS Input threshold voltage AN320LH MAX 2.2 25°C VI - VCC or 0, MIN to MAX VCC - 5 V, VCC - 5 V, PARAMETER VT AN310LH TEST CONDITIONS UNIT V 438 26.3 nA 0.12 0.26 pF 2.59 4.08 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) AN310LH c PARAMETERt D) r+ tplH tpHl D) (f) -:r tplH CD CD ~tplH (I) ~tpHl tpHl r+ FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A,B,e A,B,e A,B,e Y Cl = 0 el = 1 pF Y Y SN54ASC11 SN74ASC11 MIN TYP* MAX MIN 0.8 3.8 0.8 0.9 1.6 1.6 MAX 1 TYP* 1.6 1.6 3.3 1.3 2.6 6 1.4 2.6 5.4 3.3 3 1.2 2.2 4.7 1.3 2.2 4.3 0.5 1 2.3 0.5 1 2.1 0.2 0.6 1.5 0.3 0.6 1.4 UNIT ns ns ns/pF AN320LH PARAMETERt tPlH tpHl tplH tpHl ~tplH ~tpHl FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A,B,e A,B,e A,B,e Y Cl Y el = = 0 1 pF SN54ASC11 TYP* MAX MIN TYP* MAX 0.8 1.8 4.2 0.9 1.8 3.8 0.9 1.6 3.5 0.9 1.6 3.2 1.1 2.3 2 5.4 4.4 1.2 1.2 2.3 4.8 2 4 0.5 0.4 1.3 0.3 0.5 1.1 0.9 0.1 0.4 0.8 1.1 0.2 Y SN74ASC11 MIN 0.1 UNIT ns ns ns/pF t Propagation delaY times are measured from the 44% point of VI to the 44% point of Va with tr = tf = 3 ns 110% and 90%). tplH '" propagation delay time, low-to-high-Ievel output tpHl '" propagation delay time, high-to-Iow-Ievel output .6tpLH ~tpHL = change in tpLH with load capacitance .. change in tPHL with load capacitance = 5 V, TA = 25°C. *Typical values are at Vee 4-24 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASCll, SN74ASCll 3-INPUT POSITIVE-AND GATES AN340LH PARAMETERt tpLH tpHL tpLH tpHL dtpLH dtpHL FROM TO TEST (INPUT) IOUTPUT) CONDITIONS A,B,G y A,B,G y A,B,G Y GL GL ~ ~ 0 1 pF SN54ASC11 Typt MAX MIN SN74ASC11 Typt MAX MIN 1.1 2.3 5.6 1.1 2.3 4.9 1.1 2.1 4.6 1.1 2.1 4.1 1.2 2.6 6.3 1.3 2.6 5.6 1.2 2.3 5.2 1.3 2.3 4.7 0.1 0.3 0.6 0.1 0.3 0.7 0.1 0.2 0.7 0.1 0.2 0.6 SN54ASC11 Typt MAX MIN UNIT ns ns nsipF AN360LH PARAMETERt tpLH tpHL tpLH tpHL dtpLH dtpHL FROM TO TEST (INPUT) IOUTPUT) CONDITIONS A,B,G Y A,B,G Y A,B,G Y GL GL ~ ~ 0 MIN SN74ASC11 Typt MAX 0.6 1.6 4.3 0.9 1.6 3.5 0.9 0.9 1.6 3.6 1.6 3.3 4.3 1 2 4.6 1 2 1 1.6 3.9 1 1.6 3.6 0.1 0.08 0.2 0.5 0.1 0.2 0.5 0.2 0.5 0.08 0.2 0.4 1 pF UNIT ns ns nsipF t Propagation delay times are measured from the 44% pOint of VI to the 44% point of Vo with tr ~ tf ~ 3 ns 110% and 90%). tPLH '" propagation delay time, low-to-high-Ievel output tPHL '" propagation delay time, high-to-Iow-Ievel output dtpLH '" change in tpLH with load capacitance dtpHL '" change in tpHL with load capacitance t Typical values are at VGG ~ 5 V, T A ~ 25°G. DESIGN CONSIDERATIONS II ... en Q) Q) .c en ... CO CO Refer to Section 7 All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 C 4-25 • c Q) r+ Q) en :r CD CD r+ VI 4-26 SN54ASt20. SN74ASC20 4·INPUT POSITIVE·NAND GATES 02939, August 1986 SystemCell™ 2-j.lm INTERNAL STANDARD CELL • Choice of Three Performance Levels • Specified for Operation Over Vec Range of • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability logic symbol 5 V to 5.5 V FUNCTION TABLE positive logic equation Y OUTPUT INPUTS = A.B.C.D = A+B+C+D A B C D Y H H H H L X X X l X X X l H X X X X X X L L H H H description The SN54ASC20 and SN74ASC20 are four-input positive-NAND gate CMOS standard cells, each implementing the equivalent of one-half of an SN54LS20 or SN74LS20. The standard·celilibrary contains three physical implementations to provide the custom IC deSigner a choice from three performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: ' II FEATURES CEll NAME NETLIST TYPICAL RELATIVE HDllABEl DELAY CEll AREA Cl - 1 pF TO NA210lH NA410LH NA420LH Label: NA4nOLH A,B,C,D, Y; NA430lH 2.6 hs 1.5 1.8 ns 2.5 1.5 ns 3.75 The SN54ASC20 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC20 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA documents contain information currant as of publication data. Products conform fa specifications par the terms of Taxas Instruments =::~:~~i~a{::,-::Ji ~!:~::i:; :,~o::;::::£::.s not Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DAlLAS;TEXAS 75265 4-27 SN54ASC20, SN74ASC20 4·INPUT POSITIVE·NAND GATES electrical characteristics PARAMETER VT Cj Cpd I SN54ASC20 TA = 25°C VCC = 5 V, VCC - 4.5 V to 5.5 V, VI - VCC or 0, I SN54ASC20 TA Input threshold voltage ICC Supply current = Equivalent power dissipation capacitance TA = 312 11.2 TA = 25°C 18.7 0.27 pF 0.5 0.96 pF 25°C NA430LH I SN54ASC20 I SN74ASC20 TA = MIN to MAX = TYP 2.2 Input threshold voltage ICC Supply current Cj Input capacitance VCC = 5 V, TA = 25°C Equivalel"!t power VCC - 5 V, TA = 25°C t r - tf - 3 ns, TA nA 0.12 tr - tf - 3 ns, VCC = 5 V, VCC - 4.5 V to 5.5 V, UNIT V 187 TEST CONDITIONS dissipation capacitance MAX 2.2 VT Cpd NA420LH TYP 2.2 MIN to MAX VCC = 6 V, VCC - 5 V, Input capacitance PARAMETER II NA410LH . TYP MAX TEST CONDITIONS 25°C MAX V 441 VI - VCC or 0, UNIT 26.4 nA 0.4 pF 1.46 pF switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) NA410LH PARAMETERt tpLH FROM TO TEST liN PUT! (OUTPUT! CONDITIONS A,B,C,D Y A,B,C,D Y tpHL tpLH tPHL <1tpLH <1tpHL A,B,C,D CL CL = = 0 1 pF Y SN74ASC20 SN54ASC20 MIN 0.8 TYP* 1.1 MAX 2 MIN 0.8 TYP* 1.1 MAX 1.9 0.6 1.1 2.7 0.6 1.1 2.4 1.3 2.4 5.7 1.3 2.4 5.2 1.4 2.9 7.5 1.5 2.9 6.5 0.5 1.3 3.9 0.5 1.3 3.5 0.8 T.8 4.8 0.8 1.B 4.1 MAX MIN TYP* UNIT ns ns nsipF NA420LH PARAMETERt tpLH tpHL tpLH tpHL <1tpLH <1tPHL 4-28 FROM TO TEST liN PUT! (OUTPUT) CONDITIONS A,B,C,D Y CL = 0 A,B,C,D Y A,B,C,D Y CL = 1 pF TEXAS SN54ASC20 SN74ASC20 MIN TYP* 0.6 1 1.B 0.7 1 1.7 0.5 0.9 1 2.4 0.5 2.1 1.6 3.3 1 1 1.6 1.9 4.6 1 1.9 4 MAX 3 O.B 0,3 0.6 1.5 0.3 0.6 1.4 0.4 O.B 2.3 0.4 0.8 2 ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 UNIT ns ns nSipF SN54ASC20, SN74ASC20 4·INPUT POSITIVE·NAND GATES NA430LH PARAMETERt tpLH tpHL tpLH tPHL dtpLH dtpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A,B,C,D Y CL = 0 A,B,C,D Y A,B,C,D Y CL = SN54ASC20 1 pF SN74ASC20 MAX MIN 0.6 TYP* 1 1.9 0.6 1 1.8 0.4 1 2.3 0.5 1 2.1 0.8 1.4 2.9 0.9 1.4 2.7 0.7 1.6 3.9 0.8 1.6 3.4 MIN TYP* MAX 0.2 0.4 1.1 0.2 0.4 1 0.3 0.6 1.6 0.3 0.6 1.3 t Propagation delay times are measured from the 44% point of VI to the 44% point of Va with tr tpLH '" propagation delay time, low-to-high-Ievel output tPHL '" propagation delay time, high-to-Iow-Ievel output = tf = UNIT ns ns ns/pF 3 ns (10% and 90%1. .6.tpLH ;;;;;; change in tpLH with load capacitance dtpHL '" change in tPHL with load capacitance * Typical values are at VCC = 5 V, TA = 25 ·C. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. a til +" Q) Q) .c: en ca ca +" o TEXAS • INSTRUMENTS POST OFFICE BOX 6550~2 • DALLAS. TEXAS 75265 4-29 III 4-30 SN54ASC21, SN74ASC21 4·INPUT POSITIVE·AND GATES D2939. AUGUST 1986 SystemCelllM 2'",m INTERNAL STANDARD CELL logic symbol • Choice of Four Performance Levels • Specified for Operation Over Vee Range of 4.5 V to 5.5 V • Functional Operation Over Vee Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability FUNCTION TABLE INPUTS =-=-=-= Y = A.B·C·D = A+B+C+D OUTPUT C H D H Y H B H L X L L X X X L X X X X X X L L A positive logic equations X X H L L description a... The SN54ASC21 and SN74ASC21 are 4-input positive-AND gate CMOS standard-cells implementing the equivalent of one-half of an SN54LS21 or SN74LS21. The standard-cell library contains four physical implementations providing the custom IC designer a choice between four performance levels for optimizing designs. The four options are designated and called from the engineering workstation input using the following Gell names to develop labels for the design netlist: en CI) CI) .s:: FEATURES CELL NAME TYPICAL NETLIST HDL LABEL AN410LH AN420LH AN440LH Label: AN4nOLH A.B.C.D.Y; AN460LH fJ) RELATIVE DELAY CELL AREA CL - 1 pF TO NA210LH 2.6 ns 2 2.5 ns 2.25 2.7 ns 2.75 2.3 ns 4 ... ~ ~ C The SN54ASC21 is characteri2!ed for operation over the full military'temperature range of - 55 DC to 125 DC. The SN74ASC21 is characterized for operation from - 40 DC to 85 DC. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA documents contain information current as of publication data. Preducts conform to specifications per the terms of Taxas Instruments ~'::~:~~i;8t::I~'~ ~=::i:; :'~D:::~9t::a~1 not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. !EXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-31 SN54ASC21, SN74ASC21 4-INPUT POSITIVE-AND GATES electrical characteristics VT Input threshold voltage Supply current Ci Cpd II Vec = 5 V, TA=25°C VCC = 4.5 V to 5.5 V, VI = VCC or 0, SN74ASC21 TA = MIN to MAX TA - 25°C Equivalent power VCC = 5 V, tr - tf - 3 ns, dissipation capacitance TA = 25°C I Cpd II = 4.5 VCC V to 5.5 V, SN74ASC21 TA = MIN to MAX 286 pF 1.18 1.72 pF AN460LH AN440LH MAX TYP MAX 2.2 2.2 500 20.9 TA - 25°C Equivalent power VCC ~ 5 V, tr - tf - 3 ns, dissipation capacitance TA = 25°C UNIT V 348 VI = VCC or 0, VCC - 5 V, nA 30 0.12 TYP Input capacitance UNIT , V 0.12 TA = 25°C VCC = 5 V, MAX 2.2 256 TEST CONDITIONS SN54ASC21 TYP 20.9 VCC - 5 V, Input threshold voltage AN420LH MAX 2,2 Input capacitance Supply current __'- Ci TYP SN54ASC21 PARAMETER VT AN410LH TEST CONDITIOt'lS PARAMETER nA 30 0.12 0.27 pF 2.77 4.58 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) AN410LH C ... PARAMETERt en tpHL I» I» tPLH ::r tPLH ('I) ('I) ...en tpHL JltpLH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A,B,C,D Y CL = 0 A,B,C,D Y CL = 1 pF A,B,C,D JltpHL Y SN74ASC21 SN54ASC21 MIN TYP* MAX MIN TYP* MAX 0.9 1.9 4.8 1 1.9 4.2 1 1.7 3.8 1 1.7 3.4 1.4 2.9 7.1 1.5 2.9 6.3 1.3 2.3 5.3 1.3 2.3 4.7 0.5 1 2.4 0.5 1 2.2 0.2 0.6 1.5 0.3 0.6 1.4 SN54ASC21 Typt MAX MIN TYP* MAX UNIT ns ns nSipF AN420LH PARAMETERt tpLH FROM TO TEST (INPUT), (OUTPUT) CONDITIONS A,B,C,D Y CL = 0 tpHL tpLH A,B,C,D Y A,B,C,D Y tpHL JltpLH JltpHL CL = 1 pF MIN SN74ASC21 1 2.1 5.5 1.1 2.1 4.8 1 1.B 4.1 1 1.8 3.7 1.3 2.7 6.7 1.4 2.7 5.9 1.2 2.2 5 1.2 2.2 4.5 0.2 0.6 1.3 0.2 0.6 1.2 0.1 0.4 1 0.1 0.4 0.9 UNIT ns ns nsipF t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tPLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output JltpLH '" change in tpLH with load capacitance JltpHL '" change in tpHL with load capacitance 'Typical values are at VCC = 5 V, TA = 25°C. 4-32 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC21, SN74ASC21 4·INPUT POSITIVE·AND GATES switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) AN440LH PARAMETERt tplH tpHl FROM TO TEST (INPUT) (OUTPUn CONDITIONS A,~,C,D Y Cl = 0 tPlH tpHl A,8,C,D Y AtPlH AtpHl A,8,C,D Y Cl = 1 pF SN54ASC21 Typt MAX MIN SN74ASC21 Typt MAX 1.2 2.7 7.2 MIN 1.3 2.7 6.2 1.1 2.1 5.1 1.2 2.1 4.6 1.4 3 8 1.5 3 6.9 1.2 2.4 5.8 1.3 2.4 5.2 0.1 0.3 0.8 0.1 0.3 0.7 0.1 0.3 0.7 0.1 0.3 0.6 SN54ASC21 Typt MAX MIN UNIT ns ns ns/pF AN460LH PABAMETERt tplH tpHl tplH tPHl AtplH FROM TO TEST (INPUT) (OUTPUn CONDITIONS A,8,C,D A,B,C,D A,B,C,D AtPHl Y Cl Y Cl = = 0 1 pF Y MIN 1 2.3 5.7 0.9 1.1 1.8 2.5 4 6.3 SN74ASC21 Typt MAX 1.1 2.3 5 1 1.8 3.6 2.5 1.1 2 4.5 1.2 1.1 2 5.5 4.1 0.1 0.2 0.6 0.1 0.2 0.5 0.09 0.2 0.5 0.1 0.2 0.5 UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns 110% and 90%). tplH '" propagation delay time, low-to-high-Ievel output tpHL = propagation delay time, high-to-Iow-Ievel output A tplH '" change in tplH with load capacitance AtpHl '" change in tpHl with load capacitance tTypical.values are at VCC = 5 V, TA = 25°C. II ... en CI) CI) ~. en DESIGN CONSIDERATIONS Refer to Section 7 ... CO CO C All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-33 II c .... r.n :::r Q) Q) CD CD .... en 4-34 SN54ASC27, SN74ASC27 3-INPUT POSITIVE-NOR GATES 02939. AUGUST 1986 SystemCell™ 2-j.lm INTERNAL STANDARD CELL logic symbol • Choice of Three Performance Levels • Specified for Operation Over Vec Range of 4.5 V to 5.5 V • Functional Operation Over Vee Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability FUNCTION TABLE INPUTS positive logic equation y = A+B+C = ABC A B H OUTPUT V X C X X H X L X X H L L L L H L description The SN54ASC27 and SN74ASC27 are 3-input positive-NOR gate CMOS standard cells, each implementing the equivalent of one-third of an SN54LS27 or SN74lS27. The standard-cell library contains three physical implementations providing the custom IC designer a choice from three performance levels for optimizing designs. The three options are designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: II ... FEATURES CELL NAME NETLIST TYPICAL RELATIVE HDL LABEL DELAV CELL AREA CL - 1 pF TO NA210LH 3.2 ns 1.25 2.1 ns 2 1.8 ns 2.75 N0310LH N0320LH Label: N03nOLH A,B,e,V; N0330LH U) Q) Q) .c: en ...asas C The SN54ASC27 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC27 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER TEST CONDITIONS N0310LH TYP 2.2 TA = 25°C VT Input threshold voltage Vee = 5 V, .lSN54Ase27 Vee - 4.5 V to 5.5 V, VI - Vee or 0, ICC Supply currentlSN74Ase27 TA = MIN to MAX ej Input capacitance 0.11 Vee - 5 V, TA - 25°C Equivalent power tr - tf - 3 ns, Vee - 5 V, 0.32 Cpd dissipation capacitance TA = 25°C =::=ir:-t::I~Je ~~-::i:; :.r-=:::~!,,::, nat TVP MAX 2.2 156 N0330LH TVP MAX 312 14 UNIT V 2.2 233 9.33 18.7 hA 0.24 0.35 pF 0.56 0.85 pF Copyright © 1986. Texas Instruments Incorporated PRODUCTION DATA documents ....tai. information current as of publication data. Products conform to spacifications par the tarms of Taxas Instruments N0320LH MAX TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-35 SN54ASC27, SN74ASC27 3-INPUT POSITIVE-NOR GATES switching characteri$tics over recommended ranges of supply voltagt and operating free-air temperjlture (unless otherwise noted) N0310LH PARAMETERt tPLH tPHL tpLH tPHL .1tpLH .1tpHL FROM (INPUT) TO TEST (OUTPUTI CONDITIONS A,B,C y CL = 0 A,B,C y CL = 1 pF A.B.C y FROM (INPUT) TO TEST (OUTPUTI CONDITIONS liN64ASC27 MII\!- TV"* MA)!: 0.6 '2.6 1 0.1 1.2 2.1 2 9.5 4 1.3 5.9 2.4 1.4 3 1.2 0:5 6.9 3·9 SN74ASC27 MIN 0.6 0.8 2.2 1.4 TVP* 1 1.2 4 2.4 MAX 2.4 2 8.6 5.2 1.5 0.5 3 1.2 6,3 3.3 UNIT ns ns n~/pF N0320LH PARAMETERt tPLH tpHL • o .... tpLH tPHL .1tpLH .1tpHL A,B,C Y A.B.C Y CL' CL =0 = 1 pF SN64ASC27 TVP* 1 MAX 2.1 0.5 1.1 2.4 1.7 2 5.4 3.5 1.4 0.6 3.4 1.3 1 0.6 A.B.C Y FROM (INPUT) TO (OUTPUTI A.B,C y SN74ASC27 MIN 0.6 0.4 1.6 MIN TVP* 1 1.1 2.4 1.4 1· 1.7 0.7 0.6 0.7 0.4 1.4 0.6 MAX 1.9 1.9 4.9 3.2 3.1 1.4 UNIT ns ns ns/pF N0330LH Q) PARAMETERt Q) en tpLH (I) (I) tPHL tpLH (I) tPHL .1tpLH .1tpHL :r .... A,B,C Y A,B,C Y TEST CONDITIONS CL = CL = 6 1 pF SN64ASC27 MIl\! TVP* MJ!.X 0.6 1 2 1.9 0.4 1 1.1 0.8 2 1.5 4.3 2.9 0.4 0.3 1 0.5 2.3 1.1 t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpLH .. propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to·low-Ievel output .1tpLH '" change in tpLH with load capacitance .1tpHL '" change in tpHL with load capacitance Typical values are at VCC = 5 V, T A = 25 ·C. SN74ASC27 MIN TVP* MAX (j.6 1 1.8 1 0.5 1.8 1.2 2 3.9 0.8 0.5 0.3 1.5 1 0.5 2.7 2.1 0.9 UNIT ns ns ns/pF = tf = 3 ns (10% and 90%1. * DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next lev!!1 of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. 4-36 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC30. SN74ASC30 8·INPUT POSITIVE·NAND GATES 02939. AUGUST 1986 SystemCenrM • • • • 2·,.m INTERNAL STANDARD CEll Choice of Two Performance Levels logic symbol Specified for Operation Over VCC Range of 4.5 V to 5.5 V A B Functional Operation Over VCC Range of 2Vt06V 0 E c Y F Dependable Texas Instruments Quality and Reliability G H FUNCTION TABLE positive logic equation Y = ABCDEFGH = A+B+C+D+E+F+G+H INPUTS OUTPUT A B C D E F G H H H H H H H H H L L X X X X X X H X X X X X X X X X X X X X X L X X X X X X X X L X X X X X X X X X X L X X X X Y X X L X X X X X X X X L X H X X X L H L H • H H H H description The SN54ASC30 and SN74ASC30 are 8-input positive-NAND gate CMOS standard cells each implementing the equivalent of an SN54LS30 or SN74LS30. The standard-cell library contains two physical implementations providing the custom IC designer a choice between two performance levels for optimizing designs. The two options are designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: FEATURES CELL NAME NA810LH NAB20LH NETLIST TYPICAL RELATIVE HDL LABEL DELAY CELL AREA CL - 1 pF TO NA210LH label: NABnOLH A,B,C,D,E,F,G,H,Y; 4.5 ns 2.5 3.3 ns 4.75 The SN54ASC30 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC30 is characterized for operation from - 40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA documents contain information current as of publication date. Products conform to specifications per the terms of Texas Instruments =~~:~~i~ai~:I~'Je ~!~~:~i:f ~~O::~:~:t:::'~S not -1!1 INSTRUMENTS Copyright © 1986, Texas Instruments Incorporated TEXAS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-37 SN54ASC30, SN74ASC30 8·INPUT POSITIVE·NAND GATES electrical characteristics VT NA810LH TEST CONDITIONS PARAMETER Input threshold voltage VCC = 5 V, VCC = 4.5 V to 5.5 V, II SN54ASC30 SN74ASC30 TVP Supply current Input capacitance VCC= 5 V, TA = 25°C Equivalent power VCC = 5 V, tr = tf' = 3 ns, dissipation capacitance TA = 25°C MAX 502 17.4 TA = MIN to MAX UNIT V 290 VI = VCC or 0, ICC TVP 2.2 2.2 TA = 25°C Ci Cpd NA820LH MAX 30.1 nA 0.12 0.22 pF 0.61 1.13 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise notedl NA810LH PARAMETERt tpLH tpHL II C tPLH tpHL t.tpLH t.tpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A thru H V CL = 0 A thru H V, CL = 1 pF A thw H V SN54ASC30 SN74ASC30 MIN TVP* MAX MIN TVP* MAX 0.9 1.8 4.2 0.9 1.8 3.7 0.8 1.6 2.3 2 6.5 0.9 2 5.6 3.6 8 5.2 1.7 3.6 7.3 5.3 2.5 5.3 13.1 0.6 1.8 4.9 0.6 1.8 4.7 1.4 3.3 8.7 1.6 3.3 7.5 MAX MIN 1 TVP* 1.6 3.6 1 TVP* 1.6 0.9 2.1 5.8 1 2.1 5 1.5 2.6 5.7 1.6 2.6 5.3 1.8 4 10.8 2.1 4 9.3 0.4 0.8 1 1.9 2.3 5.1 0.5 0.9 1 1.9 4.4 UNIT ns ns ns/pF NA820LH Q) r+ Q) PARAMETERt en tPLH ::r CD CD tpHL en tPHL tpLH r+ t.tpLH t.tpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A thru H V CL = 0 A thru H V A thru H V CL = 1 pF SN54ASC30 MIN SN74ASC30 MAX 3.3 2.1 UNIT ns ns ns/pF t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpLH '" propagation delay time, low-to:high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output t.tpLH '" change in tPLH with load capacitance t.tpHL '" change in tpHL with load capacitance t Typical values are at VCC = 5 V, T A = 25°C. DESIGN CONSIDERATIONS Refer to Section 7 All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. 4-38 ,TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC32.SN74ASC32 2·INPUT POSITIVE·OR GATES 02939. AUGUST 1986 SystemCell™ 2-ttm INTERNAL STANDARD CELL logic symbol • Choice of Four Performance Levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability FUNCTION TABLE INPUTS AI3 OUTPUT Y positive logic equation H X H X H H Y=A+B=AB L L L description The SN54ASC32 and SN74ASC32 are 2-input positive-OR gate CMOS standard cells each implementing the equivalent of one-fourth of an SN54LS32 or SN74LS32. The standard- cell library contains four physical implementations providing the custom IC designer a choice between four performance levels for optimizing design. The four options are designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: II ...en FEATURES CELL NAME NETlIST TYPICAL HDL LABEL RELATIVE DELAY CELL AREA CL - 1 pF TO NA210LH OR210LH 2.3 ns 1.5 OR220LH 2.1 ns 1.75 1.8 ns 2.6 1.7 ns 3.75 OR240LH OR260LH Label: OR2nOLH A,B, Y; CD CD .s: til ... CO CO Q The SN54ASC32 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC32 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PROOUCTION'OATA documents contei. information currant IS of publication date. Products conform to specifications par the terms of Texas Instruments ::~:~i~a{nr:I~7e ~!:~:~ti:.n :'iO=:::~:.s not Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-39 SN54ASC32, SN74ASC32 2·INPUT POSITIVE·OR GATES electrical characteristics PARAMETER VT Input threshold voltage ISN54ASC32 VCC = 5 V, Vec = 4.5 V to 5.5 V, ISN74ASC32 TA =MIN to MAX Input capacitance VCC - 5 V, TA - 25°C Equivalent power VCC = 5 V, TA = 25°C tr = tf = 3 ns, VT ISN54ASC32 VCC = 5 V, VCC = 4.5 V to 5.5 V, ISN74ASC32 TA = MIN to MAX pF 1.62 pF TA = 25°C Equivalent power VCC = 5 V, TA = 25°C tr = tf = 3 ns, TYP MAX 461 18.3 UNIT V 2.2 305 V, = VCC or 0, VCC = 5 V, dissipation capacitance OR260lH MAX 2.2 TA = 25°C Input capacitance nA 0.86 OR240lH Supply current 13 0.11 TYP ICC UNIT V 217 11.1 Ci Cpd 2.2 0.11 TEST CONDITIONS Input threshold voltage OR220lH TYP, MAX 185 V, = VCC or 0, Supply current dissipation capacitance MAX 2.2 TA = 25°C ICC PARAMETER \ill TYP Ci Cpd II OR210lH TEST CONDITIONS 27.7 nA 0.22 0.36 pF 3.0S 4.7 pF switching characteristics .over recommended ranges of supply voltage and operating free·air temperature (~nless otherwise noted) OR210LH c ... CI) PARAMETERt CI) tplH en tPHL tpLH ::r CD CD ... tPHL atpLH VI atpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A or B Y CL = 0 A or B y. A or B y CL = 1 pF SN54ASC32 MIN SN74ASC32 MAX MIN 0.6 TYP* 1.3 2.9 0.6 O.S 1.7 3.6 1 1.7 3.3 1.1 2.3 5.2 1.2 2.3 4.8 1.2 2.3 5.2 1.3 2.3 4.6 0.5 1 2.3 0.5 1 2.1 0.2 0.6 1.6 0.3 0.6 1.4 MAX MIN 3.4 0.8 TYP* 1.5 MAX 0.7 TYP* 1.5 1 1.8 4.2 1 1.8 3.8 TYP* 1.3 MAX 2.7 UNIT ns ns ns/pF OR220LH PARAMETERt tpLH tpHL tPLH tpHL atpLH atpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A or B Y CL = 0 A or B Y CL = 1 pF A or B Y SN54ASC32 MIN SN74ASC32 3.2 1 2 4.6 1 2 4.2 1.2 2.2 5.1 1.2 2.2 4.6 0.2 0.5 1.2 0.2 0.5 1.1 0.1 0.4 1 0.2 0.4 O.S UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of V, to 'the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpLH " propagation delay time, low-to-high-Ievel output tpHL !!!! propagation delay time, high-to-Iow-Ievel output atpLH '" change in tPLH with load capacitance atpHL '" change in tpHL with load capacitance Typical values are at V CC = 5 V, T A = 25°C. * 4-40 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 SN54ASC32. SN74ASC32 2·INPUT POSITIVE·OR GATES OR240LH PARAMETERt tpLH tpHL tpLH tPHL dtpLH dtpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A or B V CL ~ ~ 0 A or B Y A or B Y FROM (INPUT) TO TEST (OUTPUT) CONDITIONS CL 1 pF SN54ASC32 SN74ASC32 MIN TVP* MAX MIN TVP* 0.6 1.4 3.1 0.7 1.4 2.8 0.9 1.7 3.6 0.9 1.7 3.4 0.8 1 1.7 3.7 0.9 1.7 1.9 4.2 1.1 1.9 3.3 3.9 0.1 0.3 0.6 0.1 0.3 0.6 0.1 0.2 0.6 0.1 0.2 0.6 SN54ASC32 Typf MAX MIN TVP* MAX 3 3.7 0.7 1.4 2.8 0.9 1.6 3.4 3.1 MAX UNIT ns ns ns/pF OR260LH PARAMETERt tpLH tpHL tpLH tpHL dtpLH dtpHL A or B Y A or B Y A or B CL CL ~ ~ 0 1 pF Y MIN SN74ASC32 0.6 1.4 0.9 1.6 0.7 1.6 3.4 0.8 1.6 1 1.8 4.1 1 1.8 3.7 0.1 0.2 0.2 0.5 0.1 0.2 0.5 0.09 0.2 0.4 0.4 0.07 UNIT ns ns ns/pF tPropagatian delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf ~ 3 ns (10% and 90%1. tpLH '" propagation delay time, law-ta-high-Ievel output tpHL '" propagation delay time, high-to-I ow-level output dtPLH '" change in tpLH with load capacitance dtpHL '" change in tpHL with load capacitance *Typical values are at Vce ~ 5 V, TA ~ 25°C. II ... tI) CD CD ..c: til ... CU CU DESIGN. CONSIDERATIONS C Refer to Section 7 All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-41 4-42 SN54ASC74. SN74ASC74 O-TYPE POSITIVE-EOGE-TRIGGEREO FLIP-FLOPS D2939, AUGUST 1986 SystemCell™ 2-Jtm HARDWIRED MACRO CELLS a and az • All Cells Provide Complementary Outputs • Choice between Two Relative Output Drive Capabilities • Choice of Asynchronous Inputs Provides Custom Cell for Most Applications • Implements High-Speed Registers: Clock Frequencies ... 46 to 69 MHz FLIP-FLOP CEll CONFIGURATIONS OFFERED DRIVE CEll NAME PRESET DFB20lH Ves Ves 2X DFC20lH No Ves 2X DFN20lH No No 2X DFP20lH Ves No 2X DFV20lH Ves No 2X DFZ20lH Ves Ves 2X DTB10lH Ves Ves 1X DTC10lH No Ves 1X DTN10lH No, Ves No 1X No 1X DTP10lH CLEAR lEVEL description The SN54ASC74 and SN74ASC74 are dedicated, hardwired st<:mdard-c<;il maCros i:nplemcn::;~;; va;icu~ D-type flip-flops. The' ASC74 cell selection offers a broad choice of flip-flop configurations, providing the custom IC designer with specific storage elements to embed in ASICs in their most efficient form: as standalone bit-storage devices or as additions to larger synchronous functions such as registers or counters, The DFB20LH and DTB10LH flip-flops are identical in function and sequential operation to one-half of the 'LS74, 'S74, or 'F74 packaged flip-flops. II ... en Q) Q) The other nine cells provide the designer with flip-flop versions having either a preset or clear or no asynchronous input. .I: en The DFY20LH and DFZ20LH cells feature grounded D inputs meaning that they can simplify implementation of flag registers that can be reset to zero with a system clock. The DFZ20LH offers asynchronous clear and preset inputs providing an option to zero the register with either the system clock or system clear signal, or both. ...caca C FEATURES CEll NAME NETLIST MAXIMUM RELATIVE HDl lABEL CLOCK CEll AREA FREQUENCY TO NA210lH DFB20lH label: DFB20lH ClRZ, PREZ, D, elK, Q, QZ; 46.3 MHz 7.7 DFC20lH label: DFC20lH ClRZ, D, ClK, Q, QZ; 52.1 MHz 7.2 DFN20lH label: DFN20lH D, elK, Q, QZ; DFP20lH 6.5 7 DFV20lH label: DFP20lH PREZ, D, elK, Q, QZ; label: DFV20lH PREZ, elK, Q, QZ; 64.2 MHz 55.8 MHz 69.2 MHz 5.7 DFZ20lH label: DFZ20lH ClRZ, PREZ, elK, Q, QZ; 59.2 MHz 6.5 DTB10lH label: DTB10lH ClRZ, PREZ, D, ClK, Q, QZ; label: DTC10lH ClRZ, D, ClK, Q, QZ; 55.8 MHz 6.5 DTC10lH 52.1 MHz 6 DTN10lH DTP10lH label: DTN10lH D, elK, Q, QZ; label: DTP10lH PREZ, D, elK, Q, QZ; 55.8 MHz 55.8 MHz 5.2 6 The SN54ASC74 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC74 is characterized for operation from -40°C to 85°C, PROOUCTION DATA documents contain information curreRt as of publicati.n data. Products ~onform to specifications per the terms of Taxas Instruments :'~~~:~~i~ar=l~lJe ~!sO:i~~i:; :,~D::~:::~:'~ not Copyright TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 © 1986, Texas Instruments Incorporated 4-43 SN54ASC74. SN74ASC74 D·TYPE POSITIVE· EDGE·TRIGGERED FLlP·FLOPS logic symbols FUNCTION TABLES DFB20LH; DTB10LH DFB20lH. DTB10lH INPUTS P R E Z i ], = S a ClK . C1 o 10 ClRZ R az CLRZ CLK l H H l L H L H H H X X X i i H H L CLRZ CLK L H X i i H L 10 R . az H o--U- C/) ::T CD CD az en H L L L H X 00 00 L H H L L H 00 00 OUTPUTS 0 Q QZ i i H H L L L H L X 00 00 DFP20LH. DTP10LH PREZ CLK L H X i i H L H OUTPUTS Q QZ 0 X H L L .H L H X 00 00 H l DFY20LH DFY20LH INPUTS PREZ CLK PREz-n-a ----t:J-- X i H H L L H H L 00 00 L az OUTPUTS Q QZ * This configuration is nonstable; that is, it will not persist when PREZ or CLRZ returns to its inactive (high) level. 4-44 L· OUTPUTS Q QZ INPUTS n a ClK C1 az o 10 ClK H CLK DFP20LH. DTP10LH PREZ r+ H 0 X H L X INPUTS ClK--Fl-- a c l L L· QZ Q DFN20LH.DTN10LH DFN20LH.DTN10LH S» r+ S» H INPUTS ClKB=1· a ClRZ 0 X X X DFC20LH.DTC10LH DFC20LH. DTC10LH o OUTPUTS PREZ TEXAS • INSTRUMENTS POST OFFICE BOX 655012 ,. DALLAs. TEXAS 75265 SN54ASC74. SN74ASC74 O·TYPE POSITIVE·EOGE·TRIGGEREO FLIP-FLOPS logic symbol FUNCTION TABLE OFZ20lH OFZ20lH INPUTS PREZEa CLK R CLRZ az R * This configuration is nonstable; that is, it will not p~rsist OUTPUTS PREZ ClRZ ClK Q l H X H L H l X l H QZ l L X H H t L' l L' H H H l 00 00 when PREZ or CLRZ returns to its inactive (high) level. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) OFB20lH fclock tw Pulse duration th MAX MIN MAX 0 46.3 0 52.1 0 64.2 Setup time Hold time MHz ns 10.8 9.6 CLRZ inactive 7.8 6.6 PREZ inactive o high or low 1.2 6.6 6.6 ClRZ low 1.2 0.6 PREZ low 3 o high or low UNIT 6.6 7.8 ClK high or low tsu MIN 7.2 PREZ low OFN20lH MAX Clock frequency ClRZ low OFC20lH MIN ns 4.8 ...ca ctI 2.4 1.8 CI) CI) .s:: tJ) ns 2.4 II ... CI) 7.8 C OFP20LH fclock MIN MAX 0 55.8 Clock frequency OFY20lH MIN MAX 0 69.2 ClRZ low tw Pulse duration OFZ20lH MIN MAX 0 59.2 UNIT MHz 7.2 PREZ low 7.2 7.2 7.8 9 7.2 8.4 1.2 1.2 1.2 ns 1.8 3 ns ClK high or low ns CLRZ inactive tsu Setup time PREZ inactive o high or low 6 ClRZlow th Hold time PREZ low o high 2.4 or low 3 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-45 SN54ASC74. SN74ASC74 O-TYPE POSITIVE-EOGE-TRIGGEREO FLIP-FLOPS timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (continued) DTB10lH fclock tw Clock frequency Pulse duration tsu th Setup time Hold time MAX 0 55.8 ClRZ low. 13.8 PREZ low 18.6 ClK high or low DTC10lH MIN DTP10lH MAX MIN MAX MIN MAX 0 52.1 0 55.8 0 55.8 UNIT MHz 10.8 20.4 ClRZ inactive 9 0.6 PREZ inactive -1.8 o high or low 3 6 ClRZ low 16.2 12.6 PREZ low 21 o high or low DTN10lH MIN 9.6 0.6 9 4.8 ns 9 -2.4 ns 4.2 22.2 2.4 3 2.4 ns 2.4 electrical characteristics DFB20LH PARAMETER II TEST CONDITIONS VT Input threshold voltage ICC Supply current TA - Ci PREZ Input capacitance 0 ClK Q) en ::s(I) c: TA - 25°C Cpd SN74ASC74 TYP TYP MAX 2.2 V, - VCC or O. 0.36 VCC = 5 V, Equivalent power VCC - 5 V, dissipation capacitance TA = 25°C TA tr - tf - 3 ns, = 25°C MAX 2.2 934 = MIN to MAX ClRZ cQ) (I) VCC - 5 V. VCC - 4.5 V to 5.5 V. SN54ASC74 UNIT V 56 nA 0.36 0.38 0.38 0.11 0.11 0.25 0.25 3.76 3.76 pF pF DFC20LH PARAMETER TEST CONDITIONS VT Input threshold voltage ICC Supply current TA I Ci Cpd Input capacitance VCC = 5 V, VCC - 4.5 V to 5.5 V, I I TA - 25°C SN74ASC74 TYP TYP VCC = 5 V, = 25°C TA Equivalent power VCC - 5 V, dissipation capacitance TA tr - tf - 3 ns, = 25°C MAX 2.2 881 = MIN to MAX ClK MAX 2.2 V, - VCC or 0, ClRZ 0 SN54ASC74 V 52.9 0.36 0.36 0.11 0.11 0.28 0.28 3.39 3.39 UNIT nA pF pF DFN20LH PARAMETER VT Input threshold voltage ICC Supply current Ci Cpd 4-46 Input capacitance SN54ASC74 TEST CONDITIONS VCC = 5 V, VCC - 4.5 V to 5.5 V, = MIN to MAX VCC = 5 V, TYP TA = 25°C 2.2 V, - Vec or 0, : ~lK dissipation capacitance VCC - 5 V, TA = 25°C = 25°C - tf = 3 ns, TA tr TEXAS . . INSTRUMENTS POST OFFICE BOX 665012 • DALLAS. teXAS 15265 SN74ASC74 TYP MAX 2.2 799 TA Equivalent power MAX V 47.9 0.13 0.13 0.27 0.27 2.71 2.71 UNIT nA pF pF SN54ASC74. SN74ASC74 O·TYPE POSITIVE·EOGE·TRIGGEREO FLlp·FLOPS electrical characteristics' DFP20LH PARAMETER TEST CONDITIONS VT Input threshold voltage lee Supply current ei epd Input capacitance Vee = 5 V, TA =.25°C Vee - 4.5 V to 5.5 V, VI - Vee or 0, SN54ASC74 SN74ASC74 TVP TYP 2.2 0.35 Vee = 5 V, TA = 25°e I elK Equivalent power Vee = 5 V, dissipation capacitance TA = 25°e tr = tf = 3 ns, MAX 2.2 845 TA = MIN to MAX I PREZ ID MAX UNIT V 50.7 r. .'~ 0.35 0.13 0.13 0.26 0.26 3.49 3.49 pF pF DFY20LH PARAMETER TEST CONDITIONS VT Input threshold voltage lee Supply current ei epd Vee - 5 V, TA - 25°e Vee - 4.5 V to 5.5 V, VI - Vee or 0, SN74ASC74 TYP TYP Vee = 5 V, TA = 25°e Vee = 5 V, tr = tf = 3 ns, dissipation capacitance TA = 25°e MAX 2.2 MAX 2.2 702 TA = MIN to MAX I PREZ I elK Equivalent power Input capacitance SN54ASC74 V 42.1 0.35 0.35 0.25 0.25 4.63 4.63 UNIT nA pF pF I/) Q) Q) DFZ20LH .s:::: PARAMETER TEST CONDITIONS VT Input threshold voltage lee Supply current ei Input capacitance Vee = 5 V, TA = 25°e Vee - 4.5 V to 5.5 V, VI - Vee or 0, SN54ASC74 SN74ASC74 TYP TYP I I Vee = 5 V, TA = 25°e Equivalent power Vee = 5 V, dissipation capacitance TA = 25°e tr = tf = 3 ns, TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 MAX 2.2 777 0.25 elRZ PREZ MAX 2.2 TA = MIN to MAX I elK epd •- UNIT V 46.6 nA en CO CO C 0.25 0.23 0.23 0.36 0.36 4.94 4.94 pF pF 4-47 SN54ASC74, SN74ASC74 O·TYPE POSITIVE·EOGE·TRIGGERED FLlP·FLOPS electrical characteristics DTB10LH PARAMETER TEST CONOITIONS VT Input threshold voltage ICC Supply current ej Input capacitance Vee = 5 V, Vce - 4.5·V to 5.5 V, TA = 25°C SN74ASC74 TYP TYP MAX 2.2 VI - Vee or 0, TA = MIN to MAX 0.12 0.12 0.18 0.18 0.20 0.20 0.14 0.14 2.12 2.12 Vee = 5 V, TA = 25°C Equivalent power Vee - 5 V, dissipation capacitance TA = 25°C tr - tf - 3 ns, UNIT V 41.9 PREZ 0 MAX 2.2 699 CLRZ eLK Cpd SN54ASC74 nA pF pF DTC10LH PARAMETER II TEST CONDITIONS VT Input threshold voltage ICC Supply current Vee - 5 V, 4.5 V to 5.5 V, Vee TA - 25°C VI Input capacitance TYP 10 1 eLK dissipation capacitance MAX 2.2 0.11 Vee = 5 V, TA = 25°C tr - tf - 3 ns, Vee - 5 V, TA = 25°C MAX 2.2 641 TA'= MIN to MAX Equivalent power epd SN74ASC74 TYP Vee or 0, LeLRZ ej SN54ASC74 UNIT V 38.5 nA 0.11 0.19 0.19 0.08 0.08 2.1 2.1 pF pF DTN10LH TEST CONDITIONS PARAMETER VT Input threshold voltage Vee = 5 V, TA = 25°C ICC Supply current Vee - 4.5 V to 5.5 V, TA = MIN to MAX VI - Vee or 0, ej Input capacitance Vee = 5 V, TA = 25°C Equivalent power Vee - 5 V, tr - tf - 3 ns, dissipation capacitance TA = 25°C epd 4·48 10 I eLK TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC74 SN74ASC74 TYP TYP MAX 2.2 MAX 544 32.6 0.10 0.10 0.11 0.11 2.21 2.21 UNIT V 2.2 nA pF pF SN54ASC74. SN74ASC74 O·TYPE POSITIVE·EOGE·TRIGGEREO FLlp·FLOPS DTP10LH PARAMETER VT ICC TEST CONDITIONS Input threshold voltage Supply current VCC = 5 V, VCC - 4.5 V to 5.5 V, TA = TA = Input capacitance tD VCC VI - VCC or 0, 5 V, TA = 25°C Equivalent power VCC - 5 V, dissipation capacitance TA 0.19 0.14 0.11 0.11 2.5 2.5 t r - tf - 3 ns, UNIT V 38.3 0.19 25°C MAX 2:2 638 MIN to MAX = = TVP MAX 2.2 I ClK Cpd SN74ASC74 TVP 25°C I PREZ Ci SN54ASC74 nA pF 0.14 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) DFB20LH PARAMETERt FROM TO TEST IINPUT) 10UTPUT) CONDITIONS SN74ASC74 SN54ASC74 MAX MIN TVP* MAX 2.1 TVP* 4.9 12.7 2.3 4.9 11.1 1.4 1.9 3.2 3.9 8.2 1.6 3.2 7.2 9.3 2 3.9 8.3 tpHl 1.1 2 4.2 1.1 2 3.8 tpLH 2.4 5.4 13.9 2.6 5.4 12.2 1.6 3.6 9.2 1.8 3.6 8.1 2.2 4.4 10.6 2.3 4.4 9.4 tplH tpHl tpLli tpHi. tPlH tpHl .o.tplH .o.tpHl ClK Q,QZ Cl = 0 PREZ,ClRZ ClK Q,QZ Q,QZ Cl = 1 pF PREZ,ClRZ Any Q,QZ Q,QZ MIN 1.3 2.4 5.2 1.3 2.4 4.7 0.2 0.5 1.3 0.4 1 0.5 0.4 1.2 0.1 0.2 0.1 0.9 UNIT ns ns ns ns nsipF fpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns 110% and 90%), tplH '" propagation delay time, low-to-high-Ievel output tpHl .. propagation delay time, high-to-Iow-Ievel output .o.tplH '" change in tPlH with load capacitance .o.tpHl '" change in tPHl with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 II ... fI) Q) Q) .c: en ... CO CO C 4-49 SN54ASC74. SN74ASC74 D-TYPE POSITIVE-EDGE-TRIGGERED FLIP-FLOPS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) DFC20LH PARAMETERt tpLH tpHL tpLH tpHL tPLH tpHL tPLH tpHL dtplH dtpHl FROM TO TEST (INPUT) (OUTPUT) CONDITIONS CLK a,QZ CLRZ QZ a CLK CLRZ CL = 0 a,az CL = 1 pF az a SN54ASC74 TYpt MAX MIN a,az FROM TO (OUTPUT) 4.5 10.7 1.9 3 3.5 5.7 7.2 1.9 4.5 12.2 1.4 7.9 1.8 3 3.5 2 1.5 8.1 1 1.8 3.9 1.1 1.8 3.6 2.1 5 13.4 2.3 5 11.8 1.5 3.4 8.8 1.7 3.4 7.7 2.1 4 9.3 2.2 4 8.3 1.2 2.2 0.5 4.9 1.3 1.3 0.2 2.2 0.5 4.4 0.4 1 0.1 0.4 0.8 SN54ASC74 TYpt MAX MIN 0.2 0.1 Any SN74ASC74 Tvpt MAX MIN 1.1 UNIT ns ns ns ns ns/p'F DFN20LH PARAMETERt III tpLH tPHL tplH tpHL dtpLH dtpHL (INPUT) CLK CLK CLK a,QZ TEST COND(TIONS Cl a,QZ CL =0 = 1 pF a,az MIN 1.7 SN74ASC74 TVPt MAX 3.7 9.5- 1.8 1.2 2.6 2.6 5.9 4.2 2.1 4.2 9.4 1.4 0.2 3 0.5 6.6 10.7 7.5 1.3 1.9 1.5 6.7 0.1 0.4 3 0.5 0.4 0.9 0.2 0.1 SN54ASC74 TVpt MAX MIN 1.2 3.7 8.4 1.1 0.8 UNIT ns ns ns/pF DFP20LH PARAMETERt tpLH tpHL tplH tpHL tPlH tPHL tpLH tPHL dtplH dtpHL FROM (INPUT) . ClK PREZ TO TEST (OUTPUT) CONDITIONS a,QZ a az ClK a,QZ PREZ a QZ Any a,az CL CL =0 = 1 pF MIN SN74ASC74 TVpt MAX 1.8 4,3 12 1.9 4.3 9.6 1.3 1.7 3 3.3 7.8 1.4 7.7 1.8 3 3.3 6.9 6.9 1.1 2 4.1 1.2 2 3.8 2 4.8 13.2 2.2 4.8 11.6 1.5 3.4 8.7 1.6 3.4 7.6 2 3.8 8.9' 2.1 3.8 7.9 1.3 0.2 0.1 2.4 0.5 5 1.3 1.3 0.2 2.4 0,5 4.5 1.1 0.4 1 0.1 0.4 0.8 UNIT ns ns ns ns ns/pF t Propagation delay times are measured from the 44% pOint of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tPLH .. propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output dtpLH '" change in tPlH with load capacitance AtPHL " change in tPHL with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. 4-50 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC74, SN74ASC74 O·TVPE POSITIVE·EOGE·TRIGGEREO FLlp·FLOPS switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) DFY20LH and DFZ20LH PARAMETERt tplH tpHl tplH tpHl tplH tpHl tplH tpHl dtplH FROM (INPUT) ClK TO (OUTPUT I Q,QZ Cl PREZ,ClRZ§ Q,QZ ClK Q,QZ Cl PREZ,ClRZ§ Q,QZ Any Q,QZ FROM (lNPUTI TO (OUTPUT) SN54ASC74 TEST CONDITIONS ~ ~ a 1 pF dtpHl SN74ASC74 MIN TYP* MAX MIN TYP* MAX 1.8 1.2 1.6 1.1 2 1.3 1.8 1.2 0.2 0.1 4.3 2.6 3.6 1.9 4.8 3 4.1 2.3 0.5 0.4 11.7 6.6 9.7 4.1 12.8 7.6 10.8 5.1 1.3 1 1.9 1.2 1.9 1.1 2.2 1.4 1.9 1.3 0.2 0.1 4.3 2.6 3.6 1.9 4.8 3 4.1 2.3 0.5 0.4 10.3 5.9 8.5 3.8 11.3 6.8 9.6 4.6 1.1 0.9 SN54ASC74 MIN TYP* MAX MIN TYP* MAX 1.6 1.8 2.2 0.9 2.1 2 3.1 3.5 4.2 1.4 4 3.8 2.2 2.4 2.8 1.5 2.8 2.6 0.5 0.6 0.5 0.6 4.1 4.8 5.2 2.7 5.3 4.8 1 1.3 1 1.3 0.5 0.7 1 1.3 6.8 7.9 9.1 2.7 8.3 7.9 8.9 10.6 11.2 5.4 11.3 9.9 2.2 2.9 2.2 2.8 2.1 3.1 UNIT ns ns ns ns ns/pF DTB10LH PARAMETERt tPlH tpHl tplH iPHl tpHl tPlH tPlH tPHl tplH tpHl tpHl tplH dtPlH dtpHl dtPlH dtpHl dtPlH dtpHl ClK TEST CONDITIONS Q,QZ Q PREZ ClRZ ClK PREZ ClRZ QZ Q ~ Cl a QZ Q,QZ Q QZ Q CL ~ 1 pF QZ ClK Q,QZ PREZ Q,QZ ClRZ Q,QZ 1.5 1.6 2.1 0.8 2 1.9 2 2.2 2.6 1.4 2.6 2.4 0.4 0.5 0.5 0.5 0.5 0.6 3.1 3.5 4.2 1.4 4 3.8 4.1 4.8 5.2 2.7 5.3 4.8 1 1.3 1 1.3 1 1.3 7.7 8.9 10.1 2.9 9.3 8.9 9.9 12 12.5 6.1 12.7 11.1 2.5 3.4 2.4 3.2 2.2 3.5 SN74ASC74 UNIT ns ns ns ns ns II I/) ..... Q) Q) .r:. en co ..... co C ns ns/pF ns/pF ns/pF t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpLH == propagation delay time, low-to-high-Ievel output tpHL == propagation delay time, high-to-low~level output atpLH == change in tpLH with load capacitance AtpHL == change in tPHL with load capacitance 'Typical values are at VCC ~ 5 V, TA ~ 25°C. § ClRZ does not apply for the DFY20lH. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-51 SN54ASC74,SN74ASC74 D·TYPE POSITIVE·EDGE·TRIGGERED FLlp·FLOPS switching characteristiCs over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) DTC10LH PARAMETERt tPlH tpHl tplH tpHl tplH tpHl tplH tpHl AtPlH AtpHl AtPlH AtPHl II ' ' 'OLH PARAMETERt tPlH tpHl tPlH tpHl AtplH AtpHl C ... I» I» tn :r FROM (lNI>UTI TO (OUTPUTI ClK a,az ClRZ, TEST CONDITIONS Cl az a =0 ClK a,az ClRZ az a ClK a,az ClRZ a,az FROM (INPUT) ·TO (OUTPUT) TEST CONDITIONS elK a,az Cl = 0 elK a,az Cl = 1 pF ClK a,az FROM (INPUT) TO (oUTPUT) ClK a,az Cl = 1 pF SN54ASC74 MIN TYP* MAX 1.5 3.2 8.4 1.5 3.3 8.4 2.4 4.9 12 2.2 4.5 10.6 4.2 10.6 2 2.1 ' 4.6 11.5 2.9 5.9 14.1 2.9 6 14.3 0.5 2.4 1 0.5 1.3 3.3 0.4 1 2.2 0.7 1.5 3.7 SN74ASC74 MIN TYP* MAX 1.6 3.2 7.5 1.7 3.3 7.5 2.6 4.9 10.6 2.4 4.5 9.4 2.1 4.2 9.5 2.3 4.6 10.2 3.1 5.9 12.6 3.1 12.7 6 0.5 1 2.2 0.6 1.3 2.9 0.5 1 2 0.7 1.5 3.3 SN54ASC74 MIN TVP* MAX 1.5 3.2 8.1 1.5 3.3 8.1 2 4.2 10.3 2.1 4.6 11.1 0.4 1 2.4 0.5 1.3 3.3 SN74ASC74 MIN TVP* MAX 1.6 3.2 7.2 1.7 3.3 7.2 2.i 4.2 9.2 2.3 4.6 9.8 1 0.5 2.2 0.6 1.3 2.9 SN54ASC74 MIN TVI>* MAX 1.5 7.2 3.2 1.6 3.5 9.1 2.4 4.9 11.7 0.9 1.4 3 2 4.2 9.5 2.2 4.8 12.3 2.9 5.9 14.1 1.5 2.7 6.2 0.5 1 2.5 0.5 1.3 3.2 0.5 1 2.5 0.5 1.3 3.2 SN74ASC74 MIN TVP* MAx 1.6 3.2 6.5 1.7 3.5 8.1 2.6 4.9 10.4 0.9 1.4 2.8 2.2 4.2 8.5 2.3 4.8 10.8 3.1 5.9 12.6 5.5 1.6 2.7 0.5 1 2.3 0.6 1.3 2.8 0.5 1 2.2 0.6 1.3 2.8 UNIT ns ns ns ns ns/pF ns/pF ,UNIT ns ns ns/pF CD ! en DTP10LH PARAMETERt tplH tpHl tPlH tpHl tPlH tpHl tPlH tpHl AtplH AtpHl AtplH AtpHl PREZ a az ClK a,az PREZ a az ClK a,az PREZ a,az TEST CONDITIONS Cl = 0 Cl = 1 pF UNIT ns ns ns ns ns/pF ns/pF tpropagation,delay times are measured from the 44% point of VI to,the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tPlH .. propagation delay time, low-to-high-Ievel outpUt tpHl '" propagation delay time, high-to-Iow-Ievel output AtplH .. change in tplH with load capacitance AtpHl .. change in tPHl with load capacitance Typical values are at Vce = 5 V, TA = 25 ·C. * 4-52 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC74, SN74ASC74 D-TYPE POSITIVE-EDGE-TRIGGERED FLIP-FLOPS DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven by either noninverting or inverting input cells when interfacing off-chip for the input data. The outputs can be interfaced to drive off-chip loads with any of the non inverting output buffers or interfaced to external bidirectional buses through a threestate input/output TTL/CMOS buffer. designing for testability Designs employing storage or bistable elements should consider testability of the design in its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously either preset or cleared may be connected to an SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Access to the clear or preset inputs from other system signals in conjunction with the power-up clear can • be implemented with an AND gate. ...en G) G) ..c en ...asas C TEXAS .." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-53 • C I» r+ I» CJ) :::r CD CD r+ UI 4-54 SN54ASC75, SN74ASC75 O-TYPE LATCHES WITH ACTIVE-HIGH ENABLE 02939, AUGUST 1986 SystemCelr M 2-/-lm HARDWIRED MACRO CELL • Provides Complementary Q and QZ Outputs • Choice Between Two Relative Output Drive Capabilities • Implements Control/Status· Registers • Parallel Latches to Implement Wide Word Widths logic symbol 0,10 1--0 C~~_C_1______~~OZ FUNCTION TABLE description INPUTS OUTPUT 0 C 0 QZ L H H L H H L H The SN54ASC75 and SN74ASC75 are X L 00 00 dedicated, hard-wired standard-cell macros 'implementing D-type latches, The 'ASC75 latches offer two choices of individual latch configurations providing the custom IC designer storage elements to embed in ASICs in their most efficient form, The LAH20LH and LAH10LH latches implement identical function and sequential operation to one-fourth of the 'LS75 packaged latches, except that the 'ASC75 enable (C) input is individually available for custom design, The LAH20LH provides twice the drive capability as the LAH 1OLH element. Information present at the data input is transferred to the Q output when the enable input is high, and the Q output will follow the data input as long as enable remains high, When enable goes low, the data that was present at the data input at the time the transition occurred is retained at the Q output until enable is taken high, The cells are designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: CELL NAME LAH10LH LAH20LH NETLIST ... CI) CD CD .c en ...caca RELATIVE CELL AREA HOL LABEL • C TO NA210LH 5 4.5 Label: LAHnOLH D,C,Q,QZ: The SN54ASC75 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC75 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2, PRODUCTION DATA documlnts contein information currant as of publication date. Products conform to BpIIcifil:atioRs par the terms of Taxas Instruments :~~=~~i~'i~:I~~ ~=:~i:r :'~D=:::~;:S not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-55 SN64ASC76, SN74ASC76 D·TYPE LATCHES WITH ACTIVE·HIGH ENABLE timing requirements over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) LAH10LH MIN tw tsu th LAH20LH MIN 6 6 Pulse duration I e high I e low Setup time, 0 high or low Hold time, 0 high or low 4.8 ns 4.8 6 0 6 0 UNIT ns ns electrical characteristics LAH10LH PARAMETER VT Input threshold voltage lee Supply current ei epd Input capacitance Ie 10 Equivalent power dissipation capacitance TEST CONDITIONS Vee - 5 V, TA - 25°e Vee = 4.5 V to 5.5 V, VI = Vee or 0, TA = MIN to MAX vee = 5 V, Vee = ,5 V, TA = 25°e TA = 25°e tr = tf = 3 ns, SN54ASC75 TYP MAX 2.2 SN74ASC75 TYP MAX 2.2 463 27.8 UNIT V nA 0.21 0.26 0.21 0.26 pF 2 2 pF LAH20LH PARAMETER VT Input threshold voltage lee Supply current ei epd 4-56 Input capacitance Ie 10 Equivalent power dissipation capacitance SN54ASC75 TEST CONDITIONS TYP TA = 25°C Vee = 5 V, Vee - 4.5 V to 5.5 V, VI - Vee or 0, TA = MIN to MAX = 25 Vee = 5 V, TA Vee = 5 V, TA = 25°e tr = tf = 3 ns, 0 e TEXAS • INSTRUMENTS POST OFFICE BOX 856012 • DALLAS, TEXAS 75266 MAX 2.2 SN74ASC75 TYP MAX 2.2 528 0.22 ' 31.7 UNIT V nA 0.25 0.22 0.25 pF 2.81 2.81 pF SN54ASC75, SN74ASC75 O·TYPE LATCHES WITH ACTlVE·HIGHENABLE switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) LAH10LH PARAMETERt tpLH tpHL tpLH tpHL tpLH tpHL tPLH tpHL tPLH tPHL tpLH tpHL tpLH tpHL tpLH tpHL 6tpLH 6tpHL FROM TO TEST IINPUT) (OUTPUTI CONDITIONS C Q C QZ CL D Q D QZ C Q C ° QZ CL 0 = = 1 pF Q 0 QZ Any Q,QZ SN54ASC75 Typt MAX MIN SN74ASC75 Typt MAX MIN 1 2.1 4.8 1.1 1.6 4 0.7 2.1 1.6 4.3 0.6 0.9 2.1 5.1 1 2.1 4.6 1.4 2.8 6.4 1.5 2.8 5.8 0.8 1.6 3.6 0.8 1.6 3.3 1 1.6 3.6 1 1.6 3.3 1.2 2.1 4.7 1.2 2.1 4.2 1.1 2.3 5.3 1.1 2.3 4.7 3.7 1.5 3.1 7 1.7 3.1 6.3 0.9 2.2 5.5 1 2.2 4.9 1.4 3.1 7.4 1.5 3.1 6.7 1.6 3.4 7.9 1.8 3.4 7 1.3 2.6 5.9 1.4 2.6 5.3 1.2 5 7 1.3 1.8 2.2 3.1 4.5 1.7 2.2 3.1 1.3 2.9 6.8 1.4 2.9 6 0.4 1 2.3 0.5 1 2.1 0.2 0.6 1.5 0.2 0.6 1.3 6.3 UNIT ns ns ns ns ns ns ns ns ns/pF PARAMETERt tpLH tpHL tPLH tpHL tPLH tpHL tPLH tPHL tpLH tpHL tpLH tpHL tpLH tpHL tPLH tPHL 6tpLH 6tpHL • ...en CD CD LAH20LH FROM TO TEST IINPUT) (OUTPUTI CONDITIONS C Q C QZ CL = 0 Q 0 QZ C Q C QZ ° CL = 1 pF 0 Q 0 QZ Any Q,QZ SN54ASC75 Typt MAX MIN MIN SN74ASC75 Typt MAX 0.9 1.9 4.5 1 1.9 4 0.6 1.7 4.1 0.7 1.7 3.7 1 2.4 5.9 1.1 2.4 5.3 1.3 2.8 6.6 1.4 2.8 5.9 0.7 1.5 3.5 0.8 1.5 3.2 1 1.7 3.6 1.1 1.7 3.3 1.3 2.4 5.4 1.4 2.4 4.9 1.1 2.4 5.6 1.2 2.4 5 1.2 2.4 5.6 1.3 2.4 5.1 0.8 1.2 2 0.9 1.4 2 4.5 2.9 5 7 2.9 1.4 3.1 7.4 1.6 3.1 6.3 6.7 1 2 4.6 1 2 4.2 1.2 2 4.5 1.2 2 4.1 1.6 2.9 6.5 1.7 2.9 5.9 1.3 2.7 1.4 2.7 0.2 0.5 6.4 1.2 0.2 0.5 5.8 1.1 0.1 0.3 0.9 0.1 0.3 0.8 .c UNIT ns ns CI) ...caca C ns ns ns ns ns ns ns/pF t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%1. tpLH '" propagation delay time, I"w-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output 6tpLH '" change in tPLH with load capacitance 6tpHL .. change in tpHL with load capacitance tTypical values are VCC = 5 V, TA = 25°C. TEXAS .." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4·57 SN54ASC75, SN74ASC75 O·TYPE LATCHES WITH ACTlVE·HIGH ENABLE DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven by either non inverting or inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a three-state input/output TTL/CMOS buffer. designing for testability Designers employing storage or bistable elements should consider testability of the design in its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenanc.e to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up Clear can be achieved with an AND gate. C I» I» r+ t/) :r CD CD r+ (II 4-58 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC85, SN74ASC85 4·81T MAGNITUDE COMPARATORS 02939. AUGUST 1986 SystemCell™ 2-Ilm SOFTWARE MACRO CELL • Performs Magnituda Comparison of Binary, BCD, and Monotonic Codes • Weighted Cascading Inputs Accommodate Both Serial and Parallel Expansion • logic symbol t }~~ PO P1 P2 Dependable Texas Instruments Quality and Reliability P3 PLTOI < PEOOI description The SN54ASC85 and SN74ASC85 are standard-cell software macros implementing 4·bit expandable magnitude comparators. The 4-bit configuration provides the custom IC designer a magnitude comparator to embed in ASICs in its most efficient form. The' ASC85 implements a comparison scheme identical with that performed by packaged. 'HC85, 'LS85 and 'F85 comparators. PGTOI 00 01 > } 02 03 P O PGTOO tThis symbol is in accordance with ANSI/IEEE Std 91·1984 and lEe Publication 617-12. These 4-bit magnitude comparators perform comparison of straight binary and straight BCD(8-4-2-1 ) codes. Three fully decoded decisions about two 4-bit words (P, 0) are made and are externally available at three outputs. These devices are fully expandable to any number of bits without external gates. Words of greater length may be compared by connecting comparators in cascade. The PGTOO, PLTOO, and PEOOO outputs of a stage handling less significant bits are connected to the corresponding PGTOI, PLTal, and PEOOI inputs of the next stage handling more significant bits. The stage handling the least significant bits must have a high-level voltage applied to the PEOOI input. The cascading path of the' ASC85 is implemented with only a two-gate-Ievel delay to reduce overall comparison times for long words. The 'ASC85 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pF) SN54ASC' CELL AREA 4 10.8 2.36 896 53.6 IV120LH 1 3 3 1.32 315 18.96 NA210LH NA310LH 1 6 6 3.06 786 47.04 1.25 2 2.5 1 326 19.56 NA410LH 1.5 2 3 1 374 22.4 NA510LH 1.75 7 12.25 3.64 1491 89.6 5 1.22 580 34.8 42.55 13.6 4768 286 2.5 S85LH 2 26 CD CD ..c tn ...caca o SN74ASC' 2.7 TOTALS ...rn MAXIMUM ICC (nA) A0221LH NA810LH • Label: S85LH P3,P2,Pl ,PO,03,02,Ol ,OO,PGTOI,PLTOI,PEOOI,PGTOO,PLTOO.PEOOO; +The equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC85 is characterized for operation over the full military temperature range of - 55 °C to 125°C. The SN74ASC85is characterized for operation from -40°C to 85°C. PRDDUCTIDI DATA documontl contain information curront os of publication date. Products conform to specifications par the terms af Tuas Instruments :'':!:~~i~a~:~~,; ~=~~i:r :.r:::=~:!~ not Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 75265 4-59 SN54ASC85, SN74ASC85 4·81T MAGNITUDE COMPARATORS FUNCTION TABLE COMPARING INPUTS CASCADING INPUTS OUTPUTS -PEOOO P3.03 P2.02 Pl.0l PO. 00 PGTOI PLTOI PEOOI PGTOO PLTOO P3 > 03 X X X X X X L L P3 < Q3 X X X X X X = = = = Q3 P2 > Q2 X X X X X Q3 P2 < X X X X X Q3 P2 = Q2 P1 > Q1 X X X X Q3 P2 P1 < X X X X = Q3 = Q3 = Q3 = Q3 = Q3 = Q3 = Q3 P2 = Q2 = Q2 = Q2 = Q2 = Q2 = Q2 = Q2 = Q2 P1 = Q1 = Q1 = 0;1 = Q1 = Q1 = Q1 = Q1 PO> QO X X X PO < QO X X X PO = QO = QO = QO = QO = QO H L L L H L H L H L H L H L H L P3 H L H L H L H L H L X X L L H L H L H L L L H H P3 P3 P3 P3 P3 P3 P3 P3 P3 P3 P2 P2 P2 P2 P2 P2 Q2 P1 P1 P1 P1 P1 P1 Q1 PO PO PO PO L L L L L L L L H L L L logic diagram • : A · ::~ Qk A ...m NAA10Wc V e m NA810Lx IVI.... D D (I) !tn J::aL- e .., C if 7 ~ NA310Lx G20 ~ '" C>-- P2 C>- ....... A :~ ;!!!...... NA210Lx .~ e V v ~ "" G ~ 1\0221'" P3 ... NA6,... A V D D A :~ NA210b ~ A NA61OLl\' 02' -.L.J J::aLA ~ NAS1Clx Pl.'" 1V12Cl.K V D A Q30 E Pl.'" A .~ NA210Lx ~ ~ ~ ~ ~ .... ~V ~ V ~ :~ e D ~ ~NMlOLX D 023~ ~NA5IOLX e~ ~:~. -+-'" e D E · e A •e v :'A4}J 1-+ ~ G28 '(~ NA310lx G27~ ~X ~ 4-60 V ~ ~ .. ... TEXAS . . INSTRUMENTS POST OFFICE BOX 656012 • DALLAS, TEXAS 75265 ,...-.!L iV120b v A ... V ~ Pl.TOO SN54ASC85, SN74ASC85 4-81T MAGNITUDE COMPARATORS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage Vee = 5 V. ICC Supply current Vee - 4.5 V to 5.5 V, VI - Vee or 0, TA = MIN or MAX Input capacitance I PQTQI, PLTQI I All Vee = 5 V, Vee = 5 V, = MAX 2.2 3 ns, TA = 25°C 286 0.36 0.36 0.12 0.12 0.37 0.37 13.6 13.6 UNIT V 4768 TA = 25°C tr = tf MAX 2.2 others Equivalent power epd dissipation capacitance t SN74ASC85 TYP TA = 25°C IPEQQI ei SN54ASC85 TYP nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) PARAMETER* FROM (INPUT) TO TEST (OUTPUT) CONDITIONS tpd Pn, Qn tpd Pn, Qn tpd PLTQI, PEQQI tpd PGTQI. PEQQI PGTQO PLTQO tpd PEQQI PEQQO Any Any dtpd SN54ASC85 TYP§ MAX MIN 12 ns (I) 12 25.1 ns 9 19.5 ns 6 5.5 15.9 6 ns 13.2 5.5 14 11.7 3 7.6 3 6.6 0.5 1.1 0.5 1 9 0.3 ns • UNIT 28 21.5 PGTQO, PLTQO PEUQO eL = 0 SN74ASC85 TYP§ MAX MIN 0.3 ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high or high-to-Iow output dtpd '" change in tpd with capacitance §Typical values are at Vee = 5 V, TA = 25°C. NOTE 1: ,These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. ... tn CD CD .c ...caca C DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 75265 4-61 SN54ASC85, SN74ASC85 4·81T MAGNITUDE COMPARATORS HDL FILE BLOCK S85LH; P3 @INPUT; P2 @INPUT; P1 @INPUT; PO @INPUT; Q3 @INPUT; Q2 @INPUT; Q1 @INPUT; QO @INPUT; PGTQI @INPUT; PLTQI @INPUT; PEQQI @INPUT; PGTQO @OUTPUT; PLTQO @OUTPUT; PEQQO @OUTPUT; • 4·62 STRUCTURE A01 A02 A03 A04 G01 G02 G03 G04 G17 G18 G19 G20 G21 G22 G23 G24 G25 G26 G27 G28 G29 G30 G31 G32 G33 G34 END S85LH; :A0221LH :A0221LH :A0221LH :A0221LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA310LH :NA410LH :NA510LH :NA510LH :NA510LH :NA510LH :NA510LH :NA510LH :NA410LH :NA310LH :NA210LH :NA810LH :NA510LH :NA810LH :IV120LH :IV120LH :IV120LH P3,G1 0,G1 0,Q3,A01 0; P2,G20,G20,Q2,A020; P1 ,G30,G30,Q1 ,A030; PO,G40,G40,QO,A040; P3,Q3,G10; P2,Q2,G20; P1,Q1,G30; PO,QO,G40; Q3,G10,G170; Q2,G20,A010,G180; Q1 ,G30,A01 0,A020,G190; QO,G40,A010,A020,A030,G200; A010,A020.A030,A040,PLTQI,G21 0; A010,A020,A030,A040,PEQQI,G220; PEQQI,A040,A030,A020,A010,G230; A040,A030,A020,A010,PGTQI,G240; A030.A020,A010,G40,PO,G250; A020,A01 0,G30,P1 ,G260; A010,G20,P2,G270; G10,P3,G280; G170,G170,G180,G180,G190,G200,G210,G220,G290; A010,A020,A030,A040,PEQQI,G300; G230,G240,G250,G260,G270,G270,G280,G280 ,G31 0; G290,PGTQO; G300,PEQQO; G310,PLTQO; TEXAS . . INSTRUMENTS POST OFF;ICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC85, SN74ASC85 4·81T MAGNITUDE COMPARATORS TYPICAL APPLICATION INFORMATION COMPARISON OF TWO N·BIT WORDS S85LH PO PO P1 P1 P2 P3 p Q PGTOO ___o=-~:,O} a 02 03 P4 P' P6 P .. Q·~NC > PGTQI 00 This application demonstrates how these magnitude comparators can be cascaded to compare longer words. The example illustrated shows the comparison of two 24-bit words; however, the design is expandable to n-bits. As an example, one S85LH macro can be used with five of these 24-bit comparators to expand the word length to 120-bits. Typical comparison times for various word lengths using the S85LH are P2 P3 3 Q3 -- S851H PO P1 COMP WORD LENGTH 1-4 bits 5-24 bits 25-120 bits P2 P7 }p P3 P8 04 PLTOO PLTO) P P>Q 06----'''''-1 00 01 } 06----'''"'-1 02 a 07----'=1 03 3 06--=t.:~ PGTOO :~:-:~:f--~~~~~:~fo'iICciMP--' COMP P1 r-_+-+_+-__ P2 P13 O'L }p P3 -t--'-"-i PLTW P a~03~2 011 010 012 0 3} II ... _ _....J S85lH PO TYPICAL COMPARE TIME 12.5 ns 25.0 ns 37.5 ns P>Q PLTOO PEDQO ~NC ~ I ,",~,03}P fI) COMP PlTQO P"PG"..,'T","al'y> P-O OO} L-+-+____-+_...:~'"':-I a S85LH P>Q IpEDGO ~ a 0 J 013------~~~______~ P-Q t---- P>Q r-t---0~3~3~________ CD CD .c fI) ...caca C 586lH =-=t----1':2{O)"--;CO'iP--l COMP PO P14 P1. P1 P16--1--!...!.j P2 P17--I--~ } p P3 P18-1--'-"--I pQ PGTQO : : 13:}0 018 -----=-e:!.-._____.....J ~~~- S85l.t1 PO COMP P1 P21 --t---:=-i P2 P22 P3 } p P23--t---'-=-i --+---=-1 PLTOI P O < PEOW 01.=:t::~~~ PLTQO PEQQO PGTOO 00 020----=.j 01 021----=-i Q2 Q22---=t 03 Q23----~eL_ _ _ _ _ _ }o H ~ J To high output of tie-off cell, L ~ To low output of tie-off cell, NC ~ no connection. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-63 4-64 SN54ASC86. SN74ASC86 2·INPUT EXCLUSIVE· OR GATES 02939, AUGUST 1986 SystemCell™ 2-"m INTERNAL STANDARD CELL logic symbol • Choice of Three Performance Levels • Specified for Operation Over V CC Range of 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instrument!; Quality and Reliability Vce :=D-- Range of y FUNCTION TABLE INPUTS positive logic equations Y = AeB = AB+AB OUTPUT A B L L Y L L H H H L H H H L description The SN54ASC86 and SN74ASCa6 are 2-input exclusive-OR gate CMOS standard cells each implementing the equivalent of one-fourth of an SN54LS86 or SN74LS86 device. The standard-cell library contains three physical implementations to provide the custom IC designer a choice between three performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell l1ames to develop labels for the design netlist: II ... en FEATURES CEll NAME TYPICAL RELATIVE DELAY CEll AREA Cl - 1 pF TO NA210lH EX210LH 2.3 ns 2 2 ns 2.25 2 ns 2.5 Label: EX2nOLH A.B,Y; EX:z20LH CD CD NEnlsT liDL LABEL EX240LH .s: o ...asas Q The SN54ASC86 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC86 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics EX210lH TEST CONDITIONS PARAMETER TYP Vee = 5 V, TA = 25°e VT Input threshold voltage .lsN54Ase86 Vee = 4.5 V to 5.5 V, V, = Vee or 0, lee Supply current ISN74Ase~6 TA = MIN to MAX ej Input capacitance Equivalent power Cpd dissipation capacitance Vee = 5 V, Vee - 5 V, TA = TA = 25°e 2.2 EX220LH TYP MAX 2.2 218 EX240LH TYP 2.2 252 13.1 MAX V 287 17,2 15.1 UNIT nA 0·19 0.19 0.19 pF 1 1.35 2.55 pF tr - tf - 3 ns, 25°e PRODUCTION DATA .....ments ••ntai. information current as of publicatiDn date. Products conform to specifications per the terms of TaXIS ,nstruments st..ndard warranty. Production p.r~il_!I daes not D8Cassarily include testing ~ all param!"l'r•. MAX Copyright @ 1986, Texas Instruments Incorporated 'TEXAS. INSTRUMENTS POST OFFICE BOX 655012 • DALLA~. TEXAS 75265 4-65 SNs4ASC86, SN74ASC86 2-INPUT EXCLUSIVE-OR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) EX210LH PARAMETERt tpLH tPHL tpLH tpHL .:l.tPLH .:l.tpHL FROM (INPUT) TO (OUTPUT) CONDITIONS A or B V CL = 0 AorB V A or B V TEST CL = 1 pF SN54ASC86 Typf MAX MIN SN74ASC86 Typf MAX MIN 0.8 1.3 1.3 2.5 3.2 0.8 0.5 1.3 1.3 2.3 0.5 1.3 2.3 4.8 2.3 4.4 1 2.3 6 1.4 ;.1 2.3 5.4 0.5 1 2.3 0.5 1 2.~ 0.5 1 2.9 0.5 1 2.5 SN54ASC86 Typf MAX MIN 2.9 UNIT ns ns ns/pF EX220LH PARAMETERt tpLH tpHL • , C ... tpLH tpHL .:l.tpLH .:l.tPHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A or B V CL = 0 A or B V CL = 1 pF A or B V FROM (INPUT) TO (OUTPUT) A or B Y MIN SN74ASC86 Typf MAX 0.7 1.4 2.7 0.8 1.4 2.5 0.5 1.4 3.2 0.5 1.4 2.9 1 1.9 3.8 1.1 1.9 3.5 O.B 0.3 2.1 5 2.1 .4.5 0.5 1.2 0.9 0.3 0.5 1.1 0.3 0.7 1.9 0.3 0.7 1.7 SN54ASC86 MIN Typf MAX MIN 0.8 1.6 3.2 0.9 1.6 2.9 0.5 1.6 3.B 0.6 1.6 3.5 1 1.9 3.8 1.1 1.9 3.5 0.7 2 5 0.8 2 4.4 0.1 0.3 0.4 0.7 1.2 0.1 0.3 0.6 0.2 0.4 1.1 UNIT ns ns ns/pF EX240LH C» C» PARAMETERt tn tpLH ::r tpHL CD CD ...en tpLH tpHL .:l.tpLH .:l.tPHL A or B Y A or B Y TEST CONDITIONS CL CL =0 = 1 pF 0.2 SN74ASC86 Typf MAX UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% pOint of Vo with tr = tf = 3 ns (10% and 90%). tpLH .. propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output .:l.tPLH '" change in tpLH with load capacitance .:l.tpHL '" change in tpHL with load capacitance ~ Typical values are at VCC = 5 V, TA = 25 ac. DESIGN CONSIDERATIONS Refer to Section 7. 4-66 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 15265 SN54ASC109, SN74ASC109 J.j( POSITIVE·EDGE·TRIGGERED FLlp·FLOPS 02939. AUGUST 1986 SystemCell'" 2·llm HARDWIRED MACRO CELL • Provides Complementary Q and QZ Outputs logic symbol t • Positive-Edge Triggered with J and KZ Data ,Inputs PREZ Q J • CLRZ and PREZ Inputs Provide Asynchronous Initialization • J and KZ Inputs Simplify Implementation of lJ CLK Cl KZ Toggle Flip-Flops CLRZ description QZ lK R tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. The SN54ASC109 and SN74ASC109 are dedicated, hardwired. standard-cell macros implementing positive-edge-triggered flip-flops. A low level at the PREZ or CLRZ input controls the state of the outputs regardless of the levels . of the other inputs. When PREZ AND CLRZ are inactive (high), data at the J and KZ inputs meeting the setup time requirements are transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level anq is not directly related to the rise time of the clock transition. Following the hold time interval, data at the J and KZ inputs may be changed without affecting the levels at the outputs. These versatile flip-flops can perform as Ootype flip-flops if J and KZ are tied together. The JK20LH flip-flop implements the function and sequential operation identical to one-half of the 'LS109,'S109, or 'F109 packaged flip-flops. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: • ... u) G) G) .c en ...caca FEATURES NETLIST CELL NAME JKB20LH HDL LABEL Label: JKB20LH CLRZ.PREZ.J.KZ.CLK.O.QZ; MAXIMUM RELATIVE CLOCK CEUAREA FREQUENCY TO NA210LH 44.2 MHz 10 C The SN54ASC109 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC109 is characterized for operation from -40°C to 85°C. FUNCTION TABLE INPUTS OUTPUTS Q QZ PREZ CLRZ CLK J KZ L H X H L L X X X X H X X X L H X I L L H* L H* H I H L TOGGLE I L 00 I H X H H X 00 L L H H H H H H H H H H L H 00 L ao .:tThis configuration is nonstable; that is, it wili not persist when PREZ or ClRZ return to their inactive (high) level. PRODUCTION DATA dilCl...onts ••ntsin infonnation curnmt as of pahlication data. Prodvcts .onform to _ifi..tlon. par theter... of To.as IlIItr....nts standerd warranty. Production PIo....ing doas not n......rily in.lude testing of .11 p.;.mlllan. Copyright @ 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75285 4-67 SN54ASC109, SN74ASC109. J-j{ POSITIVE-EDGE-TRIGGERED FLIP-FLOPS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) f max Clock frequency tw Pulse duration tsu Setup time th MIN 0 9 9 11.4 ClRZ low PREZ low CK High CK low ns 9 3 9.6 PREZ low J or KZ high or low UNIT MHz ns 11.4 I.B -0.4 ClRZ inactive PREZ inactive J or KZ low ClRZlow Hold time MAX 44.2 ns 0 . . elee'''eel eha........tIco VT C ... Input threshold voltage tn Ci :::T CD CD ...en TA Input capacitance PREZ or ClRZ J KZ ClK Equivalent power Cpd dissipation capacitance = 5 V, = 4.5 V to 5.5 V, = MIN to MAX VCC VCC ICC Supply current C» C» SN54ASCOI9 MAX TYP TEST CONDITIONS PARAMETER VCC = 5 V, TA - 25°C V, - VCC or 0, TA VCC = 5 V, TA = 25°C 2.2 tr llBl 3 ns, 70.9 0.25 0.12 0.25 0.12 0.13 = 25°C = tf = SN74ASC019 TYP MAX 2.2 0.13 p.13 0.13 4.81 4.Bl UNIT V nA pF pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tplH tpHl tplH tpHl tplH tpHl tplH tpHl .1tPlH .1tpHl FROM (INPUT) TO (OUTPUT) ClK Q,QZ TEST CONDITIONS Cl PREZ,ClRZ ClK =0 Q,QZ 1.1 2.1 2.1 Q,QZ Cl PREZ,ClRZ Q,QZ Any Q,QZ = SN54ASC109 MIN Typt MAX 1.8 13.5 5 12.2 1.9 4.5 11 2 4.2 1 pF 2.3 1.3 0.2 0.1 2.2 5.5 2.2 1.2 2.3 4.9 5.2 14.6 13.1 4.7 12.2 2.6 0.5 0.4 6.4 1.3 2.5 1.4 0.2 1.2 0.1 t Propagation delay times are measured from the 44% pOint of V, to the 44% point of Vo with tr tplH " propagation delay time, low-to-high-Ievel output tpHl .. propagation delay time, high-to-Iow-Ievel output .1tplH .. change in tplH with load capacitance .1tpHl '" change in tpHl with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. 4-68 SN74ASC109 MIN TYpt MAX 2 11.9 5 2.1 4.5 10.9 ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 ~ 2.2 4.2 2.2 5.5 4.9 4.7 2.6 0.5 0.4 UNIT ns 9.8 4.7 ns 13 11.7 ns 10.9 5.B 1.2 1.1 ns ns/pF = tf = 3 ns 110% and 90%). SN54ASC109, SN74ASC109 J.j( POSITIVE·EDGE·TRIGGERED FLlp·FLOPS DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly with cells and macros available in the TI standard cell library . The inputs can be driven by either noninverting or inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. designing for testability Designs employing storage or bistable elements should consider testability of the design in its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capabilitY to be asynchronously preset or cleared may be connected to the SN54ASC1 09 or SN74ASC1 09 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 II III 4-69 • C I» r+ I» en :::T CD CD r+ til 4-70 SN54ASC137, SN74ASC137 3-L1NE TO B-L1NE DECODERS/DEMULTIPLEXERS WITH ADDRESS LATCHES 02939, AUGUST 1986 SystemCell™ 2-llm SOFTWARE MACRO CELL • Latched Address Lines Ensure Stable Bus Interfaces • Expandable Select Width • Parallel Decoders for Multiple-Bit Words logic symbol t DMUX GLZ description The SN54ASC137 and SN74ASC137 are standard-cell software macros implementing a 3-line to 8-line ,decoder/demultiplexer. The , ASC 137 incorporates a 3-bit latch on the three address inputs to simplify system design, as the data selected is stored and is available until replaced by another selection. The 'ASC 137 implements the full function table identical with that performed by packaged ICs such as the 'LS137. YO l~ A B C Y1 Y2 Y3 Y4 Gl Y5 G2Z Y6 Y7 tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. II When the latch-enable input (GLZ) is low, the 'ASC137 acts as a decoder/demultiplexer. When GLZ goes from low to high, the address present at the select inputs (A, B, and C) is stored in the latches, Further address changes are ignored as long as GLZ remains high. This latching capability makes the' ASC137 ideally suited for implementing stable decoders for strobed (stored-address) applications in bus-oriented systems. en ~ II) II) .c Also provided in the macro are output controls, G1 and G2Z, that enable and disable the outputs when G1 is low or G2Z is high. When enabled (G1 high and G2Z low), the selected output is low, These enables permit the' ASC 137 to be cascaded to accommodate wider multiplexers, as only the enabled 8-bit field will contain an active data bit. The' ASC137 is implemented with standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO, USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pF) CELL AREA tn CO CO ~ o MAXIMUM ICC (nA) SN54ASC' SN74ASC' IVll0LH 0.75 5 3.75 2.2 525 31.6 AN210lH 1.5 5.4 2.31 69.6 1 9 7 1164 N0210LH 6 7 896 54 NA420LH 2.5 8 26 20 7.68 290 149.6 39.75 17.59 TOTALS Label: S137LH C,B,A,GLZ,G2Z,Gl ,YO,Yl ,Y2,Y3,Y4,Y5,Y6,Y6; 2875 305 tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC137 is characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC137 is characterized for operation from -40°C to 85°C. Copyright © 1986, Texas Instruments Incorporated PRODUCTION DATA do.uments .ontaln information currant 8S of publication date. Preducts conform to spacifications par tb. terms of Taxas Instruments ::=~~i~8i:I~1i =~:~ti:; fI~-=:::~::.s not TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-71 SN54ASC137, SN74ASC137 3·L1NE TO B·L1NE DECODERS/DEMULTIPLEXERS WITH ADDRESS LATCHES FUNCTION TABLE' INPUTS ENABLE SELECT C B A OUTPUTS YO Y1 Y2 Y3 Y4 Y5 Y6 Y7 X X X X H H H H H H H H X X X H H H H H H H H H L L L L L H H H L H L L L H H L H H H H H H H H H L H L L H L H H L H H H H H L H L L H H H H H L H H H H L H L H L L H H H H L H H H L H L H L H H H H H H L H H L L H L H H H H H L H H H H H H L L H H H H H H H L X X X GLZ X X G1 X G2Z L L H H L H H H H Output corresponding to stored address - L All others = H logic diagram • v V C ... C» C» v (I) :::T CD CD ...en Y1 Y2 B V v v C V V GLZ G2Z G1 Lx = LH 4-72 VO A TEXAS • INSTRUMENTS POST OFFICE BOX 656012 • DALLAS, TEXAS 75265 Y3 V4 V5 VB Y7 SN54ASC137, SN74ASC137 3-LlNE TO B-LlNE DECODERS/DEMULTIPLEXERS WITH ADDRES$ LATCHES absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER TEST CONDITIONS ~ VT Input threshold voltage VCC ~ 5 V, ICC Supply current VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA ~ MIN to MAX Ci Input capacitance TA VCC ~ 5 V, TA Equivalent power tr VCC - 5 V, ~ TYP ~ ~ MAX 2.2 3 ns, dissipation capacitance t 305 0.25 0.25 0.12 0.12 0.11 0.11 17.59 17.59 UNIT V 2875 25·C tf MAX 2.2 I G2Z Cpd SN74ASC137 TYP 25·C LA,8,C I GLZ,G1 SN54ASC137 nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd A,B,C,GLZ Any tpd G1 or G2Z Any Any Any PARAMETER: ~tpd CL ~ SN54ASC137 TYP§ MAX MIN UNIT 12 25.8 12 .23.3 ns 5 12.3 5 0.7 2.3 11.3 2 ns/pF 0 0.3 SN74ASC137 TYP§ MAX MIN 0.3 0.7 • ... U) ns Q) Q) t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf ~ 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output ~tpd '" change in tpd with load capacitance § Typical values are at VCC ~ 5 V, T A ~ 25 'c. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. .c en ...caca C DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for a reference. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-73 SN54ASC137, SN74ASC137 3·L1NE TO B·L1NE DECODERS/DEMULTIPLEXERS WITH ADDRESS LATCHES HDL FILE BLOCK S 137LH; C @INPUT; B @INPUT; A @INPUT; GLZ @INPUT; @INPUT; G2Z G1 @INPUT; YO @OUTPUT; Y1 @OUTPUT; Y2 @OUTPUT; Y3 @OUTPUT; Y4 @OUTPUT; Y5 @OUTPUT; Y6 @OUTPUT; Y7 @OUTPUT; • ...'C" 'tn" ::T CD CD ... en 4-74 STRUCTURE AN1 AN2 AN3, AN4 AN5 AN6 INV1 INV2 INV3, INV4 INV5 NAl NA2 NA3 NA4 NA5 NA6 NA7 NA8 N01 N02 N03 N04 N05 N06 N07 END S137LH; :AN210LH :AN210LH :AN210LH :AN210LH :AN210LH :AN210LH :IV110LH :IV110LH :IVll0LH :IVll0LH :IV110LH :NA420LH :NA420LH :NA420LH :NA420LH :NA420LH :NA420LH :NA420LH :NA420LH :N0210LH :N0210LH :N0210LH :N0210LH :N0210LH :N0210LH :N0210LH AN,GLP,LlAP; A,GLP,LlAN; BN,GLP,LlBP; B,GLP,LlBN; CN,GLP,LlCP; C,GLP,lICN; A,AN; B,BN; C,CN; GLZ,GLP; G1,IV50; LOAD,LOBN,LOCN,OC, YO; LOAP,LOBN,LOCN,OC,Y1 ; LOAN,LOBP ,LOCN,OC, Y2; LOAP,LOBP,LOCN,OC,Y3; LOAN,LOBN,LOCP,OC,Y4; LOAP,LOBN,LOCP,OC,Y5; LOAN,LOBP,LOCP,OC, Y6; LOAP,LOBP,LOCP,OC,Y7; LlAP,LOAN,LOAP; LOAP,LlAN,LOAN; LlBP,LOBN,LOBP; LOBP,LlBN,LOBN; LlCP,LOCN,LOCP; LOCP,LlCN,LOCN; G2Z,IV50,OC; TEXAS ..Jf INSTRUMENTS POST OFFICE BOX 655012 •. DALLAS, TEXAS 75266 SN54ASC137, SN74ASC137 3·L1NE TO B·L1NE DECODERS/DEMULTIPLEXERS WITH ADDRESS LATCHES Dedicated 2·line to 4-line decoder cells (' ASC2350) are also available in the standard cell library for implementing small data-path decoders. Two predesigned cells, designated as the DE210LH and the DE212LH, are offered. The DE212LH cell incorporates an enable input that can be used for expanding the word width. Latch cells can be added at the select inputs to facilitate storage. These hardwired cells should be considered if the decoder is in a critical path, as their performance is predetermined as specified in their switching characteristics. interfacing the macro Inputs and outputs of the predesigned macro are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven by either inverting or non inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the non inverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. • ...en Q) Q) .c en ...caca C TEXAS • INSTRUMENTS POST OFFICE BOX 665012 • DALLAS, TEXAS 75265 4·75 II ...C I» I» en ::r CD CD ... CIl 4-76 SN54ASC13B, SN74ASC13B 3-UNE TO B-UNE DECODERS/DEMULTIPLEXERS 02939, AUGUST 1986 SystemCell™ 2-llm SOFTWARE MACRO CELL logic symbol t • Three Enable Inputs for Expandability • Choice of an Active-High or Two ActiveLow Enables • DMUX JG~ A Parallel Decoders for Multiple-Bit Words C vo VI V2 V3 description V4 & The SN54ASC138 and SN74ASC138 are standard-cell software macros implementing a 3-line to 8-line decoder/demultiplexer. The , ASC 1 38 implements the full function table identical with that performed by packaged ICs such as the 'lS138, 'S138, and 'F138, Gl V5 G2A2 V6 G2BZ V7 tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Also provided in the macro are strobe inputs G1, G2AZ, and G2BZ, which enable and disable the inputs. All of the outputs are high, disabled, unless G1 is high and unless G2AZ and G2BZ are low, enabling the outputs. When enabled the selected output assumes a lOW-logic level. These strobes also permit the 'ASC 138 to be cascaded to accommodate wider multiplexers, as only the enabled 8-bit field will contain an active data bit. The' ASC138 is implemented with the standard cell functions indicated. The HDl netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USEO TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pFI CELL AREA SN54ASC' 1 1 0.44 105 6.32 IV120LH 1 6 6 4.8 786 47.1 N0330LH 2.75 1 312 18.7 2.5 8 2.75 20 29.75 0.85 NA420LH 7.68 2496 149.6 13.77 3699 222 TOTALS 16 U) CD CD SN74ASC' 0.75 \ill ... MAXIMUM ICC (nA) IV110LH a .c U) ...caca C Label: S 138LH G l.G2AZ,G2BZ,A,B.C, YO, Y1. Y2, Y3, Y 4, Y5, Y6, Y7; :l:The equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC138is characterized for operation over the full military temperature range of - 55 °C to 125°C. The SN74ASC138 is characterized for operation from -40°C to 85°C. PRODUCTION DATA documents contain information currant 8S of publication data. Products conform to specifications par the terms of TUI. Instruments :'~:::=i~air::I~1i ~=:~~; :'~D:=:=::':' not Copyright @ 1986. Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 76265 4-77 SN54ASC13B. SN74ASC13B 3·LlNE TO B·LlNE DECODERS/DEMULTIPLEXERS FUNCTION TABLE INPUTS ENABLE G1 G2AZ G2BZ C X X H X X H X X L X X X H L L L H L L L H L L L H L L L H L L H H L L H H L L H H L L H OUTPUTS SELECT B X X X L L H H A X VO H V1 H V2 H X X H H L H H H H H H H H H H L H H H H H H H H H H L H H H H H L H L H L H L H L L H H V3 H H H H H H L V4 H H H H H H H V5 H H H H H H H H H H H L H H H H V6 H V7 H L H H H H H H H H H H H H H H H H H H H H L L logic diagram (positive logic) A NA420Lx B liliiiio :::~~--------------------------~~ C 0 Y y YO 001 NA420Lx v m r+ y m rn :s- Y CD CD VI V2 va r+ (I) y V4 Y A V B V c G16 Lx = LH for 4-78 2-~m G18 standard cells. . TEXAS. INSTRUMENTS POST OFFICE BOX 665012 • DALLAS, TEXAS 75265 V7 SN54ASC13B, SN74ASC13B 3-LlNE TO B-LlNE DECODERS/DEMULTIPLEXERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage Vec - 5 V, ICC Supply current Vce - 4.5 V to 5.5 V, VI - VCC or 0, TA = MIN to MAX Ci Input capacitance Cpd I A,8,C LGl I G2AZ,G2BZ Vec = Vec - 5 V, dissipation capacitance t TA = SN74ASC138 TYP lYP TA = MAX 2.2 TA - 25°C 5 V, Equivalent power SN54ASC138 MAX 2.2 V 222 3699 25°C tr - tf - 3 ns, 25°C 0.24 0.24 0.12 0.12 0.35 0.35 13.8 13.8 UNIT nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 11 PARAMETER* tpd FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A,B,C (;1, (;2AZ, tpd Atpd or G2BZ Any SN54ASC138 TYP§ MAX MIN Any Any CL =0 Any 0.3 SN74ASC138 TYP§ MAX UNIT MIN 4 8.1 4 7.5 ns 7 13.2 7 12.2 ns 2.3 0.7 2 0.7 *Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr 0.3 = tf = nsipF • 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high·level or high-to-Iow-Ievel output Atpd '" change in tpd with load capacitance §Typical values are at Vec = 5 V, TA = 25°C. NOTE 1: These switching ·characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses aetut'l interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TexAs 75265 4-79 SN54ASC138. SN74ASC138 3·LlNE TO 8·LlNE DECODERS/DEMULTIPLEXERS HDL FILE BLOCK S138LH; G1 @INPUT; G2AZ @INPUT; G2BZ @INPUT; A @INPUT; B @INPUT; . C @INPUT; YO @OUTPUT; Y1 @OUTPUT; Y2 @OUTPUT; Y3 @OUTPUT; Y4 @OUTPUT; Y5 @OUTPUT; Y6 @OUTPUT; Y7 @OUTPUT; STRUCTURE G01 G02 G03 G04 G05 G06 G07 G08 G09 G10 G11 G12 G13 G14 G15 G16 END S138LH: II ...C I» I» (I) ::r CD CD ... (I) :NA420LH :NA420LH :NA420LH :NA420LH :NA420LH :NA420LH :NA420LH :NA420LH :IV110LH :N0330LH :IV120LH :IV120LH :IV120LH :IV120LH :IV120LH :IV120LH ' G110,G1'30,G150,G100,YO; G120,G130,G150,G100,Y1; G110,G140,.G150,G100,Y2; G120,G140,G150,G100,Y3; G110,G130,G160,G100,Y4; G130,G160,G120,G100,Y5; G110,G160,G140,G100,Y6; G100,G120,G140,G160,Y7; G1,G090; G090,G2AZ,G2BZ,G 100; A,G110; G110,G120; B,G130; G130,G140; C,G150; G150,G160; Dedicated 2·line to 4·line decoder cells (' ASC2350) are also available in the standard cell library for implementing small, data-path decoders. Two predesigned cells, designated as the DE210LH and the DE212LH, are offered. The DE212LH cell incorporates an enable input that can be used for expanding the word width~ Latch cells can be added at the select inputs to implement storage. These hardwired cells should be considered if the decoder is in a critical path, as their performance is predetermined as specified in their switching characteristics. interfacing the macro Inputs and outputs of the predesigned macro are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven by either inverting or non inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. 4-80 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 76266 SN54ASC139, SN74ASC139 DUAL 2·UNE TO 4·UNE DECODERS/DEMULTIPLEXERS SystemCell™ 2·/lm SOFTWARE MACRO CELL • Enable Input Permits Expansion of Each Decoder • Parallel Decoders for Multiple Bit Words logic symbol t Yl0 Al Yll Bl description Y12 G1Z Y13 The SN54ASC139 and SN74ASC139 are standard-cell software macros implementing dual 2-line to 4-line decoders/demultiplexers. The' ASC139 implements the full function table identical with that performed by packaged ICs such as the 'lS139A, 'S139, and 'F139. Y20 A2 Y21 B2 Y22 G2Z Y23 Also provided in the macro are two strobe inputs G1Z and G2Z that enable and disable the tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and outputs. The four outputs of a decoder are high lEe Publication 617-12. when its corresponding strobe is high. When the strobe is low, the selected output is low. These strobes, G 1Z for decoder 1 and G2Z for decoder 2, permit the' ASC139 decoders to be cascaded to accommodate wider multiplexers, as only the enabled 4-bit field will contain an active data bit. The' ASC139 is implemented with the standard cell functions indicated. The HDl netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TOTAL TOTAL RELATIVE Cpd* (pF) CELL AREA TO NA210LH IV110LH 0.75 8 6 IV120LH 1 2 2 NA320LH 2 TOTALS 3.52 1.6 .s:::: fn SN74ASC' 840 50.56 262 15.7 8 16 7.52 2040 122.4 18 24 12.64 3142 189 fI) G) G) MAXIMUM ICC InA) SN54ASC' .... ....asas C Label: S139LH Al,81.G1Z.A2.B2.G2Z.Yl0,Yl1.Y12,Y13.Y20,Y21.Y22.Y23; tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC139 is characterized for operation over the full military temperature range of -.55 °C to 125°C. The SN74ASC139 is characterized for operation from -40°C to 85°C. FUNCTION TABLE INPUTS ENABLE PRODUCTION DATA documaida •••tai. Infonaotio•. • urra.t I. 01 publi..tlo. dlta. Prod.cts .onfona to .paeili.oti••• po, tho tarm. 01 Ten. Inll,"",101I :=il;"f.':t"::li ~,=:~ti:r ru==~ not OUTPUTS SELECT GnZ Bn An YnO Yn1 Yn2 Yn3 H X X H H H H L L L L H H L L L H H H H H L H H L H L H H H H H L L H Copyright @ 1986. Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-81 SN54ASC139. SN74ASC139 DUAL 2·UNE TO 4·UNE DECODERS/DEMULTIPLEXERS A NA320Lx B 1V12Olx Y G1Z C 011 Y10 Ole A NA320lx Y B C 017 Y11 A NA32Ol.x Y C 018 Al A 'NA32Olx Y I 81 Y12 Y Y A C 01. Y13Z G16 A NA3ZOl.x Y 1V12Olx O2Z A Y C 021 G2e A NA3ZOl.x Y B C 027 Y20 Y21Z A NA3ZOl.x Y C ... I» I» en ::r C A2 028 A NA32Ol.x Y B2 Y c 02. CD !. en 4·82 Y22 Y TEXAS. INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 Y23 SN54ASC139, SN74ASC139 DUAL 2-LlNE TO 4-LlNE DECODERS/DEMULTIPLEXERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci Input capacitance I I Equivalent power Cpd TEST CONDITIONS SN54ASC139 SN74ASC139 TYP TYP VCC = 5 V, TA = 25°C VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA = MIN to MAX An,8n GnZ VC.C = 5 V, TA VCC = 5 V, tr = = MAX 2.2 MAX 2.2 V 3142 25°C tf = 3 ns, dissipation capacitance t 189 0.12 0.12 0.24 0.24 12.64 12.64 UNIT nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) FROM TO TEST (lNPUTI (OUTPUT) CONDITIONS tpd An or Bn Any tpd GnZ Any .:l.tpd Any Any PARAMETER* SN54ASC139 TYP§ MAX MIN UNIT ns 4 B.1 4 7.5 3 5.2 3 4.B ns 0.6 1.8 0.6 1.5 nsipF CL = 0 0.3 SN74ASC139 TYP§ MAX MIN 0.3 II .... CI) Q) Q) *Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%1. tpd ill!! propagation delay time, low-ta-high or high-to-Iow-Ievel output .:l.tpd '" change in tpd with load capacitance §Typical values are at VCC = 5 V, TA = 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. .c en ....asas C DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. The HDL for this soft macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS . " INSTRUMENTS POST OFFICE BOX 656012 • DALLAS, TEXAS 75265 4-83 SN54ASC139. SN14~SC139 DUAL 2·UNE TO 4·LlNE DECODERS/DEMULTIPLEXERS Hol FILE BLOCK S 139LH; ': " A1 @INPUT; B1 @INPUT; G1Z @INPUT; A2 @INPUT; B2 @!NPUT; G2Z @INpUT; Y10 @OUTPUT; Y11 @OUTPUT; Y12 @OUTPUT; Y13 @OUTPUT; Y20 @OUTPUT; Y21 @bUTPUT; Y22 @OUTPUT; Y23 @OUTPUT; STRUCTURE Gi1 G12 G13 G14 G15 G16 G17 G18 G19 G21 G22 G23 G24 G25 G26 G27 G28 G29 END S139LH; :IV120LH :IV110LH :IV110LH :IV110LH :IV110LH :NA320LH :NA320LH :NA320LH :NA320LH :IV120LH :IVl10LH :IV110LH :IV110LH :IV110LH :NA320LH :NA320LH :NA320LH :NA320LH G1Z,G110; A1,G120; B1,G130; G120,G140; G130,G150; G120,G130,G110,Y10; G11 O,G130,G140,Y11; G110,G120,G150,Y12; G11O,G140,G150,Y13; G2Z,G210; A2,G220; B2,G230; G220,G240; G230,G250; G220,G230,G21 0, Y20; G210,G230,G240,Y21; G210,G220,G250,Y22; G210,G240,G250,Y23; Dedicated 2-line to 4-line decoder cells (' ASC2350) are aiso available in the standard cell library for implementing small, data-path decoders. Two predesigned cells, designated as the bE210LH and the DE212LH, are offered. The DE212LH cell incorporates an enable input that can be used for expanding the word width. Latch cells can be added at the select inputs to facilitate storage. These hard-wired cells should be considered if the decoder is in a critical path, as their performance is predetermined as specified in their switching characteristics. interfacing the macro Inputs and outputs Qf the predesigned macro are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven by either noninverting or inverting input cells when interfacing off-chip forthe input data words. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. 4-84 -n- ~ It:J(AS INSTRUMENTS post OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC151, SN74ASC151 B-L1NE TO 1-L1NE MULTIPLEXERS D2939, AUGUST 1986 SystemCelI™ 2-f.lm SOFTWARE MACRO CELL • Active-Low Strobe for Expandability • Use Parallel Multiplexers for Multiple-Bit Words logic symbol t MUX GZ A description B C The SN54ASC151 and SN74ASC151 are standard-cell software macros implementing 8-line to 1-line multiplexers, The 'ASC 1 51 implements a function table identical with that performed by packaged 'HC 151, 'LS 151, 'S151, and 'F151 multiplexers. 00 y 01 02 2 03 04 3 4 05 5 w The macro has a strobe input, GZ, that enables 6 06 and disables the inputs. The Y output is low and 07 7 the W output is high when GZ is high. When GZ is low, the Y output assumes the level of the tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and selected input and the W output assumes the IEC Publication 617-12. complement of that level. This strobe permits the macro to be employed for designing wider multiplexers, as only the enabled 8-bit field will output an active data bit, The' ASC 151 is implemented with standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USEO TOTAL TOTAL RELATIVE SN54ASC' CELL AREA IVll0LH 0.75 3 2.25 1.32 310 19 IV120LH 1 5 5 4 655 39.3 NA510LH 1.75 8 14 4.16 1704 102.4 NA810LH 2.5 1 2.5 0.61 290 17.4 10.09 2964 179 TO NA210LH TOTALS 23.75 17 Label: S151 LH GZ,A,B,C,00,01,02,03,04,D5,D6,D7,Y,W; U) Q) Q) .s:: MAXIMUM ICC (nA) Cpd* (pF) III ... fJ) ... SN74ASC' a:I a:I C tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC151 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC151 is characterized for operation from -40 DC to 85 DC. PRODUCTION DATA documents contein information currant 8S of publication data. Products conform to specifications par the terms of Texas Instruments ==~~i~ar::,~1i ~:~:~ti:r ~~o:::~9t:~~s not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-85 SN54ASC151, SN74ASC151 8·L1NE TO 1·L1NE MULTIPLEXERS FUNCTION TABLE INPUTS STROBE SELECT OUTPUTS GZ y W x A X H L H L L L L L H L H L L L L 00 00 01 i5T 02 02 03 03 04 04 05 05 06 06 07 07 C B x L L H H H L L L H L H L H H L L H H H L See explanation of Function Tables in Section 1. DO, 01 .. . 07 :::: the level of the respective D input. logic diagram c g) r+ g) en 07 ::::r CD CD r+ 06 en d. 0' 0 ~""-'-----;::::>W 03 02 D1 DO GZ INV7 4-86 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC151. SN74ASC151 B-LlNE TO 1-LlNE MULTIPLEXERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT 'TEST CONDITIONS Input threshold voltage ei Vee = TA I GZ Input capacitance I All other inputs Equivalent power Cpd dissipation capacitance t t The = = Vee ICC Supply current 4.5 V to 5.5 V, VI TYP = 5 V, TA Vee = 5 V, tr = = 3 ns, 25°C MAX 2.2 179 0.24 0.24 0.12 0.12 10.09 10.09 UNIT V 2964 25°C = tf = MAX 2.2 MIN or MAX Vee TA SN74ASC151 TYP = 25°C = Vee or 0, TA 5 V, SN54ASC151 nA pF pF equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) PARAMETER* tpd tpd tpd tpd tpd tpd FROM TO TEST IINPUT) IOUTPUT) CONDITIONS A,B,ore AnyD GZ SN54ASC151 TYP§ MAX MIN SN74ASC151 TYP§ MAX Y 7 16.5 7 14.B W B 17.5 B 15.B 4 10.1 4 8.9 4.5 11.1 4.5 9.9 5.5 12.7 5.5 11.3 Y W eL = a Y W UNIT MIN 6 13.7 6 12.3 l>tpd Any Y 0.6 2.6 B.7 0.6 2.6 7.5 l>tpd Any W 0.3 0.5 1.1 0.3 0.5 1 ns ns ns ns/pF tpropagation delay times are measured from the 44% pOint of VI to the 44% point of Vo with tr = tf = 3 ns 110% and 90%). tpd '" propagation delay time, low-to-high or high-to·low-Ievel output .6.tpd change in tpd with load capacitance § Typical values are at Vee = 5 V, T A = 25°C. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. II... U) Q) Q) .s:. en ...asas 0 = DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference, TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-87 SN54ASC151, SN74ASC151 B·LlNE TO 1·LlNE MULTIPLEXERS . HOL FILE BLOCK S151 LH; GZ @INPUT; A @INPUT; B @INPUT; C @INPUT; DO @INPUT; 01 @INPUT; 02 @INPUT; 03 @INPUT; 04 @INPUT; 05 @INPUT; 06 @INPUT 07 @INPUT; Y @OUTPUT; W @OUTPUT; STRUCTURE GOl G02 G03 G04 G05 G06 G07 G08 GOS INVl INV2 INV3 INV4 INV5 INV6 INV7 INV8 END S151LH; II C I» r+ I» en ::T CD CD r+ (I) :NA510LH :NA510LH :NA510LH :NA510LH :NA510LH :NA510LH :NA510LH :NA510LH :NA810LH :IV110LH :IV110LH :IV110LH :IV120LH :IV120LH :IV120LH :IV120LH :IV120LH CZ,BZ;AZ,DO,INV70,UO; CZ,BZ,AT,Dl ,INV70,Ul; CZ,BT,AZ,D2,INV70,U2; CZ,BT,AT,D3,INV70,U3; CT,BZ,AZ,D4,INV70,U4; CT,BZ,AT,D5,INV70,U5; CT,BT,AZ,D6,INV70,U6; CT,Bi,AT,D7,INV70,U7; U7 ,U6,U5,U4,U3,U2,U 1,UO, Y; A,AZ; B,BZ; C,CZ; AZ,AT; BZ,BT; CZ,CT; GZ,INV70; Y,W; Dedicated 8-line to l-line multiplexers (' ASC2342) are also available in the standard celi library for implementing data-path multiplexers. The' ASC2342 cell incorporates an enable input that can be used for expanding the word width. These hardwired celis should be considered if the multiplexer is in a critical path, as their performance is predetermined as specified in their switching characteristics. interfacing the macro Inputs and outputs of the pre designed macro are compatible for interfacing directly with celis and macros available in the TI standard celi library. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. If bus interface is needed, the' ASC251 8-line to l-line multiplexer incorporates 3-state outputs capable of driving internal data buses. 4-88 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 SN54ASC153, SN74ASC153 DUAL 4-LlNE TO '-LiNE MULTIPLEXERS 02939. AUGUST 1986 SystemCell™ 2-"m SOFTWARE MACRO CELL logic symbol t • Active-Low Strobe for Expandability • Use Parallel Multiplexers for Multiple-Bit Words A description B The SN54ASC153 and SN74ASC153 are standard-cell software macros implementing dual 4-line to 1-line multiplexers. The' ASC 153 implements a function table identical with that performed by packaged 'HC153, 'LS153, 'S153, and 'F153 multiplexers. Each 4-bit half of the macro has a strobe input that enables and disables its associated inputs. The Yn output is low when GnZ is high. When GnZ is low, the output assumes the level of the selected input. These strobes permit the macro to be employed for designing wider multiplexers, as only the enabled 4-bit field will output an active data bit. The 'ASC 153 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED GIZ Cl0 VI Cll C12 C13 G2Z C20 V2 C21 C22 C23 U) TOTAL TOTAL RELATIVE CELL AREA 0.75 6 4.5 2.64 630 NA410LH 1.5 8 12 4 1496 38 89.6 NA420LH 2.5 2 5 1.92 624 37.4 16 21.5 8.56 2750 165 TO NA210LH TOTALS Q) Q) ~ MAXIMUM ICC InA) Cpd* IpFI IVll0LH II ... tThis symbol is in accordance with ANSI/IEEE SId 91-1984 and IEC Publication 617-12. SN54ASC' tn ...caca SN74ASC' C Label: S153LH Gl Z,G2Z,A,B,Cl O.Cll ,CI2,CI3,C20,C21 ,C22,C23, Yl.Y2; :tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC153 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ASC153 is characterized for operation from -40°C to 85°C. FUNCTION TABLE INPUTS SELECT C2 OUTPUT GnZ Y X H L L L H A CO X X X X X X L L L X X Cl C3 L L H X X X L L H X L X X L L L H X H X X L H H L X X L X L L H H L H X X H X H X X X L L L H H X X X H L H PRODUCTION DATA documents contein information currant 81 of publication data. Producta conform to specifications per thl terms of Taxa. Instruments ::~:~~i~a{nr:l:ri STROBE DATA B ==::i:; 1i~o:.a::::t::I~S not L Copyright © 1986, Texas Instruments Incorporated TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-89 SN54ASC153, SN74ASC153 DUAL 4·LINE. TO 1·LlNE MULTIPLEXERS logic diagram 1V11OLx G1Z A V INV7 C10 C11 V V1 C12 C13 B II C m m tn V A C20 r+ C21 :::r CD CD r+ en v C22 C23 B 1V11OLx G2Z C V A 0 INVS 4-90 ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 ~ DALLAS. Tf;XAS 75265 Y2 SN54ASC153, SN74ASC153 DUAL 4-LlNE TO 1-LlNE MULTILPLEXERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER Input threshold voltage Vee ~ 5 V. lee Supply current 4.5 V to 5.5 V. VI Vee TA ~ MIN or MAX ei epd Input capacitance Vee - 5 V, TA - 25°e Equivalent power Vee ~ 5 V, tr dissipation capacitance t TA ~ tf ~ TYP 2.2 Vee or O. ~ MAX TYP TA ~ 25°e VT SN74ASC153 SN54ASC153 TEST CONDITIONS MAX 165 2750 3 ns, UNIT V 2.2 nA 0.12 0.12 pF 8.56 8.56 pF 25°e t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (See Note 1) PARAMETER* FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd A or B Y tpd Anye Y tpd G1Z or G2Z Y Any Y 4tpd SN54ASC153 TYP§ MAX MIN UNIT 8 13.7 8 12.4 ns 4 7.1 4 6.3 ns 6.5 10.4 6.5 9.3 0.7 2.3 0.7 2 eL ~ 0 0.3 SN74ASC153 TYP§ MAX MIN 0.3 ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf ~ 3 ns (10%and 90%). tpd '" propagation delay time, low-to-high or high-to-Iow-Ievel output Atpd :;;:;; change in tpd with load capacitance §Typical values are at Vee ~ 5 V, T A ~ 25 ce. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. • ... U) CD CD .c en ...caca C DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this soft macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS .. TEXAS 75265 4-91 SN54ASC153, SN74ASC153 DUAL 4·LlNE TO 1·LlNE MULTIPLEXERS HDL FILE BLOCK S 1 53LH; G1Z @INPUT; G2Z @INPUT; A @INPUT; B @INPUT; Cl0 @INPUT; ell @INPUT; C12 @INPUT; C13 @INP\JT; C20 @INPUT; C2l @INPUT; C22 @INPUT; C23 @INPUT; Yl @OUTPUT; Y2 @OUTPUT; STRUCTURE GOl G02 GQ3 G04 G05 GOB G07 GOB G09 Gl0 INVl INV2 INV4 INV5 INV7 INVB END S153LH; C ...mm en :::r CD CD ...en. :NA4l0LH :NA410LH :NA4l0LH :NA4l0LH :NA4l0LH :NA4l0LH :NA4l0LH :NA4l0LH :NA420LH :NA420LH :IV110LH :IVll0LH :IVll0LH :IVll0LH :IVll0LH :IVll0LH STBl Z,BZ,AZ,ClO,Ul0; STBl Z,BZ,AT,Cll ,Ull; STB1Z,BT,AZ,C12,U12; STBl Z,BT,AT,C13,U13; C20, BZ,AZ,STB2Z, U20; C2l,BZ,AT,STB2Z,U2l; C22,BT,AZ,STB2Z,U22; C23,BT,ZT,STB2Z,U23; Ul0,U11 ,U12,U13,Yl; U20,U2l,U22,U23,Y2; A,AZ; B,BZ; AZ,AT; BZ,BT; G1Z,STB1Z; G2Z,STB2Z; Dedicated 4-line to l-line multiplexers ('SC2341) are also available in the standard cell library for implementing data-path multiplexers. These hardwirt;!d cells should be considered if the multiplexer is in a critical path, as their performance is predeterminecl as specified in their switching characteristics. interfacing the macro Inputs and outputs of the predesi9ned macro are compatible for interfacing directly with cells and macros a·vailable in the TI standard cell library. The inputs can be driven by either inverting or nOl'1inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. 4-92 TEXAS . " INSTRUMENTS . POST OFFICE BOX 666012 • DALLAS. TeXAS 75265 SN54ASC155, SN74ASC155 DUAL 2·LlNE TO 4·LlNE DECODERS/DEMULTIPLEXERS WITH DATA AND ENABLE LINES 02939. AUGUST 1986 • SystemCell™ 2·llm SOFTWARE MACRO CELL • Enable Input Permits Expansion of Each Decoder • Individual Data Inputs to Each 4-Line Decoder • logic symbol t O} 0 A .., G - 1 B Parallel Decoders for Multiple Bit Words 3 r DMUX description The SN54ASC155 and SN74ASC155 are standard-cell software macros implementing 8-line or dual 4-line decoders/demultiplexers. The 'ASC155 implements the full function table identical with that performed by packaged ICs such as the 'LS 155A. G1Z " Cl G4 4 0. . . Yl0 1 Yll 2 Y12 Y13 3 G2Z r-- C2Z .... ~ Y20 Y21 ====--- Y22 The A and B inputs are common to the two Y23 sections of the macro and select one of the four outputs in each section. Each section has a C tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. input ANDed with a G input and for 4·line demultiplexer applications, a choice can be made in the use of these inputs as strobe and data inputs. In Section 1, when C1 is high the selected output assumes the level of G1 Z, or to view this another way, when G 1Z is low the selected output assumes the complement of the level of C 1 . In Section 2, C2Z and G2Z are interchangeable. When both are low, the selected output is low. When one of them is high, all outputs are high. Because the active levels of C1 and C2Z are complementary, they can be connected together in 3-line to 8-line decoder or 1-line to 8-line demultiplexer applications to serve as the third (C) select line with A and B. G1 Z and G2Z are connected together as the active-low strobe or data line. II The' ASC155 is implemented with the standard cell functions indicated. The HDL neWst label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE CELL AREA Cpd* (pFI SN54ASC' MAXIMUM ICC (nAI SN74ASC' IV110LH 0.75 1 0.75 0.44 105 6.32 IV120LH 4 8 4 16 3.2 7.52 524 2040 31.4 NA320LH 1 2 N0220LH 1.5· 2 3 1.04 15 23.75 12.2 370 3039 TOTALS 122.4 22.2 183 Label: S155LH C1.G1Z.C2Z.G2Z.A.B.Y10.Y11.Y12.Y13.Y20.Y21.Y22.Y23; tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC155 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC155 is characterized for operation from -40°C to 85°C. PRODUCTION DATA documants contain information currant as of publication date. Products conform to specifications par the terms of Texas Instruments :'~~=~~i~l{nr:I~1i ~=:i~~ti:r :.~o::::::9t::.s not Copyright TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 © 1986, Texas Instruments Incorporated 4-93 SN54ASC155, SN74ASC155 DUAL 2·LlNE TO 4·LlNE DECODERS/DEMULTIPLEXERS WITH DATA AND ENABLE LINES FUNCTION TABLES FUNCTION TABLE 2-LlNE-TO-4-LlNE DECODER 3-LlNE-TO-B-LlNE DECODER OR 1-LlNE-TO-4-LlIliE DEMULTIPLEXER INPUTS SELECT STROBE B DATA Yl0 Yll Y12 INPUTS Y13 SELECT OUTPUTS STROBE (01 (11 (21 (31 (41 (61 (71 G1Z X X H X H H H H Ct B A G* L L L H L H H H X X X H H H H H H H H H L H L H H L H H L L L L L H H H H H H H H L L H H H L H L L H L H L H H H H H H H H L H H .H H L L H L L H H L H H H H H X X X L H H H H L H H L H H H L H H H H H L L L H H H H L H H H H L H L H H H H H L H H H H L L H H H H H H L H H H H L H H H H H H H L Cl OUTPUTS DATA SELECT STROBE B A G2Z C2Z X X H X Y20 Y21 H H Y22 Y23 H H L L L L L H H H L H L L H L H H H L L L H H L H H H L L H H H L X X X H H H H H OR DATA Y20Y21 Y22Y23Yl0Yll Y12Y13 t C = inputs C 1 and C2Z connected together :1:(3 = inputs G1Z and G2Z connected together logic diagram A NA320lx B C Y10 G1Z Y11 C1 Y12 NA3 1V120lx A A NA320lx B NA4 C Y Y13 A B B C Y20 Y G2Z NA6 C2Z 4-94 (51 A INPUTS • OR 1-LINE-TO-B-LlNE DEMULTIPLEXER OUTPUTS B NA7 C A NA320lx B NA6 C TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Y Y Y21 Y22 Y23 SN54ASC155. SN74ASC155 DUAL 2·LlNE TO 4·LlNE DECODERS/DEMULTIPLEXERS WITH DATA AND ENABLE LINES absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT ICC Ci Cpd VCC = 5 V. Input threshold voltage TA TYP = 25°C TA Input capacitance I A, B I Cl I C2Z, = 5 V, TA = 25°C GnZ = 5 V, = 25°C Equivalent power VCC dissipation capacitance t TA tr TYP MAX 183 = tf = 3 ns, 0.24 0.24 0.12 0.12 0.24 0.24 12.2 12.2 UNIT V 2.2 3039 = MIN to MAX VCC MAX 2.2 VCC - 4.5 V to 5.5 V, VI - VCC or 0, Supply current SN74ASC155 SN54ASC155 TEST CONDITIONS nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) PARAMETER' FROM TO tpd A or B Any tpd GnZ or Cn Any Yn Any Any Ll.tpd TEST CONDITIONS SN54ASC155 TYP§ MAX MIN 4 7.5 5 B.6 0.6 1.8 CL = 0 0.3 SN74ASC155 TYP§ MAX UNIT 4 6.9 ns 5 B.l ns 0.6 1.5 ns/pF MIN 0.3 II ... CI) tate outputs capable of driving internal data buses. 4-100 TEXAS . " INSTRUMENT::; POST OFFICE BOX 655012 • DALLAS. T~XAS 76265 SN54ASC158. SN74ASC158 QUADRUPLE 2·LlNE TO 1·LlNE INVERTING MULTIPLEXERS 02939. AUGUST 1986 SysternCell™ 2·j.lm SOFTWARE MACRO CELL • Active-Low Strobe for Expandability • Use Parallel Multiplexers for Multiple-Bit Words logic symbol t description A1 The SN54ASC158 and SN74ASC158 are standard-cell software macros implementing four 2-line to 1-line multiplexers. The 'ASC158 implements a function table identical with that performed by packaged 'HC158, 'lS158, 'S 158, and 'F158 multiplexers. Y1 B1 A2 Y2 B2 A3 B3 Y3 A4 Y4 The macro has a strobe input, GZ, that enables B4 and disables the outputs. The Y output is forced high when GZ is high. When GZ is low, the tTl,is symbol is in accordance with ANSI/IEEE Std 91-1984 and output assumes the complement of the level of lEe Publication 617·12. . the selected input. This strobe permits the macro to be employed for designing wider multiplexers, as only the enabled 2-bit field will output an active data bit. The 'ASC158 is implemented with standard cell functions indicated. The HDl netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USEO TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pFI CELL AREA MAXIMUM ICC InA) SN54ASC' SN74ASC' IVll0LH 0.75 2 1.5 0.88 210 12.64 NA210LH 1 8 8 4.08 1048 62.72 1.75 6 10.5 7.2 1368 81.6 20 12.16 2626 157 AN220LH TOTALS 16 Label: S158LH Al ,A2,A3,A4,Bl ,B2.B3,B4,AZ II B,GZ,Yl,Y2,Y3,Y4; tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC158 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC158 is characterized for operation from - 40°C to 85 °C. FUNCTION TABLE INPUTS STROBE SELECT GZ H L PRODUCTION DATA documents contain informatio, currant as of publication date. Products conform tl specifications par the terms of Texas Instrument! ::':!:~~i~ai~:1~1i ~!:~::i:; ~~O::~:::::t:~~S no' AZ B DATA OUTPUT Y A B X X X H L L X H L L H X L L H L H L H X X H L Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-101 SN54ASC158, SN74ASC158 QUADRUPLE 2·LlNE TO 1·LlNE INVERTING MULTIPLEXERS logic diagram A1 81 A2 B2 A3 II 83 C A4 I» .... I» 0 :::r B4 CD CD ....en y GZ 1V11OLx ~_ _ _--.:A~ y GUI 4-102 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC158, SN74ASC158 QUADRUPLE 2-LlNE TO 1-LlNE INVERTING MULTIPLEXERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage lee Supply current ei Input capacitance epd I AZ_B I All others Equivalent power dissipation capacitance t TEST CONOITIONS SN54ASC158 SN74ASC158 TYP TYP TA ~ 25°e Vee - 5V, Vee - 4.5 V to 5.5 V, VI - Vee or 0, TA ~ MIN to MAX ~ Vee 5 V, TA ~ 2.2 25°e MAX 2.2 2626 tr ~ tf - 3 ns, Vee - 5 V, TA ~ 25°e MAX V 157 0.25 0.25 0.12 0.12 12.16 12.16 UNIT nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1 ) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd Any A or B Y tpd GZ or AZ_B y y PARAMETER; t.tpd Any eL ~ SN54ASC158 TYP§ MAX MIN 0 0.1 tpropagation delay times are measured from the 44% point of VI to the 44% point of tpd == propagation delay time, low-ta-high or high-to-Iow-Ievel output 2.8 6.2 5.7 12.2 0.4 1.2 Vo SN74ASC158 TYP§ MAX MIN 0.2 II UNIT 2.8 6.2 5.2 11.4 ns 0.4 1.1 nsipF ns with tr = tf = 3 ns (10% and 90%). dtpd ;;;;; change in tpd with load capacitance §Typical values are at Vee ~ 5 V, TA ~ 25°e. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS -I!} INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-103 SN54ASC158, SN74ASC158 QUADRUPLE 2·UNE TO 1·UNE INVERTING MULTIPLEXERS HDL FILE BLOCK S158LH; A1 @INPUT; A2 @INPUT; A3 @INPUT; A4 @INPUT; B1 @INPUT; B2 @INPUT; B3 @INPUT; B4 @INPUT; AZ_B @INPUT; GZ @INPUT Y1 @OUTPUT; Y2 @OUTPUT; Y3 @OUTPUT; Y4 @OUTPUT; STRUCTURE G01 G02 G03 G04 G05 G06 G07 GOB G09 G10 G11 G12 G13 G14 G15 G16 END S15BLH; II c D) r+ D) tn :::r CD CD r+ Ul :AN220LH :AN220LH :AN220LH :AN220LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :AN220LH :AN220LH :IV110LH :IV110LH G050,G060,Y1 ; G070,GOBO, Y2; G090,G100,Y3; G110,G120,Y4; A 1 ,G130,G050; B1,G140,G060; A2,G130,G070; B2,G140,GOBO; A3,G 130,G090; B3,G140,G100; A4,G130,G110; B4,G140,G120; G150,G160,G130; AZ_B,G160,G140; AZ_B,G150; GZ,G160; Dedicated 2·line to 1-line multiplexers (' ASC2340) are also available in the standard cell library for implementing data-path multiplexers. These hardwired cells should be considered if the multiplexer is in a critical path, as their performance is predetermined as specified in their switching characteristics. interfacing the macro Inputs and outputs of the predesigned macro are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven with inverting or noninverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. If bus interface is needed, the' ASC25BA 2-line to 1-line multiplexer incorporates 3-state outputs capable of driving internal data buses. 4-104 TEXAS . . , INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC161A, SN74ASC161A SYNCHRONOUS 4-BIT BINARY COUNTERS WITH DIRECT CLEAR 02939, AUGUST 1986 SystemCell™ 2-llm SOFTWARE MACRO CELL • Internal Look-Ahead Enhances Performance of Cascaded Counters • Asynchronous Clear Initializes Sequence Regardless of Mode logic symbol t CLRZ LOADZ • • Parallel Synchronously Presettable for FullCycle Modulo-N Sequences RCO ENT ENP Gated Enables and RCO Implement Local and Global Carry Status CLK aA A description as [4] The SN54ASC161A and SN74ASC161A are c ac [8] standard-cell software macros implementing aD o synchronous 4-bit binary counter elements, The tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and 4-bit configuration provides the custom IC ,lEe Publication 617-12. designer a synchronous counter to embed in ASICs in its most efficient form, and its 4-bit length means that testability is simplified when constructing large counters, The' ASC 161 A implements a count sequence identical with that performed by packaged 'HC161 A, 'LS 161 A, and 'F161 A counters, S Synchronous operation is provided by having all flip-flops clocked simultaneously so that the outputs change coincidentally with each other when so instructed by the count-enable inputs and other gating, This mode of operation eliminates output counting spikes associated with asyncl"ronous (ripple) counters, The clear and load inputs are buffered to enhance performance, and clockinglf the register occurs on the rising (positive-going) edge of the clock waveform, The' ASC 161 A is implemR ,ted with the standard cell functions indicated, The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA TO NA210LH NO, USED TOTAL TOTt,L RELATIVE CELL AREA Cpd+ (pr MAXIMUM ICC 1.56 1,76 249 15 420 25,28 3.2 524 31.4 3,22 380 22,8 786 1630 47.04 97,8 1 374 22.4 1.04 426 25.6 2 1 2 IVll0LH 0.75 4 4 IV120LH 1 4 4 IV140LH 1.5 2 3 NA210LH 6 10 6 12.5 3.06 NA310LH. 1 1.25 NA410LH 1.5 2 3 NA510LH 1.75 2 3.5 R2406LH 26,25 1 26.25 11.69 2931 176 32 63.25 31,53 7720 464 TOTALS I CD CD .c fn ...caca SN74ASC' AN320LH 5 en C (nAI SN54ASC' II ... Label: 5161 ALH D,C,8,A,CLK,CLRZ,ENP,ENT,LOADZ,OD,OC,08,OA,RCO; tThe equivalent power dissipation capacitance does not include interconnect capacitance. PRODUCTION DATA documents contain information c.urrant as of publication data. Products conform to specifications'per the terms of TaxBs Instruments =~~:=i~8i~:I~'le ~~~:~i:; :r~o:=::,:~~ not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © 1986. Texas Instruments Incorporated 4-105 SN54ASC161A, SN74ASC161A SYNCHRONOUS 4·BIT BINARY COUNTERS WITH DIRECT CLEAR These counters are fully programmable; that is, they may be preset to any number between 0 and 15. As presetting is synchronous, setting up a low level at the load input disables the counter and causes the outputs to agree with the setup data after the next clock pulse regardless of the levels of the enable inputs. Clearing is asynchronous. A low level at the clear input sets all outputs low regardless of the levels of the clock, load, or enable. The carry look-ahead circuitry provides for ca~cading counters in n-bit synchronous applications without additional gating. Instrumental in achieving this are two count-enable inputs and a ripple carry output. Both count-enable inputs (ENP and ENT) must be high to count. ENP enables the local 4-bits and the ENT is fed forward to globally extend the enable/disable of previous/next 4-bit cascaded counters. The ripplecarry out (RCO), when locally and globally enabled, will output a high-level pulse at maximum count that is used to enable successive stages. These counters feature a fully independent clock. Changes at control inputs other than the clear will have no effect on the counter until clocking occurs. The functions of the counter are dictated solely by conditions meeting setup, hold, and duration recommendations. The SN54ASC161A is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC161A is characterized for operation from -40°C to '85°C . • C I» I» r+ t/) ::r CD CD r+ (II 4·106 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAs 75265 SN54ASC161A. SN74ASC161A SYNCHRONOUS 4·BIT BINARY COUNTERS WITH DIRECT CLEAR •Ase 161 A output sequence Illustrated below is the following sequence: 1 . Asynchronously clear outputs to zero 2. Preset to binary twelve 3. Count to thirteen, fourteen, fifteen, zero, one, and two 4. Inhibit CLR~ I I u I LOAD I I DATA INPUTS A 1-I ____~----------JI B ____~----------JI-_ 1-- c.-J~~--------~,1 _- - ...-...;..--------...,,- - D-.J 1_- CLK ....en ENP .c CI) CI) til ....ctIctI ENT I I OA -, C -..l __ OB _ -,I _ OUTPUTS OD= - ; _--.J I I I I I I I I IL _____ RCO--~----+----------J I I I : 12 14 13 I- I 15 ~ ________________ 2 COUNT PRESET + INHIBIT ASYNC CLEAR TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-107 SN54ASC161A, SN74ASC161A SYNCHRO.NOUS 4·BIT BINARY COUNTERS WITH DIRECT CLEAR logic diagram 1V110lx ClRZ D- ClK ...-... LOADZ A ENP ENT ~ lV140Lx .j...V A~ ~ INV1 INV> A r 1NV8 0 ~ 1V'110Lx _~2OLx ~_"V INV7 _"v C A B -"V reD 'v • INV8 IP IF IJF A • C II v NA3 A _"'V K=r °50 B C A31 NAtl V INV9 Y NAg A NAS10Lx B y C NA7 NA3;Olx V NAB B C V NA10 NA210lx A D- A NA310Lx Y B NAt3 B Y 'C ~ ~ ~ Q2 ~ as ~ 02 Q32 03 ~ ,.,. Q1 ..012 Q. ~ ........... ~ ~ QA as -C> QC ...-... QD '--- NA14 A~x B V g ~ f1i:5 B A V lNVlO L'> Y NA4 NA2 NA210lx B A B C • C NA6 ...-... ~' A NA310Lx Y NAB A~)(y AN1 ~' Y NAt A 8 ~32OL' B "\V ...-... B C '!.,.A210l.)I VINV6 ~c NAte D~ V NA12 B V C NA17 NA210lx A B Y NA16 A NA310Lx B C NA19 Y A NA510Lx B C o ~ A V INV11 ..u NA20 A NA610lx B C D E -C> RCO ~ NA2t A V INV12 absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. 4-108 TEXAS .." INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC161A, SN74ASC161A SYNCHRONOUS 4-BIT BINARY COUNTERS WITH DIRECT CLEAR electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci Cpd SN54ASC161A TEST CONDITIONS TA VCC = 5 V, = TYP 25°C MIN to MAX 464 0.12 0.12 0.24 0.24 0.12 0.12 0.12 0.12 ENT 0.25 0.25 lOADZ 0.36 0.36 31.54 31.54 ENP = 5 V, Equivalent power VCC - 5 V, dissipation capacitance t TA = 25°C TA = 25°C t r - tf - 3 n5, UNIT V 7720 ClK VCC MAX 2.2 A,B,C,D ClRZ Input capacitance = TYP 2.2 VCC - 4.5 V to 5.5 V, V, - VCC or 0, TA SN74ASC161A MAX nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd ClK RCa 12 22 12 19.8 ns tpd ClK Any Q 4.5 10.4 4.5 9.4 ns tpd ENT RCa 4 7.6 4 6.6 ns tpHl ClRZ Any Q 5 8.3 5 7.7 ns tpHl ClRZ RCO 12 19.5 12 17.9 ns Atpd Any Any Q 0.3 1 2.4 0.3 1 2.1 nsipF Atpd Any RCO 0.3 0.5 1.1 0.3 0.5 1 nsipF PARAMETER* SN54ASC161A TYP§ MAX MIN Cl = 0 SN74ASC161A TYP§ MAX MIN II ... UNIT o G) G) .c en 1: Propagation delay times are measured from the 44% point of V, to the 44% point of Va with tr = tf = 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high or high-to-Iow-Ievel output tpHl '" propagation delay time, high-to-Iow-Ievel output .6.tpd =: change in tpd with load capacitance §Typical values are at VCC = 5 V, TA = 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Postwlayout simulation uses actual interconnect capacitance values. ...caca C DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS • INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 4-109 SN54ASC161A, SN74ASC161A SYNCHRONOUS 4·BIT BINARY COUNTERS WITH DIRECT CLEAR HDL FILE BLOCK S161ALH; @INPUT; D C @INPUT; B @INPUT; A @INPUT; CLK @INPUT; CLRZ @INPUT; ENP @INPUT; ENT @INPUT; LOADZ @INPUT; QD @OUTPUT; QC @OUTPUT; QB @OUTPUT; QA @OUTPUT; RCO @OUTPUT; III .. C I» I» t/) .. ::T CD CD (I) 4·110 STRUCTURE AN1 FF14 :AN320LH :R2406LH INV1 :lvf10LH INV10 :IV120LH INV11 :IV110LH INV12 :IV120LH INV2 :IV140LH INV5 :IV110LH INV6 :IV120LH INV7 :IV110LH INV8 :IV140LH INV9 :IV120LH NA1 :NA310LH NA10 :NA310LH NA11 :NA310LH NA12 :NA410LH NA13 :NA210LH NA14 :NA310LH NA15 :NA210LH NA16 :NA410LH NA17 :NA310LH NA19 :NA310LH NA2 :NA210LH NA20 :NA510LH NA21 :NA510LH NA3 :NA310LH NA4 :NA310LH NA5 :NA210LH NA6 :NA310LH NA7 :NA310LH NA8 :NA210LH NA9 :NA210LH END S161ALH; LOADZ,ENP,ENT,AN10; INV20,NA40,NA70,NA 140,NA 190,CLK,QA,FFA_QZ, QB,FFB_QZ,QC,FFC_QZ,QD,FFD_QZ; CLRZ,INV10; FFC_QZ,INV100; FFD_QZ110; NA210,RCO; INV10,INV20; INV60,INV50; LOADZ,INV60; AN10,INV70; FFA_QZ,INV80; FFB_QZ,INV90; QA,INV70,INV50,NA 10; QC,NA 11 0,INV50,NA 100; AN1 0,INV80,INV90,NA 110; INV80,INV90,AN10,FFC_QZ,NA120; INV60,C,NA 130; NA100,NA130,NA120,NA140; INV60,D,NA 150; AN1 0,INV80,INV90,INV1 OO,NA 160; QD,NA 160,INV50,NA 170; NA 170,NA 150,NA200,NA 190; AN10,FFA_QZ,NA20; AN 10,INV80,INV90,INV1 00,FFD_QZ,NA200; INV80,INV90,INV1 00,INV110,ENT,NA21 0; QB,NA50,INV50,NA30; NA 10,NA80,NA2Q,NA40; AN10,INV80,NA50; INV80,AN10,FFB_QZ,NA60; NA30,NA90,NA60,NA 70; INV60,A,NA80; INV60,B,NA90; TEXAS • INSTRUMENTS POST OFFICE BOX 666012 • DALLAS, TeXAS 75265 SN54ASC161A, SN74ASC161A SYNCHRONOUS 4-BIT BINARY COUNTERS WITH DIRECT CLEAR count definition These counters are unidirectional with respect to count operation. Inverting the output levels will produce a down-count sequence. Bidirectional counters are available in software macros or can be constructed using the 'ASC2405 through 'ASC2407 4-bit predesigned registers. designing for testability Designs employing storage or bistable elements, especially long counters (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. II... en Q) Q) .c U) ... CU CU C ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-111 II c .... Q) en ::T Q) CD CD .... til 4-112 SN54ASC163A, SN74ASC163A SYNCHRONOUS 4·BIT BINARY COUNTERS 02939, AUGUST 1986 SystemCeIrM 2-j.lm SOFTWARE MACRO CELL • Internal Look-Ahead Enhances Performance of Cascaded Counters • Synchronous Clear Initializes Sequence Regardless of Mode logic symbol t ClRZ LOADZ • Parallel Synchronously Presettable for FullCycle Modulo-N Sequences • Gated Enables and RCO Implement Local and Global Carry Status RCO ENT ENP ClK description A QA B OB c The SN54ASC163A and SN74ASC163A are 141 OC standard-cell software macros implementing D 18J QD synchronous 4-bit binary counter elements, The tThis symbol is in accordance with ANSI/IEEE Std 91·1984 and 4-bit configuration provides the custom IC IEC Publication 617-12, designer a synchronous counter to embed in ASICs in its most efficient form, and its 4-bit length means that testability is simplified when constructing large counters. The' ASC 163A implements a count sequence identical with that performed by packaged 'HC163, 'LS163A, and 'F163A counters. Synchronous operation is provided by having all flip-flops clocked simultaneously so that the outputs change coincidentally with each other when so instructed by the count-enable inputs and other gating. This mode of operation eliminates output counting spikes associated with asynchronous (ripple) counters. The clear and load inputs are bUffered to enhance performance, and clocking of the register occurs on the rising (posi'tive-going) edge of the clock waveform. The' ASC163 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TOTAL TOTAL RELATIVE Cpd* (pF) SN54ASC' 2 1 2 1.18 256 15.3 IVll0LH 0.75 3 2.25 1.32 315 18.96 IV120LH IV140LH 1 1.5 3 1 3 1.5 2.4 1.61 393 190 23.55 NA210LH 1 6 6 3.06 786 47.04 NA310LH 1.25 10 12.5 5 1630 97.8 NA410LH 1.5 2 3 1 374 22.4 NA510LH 1.75 2 3.5 1.04 426 25.6 N0220LH N0240LH 1.5 2.5 1 1 1.5 2.5 0.52 0.98 185 292 17.5 R2406LH 41 1 26.25 11.69 2931 176 T0010LH 2 1 2 177 10.6 32 66 7955 478 tOTALS CELL AREA 29.8 ....CD CI) CD .c tn ....lala C MAXIMUM ICC (nA) AN410LH TO NA210LH • SN74ASC' 11.4 11.1 Label: S 163ALH D,C.8.A.CLK.CLRZ.ENP,ENT,LOADZ.QD.QC,QB,QA,RCO; ::t:The equivalent power dissipation capacitance does not include interconnect capacitance. ~ROOUCTION DATA doc.mants.ontain information :urr~~~o~p=:~n:O~:lm"!".r~:=I:::':':n: :&:'.rd "'.rrIRty. Production prollllling do•• not .......rily includ. tasting of In p.r.m8l8rs. Copyright © 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXA~ 4-113 75285 SN54ASC163A, SN74ASC163A SYNCHRONOUS 4·B11 BINARY COUNTERS These counters are fully programmable; that is. they may be preset to-any number between 0 and 15. As presetting is synchronous. setting up a low level at the load input disables the counter and causes the outputs to agree with the setup data after the next clock pulse. regardless of the levels of the enable inputs. Clearing is synchronous. A low level at the clear input will set all outputs low on the next positive transition of the clock. The carry look-ahead circuitry provides for cascading counters in n-bit synchronous applications without additional gating. Instrumental in achieving this are two count-enable inputs and a ripple carry output. Both count-enable inputs (ENP and ENT) must be high to count. ENP enables the local 4-bits and the ENT is fed forward to globally extend the enable/disable of previous/next 4-bit cascaded counters. The ripplecarry out (RCO). when locally and globally enabled. will output a high-level pulse at maximum count that is used to enable successive stages. These counters feature a fully independent clock. Changes at control inputs. including clear, will have no effect on the counter until clocking occurs. The functions of the counter are dictated solely by conditions meeting setup. hold. and duration recommendations. The SN54ASC163A is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC163A is characterized for operation from -40°C to 85°C . • 4-114 TEXAS .." INSTRUMENTS POST Of::FICE BOX 655012 • DALLAS. TEXAS 75265 logic diagram (positive logic) TOO1OLx .... vee 1NV1~ ClK (N) ~ ClRZ .......... "--' ·LOAOZ Il ~ Q ~z -DQA -DaB .~ ~ ~ ;o~ -CJQC ~C::~ ~s:: 1V12OLx A ~1'1 Y B INVII ~z ~~ Ui4r A NA310lx p:.;Y_++-";ri Q[) NAll c:n FI'14 C < 2 NA13 F>"-Y--f--l n :z: ~ :a '" '"'" ~ = 2c:n =2 c:n-,=" -,=":1> • c:n CU'I o .-+---------~;~NA21 ~ A Y INVS II Y b A NA61CL. B -1- -D RCO ~ lV12CLx ;~ INIIII f" ~ 01 !!n ~Y~____~ Data Sheets II en ca _w 2:1> :1>" :ac:n <2 n-,=" =:1> C c:n 2n -1men :aw c:n:l> .... SN54ASC163A, SN74ASC163A SYNCHRONOUS 4·B11 BINARY COUNTERS 'ASC163A outpUt sequence Illustrated below is the following sequence: . 1. Synchronously clear outputs to zero 2. Preset to binary twelve 3. Count to thirteen, fourteen, fifteen, zero, one, and two 4. Inhibit CLRZ~ u LOADZ 1-A _____________________--JI_ _ 1-B _____________________..JI _ _ DATA INPUTS ~-----------------.I- 1_- ~-----------------.I- D..J II - ._- C..J ClK ENP 0 .... I» I» ENT tn ::r- QA CD CD .... til --,I aB OUTPUTS ac ::LJ aD ;--.1 RCO i: I I I I :12 13 14 n. 15 I 1.....,.---- oL-.----2-+:- - - - - - - - - - - - COUNT --~+N---. INHIBIT SYNC PRESET CLEAR absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve eath specific timing need. 4-116 ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 SN54ASC163A, SN74ASC163A SYNCHRONOUS 4-BIT BINARY COUNTERS electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci Cpd SN54ASC163A TEST CONDITIONS Vec = 5 V, TYP Input capacitance = TYP 2.2 TA = 25°C VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA SN74ASC163A MAX MIN to MAX 478 0.12 0.12 elK 0.24 0.24 0.24 0.24 0.12 0.12 ENT 0.24 0.24 lOADZ 0.59 0.59 29.8 29.8 ENP Vec = 5 V, Equivalent power Vec = 5 V, dissipation capacitance t TA = 25°C TA tr = 25°C = tf = 3 ns, UNIT V 7955 A,B,C,D ClRZ MAX 2.2 nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (See Note 1) PARAMETER' FROM TO TEST IINPUT) IOUTPUT) CONDITIONS tpd ClK RCO tpd ClK Any Q SN54ASC163A TYP§ MAX SN74ASC163A TYP§ MAX MIN CL = 0 MIN 9 22.2 9 20.1 ns 5 10.6 5 9.6 ns tpd ENT RCO 2 7.6 <1tpd Any Any Q 0.3 1 2.4 <1tpd Any ReO 0.3 0.5 1.1 = II UNIT 2 6.6 ns 0.3 1 2.1 ns/pF 0.3 0.5 1 ns/pF = 'Propagation delay times are measured from the 44% point of VI to the 44% pOint of Vo with tr tf 3 ns 110% and 90%). tpd '" propagation delay time, low-to-high or high-to-Iow-Ievel output <1tpd '" change in tpd with load capacitance §Typical values are at VCC = 5 V, TA = 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2.000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs, The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-117 SN54ASC163A, SN74ASC163A SYNCHRONOUS 4-811 BINARY COUNTERS HDL FILE BLOCK S163ALH; D @INPUT; C @INPUT; B @INPUT; A @INPUT; CLK @INPUT; CLRZ @INPUT; ENP @INPUT; ENT @INPUT; LOADZ @INPUT; OD @OUTPUT; OC @OUTPUT; OB @OUTPUT; OA @OUTPUT; RCO @OUTPUT; • ...c C» C» en ::r CD ! (I) '4-118 STRUCTURE AN 1 FF14 :AN41 OLH :R2406LH INV1 :T0010LH INV3 :IV110LH INV4 :IV110LH INV5 :IV140LH INV6 :IV120LH INV7 :IV120LH INV8 :IV110LH INV9 :IV120LH NA1 :NA310LH NA10 :NA210LH NA11 :NA310LH NA12 :NA310LH NA13 :NA310LH NA14 :NA410LH NA15 :NA210LH NA16 :NA210LH NA17 :NA410LH NA18 :NA310LH NA2 :NA310LH NA20 :NA310LH NA21 :NA510LH NA22 :NA510LH NA3 :NA210LH NA5 :NA210LH NA6 :NA210LH NA7 :NA310LH NA8 :NA310LH NA9 :NA310LH N01 :N0220LH N02 :N0240LH END S163ALH; CLRZ,LOADZ,ENP,ENT,AN10; ICLRZ,NA20,NA80,NA 1. 30,NA200,CLK,OA,OAZ,OB,OBZ, OC,OCZ,OD,ODZ; DUM,ICLRZ; CLRZ,INV30; AN10,INV40; OAZ,INV50; OBZ,INV60; OCZ,INV70; ODZ,INV80; NA220,RCO; OA,N01 0,INV40,NA 10; N020,B,NA 100;' AN10,INV60,INV50,NA110; OC,NA 11 0,N01 O,NA 120; NA 120,NA 150,NA 140,NA 130; AN 10,INV50,INV60,OCZ,NA 140; N020,C,NA 150; N020,D,NA 160; AN1 OlINV70,INV50,INV60,NA 170; OD,NA 170,N01 O,NA 180; NA 10,NA50,NA30,NA20; NA 180,NA 160,NA210,NA200; AN 10,INV50,INV60,INV70,ODZ,NA21 0; INV50,INV60,INV70,INV80,ENT,NA220; AN10,OAZ,NA30; N020,A,NA50; AN10,INV50,NA60; OB,NA60,N01 O,NA 70; NA70,NA 100,NA90,NA80; AN10,INV50,OBZ,NA90; INV30,N020,N010; INV30,LOADZ,N020; TEXAS • INSTRUMENTS POST OFFICI; BOX 655012 • DALLAS. TEXAS 75265 SN54ASC163A. SN74ASC163A SYNCHRONOUS 4·BIT BINARY COUNTERS count definition These counters are unidirectional with respect to count operation. Inverting the output levels will produce a down-count sequence. Bidirectional counters are available in software macros or can be constructed using the' ASC2405 through' ASC2407 4-bit predesigned registers. designing for testability Designs employing storage or bistable elements, especially long counters (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and to read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. II '1!1 TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-119 4-120 SN54ASC164, SN74ASC164 8·BIT PARALLEL·OUT SERIAL SHIFT REGISTERS 02939, AUGUST 1986 SystemCell™ 2-j.lm SOFTWARE MACRO CELL • AND-Gated (Enable/Disable) Serial Inputs • Buffered Clear and Serial Inputs logic symbol t • Direct Clear • Embedded Clock Drivers Provide Clock Buffering • Dependable Texas Instruments Quality and Reliability ClRZ ClK A QA 8 08 OC 00 OE description The SN54ASC164 and SN74ASC164 are standard-cell ,softWare macros implementing 8-bit parallel-out shift registers, The 8-bit configuration provides the custom IC designer a register to embed in ASICs in its most efficient form, Its 8-bit length simplifies construction of 'large counters. The 'ASC164 implements a shift sequence identical with that performed by packaged 'HC164, 'LS164, and 'F164 registers, OF OG OH tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and lEe Publication 617-12. These 8-bit shift registers feature AND-gated serial inputs and an asynchronous clear. The gated serial inputs (A and B) permit complete control over incoming data, as a low at either input inhibits entry of new data and resets the first flip-flop to a low level at the next clock pulse. A high-level input enables the other input, which will then determine the state of the first flip-flop. Data at the serial inputs may be changed while the clock is high or low, provided the minimum setup time requirements are met. Clocking occurs on thelow-to-high-Ievel transition of the clock pulse. The' ASC 164 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CEll NAME CEll AREA NO. USED TO NA210lH TOTAL TOTAL RELATIVE Cpd* IpFI CELL AREA J: en ... CO CO C SN74ASC' 1 1.5 0.9 194 11.6 IVll0lH 0.75 1.5 1 1 0.75 1.5 0.44 1.61 105 190 6.32 11.4 39.4 2 50.5 20.6 6142 370 5 54.25 23.55 6631 400 TOTALS fI) Q) Q) InAI SN54ASC' 1.5 IV140lH ... MAXIMUM ICC AN210lH R2401lH • label: S164lH A,8,ClK,ClRZ,QA,QB,QC,QO,QE,QF,QG,QH; ;The equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC 164 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC164 is characterized for operation from - 40°C to 85 DC. pRODUCTION DATA d••• ments .ontein information .urrent al of publication data, Products .onlann 10 .pacificati.ns pa, Iha I.nna 01 T.... Inll......ts :.=~i~·I::-:IO::l,; =~:~:; CJ·:::':Zt~ not Copyright © 1986, Texas Instruments Incorporated TEXAS " , INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-121 SN54ASC164, SN74ASC164 8·BIT PARAlLEL·OUT SERIAL REGISTERS FUNCTION TABLE INPUTS OUTPUTS ClR ClK A B QA l X X X L H H H L X X i i i H H L X X L H OB .. . OH l QAO QBO H QAn L QAn L QAn L QHa QG n QG n QG n logic diagram CLK R2401Lx CLK I-"Q,,-,_ _ _-, • QA 4-122 as· ac ao TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 QE Of QG QH SN54ASC164, SN74ASC164 8-BIT PARAllEL-OUT SERIAL REGISTERS typical clear, shift, and clear sequences u CLRZf.J , SERIAL { L-Jl__________~-------- A INPUTS B--i------' CLK---'-I---' I I QA==='~I ---, __________' ~--------+--------~----~~------- QB ___ ~I~_ _ _ _ _ _ _ _ ___' Qc==-~l~ QD==-~l~ ---, OUTPUTS QE __ ~I~ ________________ _____________________ ~~--~------- --J ~~--------, ~ Ln'--_______ ___________________________~ ___________________________ , QG===~ _______________________~~~:_____________ QF==-l~~ ~ ---, QH ___ ______________________________________ ~I n' ~ ~ II ____________ I CLEAR CLEAR absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT lee ej Input threshold voltage Supply current Input capacitance SN54ASC164 TEST CONDITIONS TA -~ elK = 5 V, = 4.5 V to 5.5 = MIN or MAX Vee Vee Vee = 5 V, TA V, VI TA TYP = 25°e = Vee or 0, = 25°e eLRZ Equivalent power epd dissipation capacitance t = 5 V, = 25°e Vee TA tr = tf =3 ns, MAX 2.2 SN74ASC164 TYP MAX 400 6631 0.13 0.13 0.48 0.48 0.12 0.12 23.55 23.55 UNIT V 2.2 nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. TE~. INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-123 SN54ASC164, SN74ASC164 8·BIT PARALLEL·OUT SERIAL REGISTERS switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) (see Note 1) PARAMETERt FROM (INPUT) ClK TO (OUTPUT) Qn ClRZ ClK or ClRZ Qn Qn tpd tPHl atpd TEST CONDIT(ONS SN54ASC164 MIN Cl = 0 TYP* 5 0.3 4 0.5 SN74ASC164 MAX 11.2 7.7 MIN 1.3 0.3 TYP* 5 4 0.5 MAX 10.2 7.5 1.1 UNIT ns ns ns/pF tpropagation delay times are ,t,'easured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpd .. propagation delay time. low-to-high- or high-to-Iow-Ievel output tpHl '" propagation delay time. high-to-Iow-Ievel output atpd '" change in tpd with load capacitance *Typical values are at VCC = 5 V. T A = 25 ·C. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs: ...C The HDL for this soft macro is included as a part ·of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. I» I» tn ::T CD CD ... UI HDL FILE BLOCK S164LH; A @INPUT; B @INPUT; CLK @INPUT; CLRZ @INPUT; OA @OUTPUT; OB @OUTPUT; OC .@OUTPUT; OD @OUTPUT; OE @OUTPUT; OF @OUTPUT; OG @OUTPUT; OH @OUTPUT; STRUCTURE AN1 INV1 INV2 FF14 FF58 END S164LH; 4-124 :AN210LH :IV110LH :IV140LH :R2401LH :R2401LH A.B,AN10; CLRZ,INV10; INV10,INV20; INV20,AN10,CLK,OA,OB,OC,OD; INV20,OD,CLK,OE,OF,OG,OH; TEXAS . " INSTRUMENTS POST OF~tCE BOX 655012,. DALLAS, TeXAS 75265 SN54ASC164, SN74ASC164 8-BIT PARALLEL-OUT SERIAL REGISTERS shift definition These registers are unidirectional with respect to shift operations. Bidirectional registers are available in software macros or can be constructed using the' ASC2405 through' ASC2407 4-bit pre designed registers. designing for testability Designers employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear, and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. . power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. II ... fI) Q) Q) .J:. o ca ca ... C TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 75265 4-125 • c g) r+ g) t/) :::T CD CD r+ en 4-126 SN54ASC165, SN74ASC165 PARALLEL-LOAD 8-BIT SHIFT REGISTERS 02939, AUGUST 1986 SystemCell™ 2-/Am SOFTWARE MACRO CELL logic symbol t • Gated (Enablellnhibit) Clock Inputs • Complementary Outputs • Direct Overriding Load (Data) Inputs • Parallel-to-Serial Data Conversion • Clock Driver Provides Clock Buffering • Dependable Texas Instruments Quality and Reliability SRG8 SH_lOZ ClKINH ClK SER A 10 B 10 C 0 E description F The SN54ASC165 and SN74ASC165 are G standard-cell software macros implementing OH H 10 8-bit parallel-in shift registers, The 8-bit OHZ' configuration provides the custom IC designer a register to embed in ASICs in its most efficient t This symbol is in accordance with ANSI/IEEE Std 91-1984 and lEG Publication 617-12. form, Its 8-bit length simplifies construction of large registers, The' ASC165 implements a shift sequence identical with that performed by packaged 'HC165 and 'LS165 registers, The' ASC165 is an 8-bit serial shift register that, when clocked, shifts the data toward serial output QH. Parallel-in access to each stage is provided by eight individual direct data inputs that are enabled by a low level at the SH_LDZ input, The' ASC165 also features a clock-inhibit function and a complementary serial output QHZ. The' ASC 165 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: • ... U) G) G) .c (J) ...caca C RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pF) CELL AREA MAXIMUM ICC (nA) SN54ASC' SN74ASC' A0221LH 2.7 1 2.7 0.59 224 DFB20LH 7.7 8 61.6 30.08 7472 448 IV140LH 1.5 2 3 3.24 380 22.8 NA210LH 1 TOTALS 13.4 16 16 8.16 2096 125.44 27 83.3 42.07 10172 610 Label: S165LH A.B,G,D,E,F,G,H,GLK,CLKINH,SH_LDZ.SER,QH,QHZ; +The equivalent power dissipation capacitance does not include interconnect capacitance. Copyright © 1986. Texas Ins~ruments Incorporated PRODUCTION DATA documents .ontain information currant as of publication data. Products conform to specific8tioni par the tarms of Texas Instrumants :'::::~~i~8{:~~tze ~=~~i:r :.r=~~s not TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265. 4-127 • SN54ASC165, SN74ASC165 PARALLEL·LOAD. 8·BIT SHIFT REGISTERS Clocking is accomplished by a low-to-high transition of the ClK input while SH_lDZ is held high and ClKINH is held,low. The functions of the ClK and ClKINH inputs are interchangeable. Since a low ClK input and a low-to-high transition of ClKINH will also accomplish clocking, ClKINH should be changed to the high level only while the ClK input is high. Parallel loading is inhibited when SH_lDZ is held high. The parallel inputs to the register are enabled while SH_lDZ is low independently of the levels of ClK, ClKINH, or SER inputs. The SN54ASC165 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC165 is characterized for operation from -40°C to 85°C. FUNCTION TABLE INPUTS SH_lDZ ClK ClKINH L X FUNCTION Parallel load A thru H H H X X H X H No change H L i Shift H i L Shift No change Shift = Content of each internal register shifts toward serial output QH. Data at serialmput IS shifted Into first register. ~ absolute maximum ratings and recommended operating conditions o See Table 1 in Section 2. I» Cit timing requirements en :::r CD CD ... en 4-128 Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 logic diagram t: I~ Cl 'G A" !il FF8 fl'C Qti c OHZ FFG ~Z ~CJJ ~~ g;or;;i ;;o c:~ ~ ~ I""l !Ul-*' I I;;Z I ~ ""1:1 >>- :D I""" I""" ", r:I""" een >-2 Clc:n CD oIiIo '> !!en en- -In =en ::;;~ -f en 2 :D ", .... C')oIiIo ->en en -In ",- f' I I ~ I\) (0 Data Sheets II :Den en U'I SN54ASC165, SN74ASC165 PARALLEL·LOAD 8·81T SHIFT REGISTERS typical shift. load. 'and inhibit sequences ClK ClKINH SER l SH/LD-U I I A~~__~______________________________ B I l I I C D ----..J:Hl------~-------------------------------------I l I I DATA E~~______~_______________________________________ F I l I I G~~__~______________~______________ II I H ----.Ji";l I ~----~--------------------------------- o I» QH H I» QH l ... t/) ::r j4-INHIBIT CD CD ... H -I~"f4f-------SERIAl SHIFT - - - - - - - - - -•• lOAD (I) electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Cj Input capacitance A thru H . ClK,CLKINH SER SH_LDZ Equiyalent power Cpd dissipation capacitance t TEST CONDITIONS VCC - 5 V, TA - 25°C VCC = 4,5 V to 5.5 V, VI = VCC or 0, TA = MIN to MAX VCC = 5 V, VCC - 5 V, TA = 25°C SN74ASC165 10172 sio 0.12 0.13 0.11 TA = 25°C t r - tf - 3 ns, SN54ASC165 TYP MAX 2,2 0.12 0,13 0.75 0.11 0.75 42.07 42.07 t The equivalent power dissipation capacitance does not include interconnect capacitance. 4-130 TYP 2,2 TEXAS" . INSTRUMENTS ~OST OFFICE BOX 655012 • DALLAS, TEXAS 75265 MAX UNIT V nA pF pF SN54ASC165, SN74ASC165 PARALLEL-LOAD 8-BIT SHIFT REGISTERS SWitching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) IOUTPUT) CONDITIONS tpd SH_LDZ OH,OHZ tpd CLK OH,OHZ tpd H OH,OHZ Any On PARAMETERt .:I.tpd SN54ASC165 MIN 7 15.5 7 14.1 ns 8 19.5 8 17.4 ns 4 7.8 4 7.2 ns 0.5 1.3 0.5 1.2 nslpF tPropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpd " propagation delay time, low-to-high- or high-to-Iow-Ievel output dtpd =- MIN 0.1 = tf = TYP* MAX UNIT MAX CL = 0 0.1 SN74ASC165 TYP* 3 ns (10% and 90%). change in tpd with load capacitance = = ; Typical values are at VCC 5 V, TA 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to cell must be accounted for in the netlist used to generate the next level of an ASIC design . A tie-off cell is offered specifically for managing unused inputs. The HDl for this software macro is included as a part of the library supplied for supported engineering workstations 50 that a single label can be developed to apply the macro as needed. The following printout of the HDl block definition is furnished for reference. • HDl FilE BLOCK S165lH; @INPUT; B @INPUT; C @INPUT; D @INPUT; E @INPUT; F @INPUT; G @INPUT; H @INPUT; ClK @INPUT; ClKINH @INPUT SH_lDZ @INPUT; SER @INPUT; QH @OUTPUT; QHZ @OUTPUT; A . TEXAS. INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-131 SN54ASC165,SN74ASC165 PARALLEL·LOAD 8·BIT ~HIFT REGISTERS HDL FILE (Continued) STRUCTURE A01 FFA FFB FFC FFD FFE FFF . FFG FFH INV1 INV3 NA01 NA02 NA03 NA04 NA05 NAOS NA07 NAOa NA09 NA10 NA11 NA12 NA13 NA14 NA15 NA16 END S165LH; • o I» 1+ I» tn ::r CD CD 1+ (I) :A0221LH :DFB20LH :DFB20LH :DFB20LH :DFB20LH :DFB20LH :DFB20LH :DFB20LH :DFB20LH :IV140LH :IV140LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH SH_ LDZ,CLK,SH _ LDZ,CLKINH,AO 10; NA020,NA010,SER,INV30,FFAQ,DUM; NA040,NA030,FFAQ,INV30,FFBQ,DUM; NA060,NA050,FFBQ,INV30,FFCQ,DUM; NAOaO,NA070,FFCQ,INV30,FFDQ,DUM; NA 100,NA090,FFDQ,INV30,FFEQ,DUM; NA 120,NA 11 0,FFEQ,INV30,FFFQ,DUM; NA 140,NA 130,FFFQ,INV30,FFGQ,DUM; NA 160,NA 150,FFGQ,INV30,QH,QHZ; SH_LDZ,INV10; A010,INV30; A,INV1 0,NA01 0; NA01 0,INV1 0,NA020; B,INV10,NA030; NA030,INV10,NA040; C,INV10,NA050; NA050,INV10,NA060; D,INV10,NA070; . NA070,INV10,NAOaO; E,INV10,NA090; NA090,INV1 O,NA 100; F,INV10,NA110; NA 11 0,INV1 O,NA 120; G,INV1 O,NA 130; NA 130,INV1 O,NA 140; H,INV1 O,NA 150; NA 150,INV1 O,NA 160; shift definition These registers are unidirectional with respect to shift operations and the relationship for shifting left or right is defined by the IC designer. Bidirectional registers are available in software macros or can be constructed using the' ASC2405 through 'ASC2407 4-bit predesigned registers. designing for. testability Designers employing storage or bistable elements, especially long registers (ripple or synchronous). should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of Ie testing, system testing, and system maintenance to be reduced significantly. 4-132 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC166, SN74ASC166 PARALLEL·LOAD 8·BIT SHIFT REGISTERS WITH DIRECT CLEAR 02939. AUGUST 1986 SystemCell™ 2·",m SOFTWARE MACRO CELL logic symbol t • Synchronous Load • Direct Overriding Clear • Parallel-to-Serial Conversion SRGS CLRZ SH_LOZ • Direct Clear • Embedded Clock Drivers Provide Clock Buffering • Dependable Texas Instruments Quality and Reliability CLKINH CLK SER 2.30 A -I ~2;.;.3;.;D_ _ _ B c o description E The SN54ASC166 and SN74ASC166 are F standard-cell software macros implementing G B-bit parallel-in shift registers. The B-bit H QH configuration provides the custom IC designer tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and a register to embed in ASICs in its most efficient IEC Publication 617-12. form. Its B-bit length simplifies construction of large counters. The 'ASC 166 implements a shift sequence identical with that performed by packaged 'HC 166 and 'LS 166 registers. The' ASC 166 is an B-bit serial shift register that, when clocked, shifts the data toward serial output QH. Parallel-in access to each stage is provided by eight individual direct data inputs that are enabled by a low level at the SH_LDZ input. The' ASC166 also features a clock inhibit function and a direct clear input. The' ASC166 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TOTAL TOTAL RELATIVE MAXIMUM ICC (nA) CELL AREA Cpd* (pF) AN221LH 2.7 8 21.6 4.72 1792 107.2 IV110LH 0.75 9 6.75 3.96 945 56.88 IV120LH 1 2 2 1.6 262 15.7 IV140LH 1 1.5 1.61 190 OR210LH 1.5 1.5 1 1.5 0.86 185 11.4 11.1 R2405LH 23.25 2 46.5 20.4 5294 318 TOTALS 23 79.85 33.15 Label: S166LH A,8,C,D,E,F,G,H,CLK,CLKINH,SER,SH _ LDZ,CLRZ,QH; 8668 521 TO NA210LH • SN54ASC' SN74ASC' :l:The equiv,slent power dissipation capacitance does not include interconnect capacitance. PRODUCTION DATA documonts onntain inform.tion curraat .s af publication dat•. ProduelS conform 10 .pooill••ti... par tho tarma af T_I Instrumo.ts =~~~.[:~':.'1.; ,:::\:~~n .ot :.:o::::::::.::.s Copyright @ 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 656012 • DALLAS, TEXAS 75265 4-133 SN54ASC166, SN74ASC166 PARALLEL·LOAD 8·BIT SHIFT REGISTERS WITH DIRECT CLEAR The parallel-in-or serial-in modes are established by the shift/load input. When high, this input enables the serial data input and couples the eight flip-flops for serial shifting with each clock pulse. When the shift load input is low, the parallel (broadside) data inputs are enabled and synchronous loading occurs on the next clock pulse. During parallel loading, serial data flow is inhibited. Clocking is accomplished on the lowto-high-Ievel edge of the clock pulse through a two-input positive NOR gate permitting one input to be used as a clock-enable or clock-inhibit function. Holding either of the clock inputs high inhibits clocking; holding either low enables the other clock input. This allows the system clock to be free-running and the register can be stopped on command with the other clock input. The clock-inhibit input should be changed to the high level only when the clock input is high. A direct clear input, when taken low, overrides all other inputs, including the clock, and resets all flip-flops to zero. The SN54ASC166 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC166 is characterized for operation from -40°C to 85°C. FUNCTION TABLE INTERNAL INPUTS OUTPUTS ClRZ SH l H II c .... lDZ X X ClKINH ClK SER A ... H X X L L X X X X t t x a.... h a H X t t L X H L L H H L H H L H X H OUTPUT OH GA L OB L L GAo aBo b aHo h H aAn aG n X L aAn X GAO aBO aG n aHo D) D) absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. t/) ::r (1) ....en (1) timing requirements 4-134 Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. TEXAS . . INSTRUMENTS POST OFFICE BOX 655012. DALLAS; TEXAS 76265 SN54ASC166. SN74ASC166 PARALLEL· LOAD 8·BIT SHIFT REGISTERS WITH DIRECT CLEAR logic diagram \V11OLx ClRZ y A INV2 ClK CLKINH ~______________~A~~1OLX>~y____________________~-, B OR1 SEA SH.lOZ A 01 Cl2 B Q3 04 II... C o Q) Q) .s::. en ...caca o C Q1 Cl2 Q3 ..,04"'--1-____-1> QH G H TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4·135 SN54ASC166, SN74ASC166 PARALLEL·LOAD 8·BIT SHIFT REGISTERS WITH DIRECT CLEAR typical clear, shift, load, inhibit, and shift sequences CLOCK "'L: !l I CLOCK INHIBIT CLEAR~~I------------------~~----~I----~I~~-------------------- I SERIAL INPUT SHIFT/LOAD I I I ~=:~~I..:~=======t::::j:=:::;-"t:;::=t:= + = = = = = = = = = = = -+--------------------- L-ur----+I I I A__~~----~----------+__+---IGiInI I I B __~~________________~~----~L~I----~~-------------------I PARALLEL INPUTS C __~~----------------~_+---'nnn~--_+_+--------------------I D I __ E _____________________ LI ~~ ~~ I F __~~----------------~_+----~L~I----~+_----------~-------I • C G __~~______~________~_+---'r.rr~---+-+--------------------I H__rl~----------------~--~--Jr.in~--+_+_-------------------I I OUTPUT QH :.:~'--'--________________..J I liII!4fo--- SERIAL SHIFT - - - - - - - . ! CLEAR I» .... I» en :::r CD ....enCD 4·136 ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DAL.LAS, TEXAS 75265 SN54ASC166, SN74ASC166 PARALLEL·LOAD S·BIT SHIFT REGISTERS WITH DIRECT CLEAR electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage ICC Supply current Ci VCC - 5 V, SN74ASC166 TYP TYP TA Input capacitance ~ MAX 2.2 TA - 25°C VCC - 4.5 V to 5.5 V, VI .- VCC or 0, MIN to MAX 0.13 0.13 CLK,CLKINH 0.11 0.11 0.13 0.13 0.24 0.24 33.03 33.03 VCC ~ 5 V, TA ~ 25°C ~ Equivalent power VCC dissipation capacitance t TA ~ 25°C 5 V, tr ~ tf ~ 3 ns, UNIT V 521 A thru H SER MAX 2.2 8668 SH_LDZ Cpd SN54ASC166 nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) PARAMETER* tpd tpHL Atpd AtPHL FROM TO TEST (lNPUTI (OUTPUT) CONDITIONS CLK QH CLRZ QH Any QH 0.3 0.9 2.3 0.3 0.9 2.1 ns/pF CLRZ QH 0.3 0.7 1.9 0.3 0.7 1.6 ns/pF SN54ASC166 TYP§ MAX MIN CL ~ 0 SN74ASC166 TYP§ MAX MIN UNIT 12.5 11.3 ns 7.7 7.1 ns t Propagation delay times are measured from the 44% pOint of VI to the 44% point of Vo with tr = tf '" 3 ns (10% and 90%). tpd :;;;;. propagation delay time, low-ta-high or high-to-Iow-Ievel output tpHL ,. propagation delay time, high-to-Iow-Ievel output .6.tpd == change in tpd with load capacitance AtPHL ,. change in tpHL with load capacitance § Typical values are at VCC = 5 V, T A = 25°C. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 II .... en CD .! en ....caca Q 4-137 SN54ASC166, SN74ASC166 PARALLEL·LOAD 8·BIT SHIFT REGISTERS WITH DIRECT CLEAR DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie·off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. HDL FILE II C I» 1"+ I» (I) :::r CD CD 1"+ o 4·138 BLOCK S166LH; . A @INPUT; B @INPUT; C @INPUT; D @INPUT; E @INPUT; F @INPUT; G @INPUT; H @INPUT; CLK @INPUT; CLKINH @INPUT; SER @INPUT; SH_LDZ @INPUT; CLRZ @INPUT; QH @OUTPUT; STRUCTURE A01 A02 A03 A04 A05 A06 A07 A08 FF14 FF58 INV1 INV10 INV11 INVi2 IIw2 INV3 INV4 INV5 INV6 INV7 INV8 INV9 OR1 END S166LH; :A0221LH :A0221LH :A0221LH :A0221LH :A0221 LH :A0221LH :A0221LH :A0221LH :R2405LH :R2405LH :IV110LH :IV110LH :IV110LH :IV110LH :IV140LH :IV120LH :IV120LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :OR210LH SER,INV40,INV30,A,A010; QA,INV40,INV30,B,A020; QB,INV4o,INV30,C,A030; QC,INV40,INV30,D,A040; QD,INV40,INV30,E,A050; OE,INV40,INV30,F,A060; QF,INV40,INV30,G,A070; QG,INV40,INV30,H,A080; INV20,INV50,INV60,INV70,INV80,OR10,QA,QB,QC,QD; INV20,INV90,INV1 OO,INV11 0,INV120,OR1 O,QE,QF,OG,QH; CLRZ,INV1 0; . A060,INV100; A070,INV110; A080,INV120; INV10,INV20; SH_LDZ,INV30; INV30,INV40; A010,INV50; A020,INV60; A030,INV70; A040,INV80; A050,INV90; CLK,CLKINH,OR10; TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 SN54ASC166. SN74ASC166 PARALLEL-LOAD 8-BIT SHIFT REGISTERS WITH DIRECT CLEAR shift definition These registers are unidirectional with respect to shift operations. Bidirectional registers are available in software macros or can be constructed using the' ASC2405 through' ASC2407 4-bit predesigned registers. designing for testability Designers employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and to read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. II... U) Q) Q) ~ UJ ... C'O C'O C TEXAS .", INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 4-139 II o .... I» I» CIl :r CD ....CD (I) 4-140 SN54ASC173, SN74ASC173 4·81T O·TVPE REGISTERS WITH 3·STATE OUTPUTS D2939, AUGUST 1986 SystemCell™ • • • • 2'/-Im SOFTWARE MACRO CELL logic symbol t 3·State Outputs Interface Internal Data Buses Directly ClR Direct Clear Input Simplifies Initialization or Pattern Length Ml Nl Embedded Clock Driver Provides Symmetrical Performance Across Long Registers G1l G2l ClK Parallel Registers for S:Bit, 16·Bit, 32·Bit Word Widths 01 01 02 02 03 03 04 04 tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. description The SN54ASC173 and SN74ASC173 are standard-cell software macros implementing 4-bit D-type register elements designed specifically for interfacing internal bus lines. Their four-bit length means that testability is simplified when constructing large registers, The' ASC173 implements a function table identical with that performed by packaged 'HC173 and 'LS173 registers. Gated enable inputs are provided on these macros for controlling the entry of data into the register. When both data enable inputs, GnZ, are low, data at the D inputs are loaded on the next positive transition of the clock input. Buffer output enable inputs, MZ and NZ, are also provided. When both are low, the normal logic states (high or low levels) of the four outputs are impressed on the data bus, The outputs are disabled by a high logic level at either output control input, The outputs then present a high impedance to the internal bus. When the outputs are disabled, sequential operation of the flip-flops is not affected. The' ASC173 is iml?lemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* IpFI CELL AREA til CI) CI) .c CJ) ...caca C MAXIMUM ICC InAI SN54ASC' SN74ASC' IV120LH 1 2 2 1.6 262 15.7 IV222LH 2 4 8 3.92 972 58.4 NA210LH 1 12 12 6.12 1572 94.08 N0210PH 1 2 2 0.66 256 15.42 R2406LH 26.25 1 26.25 11.7 2931 176 21 50.25 24 5993 360 TOTALS II ... Label: S173LH D1.D2.D3.D4.CLK,CLR.G1 Z.G2Z.MZ.NZ,01 ,02.03.04; :l:The equivalent power diSSipation capacitance does not include interconnect capacitance. PRODUCTIOII DATA d.cumants contain information currant 8S of publication data. Products conform to specifications par the terms of Texas Instruments ::'=i~8{::I~lJi =~:~:r lIr:=::;:.~ not Copyright © 1986, Texas Instruments Incorporated TEXAS . . INSTRUMENTS POST OFFICE BOX 665012 • DAll.AS. TEXAS 75265 4-141 SN54ASC173, SN74ASC173 4·81T O·TYPE REGISTERS WITH 3·STATE OUTPUTS The SN54ASC173 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC173 is characterized for operation from - 40°C to 85 DC. FUNCTION TABLE (EACH FLIP-FLOP) (see Note 1) INPUTS OUTPUT CLR C,LK G1Z G2Z H X L L X X L t t t t H X X X 0 X X X X H H L L L L L H' L L L Q L 00 00 00 L H 00 = level of 0 before the indicated steadystate input conditions were established. NOTE 1: When either MZ or NZ (or both) is (are) high, the output is disabled to the high-impedance state; however, sequential operation of the flip-flops is not affected . • logic diagram CLK C .... I» I» CJ) :::r CD CD .... en Q1 Q2 os Q4 y 4-142 TEXAS • INSTRUMENTS POST'OFFlce BOX 655012 • DALLAS. TEXAS 75265 SN54ASC173, SN74ASC173 4-81T O-TYPE REGISTERS WITH 3-STATE OUTPUTS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most' engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements are made during pre-layout simulation that produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage ICC Supply current VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA = Input capacitance On = VCC TA 5 V, = 25°C MZ, NZ OutpUt capacitance VCC - 5 V, TA - 25°C Equivalent power 5 V, VCC TA = 25°C tr dissipation capacitance t tf MAX 2.2 5993 MINto MAX GnZ Cpd TYP MAX 2.2 ClK Co SN74ASC173 TYP TA - 25°C VCC - 5 V, ClR Ci SN54ASCl73 V 360 0.24 0.24 0.24 0.24 UNIT nA 0.12 0.12 0.11 0.11 0.11 0.11 0.33 0.33 pF 24 24 pF 3 ns, • pF ... II) Q) Q) tThe equivalent power dissipation capacitance does not include interconnect capacitance. .s::. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Notes 2 and 3) * FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd ClK Q tpHl ClR Q MZ,NZ Q Any Q Any Q PARAMETER ten Atpd 6.t en CL SN54ASC173 TYP§ MAX MIN SN74ASC173 TYP§ MAX UNIT ...caca C MIN 7.1 15.2 7.1 13.8 ns 5.5 11.5 5.5 10.3 ns 3.9 8.2 3.9 7.4 ns 0.3 0.9 2.3 0.4 0.9 2.1 ns/pF 0.4 0.9 2.3 0.5 0.9 2.1 ns/pF =0 rn tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%), tpd '" propagation delay time, low-to-high or high-to-Iow output ten e; enable time, high-impedance state to low- or high-logic-level output tPHL '" propagation delay time, high-to-Iow output ~tpd ;;;;;; change in tpd with load capacitance boten ;;;;; change in ten with load capacitance §Typical values are at V CC = 5 V, TA = 25 ·C. NOTES: 2. These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Actual performance can be evaluated at post-layout simulation. 3. Enable and delta-enable times are measured using the conditions specified for the 'ASC2311 (lV222LH). TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 4-143 SN54ASC173, SN74ASC173 4·81T O·TYPE REGISTERS WITH 3·STATE OUTPUTS DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HOL for this soft macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed.The following printout of the HOL block definition is furnished for reference. HDL FILE • BLOCK S173LH; 01 @INPUT; 02 @INPUT; 03 @INPUT; 04 @INPUT; CLK @INPUT; CLR @INPUT; G1Z @INPUT; G2Z @INPUT; MZ @INPUT; NZ @INPUT; Q1 @OUTPUT; Q2 @OUTPUT; Q3 @OUTPUT; Q4 @OUTPUT; STRUCTURE G01 G02 G03 G04 INV2 INV6 NA1 NA10 NA11 NA12 NA2 NA3 NA4 NA5 NA6 NA7 NA8 NA9 N01 N02 FF14 :IV222LH :IV222LH :IV222LH :IV222LH :IV120LH :IV120LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :N0210LH :N0210LH :R2406LH QAZ,N020,Q1; QBZ,N020,Q2; QCZ,N020,Q3; QOZ,N020,Q4; CLR,INV20; N010,INV60; QA,INV60,NA 10; NA30,NA40,NA 100; NA50,NA60,NA 110; NA70,NA80,NA 120; N01 0,01 ,NA20; QB,INV60,NA30; N010,02,NA40; QC,INV60,NA50; N010,03,NA60; QO,INV60,NA70; N010,04,NA80; NA 10,NA20,NA90; G1Z,G2Z,N010; MZ,NZ,N020; INV20,NA90,NA 1OO,NA 11 O,NA 120,CLK,QA,QAZ,QB,QBZ,QC, QCZ,QO,QOZ: END S173LH; 4-144 TEXAS .." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC173, SN74ASC173 4-81T O-TYPE REGISTERS WITH 3-STATE OUTPUTS designing for testability Designs employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected through an inverter to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an OR gate. II ... U) II) II) .c en ... CO CO C TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-145 • c Q) r+ Q) C/) :::r CD CD r+ til 4-146 SN54ASC174, SN74ASC174 HEX OoTYPE FLIP-FLOPS D2939, AUGUST 1986 SystemCell™ • • • 2-J.lm SOFTWARE MACRO CELL logic symbol t Six-Bit Register Direct Clear Input Simplifies Initialization or Pattern Length CLRZ CLK Clock Buffer Provides Symmetrical Performance Across Long Registers description Dl 01 D2 02 D3-- 03 D4 04 05 D5 The SN54ASC174 and SN74ASC174 are 06 standard-cell software macros implementing a D6 6-bit D-type register element for embedding in t This symbol is in accordance with ANSI/lEEe Std 91-1984 and ASICs in its most efficient form. Its 6-bit length IEC Publication 617-12. simplifies construction of large counters. The 'ASC174 implements a function table identical with that performed by packaged 'HC174, 'LS174, and 'F174 registers. It may be customized to meet specific systems requirements. This software macro reduces the input loading for implementation of larger registers, as standard library cells are used to buffer the clear and clock inputs to further enhance performance across long registers. The' ASC174 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: 4 en ~ CELL NAME RELATIVE CELL AREA TOTAL RELATIVE NO. USED TO NA210LH CELL AREA 0,75 IVll0LH 2 1.5 TOTAL Cpd* (pFI 0,88 SN54ASC' 210 .c SN74ASC' tn 12.64 IV140LH 1,5 2 3 3.22 380 22.8 DFC20LH 7,2 6 43.2 20.34 5286 317.4 10 47.7 24.44 5876 353 TOTALS Q) Q) MAXIMUM ICC (nAI ca ca ~ C Label: S174LH 01 ,D2,D3,D4,D5,D6,CLK,CLRZ,Ql ,Q2,Q3,Q4,Q5,Q6; +The equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC174 is characterized for operation over the full military temperature range of - 55 DC to 125 DC, The SN74ASC174 is characterized for operation from - 40 DC to 85°C. FUNCTION TABLE (EACH FLiP-FLOPI INPUTS CLRZ CLK PRODUCTION DATA dooum~." oOR"i. inlorm.ti•• ou,ra.t .s of publlostio. data. Products co.farm to _iliostlo•• PO' the torms of T.... Instruments standard warranty. PrJHIuctian ~raC8lsiJta dolS not .......rily inolude tasting 01 III poramiltar•. OUTPUT On Q L X X L H H t t H H L L H L X QO Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTs POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 4-147 SN54ASC174, SN74ASC174 HEX O·TYPE FLlp·FLOPS logic diagram DFC201.x r---=CK~~C1 Q Q1 01 CLRZ OFC201.x Q2 02 "1V11Otx 1V1401.x CLK DfC201.x Q3 03 • OFC201.x Q4 04 ...C I» I» rn DFC20Lx =- CD CD ... D6 (I) DFC201.x Q6 D6 absolute"maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarc;ling pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre·layout simulation produce workstation output used to identify and resolve each specific timing need. 4·148 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC174. SN74ASC174 HEX O·TYPE FLlp·FLOPS electrical characteristics PARAMETER VT ·Iec Ci VCC ~ 5 V, Input threshold voltage SN54ASC174 SN74ASC174 TYP TYP TA ~ 25°C Supply current I CLRZ ( On I eLK TA Vce - 5 V, ~ 25°C tr - tf - 3 ns, TA ~ 25°C dissipation capacitance t UNIT V 353 0.12 Vee ~ 5 V, MAX 2.2 5876 TA ~ MIN to MAX Input capacitance MAX 2.2 Vee - 4.5 V to 5.5 V, VI - Vee or 0, Equivalent power Cpd TEST CONDITIONS nA 0.12 0.11 0.11 0.12 0.12 24.44 24.44 pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of operating free-air temperature and supply voltage . (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd CLK Q tpHL CLRZ Q <1tpd Any Q PARAMETER* SN54ASC174 TYP§ MAX MIN CL ~O 0.1 SN74ASC174 TYP§ MAX UNIT ns MIN 8 17.4 8 15.6 5.1 9.5 5.1 8.8 0.5 1.1 0.5 1 0.1 ns nslpF *Propagation delay times are measured from the 44% point of VI to the 44% point c~ Vo with tr ~ tf ~ 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output tPHL '" propagation delay time, high-to-Iow output .6.tpd 5 change in tpd with load capacitance § Typical values are at Vec ~ 5 V, T A ~ 25°C. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. . • .... U) CJ) CJ) .c t/) ....COCO C DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the mitlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-149 SN54ASC174, SN74ASC174 HEX O·TYPE FLlP·FLOPS HDL FILE BLOCK S174LH; D1 @INPUT; D2 @INPUT; D3 @INPUT; D4 @INPUT; 05 @INPUT; D6 @INPUT; CLK @INPUT; CLRZ @INPUT; 01 @OUTPUT; 02 @OUTPUT; 03 @OUTPUT; 04 @OUTPUT; 05 @OUTPUT; 06 @OUTPUT; STRUCTURE FF1 FF2 FF3 FF4 FF5 FF6 INV1 INV2 INV3 INV4 END S174LH: III C I» r+ I» tn ::T CD CD :DFC20LH :OFC20LH :OFC20LH :OFC20LH :DFC20LH :DFC20LH :IV110LH :IV140LH :IV110LH :IV140LH INV20,D1 ,INV40,01 ,DUM: INV20,D2,INV40,02,DUM; INV20,D3,INV40,03,DUM; INV20,D4,INV40,04,DUM; INV20,D5,INV40,05,DUM; INV20,D6,INV40,06,DUM; CLRZ,INV10; INV10,INV20; CLK,INV30; INV30,INV40; r+ CI) designing for testability Designs employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the Clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. 4-150 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC175, SN74ASC175 QUADRUPLE D·TYPE FLlp·FLOPS WITH COMPLEMENTARY OUTPUTS 02939, AUGUST 1986 SystemCelr M 2-j.lm SOFTWARE MACRO CELL logic symbol t • Four-Bit Register with Complementary Outputs • Direct Clear Input Simplifies Initialization or Pattern Length • Embedded Clock Driver Provides Clock Buffering • CLRI CLK 01 01 011 02 02 Parallel Latches for a-Bit, 16-Bit, 32-Bit Word Widths 021 03 03 03Z 04 04 description 04Z The SN54ASC175 and SN74ASC175 are t This symbol is in accordance with ANSI/IEEE Std 91-1984 and standard-cell software macros implementing a IEC Publication 617-12. 4-bit register element for embedding in ASICs. Its 4-bit length simplifies construction of large registers. The' ASC175 implements a function table identical with that performed by packaged 'HC175, 'LS175, and 'F175 registers. This macro reduces the input loading for implementation of larger registers, as standard library cells are used to buffer the clear input and the R2406lH register clock input is internally buffered. The' ASC175 is implemented with the standard cell functions indicated. The HDl netlist label for this software macro is shown on the last line of the following table: II ... fI) Q) Q) .c RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pF) CELL AREA SN54ASC' ...caca SN74ASC' IVll0LH 0.75 1 0.75 0.44 105 6.32 IV140LH R2406LH 1.5 26.5 1 1.61 11.69 190 2931 11.4 1 1.5 26.5 3 28.5 13.74 3226 194 TOTALS U) MAXIMUM ICC (nA) C 176 Label: S175LH D1 ,D2,D3,D4,CLK,CLRZ,01 ,Q1Z,Q2,Q2Z,Q3,Q3Z,Q4,Q4Z; tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC175 is characterized for operation over the full military temperature range of - 55 DC to 125°C. The SN74ASC175 is characterized for operation from -40 DC to 85°C. FUNCTION TABLE (EACH FLIP-FLOP) INPUTS CLRZ CLK On X L H H L H X t t L L H H L X 00 00 L H PRODUCTION DATA documents .o.lai. information current as of publication data. Products conform to spacifications per-the terms of Taxas Instruments :'=~~i;a[::1~1e ~=::i:r :1~o::::9t::ae:s not OUTPUTS QZ 0 H ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-151 • SN54ASC175, SN74ASC175 QUADRUPLE D·TYPE FLlp·FLOPS WITH COMPLEMENTARY OUTPUTS logic diagram R2408Lx CLK >-..........~~~...............~~~.....~..........CL~K~ FQ~l~..............................~ Q,' Q1Z CLRZ Q2 01 Q2Z 02 Q3 03 FF14 Q3Z 04 Q4 Q4Z absolute maximum ratings and recommended operating conditions See Table 1 in Section 2 . timing requirements III Specific tim'ing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. C I» pot. I» (/) electrical characteristics ::r CD CD pot. rn . PARAMETER VT Input threshold voltage lee Supply current ei Input capacitance epd TEST CONDITIONS SN74ASC175 TYP TYP I I On I elK Equivalent power Vee = 5 V. dissipation capacitance t TA = 25°e 0.12 0.13 0.13 0.24 0.24 I r =lf=3ns, 13.74 13.74 int~rconnect capacitance. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 UNIT V 194 0.12 TA = 25°e MAX 2.2 3226 elRZ Vee = 5 V, MAX 2.2 TA = 25°e Vee = 5 V, Vee - 4.5 V 10 5.5 V, VI - Vee or 0, TA = MIN to MAX t The equivalent power dissipation capacitance does not include 4-152 SN54ASC175 nA pF pF SN54ASC175. SN74ASC175 QUADRUPLE D·TYPE FLlP·FLOPS WITH COMPLEMENTARY OUTPUTS switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) FROM (INPUT) TO TEST (OUTPUT) CONDITIONS tpd CLK Q tpd CLK QZ PARAMETERt tPLH tpHL CLRZ QZ CLRZ Q L>tpd CLK Q CL SN54ASC175 Typt MAX =0 0.2 SN74ASC175 TYP* MAX 5 10.6 5 9.6 5.5 12.5 5.5 MIN MIN 6 10.4 6 11.3 9.4 5.4 8.3 5.4 7.7 0.9 2.3 0.9 2.1 0.3 UNIT ns ns ns/pF t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpd s propagation delay time. low-to-high-Ievel or high-to-Iow-Ievel output tpLH '" propagation delay time. low-to-high-Ievel output tpHl ;;;;; propagation delay time, high-to-Iow-Ievet output L>tpd '" change in tpd with load capacitance Typical values are at VCC = 5 V. T A = 25 ·C. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. * DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HOL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HOL block definition is furnished for reference. rn CD CD .c en ...asas HDL FILE C BLOCK S175LH; 01 @INPUT; 02 @INPUT; 03 @INPUT; 04 @INPUT; CLK @INPUT; CLRZ @INPUT; Q1 @OUTPUT; Q1Z @OUTPUT; Q2 @OUTPUT; Q2Z @OUTPUT; Q3 @OUTPUT; Q3Z @OUTPUT; Q4 @OUTPUT; Q4Z @OUTPUT; STRUCTURE FF14 :R2406LH INV1 :IV110LH :IV140LH INV2 END S175LH: II ... INV20,01 ,02,03,04,CLK,Q1 ,Q1 Z,Q2,Q2Z,Q3,Q3Z,Q4,Q4Z; CLRZ,INV10; INV10,INV20; TEXAS -II INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-153 SN54ASC175, SN74ASC175 QUAORUP~E OoTYPE FLIP-FLOPS WITH COMPLEMENTARY OUTPUTS designing for testability Designs employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the qesign in its final form. The need to preset or clear and read intermediate stages of these eleml'lnts should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to .maintainability. Simple ·actions on the part of the ASIC qesigner can result in considerable cost savings, ~lIowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. . power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. II 4-154 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • OALLAS, TEXAS 76265 SN54ASC177. SN74ASC177 1-BIT AND 3-BIT BINARY RIPPLE COUNTERS D2939, AUGUST 1986 SystemCelJ1'" 2-llm SOFTWARE MACRO CELL logic symbol t • Individual 1-Bit and 3-Bit Counters for Implementing Custom Count Sequences • Asynchronous Clear Initializes Sequence Regardless of Mode • Parallel Asynchronously Presettable for Modulo-N Sequel"!ces • Performs Ripple-Count or Simple Latching Functions LOADZ CLRZ CLK1Z OA lD A description DIVS The SN54ASC177 and SN74ASC177 are standard-cell software macros implementing 1-bit and 3-bit ripple counter elements. The overall 4-bit configuration provides the custom IC designer a multifunction counter/latch to embed in ASICs in its most efficient form, and its 4-bit length simplifies construction of large counters, The 'ASC 177 implements a count sequence identical with that performed by packaged' ASC177 counters. 08 8 oc C OD D tThis symbol is in accordance with ANSI/IEEE Std 91·1984 and . . IEC Publication 617-12. . . RELATIVE CELL NAME CELL AREA NO, USED TO NA210LH -TOTAL TOTAL RELATIVE Cpd* IpF) CELL AREA SN54ASC' CD CD .c en ...caca o MAXIMUM ICC InA) SN74ASC' AN220LH 1.75 1 1.75 1.2 228 DFB20LH 7.7 4 30.8 15.04 3736 224 IV110LH 0.75 3 2.25 1.32 315 18.96 13.6 IV140LH 1.5 1 1.5 1.61 190 11.4 NA210LH NA310LH 1 1.25 4 4 4 2.04 524 31.36 5 2 652 39.12 N0410LH 1.5 1 1.5 0.35 177 10.6 18 46.8 23.56 5822 350 TOTALS ... II) These ripple counters consist of four D-type flip-flops that are interconnected to provide a divide-by-two and a divide-by-eight counter. A divide-by-16 sequence is obtained by connecting the QA output to the CLK2Z input, During the count operation, transfer of information to the outputs occurs on the negativegoing edge of the clock pulse. The' ASC177 is implemented with the standard cell functions indicated, The HDL netlist label for this software macro is shown on the last line of the following table: Label: SI77LH A,B,C,D,LDADZ,CLRZ,CLK 1Z,CLK2Z,QA,QB,QC,QD; +The equivalent power dissipation capacitance does not include interconnect capacitance. PRODUCTION DATA documents contain Information .urrent as of publication datil. Products ".form 10 specifications per the lonna of Toni I••trumants :.:=~;ai:I~I,; ~~~:l' :.:o;::::lt:~~!lot -1!1 TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright @ 1986, Texas Instruments Incorporated 4-155 SN54ASC1l7, SN74ASC177 1:BIT .AND 3·B11 BINARY RIPPLE COUNTERS The counter is fully programmable; that is, it may be preset to any number between 0 and 15. As presetting is asynchronous, a low level at the load input disables the counter and causes the outputs to agree with the setup data independently of the level of the clock input. These counters may be used as 4-bit latches by using the LOADZ input as the strobe and entering data at the data inputs. The outputs will directly follow the data inputs while LOADZ is low, but will remain unchanged while LOADZ is high and the clock inputs are inactive. Clearing is asynchronous. A low level at the clear input sets all outputs low regardless of the levels of the clocks or LOADZ. . The SN54ASC177 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC177 is characterized for operation from -40°C to 85°C. FUNCTION TABLE ISee Note 11 OUTPUTS INPUTS II c .... Q) Q) en ::r CD ....CD U) CLRZ LOADZ D C B A CLK1Z OD OC OB QA L H L L L d c b a H H L L L H H H L L H L H H X X i i i i i i i t i t t i i L L X b X X X X X X X H X c X X X X X X X X X X X X X X X X L L H H L H L L L H L H L H H L L H H L H H L L H L L H H L H L H L H H H H L L H H L H H H H X X H H X d X X X X X X X X X X X X X X X X H H X H H H H H H H H H H H 11 H H H H H H H H H H H H X X X X X X X X X X a X X X X X X X X X X X X X X X X X H H H H L L L L L 00 00 00 00 See Explanation of Function Tables in Section 1. NOTE 1: Table applies with output OA connectd to CLK2Z input. 4-156 L t i i TEXAS • INSTRUMENlS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC177. SN74ASC177 1·BIT AND 3·BIT BINARY RIPPLE COUNTERS logic diagram IVllOLx A CLK1Z A 1-~--r'")QA LOADZ CLRZ 1-.......---t>QB B r">-----------++;.....!NA4 IVllOLx CLK2Z r">-_---=A::....j v INV4 c QC a D r">-----------++~~~ ao en ~ Go) Go) .c (J) co co absolute maximum ratings and recommended operating conditions ~ C See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre·layout simulation produce workstation output used to identify and resolve each specific timing need. . electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage lee Supply current ej Input capacitance I epd r r SN74ASC177 TYP TYP Vee = 5 V. TA = 25°e All others Equivalent power Vee = 5 V, dissipation capacitance t TA = 25°e tr = tf = 3 ns, MAX 2.2 Vee = 5 V, TA= 25°e Vee = 4.5 V to 5.5 V, VI = Vee or 0, TA = MIN to MAX LOADZ eLRZ SN54ASC177 MAX 2.2 5822 V 350 0.13 0.13 0.25 0.25 0.12 0.12 23.56 23.56 UNIT nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-157 SN54ASC177. SN74ASC177 1·B11 AND 3·B11 BINARY RIPPLE COUNTERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) PARAMETERt tpd FROM (INPUT) TO TEST (OUTPUT) CONDITIONS CLK1Z OA tpd tpd CLK2Z tpd SN54ASCl77 MIN TYP* SN74ASCl77 MAX 6 6 15 OB OC 10 28.1 16 41.2 00 CL =0 MIN 15 MAX 6 6 13.3 ns 13.3 ns 10 16 24.9 ns 36.5 ns 10.6 12,4 ns tpd A,B,C,D Any 5 11.5 tpd LOADZ Any 7 13.9 5 7 CLRZ Any RCO 5,4 21.3 5,4 19.4 0.5 1.3 0.5 1.2 tpd lltpd Any 0.1 0.1 UNIT TYP* ns no ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high-Ievel or high-to-Iow·level output lltpd .. change in tpd with load capacitance Typical values are at VCC = 5 V, TA = 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. * II DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. HDL FILE BLOCK Sl77LH; A @INPUT; B @INPUT; C @INPUT; D @INPUT; LOADZ @INPUT; CLRZ @INPUT; CLK1Z @INPUT; CLK2Z @INPUT; OA @OUTPUT; OB @OUTPUT; OC @OUTPUT; OD @OUTPUT; 4-158 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 SN54ASC177, SN74ASC177 1-BIT AND 3-BIT BINARY RIPPLE COUNTERS HDl (Continued) STRUCTURE AN1 FFA FFB FFC FFD INV1 INV2 INV3 INV4 NA1 NA3 NA4 NA5 NA6 NA7 NA8 NA9 N01 END S177lH; :AN220lH :DFB20LH :DFB20lH :DFB20LH :DFB20lH :IV110lH :IV110LH :IV140lH :IV110lH :NA310lH :NA210lH :NA310LH :NA210LH :NA310LH :NA210LH :NA310LH :NA210LH :N0410lH LOADZ,ClRZ,AN10; NA30,NA 1 0,FFAQZ,INV1 O,QA,FFAQZ; NA50 ,NA40 ,FFBQZ,INV40 ,QB,FFBQZ; NA 70, NA60, FFCQZ, FFBQZ, QC ,FFCQZ; NA90,NA80,FFDQZ,FFCQZ,QD,FFDQZ; ClK1Z,INV10; ClRZ,INV20; AN10,INV30; ClK2Z,INV40; A,N01 0,INV30,NA 10; NA 1 0,INV30,NA30; N010,B,INV30,NA40; NA40,INV30,NA50; C,N010,INV30,NA60; NA60,INV30,NA70; D,N010,INV30,NA80; NA80,INV30,NA90; INV20,INV20,INV20,INV20,N010; • ... II) count definition These counters ar~ unidirectional with respect to count operation. Inverting the output levels will produce a down-count sequence. Bidirectional counters are available in software macros 'or can be constructed using the' ASC2405 through' ASC2407 4-bit predesigned registers. Additional single bits can be achieved with predesigned flip-flops offered in TI's standard cell family. designing for testability CD CD .c CI) ... CO CO C Designers employing storage or bistable elements, especially long counters (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of th.e clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. TEXAS • INSTRUMENTSPOST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-159 c C» r+ C» en ::r CD CD r+ en 4-160 SN54ASC181, SN74ASC181 ARITHMETIC LOGIC UNITS/FUNCTION GENERATORS 02939. AUGUST 1986 SystemCell™ 2-j.lm SOFTWARE MACRO CELL logic symbol t • Performs Full 16-Function Arithmetic or Boolean Combinations of Two Variables • Arithmetic Operating Modes: Addition Subtraction Shift Operand A One Position Magnitude Comparison Plus Twelve Other Arithmetic Operations • };, so Sl S2 S3 ALU PZ GZ AEQB M Logic Function Modes: Exclusive-OR Comparator AND, NAND, OR, NOR Plus Ten Other Logic Operations CNPL4 CI CN AOZ IIJ FOZ [2J FIZ [4J F2Z [8J F3Z BOZ AIZ BIZ description A2Z The 5N54A5C181 and 5N74A5C181 are standard-cell software macro 4-bit arithmetic logic units. The' A5C 181 implements a function table identical with that performed by packaged 'L5181, '5181, and 'F181 arithmetic logic units/function generators. B2Z II A3Z B3Z tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. The' A5C 181 performs 16 arithmetic or Boolean operations on two 4-bit binary words 'IS shown in Tables 1 and 2. Choice between the two operating modes is established by the mode control, M, and selection of one-of-sixteen operations is accomplished at the select inputs 53, 52, 51, and 50. The' A5C181 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TOTAL TOTAL RELATIVE Cpd* (pF) MAX[MUM ICC InA) SN54ASC' SrI/74ASC' AN210LH 1.5 9 13.5 8.1 1746 104.4 AN310LH 1.75 9 15.75 9.54 1989 119.7 AN420LH 2.25 1 2.25 1.72 286 17.2 EX210LH 4 8 4.48 EX220LH 2 2.25 4 9 6 892 1032 53.6 62 IVll0LH 0.75 8 6 3.52 840 50.56 IV120LH 1 1 1 0.8 131 7.85 NA210LH 1 4 5 2.55 655 TO NA210LH CELL AREA NA220LH 1.5 1 1.5 1 196 :39.2 11.7 NA310LH NA410LH 1.25 1.5 4 2 6 5 9 3 652 1122 39.12 67.2 NA510LH 1.75 2 3.5 1.04 426 25.6 N0210LH 1 5 5 1.65 38.55 37.32 675 N0310LH 1.25 TOTALS 4 5 1.28 64Q 624 62 89.5 46.68 11231 Label: S181 LH A3Z,A2Z,A 1Z,AOZ.B3Z.B2Z.B1Z.80Z.CN,M,S3.S2.S1.S0.F3Z.F2Z. F I Z.FOZ.AEQB.GZ.PZ.CNPL4; tThe equivalent power dissipation capacitance does not include interconnect capacita~ce. PRODUCTION DA fA doc.manl. contain information current as of publication date. Products conform to specifications per the terms of TeXIS Instruments ::=:~~;a{::I~'le =:~ti:r lIr=::::t:::: s not Copyright © 1986. Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-161 SN54ASC181, SN14ASC181 ARITHMETIC LOGIC UNITS/FUNCTION GENERATORS When the mode control input is low, the 16 arithmetic operations are accessible via the four select inputs. The 4-bit fu'li adder incorporates both ripple and look-ahead carry circuitry, providing the capability to extend either technique across expanded word widths when multiple' 'ASC181s are Llsed in parallel. The 'ASC181 accommodates both active-high and active-low data'simply by redefining the designations used to describe the data inputs and outputs. For use with active-low data, use Table 1 and the input/output designations provided for the label developed above. For use with active-high data. use Table 2. Note that only the relationships of A, B, and F data with respect to the carrY and look-ahead circuitry are affected. Subtraction is accomplished by 1's complement addition in which the 1's complement of the subtrahend is generated internally. The resultant output is A-B-1, which ret!uires an end-around or forced carry to provide A-B. Arithmetic operations with and without carry are shown in Tables 1 and 2. The 'ASC181 also performs a comparison of the A and B operands. The AEOB output is decoded from the function outputs (F3, F2, F1, and FO) so that, when two words of equal magnitude are applied at the A and B inputs, it will assume a high level to indicate equality (A = B). The ALU must be in the subtract mode with CN = H when performing this comparison. The AEOB output can be AND- or NAND-gated to perform comparisons over expanded ALUs. The CNPL4 carry output can also be used to supply relative magnitude information. Again, the ALU must be in the subtract mode by having the select inputs S3, S2, S 1, and SO at L, H, H, L, respectively. II INPUT CN OUTPUT CNPL4 ACTIVE·LOW DATA (FIGURE 11 ACTIVE-HIGH DATA (FIGURE 21 H H A",B AsB H L AB L H A>B A ~ .., NA21Qb ·.. A'''''''', A ...," au ...caca C ., A NA21C1.>r y .~ • , .. ... -~ ~'0I..lc c::tG88 A' NA21CLX V G31 > A , Gall II NA2I!lt.. • M10Lx A "'" '"' .c I ·"" ~Y U,"'" CI) CI) ~. , . U) U) ~GZIYAf¥I.'Y 7~ II ... GOO . ANA2ICL~ '" . ~ ..., :~- · -+Qv "" , ... ... ~ TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-171 SN54ASC191, SN74ASC191 SYNCHRONOUS. UP/DOWN BINARY COUNTERS WITH DOWN/UP MODE CONTROL typical load, count, and inhibit sequences Illustrated below is the following sequence: Load (preset) to binary thirteen. Count up to fourteen, fifteen (maximum), zero, one, and two. Inhibit. Count down to one, zero (minimum), fifteen, fourteen, and thirteen. 1. 2. 3. 4. lOADZ--U I I I-I A--1 L..._ I I I B r- ,--- I I DATA INPUTS C--1 II L..._ 0--1 1 -- L..._ ClK D-UZ - , I I I I I I CTENZ - , I I - I: I i-----... L.iJ - -, OB ___ '--__ --I I I OC - --I - --' 00 - --I __ .-I --~ MAX_MIN ___ I I I I I I I I I I I I I I I II I II I I I I RCOZ==J I I I I I 13 I I I I U~ 14 U 15 I 0 COUNT UP I 2 2 I ~I" INHIBIT I 2 -.t I---- lOAD 4-172 I Il U TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 0 15 COUNT DOWN 14 13 ~I SN54ASC191. SN74ASC191 SYNCHRONOUS UP/DOWN BINARY COUNTERS WITH DOWN/UP MODE CONTROL absolute maximum ratings and recommended' operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT lee ei epd = 5 V, Vee = 4.5 V to 5.5 TA = MIN to MAX Input threshold voltage Vee Supply current Input capacitance ~ SN54ASC191 TEST CONDITIONS eTENZ All others Vee = TA V, VI TA 5 V, =5 = 25 Equivalent power Vee V, dissipation capacitance TA °e tr = 25°e = Vee or 0, 2.2 TYP MAX 2.2 3 ns, 586 0.34 0.34 0.12 0.12 37.26 37.26 UNIT V 9763 = 25°e = tf = SN74ASC191 MAX TYP nA pF pF switchiJ;lg characteristics over recommended ranges of supply voltage and operating free-air temperature. (unless otherwise noted) (see Note 11 ... fI) PARAMETERt FROM TO TEST CONDITIONS SN54ASC191 Typt MAX MIN SN74ASC191 Typt MAX MIN (INPUT) (OUTPUT) tpd lOADZ Q 7.7 15 7.7 13.0 ns tpd A,B,C,D Q 5.9 11.6 5.9 10A ns tpd ClK Rcaz 2.7 4.5 2.7 4.3 ns tpd ClK Q 8 18 8 16 ns tpd ClK MAX MIN 11.5 25.5 11.5 22.7 ns tpd D UZ ReaZ 6.9 1'3.2 6.9 11.9 ns tpd D UZ MAX MIN 5.9 11.2 5.9 10.1 ns tpd CTENZ RCaZ 2.6 4.8 2.6 4.5 ns dtpd Any Q 0.1 0.5 1.3 0.1 0.5 1.2 ns/pF dtpd Any RCaZ 0.5 1.3 3.8 0.5 ns/pF Any MAX MIN 0.5 1.1 2.7 0.5 1.3 1.1 3.2 dtpd 2.5 ns/pF el = ° G) G) UNIT .c (I) ...caca C tpropagation delay times are measured from the 44% point of VI to the 44% point of Va with tr = tf = 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel .output dtpd '" change in tpd with load capacitance tTypical values are at VCC = 5 V, TA = 25°C. . NOTE 1: These switching characteristics arS simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post·layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-173 SN54ASC191, SN74ASC191 SYNCHRONOUS UP/DOWN BINARY COUNTERS WITH DOWN/UP MODE CONTROL HDL FILE BLOCK S191 LH; D @INPUT; C @INPUT; B @INPUT; A @INPUT; CLK @INPUT; D_UZ @INPUT; CTENZ @INPUT; LOADZ @INPUT; QD @OUTPUT; QC @OUTPUT; QB @OUTPUT; QA @OUTPUT; RCOZ @OUTPUT; MAX_MIN @OUTPUT; • C m r+ m en :::r CD CD r+ tn 4-174 STRUCTURE FF1 FF2 FF3 FF4 G01 G02 G03 G04 G05 G06 G07 G08 G09 G10 G11 G12 G13 G14 G15 G16 G17 G18 G19 G20 G21 G22 G23 G24 G25 G26 G27 G28 G29 G30 :DFB20LH :DFB20LH :DFB20LH :DFB20LH :IV110LH :IV110LH :N0210LH :N0210LH :NA510LH :NA510LH :NA210LH :NA310LH :NA210LH :IV110LH :IV110LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :IV110LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA310LH :NA310LH :NA210LH :IV110LH :NA210LH G150,G090,G140,G440,QA,FF1QZ; G240,G160,G230,G440,QB,FF2QZ; G330,G250,G320,G440,QC,FF3QZ; G420,G340,G410,G440,QD,FF4QZ; D_UZ,G010; . G010,G020; G020,CTENZ,G030; G010,CTENZ,G040; G010,QA,QB,QC,QD,G050; G020,FF1 QZ,FF2QZ,FF3QZ,FF4QZ,G060; G050,G060,MAX_MIN; G430,MAX_MIN,G100,RCOZ; A,G450,G090; CTENZ,G100; G100,G110; QA,G110,G120; G100,FF1QZ,G130; G120,G130,G140; G090,G450,G150; B,G450,G160; G040,FF1 QZ,G170; QA,G030,G180; G170,G180,G190; G190,G200; QB,G200,G210; G190,FF2QZ,G220; G210,G220,G230; G160,G450,G240; C,G450,G250; G040,FF1 QZ,FF2QZ,G260; QA,QB,G030,G270; G260,G270,G280; G280~G290; QC,G290,G300; TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC191, SN74ASC191 SYNCHRONOUS UP/DOWN BINARY COUNTERS WITH DOWN/UP MODE CONTROL HDL FILE (Continued) STRUCTURE (Continued) G31 :NA210LH G32 :NA210LH G33 :NA210LH G34 :NA210LH G35 :NA410LH G36 :NA410LH G37 :NA210LH G38 :IVJ 10LH G39 :NA210LH G40 :NA210LH G41 :NA210LH G42 :NA210LH G43 :IV110LH G44 :IV120LH G45 :IV110LH END S191LH; G280,FF3QZ,G310; G300,G310,G320; G250,G450,G330; D,G450,G340; G040,FF1 QZ,FF2QZ,FF3QZ,G350; QA,QB,QC,G030,G360; G350,G360,G370; G370,G380; QD,G380,G390; G370,FF4QZ,G400; G390,G400,G410; G340,G450,G420; CLK,G430; G430,G440; LOADZ,G450; II count definition These counters are bidirectional with respect to count operations, and the relationship for counting up or down is defined by the D_UZ select input. Unidirectional counters are available in software macros or can be constructed using the' ASC2405 through' ASC2407 4-bit predesigned registers. Additional single bits can be achieved with flip-flop cells offered in TI's standard cell family. ... U) Q) Q) .c en designing for testability Designers employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 ...caca C 4-175 II ...c D) D) en :::r ... CD CD tn 4-176 SN54ASC193, SN74ASC193 SYNCHRONOUS 4-811 UP/DOWN COUNTERS (DUAL CLOCK WITH CLEAR) 02939, AUGUST 1986 SystemCell™ • • 2-",m SOFTWARE MACRO CELL logic symbol t Dual Clock Inputs for Sourcing Count Direction Fully Synchronous in Count Modes • • • CTRDIV 16 ClR Parallel Asynchronous Load for Modulo-N Count Sequences CT-D UP 2+ COZ Gl Asynchronous Clear DOWN Look-Ahead Circuitry Enhances Performance of Cascaded Counters 1- BOl G2 lOADZ A [1] QA B [2] QB C [4] QC D [8] QD tThis symbol is in accordance with ANSIIIEEE Std 91-1984 and IEC Publication 617-12. description The SN54ASC193 and SN74ASC193 are standard-cell software macros implementing 4-bit up-down binary counters, The 4-bit configuration provides the custom IC designer a bidirectional counter to embed in ASICs in its most efficient form. Its 4-bit length means that testability is simplified when constructing large counters. The' ASC 193 implements a count sequence identical with that performed by packaged 'HC193, 'LS193, and 'F193 counters. The' ASC 193 is a synchronous, reversible up/down counter. Synchronous operation is provided by having all flip-flops clocked simultaneously so that the outputs change coincidentally with each other when so instructed by the steering logic. This mode of operation eliminates the output counting spikes normally associated with asynchronous (ripple clock) counters. The' ASC 193 is implemented with the standard cell functions indicated. This software macro is identified and called from the engineering workstation input using the cell name and netlist in conjunction with a label developed as shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE cpd* CELL AREA (pF) SN54ASC' 1164 442 2 2 4 2.36 512 30.6 1 4 4 1.76 420 25.28 AN410LH IV120LH NA210LH 1 4 4 2.04 524 31.36 NA310LH 1.25 4 5 2 652 39.12 NA520LH N0210LH 1.75 2 4 3.5 1.04 1.32 426 512 25.6 30.84 TAB20LH 1 4 en ...caca C 69.6 26.6 3.5 1.75 .c SN74ASC' 5.4 2.12 9 U) Q) Q) MAXIMUM ICC (nAI 6 2 1.5 AN210lH AN310LH a... 3756 30.8 16.8 7.7 4 34.84 8408 32 67.8 TOTALS Label: S193LH A.B,C,O,UP,OOWN,LOAOZ,CLR,BOZ,CQZ.QA.QB,QC,OO; 224.8 504 :t:The equivalent power dissipation capacitance does not include interconnect capacitance. PRODUCTION DATA documents contain informatio•. current as of publication date. Products conform to spacificatians par the terms of TeXIs Instruments :~~::~~i~a{::1~18 :~:~i:; ~iO=::~::"as not Copyright © 1982. Texas Instruments Incorporated TEXAS . " . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-177 SN54ASC193. SN74ASC193 SYNCHR()NOUS 4·81T UP/DOWN COUNTERS (DUAL CLOCK WITH CLEAR) The outputs of the four flip-flops are triggered by a low-to-high-Ievel transition of either count (clock) input (UP or DOWN). The direclion of counting is determined by which count input is pulsed while the pther count input is high. These counters are fully programmable; that is, they may be preset to any number between and 15 by placing a low on the load input and entering the desired data at the data inputs. The output will change to agree with the data inputs independently of the count pulses. This fe<;lture allows the counters to be used as modulo-N dividers by simply modifying the count length with the preset inputs. o A clear input has been provided that forces all outputs to the low level when a high level is applied. The clear function is independent of the count and the load inputs .. These counters are designed to be 'cascaded without the need for additional circuitry. The borrow output (BOZ) produces a low-level pulse while the count is zero (all outputs low) and the count-down is low. Similarly, the carry output (COZ) produces a low-level pulse w!lile the count is maximum (all outputs high) and the count-up input is low. The counters are cascaded by feeding the borrow and carry outputs to the count-down and count-up inputs, respectively, of the succeeding counter. The SN54ASC 193 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC193 is characterized for operation from -40°C to 85°C. 4-178 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC193. SN74ASC193 SYNCHRONOUS 4-811 UP/DOWN COUNTERS (DUAL CLOCK WITH CLEAR) logic diagram , A NA620L • , • -",y NA2 V • J V RZ N01 ~ B NA7 COl ~ ANl : AN210LII A ~ QA .AN21Ot'v ....... V r • . ", ~ '-"' QZ AN7 A NA31C1l.x B Q CK N0210lx ~ • ~ S A tV120Lx A -"'V ~ ......., OlXy r N02 0; ~. " Ff V AN2 ~ A • V NAS A AN2101.Jc as ~ CI) CI) v .s::. .. • AN. en ~ C V C AN0210Lx I V ANa • A AN31Ol..x • N03 V ~ AN4 A B '1--.. ......., A 1V12PLx A ..b V "V3 • C NAS ? • -"'V ..V4 C D- Q CK CLRZ co co v • N V ~ ' - " ' QC C Q2 .RFFS AN210u< V • AN. ~~'Q A AN41OL.x IV120l.x V NA9 NA310lx ,,"V D A ~ S A AN310lx • II .. CI) Q2 Po NA31C1l.x ....... V • '-"' LOAOZ NA620LlC eaz v r 1V12Ol.x A 'NII2 CLR A C D ~ '-"' A NA310Lx 'NV1 .... NA1 • , :...... ......., DOWN ,,"v C D I - QD ~ NAZ10Lx A B~ TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 :"ZU-Q2 A AN210Lx Y B ~ Y 4-179 . ".' SN54ASC193; SN74ASC193 , SYNCHRONOUS 4~BIT UP/DOWN COUNTERS (DUAL CLOCK WITH CLEAR) , , typical clear. load, and count sequences Illustrated below is the following .sequence: 1. Clear outputs to tero. 2. Load (preset) to binary thirteen. 3. CouHi: up to fourteen, fifteen, carry, zero, one, and two. 4. Count down to one, zero, borrow, fifteen, fourteen, and thirteen. --1l~ CLR LOADl ________________________________ U 1 1 I 1 A -_ _ -1-1--'-' _ _ ....J L-_ _ _1 1 I I B -_ _ -1-1-,L..Jr-___ _ I I I I _._---,-, - DATA C __1_'_-, • UP - DOWN - C ... QA rn ::r ... _'-1- _,_,_ I I 1 1 -1-1--1-1--' -.- - - - - -r------------..;....-., _ _ I_I __ I_'_J I I» I» CD CD L- I 1 1 I D -_ _ -1-1-11 -__ ' L QB : OUTPUTS 1 1 1 I I 1 I I 1 I .JL.._I_ _~_~ ~ I 1 til QC QD COl BOl SEQUENCE ILLUSTRATED =~'--_-' 1 ='",_--, I 1 I 101 I 113J r--.. ,.-t'-.. CLEAR u I 1 I r-14 15 0 1 21 COUNT UP - - - - , LJ 1 I 1 0 I 15 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 13 1 r--COUNT DOWN~ PRESET NOTES: A, Clear overrjdes load, data, and count inputs. B. When counting up, count·down input must be high; when counting down, count-up input must be high. 4-180 14 SN54ASC193. SN74ASC193 SYNCHRONOUS 4-81T UP/DOWN COUNTERS (DUAL CLOCK WITH CLEAR) absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models ar.e incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage lee Supply current ei Input capacitance Vee = 5 V, TA = 25°e Equivalent power Vee - 5 V, tr - tf - 3 ns, dissipation capacitance t TA = 25°e epd SN54ASC193 SN74ASC193 TYP TYP 2.2 TA - 25°e Vee - 5 V, Vee - 4.5 V to 5.5 V, VI = Vee or 0, .1I A,8,e,D All others MAX 2.2 504 0.12 0.12 0.24 0.24 34.84 34.84 UNIT V 8408 TA = MIN to MAX . MAX nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. II ... en switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) PARAMETER* tpd FROM TO TEST (INPUT) (OUTPUT) CONDITIONS UP eoz tpd DOWN BOZ tpd DOWN, UP Any Q tpd LOADZ tpHL SN54ASC193 MIN TYP§ MAX 3 SN74ASC193 MIN TYP§ MAX 5.1 3 ns 3 5.2 3 4.7 ns 24.1 11 14.5 7 21.6 13.5 ns Any Q 11 7 eLR Any Q 5 10.5 5 9.6 ns Atpd Any Any Q 0.1 0.5 1.4 0.1 0.5 1.2 ns/pF Atpd Any BOZ,eOZ 0.3 0.9 2.8 0.3 0.9 2.4 ns/pF eL =0 .c o UNIT 4.7 CD CD ... CO CO C ns * Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns 110% and 90%). tpd .. propagation delay time, low-to-high or high-to-Iow-Ievel output tpHL = propagation delay time, high-to-Iow-Ievel output Atpd .. change in tpd with load capacitance § Typical values are at Vee = 5 V, TA = 25 oe. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-181 SN54ASC193. SN74ASC193 SYNCHRONOUS 4·81T UP/DOWN COUNTERS (DUAL CLOCK WITH CLEAR) HDL FILE BLOCK S193LH; A @INPUT; B @INPUT; C @INPUT; D @INPUT; UP @INPUT; DOWN @INPUT; LOADZ @INPUT; CLR @INPUT; BOZ @OUTPUT; COZ @OUTPUT; QA @OUTPUT; QB @OUTPUT; QC @OUTPUT; QD @OUTPUT; • ...c C» C» (I) ::r CD !(II 4-182 STRUCTURE AN1 :AN210LH :AN210LH AN10 :AN210LH AN2 :AN3fOLH AN3 :AN310LH AN4 AN5 :AN410LH :AN410LH ANB AN7 :AN210LH :AN210LH AN8 :AN210LH AN9 FF1 :TAB20LH :TAB20LH FF2 :TAB20LH FF3 FF4 :TAB20LH INV1 . :IV120LH :IV120LH INV2 :IV120LH INV3 :IV120LH INV4 :NA520LH NA1 NA10 :NA210LH :NA520LH NA2 :NA310LH NA3 :NA310LH NA4 :NA310LH NA5 :NA310LH NAB NA7 :NA210LH . :NA210LH NA8 :NA210LH NA9 :N0210LH N01 :N0210LH N02 :N0210LH N03 :N0210LH N04 END S193LH; INV1 S,FF1 SAN1 S; INV3S,NA 1O,AN 10S; QA,INV2S,AN2S; INV1 S,FF1 S,FF2S,AN3S; QA,QB,INV2S,AN4S; INV1 S,FF1 S,FF2S,FF3S,AN5S; QA,QB,QC,INV2S,ANBS; INV3S,NA 7S,AN7S; INV3S,NA8S,AN8S; INV3S,NA9S,AN9S; AN7S,NA3S,N01 S,aA,FF1S; AN8S,NA4S,N02S,QB,FF2S; AN9S,NA5S,N03S,QC,FF3S; AN 1OS,NABS,N04S,QD,FF4S; DOWN,INV1 S; UP,INV2S; CLR,INV3S; LOADZ,INV4S; INV1 S,FF1 S,FF2S,FF3S,FF4S,BOZ; NABS,INV4S,NA 1OS; QA,QB,QC,QD,INV2S,COZ; A,INV4S,INV3S,NA3S; B,INV4S,INV3S,NA4S; C,INV4S,INV3S,NA5S; D,INV4S,INV3S,NABS; NA3S,INV4S,NA 7S; NA4S,INV4S,NA8S; NA5S,INV4S,NA9S; INV1 S,INV2S,N01 S; AN1 S,AN2S,N02S; AN3S,AN4S,N03S; AN5S,ANBS,N04S; TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 . SN54ASC193. SN74ASC193 SYNCHRONOUS 4·81T UP/DOWN COUNTERS (DUAL CLOCK WITH CLEAR) count definition These counters are bidirectional with respect to count operations, and the relationship for counting up or down is defined by the UP and DOWN inputs. Unidirectional counters are available in software macros or can be constructed using the' ASC2405 through' ASC2407 4·bit predesigned registers. Additional single bits can be achieved with pre designed flip-flops offered in TI's standard cell family. designing for testability Designs employing storage or bistable elements, especially long counters (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and to read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense . of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an OR gate. • ... U) CD CD .c U) ...'" o'" TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-183 C I» r+ I» en :r CD CD r+ til 4-184 SN54ASC194A. SN74ASC194A 4-B11 BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS 02939. AUGUST 1986 SystemCell™ 2-/lm SOFTWARE MACRO CELL logic symbol t • Parallel Inputs and Outputs • Four Operating Modes: Synchronous Parallel Load Right Shift Left Shift Do Nothing ClRZ so SI ClK • Positive Edge-Triggered Clocking • Embedded Clock Drivers Provide Clock Buffering SRSER QA A OB B OC C description o 00 The SN54ASC194A and SN74ASC194A are 2.40 SlSER standard-cell software macros implementing 4-bit parallel-in/parallel-out bidirectional, tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and universal shift registers. The 4-bit configuration IEC Publication 617-12. provides the custom IC designer a register to . embed in ASICs in its most efficient form. Its 4-bit length simplifies construction of large registers. The 'ASC 194A implements a shift register identical with that performed by packaged 'HC 194, 'LS 194A, and 'F194 registers. These bidirectional shift registers are designed to incorporate virtually all of the features a system designer may want in a shift register. The circuit features parallel inputs, parallel outputs, right-shift and left-shift inputs, operating-made-control inputs, and a direct overriding clear line. The register has four distinct modes of operation, namely: Inhibit clocking (do nothing) Shift right (in the direction OA toward OD) Shift left (in the direction OD toward OA) Parallel (broadside load) II ~ ... r/) II) II) .c en ...co CO C The 'ASC194A is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA TO NA210lH NO. USED TOTAL RELATIVE TOTAL CELL AREA (pF) Cpd* MAXIMUM ICC (nA) SN54ASC' SN74ASC' IVll0LH 0.75 1 0.75 0.44 105 6.32 IV120LH 1 4 4 3.2 524 31,.4 IV140LH 1.5 1 1.5 1.61 190 11.4 NA310LH 1.25 16 20 8 2608 156.48 1.5 4 1 6 23.25 2 748 44.8 10.2 2647 159 27 55.5 25.45 6822 410 NA410LH R2405LH S194ALH 23.25 TOTALS Label: S194ALH A,8.C.O,SRSER.SLSEll.CLK,CLRZ,Sl.S0,QA.QB,QC,QO; tThe equivalent power dissipation capacitance does not include interconnect capacitance. PRODUCTION DATA documants cont.i. i.fa,motio. currant I. of publicatian data. Products conform to specifications per the terml of Taul InstrumaRtI :::=~i~·r::I~'1.; ~=:~I:: ~r':'''::~":t:~~ not Copyright @ 198~. Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-185 SN54ASC194A, SN74ASC194A 4-PIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS Synchronous parallel loading is accomplished by applying the four bits of data and taking both mode control inputs, SO and 51, high. The data are loaded into the associated flip-flops and appear at the outputs after the positive transition of the clock input. During loading, serial data flow is inhibited. ' Shift right is accomplished synchronously with the rising edge of the clock pulse when SO is high and, 51 is low. Serial data for this mode are entered at tne shift-right data input. When SO is low and 51 is high, data shift left synchronously and neW data are entered at the shift-left serial input. When both mode control inputs are low, a free-running clock will reload the present state of each flip-flop on each clock transition to implement the do-nothing mode. The SN54ASC194A is characterized for operation over the full military temperature range of - 55 DC to 125°C. The SN74ASC194A is characterized for operation from -40 DC to 85°C. logic diagram CLKc:>------------------------------------------, c:>~ ____~A~~~N~Y-------------------, ~V2 IVllOlx IV140Lx so • 51 st."R 02401'-' CU( ao CCRZ QC Q3 1 02 O. Q4 QA 04 FF1. A SROER 4-186 TEXAS • INSTRUMENTS POST OFF!CE BOX 655012 • D.o:-LLAS. TEXAS 75285 os SN54ASC194A. SN74ASC194A 4-BI1 BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS FUNCTION TABLE INPUTS CLRZ MODE CLK S1 SO X X X H X X H H H L H H H L H H H L H H L t t t t t H L L X L L OUTPUTS SERIAL SLSER SRSER X X X X X H L X PARALLEL QA QB QC QD L L L L QAO a QBO b c d X X· H QAn QBn QC n L QAn QBn QC n QDn QC n QDn QC n A B C 0 X X X X X X X X X a b H X X X X QBn X X X X X X X c X X X X X QSn X X X X QAO QBO QCO QDO L X X X d QCO QDO H L See Explanation of Function Tables in Section 1. typical clear, load, right-shift, left-shift, inhibit, and clear sequences CLOCK MODE {SO - CONTROL -S1 INPUTS J I I ::n. ......,r-+--------;.__________ -i_________ I --U I LJ R _-:--+I_-i-In..._____~-_:_------+r-t....JI......._i_:- CLEAR I SERIAL{ DATA INPUTS L II ... U) ~ .c f/) --r-r-__r----------T--+-' ... C'O C'O C PARALLEL DATA INPUTS B _~~--+----------~_+-------~-------_+-- ~ ______~~________~Irl'-------------~~ ~---+--ir------'n: OUTPUTS : I I I i.--SHIFT RIGHT---+! CLEAR LOAD oH~I---INHIBIT----+I If----SHIFT LEFT-...... CLEAR absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. "'I} TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-187 SN54ASC194A, SN74ASC194A 4·BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT lee Ci SN54ASC194A TEST CONDITiolllS = = TYP Input threshold voltage VCC Supply current VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA = MIN to MAX Input capacitance I ClK,SO,S1 I All others Equivalent power Cpd dissipation capacitance t = VCC 5 V, TA 5 V, TA = 5 V, = 2.5 o e VCC TA tr = TYP 2.2 25°C ns, MAX 2.2 410 0.24 0.12 0.12 25.45 25.45 UNIT V 6822 0.24 25°C = tf = 3 SN74ASC194A MAX nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance . . . switching characteristics over recommended ranges of supply voltage and operating free-air temperature . . (unless otherwise noted) (see Note 1) PARAMETER; tpd tpHl .:l.tpil .:l.tpHl FROM TO TEST (lN~UTl (OUTPUT) CONDITIONS ClK ClRZ an an ClK an ClRZ an SN54ASC194A TVP§ MAX MIN 5 10.5 !1 8.4 0.3 0.9 2.3 0.3 0.7 1.9 CL = 0 SN74ASC194A TYP§ MAX MIN 9.4 UNIT 5 5 7.7 ns ns 0.3 0.9 2.1 nsJpF 0.3 0.7 1.6 nsJpF iprol'agation delay.times are measured from the 44% point of VI to the 44% point of Vo with tr = tf .= 3 ns (10% and 90%). tpd. '" propagation delay time, low-to-high- or high-to-Iow-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output .:l.tpd '" change in tpd with load capacitance' .:l.tPHL " change in tpHl with load capacitance § Typical values are at Vec = 5 V, T A = 25°C. NOTE1: Thes~ switching characte~istics ~re simulations of the software macro cell using interconnect capacitance values for' an array design having 2,000 gates. Post~layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be devl:!loped to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. 4-188 TEXAS • INSTRUM~NTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC194A, SN74ASC194A 4·BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS HDL FILE BLOCK S194ALH; A @INPUT; B @INPUT; C @INPUT; D @INPUT; SRSER @INPUT; SLSER @INPUT; CLK @INPUT; CLRZ @INPUT; S1 @INPUT; SO @INPUT; QA @OUTPUT; QB @OUTPUT; QC @OUTPUT; QD @OUTPUT; STRUCTURE FF14 :R2405LH INV1 :IV110LH INV2 :IV140LH INV5 :IV120LH INV6 :IV120LH INV7 :IV120LH INV8 :IV120LH NA1 :NA310LH NA10 :NA310LH NA11 :NA310LH NA12 :NA310LH NA13 :NA310LH NA14 , :NA310LH NA15 :NA310LH NA16 :NA310LH NA17 :NA410LH NA18 :NA410LH NA19 :NA410LH NA2 :NA310LH NA20 :NA410LH NA3 :NA310LH NA4 : NA31 OLH NA5 :NA310LH NA6 :NA310LH NA7 :NA310LH NA8 :NA310LH NA9 :NA310LH END S194ALH; INV20,NA 170,NA 180,NA 190,NA200,CLK,QD,QC,QB,QA; CLRZ,INV10; INV10,INV20; S1,INV50; INV50,INV60; SO,INV70; INV70,INV80; QD,INV50,INV70,NA 10; QC,INV60,INV70,NA 100; B,INV60,INV80,NA 110; INV80,INV50,QA,NA 120; QA,INV50,INV70,NA 130; QB,INV60,INV70,NA 1:40; A,INV60,INV80,NA 150; INV80,INV50,SRSER,NA 160; NA 10,NA20,NA30,NA40,NA 170; NA50,NA60,NA70,NA80,NA 180; NA90,NA 1O,NA 11 O,NA 120,NA 190; SLSER,INV60,INV70,NA20; NA 130,NA 140,NA 150,NA 160,NA200; D,INV60,INV80,NA30; INV80,INV50,QC,NA40; QC,INV50,INV70,NA50; QD,INV60INV70,NA60; C,INV60,INV80,NA 70; INV80,INV50,QB,NA80; QB,INV50,INV70,NA90; TEXAS . . INSTRUMENTS POST OFFICE BOX 656012 • bAlLAs. TEXAS 75266 •.. en CD CD .c en .. as as o 4-189 SN54ASC194A, SN74ASC194A 4·BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS shift definition These registers are bidirectional with respect to shift operations and the relationship for shifting left or right is defined by the SO and S1 inputs. Unidirectional registers are available in software macros or can be constructed using the' ASC2405 through' ASC2407 4·bit predesigned registers. Additional single bits can be achieved with flip-flop cells offered in TI's standard cell family. designing for testability Designs employing. storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. • power-up clear preset • 4-190 Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate . TExAs • INSTRUMENTS POST OFFICE BOX-655012 • DALLAS. TeXAS 75266 SN54ASC195A, SN74ASC195A 4·81T PARALLEL·ACCESS SHIFT REGISTERS 02939, AUGUST 1986 SystemCell™ • • • • • • 2-j.lm SOFTWARE MACRO CELL logic symbol t Synchronous Parallel Load Positive-Edge-Triggered Clocking SRG4 J and KZ Inputs to First Stage CLRZ SH_LDZ Complementary Outputs from Last Stage Embedded Clock Drivers Provide Clock Buffering CLK Dependable Texas Instruments Quality and Reliability KZ A QA 2,30 2,30 2,30 B description C 08 ac The SN54ASC195A and SN74ASC195A are QD o standard-cell software macros implementing aDZ 4-bit parallel-out shift registers, The 4-bit configuration provides the custom IC designer tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. a register to embed in ASICs in its most efficient form. The 4-bit length simplifies construction of large counters. The' ASC 195A implements a shift sequence identical with that performed by packaged 'HC195, 'LS195A, and 'F195 registers. These 4-bit shift registers feature parallel inputs, parallel outputs, J-KZ serial inputs, shiftlload control input, and a direct overriding clear. The registers have two modes of operation: parallel (broadside) load, and shift (in the direction of OA toward 00). The' ASC 195A is implemented with the standard cell functions indicated. The HDl netlist label for this software macro is shown on the last line of the following table: CELL NAME RELATIVE CELL AREA NO. USED TO NA210LH TOTAL RELATIVE CELL AREA TOTAL Cpd* (pFI MAXIMUM ICC (nA) SN54ASC' 0.75 1 0.75 0.44 105 6.32 IV120LH 1 2 2 1.6 262 15.7 IV140LH 1.5 1 1.5 1.61 190 11.4 NA210LH 1 10 10 5.1 1310 NA310LH 1.25 3.75 1.5 489 R2406LH 26.25 3 "1 78.4 29.34 26.25 11.69 2931 18 44.25 21.94 S195ALH 5,287 Label: S195ALH CLRZ,CLK,SH_LDZ.J,KZ,A,B,C,D,OA,OB,OC,OD,ODZ; U) CD CD .c ..o en ca ca SN74ASC' IV110LH TOTALS •.. 176 318 iThe equivalent power dissipation capacitance does not include interconnect capacitance. Parallel loading is accomplished by applying the four bits of data and taking the shift/load control (SH _ lDZ) input low. The data is loaded into the associated flip-flop and appears at the outputs after the pOSitive transition of the clock (ClK) input. During loading, serial data flow is inhibited. Copyright @ 1986, Texas Instruments Incorporated PRODUCTION DATA documenls contain information current as of publication date. Products conform to specifications paf the terms of Taus Instruments =-::~~i~·i~:I-:Ji ~~::~r Jr.-=:::':~~ not TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-191 SN54ASC195A, SN74ASC195A 4·81T PARALLEL·ACCESS SHIFT REGISTERS description (continued) Shifting is accomplished synchronously when the shift/load control is high. Serial data for this mode is entered at the J-KZ inputs. These inputs permit the first stage to perform as a J-K, D-, or T-type flip-flop as shown in the function table. The SN54ASC195A is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC195A is characterized for operation from -40°C to 85°C. logic diagram ClRZ ClK C=~--~~----~~----------~~~----~~~----~ SH.LOZ C=")---..=..j II KZ A NA21OL. C QA .... C» C» QB 01 en B CD CD c ::r .... 02 03 ao D4 GOI U) 0 4-192 QC TEXAS ~ INSTRUMENTS POST OFFlte BOX 665012 • DALLAS. TEXAS 75265 aoz SN54ASC195A, SN74ASC195A 4·811 PARALLEL·ACCESS SHIFT REGI~TERS FUNCTION TABLE INPUTS CLRZ SH_LDZ CLK L X H L X 1 H H H H H H H H H H OUTPUTS SERIAL PARALLEL KZ A L J X X X X X X 1 L H t t t L L H H H L X a X X X X X B X C 0 OA OB OC 00 X X L L L L H b c d a b c d dZ X X X X X X X X X X X X X X X OAO OBO OCo OAO L OAO OBn ODO OC n aDO aC n OAn OBn OC n aC n H OAn OBn OC n aC n aAn OAn OBn OC n aC n ODZ typical clear. shift and load sequences CLK I I SERIAL { J - - : - - -....'T"'L-------------:--~----------- ~L_ _ _ _~--------':_-~----------- SH_LDZ--+-----~:-------------~~ INPUTS KZ A~----+--:_ PARALLEL DATA INPUTS { • _---Ir.rlr B . J!! L : CD CD I r;T"I C L : ~ {:~~~~~l'------!iL-----------..J ~ o I OUTPUTS OC:::1~----_;:-----..... OD:~~'~----~I--------.... I I I lllljef----- SERIAL SHIFT I -----I~ ~ SERIAL SHIFT --+ LOAD CLEAR absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DAl.LAS, TeXAS 75265 4-193 SN54ASC195A. SN74ASC195A 4·81T PARALLEL·ACCESS SHIFT REGISTERS electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci Input capacitance I Cpd TYP VCC ~ 5 V, TA Equivalent power VCC ~ 5 V, tr dissipation capacitance t TA ~ ~ ~ ~ TYP MAX 2.2 318 0.24 3 ns, 25°C UNIT V 5287 25°C tf SN74ASC195A MAX 2.2 TA - 25°C VCC - 5 V, VCC ~ 4.5 V to 5.5 V, VI - VCC or 0, TA ~ MIN to MAX I CLK,SH_LDZ All others SN54ASC195A TEST CONDITIONS nA 0.12 0.24 0.12 pF 21.95 21.95 pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) PARAMETER* II FROM (INPUT) TO (OUTPUT) tpd ClK tpd ClK an aDZ tpHl ClRZ an tPlH :1. ....- - - - - - - - t > V2Z B2 A3 ....--------c=>V~ B3 A4 t---------c=> V4Z B4 C m r+ m en ::T CD CD r+ 1V11Clx /I\1..J!J GZ (I) 4-216 TEXAS • INSTRUMENTS POST OFFICE BOX 666012 • DAUAS. TEXAS 75266 SN54ASC258A, SN74ASC258A QUADRUPLE 2-LlNE TO '-LINE INVERTING MULTIPLEXERS WITH 3-STATE OUTPUTS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER SN54ASC258A TEST CONDITIONS ~ TA ~ Input threshold voltage Vee lee Supply current Vee - 4.5 V to 5.5 V, VI - Vee or 0, TA ~ MIN to MAX ei Input capacitance I AZ __ B All other inputs Vee ~ 5 V, TA ~ 25°e Equivalent power Vee - 5 V, t r - tf - 3 ns, dissipation capacitance t TA ~ 25°e I SN74ASC258A MAX TVP 2.2 25°e VT epd 6 V. TVP MAX 2.2 V 2106 127 0.25 0.25 0.12 0.12 7.28 7.28 UNIT nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Notes 1 and 2) PARAMETERt FROM TO TEST (lNPUTI (OUTPUT 1 CONDITIONS tpd Any A orB V tpd ALB V ten GZ V t.tpd Any V ~ten Any V SN54ASC258A TVP§ MAX MIN SN74ASC258A TVP§ MAX UNIT 1.4 2.8 1.4 2.5 ns 5 10.4 5 9.5 ns 5 10.7 5 9.8 ns 0.6 1.7 4.6 0.6 1.7 4.2 ns/pF 0.7 1.7 4.8 0.7 1.7 4.4 ns/pF eL = 0 II ... MIN en Q) Q) ..c: tPropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf ~ 3 ns (10% and 90%1. tpd 5: propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output ten :5 enable time, high impedance state to low- or high-logic-level output Lltpd 55 change in tpd with load capacitance 4ten == change in ten with load capacitance § Typical values are at Vee = 5 V, T A ~ 25°e. NOTES: 1. These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post~layout simulation uses actual interconnect capacitance values. 2. Enable and delta·enable times are measured using the conditions specified for the 'ASe2311 (lV212LH). en ...a:sa:s o DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-217 SN54ASC258A, SN74ASC258A QUADRUPLE 2·LlNE TO 1·LlNE INVERTING MULTIPLEXERS WITH 3·STATE OUTPUTS HDL FILE BLOCK S258ALH; A1 @INPUT; A2 @INPUT; A3 @INPUT; A4 @INPUT; B1 @INPUT; B2 @INPUT; B3 @INPUT; B4 @INPUT; GZ @INPUT; AZ_B @INPUT; Y1 @OUTPUT; Y2 @OUTPUT; Y3 @OUTPUT; Y4 @OUTPUT; STRUCTURE :IV212LH G01 G02 :IV212LH G03 :IV212LH G04 :IV212LH G05 :IV212LH G06 :IV212LH G07 :IV212LH G08 :IV212LH G09 :AN220LH G10 :AN220LH G11 :IV110LH G12 :IV110LH END S258ALH; ...C I» I» t/) :::r CD CD ... (I) A 1,G090,Y1; B1,G100,Y1; A2,G090,Y2; B2,G 100, Y2; A3,G090,Y3; B3,G100,Y3; A4,G090,Y4; B4,G100,Y4; G110,G120,G090; AZ_B,G120,G100; AZ_B,G110; GZ,G120; Dedicated 2·line to 1-line multiplexers are also available in the standard cell library ('SC2340) for implementing data-path multiplexers. The 'SC2340 cell incorporates an enable input which can be used for expanding the word width. These hard-wired cells should be considered if the multiplexer is in a critical path, as their performance is predetermined as specified in their switching characteristics. interfacing the macro Inputs and outputs of the predesigned macro are compatible for interfacing directly with cells and macros available in the TI standard cell library. The 3-state outputs can interface internal bidirectional buses. The inputs can be driven by either inverting or non inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state I/O TTL/CMOS buffer. If bus interface is not required, the 'ASC 1 58 2-line to Hine multiplexer provides totem-pole outputs. 4-218 TEXAS . . INSTRUMENTS POST OF~ICE BOX 655012 • DALLAS, TeXAS 75265 SN54ASC259, SN74ASC259 8-BIT ADDRESSABLE LATCHES 02939. AUGUST 1986 SystemCell™ 2-llm SOFTWARE MACRO CELL logic symbol t • Parallel-Out Register Performs Serial-toParallel Conversion with Storage • Expandable for N-Bit Applications • Enable/Disable Input Simplifies Expansion • Four Functional Modes: Addressable Transparent Latch Parallel 8-Bit Storage Latch 1-of-8 Demultiplexer Asynchronous Parallel Clear so S1 S2 8M :} 4 GZ 0 CLRZ 00 10.iiR description The SN54ASC259 and SN74ASC259 are standard-cell software macros implementing addressable 8-bit parallel latches. The 8-bit configuration provides the custom IC designer a fully designed addressable register/ demultiplexer to embed in ASICs in its most efficient form, and its 8-bit length simplifies construction of large latches. The 'ASC259 implements an addressable latch function identical with that performed by packaged 'HC259, 'LS259, and 'F259 latches. 9,10 10,lR 01 9,20 10;2R 02 9,30 10;3R 03 9,40 • 04 10,4R 9.50 10;5R 05 9.60 1o;6R 06 9,70 10.7R 07 These 8-bit addressable latches are designed for tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and lEe Publication 617- 12. general purpose storage applications where demultiplexing and/or addressable bit storage locations are useful co-functions. Some uses include working registers, serial-holding registers, and active-high decoders or demultiplexers. They are multifunction macros capable of storing Single-line data in eight addressable latches or of implementing a 1-of-N line decoder or demultiplexer with active-high outputs. The' ASC259 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE TOTAL TOTAL Cpd* (pFI MAXIMUM ICC (nAI CELL AREA TO NA210LH AN240LH 2.25 1 2.25 2.32 286 17.2 IV110LH 0.75 2 1.5 0.88 210 12.64 IV120LH 1 6 6 4.8 786 47.1 IV140LH 1.5 1 1.5 1.61 190 11.4 NA220LH NA310LH 1.5 1.25 8 8 12 1568 10 8 4 NA410LH 1.5 16 24 N0240LH 2.5 1 43 TOTALS NO. USED RELATIVE CELL NAME CELL AREA SN54ASC' SN74ASC' 1304 93.6 78.24 2992 179.2 2.5 8 0.98 292 17.5 59.75 40.59 7528 457 Label: S259LH CLRZ,D.GZ,SO.Sl,S2.00.01.02,03,04.05,06.07; *The equivalent power dissipation capacitance does not include interconnect capacitance. PRODUCTION DATA documents contein information current as of p~blic8tion date. Products conform to speCifications per the terms of Texas Instruments :~~~:~~i~at::1~1i ~!~~:i:; :.~a:=:~:t::s~S not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, tEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-219 SN54ASC259, SN74ASC259 8·BIT ADDRESSABLE LATCHES logic diagram C I» r+ I» (f) ::T CD CD y ADOR3 r+ en Y CLEARZ 4-220 'Ii1 TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265.. SN54ASC259. SN74ASC259 8-BIT ADDRESSABLE LATCHES Four distinct modes of operation are selectable by controlling the clear (CLRZ) and enable (GZ) inputs as shown in the function table. In the addressable-latch mode, data at the data-in input D are written into the addressed latch. The addressed latch will follow the data input with remaining unaddressed latches retaining their previous states. In the memory mode, all latches remain in their previous states and are not affected by changes at the data or address inputs. To preclude entering erroneous data in the latches, enable GZ should be held high (inactive) while the address lines are changed. In the 1-of-8 decoding or demultiplexing mode, the addressed output will follow the level at the D input with the remaining outputs low. In the clear mode, all outputs are set low and are not affected by address and data changes. The SN54ASC259 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC259 is characterized for operation from -40°C to 85°C. FUNCTION TABLE LATCH SELECTION TABLE OUTPUT OF ADDRESSED OTHER LATCH OUTPUT D QiO Addressable Latch L QiO D QiO L H L L Clear INPUTS CLRZ GZ H L H H L L EACH SELECT INPUTS FUNCTION LATCH SO S1 L L Memory L H L 2 8-Une Demultiplexer L H H 3 H L L 4 H H L H H L 5 6 H H H 7 D = the level at the data input QiO = the level of Qi (i = O. 1, . . . 7, as appropriate) before the indicated steady-input conditions were established. S2 ADDRESSED L L L H 0 1 II absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci Input capacitance Cpd I SO.S1,S2 ID I CLRZ, GZ TEST CONDITIONS TA = 25°C VCC = 5 V, VCC - 4.5 V to 5.5 V, VI - VCC or O. TA = MIN to MAX VCC = 5 V, Equivalent power VCC - 5 V, dissipation capacitance TA = TA tr = 25°C = tf - 3 ns, 25°C TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS •. "TEXAS 75285 SN54ASC259 SN74ASC259 TYP TYP MAX MAX 2.2 2.2 7528 V 457 0.24 0.24 0.13 0.13 0.6 0.6 40.59 40.59 UNIT nA pF pF 4-221 SN54ASC259. SN74ASC259 8-BIT ADDRESSABLE LATCHES switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) (OUTPUT) CONOITIONS tpd '50, 51. 52 an tpd 0 an tpd GZ an tpHL CLR -____:..:A~ 4·240 V. TEXAS • INSTRUMENTS POST OFFICE BOX 855012 • ,DALLAS, TEXAS 75285 SUM3 SN54ASC283, SN74ASC283 4·BIT BINARY FULL ADDERS WITH FAST CARRY FUNCTION TABLE L L L L H L L H L H L L H L H L L H L L H H L H H L L H H H L L H H L H H H H H L H H H H H L H H L L L H H L L L H H L H H L H H H L L L H L H L H H L H H H H H H H H H H L L H H L H L H H H L H H H H L H H H L H L H H L H H L H L H H H L H H H H H H H II .... U) NOTE: Input conditions at A 1, B1, A2, B2, and CO are used to determine outputs SUM1 and SUM2 and the value of the internal carry C2. The values at C2, A3, B3, A4, and B4 are then used to determine outputs SUM3, SUM4, and C4. CD CD .c tJ) absolute maximum ratings and recommended operating conditions ....caca See Table 1 in Section 2. C electrical characteristics PARAMETER TEST CONDITIONS ~ ~ VT Input threshold voltage VCC ICC Supply current VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA ~ MIN to MAX Ci Cpd I An,Bn 5 V, TA VCC ~ 5 V, TA Equivalent power. VCC ~ 5 V, tr dissipation capacitance t TA Input capacitance ICO ~ ~ ~ SN54ASC2B3 SN74ASC2B3 TVP TVP 25°C 2.2 ~ 3 ns, 25°C MAX 2.2 8457 0.5 0.12 0.12 36.28 36.28 UNIT V 508 0.5 25°C tf MAX nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 75265 4-241 SN54ASC283, SN74ASC283 4-B11 BINARY FULL ADDERS WITH .FAST CARRY switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note, 1) FROM (INPUT) TO TEST (OUTPUTI CONDITIONS tpd CO tpd PARAMETERt SN54ASC283 SN74ASC283 Typt MAX MAX SUMn 8.5 16.5 8.5 15 ns An, Sn SUMn 7.5 15.5 7.5 14.3 ns tpd CO C4 6 12.6 6 11.7 ns tpd An, Sn C4 6 12.8 6 11.6 Any Any 0.6 1.9 0.6 1.7 .:I.tpd ~ 0 0.3 MIN UNIT TYP* CL MIN 0.3 ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Va with tr ~ tf.~ 3 ns (10% and 90%1. tpd 5 propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output Atpd ;;;;; change in tpd with load capacitance *Typical values are at VCC ~ 5 V, TA ~ 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS • C I» r+ I» All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. en HOL FILE ::r CD CD r+ (II 4-242 BLOCK S283LH; A4 @INPUT; A3 @INPUT; A2 @INPUT; A1 @INPUT; B4' @INPUT; B3 @INPUT; B2 @INPUT; B1 @INPUT; CO @INPUT; SUM4 @OUTPUT; SUM3 @OUTPUT; SUM2 @OUTPUT; SUM1 @OUTPUT; C4 @OUTPUT; TEXAS " , INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC283, SN74ASC283 4·BIT BINARY FULL ADDERS WITH FAST CARRY HDL FILE (Continued) STRUCTURE EXl EX2 EX3 EX4 INVl INV10 INVll INV12 INV13 INV2 I!\IV3 INV4 INV5 INV6 INV7 INV8 NAl AN10 NA11 NA12 NA13 NA14 AN15 NA16 NA17 NA18 AN19 NA2 NA20 AN21 NA3 NA4 NA5 NA6 NA7 NA8 NA9 NOl N02 N03 N04 N05 END S283LH; :EX220LH :EX220LH :EX220LH :EX220LH :IVll0LH :IVll0LH :IV120LH :IV110LH :IVll0LH :IVll0LH :IVll0LH :iVll0LH :IVll0LH :IV120LH :IVll0LH :IVll0LH :NA220LH :AN220LH :NA220LH :NA320LH :NA420LH :NA420LH :AN220LH :NA220LH :NA320LH :NA320LH :AN220LH :NA220LH :AN220LH :AN220LH :NA220LH :NA220LH :NA220LH :NA320LH :NA420LH :NA520LH :NA520LH :N0220LH :N0220LH :N0220LH :N0220LH :N0220LH AN100,INV120,SUM4; AN 150,INV130,SUM3; AN190,N050,SUM2; AN210,INV100,SUMl ; CO,INV10; INVl O,INVl 00; NA90,C4; NA 140,INV120; NA 180,INV130; N010,INV20; N020,INV30; N030,INV40; N040,INV50; N010,INV60; N020,INV70; N030,INV80; B4,A4,NA10; NA10,INV20,AN100; N030,NA20,NA 110; N040,NA20,NA30,NA 120; NA20,NA30,NA40,INVl O,NA 130; INV70,NA 11 O,NA 120,NA 130,NA 140; NA20,INV30,AN150; N040,NA30,NA 160; NA30,NA40,INVl O,NA 170; INV80,NA 160,NA 170,NA 180; NA30,INV40,AN190; . B3,A3,NA20; NA40,INV10,NA200; NA40,INV50,AN210; B2,A2,NA30; Bl ,A 1 ,NA40; N020,NA 10,NA50; N030,NA 10,NA20,NA60; N040,NA 10,NA20,NA30,NA70; NA 10,NA20,NA30,NA40,INVl 0,NA80; INV60,NA50,NA60,NA70,NA80,NA90; B4,A4,N010; B3,A3,N020; B2,A2,N030; Bl,A 1 ,N040; N040,AN200,N050; TEXAS " , INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75285 II 4·243 4-244 SN54ASC298, SN74ASC298 QUADRUPLE 2-INPUT MULTIPLEXERS WITH NEGATIVE-EDGE-TRIGGERED REGISTER 02939, AUGUST 1986 SystemCeIlTM 2-llm SOFTWARE MACRO CELL • Selects One of Two 4-Bit Data Sources and Stores Data Synchronously with System Clock • Storage Register Loads New Data on Negative-Going Transition • Implements Hexadecimal/BCD Shifter • Parallel Multiplexers for Wider Words logic symbol t ws CLKZ -....L:"'C> Al QA 1,2D A2 Bl QB B2 Cl QC C2 Dl QD D2 tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. description The SN54ASC298 and SN74ASC298 are standard-cell software macros implementing four 2-line to 1-line multiplexers with storage. The 'ASC298 implements a function table identical with that performed by packaged 'HC298, 'LS298, and 'F298 multiplexers, When the Word-Select (WS) input is low, word one (A1, B1,C1, 01) is applied to the flip-flops. A high WS input causes word two (A2, 82, C2, 02) to be selected. The selected word is clocked to the output terminals on the negative-going edge of the clock pulse. The' ASC298 is implemented with standard cell functions indicated. The HOL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH IV120LH 1 TOTAL TOTAL RELATIVE Cpd* IpFI CELL AREA NA210LH 1 3 12 R2405LH 23.25 I 23.25 T0010LH 1.5 1 1.5 17 39.75 TOTALS 3 12 2.4 23.55 6.12 1572 94.2 10.2 2647 159 177 10.6 4789 288 18.72 .c CJ) ctI ctI C SN74ASC' 393 en Q) Q) ... MAXIMUM ICC (nAI SN54ASC' II ... Label: S298LH A l,A2,Bl ,82,Cl ,C2,Dl ,D2,CLKZ,WS,OA,OB,OC,OD; tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC298 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC298 is characterized for operation from -40°C to 85°C. FUNCTION TABLE INPUTS PRODUCTION DATA documants contain information currant as of publication data. Products conform to specifications per the terms of Taul Instruments ::~~~~~a[::I~li =.~:~:; lIl";'~~~:;S not OUTPUTS WS CLKZ QA OB QC QD L j al bl cl dl H j a2 b2 c2 d2 X H ~AO aBo OCo 000 Copyright © 1986. Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-245 SN54ASC298, SN74ASC298 QUADRUPLE 2·INPUT MULTIPLEXERS WITH NEGATIVE·EDGE·TRIGGERED REGISTER logic diagram TOO101.x vee INVI 1V1201.x ClKZ ~>- ____~A~ GND y INI/4 R2406Lx ClK NA2101.x Ql ClR2 AI y WS A2 Q2 1=-----.r~QB 01 02 03 04 D3 Q4 Ff14 81 B2 Cl C2 0 .... 01 y C\) C\) tn 02 ::r CD CD .... 0 4·246 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • CALLAS, TEXAS 752B5 QC ~----.r~0Il SN54ASC298, SN74ASC298 QUADRUPLE 2-INPUT MULTIPLEXERS WITH NEGATIVE-EDGE-TRIGGERED REGISTER absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT lec TEST CONDITIONS Input threshold voltage Vee - 5 V. Supply current Vce - 4.5 V to 5.5 V. VI - Vee or O. TA ~ MIN to MAX Input capacitance I WS TYP MAX 2.2 Vee ~ 5 V. TA ~ ~ Equivalent power Vee dissipation capacitance t TA ~ 25°e tr 5 V, ns, UNIT V 4789 25°C = tf = 3 MAX 2.2 288 0.24 nA 0.24 0.24 0.24 0.12 0.12 18.72 18.72 I All others epd SN74ASC298 TYP TA - 25°e I CLKZ Ci SN54ASC298 pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. • ... tI) switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) PARAMETER tpd dtpd * FROM TO TEST (INPUT) (OUTPUT) CONDITIONS eLKZ On Any On CL ~ 0 SN54ASC298 TYP§ MAX MIN 0.3 6 12 0.8 2.3 SN74ASC298 TYP§ MAX UNIT 6 11 ns 0.8 2.1 ns/pF MIN 0.3 Q) Q) .c en ...caca C 'Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf ~ 3 ns (10% and 90%). tpd '" propagation delay time. low-to-high or high-to-Iow-Ievel output ..1.tpd 5 change in tpd with load capacitance §Typical values are at Vec ~ 5 V. TA ~ 25°e. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array desigri having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-247 SN54ASC298, SN74ASC298 QUADRUPLE 2-INPUT MULTIPLEXERS WITH NEGATIVE-EDGE-TRIGGERED REGISTER HDL FILE BLOCK S298LH; A1 @INPUT; A2 @INPUT; B1 @INPUT; B2 @INPUT; @INPUT; , C1 C2 @INPUT; D1 @INPUT; D2 @INPUT; CLKZ @INPUT; WS @INPUT QA @OUTPUT; QB @OUTPUT; QC @OUTPUT; QD @OUTPUT; STRUCTURE FF14 INV1 INV2 INV3 INV4 NA1 NA10 NA11 NA12 NA2 NA3 NA4 NA5 NA6 NA7 NA8 NA9 END S298LH; ...c S» S» en :::r CD CD ... til :R2405LH :T0010LH :IV120LH :IV120LH :IV120LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH :NA210LH INVl 0,NA30,INV40,NA60,NA90,NA 120,QA,QB,QC,QD; DUM,INV10; WS,INV20; INV20,INV30; CLKZ,INV40; A 1 ,INV20,NA 10; INV20,Dl,NA100; INV30,D2,NA 110; NA100,NA110,NA120; A2,INV30,NA20; NA 1O,NA20,NA30; B1,INV20,NA40; INV30,B2,NA50; NA40,NA50,NA60; C1,INV20,NA70; INV30,C2,NA80; NA70,NA80,NA90; Dedicated 2-line to l-line multiplexers ('ASC2340) are also available in the standard cell library for implementing data-path multiplexers. These hard-wired multiplexers in conjunction with hard-wired registers should be considered if the multiplexer is in a critical path, as their performance is predetermined as specified in their switching characteristics. interfacing the macro Inputs and outputs of the predesigned macro are compatible for interfacing directly with cells and macros available in the TI stan,dardcell library. The inputs can be driven by either inverting or non inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. 4-248 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC298, SN74ASC298 QUADRUPLE 2·INPUT MULTIPLEXERS WITH NEGATIVE·EDGE·TRIGGERED REGISTER TYPICAL APPLICATION DATA This versatile multiplexer/register can be connected to operate as a shift register that can shift N·places in a single clock pulse. The following figure illustrates a BCD shift register that will shift an entire 4-bit BCD digit in one clock pulse. PARALLEL LOAD A WOAD SELECT kr- CLOCK 'ASC298 'ASC298 ~ ws G1 Cl.... ~ ~ ws Gl MUX CLKp., C2 C2 ws G1 lKto, "i ~i.20 OA "7.20 A2 1,20 QB B2 ~ C2 QC ~ C2 ----1!!. QD '----!!.!02 .2 02 r -..DIGIT 1 , C2 ~'.2D OA OA A2 1.20 A2 1,20 L.....-.!!. ~ BCD { DIGIT MUX I MUX C---!!! QB QB B2 QC ~ C2 QC QD ----1!!. QD 02 } BCD DIGIT I I --..- -.DiGIT3 DIGIT 2 When the word-select input is high and the registers are clocked, the contents of register 1 is transferred (shifted) to register 2, etc. In effect, the BCD digits are shifted one position. In addition, this application retains a parallel-load capability which means that new BCD data can be entered in the entire register with one clock pulse. This arrangement can be modified to perform the shifting of binary data for any number of bit locations. Another function that can be implemented with the' ASC298 is a rgister that can be designed specifically for supporting multiplier or division operations. The example below is a one-place/two-place shift register. II ... CI) CD CD .c U) ... CO CO C 'ASC298 WORD SELECT CLOCK wsl G1 MUx eLK C2 A1 A2 1,20 B1 1,20 FO 'ASC181A (ALUI { 1=1 1!z r- - .2 C1 g. 01 ~ OA QB QC QD F3 'ASC298 ~ WS G1 elK MUX C2 A1 "0 'ASC181A IALU) 1 F1 F2 Ai" i~·20 1.20 ~ 1.!!3. C1 r- QA .r- QB ILg t-- QC ~ t-- QD 01 F3 When word select is low and the register is clocked, the outputs of the arithmetic/logic units (AlUs) are shifted one place. When word select is high and the registers are clocked, the data is shifted two places. TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-249 II C I» .... I» en :::T CD CD .... en 4-250 SN54ASC299, SN74ASC299 8·BIT BIDIRECTIONAL UNIVERSAL SHIFT/STORAGE REGISTERS 02939, AUGUST 1986 SystemCell™ • 2-~m SOFTWARE MACRO CELLS logic symbol t Ported 3-State Inputs/Outputs Simplify Implementation of: Single/Multiple Push/Pop Stack Multiple/Supplementary Accumulator Bus Storage/Shift Register SRGS ClRZ G1Z 3EN5 G2Z - - ' - - - - - - - ' • Four Operating Modes: Synchronous Parallel Load Right Shift Left Shift Do Nothing so Sl CLl< QAP SR LOA • Positive-Edge-Triggered Clocking • Embedded Clock Drivers Provide Clock Buffering C_QC D_QD --~.r-------I E_~ ~ I-____ __'__ QHP 2,4D SL tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. description The SN54ASC299 and SN74ASC299 are standard-cell software macros implementing S-bit parallelin/parallel-out bidirectional, universal shift/storage registers, The S-bit configuration provides the custom IC designer a register to embed in ASICs in its most efficient form. The S-bit length simplifies construction of large registers. The 'ASC299 implements an S-bit shift sequence identical with that performed by packaged 'HC299, 'LS299, and 'F299 4-bit shift registers. These bidirectional shift registers are designed to incorporate virtually all of the features a system designer may want in a shift register. The circuit features parallel inputs, parallel outputs, right-shift and left-shift inputs, operating-mode-control inputs, and a direct overriding clear line. The' ASC299 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pF) CELL AREA SN54ASC' 1 15 0.9 194 11.6 IVll0LH 0.75 1 0.75 0.44 210 12.64 IV140LH 1.5 5 6 8.05 760 45.6 IV222LH NA310LH 1.5 1.25 8 32 16 7.84 1944 40 16 5216 116.8 312.96 NA410LH 1.5 8 12 4 1496 89.6 N0310LH 1.25 1 1.25 .32 312 18.66 26.25 CD CD .s: o ...'" '" C SN74ASC' 1.5 TOTALS U) MAXIMUM ICC (nAI AN210LH R2406LH II ... 2 52.5 23.4 5862 352 58 181.5 60.02 15915 956 Label: S299LH 50,51 ,Gl Z,G2Z,SL,SR,CLK,CLRZ,QAP,QHP.A_ QA,8_QB,C_QC, 0 QO,E QE,F QF,G QG,H_QH; iThe equivalent power dissipation capacitance does not include interconnect capacitance. PRDbuCTIDN DATA documants contain information currant as of publication date. Products conform tD specifications per the terms of Texas Instruments =~~:~i;lr::I~lJi ~:~:~ti:r :.r:=::t:~~ not Copyright © 1986. Texas Instruments Incorporated TEXAS • INSTRUMENTS POST O~FICE BOX 655012 • DALLAS, TEXAS 75265 4-251 SN54ASC299. SN74ASC299 8·BIT BIDIRECTIONAL UNIVERSAL SHIFT/STORAGE REGISTERS The 'ASC299 register has four distinct modes of operation, namely: Parallel (broadside load) Shift right (in the direction QA toward QH) Shift left (in the direction QH toward QA) Inhibit clocking (do nothing). Synchronous parallel loading is accomplished by taking either output control input, G1 Z or G2Z, high and applying the eight bits of data while both' mode control inputs, SO and S 1, are high. The data are loaded into the associated flip-flops on the positive transition of the clock input. During loading, serial data flow is inhibited. Shift right is accomplished synchronously with the rising edge of the clock pulse when SO is high and S 1 is low. Serial data for this mode is entered at the shift-right data input. When SO is low and S 1 is high, data shifts left synchronously and new data is entered at the shift-left serial input. When both mode control inputs are low, a free-running clock will reload the present state of each flip-flop on each clock transition to implement the do-nothing mode. The SN54ASC299 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC299 is characterized for operation from - 40 DC to 85 DC. • C ... I» I» FUNCTION TABLE INPUTS ClRZ MODE S1 OUTPUT CONTROLS SO G1Z t ClK G2Z t l L L l L X L L SR X X X X X L H H X X :::r (1) H L L L L H X X L L L' (1) H L H L L I (I) H L H L L I X X X X X X X H H L L L I H H H L L L I L H H H X X I X ... X SL X X X X en l OUTPUTS 1/0 PORTS SERIAL A QA 8 Q8 C QC 0 QD E QE F QF G QG H QH QAP QHP L L L L L L L L L L L L L L L L L L L L X X X X X X X X L L OAo OBo OCo 000 OEo OFo OGo OHo OAo OHo OAo OBo QCo QFo OGo QHo OAn OBn 000 OC n QEo H QDn OEn OFn OG n OAo H OHo OG n L ~ X X X OBn OAn OC n ODn OBn OC n COn a b C H OBn OC n OE n ' ODn OEn OFn OG n L OG n OFn OG n OHn H OBn H OEn d OFn OG n OHn L OBn e f 9 h a L h t When one or both output controls are high, the eight input/output terminals are disabled to the high-impedance state; however, sequential" operation or clearing of the register is not affected. a . .. h = the level of the steady-state input at inputs A through H, respectively. These data are loaded into the flip-flops while the flip-flop outputs are isolated from the inputloutput terminals, See explanation of Function Tables in Section 1. . 4-252 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75285 SN54ASC299. SN74ASC299 8-BIT BIDIRECTIONAL UNIVERSAL SHIFT/STORAGE REGISTERS logic diagram II ... I/) Q) Q) .s::: en ... «J «J C TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-253 SN54ASC299. SN74ASC299 8-BIT BIDIRECTIONAL UNIVERSAL SHIFT/STORAGE REGISTERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT ICC TEST CONDITIONS Input threshold voltage = 5 V, = 4.5 V to 5.5 = MIN to MAX VCC Supply current TA VCC TA V, V, = 25°C = VCC or Input III c ... capacitance = VCC 5 V, Cpd TA = 25°C Equivalent power VCC - 5 V, tr - tf - 3 ns, dissipation capacitance TA = 25°C 956 nA 0.48 0.24 0.24 0.62 0.62 0.45 0.45 0.12 0.12 0.33 0.33 pF 60.02 60.02 pF A_aA ... H_aH VCC = 5 V, UNIT V 15915 TA = 25°C Output capacitance MAX 2.2 0.48 All others Co TYP MAX O. G1Z,G2Z SO, S1 SN74ASC299 TYP 2.2 ClK Ci SN54ASC299 pF CI) CI) (I) :T CD CD ... switching characteristics over recommended ran!}es of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd ClK tPHl ClRZ 'pd tPHl ClK aAP,aHP ClRZ aAP, aHP 'en Ll.tpd GnZ an Any Any ~ten GnZ an PARAMETERt U) SN74ASC299 SN54ASC299 UNIT TYP~ MAX 15.2 7.1 13.8 ns 17 8.4 15.3 ns 5 10.3 5 9.4 ns 6 11.4 6 10.4 ns 6.1 13.5 6.1 12.2 ns 0.2 0.9 2.3 0.3 0.9 2.1 nsipF 0.4 0.8 2.3 0.5 0.8 2.1 nsipF TYP~ MAX an 7.1 an 8.4 MIN Cl = 0 MIN t Propagation delay times are measured from the 44% point of VI to the 44% point ofVO with tr :;;:; tf = 3 ns (10% and 90%). tpd ;;:;; propagation delay time, low-ta-high or high-to-Iow-Ievel output tpHl " propagation delay time, high-to-Iow-Ievel output ten == enable time, high-impedance state to low- or high-logic-level output .6.tpd == change in tpd with load capacitance aten change in ten with load capacitance tTypicalvaluesareatVcc = 5V,TA = 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post·layout simulation uses actual interconnect capacitance values. ~ = DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design, A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a'single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for a reference. 4-254 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 .'DAlLAS, :TEXAS 75265 SN54ASC299, SN74ASC299 8·BIT BIDIRECTIONAL UNIVERSAL SHIFT/STORAGE REGISTERS HDL FILE BLOCK S299LH; SO @INPUT; Sl @INPUT; G1Z @INPUT; G2Z @INPUT; SL @INPUT; SR @INPUT; CLK @INPUT; CLRZ @INPUT; QAP @OUTPUT; QHP @OUTPUT; A_QA @INOUT; B_QB @INOUT; C_QC @INOUT; O_QO @INOUT; E_QE @INOUT; F_QF @INOUT; G_QG @INOUT H_QH @INOUT; STRUCTURE AN1 INV1 INV10 INV11 INV12 INV13 INV14 INV15 INV2 INV3 INV4 INV6 INV7 INV8 INV9 NA1 NA10 NA11 NA12 NA13 NA14 NA15 NA16 NA17 NA18 NA19 NA2 NA20 NA21 NA22 :AN210LH :IV140LH :IV222LH :IV222LH :IV222LH :IV222LH :IV222LH :IV222LH :IV140LH :IV140LH :IV140LH :IV110LH :IV110LH :IV222LH :IV222LH :NA310LH :NA410LH :NA310LH :NA310LH :NA310LH :NA310LH :NA410LH :NA310LH :NA310LH :NA310LH :NA310LH :NA310LH :NA410LH :NA310LH :NA310LH SO,Sl,AN10; SO,INV10; eN,N010,C_QC; ON,N010,0_QO; EN,N010,E_QE; FN,N010,F_QF; GN,N010,G_QG; HN,N010,H_QH; INV10,INV20; Sl,INV30; INV30,INV40; INV70,INV60; CLRZ,INV70; AN,N010.A_QA; BN,N010,B_QB; QHP,INV1 0,INV30,NA 10; NA60,NA70,NA80,NA90,NA 100; FP,INV1 0,INV30,NA 110; F _QF,INV20,INV40,NA 120; GP,INV1 0,INV40,NA 130; INV30,INV20,EP,NA 140; NA 11 O,NA 120,NA 130,NA 140,NA 150; EP,INV1 0,INV30,NA 160; E_QE,INV20,INV40,NA 170; FP,INVl 0,INV40,NA 180; INV30,INV20,OP,NA 190; H_QH,INV20,INV40,NA20; NA 160,NA 170,NA 180,NA 190,NA200; OP,INVl 0,INV30,NA21 0; 0_QO,INV20,INV40,NA220; TEXAS . . INSTRUMENTS POST OFFICE BOX 6.55012 • DALLAS, TEXAS 75265 • ....CD U) CD .c en ....COCO o 4·255 SN54ASC299, SN74ASC299 8-BIT BIDIRECTIONAL UNIVERSAL SHIFT/STORAGE REGISTERS . HDL FILE (Continued) en ::r STRUCTURE (Continued) NA23 :NA310LH :NA310LH NA24 NA25 :NA410LH NA26 :NA310LH NA27 :NA310LH NA28 :NA310LH NA29 :NA310LH NA3 :NA310LH NA30 :NA410LH NA31 :NA310LH NA32 :NA310LH NA33 :NA310LH NA34 :NA310LH NA35 :NA410LH NA36 :NA310LH NA37 :NA310LH NA38 :NA310LH NA39 :NA31OLH NA4 :NA310LH NA40 :NA410LH NA5 :NA410LH :NA310LH NA6 NA7 :NA310LH NA8 :NA310LH :NA310LH NA9 NOl :N0310LH· FF14 :R2406LH r+ FF58 • 0 Q) r+ Q) CD CD til :R2406LH EP,INV10,INV40,NA230; INV30,INV20,CP,NA240; NA210,NA220,NA230,NA240,NA250; CP,INV10,INV30,NA260; C_QC,INV20,INV40,NA270; DP,INV10,INV40,NA280; INV30,INV20,BP,NA290; SL,INV10,INV40,NA30; NA260,NA270,NA280,NA290,NA300; BP,lNVl O,INV30,NA31 0; B_QB,INV20,INV40,NA320; CP,INV10,INV40,NA330; INV30,INV20,QAP,NA340; NA310,NA320,NA330,NA340,NA350; QAP,INV10,INV30,NA360; A_QA,INV20,INV40,NA370; BP,INV10,INV40,NA380; INV30,INV20,SR,NA390; INV30,INV20,GP,NA40; NA360,NA370,NA380,NA390,NA400; NA 1O,NA20,NA30,NA40,NA50; GP,INV10,INV30,NA60; G_QG,INV20,INV40,NA70; QHP,INV10,INV40,NA80; INV30,INV20,FP,NA90; ANl 0,G1Z,G2Z,NOl 0; INV60,NA250,NA300,NA350,NA400,CLK,DP,DN,CP,CN,BP, BN,QAP,AN; INV60,NA50,NA 1OO,NA 150,NA200,CLK,QHP,HN,GP,GN,FP, FN,EP,EN; END S299LH; shift definiti()n These registers are bidirectional with respect to shift operations, and the relationship for shifting left or right is defined by the SO and 51 inputs. Unidirectional registers are available in software macros or can be constructed using the' ASC2405 through' ASC2407 8-bit predesigned registers. Additional single bits ; can be achieved with flip-flop cells offered in TI's standard cell family. designing for testability Designers employing storage or bistable elements, especially long registers (ripple or synchronous)', should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost saVings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achi.eve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an· AND gate. 4-256 TEXAS. INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC299X, SN74ASC299X 8-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS 02939, AUGUST 1986 SystemCell™ 2-/lm SOFTWARE MACRO CELL logic symbol t • Parallel Inputs and Outputs • Four Operating Modes: Synchronous Parallel Load Right Shift Left Shift Do Nothing SRG8 ClRZ so S1 ClK • Positive Edge-Triggered Clocking • Embedded Clock Drivers Provide Clock Buffering SR description The SN54ASC299X and SN74ASC299X are standard-cell software macros implementing 8-bit paraliel-in/parall'el-out bidirectional, universal shift registers. The a-bit configuration provides the custom IC designer a register to embed in ASICs in their most efficient form, The a-bit length simplifies construction of large registers. The' ASC299X implements an a-bit shift sequence identical with that performed by packaged 'HC194A, 'LS194A, and 'F194 4-bit shift registers. A 3.40 8 3.40 OA 08 C OC 0 00 OE OF G OG H 3.40 Sl 2.40 OH tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617·12. • ... U) Q) Q) These bidirectional shift registers are designed to incorporate virtually all of the features a system designer may want in a shift register. The circuit features parallel inputs, parallel outputs, right-shift and left-shift inputs, operating-mode-control inputs, and a direct overriding clear line. The register has four distinct modes of operation, namely: Parallel (broadside load) Shift right (in the direction QA toward QH) Shift left (in the direction QH toward QA) Inhibit clocking (do nothing) .s:: en ... C'CI C'CI C The' ASC299X is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pF) CELL AREA MAXIMUM ICC (nA) SN54ASC' SN74ASC' IVll0LH 0.75 1 0.75 0.44 105 IV140LH 1.5 5 7.5 8.05 950 57 NA310LH NA410LH 1.25 32 40 16 5216 312.96 1.5 8 12 4 1496 89.6 R2405LH 23.25 2 46.5 20.4 5294 318 48 106.75 48.89 13061 784 TOTALS 6.32 Label: S299XLH A,B,C,D,E,F,G,H,SO,Sl ,SL,SR,CLK,CLRZ,QA,QB,QC,QD,QE,QF,QG,QH; +The equivalent power dissipation capacitance does not include interconnect capacitance. PRODUCTION DATA documants contain information currant 8S of publication data. Products co,.form to specifications per the tarms of Taxas Instruments :e~~=~~i~ai~:I~Ji ~=~~ti:r :'~O:::::::t:~~S not Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DA.LLAS, TEXAS 75265 4-257 SN54ASC299X, SN74ASC299X 8-BIT BIDIRECTIONAL. UNIVERSAL SHIFT REGISTERS description (continued) Synchronous parallel loading is accomplished by applying the eight bits of data and taking both mode control inputs, SO and S 1, high. The data are loaded into the associated flip-flops and appear at the outputs after the positive transition of the clock input. During loading, serial data flow is inhibited. Shift right is accomplished synchronously with the rising edge of the clock pulse when SO is high and S1 is low. Serial data for this mode is entered at the shift-right data input. When SO is low and S1 is high, data shifts haft synchronously and new data is entered at the shift-left serial input. When both mode control inputs are low, a free-running clock will reload the present state of each flip-flop on each clock transition to implement the do-nothing mode. The SN54ASC299X is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC299X is characterized for operation from -40°C to 85°C. FUNCTION TABLE INPUTS MODE SO CLK SL SR A B C X H X X H H L H H H L H H H L H H H L H L L t t t t t X X X X X X X X X X X b X X X X X X X H X X X X X H X X X X X L o ... C» C» L L X L OUTPUTS PARALLEL 51 X X CLRZ • SERIAL a c X X X X X 0 X X d X X X X X E F G H QA QB QC QD QE QF QG QH X X e X X X X X X X X X L L L L L L L L QEo Q~o f 9 X X X X X X X h X X X X X X X X X X QAo QBo QCo QDo QGo QHo a b c d e f 9 h H QAh QBn QCn QDn QEn QFn QGn L QAn QBn QCn QDn QEn QFn QGn QBn QCn QDn QEn QFn QGn QHn H QBn QCn QDn QEn QFn QGn QHn L QAO QBo QCO QDO QEO QFO QGO QHO t/) :r !CD typical clear. load. right-shift. left-shift. inhibit. and clear sequences en 4-258 The 4-bit sequences illustrated on the 'ASC194 data sheet are applicable for similar 8-bit functions performed by the 'ASC299X. TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC299X, SN14ASC299X 8·BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS logic diagram II ... fI) CD CD .c CI) ...asas C TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4·259 SN54ASC299X, SN74ASC299X 8·BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci Input capacitance SN54ASC299X TEST CONDITIONS TYP TA - 25°C VCC - 5 V. VCC = 4.5 V to 5.5 V, VI = VCC or O. TA = MIN to MAX II ~ ;- tn ::r Equivalent power Cpd dissipation capacitance t tr = tf = 3 ns, VCC = 5 V. TA = 25°C MAX 784 0.48 0.48 0.49 0.49 0.12 0.12 48.89 48.89 UNIT V 2.2 13061 TA = 25°C VCC = 5 V, TYP 2.2 I ClK LSO,S1 I All others SN74ASC299X MAX nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) PARAMETER* FROM (INPUT) TO TEST (OUTPUT) CONOITIONS CD CD tpd ClK Qn (I) tpHl ClRZ Qn .:l.tpd ClK Qn .:l.tpHl ClRZ Qn ... SN54ASC299X TYP§ MAX SN74ASC299X TYP§ MAX UNIT 10.5 5 9.4 ns 9.3 6.1 8.6 ns 0.9 2.1 nsipF 0.7 1.6 nsipF MIN Cl = 0 0.3 0.3 5 5 0.9 0.7 2.3 1.9 MIN 0.3 0.3 *Propagation delay times are measured from the 44% pOint of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpd " propagation delay time, low-to-high-Ievel or high-to· low-level output tpHl '" propagation delay time. high·to·low·level output .:l.tpd '" change in tpd with load capacitance .:l.tPHl '" change in tpHl with load capacitance § Typical values are at VCC = 5 V, T A '= 25°C. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HOl for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HOL block definition is furnished for reference. 4-260 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC299X, SN74ASC299X 8·BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS HDL FILE BLOCK S299XLH; A @INPUT; B @INPUT; @INPUT; C @INPUT; D @INPUT; E @INPUT; F @INPUT; G @INPUT; H @INPUT; SO @INPUT; Sl @INPUT; SL @INPUT; SR @INPUT; CLK @INPUT; CLRZ @OUTPUT; QA @OUTPUT; QB @OUTPUT; QC @OUTPUT; QD @OUTPUT; QE @OUTPUT; QF @OUTPUT; QG @OUTPUT; QH STRUCTURE INVl INV2 INV3 INV4 INV5 INV6 NAl NA10 NAll NA12 NA13 NA14 NA15 NA16 NA17 NA18 NA19 NA2 NA20 NA21 NA22 NA23 NA24 NA25 NA26 NA27 a... en C1) C1) .s:::. :IV140LH :IV140LH :IV140LH :IV140LH :IVll0LH :IV140LH :NA310LH :NA410LH :NA310LH :NA310LH :NA310LH :NA310LH :NA410LH :NA310LH :NA310Lh :NA310LH :NA310LH :NA310LH :NA410LH :NA310LH :NA310LH :NA310LH :NA310LH :NA410LH :NA310LH :NA310LH SO,INV10; INV10,INV20; Sl,INV30; INV30,INV40; CLRZ,INV50; INV50,INV60; QH,INVl 0,INV30,NA 10; NA60,NA 70,NA80,NA90,NA 100; QF,INVl 0,INV30,NA 110; F,INV20,INV40,NA 120; QG,INVl 0,INV40,NA 130; INV30,INV20,QE,NA 140; NAll0,NA120,NA130,NA140,NA150; QE,INVl 0,INV30,NA 160; E,INV20,INV40,NA 170; QF,INVl 0,INV40,NA 180; INV30,INV20,QO,NA 190; H,INV20,INV40,NA20; NA 160,NA 170,NA180,NA 190,NA200; QO,INVl 0,INV30,NA21 0; D,INV20,INV40,NA220; QE,INV10,INV40,NA230; INV30,INV20,QC,NA240; NA210,NA220,NA230,NA240,NA250; QC,INV10,INV30,NA260; C,INV20,INV40,NA270; TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • bALLAS, TEXAS 75265 o co co ... C 4·261 SN54ASC299X, SN14ASC299X 8·BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTERS HDL FILE (continued) STRUCTURI" (continued) NA28 :NA310LH NA29 :NA310LH NA3 :NA310LH NA30 :NA410LH NA31 :NA310LH NA32 :NA310LH NA33 :NA310LH NA34 :NA310LH NA35 :NA410LH NA36 :NA310LH NA37 :NA310LH NA38 :NA310LH NA39 :NA310LH NA4 :NA310LH NA40 :NA410LH NA5 :NA410LH NA6 :NA310LH NA7 :NA3iOLH NA8 :NA310LH NA9 :NA310LH FF14 :R2405LH FF58 :R2405LH END S299XLH; II QD,INV10,INV40,NA280; INV30,INV20,QB,NA290; SL,INV10,INV40,NA30; NA260,NA270,NA280,NA290,NA300; QB,INV1 O,INV30,NA31 0; B,INV20,INV40,NA320; QC,INV10,INV40,NA330; INV30,INV20,QA,NA340; NA310,NA320,NA330,NA340,NA350; QA,INV10,INV30,NA360; A,INV20,INV40,NA370; QB,INV10,INV40,NA380; INV30,INV20,SR,NA390; INV30,INV20,QG,NA40; NA360,NA370,NA380,NA390,NA400; NA 1O,NA20,NA30,NA40,NA50; QG,INV10,INV30,NA60; G,INV20,INV40,NA70; QH,INV10,INV40,NA80; INV30,INV20,QF,NA90; INV60,NA250,NA300,NA350,NA400,CLK,QD,QC,QB,QA; INV60,NA50,NA 1OO,NA 150,NA200,CLK,QH,QG,QF,QE; shift definition These registers are bidirectional with respect to shift operations and the relationship for shifting left or right is defined by the SO and S 1 inputs. Unidirectional registers are available in software macros or can be constructed using the' ASC2405 through' ASC2407 8-bit predesigned registers. Additional single bits can be achieved with flip-flop cells offered in TI's standard cell family. designing for testability Designs employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage e.lements containing the capability to be asychronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. 4-262 . TEXAS'" INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 SN54ASC373.SN74ASC373 8-BIT OoTYPE LATCHES WITH 3-STATE OUTPUTS D2939, AUGUST 1986 SystemCell™ 2-/lm SOFTWARE MACRO CELL • 3-State Outputs Interface with Internal Data Buses Directly • Buffered Output Enable Simplifies System Design • Full Parallel Access for Loading • Parallel Latches for 16-Bit. 32-Bit, 64-Bit Word Widths • Dependable Texas Instruments Quality and Reliability logic symbol t ocz C 01 02 03 08 as D4 description The SN54ASC373 and SN74ASC373 a~ standard-cell software macros implementing 8-bit D-type latch elements designed specifically for interfacing internal bus lines. The 8-bit length means that testability is simplified when constructing large latches. The 'ASC373 implements a function table identical with that performed by packaged 'HC373, 'LS373, and 'F373 latches. 05 06 07 01 02 03 04 05 06 07 tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. II ... rn The eight latches of the 'HC373 are transparent D-type latches. While the enable (C) is high, the Q outputs will follow the data (D) inputs. When the enable is taken low, the Q outputs will be latched at the levels that were set up at the D inputs. The output-control input OCl can be used to place the eight outputs in either a normal logic state (high or low logiC levels) or a high-impedance state. When the outputs are enabled with OCl low, the logic level at each of the eight outputs is impressed on the data bus. The outputs are disabled by a high logic level at OCl. The outputs then present a high impedance to the internal bus. The output control does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are off. The' ASC373 is implemented with standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USEO TOTAL TOTAL RELATIVE Cpd* (pF) CELL AREA TO NA210lH ~ (J) ...nsns C MAXIMUM ICC (nA) SN54ASC' SN74ASC' IV110LH 0.75 8 6 3.52 840 50.56 IV140LH 1.5 3 4.5 4.83 570 34.2 IV212LH 1.5 8 12 4 1440 86.4 A0221 LH 2.7 8 21.6 4.72 1792 107.2 27 44.1 17.07 4642 279 TOTALS Q) Q) Label: S373LH 01,02,03,04,05,06,07 ,08,C,OCZ,Q1,02,03,04,05,06,07 ,08; tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC373 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC373 is characterized for operation from - 40°C to 85 DC. PRODUCTION DATA documents contain information currant as of publication data. Products conform to specifications par the tarms of Texas Instruments ==~~i~.r::1~1~ ~r;~:~i:: ~ID:::::::t:~~S not .J.!1 TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-263 SN54ASC373. SN74ASC373 8·BIT O·TYPE LATCHES WITH 3·STATE OUTPUTS FUNCTION TABLE (EACH LATCH) INPUTS OUTPUT OCZ C 0 Q L H H H L H L L L L X X X 00 H Z logic diagram 0, Ql 02 Q2 II 03 C Q3 Q) pt. Q) en ::r D4 Q4 CD CD pt. en 011 07 r-~------------------~+-~H ~::.:..-----r, Q7 ~~---f>Q8 c ocz 4-264 r">--------!:'-j TEXAS • INSTRUMENTS POST OFFICE BOX 655012. DALLAS, TEXAS 75265 SN54ASC373, SN74ASC373 B-BIT OoTYPE LATCHES WITH 3-STATE OUTPUTS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics TEST CONOITIONS PARAMETE' VT Input threshold voltage lee Supply current ei Input capacitance t= epd SN74ASC373 TYP TYP MAX 2.2 Vee ~ 5 V, TA = 25°e Vee - 4.5 V to 5.5 V, VI - Vee or 0, 2.2 ~ TA 5 V, ~ 25°e Output capacitance Vee ~ 5 V, TA = 25°e Equivalent power Vee = 5 V, tr dissipation capacitance t TA ~ 25°e ~ tf ~ 3 ns, UNIT V 279 0.49 Vee MAX 4642 TA = MIN to MAX aez eo SN54ASC373 nA 0.49 0.13 0.13 0.49 0.49 pF 0.18 0.18 pF 17.07 17.07 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Notes 1 and 2) PARAMETERt FROM TO TEST (INPUT) (OUTPUT) CONDITIONS SN54ASC373 MAX MIN TYP§ SN74ASC373 MAX MIN TYP§ 3 7.5 3 6.7 5 10.2 UNIT ns Q aez Q 5 9.2 ns D Q 0.6 1.7 4.6 0.6 1.7 4.2 ns/pF fiten Any Q 0.7 1.7 4.8 0.7 1.7 4.4 ns/pF eL ~ 0 Q) Q) .c tn ...caca C a ten t.tpd tpd • ...en t The equivalent power dissipation capacitance does not include interconnect capacitance. tPropagation delay times are measured from the 44% pOint of VI to the 44% point of Va with tr ~ tf ~ 3 ns (10% and 90%). tpd == propagation delay time, low~to-high-Ievel or high-to-Iow-Ievel output ten 5" enable time, high-impedance state to low- or high-Iogic-Jevel output .Mpd == change in tpd with load capacitance l1ten == change in ten with load capacitance § Typical values are at Vee = 5 V, T A ~ 25°e. NOTES: 1. These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. 2. Enable and delta-enable times are measured using the conditions specified for the' ASC2407. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS:TEXAS 76265 4-265 SN54ASC373, SN74ASC373 8·BIT D·TYPE LATCHES WITH 3·STATE OUTPUTS HDL FILE IIo I» Dr t/) ::r CD CD S 4-266 BLOCK S373LH; 01 @INPUT; 02 @INPUT; 03 @INPUT; 04 @INPUT; 05 @INPUT; 06 @INPUT; 07 @INPUT; 08 @INPUT; C @INPUT; OCZ @INPUT; Q1 @OUTPUT; Q2 @OUTPUT; Q3 @OUTPUT; Q4 @OUTPUT; Q5 @OLiTPUT; Q6 @OUTPUT; Q7 @OUTPUT; Q8 @OUTPUT; STRUCTURE A01 A02 A03 A04 A05 A06 A07 . A08 INV10 INV11 INV12 INV13 INV14 INV15 INV16 INV17 INV18 INV20 INV21 INV22 INV23 INV24 INV25 INV26 INV27 INV28 INV9 END S373LH; :A0221LH :A0221LH :A0221LH :A0221LH :A0221LH :A0221LH :A0221LH :A0221LH :IV140LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH. :IV140LH :IV212LH :IV212LH :IV212LH :IV212LH :IV212LH :IV212LH :IV212LH :IV212LH :IV140LH 01 ,INV90,INVioO,INV11 0,A01 0; 02,INV90,INV100,INV120,A020; 03,INV90,INV100,INV130,A030; 04,INV90,INV100,INV140,A040; 05,INV90,INV100,INV150,A050; 06,INV90,INV100,INV160,A060; 07,INV90,INV100,INV170,A070; 08,INV90,INV100,INV180,A080; C,INV100; A010,INV110; A020,INV120; A030,INV130; A040,INV140; A050,INV150; A060,INV160; A070,INV170; A080,INV180; OCZ,INV200; A01 O,INV200,Q1; A020,INV200;Q2; A030,INV200,Q3; A040,INV200,Q4; A050,INV200,Q6; A060,INV200,Q6; A070,INV200,Q7; A080,INV200,Q8; INV100,INV90; TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC374, SN74ASC374 8·BIT O·TYPE FLlp·FLOPS WITH 3·STATE OUTPUTS 02939. AUGUST 1986 SystemCell™ 2·",m SOFTWARE MACRO CELL • 3-State Outputs Interface with Internal Data Buses Directly • Buffered Output Control Simplifies System Design • Embedded Clock Drivers Provide Symmetrical Performance Across Long Registers • Parallel Latches for 16-Bit, 32-Bit, 64·Bit Word Widths logic symbol t ocz ClK 01 01 02 02 description The SN54ASC374 and SN74ASC374 are standard-cell software macros implementing 8-bit D-type register elements designed specifically for interfacing internal bus lines. The 8-bit length simplifies construction of large registers. The' ASC374 implements a function table identical with that performed by packaged 'HC374, 'LS374, and 'F374 latches. 03 03 D4 04 05 05 06 06 07 07 os as tThis symbol is in accordance with ANSI/IEEE Std 91·19B4 and IEC Publication 617·12. The Output-Control input OCZ can be used to place the eight outputs in either a normal logic state (high or low logic levelsl or a high-impedance state. When the outputs are enabled with OCZ low, the logic level at each of the eight outputs is impressed on the data bus. The outputs are disabled by a high logic level at OCZ. The outputs then present a high impedance to the internal bus. When the outputs are disabled, sequential operation of the flip-flops is not affected. The 'ASC374 is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CEll NAME CELL AREA NO. USED TO NA210LH IV120LH 1 R2407LH 26.25 TOTAL TOTAL RELATIVE Cpd* (pFI CEll AREA 1 1 a... (I) Q) Q) .c: (I) ... CU CU C MAXIMUM ICC (nA) SN54ASC' SN74ASC' 7.B5 2 52.5 6062 384 22 T0010LH 1.5 1 1.5 177 10.6 TOTALS 4 55 22.80 6370 403 label: S374lH Dl.D2.D3.D4.D5.D6.D7.DB.ClK.OCZ.01.Q2,Q3,Q4.Q5.Q6.Q7,QB; O.B 131 :l:The eq~ivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC374 is characterized for operation over the full military temperature range of - 55 0<;: to 125°C. The SN74ASC374 is characterized for operation from -40°C to 85°C. PRODUCTION DATA documenls conlain informalion current as of publication date. P,oducts conform to specifications par the terms of Texas Instruments ::~~:~~i;ai~:I:r~ ~~:~ti:r :I~D::~::~::~ not Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-267 SN54ASC374, SN74ASC374 8·BIT O·TYPE FLlp·FLOPS WITH 3·STATE OUTPUTS FUNCTION TABLE (EACH FLIP-FLOP) OUTPUT INPUTS OCZ CLK On Q L H H L t t L L L L X QO H X X Z logic diagram TOO10Lx vee INV1 GNO R2407Lx 01 eLK eLK Q2 01 III C ....I» I» tJ) :T CD CD .... en Q3 02 04 03 Q3 04 FF14 04 01 eez Q2 INV5 05 06 07 Q3 01 02 03 04 04 FF58 08 4-268 01 Q2 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 DOD OD Q7 Q6 SN54ASC374, SN74ASC374 8·BIT O·TYPE FLlp·FLOPS WITH 3·STATE OUTPUTS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration. setup time. and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics TEST CONDITIONS PARAMETER = 5 V, = 4.5 V to 5.5 = MIN to MAX VT Input threshold voltage ICC Supply current Ci Input capacitance On Co DCZ Output capacitance VCC Equivalent power VCC dissipation capacitance t TA Cpd VCC Vce TA ,~ = VCC = = = TA V. VI 5 V, TA = 25°C = Vec or 0, = TA tr SN74ASC374 TYP 2.2 TYP MAX MAX 25°C 403 nA 0.4S 0.4S 0.25 0.25 0,24 pF 0,24 pF 22,S pF 0.24 0,24 22,S 25°C UNIT V 2.2 6370 = 25°C = tf = 3 ns, 5 V, 5 V, SN54ASC374 t The equivalent power dissipation capacitance does not include interconnect capacitance. en switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Notes 1 and 2) FROM (INPUT) TO (OUTPUT) tnd CLK Q ten Atpd OCZ Q CLK Any Q Q PARAMETER* .t1ten TEST CONDITIONS CL = 5 11,4 5 10.4 ns 7,1 4 6.6 ns 0,6 4,6 0,6 ns 1,7 4,S O,S 1.7 1.7 4.2 O.S 4.3 ns/pF :5 = tf = G) G) .c en ... ta ta UNIT 4 1,7 tpropagation delay times are measured from the 44% pOint of VI to the 44% point of Va with tr tpd '" propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output ten SN74ASC374 MIN TYP§ MAX SN54ASC374 MIN TYP§ MAX ° II ... o 3 ns (10% and 90%1, enable time, high-impedance state to low- or high-logic-level output Atpd '" change in tpd with load capacitance ~ten ;;;: change in ten with load capacitance § Typical values are at V CC = 5 V, T A = 25°C. NOTES; 1. These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array ' design having, 2,000 gates. Actual performance can be ,evaluated at post-layout simulation. 2. Enable and delta-enable times are measured using the conditions specified for the' ASC2407, TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-269 SN54ASC374, SN74ASC374 8-BIT O·TYPE FLlP·FLOPS WITH 3·STATE OUTPUTS DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. HOL FILE BLOCK S374LH; 01 @INPUT; D2 @INPUT; 03 @INPUT; D4 @INPUT; D5 @INPUT; D6 @INPUT; D7 @INPUT; DS @INPUT; CLK @INPUT; OCZ @INPUT; 01 @OUTPUT; 02 @OUTPUT; 03 @OUTPUT; 04 @OUTPUT; 05 @OUTPUT; 06 @OUTPUT; 07 @OUTPUT; 08 @OUTPUT; II c ... CI) CI) en :::r CD CD ... (II STRUCTURE INV1 INV5 FF14 FF5S END S374LH; :T0010LH :IV120LH :R2407LH :R2407LH DUM,ICLRZ; OCZ,INV50; ICLRZ,D1 ,D2,D3,D4,CLK,INV50,01 ,02,03,04; ICLRZ,D5,D6,D7 ,DS,CLK,INV50 ,05,06,07 ,OS; designing for testability Designers employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly . 4-270 . TEXAS" INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC375, SN74ASC375 4-BIT BISTABLE LATCHES 02939, AUGUST 1986 SystemCelllM 2-/lm SOFTWARE MACRO CELL logic symbol t • Four-Bit Software Latches with Complementary Outputs • Eliminates Skew and Mismatch of Long versus Short Data Paths • 10 01 01 01Z C1C2 Parallel Latches for 8-Bit, 16-Bit, 32-Bit Word Widths 02 02 02Z 03 03 03Z C3C4 description The SN54ASC375 and SN74ASC375 are standard-cell software macros implementing 4-bit bistable latch elements for embedding in ASICs, The 4-bit length simplifies construction of large registers, The 'ASC375 implements a function table identical with that performed by packaged 'HC375 and 'LS375 registers. 04 04 04Z tThis symbol is in accordance with ANSI/IEEE SId 91-1984 and IEC Publication 617-12. Information present at a On input is transferred to the Qn output when the Cn input is high, and the Qn output will follow the data input as long as Cn remains high, When Cn goes low, the data (that was present at the On input at the time the transition occurred) is retained at the Qn output until CnCn is taken high. The' ASC375 is implemented with the standard cell functions indicated. The HOL netlist label for this software is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE CELL AREA Cpd* (pF) 10.8 2.36 896 53.6 4 2.7 IVll0LH 0.75 4 3 1.76 420 25.28 IV120LH 1 4 4 3.2 524 31.4 12 17.8 7.32 1840 111 TOTALS .c U) SN74ASC' A0221LH ...en CD CD MAXIMUM ICC (nA) SN54ASC' 4 ...'" o'" Label: S375LH 01,02,D3,D4,Cl C2,C3C4,Ql,Q1Z,Q2,Q2Z,Q3,Q3Z,Q4,Q4Z; tThe equivalent power diSSipation capacitance does not include interconnect capacitance. The SN54ASC375 is characterized for operation over the full military temperature range of - 55 °C to 125°C. The SN74ASC375 is characterized for operation from -40°C to 85°C. FUNCTION TABLE (EACH FLIP-FLOP) INPUTS PRODUCTION DATA documanll .onllin information currant as of publication data. Products conform to specifications per the tarms of Tuas Instruments ::.:!:~~i;8r::1~7i :3::,:.~O:=:::~~~ not OUTPUTS On Cn an OnZ L H L H H H H L X L Qno Qno Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 76266 4-271 SN54ASC375. SN74ASC375 4·BIT BISTABLE LATCHES logic diagram ,.-------£::::::::> 01 =>"-'-....--r~ C1C2 a1Z a1 Q2Z 02 ....--£::::::::> Q2 ~-'- Q3Z D3 • ...Cmm Q3 EN34 Q4Z 04 en :::r Q4 CD CD ...en 4-272 TEXAS . . INSTRUMENTS POST OFFICE BOX 665012 • DALLAS, TeXAS 75265 SN54ASC375, SN74ASC375 4·BIT BISTABLE LATCHES absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation, produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage lec Supply current Ci Cpd Vce - 5 V, TA ~ SN54ASC375 SN74ASC375 TYP TYP 25°C 2.2 VCC - 4.5 V to 5.5 V, VI - VCC to 0, TA I On I CnCm ~ TA ~ 25°C Equivalent power Vee - 5 V, t r - tf - 3 ns, dissipation capacitance t TA ~ 25°C MAX 2.2 111 0.13 0.13 0.12 0.12 7.32 7.32 UNIT V 1840 MIN to MAX Vee ~ 5 V, Input capacitance MAX nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd tpd On On Qn QnZ tpd tpd Cn Cn Qn QnZ PARAMETERt CL SN54ASC375 TYP§ MAX MIN =0 SN74ASC375 Typ9 MAX II UNIT MIN 3 2 6.4 4.8 3 2 5.8 4.8 ns ...co 5 4.5 10.2 8.7 5 4.5 9.5 8 ns C t.tpd Any Qn 0.3 0.5 1.1 0.3 0.5 1 t.tpd Any Qnz 0.5 1.5 4.6 0.5 1.5 4.1 CO ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf ~ 3 ns (10% and 90%). tpd :;;: propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output t.tpd " change in tpd with load capacitance §Typical values are at Vee ~ 5 V, TA ~ 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-273 SN54ASC375, SN74ASC375 4-BIT BISTABLE LATCHES DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifica!ly for managing unused inputs. The HOL for this software macro is iricluded as a .part of the library supplied for supported engineering workstations so that a siQgle label can be developed to apply the macro as needed. The following printout of the HOL block definition is furnished for reference. HOL FILE II ...C I» I» en :::T CD !en 4-274 BLOCK S375LH; 01 @INPUT; 02 @INPUT; 03 @INPUT; 04 @INPUT; C1C2 @INPUT; C3C4 @INPUT; Q1 @OUTPUT; Q1Z @OUTPUT; Q2 @OUTPUT; Q2Z @OUTPUT; Q3 @OUTPUT; Q3Z @OUTPUT; Q4 @OUTPUT; Q4Z @OUTPUT; STRUCTURE A01 A02 A03 A04 INV1 INV2 INV3 INV4 INV5 INV6 INV7 INV8 ENO S375LH; :A0221LH :A0221LH :A0221LH :A0221LH :IV110LH :IV120LH :IV120LH :IV120LH :IV120LH :IV110LH :IV110LH :IV110LH 01 ,INV60,INV1 O,Q1 ,Q1 Z; 02,INV60,INV10,Q2,Q2Z; 03,INV80,INV70,Q3,Q3Z; 04,INV80,INV70,Q4,Q4Z; C1C2,INV10; Q1Z,Q1; Q2Z,Q2; Q3Z,Q3; Q4Z,Q4; INV10,INV60; C3C4,INV70; INV70,INV80; TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS;. TEXAS 75266 SN54ASC375, SN74ASC375 4·BIT BISTABLE LATCHES designing for testability Designs employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. II .... CI) CI) CI) .r:. en ....caca C TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 75265 4-275 III C I» I» ..... en :r CD CD ..... f/) 4-276 SN54ASC393, SN74ASC393 DUAL FOUR-BIT RIPPLE COUNTERS 02939. AUGUST 1986 SystemCell™ • • • 2-Jlm SOFTWARE MACRO CELL Software Dual Four-Bit Counter for Custom IC Applications logic symbol t ,{ CTRDIV16 Direct Clear Input Simplifies Initialization or Cycle Length Embedded Clock Drivers Provide Symmetrical Performance Across Long Counters • CT-O CLRI + AI QAl aBl aCl aDl Cascadable and Expandable for Full Customization aA2 CLR2 aB2 description aC2 A2 aD2 The SN54ASC393 and SN74ASC393 are standard-cell software macros implementing dual4-bit binary counter elements. The dual 4-bit tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. configuration provides the custom IC designer a fully designed counter element to embed in ASICs in its most efficient form, and the 4-bit length simplifies construction of large counters. The' ASC393 implements a count sequence identical with that performed by packaged 'HC393 and 'LS393 counters. This software macro reduces the input loading for implementation of larger counters, as standard library buffer cells are used to buffer each clock and clear input to further enhance the performance across long counters. The' ASC393 is implemented with standard cell functions indicated. The HDL netlist label for this software is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pF) SN54ASC' 210 CELL AREA 0.75 IV120LH 1 2 2 1.5 2 1.6 262 12.64 15.7 R240SLH 2S.25 2 56.5 14.44 6926 416 TOTALS 16.92. 6 60 7398 Label: S393LH Al ,CLRI ,A2,CLR2,QA 1,QSl ,QCl ,QDl ,QA2,QB2,aC2,QD2; 445 If) Q) Q) .s::. en C SN74ASC' 0.88 .... ....C'C'OO MAXIMUM ICC (nA) IV110LH • +The equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC393 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC393 is characterized for operation from - 40 DC to 85 DC. Copyright © 1986, Texas Instruments Incorporated PRODUCTIOI DATA documonts .ontoin information of publication date. Products conform to current I' specificatioRS per the terms of Texas Instruments :=~~~8{::1~1i =~:~:; :'~D:::::9t::.s not TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-277 SN5~ASC393. SN74ASC393 DUAL FOUR·BIT RIPPLE COUNTERS FUNCTION TABLE (EACH COUNTER) INPUTS ClRn An H X l l l l l l l l l L L L L L L L • • • • • • • • • • • • • • • lI_d,ag,am • OUTPUTS ODn OCn OBn OAn l l l l H l l l l l H l l l H H l l l H H l H l l H H l H H H l H l l L H l L H H L H L H L H H H L L H Ii H L H H H L H H H H H L L L L C a R24081.x A1 V D) en ~ CD CD Q.K Q1 Q.RZ Q.R1 Q2 I·~--------~ Q3 1NV2 0+ (II Q4 QA1 as1 QC1 aD1 FF14 A2 Q.R2 R24081.x V Q.K Q1 Q.RZ Q2 Q3 Q4 FFIi8 4-278 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 QA2 QB2 QC2 aD2 SN54ASC393, SN74ASC393 DUAL FOUR-BIT RIPPLE COUNTERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during.pre-Iayout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT Input threshold voltage lee Supply current Ci lelRn Input capacitance An TA I = 4.5 V to 5.5 = MIN to MAX dissipation capacitance t Vee = SN54ASC393 SN74ASC393 TYP TYP TA - 25 De Vee - 5 V. Vee Equivalent power epd TEST CONDITIONS V, 5 V, VI TA = Vee = 2.2 or O. MAX 25 De 445 0.24 0.24 0.12 0.12 16.92 16.92 UNIT V 2.2 739B t r - tf - 3 ns, Vee - 5 V, TA = 25 De MAX nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) PARAMETER; tpd FROM TO TEST (INPUT) (OUTPUT) CONDITIONS Any tpd SN54ASC393 TYP§ MAX MIN tpHl ClRn Q ~tpd Any Any Q 14.9 7 13.6 ns 14 31.5 14 2B.5 ns 4.5 8.7 4.5 B.1 ns 0.5 1.3 0.5 1.1 ns/pF Cl = 0 0.3 UNIT 7 QA QD SN74ASC393 TYP§ MAX MIN 0.3 II ... fI) CI,) CI,) .c en ...caca C *Propagation delay times are measured from the 44% point of VI to the 44% pOint of Vo with t, = tf = 3 ns (10% and 90%). tpd 5 propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output tPHl 5 propagation delay time, high-to-Iow level output ~tpd '" change in tpd with load capacitance §Typical values are at Vee = 5 V. T A = 25 De. NOTE1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Actual performance can be evaluated at postMlayout simulation. ~ TEXAS INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-279 SN54ASC393, SN74ASC393 DUAL FOUR-BIT RIPPLE COUNTERS DESIGN CONSIDERATIONS All inputs to this 'cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for .supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. HDL FILE • ...o Q) Q) (I) ::T CD CD ... (I) BLOCK S393LH; A1 @INPUT; CLR1 @INPUT; A2 @INPUT; CLR2 @INPUT; QA 1 @OUTPUT; QB1 @OUTPUT; QC1 @OUTPUT; QD1 @OUTPUT; QA2 @OUTPUT; ·QB2 @OUTPUT; QC2 @OUTPUT; QD2 @OUTPUT; STRUCTURE INV1 :IV110LH INV2 :IV110LH INV3 :IV110LH INV4 :IV110LH FF14 :R240BLH :R240BLH. FF5B END S393LH; A1,INV10; CLR1,INV20; A2,INV30; CLR2,INV40; INV1 O,INV20,QA 1 ,QB1 ,QC1 ,QD1; INV30,INV40,QA2,QB2,QC2,QD2; count definition These counters are unidirectional with respect to count operations. Inverting the output levels will produce a down-count sequence. Bidirectional counters are available in software macros or can be constructed using the' ASC2405 through 'ASC2407 4-bit predesigned registers. designing for testability Designs employing storage or bistable elements, especially long counters (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits, with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up-clear/preset Standard cell storage elements containing the capability to be asynchronously either preset or cleared may be connected through an inverter to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Access to the clear inputs from other system signals in conjunction with power-up clear can be implemented with an OR gate. 4-2BO TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS', TeXAS 75265 SN54ASC398, SN74ASC398 QUADRUPLE 2·INPUT MULTIPLEXERS WITH POSITIVE·EDGE· TRIGGERED COMPLEMENTARY OUTPUT REGISTER 02939, AUGUST 1986 SystemCelr 2·llm SOFTWARE M • Selects One of Two 4-Bit Data Sources and Stores Data Synchronously with System Clock • Storage Register Loads New Data on Positive-Going Transition • • MACRO CELL logic symbol t ws ClK Implements Hexadecimal/BCD Shifter Use Parallel Multiplexers for MUltiple-Bit Words description The SN54ASC398 and SN74ASC398 are standard-cell software macros implementing four 2-line to 1-line multiplexers with storage, The 'ASC398 implements a function table identical with that performed by packaged 'LS398 and 'F398 multiplexers. A1 CIA A2 ClAZ B1 aB B2 aBZ C1 ac C2 01 acz aD 02 aDz tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. When the word-select (WS) input is low, word 1 (A 1. B1 ,C 1, D1) is applied to the flip-flops. A high WS input causes word 2 (A2, B2, C2, D2) to be selected. The selected word is clocked to the output terminals on the positive-going edge of the clock pulse. The 'ASC398 is implemented with standard cell functions indicated. The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA TOTAL RELATIVE NO. USED TO NA210lH CEll AREA TOTAL Cpd* (pFI IV120LH 1 2 2 1.6 262 15.7 1 12 12 6.12 1572 94.2 R2405LH 26.25 1 26.25 11.7 2931 176 T0010LH 1.5 1 1.5 10.6 16 41.75 177 4942 TOTALS 19.42 .c: en SN74ASC' NA210LH CI) Q) Q) MAXIMUM ICC (nAI SN54ASC' II .... ....COCO C 297 Label: S398LH A 1.A2,B1 ,B2,Cl ,C2,D1 ,D2,ClK,WS,OA,OAZ,OB,OBZ,OC,OCZ,OD,ODZ; :J:The equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC398 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC398 is characterized for operation from - 40°C to 85 DC .. FUNCTION TABLE INPUTS WORD SELECT L OUTPUTS§ ClK i H t X L CIA aB bl ac al cl aD dl a2 b2 c2 d2 OAO OBO oeO ODO §Corresponding QnZ output is the complement of On (shownl. PRODUCTION DATA d.c.manls contain information current as of publication date. Praducts conform to spacifications per the terms af Taxas Instruments =~~:=i~a{nr:~'li =~~~:; :.r:=::~~~s not Copyright @ 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 650012. DALLAS. TEXAS 75265 4-281 SN54ASC398, SN74ASC398 QUADRUPLE 2·INPUT MULTIPLEXERS WITH POSITIVE·EDGE· TRIGGERED COMPLEMENTARY OUTPUT REGISTER logic diagram T00101.. vec INVl GNO CLK A1 r-----i.:::J DA r----L--> QAZ PlL:.....r--C::> 08 p..:~ _ _ _ _--1.--> O8Z oc II ocz '-----[::J aD '------i.:::J aDZ D1 02 timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements are made during pre-layout simulation that produce workstation output used to identify and resolve each specific timing need. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Cj Input capacitance L CLK I WS I Cpd SN54ASC398 TEST CONDITIONS TA = 25°C VCC = 5 V. VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA = MIN to MAX VCC = 5 V, TA = 25~C All others Equivalent power dissipation capacitance t VCC = 5 V, TA = 25°C tr = tf = 3 ns, TVP 2.2 TEXAS . " INSTRUMENTS POST OFFice "BOX 655012· DALLAS. TeXAS 75265 SN74ASC398 MAX TVP 2.2 UNIT V 297 4942 nA 0.24 0.24 0.24 0.12 0.24 0'.12 pF 19.42 19.42 pF . t The equivalent power dissipation capacitance does not include interconnect c;:apacitance. 4-282 MAX SN54ASC398. SN74ASC398 QUADRUPLE 2-INPUT MULTIPLEXERS WITH POSITIVE-EDGETRIGGERED COMPLEMENTARY OUTPUT REGISTER switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd elK an tpd elK OnZ A N031Cl.x • 1""'- ~ Ol- DFC2Ol.II ~.~~ '"" • v NAO C Jaf; C o oz QZ ~ ~x V C ~ ~ CKftL ~'" R FF8 V C 10 I NA4 l~ Q 10 Y ~ QZ ' ... NAS • 'FF~ ~ RZ "" 00 B ~ ~ ~ ~ ~ 01-- C1 ~ .. =-- 10 C1AZ ACOZ • ~v ~NA2 - f-!!-.J- Ff2 CKCJ ClRZ 4-290 A NA420LX INV2 1NV7 V v NAB E A N0310l1l • ~ v ~ o C ~ ENA ~ Q1 ~ 02 D1 02 03 D3 Q4 r~ TEXAS • INSTRUMENTS POST OFFICE BOX 655012. DALLAS;TEXAS 75265 ~v NAg OE ;!( 'Oil" "7ir ~ SN54ASC590, SN74ASC590 8·BIT BINARY COUNTEItS WITH 3·STATE OUTPUT REGISTERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements are made during pre-layout simulation that produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT ICC TEST CONDITIONS Input threshold voltage Cpd SN74ASC590 TYP TYP TA - 25°C VCC - 5 V, MAX 2.2 Supply current 0.26 CCKENZ,CCLRZ GZ RCK Equivalent power dissipation capac;:,:itance t TA = 25°C VCC = 5 V, VCC = 5 V, tr = tf = 3 ns, TA = 25°C UNIT V 977 15941 TA = MIN to MAX Input capacitance MAX 2.2 VCC = 4.5 V to 5.5 V, VI = VCC or 0, CCK Ci SN54ASC590 nA 0.26 0.12 0.12 0.24 0.48 0.24 0.48 58.24 58.24 pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. FROM (INPUT) TO TEST (OUTPUT) CONDITIONS tpd CCKi RCaZ tpd CCLRZl RCOZ tpd RCKi On PARAMETERt SN54ASC590 MIN CL = 0 MAX 10.4 MIN UNIT TYP* MAX 22.8 10.4 20.4 ns 7.4 13.5 7.4 12.3 ns 5.7 11.6 5.7 10.6 ns 3.1 6 3.1 5.6 ns 1.6 4.6 0.6 1.6 4.2 ns/pF RCaZ 0.3 0.7 2.3 0.3 0.7 2 ns/pF On 0.8 1.7 4.8 0.8 1.7 4.3 ns/pF GZ! On Any On .ltpd Any 8.t en Any .... Q) Q) J: (/) SN74ASC590 TYP* 0.6 ten .ltpd • U) switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Notes 1 and 2) ....COCO C t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%l. tpd '" propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output ten :!! enable time. high-impedance state to IOWH or high-logic-level output .ltpd '" change in tpd with load capacitance .6.ten ;;;;; change in ten with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. NOTES: 1., These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Actual performance can be evaluated at post-layout simulation. 2. Enable and delta-enable times are measured using the conditions specified for the' ASC2407. . TEXAS. INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-291 SN54ASC590, SN74ASC590 8·BIT BINARY COUNTERS ""ITH 3·STATE OUTPUT REGISTERS DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block clefinitiol1 is furnished for reference. . HDL FILE II c D) S- en :r CD CD ... (I) 4-292 BLOCK S590LH; CCK @INPUT; CCKENZ @INPUT; RCK @INPUT; CCLRZ @INpUT; GZ @INPUT; OA @OUTPUT; OB @QUTPUT; OC @OUTPUT; OD @OUTPUT; OE @OUTPUT OF @PUTPUT; OG @OUTPUT; OH @OUTPUT; RCOZ @OUTrUT; STRUCTURE FF1 FF2 FF3 FF4 FF5 FF6 FF7 FF8 INV1 INV2 INV5 INV6 INV7 :DFC20LH :DFC20LH :OFC20LH :DFC20LH :pI=C20LH :DFC20LH :DFC20LH :DFC20LH :IV120LH :T0010LH :IV110LH :IV120LH :IV1 tOLH INV60,FF1 OZ,INV70,FF1 O,FFi OZ; INV60, FF20Z, NA30, FF20, FF20Z; INV60,FF30Z,NA40,FF30,FF30Z; INV60 ,FF40Z, NA50, FF40, FF40Z; INV60, FFSOZ, NA60, FF50, FF50Z; INV60, FF60Z, NA 70, FF60,FF60Z; INV60,FF70Z,NASO,FF70,FF70Z; INV60, FFSOZ, NA90, FFSO,FFSOZ; GZ,INV10; DUM,INV20; CCLRZ,INV50; INV50,INV60; NA10,INV70; TEXAS . " INSTRUMENTS POST OFFICE BOX 655012.• DALLAS, TEXAS 75265 SN54ASC590, SN74ASC590 8·BIT BINARY COUNTERS WITH 3·STATE OUTPUT REGISTERS HDL FILE (Continued) STRUCTURE (Continued) NA 1 :NA220LH NA10 :NA210LH NA2 :NA420LH NA3 :NA210LH NA4 :NA310LH NA5 :NA410LH NA6 :NA310LH NA7 :NA410LH NAS :NA510LH NA9 :NA410LH N02 :N0310LH N03 :N0310LH FFAD :R2407LH FFEH . :R2407LH END S590LH; NA 1OO,CCK,NA 10; NA 1O,CCKENZ,NA 100; FFSQ,N030,N020,FFl Q,RCOZ; NA 1O,FFl Q,NA30; NA 1O,FFl Q,FF2Q,NA40; NA 1O,FFl Q,FF2Q,FF3Q,NA50; NA 10,N020,FFl Q,NA60; NA 1O,FFl Q,N020,FF5Q,NA 70; NA 1O,FFl Q,N020,FF5Q,FF6Q,NASO; NA 1O,FFl Q,N020,N030,NA90; FF2QZ,FF3QZ,FF4QZ,N020; FF5QZ, FF6QZ, FF7QZ, N030; INV20,FF 1Q,FF2Q,FF3Q,FF4Q,RCK,INVl O,QA,QB,QC,QD; INV20, FF5Q,FF6Q,FF7Q, FFSQ,RCK, INV 10, QE, QF, QG, QH; count defintion These counters are unidirectional with respect to count operation. Inverting the output levels will produce a down-count sequence. Bidirectional counters are available in software macros or can be constructed using the' ASC2405 through' ASC2407 4-bit predesigned registers. Additional single bits can be achieved with predesigned flip-flops offered in TI's standard cell family. II ... U) G) G) designing for testability Designs employing storage or bistable elements, especially long counters (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits, with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. .l: en ...caca o power-up-clear/preset Standard cell storage elements containing the capability to be asynchronously either preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Access to the clear inputs from other system signals in conjunction with the power-up clear can be accomplished with an AND gate. TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-293 • C I» r+ I» (J) ::r (1) (1) r+ (I) 4-294 SN54ASC593X,SN74ASC593X 8-BIT BINARY COUNTERS WITH INPUT REGISTERS D2939. AUGUST 1986 SystemCell™ 2-/lm SOFTWARE MACRO CELL logic symbol t • 8-Bit Counter with Input Registers • Individual Positive-Edge-Triggered Clocks for Counter and Register • 3-State Counter Outputs Provide Parallel Bus Interface • Counter Has Direct Clear and Clock Enable • Ripple-Carry Output Simplifies Expansion G1 GZ CCLRZ CCKEN CCKENZ RCOZ description The SN54ASC593X and SN74ASC593X are standard-cell software macros implementing synchronous 8-bit binary counter elements. The 8-bit configuration provides the custom IC designer a counter to embed in ASICs in its most efficient form, and the 8-bit length simplifies construction of large counters. The' ASC593X implements a count sequence identical with that performed by packaged 'HC593 and 'LS593 counters, but the common data input/output terminals have been separated to provide individual data inputs to the register and 3-state outputs from the counter. The 'ASC593X implements an 8~bit storage register that feeds an 8-bit binary counter. CCK---i> CLOADZ RCKENZ RCK---i> A B QB C QC o <;lD E F QE QF G QG H QH I en ..... Q) Q) tThis symbol is in accordance with ANSI/IEEE Std 91·1984 and lEG Publication 617·12. The counter has parallel 3-state outputs. Separate clocks are provided for both the binary counter am;1 storage register. The' ASC593X is implemented with the standard cell functions indicated. The HDL netlist label for this software macro is- shown on the last line of the table on the following page. PRODUCTION DATA documents contain information current a. of publication date. Products conform to specifications par the tarms of Texas Instruments ::=~~~ai~:1~1i ~r:~::i:r IIID:==~ nat .c U) as ..... as C Copyright © 1986. Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-295 SN54ASC593X, SN74ASC593X 8·BIT BINARY COUNTERS WITH INPUT REGISHRS CELL NAME RELATIVE CELL AREA NO. USED TOTAL Cpd t CELL AREA (pF) MAXIMUM ICC (nA) SN54ASC' SN74ASC' AN210LH 1.5 8 12 7.2 1552 92.8 DFB20LH 7.7 8 61.6 30.08 7472 448 IV110LH 0.75 4 3 1.76 420 25.28 IV120LH IV140LH 1 1.5 2 2 1.6 262 15.7 1 1.5 1.61 190 11.4 IV212LH 1.5 8 12 4 720 86.4 NA210LH 1 19 19 9.69 2489 148.96 NA220LH 1.5 1 1.5 1 131 7.84 NA310LH 1.25 3 3.75 1.5 489 29.34 NA410LH NA420LH 1.5 3 4.5 33.6 1 2.5 1.5 0.96 561 2.6 312 18.7 NA510LH 1.75 1 1.75 0.52 213 12.8 N0310LH 1.25 2 2.5 0.64 312 18.66 11.1 TO NA210LH II TOTAL RELATIVE OR210LH 1.5 1 1.5 ~86 185 R2406LH 26.25 2 52.5 23.4 5862 352 T0010LH 1.5 1 1.5 177 10.6 - TOTALS 183.1 86.32 21347 1324 65 Label: S593XLH A,8,C,D,E,F,G,H,CCK,CCKEN,CCKENZ,RCK,RCKENZ,CCLRZ,CLOADZ,G1,GZ,OA,OB, OC,OO,OE,OF,OG,OH,RCOZ; tThe equivalent power dissipation capacitance does not include interconnect capacitance. The binary counter features a direct clear input CCLRZ and a count enable input CCKENZ. For cascading, a ripple-carry output RCaZ is provided. Expansion is easily accomplished by tying RCaZ of the lower stage to CCKENZ of the higher stage, etc. Both the counter and register clocks are positive-edge-triggered. If the user wishes to connect both clocks together, the counter state will equal the previous register contents plus one. Internal circuitry prevents clocking from the clock enable. The SN54ASC593X is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC593X is characterized for operation from - 40°C to 85 °C. 4-296 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DAL~S; tEXAS 75266 logic diagram 1V12OLx & _________________________________ ,.~V ~V1 o 01 ORZ10Lx ~r_'\~y~ ~ _____________________, ACO' QA ~ "i ~ ~z ~(J) x.., ~;;t1~ CICI CD ~C:~ ~~ ::::j ~~~ iii CCI ~!TI l; TQ010L1c " '"'" ONO vee m N Of :.= < n Q e Z en .... mZ = U'I en.j:lo :e~ n .... U'I ::Cea _w 2>< ""CII" een H D--- .... 2 m.j:lo =""'" 1:':'_en enn mea =w en>< .... U'I ~ ,:." co -..J Data Sheets II SN54ASC593X,SN74ASC593X 8-BIT BINARY COUNTERS WITH INPUT REGISTERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements, made during pre-layout simulation, produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci IIc !I» en i" ...m UI SN54ASC593X TEST CONDITIONS TYP 0,13 CCK 0.26 0,26 CLOADZ 0.49 0,11 0.49 0,24 0.24 0.12 0.12 86,32 86.32 VCC = 5 V, TA = 25°C All others Equivalent power dissipation capacitancQ t t The equivalent Vce - 5 V, TA' = 25°C tr - tf - 3 ns, UNIT V 1324 0,13 Gl MAX 21347 A,thru H GZ Cpd TYP 2.2 2.2 TA - 25°C VCC - 5 V. VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA = MIN to MAX Input capacitance SN74ASC593X MAX nA pF 0.11 pF pow~r dissipation capacitance does not include interconnect capacitance, switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Notes 1 and 2) , FROM (INPUT) TO (OUTPUT) tpd CCKt Reoz 9 23.2 tpd CCLRZ. RCOZ B tpd CCLRU an tpd CCKt an tpd CLOADZ tpd ten Atpd Any an Atpd Any RCaZ Aten Any an PARAMETER* TEST sN54ASC593X TYP§ MAX CONDITIONS MIN SN74ASC593X TYP§ MAX MIN UNIT 20.7 13,B ns 10 15 21,1 9 8 10 19 ns 9 23.1 9 20,7 ns an 9 21,6 9 ns CLOADZ RCOZ 10 24,4 10 19.4 22,1 Gl or GZt an 4 B,B 4 B.l ns 0.6 1.6 4,6 0.6 1.6 4.2 ns/pF 0.3 O,B 0.7 2.3 0.3 0.7 2 ns/pF 1.7 4.B 0.8 1.7 4.4 ns/pF CL = 0 ns ns t Propagation delay times are measured from the 44% point of VI to the 44% point of Va with tr = tf = 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output ten '" enable time, low-to-high-Ievel or high-to-Iow·level output .6.tpd ,.. change in tpd with ·Ioad, capacitance .t1ten !iiii change in ten with load capacitance § Typical values are at V CC = 5 V, T A = 25°C. NOTES: 1. These,switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Actual performance can be evaluated at post-layout simulation. 2, Enable and delta-enable times are measured using the conditions specified for the 'ASC2407. 4-298 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TE~AS 75265 S~54ASC593X, SN74ASC593X 8·BIT BINARY COUNTERS WITH INPUT REGISTERS DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. HDL FILE BLOCK S593XLH; @INPUT; B @INPUT; C @INPUT; D @INPUT; E @INPUT; F @INPUT; @INPUT; G H @INPUT; CCK @INPUT; CCKEN @INPUT; @INPUT; CCKENZ RCK @INPUT; @INPUT; RCKENZ CCLRZ @INPUT; @INPUT; CLOADZ G1 @INPUT; GZ @INPUT; QA @OUTPUT; OB @OUTPUT; QC @OUTPUT; QD @OUTPUT; QE @OUTPUT QF @OUTPUT; QG @OUTPUT; @OUTPUT; OH : RCOZ @OUTPUT; A STRUCTURE AN2 AN3 AN4 AN5 AN6 AN7 AN8 AN9 FFA FFB FFC FFD FFE :AN210LH :AN210LH :AN210LH :AN210LH :AN210LH :AN210LH :AN210LH :AN210LH :DFB20LH :DFB20LH :DFB20LH :DF!320LH :DFB20LH • ... II) CI) CI) .s::: Ul ... CIS CIS C INVeO,NA30,AN20; INV60,NA50,AN30; INV!\O,NA70,AN40; INV60,NA90,AN50; INV6Q,NA 11 O,AN60; INV60,NA 130,AN70; INV60,NA 150,AN80; INV60,NA 170,AN90; AN20,NA20,FFAQZ,INV100,FFAQ,FFAQZ; AN30,NA4Q,FFBQZ,NA 190,FFBQ,FFBQZ; AN40,NA60;FFCQZ,NA200,FFCQ,FFCQZ; AN50,NA80,FFDQZ,NA210,DUM,FFDQZ; AN60,NA 1OO,FFEQZ,NA220,FFEQ,FFEQZ; TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-299 SN54ASC593X, SN74ASC593X 8·BIT BINARY COUNTERS WITH INPUT REGISTERS HDL FILE (Continued) II C r» Dr en :::r CD CD ... til 4-300 STRUCTURE (Continued) :DFB20LH FFF FFG :DFB20LH FFH :DFB20LH INV1 :IV120LH INV10 :IV110LH INV11 :IV212LH INV12 :IV212LH INV13 :IV212LH INV14 :IV212LH INV15 :IV212LH INV16 :IV212LH INV17 :IV212LH INV18 :IV212LH INV2 :IV110LH INV5 :IV110LH INV6 :IV120LH INV7 :IV140LH INV8 :IV110LH INV9 :T0010LH NA1 :NA220LH NA10 :NA210LH NA11 :NA210LH NA12 :NA210LH NA13 :NA210LH NA14 :NA210LH NA15 :NA210LH NA16 :NA210LH NA17 :NA210LH NA18 :NA420LH NA19 .:NA210LH NA2 :NA210LH NA20 :NA310LH NA21 :NA410Ll-i NA22 :NA310LH NA23 :NA410LH NA24 :NA510LH NA25 :NA410LH NA26 :NA310LH NA27 :NA210LH NA28 :NA210LH NA3 :NA210LH NA4 :NA210LH NA5 :NA210LH NA6 :NA210LH NA7 :NA210LH NA8 :NA210LH NA9 :NA210LH N01 :OR210LH N03 :N0310LH N04 :N0310LH AN70,NA 120,FFFQZ,NA230,FFFQ,FFFQZ; AN80,NA 140,FFGQZ,NA240,DUM,FFGQZ; AN90,NA 160,FFHQZ,NA250,FFHQ,FFHQZ; GZ,INV10; NA10,INV100; FFAQZ,N010,QA; FFBQZ,N010,QB; FFCQZ,N010,QC; FFDQZ,N010,QD; FFEQZ,N010,QE; FFFQZ,N010,QF; FFGQZ,N010,QG; FFHQZ,N010,QH; CCKEN,INV20; CCLRZ,INV50; INV50,INV60; CLOADZ,INV70; NA270,RCFQZ; DUM,CLR; NA260,CCK,NA 1O; INV70,F5Q,NA 10O; INV70,F5QZ,NA 11O; INV70,F6Q,NA 120; INV70,FSQZ,NA 130; INV70,F7Q,NA 140; INV70,F7QZ,NA 150; F8Q,INV70,NA 160; INV70,F8QZ,NA 170; FFHQ,N040,N030,FFQA,RCOZ; NA 1O,FFAQ,NA 190; INV70,F1 Q,NA20; NA 1 0,FFQA,FFBQ,NA200; NA 1 0,FFAQ,FFBQ,FFCQ,NA21 0; NA 1 0,FFAQ,N030,NA220; NA 1 0,FFAQ,N030,FFEQ,NA230; NA 1 0,FFAQ,N030,FFEQ,FFFQ,NA240; NA 10,FFAQ,N030,N040,NA250; NA 10,INV20,CCKENZ,NA260; RCK,NA280,NA270; RCKENZ,NA270,NA280; INV70,F1 QZ,NA30; INV70,F2Q,NA40; INV70;F2QZ,NA50; INV70,F3Q,NA60; INV70,F3QZ,NA 70; F4Q,INV70,NA80; INV70,F4QZ,NA90; INV10,G1,N010; FFBQZ,FFCQZ,FFDQZ,N030; FFEQZ,FFFQZ,FFGQZ,N040; TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC593X, SN74ASC593X 8·BIT BINARY COUNTERS WITH INPUT REGISTERS HDl FilE (Continued) STRUCTURE (Continued) :R2406LH FF14 FF5S :R2406LH END S593XLH; CLR,A,B,C,D ,RCFQZ,F 1 Q,F1 QZ,F2Q,F2QZ,F3Q,F3QZ,F4Q,F4QZ; CLR,E,F,G,H,RCFQZ,F5Q,F5QZ,F6Q,F6QZ,F7Q,F7QZ,FSQ,FSQZ; count definition These counters are unidirectional with respect to count operation. Inverting the output levels will produce a down-count sequence. Bidirectional counters are available in software macros or can be constructed using the' ASC2405 through' ASC2407 4-bit predesigned registers. designing for testability Designs employing storage or bistable elements, especially long counters (ripple or s·ynchronous), should consider testability of the design in its final form. The need to preset or clear and read intermediate stages of these elements should be assessed throughout the development of custom logic circuits, with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up-clear/preset Standard cell storage elements containing the capability to be asynchronously either preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Access to the clear inputs from other system signals in conjunction with the power-up clear can be accomplished with an AND gate. II... U) Q) Q) .s::. Ul ...caca C TEXAS . " INSTRUMENTS POST OFFicE BOX 655012 • DALLAS, TEXAS 75265 4-301 II ...C I» I» en ::r CD CD ... til 4-302 SN54ASC595, SN74ASC595 8-BIT SHIFT REGISTERS WITH 3-STATE OUTPUT REGISTERS 02939, AUGUST 1986 SystemCell™ 2-j.lm SOFTWARE MACRO CELL • a-Bit Serial-In, Parallel-Out Shift Registers with- Output Storage • Buffered Clear and Output-Enable Inputs logic symbol t GZ RCK • Shift Register has Direct Clear • Embedded Clock Drivers Provide Clock Buffering • Dependable Texas Instruments Quality and Reliability SRCLRZ SRCK SER QA OB OC OD description OE The SN54ASC595 and SN74ASC595 are standard-cell software macros implementing synchronous 8-bit parallel-out shift registers with output storage registers, The 8-bit configuration provides the custom IC designer a multifunction register to embed in ASICs in its most efficient form, The 8-bit length simplifies construction of large registers. The' ASC595 implements a shift sequence identical with that performed by packaged 'HC595 and 'LS595 registers, OF OG 2D 3'17 OH OHP tThis symbol is in accordance with ANSI/IEEE Std91-1984 and IEC Publication 617-12. U) These macros each contain an 8-bit serial-in, parallel-out shift register that feeds an 8-bit Ootype storage register. The storage register has parallel 3-state outputs, Separate clocks are provided for both the shift register and the storage register, The shift register has a'direct-overriding clear, serial input, and serial output pins for cascading, Both the shift register and storage register clocks are positive-edge triggered. If the user wishes to connect both clocks together, the shift-register state will always be one clock pulse ahe?ld of the storage register, The' ASC595 is implemented with the standard cell functions indicated, The HOL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH TOTAL TOTAL RELATIVE Cpd* (pFI SN54ASC' CELL AREA 1 0.75 0.44 105 6.32 IV120LH 1 2 2 1.6 262 15.70 R2401LH 25.25 26.25 2 2 50.5 52.5 20.6 22 6142 6062 370 384 177 10.6 105.75 44.64 12748 787 - 1 TOTALS 8 en ....COCO C SN74ASC' 0.75 T0010LH Q) Q) .c:: MAXIMUM ICC (nAI IV110LH R2407LH II .... Label: S595LH SER,SRCK,SRCLRZ,RCK,GZ,QA,QB,QC,QD,QE,QF,QG,QH,QHP; tThe equivalent power dissipation capacitance does not include interconnect capacitance. The SN54ASC595 is characterized for operation over the full military temperature range of - 55°C to '"25°C. The SN74ASC595 is characterized for operation from -40°C to 85°C, Copyright @ 1986, Texas Instruments Incorporated PRODUCTION DATA documants contain information currant 81 of publication data. Products canfarm to :acifications par tha tarms af Texas Instruments n'::=~i~8{::I~'li =::i:r 1I~D:::~:,:~~ not TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-303 SN54ASC595, SN74ASC595 8-BIT SHIFT REGISTERS WITH 3-STATE OUTPUT REGISTERS FUNCTION TABLE SHIFT REGISTER INPUTS OUTPUT REGISTER INPUTS OUTPUTS SRCLRZ SRCK SER sQA X X X X X X X L L L H L H L sQAn sOG n sQAn sOG n H H sQAn sOG n sQG n H X X X t t t t L L sQAn sQG n sQG n H L X sQAO sOBO sQHo sOHO L H H H sOB ... sOH X X X X OUTPUTS sOHP RCK GZ QA X X X H Z Z Z L L L t L QAO L QBO L QHO L sOG n L L rQAO rOBo rQHO l t L rQAO sOA rQHo sQH t t L rOBo sOB sQB sQB sOH sQG n L sOA sQA L OB ..• OH sQH H = high level (steady state) L = low level (steady state I sa = shift register output, x = irrelevant (any input, including transitions) t = transition from low to high level. QAO. QBo. QHO = the level of QA. OB. or QH. respectively. before the indicated steady-state input conditions were established. QAn. OG n = the level of QA or OG before the most-recent t transition of the clock; indicates a one-bit shift. III09iC diagram c ~ .... CI) &lICk CD CD lEft en IlAQ.RZ .... ~'~. oz CI) en ::r C:~---------------------------------------------, 01 02 Dl D2 Q3 Q4 D3 D4 QE C»' QG OH FRi8 FFEH OHP 4-304 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • D~LLAS, TEXAS 75265 SN54ASC595, SN74ASC595 8·BIT SHIFT REGISTERS WITH 3·STATE OUTPUT REGISTERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements, made during pre-layout simulation, produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER SN54ASC595 TEST CONDITIONS VT Input threshold voltage ICC Supply current TYP TA - 25°C VCC - 4.5 V to S.S'V, VI - VCC or 0, TA = Ci Input capacitance RCK,SRCK SRCLRZ 5 V, TA = 25°C SER Cpd = 5 V, = 25°C Equivalent power VCC dissipation capacitance TA tr = tf = 3 ns, MAX 2.2 7B7 0.24 0.24 O.4B 0.4B 0.12 0.12 0.13 0.13 44.64 44.64 UNIT V 1274B MIN to MAX = VCC TYP 2.2 VCC - 5 V, GZ SN74ASC595 MAX nA pF pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Notes 1 and 2) PARAMETERt tpd tpd FROM TO TEST (iNPUTI (OUTPUTI CONDITIONS SRCKI QHP SN74ASC595 SN54ASC595 MIN TYP* MAX 5.5 11.3 MIN UNIT TYP* MAX 5.5 10.4 ns 5.5 11.6 5.5 10.6 ns 3.6 7 3.6 6.6 ns ten GZ. Qn 3.1 5.6 3.1 4.B ns atpd ..6.t en Any On 0.6 1.7 4.6 0.6 1.7 4.2 ns/pF GZl On O.B 1.7 4.B O.B 1.7 4.3 ns/pF =0 tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpd '" propagation delay time, low·to·high·level or high-to-Iow-Ievel output tpHL " propagation delay time, high-to-Iow level output = tf CD CD .s::. Ul CO Qn QHP CL CI) ; RCKI SRCLRZ tpHL II... C = 3 ns (10% and 90%1- ten ;;;;; enable time, high-impedance state to high- or low-level output 4tpd ;:; change in tpd with load capacitance .6.ten :; change in ten with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. NOTES: 1. These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Actual performance can be evaluated at post-layout simulation. 2. Enable and delta-enable times are measured using the conditions specified for the' ASC2407. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed, The following printout of the HDL block definition is furnished for reference, TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 76265 4-305 SN54ASC595, SN74ASC595 8·BIT SHIFT REGISTERS WITH 3·STATE OUTPUT REGISTERS HDL FILE BLOCK S595LH; SER @INPUT; SRCK @INPUT; SRCLRZ @INPUT; RCK @INPUT; GZ @INPUT; QA @OUTPUT; QB @OUTPUT; QC @OUTPUT; QD @OUTPUT; QE @OUTPUT Ci.F @OUTPUT; QG @OUTPUT; QH @OUTPUT; QHP @OUTPUT; STRUCTURE INV1 INV2 INV3 INV4 FF14 FF58 FFAD 'FFEH END S595LH; II c ... I» I» rJ) ::r (1) (1) ...en :T0010LH :IV120LH :IV110LH :IV120LH :R2407LH :R2407LH :R2401LH :R2401LH DUM,INV10; GZ,INV20; SRCLRZ,INV30; INV30,INV40; INV10,FFAQ,FFBQ,FFCQ,FFDQ,RCK,INV20,QA,QB,QC,QD; INV10,FFEQ,FFFQ,FFGQ,QHP,RCK,INV20,QE,QF,QG,QH; INV40,SER,SRCK,FFAQ,FFBQ,FFCQ,FFDQ; INV40,FFDQ,SRCK,FFEQ,FFFQ,FFGQ,QHP; shift defintion The:;;e registers are unidirectional with respect to shift operations and the relationship for shifting left or right is defined by the IC designer. Bidirectional registers are available in software macros or can be . constructed using the' ASC2405 through' ASC2407 4-bit predesigned registers. designing for testability Designs employing storage or bistable elements, especially long registers (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear and to read intermediate stages of these elements should be assessed throughout the development of custom logic circuits, with these considerations extended to the end-equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expen:;;e of IC testing, system testing, and system maintenance to be reduced 'significantly. power-up-clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from other system signal in conjunction with the power-up clear can be accomplished with an AND gate. 4-306 TEXAS . " INSTRUMENTS POST OFFICE BOX 225012 • DALLAS, TE~AS 75265 SN54ASC598X, SN74ASC598X 8-BIT SHIFT REGISTERS WITH INPUT REGISTERS 02939, AUGUST 1986 SystemCell™ 2-llm SOFTWARE MACRO CELL • 8-Bit Serial-In, Parallel-Out Shift Registers with Inpllt Storage • Buffered Clear and Output-Enable Inputs logic symbol t SRG8 GZ • Shift Register Has Direct Clear • Emblt SLOZ Dependable Texas Instruments Quality and Reliability RCK--l>c:21 os SERO description 1,50 SERl The SN54ASC598X and SN74ASC598X are standard-cell software macros implementing 8-bit parallel-out shift registers with input storage registers, The 8-bit configuration provides the custom IC designer a multifunction register to embed in ASICs in its most efficient form. The 8-bit length simplifies oonstruction of large registers. The 'ASC598X implements a count sequence identical with that performed by packaged 'HC598 and 'LS598 registers. OA 20 3D 08 20 3D QS DC DO QC DE QE QO OF QF OG QG 20 OH QH 3D QHP tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and These macros each contain an 8-bit serial-in, IEC Publication 617-12. parallel-out shift register fed by an 8-bit D-type input register. The shift register has parallel 3-state outputs, Separate clocks are provided for the shift register and the input register, The' ASC598X is implemented with the standard cell functions indicated, The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TOTAL TOTAL RELATIVE Cpd* (pFI MAXIMUM ICC (nAI SN54ASC' SN74ASC' AN210LH 1.5 10 15 9 1940 116.0 DFS20LH 7.7 8 61.6 30.08 7472 448 IVll0LH 0.75 3 2.25 1.32 315 18.96 IV120LH 1 1.5 1.5 1 1.5 41 - 4 4 3.2 524 31.4 1 1.5 1.61 190 11.4 8 18 12 4 1440 86.4 18 9.18 2358 141.12 1 1.5 0.86 185 11.1 2 50.5 23.38 5862 352 177 10.6 20463 1227 TO NA210LH IV140LH IV21;1LH NA210LH OR210LH R2406LH T0010LH CELL AREA - 1 TOTALS 56 166.35 82.63 Label: S598XLH DA,D8,DC,DD,DE,DF,DG,DH,RCK,SCK,SCKENZ,SLOZ,SCLRZ,SERO,SER1,DS,GZ,OA, OB,OC,OD,OE,OF,OG,OH,OHP; :l:The equivalent power dir;;sipation capacitance does not include interconnect capacitance. PRODUCTIOII DATA d..,monts coatoi. iniormalipn cumnt •• of pubUmi •• date. Products conf.rm to spacifications par the tanns at T8QI Instruments :'!:~~~·{::I~'l.i ~::I:~i:r l!1.=~:':~~ not Copyright © 1986. Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-307 SN54ASC598X, SN74ASC598X 8-BIT SHIFT REGISTERS WITH INPUT REGISTERS The shift register has a direct overriding clear, multiplexed dual serial inputs, and dual serial outputs to simplify cascading. Both the shift register and input register clocks are positive-edge triggered. If the user wishes to connect both clocks together, the shift-register output will be half or double the previous value of the storage register. The shift register has a clock emible associated with internal circuitry that prevents it from triggering the clock. ' The SN54ASC598X is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC598X is characterized for operation from -40°C to 85°C. FUNCTION TABLE ,INPUT REGISTER RCK INPUTS DA ... DH X X t L t X X X X X X X a X a X X X X X X X h X RAO h a X X X X X CLOCK SCLRZ GZ X X H x i. L X X h H L H RHO h H L L H L L X X X X X H L H L H RA. .. RH X X a X X X X X SHIFT REGISTER INPUTS OUTPUTS SCKENZ SCK SLDZ X X X X X X t t L L L L H L H L OUTPUTS SERIAL LOAD OS SERO SER1 L X X X X X X X X H L H ! H L H t H L L ! H H L t H H X L X X X X X QA QB ... QH QHP X Z Z Z QH X X X X X X L L L L ~AO OHO QHo RA OBO RB H QAn OG n OG n H OAn OG n QG n L QAn QG n QG n H H QAn OG n OG n L L QAn OG n OG n X ~AO OBo OHO OHO RH RH C I» r+ I» absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. en :r CD CD timing requirements r+ (II Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. , 4-308 TEXAS . " INSTRUMENTS 1:'05T OFFICE BOX 655012 • DALLAS, TEXAS 75266 SN54ASC598X, SN74ASC598X 8·BIT SHIFT REGISTERS WITH INPUT REGISTERS logic diagram GZ ~ os ...., 8CLRZ NV4 1V1401..1C A ILDZ INV6 """ ClRZ DA DB DC INVO D1 D2 D3 • DO "'4 DO ... U) II) II) .c en ... CU CU C eLK CLRZ DE Of DG D1 D2 D3 D4 ,... DH flCl M ... O~ J.P......¥iU I ... ';'::: .. M~ , ' I V NIIZ v_ ~ A v YAY IN\II ~ , ~~ ' ow' ~~' r~A NAIl V~. ~ INW ~ E V 'Mill. ' . 1NV10~ V~.'" .. HIli ~ I ~ gQ: N. I .to JIM NAt' V~ ... y~'CII..x A ~~ .a::::... ~ ~"'- J .. i= -!!..~ r=- V~I ' "."'1 Y,~A Q1~~ .. ~ ~ , ~. W"'" m OM ~~ ::: ""'-Wf1..- • ~ :§.' " A NAZlGl. Y NAil ~" ....... .~ ~. ,,~V ... NA21 Y ~ ~ ~~ en ::r ~t:iM .. ., ~V ~ 3·- -'5'''''''' ~~' V~A -~ ...... ~.' y~'" -' ......'5- ~..,..., ' . yNA21Cl..x" y Q1~-= _ .... ....... !W1 twill ~ 02 J . -"'-~ ~ c..!!L MA21CLx,.,;....!'!:!\A -~ l .~,.~ . ' , ~ vNA»'~. ~ ... HA2lC1b t....s...~m ~ ~~ '------* "'""Qa , ~ ~ 'A NA21Ola V Il ,-~ --TlNMO y ,.,.. , ~.- ~y ... ~'-e:=5' ~YWL' --=:r y , ....... ~ _'I • ~E- ..- ~ NAZ'lIII.Jr A .7'1 . . E 'NVI7 --~~~' 4·318 . . ~ ~'.."" c CD CD . tM15 y ...~V ~ ...en ....... , , ~~ ~' .- IT V - TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DAllAS, TEXAS 75265 ~ A V ~EINV18 " . SN54ASC651, SN54ASC652, SN74ASC651, SN74ASC652 8·BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS logic diagram •ASC652 a ....en Q) Q) .J: en ....C1:IC1:I C TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4·319 SN54ASC651, SN54ASC652, SN74ASC651, SN74ASC652 8·BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the dlocked cells embedded in the software macros. Evaluations of timing requirements made during pre-layout simulation produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER TEST CONDITIONS SN54ASC651 SN74ASC651 SN54ASC652 SN74ASC652 MAX TYP Input threshold voltage VT S651LH Supply current ICC S652LH VCC - 5 V, 2.2 TA - 25°C II c C\) ... TA = 25°C VCC = 5 V, TA GBAZ, SAB, Equivalent power Cpd dissipation capacitance t S651LH VCC = 5 V, S652LH TA = 25°C tr = 3 ns, 0.48 0,48 0.12 0.12 0.49 0.58 0.58 91.06 91.06 104.1 104.1 25°C = tf = 1501 0.58 0.49 SBA Output capacitance Co C\) CJ) VCC = 5 V, V 1332 25002 CAB,CBA Input capacitance GAB 2.2 0.58 UNIT MAX 22186 VCC - 4.5 V to 5.5 V. VI - VCC or 0, TA = MIN to MAX An or Bn Ci TYP nA pF pF pF t The e.quivarent power digs.ipatian capacitance does not include interconnect capacitance. ::T !CD o switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Notes 1 and 2) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd CAB,CBA tpd A,B PARAMETERt SN54ASC651 SN74ASC651 SN54ASC652 SN74ASC652 TYP* MAX A,B 10,4 !l,A 5,4 6.6 12.3 4.7 8.7 CL MIN =0 UNIT TYP* MAX 20.9 10.4 19.1 10.1 5.4 9.4 tpd SAB,SBA A,B ten GAB,GBAZ A,B ~tpd Any Any 0.3 0.9 2.3 ~ten GAB,GBAZ Any 0,4 0.9 2,3 MIN 6.6 ' 11.8 4.7 8.3 0,4 0.9 2.1 0.5 0.9 2.1 ns ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high-Ievel or high-to-Iow-Ievel output ten "'enable time, high-impedance state to low- or high'iogic:level output ~tpd 8 change in tpd with load capacitance .6.ten 5 change in ten with load capacitance ~Typical values are at VCC = 5 V, TA = 25°C. NOTES: 1. These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation"uses actual interconnect capacitance values. 2. Enable and delta-enable times are measured using the conditions specified for the SN54ASC2311 and SN74ASC2311 (lV222LH). 4-320 TEXAS • INSTRUMENTS POST OFFICE soX 655012 • DALLAS! TEXAS 75265 SN54ASC651. SN54ASC652. SN74ASC651. SN74ASC652 8·BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. HOL FILE BLOCK S651 LH; GBAZ @INPUT; @INPUT; GAB SBA @INPUT; @INPUT; SAB @INPUT; CBA @INPUT; CAB A1 @INOUT; @INOUT; A2 A3 @INOUT; @INOUT A4 A5 @INOUT; @INOUT; A6 @INOUT; A7 @INOUT; A8 @INOUT; B1 @INOUT; B2 @INOUT; B3 @INOUT; B4 @INOUT; B5 B6 @INOUT; @INOUT; B7 @INOUT; B8 STRUCTURE INV1 INV10 INV11 INV2 INV20 INV21 INV22 INV23 INV24 INV25 INV26 INV27 INV3 INV36 INV37 INV38 INV39 :IV140LH :IV222LH :IV222LH :IV140LH :IV222LH :IV222LH :IV222LH :IV222LH :IV222LH :IV222LH :IV222LH :IV222LH :IV140LH :IV222LH :IV222LH :IV222LH :IV222LH a... en CD CD .s: en ...caca Q SBA,SBAZ; SNA9,GBA,A3; SNA 12,GBA,A4; SBAZ,SBA1; SNA 15,GAB1,B1; SNA18,GAB1,B2; SNA21 ,GAB1 ,B3; SNA24,GAB1,B4; SNA27,GBA,A5; SNA30,GBA,A6; SNA33,GBA,A 7; SNA36,GBA,A8; SAB,SABZ; SNA39,GAB1,B5; SNA42,GAB1,B6; SNA45,GAB1,B7; SNA48,GAB1,B8; TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-321 SN54ASC651, SN54ASC6~2, SN74ASC651, SN74ASC652 B·BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS HDL FILE (Continued) STRUCTURE (Continued) INV4 :IV140LH :IV110LH INV5 INV6 :IV140LH INV7 :IV140LH INV8 :IV222LH INV9 :IV222LH NAl :NA210LH :NA210LH NA10 NAll :NA210LH :NA210LH NA12 NA13 :NA210LH NA14 :NA210LH :NA210LH NA15 :NA210LH NA16 NA17 :NA210LH NA18 :NA210LH NA19 :NA210LH :NA210LH NA2 NA20 :NA210LH NA21 :NA210LH :NA210LH NA22 NA23 :NA210LH NA24 :NA210LH :NA210LH NA25 :NA210LH NA26 NA27 :NA210LH NA28 :NA210LH :NA210LH NA29 :NA210LH NA3 :NA210LH NA30 NA31 :NA210LH NA32 :NA210LH :NA210LH NA33 NA34 :NA210LH NA35 :NA210LH NA36 :NA210LH NA!37 :NA210LH NA38 :NA210LH NA39 :NA210LH NA4 :NA210LH 4-322 SABZ,SAB1; GAB,GABZ; GABZ,GAB1; GBAZ,GBA; SNA3,GBA,A 1; SNA6,GBA,A2; SBA 1 ,FFl ASNA 1 ; SBA 1,FF 1D,SNA 10; SBAZ,B4,SNA 11; SNA 1O,SNA 11 ,SNA 12; SABl ,FF2A,SNA 13; SABZ,A 1 ,SNA 14; SNA 13,SNA 14,SNA 15; SABl ,FF2B,SNA 16; SABZ,A2,SNA 17; SNA 16,SNA 17 ,SNA 18; SABl ,FF2C,SNA 19; SBAZ,Bl,SNA2; SABZ,A3,SNA20; SNA 19,5NA20,SNA21; SAB1,FF2D,SNA22; SABZ,A4,SNA23; SNA22,SNA23,SNA24; SBA 1,FF3A,SNA25; SBAZ,B5,SNA26; SNA25,SNA26,SNA27; SBA 1 ,FF3B,SNA28; SBAZ,B6,SNA29; SNA 1 ,SNA2,SNA3; SNA28.SNA29,SNA30; SBA 1,FF3C,SNA31; SBAZ,B7,SNA32; SNA31,SNA32,SNA33; SBA 1 ,FF3D,SNA34; SBAZ,B8,SNA35; SNA34,SNA35,SNA36; SAB1,FF4A,SNA37; SABZ,A5,SNA38; SNA37,SNA38,SNA39; SBA 1 ,FFl B,SNA4; TEXAS . " INSTRUMENTS POST OFFICE sox 655012 • DALLAs. TexAs 75265 SN54ASC651, SN54ASC652, SN74ASC651, SN74ASC652 8·BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS HDL FILE (Continued) STRUCTURE (Continued) NA40 :NA210LH NA41 :NA210LH NA42 :NA210LH NA43 :NA210LH NA44 :NA210LH NA45 :NA210LH NA46 :NA210LH NA47 :NA210LH NA48 :NA210LH NA5 :NA210LH NA6 :NA210LH NA7 :NA210LH NA8 :NA210LH NA9 :NA210LH T01 :T0010LH FF1 :R2405LH FF2 :R2405LH FF3 :R2405LH FF4 :R2405LH END S651LH SAB1,FF4B,SNA40; SABZ.A6,SNA41 ; SNA40,SNA41,SNA42; SAB1,FF4C,SNA43; SABZ,A7,SNA44; SNA43,SNA44,SNA45; SAB1,FF4D,SNA46; SABZ,A8,SNA47; SNA46,SNA47,SNA48; SBAZ,B2,SNA5; SNA4,SNA5,SNA6; SBA 1;FF1 C,SNA7; SBAZ,B3,SNA8; SNA7,SNA8,SNA9; DUM,ST01: ST01 ,B1 ,B2,B3,B4,CBA,FF1A,FF1 B,FF1 C,FF1 D; ST01 ,A 1 ,A2.A3,A4,CAB,FF2A,FF2B,FF2C,FF2D; STO 1,B5,B6,B7 ,B8,CBA,FF3A,FF3B,FF3C,FF3D; STO 1,A5,A6,A 7 ,A8,CAB,FF4A,FF4B,FF4C,FF4D; II ... II) BLOCK S652LH; GBAZ @INPUT; GAB @INPUT; SBA @INPUT; SAB @INPUT; CBA @INPUT; CAB @INPUT; A1 @INOUT; A2 @INOUT; A3 @INOUT; A4 @INOUT A5 @INOUT; A6 @INOUT; A7 @INOUT; A8 @INOUT; B1 @INOUT; B2 @INOUT; B3 @INOUT;B4 @INOUT; B5 @INOUT; B6 @INOUT; B7 @INOUT; B8 @INOUT; CD CD .c en ...caca C ~ TEXAS -INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-323 SN54ASC651, SN54ASC652, SN74ASC651, SN74ASC652 8·BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS HDL FILE (Continued) II ...0 Q) Q) en ::r CD CD ... CIl 4-324 STRUCTURE (Continued) INVl :IV140LH INV10 :IV222LH INVll :IV222LH INV12 :IVll0LH INV13 :IV110LH INV14 :IVllOLH INV15 :IVllOLH INV16 :IV110LH INV17 :IV110LH INV18 :IVllOLH INV19 :IVllOLH INV2 :IV140LH INV20 :IV222LH INV21 :IV222LH INV22 :IV222LH INV23 :IV222LH INV24 :IV222LH INV25 :IV222LH INV26 :IV222LH INV27 :IV222LH INV28 :IVllOLH INV29 :IV110LH INV3 :IV140LH INV30 :IV110LH INV31 :IV110LH INV32 :IV110LH INV33 :IV110LH INV34 :IV110LH INV35 :IV110LH INV36 :IV222LH INV37 :IV222LH INV38 :IV222LH INV39 :IV222LH INV4 :IV140LH INV5 :IVllOLH INV6 :IV140LH INV7 :IV140LH INV8 :IV222LH INV9 :IV222LH NAl :NA210LH NA10 :NA210LH NAll :NA210LH NA12 :NA210LH NA13 :NA210LH NA14 :NA210LH NA15 :NA210LH NA16 :NA210LH NA17 :NA210LH NA18 :NA210LH NA19 :NA210LH SBA,SBAl; SNA9,GBA,A3; SNA 12,GBA,A4; B1,SIV12; B2,SIV13; B3,SIV14; B4,SIV15; Al,SIV16; A2,SIV17; A3,SIV18; A4,SIV19; SBAl,SBA1; SNA 15,GABl ,Bl; SNA 18,GABl ,B2; SNA21 ,GABl ,B3; SNA24,GAB1,B4; SNA27,.GBA,A5; SNA30,GBA,A6; SNA33,GBA,A7; SNA36,GBA,A8; B5,SIV28; B6,SIV29; SAB,SABl; B7,SIV30; B8,SIV31; A5,SIV32; A6,SIV33; A7,SIV34; A8,SIV35; SNA39,GAB1,B5; SNA42,GAB1,B6; SNA45,GAB1,B7; SNA48,GAB1,88; SABl,SABl ; GAB,GABl; GABl,GAB1; GBAl,GBA; SNA3,GBA,A 1; SNA6,GBA,A2; SBA 1 ,FFl Al,SNA 1; SBA 1,FFl Dl,SNA 10; SBAl,SIV15,SNA 11; SNA 1O,SNA 11 ,SNA 12; SABl ,FF2Al,SNA 13; SABl,SIV16,SNA 14; SNA 13,SNA 14,SNA 15; SABl ,FF2Bl,SNA 16; SABl,SIV17,SNA17; SNA 16,SNA 17 ,SNA 18; SABl ,FF2CZ,SNA 19; TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC651, SN54ASC652, SN74ASC651, SN74ASC652 8·BIT BIDIRECTIONAL UNIVERSAL TRANSCEIVER REGISTERS HDL FILE (Continued) STRUCTURE (Continued) NA2 :NA210LH NA20 :NA210LH NA21 :NA210LH NA22 :NA210LH NA23 :NA210LH NA24 :NA210LH NA25 :NA210LH NA2B :NA210LH NA27 :NA210LH NA28 :NA210LH NA29 :NA210LH NA3 :NA210LH NA30 :NA210LH NA3l :NA2l0LH NA32 :NA210LH NA33 :NA210LH NA34 :NA2l0LH NA35 :NA2l0LH NA3B :NA2l0LH NA37 :NA2l0LH NA38 :NA210LH NA39 :NA210LH NA4 :NA2l0LH NA40 :NA210LH NA4l :NA210LH NA42 :NA210LH NA43 :NA2l0LH NA44 :NA2l0LH NA45 :NA210LH NA4B :NA210LH NA47 :NA210LH NA48 :NA210LH NA5 :NA2l0LH NAB :NA2l0LH NA7 :NA2l0LH NA8 :NA2l0LH NA9 :NA2l0LH TOl :TOO10LH FFl :R240BLH FF2 :R240BLH FF3 :R240BLH FF4 :R240BLH SBAZ,SIV12,SNA2; SABZ,SIV18,SNA20; SNA 19,5NA20,SNA21; SAB1,FF2DZ,SNA22; SABZ,SIV19,SNA23; SNA22,SNA23,SNA24; SBA l,FF3AZ,SNA25; SBAZ,SIV28,SNA2B; SNA25,SNA2B,SNA27; SBA l,FF3BZ,SNA28; SBAZ,SIV29,SNA29; SNA l,SNA2,SNA3; SNA28,SNA29,SNA30; SBA l,FF3CZ,SNA3l; SBAZ,SIV30,SNA32; SNA31,SNA32,SNA33; SBA 1 ,FF3DZ,SNA34; SBAZ,SIV31,SNA35; SNA34,SNA35,SNA3B; SAB1,FF4AZ,SNA37; SABZ,SIV32,SNA38; SNA37,SNA38,SNA39; SBA l,FFl BZ,SNA4; SAB1,FF4BZ,SNA40; SABZ,SIV33,SNA4l ; SNA40,SNA41,SNA42; SAB1,FF4CZ,SNA43; SABZ,SIV34,SNA44; SNA43,SNA44,SNA45; SAB1,FF4DZ,SNA4B; SABZ,SIV35,SNA47 ; SNA4B,SNA4 7 ,SNA48; SBAZ,SIV13,SNA5; SNA4,SNA5,SNAB; SBA l,FFl CZ,SNA7; SBAZ,SIV14,SNA8; SNA7,SNA8,SNA9; DUM,ST01: ST01,B1,B2,B3,B4,CBA,DUM,FF1AZ,DUM,FF1 BZ,DUM,FFl CZ, DUM,FF1DZ; ST01,A l.A2,A3,A4,CAB,DUM,FF2AZ,DUM,FF2BZ,DUM,FF2CZ, DUM,FF2DZ; STO 1,B5,BB,B7 ,B8,CBA,DUM,FF3AZ, DUM, FF3BZ,DUM,FF3CZ, DUM,FF3DZ; STO 1,A5,AB,A 7 ,A8 ,CAB, DU M, FF4AZ, DU M, FF4BZ, DU M, FF4CZ, DUM,FF4DZ; • END SB52LH TEXAS , . , INSTRUMENTS POST OFFICE dox 655012 • DALLAS. TeXAS 752:66 4·325 II c .... C\) C\) (J) ::r- CD CD .... tn ·4-326 SN54ASC669, SN74ASC669 SYNCHRONOUS 4-BIT UP/DOWN BINARY COUNTERS WITH LOOK-AHEAD 02939, AUGUST 1986 SystemCell™ 2-llm SOFTWARE MACRO CELL • Fully Synchronous Operation for Counting and Programming • Internal look-Ahead for Fast Counting • Carry Output for n-Bit Cascading • Fully Independent Clock Circuit logic symbol t CTRDIV16 • LOADZ U_DZ RCOZ ENTZ Buffered Outputs ENPZ 2,3,5,6 + IC7 CLK description The SN54ASC669 and SN74ASC669 are standard-cell software macros implementing synchronous 4-bit up-down binary counter elements. The four-bit configuration provides the custom IC desi9ner a fully designed bidirectional counter to embed in ASICs in its most efficient form, and the 4-bit length simplifies construction of large counters. The' ASC669 implements a count sequence identical with that performed by packaged 'lS669 counters. 2,4,5,6A [1] QA B [2] OB C [4] oc 0 [8) 00 tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. These synchronous presettable counters feature an internal carry look-ahead for cascading in high-speed counting applications. Synchronous operation is provided by having all flip-flops clocked simultaneously so that the outputs change coincidentally with each other when so instructed by the count-enable inputs and internal gating. This mode of operation helps eliminate the output counting spikes that are normally associated with asynchronous (ripple-clock) counters. A buffered clock input triggers the four master-slave flip-flops on the rising (positive-going) edge of the clock waveform. The 'ASC669 is implemented with the standard cell functions indicated. The HDl netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA NO. USED TO NA210LH AN320LH TOTAL TOTAL RELATIVE Cpd t SN54ASC' CELL AREA (pF) (nA) (nA) 1.06 221 13.3 2 MAXIMUM ICC SN74ASC' 2 1 A0221LH 2.7 4 10.8 2.36 896 53.6 IV110LH 0.75 7 5.25 3.08 735 44.24 IV120LH 1 3 3 2.4 393 23.55 NA210LH 1 6 6 3.06 786 47.04 97.8 NA310LH 1.25 12.5 5 1630 NA410LH 1.5 2 3 1 374 11.4 NA510LH 1.75 2 3.5 1.04 426 25.6 R2406LH 26.25 1 26.25 11.7 2931 176 T0010LH 1.5 1 1.5 177 10.6 37 73.75 8569 504 TOTALS 10 II 30.7 Label: S669LH D,C,B,A,CLK,U_DZ,ENPZ,ENTZ,LOADZ,QD,QC,Q8,QA,RCOZ; tThe equivalent power dissipation capacitance does not include interconnect capacitance. PRODUCTION DATA documents contain information currant 8S of publication date. Products conform to specifications per the terms of Texas Instruments :::~::i~8{::,~I~ ~=:~i:; li~a:::~~~~ not Copyright @ 1986, Texas Instruments Incorporated TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-327 SN54ASC669. SN74ASC669 SYNCHRONOUS 4-BIT UP/DOWN BINARY COUNTERS WITH LOOK-AHEAD description (continued) These counters are fully programmable; that is, they may be preset to any number between 0 and 15. The load input circuitry allows loading with the carry-enable output of cascaded counters. As loading is synchronous, setting up a low level at the load input disables the counter and causes the output to agree with the data inputs after the next clock pulse. The carry look-ahead circuitry provides for cascading counters in n-bit synchronous applications without additional gating. Instrumental in achieving this are two count-enable inputs and a ripple carry output. Both count-enable inputs (ENPZ and ENTZ) must be low to count. ENPZ enables the local 4-bits and the ENTZ is fed forward to globally extend the enable/disable of previous/next 4-bit cascaded counters. The ripplecarry out RCOZ, when locally and globally enabled, will output a low-level pulse that is used to enable successive stages. Transitions at the ENPZ and ENTZ inputs are allowed regardless of the level of the clock input. These counters feature a fully independent clock circuit. Changes at control inputs (ENPZ, ENTZ, LOADZ, U _ DZ) that will modify the operating mode have no effect until clocking occurs. The function of the counter (whether enable, disable, load, or count) will be dictated solely by the conditions meeting"the setup and hold times. II The SN54ASC669 is characterized for operation over the full military temperature range of 125°C. The SN74ASC669 is characterized for operation from - 40°C to 85 °C. typical load, count, and inhibit sequences LOADZ~------------------------------------- c Q) ... A~~= Q) DATA (/) ::r INPUTS IT! en < 2 OND 6 ~ e NA3 A ~x A NA310lx : L!J r-cl o TOO10lx yee ~ ~ ~I INY13 NA2 -=-1~B ",V B INA8 e NA7 L ~ B C AYe '8(JJ ~ ~(JJ pV UAI:. HA6 +--==-_-2B-I 1Y110lx 'll_ f:iz ~ c:~ B ~A0221LX "-' -l ~;;Or;;1 IBl Y 3 A NA310lx B y e HA4 " V A '':=-x I 1NV7 I ~A0221LX INYB o ~ ~'OlXV A IVl10lx J-...V ; ~eNAI I ~ 1NV6 c. iii" IQ P~---' :::c- ,...en QZ Q~ =-:~ .::ra -1>0 W '" (l) Data Sheets II ::raen :en men ::raen CI ea SN54ASC669. SN74ASC669 SYNCHRONOUS 4·BIT UP/DOWN BINARY COUNTERS WITH LOOK·AHEAD absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements Specific timing data regarding pulse duration, setup time, and hold time models are incorporated in most engineering workstation libraries. These models are for the clocked ceils embedded in the software macros. Evaluations of the timing requirements, ate made durihg pre-layout s.itnulation, produce workstation output used to identify and resolve each specific timing need. electrical characteristics PARAMETER VCC = 5 V, ICC Supply current VCC - 4.5 V to 5.5 V. VI - Vce or O. TA = MIN to MAX Input capacitance I CLK,LOADZ, and U ~ DZ I All TA = 25°C others Equivalent power Cpd dissipation capacitance t VCC = 5 V. TYP 2.2 MAX tr = tf = 3 ns. TA = 25°C 504 0.24 0.24 0.12 0.12 30.7 30.7 UNIT v 8569 TA = 25°C VCC = 5 V, SN74ASC669 MAX TYP 2.2 VT Input threshold voltage Ci II SN54ASC669 TEST CONDITIONS nA pF pF t The equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 11 PARAMETERt tpd FROM (INPUT) TO (OUTPUT) eLK ReOZ tpd CLK On tpd ENTZ U_DZ RCOZ Any <;In RCOZ tpd Atpd Atpd Any TEST CONDITIONS CL SN54ASC669 MIN SN74ASC669 TYP* MAX TYP* MAX 10 24.2 10 22 5 10.4 5 9.4 3 5.9 3 =0 MIN 6 14.2 6 5.3 13 0.2 0.9 2.4 0.3 0.9 2.1 0.5 1.8 5.8 0.5 1.8 5 RCOZ tprapagatian delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% UNIT ns ns ns/pF and 90%). tpd '" propagation delay time, low-to-high or high-to-low output Atpd '" change in tpd with load capacitance *Typical values are at Vec = 5 V, TA = 25°C. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. 4-330 TEXAS . " INSTRUMENTS POST OFFice BOX 65501~· • DALLAs. TEXAS 75266 SN54ASC669, SN74ASC669 SYNCHRONOUS 4·BIT UP/DOWN BINARY COUNTERS WITH LOOK·AHEAD DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. HOL FILE BLOCK S669LH; D @INPUT; C @INPUT; B @INPUT; A @INPUT; eLK @INPUT; U_DZ @INPUT; ENPZ @INPUT; ENTZ @INPUT; LOADZ @INPUT; QD @OUTPUT; QC @OUTPUT; QB @OUTPUT; QA @OUTPUT; RCOZ @OUTPUT; STRUCTURE AN1 A01Z A02 AQ3 A04 INV1 INV10 INV11 INV12 INV13 INV2 INV5 INV6 INV7 INV8 INV9 NA1 NA10 NA11 NA12 NA13 NA14 NA15 NA16 NA17 II ... CI) CI) CI) .c :AN320LH :A0221LH :A0221LH :A0221LH :A0221LH :IV110LH :IN110LH :IV110LH :INV120LH :T0010LH :IV110LH :IV120LH :IV120LH :IV110LH :IV110LH :IV110LH :NA310LH :NA310LH :NA310LH :NA410LH :NA210LH :NA310LH :NA210LH :NA410LH :NA310L.H LOADZ,INV20,INV1 0,AN1 0; QA,INV120,INV80,FFAQZ,A010; QB,INV120,INV90,FFBQZ,A020; QC,INV20 ,INV1 00,FFCQZ,A030; QD,INV120,INV110,FFDQZ,A040; ENTZ,INV10; INV120,INV100; INV120,INV110; U_DZ,INV120; DUM,CLRZ; ENPZ,INV20; LOADZ,INV50; INV5Q,INV60; AN10,INV70; INV120,INV80; INV120,INV90; QA,INV70,INV60,NA 10; QC,NA 11 0,INV60,NA 100; AN1 0,A020,A01 O,NA 110; A01 0,A020,AN1 O,FFCQZ,NA 120; INV50,C,NA 130; NA100,NA130,NA120,NA140; INV50,D,NA 150; ANl 0,A01 0,A020,A030,NA 160; QD,NA 160,INV60,NA 170; TEXAS. INSTRUMENTS POST OFfICE BOX 655012· DALLAS, TEXAS 75765 en ...coco C 4-331 • SN54ASC669, SN74ASC669 SYNCHRONOUS 4·BIT UP/DOWN BINARY COUNTERS WITH LOOK·AHEAD HDL FILE (Continued) STRUCTURE (Continued) NA19 :NA310LH NA2 :NA210LH NA20 :NA510LH NA21 :NA510LH NA3 :NA310LH NA4 :NA310LH NA5 :NA210LH NA6 :NA310LH NA7 :NA310LH :NA210LH NA8 :NA210LH NA9 FF14 :R2406ZLH NA 170,NA 150,NA200,NA 190; AN10,FFAQZ,NA20; ANl O,AOl 0,A020,A030,FFDQZ,NA200; AOl 0,A020,A030A040,INVl O,RCOZ; QB,NA50,INV60,NA30; NA 1 0,NA80,NA20,NA40; ANl OAOl 0,NA50; ANl O,AOl 0,FFBQZ,NA60; NA30,NA90,NA60,NA70; INV50A,NA80; INV50,B,NA90; CLRZ,NA40,NA70,NA 140,NA 190,CLK,QA,FFAQZ,QB,FFBQZ, QC,FFCQZ,QD,FFDQZ; END S669LH count definition These counters are bidirectional with respect to count operations and the relationship for counting up or down is defined by the U_DZ input. Unidirectional counters are available in software macros or can be contructed using the' ASC2405 through' ASC2407 4-bit predesigned registers. Additional single bits can be achieved with predesigned flip-flops offered in TI's standard cell family. designing for testability Designers employing storage or bistable elements, especially long counters (ripple or synchronous), should consider testability of the design in its final form. The need to preset or clear, and read intermediate stages of these elements, should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable costs savings as the expense of IC testing, system testing, and system maintenance can be reduced signi·ficantly. power-up-clear/preset Standard cell storage elements containing the capability to be asynchronously either preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Access to the clear inputs from other system signals in conjunction with the power-up clear can be facilitated with an AND gate. 4-332 ".!1 TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC686, SN74ASC686 8·BIT MAGNITUDE COMPARATORS 02939, AUGUST 1986 SystemCell"" 2·",m SOFTWARE MACRO CELL • Performs Magnitude Comparison of Binary, BCD, and Monotonic Codes • Weighted Cascaded Inputs Accomodate Both Serial and Parallel Expansion • Dependable Texas Instruments Quality and Reliability logic symbol t COMP G1Z G2Z PO Pl P2 description The SN54ASC686 and SN74ASC686 are standard-cell software macros implementing 8-bit expandable magnitude comparators, The 8-bit configuration provides the custom IC designer a magnitude comparator to embed in ASICs in its most efficient form, and the 8 bit width simplifies construction of wider comparators, The 'ASC686 implements a comparison scheme identical with that performed by packaged 'HC686 and 'LS686 comparators, P3 P4 P P5 1P-O p~-- PEOOZ 2P>0 p~-- PGT02 ps P7 7 00 0 01 02 03 a 04 05 as 07 7 These 8-bit magnitude comparators perform comparison of straight binary and straight BCD tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and (8-4-2-1), codes, Two fully decoded decisions, lEe Publication 617-12. P>Q or P = Q, about two eight-bit words (P,Q) are made and are externally available at two outputs that can be decoded with a NAND gate to provide the P < Q decision, These devices are fully expandable to any number of bits, Words of greater length may be compared by connecting comparators in cascade, ThePEQQZ and PGTQZ outputs of a stage handling less-significant bits are connected to the corresponding G 1Z and G2Z inputs of the next stage handling more-significant bits, The' ASC686 is implemented with the standard cell functions indicated, The HDL netlist label for this software macro is shown on the last line of the following table: RELATIVE CELL NAME CELL AREA TOTAL TOTAL RELATIVE CELL AREA Cpd* (pF) SN54ASC' (nA) SN74ASC' (nA) 4 7 6 12.25 3.6 7.42 776 1547 46.4 93.1 NO. USED TO NA210LH fI) G) G) .c en ... CU CU C MAXIMUM ICC AN210LH AN310LH 1.5 1.75 AN410LH 2 6 12 7.08 1536 91.8 EX210LH 2 8 16 8.96 1784 107.2 IV110LH 0.75 9.75 5.72 1365 82.16 IV120LH 1 5 5 4 655 39.25 NA210LH NA310LH 1 1.25 4 4 524 31.36 3 3.75 2.04 1.5 489 29.34 NA410LH 1.5 3 4.5 1.5 561 33.6 NA420LH 2.5 1 2.5 0.96 312 18.7 N0220LH 1.5 1 1.5 0.52 185 11.1 13 II... 43.3 9734 585 TOTALS 55 77.25 Label: S686LH PO,Pl,P2,P3,P4,P5,P6,P7 ,00,01,02,03,04,05,06,07 ,Gl Z,G2Z, PEOOZ,PGTOZ; tOoes not include interconnect capacitance. Copyright © 1986, Texas Instruments Incorporated PRODUCTION DATA documants contain information current as of publication data. Products conform to specifications per the terms of Texas Instruments :~=~;ai~:1~1e ~:~:~ti:fn :.~o:.e:;;~~~s not TEXAS " " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-333 SN54ASC686, SN74ASC686 8-BIT MAGNITUDE COMPARATORS The SN54ASC688 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC688 is characterized for operation from - 40°C to 85 DC. FUNCTION TABLE INPUTS DATA OUTPUTS* ENABLESt PEQOZ PGTOZ H G1Z G2Z P=Q L X L P>Q X L H L P Q x H H H X H H H H P.Q t G1Z enables PEQQZ, and G2Z enables PGTQZ. *The 'i'<'Q function can be generated by applying the PEQQZ and PGTQZ outputs to a 2-input NAND gate . • ...o C» C» o:::r ...en (I) (I) 4-334 TEXAS . . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC686, SN74ASC686 8-BIT MAGNITUDE COMPARATORS logic diagram P7 Q7 PO Q8 PO P4 POQQZ Q4 P, '" Q2 Q' PO ao II... G'Z II) GZZ Q) Q) .s:: en ... CtI CtI C PGTaz '1!1 TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-335 SN54ASC686. SN74ASC686 8·BIT MAGNITUDE COMPARATORS. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current TEST CONDITIONS Input capacitance I G2Z t The TYP MAX 2.2 TA = 25°C Vee = 5 V, tr = tf = 3 ns, TA = 25°C UNIT V 585 0.12 Vee = 5 V, MAX 2.2 9734 IAnyPorQ Equivalent power Cpd dissipation capacitance t SN74ASC686 TYP Vee = 5 V, TA = 25°C Vee = 4.5 V to 5.5 V, VI - Vee or 0, TA = MIN to MAX I GIZ ei SN64ASC686 nA 0.12 0.24 0.24 0.34 0.34 43.3 43.3 pF pF equivalent power dissipation capacitance does not include interconnect capacitance. switching characteristics over recommended ranges of supply yoltage and operating free-air temperature lunless otherwise noted) Isee Note 1) II C .... DI DI t/) ::T CD ....CDen * FROM (INPUT) TO TEST (OUTPUTI CONDITIONS tpd Pn, Qn Any tpd G1Z,G2Z Any Any Any PARAMETER .1tpd SN54ASC686 TYP§ MAX MIN 9 20.6 7 15.4 0.8 2.3 eL = 0 0.3 SN74ASC686 TYP§ MAX MIN 0.3 9 7 19.1 0.8 2 14.1 UNIT ns nsipFO x P :_ _ _- - - - . J cD) at G,Z absolute maximum ratings and recommended operating conditiohs See Table 1 in Section 2. t/) :r g r+ electrical characteristics en PARAMETER VT Input threshold voltage lee Supply current ej I G1Z Input capacitance I Any P or Q Equivalent power Cpd dissipation capacitance t TEST CONDITIONS SN54ASC688 SN74ASC688 TYP TYP TA = 25°e Vee = 5 V. Vee - 4.5 V to 5.5 V. VI - Vee or O. TA = MIN to MAX Vee = 5 V. Vee = 5 V. TA = 25°e TA tr = 25°e = tf = 3 ns. 2.2 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 MAX 2.2 3677 0.12 0.22 0.22 15.94 15.94 UNIT V 221 0.12 t The equivalent power dissipation capacitance does not include interconnect capacitance. 4·340 MAX nA pF pF SN54ASC688. SN74ASC688 8-81T IDENTITY COMPARATORS switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) (see Note 1) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpd Pn, Qn PEQQZ tpd G1Z PEQQZ ~tpd Any PEQQZ PARAMETERt eL SN54ASC688 MIN SN74ASC688 TYP* MAX TYP* MAX 7.5 13.6 7.5 12.3 3 4.7 3 4.4 0.7 2.3 0.7 2 =0 0.3 MIN 0.3 UNIT ns ns ns/pF tPropagation delay times are. measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpd 5 propagation delay time, low-ta-high or high-ta-Iow output .6.tpd == change in tpd with capacitance *Typical values are at Vee = 5 V, TA = 25°e. NOTE 1: These switching characteristics are simulations of the software macro cell using interconnect capacitance values for an array design having 2,000 gates. Post-layout simulation uses actual interconnect capacitance values. DESIGN CONSIDERATIONS All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. The HDL for this software macro is included as a part of the library supplied for supported engineering. workstations so that a single label can be developed to apply the macro as needed. The following printout of the HDL block definition is furnished for reference. ... (/) HDL FILE CD CD .c en BLOCK S688LH; PO @INPUT; P1 @INPUT; P2 @INPUT; P3 @INPUT; P4 @INPUT; P5 @INPUT; P6 @INPUT; P7 @INPUT; 00 @INPUT; 01 @INPUT; 02 @INPUT; 03 @INPUT; 04 @INPUT; 05 @INPUT; 06 @INPUT; 07 @INPUT; G1Z @INPUT; PEOQZ @OUTPUT; ...co CO C TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 76266 4-341 SN54ASC688, SN74ASC688 8·BIT IDENTITY COMPARATORS STRUCTURE AN1 AN2 AN3 EX1 EX2 EX3 EX4 EX5 EX6 EX7 EX8 INV1 INV2 INV3 INV4 INV5 INV6 INV7 INV8 INV9 NA1 END S688LH; C :AN310LH :AN310LH :AN210LH :EX210LH :EX210LH :EX210LH :EX210LH :EX210LH :EX210LH :EX210LH :EX210LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :IV110LH :NA420LH INV1 0,INV20,INV30,AN1 0; INV40,INV50,INV60,AN20; INV70,INV80,AN30; P7,Q7,EX10; P6,Q6,EX20; P5,Q5,EX30; P4,Q4,EX40; P3,Q3,EX50; P2,Q2,EX60; P1 ,Q1 ,EX70; PO,QO,EX80; EX10,INV1O; EX20,INV20; EX30,INV30; EX40,INV40; EX50,INV50; EX60,INV60; EX70,INV70; EX80,INV80; G1Z,INV90; AN10,AN20,AN30,INV90,PEQQZ; I» r+ I» en ::r CD CD r+ en 4·342 ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • OALLAS, TEXAS 75265 PRODUCT PREVIEW SN54ASC888. SN74ASC888 8·BIT PROCESSOR SLICES D2939, AUGUST 1986 SystemCell™ COMPATIBLE MegaModule™ • • • • • • • • • • • Parallel 8·Bit ALU with Expansion Nodes • Full Carry Look Ahead Support 13 Arithmetic and Logic Functions • 8 Conditional Shifts (Single and Double Length) Sign. Carry Out. Overflow. and Zero-Detect Status Capabilities • Excess-3 BCD Arithmetic 9 Instructions that Manipulate Bytes • ALU Bypass Path Increases Speeds of Multiply. Divide. and Normalize Instructions and Provides New Instructions such as Bit Set. Bit Reset. Bit Test. Byte Subtract. Byte Add. and Byte Logical • 3-0perand Register Files Allow an Operation and a Move Instruction to be Combined • Bit and Byte Masks are Shared with Register Address Fields to Minimize Control Store Word Width • 3 Data Input/Output Ports Maximize Data Throughput 4 Instructions that Manipulate Bits Add and Subtract Immediate Instructions Absolute Value Instruction Signed Magnitude to/from Two's Complement Conversion Single· and Double-LlIngth Normalize Select Functions Signed and Unsigned Divides with Overflow Detection; Input Does Not Need to be Prescaled • Signed. Mixed. and Unsigned Multiplies • Three-Operand. 16-Word Register File • description These 8-bit Advanced CMOS SystemCeliN compatible standard cells implement high-performance digital computer or controller data-paths, An architecture and instruction set has been chosen that supports a fast system clock. a narrow micro-code word width. and a high system throughput. The powerful instruction set allows high-speed system architecture to be implemented and also allows an existing system's performance to be upgraded while protecting software investments, These processors are designed to be cascadable. in increments of eight bits. to any word width of 16 bits or greater. The SN54ASC888 will be characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC888 will be characterized for operation from ~40°C to 85°C. PRODUCT PREVIEW documents contain information on products in the formative Dr design p'hasa of development. Charecteristic deta end other ~:.a:~i::t~:1rr::t ~-::if.=::I~r T3i::~~:::~~:S~ pnNIucts without notice. Copyright © '986, Texas Instruments Incorporated. TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-343 SN54ASC888, SN74ASC888 8-BIT PROCESSOR SLICES node descriptions AO I/O I A1 I A2 I A3 I BO B1 I B2 I B3 I CO I NODE NAME • C1 I C2 I Register file A port read address select IlSB = 0) Register file B port read address select ILSB = 0) Register file address select C3 I ClK I Clocks aU synchronous registers on positive edge Cn I AlU carry input CNPl8 0 AlU ripple carry output DAO I/O DA1 110 DA2 110 DA3 110 DA4 110 DA5 110 DA6 110 DA7 110 DBO 110 DBl 110 DB2 110 DB3 110 DB4 110 DB5 110 DB6 110 DB7 110 EAZ I EBO I EBl I GZ_N a 10 I 11 I 12 I 13 I 14 )5 I 16 I 17 I lSC MSC OEAZ 4-344 I DESCRIPTION A port data bus. Outputs registe, data if EAZ is low, or inputs data if EAZ is high. B port data bus. Outputs register data if OEBZ is low, or input data if O~BZ is high. AlU input operand select. High state selects DA bus, and low state selects register file. ALU input operand select. EBO and EB 1 select the source of data that the S multiplexer provides for the S bus. Independent control of the DB bus and data-path selection allows the user to isolate the DB bus while the AlU continues to process data. ALU generate/negative result for most significant 8-bit slice, active low Instruction input ) , I Package position inputs I DA bus enable, active low OEBZ I DB bus enable, active low OEYZ I Y bus output enable, active low TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC888. SN74ASC888 8·BIT PROCESSOR SLICES node descriptions (continued) NODE NAME SI07Z 1/0 0 110 OI07Z 110 OIOOZ SELY 110 110 I SSF 110 WEZ I YO 110 I/O 110 PZ_OVR SIOOZ Yl Y2 Y3 110 Y4 110 Y5 Y7 110 110 110 ZERO 110 Y6 DESCRIPTION AlU propagatelinstruction overflow for most significant a-bit slice, active low Bidirectional shift pin, active low Y bus select, active high Expandable shift function. Used to transfer information between 8-bit slices during special instruction execution in expanded (16-bit, 32-bitl systems Register file (RF) write enable. Data is written into RF when WEZ is low and a low-ta-high clock transition occurs. RF write is inhibited when WEZ is high. Y port data bus. Outputs instruction results if OEYZ is low or input data register file if OEYZ is high. ALU shifter zero detection, open drain. Input during certain special instructions TEXAS • INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 4-345 SN54ASC888, SN74ASC888 8·BlT PROCESSO~ SLICES functional block diagram 4 C3-CO .16 X 8 WEZ REGISTER FILE 4 4 A3-AO CK 83-80 OE8Z 8 8 DA7-DAO DB7-DBO OEAZ EBO EBl PN_OVR ---'- LCS MSCD-SSFC-- ~ CD CD ... (I) 8 8 17-10 C>--'- OEVZ SELV V7-VO For additional detailed information refer to the SN54AS888 and the SN74AS888 data sheet, SDBS001B, and the Bit-Slice Processor User's Guide, SDBUOOl A. 4-346 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 PRODUCT PREVIEW SN54ASC890, SN74ASC890 MICROSEOUENCERS 02939, AUGUST 1986 SystemCell™ COMPATIBLE MegaModule"" • 14 Bits Wide - Addresses Up to 16,384 Words of Microcode with One Megacell • Selects Address from One of Eight Sources • Independent Read Pointer for Aid in Microcode Diagnostics • Supports Real-Time Interrupts • Two Independent Loop Counters • Supports 64 Powerful Instructions • Dependable Texas Instruments Quality and Reliability description node descriptions NODE NAME 1/0 RAOEZ I ORA6-0RAO I/O Seven lSBs of the A direct data 110 port MUX control for the source to DRA. Low OSEl I MUX2-MUXO I MUX control for Y output bus RC2-RCO I Register/counter controls S2-S0 I Stack control CCZ I Condition code ClK I Clock ZERO 0 0 Stack overflow. underflow/read efror flag I/O Seven lSBs of the B direct data I/O port STKWRN/RER ORB6-0RBO The SN54ASC890 and SN74ASC890 are Advanced CMOS standard cell microseqencers supporting traditional bit-slice data-path implementations. FUNCTION Enables ORA output. active low selects RA. high selects stack, Zero detect flag for register A and B (0 = lSBI RBOEZ I DRB13-DRB7 I/O Seven MSBs of the B direct data I/O port INTZ I When low selects INT RT register to stack Y13-YB I/O Six MSBs of bidirectional Y port Y7 I/O Seventh bit of bidirectional Y port Enables ORB output. a,ctive low The microsequencers select a 14-bit YOEZ Enables Y output bus, active low I microaddress from one of eight sources to Seven LSBs of bidirectional Y port provide the proper microinstruction sequence for Y6-YO I/O (0 = lSBI bit-slice processor megacells or other microcodeINC I Incrementer control based data paths. These high-performance DRA13-0RA7 I/O Seven MSBs of direct B data I/O port megacells are capable of addressing 16,384 B3-BO16-way branch inputs I control store memory locations either sequentially or via conditional branching algorithms. This multiway branching capability, coupled with a nine-word-deep FILa (first in, last out) stack, allows the microprogrammer to arrange his code in blocks so that microprograms may be structured in the same fashion as such high-level languages as ALGOL, Pascal, or Ada. II ... en CD CD .c tn ca ca ... C Both polled and real-time interrupt routines are supported by the' ASC890 to enhance system throughput capability. Vectored interrupts may occur during any instruction, including PUSHes and POPs. The SN54ASC890 will be characterized for operation over the full military temperature range of - 55°C to 125 cC. The SN74ASC890 will be characterized for operation from - 40 cC to 85°C. Copyright © 1986, Texas Instruments Incorporated PRODUCT PREVIEW documant. contain information on products in the formative or design phase of development. Characteri.tic data and other ::::;~i:t:=:srr;:t dt~Si~8=::I!r T:i~::~~:~:~:~!: products without AOticI. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-347 SN54ASC890, SN74ASC890 MICROSEQUENCERS functional block diagram RAOEZD----~ RBOEZ OSELD---~ III ZERO STACK POINTER STACK 14x 9 C C» r+ C» 5TKWRN/RER 3 READ POINTER 14 14 14 tn N T RCZ-RCO 52-SO CCZ R 0 L ::T 3 3 MUX2-MUXO ~ e fII 4 B3-BO -- -----+-------------~ For additional detailed information refer to the SN54AS890 and SN74ASS90 data sheet, SOBS002, and the Bit-Slice Processor User's Guide, SOBU001A. 4-348 TEXAS . " INSTRUMENTS POST OFFICE BOX 665012. DALLAS. TEXAS 75265 SN54ASC2022, SN74ASC2022 5-INPUT POSITIVE-NAND GATES D2939. AUGUST 1986 SystemCell™ 2-J.tm INTERNAL STANDARD CELL logic symbol • Choice of Two Performance Levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over Vce Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability FUNCTION TABLE OUTPUT INPUTS positive logic equation Y = A·B·C.D.E = A+B+C+D+E A B C 0 E H H H H H L L X X X X H X L X X X H X X L X X H Y X X X L X H X X X X L H description The SN54ASC2022 and SN74ASC2022 are 5-input positive-NAND gate CMOS standard cells. The standard-cell library contains two physical implementations providing the custom IC designer a choice between two performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: NA510LH NA520LH CI) CI) en NETLIST TYPICAL RELATIVE HOL LABEL DELAY CELL AREA CL - 1 pF 2.7 ns TO NA210LH Label: NA5nOLH A,B.e,O,E,Y; U) .s: FEATURES CELL NAME II .... ....COCO C 1.75 3 2.1 ns The SN54ASC2022 is characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC2022 is characterized for operation from -40°C to 85°C, absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage I SN54Ase2022 I SN74Ase2022 NA510LH TEST CONDITIONS Vee ~ 5 V, TA TYP ~ 25°e Supply current ej Input capacitance Vee ~ 5 V, TA ~ 25°e Equivalent power Vee - 5 V. tr dissipation capacitance TA epd PRODUCTION DATA documonts contain information currant as of publication date. Products conform to spacifications per the terlls of Texas Instruments :':~:=i~a{~:1~1i ~~::i::i:r lI~O::~:~~::-:S not 2.2 Vee ~ 4.5 V to 5.5 V, VI ~ Vee or 0, lee TA ~ ~ MAX NA520LH TYP 213 MIN to MAX tt' ~ 3 ns, 25°e UNIT V 365 12.8 ~ MAX 2.2 21.9 nA 0.12 0.25 pF 0.52 1.02 pF Copyright © 1986, Texas Instruments Incorporated TEXAS. I~STRUMEN1S POST OFFICE BOX 855012 • DALLAS, TeXAS 75266 4-349 SN54ASC2D22, SN74ASC2D22 5-INPUT POSITIVE-NAND GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature lunlessotherwise noted) NA510LH PARAMETERt tpLH tpHL tpLH tpHL J.tpLH J.tPHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A thru E A thru E Y CL CL Y A thru E Y FROM (INPUT) TO (OUTPUT) =a = 1 pF SN54ASC2022 MIN SN74ASC2022 MAX MIN 0.8 TYP* 1.2 2.4 0.6 1.3 3.5 0.8 0.7 1.3 2.6 6.3 TYP* 1.2 MAX 2.2 1.3 3 1.4 2.6 5.8 1.6 2.7 9.2 1.7 2.7 0.5 1.4 4.3 0.5 1.4 8 3.9 0.9 2.2 5.8 1 2.2 5 UNIT ns ns nsipF NA520LH PARAMETERt tpLH tpHL tpLH II tpHL J.tpLH J.tpHL A thru E Y A thru E Y A thru E TEST CONDITIONS CL CL Y =a = 1 pF SN54ASC2022 SN74ASC2022 TYP:I: MAX MIN TYP* MAX MIN 0.7 1.2 2.4 0.7 1.2 2.2 0.6 1.2 2.9 0.6 1.2 2.6 3.5 1 1.9 3.9 1.1 1.9 1.1 2.2 5.7 1.2 2.2 5 0.3 0.7 1.6 0.3 0.7 1.4 0.4 1 2.8 0.5 1 2.4 t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tPLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high·to·low'level output = UNIT ns ns nsipF tf = 3 ns (10% and 90%1- .6.tPLH ;;;;;: change in tPLH with load capacitance J.tpHL '" change in tpHL with load capacitance 'Typical values are Vee = 5 V, TA = 25°C. DESIGN CONSIDERATIONS Refer to Section 7. All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. 4-350 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC2024, SN74ASC2024 5-INPUT POSITIVE-AND GATES D2939, AUGUST 1986 SystemCell™ 2-/Lm INTERNAL STANDARD CEll • 2.9 ns Typical Propagation Delay with 1-pF Load • Specified for Operation Over Vee Range of 4.5 V to 5.5 V • Functional Operation Over Vee Range of • Dependable Texas Instruments Quality and Reliability logic symbol 2Vt06V FUNCTION TABLE OUTPUT positive logic equation Y = ABCDE = =A~+~B~+~C'--+~D=--+~E INPUTS A B C D E Y H H H H H H L X X X X L X L X X X L X X L X X L X X X L X L X X X X L L description The SN54ASC2024 and SN74ASC2024 are 5-input positive-AND gate CMOS standard cells, Each cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: AN510LH NETLIST TYPICAL RELATIVE HDL LABEL DELAY CELL AREA CL - 1 pF 2,9 ns TO NA210LH Label: AN510LH A,B,e,D,E,Y; ... til CD CD .c FEATURES CELL NAME II Ul ...caca 2,25 C The SN54ASC2024 is characterized for operation over the full military temperature range of - 55 ac to 125 ac, The SN74ASC2024 is characterized for operation from - 40 ac to 85 ac, absolute maximum ratings and recommended operating conditions See Table 1 in Section 2, electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage ICC Supply current ei Input capacitance Vee - 5 V, Equivalent power Vee epd ISN54Ase2024 ISN74Ase2024 . dissipation capacitance Vee - 5 V, Vee = 4,5 V to 5,5 V, TA = TA VI ~ = 25°C Vee or 0, MIN to MAX = 5 V, TA - 25°C tr = tf = TA = 25°C :':~:~~i;8{::1~1e =~:i:r :.~u:a-:~:t::'S not 3 ns, MAX UNIT 286 17,2 nA V 0,13 pF 1.12 pF Copyright © 1986. Texas Instruments Incorporated PRODUCTION DATA do.uments .ontain information current 8S of publication date. Products conform to specifications par the terms of Taxas Instruments TYP 2,2 TEXAS . " INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-351 SN54ASC2024, SN74ASC2024 5·INPUT POSITIVE·AND GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH tpHL tpLH tpHL .:l.tpLH .:l.tpHL TEST FROM (INPUT) TO (OUTPUT) CONDITIONS A thru E Y CL = 0 A thru E Y A thru E Y CL = 1 pF tpropagation delay times are measured from VI = 44% to Vo tpLH ,'" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output .:l.tpLH '" change in tpLH with load capacitance .:l.tpHL '" change in tpHL with load capacitance tTypical values are VCC = 5 V, TA = 25°C. • SN54ASC2024 = MIN MAX 1 TYP* 2.4 6.1 0.7 1.7 3.9 1.6 3.4 1.1 SN74ASC2024 MIN MAX 1.1 TYP* 2.4 0.8 1.7 3.5 8.6 1.7 3.4 7.5 2.3 5.5 1.1 2.3 4.9 0.5 1 2.5 0.5 1 2.2 0.2 0.6 1.6 0.3 0.6 1.4 44% of VCC with tr = tf = 5.3 UNIT ns ns ns/pF 3 ns (10% and 90%), DESIGN CONSIDERATIONS Refer to Section 7. o .... All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. I» I» en :T CD CD .... tI) 4-352 TEXAS • INSTRUMENT'S POST Oi=FICE BOX 665012 • DALLAS, nXAS 75265 SN54ASC2102, SN74ASC2102 TOGGLE FLIP-FLOPS WITH PRESET/CLEAR 02939. AUGUST 1986 SystemCell™ a and az 2-j.lm HARDWIRED MACRO CELL • Provides Complementary • Choice Between Three Clocked Toggle Flip-Flop Configurations latch cells offered Outputs • Cascadable for Implementing Ripple Counters • Implements High-Speed Counters: Clock Frequencies'. . . 54 to 65 MHz CELL NAME PRESET CLEAR TAB20LH yes yes TAC20LH TAP20LH no yes yes no description The SN54ASC2102 al]d SN74ASC2102 are dedicated, harclwired standard-cell macros implementing toggle flip-flops with clear andlor preset. The 'ASC21 02 latches offer three choices of individual flip-flop configurations providing the custom IC designer a clocked storage element to embecl in ASICs in its most efficient form: as stand-alone bit-control devices or as additions to larger latched function. A low level at the preset or clear input controls the state of the outputs regarclless of the levels at other inputs. When preset and clear inputs are inactive (high) and the clock input makes a low-to-high transition, each of the complementary outputs will toggle to its opposite state. While the clock remains high or transitions to the low level and remains low, the outputs will remain stable. The cells are designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: FEATURES MAXIMUM NETLIST CELL NAME HDL LABEL CLOCK CELL AREA TO NA210LH 54.2 MHz 7.7 TAC20LH Label: TAC20LH CLRZ.CLK.O.OZ; 61.7 MHz 7.2 TAP20LH Label: TAP20LH PREZ,CLK,O,OZ; 65.8 MHz 7 en ..... ..c FREQUENCY Label: TAB20LH CLRZ.PREZ.CLK.O,OZ; III CD CD RELATIVE TAB20LH II en .....CO CO C The SN54ASC2102 is characterized for operation over the full military temperature range of - 55 DC to 125°C. The SN74ASC2102 is characterized for operation from -40 0 C to 85 DC. logic symbol t FUNCTION TABLE TAB20LH TAB20LH. ~ PREZ=a;S CLK T CLRZ R OUTPUTS INPUTS Q OZ ........ '--- ,t This symbol is in accordance with ANSIIIEEE Std 91·1984 and IEC Publication 617·12. PREZ CLRZ CLK Q L H H L H L L Lt H Lt 00 00 00 00 L L H H X X X i H H L OZ :t: This configuration is nonstable; that is, it will not persist when the PREZ and CLRZ inputs return to their inactive (H) level. PRODUCTION DATA dllt;um••ts cont.in inlormatio. currant as af Pllblicl1:ion data. Products conform to .cilic.tlo.s par the terms 01 TOlla. I.s!fu",••ts standard JVI"~nty. Praduction processing duas nOt .......ril' i.clud. lastio. 01 .n R.raDlate... ~ TEXAS INSTRUMENTS POST OfFICE BOX 655012. DALLAS, TEXAS 75265 Copyright © 1986. Texas Instruments Incorporated 4-353 SN54ASC2102, S~74ASC2102 TOGGLE FLlP·FLOPS WITH PRESET/CLEAR logic symbols t FUNCTION TABLES TAC20lH ClK ClRZ --:-f>T TAC20lH r-- a INPUTS -Ir-- az ~L_ RR _ _ OUTPUT ClRZ ClK a l X L H H T Co L 00 ao Co H TAP20LH PREZ:S QZ TAP20lH J--- a INPUTS .Jr-- az ClK - - - P -__ L T_ _ tThese symbols are in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. OUTPUT PREZ L ClK X a H L H T 00 00 H L 00 00 QZ absoiute maximum ratings and recommended operating conditions See Table 1 in Section 2. 4 o ....C»C» . timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TAB20lH SN54' en ::r CD CD a MIN fclock tw tsu th Clock frequency Pulse duration Setup ,time:, before clock Hold time after clock TAC20lH SN74' MAX MIN 50.8 MAX SN64' MIN 54.2 CLRZ low 8.8 7.6 PREZ low 7.6 7.6 CLK high or low 9.8 CLRZ inactive PREZ inactive SN74' MAX MIN 54.2 61.7 7.6 7.6 9.2 9.2 8.2 7.2 6 4.8 4.8 7.2 4.8 CLRZ low 0 0 0 PREZ low 0 0 -0.8 UNIT MAX MHz ns ns ns TAP20lH SN54' MIN fclock Clock frequency tw Pulse duration tsu th Setup time before clock Hold time after clock 4·354 MAX SN74' MIN 58.3 UNIT MAX 65.8 MHz PREZ low 7.6 7.6 CLK high or low 8.5 7.6 PREZ inactive 2.4 2.4 ns PREZ low 2.4 2.4 ns TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 ns SN54ASC21D2, SN74ASC21D2 TOGGLE FLlp·FLOPS WITH PRESET/CLEAR electrical characteristics TAB20LH PARAMETER VT Input threshold voltage lee Supply current I ei epd Input capacitance SN54ASC2102 TEST CONDITIONS I elRZ PREZ I elK TYP TA = 25°e Vee = 5 V, Vee - 4.5 V to 5.5 V, VI - Vee or 0, TA = MIN to MAX Vee = TA 5 V, = 5 V, = 25°e Equivalent power Vee dissipation capacitance TA tr = 25°e = tf = 3 ns, MAX 2.2 SN74ASC2102 TYP MAX 56.2 939 0,25 0.25 0.36 0.36 0.29 0.29 4.2 4.2 UNIT V 2.2 nA pF pF TAC20LH VT Input threshold voltage lee Supply current Ci Cpd Input capacitance I I SN54ASC2102 TEST CONDITIONS PARAMETER elRZ elK TYP TA = 25°e Vee = 5 V, Vee - 4.5 V to 5.5 V, VI - Vce or 0, TA = MIN to MAX Vee = = 5 V, = 25°e Equivalent power Vee dissipation capacitance TA = TA 5 V, tr = 25°e tf = 3 ns, MAX 2.2 SN74ASC2102 TYP MAX 884 53 0.36 0.36 0.25 0.25 3.79 3.79 UNIT V 2.2 nA pF pF II ... CI) CI) CI) TAP20LH ~ VT Input threshold voltage lec Supply current Ci epd Input capacitance I PREZ ClK TYP TA = 25°e Vec = 5 V, Vec - 4.5 V to 5.5 V, VI - Vce or 0, = TA I SN54ASC2102 TEST CONDITIONS PARAMETER Vec 5 V, = 5 V, = 25°e Equivalent power Vec dissipation capacitance TA 2.2 TA = 25°e t r - tf - 3 ns, TEXAS·~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 15285 SN74ASC2102 TYP MAX 50.8 0.35 0.35 0.26 0.26 3.59 3.59 UNIT V 2.2 846 MIN to MAX = MAX nA til ...caca C pF pF 4-355 SN54ASC2102, SN74ASC2102 TOGGLE FLIP-FLOPS WITH PRESET/CLEAR switching characteristics over recommended ranges of supply voltage and operating free-air temperi!ture (unless otherwise noted) TAB20LH PARAMETERt tPlH FROM (INPUT) ClK TO TEST (OUTPUT) CONDITIONS SN54ASC2102 Q,QZ tPHl tplH tpHl tplH tpHl tplH tpHl 6tPlH 6tpHl MIN TYP* 2.2 5.1 1.5 SN74ASC2102 I\IIAX 13.4 MIN TYP* MAX 2.4 5.1 11.8 8.4 1.6 3.3 7.4 2 3.3 4 9.7 2.1 4 8.6 2 4 9.7 2.1 4 8.6 PREZ Q ClRZ QZ PREZ QZ 1.1 2 4.4 1.2 2 4 ClRZ Q 1.1 2 4.4 1.2 2 4 ClK Q,QZ 2.4 5.6 14.7 2.6 5.6 12.9 1.7 3.7 9.4 1.!j 3.7 PREZ Q 2.3 4.5 11 2.4 4.5 ClRZ QZ 2.3 4.5 11 2.4 4,6 8.3 9.B 9.8 = Cl Cl = 0 1 pF PREZ QZ 1.3 2.4 5.4 1.4 ClRZ Q 1.3 2.4 5.4 1.4 2.4 2.4 Any Q,m 0.2 0.5 1.4 0.2 0.5 1.2 0.1 0.4 1.1 0.1 0.4 Q.9 FROM (INPUT) TO TEST (PUTPUTI CONDITIONS UJIIIT ns ns ns 4.9 4.9 ns/pF mTAC20LH PARAMETERt C tplH SN54ASC2102 ClK Q,QZ tplH ClRZ QZ en tpHl ClRZ Q CD CD- tpHl ClK Q,QZ ClRZ QZ ClRZ Q Any Q,QZ FROM (INPUT) TO TEST (OUTPUT) CONDITIONS C» C» tpHl r+ :r tplH tPlH tpHl 6tplH r+ en 6tpHl = Cl 0 TYP* 4.6 MAX 1.4 1.8 1.1 13 IIIIIN 2.1 TYP* 4.6 3.1 7.9 1.6 3.5 8.3 2 4.3 1.2 14.2 2.3 8.8 1.7 9.4 2.2 5.3 1.4 0.2 2 5.1 3.5 4 2.4 0.6 1.3 0.2 0.1 0.4 1 0.1 3.1 3.6 2 6.1 3.5 4 2.4 0.5 0.4 2.2 Cl = 1.6 1 pF SN74ASCal0a MIN 1.9 2.1 1.3 MAX 11.3 7 7.4 3.9 UNIT ns 12.5 7.7 8.4 ns 4.8 1.2 0.9 ns/pF TAP20LH PARAMETERt tplH ClK Q,QZ tplH PREZ Q tpHl PREZ QZ ClK Q,QZ tplH PREZ Q tPHl 6tPLH 6tpHl PREZ QZ Any Q,QZ tpHL tpLH SN54ASC2102 CL = 0 tpHl CL = 1 pF SN14....SC2102 MIN Typl ~AX MIN TYP* MAX 1.9 4.5 12.5 2 1.3 3 8.2 1.8 3.4 8 1.1 2 2.1 1.5 2 1.3 0.2 0.1 4.6 10.9 1.4 3 7.2 1.9 3.4 7.1 4.1 1.2 2 3.8 5 l:P 2.3 5 12 3.4 9.1 1.6 3.4 8 3.9 2.4 9.2 2.2 3.9 8.2 5 1.3 2.4 4.6 0.5 1.3 1 0·2 0.1 0.5 0.4 0·4 1·1 0.9 UNIT ns ns ns/pF t Propagation delay times are measured from the 44% point of VI to the 44% PQint pf Vo with tr = tf = 3 ns (10% and !!O%). tPLH '" propagation delay time, low·to-high-Ievel output . tpHL '" propagation delay time, high-to-Iow-Ievel output 6tpLH '" change in tpLH with load capacitance 6tpHL '" change in tpHL with load capacitance *Typical values are at VCC = 5 V, TA = 25·C. TEXAS . " 4-356 INSTRUMENlS ~ Po.ST OFFICE BOX 655012 ~ DALLAS, TEXAS 7526~ SN54ASC21D2, SN74ASC21D2 TOGGLE FLlp·FLOPS WITH PRESET/CLEAR DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly with cells and macros available in the TI standard-cell library. The inputs can be driven by either noninverting or inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTl/CMOS buffer. All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered for managing unused inputs. designing for testability Designers employing storage or bistable elements should consider testability of the design in its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard-cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up/clear cells to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. TEXAS. INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 II • 4-357 • C I» r+ I» en ::T CD CD r+ til 4-358 SN54ASC210B, SN74ASC210B J-K-TYPE NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS 02939. AUGUST 1986 SystemCell™ 2-llm HARDWIRED MACRO CELL • Provides Complementary Q and QZ Outputs • Negative-Edge Triggered with J and KZ Data Inputs • CLRZ and PREZ Inputs Provide Asynchronous Initialization • J and KZ Inputs Simplify Implementation of logic symbol t PREZ J Q CLKZ --.&...;:,4> C1 Toggle Flip-Flops KZ---'c.:.>.t CLRZ---'c.:.>.t QZ t This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. description FUNCTION TABLE The SN54ASC2108 and SN74ASC2108 are INPUTS OUTPUTS dedicated, hardwired standard-cell macros PREZ CLRZ CLKZ J KZ Q QZ implementing negative-edge-triggered flip-flops. L H X X X H L A low level at the Preset or Clear input controls H X X X L L H Lt Lt the state of the outputs regardless of the levels L L X X X of the other inputs. When Preset and Clear are H H L L L H inactive (high), data at the J and KZ inputs H H L H TOGGLE meeting the setup time requirements are H H L H 00 OZO transferred to the outputs on the negative-going H H H H L H edge of the clock pulse. Clock triggering occurs H H L X X 00 OZO at a voltage level and is not directly related to f This configuration is nonstable; that is, it will not the fall time of the clock transition. Following the persist when PREZ or CLRZ returns to its inactive hold time interval, data at the J and KZ inputs (high) level. may be changed wihout affecting the levels at the outputs. These versatile flip-flops can perform as toggle flip-flops by tying J high and KZ low. They also can perform as Ootype flip-flops if J and KZ are tied together. The JKB21 LH flip-flop implements the identical function and sequential operation to one-half of the 'LS 109, 'S 109, or 'F1 09 packaged flip-flops except the JKB21 LH is negative-edge triggered rather than positive-edge triggered. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: • • • • II ... fI) CD CD .c en ...mm C FEATURES CELL NAME JKB21LH NETLLlST MAXIMUM HOL LABEL CLOCK RELATIVE CELL AREA FREQUENCY TO NA210LH 44.2 MHz 13.3 Label: JKB21 LH CLRZ.PREZ.J.KZ.CLKZ.O.OZ; The SN54ASC21 08 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC21 08 is characterized for operation from - 40°C to 85 DC. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA do.umanls .ontain information CURent as of publication data. Products conform to spacifications per the terms of Texi. Instruments :~~=~i;·i~:I~'li ~~:~:r lI~O=::::~:~S not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 Copyright @ 1986, Texas Instruments Incorporated 4-359 SN54ASC210B, SN74ASC210B J-j(-TYPE NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) MIN fclock Clock frequency tw Pulse duration tsu Setup time PREZ or CLRZ low CLKZ high or low Hold time UNIT 44.2 MHz 9 ns 11.4 CLRZ inactive 1.8 PREZ inactive -0.4 J or KZ high or low th MAX ns 9 CLRZ low 3 PREZ low 9.6 J or KZ high or low ns 0 electrical characteristics PARAMETER VT • SN54ASC2108 TEST CONDITIONS TYP TA = 25°C VCC = 5 V, VCC - 4.5 V to 5.5 V, VI - VCC or 0, Input threshold voltage ICC Supply current = TA IJ Input capacitance VCC 5 V, TA = 25°C = 5 V, = 25°C Equivalent power VCC dissipation capacitance TA tr = tf = 3 ns, 71.6 0.25 0.25 0.12 0.12 0.13 0.13 4.97 4.97 UNIT V 1194 IKZ or CLKZ Cpd MAX 2.2 MIN to MAX, = TYP 2.2 I PREZ or CLRZ Ci SN74ASC2108 MAX nA pF pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) . PARAMETERt tPLH tpHL tpLH tpHL FROM UN PUT) TO (OUTPUT) CLKZ a,az CL PREZ,CLRZ a,az CLKZ a,az tPLH tpHL tpLH tpHL .:I.tpLH TEST CONDITIONS CL PREZ,CLRZ a,Ol Any a,az .:I.tpHL = = 0 1 pF SN54ASC2108 MIN SN74ASC2108 TYP* MAX MIN TYP* MAX 1.8 5 12.9 1.9 2 4.5 4.3 13.4 11.1 2.2 5 11.4 2 4.5 11.1 2.2 4.3 9.8 1.1 2.1 5.2 1.2 2.1 4.8 2.3 5.5 14 2.5 5.5 12.5 2.1 4.9 12.5 2.3 4.9 11.9 2.3 4.8 12.2 2.5 4.8 10.9 1.3 2.5 1.4 2.5 5.8 0.2 0.5 1.2 0.1 0.4 1.1 0.2 0.5 6.4 1.3 0.1 0.4 1.2 UNIT ns ns ns ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tptH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output .:I.tpLH '" change in tpLH with load capacitance .6.tpHL ;;;;; change in tpHL with load capacitance = 5 V, TA = 25°C. *Typical values are VCC 4-360 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 75265 SN54ASC2108, SN74ASC2108 J·j(·TYPE NEGATIVE·EDGE·TRIGGERED FLIP·FLOPS DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven by either noninverting or inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. designing for testability Designs employing storage or bistable elements should consider testability of the design in its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with. respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. III ... en Q) Q) .c tn ... CO CO o TEXAS • INSTRUMENTS POST OFFICE !;lOX 655012 • DALLAS, TEXAS 75265 4-361 II 4-362 SN54ASC2310, SN74ASC2310 INVERTING 3·STATE BUFFERS WITH ACTIVE·LOW ENABLE 02939, AUGUST 1986 SystemCell™ 2-",m INTERNAL STANDARD CELL logic symbol • Choice of Three Performance Levels • Active-Low Enable • Specified for Operation Over Vee Range of 4.5 V to 5.5 V • Functional Operation Over Vee Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability A-DP-- GZ~ FUNCTION TABLE INPUTS positive logic equation y = If. when y GZ is L OuTPUT GZ L A H Y L L L H H X Z description The SN54ASC231 0 and SN74ASC231 0 are inverting 3-state internal buffer standard cells that interface internal cells with internal buses, The standard-cell library contains three physical implementations providing the custom IC designer a choice between three performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: CELL NAME HOL LABEL IV211LH IV221LH Label: IV2nlLH A,GZ,Y: IV241LH TYPICAL .c RELATIVE DELAY CELL AREA CL - 1 pF 2.6 ns TO NA210LH 1.7 ns 1.5 2 1.3 ns 3 U) G) G) FEATURES NETLIST II ... til ...caca C The SN54ASC231 0 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC231 0 is characterized for operation from - 40°C to 85 °C. absolute maximum ratings and recommended operl'!ting conditions See Table 1 in Section 2. Copyright © 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 225012 • DALLAS, TEXAS 75265 4·363 SN54ASC2310, SN74ASC2310 INVERTING 3·STATE BUFFERS WITH ACTIVE·LOW ENABLE electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci Co Cpd Input capacitance II TYP TA = 25°C VCC = 5 V, A TA = 25°C VCC = 5 V, GZ Output capacitance VCC = 5 V, TA = 25°C Equivalent power VCC - 5 V, t r - tf - 3 ns, dissipation capacitance TA = 25°C VT Input threshold voltage ICC Supply current Ci Input capacitance Co Output capacitance 0.22 0.39 pF 1 pF pF IV241LH TYP VI - VCC or 0, SN74ASC2310 TA = MIN to MAX MAX TA = 25°C 359 VCC = 5 V, TA = 25°C Equivalent power VCC = 5 V, tr dissipation capacitance, TA = tf = C (f) J CD CD .... (I) ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 3 ns, 1 UNIT V 2.2 21.5 VCC = 5 V, .... nA 0.49 VCC - 4.5 V to 5.5 V, I» I» 4·364 14.6 0.47 0.55 SN54ASC2310 25°C UNIT V 244 10.8 TA = 25°C = MAX 2.2 0.22 0.4 VCC = 5 V, GZ IV221LH TYP 180 TEST CONDITIONS A MAX 2.2 SN54ASC2310 VCC - 4.5 V to 5.5 V, VI - VCC or 0, SN74ASC2310 TA = MIN to MAX PARAMETER Cpd IV211LH TEST CONDITIONS nA pF 0.85 0.59 pF 1.88 pF SN54ASC2310. SN74ASC2310 INVERTING 3-STATE BUFFERS WITH ACTIVE-LOW ENABLE switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) IV211LH PARAMETERt tPLH tpHL FROM (INPUT) A tpLH A tpHL TO TEST (OUTPUT) CONDITIONS Y tpZH GZ Y tpZL GZ Y tpHZ GZ Y tpLZ GZ Y AtPLH .l.tpHL .l.tpZH .l.tpZL =0 CL Y = CL SN54ASC2310 1 pF CL-1pF, RL = 40klltoGND RL = 20klltoVcC CL - 1 pF, = 40 MAX MIN TYP* MAX 0.6 0.9 2 0.6 1.8 0.5 0.9 2.3 0.6 0.9 0.9 1.6 2.9 6.5 1.7 2.9 5.9 1.1 2.2 5.3 1.2 2.2 4.6 1.4 2.7 5.9 1.5 2.7 5.3 ns 1.3 2.5 5.9 1.4 2.5 5.1 ns 7.5 kll to GND Cl - 1 pF, Y GZ Y FROM (INPUT) TO TEST (OUTPUT) CONDITIONS 2 7.5 4 RL = 20 kll to V CC A UNIT TYP* CL - 1 pF, RL SN74ASC2310 MIN ns ns ns 4 ns 0.9 2 4.6 1 2 4.2 0.6 1.3 0.6 1 2.1 3 4.8 1 1.3 2.1 2.7 4.4 0.5 1.3 3.6 0.6 1.3 3.1 SN54ASC2310 MIN TYP* MAX MIN TYP* MAX 1.9 0.6 0.9 1.7 ns/pF ns/pF IV221LH PARAMETERt tpLH tpHL tpLH tpHL A A GZ tpZH GZ tpZL Y Y Y tpLZ GZ Y .l.tpZL A Y GZ Y = 1 pF RL = 40klltoGND 0.9 0.4 0.9 1.9 0.4 0.9 1.7 1.1 1.9 4.1 1.1 1.9 3.8 0.8 1.5 3.5 0.8 1.5 3.1 0.7 1.5 3.2 O.B 1.5 3 ns 1 l.B 4 1.1 l.B 3.5 ns RL = 20klltoVCC CL - 1 pF, RL = 40 B.9 kll to GND CL - 1 pF, B.9 4.5 RL = 20 kll to VCC 4.5 2.3 0.5 1 2.1 0.3 0.7 1.7 0.4 0.7 1.5 0.6 1 2.3 0.6 1 2.1 0.2 0.7 1.8 0.3 0.7 1.5 !!!! tf = ns ns 1 = ns ns 0.4 tpropagation delay times are measured from the 44% pOint of VI to the 44% point of Va with tr tPLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output tpZH '" output enable time to high level tpZL '" output enable time to low level tPHZ '" output disable time from high level tpLZ '" output disable time from low level .6.tpLH 5 change in tPLH with load capacitance .l.tPHL '" change in tpHL with load capacitance .6.tPZH UNIT 0.6 CL - 1 pF, Y GZ .l.tPHL .l.tpZH CL =0 CL - 1 pF, Y tPHZ .l.tpLH CL SN74ASC2310 a ns/pF ns/pF 3 ns (10% and 90%). change in tpZH with load capacitance .l.tpZL '" change in tpZL with load capacitance t Typical values are VCC = 5 V, TA = 25°C. TEXAS . . INSTRUMENTS POST OFFICE BOX 6~5012 • DALLAS, TEXAS 75265 4-365 SN54ASC2310, SN74ASC2310 INVERTING 3·STATE BUFFERS WITH ACTIVE·LOW ENABLE switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) . iV241LH PARAMETERt tPLH tpHL tpLH tpHL tpZH tpZL tpHZ tpLZ .:l.tpLH .:l.tPHL IIo C» ; (I) :::r CD ! en .:l.tPZH .:l.tpZL (lNPUTI FROM TO (OUTPUT) A Y A GZ GZ GZ GZ A GZ TEST CONDITIONS CL Y Y Y Y CL =0 = 1 pF CL - 1 pF, RL = 40 kOto GND CL - 1 pF, RL = 20kOtoVCC SN54ASC2310 = 40 MAX MIN TYP* MAX 0.6 0.9 1.7 0.6 0.3 0.7 1.8 0.3 0.9 0.7 1.6 1.6 O.B 1.4 2.9 O.B 1.4 2.6 0.5 1.1 2.6 0.5 1.1 2.3 0.2 0.9 2.1 0.3 0.9 1.9 ns 0.9 1.5 3.3 0.9 1.5 2.9 ns 9.8 kO to GND CL - 1 pF, y RL = y 9.8 4.9 20 kO to VCC Y UNIT TYP* CL - 1 pF, RL SN74ASC2310 MIN ns ns ns ns 4.9 0.2 0.5 1.2 0.2 0.5 1.1 0.2 0.4 0.6 0.9 1.1 0.2 0.4 0.4 0.6 O.B 0.4 0.1 0.4 1 0.1 0.4 0.8 1 ns/pF ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%), tpLH .. propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output tpZH .. output enable time to high level tpZL 2 output enable time to low level tpHZ .. output disable time from high level tpLZ .. output disable time from low level .:l.tpLH '" change in tpLH with load capacitance .:l.tpHL '" change in tpHL with load capacitance .:l.tpZH '" change in tpZH with load capacitance .:l.tpZL '" change in tpZL with load capacitance *Typical values are VCC = 5 V, TA = 25°C. DESIGN CONSIDERATIONS Refer to Section 7. 4-366 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC2311, SN74ASC2311 INVERTING 3·STATE BUFFERS WITH ACTIVE·HIGH ENABLE 02939, AUGUST 1986 SystemCell™ 2·llm INTERNAL STANDARD CELL logic symbol • Choice of Three Performance Levels • Active·High Enable • Specified for Operation Over V CC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability FUNCTION TABLE INPUTS positive logic equation Y=A OUTPUT G A H H Y L H L H L X Z description The SN54ASC2311 and SN74ASC2311 are inverting 3-state internal buffer standard cells that interface internal cells with internal buses, The standard-cell library contains three physical implementations to provide the custom IC designer a choice between three performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: .J: NETLIST TYPICAL RELATIVE (J) HDL LABEL DELAY CELL AREA CL - lpF 2.6 ns TO NA210LH ....COCO IV212LH IV222LH (I) Q) Q) FEATURES CELL NAME II .... Label: IV2n2LH A.G, Y; IV242LH 1.5 1.8 ns 2 1.3 ns 3 C The SN54ASC2311 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC2311 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. Copyright © 1982, Texas Instruments Incorporated PRODUCTION DATA documents contain information current as of publication date. Products conform to specifications per the terms of Texas Instruments :~~~~:~~ifva{~:I~~e ~!::i~~ti:f ~Io::~:::t::'s~s not TEXAS -II} INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-367 SN54ASC2311, SN74ASC2311 INVERTING 3-STATE BUFFERS WITH ACTIVE-HIGH ENABLE electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current A Ci Input capacitance VCC '" 5 V, TA = 25°C Output capacitance VCC = 5 V, TA = 25°C Equivalent power VCC = 5 V, tr = tf = 3 ns, dissipation capacitance TA = 25°C G VT ICC Ci C» C» en :r- CD CD Co Cpd 2.2 UNIT V 243 10.8 14.6 nA 0.24 0.47 0.31 0.42 0.18 0.33 pF 0.5 0.98 pF pF IV242LH TYP MAX SN54ASC2311 VCC = 4.5 V to 5.5 V, VI = VCC or 0, SN74ASC2311 TA = MIN to MAX 358 21.5 VCC = 5 V, TA = 25°C 1 Output capacitance VCC = 5 V, TA = 25°C VCC ~ 5 V, tr - tf - 3 ns, dissipation capacitance TA = 25°C nA pF 0.58 Equivalent power UNIT V 2.2 TA = 25°C G MAX 180 VCC = 5 V, A Input capacitance TYP TEST CONDITIONS Input threshold voltage Supply current IV222LH MAX 2.2 TA = 25°C VCC = 5 V, SN54ASC2311 VCC - 4.5 V to 5.5 V, VI - VCC or 0, SN54ASC2311 TA = MIN to MAX PARAMETER r+ TYP Co Cpd IIc IV212LH TEST CONDITIONS 0.48 pF 1.86 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) IV212LH PARAMETERt tpLH r+ en tpHL tPLH FROM TO TEST (INPUT) (OUTPUTI CONDITIONS A Y CL = 0 A Y CL = 1 pF tPHL tpZH G Y tpZl G y G y tpLZ G y -V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability BUll1LH A---{>--Y positive logic equations BU110LH, BU112LH BU111LH Y=A Y=A description The SN54ASC2321 and SN74ASC2321 are three internal delay buffer standard cells that provide the ASIC designer with symmetrical delay elements. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: .c NETLIST TYPICAL RELATIVE HDL LABEL DELAY CELL AREA en CL - 1 pF 3 ns TO NA210LH CO 2 ... 4 ns 2 C 3 ns 2 BUll0LH BUlllLH en Q) Q) FEATURES CELL NAME II ... Label: BU11nLH A,V; BUl12LH CO The SN54ASC2321 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC2321 is characterized for operation from -40°C to 85°C, absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA documonts contain intormolio. curront .s of publicolion date, Products conform to spacifications par th. terms of TaXIS Instruments :'=~i~'i~:lo:,tJ,; ~~":\:;ti:; lil":=:::1t::.s not Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-373 SN54ASC2321, SN74ASC2321 BUFFERS electrical characteristics PARAMETER VT I SN54ASC2321 I SN74ASC2321 Supply current Ci Input capacitance VCC - 5 V, Equivalent power VCC - 5 V, dissipation capacitance TA = 12.7 9 25°C 0.05 pF 0.74 0.83 pF BU112LH TYP Input threshold voltage Supply current Ci Input capacitance VCC - 5 V, TA - 25°C Equivalent power VCC = 5 V, TA = 25°C tr VCC - 5 V, VCC - 4.5 V to 5.5 V, TA dissipation capacitance = nA 0.05 VT I SN54ASC2321 UNIT V 212 TEST CONDITIONS I SN74ASC2321 MAX 2.2 150 ICC Cpd BU111LH TYP MAX 2.2 TA - 25°C tr - tf - 3 ns, PARAMETER 4 TYP VCC = 5 V, TA = 25°C VCC - 4.5 V to 5.5 V, VI - VCC orO, TA = MIN to MAX .Input threshold voltage ICC Cpd BU110LH TEST CONDITIONS MAX 2.2 TA - 25°C V 151 VI - VCC or 0, 9.1 MIN to MAX = tf = 3 ns, UNIT nA 0.06 pF 0.56 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) BU110LH c ... PARAMETERt en ::r tPHL tpLH CD CD tpLH CD CD tpHL , : Range of Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability FUNCTION TABLE INPUTS positive logic equation Y = (A.B) + (C.D) OUTPUT A B C D Y H H X X l X X H H l Any other combination H description The SN54ASC2330 and SN74ASC2330 are 2-wide, 2-input AND-NOR gate CMOS standard cells. Each cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: FEATURES CELL NAME NETLIST HDl LABEL TYPICAL DELAY A0221LH label: A0221lH A,B,C,D,Y; CL - 1 pF 2.6 ns II ... U) RELATIVE Q) Q) CELL AREA .c: TO NA210LH CJ) 2.7 The SN54ASC2330 is characterized for operation over the full military temperature range of - 55 DC to 125 DC, The SN74ASC2330 is characterized for operation from - 40 DC to 85 DC, ... C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current ._._ .. II ...... ~ -- - - _.,- TYP 2.2 TEST CONDITIONS VCC - 5 V, ISN54ASC2330 VCC - 4.5 V to 5.5 V, ISN74ASC2330 . . . . . , . . . . . . . . . . . . . , , ...... Equivalent power Cpd dissipation capacitance PRODUCTION DATA documents contein informetion current 88 of publication data. Products conform to spacifications par the terms of Texas Instruments :~:=~i~8i~:1~18 ~r::i:~i:r :.r::;::::~::.~s nat 13.4 IA VCC = 5 V, TA = 25°C tr = = ,,~- tf i ... =3 ns, UNIT V 224 VI - VCC or 0, TA = MIN to MAX I MAX nA V.I" I P" I 0.59 pF Copyright © 1986. Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 CO CO 4-383 SN54ASC233D, SN74ASC233D 2·WIDE, 2·INPUT AND·NOR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH FROM (INPUT) TO TEST (OUTPUT) CONDITIONS Any tpHL tpLH Any tpHL dtPLH Any dtPHL Y = CL CL Y = 0 1 pF Y SN54ASC2330 SN74ASC2330 MIN TYP* MAX MIN TYP* MAX 0.7 1.2 2.9 O.B 1.2 2.6 0.4 1.1 2.2 0.4 1.1 2 1.7 3.2 7.3 1.B 3.2 6.7 0.9 2 4.6 0.9 2 4.1 0.9 2 4.6 1 2 4.1 0.5 0.9 2.5 0.5 0.9 2.2 UNIT ns ns ns/pF tpropagation delay times are measured from 44% pOint of VI to the 44% pOint of Vo with tr = tf = 3 ns (10% and 90%). tPLH '" propagation delay time, low-to-high-Ievel output . tPHL '" propagation delay time, high-to-Iow-Ievel output dtPLH '" change in tPLH with load capacitance dtpHL '" change in tpHL with load capacitance * Typical values are VCC = 5 V, T A = 25°C. • C m r+ m DESIGN CONSIDERATIONS Refer to Section 7. All inputs to this celi, as well as all cells, must be accounted for in the netlist used to generate the next level of an ASIC design, A tie-off cell is offered specifically for managing unused inputs, This Boolean function is a member of a series of multifunction cells designed specifically to simplify the implementation of a broad class of higher-level logic equations such as: rJ) • CD CD • Exclusive-OR and exclusive-NOR functions • Majority decoders • Modulo adders • Carry-save adders • Function generators • Random logic ::r r+ en Sum of products Other members of this class of standard-cell functions are grouped in the' ASC6000 series of type numbers, The selection consists of four primary architectures with expandable versions offered in each: • Dedicated and expandable AND-NOR gates • Dedicated and expandable OR-AND-NOR gates • Expandable AND-OR-NOR gates • Expandable OR-NAND gates • Expandable AND-OR-NAND gates • Expandable OR-ANO-OR-NAND gates Options are offered in each architecture from basic 2-wide functions up to expandable 3-wide functions providing single-macro solution to most design requirements, The expandable functions can be combined with basic gating cells and/or other Boolean cells offered in Texas Instruments SystemCell'" family to implement application-specific solutions. 4-3B4 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC2331, SN74ASC2331 2-WIDE, 2-INPUT AND-OR GATES 02939, AUGUST 1986 SystemCelrM • Typical Propagation Delay: 2.6 ns with 1-pF Load • Specified for Operation Over 4.5 V to 5.5 V 2-pm INTERNAL STANDARD CELL logic symbol Vee Vee Range of Range of • Functional Operation Over • Dependable Texas Instruments Quality and Reliability 2Vt06V A--....--... B--'" Y C-----~ D---. = (A.B) .~ FUNCTION TABLE INPUTS positive logic equation Y ~ + (C·D) OUTPUT A B C D Y H H X X H X X H H H Any other combination L description The SN54ASC2331 and SN74ASC2331 are 2-wide, 2-input AND-OR gate CMOS standard cells, Each cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: II .... II) FEATURES CELL NAME A0220LH NETLIST TYPICAL Q) Q) RELATIVE HDL LABEL DELAY CELL AREA TO NA210LH Label: A0220LH A,B,C,D,Y; CL - 1 pF 2.6 ns .c U) ....COCO 3.1 The SN54ASC2331 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC2331 is characterized for operation from -40°C to 85°C, 0 absolute maximum ratings and recommended operating conditions See Table 1 in Section 2, PRODUCTION DATA d••unien" •• ntoin information • urrent II of publication dille. P..ducts .onform 10 sp..ifications per Ih. lerm. of T.llls IlIIIrulD.nts. standord w.",IIty. Production p......i•• do... not ._rily includ. tasting 01 .11 Pll'lIm8l8rs. Copyright © 1986, Texas Instrumel1ts Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-385 SN54ASC2331. SN74ASC2331 2-WIDE. 2-INPUT AND·OR GATES electrical characteristics VT PARAMETER Input threshold voltage I ICC Supply current Ci TEST CONDITIONS SN54ASC2331 LSN74ASC2331 Input capacitance Equivalent power Cpd dissipation capacitance TYP 2.2 VCC - 5 V, VCC = 4.5 V to 5.5 V, TA = MIN to MAX TA - 25°C VCC = .5 V, VCC - 5 V, TA = 25°C TA - 25°C t, - tf - 3 ns, VI = MAX V 255 15.3 VCC or 0, UNIT nA 0.13 pF 0.9 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt FROM (INPUT) TO TEST (OUTPUTI CONDITIONS tpLH tpHL Any Y CL = 0 Any Y CL = 1 pF tpLH tpHL CLK---t> SERIN GA OA SERIN GAZ OB OC OB 00 OBZ OC OCZ 00 ODZ LZ_S LZ_S ClK CLK SERIN SERIN 20 D) A 10 D) B 10 en C OC 0 00 C ... OA :r CD CD ... OA A OB GAZ OB B OBZ OC C OCZ 00 (/I 0 ODZ tThese symbols are in accordance with ANSIIIEEE Std 91-1984 and IEC Publication 617-12. FUNCTION TABLES •ASC2401 ••ASC2402 INPUTS CLRZ CLK SERIN L H X t i H L H •ASC2403.· ASC2404 INPUTS OUTPUTS OC* L 00* X OB* L SERIN A B C 0 H OAn OC n L t X a b c d a OC* c L L OAn QBn Q8 n OB* b 00* H QC n H i OAn QBn OC~ 00 QO 00 00 X X X X X X X X X H X X X X L OAn QBn OC n L LZ_S CLK H t H L X L X ~The •ASC2402 and •ASC2404 QxZ output is the complement of Ox. absolute maximum ratings an~ recommended operating conditions See Table 1 in Section 2. 4-408 OUTPUTS DATA GA* L TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 OA* QO no no d 00 SN54ASC2401 THRU SN54ASC2404 SN74ASC2401 THRU SN74ASC2404 4-811 SHIFT REGISTERS timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) R2401lH SN54' fclock tw tsu th Clock frequency r-'MIN MAX 0 59.6 MIN MAX 0 59.6 MIN MAX 0 59.6 8.4 8.4 8.4 8.4 8.4 8.4 SERIN (H or L) 5.8 5.8 5.8 5.8 CLRZ inactive -3 0.2 -3 0.2 -3 0.3 5.4 5.4 5.4 Setup time Hold time SERIN (H or LI -3 0.2 after clock ClRZ active 5.4 Setup time before clock Hold time th after clock MIN MAX 0 59.6 SN74' MIN MAX 0 59.6 SN54' MIN MAX MHz ns ns ns 0 59.6 SN74' MIN MAX 0 59.6 CLK high 8.4 8.4 8.4 8.4 ClK low 8.4 8.4 8.4 8.4 SERIN (H or LI 5.8 5·8 5.8 5.7 LZ_S (H or L) 0 0 0 0 A .. D (H or L) 5.8 5.8 5.8 5.7 SERIN (H or L) -0.4 0 -0.3 -0.3 0 -0.4 LZ_S (H or L) 0 -0.3 0 -0.3 -0.4 -0.3 A .. D (H or L) UNIT R2404lH R2403lH SN54' tsu 59.6 8.4 before clock tw 0 8.4 ClK low Clock frequency MAX 6.6 ClK high Pulse duration MIN 6.6 5.4 fclock SN74' SN54' 5.4 ClRZ low Pulse duration R2402lH SN74' UNIT MHz ns ns • .... U) ns CI) CI) .c (J) ....C'C'CCII C TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-409 SN54ASC2401 THRU SN54ASC2404 SN74ASC2401 THRU SN74ASC2404 4·81T SHIFT REGISTERS electrical characteristics R2401LH TEST CONDITIONS PARAMETER VT lee ei Input threshold voltage Supply current Vee = 5 V, Vee - 4.5 V to 5.5 V, TA = 25°e TYP ~ SERIN TA = 25°e Equivalent power dissipation capacitance tr = tf = 3 ns, Vee = 5 V, TA = 25°e TYP MAX 2.2 1.04 Vee = 5 V, SN74ASC2401 UNIT V 184 3071 TA = MIN to MAX Input capacitance MAX 2.2 VI - Vee or 0, elK epd SN54ASC2401 nA 1.04 0.13 0.13 0.24 0.24 10.3 10.3 pF pF R2402LH TEST CONDITIONS PARAMETER VT lee .. .. C t» t» en ::r ei Input threshold voltage Supply current Input capacitance ~ SERIN Vee = 5V, Vee - 4.5 V to 5.5 V, T A = MIN to MAX TA = 25°e elK Equivalent power epd dissipation capacitance tr = tf = 3 ns, Vee = 5 V, TYP TA = 25°e MAX 2.2 VI - Vec or 0, TA = 25 0 e Vee = 5 V, SN54ASC2402 SN74ASC2402 TYP MAX 3355 202 1.04 1.04 0.13 0.13 0.24 0.24 12.1 12.1 UNIT V 2.2 nA pF pF R2403LH CD CD PARAMETER en Input threshold voltage VT lee ei TEST CONDITIONS Supply current Input capacit~nce Vee = 5 V, Vee - 4.5 V to 5.5 V, TA = 25°e TYP 2.2 VI - Vee or 0, ~ lZ_S Ci:K Equivalent power dissipation capacitance MAX TA = 25°e Vee = 5 V, TA = 25°e tr = tf = 3 ns, TYP MAX UNIT V 2.2 223 nA 0.19 0.19 Vee = 5 V, SN74ASC2403 3711 TA = MIN to MAX -D,;-"1 epd SN54ASC2403 0.8 0.8 0.24 0.24 0.19 0.19 11.1 11.1 pF pF R2404LH TEST CONDITIONS PARAMETER VT Input threshold voltage lee Supply current Vee = 5 V, Vee = 4.5 V to 5.5 V, TA = 25°e Input capacitance ~ ~ TA = 25°e 4-410 Equivalent power Vee = 5 V, dissipation capacitance TA'" 25 0 e tr - tf - 3 ns, TEXAS • INSTRqM~N1S POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN74ASC2404 TYP MAX UNIT V 2.2 240 3995 0.19 Vee = 5 V, MAX 2.2 TA = MIN to MAX On epd TYP VI - Vee or 0, ~ ei SN54ASC2404 nA 0.19 0.8 0.8 0.24 0.24 0.19 0.19 12.1 12.1 pF pF SN54ASC2401 THRU SN54ASC2404 SN74ASC2401 THRU SN74ASC2404 4·81T SHIFT REGISTERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) R2401LH PARAMETERt tPlH tPHl tPHl tplH tpHl tpHl LltplH LltPHl LltpHl FROM (INPUT) TO (OUTPUT) ClK Q ClRZ Q ClK Q ClRZ Q TEST CONDITIONS Cl = 0 Cl = 1 pF ClK Q ClRZ Q FROM (INPUT) TO (OUTPUT) SN54ASC2401 SN74ASC2401 MIN TYP~ MAX MIN TYP~ MAX 3.6 2.4 1.2 3.9 2.7 1.5 0.3 0.3 0.3 5.7 4.7 1.9 6.2 5.2 2.4 0.5 0.5 0.5 11.1 10.2 3.9 12.3 11.1 4.7 1.3 0.9 0.9 4.1 2.8 1.5 4.4 3.1 1.8 0.3 0.3 0.3 5.7 4.7 1.9 6.2 10.1 9.3 3.6 11.2 5.2 2.4 0.5 0.5 0.5 10 4.4 1.1 0.8 O.B UNIT ns ns ns ns ns/pF ns/pF R2402LH PARAMETERt tplH tPHl tplH tpHl tplH tpHl tplH tpHl tplH tpHl tplH tPHl LltPlH LltpHl LltplH LltpHl LltPlH LltpHl ClK TEST CONDITIONS Q ClK QZ ClRZ ClRZ QZ Q ClK Q ClK oz ClRZ ClRZ QZ ClK Q ClK QZ ClRZ ClRZ QZ Cl = 0 Cl = 1 pF Q Q SN54ASC2402 SN74ASC2402 MIN TYP~ MAX MIN TYP~ MAX 3.7 2.5 5.9 4.9 11.6 10.5 3.9 2.6 5.9 4.9 2.7 3.8 1.5 1.3 4 2.7 3.3 4.3 2.1 1.5 0:3 0.2 0.6 0.5 0.6 0.2 5.3 6.1 2.5 2.1 6.4 5.3 6.3 7.2 3.5 2.5 0.5 0.4 1 1.1 1 0.4 11.1 12.2 4.7 4.1 12.8 11.3 13.5 14.8 6.9 4.9 1.2 0.8 2.3 2.7 2.3 0.8 2.9 4.1 1.6 1.3 4.2 2.9 3.5 4.7 2.2 1.6 0.3 0.3 0.6 0.6 0.6 0.3 5.3 6.1 2.5 2.1 6.4 5.3 6.3 7.2 3.5 2.5 0.5 0.4 1 1.1 1 0.4 10.5 9.5 10.1 11.1 4.5 3.9 11.6 10.2 12.1 13.4 6.5 4.6 1.1 O.B 2 2.4 2 O.B tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with t- = tf = UNIT ns ns ns ns ns a... U) CD CD J:. (/) ns ns ns ...caca C ns/pF ns/pF ns/pF ns/pF 3 ns (10% and 90%). tplH ., propagation delay time, low-to-high-Ievel output tpHl '" propagation delay time, high-to-Iow-Ievel output LltplH .. change in tplH with load capacitance AtpJ-I1 ;;;5 chanoe in teul with 1('11=10 *Typical values are at\i c-c rSlnSlr.it::ln~~ = 5 V, TA'= 25°C. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-411 SN54ASC2401 THRU SN54ASC2404 SN74ASC2401 THRU SN74ASC2404 4·81T SHIFT REGISTERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (continued) R2403LH PARAMETERt tpLH tPHL tpLH tpHL AtPLH AtpHL FROM (INPUT) TO (OUTPUT) CLK a TEST CONDITIONS CL =0 CLK a CLK a FROM (INPUT) TO TEST (OUTPUT) CONDITIONS CL = 1 pF SN74ASC2403 SN54:ASC2403 MIN MAX MIN TYP* MAX 3.5 TYP* 5.4 10.2 4.6 10 3.6 2.5 5.4 4.6 9.4 2.3 3.8 6 11.5 3.9 6 10.5 2.6 5 10.8 2.8 9.8 0.3 0.5 1.3 0.3 5 0.5 0.3 0.5 0.9 0.3 0.5 0.8 9 1.1 UNIT ns ns ns/pF R2404LH PARAMETERt tPLH tpHL tpLH • tpHL tpLH tpHL tpLH c tpHL .... CI) AtPLH AtPHL CI) en ! AtPLH :::T CD til AtPHL CLK a CL CLK CLK az a CLK CLK SN74ASC2404 TYP* MAX MIN 5.6 10.7 3.7 TYP* 5.6 MAX 3.6 2.4 4.8 10.2 2.6 4.8 9.3 9.8 2.6 5.2 10.8 2.7 5.2 9.9 3.7 5.8 11.3 3.9 5.8 10.4 3.9 6.1 11.9 4 6.1 10.8 2.6 5.2 11 2.9 5.2 10 3.2 6.2 13.1 3.4 6.2 11.9 4.2 6.9 13.9 4.5 6.9 12.7 a 0.3 0.5 1.2 0.3 0.5 1.1 0.2 0.8 2.3 0.3 0.7 0.8 az 0.4 1 0.4 0.6 1 2 0.5 1.1 2.7 0.6 1.1 2.4 CL CLK =a SN54ASC2404 MIN = 1 pF az UNIT ns ns ns ns ns/pF ns/pF tPropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%1. tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output 4tPlH .= change in tpLH with load capacitance AtpHL '" change in tpHL with load capacitance Typical values are at VCC = 5 V, TA = 25°C. * DESIGN CONSIDERATIONS designing for testability Designers employing storage or bistable elements should consider testability of the design in its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple action on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. 4-412 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC2405 THRU SN54ASC2407 SN74ASC2405 THRU SN74ASC2407 4-BIT FLIP-FLOPS/REGISTERS 02939, AUGUST 1986 SystemCell™ 2-/lm HARDWIRED MACRO CELL • Designed for Implementing Synchronous Registers • Choice of Three Versions to Achieve Best Design Density • Embedded Clock Drivers Provide Symmetrical Performance Across Long Registers • Cascable and Expandable for Full Customization REGISTER CONFIGURATIONS OFFERED ASVNCHRONOUS CELL NAME OUTPUTS 'ASC2405 'ASC2406 Q Q and Q Ves Ves 'ASC2407 Q 13-State) Ves CLEAR description The' ASC2405 thru 'ASC2407 are dedicated, hard-wired standard-cell macros implementing a three 4-bit flip-flop register elements. The three register configurations provide the custom IC designer with 4-bit registers to embed in ASICs in their most efficient form. Their 4-bit length means that larger blocks of custom logic can be handled efficiently to construct large registers. The macros each contain an embedded clock driver that buffers the clock input to a single 2-line input. This further simplifies implementaion of longer registers, as standard library buffer cells can be used to drive mUltiple clock inputs, which are used in the longer registers. The macro cells are identified and called from the engineering workstation input using the cell names and netlist in conjunction with labels developed as shown in the following table: CELL NAME NETLIST CLOCK HDL LABEL FREQUENCV (SN74ASC') R2405LH Label: R2405LH CLRZ,Dl,D2,D3,D4,CLK,Ql,Q2,Q3,Q4; R2406LH Label: R2406LH CLRZ,Dl ,D2,D3,D4,CLK,Ql ,Ql Z,Q2,Q2Z,Q3,Q3Z,Q4,Q4Z; 64.2 MHz 64,2 MHz R2407LH Label: R2407LH CLRZ,Dl ,D2,D3,D4,CLK,G,Q 1,Q2,Q3,Q4; 36,3 MHz en ... RELATIVE CO CO CELL AREA TO NA210LH 23.25 26,25 26,25 U) Q) Q) .c FEATURES MAXIMUM ... o The R2407LH incorporates 3-state outputs for interfacing internal buses directly. When enable G is high, the normal logic states (high or low levels) of the four outputs are impressed on the data bus. The outputs are disabled by a low logic level at enable G. The outputs then present a high impedance to the internal bus. While the outputs are disabled, sequential operation of the flip-flops is not affected. The SN54ASC' cells are characterized for. operation over the full military temperature range of - 55°C to 125°C. The SN74ASC' cells are characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA doc.mants contain information current as of publication date. Products conform to spacifications per the terms of Texas Instruments :::=~~i~8i~:I~~i :=:~ti~n :'~D=::t:~~s not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright @ 1986, Texas Instruments Incorporated 4-413 SN54ASC2405 THRU SN54ASC2407. SN74ASC2405 THRU SN74ASC2407 4·81T FLlP·FLOPS/REGISTERS logic symbols t 'ASC2405 FUNCTION TABLE 'ASC2405, 'ASC2406 ClRZ (EACH FLIP-FLOP) ClK 01 02 01 02 03 03 04 04 INPUTS OUTPUTS ClRZ ClK 0 a oz* l X X l H H H H L H t t l l H H l X 00 00 'ASC2406 t, ASC2406 only ClRZ ClK 01 01 01l 02 02 02l 03 03 03l Q4 04 C 04Z 'ASC2407 Q) r+ FUNCTION TABLE 'ASC2407 (EACH FLIP-FLOP) ClRZ Q) G en :r ClK r+ 01 02 02 03 Q3 04 Q4 CD CD (II OUTPUT INPUTS 01 tThese symbols are in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. a G CLRZ ClK 0 H L X X l H H H H H H t t L l H H L X 00 L X X X Z timing requirements over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) R2405lH SN54ASC' MIN fclock tw Clock frequency Pulse duration tsu Setup time before clock th Hold time after clock 4·414 MAX R2406lH SN74ASC' MIN 64.2 MIN 64.2 6 6 ClK hi.gh or low On .(high or low) 7.8 7.8 5.8 5.7 ClRZ inactive -3 On (high or low) CLRZ active ClRZ low MAX SN54ASC' MAX SN74ASC' MIN 64.2 64.2 7.8 7.8 7.8 5.7 -3 5.8 -3 0.2 0.3 -0.4 -0.3 5.4 5.4 5.4 5.4 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 7.8 -3 UNIT MAX MHz ns ns ns SN54ASC2405 THRU SN54ASC2407 SN74ASC2405 THRU SN74ASC2407 4-81T FLIP-FLOPS/REGISTERS timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) R2407lH SN54ASC' MIN fclock Clock frequency tw Pulse duration tsu Setup time before clock th MAX SN74ASC' MIN 36.3 ClRZ low ClK high or low Hold time after clock 6.6 13.8 On Ihigh or low) 36.3 6.6 13.8 7.6 7.5 CLRZ inactive -3.6 -3.6 On Ihigh or low) -0.4 -0.3 6.6 6.6 ClRZ active UNIT MAX MHz ns ns ns electrical characteristics R2405LH PARAMETER VT Input threshold voltage ICC Supply current Ci Input capacitance SN54ASC' TEST CONOITIONS VCC = 5 V, VCC - 4.5 V to 5.5 V, TA ~ On = TYP TA = 25°C VI - VCC or 0,' Equivalent power dissipation capacitance 2.2 = TA 5 V, = 25°C = 5 V, = 25°C VCC TA = tf = tr 3 ns, MAX 2.2 1.08 VCC SN74ASC' TYP 2647 MIN to MAX ClK Cpd MAX UNIT V 159 nA 1.08 0.13 0.13 0.24 0.24 10.2 10.2 pF CI) pF fn PARAMETER ICC Ci Input threshold voltage Supply current Input capacitance SN54ASC' TEST CONDITIONS VCC = 5 V, VCC - 4.5 V to 5.5 V, TA ~ On = VCC TA TYP = 25°C TA 5 V, = 25°C Equivalent power dissipation capacitance = 5 V, = 25°C VCC TA tr = tf = 3 ns, SN74ASC' TYP MAX 176 1.04 1.04 0.13 0.13 0.24 0.24 11.7 11.7 UNIT V 2.2 2931 MIN to MAX = MAX 2.2 VI - VCC or 0, ClK Cpd CD CD .c R2406LH VT II ... ...asas C nA pF pF R2407LH PARAMETER VT Input threshold voltage ICC Supply current Ci Co Cpd Input capacitance -.-- ..._- TEST CONDITIONS VCC = 5 V, VCC - 4.5 V to 5.5 V, TA = TA TYP = 25°C MAX 3031 MIN to MAX MAX UNIT V 2.2 2.2 VI - VCC or 0, _... ,-._TYP 192 nA ClRZ 2.08 2.08 rcuzrc;- 0.25 0.25 0.24 0.24 1.4 0.24 1.4 0.24 pF 11 11 pF ro;- VCC = 5 V, TA = 25°C Output capacitance VCC - 5 V, TA - 25°C Equivalent power VCC - 5 V, tr - tf - 3 ns, dissipation capacitance TA = 25°C TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 pF 4-415 SN54ASC2405 THRU SN54ASC2407 SN74ASC2405 THRU SN74ASC2407 4-81T FLIP-FLOPS/REGISTERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) R2405LH PARAMETERt tplH tpHl tpHl tplH FROM (INPUT} TO TEST IOUTPUT} CONDITIONS ClK Q ClRZ Q ClK Q Cl = 0 Cl = 1 pF tpHl tpHl ClRZ Q AtplH AtpHl ClK Q AtpHl ClRZ Q SN54ASC2405 MIN SN74ASC2405 MIN TYP* MAX 10.5 5.1 4.4 9.4 8.9 ns ns 3.1 2.3 4.4 10 3.3 2.5 1 1.7 3.5 1.1 1.7 3.2 3.5 6.1 12.8 3.8 6.1 11.5 2.6 5.1 11.8 2.8 5.1 10.5 1.3 2.4 5.3 1.4 2.4 0.4 1 2.3 0.5 1 4.7 '2.1 0.3 0.7 0.7 1.8 1.9 0.3 0.7 1.6 0.3 0.7 1.6 0.3 UNIT MAX TYP* 5.1 ns ns ns/pF ns/pF R2406LH PARAMETERt tplH IIc tpHl tplH tPHl tplH ... D) tPHl tpLH D) en ::r FROM TO TEST (INPUT) IOUTPUT} CONDITIONS ClK Q ClK CLRZ tpLH tpHL (II tpHL tpLH r+ MAX MIN 3.1 10.5 2.3 4.5 9.9 2.4 4.8 3.4 5.8 1.1 12.3 QZ 1.4 2.4 Q 1 1.7 3.6 6.1 12.8 2.6 5.2 QZ CLK Q ClK QZ AtPlH AtpHl AtpLH AtpHl AtpLH AtpHl CLRZ ClK ClK ClRZ Cl =' 0 3.3 TYP* 5.1 MAX 9.4 2.5 4.5 8.9 2.6 4.8 9.9 3.6 5.8 11.1 5.4 1.5 2.4 4.8 3.4 1.1 1.7 3.2 6.1 11.5 11.8 3.8 2.8 5.2 10.5 2.9 5.8 13.2 3.1 5.8 11.9 3.6 6.4 13.8 3.9 6.4 12.3 QZ 1.8 3.4 7.7 2 3.4 6.9 Q 1.3 2.4 5.3 1.4 2.4 4.8 0.5 1 2.4 0.5 1 2.1 0.3 0.7 1.9 0.3 0.7 1.7 0.5 1 2.3 0.5 1 2.1 0.2 0.6 1.5 0.3 0.6 1.3 Q QZ CL = 1 pF QZ 0.4 1 2.3 0.5 1 2.1 Q 0.3 0.7 1.9 0.3 0.7 1.6 tpropagation delay times are measured from the 44% pOint of VI to the 44% point of Vo with tr tplH '" propagation delay time, low-to-high-Ievel output tpHL " propagation delay time, high-to-Iow-Ievel output AtplH '" change in tplH with load capacitance AtpHl '" change in tpHL with load capacitance :I Typical values are at VCC = 5 V, T A = 25 ·C. 4-416 SN74ASC2406 TYP* 5.1 tpHl CD CD SN54ASC2406 MIN TEXAS . " INSTRUMENTS POST CiFFICE BOX 655012 • DALLAS, TEXAS 75265 = tf = 3 UNIT ns ns ns ns ns ns ns/pF ns/pF ns/pF ns 110% and 90%). SN54ASC2405 THRU SN54ASC2407 SN74ASC2405 THRU SN74ASC2407 4·81T FLlP·FLOPS/REGISTERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) R2407LH PARAMETERt tplH tPHl tpHl tplH tpHl tpHl FROM (INPUT) TO (OUTPUT) ClK Q ClRZ Q ClK Q ClRZ Q tpZH G Q tpZl G Q tpHZ G Q tplZ G Q Il.tplH Il.tpHl Il.tPHl Il.tPZH Il.tpZl ClK Q ClRZ Q G Q TEST CONDITIONS Cl Cl ~ ~ 0 1 pF ~ 1 pF, 1 kO to GND Cl - 1 pF, Rl ~ 1 kO to VCC Cl - 1 pF, Rl ~ 40 kO to GND Cl ~ 1 pF, Rl ~ 20 kO to VCC Cl Rl ~ SN54ASC2407 MIN TYP* MAX 3.3 5.5 11.6 4.8 11.1 2.4 1.1 2 4.4 4.3 7.5 16.1 3 14.4 6.2 1.7 7.9 3.4 ns ns 9.4 10.5 14.4 ns 4.3 5 8.1 4.4 4 7.7 ns 9.8 9.8 5.6 1 0.6 0.6 0.9 0.8 2 1.4 1.4 2 1.4 Va ns 5.6 4.6 3.4 3.5 4.8 3.9 1 0.6 0.7 1 0.8 2 1.4 1.4 2 1.4 ns 4.2 3 3.1 4.3 3.3 nsipF nSipF nsipF with tr = tf = 3 ns (10% and 90%), II .... en CD CD .c en ....COCO tpHZ " output disable time from high level C output disable time from low level 5 ns 14.7 tpZH " output enable time to high level 5: ns 10.5 tpZL ;;:: output enable time to low level tpLZ UNIT 9.4 t Propagation delay times are measured from the 44% point of V, to the 44% point of tpLH == propagation delay time, low~to-high-Ievel output tpHL ;;:: propagation delay time. high-to-Iow-Ievel output Il.tplH SN74ASC2407 MIN TYP* MAX 3.5 5.5 10.5 2.6 4.8 9.8 1.2 2 4 4.5 7.5 14.6 3.2 6.2 12.7 3.4 1.9 7 change in tplH with load capacitance atpHL '= change in tpHL with load capacitance Il.tpZH " change in tpZH with load capacitance Il.tpZl 5 change in tpZl with load capacitance Typical values are at VCC ~ 5 V, TA ~ 25°C. * TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-417 SN54ASC2405THRU SN54ASC2407 SN74ASC2405 THRU SN74ASC2407 4-81T FLIP-FLOPS/REGiSTERS DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly witH cells and macros available in the TI standard cell library. The inputs can be driven by either noninverting or inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfa~ed to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. All inputs to this cell must 6e accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. designing for testability Designers employing storage or bistable elements should consider testability of the design ih its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings. allowing the expense of IC testing. system testing. and system maintenance to be reduced significantly. • power-up clear/preset C Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. I» r+ I» en :::sCD CD r+ (I) 4-~18 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • CALLAS. TEXAS 75265 SN54ASC240B, SN74ASC240B FOUR-BIT RIPPLE COUNTERS 02939, AUGUST 1986 SystemCell™ 2-llm HARDWIRED MACRO CELL logic symbol t • Predesigned for Implementing Custom Counters • Direct Clear Input Simplifies Initialization or Cycle Length • CTRDIV16 ~{ CLRZ Embedded Clock Drivers Provide Clock Buffering + A QA QB QC no description The SN54ASC2408 and SN74ASC2408 are dedicated, hardwired standard-cell macros implementing a 4-bit binary counter element. The 4-bit configuration provides the custom IC designer a counter element to embed in ASICs in its most efficient form, Its 4-bit length means that larger blocks of custom logic can be handled efficiently to construct large counters, The 'ASC2408 implements a count sequence identical with that performed by one-half of packaged 'HC393 and 'LS393 counters with the exceptions that the' AS2408 clock, A, triggers on the positive-going edge, and the clear is active low, tThis symbol is in accordance with ANSI/IEEE std 91-1984 and IEC Publication 617-12. FUNCTION TABLE INPUTS OUTPUTS QD QC QB QA CLRZ A L H X L L L L t t t t t t L L L H L L H L L L H H L H L L L H L H L H H L t t t t t t t L H H H H L L L UJ H L L H H L H L H L H H CO CO H H L L H H L H H H H H H H The macros each contain an embedded clock driver, that buffers the clock input to a single 2-line input. This further simplifies implementaion of longer counters, as standard library buffer cells can be used to drive multiple clock inputs that are used in the longer collntets. The macro cell is identified and called from the engineering workstation input using the cell name and netlist in conjunction with a label developed as shown in the following table: H H H H H H H t' H H H L H i H H H H H t L L L L II ... tI) Q) Q) .c ... o FEATURES MAXIMUM CELL NAME NETLIST CLOCK HDL LABEL FREQUENCY RELATIVE CELL AREA TO NA210LH I!;N74A!;r.', Label: R2408LH CLRZ,A,QA,QB,QC,QO; The SN54ASC2408 is characterized for operation over the full military temperature range of - 55 cC to 125 cC. The SN74ASC2408 is characterized for operation from - 40 cC to 85 CC. absolutemaxiinum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA do.uments .ontsin information • urlift! IS of publi.ltion dsIJ. Products .onform to opacifi.atio•• ,Ir thl "'ml of Texal Instruments :=~l;"[n':.':.'li ~.:l::i:; :.r;:!:':t::." not Copyright © 1986, Texas Instruments Incorporated TEXAS . . INSTRUMENTS POST OFFICE BOX 666012 • DAI.LAS. TEXAS 75265 4-419 SN54ASC240B. SN74ASC240B FOUR-BIT RIPPLE COUNTERS timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) SN54ASC2408 MIN MAX 0 59.6 SN74ASC2408 MIN MAX 0 59.6 UNIT fclock Clock frequency tw Pulse duration A high or low 8.4 8.4 tsu Setup time CLRZ inactive -1.2 -1.2 ns th Hold time CLRZ active 4.2 4.2 ns CLRZ low 7.8 7.8 MHz ns electrical characteristics VT II C ....m m Input threshold voltage VCC = TA 5 V, VCC - 4.5 V to 5.5 V, ICC Supply current Ci LCLRZ Input capacitance I A Cpd SN54ASC2408 TEST CONDITIONS PARAMETER TA = VCC VCC dissipation capacitance TA = 5 V, TA tr = MAX 2.2 3 ns, 208 1.04 1.04 0.24 0.24 7.22 7.22 UNIT V 3463 25°C = tf = TYP 2.2 25°C MIN'to MAX = SN74ASC2408 MAX VI - VCC or 0, = 5 V, = 25°C Equivalent power TYP nA pF pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt FROM TO TEST (INPUT) (OUTPUT) CONDITIONS en OA ::r tpd CD CD .... til tPHL tpd A CLRZ A tPHL lltpLH CLRZ lltpHL Any A SN54ASC2408 SN74ASC2408 MIN TYP* MAX MIN 2.6 5.5 12.3 2.8 TYP* 5.5 MAX 3.7 8 17.7 4 8 15.9 4.8 10.2 23.1 5.2 10.2 20.7 aD a 5.9 12.5 28.5 6.4 12.5 25.5 1.3 2.2 4.6 1.4 2.2 4.2 OA 2.9 6 13.5 3.1 6 12.2 08 OC CL =0 4 8.5 18.9 4.3 8.5 17 5.1 10.7 24.3 5.5 10.7 21.8 6.2 13 29.7 6.7 13 26.6 08 OC CL = 1 pF aD a Any a Any UNIT 11.1 1.6 2.7 5.4 1.7 2.7 5 0.3 0.5 1.3 0.3 0.5 1.1 0.3 0.5 0.9 0.3 0.5 0.8 ns ns ns ns ns/pF t Propagation delay times are measured from the 44% point of VI to the 44% point of Va with tr = tf = 3 ns (10% and 90%). tpd '" propagation delay time, low-to-high· or high-to· low-level output tpHL .. propagation delay time, high·to-Iow-Ievel output lltpLH .. change in tpLH with load capacitance lltpHL .. change in tPHL with load capacitance 'Typical values are at VCC = 5 V, TA = 25°C. 4-420 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC2408, SN74ASC2408 FOUR·BIT RIPPLE COUNTERS DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven by either noninverting or inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the non inverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. count definition Bidirectional counters are available in software macros or can be. constructed using the' ASC2405 through 'ASC2407 4-bit registers. designing for testability Designers employing storage or bistable elements should consider testability of the design in its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintainence to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. TEXAS • INSTRUMENTS POST OFFICE BOX 665012 • DALLAS, TEXAS 75265 a 4-421 III ...c Q) Q) en :T CD CD ... U) 4-422 SN54ASC2500, SN74ASC2500 CRYSTAL·CONTROLLED OSCILLATORS PRODUCT PREVIEW D2939,AUGUST1986 SystemCell™ 2-j.lm HARDWIRED STANDARD CELL • Crystal-Contro"ed Oscillator for Generating On-Chip Clock Signals Up to 20 MHz • Specified for Operation Over VCC Range of 4,5 V to 5,5 V • Functional Operation Over VCC Range of 2Vt06V • logic symbol G JUL XI Y XO Dependable Texas Instruments Quality and Reliability description The SN54ASC2500 and SN74ASC2500 are crystal-contro"ed CMOS oscillators for use in SystemCe"'" designs. The input XI and the feedback output XO provide the connections for use with an external series resonant fundamental crystal. The' ASC2500 provides three cells supporting frequencies up to 20 MHz. Driving on-chip binary frequency dividers, a single oscillator can generate mUltiple system clocks and/or control functions. Each option is designated and called from the engineering workstation input using the following cell name and netlist label. FEATURES CELL NAME NETLIST MAXIMUM HDL LABEL FREQUENCY OSEOOLH Label: OSxOnLH XI,Y,XO; OSF02LH OSE06LH RELATIVE ...en CELL AREA TO NA210LH 5 MHz 129 20 MHz 150 800 kHz 128 G) G) .r:. o The SN54ASC2500 will be characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC2500 will be characterized for operation from -40°C to 85°C, ~hal8 of development. Characteristic data aRit othar ~:;~i::t:=:Sr~:t dt~Si~a=::I~r T:i::~~:~:~:::: products without notica. C Copyright © 1986, Texas Instruments Incorporated PRODUCT PREVIEW d••• mants .ontain information on products in thl formative or design ...caca TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-423 IIo .... I» I» en ::r (1) (1) .... en 4-424 SN54ASC2502, SN74ASC2502 RC OSCILLATORS ADVANCE INFORMATION 02939. AUGUST 1986 SystemCell™ 2-llm HARDWIRED STANDARD CELL • Single-Pin RC-Controlled Oscillator for Generating On-Chip Clock Signals • Input Hysteresis Improves Response to Analog Input Levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Dependable Texas Instruments Quality and Reliability logic symbol G JilL RC Y description The SN54ASC2502 and SN74ASC2502 are single-input RC-controllable CMOS oscillators for use in SystemCell"' IC designs. Input RC serves as the external connection point for the RC frequency-determining network. The ASC2502 has a bandwidth of 10 kHz to 1 MHz with the actual frequency dependent on the RC time constant. The oscillator incorporates hysteresis in the RC input threshold to sharpen the oscillator response. The cell is designated and called from the engineering workstation input using the following cell name and netlist label. II... FEATURES NETLIST CELL NAME OSE03LH HOL LABEL MAX OUTPUT RELATIVE FREQUENCY CELL AREA RANGE TO NA210LH 1 MHz 42.2 Label: OSE03LH RC. Y; U) Q) Q) .c The SN54ASC2502 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC2502 is characterized for operation from -40°C to 85°C. tn ... CO CO C absolute maximum ratings and recommended operated conditions SN54ASC2502 MIN Cext Rext f out External RC capacitor 10 External RC resistor 10 MAX SN74ASC2502 MIN 10 100 10 1 Output frequency MAX UNIT pF 100 1 k!l MHz Also, see Table 1 in Section 2. electrical characteristics TI=~T ""nl\lnITlnl\l~ PARAMFTFR TYP V 1.3 V TA - 25°e 2.3 2.3 Negative-going threshold voltage VCC ~ 5 V TA Vee - 5 V. ~ Vee - 4.5 V to 5.5 V. lec Supply Current TA ~ MIN to MAX. VI ~ Vee or 0 ei Input capacitance Vee - 5 V. TA - 25°e Equivalent power Vee - 5 V. tr - tf dissipation capacitance TA ~ 25°e ADVANCE INFORMATION do.uments contain information on new predaucts in the samplinp or ~reproduction phase 01 dauelopmenL Characteristic data and other specifications are subject to change without notice. _.- .. 1.3 Vt - epd MAX 25°C Vt + TA ~ 25°C VT-I TYP 3.6 VCC ~ 5 V. Vhys Hysteresis (VT + MAX 3.6 Positive-going threshold voltage 3 ns, 1026 V 61.5 nA 2.34 2.34 pF 2.44 2.44 pF Copyright © 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-425 SN54ASC2502, SN74ASC2502 RC OSCILLATORS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tPLH tPHL tPLH tpHL .1tPLH .1tPHL FROM (INPUT) TO (OUTPUT) RC Y CL SN74ASC2502 TYP* MAX MIN =a 6.8 14.7 4.2 TYP* 6.8 MAX 3.9 3.3 3.5 5.8 11.5 = 1 pF 5.8 7.6 12.9 4.3 16.7 3.9 7.2 16.3 4.6 4.2 7.6 7.2 14.9 14.4 0.4 0.8 2 0.4 0.8 1.8 0.6 1.4 3.4 0.7 1.4 2.9 y RC SNS4ASC2502 MIN CL .y RC TEST CONDITIONS tpropagation delay times are measured from the 50% point of VI to the 50% point of Vo with tr tpLH '" propagation delay time, low-to-high·level output tpHL ;a propagation delay time, high-to~low-level output .1tpLH '" change in tpLH with capacitance .1tpHL .. change in tpHL with capacitance *Typical values are at VCC = 5 V, TA = 25°C. II UNIT ns ns ns/pF (10% and 90%). DESIGN CONSIDERATIONS An RC network is used to drive the oscillator input. Oscillator output stability is primarily a function of the temperature coefficients of the components in the RC network. TYPICAL OUTPUT FREQUENCIES Rext (kill f out Coxt 100 100 Hz 0.1 ~F 100' 10 kHz 0.001 ~F 10 pF 100 VCC 700 kHz G ..Jl...f'L RC >-....- i - - - Y *On resistance = 150 (} 4-426 = tf = 3 ns 13.6 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 PRODUCT PREVIEW SN54ASC2503, SN74ASC2503 DIFFERENTIAL COMPARATORS 02939, AUGUST 1986 SystemCell™ ± 10% COMPATIBLE ANALOG CELL • Single 5-V Supply with • Very Low Power Consumption ... 60 ,.W Typical Tolerance • Wide Range of Common-Mode Input Voltage Includes Ground on P-Channel Inputs and VCC on N-Channel Inputs • External Voltage Reference logic symbol INZ~ OUT IN description The C0212LH and C0213LH standard cells are medium-speed comparators and operate from a single 5-volt supply. The e0212LH standard cell is a P-channel comparator, and the e0213LH is an N-channel comparator. The inputs are connected to ESD-protected bond pads, which are connected to an external voltage reference and the analog input. The comparators can be configured as either inverting or non inverting functions and are designed to drive the inputs of logic cells or buffers. The e0212LH P-chaimel comparator can be used with input voltages between (ground) and 3.5 volts. The e0213LH N-channel comparator can operate with input voltages between 1.5 volts and Vec. Each cell is designated and called from the engineering workstation input using the following cell name and netlist label: CELL NAME DESCRIPTION NETLIST RELATIVE CELL HDL LABEL AREA TO NA210LH 5 5 C0212LH P-C~annel Comparator C0212LH INZ,IN.OUT; C0213LH N-Channel Comparator C0213LH INZ,IN,OUT; II ... U) Q) Q) The SN54ASe2503 is characterized for operation over the full military temperature range of - 55 °e to 125 oe. The SN74ASC2503 is characterized for operation from - 40 °e to 85°C. absolute maximum ratings and recommended operating conditions .c en ...caca C See Table 1 in Section 2. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature. CL .. 1 pF C0213LH PARAMETER V,O Input offset voltage VICR Common-mode input voltage MIN ICC VCC product. without noli... ' TYP I UNIT MAX 50 0 mv 3.5 V dB 94 100 104 dB 11 11.7 Supply current =::::sr~:t d:i::.=::'!,T3i::~':::~::'~ MIN 116 97 116 Supply voltage rejection ratio at f = 1 kHz PRODUCT PREVIEW docume.ts coatain informati.n on products in the formltl.e or dllion ph••• of dlvalopment. Characteristic dati anil othar C0212LH MAX 50 1.5 Large-signal differential voltage amplification AVO CMRR Common-mode rejection ratio at f - 1 kHz i kSVR TYP fiR I p.A Copyright @ 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-427 SN54ASC2503, SN74ASC2503 DIFFERENTIAL COMPARATORS switching characteristics at Vee - PARAMETER 5 V. TA ... 25 °e C0213LH TEST CONDITION MIN tpLH tpHL AtPLH 100-mV input step with 5 mV of overdrive. Vref = VCC/2 AtPHL TYP MIN TYP 1.9 1.71 1:5 8 6 2.14 6 7 MAX UNIT ns ns/pF 1.71 tpLH tpHL TTL-level input step 0.2 to 3 V. AtpLH Vref 2.06 = 1:6 V 3 7 AtPHL • C m r+ m en ::T CD CD r+ (I) 4-428 C0212LH MAX TEXAS • INSTRUMENTS POST OFFICE BOX 656012 .' DALLAS, TEXAS 752,65 ~s ns/pF SN54ASC2507, SN74ASC2507 DYNAMIC DELAY ELEMENT PRODUCT PREVIEW 02939. AUGUST 1986 SystemCell™ COMPATIBLE MACRO CELL • Provides Dynamic Delay for Custom Delay Lines • Specified for Operation Over 4.5 V to 5.5 V • Vce logic symbol Range of I 3t012"0 I A---t Dependable Texas Instruments Quality and Reliability pv NV n n ~Y r-.. JOELAY ADJUST description The SN54ASC2507 and SN74ASC2507 are hardwired standard cells implementing an inverting delay buffer preceded by a transmission gate and driven by an SN54ASC2508/SN74ASC2508 control element. This provides a custom delay line with a typical delay tolerance range of ± 5%. The 'ASC2508 control element uses a reference clock signal as a time-base for generating the complimentary reference voltages, NV and PV, for controlling the data path delay output of the' ASC2507. The reference clock signal can be supplied from either an on-chip oscillator or an external source. CELL NAME DLE10LH NETLIST HOL LABEL Label: DLE10LH A.PV.NV,Y; TYPICAL RELATIVE , DELAY CL - 1 pF CELL AREA TO NA210LH 31012n. 7.41 II The SN54ASC2507 will be characterized for operation over the full military temperature range of - 55 °C to 125 DC. The SN74ASC2507 will be characterized for operation from - 40 DC to 85 DC. design considerations Data path delays are dependent on the accuracy of the time-base reference and the control block. The custom delay line can be broken into two sections: 1) the control section and 2) the delay section. The control section provides the NV and PV voltages for controlling the delay time through the data delay paths (see Figure 1). Copyright © 1986. Texas Instruments Incorporated PRODUCT PREVIEW documonts contain information on products in the formative or Jlesign ~hase of davalopment. Characteristic data anll athar :=:~:sat!=:srr;~t dte:i~a=::I~rT3i=~:~:~~=:: products without notice. ' TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-429 SN54ASC2507, SN74ASC2507 DYNAMIC DELAY ELEMENT design considerations (continued) IN A1 OUT Y1 IN OUT A2 OUT IN Yx Ax TIME BASE . REFERENCE RESET DELAY SECTION Y2 CONTROL BLOCK (INCLUDES 'ASC25081 } CONTROL SECTION FIGURE 1. BLOCK DIAGRAM OF CUSTOM DELAY LINE II C I» r+ I» en ::r The delay section offers two methods to program line delays. either by the number of delay elements in the data path or, by the voltage to the PV and NV lines. In Figure 2, the delay ratio between the delay 1, delay 2, and delay 3 data paths is set with the number of delay elements in each data line. Actual dehiy times through the delay elements can be determined and changed with the PV and NV voltages that are governed by the control block and the' ASC2508. Figure 2 shows the basic method of providing three different delay times using six' ASC2507s controlled by a single 'ASC2708. CD CD 'ASC2507 (/I 3to 12ns r+ - ... J PV FRDM 'ASC250a) NV 1------1 DELAY 1 JDELAY ADJUST 'ASC2507 DATA .... ........b - 'ASC2507 3 to 12 ns 3to 12n5 1------1 1------1 J DELAY ADJUST - 'ASC2607 'ASC2607 1------1 L.t:.. '--- 'ASC2507 3 to 12 ns 3to 12nl '--- DELAY 2 -I:::. J DELAY ADJUST 3 to 12 ns 1-------1 1------1 L..t:. J DELAY ADJUST ......t::. JDELAY '--ADJUST - ] p....- DELAY 3 DELAY ADJUST. FIGURE 2. THREE DELAY PATHS CONTROLLED BY A SINGLE CONTROL ELEMENT 4-430 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012. DALLAS, TEXAS 75265 SN54ASC2508, SN74ASC2508 CONTROL ELEMENT FOR DYNAMIC DELAY ELEMENT PRODUCT PREVIEW 02939. AUGUST 1986 SysternCell™ COMPATIBLE MACRO CELL • Provides Dynamic Control for Custom Delay Lines • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Dependable Texas Instruments Quality and Reliability logic symbol R P N n n PV NV CAP description The SN54ASC2508 and SN74ASC2508 are hardwired standard cell analog voltage control blocks for the 'ASC2507 dynamic delay elements, providing control voltages for the PV and NV inputs of the delay element. The 'ASC2508 control element uses a reference clock signal as a time-base for generating the complimentary reference voltages, NV and PV, to control the' ASC2507 element data path delays. The reference clock signal can be supplied from either an on-chip oscillator or an external oscillator. A single control element can control several delay paths and each path can have a different delay time. Typical time-base reference frequency range is from 5 MHz to 25 MHz. NETLIST CELL NAME HDL LABEL DLC10LH Label: DLC10LH P,N,R,CAP,PV,NV; a • ...en RELATIVE CELL AREA G) G) TO NA210LH .c 7.41 o The SN54ASC2508 will be characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC2508 will be characterized for operation from -40°C to 85°C. ...caca C DESIGN CONSIDERATIONS The timing reference, shown in Figure 1, is implemented with System Cell'" components to provide temperature and voltage-compensated digital reference inputs that activate the' ASC2508, which generates the NV and PV control voltages for the' ASC2507 delay element. The timing reference is unique for each application. Specific timing design information is made available in conjunction with the completion of a customer's ASIC specification. Copyright © 1986, Texas Instruments Incorporated PRODUCT PREVIEW do.uments .ontein i.formatio. on products in the formative or dasign ~h.sa of development. Characteristic data anll othar :::::.at:C:S r~:t dt-:lira=::'~r T3i::~~:::~::'~ products without .oli••. TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-431 SN54ASC2508, SN74ASC2508 CONTROL ELEMENT FOR DYNAMIC DELAY ELEMENT FROM SYSTEM INITIALIZATION REFERENCE ClK n TIMING REFERENCE (Information Available from TI design Centerl CAP n REFERENCE PV ANALOG OUTPUT NV VOLTAGES TO 'ASC2507 DlC10lH FIGURE 1. BLOCK DIAGRAM OF TIMING REFERENCE AND CONTROL ELEMENT FOR GENERATING ANALO~ VOLTAGES. PV AND NV II C m ....m en :::T CD CD .... (I) 4-432 . TEXAS " , INSTRUMENTS POST OFFICE BOX 665012 • DALLAS. TEXAS 75265 PRODUCT PREVIEW SN54ASC2519, SN74ASC2519 MEDIUM-DRIVE OPERATIONAL AMPLIFIER D2939. AUGUST 1986 SystemCell™ COMPATIBLE ANALOG CELL logic symbol • Single 5-Volt Supply • Internally Frequency Compensated • Inputs are ESD and Latch-Up Protected • Medium Output Drive Capability: 10 kO and 50-pF External Load IN~ OUT INZ description The SN54ASC2519 and SN74ASC2519 standard cells are medium-speed operational amplifiers that operate from a single 5-V supply. Their inputs and outputs are connected to ESD-protected bond pads for connection to external circuitry. The operational amplifiers can be configured as either inverting or noninverting amplifiers. For precision applications, a separate VCC and ground should be included in the design specification. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: NETLIST HOL LABEL AMC12NH IN.INZ.OUT; The SN54ASC2519 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC2519 is characterized for operation from -40°C to 85°C. • .... (I) G) G) absolute maximum ratings and recommended operating conditions .c: (J) CL External load capacitance RL External load resistance ....COCO C Also, see Table 1 in Section 2. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature, CL = 1 pF PARAMETER MIN via Input offset voltage VICR Common-mode input voltage 1 YOM Maximum peak output voltage swing 1 AVO Large-signal differential amplification Unity-gain bandwidth Bl Phase margin , 2 V READ description The SN54ASC3103 and SN74ASC3103 are dedicated. hard-wired standard-cell macros implementing a 3-port. high-speed register file organized as 16 words of 8 bits each. These devices provide cost-effective. closely coupled working registers to support high-performance. bus-structured processors embedded in ASICs. Multiple 8-bit-wide register files can be used to implement wide-word. scratch-pad memories. ADDRESS , AODRESS W",,, CA' DA4 The register macros contain embedded buffers to reduce input loading. This further simplifies implementation Of larger registers as standard library cells can be used to interface the register control inputs. The macro cells are designated and called from the engineering workstation input using the cell name and netlist in conjuction with a label developed as shown in the following table: CELL NAME 3 ~ D4 os I.. " u. a: a: ~ .c . CIl «I «I C NETLIST HOL LABEL Label: RF408LH CLK,WZ,WO,W1,W2,W3,RAO,RA 1,RA2,RA3,RBO,RB1,RB2,RB3, RF408LH 00.01,02.03,04,05,06.07 ,QAO,QA 1,QA2,QA3,QA4,QA5,QA6,QA 7, QBO,QB1,QB2,QB3,QB4,Q85,Q86,QB7; The 16-word-by-8-bit register organization is provided with a data-input port and two read ports that incorporate dedicated address inputs. As the read mode is asynchronous at both output ports. data entry and retrieval can occur simultaneously at all three ports. The dedicated address inputs permit full access to any of the 16-word locations from each port. An independent write enable. WZ. is provided to simplify implementation of the write cycle. When high. l;'" write enailie inmolls new aata entry. When low. the write function is enabled. and a positive transition at the clock input will store data applied at the data inputs in the register word addressed by the writeaddress inputs. WO thru W3. The SN54ASC31 03 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC3103 is characterized for operation from -40°C to 85°C. PRODUCTION DATA documents contain information currant as of publicatioR date. Products conform to specifications par the terms of TaXIS Instruments =~:~~i~a{::1~1i ~=:~i:r :.~o:::::::.:~~ not ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated. 4-455 SN54ASC3103, SN74ASC3103 16·WORD BY 8·BIT EDGE TRIGGERED 3·PORT REGISTER FILES WRITE FUNCTION TABLE WRITE DATA ADDRESS INPUTS REGISTER 00 •. 07 ADDRESSED ·. ·. ·. ·. ·. 000 .. 070 a ·. h ClK WZ WO W1 W2 W3 X t t t t H X X X X X l L L L L a L H L L H L L a L L L a L H H L L a t L H H a X H X H L X X X X ·. ·. OUTPUTS OF X h h Write word 1 h Write word 2 a h Write word 3 a ·. h Write word 1 5 No change a h a h h No change Write word 0 ·. ·. ·. h X FUNCTION 0°0 .. 070 READ FUNCTION TABLE APORT A PORT B PORT B PORT READ ADDRESS DATA OUTPUTS READ ADDRESS DATA OUTPUTS RAO RA1 L L RA2 L H L L L L H L L H H L L H L L H H H Ic .. .. RA3 OAQ •• 0A7 RBO RB1 RB2 RB3 aBO •• OB7 L Read word 0 H H H H Read word 15 Read word 1 L H H H Read word 14 Read word 2 H L H H Read word 13 Read word 3 L L H H Read word 12 L Read word 7 H L L L Read word 7 H Read word 15 L L L L Read word C» C» (I) :::r CD CD (I) ° SIGNAL DESCRIPTIONS NODE NAME(S) TITLE CLK Clock input DO,Dn OAO,OAn Data input Data output Data inputs OBO,OBn Data output Data outputs for B port RAO,RAn RBO,RB'n Read address input WO,Wn Write address WZ Write input Read address input FUNCTION Data present at the data inputs are stored in the addressed locations during a positive transition at the clock input. During steady-state (high or low) the clock is inactive. Data outputs for A port Read address inputs for A port Read address inputs for B port Write address inputs When low, data can be clocked into the addressed locations. When high, writing is inhibited, absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. Data stored in the register are retained if the supply voltage is not permitted to go below 2 volts minimum. Functional characteristics other than data retention are not specified when Vee = 2 V to 4.5 V. 4·456 ' T~XAS ~ INSTRUMENTS POST O~FleE ~ox 655012 • bAllAS. fS)(AS 76285 SN54ASC31D3, SN74ASC31D3 16-WORD BY 8-BIT EDGE TRIGGERED 3-PORT REGISTER FILES electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current Ci = = VCC VCC TA = 5 V, TA 4.5 V to 5.5 V, VI MIN to MAX = = TYP TYP 2.2 25°C 4.2 0.1 0.1 0.16 0.16 VCC = 5 V, TA = 25°C WZ = 5 V, = 25°C Equivalent power VCC dissipation capacitance TA V 69.6 On RBn tr = tf = 3 ns, UNIT MAX 2.2 VCC or 0, Wn Cpd SN74ASC3103 MAX ClK RAn Input capacitance SN54ASC3103 TEST CONOITIONS 0.14 0.14 0.14 0.14 0.14 0.14 0.23 0.23 289 289 ~A pF pF timing requirements over recommended ranges of supply voltage and operating free-air temperature MIN tw Clock pulse duration tsu Setup time before ClK f th Hold time after elK r High MAX UNIT 10.5 ns 10 low Write address 8.5 Data 3.5 Write enable 10 Write address 0 Data 6 Write enable 1 ns CI) ns tplH tpHl tPlH tpHl tpLH tpHl tplH tpHl Atpi H FROM (INPUT) TO (OUTPUT) RAn, RBn Any TEST CONDITIONS Cl ClK RAn, RBn = 0 Any Any ClK Any I"'I.lly Mlly Cl = 1 pF SN54ASC3103 SN74ASC3103 MIN TYP~ MAX MIN TYP~ MAX 3.3 6.3 13.4 3.6 6.3 3.7 6.2 13.6 3.9 6.2 12.1 4.7 10.3 22.4 5.1 10.3 19.9 en ... 4.2 10.2 20.6 4.6 10.2 18.3 7 3.9 4.2 7 13 7 14.7 15.1 7 13.5 5.1 11 23.7 5.5 11 21 .. 1 4.6 11 22.1 5 11 19.7 0.3 0.7 1.4 0.3 0.7 1.3 0.8 1.6 0.3 0.8 1.5 t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~Typical values are at VCC = 5 V, TA = 25°C. TEXAS • INSTRUMENTS POST OFFICE BOX 655012. DALLAS, TEXAS 75265 I = tf = CO CO UNIT 11.8 3.6 4 I 0.3 CD CD .r:. switching characteristics over recommended ranges of supply voltge and operating free-air temperature (unless otherwise notedl PARAMETERt II ... C ns ns ns ns I USJpr 3 ns (10% and 90%). 4-457 SN54ASC3103, SN74ASC3103 , 16-WORD BY 8-BIT EDGE TRIGGERED 3-PORT REGISTER FILES PARAMETER MEASUREMENT INFORMATION =:)( WRITE ADDRESS )C : I I WRITE ENABLE I I, I I DATA INPUT ,I CLOCK INPUT 1 1 ~ if :X )(: 1 ,: I I I I 1 I 1 tsu 1-1 ~ ~ ~ tsu ~~ ~It ~" tsu I I I I 1 th--.l I 1 th--.t I I ~I th FIGURE 1. SETUP AND HOLD TIMES II C \ \...--_----~/ WRITE ENABLE X~__________~X~___ DATA INPUT C» C» r+ en ::r CI) CI) r+ CLOCK INPUT ~1~~--~f ~ '(I) A PORT OUTPUTS ~ I I tw(L1 ---"'+I4---tw(H)--~~ It--- tpLH or t PHL '--+/ I ------~--------------~*~-I I B~ OUTPUTS ----------_____"'""'V"'1,..,--7'\~ __ Addresses for write and both reads are the same. FIGURE 2. CLOCK PULSE DURATION. PROPAGATION DELAY TIMES FROM CLOCK 4-458 tEXAS • INSTRUMENTs POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 SN54ASC3103, SN74ASC3103 16-WORD BY 8-BIT EDGE TRIGGERED 3-PORT REGISTER FILES PARAMETER MEASUREMENT INFORMATION ADDRESS~ RAn I ----------------------------------- !---tPLH or tPHL ~ OUTPUT CAn 7'\_ ---------~~---------------- ADDRESS~ RBn ~~------------------------------------------~tPLH O~:~T or tPHL~ ______________ _J)(~_____________________________ ______________F_IG_U_R_E_3_._P_R_P_P_A_G_A_T_IO_N_D_E_L_A_Y_T_I_M_E_S_F_R_O_M_R_E_A_D_A_D_D_R_E_S_S______________ ~ ...en DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly with cells and macros available in the TI standarq cell library. The inputs can be driven by either noninverting or inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. CD CD J::. tJ) ... CO CO C All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. designing for testability Designers employing register elements should consider testability of the design in its final form. The need to provide either direct or multiplexed input pins fQr controlling the register will enhance both testing at the device level and troubleshooting under field maintenance conditions. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system mqintenance to be re!duced significantly. TEXAS. INSTRUMENTS POS1 OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-459 II c .... Q) Q) t/) ::r CD CD .... en 4-460 PRODUCT PREVIEW SN54ASC3200, SN74ASC3200 CompilerCell™ READ-ONLY MEMORIES 02639. AUGUST 1986 SystemCell™ COMPATIBLE 2-/lm CompilerCell'" ROMs logic symbol ROM [W x BI 4> description The SN54ASC3200 and SN74ASC3200 are read-only memory (ROM) CompilerCell"'. They are compatible with TI's System Cell'" library and can be a powerful aid to the solution of cell design problems. They can be selected with bit capacities between 512 and 65,536. AO O} An n 'A~C3200 A W - 1 I ClKl ClK2 CLOCKS ClK2Z EN These ROMs are clock controlled, which permits pre-charging of some circuit regions resulting in speed advantages, lower power dissipation, and optimum use of silicon. The 'ASC3200 is a nonvolatile memory whose bit contents are determined by the presence or absence of transistors in the rows and columns of the ROM matrix. The transistors are formed during the custom patterning process defined by the user. 0 QO IOATV i-1 II... Qi-l HDL CALL LABEL: ROM For bit capacities up to 16K, a single array is used. For greater capacities, a double array offers 64K-bit capacity for only 70% more silicon area. A choice of multiplexing ratios is offered between the array columns and the output word, which allows greater flexibility in the layout of the cell. CI) ADO ... ADn.PHllB.PHI2,PHI2B,POWD, CI) CI) OUTO ... OUTn; ..c:: o ... CIS CIS o TI Compiler Software permits rapid programmation and verification of the chosen pattern, as well as rapid generation of the desired ROM bit organization. The possible combination of ROM organizations are shown in Tables 1 and 2. TABLE 1. SINGLE ARRAY PARAMETER LIMITS PARAMETERS Number of Words (W 2: 2n) Word length (B = i) Total Number of Bits (W x B) MIN 8 MAX 2048 4 32 512 16384 COMMENTS Must be multiple of 4 Even or Odd TABLE 2. DOUBLE ARRAY PARAMETER LIMITS MIN PARAMETERS Number of Words IW 2: 2n) Word Length IB = i) Total Number of Bits IW x B) 8 MAX . 4096 4 64 512 65536 .;:.e:~::t:=:srr:Ct ~if8=::I~rT:~::'::':~:~::: products without notice. Must be Even Copyright © 1986, Texas Instruments Incorporated PRODUCT PREVIEW documents contain information on products in the formative or design ~hase of dBvalopmant. Characteristic data anit othar COMMENTS Must be multiple of 4 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-461 II C I» ~ I» o ::::r CD CD ~ til 4-462 ADVANCE INFORMATION SN54ASC3430, SN74ASC3430 CompilerCeWM PIPELINE TEST REGISTERS 02939. AUGUST 1986 SystemCell™ COMPATIBLE 2-llm INTERNAL STANDARD CELL logic symbol • n-BIT PIPELINE TEST REGISTER desc~iption 'ASC3430 The SN54ASC3430 and SN74ASC3430 CompilerCeU'" Pipeline Test Registers assist the designer in solving the problem of testing VLSI cell designs. The large gate counts and circuit complexities permitted by 2-ILm technologies result in functional blocks so embedded within the circuit that their inputs/outputs can neither be monitored or initialized without the use of very large test pattern sets of I/O cells assigned specifically for test purpose. The PTR is an n-bit register whose size is determined by the user in the design phase (n = 4 to 32). The principal modes of operation are as a parallel master-slave latch for holding and latching data buses or as a serially-loaded unidirectional register that allows test stimuli and results to be shifted around the circuit. SI I I PLD PLD eLK1 51 L CLOCKS CLK2 SO H H SO L H L H MODE HOLD LOAD/HOLD SHIFT TEST SUB-MODES IN MODE 3 PLD SUB-MODE H PAR LOAD L LOCAL HOLD MODE SUB-MODES IN MODE 4 81 Dl D QO. Dn D Qn 80 81 H H DO Ql Sections of a logic circuit may be self tested using a pair of PTRs. The first PTR is configured as a pseudo-random pattern generator that delivers random values at a number of outputs over a time period. The second PTR, arranged as a signature analyzer, takes the outputs from the circuit under the test over a number of clock cycles and condenses them into a test signature whose value depends totally on the tested outputs over the specified time period. At the end of the period, the signature is serially down-loaded from the PTR and compared with a known "fault free" value in order to arrive at a pass/fail decision. The modes of operation are listed in Table 1 and described in the following paragraphs. ....en CI) CI) .s:: en ....caca o TABLE 1. MODES OF OPERATION MAIN MODE SUB·MODE 51 SO HOLD L L USER FUNCTIONAL L H C::::WIE:T .. ~ TEST H H PLD B1 BO LOCAL HOLD L PARALLEL LOAD H X X X X NONE ."--.- ."v."r: PATTERN GENERATE X L L CIRCULAR SHIFT x L H SIGNATURE ANALYZE X H L LOCAL HOLD x H H Copyright © 1986, Texas Instruments Incorporated ADVANCE INFORMATION do.umants .ontain ~,:!:':=O:;h~~~o~r::a;'~~~~:::::=:~ _ and othar specifications are .ubject 10 change without notice. TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALl.AS, TEXAS 75286 4-463 SN54ASC3430, SN74ASC3430 CompilerCell™ PIPELINE TEST REGISTERS Hold AU data is retained in the registers. If all PTRs in the system have common pins, then all data is held in all registers. Shift Data may be serially loaded into the register via pin DO. The data passes through a two-bit control register whose ouputs BO and B1 determine the sub-mode. . User Functional Data is parallel loaded into the register or held according to the setting of input PLD. In this mode, each element of the register is isolated from its neighbor and acts as an independent data latch. in sub-mode "Local Hold", data may be held in just a single register while the remaining PTRs may be performing other tasks. Test In this ~ode, there are four available sub-modes. Sub-mode O. Pseudo-Random Pattern Generation The outputs from the register are fed back to the input via a selected number of ExclusiveOR gates. This is a well-documented method of producing a sequence of pseudo-random signals from a register for use as test signals for a logic circuit. A four-bit example is shown in Figure 1. Sub-mode 1. Circular Shift Connection in the circular shift mode causes the last output of the PTR to be connected to the first. Sub-mode 2. Signature Analysis As with Pattern Generation, the Signal Analyzer has data fed back to its first input as indicated in Figure 2. The input of each section of the register is determined by both the preceding output and the output from the circuit under test. A characteristic data signature is built up on the register outputs. This signature is dependent on all of the previous output states of the circuit under test. After a number of clock cycles, the signature of a faulty circuit will be different from that of a gOOd one. Sub-mode 3. Local Hold This sub-mode permits a user to command one or more PTRs in a system to hold its data. FIGURE 1. PTR AS A PSEUDO-RANDOM PATTERN GENERATOR FIGURE 2. 4-BIT PTR AS A SIGNATURE ANALYZER 4-464 TEXAS ." INSIRUMENTS POST OFfiCE BOX 655012 • DALLAS. TEXAS 75266 PRODuct PREVIEW SN54ASC3800, SN14ASC3800 CompilerCeWM PROGRAMMABLE LOGIC ARRAYS 02939, AUGUST 1986 SystemCell™ COMPATIBLE 2-l'm INTERNAL STANDARD CELL description functional block diagram The SN54ASC3800 and SN74ASC3800 CompilerCeU'· logic arrays are semicustom PLAs having many of the features of the current packaged PLAs. The cells operate dynamically from a system-derived clock and offer significant power savings compared to the packaged devices. Cell complexity is decided at the design stage and can be tailored for the application resulting in economical use of silicon. Texas Instruments software generates the PLA automatically from a library of primitive cells according to the user's function tables or Boolean equations. The software will also produce an HDL description, a simulation model, timing diagrams, and an individual data sheet. INPUT BUFFERS INO C> AND MATRIX OR MATRIX & ,,' 2mXp ,,' ,,' INm m = number of inputs n = number of outputs p = number of product terms = qD + q 1 + ... qn - 1 qx = number of inputs to OR gate x (x = D ... n) OUTO OUT1 OUTn·' OUTn + qn The cells are specified by number of inputs, m, number of product terms, p, and number of outputs, n. The internal matrix follows the usual arrangement of an AND matrix and an OR matrix, Each product term ANDs together a specified number of inputs, and each output comes from a specified number of product terms via an OR gate. Maximum values for the parameters are shown below: INPUTS PRODUCT m p 128 ... U) CD CD .c U) ...caca OUTPUTS TERMS 64 • C n 32 Circuit design is optimized around a 32-input X 64-product term X 32-output design that will run at a speed of 20 MHz. The SN54ASC3800 will be characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC3800 will be characterized for operation from 0 DC to 70 DC. PRODUCT PREVIEW d•• umenls .ontain information .n products in the formative or de.ign ~h••••f devalopmant, Chara.tari.tl. data .n~ .ther specifications .r. design gaals. Taus Instruments reserves the right to change ar discontinue thaSl products without natica. Copyright © 1986, Texas Instruments Incorporated, TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-465 III ...C I» I» C/) :::r C'D ... CD til 4-466 SN54ASC4002, SN74ASC4002 4-INPUT POSITIVE-NOR GATES 02939, AUGUST 1986 SystemCell™ 2-llm INTERNAL STANDARD CELL logic symbol • Choice of Two Performance Levels • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability A3YB D FUNCTION TABLE INPUTS positive logic equation Y = A+B+C+D = ABeD description Y c OUTPUT A B C D Y H X X X L X H X X L X X H X L X X X H L L L L L H The SN54ASC4002 and SN74ASC4002 are 4-input positive-NOR gate CMOS standard cells that implement the equivalent of one-half of the SN54HC4002 or SN74HC4002, The standard-cell library contains two physical implementations to provide the custom IC designer a choice between two performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: . N0410LH NETLIST TYPICAL RELATIVE HDL LABEL DELAY CELL AREA CL - 1 pF 4.1 ns TO NA210LH Label: N04nOLH A,B,C,D,Y; N0420LH 2.6 ns (I) Q) Q) FEATURES CELL NAME •.. .c en .. ca ca 1.5 2,5 C The SN54ASC4002 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC4002 is characterized for operation from - 40°C to 85 °C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PROPUCTION DATA do.umllft1S ...ntai. information currant a8 !o, publication data. Products conform to ~p8Cific.tion. per the terms of Texa. Instruments standard warranty_ Production processing does not .......ril' i.clude \a~1iriil of all para mete... Copyright © 1986, Texas Instruments Incorporated TEXAS . . INST~UMENTS POST OFFICE BOX 666012 • DALLAS, TEXAS 75265 4-467 SN54ASC4002, SN74ASC4002 4-INPUT POSITIVE-NOR GATES electrical characteristics VT Input threshold voltage VCC = 5 V, TA = TVP VCC - 4.5 V to 5.5 V, VI - VCC or 0, ISN74ASC4002 TA ICC Supply current Input capacitance Equivalent power VCC = 5 V, VCC - 5 V, dissipation capacitance TA = = N0420LH MAX TVP MAX 2.2 2.2 25°C ISN54ASC4002 Ci Cpd N0410LH TEST CONDITIONS PARAMETER V 177 277 10.6 MIN to MAX TA = 25°C tr - tf = 3 ns, 25°C UNIT 16.6 nA 0.11 0.22 pF 0.35 0.55 pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) N0410LH PARAMETERt tpLH tpHL II C ... I» I» tPLH tpHL tpLH .... CIl FROM TO TEST (INPUT) (OUTPUT) CONOITIONS A Y CL = 0 A Y CL = 1 pF A Y L>tPHL SNS4ASCSOO3 Typt MAX MIN SN74ASCSOO3 Typt MAX MIN 3 6 19 3.1 6 17 1.1 1.4 2.3 1.1 1.4 2.2 6.3 13 35 6.B 13 32 1.3 2 3.B 1.4 2 3.5 3.4 7 17 3.7 7 15 0.2 0.6 1.5 0.2 0.6 1.3 UNIT ns ns ns/pF IPF08LH PARAMETER§ tpLH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y tpHL tPLH tpHL L>tPLH L>tPHL A Y A Y CL CL = = 0 1 pF SNS4ASCSOO3 MIN TYPt SN74ASCSOO3 MAX MIN Typt MAX 3.5 7 18 3.7 7 17 1.1 1.5 2.3 1.1 1.5 2.2 7 14 35 7.5 14 32 1.3 2.1 3.B 1.4 2.1 3.5 3.5 7 17 3.B 7 15 0.2 0.6 1.5 0.2 0.6 1.3 UNIT ns ns ns/pF tTypical values are at VCC = 5 V, TA = 25°C. Total input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. The value shown includes the pull-up tap. § Propagation delay times times are measured from the 1.3 V point of VI (0 to 3 V) to the 44% point of Va with tr = tf = 2 ns (10% and 90%). tPLH == propagation delay time, low-to-high-level output tpHL == propagation delay time, high-to-Iow-Ievel output .6.tpLH == change in tPLH with load capacitance .6.tpHL == change in tpHL with load capacitance :j: 4-486 ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5004, SN74ASC5004 CMOS-COMPATIBLE INVERTING INPUT BUFFERS WITH PULL-UP TAP D2939, AUGUST 1986 SystemCell™ 2-j.lm INPUT STANDARD CELL • ns Typical Propagation Delay with 1-pF Load • Incorporates Circuitry to Protect Against ESD and Latch-Up logic symbol TAP=-:1 • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • ~ A--y-Y FUNCTION TABLE INPUT A Dependable Texas Instruments Quality and Reliability OUTPUT Y' H L L H positive logic equation Y=A description The SN54ASC5004 and SN74ASC5004 are inverting input buffer CMOS standard cells that interface external CMOS inputs with CMOS internal cells. The cell is designated and called from the engineering workstation input using the following cell name and netlist label: 4 ... fI) FEATURES NETLIST CELL LAYOUT HDL LABEL ASPECT RATIO Label: IPF02LH A,TAP.Y; minimum width CELL NAME IPF02LH G) G) RELATIVE .t:. CELL AREA UJ TO NA210LH 35 The cell incorporates a pull-up tap to simplify termination of the input. This tap may be used in conjunction with an active pull-up/pull-down terminator in the 'ASC237x group or the pull-up tap may be left unconnected. When the terminator is used it ensures that the input will be driven to a high or low logic level, thereby avoiding exposure to a high-impedance or floating condition. Refer to Section 7 for implementation of the pUll-Up. ...caca C The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. The SN54ASC5004 is characterized for operation over the full military temperature range of - 55°C to 1?f1 or. Thp ~N74A~rt;n()4 i~ ,...h~r~,..,,:~ri·7I'~~ oF,:,!" 'Y::'~!"?!~~~ ~!"~~ - ~0 or: ~~ ~= 0C'. absolute maximum ratings and recommended operating conditions See Table 2 in Section 2. PRODUCTION DATA documents contain information currant as of publication data. Pradoct. conform to spacificatiDns par the terms of Taxas Instruments =~=~~i~8{nr:I~1e =:~i:r :'f=::::r:::s not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-487 SN54ASC5004, SN74ASC5004 CMOS-COMPATIBLE INVERTING INPUT BUFFERS WITH PULL-UP TAP electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER SN54ASC5004 TEST CONDITIONS TYP VT Input threshold voltage Vee - 5 V, II Input current VI - 0 to Vee lee Supply current VI = Vee or 0 VI - 3.15 V or 0.9 V ei Intrinsic input c.apacitance t Vee TA Equivalent power Vee tr dissipation capacitance TA epd TYP 2.5 TA - 25°e = 5 V, = 5 V, = 25°e SN74ASC5004 MAX = 25°e = tf = 3 ns, MAX 2.5 UNIT V ±1 ±1 ~A 999 4.37 60 4.14 rnA nA 2.3 2.3 pF 2 2 pF t Total input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. The value shown includes the pull-up tap. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER* tpLH IIo I» r+ I» en :::T CD CD r+ fn tpHL tPLH tpHL .l.tpLH .l.tPHL FROM (INPUT) TO (OUTPUT) A Y A Y A Y TEST CONDITIONS eL eL =0 = 1 pF SN54ASC5004 TYP§ MAX MIN SN74ASC5004 TYP§ MAX MIN 0.4 0.7 1.2 0.5 0.7 1.2 0.3 0.6 1.5 0.3 0.6 1.3 0.7 1 1.B 0.7 1 1.B 0.5 1 2.3' 0.6 1 2.1 0.2 0.2 0.3 0.7 0.2 0.3 0.6 0.4 0.9 0.2 0.4 O.B UNIT ns ns ns/pF * Propagation delay times are measured from the 50% point of VI to the 44% pOint of Vo with tr = tf = 4 ns (10% and 90%). tpLH '" propagation delay time, low-to-high-Ievel output tpHL " propagation delay time, high-to-Iow-Ievel output .l.tpLH '" change in tPlH with load capacitance .l.tPHL '" change in tpHL with load capacitance §Typical values are at Vee =' 5 V, TA = 25 oe. DESIGN CONSIDERATIONS Refer to Section 7. 4-488 'If TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75266 SN54ASC5005, SN74ASC5005 TTL-COMPATIBLE INVERTING INPUT BUFFERS WITH PULL-UP TAP 02939. AUGUST 1986 SystemCelr M 2-lJm INPUT STANDARD CELL • 2.1 ns Typical Propagation Delay with 1-pF Load • Incorporates Circuitry to Protect Against ESD and Latch-Up • logic symbol Specified for Operation Over VCC Range of 4.5 V to 5.5 V FUNCTION TABLE • • Functional Operation Over VCC Range of 2Vt06V Dependable Texas Instruments Quality and Reliability INPUT OUTPUT A V H L L H positive logic equation Y=A description The SN54ASC5005 and SN74ASC5005 are inverting input buffer CMOS standard cells that translate TTL input voltage levels to CMOS internal-cell voltage levels. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: CELL NAME IPE05LH IPF05LH CELL LAVOUT HOL LABEL ASPECT RATIO Label: IPF05LH A.TAP.V; 28.6 31.5 (/) o CELL AREA TO NA210LH minimum width .c «S «S RELATIVE minimum height en II) II) ... FEATURES NETLIST II... These input cells incorporate a pull-up tap to simplify termination of the input. This tap may be used in conjunction with an active pull-up/pull-down terminator from the' ASC2370 through' ASC2374 group, otherwise the pull-up tap may be left unconnected. When the terminator is used it ensures that the input will be driven to a high or low logic level thereby avoiding exposure to a high-impedance or floating condition. The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current "'''''''gemem lecrmiques Tor me cell 10 recover Trom exposure to nlgn currents ot up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. The SN54ASC5005 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5005 is characterized for operation from -40°C to 85°C. Copyright © 1986. Texas Instruments Incorperated PRODUCTION DATA documonts contain information current as of publication date. Products conform to specifications per the terms of Taxas Instruments :'~~:~~i~a[::1~1i ~:~::i:; :1~O::;::::~:r~':" nat TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-489 SN54ASC5005, SN74ASC5005 TTL·COMPATIBLE INVERTING INPUT BUFFERS ·WITH PULL·UP TAP electrical characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) PARAMETER VT Input threshold voltage Vee II Input current lee Supply current VI V, V, IPE05LH V, V, IPF05LH ei Cpd SN54ASC5005 TVP MAX 1.3 TEST CONDITIONS Intrinsic input = = = = = Vee capacitance t = 5 V, TA dissipation capacitance 25°e Vee or 0 Vee orO 2 V or O.B V ±1 905 1.21 Vee orO 2 V or O.B V 75B 1.21 = 5 V, TA Vee = 5 V, TA = 25°e Equivaleht power = tr = 25°e = tf = SN74ASC5005 tvp MAX 1.3 ±1 54.3 1.13 45.5 1.13 UNIT V ~A nA mA nA mA 2.1 2.1 pF 16 16 pF 3 ns, trotal input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. The value shown includes the pull-up tap. switching characteristics over recommended ranges of supply voltage and operating free-ait temperature (unless otherwise noted) PARAMETER* tpLH tpHL tpLH tpHL .l.tpLH .l.tpHL FROM (INPUT) A TO (OUTPUT) V A V A V TEST CONDITIONS eL eL =0 = 1 pF SN54ASC5005 MIN TVP§ MAX 0.6 0.9 2 MIN 0.6 0.4 1.6 O.B 1 0.3 SN14ASC5005 TVP§ MAX 0.9 2.8 1.3 1.9 1.3 0.5 6.2 2.2 4.2 0.4 0.9 1.7 0.8 1 0.3 t Propagation delay times are measured from the 1.3 V point of VII 0 to 3 VI to the 44% pOint of Vo with tr tpLH .. propagat;on delay time, low-to-high·level output tpHL '" propagation delay time, high-to-Iow-Ievel output .l.tpLH '" change in tpLH with load capacitance .l.tpHL '" change in tPHL with load capacitance §Typical values are at Vee = 5 V, TA = 25°e. DESIGN CONSIDERATIONS Refer to Section 7. 4-490 TEXAS . " INSTRUMENTS POST OFFICE BOX 65~O' 2 • DALLAS, TEXAS 15265 = tf 0.9 0.9 2.8 1.3 1.9 0.4 2 1.3 5.5 2 3.8 0.8 UNIT ns ns ns/pF = 2 ns (10% and 90%1. SN54ASC5006. SN74ASC5006 CMOS-COMPATIBLE NONINVERTING INPUT BUFFERS 02939, AUGUST 1986 SystemCell'" 2-/Am INPUT STANDARD CELL logic symbol • Typical Propagation Delay with 1-pF Load 1.9 ns for the IPE01LH 1.1 ns for the IPF01 LH • Incorporates Circuitry to Protect Against ESD and Latch-Up . • Specified for Operation Over VCC Range of 4.5 V to 5.5 V A--t>--V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Ouality and Reliability FUNCTION TABLE INPUT OUTPUT A V H H L L positive logic equation Y=A description The SN54ASC5006 and SN74ASC5006 are noninverting input buffer CMOS standard cells that buffer CMOS input voltage levels to CMOS internal-cell voltage levels. This cell function eixsts in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: IPE01LH IPF01LH NETllST CELL LAVOUT HOL LABEL ASPECT RATIO Label: IPF01 LH A, V; U) CD CD .c .. (/) CO CO FEATURES CELL NAME II .. RELATIVE C CELL AREA TO NA210LH minimum height 31 minimum width 31.5 The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. The SN54ASC5006 is characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC5006 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 2 in Section 2. PRODUCTION DATA documlnts ..ntain inlormati,,~ .u"••t .s 01 publi••tion d.te, Products •••Iomi 10 specifications par the terms of Taxas Instrumen~ standard warranty,. Production proclssing daes not necessarily i~clud. testing of all parameters. Copyright TEXAS . " INSTR.UMENTS POST OFFICE BOX 655012! DALLAS. TEXAS 75265 Cl 1986. Texas Instruments Incorporated 4-491 SN54ASC5006, SN74ASC5D06 CMOS·COMPATIBLE NONINVERTING INPUT BUFFERS electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT Input threshold voltage Vee = 5 V. II Input current VI - Vec or 0 lec Ci epd SN54ASC5006 TEST CONDITIONS TYP SN74ASC5006 MAX TYP 2.5 TA - 25°e MAX UNIT V 2.5 ±1 ±1 pA rnA IPE01LH Vce or 0 VI VI = 3.15 V or 0.9 V 1218 2.93 73.1 2.62 IPF01LH VI = Vce or 0 VI = 3.15 V or 0.9 V 1353 Bl.2 nA 2.95 2.62 rnA Supply current Intrinsic input capacitance t Vee = 5 V. TA = 25°C Equivalent power VCC = 5 V. tr = tf = 3 ns. dissipation capacitance TA = 25°C nA 2 2 pF 3 3 pF t Total input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise n o t e d ) ' . IPE01LH IIc PARAMETER* . tpLH tpHL ... D) tpLH CI) tpHL C/) .o.tpLH iCD a .o.tpHL .FROM TO TEST (INPUT! (OUTPUT! CONDITIONS A A A Y CL Y CL =0 = 1 pF Y SN54ASC5006 TYP§ MAX MIN 0.9 1.7 3.7 1 1.7 1 1.9 SN74ASC5006 TYP§ MAX MIN 1 1.7 3.4 3.3 1 1.7 3.1 4.1 1.1 1.9 3.B 1.1 1.9 3.7 1.1 1.9 3.4 0.07 0.2 0.5 0.09 0.2 0.4 0.1 0.2 0.5 0.1 0.2 0.4 UN1T ns ns ns/pF IPF01LH PARAMETER* tpLH tpHL tpLH tpHL .o.tPLH .o.tpHL FROM TO TEST (INPUT) (OUTPUT! CONDITIONS A A A Y Y Y eL CL =0 = 1 pF SN54ASC5006 TYP§ MAX MIN 0.5 0.7 0.2 0.7 1.2 0.7 1.2 0.7 1.5 0.3 0.7 1.4 1.1 1.9 0.7 1.1 1.8 0.5 1.1 2.3 0.6 1.1 2.1 0.2 0.4 0.7 0.2 0.4 0.6 0.2 0.4 0.9 0.2 0.4 O.B * Propagation delay times are measured from the 50% point of VI to the 44% point of Vo with tr tpLH " propagation delay time. low-to-high-Ievel output tPHL " propagation delay time. high-to-Iow-Ievel output .o.tpLH " change in tpLH with load capacitance .o.tpHL " change in tpHL with load capacitance § Typical values are at VCC = V. T A = 25°e. DESIGN CONSIDERATIONS Refer to Section 7. 4-492 SN74ASC5006 TYP§ MAX MIN 0.5 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 = tf = 4 UNIT ns ns ns/pF ns (10% and 90%). SN54ASC5007, SN74ASC5007 TTL-COMPATIBLE NONINVERTING INPUT BUFFERS 02939, AUGUST 1986 SystemCell™ 2-/Am INPUT STANDARD CELL logic symbol • Typical Propagation Delay with 1-pF Load 2.1 ns for the IPE04LH and IPF04LH 1.6 ns for the IPF12LH • Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • • A~Y FUNCTION TABLE Functional Operation Over VCC Range of 2Vt06V INPUT OUTPUT A Y H H L L Dependable Texas Instruments Quality and Reliability positive logic equation Y=A description The SN54ASC5007 and SN74ASC5007 are non inverting input buffer CMOS standard cells that translate TTL input voltage levels to CMOS internal-cell voltage levels. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical. for simplicity only one version (the"F" cell) will be contained in the engineering workstation cell libraries, Determination of the most appropriate cell version will be made during the layout stage, The options are designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: FEATURES CELL NAME IPE04LH IPF04LH IPF12LH NETLIST CELL LAYOUT HDL LABEL ASPECT RATIO Label: IPF04LH A,Y; Label: IPF12LH A, Y; a... II) CD CD .c en ...caca C RELATIVE CELL AREA TO NA210LH minimum height 28,6 minimum width 31.5 37.5 minimum width The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes. thereby negating most common sources that can produce a latch-up condition, Th .. SN54ASC5007 is characterized for oDeration over the full military temperature range of - 55°C to 125°C, The SN74ASC5007 is characterized for operation from - 40°C to 85 DC, absolute maximum ratings and recommended operating conditions See Table 2 in Section 2, PRODUCTION DATA d...manls .ontain information currant as of publication data. Products conform to spacifications par the tarms of TaxIs Instruments ::,':':::i~ai~:I'::l~ ~:~:~i:r :I\"::"':=~:.s not Copyright © 1986, Texas Instruments Incorporated TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-493 SN54ASC5007, SN74ASC5007 TTL-COMPATIBLE NONINVERTING INPUT BUFFERS electrical characteristics over r.ecommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER = VT Input threshold voltage Vee II Input current VI - Vce or 0 lec Supply current SN54ASC5007 TEST CONDITIONS TA 5 V, = TYP II :l1li .... UNIT V ±1 ±1 pA nA rnA nA rnA VI - Vee or 0 VI - 2 V or 0.8 V 1040 1.21 62.4. 1.13 IPF04LH VI - Vee or 0 VI - 2 V or 0.8 V 1307 78.4 1.2 1.13 IPF12LH VI = Vce or 0 VI - 2 V or 0.8 V 1303 78.2 nA 3 2.81 rnA Intrinsic input capacitance t IPF04LH Vee = 5 V, TA = 5 V, = 25°e Equivalent power VCC dissipation capacitance TA = 25°e tr = tf = 1.9 1.9 2.2 2.2 2.8 2.8 18 18 3 ns, pF pF t Total input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) IPE04LH and IPF04LH C m m MAX 1.3 IPE04LH IPF12LH Cpd TYP 1.3 25°C IPE04LH ei SN74ASC5007 MAX PARAMETERt rn tpLH CD CD tpLH tpHL ::r .... tn tpHL dtpLH dtpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y A Y A Y eL CL =0 = 1 pF SN54ASC5007 TYP§ MAX MIN 0.8 1.3 1.2 2.3 1 SN74ASC5007 TYP§ MAX 2.5 MIN 0.8 1.3 2.3 5.4 1.3 2.3 4.8 1.6 3.2 1 1.6 3 1.4 2.6 6.2 1.5 2.6 5.5 0.1 0.3 0.8 0.1 0.3 0.7 0.1 0.3 0.8 0.1 0.3 0.8 SN54ASC5007 TYP§ MAX MIN UNIT ns ns nsipF IPF12LH PARAMETER tpLH tpHL tPLH tpHL dtpLH dtpHL * FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y CL = 0 A Y CL = 1 pF A Y MIN SN74ASC5007 TYP§ MAX 0.5 1.1 2 0.6 1.1 1.9 0.8 1.6 3.5 0.9 3.1 0.7 1.4 2.7 0.7 1.6 1.4 1 1.8 4.2 1 1.8 3.7 0.1 0.3 0.7 0.1 0.3 0.7 0.1 0.2 0.7 0.1 0.2 0.6 *Propagation delay times are measured from the 1.3 V point of VI (0 to 3 V) to the 44% point of Vo with tr '= tf tpLH '" propagation delay time, low-to-high-Ievel output tpHL ~ propagation delay time, high-to-Iow-Ievel output dtpLH '" change in tpLH with load capacitance dtpHL '" change in tpHL with load capacitance §Typical values are at Vee = V, TA = 25°C. DESIGN CONSIDERATIONS Refer to Section 7. 4-494 TEXAS . . INSTRUMENTS POST OFFICE BOX 665012 • DALLAS. TEXAS 75265 2.5 UNIT ns ns nSipF = 2 ns (10% and 90%). SN54ASC5010, SN74ASC5010 TTL-COMPATIBLE INVERTING SCHMITT-TRIGGER INPUT BUFFERS WITH PULL-UP TAP D2939, AUGUST 1986 SystemCell"" 2-/-Im INPUT STANDARD CELL • 7.5 ns Typical Propagation Delay with 1-pF Load • Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.6 V • Functional Operation Over VCC Range of 2Vt06V • logic symbol FUNCTION TABLE Dependable Texas Instruments Quality and Reliability INPUT OUTPUT A Y H L L H positive logic equation Y=A description The SN54ASC5010 and SN74ASC5010 are inverting Schmitt-trigger input buffer CMOS standard cells that translate TTL input voltage levels to CMOS internal-cell voltage levels. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the finallC area tD be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: II ... U) Q) Q) .c (f) ...mm FEATURES CELL NAME IPE10LH NETLIST CELL LAYOUT HDL LABEL ASPECT RATIO Label: IPF10LH A,TAP,Y; IPF10LH RELATIVE C CELL AREA TO NA210LH 29.4 37.5 minimum height minimum width These input cells incorporate a pull-up tap to simplify termination of the input. This tap may be used in conjunction with an active pull-up/pull-down terminator from the 'ASC2370 through 'ASC2374 group, otherwise the pull-up tap may be left unconnected, When the terminator is used it ensures that the input will be driven to a high or low logic level thereby avoiding exposure to a high-impedance or floating condition, The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts, Guard-ring structures are employed that provide current ,. ~. ITlctIIClyt::lllt:lll ltH,';IIIIIl.jUt";:> lUI lilt;:: •• ~t::11 . ~ LV I C\.iUV t:;:r IIVIII t:AIJU~UIC LV ••• III~II . r . . . ,....,.. \.oUIIOIIL;" VI UtJ LV "'TVV __ ... _ .__ . _ ." __ 1IIIIIIglll"''OI~''', ~ thereby negating most common sources that can produce a latch-up condition. The SN54ASC5010 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5010 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. PRODUCTION DATA doc.monts contaip information currant as of publication date. Products conform to specifications par the tarms of Texas Instruments :'~~::~~i~8i~r:1~1~ ~~:~:; :....:::~~::.s not Copyright TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 © 1986.. Texas Instruments Incorporated 4-495 SN54ASC5010, SN74ASC5010 TTL-COMPATIBLE INVERTING SCHMITT-TRIGGER INPUT BUFFERS WITH PULL-UP TAP electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS VT+ Positive-going threshold level VT- Negative-going threshold level Vhys Hysteresis (VT + - VT-I Input current II lee e; epd SN54ASC5010 MIN TYP SN74ASC5010 MAX MIN TYP MAX 1.5 1.8 2 1.5 1.8 2 0.6 0.9 1.1 0.6 0.9 1.1 900 - 900 UNIT V V mV ±1 ±1 ~A IPE10LH VI - Vee orO VI - 2 V or 0.8 V 1125 67.5 nA 1.47 1.37 rnA IPF10LH VI = Vee or 0 VI - 2 V or 0.8 V 1548 92.9 nA 1.45 1.37 rnA Supply current Intrinsic input capacitance t VI - Vee or 0 Equivalent power Vee = 5 V, TA = 25°e Vee - 5 V, tr - t1 ~ 3 ns, dissipation capacitance TA = 25°e 2.1 2.1 pF 20 20 pF trotal input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrins"ic input capacitance. The value shown includes the pull-up tap. • switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER* ...o tpLH D) tpHL D) tpLH tpHL .:l.tpLH· (f) ::::r CD CD ... (I) .:l.tpHL FROM (lNPUTI A A A TO TEST (OUTPUTI CONDITIONS Y Y y eL = 0 eL'= 1 pF SN54ASC5010 TYP§ MAX MIN 2.9 6 16 SN74ASC5010 TYp§ MAX MIN 3.1 6 14 1.1 1.4 2.2 1.1 1.4 2 6.3 1.3 13 2 33 3.6 6.8 1.4 13 29 3.3 3.4 7 18 3.7 7 '0 0.2 0.6 1.5 0.2 0.6 1.3 2 UNIT ns ns ns/pF t Propagation delay times are measured from the 1.3 V pOint of VI (0 to 3 VI to the 44% point of Vo with tr = tf = 2 ns (10% and 90%1. tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output .:l.tpLH '" change in tpLH with load capacitance .:l.tpHL '" change in tpHL with load capacitance §Typical value.s are at Vee = 5 V, TA = 25°e. DESIGN CONSIDERATIONS Refer to Section 7. 4-496 TEXAS . . INSTRUMENTS POST OFFICE SOX 655012 • DALLAS, TEXAS 75265 SN54ASC5013, SN74ASC5013 TTL-COMPATIBLE NON INVERTING INPUT BUFFERS WITH PULL-UP TAP 02939, AUGUST 1986 SystemCell™ 2-/Am INPUT STANDARD CELL • 2.1 ns Typical Propagation Delay With 1-pF Load • Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • • logic symbol TAP~ A--v- Y ""- FUNCTION TABLE Functional Operation Over VCC Range of 2Vt06V Dependable Texas Instruments Quality and Reliability INPUT OUTPUT A Y H H L L positive logic equation Y=A description The SN54ASC5013 and SN74ASC5013 are noninverting input buffer CMOS standard cells that translate TTL input voltage levels to CMOS internal-cell voltage levels. The cell is designated and called from the engineering workstation input' using the following cell name to develop labels for the design netlist: 4 ... U) FEATURES NETLIST HOL LABEL CELL LAYOUT ASPECT RATIO Label: IPF13LH A.TAP,Y; minimum height CELL NAME IPF13LH Q) Q) RELATIVE .c CELL AREA en TO NA210LH ... 29.4 C'CS This input cell incorporates a pull-up tap to simplify termination of the input. This tap may be used in conjunction with either an active pull-up/pull-down terminator from the' ASC2370 through' ASC2374 group, otherwise the pull-up tap may be left unconnected. When the terminator is used it ensures that the input will be driven to a high or low logic level thereby avoiding exposure to a high-impedance or floating condition. C'CS C The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. Copyright © 1986. Texas Instruments Incorporated PRODUCTION DATA documonls contain info,mation curfant as of publication data. Products conform to spacifications per the tarms of Taxas Instruments =~:~i~ai~:1~7i ~.:\::i:; :.r::::::~:~~ not TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-497 SN54ASC5013, SN74ASC5013 TTL·COMPATIBLE NONINVERTING INPUT BUFFERS WITH PULL·UP TAP electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) . ... , PARAMETER SN54ASC5013 TEST CONDITIONS VT Input threshold voltage Vee - 5 V, II Input current VI - Vee or 0 lee Supply current VI - Vee or 0 VI - 2 V or 0.8 V ei Input capacitance t Equivalent power Cpd dissipation capacitance TYP SN74ASC5Q13 MAX TYP 1.3 TA - 25°e Vee - 5 V, TA - 25°e tr tf :$ UNIT V ±1 ±1 1037 62.2 1.13 1.21 l> V, vee TA = 25°e N!~X 1.3 p.A nA 2.2 2.2 rnA pF 1B lB pF ns, tTotal input capacitance is dependeflt on the package type and is equal to t~~ sum 9f package capacitance and intrinsic input capacitanc~. switching characteristics over recommended ranges of supply voltage and operating free-air temperatlJre (unless otherwise noted) . PARAMETER; tPLH tPHL • tpLH tpHL l1tpLH C I» r+ I» en ::r CD CD r+ l1tpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y A Y A Y eL eL tpropagation delay times are measured from VI tpLH 5: propagation delay time, =0 = 1 pF SN54ASC5013 TYP§ MAX MIN O.B 1.3 2.4 O.B 1.3 2.3 1.3 2.3 5.3 1.3 4.7 1 1.6 3.2 1 2.3 1.6 1.4 2.6 6.1 1.5 2.6 5.4 0.1 0.3 0.8 0.1 0.·3 0.7 0.1 0.3 O.B 0.1 0.3 0.8 = 1.3 V to the 44% point of Vo with tr = tf = 2 ns (10% low-to-higr-!~vel output tpHL .. propagation delay time, high-to-!ow-Ievel OUtput l1tpLH '" change intpLH with load capacitance l1tpHL .. change in tpHL with load capacitance §Typical values are at Vee = 5 V, TA = 25°e. til DESIGN CONSIDERATIONS Refer to Section 7. 4-498 SN74Ase5013 TYP§ MAX TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 UNIT MIN 2.9 and 90%1. ns ns ns/pF SN54ASC5100, SN74ASC5100 TTL-leMOS-COMPATIBLE OUTPUT BUFFERS D2939. AUGUST 1986 SystemCell™ • Typical Propagation Delays 2.7 ns with 15-pF load 4.7 ns with 50-pF load • Output Current Ratings SN54ASC5100 IOl IOH SN74ASC5100 IOl IOH 2-/lm OUTPUT STANDARD CELL logic symbol A-t>-V 3.4 rnA -3.4 rnA 4mA -4mA FUNCTION TABLE INPUT • Incorporates Circuitry to Protect Against ESD and latc!1-Up • Specified for Operation Over Vee Range of 4.5 V to 5.5 V • Functional Operation Over Vee Ranlle of 2Vt06V • Dependable Texas Instruments Quality and Reliability OUTPUT A V H L H L • positive logic equation ... Y=A tI) CI) CI) description The SN54ASC51 00 and SN74ASC51 00 are noninverting output buffer standard cells that interface internal cells with TTL or CMOS external loads. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. DeterminatiOn of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: .c: o ...a:sa:s C FEATURES CELL NAME OPE40LH OPF40LH NETLIST CELL LAVOUT HDL LABEL ASPECT RATIO Label: OPF40LH A,V; minimum height minimum width RELATIVE CELL AREA TO NA210LH 31.8 39 with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sourCIlS that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to Vee will cause current flow ab.ove that recommended fqr normal opeation. Therefore. it is recommended that outputs not be shorted directly to ground or Vee. Copyright © 1986, Texas Instruments Incorporated PRODUCTION DATA documents conlain inlo"'8lion current 8S of publication date. Products ,!=onform to specili""lions par Ihe lerms 01 Tex@llnslrume.ts standard warranty. Pradu~ion .,fucesling does not n......rily include teelillll 01 .~ parameters. TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75266 4-499 SN54ASC5100, SN74ASC5100 TTL·/CMOS·COMPATIBLE OUTPUT BUFFERS The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta delay times provide a means for making direct comparisons of the various output responses with changes in capacitive loading. The SN54ASG51 00 is chatacterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5100 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended, operating conditions See Table 3 in Section 2. The maximum high-level or low-level output current is 3.4 milliamperes for the SN 54ASC 51 00 and 4 milliamperes for the SN 7 4ASC 51 00. electrical characteristics over recommended ranges of .supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT TEST CONDITIONS Input threshold voltage • !D) lee Supply current ej Input capacitance Equivalent power epd U) ::T CD CD ... IOL 2.2 V 3.7 V Vee- 0.1 Vee- 0.1 0.5 0.5 V 0.1 0.1 tOPE40LH See Note 1 IOL Vee':" 4.5Vto5.5V, 1563 93.8 IOPF40LH VI = Vee orO, TA = Minto Max 1988 119 lOPE40LH dissipation capacitance IOPF40LH Vee = 5 V, Vee = 5 V, TA = 25°e = 25°e = tf = 3 ns, TA 0.7 0.7 tr 9.1 9.1 10.9 10.9 NOTE 1: These limits apply when all other outputs are open. (I) 4-500 UNIT 3.7 = 4 mA = 3.4 mA = 20 p.A, IOL VOL Low-level output voltage SN74ASC5100 M'IN TYP MAX 2.2 Vee VOH High-level output voltage c TA = 25°e = 5 V, IOH = -4 mA IOH -: ,-3.4 mA IOH - - 20 p.A, See Note 1 SN54ASC5100 MIN TYP MAX TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 nA . pF pF SN54ASC5100, SN74ASC5100 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads PARAMETERt tpLH FROM TO TEST (INPUT) (OUTPUT) CONOITIONS MIN TYP* MAX MIN TYP* MAX CL - 15 pF, 1 1.9 4.1 1.1 1.9 3.7 A Y RL tPHL tpLH A CL Y RL tpHL <1tpLH A = = SN54ASC5100 SN74ASC5100 00 1.8 3.7 8.7 1.9 3.7 7.8 50 pF, 1.5 2.9 6.6 1.7 2.9 5.9 = 3.3 6.9 16.2 3.7 6.9 10 30 SO 10 30 14.3 70 . 40 90 210 50 90 190 00 Y <1tPHL UNIT ns ns ps/pF CMOS loads PARAMETERt tpLH FROM TO TEST INPUT OUTPUT CONDITIONS MIN TYP* MAX MIN TYP* MAX CL-15pF, 1.2 2.4 5.3 1.3 2.4 4.S A Y tpHL tpLH A Y tPHL <1tPLH A SN54ASC5100 1.6 3 7.1 1.7 3 6.3 CL - 50 pF, 2.2 4.4 9.9 2.4 4.4 9 = 2.5 5.1 12.2 2.7 5.1 10.7 30 60 130 30 60 120 30 60 150 30 60 130 RL = RL 00 00 Y <1tPHL tpropagation delay times are measured from the 44% point of V, with tr = tf at Vo = 1.3 V. For CMOS loads, the times end at the 50% point of VO. tPLH '" propagation delay time, low-to-high-Ievel output tPHL == propagation delay time. high-to· low-level output <1tpLH .. change in tpLH with load capacitance .6.tpHL change in tpHL with load capacitance = UNIT ns ns ps/pF 3 ns (10% and 90%). For TTL loads, the times end = tTypical values are atVcc = 5V, TA SN74ASC5100 ... U) (1) (1) .c (I) ... CO CO = 25°C. C DESIGN CONSIDERATIONS Refer to Section 7. TEXAS . " INSTRUME~TS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-501 ...c Q) Q) en ::::r CD CD ...en 4-502 SN54ASC5103, SN74ASC5103 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS D2939, AUGUST 1986 System~eIrM 2-/lm OUTPUT STANDARD CELL • Typical Propagation Delay 2.4 ns with 1S-pF Load 3,S ns with SO-pF Load • Output Current Ratings SNS4ASCS103 IOL IOH SN74ASCS103 IOL IOH • logic symbol S.1 mA -S,1 mA 6 mA -6 mA FUNCTIOI\I TABLE Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.S V to S.S V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability INPUT OUTPUT A V H H L L • positive logic equation ... Y=A U) CI) CI) description The SN54ASC5103 and SN74ASC5103 are noninverting output buffer standard cells that interface CMOS internal cells with TTL or CMOS external loads, This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical. for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage, The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: .c CI) ... C FEATURES NETLIST CELL NAME OPE60LH OPF60LH HOL LABEL Label: OPF60LH A,V; CELL LAVOUT ASPECT RATIO RELATIVE CELL AREA TO NA210LH minimum height 43 minimum width 40.5 I ne celis Incorporate CirCUlI elerTlen15 aesigneo 10 ClCllvelY Dypass ano UIS51pcne tUt:;l{;[fUSnHIC uisc;iH:::Irges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes. thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result. passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to Vee will cause current flow in excess of that recommended for normal operation. Therefore. it is recommended that outputs not be shorted directly to ground or VCC. PRODUCTION DATA dD.umants .Dntain information current as of publication data. Products conform to spacifications par the terms of Texas Instruments :'~=~~i~8i~:1~1i =:~ti:r :.r::::::~~~ not Copyright © 1986. Texas Instruments tnc-y GZ~ FUNCTION TABLE Incorporates Circuitry to Protect Against ESD and Latch·Up INPUTS raz---A Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vto6V • Dependable Texas Instruments Quality and Reliability OUTPUT y L H L L H L H X Z • positive logic equation ... Y = A (when GZ is L) U) Q) Q) description The SN54ASC51 04 and SN74ASC51 04 are noninverting3-state output buffer standard-cells that interface internal cells with TTL or CMOS external buses, This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical. for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries, Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: .c en ... CO CO C FEATURES NETLIST CELL NAME OPE63LH OPF63LH CELL LAYOUT HDL LABEL ASPECT RATIO Label: OPF63LH A,GZ,Y; minimum height minimum width RELATIVE CELL AREA fo NA210LH 51 49.2 The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-rihg structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes. thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide iow-impedance drive levels for both the high- and lowlogic-level states; therefore. passive resistance has been omitted in series with the output transistors, Shorting a high-level output to ground or a low-level output to Vce will cause current flow in excess of that recommended for normal operation. Therefore. it is recommended that outputs not be shorted directly to ground or VCC. PRODUCTION DATA documants .. ntain inlormation carrent IS af publicition data. Products conform to spacifications par the tarms af Texas Instruments :.~=~~;;ai~::ri =::i:r lIi°:=~.::9t::a~s not Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE '£lOx 65501 ~ • DALLAS. TEXAS 75265 4-507 SN54ASC5104, SN74ASC5104 TTL-/~""OS-COMPATlbL~ 3-STATE OUTPUT BUFFERS descriptil,ln (c:ontinued) The dynamic drive capability of each output is specified by the delta propagation delay time parameter that is included with the switching characteristics. The delta propagation delay times provide a means fOr making direct comparispns of the various output responses with change in capacitive loading. The SN54ASC51 04 is characterized for pperation over the full military temperature range of - 55°C to 125°C. The SN74ASC5104 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended I,lperating conditions See Table 3 in Section 2 and the 10 test conditions shown in the electrical characteristics. The maximum low-level Qr high-level Qutput current is 5.1 milliamperes for the SN54ASC5104 and 6 milliamperes for the SN74ASC5104. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless "tjlerwise noted) PARAMETER VT TEST CONDITIONS Input threshold voltage low-lev~1 output voltage 10H - -5.1 mA 20 pA See Note 1 IOH 10l - 6 mA IOl'- 5.1 mA . 10l - 20 pA, 10Z Off-state output current ICC Supply current Ci I~put 'Cpd capacitance Equivalent power OPE63lH OPF63lH A GZ OPE63lH diss'ipation capacitance OPF63lH TYP Vec - 5 V, TA = = UNIT V V Vee 0.1 0.5 0.5 25°C t r - tf - 3 ns, 25°C V 0.1 0.1 ±10 ±5 3145 189 3039 182 1 1 0.7 0.7 17.1 17.1 19.4 19.4 NOTE 1: These limits apply when all other outputs are open. 4-508 MAX 3.7 See Note 1 TA TYP 2.2 Vee 0.1 VI = VCC or 0, TA = MIN to MAX = ? V, SN74ASC5104 MIN 3.7 Vo - VCC or 0 VCC .4.5 V to 5.5 V, VCC MAX 2.2 TA - 25°C VCC - 5 V, IOH - -6 mA VOH !'iigh-Ievel output voltage VOL SN54ASC5104 MIN TEXAS • INSTRUMENTS POST OFFiCE BOX 655012 • DALLAS, TEXAS 75265 ~A nA pF pF SN54ASC5104, SN74ASC5104 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads. CL - 15 pF PARAMETERt tpLH tpHL tpZH tpZL FROM TO TEST IINPUTI (OUTPUT! CONDITIONS A Y RL = y GZ SN54ASC5104 SN74ASC5104 MIN TYP* MAX MIN 1 1.6 2 3.3 2.8 3 4.5 1.1 7.8 1.7 6.6 1.3 7.1 1.6 00 RL - 1 kO to GND 1.2 RL - 1 kO to Vee 1.5 TYP* 2 MAX 3.3 2.8 3 6.9 4 6 6.4 UNIT ns ns TTL loads. CL - 50 pF PARAMETERt tpLH tpHL tpZH tpZL tpHZ tpLZ FROM IINPUTI TO (OUTPUTI A Y SN74ASC5104 MIN TYP* MAX 1.4 2.7 6.3 1.5 2.7 5.6 5.2 12.7 2.6 5.2 11.1 1 kO to GND 1.5 3.5 8.4 1.7 3.5 7.6 RL - 1 kO to Vee 2.4 5.2 12.6 2.6 5.2 11 RL = = = 00 1 kO to GND 10 10 RL - 1 kO to Vee 9 9 RL Y GZ SN54ASC5104 MIN TYP* MAX 2.4 RL y GZ TEST CONDITIONS UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads PARAMETERt --Y FUNCTION TABLE Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability INPUT OUTPUT A Y H H L L positive logic equation Y=A description The SNS4ASCS1 OS and SN74ASCS1 05 are non inverting output buffer standard cells that interface CMOS internal cells with a passive pull-up external load. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for Simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designatec;i and called from the engineering workstation input using the following cell name to develop labels for the design netlist: -- FEATURES CELL NAME OPE61LH OPF61LH NETLIST CELL LAYOUT HDL LABEL ASPECT RATIO Label: OPF61 LI-> A,V; RELATIVE CELL AREA TO NA210LH minimum height 31 minimum width 40 The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ran!;!in!;! up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for low-logic-level outputs interfacing a bus having a terminated high-level drive source. As a result, passive resistance has been omitted in series with the output transistor. Shorting the low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to VCC. The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta delay times provide a means for making direct comparisons of the various output responses to increased capacitive loading. PRODUCTION DATA documonts contain information current as of publication date. Products conform to specifications per the terms of Taxas Instrumants :'::~~:~~i;ai~r:I~~i ~!:t1:~i:;. :....:.~:~9t::a~s not Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-S11 SN54ASC5105, SN74ASC5105 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS description (continued) The SN54ASC51 05 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5105 is characterized for operation from -40°C to 85°C. absolute maximum ratings. and recommended operating conditions See Table 3 in Section 2. Maximum low-level output current is 5.1 milliamperes for the SN54ASC51 05 and 6 milliamperes for the SN74ASC5105. , electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TEST CONDITIONS PARAMETER VT Input threshold voltage VOL Low-level output voltage IOZ Off~state ei Equivalent power IOPE61 LH epd dissipation capacitance Vee = 5 V, iOPF61LH TA = 25°e MAX UNIT v 2.2 V 0.1 ±10 ±5 1192 63.8 1 1 3.8 3.8 4 4 TA = 25°e tr = tf = 3 ns, 71.5 , 1063 IOPF61LH TA = MIN to MAX Vee = 5 V, TYP 0.1 Vo - Vee or 0 IOPE61LH Vee - 4.5 V to 5.5 V, VI - Vee or 0, Input capacitance MIN 0.5 See Note 1 output current lee Supply current MAX 0.5 IOL - 6 mA IOL - 5.1 mA IOL - 20 "A, I TYP 2.2 TA - 25°e Vee - 5 V. SN74ASC5105 SN54ASC5105 MIN "A nA pF pF NOTE 1: These limits apply when all other outputs are open. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads PARAMETERt FROM TO TEST (INPUT) (OUTPUT) CONDITIONS eL = 15 pF. tpZL A y tpZL A y tpLZ A AtpZL A y y RL = 1 kll to Vee eL - 50 pF, RL = 1 kll to Vee SN54ASC5105 Typt MAX MIN TYpt MAX MIN SN74ASC5105 UNIT 1 2 4,7 1.1 2 4,2 ns 1.9 4 9.8 2,1 4 8.6 ns 130 ps/pF 8 RL - 1 kll to Vee 30 60 8 ns 150 30 SN54ASC5105 Typt MAX MIN Typt MAX 3.5 1 1.6 3,2 60 CMOS loads PARAMETERt FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpZL A Y tpZL A Y AtpZL A Y eL=15pF, RL = 1 kllto Vee eL - 50 pF, RL = 1 kll to Vee MIN SN74ASC5105 UNIT 0.9 1.6 1,5 2.9 7 1.6 2,9 6,1 ns 20 37 100 20 37 80 ps/pF ns tPropagation delay times are measured from the 44% pOint of VI with tr = tf = 3 ns (10% and 90%1. For TTL loads, the times end at Vo = 1.3 V. For eMOS loads, the times end at the 50% point of VO, tpZL .. output enable time to low level tPLZ '" output disable time from low level AtpZL 5ii change in tpZl with load capacitance ; Typical values are at Vee = 5 V, TA = 25°e. 4-512 TEXAS • INSTRUMENTS POS1 O!=Fice BOX. 665012 • DALLAS, TEXAS 15265 SN54ASC5106, SN74ASC5106 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS 02939, AUGUST 1986 SystemCell™ • Typical Propagation Delays 2 ns with 15~pF Load 2,8 ns with 50-pF Load • Output Current Ratings SN54ASC5106 IOL IOH SN74ASC5106 IOL IOH • 2-/Am OUTPUT STANDARD CELL logic symbol A---f>-V 8.5 rnA -8.5 rnA 10 rnA -10 rnA FUNCTION TABLE INPUT Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over Vec Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2 V to 6 V • Dependable Texas Instruments Quality and Reliability OUTPUT A V H H L L • positive logic equation ... Y=A U) Q) Q) description The SN54ASC51 06 and SN74ASC51 06 are noninverting output buffer standard-cells that interface CMOS internal cells with TTL or CMOS external loads. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: .s::. o ...caca C FEATURES CELL NAME OPEOOLH OPFOOLH NETLIST CELL LAVOUT HDL LABEL ASPECT RATIO Label: OPFOOLH A,V; minimum height minimum width RELATIVE CELL AREA TO NA210LH 47.7 42 The cells incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that proviqll current management techniques for the cell to recover from exposure to high currents of up to 400 miiliamperes; thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shQ'1ed directly to ground or VCC. Copyright © 1986. Texas Instruments Incorporated PRODUCTION DATA documents contain information current as of publication date. Products conform to specifications per the terms of Texas Instruments :~~~~:~~i~ai~:I~~e ~!:~:~ti:f :.~O::;::~:~~ not TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-513 SN54ASC5106, SN74ASC5106 TTL·/CMOS·COMPATIBLE OUTPUT BUFFERS The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a hlelihS for milking direct comparisons of the various output responses with change in capacitive loading. The SN54ASC5106 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC5106 is characterized for operation from -40 DC to 85 DC. absolute maximum ratings and recommended operating conditions See Table 3 in Section 2 and the 10 test conditions shown in the electrical characteristics. The maximum low-level or high-level output current is 8.5 milliamperes for the SN54ASC5106 and 10 milliamperes for the SN74ASC5106. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT Input threshold voltage Vee = IOH VOH I-ii~h-Ievel output voltage • VOL Low-level output voltage o C» ..... C» lee Supply current ei epd dissipation capacitance (D ..... (I) MIN TYP Vee = 5 V, 10I'FOOLH TA = 25°e TYP MAX UNIT V 3.7 Vee See Note 1 V Vee 0.1 0.1 _ 0.5 V 0.5 See Note 1 v, VI - Vee or 0, 0.1 0.1 2933 176 2590 MAX TA tr = 25°e = tf = 3 ns, TEXAS 155 1.4 1.4 21.8 21.8 20.1 20.1 NOTE 1: These limits apply when all other outputs are open. 4-514 SN74ASC5106 MIN 2.2 2.2 25°e IOL - 8.5 mA = MINto Vee = 5 V, MAX 3.7 8.5 mA IOH 20 ~A. IOH 10l. - 10 mA IOPFOOLH TA I = TA 5 V. -10 mA IOL - 20 ~A, IOPEOOLH Vee - 4.5 V to 5.5 Equivalent power OPEOOLH t/) i" Input capacitance SN54ASC5106 TEST CONDITIONS ~ INSTRUM~NTS POST OFFICE BOX 655012-· OALLAS, TEXAS 75265 nA pF pF SN54ASC5106, SN74ASC5106 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads PARAMETERt tpLH tpHL tpLH tpHL AtPLH AtPHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS MIN A Y CL - 15 pF, RL ~ '" CL - 50 pF = A A Y RL co SN54ASC5106 SN74ASC5106 MAX MIN 0.8 TYP* 1.5 3.2 0.9 TYP* 1.5 1.2 2.6 5.7 1.3 2.6 2.9 5.1 1.1 2 4.4 1.2 2 4 1.8 3.7 8.5 1.9 3.7 7.6 10 14 40 10 14 30 20 31 80 20 31 70 Y MAX UNIT ns ns ps/pF CMOS loads PARAMETERt tpLH tpHL tpLH tpHL AtPLH AtPHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS MIN TYP* MAX MIN TYP* MAX CL - 15 pF, 0.9 1.9 4 1 1.9 3.6 RL = co CL - 50 pF, 1.2 2.2 4.8 1.3 2.2 4.4 1.4 2.7 1.5 5.6 6.1 A A A Y Y RL = co SN54ASC5106 SN74ASC5106 1.6 3 6.2 6.8 1.7 2.7 3 10 23 60 10 23 60 10 23 60 10 23 50 Y UNIT ns ns ps/pF tpropagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For TTL loads, the times end at Vo = 1.3 V. For CMOS loads, the times end at 50% point of VO. tpLH '" propagation delay time, low-to-high-Ievel output II en t) CD tpHL := propagation delay time, high-to-Iow-Ievel output AtpLH '" change in tpLH with load capacitance AtPHL '" change in tpHL with load capacitance 'Typical values are at VCC = 5 V, TA = 25°C. .c en DESIGN CONSIDERATIONS ...caca C Refer to Section 7. ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-515 III 4-516 SN54ASC5107, SN74ASC5107 TTL·/CMOS·COMPATIBLE 3·STATE OUTPUT BUFFERS 02939, AUGUST 1986 SystemCell™ 2·llm OUTPUT STANDARD CELL • Typical Propagation Delays 2,7 ns with 15-pF Load 3.7 ns with 50-pF Load • Output Current Ratings SN54ASC5107 IOL IOH SN74ASC5107 IOL IOH • logic symbol A-----f>- Y GZ~' 8.5 rnA -8.5 rnA 10 rnA -10 rnA FUNCTION TABLE INPUTS Incorporates Circuitry to Protect Against ESD and Latch-Up Vee • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vec Range of OUTPUT GZ A Y L H H L L L H X Z Range of II .. positive logic equation Y = A (when GZ is L) tI) CD CD description The SN54ASC51 07 and SN74ASC51 07 are non inverting 3-state output buffer standard cells that interface CMOS internal cells with TTL or CMOS external buses. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the finallC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate celi version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following celi name to develop labels for the design netlist: .c .. o CO CO C FEATURES CELL NAME OPE03LH OPF03LH NETLIST CELL LAYOUT HOL LABEL ASPECT RATIO Label: OPF03LH A,GZ,Y; minimum height minimum width RELATIVE CELL AREA TO NA210LH 54 52.4 The celis incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the celi to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or Vee. PRODUCTION DATA do.umenll contain informetion currant 81 of publication date. Products confarm to specifi.ations per the tarms of Texas Instruments =~~:~~i;;at::I:ri =:~ti:r IIr:::~9t::'S no~ Copyright @ 1986, Texas Instruments "Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 6615012 • DALLAS. TEXA~ 75265 4-517 SN54ASC5107. SN74ASC5107 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS description (continued) The'dynamic drive capability of each output is specified by the .delta propagation delay time parameter included with the switching characteristics, The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. The SN54ASC51 07 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5107 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 3 in Section 2. The maximum low-level or high-level output current is 8.5 milliamperes for the SN54ASC5107 and 10 milliamperes for the SN74ASC5107. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT Input threshold voltage VOH High-level output voltage II ...c CI) CI) en ::r ...en SN54ASC5107 TEST CONDITIONS Vee = = MIN 5 v, -10 mA TA = -20 pA, See Note 1 MAX SN74ASC5107 MIN TYP 2.2 25°e IOL IOL 10Z Off-state output current lee Supply current ei CD CD V Vee- O.1 0.5 A capacitance GZ epd dissipation capacitance 2OI'A, Vee = 5 V, OPE03LH Vce = 5 V, OPF03LH TA = 25°e V 0.5 8,5 mA 0,1 See Note 1 Vo - Vee or 0 OPE03LH Vee = 4,5 V to 5,5 V, VI OPF03LH TA = MIN to MAX Input Equivalent power = = UNIT V 3,7 Vee- D,l IOL - 10 mA VOL Low-level output voltage MAX 2.2 3.7 IOH IOH = -8.5 mA IOH TYP = TA tr Vee or 0, = 25°e = tf = 3 ns, 0.1 ±10 ±5 3483 209 3318 199 1.1 1,1 0.7 0,7 19.9 19,9 23.2 23.2 I'A nA pF pF NOTE 1: These limits apply when all other outputs are open. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads, CL - 15 pF PARAMETERt tpLH tpHL tpZH tpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A GZ Y y. RL = 00 SN74ASC5107 MAX MIN 4.8 1.2 TYP* 2.1 MAX 1.1 TYi>* 2.1 4.3 1.5 3.3 8,2 1.6 3.3 7,3 RL' = 1 kll to GND 1.2 2.8 6,8 1.3 2.8 6,2 RL - 1 kll to Vec 1.4 3.1 7.3 1.5 3.1 6.5 tpropagation delay times are measured from the 44% point of VI with tr at Vo = 1.3 V, tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-,o-Iow-Ievel output tpZH '" output enable time to high level tpLZ " output disable time from low level * Typical values are at VCC = 5 V, T A = 25°C. 4-518 SN54ASC5107 MIN = tf = UNIT ns ns 3 ns (10% and 90%1. For TTL loads, the times end TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5107. SN74ASC5107 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (continued) . TTL loads, CL = 50 pF PARAMETERt tpLH tpHL tpZH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y GZ Y RL = SN54ASC5107 00 SN74ASC5107 MIN TYP* MAX MIN TYP* MAX 1.4 2.7 6.5 1.5 2.7 5.7 2.2 4.7 11.6 2.4 4.7 10.3 RL - 1 kG to GND 1.5 3.5 8.5 1.7 3.5 7.6 Vee 2.2 4.7 11.2 2.4 4.7 10 = tpZL RL tpHZ RL - 1 kG to GND 10 10 Vee 8 8 tpLZ GZ y RL = 1 kG to 1 kG to UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt .:I.tpLH .:I.tpHL .:I.tpZH .:I.tpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A GZ SN54ASC5107 SN74ASC5107 MIN TYP* MAX MIN TYP* MAX 10 17 50 10 17 40 20 40 100 20 40 90 10 20 50 10 20 40 20 46 110 20 46 100 Y Y UNIT ps/pF ps/pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads, CL PARAMETERt tpLH tpZH tpZL CMOS loads, CL PARAMETERt tpLH tpHL tpZH tpZL .... U) G) G) = , 5 pF FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y GZ Y tpHL • SN54ASC5107 .c SN74ASC5107 MIN TYP* MAX MIN TYP* MAX 1.2 2.5 5.9 1.3 2.5 5.3 1.5 2.9 7.1 1.5 2.9 6.3 RL - 1 kG to GND 1.7 3.3 7.6 1.8 3.3 6.8 Vee 1.3 2.6 6.1 1.4 2.6 5.5 RL RL = = 00 1 kG to tn UNIT ....COCO ns C ns 50 pF FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y GZ Y SN54ASC5107 SN74ASC5107 MIN TYP* MAX MIN TYP* MAX 1.7 3.5 8.3 1.9 3.5 7.4 1.9 3.9 9.6 2 3.9 8.5 RL - 1 kO to GND 2.2 4.3 10.1 2.3 4.3 9.1 Vee 1.9 3.8 9 2 ,3.8 8 RL = 00 RL - 1 kG to UNIT ns ns TPropagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For TTL loads, the times end at Va = 1.3 V. For eM as loads, the times end at the 50% point of Va. tpLH = propagation delay time, low-to-high-Ievel output .:I.tpLH = change in tpLH with load capacitance tpHL = propagation delay time, high-to-Iow-Ievel output dtpHL == change in tpHL with load capacitance tpZH = output enable time to high level .:I.tpZH = change in tpZH with load capacitance tpZL == output enable time to low level AtpZL ;;;;: change in tpZL with load capacitance tpHZ output disable time from high level tPLZ == output disable time from low level 'Typical values are at Vee = 5 V, TA = 25 ce. = TEXAS l!1 INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 4-519 SN54ASC5107, SN74ASC5107 TTL·/CMOS·COMPATIBLE 3·STATE OUTPUT BUFFERS change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads PARAMETERt .1tpLH AtpHL .1tPZH .1tpZL FROM (INPUT) TO (OUTPUT) A Y GZ TEST CONDITIONS y tpropagation delay times are measured from the 44% pOint of VI with tr at the 50% point of VO . .1tpLH .. change in tpLH with load capacitance .1tpHL '" change in tpHL with load capacitance .1tpZH '" change in tpZH with load capacitance .1tpZL '" change in tpZL with load capacitance *Typical values are at VCC = 25°C, T A = 25°C. III SN54ASC5107 TYP* MAX MIN TYP* MAX 10 29 10 29 70 70 10 10 29 29 60 10 29 '70 10 29 70 20 34 80 20 34 70 = tf = 3 DESIGN CONSIDERATIONS Refer to Section 7. II) II) en :::r ...en CD CD TEXAS • INSTRUMENTS post OFFICE 70 UNIT ps/pF ps/pF ns (10% and 90%). For CMOS loads, the times end ...c 4-520 SN74ASC5107 MIN BOX 65.6012 • OAb.b.AS, TEXAS 75266 SN54ASC5108. SN74ASC5108 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS D2939. AUGUST 1986 SystemCeIrM • Typical Propagation Delays 1.7 ns with 15-pF load 3 ns with 50-pF load • Output Current Ratings SN54ASC5108 IOl = 8.5 mA SN74ASC5108 lOt = 10 mA 2-/Am OUTPUT STANDARD CELL logic symbol A--I>-V • FUNCTION TABLE INPUT Incorporates Circuitry to Protect Against ESD and latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability OUTPUT A V H H L l positive logic equation Y=A a... en description The SN54ASC51 08 and SN74ASC51 08 are noninverting output buffer standard-cells that interface CMOS internal cells with a passive pull-up external load. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: Q) Q) .c en !CO o FEATURES CELL NAME OPEOl lH OPF01 lH NETlIST CELLLAVOUT HOl LABEL ASPECT RATIO label: OPFOl lH A.V; RELATIVE CELL AREA TO NA210LH minimum height 31.8 minimum width 42 The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges .... ,i+h ..... ,,+ ......... +; .... 1.................. : .............. + .... A 1,:'..., ...... ,-4- .... .. .." .. ..J .. : ........... ...... .." ............ "..-.. ..... , ............ ..4 +1-. .... + .. '"' •• -. ...... ,,_+ -.. _.. '-";;;:1"';::1 -r.. - - - , ........ :;, ...... 'f"" .... , ................ ,.. ........ ""''-' ................ " .. management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. ~ r---~.'-.-.- -~ ~"'~.~.-~. +~."....,+., u ~ :....I~ ........ _ .... • . . . . . . . . . . . . . . . . . . . . . . . . . These output cells have been designed to provide low-impedance drive levels for low-logic-level outputs interfacing a bus having a terminated high-level drive source. As a result, passive resistance has been omitted in series with the output transistor. Shorting the low-level outpu't to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to VCe. The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. PRODUCTION DATA documents contain information current as of publication date. Products conform to specifications per the terms of Texas Instruments ~~~~~:~~i~ai~:1~1e ~!~~~~ti~fn :llo::~:~9t:~~s not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-521 SN54ASC51 08i .SN74ASC511J8 TIL·/CMOS·COMPATIBLE OPEN·bRAIN OUTPUT BUFFERS The SN54ASC51 Of! ill Characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5108 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 3 in SeCtion 2 and the 10 test conditions shown in the electrical characteristics. Maximum lowlevel ou~put current is 8.5 milliamperes for the SN54ASC510S and 10 milliamperes for the SN74ASC51 OS. electrical characteristics over recommended ranges of suply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT Input threshold voltage VCC ~ 5 V. TA ~ SN74ASC5108 SN54ASC5108 TEST CONDITIONS MIN TYP MAX MIN 2.2 25°C TYP See Note 1 • C m m ... tn :r CD CD ...en Equivalent powerlOPEOl LH Cpd dissipation capacitance 0.1 ±10 ±5 1302 78.1 1193 71.6 VCC ~ 5 V, TA = 25°C 1.4 1.4 VCC ~ 5 V, tr = tf = 3 ns, 5.6 5.6 5.S 5.S IOPF01 LH TA = 25°C NOTE 1: These limits apply when V 0.1 Vo - VCC or 0 10Z Off-state output current IOPE01LH VCC - 4.5 V to 5.5 V, VI - VCC or 0, Supply current ICC IOPF01LH TA = MIN to MAX Input capacitance V 0.5 10L - 8.5 rnA 10L - 20 ~A, Ci UNIT 0.5 IOL - 10 rnA VOL Low-level output voltage MAX 2.2 ~A nA pF pF ail other outputs are open. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads PARAMETERt FROM (INPUT( TO TEST (OUTPUT) CONDITIONS SN54ASC51OS CL - 15 pF, tPZL A Y tpZL A y tpLZ dtpZL A y A Y FROM (INPUT( TO TEST (OUTPUTI CONDITIONS CL - 15 pF, RL = 1 kll to Vcc CL - 50 pF, RL = 1 kll to RL = 1 kll to Vct Vcc SN74ASC510S UNIT MIN TYP* MAX MIN TYP* MAX 0.9 1.7 3.7 0.9 1.7 3.3 ns 3 6.S 1.5 3 6 ns 80 ps/pF 1.4 7.2 10 7.2 37 90 20 ns 37 CMOS loads PARAMETERt tpZL A y tpZL A y dtpZL A Y RL = 1 kO to Vec CL - 50 pF, RL = 1 kO to VCC tpropagation delay times are measured from· the 44% point of V, with tr = tf at Vo = 1.3 V. For CMOS loads, the times end at the 50% pOint of VO. tPZL '" output enable time to low level tpLZ ~ output disable time from low level dtpzL '" change in tpZL with load capacitance * Typical values are at VCC = 5 V, T A ~ 25°C. 4-522 SN54ASC510B SN74AsC51OS UNIT MIN TYP* MAX MIN TYP* MAX O.S 1.4 2.9 O.S 1.4 2.S 1.2 2.2 5 1.:i 2.2 4.5 ns 10 23 so. 10 23 50 pslpF. =3 ns ns (10% and 90%), For TTL loads, the times end TEXAS . . INSTRUMENTS POST OFFICE BOX 6550'2 • DALLAS, tEXAS 75265 SN54ASC5109, SN74ASC5109 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS D2939, AUGUST 1986 SystemCell™ logic symbol • Typical Propaglltion Delay 2.7 ns with 15-pF Load 6 ns with 50-pF Load • Output Current Ratings SN54ASC5109 IOL - 3.4 mA SN74ASC5109 IOL - 4 mA • 2-,..m OUTPUT STANDARD CELL A---t>-V FUNCTION TABLE INPUT Incorporates Circuitry to Protect Agllinst ESD arid Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability OUTPUT A V H H L L positive logic equation Y = A description a... fI) The SN54ASC51 09 and SN74ASC51 09 are noninverting output buffer standard cells that interface CMOS internal cells with a passive pull-up external load. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the eillctrical performance of each version is identical, for simplicity only qne versjo[1 (the "F" cell) will be contained in the engineering workstation cell libraries, Determination of the mOllt appropriate cell version will be made during the layout stClge. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: CD CD .c en ...caca C FEATURES CELL NAME OPE41LH NETLIST CELL LAVOUT HDL LABEL ASPECT RATIO Label: OPF41 LH A, V; OPF41LH RELATIVE CELL AREA TO NA210LH 27.8 39 minimum height minimum width The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts, Guard-ring structures are employed that provide current management tecrmiques Tor me cell to recover Hom exposure to "'gn currents OT up to 4UU milliamperes, thereby '1eg!!ting most common sources thilt can produce a latch-up condition. These OLjtput cells have been designed to provide low-impedance drive levels for low-logic-level outputs interfacing a bus having a terminated high-level drive source, As a reSUlt, passive resistilnce has been omitted in series with the outP\.lt transistor. Shorting the low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to VCC. The dynamic drive capability of each output is specified by the delta propagation delay time PClrameter included with the switching characteristics. The delta propagation delClY times provide a means for making direct comparisons of the various output responses with change in capacitive loading. PRODUCTION DATA do.....n...oniain information Gurrent as 01 publiution dita. Products .0.lorm to per \_ terms· sf rexas Instruments i:: :'i:;:::::':~~ ==:i~ai~:1~7i sp.&:ifi~tionl t:g:: nDt . T~XAS .." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © i 986, Texas Instruments Incorporated 4-523 SN54ASC5109, SN74ASC5109 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS description (continued) The SN54ASC51 09 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5109 is characterized for operation from -40°C to 85°C. . absolute maximum ratings and recommended operating conditions . See Table 3 in Section 2. Maximum low-level output current is 3.4 milliamperes for the SN54ASC51 09 and 4 milliamperes for the SN74ASC5109. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT SN54ASC5109 TEST CONDITIONS Input threshold voltage Vee 10L VOL Low-level output voltage = 5 V, = 4 mA MIN TYP Equivalent powerlOPE41LH epd dissipation capacitance See Note 1 Vee = 5 V, TA Vee = 5 V, tr = MAX 2.2 UNIT V 0.5 10L - 3.4 mA IOPF41 LH TA TYP 0.5 = 0.1 ±10 ±5 1052 63.1 1037 25°e = tf = V 0.1 Vo = Vee or 0 10Z OffRstate output current IOPE41LH Vee - 4.5 V to 5.5 V, VI - Vee or 0, lee Supply current iOPF41LH TA = MIN to MAX Input capacitance MIN 2.2 TA - 25°e IOL - 20 pA, ei SN74ASC5109 MAX 3 ns, 25°e 62.2 0.7 0.7 2.4 2.4 2.6 2.6 pA nA pF pF NOTE 1: These limits apply when all other outputs are open. switching characteristics over recommended ranges of supply voltage and operating free-air temperature . (unless otherwise noted I TTL loads PARAMETERt tpZL FROM (INPUT) A TO (OUTPUT) SN54ASC5109 TEST CONDITIONS eL - 15 pF, Y RL = 1 kll to V CC CL - 50 pF, tpZL tpLZ A Y AtpZL A Y PARAMETERt FROM (INPUT) TO TEST (OUTPUT) CONDITIONS tpZL A Y RL = SN74ASC5109 MIN TYP* MAX MIN TYP* 1.3 2.7 2.8 6 6.5 1.4 2.7 5.7 14.5 3.1 6 12.5 230 50 9.6 1 kll to V CC 40 90 MAX 9.6 90 200 UNIT ns, ns ps/pF CMOS loads tpZL A Y AtpZL A y CL RL = = SN54ASC5109 15 pF, 1 kll to VCC CL - 50 pF, RL = 1 kll to VCC tpropagation delay times are measured from the 44% point of VI with tr = tf at Vo = 1.3 V. For CMOS loads, the times end at the 50% point of Vo. tPZL '" output enable time to low level tPLZ '" output disable time from low level AtpZL '" change in tpZL with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. 4-524 TEXAS SN74ASC5109 MIN TYP* MAX MIN TYP* MAX 1.1 2 4.8 1.2 2 4.3 UNIT ns 2.1 4 10 2.2 4 8.7 ns 30 57 150 30 57 130 ps/pF = 3 ns (10% and 90%). For TTL loads, the times end ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 SN54ASC511D, SN74ASC511D TTL·/CMOS·COMPATIBLE NONINVERTING 3·STATE OUTPUT BUFFERS D2939. AUGUST 1986 SystemCelr M 2'/lm OUTPUT STANDARD CELL • Typical Propagation Delay 3.4 ns with 15-pF Load 6.2 ns with 50·pF Load • Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • • logic symbol :=£>-v FUNCTION TABLE INPUTS OUTPUT Functional Operation Over VCC Range of 2 V to 6 V G A Y H H H Dependable Texas Instruments Quality and Reliability H L L X Z L positive logic equation Y = A (when G is H) Y is at a high impedance when G is low. description • The SN54ASC5 1 10 and SN74ASC51 10 are non inverting 3-state output buffer standard cells that interface internal cells with TTL or CMOS external loads. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: FEATURES NETLIST HOL LABEL CELL NAME OPE42LH OPF42LH Label: OPF42LH A,G, Y; CELL LAYOUT ASPECT RATIO ....asas C RELATIVE CELL AREA TO NA210LH minimum height 38.1 minimum width 45 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can' produce a latch-up condition. PRODUCTION DATA d••umanls contain informat,on currant a. of publication data. Product. conform to spacifications par the terms of Texas Instruments :=~i~li~:1~1i ~!::\::i:fn lI~O:::::~:~~ not Copyright © 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4·525 SN54ASC5110, SN74ASC5110 TTL-/CMOS-COMPATIBLE NONINVERTING 3-STATE OUTPUT BUFFERS These output cells have been designed specifically to provide low-impedance drive levels for both the highand low-logic-level states. Therefore, passive resistance has been omitted in series with the output transistors. Shorting of a high-level output to ground or a. low-level output to Vcc will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. The SN54ASC511 0 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5110 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 3 in Section 2 and the 10 test conditions shown in the electrical characteristics. The maximum high-level or low-level output current is 3.2 milliamperes for the SN54ASC511 0 and 4 milliamperes for the SN74ASC5110. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) II c D) r+ VT Input threshold voltage IOH VOH High-level output voltage r+ IOH 5 V, TA = MIN VOL Low-level o'utput voltage = IOZ lee ei Supply current Input capacitance Equivalent power epd OPF42LH A G OPE42LH dissipation capacitance OPF42LH VI = Vee 5 V, Vee = 5 V, TA = 25°e UNIT V V Vee· 0-. 1 0.4 V 0.4 See Note 1 TA tr = 25°e = tf = 3 ns, 0.1 0.1 ±10 ±5 1962 2317 118 139 0.6 0.6 0.5 0.5 8.6 8.6 10.5 10.5 NOTE 1: These limits apply when all other outputs are open. 4-526 MAX 3.7 Vee or 0 = TYP 2.2 Vee 0.1 Vo - Vee or 0 OPE42LH SN74ASC5110 MIN 3.7 IOL - 3.2 mA Off-state output current MAX 2.2 25°e -3.2 mA IOL - 20 ~A, (I) TYP -4 mA IOH - -20 ~A, See Note 1 IOL - 4 mA (J) CD CD = Vce D) ::r SN54ASC5110 TEST CONDITIONS PARAMETER TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 ~A nA pF ns SN54ASC5110, SN74ASC5110 TTL-/CMOS-COMPATIBLE NONINVERTING 3-STATE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads, CL ~ PARAMETERt tpLH tpHL tpLH tpHL tpZH tpZL tpHZ tpLZ TO TEST (OUTPUT) CONDITIONS G tpZL PARAMETERt FROM liN PUT) A tpZH TTL loads, CL 15 pF ~ 1.3 TYP* 2.3 MAX MIN 1.4 2.4 TYP* 2.3 MAX 4 2.2 4.5 4.4 8.8 4.5 7.8 1 k[J to GND 1.3 2.4 4.5 1.4 2.4 4.1 RL - 1 k[J to Vcc 2.7 5.2 10.4 2.9 5.2 9 TEST CONDITIONS MIN SN54ASC5110 TYP; MAX MIN Y RL RL y SN74ASC5110 SN54ASC5110 MIN = = '" UNIT ns ns 50 pF FROM IINPUT) A G G TO (OUTPUT) Y RL = '" y Y SN74ASC5110 TYP; MAX 1.9 3.7 7.2 2 3.7 6.5 4.3 8.8 17.2 4.7 8.8 15 RL - 1 k[J to GND 1.9 3.8 7.4 2 3.8 6.6 RL - 1 k[J to V CC RL - 1 k[J to GND 4.8 9.8 20 5.3 9.8 17.2 RL 10 10 10 10 1 k[J to Vee UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt Ll.tPLH Ll.tPHL Ll.tpZH Ll.tPZL IINPUT) FROM TO (OUTPUT) A Y G TEST CONDITIONS y UNIT ... ps/pF .c U) SN74ASC5110 SN54ASC5110 MIN TYP* MAX MIN TYP; MAX 20 40 80 20 40 70 60 123 240 70 123 212 20 40 80 20 40 70 60 131 270 70 131 230 Q) Q) en ... CO CO ps/pF tPropagation delay times are measured from the 44% pOint of VI with tr = tf = 3 ns (10% and 90%). For TTL loads, the times end at Va = 1.3 V. tpLH '" propagation delay time, low-to· high· level output Ll.tpLH '" change in tpLH with load capacitance tpHL '" propagation delay time, high-to-Iow·level output Ll.tpHL '" change in tpHL with load capacitance tpZH '" output enable time to high level Ll.tpZH '" change in tpZH with load capacitance tPZL " output enable time to low level Ll.tpZL '" change in tpZL with load capacitance tpHZ " output disable time from high level tpLZ '" output disable time from low level *Typical values are at Vec = 5 V, T A = 25°C. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 II C 4-527 SN54ASC5110, SN74ASC5110 TTL·/CMOS·COMPATIBLE NONINVERTING 3·STATE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads, CL - 15 pF PARAMETERt tPLH tpHL tpZH tpZL FROM (INPUT) TO (OUTPUT) A Y G TEST CONDITIONS TYP* SN74ASC5110 MAX MIN TYP* MAX 1.5 3 5.8 1.6 3 5.2 3.8 3.2 7.9 2 RL - 1 kll to GND 1.9 1.6 6 1.7 3.8 3.2 5.4 1 kll to Vee 2 4.4 9.3 2.1 4.4 8.2 RL = y SN54ASC5110 MIN RL 00 7 UNIT ns ns CMOS loads, CL - 50 pF PARAMETERt tpLH FROM (INPUT) A tpHL tpZH tpZL II ~ C -y Gz--1l. FUNCTION TABLE INPUTS Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability OUTPUT GZ A Y L H H L L L H X Z • positive logic equation ... tn Y = A (when GZ is L) CD CD description .c The SN54ASC5111 and SN74ASC5111 are noninverting 3-state output buffer standard cells that interface CMOS internal cells with TTL or CMOS external buses. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the finallC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during layout stage. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: FEATURES NETLIST CELL NAME OPE43LH OPF43LH HOL LABEL Label: OPF43LH A. GZ. Y; RELATIVE CELL LAYOUT ASPECT RATIO CELL AREA TO NA210LH minimum height 38 minimum width 45 I ne celis Incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states; therefore, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. PRODUCTION DATA documonts contain information current 8S of publication date. Products conform to specifications per the terms of Texas Instruments :'::~:~~i~ai~:1~7i ~:~:~ti:; lIiO;::::::t:~~S not Copyright @ 1986, Texas Instruments Incorporated TEXAS " , INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-529 C/) ... CO CO C SN54ASC5'1',SN74ASC51" TTL·/CMOS·COMPATIBLE 3·STATE OUTPUT BUFFERS description (continued) The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. The SN54ASC5111 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5111 is characterized for operation from - 40°C to 85 DC. absolute maximum ratings and recommended operating conditions See Table 3 in Section 2 and the 10 test conditions shown in the electrical characteristics. The maximum low-level or high-level output current is 3.4 milliamperes for the SN54ASC51 1'1 and 4 milliamperes for the SN74ASC5111. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) . PARAMETER VT II Input threshold voltage VOH High-level output voltage Vee 10H 10H = 5 V, = -4 mA = -3.4 mA 10H - lee ei Supply current 10L Input capacitance Equivalent power epd dissipation capacitance OPE43LH OPF43LH = 5 V, = UNIT V V Vee- O.I 0.5 See Note 1 = vee V 0.1 0.1 ±10 ±5 119 1982 or 0, 2334 TA 5 V, tr = 25°e = tl = 3 ns, 25°e NOTE I: These limits apply when all other outputs are open. 4-530 2.2 Vee- O.1 = MIN to MAX Vee TA MAX 0.5 TA = TYP 3.7 OPF43LH Vee SN74ASC5111 MIN 2.2 See Note ·1 -20 pA, Vo = Vee or 0 vee = 4.5 V to 5.5 V,V, G2 MAX 3.7 OPE43LH A TYP TA = 25°e 10L - 20 pA, Off-state output current MIN = 4 mA = 3.4 mA 10L VOL Low-level output voltage 102 SN64ASC6111 TEST CONDITIONS TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALl.AS, TEXAS 75265 140 0.6 0.6 0.4 0.4 10.3 10.3 10.9 10.9 pA nA pF pF SN54ASC5111, SN74ASC5111 TTL·/CMOS·COMPATIBLE 3·STATE OUTPUT BUFFE~S switching characteristics over recommended ranges of supply voltage and operating free·air telT!perature (unless otherwise noted) , TTL loads. CL PARAMETERt tpLH tpHL tpZH tpZL TTL loads. CL PARAMETERt tpLH a 15 pF FROM TO TEST (lNPUTI (OUTPUT) CONDITIONS A Y GZ Y SN54ASC5111 TYP* MAX MIN TYP* MAX 1.3 2.4 5.6 1.4 2.4 5 4.5 11.3 3.3 8 2.2 1.6 4.5 1 kg to GND 2.1 1.5 3.3 10 7.2 RL - 1 kg to Vec 2 4.5 11.6 2.2 4.5 10.2 RL RL ~ ~ 00 tpZL tPHZ tpLZ UNIT ns ns 50 pF FROM (lNPUTI TO A Y GZ Y SN54ASC5111 Typt MAX TEST CONDITIONS (OUTPUT) RL ~ MIN 00 tPHL tpZH SN74ASC5111 MIN GZ 1.8 3.5 8.5 1.9 3.5 7.6 3.8 8 19.7 4.2 8 17.3 2 4.4 10.9 2.1 4.4 9.8 3.9 8.3 21 4.2 8.3 18.2 RL - 1 kg to GND Y SN74ASC5111 MIN TYpt MAX RL ~ 1 kg to Vee RL ~ 1 kg to GND 11 11 RL - 1 kg to Vec 10 10 UNIT ns ns ns change in propagation delay times with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt IItPLH IItpHL IItpZH IItpZL FROM (INPUTI' TO (OUTPUT) A Y GZ y TEST SN54ASC5111 CONDITIONS MIN tpropagation delay times are measured from the 44% point of VI with tr at Vo ~ 1.3 V. . tpLH == propagation delay time, low-to-high-Ievel output tPHL '" propagation delay time, high-to-Iow-Ievel output tPZH '" output enable time to high level tpZL !!5 output enable time to low level tpHZ '" output disable time from high level tpLZ 55 output disable time from low level *Typical values are at Vee ~ 5 V, TA ~ 25°e. .atpLH iii ~ tf TYP* MIN TYP* 10 31 80 20 31 !\IIAX 70 50 100 240 50 100 210 10 31 80 20 31 70 50 lQ9 280 60 109 230 ~ ....CD U) SN74ASC5111 MAX a UNIT CD .c ps/pF (/) ....asas ps/pF 3 ns (10% and 90%). For TTL loads, the times end 0 change in tpLH with load capacitance IItPHL '" change in tpHL with load capacitance IItpZH " change in tpZH with load capacitance .a~PZL == change in tpZL with load capacitance ~ TEXAS INSTRUM~NTS POST OFF!CE BOX 655012 • OAl,.lAS, TEXAS 75265 4-53'1 • SN54~SC5111, SN74ASC5111 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS switching ciharacteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads. CL - 15 pF PARAMETERt tp~H tpHL tpZH tpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y GZ Y SN54ASC5111 SN14ASC5111 1.5 3 MAX ' 7.1 3,7 9,3 RL - 1 kO to GND 1.8 2 4 9.3 1.9 2.2 = 1 kO to V CC 1.7 3.6 9.2 1.9 RL RL = 00 MIN TYP* MAX MIN 1.6 3 6.3 3.7 4 8.3 8,3 3.6 8,2 TYP* UNIT ns ns CMOS loads. CL - 50 tlF PARAMETERt tpLH tpHL tpZH tpZL '. FROM (INPUT) A GZ TO (OUTPUT) Y Y TEST CONDiTIONS RL = 00 SN54ASC5111 MIN TYP* 2.5 5 SN74ASC5111 MAX 11.9 MIN 2.7 TYP* 5 MAX 10.6 2.9 6 6 3.1 3,2 13.4 3 15.3 14,2 6 RL - 1 kO to GND 6 12.7 Ri. - 1 kO to V CC 2.9 6 15.6 3.1 6 13.7 UNIT ns ns change in propagation delay times with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) :l1li PARAMETERt C &» .... &» en ::r : .... rn AtpLH AtpHL AtPZH AtpZL FROM TO TEST '(INPUT) (OUTPUT) CONDITIONS A Y GZ Y SN54ASC5111 MIN SN74ASC5111 TYP* 57 MAX MIN TYP* MAX 130 30 57 120 170 30 66 150 30 66 57 130 130 69 180 30 40 57 30 69 160 30 30 UNIT ps/pF ps/pF t Propagation delay times are measured from the 44% point of VI with tr = tf = 3 n5 (10% and 90%). For CMOS loads, the times end at 50% point of Va. tPLH '" propagation delay time, low-to-high-Ievel output .1tpLH '" change in tPLH with load capacitance .1tpHL '" change in tpHL with load capacitance tpHL '" propagation delay time, high-to-Iow-Ievel output tpZH '" output enable time to high level .1tpZH '" change in tpZH with load capacitance tpZL '" output enable time to low level .1tpZL '" change in tPZL with load capacitance * Typical values are at V CC = 5 V, TA = 25°C. DESIGN CONSIDERATIONS Refer to Section 7. 4-532 TEXAS. INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TI;XAS 75265 ADVANCE INFORMATION SN54ASC5120. SN74ASC5120 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS 02939. AUGUST 1986 SystemCelrM • Typical Propagation Delay 1 .7 ns with 15-pF Load 2.2 ns with 50-pF Load • Output Current Ratings SN54ASC5120 IOL IOH SN74ASC5120 IOL IOH 2-j.lm OUTPUT STANDARD CELL logic symbol A-[>-V • 20.4 mA -10.2 mA 24mA -12 mA FUNCTION TABLE INPUT Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability OUTPUT A V H H L L II ... positive logic equation Y =A U) II) II) description The SN54ASC5120 and SN74ASC5120 are noninverting output buffer standard cells that interface CMOS internal cells with TTL or CMOS external loads. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: OPFBOLH NETLIST CELL LAVOUT HOL LABEL ASPECT RATIO Label: OPFBOLH A.V; minimum width en ...caca C FEATURES CELL NAME .c RELATIVE CELL AREA TO NA210LH 63 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are. employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. -;-i,,,,,,, uU'llUL ""jj" j,,,v,, U""" ,j":;ign,,,j to provloe low-Impeoance arlve levelS tor both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. ADVANCE INFORMATION documenls cO.lai. informatioR on new pradoucts in the 88mplinp or IKap.oduotio. ph... tit development. Cha.actllriSlic ~ata a.d otho. spacificatio.. a.a subjlcllo cha.ge without notice. Copvrigh~ @ 1986, Texas Instrument.s Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-533 SN54ASC5120, SN74ASC5120 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS description (continued) The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. The SN54ASC5120 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5120 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 3 in Section 2. The maximum high-level output current is -10.2 milliamperes for the SN54ASC5120 and -12 milliamperes for the SN74ASC5120. The maximum low-level output current is 20.4 milliamperes for the SN54ASC5120 and 24 milliamperes for the SN74ASC5120. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT • Input threshold voltage VOH High-level output voltage Vee IOH IOH IOH IOL C ... I» I» en :r CD CD .... VOL Low-level output voltage IOL IOL ICC Supply current ej Input capacitance Equivalent power epd dissipation capacitance til SN54ASC5120 TEST CONDITIONS = 5 V. = -12 rnA = -10.2 rnA = -20.pA, = 24 rnA = 20.4 rnA = 20 pA, TA TYP MIN = = MIN to Vee = 5 V, = 5 V, = 25°C Vee TA TYP MAX 2.2 UNIT V 3.7 3.7 See Note 1 V Vee- D. 1 Vee- D. 1 0.5 V 0.5 See Note 1 MAX TA tr = 25°C = tf = 3 ns, 0.1 0.1 4207 252 nA 2.7 2.7 pF 32.8 32.8 pF NOTE 1: These limits apply when all other outputs are open. 4-534 SN74ASC5120 MIN 2.2 25°C Vee - 4.5 V to 5.5 V, VI - Vee or 0, TA MAX TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5120. SN74ASC5120 TTL-/CMOS-COMPATIBLE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads PARAMETERt tpLH FROM TO TEST (lNPUTI (OUTPUT) CONDITIONS A tPHL tpLH A tpHL Ll.tpLH Ll.tpHL A CL Y = RL CL Y = RL SN54ASC5120 Typt MAX MIN 1.3 15 pF, = SN74ASC5120 Typt MAX MIN 1.3 2 2 50 pF, 1.7 1.7 = 2.6 2.6 11 11 17 17 00 00 Y UNIT ns ns psipF CMOS loads PARAMETERt tpLH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y tpHL tpLH tpHL Ll.tPLH Ll.tpHL A A Y CL = RL CL = RL SN54ASC5120 Typt MAX MIN SN74ASC5120 Typt MAX MIN 15 pF, 1.6 1.6 = 00 1.8 1.8 50 pF, 2.1 2.1 = 2.2 2.2 14 14 11 11 00 Y UNIT ns ns psipF tpropagation delay times are meas·ured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For TTL loads, the times end at Vo = 1.3 V. For CMOS loads, the times end at the 50% point of Va. tpLH := propagation delay time, low;to-high level output tpHL == propagation delay time, high-ta-Iow level output AtpLH == change in tpl.H with load capacitance ..1tpHL == change in tpHL with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. II ... rn CU CU .c en ... ctI ctI DESIGN CONSIDERATIONS C Refer to Section 7. -1!1 TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-535 4-536 PRODUCT PREVIEW SN54ASC5121, SN74ASC5121 TTL-/CMOS-COMPATIBLE OPEN-DRAIN OUTPUT BUFFERS 02939. AUGUST 1986 SystemCelrM 2-lAm ''lgic symbol • Typical Propagation Delays 1 .7 ns with 15-pF Load 2.2 ns with 50-pF Load • Output Current Ratings SN54ASC5121 IOL - 37.4 mA SN74ASC5121 IOL = 44 mA • OUTPUT STANDARD CELL A-[>--V FUNCTION TABLE INPUT Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability OUTPUT A V H H L L II ... positive logic equation Y=A U) description The SN54ASC5121 and SN74ASC5121 are noninverting output buffer standard cells that interface CMOS internal cells with a passive pull-up external load. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: FEATURES CELL NAME OPFD1LH NETLlst CELL LAVOUT HOL LABEL ASPECT RATIO Label: OPFD1 LH A.V; minimum width G) G) .c en ...caca C RELATIVE CELL AREA TO NA210LH 54 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to' 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, . thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for low-logic-level outputs interfacing a bus having a terminated high-level drive source. As a result, passive resistance has been omitted in series with the output transistor. Shortino the low-level outout to Vr:r: will,,,,,,,,,, r.llrrp.nt flow in ''''''P.'''' of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to Vec. PRODUCT PREVIEW documents contain infurmation an products in the formative or design phala of development. Characteristic data and other i: t::: dt-:iX'a=::I~rT3i~::~a:u':~:= products without notice. :r::t srrgr:t Copyright © 1986, Texas Instruments Incorporated .. TEXAS'" INSTRUMENts POST OFFICE BOX 655012 • DALLAS, T-EXAS 75265 4-537 SN54A~~5121, SN74ASC5121 TTL-/CMOS-COMPATIBLE OPEN-DRAIN, OUTPUT BUFFERS description (continued) The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loacjing. The SN54ASC5121 is charactElrized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5121 is characterized for operation from -40°C to 85°C . . absolute maximum ratings and recomrrended operating conditions See Table 3 in Section 2. The maximum low-level output current is 37.4 milliamperes for the SN54ASC5121 and 44 milliamperes for the SN74ASC5121. electrical charaoteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) . . PARAMETER VT Input threshold voltage SN54ASC5121 TEST CONDITIONS VCC = TA 5 V, MIN = TYP MAX 2.2 25°e SN74ASC5121 MIN TYP 2.2 II C ... I» I» ...en = IOZ Off·state output current lee supply current Ci Input capacitance Equivalent power epd dissipation capacitance 0.5 0.1 37A mA IOL - 20 ~A, f/) :r --V FUNCTION TABLE INPUT Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.S V to S.S V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability OUTPUT A Y H H L L positive logic equation II V=A description The SN54ASC5123 and SN74ASC5123 are non inverting output buffer standard-cells that interface CMOS internal cells with a passive pull-up external load. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: FEATURES CELL NAME OPFE1LH NETLIST CELL LAYOUT HDL LABEL ASPECT RATIO Label: OPFE1 LH A,Y; minimum width RELATIVE CELL AREA TO NA210LH 69 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for the lOW-logic-level outputs interfacing a bus having a terminated high-level drive source. As a result, passive resistance has been omitted in series with the output transistor. Shorting the low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to VCC. The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive .loading. The SN54ASC5123 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5123 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 3 in Section 2. The maximum low-level output current is 40.8 milliamperes for the SN54ASC5123 and 48 milliamperes for the SN74ASC5123. Copyright © 1986, Texas Instruments Incorporated ADVANCE INFORMATION documenlS contain =':::~~:~r.'!: Jr::..-:.!~:~:::::~':rst~~ data and other .pacifications are ••bjact to change without notice. TEXAS • INSTRUMENTS POST OFFice sox 655012 • DALLAS, TEXAS 75266 4-541 SN54ASC5123. SN74ASC5123 TTL-/CMOS-COMPATlBLE OPEN-DRAIN OUTPUT BUFFERS electrical characteristics over recorrimended ranges of supply voltage and operating free-air temperature (unless otherll!'ise noted) PARAMETER VT SN54ASC5123 TEST CONDITIONS Input threshold voltage MIN MAX SN74ASC5123 MIN 2.2 TA = 25°C Vee = 5 V, TYP TYP IOL - 40.8 pA, IOL - 20 ~A, See Note 1 IOZ Off-state output current Vo - Vee or 0 Vee - 4.5 V to 5.5 V, ICC Supply current VI = Vee or 0, TA = MIN to MAX ei Input capacitance Vee = 5 V, TA = 25°C Equivalent power Vee - 5 V, TA = 25°C tr - tf - 3 ns, epd dissipation capacitance UNIT V 0.5 IOL - 48 mA, VOL Low-level output voltage MAX 2.2 V 0.5 0.1 0.1 ±10 ±5 pA 3171 190 nA 1.8 1.8 pF 16.2 16.2 pF NOTE 1: These limits apply when all other outputs are open. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) ~ TTL loads PARAMETERt C m FROM TO TEST (lNPUTI (OUTPUT) CONDITIONS r+ tpZL A y rn ::r tpZL A y tPLZ t.tpZL A Y A y m CD CD r+ (II SN54ASC5123 Typf MAX SN74ASC5123 Typf MAX UNIT 1.5 1.5 ns 1.9 1.9 ns 9 9 11 11 ps/pF SN74ASC5123 Typf MAX UNIT 1.3 1.3 ns 1.7 1.7 ns 11 11 ps/pF MIN eL = 15 pF, RL = 1 k!l to Vee eL - 50 pF, RL = 1 k!l to Vee RL = 1 k!l to Vee MIN ns CMOS loads PARAMETERt tpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A y SN54ASC5123 Typf MAX MIN eL - 15 pF, RL = 1 k!l to Vee tpZL A Y t.tPZL A y eL - 50 pF, RL = 1 k!l to Vee t Propagation delay times are measured from the 44% point of VI with tr at Va = 1.3 V. For CMOS loads, the times end at 50% pOint of VO· tpZL .. output enable time to low level tpLZ .. output disable time from low level t.tpZL .. change in tpZL with load capacitance fTypical values are at Vee = 5 V, TA = 25°C. ;= tf = 3 ns 110% and 90%). For TTL loads, the times end DESIGN CONSIDERATIONS Refer to Section 7, 4-542 MIN TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 ADVANCE INFORMATION SN54ASC5124, SN74ASC5124 TTL·/CMOS·COMPATIBLE 3·STATE OUTPUT BUFFERS 02939, AUGUST 1986 SystemCell™ • Typical Propagation Delays 2,5 ns with 15-pF Load 3 ns with 50-pF Load • Output Current Ratings SN54ASC5124 IOL IOH SN74ASC5124 IOL IOH • 2-l"m OUTPUT STANDARD CELL logic symbol A~Y GZ~ 37.4 mA -10,2 mA 44mA -12 mA FUNCTION TABLE INPUTS Incorporates Circuitry to Protect Against ESD and -Latch-Up • Specified for Operation Over VCC Range of 4,5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability OUTPUT GZ A Y L H L L H L H X Z a... positive logic equation Y =A (when GZ is L) fI) G) G) description The SN54ASC5124 and SN7 4ASC5124 are noninverting 3-state output buffer standard cells that interface CMOS internal cells with TTL or CMOS external buses. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: FEATURES CELL NAME OPF03LH NETLIST CELL LAYOUT HOL LABEL ASPECT RATIO Label: OPF03LH A,GZ, Y; minimum width RELATIVE .z:. en ...'" o'" CELL AREA TO NA210LH 93 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. Thp.c:::p nllt~llt r.p.1I1=: h;=:j\lA hj:lp,n ri':::&c::i~nprl tn !""rn\liria In\AI_irn:-'Qrt~n""Q riri\lc IC\Jpl~ f"r hnth t+~",=, ~i~~_?!,,~ 1':',.11.,- logic-level states. As a result, passive resistance has been omitted in series with the output transistors, Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC, The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. The SN54ASC5124 is characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC5124 is characterized for operation from -40°C to 85°C. ADVANCE INFORMATION d••uments •• ntain ~=:3~~~::h~~= o~r3!-:~~~~:ec~::~~Pst1! IIBIa and othar specifications are subject to changa without notics. Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-543 SN54ASC5124, SN74ASC5124 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS absolute maximum ratings and recommended operating conditions See Table 3 in Section 2. The maximum high-level output current is 10.2 milliamperes for the, SN54ASC5124 and 12 milliamperes for the SN74ASC5124. The maximum low-level output current is 37.4 milliamperes for the SN54ASC5124 and 44 milliamperes for the SN74ASC5124. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT SN54ASC5124 TEST CONDITIONS Input threshold voltage VOH High-level output voltage = 5 V, 10H = -12 mA IOH - -10.2 mA 20 pA, IOH Vee TA = TYP MIN MAX SN74ASC5124 MIN TYP 2.2 25°e 2.2 V Vee Vee 0.1 0.1 0.5 0.5 IOL - 20 ~A, • IOZ Off-state output current lee Supply. current ei Input capacitance I I GZ Equivalent power epd C I» r+ I» dissipation capacitance See Note 1 Vo - Vee or 0 Vee - 4.5 V to 5.5 V, V, TA A = MIN Vee = V 3.7 See Note 1 = 37.4 mA IOL UNIT 3.7 IOL - 44 mA VOL Low-level output voltage MAX Vee or 0, to MAX 5 V, TA Vee - 5 V, TA = 25°e = 25°e = tf = tr V 0.1 3 ns, 0.1 ±10 ±5 pA 6320 379 nA 1.8 1.8 1.4 1.4 49 49 pF pF NOTE 1: These limits apply when all other outputs are open. en switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CD CD TTL loads. CL - 15 pF :::r r+ (I) PARAMETERt tpLH tpHL tpZH tpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y GZ Y RL SN54ASC5124 MIN RL = 00 = 1 kO to GND RL - 1 kO to Vee TYP* 2.2 MAX SN74ASC5124 MIN TYP* 2.2 2.5 2.5 3 3 2.1 2.1 MAX UNIT ns ns t Propagation delay times are measured from the 44% point of V, with tr = tf = 3 ns (10% and 90%). For TTL loads, the times end at Vo = 1.3 V. . tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output tpZH '" output enable time to high level tpZL '" output disable time from low level ~Typical values are at Vee = 5 V, TA = 25°e. 4-544 TEXAS . . INSTRUMENTS POST OFFICE BOX 656012 .. DALLAS, TEXAS 75285 SN54ASC5124, SN14ASC5124 TTL-ICMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (continued) TTL loads, CL = 50 pF PARAMETERt tpLH TO TEST (OUTPUT) CONDITIONS A Y GZ Y RL tPHL tpZH tpZL tpHZ SN54ASC5124 FROM (INPUT) GZ RL = = MIN TYP* 00 1 kll to GND RL = 1 kll to GND Y RL = SN74ASC5124 MIN 2.8 3 3.6 2.8 10 9 RL - 1 kll to Vee tPLZ MAX 1 kll to Vee TYP* MAX 2.8 3 3.6 2.8 10 9 UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads PARAMETERt Ll.tpLH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Ll.tpHL Ll.tpZH Ll.tpZL GZ SN54ASC5124 MIN TYP* MAX SN74ASC5124 MIN 17 14 Y Y TYP* 17 17 14 17 20 20 MAX UNIT ps/pF ps/pF II switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads, CL - 15 pF PARAMETERt tpLH tpHL tpZH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y GZ Y tpZL CMOS loads, CL PARAMETERt tpLH tpHL RL = = TYP* MAX SN74ASC5124 MIN 00 1 kll to GND RL - 1 kll to Vee TYP* MAX 2.7. 2.2 3.4 1.8 2.7 2.2 3.4 1.8 UNIT ns ns 50 pF SN54ASC5124 FROM TO TEST liN PUT) (OUTPUT) CONDITIONS A Y U£ Y MIN TYP* MAX SN74ASC5124 MIN TYP* 3.6 2.q 3.6 2.6 ~~In 44 AA RL - 1 kll to Vee 2.4 2.4 RL = R, _ 1 kO tp7J-1 tpZL RL SN54ASC5124 MIN 00 tn MAX UNIT ns ns tPropagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%1. For TTL loads. the times end at Vo = 1.3 V. For eMOS loads. the times end at the 50% point of VO. tPLH '" propagation delay time. low-to-high-Ievel output i!.tPLH·'" change in tpLH with load capacitance tPHL '" propagation delay time. high-to-Iow-Ievel output Ll.tpHL '" change in tpHL with lo~d capacitance tpZH '" output enable time to high level Ll.tpZH '" change in tpZH with loap capacitance tpZL '" output enable time to low level Ll.tpZL '" change in tpZL with load capacitance tpHZ '" output disable time from high level tpLZ == output disable time ,from low level tTypical values are at Vee = 5 V, TA = 25°C. . TEXAS. INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-545 SN54ASC5124, SN74ASC5124 , TTL-/CMOS-COMPATIBLE 3-STATE t)UTPUT BUFnRS change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads PARAMETERt a.tPLH a.tpHL a.tpZH a.tpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A GZ SN54ASC5124 MiN TYP* 26 Y y MAX SN74ASC5124 MIN TYP* 26 11 11 29 29 17 17 MAX UNIT pslpF pslpF tPropagation delay times are measured from the 44% point 0.1 VI with tr = tf = 3 ns (10% and 90%). For CMOS loads, the times end at the 50% point of VO. a.tpLH .. change in tPLH with load capacitance a.tpHL '" change in tPHL with load capacitance a.tpZH ., change in tpZH with load capacitance atpZL ., change in tpZL with load capacitance *Typical values are at VCC = 5 V, T A = 25 ac. • DESIGN CONSIDERATIONS Refer to Section 7. c ... C» C» (I) :r ... CD CD en 4-546 ..tj TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. r·EXAS 762.65 SN54ASC5125, SN74ASC5125 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS ADVANCE INFORMATION 02939, AUGUST 19B6 SystemCell™ • Typical Propagation Delays 2.8 ns with 15-pF load 3.7 ns with 50-pF load • Output Current Ratings SN54ASC5125 IOl IOH SN74ASC5125 IOl IOH • 2-llm OUTPUT STANDARD CELL logic symbol A~Y GZ 20.4 mA -10.2 mA 24 mA -12 mA --.11 FUNCTION TABLE INPUTS Incorporates Circuitry to Protect Against ESD and latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability GZ A L H OUTPUT Y H L L L H X Z • positive logic equation ... Y = A (when GZ is l) II) Q) Q) description The SN54ASC5125 and SN74ASC5125 are noninverting 3-state output buffer standard cells that interface CMOS internal cells with TTL or CMOS external buses. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: OPFB3LH NETLIST CELL LAYOUT HOL LABEL ASPECT RATIO Label: OPFB3LH A,GZ,Y; minimum width en ...caca C FEATURES CELL NAME .s: RELATIVE CELL AREA TO NA210LH 64 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. The SN54ASC5125 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC5125 is characterized for operation from -40°C to 85°C. Copyright © 1986, Texas Instruments Incorporated ADVANCE INFORMATION documonto contain ::':3!:rO::h~~= o,r:!~r~~~n\~~~:::::::Pst~! ~ata and other opacifications ora subjact to chango without notice. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-547 SN54ASC5125, SN74ASC5125 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS absolute maximum ratings and recommended operating conditions See Table 3 in Section, 2, The maximum high-level output current is 10,2 milliamperes for the SN54ASC5125 and 12 milliamperes for the SN74ASC5125, The maximum low-level output current is 20.4 milliamperes for the SN54ASC5125 and 24 milliamperes for the SN74ASC5125, electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT Input threshold voltage Vce 10H VOH High-level output voltage 10H = 5 V, = -12 mA = -10,2 mA = -20 pA, TA VOL Low-level output voltage • 10Z Off-state output current ICC Supply current ei Input capacitance 10l = 10l ~ Equivalent power dissipation capacitance 2Soe TYP MAX SN74ASC5125 MIN 2,2 TYP 2,2 MAX UNIT V 3,7 V Vee- D,1 Vee- D. l O,S O,S ° ~ Vee or 0, MAX TA = V 0,1 See Note 1 \(0 - Vee or Vee = 4,5 V to S,5 V, VI = MIN to Vee = S V, Vee = 5 V, TA = 25°C = See Note 1 2004 mA 20 pA, TA MIN 3,7 10H IOL - 24 mA epd SN54ASC5125 TEST CONDITIONS 25°C 0,1 ±10 ±S pA 4009 241 nA 1,1 1.1 pF 29 29 pF tr :::: tf :::: 3 ns, NOTE 1: These limits apply when all other outputs are open. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads, CL = 15 pF PARAMETERt tPlH tpHl tpZH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Y Rl Y GZ tPZl SN74ASC5125 Typt MAX UNIT 3,2 2,3 3,2 ns 1 k!l to GND 2,7 2,7 1 k!l to Vee 3 3 Rl Rl = = = SN54ASC5125 Typt MAX MIN 2,3 00 MIN ns t Propagation delay times are measured from the 44% point of VI with tr :::: tf :::: 3 ns (10% and 90%), For TTL loads, the times end at Vo = 1,3 V, tpLH ;;;;: propagation delay time, low-to-high-Ievel output tpHl " propagation delay time, high-to-Iow-Ievel output tpZH E output enable time to high level tpZL ;;;: output disable time from low level +Typical values are at Vee 4-548 = 5 V, TA = 25°C, TEXAS "11 INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5125, SN74ASC5125 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (continued) TTL loads, CL = PARAMETERt 50 pF FROM (INPUT) TO (OUTPUT) A Y tpLH tpHL tpZH tpZL tpHZ tpLZ GZ Y GZ Y TEST CONOITIONS RL SN54ASC5125 MIN ~ 00 TYP* MAX SN74ASC5125 MIN TYP* 2.9 4.3 4.3 2.9 RL ~ 1 kll to GND 3.4 3.4 RL RL ~ 1 kll to Vce 1 kll to GND 4.2 4.2 8.5 8.5 RL ~ 1 kll to Vee 8.2 8.2 ~ MAX UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads PARAMETERt FROM (INPUT) TO TEST (OUTPUT) CONDITIONS A Y atpLH atpHL atpZH GZ atpZL SN54ASC5125 MIN TYP* y MAX SN74ASC5125 MIN TYP* 17 17 31 31 20 20 34 34 MAX UNIT ps/pF ps/pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads, CL PARAMETERt = TO TEST (INPUT) (OUTPUT) CONDITIONS A Y tpLH tpZH GZ tPZL CMOS loads, CL PARAMETERt tpLH tpHL tpZH . -- fn..,., 15 pF FROM tpHL = a RL SN54ASC5125 MIN ~ 00 RL - 1 kg to GND Y RL ~ 1 kll to Vee TYP* 2.7 MAX SN74ASC5125 MIN TYP* 2.7 2.9 3.2 3.2 2.6 2.6 MAX UNIT ns 2.9 ns 50 pF FROM' (INPUT) TO TEST (OUTPUT) CONDITIONS A Y GZ Y RL SN54ASC5125 MIN ~ 00 TYP* 3.7 MAX SN74ASC5125 MIN TYP* 3.7 3.7 3.7 RL - 1 kg to GND 4.2 4.2 R, 3.5 3.5 - 1 kO to V,..r-- MAX UNIT ns ns tpropagation delay times are measured from the 44% point of VI with tr ~ tf ~ 3 ns (10% and 90%). For TTL loa'ds. the times end at Va ~ 1.3 V. For eMOS loads, the times end at the 50% point of Va. tpLH '" propagation delay time, low-to-high-Ievel output atpLH '" change in tPLH with load capacitance tpHL '" propagation delay time. high-to-Iow-Ievel output atpHL '" change in tpHL with load capacitance tpZH '" output enable time to high level atpZH '" change in tpZH with load capacitance tpZL '" output enable time to low level atpZL .. change in tpZL with load capacitance tPHZ '" output disable time from high level tpLZ '" output disable time from low level *Typical values are at Vee = 5 V. TA = 25°e. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-549 SN54ASC5125, SN74ASC5125 TTL-/CMOS-COMPATIBLE 3-STATE OUTPUT BUFFERS change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads PARAMETERt IltPLH IltpHL IltpZH IltpZL FROM (INPUT) TO TEST (OUTPUT) CONDITIONS A Y GZ Y tpropagation delay times are measured from the 44% point of VI with tr at the 50% point of Va. IltpLH '" change in tpLH with load capacitance IltpHL .. change in tpHL with load capacitance IltpZH .. change in tpZH with load capacitance IltpZL '" change in tpZL with load capacitance *Typical values are at VCC = 5 V, T A = 25°C. SN54ASC5125 MIN = tf = TYP* TYP* 23 29 29 26 26 29 MAX UNIT ps/pF ps/pF 3 ns (10% and 90%). For TTL loads, the times end Refer to Section 7. D) D) en :r .. CD CD U) 4-550 SN74ASC5125 MIN 29 23 DESIGN CONSIDERATIONS IIc .. MAX ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5200, SN74ASC5200 J·STAH 1/0 BUFFER WITH INVERTING CMOS INPUT AND CMOSITTL OUTPUT D2939, AUGUST 1986 SystemCell™ • Typical Propagation Delays 3.3 ns with 15·pF load 5.9 ns with 50-pF load • Output Current Ratings: SN54ASC5200 IOl IOH SN74ASC5200 IOl IOH 2·/Am OUTPUT STANDARD CELL logic symbol A • 3.4mA -3.4 mA 4mA -4 mA GZ--_...J Y2 Incorporates Circuitry to Protect Against ESD and latch-Up FUNCTION TABLE INPUTS • • • Yl OUTPUTS Specified for Operation Over VCC Range of 4.5 V to 5.5 V A GZ Yl Yl Y2 L L L L H Functional Operation Over VCC Range of 2Vt06V H L H H L X H L Z H X H H Z L Dependable Texas Instruments Quality and Reliability II positive logic equations Y1 = A Y2 = VI description The SN54ASC5200 and SN74ASC5200 are three-state input/output buffer standard cells that interface CMOS internal cells with TTL or CMOS bidirectional bus lines. The input buffer responds to CMOS threshold levels imposed on the I/O bus regardless of the state of the internal 3-state control GZ, This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries, Determination of the most appropriate cell version will be made during the layout stage, The cell is designated and called from the engineering workstation input using the following cell name and netlist label: FEATURES NETLIST CELL NAME IOE40LH IOF40LH HDL LABEL Label: IOF40LH A,GZ,Y2,Yl; CELL LAYOUT ASPECT RATIO RELATIVE CELL AREA TO NA210LH minimum height 44.5 minimum width 49.5 The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or V CC, PRODUCTION DATA documents contain information current as of publication date. Products conform to specifications per the terms of Texas Instruments :~~~~:~~i~ai~:1~1e ~!::i~~ti:r :I~o::~:~:t:~~s not -1!1 TEXAS INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 752tl5 Copyright © 1986, Texas Instruments Incorporate 4-551 SN54ASC5200, SN74ASC5200 3·STATE 1/0 BUFFER WITH INVERTING CMOS INPUT AND CMOSITTL OUTPUT description (continued) The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various outputs response with change in capacitive loading. The SN54ASC5200 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5200 is characterized for operation from -'40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 4 in Section 2. The maximum high-level or maximum low-level output current is 3.4 milliamperes for the SN54ASC5200 and 4 milliamperes for the SN74ASC5200. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT TEST CONDITIONS ~ Input threshold voltage V 1 VOH High-level output voltage II Vee = 5 V, SN54ASC5200 MIN TYP MIN TYP Off-state output current V 2.5 3.7 V Vee- O. l Vee- O.l 0.5 0.5 10L = 3.4 mA 10L - 20 ~A, 10Z UNIT 3.7 10L - 4 mA VOL Low·level output voltage MAX 2.2 2.2 2.5 TA = 25°e 10H = -4 mA 10H - -3.4 mA 10H = -20 ~A, See Note 1 SN74ASC5200 MAX See Note 1 Vo - Vee or 0 V 0.1 0.1 ±10 ±5 ~A NOTE 1: These limits apply when all other outputs are open. IOE40LH . PARAMETER lee Supply current ei Input capacitance TEST CONDITIONS Equivalent power TYP VI - Vee or 0 VI - 3.15 V or 0.9 V ~ GZ dissipation capaCitance MAX TA = 25°e Vee = 5 V, TA = 25°e tr = tf = 3 ns, SN74ASC5200 2373 MAX 142 4.33 4.1 0.61 Vee = 5 V, Yl t epd SN54ASC5200 TYP UNIT nA mA 0.61 0.4 0.4 3.84 3.84 12.5 12.5 pF pF IOF40LH PARAMETER lee Supply current ei Input capacitance TEST CONDITIONS Equivalent power TYP ~ GZ Vee = 5 V, TA = 25°C dissipation capaCitance Vee = 5 V, tr = tf = 3 ns, TA = 25°e MAX SN74ASC5200 TYP 2592 4.29 VI =. Vee or 0 VI - 3.15 V or 0.9 V Yl t epd SN54ASC5200 MAX 155 4.06 0.59 0.59 0.47 0.47 4.38 4.38 12.7 12.7 UNIT nA mA pF 'pF tTotal input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. 4-552 TEXAS • INSTRUMENTS POST OFFICE 'BOX 655012 • DALLAS. tEXAS 75265 SN54ASC5200, SN74ASC5200 3·STATE I/O BUFFER WITH INVERTING CMOS INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads. CL = 15 pF PARAMETERt FROM (INPUT) TO (OUTPUT) tpLH tpHL A Yl tpZH tpZL GZ TEST CONDITIONS SN74ASC5200 TYP* MAX MIN TYP* MAX 1.3 2.1 2.5 4.5 5.9 11.6 1.4 2.3 2.5 4.5 10.4 RL - 1 k!l to GND 1.5 3.4 8.4 1.6 3.4 7.6 RL - 1 k!l to Vee 2.1 4.6 11.8 2.2 4.6 10.5 RL = Yl SN54ASC5200 MIN 00 5.3 UNIT ns ns TTL loads. CL = 50 pF PARAMETERt tpLH tpHL tpZH tpZL. tpHZ tpLZ FROM (INPUT) A GZ GZ TO (OUTPUT) TEST CONDITIONS MAX MIN 3.6 8.8 2 TYP* 3.6 MAX 1.8 3.9 8.2 19.8 4.3 8.2 17.4 1 k!l to GND 2 4.5 11.3 2.1 4.5 10.2 RL = 1 k!l to Vee RL - 1 k!l to GND 4 8.5 20.8 4.3 8.5 18.1 RL RL Yl SN74ASC5200 TYP* Yl Yl SN54ASC5200 MIN RL = = = 00 1 k!l to Vee 11 11 10 10 7.8 UNIT ns ns ns change in propagation delay times with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt Ll.tpLH Ll.tpHL Ll.tpZH Ll.tpZL FROM (INPUT) TO (OUTPUT) A Yl GZ Yl TEST CONDITIONS SN54ASC5200 MIN TYP* SN74ASC5200 TYP* MAX MAX MIN 10 31 80 20 31 80 50 106 230 50 106 210 10 31 80 20 31 60 50 111 260 60 111 240 a ....en UNIT G) G) ps/pF .c en ps/pF ....caca switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) C CMOS loads. CL = 15 pF PARAMETERt tpLH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Yl GZ Yl tPHL tpZH tpZL RL = RL RL = SN54ASC5200 SN74ASC5200 MIN TYP* MAX MIN 1.5 1.8 3.1 3.7 7.5 9.7 1.7 2 00 TYP* 3.1 MAX 3.7 8.6 6.7 1 k!l to GND 2 4 9.8 2.2 4 8.8 1 k!l to Vee 1.8 3.7 9.4 1.9 3.7 8.4 t Propagation delay times are measured from the 44% point of VI with tr = tf at Vo = 1.3 V. For CMOS loads, the times end at the 50% point of VO. tpLH == propagation delay time, low-to-high-Ievel output .6.tpLH tpHL == propagation delay time, high-to-Iow-Ievel output ..:ltpHL =: tpZH ;;;;;: output enable time to high level LltpZH == tpZL == output enable time to low level .6.tpZL == tpHZ == output disable time from high level tpLZ i5! output disable time from low level Typical values are at Vee = 5 V, TA = 25°C. = UNIT ns ns 3 ns (10% and 90%1. For TTL loads, the times end = change in tpLH with load capacitance change in tpHL with load capacitance change in tpZH with load capacitance change in tPZL with load capacitance * TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4·553 SN54ASC5200,SN74ASC5200 3·STATE 1/0 BUFFER WITH INVERTING CMOS INPUT AND CMOSITTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads. CL = 50 pF PARAMETERt tpLH FROM !INPUT) TO (OUTPUT) A VI tpZL GZ VI SN54ASC5200 TVPt MAX MIN SN74ASC5200 TVpt MAX MIN 2.6 5.2 2.9 6.2 12.1 15.5 2.8 3.2 5.2 6.2 10.8 13.7 RL - 1 kll to GND 3.1 6.2 14.6 3.3 6.2 13 RL - 1 kll to VCC 2.9 6.2 15.7 3.2 6.2 13.8 RL = tpHL tpZH TEST CONDITIONS 00 UNIT ns ns change in propagation delay times with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless othinwise noted) PARAMETERt .:l.tpLH FROM (INPUT) A TO (OUTPUT) SN54ASC5200 TVPt MAX TEST MIN CONDITIONS VI .:l.tpHL .:l.tpZH • o GZ VI .:l.tpZL SN74ASC52000 TVpt MAX MIN 30 60 140 30 60 120 30 69 170 30 69 150 30 63 140 30 63 130 30 71 190 40 71 160 UNIT ps/pF ps/pF input buffer switching characteristics over recommended ranges of supply voltage arid operating free-air temperature (unless otherwise noted) PARAMETER§ !Q) tpLH tpHL tJ) ::r tPLH tpHL ....o .:l.tpHL CD CD .:l.tpLH FROM TO TEST (INPUT) 10UTPUT) CONDITIONS VI V2 VI V2 VI V2 CL CL =0 = SN54ASC5200 TYpt MAX MIN MIN 1 pF SN74ASC52000 TVpt MAX 0.4 0.7 1.2 0.4 0.7 1.2 0.2 0.7 1.5 0.3 0.7 1.3 0.7 1 1.8 0.1 1 1.8 0.5 1.1 2.3 0.6 1.1 2.1 0.2 0.3 0.7 0.2 0.3 0.7 0.2 0.4 0.9 0.2 0.4 0.8 UNIT ns ns ns/pF t Propagation delay times are measured from the 44% point of VI with tr = tf = 3 ns 110% and 90%). For CMOS loads, the times end at the 50% pOint of Vo. tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output tpZH '" output enable time to high le\lel tpZL '" output enable time to low level tTypical values are at VCC = 5 V, TA = 25°C. § Input propagation delay times are measured from the 50% pOint of .:l.tpLH .:l.tpHL .:l.tPZH .:l.tPZL " '" '" " change in ipLH with load capacitance change in tpHL with load capacitance change in tpZH with load capacitance change in tpZL with load capacitance VI to the 44% point of Vo with tr DESIGN CONSIDERATIONS Refer to Section 7. 4-554 TEXAS • INSTRUMENTS POST OFFICE BOX 655012· DALLAS, T!:XAS 7526~ = tf = 4 ns. SN54ASC52D1, SN74ASC52D1 3·STATE I/O BUFFER WITH INVERTING TTL INPUT AND CMOS/TTL OUTPUT 02939. AUGUST 1986 SystemCell11\1 logic symbol • Typical Propagation Delays 3.5 ns with 15-pF Load 5.8 ns with 50-pF Load • Output Current Ratings SN54ASC5201 IOL - 3.4 rnA IOH - -3.4 rnA SN74ASC520110L - 4 rnA IOH - -4 rnA • A;tt-Vl GZ V2 FUNCTION TABLE Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over Vee Range of 4.5 V to 5.5 V • Functional Operation Over VCC Rangeof2Vt06V • 2-~m OUTPUT STANDARD CELL INPUTS OUTPUTS A GZ Vl Vl L L L L H L H H L X X H L Z H H H Z L V2 H Dependable Texas Instruments Quality and Reliability II ... positive logic equations Yl =A en description The SN54ASC5201 and SN74ASC5201 are 3-state input/output buffer standard-cells that interface CMOS internal cells with TTL or CMOS \:lidirectional bus lines. The input buffer responds to TTL threshold levels imposed on the I/O bus regardless of the state of the internal 3-state control GZ. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be containec! in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name and netlist label: CD CD .c en ...asas C FEATURES NETLIST CELL NAME IOE43LH IOF43LH CELL LAVOUT HDL LABEL Label: IOF43LH A,GZ.Y2,Yl; RELATIV~ ASP!,CT RATIO CELL AREA TO NA210LH minimum height 47.7 minimum width 50.9 The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guarc!-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most r;ommon sources that can produce a' latch-up condition. These output cells have been designed to provide low-impedance drive l\3vels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to' ground or a low-level output to V CC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. PRODUCTION DATA doouments oontain inform.tl," ourrent .. of publio.tion d.te. Products' oonform to .pecifications por the terms of T.... Instruments atandard werrenty. Prad.olion prtioassing dQIS Dot n......ril' inolu..e testing of p.remate"" ' .,1 "'!1 TEXAS INSTRUMENTS POST OFFICE ~OX 655012 ~ DALl.AS, TEXAS 75265 Copyright © 1986. Texas Instruments Incorporated 4-555 SN54ASC5201. SN74ASC5201 3-STATE I/O BUFFER WITH INVERTING TTL INPUT AND CMOS/TTL OUTPUT description (continued) The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses to change in capacitive loading. The SN54ASC5201 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5201 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 4 in Section 2. The maximum high-level or maximum low-level output current is 3.4 milliamperes for the SN54ASC5201 and 4 milliamperes for the SN74ASC5201. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT II TEST CONDITIONS ,~ Input threshold voltage Yl VOH High-level output voltage v, Dr en :::r ... SN74ASC5201 MAX MIN TYP 1.3 10Z Off-state output current UNIT v 1.3 3.7 -20 ~A, See Note 1 V Vee- O. 1 Vee- O. 1 0.5 10L = 4 mA VOL Low-level output voltage MAX 2.2 3.7 V 0.5 10L = 3.4 mA See Note 1 10L - 20 pA, I» TYP 2.2 TA = 25°e 10H = -4 mA 10H = -3.4 mA 10H - C CD CD Vee = 5 SN54ASC5201 MIN Vo = Vee or 0 0.1 0.1 ±10 ±5 ~ NOTE 1: These limits apply when all other outputs are open. IOE43LH (I) PARAMETER lee Supply current ei Input capacitance TEST CONDITIONS Equivalent power TYP VI - Vee or 0 VI = 2 V or 0.8 V ~ Vee = 5 V, TA = 25°e Yl t epd SN54Ase5201 dissipation capacitance Vee = 5 V, TA = 25°e tr = tf = 3 ns, MAX SN74ASC5201 TYP MAX UNIT 2500 150 nA 1.2 1.12 mA 0.62 0.62 0.41 0.41 4.34 4.34 13.2 13.2 pF pF IOF43LH PARAMETER Ice Supply current ei Input capacitance 'TEST CONDITIONS Equivalent power TYP ~ Vee = 5 V, TA = 25°e dissipation capacitance Vee'= 5 V, tr = tf = 3 ns, TA = 25°e MAX SN74ASC5201 TYP 2588 1.21 VI = Vee or 0 VI = 2 V or O.B V Y1 epd SN54ASC5201 0.59 0.59 0.47 0.47 4.26 4.26 13.4 13.4 MAX UNIT 155 nA 1.13 mA pF pF tTotal input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. 4-556 TEXAS . " INSTRUMENTS . POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5201, SN74ASC5201 3-STATE 110 BUFFER WITH INVERTING TTL INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise notedl TTL loads. CL - 15 pF PARAMETERt tpLH tpHL tpZH tpZL fROM (INPUT) TO (OUTPUT) A Yl GZ Yl TEST CONOITIONS RL RL RL = = = 00 SN54ASC5201 SN74ASC5201 MIN TYP* MAX MIN 1.3 2.5 4.5 6 11.2 1.4 2.2 2.1 TYP* 2.5 MAX 4.5 9.9 5.4 1 kO to GND 1.5 3.5 8.5 1.6 3.5 7.8 1 kO to Vee 2 4.4 11.2 2.2 4.4 9.8 UNIT ns ns TTL loads. CL - 50 pF PARAMETERt tpLH tpHL tPZH tpZL tpHZ tpLZ FROM (INPUT) TO (OUTPUT) A Yl GZ Yl GZ Yl TEST CONDITIONS RL RL RL = = = = SN74ASC5201 MIN TYP* MAX 1.8 3.6 9 2 3.6 8 3.7 8 20.2 4 8 17.7 1 kO to GND 2 4.6 11.4 2.2 4.6 10.4 1 kO to Vee 3.7 8 21.7 4 8 18.7 RL RL SN54ASC5201 MIN TYP* MAX = 00 1 kO to GND 11 10 1 kO to Vee 11 10 UNIT ns ns ns change in propagation delay time. with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted I PARAMETERt AtPLH AtpHL AtpZH AtpZL FROM (INPUT) TO TEST (OUTPUT) CONDITIONS A Yl GZ Y1 tPropagation delay times are measured from the 44% point of VI with tr = tf at VO. = 1.3 V. tpLH '" propagation delay time, low-to-high-Ievel output AtpLH '" tpHL '" propagation delay time, high-to-Iow-Ievel output AtpHL " tpZH '" output enable time to high level AtpZH '" tpZL '" output enable time to low level AtpZL " tPHZ '" output disable time from high level tpLZ '" output disable time from low level *Typical values are at Vee = 5 V, TA = 25°e. SN74ASC5201 SN54ASC5201 MAX 10 TYP* 31 50 100 10 50 MIN = TYP* 31 MAX 80 MIN 20 260 50 100 220 31 90 20 31 80 103 300 50 103 250 70 II ... U) UNIT CI) CI) ps/pF .r:. en ps/pF 3 ns (10% and 90%). For TTL loads, the times end ...caca C change in tpLH with load capacitance change in tPHL with load capacitance change in tpZH with load capacitance change in tpZL with load capacitance TEXAS • INSTRUMENlS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-557 SN54ASC5201, SN74ASC5201 3-STATE I/O BUFFER WITH INVERTING TTL INPUT AND CMOS/TTL OUTPUT switching characteristics over'recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads, CL - 15 pF PARAMETERt tpLH tpHL tpZH tpZL FROM TO TEST (lNPUTI (OUTPUT) CONDITIONS A Y1 GZ SN74ASC5201 TYP* 3,1 MAX 7,7 MIN 1,7 1,8 3.5 9.2 RL - 1 kll to GND 2.1 RL - 1 kllto Vcc 1.7 4 3,3 10 8,7 1.9 2.2 TEST CONDITIONS MIN RL = Y1 SN54ASC5201 MIN 1,5 00 1.8 TYP* 3.1 3,5 MAX 4 8.9 3.3 7.7 6,8 8,1 UNIT ns ns CMOS loads, CL - 50 pF PARAMETERt tpLH tpHL tpZH tpZL FROM (INPUT) TO {OUTPUT! A Y1 GZ SN74ASC5201 MIN TYP* MAX 2.7 11 5.2 MAX 2.5 TYP* 5,2 2.8 5,6 15.4 3 5.6 13.4 RL = 1 kO to GND 3,1 6.1 14,8 3.3 6,1 13.2 RL - 1 kO to Vcc 2.8 5.6 15,6 3 5.6 13,6 RL = Y1 SN54ASC5201 00 12,3 UNIT ns ns , IIo change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt AtPLH AtPHL Q) r+ Q) en :r CD CD r+ AtPZH AtpZL FROM TO TEST (INPUT! (OUTPUT! CONDITIONS A Y1 GZ Y1 SN54ASC5201 SN74ASC5201 MIN TYP* MAX MIN TYP* MAX 30 60 130 30 60 120 30 30 60 60 180 140 30 30 60 60 150 120 30 66 200 30 66 170 UNIT ps/pF ps/pF input buffer switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) , " (I) PARAMETER§ tpLH tpHL tpLH tpHL AtpLH AtPHL FROM (INPUT) TO (OUTPUT) TEST CONDITIONS Y1 Y2 CL = 0 Y1 Y2 CL = 1 pF Y1 SN54ASC5201 MIN 0.6 TYP* 1 MAX 2,2 0.5 0.9 1,4 1.6 2.9 1,3 6,2 0.8 0.9 0,3 Y2 SN74ASC5201 MAX MIN TYP* 0,6 1 1,9 0,5 1,7 0.9 1.4 5,6 0,8 1.3 1.9 2.2 4,1 1 1.9 2.1 3,7 0.4 0.9 0,3 0.4 0.8 2.9 UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For CMOS loads, the times end at the 50% point of Va, tpLH '" propagation delay time, low-to-high-Ievel output AtpLH '" change in tpLH with load capacitance tpHL "'propagation delay time, high-to-Iow-Ievel output AtPHL '" change in tpHL with load capacitance tpZH '" output enable time to high level AtpZH .. change in tpZH with load capacitance tpZL '" output enable time to low level AtpZL .. change in tpZL with load capacitance *Typical values are at VCC = 5 V, TA = 25°C. § Input propagation delay times are measured from the 1.3 V point of VI to the 44% point of Va with tr = tf = 2 ns. 4-558 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5202, SN74ASC5202 3-STATE I/O BUFFER WITH INVERTING CMOS INPUT AND CMOS/TTL OUTPUT 02939, AUGUST 1986 SystemCell™ • • 2-j.lm OUTPUT STANDARD CELL logic symbol Typical Propagation Delays 3.6 ns with 15-pF Load 6,8 ns with 50-pF Load Output Current Ratings SN54ASC5202 IOL IOH SN74ASC5202 IOL IOH TAP A 3.4 rnA -3.4 rnA 4mA -4mA GZ----I • Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • • ,,---Yl YZ--~~ FUNCTION TABLE OUTPUTS INPUTS Functional Operation Over VCC Range of 2Vt06V A Dependable Texas Instruments Quality and Reliability GZ Yl Yl Y2 L L L L H H L H H L X H L Z H X H H Z L II ... positive logic equations Y = A Y2 = Y1 en description The SN54ASC5202 and SN74ASC5202 are 3-state input/output buffer standard cells that interface CMOS internal cells with TTL or CMOS bidirectional bus lines, The Schmitt-trigger input buffer, providing additional noise-rejection with its hysteresis loop, responds to CMOS threshold levels imposed on the I/O bus regardless of the state of the internal 3-state control GZ, The cell is designated and called from the engineering workstation input using the following cell name and netlist label: Q) Q) .c en ...caca C FEATURES NETLIST CELL LAYOUT HOL LABEL ASPECT RATIO Label: IOF47LH A,GZ,TAP,Y2,Yl; minimum width CELL NAME IOF47LH RELATIVE CELL AREA TO NAZ10LH 55.4 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, +h~ .. ""h ...... "' .... .,,+; ..................... + ...................................................... +1-. ............ _ _ ~ ... -' •• _ _ _ 1......... 1- -- . _ . - - I •• _~ _ _ . . . .,. ,_ • _ _ _ _ _ . . . . . . . . . . . . . . . "" ....... ""' . . . . . . . . . . . . . . . . . . . . •• _ _ _ _ -1: ... : __ _ ,.... ......................................................... L"'.... . The IOF47LH incorporates a pull-up tap to simplify termination of the I/O, This tap may be used in conjunction with an active pull-up/pull-down terminator in the 'ASC237x group or the pull-up tap may be left unconnected, When the terminator is used it ensures that the input will be driven to a high Dr low logic level thereby avoiding exposure to a high-impedance or floating condition. Refer to Section 7 for implementation of the pUll-Up. PRODUCTION DATA documants .ontain information current .s of public.tlon date. Products conform to spacifications par th. terms of TaXIS Instruments :'~~~:=i~.i~r:1~1i ~~=:~ti:r ~~D:::::~~~ not TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-559 SN54ASC5202, SN74ASC5202 3·STATE I/O BUFFER WITH INVERTING CMOS INPUT AND CMOS/TTL OUTPUT description (continued) These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propogation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. The SN54ASC5202 is characterized for operation over the full military temperature range of .,. 55 DC to 125°C. The SN74ASC5202 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended. operating conditions See Table 4 in Section 2. The maximum high-level or maximum low-level output current is 3.4 milliamperes for the SN54ASC5202 and 4 milliamperes for the SN74ASC5202. • C I» .... I» en :r CD CD .... en electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT TEST CONDITIONS Input threshold voltage at A. GZ Positive-going threshold VT+ level (Vll Negative-going threshold VTlevel (Vl) = Vee 5 V. TA = SN54ASC5202 MIN TYP MAX 4mA - -3.4 mA 20 pA. See Note 1 - 4 mA - 3.4 mA See Note 1 10L = 20 ~A. VOL 10Z Low-level output voltage Off-state output curre~t Supply current ei IA Input capacitance I GZ 3.5 2.9 3.2 3.5 V 1.5 1.7 1.9 1.5 1.7 1.9 V = 5 V. TA = 3.7 V Vee 0.1 Vee- O.1 0.5 0.5 0.1 25°e Equivalent power dissipation capacitance Vee - 5 V. TA = 25°e tr - tf - 3 ns. V 0.1 ±10 ±5 pA 3005 2.44 leO 1.23 nA rnA 0.55 0.44 0.55 0.44 4.5 4.5 13.1 13.1 ITAPorVl t epd V 1.5 3.7 Vo - Vee or 0 Vee v 3.2 VI - Vee or 0 VI = 3.5 V or 0.9 V lee UNIT 2.9 1.5 IOH 10H 10L 10L MAX 2.t 10H - High-level output voltage TVP 2:2 25°e Hysteresis (VT + - VT-) Vhys at Vl VOH SN74ASC5202 MIN pF pF tTotal input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. NOTE 1: These limits apply when all other outputs are open. 4-560 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5202, SN74ASC5202 3-STATE I/O BUFFER WITH INVERTING CMOS INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads, CL - 15 pF PARAMETERt tpLH tpHL tpZH tpZL FROM (INPUT) TO TEST (OUTPUT) CONDITIONS A Yl GZ Yl SN54ASC5202 SN74ASC5202 MIN TYP* MAX MIN TYP* MAX 1.3 2.5 5.7 1.4 2.5 5 2.3 4.8 10 1.5 3.4 2.5 1.6 4.8 RL - 1 kG to GND 11.3 8.2 3.4 7.4 RL - 1 kG to Vee 2.3 4.8 11.4 2.5 4.8 10.1 SN54ASC5202 TYpl' MAX MIN RL = 00 UNIT ns ns TTL loads, CL - 50 pF PARAMETERt tpLH tpHL FROM (INPUT) A Yl GZ Yl SN74ASC5202 TYpl' MAX 1.8 3.6 8.5 1.9 3.6 7.5 3.9 8.1 19.1 4.2 8.1 16.8 1 kG to GND 2 4.5 11 2.2 4.5 9.9 RL = 1 kG to Vee RL - 1 kG to GND 4 8.3 20.1 4.3 8.3 17.5 RL tPHZ tpLZ MIN CONDITIONS RL tpZH tpZL TEST TO (OUTPUT) RL = = = 00 1 kG to Vee 11 11 10 10 UNIT ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt Ll.tPLH Ll.tPHL Ll.tpZH Ll.tpZL FROM (INPUT) TO (OUTPUT) A Y1 GZ SN54ASC5202 TEST CONDITIONS MIN TYP* Yl SN74ASC5202 MAX TYP* 31 MAX 70 10 31 80 MIN 10 50 94 230 SO 94 200 10 31 80 20 31 70 SO 100 2S0 SO 100 210 II .. .. tI) UNIT CI) CI) .s:. ps/pF CI) ps/pF as as switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) C CMOS loads, CL = 15 pF PARAMETERt tpLH tpHL tpZH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Yl GZ MAX 7.2 1.7 3.1 6.4 9.4 2.2 4 8.4 4 9.S 2.2 4 3.9 9.2 2.2 3.9 8.S 8.2 1.6 3.1 2 4 1 kG to GND 2.1 RL - 1 kG to Vee 2 RL Yl TYP* MAX = = 00 SN74ASC5202 MIN TYP* RL tpZL SN54ASC5202 MIN UNIT ns ns tpropagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For TTL loads, the times end at Vo = l.;j v. ~or CMOS loads, the times end at the SO% point of VO. tPLH '" propagation delay time, low-to-high-Ievel output Ll.tpLH '" change in tpLH with load capacitance tPHL '" propagation delay time, high-to-Iow-Ievel output Ll.tpHL '" change in tpHL with load capacitance tpZH ;;;;:: output enable time to high level 6.tpZH tpZL '" output enable time to low level tPHZ '" output disable time from high level tpLZ '" output disable time from low level Typical values are at Vee = S V, TA = 2Soe. Ll.tpZL '" change in tpZL with load capacitance !!! change in tpZH with load capacitance * TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-561 SN54ASC5202, SN74ASC5202 3-STATE I/O BUFFER WITH INVERTING CMOS INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating' free-air temperature (unless otherwise noted) (continued) CMOS loads, CL - 50 pF PARAMETERt tpLH tpHL tpZH tpZL FROM (INPUT) A GZ TO (OUTPUT) Vl TEST CONDITIONS RL = Vl 00 SN54ASC5202 MIN 2.5 TVP* 5.1 SN74ASC5202 MAX MIN TVP* 11.7 2.7 5.1 10.4 MAX. 3.1 6.3 15 3 6.1 14.1 3.3 3.3 6.3 6.1 13.3 RL - 1 kll to GND RL - 1 kll to V CC 3.1 6.3 15.2 3.4 6.3 13.4 12.6 UNIT ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads PARAMETERt dtpLH dtpHL • c .... CI) AtPZH dtpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Vl GZ SN54ASC5202 MIN Vl SN74ASC5202 MAX MIN 30 TVP* 57 TVP* MAX 130 30 66 160 30 57 110 30 66 30 60 140 130 30 60 120 30 69 170 30 69 150 UNIT pSipF psipF input buffer switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERS§ CI) tpLH fn tPHL ::r tPLH tpHL CD CD .... dtPLH dtpHL (I) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS Yl Yl Yl Y2 Y2 V2 CL CL = = 0 1 pF SN54ASC5202 MIN 2.1 TVP* 2.6 MAX 4.3 SN74ASC5202 MIN 2.1 TVP* 2.6 MAX 4.1 2.1 2.9 5.4 2.1 2.9 4.9 3 4.4 8.4 3.1 4.4 7.8 3.1 5 10.9 3.2 5 9.6 0.9 1.8 4.1 0.9 1.8 3.7 0.9 2.1 5.5 1.1 2.1 4.7 UNIT ns ns nsipF tPropagation delay times are measured from the 44% point of VI with tr = tf = 3 ns 110% and 90%). For CMOS loads. the times end at the 50% point of VO. tpLH '" propagation delay time. low-to-high-Ievel output AtPLH '" change in tpLH with load capacitance dtPHL '" change in tPHL with load capacitance tpHL '" propagation delay time. high-to-Iow-Ievel output tpZH '" output enable time to high level dtPZH '" change in tpZH with load capacitance tpZL '" output enable time to low level AtpZL '" change in tpZL with load capacitance *Typical values are at VCC = 5 V. TA = 25°C. § Input propagation delay times are measured from the 50% point of VI to the 44% point of Vo with tr = tf = 4 ns. DESIGN CONSIDERATIONS Refer to Section 7. 4-562 ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012 ": DALLAS, TEXAS 75265 SN54ASC5203, SN74ASC5203 3·STATE 110 BUFFER WITH INVERTING TTL INPUT AND CMOS/TTL OUTPUT 02939, AUGUST 1986 SystemCell™ • Typical Propagation Delays 3.3 ns with 15-pF Load 5.5 ns with 50-pF Load • Output Current Ratings SN54ASC5203 IOL IOH SN74ASC5203 IOL IOH • logic symbol A 3.4mA -3.4 mA 4mA -4mA GZ _ _ _..J Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Ranglilof2Vt06V Y1 Y2 Incorporates Circuitry to Protect Against ESD and Latch-Up • • 2·",m OUTPUT STANDARD CELL FUNCTION TABLE INPUTS Dependable Texas Instruments Quality and Reliability A GZ Y1 OUTPUTS Y1 Y2 L L L L H L H H L X H L Z H X H H Z L H positive logic equations Y1 = A Y2 = VI description The SN54ASC5203 and SN74ASC5203 are three-state input/output buffer standard-cells that interface CMOS internal cells with TTL or CMOS bidirectional bus lines. The input buffer responds to TTL threshold levels imposed on the I/O bus regardlel>5 of the state of the internal 3-state control GZ. The cell is designated and called from the engineering workstation input using the following cell name and netlist label: • FEATURES NETLIST CELL NAME IOF48LH HDL LABEL Label: IOF48LH A,GZ,Y2,Yl; CELL LAYOUT ASPECT RATIO minimum width RELATIVE CELL AREA TO NA210LH 45,2 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a reSUlt, passive resistance has been purposely omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. The dynamic drive capability of each output is specified by the delta delay propagation time parameter included with the switching characteristics. The delta delay times provide a means for making direct comparisons of the various outputs response to change in capacitive loading. The SN54ASC5203 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5203 is characterized for operation from -40°C to 85°C. PRODUCTION DATA ....um.nts .ontllin inform.tio. ourr.nt al of publicatio. dalO. Preducts co.form to =IiCationl per !hi t..... of To.a. Instrum.nts n"~~::i~at::I':.'li ~:~:~:; :'l"=:~:~ .ot Copyright © 1986,· Texa·~ Instruments Incorporate TEXAS • INSTR,l..JMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-563 SN54ASC5203, SN74ASC5203 3·STATE I/O BUFFER WITH INVERTING TTL INPUT AND CMOS/TTL OUTPUT absolute maximum ratings and recommended operating conditions See Table 4 in Section 2. Maximum high-level or maximum low-level output current is 3.4 milliamperes for the SN54ASC5203 and 4 milliamperes for the SN74ASC5203. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT ,~ Input threshold voltage VI VOH High-level output voltage VOL Low-level output voltage = Vee TA 5 V. = MIN 25°e 4mA 10H 10H - -3.4 mA 2O/LA. See Note 1 10H 10L - 4 mA TYP Off·state output current = SN74ASC5203 MAX MIN TYP 2.2 2.2 1.3 1.3 MAX 3.7 V Vee 0.1 Vee- O.1 0.5 0.5 See Note 1 2O/LA, UNIT V 3.7 10L - 3.4 mA 10L 10Z SN54ASC5203 TEST CONDITIONS Vo - Vee or 0 V 0.1 0.1 ±10 ±5 /LA NOTE 1: These limits apply when all other outputs are open. • IOF48LH PARAMETER o .... ICC Supply current Ci Input capacitance C\) C\) (I) :::T CD CD .... en tfu VI Cpd SN54ASC5203 TEST CONDITIONS TYP VI = Vec or 0 V VI - 2 V or 0.8 V Vce = 5 V, TA = 25°e t = 5 V, = 25°C Equivalent power VCC dissipation capacitance TA tr = tf = 3 ns, MAX SN74ASC5203 TYP MAX UNIT 2795 168 nA 1.43 1.32 mA 0.63 0.63 0.41 0.41 4.5 4.5 14.9 14.9 pF pF tTotal input capacitance for Y1 is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. 4-564 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75285 SN54ASC5203, SN74ASC5203 3-STATE I/O BUFFER WITH INVERTING TTL INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads, CL PARAMETERt tPLH tpHL tpZH tpZL = 15 pF FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A GZ Yl RL Yl ~ SN54ASC5203 Typt MAX MIN co 1.3 2.4 SN14ASC5203 Typt MAX MIN 5.7 1.4 2.4 5.1 2.1 4.2 10 2.2 4.2 8.9 RL - 1 kO to GND 1.5 3.3 8.1 1.6 3.3 7.3 RL - 1 kO to Vee 2 4.2 9.9 2.2 4.2 8.7 SN54ASC5203 Typt MAX MIN UNIT ns ns TTL loads, CL = 50 pF PARAMETER t tPLH FROM (INPUT) TO TEST (OUTPUT) CONDITIONS A Yl GZ Yl MIN 1.8 3.6 8.5 1.9 3.6 7.6 3.7 7.5 18 4 7.5 16 RL - 1 kO to GND 2 4.5 11 2.2 4.5 9.9 RL ~ 1 kO to Vee 3.7 7.7 19 4 7.7 16.3 RL ~ co tPHL tPZH tpZL tpHZ tpLZ GZ Yl SN74ASC5203 Typt MAX RL - 1 kO to GND 11 11 1 kO to Vee 10 10 RL UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage • and operating free-air temperature (unless otherwise noted) PARAMETERt <1tPLH <1tpHL <1tpZH <1tpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Yl GZ SN54ASC5203 Typt MAX MIN Yl tpropagation delay times are measured from the 44% point of VI with tr ~ at Vo ~ 1.3 V. tPLH '" propagation delay time, low-to-high-Ievel output <1tpLH tPHL '" propagation delay time, high-to-Iow-Ievel output <1tpHL tPZH '" output enable time to high level <1tpZH tpZL '" output enable time to low level <1tpZL tpHZ .. output disable time from high level tpLZ 5i output disable time from low level tTypical values are at Vee = 5 V, TA = 25°e. SN74ASC5203 TYpt MAX MIN 10 34 80 20 34 70 50 94 220 50 94 190 10 54 80 20 54 70 50 100 250 50 100 210 ps/pF CD CD ~ U) ps/pF tf ~ 3 ns (10% and 90%). For TTL loads, the times end '" " " '" ... U) UNIT ... CO CO C change in tpLH with load capacitance change in tpHL with load capacitance change in tpZH with load capacitance change in tpZL with load capacitance TEXAS . . INSTRUMENTS POST OFFICE BOX 656012 • DALLAS, TEXAS 75265 4-565 SN54ASC5203, SN74ASC5203 3-STATE I/O BUFFER WITH INVERTING TTL INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads, CL = 15 pF PARAMETERt tpLH tpHL tpZH tpZL FROM (INPUT) TO (OUTPUT) A Y1 GZ TEST CONDITIONS TYP* MAX 1.S 3.1 1.8 3.S RL - 1 kO to GND 2.1 RL - 1 kO to Vcc 1.7 RL = Y1 SN74ASCS203 SNS4ASCS203 MIN ex> MIN TYP* MAX 7.3 1.6 3.1 6.S 8.2 1.9 3.5 7.3 4 9.5 2.2 4 8.4 3.3 7.8 1.8 3.3 6.9 UNIT ns ns CMOS loads, CL - 50 pF PARAMETERt tpLH tpHL tpZH tpZL TO (OUTPUT) A Y1 GZ Y1 TEST CONDITIONS RL = ex> SN54ASC5203 SN74ASCS203 MAX MIN TYP* MAX 2.5 TYP* 5.1 11.8 2.7 5.1 10.6 2.8 5.6 13.6 3 5.6 12 MIN RL - 1 kO to GND 3 6.1 14.2 3.3 6.1 12.7 RL = 1 kO to Vcc 2.8 5.6 13.7 3 5.6 12 UNIT ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) • PARAMETERt AtPLH AtPHL C ... AtpZH I» I» t/) i' ... AtpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A GZ SNS4ASC5203 MIN Y1 30 30 Y1 30 30 SN74ASCS203 TYP* 57 MAX MIN TYP* MAX 130 30 57 120 60 150 30 60 130 60 65 130 170 30 60 65 120 30 150 UNIT ps/pF ps/pF input switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CD (I) FROM (INPUT) PARAMETER§ tPLH tpHL tpLH tpHL AtpLH AtpHL FROM (INPUT) Y1 Y1 Y1 TO (OUTPUT) Y2 Y2 Y2 TEST CONDITIONS CL CL = = 0 1 pF SNS4ASCS203 MIN SN74ASCS203 MAX MIN TYP* MAX 3 TYP* 6 14.6 3.2 1.1 1.4 2.2 1.1 6 1.4 13.6 2.1 6.5 13 32 7 13 29 2 3.7 1.4 2 3.4 7 17.3 0.6, 1.5 3.7 7 15.2 0.2 0.6 1.4 1.3 3.4 0.2 UNIT ns ns ns/pF t Propagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For CMOS loads, the times end at the SO% point of VO. tpLH .. propagation delay time, low-to-high-Ievel output AtPLH '" change in tpLH with load capacitance tpHL '" propagation delay time, high-to-Iow-Ievel output AtPHL .. change in tPHL with load capacitance tPZH " output enable time to high level AtpZH .. change in tpZH with load capacitance AtpZL '" change in tpZL with load capacitance tpZL '" output enable time to low level *Typical values are at VCC = 5 V, TA = 2SoC. § Input propagation delay times are measured from the 1.3 V point of VI and the times end at the 44% point of Vo with tr = tf = 2 ns. DESIGN CONSIDERATIONS Refer to Section 7. All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. 4-566 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5206, SN74ASC5206 3-STATE I/O BUFFER WITH NONINVERTING CMOS INPUT AND CMOS/TTL OUTPUT 02939. AUGUST 1986 SystemCell™ • Typical Propagation Delays 3.3 ns with 15-pF Load 5.5 ns with 50-pFLoad • Output Current Ratings SN54ASC5206 IOL IOH SN74ASC5206 IOL IOH • • • • 2-",m OUTPUT STANDARD CELL logic symbol A 3.4 mA -3.4 mA 4mA -4 mA GZ---..J Yl Y2 Incorporates Circuitry to Protect Against ESD and Latch-Up FUNCTION TABLE INPUTS Specified for Operation Over VCC Range of 4.5 V to 5.5 V Functional Operation Over VCC Rangeof2Vt06V Dependable Texas Instruments Quality and Reliability OUTPUTS A GZ Yl Yl L L L L L H L H H H X X H L Z L H H Z H Y2 positive logic equations Y1 = A Y2 = Y1 ... fI) description The SN54ASC5206 and SN74ASC5206 are three-state input/output buffer standard-cells that interface CMOS internal cells with TTL or CMOS bidirectional bus lines. The input buffer responds to CMOS threshold levels imposed on the 110 bus regardless of the state of the internal 3-state control GZ. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineering workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name and netlist label: CD CD .c (I) ... CO CO C FEATURES NETLIST CELL NAME IOE41LH IOF41LH HDL LABEL Label: IOF41 LH A,GZ, Y2, Y1; CELL LAYOUT ASPECT RATIO RELATIVE CELL AREA TO NA210LH minimum height 49.2 minimum width 49.4 The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. PRODUCTION DATA documents contain information current as of publication data. Products conform to specifications per the tarms of Taxas Instruments ::n.:!:=i~a{::1~1~ ~~~:~ti:; ~~D:::~9t~:'s~S not ~ . TEXAS INSTRUMENTS POST OFFICE BOX 655012. DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporate 4-567 SN54ASC5206, SN74ASC5206 3·STATE I/O BUFFER WITH NONINVERTING CMOS INPUT AND CMOS/TTL OUTPUT description (continued) The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various outputs response to change in capacitive loading. The SN54ASC5206 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5206 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 4 in Section 2. The maximum high-level or maximum low-level output current is 3.4 milliamperes for the SN54ASC5206 and 4 milliamperes for the SN74ASC5206. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT ,~ Input threshold voltage VI VOH High-level output voltage • SN54ASC5206 TEST CONDITIONS VCC = 5 V, TA 10H = -4 rnA 10H = -3.4 rnA 10H - -20 ~A, = MIN 25°C TYP SN74ASC5206 MAX MIN TVP 2.2 2.2 2.5 2.5 C = 10l 3.7 See Note 1 V Vee- O.1 Vce- O.1 0.5 0.5 3.4 rnA 10l - 20 ~A, See Note 1 ...m m NOTE 1: These limits apply when all other outputs are open. ~ IOE41LH 10Z Off~state CD CD ... output current Vo = PARAMETER ICC Supply current Ci Input capacitance Equivalent power Cpd VCC or 0 TVP VI - VCC or 0 VI ~ GZ VI t dissipation capacitance = VCC 3.5 V or 0.9 V = 5 V, VCC = 5V, TA = 25°C TA = 25°C = tf = tr 3 ns, V 0.1 0.1 ±10 ±5 SN54ASC5206 TEST CONDITIONS (I) UNIT V 3.7 10l - 4 rnA VOL low-level output voltage MAX MAX SN74ASC5206 TYP MAX ~A UNIT 2755 165 nA 3.26 2.86 rnA 0.6 0.6 0.42 0.42 4.09 4.09 16.7 16.7 pF , pF IOF41LH ICC Supply current Ci Input capacitance SN54ASC5206 TEST CONDITIONS PARAMETER VI VI .~ GZ = VCC = 3.15 VCC = TVP Equivalent power dissipation capacitance SN74ASC5206 TYP MAX UNIT or 0 2579 155 nA V or 0.9 V 2.96 2.58 rnA 5 V, TA = 25°C Vlt Cpd MAX VCC = 5 V, TA = 25°C tr = tf = 3 ns, 0.62 0.62 0.44 0.44 3.83 3.86 14.3' 14.3 pF pF tTotal input capacitance for Y1 is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. 4-568 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 SN54ASC5206. SN74ASC5206 3·STATE I/O BUFFER WITH NONINVERTING CMOS INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads. CL = 15 pF PARAMETERt tpLH FROM (INPUT) TO TEST (OUTPUT) CONDITIONS MIN TYP* MAX MIN TYP* MAX = 2.5 6 10.2 1.4 2.5 4.3 5.3 00 1.3 2.1 9.1 1 k[J to GND 1.5 3.5 8.4 1.6 3.5 7.6 1 k[J to vee 2 4.2 10.4 2.2 4.2 9.2 A Vl tpZH, GZ Yl RL tpZL GZ Yl RL tpHL RL = = SN54ASC5206 4.3 SN74ASC5206 2.3 UNIT ns ns TTL loads. CL - 50 pF PARAMETERt tpLH tpHL tpZH tpZL tpHZ tpLZ FROM (INPUT) TO (OUTPUT) A Yl GZ Yl GZ RL RL RL RL = = = = SN74ASC5206 MIN TYP* MAX 1.9 3.7 8.9 2 3.7 7.9 3.7 7.6 18.4 4 7.6 16.1 1 k[J to GND 2.1 4.6 11.4 2.2 4.6 10.3 1 k[J to Vee 1 k[J to GND 3.7 7.8 19.6 4 7.8 17 RL y1 SN54ASC5206 MIN TYP* MAX TEST CONDITIONS = 00 1 k[J to Vee 11 11 10 10 UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage • . and operating free-air temperature (unless otherwise noted) PARAMETERt lltpLH lltpHL lltpZH lltpZL FROM (INPUT) A GZ TO (OUTPUT) TEST SN54ASC5206 CONDITIONS Y1 V1 ·SN74ASC5206 MIN TYP* MAX MIN TYP* MAX 20 33 90 20 33 80 50 98 230 50 98 200 10 31 90 20 31 80 50 105 260 50 105 220 ... UJ UNIT CD CD ps/pF .c C/) ps/pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) ...caca C CMOS loads. CL - 15 pF PARAMETERt tpLH tPHL tpZH tpZL FROM (INPUT) A GZ TO TEST (OUTPUT) CONDITIONS SN74ASC5206 TYP* MAX MIN 3.3 7.6 1.7 3.5 8.4 1.9 3.5 6.8 7.4 RL - 1 k[J to GND 1.6 1.8 '2.1 4.2 9.8 2.3 4.2 8.8 RL - 1 kll to Vee 1.7 3.4 8.2 1.8 3.4 7.3 Yl RL Y1 SN54ASC5206 MIN = 00 TYP* 3.3 MAX UNIT ns ns ·r Propagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For TTl loads, the times end AT Vo = 1.3 V. For eMOS loads, the times end at the 50% point of VO· tpLH " propagation delay time, low-to-high-Ievel output lltpLH " change in tpLH with load capacitance tpHL == propagation delay time, high-to-Iow-Ievel output tpZH .. output enable time to high level tpZL .. output enable time to low level tpHZ " output disable time from high level tpLZ .. output disable time from low level *Typical values are at Vee = 5 V, TA = 25°e. .6.tpHL == change in tpHL with load capacitance lltpZH " change in tpZH with load capacitance lltpZL " change in tpZL with load capacitance TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-569 • SN54ASC5206, SN74ASC5.~06 3-STATE I/O BUFFER WJTH NONINVERTING t:MOS INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads, CL - 50 pF PARAMETERt tpLH tpHL tpZH FROM (INPUT) TO (OUTPUT) A Yl GZ . TEST CONDITIONS RL = 00 RL = 1 kll to GND Yl RL - 1 kll to Vce tPZL SN~4ASC5206 SN74ASC5206 MIN TYP* MAX MIN TYP* MAX 2.6 2.B 5.3 5.B 12.5 14.1 2.8 5.3 5.8 11.2 3 3.1 2.8 6.3 15.1 3.3 6.3 13.5 5.8 14.3 3 5.8 12.5 12.4 UNIT ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt AtpLH AtpHL AtpZH AtpZL FROM (INPUT) TO TEST (OUTPUT) CONDITIONS A Yl GZ Yl SN54ASC5206 MIN TYP* SN74ASC5206 MAX MIN MAX 30 57 150 30 TYP* 67 30 30 66 160 30 66 140 60 160 30 60 140 30 69 180 30 69 150 130 UNIT ps/pF ps/pF input buffer switching cllaracteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER§ tpLH tpHL tpLH tpHL AtpLH AtpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS Yl Y2 CL = 0 Yl y2 Yl Y2 CL = 1 pF SN54ASC5206 MIN SN74ASC5206 MAX 4.1 MIN 0.9 TYP* 1.8 1 1.8 3.4 1 2 1.1 2 0.1 0.1 1 TYP* 1.8 MAX 3.7 1.1 1.8 3.2 4.5 1.1 2 4 3.8 1.2 2 3.6 0.2 0.5 0.1 .0.2 0.4 0.2 0.5 0.1 0.2 0.4 UNIT ns ns ns/pF t Propagatio~ delay 'times are measured frorn the 44% point of VI with tr = tf = 3 ns (10% and 90%). For CMOS loads, the times end at the 50% point of VO. tPLH '" propagation delay time, low-to-high-Ievel output AtpLH .. change in tpLH with load capacitance tpHL '" propagation delay time, high-to-Iow-Ievel output AtpHL '" ch~nge in tpHL with load capacitance AtpZH '" change in tpZH with load capacitance tPZH '" output enable time to high level AtpZL '" change in tpZL with load capacitance tpZL '" output enable time to low level *Typical values are at VCC = 5 V, TA = 25°C. § Input propagation delay times are measured from the 50% point of VI to the 44% point of Va with tr = tf = 4 ns. DESIGN CONSIDERATIONS Refer to Section 7. 4-570 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 ,. DALLAS, TeXAS 75265 SN54ASC5207, SN74ASC5207 3-STATE I/O BUFFER WITH NON INVERTING TTL INPUT AND CMOS/TTL OUTPUT 02939. AUGUST 1986 SystemCell™ • Typical Propagation Delays 3.5 ns with 15-pF Load 5.8 ns with 50-pF Load • Output Current Ratings SN54ASC5207 IOL IOH SN74ASC5207 IOL IOH 2-llm OUTPUT STANDARD CELL logic symbol A~Yl 3.4 rnA -3.4 rnA 4mA -4mA GZ Y2 • Incorporates Circuitry to Protect Against ESD and Latch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • • FUNCTION TABLE INPUTS A Functional Operation Over VCC Range of 2 V to 6 V GZ Yl OUTPUTS Yl Y2 L L L L L H L H H H X X H L Z L H H Z H Dependable Texas Instruments Quality and Reliability positive logic equations Y1 = A Y2 = Y1 • ... U) description Q) Q) The SN54ASC5207 and SN74ASC5207 are three-state input/output buffer standard-cells that interface CMOS internal cells with TTL or CMOS bidirectional bus lines. The input buffer responds to TTL threshold levels imposed on the I/O bus regardless of the state of the internal 3-state control GZ. This cell function exists in two versions ("E" and "F") with different physical implementations to allow the final IC area to be optimized. Since the electrical performance of each version is identical, for simplicity only one version (the "F" cell) will be contained in the engineeririg workstation cell libraries. Determination of the most appropriate cell version will be made during the layout stage. The cell is designated and called from the engineering workstation input using the following cell name and netlist label: .c o ...a:sa:s C FEATURES NETLIST CEll NAME IOE44LH IOF44LH CEll LAYOUT ASPECT RATIO HDllABEl Label: IOF44LH A,GZ, Y2, Y1; RELATIVE CEll AREA TO NA210lH minimum height 49.2 minimum width 52.4 The cells incorporate circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby negating most common sources that can produce a latch-up condition. These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors. Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC. PRODUCTION DATA do.ument••ontein information currant .s of publication date. Products conform to specifications par ~h. :.~=~;a[::I~~ tarms of tl18S Instruments =:l::i:.n lI~D::;::lt::.~ not TEXAS ~ INSTRUMENTS POST OFFice BOX 655012 • DALLAS. TEXAS 75265 Copyright ~ 1986. Texas Instrur:nents Incorp~lrateq 4-571 SN54ASC52D7, SN74ASC52D7 3-STATE I/O BUFFER WITH NONINVERTING TTL INPUT AND CMOS/TTL OUTPUT description (continued) The dyn;lmic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various outputs response to change in capacitive loading. The SN54ASC5207 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5207 is characterized for operation from - 40°C to 85 DC. absolute maximum ratings and recommended operating conditi.ons See Table 4 in Section 2. The maximum high-level or maximum low-level output current is 3.4 milliamperes for the SN54ASC5207 and 4 milliamperes for the SN74ASC5207. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT ,~ Input threshold voltage VI Vee IOH VOH High-level output voltage • VOL Low-level output voltage C CI) Off-state output current = = = TA 5 V. = MIN TYP 2.2 25°C TYP MAX 2.2 1.3 UNIT V 1.3 3.7 3.7 V Vee- O.1 See Note 1 Vee- 0.1 0.5 0.5 IOL - 3.4 rnA Vo SN74ASC5207 MIN MAX -4 rnA -3.4 rnA IOH IOH - -20 ~A. IOL = 4 rnA IOL IOZ SN54ASC5207 TEST CONDITIONS = 20 ~A, = Vce or 0 See Note 1 V 0.1 0.1 ±10 ±5 ~A pot. CI) NOTE 1: These limits apply when all other outputs are open. (/) :r IOE44LH CD CD pot. PARAMETER en ICC Supply current ei Input capacitance SN54ASC5207 TEST CONDITIONS TYP V, = Vee or 0 V, - 2 V'or 0.8 V ~ Vee = 5 V, TA = 25°C Vlt epd Equivalent power dissipation capacitance Vee = 5 V, TA = 25°C tr = tf = 3 ns, MAX SN74ASC5207 TYP MAX 2611 157 1.17 1.1 0.6 0.6 0.42 0.42 4.17 4.17 14.5 14.5 UNIT nA rnA pF pF IOF44LH PARAMETER ICC Supply current ei Input capacitance epd SN54ASC5207 TEST CONDITIONS TYP V, = Vee or 0 V, = 2 V or 0.8 V ~ GZ VI t Equivalent power dissipation capacitance Vee = 5 V, Vee = 5 V, TA = 25°C tr = tf = 3 ns, TA = 25°C MAX SN74ASC5207 TYP MAX UNIT 2725 163 nA 1.2 1.12 rnA 0.6 0.6 0.48 0.48 4.23 4.23 14.3 14.3 pF pF tTotal input capaciatance for the Y1 input is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. 4-572 ' TEXAS ~ INSTRUMENTS POST OFFICE BOX 65501'2 • DALLAS. TEXAS 75265 SN54ASC5207, SN74ASC5207 3-STATE I/O BUFFER WITH NON INVERTING TTL INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTL loads, CL - 15 pF PARAMETERt tPLH tpHL tpZH tpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A GZ TVP* MAX MIN TVP* MAX 5.9 1.4 5.2 9.9 00 1.3 2.1 2.5 4.5 11.1 2.2 2.5 4.5 1 kO to GND 1.5 3.4 8.4 1.7 3.4 7.6 RL - 1 kO to Vee 2 4.4 11.3 2.2 4.4 9.9 SN54Ase5207 MIN TVP* MAX 8.9 1.9 3.7 MIN RL Vl RL Vl SN74ASC5207 SN54ASC5207 MIN ~ ~ UNIT ns ns TTL loads, CL - 50 pF PARAMETERt tpLH tpHL tpZH FROM (INPUT) A GZ GZ CONDITIONS Vl RL RL - Vl RL tpZL tPHZ tpLZ TEST TO (OUTPUT) Vl ~ ~ 00 SN74ASC5207 MAX TVP* 2 3.7 7.9 3.7 8 20.3 4 B 17.7 1 kO to GND 2.1 4.6 11.4 2.2 4.6 10.2 1 kO to Vec 3.7 B 21.B 4.1 B 18.B RL - 1 kO to GND RL - 1 kO to Vee 11 10 11 10 UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage . and operating free-air temperature (unless otherwise noted) _ PARAMETERt tpLH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Yl GZ Yl MpHL f>tpZH f>tpZL SN54ASC5227 Typt MAX MIN SN74ASC5227 Typt MAX MIN 10 17 50 10 17 40 20 40 100 20 40 so 10 20 50 10 20 40 20 43 110 20 43 90 UNIT ps/pF ps/pF switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) tpLH tpHL tpZH tpzL CMOS loads, CL PARAMETERt tpLH FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Yl GZ tpZL ! SN74ASC5227 Typt MAX MIN 1.3 2.5 5.9 1.4 2.5 5.2 1.5 3 6.8 1.6 3 6.1 RL - 1 kll to GND 1.7 3.3 7.6 1.8 3.3 6.8 RL - 1 kll to VCC 1.4 2.7 6.1 1.5 2.7 5.5 SN54ASC5227 Typt MAX MIN RL Yl SN54ASC5227 Typt MAX MIN ~ 00 ..c UNIT en ns +or C'CS C'CS C ns 50 pF FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A Yl GZ Yl tPHL tpZH f/) +or Q) Q) CMOS loads. CL = 15 pF PARAMETERt II RL ~ MIN 1.8 3.6 2 00 SN74ASC5227 Typt MAX 1.9 3.6 7.5 4 8.3 9.3 2.1 4 8.3 RL ~ 1 kll to GND 2.2 4.4 10.2 2.4 4.4 9.1 RL ~ 1 kll to Vee 2 3.8 8.9 2.1 3.8 8 UNIT ns ns Propagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For TTL loads, the times end at Vo ~ 1.3 V. For eM OS loads, the times end at the 50% point of Vo. tpLH '= propagation delay time, low-to-high-Ievel output L'ltpLH == change in tpLH with load capacitance tpHL := propagation delay time. high-to-Iow-Ievel output tpZH '= output enable time to high level tpZL =: output enable time to low level tpHZ = output disable time from high level tplZ == output disable time from low level tTypical values are at Vee ~ 5 V, TA ~ 25°e. ~tpHL =: change in tpHL with load capacitance LltpZH == change in tpZH with load capacitance LltpZL == change in tpZl with load capacitance TEXAS -1.!1 INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-593 SN54ASC5227, SN74ASC5227 3·STATE 1/0 BUFFER WITH NONINVERTING TTL INPUT AND CMOS/TTL OUTPUT change in propagation delay time with load capacitance over recommended ranges of supply voltage and oPerating free·air temperature (unless otherwise noted) PARAMETERt 4tpLH 4tpHL 4tpZH 4tPZL FROM (INPUT) TO (OUTPUT) A Y1 GZ Y1 TEST CONDITIONS SN54ASC5227 SN74ASC5227 MIN TYP* . MAX 10 31 70 10 29 70 10 31 70 20 31 70 20 31 80 20 31 79 MIN 20 10· TYP* MAX 31 60 29 60 UNIT ps/pF ps/pF input buffer switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER§ FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tPLH tpHL Y1 Y2 CL = 0 tPLH tpHL Y1 Y2 CL = 1 pF 4tpLH 4tpHL Y1 Y2 SN54ASC5227 SN74ASC5227 MAX 2.6 M(N O.B TYP* 1.4 0.9 TYP* 1.4 1.3 2.6 5.9 1.4 2.6 2.4 5.3 3.1 MIN MAX 1 1.7 3.3 1 1.7 1.5 2.9 6.8 1.6 2.9 6 0., 0.3 0.8 0.1 0.3 0.7 0.2 0.3 0.9 0.2 0.3 O.B UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of VI with tr = tf = 3 ns (10% and 90%). For CMOS loads, the times end at the 50% point of VO. tpLH '" propagation delay time, low-to-high-Ievel output 4tPHL '" change in tpHL with load capacitance 4tpZH .. change in tpZH with load capacitance tPHL '" propagation delay time, high-to-Iow-Ievel output 4tpLH .. change in tpLH with load capacitance 4tpZL .. change in tpZL with load capacitance *Typical values are at VCC = 5 V, TA '" 25°C. § Input propagation delay times are measured from the 1.3 V point of VI to the 44% point of Vo with tr = tf = 2 ns. DESIGN CONSIDERATIONS Refer to Section 7. 4-594 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5239, SN74ASC5239 3-STATE I/O BUFFER WITH NONINVERTING TTL INPUT AND CMOS/TTL OUTPUT ADVANCE INFORMATION 02939, AUGUST 1986 SystemCell™ • Typical Propagation Delays 2,7 ns with 15-pF Load 3,7 ns with 50-pF Load • OutPUt Current Ratings SN54ASC5239 IOL IOH SN74ASC5239 IOL IOH 2-/lm OUTPUT STANDARD CELL logic symbol A;tJ-Vl 20.4 mA -10.2 mA 24mA -12 mA GZ V2 • Incorporates Circuitry to Protect Against ESD and !-atch-Up • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • • FUNCTION TABLE INPUTS A Functional Operation Over VCC Range of 2Vt06V GZ V1 OUTPUTS V1 V2 l l l l l H l H H H X H l Z l X H H Z H Dependable Texas Instruments Quality and Reliability positive logic equations Y1 = A Y2 = Y1 • ... CI) description The SN54ASC5239 and SN74ASC5239 are 3-state input/output buffer standard-cell functions that interface CMOS internal cells with TTL or CMOS bidirectional bus lines, The input buffer responds to TTL threshold levels imposed on the 110 bus regardless of the state of the internal 3-state cOritrol GZ, The cell is designated and called from the engineering workstation input using the following cell name and netlist label: Q) Q) .c (fJ ...'" C'" FEATURES CELL NAME IOFB8lH NETLIST CELL LAVOUT HOL LABEL ASPECT RATIO label: IOFB8lH A,GZ,V2,Vl; minimum width RELATIVE CELL AREA TO NA210LH 73.4 The cell incorporates circuit elements designed to actively bypass and dissipate electrostatic discharges with potentials ranging up to 4 kilovolts. Guard-ring structures are employed that provide current management techniques for the cell to recover from exposure to high currents of up to 400 milliamperes, thereby nA~atin~ mo!C;t r.nmmnn ~nllrr.AC:: th~t I""~n :-,rnf.ll.II"O ~ I~-t:':"~-I_~~ ~':"~~~'!:~~~_ These output cells have been designed to provide low-impedance drive levels for both the high- and lowlogic-level states. As a result, passive resistance has been omitted in series with the output transistors, Shorting a high-level output to ground or a low-level output to VCC will cause current flow in excess of that recommended for normal operation. Therefore, it is recommended that outputs not be shorted directly to ground or VCC, The dynamic drive capability of each output is specified by the delta propagation delay time parameter included with the switching characteristics. The delta propagation delay times provide a means for making direct comparisons of the various output responses with change in capacitive loading. ADVANCE INFORMATION do.uments .ontein information DR new rroduets in the sampling or ~"",roduction ph... 0 davelopmont, Characteristics iIota and other spacifications ar. subject to change without notice. ~ TEXAS INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 Copyright © 1986, Texas Instruments Incorporated 4-595 S1II54ASC5~39r SN74ASC5239 3-STATE lib IiUFFER WITH NONINVERTING tTL INPUT AND CMOS/TTL OUTPUT description (continued) The SN54ASC5239 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC5239 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 4 in Section 2. The maximum high-level output current is 10.2 milliamperes for the SN54ASC5239 and 12 milliamperes for the SN74ASC5239. The maximum low-level output current is 20.4 milliamperes for the SN54ASC5239 and 24 milliamperes for the SN74ASC5239. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VT SN54ASC5239 TEST CONDITIONS Input threshold I A,GZ voltage I Y1 = Vee TA 5 V, = MIN TYP 2.2 25°C IOH = IOH - -10.2 mA MAX High-level output voltage 1.3 • c .... en :::r ur 3.7 V Vee- O.1 Vee- D.1 0.5 lal - 20.4 mA IOl C» C» (1) (1) low-level output voltage = 20 pA, 0.5 See Note 1 IOZ Off·state output current Vo - Vee or 0 ICC Supply current VI - Vee or 0 Vi = 2 V or 0.8 V ei IA Input capacitance I GZ Vee = 5 V, Equivalent power dissipation capacitance Vee = 5 V, TA = 25°C TA tr V 0.1 0.1 ±10 ±5 ~A 4538 272 nA 1.12 mA 1.2 = 25°C I Y1 t epd UNIT V 1.3 Idl - 24 mA VOL MAX 3.7 - 20 pA, See Note 1 IOH - TYP 2.2 -12 mA VOH SN74ASC5239 MIN = tf = 3 ns, 1.18 0.89 1.18 0.89 7.39 7.39 28.2 28.2 pF pF tTotal input capacitance is dependent on the package type and is equal to the sum of package capacitance and intrinsic input capacitance. NOTE 1: These limits apply when all other outputs are open. 4-596 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC5239. SN74ASC5239 3-STATE I/O BUFFER WITH NON INVERTING TTL INPUT AND CMOS/TTL OUTPUT switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) TTl loads, CL = 15 pF PARAMETERt FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpLH tpHL tpZH tpZL TTl loads, CL PARAMETERt A V1 GZ V1 RL = SN54ASC5239 MIN TVP* MAX SN74ASC5239 MIN 2.3 3.2 00 TVP* 2.3 MAX ns 3.2 RL - 1 kO to GND 2.7 2.7 RL - 1 kO to Vee 3 3 UNIT ns· 50 pF FROM (INPUT) tpLH tpHL tpZH tpZL tpHZ A V1 GZ V1 GZ tPLZ TO (OUTPUT) TEST CONDITIONS RL VI = SN54ASC5239 MIN TVP* MAX 00 SN74ASC5239 MIN 2.9 TVP* 2.9 4.2 4.2 RL - 1 kO to GND 3.4 3.4 RL = 1 kO to Vee RL - 1 kO to GND 4.2 4.2 10 10 RL - 1 kO to Vee 9 9 MAX UNIT ns ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A V1 GZ V1 LitpLH LitPHL LitpZH LitpZL SN54ASC5239 MIN TVP* MAX SN74ASC5239 MIN 17 TVP* 17 29 29 20 20 34 34 MAX ... II) UNIT CD CD ps/pF .c switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) CMOS loads, CL PARAMETERt tpLH tpHL tpZH tpZL = en ca ca ... ps/pF C 15 pF FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A V1 GZ V1 RL RL = RL - = SN54ASC5239 MIN 00 TVP* 2.7 MAX SN74ASC5239 MIN TVP* 2.7 2.8 2.8 1 kO to GND 3.2 3.2 1 kO to Vee 2.6 2.6 tPrnn&:l'2'~tinn rlAI~~1 tirnp.~ ~rJ:> rTH"::I~lIrp.rI frorn th", 4.dOh ~t'lin1' nf ": .... i-th 1',_ "..,. ... ~ at Vo = 1.3 V. For eMOS loads, the times end at the 50% pOint of VO. tpLH '" propagation delay time, low-to-high-Ievel output LitpLH tpHL '" propagation delay time, high-to-Iow-Ievel output LitpHL tpZH '" output enable time to high level LitpZH tPZL " output enable time to low level LitpZL tpHZ .. output disable time from high level tpLZ '" output disable time from low level Typical values are at Vee = 5 V, T A = 25°e. '" '" '" '" MAX UNIT ns ns -.~ ne> ~1not. <>"~ Qnot.~ t:,.. .. TTl I...... ~~ ... h ..... i ..... """" "" ...... change in tpLH with load capacitance change in tpHL with load capacitance change in tpZH with load capacitance change in tpZL with load capacitance * TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-597 SN54ASC5239, SN74ASC5239 3-STATE I/O BUFFER WITH NONINVERTING TTL INPUT AND CMOS/TTL OUTPUT switching charac;:teristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (continued) CMOS loads, CL PARAMETERt tpLH tPHL tpZH = 50 pF FROM (INPUT) TO (OUTPUT) A VI GZ tpZL TEST CONDITIONS = RL VI SN54ASC5239 MIN TVP* 3.7 00 MAX SN74ASC5239 MIN TVP* MAX 3.7 3.6 RL -' 1 kll to GND 4.2 3.6 4.2 RL - 1 kll to Vcc 3.5 3.5 UNIT ns ns change in propagation delay time with load capacitance over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt -. Range of Range of FUNCTION TABLE positive logic equation Y = (A 1.A2) INPUTS + (81.82) OUTPUT AI A2 BI B2 H H X X L X X H H L Y Any other H combination description The SN54ASC6003 and SN74ASC6003 are 2-wide. 2-input AND-OR gate CMOS standard cells. The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: CELL NAME BF003LH TYPICAL .c RELATIVE HDL LABEL DELAY CELL AREA TO NA210LH Label: BF003LH Al,A2,Bl,B2,Y; CL - I pF 2,6 ns o CI) CI) FEATURES NETLIST II .... en ....CISCIS 1.75 Q The SN54ASC6003 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6003 is characterized for operation from - 40°C to 85 °C, absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER Equivalent power Vee - 5 V, voltage ISN54Ase6003 ISN74ASe6003 Cpd dissipation capacitance PRODUCTION DATA do.omants contain information currant B~ of publication date. Products conform to .pacifications per the tarms of Taxas Instruments standard warranty. Production ~rocessing d~s not nac8ISsri.y iflcluda testing of all paramat!fS. TVP TEST CONDITIONS Input capacitance thres~old ICC Supply current ei I I = 5 V, = 4.5 V to 5.5 V, TA = MIN to MAX Vee = 5 V, I VT Input Vee Vee TA = TA VI = 25°C = Vee or 0, MAX 2.2 :lLU 13.2 TA = 25°C t r - tf - 3 ns, 25°C I UNIT I I V I nA 0.13 pF 0.51 pF Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-609 SN54ASC6003, SN74ASC6003 AND·NOR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH FROM (INPUT) tpHL tltpLH tltpHL TEST CONDITIONS Any Y Any Y tpHL tpLH TO (OUTPUT) Any CL CL ~ ~ 0 1 pF Y SN54ASC6003 SN74ASC6003 MIN TYP* MAX MIN TYP* MAX 0.7 1.2 2.7 0.7 1.2 2.5 0.3 1 2 0.4 1 1.9 1.6 3.2 2 7.2 1.7 4.5 0.9 3.2 2 6.6 0.9 0.9 2 4.6 1 2 4.2 0.5 0.9 2.5 0.5 0.9 2.2 t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output tltPLH '" change in tpLH with load capacitance tltpHL '" change in tpHL with load capacitance *Typical values are at VCC = .5 V, TA ~ 25°C. DESIGN CONSIDERATIONS III Refer to the 'ASC60 1 7 data sheet and Section 7. C ... I» I» en :::r CD CD ... (II 4-610 TEXAS " , INSTRUMENTS POST OFFICE BOX 6!l5Qi 2 • DALLAS. TEXAS 15265 =3 4 UNIT ns ns ns/pF ns (10% and 90%1. SN54ASC6004. SN74ASC6004 AND·NOR GATES v = (A1.A2) + (81·82.83) 02939, AUGUST 1986 SystemCeIrM 2-/-Im INTERNAL STANDARD CELL • 2,8 ns Typical Propagation Delay with 1-pF Load • Specified for Operation Over Vee Range of 4,5 V to 5,5 V • Functional Operation Over Vee Range of logic symbol 2Vt06V • Dependable Texas Instruments Quality and Reliability FUNCTION TABLE INPUTS positive logic equation + (81·82·83) Y = (A1.A2) OUTPUT A1 A2 B1 B2 B3 Y H H X X X L X X H H H l H Any other combination description The SN54ASC6004 and SN74ASC6004 are 2-wide, 2-3-input AND-NOR gate CMOS standard cells, The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: FEATURES CELL NAME BF004lH NETLIST TYPICAL RELATIVE HDL LABEL DELAY CELL AREA U) TO NA210LH CL - 1 pF label: BF004LH A 1,A2,B1 ,B2,B3,Y; 2.8 ns II .. CD CD 1.75 .c The SN54ASC6004 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6004 is characterized for operation from - 40°C to 85 DC. en .. ca ca C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2, electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage I SN54ASe6004 ICC Supply current SN74ASe6004 Vec - 5 V, 4.5 V to 5.5 V, Vec I Cj TA Input capacitance .- . .. . .... '-I .... 'vc" ..... ~ t-'V." ... , Cpd dissipation capacitance I PRODUCTION DATA documents contain information carnnt as of publication data. Products conform to specificatioos per the terms of Texas Instruments =:~:=i~ai~:r.~~ ~!:~:~:; :'~U:::::~:'8 ~ Vee not ....... \'-TA ~ TYP 5 V, "" V nA 14.2 MIN to MAX ~ UNIT 237 Vee or 0, VI MAX 2.2 TA - 25°C . TA " ~ 25°C " 25°C ~ pF 0.13 "" I 0.53 I p~ I Copyright © 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICI: BOX 655012 • DALLAS, TEXAS 75265 4-611 SN54ASC6004, SN74ASC6004 AND·NOR GATES switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise rioted) PARAMETERt tpLH FROM TO TEST UNPUT) (OUTPUT) CONDITIONS Any y tPHL tPLH tpHL .l.tpLH .l.tpHL Any Y Any Y SN74ASC6004 TYP* MAX MIN =0 0.6 1'.3 2.7 0:7 TYP* 1.3 0.4 1 2.1 1.9 = 1 pF 3.3 2.2 6.4 0.4 1.7 1 1.6 3.3 2.2 5.9 4.4 0.9 2 3.8 2 3.5 0.5 1.2 3 1.2 2.6 CL CL SN54ASC6004 MIN 0.9 5 tpropagation delay times are measured from the 44% point of VI to the 44% point ~f Vo with tr tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output .l.tPLH = change in tpLH with load capacitance .l.tpHL .. change in tpHL with load capaCitance Typical values are at VCC = 5 V, TA = 25°C. * DESIGN CONSIDERATIONS II 4-612 Refer to the' ASC6017 data sheet and Section 7. TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 1 1 0.5 = tf = MAX 2.5 UNIT ns ns ns/pF 3 ns (10% and 90%). SN54ASC6005. SN74ASC6005 AND·NOR GATES v == (A1·A2·A3)+(B1.B2.B3) 02939. AUGUST 1986 SystemCell™ 2-llm INTERNAL STANDARD CELL • 3 ns Typical Propagation Delay with 1-pF Load • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Vee logic symbol ~:---t-_>-' Range of Range of FUNCTION TABLE positive' logic equation Y = (A 1·A2·A3) INPUTS + (81·82.83) OUTPUT A1 A2 Al B1 B2 H H H X X X X X H H B3 X H Any other combination Y L L H description The SN54ASC6005 and SN74ASC6005 are 2·wide, 3-input AND-NOR gate CMOS standard cells. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: FEATURES NETLIST TYPICAL RELATIVE HDL LABEL DELAY CELL AREA CL - 1 pF 3 ns TO NA210LH Label: BF005LH Al.A2,Al,B1.B2.Bl.Y; CELL NAME BF005LH • 2 The SN54ASC6005 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC6005 is characterized for operation from -40 DC to 85 DC. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage SN54Ase6005 lee Supply current ! SN74ASC6005 Vee - 5 I ej Input capacitance I Equivalent power Cpd dissipation capacitance TYP TA - 25°e Vee = 4.5 V to 5.5 V. TA = MIN to MAX VI = 5 V. Vee = 5 V. TA = 25°e TA Vee PRODUCTION DATA d...mants contain imarmati •• currant I. of publication data. Products co.form ta opacifications par tho torms of T.... Instruments :'=~~i~·ir,::r.'li ~::~~:r :II"::~~:'~ lot v, = MAX 2.2 V 266 Vee or O. 15.9 tr = 25°e = tf = 3 ns. UNIT nA 0.13 pF 0.64 pF J Copyright © 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFl=ICE sox 656012 • DALLAS, .TEXAS 76266 4-613 SN54ASC6005, SN74ASC6005 AND-NOR GATES switching charac~eristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) , PARAMETERt tpLH FROM (INPUT) Any tpHL .tpLH tpHL AtPLH AtpHL Any Any TO TEST (OUTPUT) CONDITIONS Y Y = CL CL = ° 1 pF V SN54ASC6005 SN74ASC6005 MIN 0,7 TVP* 1,5 MAX 3,3 MIN 0,7 TVP* 1,5 MAX 0,5 1.2 3,5 2,4 1,6 7,1 0,5 1,7 1.2 3,5 2.1 6,5 1,1 2.5 5,2 1,2 2.5 4.5 0,9 2 1,3 3,B 1 0,6 2 1,3 3,5 0.6 3 3,1 2,5 UNIT ns ns nsipF t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%1. tPLH " propagation delay time, low-to-high-Ievel output tpHL " propagation delay time, high-to-Iow-Ievel output AtPLH " change in tpLH with load capacitance AtpHL " change in tpHL with load capacitance Typical values are at VCC = 5 V, T A = 25 DC. * DESIGN CONSIDERATIONS II Refer to the 'ASC6017 data sheet and Section 7, C m m .... t/) :::T CD CD .... (I) 4-614 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC6006, SN74ASC6006 AND-NOR GATES Y = A1 +A2+(B1.B2) 02939. AUGUST 1986 SystemCell™ 2-~m INTERNAL STANDARD CEL~ • Typical Propagation Delay with 1-pF Load 3 ns from Any A 3.2 ns from Any B • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Vee logic symbol B1 Range of B2 A1 ~ . Y A2 Vee Range of FUNCTION TABLE INPUTS Dependable Texas Instruments Quality and Reliability positive logic equation Y = A1 +A2+(B1·B2) OUTPUT A1 A2 B1 B2 Y H X X X L X H X X L X X H H L L L L X H L L X L H description The SN54ASC6006 and SN74ASC6006 are expandable 1-1-2-input AND-NOR gate CMOS standard cells. • The cells are designated and called from the engineering workstation input using the following cell name :. to develop labels for the design netlist: CELL NAME BF006LH ... II) RELATIVE NETLIST CD CD CELL AREA HDL LABEL TO NA210LH .c 1.75 Label: BF006LH A1.A2.B1,B2,V; U) The SN54ASC6006 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6006 is characterized for operation from - 40°C to 85 DC. ... CU CU C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER TEST CONDITIONS Vee = 5 V. Vee - 4.5 V to 5.5 V, VT Input threshold voltage ISN54Ase6006 lee Supply Current ISN74ASe6006 I::' TA . . -'. "'I-' ... L ..... "" ....... L""' ....... = '"'' Vee Equivalent power Cpd dissipation capacitance TA = 25°C - " - 5 V. 13.3 T. _ ..,c:or- :.~~~:~~;ar::1~1~ =:~ti;; :I~o:=::~~~s not UNIT V 222 VI - Vee or 0, nA roo , ? ~O 0.36 pF .~ tr - tf - 3 ns, 25°e Copyright © 1986, Texas Instruments Incorporated PRODUCTION DATA documonts contain informotion current as of publication date. Products conform to specifications par the terms of Tuas Instruments MAX 2.2 MIN to MAX 0:'" = TYP TA TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-615 SN54ASC6006, SN74ASC6006 AND-NOR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted~' PARAMETERt tPLH tpHL tpHL tPLH tpHL tpHL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS Any Y Y Y Y Y Y y Any A Any B Any Any A Any B dtpLH Any dtpHL Any A dtpHL Any B CL = 0 CL = 1 pF Y Y SN54ASC6006 TYP:): MAX MIN SN74ASC6006 TYP:): MAX MIN 0.8 1.5 4.1 0.8 1.5 3.7 0.2 1.6 0.3 0.8 1.6 0.4 0.8 1 2 11 0.5 2.3 1 4.5 1.9 9.9 2.2 4.5. 0.7 1.4 3 0.8 1.4 2.8 0.9 1.9 4.6 1 1.9 4 6.3 1.4 3 7 1.5 3 0.4 0.6 1.4 0.4 0.6 1.2 0.5 0.9 2.6 0.5 0.9 2.2 UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% pOint of Va with tr = tf = 3 ns (10% and 90%1. tPLH " propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output dtpLH " change in tpLH with load capacitance dtpHL '" change in tpHL with load capacitance :):Typical values are at VCC = 5 V, TA = 25°C . • C DESIGN CONSIDERATIONS Refer to the 'ASC60 1 7 data sheet and Section 7. I» r+ I» rn ::::r- CD .CD r+ 'en 4·616 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DAL.LAS, TEXAS 75265 SN54ASC6007. SN74ASC6007 AND-NOR GATES Y == A1+A2+(B1.B2.B3) 02939, AUGUST 1986 SystemCell'''' 2-",m INTERNAL STANDARD CELL • Typical Propagation Delay with '-pF Load 3,2 ns from Any A 3,7 ns from Any B • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Vee logic symbol rp-- A1------, ~d Range of A2------..J Range of FUNCTION TABLE INPUTS positive logic equation Y = A1 +A2+(B1.B2.B3) OUTPUT A1 A2 B1 B2 B3 Y H X X X X L X H X X X L X X H H H L L L L X X H L L X L X H L L X X L H description The SN54ASC6007 and SN74ASC6007 are expandable 1-1-3-input AND-NOR gate CMOS standard cells. The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: CELL NAME BF007LH ~ CELL AREA HDL LABEL ...caca TO NA210LH 1.75 Label: BF007LH A 1,A2,B1,B2,B3,Y; U) CD CD RELATIVE NETLIST a... The SN54ASC6007 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6007 is characterized for operation from - 40°C to 85 DC. C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER I VT ~~.- ICC Supply current Cj TYP TEST CONDITIONS Input threshold voltage ..... .-,. ........... I -....... ! \, I;~;;~;;~~~; TA ~ Vee ~ 5 V, Equivalent power Vee - 5 V, Cpd dissipation capacitance TA PRODUCTION DATA do•• mants oontaln information currant as of publicatian date. Products conform to specificaliaDs per the terms of TaxBI Instruments =~:=i~ai:,~7e ~1~~~; :UD=:~;:S not ~ 14.4 tr - tf - 3 ns, 25°C UNIT v 240 MIN to MAX Input capacitance MAX 2.2 nA 0.13 pF 0.36 pF Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-617 SN54ASC6007, SN74ASC6007 GATES switching characteristics over recommended ranges of supj:lly voltage and operating free-air temperature (unless otherwise noted) FROM TO TEST (INPUT) (OUTPUT) CONDITIONS tpLH Any Y tpHL Any A tpHL Y y tpLH Any B Any. tpHL Any A tPHL t.tPLH t.tpHL Any B Any A t.tPHL Any B PARAMETERt Any Y Y Y y CL CL ~ ~ 0 1 pF Y Y SN54ASC6007 MIN SN74ASC6007 MAX MIN 0.7 TYP* 1.8 MAX 0.7 TYP* 1.8 0.3 0.9 5 1.6 0.3 0.9 1.6 0.4 2.2 1.2 4.8 2.7 11.8 0.5 2.3 1.2 2.4 10.7 0.7 1.5 3.1 0.8 1.5 2.8 1.1 2.5 6.2 1.2 2.5 5.4 6.3 4.8 UNIT 4.5 1.4 3 6.9 1.5 3 0.4 0.6 1.5 0.4 0.6 1.2 0.6 1.3 3.6 0.7 1.3 3.1 ns ns nsipF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr ~ tf ~ 3 ns (10% and 90%l. tpLH '" propagation delay time, low-to-high-Ievel output tpHL .. propagation delay time, high-to-Iow-Ievel output t.tPLH '" change in tpLH with load capacitance t.tPHL .. change in tpHL with load capacitance *Typical values are lit VCC ~ 5 V, TA ~ 25°C . • DESIGN CONSIDERATIONS C Refer to the' ASC6017 data sheet and Section 7. I» fit en ::r CD CD .... en 4-618 TEXAS .Jj:~ INSTRUMENTS POST OFFIcE BOX 66/5012 .. DALLAS. TEXAS 75265 SN54ASC6008, SN74ASC6008 AND·NOR GATES v = A1 + (81·82)+ (C1.C2) 02939, AUGUST 1986 SystemCell™ 2-j.lm INTERNAL STANDARD CELL • 3.4 ns Typical Propagation Delay with 1-pF Load • Specified for Operation Over 4.5 V to 5,5 V Vee logic symbol ..r-, Bl _ _ Range of B2---...._, Al-------~ Vee • Functional Operation Over 2Vt06V Range of • Dependable Texas Instruments Quality and Reliability Cl Y ---r--, C2----...._, FUNCTION TABLE INPUTS positive logic equation Y = A1 +(81.82) + (C1.C2) OUTPUT 111 X B2 Cl C2 Y X X X L H H X X L X X H H L Any other combination H Al H X X RELATIVE • (/) description The SN54ASC6008 and SN74ASC6008 are expandable 1-2-2 input AND-NOR gate CMOS standard cells. The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: ... II) G) G) FEATURES CELL NAME BF008LH TYPICAL NETLIST HDL LABEL DELAY CELL AREA TO NA210LH Label: ElF008LH A 1,81 ,B2,C1 ,C2,Y; CL - 1 pF 3,4 ns .c ... CO CO 2 The SN54ASCB008 is characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC6008 is characterized for operation from -40°C to 85°C. C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2, electrical characteristics PARAMETER _................................ ~1\1I="A~r-C!,..."O ICC Supply current ISN74ASC6008 TA - 25°C VCC = 5 V, ...... ·\.A.. " • ".... VCC = 5 V, Equivalent power VCC - 5 V, Cpd. dissipation capacitance TA = 25°C PRODUCTION DATA documanlo contain information currant as of publication data. Producq conform to opaciflcati.ns par tho termo Taxn Instruments :'=~i;a{::I~'l,; ~r;:I:~i:; lr:"::::::':~~' not 0' , w L_ ~ .... f':' r:" , . .,..... w, '0 MAX 2.2 .. \..1.,. ........ , 14.9 TA = 25°C t r - tf - 3 ns, UNIT V -~~ TA = MIN to MAX Input capacitance Cj TYP TEST CONDITIONS VT Input threshold voltage nA 0.13 pF 0.44 pF Copyright @ 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012. • DALLAS. TEXAS 752.65 4-619 SN54ASC6008, SN74ASC6008 AND-NOR GATES switching characteristics over recommended ranges Qf supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt FROM (INPUT) tpLH Any tpHL tpHL A1 Any e, C tpLH Any tpHL '. tpHL atpLH atpHL atpHL A1 Any e, C TO (OUTPUT) Y Y TEST CONDITIONS CL = 0 CL = 1 pF Any y A1 Any e, C SN54ASC6008 SN74ASC6008 MIN TYP* MAX MIN TYP* MAX 0.9 I.B 5.3 0.9 I.B 4.7 0.4 1 0.4 1 1.7 0.3 1 0.4 2.5 1 4.B 2.1 2.3 4.B 1.7 2.3 12.1 O.B 1.6 3.2 0.9 1.6 2.9 O.B 2 4.B 0.9 2 4.2 6.3 1.4 3 6.9 1.5 3 0.6 1.5 0.4 0.6 1.3 0.5 1 2.6 0.5 1 2.2 * II DESIGN CONSIDERATIONS Refeno the' ASC6017 data sheet and Section 7. C ... I» I» C/) :r CD CD ... tn 4-620 TEXAS -II INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 = ns 10.9 0.4 tPropagation delay times are m~sured from the 44% point of VI to the 44% point of Vo with tr = tf tpLH " propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output atpLH '" change in tpLH with load capacitance atpHL '" change in tpHL with load capacitance Typical values are at VCC = 5 V, T A = 25 DC. UNIT ns ns/pF 3 ns (10% and 90%). SN54ASC6009. SN74ASC6009 AND-NOR GATES Y = A1 +(B1.B2)+(C1·C2·C3) 02939. AUGUST 1986 SystemCell™ 2-/Am INTERNAL STANDARD CELL • 3.7 ns Typical Propagation Delay with l-pF Load • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Vee 'Iogic symbol Range of Range of FUNCTION TABLE INPUTS positive logic equation Y = A 1 + (81·82) + (C1.C2.C3) OUTPUT A1 B1 B2 C1 C2 C3 Y H X X X X X L X H H X X X L X X X H H H Any other combination L H description The SN54ASC6009 and SN74ASC6009 are expandable 1-2-3-input AND-NOR gate CMOS standard cells. The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: CELL NAME BFOO9LH TYPICAL HDl LABEL DELAY ... fI) .c RELATIVE en CELL AREA ... CO CO TO NA210LH CL - 1 pF Label: BF009LH A 1.B1.B2,C1 ,C2.C3.Y; 3.7 ns :ill G) G) FEATURES NETLIST II 2 The SN54ASC6009 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC6009 is characterized for operation from - 40 DC to 85 DC. C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics '1 PARAMETER I VT lee Supply current ej TYP TEST CONDITIONS = 5 V. Vec = 4.5 V to 5.5 TA = MIN to MAX Input threshold voltage Vee rISN54ASe6009 SN74ASe6009 Input capacitance Vee - 5 V. Equivalent power Vee Cpd dissipation capacitance TA PRODUCTION DATA documo.ts •••toi. i.f.rmati•• currant as of publication date. Products conform to spacificatioDs par the terms of Taxas Instruments ===i~8;'::I~'i ~:~~~i:: :.~u:::::.::.~s not = 5 V. = 25°e ---_ .. _- TA V. VI = 25°C = Vce or MAX 2.2 266 O. 15.9 TA - 25°C tr - tf - 3 ns. I UNIT I v nA 0.13 pF 0.45 pF Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-621 SN54ASC6009, SN74ASC6009 AND-NOR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt FROM (INPUT) TO TEST (OUTPUT) CONDITIONS tpLH Any V tpHL Al Any B, C V tpHL CL =0 V SN54ASC6009 SN74ASC6009 MIN TYP* MAX MIN TVP* MAX 0.9 2 6.1 0.9 2 5.5 0.4 1 1.8 0.5 1 1.7 0.3 2.3 1.2 0.4 1.2 2.7 5 3 12.9 2.5 5 11.7 0.8 1.6 3.2 0.9 1.6 2.9 2.4 6.6 1 2.4 5.7 6.3 tpLH Any V tpHL Al V tpHL Any B, C 0.9 AtPLH AtpHL Any V V 1.4 3 6.9 1.5 3 A1 Any 8, C Y Y 0.4 0.6 1.5 0.4 0.6 1.3 0.5 1.2 3.6 0.5 1.2 3.1 AtPHL CL = 1 pF UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpLH '" propagation delay time, low·to·high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output AtpLH '" change in tpLH with load capacitance AtpHL '" change in tPHL with load capacitance Typical values are at VCC = 5 V, TA = 25°C . * • DESIGN CONSIDERATIONS Refer to the' ASC6017 data sheet and Section 7. 4-622 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 = Y SystemCell™ 3.7 ns Typical Propagation Delay with 1-pF Load • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee 02939, AUGUST 1986 2-l'm INTERNAL STANDARD CELL • Vee SN54ASC6012, SN74ASC6012 AND-NOR GATES (A1.A2) + (81.82) + (C1.C2·C3) logic symbol A1--...r"'-..... Range of A2--_L_" C1---I""-'" C2 C3 ---L_--" B1 _ _. J " -..... Range of ---1...._-" B2 positive logic equation Y = (A 1·A2) Y FUNCTION TABLE + (81.82) + (C1.C2.C3) OUTPUT INPUTS A1 A2 B1 B2 C1 C2 C3 Y H H X X X X X l X X H H X X X l X H H X X X Any other combination H l H description The SN54ASC6012 and SN74ASC6012 are 3-wide, 2-2-3-input AND-NOR gate CMOS standard cells, The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: a FEATURES NETLIST TYPICAL RELATIVE HDllABEl DELAY CEll AREA TO NA210lH Label: BF012lH A 1,A2,B1,B2,C1,C2,C3,Y; Cl - 1 pF 3.7 ns CEll NAME BF012lH ...co CO 2.5 C The SN54ASC6012 is characterized for operation over the full military temperature range of - 55 DC to 125 DC, The SN74ASC6012 is characterized for operation from -40 DC to 85 DC. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER "I :" ....... ~ TEST CONDITIONS ~;,'<;i.,;'U;...; vu;i.a!::t~ vee = 0 v, Cj Input capacitance = 4.5 V to 5.5 TA = MIN 10 MAX VCC = 5 V, C Equivalent power VCC - 5 V, ICC Supply current ISN54ASC6012 ISN74ASC6012 pd dissipation capacitance PRODUCTION OATA do•• monts contoin information currant as of publication data. Products conform to specifications par the terms of Taxas Instruments =~:~ri~8i~:,-:li ~::\~:i:r ~D::::'::~~ nat VCC TA = TYP V, MAX 2.2 = 25°C = tf = 3 ns, 0.13 pF 0.56 pF VI V 312 18.7 TA I, UNIT = ;'0"(; = VCC 0' 0, 'A 25°C nA Copyright @ 1986. Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-623 SN54ASC6012, SN74ASC6012 AND-NOR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH tpHL tpLH tpHL .1tpLH .1tpHL FROM UNPUT} Any Any Any TO (OUTPUT) y Y TEST CONDITIONS CL CL =0 = 1 pF Y SN54ASC6012 SN74ASC6012 MIN TYP* MAX MIN TYP* MAX 0.9 2.1 0.9 2.1 6.3 0.3 1.2 '0.4 1.2 2.8 2.3 0.9 5.1 2.5 5.1 12.5 2.3 0.9 2.3 5.8 1.4 3 1.5 3 6.2 0.5 1.1 7 3.2 13.8 6.7 6.9 3.5 0.5 1.1 3.1 UNIT ns ns ns/pF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpLH " propagation delay time. low-to-high-Ievel output tpHL '" propagation delay time. high-to-Iow-Ievel output .1tpLH " change in tpLH with load capacitance .1tpHL·" change in tpHL with load capacitance Typical values are at VCC = 5 V. TA = 25°C. * ·DESIGN CONSIDERATIONS II 4-624 Refer to the' ASC6017 data sheet and Section 7. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 v= SystemCenr M 4.1 ns Typical Propagation Delay with 1-pF Load • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee 02939. AUGUST 1986 2-j.lm INTERNAL STANDARD CELL • Vee SN54ASC6013, SN74ASC6013 AND·NOR GATeS (A1.A2)+(B1.B2.B3)+(C1.C2.C3) logic symbol B1 _ _,...._ Range of B2 B3---t...._" C1 _ _.r--.... Range of C2 C3---t....-" Y A1 A2--"'----_' positive logic equation Y = (A 1·A2) FUNCTION TABLE + (81.82.83) + (C1.C2.C3) INPUTS description The SN54ASC6013 and SN74ASC6013 are 3-wide, 2-3-3-input AND-NOR gate CMOS standard cells. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: OUTPUT A1 A2 B1 B2 B3 C1 C2 C3 Y H H X X X X X X X H H H X X X X X X L X X X H H H L L HDL LABEL DELAY CELL AREA • TO NA210LH CI) Label: BF013LH A 1.A2.B1.B2,B3,C1 ,C2,C3, Y; CL - 1 pF 4.1 ns 2.5 ....caca H Any other combination ....enCD FEATURES NETLIST CELL NAME BF013LH TYPICAL RELATIVE CD .c The SN54ASC6013 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6013 is characterized for operation from -40°C to 85°C. C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage SN54Ase6013 lee Supply current SN74Ase6013 TEST CONDITIONS Vee = 5 V, TA = 25°C Vee = 4.5 V to 5.5 V. T. = MIN to MAX VI = Vee or 0, Input capacitance Vee = 5 V, TA = 25°e EquivalE;mt power Cpd dissipation capacitance Vee - 5 V, TA= 25°C t r = tf = 3 ns. "1 r ej PRODUCTIOI DATA ....uinanll ••ntain information currant as of pulllicolilll dlla. Products c.nform ta .pacificati.ns par tho terms of TUis IIWu188m :.:.=~m~:I':.'li ~~::i:l' lil":::':~ not TYP _2.2 MAX UNIT V 330 19.8 nA 1 0 . 13 pF 0.57 pF Copyright © 1986. Texas Instruments Incorporated . TEXAS'" INSTRUMENTS POST OFFICE BOX 225012 • DALLAS. TEXAS 75265 4-625 SN54ASC6013. SN74ASC6013 AND·NOR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH FROM (INPUT) Any TO (OUTPUT) TEST CONDITIONS V CL = 0 tPHL tpLH tpHL dtpLH dtPHL Any Any CL = 1 pF V Y SN54ASC6013 TYP* MAX MIN TYP* MAX 1 2.5 7.9 1.1 2.5 7.1 0.4 1.3 3.4 0.4 1.3 3 2.5 5.5 2.6 5.5 13.2 0.9 2.6 14.6 7 1 2.6 6 1.4 3 1.3 6.9 1.5 3 6.3 3.7 0.5 1.3 3.2 0.5 tProp~gation delay times are measured from the 44% pOint of VI to the 44% point of Vo with tr tpLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output atpLH 3!5 change in tpLH with load capacitance dtpHL '" change in tpHL with load capacitance Typical values are at VCC = 5 V, TA = 25°C. * DESIGN CONSIDERATIONS II 4-62.6 SN74ASC6013 MIN Refer to the' ASC6017 data sheet and Section 7. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALl.AS. T~XAS 75265 = tf = UNIT ns· ns ns/pF 3 ns (10% and 90%1. Y = SN54ASC6014, SN74ASC6014 AND-NOR GATES (A1.A2.A3l+ (81·82·83) + (C1.C2.C3) 02939. AUGUST 1986 SystemCell™ 2-llm INTERNAL STANDARD CELL • 4.3 ns Typical Propagation Delay with l-pF Load • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Vee Vee logic symbol A1--..J!'"-.... A2 A 3 - -....._ ' Range of Range of B1---r--, B2 B 3 - -....._ ' Dependable Texas Instruments Quality and Reliability Y C 1 - - - r - -.... C2 C3---1.._" positive logic equation Y = (A 1.A2·A3) FUNCTION TABLE + (81·82·83) + (C1.C2.C3) INPUTS A2 ~3 H H A1 H OUTPUT B1 B2 B3 C1 C2 C3 X X X X X X L L X X X H H H X X X X X X X X X H H H Y L Any other combination H description • The SN54ASC6014 and SN74ASC6014 are 3-wide, 3-input AND-NOR gate CMOS standard cells. The cells are designated and called from the engineering workstation input using the following cell name to develop labe!s for the design netlist: II) ~ CD .: FEATURES CELL NAME BF014lH NETLIST TYPICAL RELATIVE HDllABEl DELAY CEll AREA Cl = 1 pF TO NA210lH 4.3 ns 2.75 Label: BF014LH A 1,A2,A3,B1.B2,B3,C1,C2,C3,Y; tn ....COCO C The SN54ASC6014 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6014 is characterized for operation from - 40°C to 85 DC. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER V1 TA = 25°C Input capacitance Vce = 5 V. TA = 25°C Equivalent power Vec = 5 V. TA = 25°e tr ICC Supply current ej =:I---TYP TEST CONOITIONS VCC = 5 V. Vee = 4.5 V to 5.5 V, TA = MIN to MAX UlfJUl mresnolO VOltage ISN54Ase6014 iSN74ASC6014 Cpd dissipation capacitance PRODUCTION DATA documents cont.in inform.tion cur(8nt 8S of publication date. Products conform to .pacifications per the terms of Texas Instruments =~:=i:8i~:r.:li ~:~:~i:r :.r::;:::~:~~ not VI = Vee or 0, = tf = 3 ns, MAX I UNIT I 363 21.8 nA 2.2 V 0.13 pF 0.71 pF Copyright © 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS· 75265 4-627 " .. P i ! . ' , ~. ':.. . SN54ASC6014, SN74ASC6D14 ~ND-NOR GATES _switching t:haracten~tics over recommended ranges of supply voltage and operating free-air temperature' lunle~s other,wise hoted) , PARAMETERt tPL:i-I tpHL tpLH tpHt. AtpLH AtpHL FROM (lIllPUT) Any Any Any TO (OUTPUT) TEST CONDITIONS Y =0 CL Y CL = 1 pF \ Y SN54ASC6014 TYP; MAX MIN 1.1 2.8 0.4 1.4 !!.4 3.9 0.5 1.4 3.4 2.5 5.8 16 2.6 5.8 14.5 7.5 6.5 6.8 1.2 1.5 2.8 3 3 6.2 0.6 1.4 3.7 0.6 1.4 3.1 = change in tPLH with load capacitance Refer to the 'ASC60 1 7 data sheet and Section 7. ...C I» I» tI) ::r CD CD ... (I) . 8.4 2.8 DESIGN CONSIDERATIONS 4-628 2.8 1.1 AtPHL '" chaMge in tPHL with load capacitance tTypical values are at VCC = 5 V, TA = 25°C. • 1.1 1.4 tprilpagation delay times are measured frOrri the 44% point of VI to the 44% point of Va with tr tpu-i " propagation delay time, low-to-high-Ievel output tpHL .. propagation delay time, high-to-Iow-Ievel output AtpLH SN74ASC6014 TYP; MAX MIN TEXAS'" INSTRUMENTs POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 = tf UNIT ns ns ns/pF = 3 ns 110% and 90%1. SN54ASC6017, SN74ASC6017 AND-NOR GATES V - A1 +(81.82) 02939. AUGUST 1986 SystemCell™ 2-llm INTERNAL STANDARD CELL • 2.5 ns Typical Propagation Delay with '-pF Load • Specified for Operation Over Vee Range of 4.5 V to 5.5 V • • logic symbol __ :~-----r--~:>~ ~~ A1 Functional Operation Over Vee Range of 2Vt06V ~Y FUNCTION TABLE INPUTS Dependable Texas Instruments Quality and Reliability OUTPUT AI B2 BI Y H X X H X L L L L X H L X L H positive logic equation Y = A1 +(61.62) H description The SN54ASC6017 and SN74ASC6017 are expandable 1-2-input AND-NOR gate CMOS standard cells. The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netHst: FEATURES CELL NAME BF001LH NETLIST TYPICAL HDL LABEL DELAY CELL AREA CL-lpF 2.5 ns TO NA210LH Label: BFOOI LH A I.B1.B2.Y; RELATIVE II .... U) CD CD .c 1.5 en The SN54ASC6017 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6017 is characterized for operation from -40°C to 85°C. ....caca C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage lee Supply current ej I. (,,;pd ISN54Ase6017 Vee - 5 V. Vee - 4.5 V to 5.5 V. ISN74ASe60 17 TA = Vee EmlivRIp.nt nn\lI/p.r \/,..,., _ c:: dissipation 'capacitance I PRODUCTIOI DATA docam..ts contain information cUmIIIl IS 01 publication data. Products conlorm 10 spacificatiDns par the terms of TeXIS Instruments =~ai~r:1~7i :::::i:r :.r:::::~:.~ not TA = 5 V. \I MAX 2.2 11.2 TA -, - = 25°e +. ~I - 25°e ~ -•• _, I UNIT V 187 VI - Vee or O. MIN to MAX = Input capacitance -- TYP TA - 25°e nA 0.13 pF 0.38 I I pF Copyright @ 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 4-629 SN54ASC6017, SN74ASC6017 AND-NOR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tPLH tPHL tpLH tPHL dtpLH FROM (INPUT) TO TEST {OUTPUTI CONDITIONS Any Y CL = 0 Any y Any y CL = 1 pF dtPHL SN54ASC6017 SN74ASC6017 MIN TYP~ MAX TVP~ MAX 0.6 1.1 2.4 0.6 1.1 0.2 0.9 1.9 0.3 0.9 1.7 1.6 0.7 3.1 6.9 1.7 3.1 6.3 1.8 4.3 0.8 1.8 3.8 0.9 2 4.6 1 2 4.2 0.4 0.9 2.5 0.4 0.9 2.1 MIN t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpLH '" propagation delay time, low·to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output dtpLH 55 change in tpLH with load capacitance dtpHL '" change in tpHL with load capacitance tTypical values are at VCC = 5 V, TA = 25°C. = tf = 2.2 UNIT ns ns ns/pF 3 ns 110% and 90%1- DESIGN CONSIDERATIONS III Refer to Section 7. All inputs to this cell. as well as all cells. must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. This Boolean function is a member of a series of multifunction cells designed to simplify the implementation of a broad class of higher-level logic equations such as: • Sum of products • Exclusive-OR and exclusive-NOR functions • Majority decoders • Modulo adders • Carry-save adders • Function generators • Random logic The members of this class of standard-cell functions are grouped in the' ASC6000 series of type numbers. The selection consists of four primary architectures with expandable versions offered in each: • Dedicated and expandable AND-NOR gates • Dedicated and expandable OR-AND-NOR gates .• Expandable AND-OR-NOR gates • Expandable OR-NAND gates • Expandable AND-OR-NAND gates • Expandable OR-AND-OR-NAND gates Options are offered in each architecture from basic 2-wide functions up to expandable 3-wide functions providing single-macro solutions to most design requirements. The expandable functions can 'be combined with basic gating cells and/or other Boolean cells offered in Texas Instruments standard-cell family to implement the application-specific solutions. 4-630 TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 v= SN54ASC6018, SN74ASC6018 AND-NOR GATES A1 +(B1.B2.B3)+(C1·C2·C3) D2939. AUGUST 1986 SystemCell™ 2-/tm INTERNAL STANDARD CELL • 3.9 ns Typical Propagation Delay with 1-pF Load • Specified for Operation Over Vee Range of 4.5 V to 5.5 V • Functional Operation Over Vee Range of 2Vt06V • Dependable Texas Instruments Quality and Reliability logic symbol ~_j____~_...J Y FUNCTION TABLE positive logic equation INPUTS Y = A 1 + (81.82·83) + (C1·C2.C3) OUTPUT A1 B1 B2 B3 C1 C2 C3 H X X X X X X L X H H H X X X L X X X H H H X Any other combination Y L H description The SN54ASC6018 and SN74ASC6018 are expandable 1-3-3-input AND-NOR gate CMOS standard cells. The cells are designated and called from the engineering wor~station input using the following cell name to develop labels for the design netlist: II FEATURES NETLIST TYPICAL RELATIVE HDL LABEL DELAY CEll AREA CL - 1 pF 3.9 ns TO NA210LH Label: BF010LH A l,Bl,B2,B3,Cl,C2,C3,Y; CELL NAME BF010LH 2 The SN54ASC6018 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6018'is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER \/~ ICC Supply current Cj TEST CONDITIONS - - ., VCC - 4,5 V to 5,5 V, ISN74ASC6018 TA Input capacitance Equivalent power Cpd dissipation capacitance PRODUCTION DATA doc.mant. contain information conant as at publication data. Products conform to .pacifil:ations per tbe tarml of Taxas Instruments ::~:~~i~8i~~1~1i - ISN54ASC6018 Innll1' i'kriCloC!hnlri \lnl+ ........ =:I::i:r lrr::~:::~:'1 nat '~~ = MIN to VCC = 5 V, VCC = 5V; TA = 25°C ' -- - " -.- VI - VCC or 0, 301 18,1 MAX = 25°C = tf = 3 ns, TA tr nA 0,13 pF 0.45 pF Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-631 SN54ASC6018, SN74ASC6018 AND-NOR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt FROM (INPUT) tpLH Any tpHL A1 tpHL Any S, e tPLH tpHL Any tpHL Any S, e AtPLH Any AtpHL A1 AtpHL Any S, e TEST CONDITIONS Y CL =0 = 1 pF SN54ASCS018 MIN SN74ASCS018 MAX MIN TYP* 0.8 TYP* 2.1 6.S 0.9 2.1 MAX 6 0.3 0.8 1.5 0.3 0.8 1.5 0.5 1.3 2.3 5.1 3 13.4 0.5 2.4 1.3 5.1 2.6 12.2 0.7 1.4 2.9 0.8 1.4 2.7 1.1 2.6 6.6 1.3 2.6 5.7 1.4 3 0.6 6.7 1.5 3 6.3 0.4 1.4 0.4 0.6 1.2 0.6 1.3 3.7 0.6 1.3 3.2 tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpLH '" propagation delay time, low:to-high-Ievel output tPHL '" propagation delay time, high-to-Iow-Ievel output AtpLH '" change in tPLH with load capacitance AtpHL '" change in tpHL with load capacitance tTypical values are at Vee = 5 V, TA = 25°e. = tf = II .. .. C A1 TO (OUTPUT! Y eL Y DESIGN CONSIDERATIONS Refer to the 'ASC6017 data sheet and Section 7, m m C/) :T CD CD en 4-632 TEXAS'" INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TeXAS 75265 UNIT ns ns ns/pF 3 ns 110% and 90%). SN54AsC6019. SN74ASC6019 AND·NORGATES V"" (A1·A2)+(B1.B2)+(C1.C2) 02939. AUGUST 1986 SystemCell™ 2-ttm INTERNAL STANDARD CELL • 3.5 ns Typical Propagation Delay with 1-pF Load • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Vee I.ogic symbol A 1 - - - r - -.... Range of A2---t..._" B 1 - - - r - -.... Range of Y B 2 - -_ _" C 1 - - - r -...... C2 --""1._-' positive logic equation Y = (A 1.A2) FUNCTION TABLE , + (81.82) + (C1.C2) INPUTS A1 B1 H H X X X X L X X H H X X L X X X H H X 82 C1 C2 OUTPUT Y' A2 L Any othe.r combination H description The SN54ASC6019 and SN74ASC6019 are 3-wide, 2-input AND-NOR gate CMOS standard cells. The cells are designated and called from the engineering workstation input using the followin9 cell name to develop labels for the design netlist: BF011LH U) iQ) .c en ca FEAtURES CELL NAME • NETLIST tyPICAL RELATIVE HDL LABEL DELAY CELL AREA «; TO NA~10LH C CL - 1 pF Label: BF011LH A1,A2,B1,B2,C1,C2.Y; 3.5 ns 2.76 The SN54ASC6019 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6019 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics 0 TEST CONDITIONS t"AKAMt.II:H VT Input threshold voltage lee Supply current ISN54Ase6019 ISN74Ase6019 Vet - 5 V. Vee = 4.5 V to 5.6 V, TYP TA - 25°e TA = MIN to MAX 19.1 Vee - 5 V, TA - 25°e Equivalent power Cpd dissipation capacitance Vee - 5 V, t r - tf - 3 ns, PROOUCTIOI DATA documants contain information currant as of publication date. Products conform to spacHications par the terms of Texas Instruments :'~~~:=i~ai~:I~J~ =:~:r lIr:~::::~:~~ not TA = 25°e UNIT V 319 VI = Vee or 0, Input capacitance ej MAX 2.2 nA 0.13 pF 0.52 pF Copyright @ 1986, Texas Instrums(lts Incorporated TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TI:X~S 76265 4-633 SN54ASC6019, SN74ASC6019 AND·NOR GATES switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) PARAMETERt tpLH tpHL tPLH tpHL .1tPLH .1tPHL FROM (INPUT) TO (OUTPUT) TEST CONDITIONS Any Y CL = 0 Any Y CL = 1 pF Any SN54ASC6019 MIN TYP* MAX 0.9 0.3 2.4 0.9 1.4 Y 0.5 2 1 5 2 3 1 6 2.4 12.8 5 6.9 2.6 SN74ASC6019 MIN TYP* MAX 1 0.4 2.5 0.9 1.5 0.5 2 1 5 2 3 1 ~.4 2.2 11.6 4.4 6.3 2.3 UNIT ns ns ns/pF tpropagation delay times are m~asured from the 44% point of VI to the 44% point of Va with ti = tf = 3 ns (10% and 90%). tpLH '" propagation delay time, low-to-high-Ievel output tPHL '" propagation delay time, high-to-Iow-Ievel output .1tpLH '" change in tpLH with load capacitance .1tpHL .. change in tpHL with load capacitance 'Typical values are at VCC =5 V, TA = 25°C. DESIGN CONSIDI;RATIONS Refer to the' ASC6017 data sheet and Section 7. II 4-634 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALlAS, TEXAS 75265 SN54ASC6022. SN74ASC6022 OR·AND·NOR GATES Y .. A1.A2+[B1.B2.(C1 +C211 02939, AUGUST 1986 SystemCell™ • 2-j.lm INTERNAL STANDARD CELL logic symbol Typical Propagation Delay with 1-pF Load 3.3 ns from Any A 3 ns from Any B 3.9 ns from Any e Vee C1--..r-... C2---c.._" • Specified for Operation Over 4.5 V to 5,5 V Range of • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability B1=====L) B2 Y Vee A1-----------~--~ Range of A2-----------~___ ' FUNCTION TABLE INPUTS positive logic equation Y = Al.A2+[Bl·B2·(Cl +C2)] OUTPUT A1 A2 B1 B2 C1 C2 Y H H X X X X L X X H H H X X X H L H H X Any other combination L H description The SN54ASC6022 and SN74ASC6022 CMOS standard-cell Boolean macros are 2-wide 2-3-input sumof-products AND-NOR gates with a dedicated 2-input OR, 3-input AND product term. Two available inputs to the 3-input AND gate and two to the other 2-input AND gate provide expandability for implementing customized product terms. The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: BF022LH en CELL AREA HDL LABEL ....asas TO NA210LH Label: BF022LH A1 ,A2,B1 ,B2,C1.C2,Y: en CD CD .c RELATIVE NETLIST CELL NAME II .... 2.25 C The SN54ASC6022 is characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC6022 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER TEST CONDITIONS VT Input threshold voltage SN54ASC6022 ICC Supply current SN74ASC6022 Ci Input capacitance I I C. Equivalent power pd diSSipation capacitance PRODUCTIOI DATA documonts contain information currant as of. publication data. Products conform to :r:ifications par the terms of Taxas Instruments ne~=~~i~a{::I~~~ ~!=:~ti:: :'~D::::!\:~ not VCC ~ TYP TA ~ 25°(: 5 V, VCC - 4.5 V to 5.5 V, TA ~ MIN to MAX VI - VCC or 0, VCC - 5 V, 5 V, VCC TA - 25°C TA ~ MAX 2.2 V 282 16.9 t r - tf 25°C -III tEXAS INSTRUMENTS POST OFFICE BOX 65B012 • DALLAS, TEXAS 75265 UNIT --~------- 3 ns, nA 0.13 pF 0.54 pF Copyright © 1986, Texas Instruments Incorporated 4-635 SN64ASC6022, SN74ASC6022 OR-A~D:NOR GATES ", o\{ .. switchin~ characteristics over re~ommende~ ran!)e$ of supply voltage and operating free-air temperature (un!eSS otherwili"l)otlldl PARi\.N!ETERt tplH tPHL tpLH . FROM (INPUT) TO TEST (OUTPUT) CONDITIONS Any A Y CL ~ 0 Any A Y Any B Y CL ~ 1 pF tPHL tPLH tpHL tpLH Any B Y Any C Y tpHL ,tPLH CL CL ~ CL ~O 1 pF ~ 0 tPt-iL tPLH tpHL Y CL ~ 1 pF 4A 1.7 11.2 4.2 3.2 2.8 7.7 6.5 1.1 1.9 0.4 0.9 2.5 0.9 4.9 1.8 0.7 1.3 0.7 1.3 1.7 3.3 1.3 2.7 1.1 0.5 2.2 1.2 5A 2.9 2.5 5.2 12.2 1.1 2.5 6.5 1.4 3 6.9 atPHL 0.5 0.9 2.5 aWLH AtPHL 0.9 0.6 2 1.4 4.6 3.6 1.4 3 6.9 0.6 1.3 3.6 4tPLH . Any C SN64ASC6022 MIN, 'TVP' MAX AtPLH Any A Any'S Any C Y Y Y 4t pI-\L SN74ASC6022 MIN 1.1 OA 2.7 1 0.7 0.8 1.8 lA 1.1 0.5 2.7 1.2 1.5 0.5 TVP' MAX 1.9 4 0.9 1.7' 4.9 10.2 1.8 3.8 1.3 2.9 1.3 2.5 3.3 7 2.7 5.6 2.2 1.2 4.9 5.2 11 2.5 5.6 3 6.3 2.5 0.9 2.2 4.2 0.6 2 1.4 1.5 3 6.2 0.6 1.3 3.1 1 3.1 UNIT ns ns ns ns ns ns ns/pF ns/pF ns/pF tPrQPa~ati()n qelay times are measured from the 44% point of VI to the 44% point of Va with tr ~ tf ~ 3 ns (10% and 90%). tpLH '" proPagation delay time, low-to-high-Ievel output tpHL .. prOpagation ejelay time, high-to·low·level output AtPLH .. change in tpLH with load capacitance AtPIjL .. c~an~e in tPHL with load capacitance tTypi~arvalues are at Vce ~ 5 V, TA ~ 25°C. DESIGN CONSIDERATIONS Refer to the' ASC6017 data sheet and Section 7. 4'1536 TEXAS . " INSTRUMf.:NTS PqST OFFICE BOx 665012 • DALLAS. TEXJ\S 75265 SN54ASC6023. SN74ASC6023 OR·AND·NOR GATES V = A1 +[81·(C1 +C2)) D2939, AUGUST 1986 SystemCell™ • 2·J.lm INTERNAL STANDARD CELL logic symbol' Typical Propagation Delay with 1-pF Load 2,9 ns from A 1 2.5 ns from B1 3.2 ns from Any e Vee • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Range of FUNCTION TABLE Range of INPUTS positive logic equation Y = A1 + [B1o(C1 +C2)] OUTPUT A1 B1 C1 C2 Y H X X X L X H H X L X H X H L L L X X H L X L L H description • The SN54ASC6023 and SN74ASC6023 CMOS standard-cell Boolean macros are 2-input sum-of-products NOR gates with a dedicated 2-input OR, 2-input AND product term. One available input to the 2-input AND gate and the 2-input NOR gate provides expandability for implementing customized product terms. The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: Q) Q) .J: en CELL AREA HDL LABEL BF015LH C/) RELATIVE NETLIST CELL NAME ... TO NA210LH Label: BF015LH A1,B1,C1,C2,Y; ... ctI ctI 1.75 C The SN54ASC6023 is characterized for operation over the full military temperature range of - 55 DC to 125 DC, The SN74ASC6023 is characterized for operation from -40 DC to 85 DC. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT I,:: Cj TEST CONDITIONS Input threshold voltage c::"'nnl,, .... "rro:on-t VCC I SN54ASC6023 VCC I SN74ASC6023 TA = = = TYP 5 V, TA 4.5 V to 5.5 V, VI VCC - 5 V, TA VCC - 5 V, tr = ~ ~ 25°C tf - 3 ns, 25°C current as of publication date. Products conform to ~~~~~:~~i~ai~:1~1e ;!:~:~ti:: :'IO::~:~:t::s~S not I "' 0.13 pF 0.36 pF I Copyright © 1986, Texas Instruments Incorporated PRODUCTION DATA documents contain information specifications per the terms of Texas Instruments 218 0, UNIT V 13.1 Equivalent power TA MAX 2.2 MIN to MAX Input capacitance Cpd dissipation capacitance = 25°C = VCC or TEXAS -1.1} INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-637 SN54ASC6023, SN74ASC6023 OR·AND·NOR GATES switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) PARAMETERt tpLH tpHL tpLH tpHL tpLH tPHL tpLH tpHL tpLH tPHL tpLH tpHL v, Vee = 4.5 V to 5.5 V, ISN74Ase6055 TA = MIN to MAX TA = 25°e 15.9 Vee = 5 V, TA = 25°e Equivalent power Cpd dissipation capacitance Vee = 5 V, tr = tf = 3 ns, PRODUCTION DATA do.uments .ontein inlormation •• r....t as 01 publi.ation date. Prodoets .onfarm 10 tbase .pacillCltions l1li" tho tarms 01 Ta.a. Instrlmantl standaril warranty. Production pr.....i.g dOlI .ot n......rily include teating of all p.ramlt..... 266 VI = Vee or 0, Input capacitance ei MAX 2.2 TA = 25°e I UNIT I V nA 0.13 pF 0.51 pF Copyright © 1986, Texas Instruments Incorporated TEXAS . " INSTRUMENTS POST OFFICE BOX 665012 • DALLAS. TEXAS 75265 4-667 SN54ASC6055, SN74ASC6055 OR·NAND GATES switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) . PARAMETERt tpLH FROM (INPUT) Any tPHL tpLH tpHL Ll.tpLH Ll.tPHL Any Any TO (OUTPUT) Y Y TEST CONDITIONS CL CL = = 0 1 pF Y SN54ASC6055 SN74ASC6055 MIN TYP* MAX MIN TYP* MAX O.B 1.6 4.5 O.B 1.6 4.1 0.3 1 2.6 0.4 1 2.4 2.2 4.6 2.4 4.6 10.3 O.B 2 11.3 5.1 O.S 2 4.5 1.4 3 7 1.5 3 6.3 0.5 1 2.6 0.5 1 2.2 tPropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpLH '" propagation delay time, low-to-high-Ievel output . tpHL '" propagation delay time, high-to-Iow-Ievel output Ll.tpLH '" change in tpLH with load capacitance Ll.tpHL '" change in tpHL with load capacitance t Typical values are at VCC = 5 V, T A = 25°C. DESIGN CONSIDERATIONS II 4·668 Refer to the' ASC6017 data sheet and Section 7. TEXAS ~ IN~UMENlS POST OFFICE BOX 655012 • OA~LAS. TEXAS 75265 = tf = UNIT ns ns ns/pF 3 ns (10% and SO%). SN54ASC6056, SN74ASC6056 OR-NAND GATES V = A1.A2.(81 + 82) 02939, AUGUST 1986 SystemCelr M 2-j.lm INTERNAL STANDARD CELL logic symbol • Typical Propagation Delay with '-pF Load 2.2 ns from Any A 2.9 ns from Any B • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Vee Range of Range of FUNCTION TABLE positive logic equation Y OUTPUT INPUTS = Al.A2.(Bl +B2) V A1 A2 B1 B2 H H H X L H H X H L L X X X H X L X X H X X L L H description The SN54ASC6056 and SN74ASC6056 are 3-wide. 1-1-2-input OR-NAND gate CMOS standard-cell • functions. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: CEll NAME BF056LH ....CD fI) RELATIVE NETLIST CELL AREA HDllABEl CD .c TO NA210lH en 1.75 Label: BF056LH A 1.A2,Bl,B2.Y; ~ The SN54ASC6056 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC6056 is characterized for operation from _40DC to 85°C. ....asas o absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics VT PARAMETER Input threshold voltage ~ TA 5 V, ~ 25°C Vee - 4.5 V to 5.5 V. TA ~ MIN to MAX V, - Vee or O. Input capacitance Vee ~ 5 V. TA - 25°C Equivalent power Vee - 5 V. TA ~ 25°C ICC Supply current Il:j I SN54Ase6056 I SN74ASe6056 TVP TEST CONDITIONS Vee Cpd dissipation capacitance PRODUCTION DATA documents contain information currant as of publication date. Products conform to specifications per the terms of Texas Instruments ::=~~i~a{::1~1e ~=~~i:r l!~o:.'::::9t:~~s not -- MAX 220 13.2 tr - tf - 3 ns. UNIT V 2.2 nA 1 0 . 13 pF 0.55 pF Copyright @ 1986, Texas Instruments Incorporated TEXAS ..., INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, rEXAS 75265 4-669 SN54ASC6056, SN74ASC6056 OR-NAND GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tPLH FROM liN PUT) Any A TO (OUTPUT) Y tPHL tpLH tPHL tpLH Any A Any B y y tPHL tPLH Any B Y Any A Y tPHL ~tpLH ~tpHL ~tpLH ~tpHL Any B TEST CONDITIONS CL CL = CL CL =a 1 pF =a = 1 pF Y SN54ASC6056 TYP* MAX MIN TYP* MAX 0.6 0.9 1.6 0.6 0.9 1.5 0.7 1.2 2.4 0.7 1.2 2.2 1.1 1.9 2.5 3.8 1.2 1.9 3.5 5.9 1.4 2.5 5.1 1.4 3.2 0.9 1.4 2.9 1.3 0.8 0.4 1 2.4 0.4 1 2.2 1.8 3.4 7.7 1.9 3.4 7 1 2.3 5.9 1.1 2.3 5.1 2.1 0.5 1 2.3 0.5 1 0.6 1.3 3.5 0.6 1.3 3 0.9 2 4.6 2 4.1 0.6 1.3 3.5 1 ,0.6 1.3 3 tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpLH 5; propagation delay time, low·to-high-Ievel output tpHL a propagation delay time, high-to-Iow-Ievel output ~tpLH '" change in tpLH with load capacitance ~tpHL '" change in tpHL with load capacitance *Typical values are at VCC = 5 V, T A ' = 25°C. • DESIGN CONSIDERATIONS C m r+ m Refer to the 'ASC60 1 7 data sheet and Section 7. en ::r CD CD r+ (I) 4-670 SN74ASC6056 MIN TEXAS • INSTRUMENTS PriST OFFICE BOX 655012 • DALLAS, TEXAS 75265 = tf = UNIT ns ns ns ns ns/pF ns/pF 3 ns (10% and 90%1. SN54ASC6057. SN74ASC6057 OR·NAND GATES = A1.A2.(81 + 82 + 83) v SystemCell™ 2-Ilm INTERNAL STANDARD CELL • Typical Propagation Delay with 1-pF Load 2.8 ns from Any A 3.7 ns from Any 8 • Specified for Operation Over Vee Range of 4,5 V to 5.5 V • Functional Operation Over Vee Range of logic symbol 2Vt06V • 02939, AUGUST 1986 FUNCTION TABLE Dependable Texas Instruments Quality and Reliability INPUTS positive logic equation Y = A1·A2·(B1 +B2+B3) OUTPUT A1 A2 B1 B2 B3 H H H X X L H H X H X L Y H H X X H L L X X X X H X L X X X H X X L L L H description II ... The SN54ASC6057 and SN74ASC6057 are 3-wide, 1-1-3-input OR-NAND gate CMOS standard-cell functions. The cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: BF057LH RELATIVE NETLIST CELL NAME CI) Q) Q) .c CELL AREA HDL LABEL TO NA210LH CI) 1.75 a:J a:J Label: BF057LH A 1 ,A2,B1 ,B2,B3,Y; ... The SN54ASC6057 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6057 is characterized for operation from -40°C to 85°C. C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics TEST CONDITIONS PARAMETER I VT Input threshold voltage I ! ~~C ~:..;;:;::.; ;::..;;-;-.:;-.: SN54ASe6057 SN74ASe6057 I ej Input capacitance Equivalent power Cpd dissipation capacitance = 5 V, Vee = 4.5 V to 5.5 TA = MIN to MAX Vee = 5 V, V, Vee - 5 V, TA = TYP TA Vee VI = 25°e = Vr.r. or 0, TA = 25°e t r - tf - 3 ns, 25°e =~=~~i~at~:I~'li ~:~~:i:; :Ir::::~:~~s not UNIT I 237 14.2 I V nA 0.13 pF 0.58 pF I I Copyright © 1986. Texas Instruments Incorporated PRODUCTION DATA doc.mants contain inlormation current 88 of publication date. Products conform to spacifications per the terms of Texas Instruments MAX 2.2 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-671 SN54ASC6057. SN74ASC6057 OR-NAND GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH tpHL tpLH tpHL tpLH FROM (INPUT) Any A Any A Any 8 tpHL tpLH Any 8 TO (OUTPUT) Y Y Y Y tpHL ---- Y positive logic equation Y=A description The SN54ASC6120 and SN74ASC6120 are two internal delay buffer standard cells that provide the ASIC designer with symmetrical delay elements that can be used to implement signal path delay-line management techniques needed to ensure timing integrity. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: ....II) I/) FEATURES··CELL NAME BU120LH BU130LH REI.·\~ NETLIST TYPICAL HDL LABEL DELAY CElio AREA CL - 1 pF TO r(,\210LH 1.7 ns 1.5 ., 75 Label: BU 1 nOLH A, Y; 1,7 ns II) .c CJ) ....caca C The SN54ASC6120 is characterized for operation over the full milil:lry temperature range of - 55°C to 125°C. The SN74ASC6120 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER VT Input threshold voltage .....::.B:.::U...:1-=2-=:OL==H~t-,=B=:=U:-:1c::3:.::0-=:LH:::-:---l1 UNIT -:: TEST CONDITIONS Vee ~ Vee ~ 5 V, . .. TA ~ 25°e TA ej Input capacitance Vee - 5 V, TA - 25°e Equivalent power Vee ~ 5 V. tr Cpd dissipation capacitance TA ~ ~ 4.5 V to 5.5 V, VI MIN to MAX ~ ISN54Ase6120 lee Supply current I SN74Ase6120 ~~~~~:~~i~8[::1~1~ ~!::i~~ti:f :,iO::~:::t:~~S not 2.2 . .. .......,..... 2.2 187 Vee or 0, ~ tf ~ 3 ns. 25°e TEXAS . " INSTRUMENTS POST OFFICE BOX 655012· DALLAS, TEXAS 75265 12.9 nA 0.13 0.13 pF 1.29 1.73 pF Copyright I V 214 11.2 PRODUCTION DATA documents contain information current as of publication date. Products conform to specifications per the terms of Texas Instruments ............. © 1986, Texas Instruments Incorporated 4-745 • SN54ASC&120; SN74ASC6120 NON INVERTING DELAY BUFFERS switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) BU120LH PARAMETERt tpLH tpHL tPLH tPHL dtpLH FROM (INPUT) TO (OUTPUT) SN84ASC6120 MIN A Y CL = 0 0.4 0.8 A Y CL = 1 pF 0·7 1 TYP* 0.9 1.2 1.6 0.2 0.1 A Y PARAMETERt FROM (INPUT) TO (OUTPUT) tPLH tpHL A Y dtpHL TEST CONDITIONS MAX 2.3 2.8 1.7 3.4 3.6 0.5 0.3 1.2 0.8 SN74ASC6120 MIN 0.5 0.9 0.8 1.1 0.2 0.1 TYP* 0.9 1.2 1.6 1.7 MAX 2.1 2.6 3.1 0.5 1.1 0.7 0.3 3.3 UNIT ns ns ns/pF BU130LH tPLH tpHL dtpLH dtpHL A Y A Y TEST CONDITIONS CL CL =0 = 1 pF SN54ASC6120 MIN 0.6 SN74ASC6120 MIN 0.6 0.9 0.8 1 TYP* 1.3 1.5 1.6 1.8 MAX 2.6 3.2 3.4 3.B 0.9 0.8 1.1 0.1 0.1 0.3 0.3 0.8 0.7 0.2 0.1 TYP* 1.3 1.5 MAX 2.4 1.6 1.8 2.9 3.1 3.5 0.3 0.3 0.6 0.8 UNIT ns ns ns/pF t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tPLH " propagation delay time, low-to-high-Ievel output tpHL .. propagation delay time, hlgh-to-Iow-)evel output .6.tpLH iiii change in tpLH with load capacitance dtpHL .. change in tpHL with load capacitance Typical values are at VCC = 5 V, TA = 25°C. * DESIGN CONSIDERATIONS Refer to Section 7. 4-746 TEXAS"" INSTRUMENTS POST OFFICE BOX 656012 • OALLAS, TEXAS 76265 SN54ASC6121, SN74ASC6121 NONINVERTING 3·STATE BUFFERS WITH ACTIVE·LOW ENABLE 02939, AUGUST 1986 SystemCell™ • 2·llm INTERNAL STANDARD CELL logic symbol Choice of Two Performance Levels • Active Low Enable • Specified for Operation Over 4,5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Vee A----{>--Y Range of GZ~ Range of FUNCTION TABLE INPUTS positive logic equation Y=A OUTPUT GZ A Y L H H L L L H X Z description The SN54ASC6121 and SN74ASC6121 are noninverting 3-state internal buffer standard cells that interface internal cells with internal buses, The standard-cell library contains two physical implementations providing the custom IC designer a choice from two performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: FEATURES NETLIST HDL LABEL CELL NAME BU221LH BU261LH Label: BU2nl LH A,GZ,Y; II ... tI) TYPICAL DELAY RELATIVE CELL AREA CL - 1 pF TO NA210LH 2.3 ns 2.75 2 ns 4.75 G) G) .c en ...asas The SN54ASC6121 is characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC6121 is chara.cterized for operation from -40°C to 85°C. C absolute maximum ratings and recommended .operating conditions See Table 1 in Section 2, electrical characteristics PARAMETER TEST CONDITIONS I v~ __I_n_p~u_t_t_hr_e_sh_o_ld_v_oTlt~a~ge07~~~-r-,v7c~c~--.5.V~'77~~~7T~A~-~2_5_0~C__~_T-1_2_._2__~~r-_2_.2__~~;-!__V__~ lee Supply current Ci SN54Ase6121 Vee - 4.5 V to 5.5 V, VI - Vee or 0, 328 562 SN74Ase6121 TA = MIN to MAX 19.7 33.7 A Input capacitance rG:':Z:--------I Equivalent power Cpd dissipation capacitance 8. Vee = 5 V, tr - tf - 3 ns, ~:c'!=~i~.{::,~l~ ~=:~i:; lI~D::;::A!~~ not 0.28 0.32 0.28 1.62 3.29 nA pF pF Copyright © 1986, Texas Instruments Incorporated PRODUCTION DATA documonts contain information currant of publication data. Praducts conform to specifications par the terms of Taxas Instrumants 0.14 TEXAS • INSTRUMENTS POST OFFICE t!OX 655012 • DALLAS, TEXAS 75265 4-747 SN54ASC6121, SN74ASC6121 NONINVERTING 3·STATE BUFFERS WITH ACTIVE· LOW ENABLE switching characteristics over recommended ranges of supply voltage and operating free·air temperature (unless otherwise noted) BU221LH PARAMETERt tpLH tpHL tpLH tpHL TO TEST (OUTPUTI CONDITIONS A Y A Y tpZH GZ Y tpZL GZ y tPHZ GZ y tpLZ GZ y A.tpLH t.tpHL A.tPZH A.tpZL • FROM (lNPUTI A Y GZ Y CL SN54ASC6121 =0 = 1 pF CL CL - 1 pF, RL = 40klltoGND RL = 20 kll to VCC MAX MIN TYP* MAX 0.6 3.6 0.7 1.5 3.2 1 1.6 3.4 1.6 3.1 RL = 20 kll to VCC 1.1 2.5 5.8 2.5 5.3 2.1 4.6 1.2 2.1 4.2 0.7 1.4 2.9 0.7 1.4 2.7 ns 1 1.6 3.4 1 1.6 3.1 ns 10 GND 1 pF, CL ns 1.2 CL - 1 pF, = 40 kll to UNIT 1 1.2 CL - 1 pF, RL SN74ASC6121 TYP* 1.5 MIN 10 5.3 ns ns 5.3 ns 0.5 1 2.3 0.5 1 2.1 0.2 0.0 1.3 0.2 0.5 1.1 0.5 0.9 2.2 0.2 0.5 1.3 0.5 0.2 0.9 0.5 2 1.2 nsipF SN74ASC6121 TVP; MAX UNIT nsipF BU261LH o PARAMETERt ~ tpLH tpHL en tpLH :r tpHL CD CD ....tn FROM to TEST (lNPUTI (OUTPUT) CONDITIONS Y A Y CL CL - 1 pF, tpZH GZ y tpZL GZ y tPHZ GZ y tpLZ GZ Y A.tpLH A.tpHL A.tpZH A.tpZL =0 A A y GZ y CL = 1 pF RL = 40klltoGND RL = 20klltoVCC CL - 1 pF, SN54ASC6121 MIN TYP* MAX MIN 0.7 1.5 3.3 1.2 2 4.1 0.8 1.2 = 40 kll to GND RL = 20 kll to V CC CL 2.9 2 3.8 ns 0.8 1.7 3.8 0.9 1.7 3.4 1.3 2.2 4.6 1.3 2.2 4.2 1.2 2.2 4.8 1.2 2.2 4.3 ns 1.1 2 4.4 1.1 2 4 ns CL - 1 pF, RL 1.5 1 pF, ns 16 16 ns 7.4 7.4 ns 0.1 0.1 0.2 0.5 0.1 0.2 0.5 0.2 0.6 0.1 0.1 0.2 0.5 0.1 0.2 . 0.2 0.5 0.5 0.1 0.2 0.7 0.1 0.2 0.6 nsipF nsipF tPropagation delay times are measured from,the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpLH '" propagation delay time, low-to-high-Ievel output A.tPLH '" change in tpLH with load capacitance A.tpHL '" change in tpHL with load capacitance tpHL '" propagation delay time, high-to-Iow-Ievel output tpZH .. output enable time to high level A.tpZH '" change in A.tpZH with load capacitance tpZL '" output enable time to low level A.tpZL '" change in A.tpZL with load capacitance tpHZ '" output disable time from high level tPLZ '" output disable time from low level Typical values are at VCC = 5 V, TA = 25°C. * DESIGN CONSIDERATIONS Refer to Section 7. 4-748 TEXAS . " ,INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC6122. SN74ASC6122 NONINVERTING 3-STATE BUFFERS WITH ACTIVE-HIGH ENABLE 02939, AUGUST 1986 SystemCell™ 2-jlm INTERNAL STANDARD CELL • Choice of Two Performance Levels • Active-High Enable • Specified for Operation Over VCC Range of 4.5 V to 5.5 V • Functional Operation Over VCC Range of 2Vt06V • logic symbol :=S>-y FUNCTION TABLE Dependable Texas Instruments Quality and Reliability INPUTS positive logic equation Y=A OUTPUT G A Y H H H H L L L X Z description The SN54ASC6122 and SN74ASC6122 are noninverting 3-state internal buffer standard cells that interface internal cells with internal buses. The standard-cell library contains two physical implementations providing the custom IC designer a choice from two performance levels for optimizing designs. Each option is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: ... FEATURES CELL NAME BU222LH BU262LH U) NETLIST TYPICAL RELATIVE HDL LABEL DELAY CELL AREA CL - 1 pF TO NA210LH 2.3 ns 2.75 2 ns 4.75 Label: BU2n2LH A,G,Y: II Q) Q) .s= (/) ... ftS ftS The SN54ASC6122 is characterized for operation over the full military temper\lture range of - 55°C to 125°C. The SN74ASC6122 is characterized for operation from -40°C to 85°C . C . absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER • I ......... "'''''UL LIII"'~I'UI"" " ....... , .. ""l;t ... lee Supply current "l.l. ~ TYP -- ..,r:-n,... ..-,' ... '" '''' _.~ ~ ~ ~ ISN54Ase6122 vee = 4.5 V to 5.5 V, VI = Vee or 0, 328 562 I SN74ASe6122 TA = MIN to MAX 19.7 33.7 Input capacitance Vee - 5 V, TA - 25°e Equivalent power Cpd dissipation capacitance Vee = 5 V, tr = tf = 3 ns, ej I BU262LH MAX I TYP MAX BU222LH TEST CONDITIONS TA = 25°e PRODUCTION DATA documonts cont.in information currant .s .1 public.tion data. Products c••form to spacifications par the terms of rexas Instruments ::=:~~a[::,-::18 ~!:~:~ti:; :.r::::::~::.~ not UNIT " nA 0.14 0.28 pF 1.62 3.3 pF Copyright © 1986, Texas Instruments Incorporated" TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-749 SN54ASC6122. SN74ASC6122 NONINVERTING 3·STATE BUFFERS WITH ACTIVE·HIGH ENABLE switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) BU222LH PARAMETERt tpLH tpHL tpLH tpHL tpZH tpZL tPHZ tpLZ AtPLH AtpHL II AtpZH AtpZL FROM TO TEST (INPUT) (OUTPUT) CONDITIONS A V G v G G G A 1.6 1.5 2.6 5.9 1.2 2.6 5.3 1.2 2 4.5 1.2 2 4.1 CL - 1 pF, = 40 kO to G ND 0.8 1.8 4.2 0.9 1.8 3.8 CL - 1 pF, RL = 20 kO to V CC 0.4 1.1 2.5 0.4 1.1 2.3 RL = = = 0 1 pF 0.6 1 pF, 11 40 kO to GND CL - 1 pF, RL = FROM (INPUT) TO (OUTPUT) A V 0.5 1 0.2 0.4 0.4 3 11 4.5 20 kO to V CC Y y MAX 0.7 1 CL G TYP* 3.6 3.3 RL V SN74ASC6122 MIN 1.6 1.5 CL V MAX 1 1.1 = CL V TYP* 3.3 V A SN54ASC6122 MIN UNIT ns ns ns ns ns ns 4.5 2.1 2.3 0.5 1 0.5 1.3 0.2 0.5 1.1 1.1 2.4 0.5 1.1 2.2 0.6 1.3 0.4 0.6 1.1 SN54ASC6122 MAX TYP* MIN nsipF nsipF BU262LH PARAMETERt tpLH tpHL tpLH tpHL tPZH A Y G V tpZL G y tpHZ G V tpLZ AtpLH AtPHL AtpZH AtpZL G V A Y G y TEST CONDITIONS CL = 0 CL = 1 pF C..: = 1 pF, RL = 40kOtoGND C~ - 1 pF, RL = 20 kO to V CC CL - 1 pF, RL = MIN 0.7 1.5 3.3 0.8 1.5 3 1.2 2 4.1 1.2 2 3.8 0.8 1.7 3.8 0.9 1.7 3.4 1.3 2.2 4.6 1.3 2.2 4.2 0.6 1.5 3.4 0.7 1.5 3 0.9 2.3 5.6 1 2.3 5 40 kO to GND CL - 1 pF, RL = SN74ASC6122 MAX TYP* 20 kO to V CC UNIT ns ns ns ns 16 16 ns 8 8 ns 0.1 0.2 0.5 0.1 0.2 0.5 0.1 0.2 0.6 0.1 0.2 0.5 0.1 0.2 0.6 0.1 0.2 0.5 0.1 0.2 0.7 0.1 0.2 0.6 nsipF nsipF tpropagation delay times are measured from the 44% point of VI to the 44% point of Va with tr = tf = ,3 ns (10% and 90%1. AtpLH '" change in tpLH with load capacitance tPLH '" propagation delay time, low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output AtpHL '" change in tpHL with load capacitance tpZH '" output enable time to high level AtpZH '" change in AtpZH with load capacitance tpZL '" output enable time to low level AtPZL '" change in AtpZL with load capacitance tpHZ '" output disable time from high level tpLZ '" output disable time from low level *Typical values are at VCC = 5 V, TA = 25°C. 4-750 TEXAS . . INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 SN54ASC6125, SN74ASC6125 OoTYPE LATCHES WITH ACTIVE-LOW ENABLE 02939, AUGUST 1986 SystemCell™ 2-/lm HARDWIRED MACRO CELL • Provides Complementary Q and QZ Outputs • Transparent When Enable Is Low • Implements Control/Status Registers • Parallel Latches to Implement Wide Word Widths logic symbol t Jt=: :~ ..'_CD_l_ _ _ t This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. description The SN54ASC6125 and SN74ASC6125 are dedicated, hardwired standard-cell macros implementing bistable latches. The 'ASC6125 latches provide an active-low enable, C, with a transparent storage element to embed in ASICs in its most efficient form, The 'ASC6125 latches implement identical function and sequential operation to one-fourth of the 'LS75 packaged latches except the' ASC125 enable is active-low and available on each individual latch. FUNCTION TABLE INPUTS OUTPUT 0 L C Q OZ L L H H X L H L H 00 OZO Information present at the data (0) input is transferred to the Q output when the enable input is low, and the Q output will follow the data input as long as enable remains low. When enable goes high, the data (that was present at the data input at the time the transition occurred) are retained at the Q output until the enable is again taken low. The cells are designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: RELATIVE NETLIST CELL NAME TO NA210LH Label: LALnOLH D,C,a,az; LAL20LH CI) Q) Q) .s:::: en ....caca CELL AREA HDL LABEL II .. C 4.25 The SN54ASC6125 is characterized for operation over the full military temperature range of - 55°C to '125°C. The SN74ASC6125 is characterized for operation from -40°C to 85°C. absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. timing requirements over recommended ranges of supply voltage and operating free-air temperature .. \Uliitliii:.:. .. . U'lla.vv.~'CJ IIUL'CiiUI MIN tw Pulse duration tsu Setup th Hold time tim~ I C low 0 high or low 9 10.8 I 0 high or low 0 I PRODUCTION DATA documents contain informadon currant IS of publication data. Products conform to specifications par tha terms of Taxas Instrumants :::::i;·i~r:I~~~ ~:~::i:: :.r:=::::~::.~ nat MAX UNIT ns Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 4-751 SN64ASC6126, SN74ASC6125 O·TYPE LATCHES WITH ACTIVE· LOW ENABLE electrical characteristics PARAMETER VT Input threshold voltage ICC Supply current ei epd SN54ASC6125 TEST CONDITIONS Input Capacitance I TYP TA e Equivalent power dissipation capacitance = Vee TA 5 V, Vee = 5 V, TA = 25°C tr = 3 ns, 30.3 0.27 0.27 0.28 0.28 4.68 4.68 UNIT V 505 25°C = tf = MAX 2.2 MIN to MAX = TYP 2.2 TA - 25°C Vee - 5 V, Vee - 4.5 V to 5.5 V, VI - Vee or 0, 0 SN74ASC6125 MAX nA pF pF switching characteristics over recommended ranges of supply volatge and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH tpHL tpLH tpHL tpLH II tpHL tPLH tpHL tpLH tpHL tpLH tPHL tpLH tpHL tpLH tpHL .:1tpLH .:1tpHL FROM (INPUT) TO TEST (OUTPUTI CONDITIONS 0 Q 0 QZ CL e Q e QZ 0 Q 0 QZ eL e Q e QZ Any =0 = 1 pF Q,QZ SN54ASC6125 MIN SN74ASC6125 MAX MIN 10.7 1.9 TYP* 4.2 MAX 1.8 TYP* 4.2 1.3 2.5 5.9 1.4 2.5 5.3 9.5 2 4 10 2.1 4 8.9 1.1 2.8 6.9 1.2 2.8 6.2 2.1 4 9.4 2.2 4 8.4 1.5 2.6 5.7 1.6 2.6 5.2 2.1 4.1 9.7 2.3 4.1 8.7 1.5 2.5 5.8 1.6 2.5 5.2 2 4.7 11.8 2.2 4.7 10.5 1.5 7 2.2 3 4:5 11.1 1.6 2.4 3 4.5 6.3 9.9 1.3 3.2 3.2 7.2 4.5 8 10.5 1.5 2.3 2.4 4.5 9.4 1.7 3 6.8 1.8 3 6.2 2.4 4.6 10.8 2.5 4.6 9.6 1.7 6.9 1.1 1.8 0.2 3 0.2 3 0.5 0.5 6.2 1 0.1 0.5 1.1 0.2 0.5 1 UNIT ns ns ns ns ns ns ns ns nsipF tpropagation delay times are measured from the 44% point of VI to the 44% pOint of Vo with tr = tf = 3 ns (10% and 90%1. tpLH .. propagation delay time, low-to-high·level output tPHL '" propagation delay time, high-to-Iow-Ievel output .:1tpLH '" change in tpLH with load capacitance .:1tpHL '" change in tPHL with load capacitance Typical values are at Vee = 5 V. TA = 25°C. * 4-752 TEXAS • INSTRUMENTS POST OFFICE BOX 656012 • DALLAS, TEXAS 75265 SN54ASC6125, SN74ASC6125 O·TVPE LATCHES WITH ACTIVE·LOW ENABLE DESIGN CONSIDERATIONS interfacing the macro Inputs and outputs of these dedicated macros are compatible for interfacing directly with cells and macros available in the TI standard cell library. The inputs can be driven by either noninverting or inverting input cells. The outputs can be interfaced to drive off-chip loads with any of the noninverting output buffers or interfaced to external bidirectional buses through a 3-state input/output TTL/CMOS buffer. designing for testability Designers employing storage or bistable elements should consider testability of the design in its final form. The need to preset or clear these elements should be assessed throughout the development of custom logic circuits with these considerations extended to the end equipment application with respect to maintainability. Simple actions on the part of the ASIC designer can result in considerable cost savings, allowing the expense of IC testing, system testing, and system maintenance to be reduced significantly. power-up clear/preset Standard cell storage elements containing the capability to be asynchronously preset or cleared may be connected to the SN54ASC2320 or SN74ASC2320 power-up clear cell to achieve system initialization. Control of the clear or preset inputs from another system signal in conjunction with the power-up clear can be achieved with an AND gate. II ... en Q) Q) .t: U) ...caca C TEXAS .." INSTRUMENTS , POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-753 • c Q) r+ Q) en ':r CD CD r+ en 4-754 SN54ASC6130, SN74ASC6130 5-INPUT POSITIVE-OR GATES D2939, AUGUST 1986 SystemCell™ 2-l-Im INTERNAL STANDARD CELL • 3.4 ns Typical Propagation Delay With 1-pF Load • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Vee logic symbol t Range of Range of tThis symbol is in accordance with ANSI/IEEE Std 91-1984 and lEe Publication 617-12. positive logic equation FUNCTION TABLE Y = A+B+C+D+E INPUTS OUTPUT A B C D E Y H X X X X H description The SN54ASC6130 and SN74ASC6130 are 5-input positive-OR gate CMOS standard cells. Each cell is designated and called from the engineering workstation input using the following cell names to develop labels for the design netlist: X H X X X H X X X H X X X H X X H H X X X X H H L L L L L L II ... II) CD CD FEATURES NETLIST CELL NAME TYPICAL DELAY CELL AREA (J) CL - 1 pF TO NA210LH 3.4 ns 2.25 CO CO HDL LABEL OR510LH .c RELATIVE Label: OR510LH A,B,e,D,E,Y; ... The SN54ASC6130 is characterized for operation over the full military temperature range of - 55°C to 125°C, The SN74ASC6130 is characterized for operation from -40°C to 85°C, C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics Input threshold voltage ! lee Supply current ej ~pd I C::~~511.A_~~,=~~~ TYP TEST CONDITIONS PARAMETER I VT ! I SN74Ase6130 ."... TA = ~ - ... ,.. ...... w " po ...... ............ v, MIN to MAX Input capacitance Vee = 5 V, Equivalent power Vee - 5 V, dissipation capacitance TA = 25°e "' - ·v·(;C :=ir,a[::I~'li ~~":\:~~r :.\o=:::~:;.~ not UI MAX UNIT V 2.2 v, LOO 15.3 TA - 25°e tr - tf - 3 ns, PRODUCTIOII DATA documents conloln 'info,motion currant as of publi.ation dall!. P'oducts conform to spacificltiaDS per tha terms of Taxas Instrumanli I TA - 25°e Vee - 5 V, nA 0.11 pF 1.11 pF Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-755 SN54ASC6130, SN14ASC61.30 5-INPUT POSITIVE-OR GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH tpHL tpLH tPHL dtpLH dtpHL FROM UN PUT) A thru E A thru E A thru E TO (OUTPUT) SN54ASC6130 TEST CONDITIONS Y CL = 0 CL = 1 pF Y Y SN74ASC6130 MAX MIN TYP* MAX 0.9 TYP* 1.8 4 1 1.8 3.6 1.4 3.1 9.1 1.4 3.1 8.2 1.4 6.3 1.5 2.8 5.7 1.7 2.8 4 11.3 1.9 4 0.4 1 2.4 0.5 1 10 2.2 0.3 0.9 2.2 0.4 0.9 1.9 MIN tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr tpLH '" propagation delay time. 10w-!0-highClevel output tpHL '" propagation delay time. high-to-Iow-Ie"el output 4tpLH = change in tplH with load capacitance dtpHL '" change in tpHL with load capacitance Typical values are at VCC = 5 V. TA = 25°C. = tf = UNIT ns ns ns/pF 3 ns (10% and 90%). * DESIGN CONSIDERATIONS II 4-756 Refer to Section 7. All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. TEXAS • INSTRUMENTS POST OFFICE aox 655012 • DALLAS. TEXAS 76265 SN54ASC6131, SN74ASC6131 8-INPUT POSITIVE-OR GATES D2939. AUGUST 1986 SystemCell™ 2-/Am INTERNAL STANDARD CELL • 3.3 ns Typical Propagation Delay with '-pF Load • Specified for Operation Over 4.5 V to 5.5 V • Functional Operation Over 2Vt06V • Dependable Texas Instruments Quality and Reliability Vee Vee logic symbol Range of Range of FUNCTION TABLE positive logic equation = Y INPUTS A B C 0 ABCDEFGH A+B+C+D+E+F+G+H description The SN54ASC6131 and SN74ASC6131 are 8-input positive-OR gate CMOS standard cells. Each cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: OUTPUTS E F G H Y H X X X X X X X H X X X X X X X H X X X X X X H H X X X X X H X X X X X H X X X X H X X X X H X X X H X H X X X X H X X X X H H H l l l l X X X X X X L l l l II ... H l rn NETLIST CELL NAME OR810lH Q) Q) FEATURES TYPICAL RELATIVE HDL LABEL label: OR810lH A.8.C.D.E.F.G,H,Y; DELAY CELL AREA CL - 1 pF 3.3 ns TO NA210lH J:. en ...caca 3.25 The SN54ASC6131 is characterized for operation over the full military temperature range of - 55°C to 125°C. The SN74ASC6131 is characterized for operation from -40°C to 85°C. C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics VT PARAMETER Input threshold voltage lec Supply current Cj Cpd TEST CONDITIONS VCC Vee -;-A - = 5 V, = 4.5 V Input capacitance Vee = Equivalent power Vec - 5 V, TA = 25°e 1 SN54ASC6131 ... , . , ....." ................ , ...... ,~" A ................ ~ dissipation capacitance PRODUCTION DATA documents contein information currant 8S of publication date. Products conform to specifications par the terms of Taxas Instruments =~~i~Bi~=i =:~:r :.~o::::::9t:~~ not :v~;;~ LU TYP TA - 25°C to 5.5 V, VI = Vee UNIT V 384 or 0, ;V~M~ 5 V, MAX 2.2 nA ~".I TA = 25°e t r - tf - 3 ns, -iii INSTRUMENTS TEXAS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 0.11 pF 1.16 pF Copyright © 1986. Texas Instruments Incorporated 4-757 SN54ASC6131, SN74ASC6131 8-INPUT POSITIVE-OR GATES switching characteristics over recommended ranges of operating free-air temperature and supply voltage (unless otherwise noted) PARAMETERt tpLH tpHL tpLH tpHL dtpLH dtpHL TEST FROM (INPUT) TO (OUTPUT) CONDITIONS A thru H Y CL = 0 A thru H Y A thru H Y CL = 1 pF SN54ASC6131 SN74ASC6131 MAX MIN 0.8 TYP* 1.7 3.9 1.3 2.9 7.4 1.3 2.7 6.1 1.8 3.9 0.4 0.4 MIN TYP* MAX 0.8 1.7 3.5 1.4 2.9 6.6 2.7 5.5 10.2 1.4 1.9 3.9 9 1 2.3 0.5 1 2.1 1 2.8 0.5 1 2.4 UNIT ns ns nsipF tpropagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns (10% and 90%). tpLH " propagation delay time. low-to-high-Ievel output tpHL '" propagation delay time, high-to-Iow-Ievel output .6.tPLH 5" change in tPLH with load capacitance dtpHL " change in tpHL with load capacitance Typical values are at VCC = 5 V, TA =25°C. * DESIGN CONSIDERATIONS II o I» Refer to Section 7. All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design. A tie-off cell is offered specifically for managing unused inputs. .... I» C/) ::T CD CD .... (I) 4-758 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXA..S 75265 SN54ASC6132, SN74ASC6132 8-INPUT POSITIVE-AND GATES D2939, AUGUST 1986 SystemCell™ 2-",m INTERNAL STANDARD CELL logic symbol • 3.4 ns Typical Propagation Delay • Specified for Operation Over Vee Range of 4.5 V to 5.5 V A B C • • Functional Operation Over Vee Range of 2Vt06V D Y E--"'L._"" Dependable Texas Instruments Quality and Reliability F G H positive logic equations = ABC Y D EFGH =-~~~~~~-= = A+B+C+D+E+F+G+H FUNCTION TABLE INPUTS description The SN54ASC6132 and SN74ASC6132 are 8-input positive-AND gate CMOS standard cells. Each cell is designated and called from the engineering workstation input using the following cell name to develop labels for the design netlist: OUTPUT A B C D E F G H Y H H H H H H H H H Any other combination l • FEATURES NETLIST HDllABEl TYPICAL DELAY Label: AN810LH A,B,e,D,E,F,G,H,Y; 3.4 ns CEll NAME AN810LH Cl - 1 pF .... U) RELATIVE Q) Q) CEll AREA .c TO NA210lH til 3.25 The SN54ASC6132 is characterized for operation over the full military temperature range of - 55 DC to 125 DC. The SN74ASC6132 is characterized for operation from _40DC to 85 DC. ....caca C absolute maximum ratings and recommended operating conditions See Table 1 in Section 2. electrical characteristics PARAMETER Input threshold voltage TEST CONDITIONS TYP 2.2 ICC Supply current C; Input capacitance TA = 25°C Vce = 5 V, VCC - 4.5 V to 5.5 V, VI - VCC or 0, TA = MIN to MAX Vr-,.. = 5 V. Til = 'nor. Equivalent power VCC - 5 V, dissipation capacitance TA VT Cpd LSN54ASC6132 I SN74ASC6132 PRODUCTION DATA documant. contain information currant a. of publication date. Products conform to 'SPIIclficatians per the terms of Taxal Instruments :=:~~i;8i:I~7e ~!=::i~n lIID::;::::':~~ not = t r - tf - 3 ns, 25°C MAX V 403 24.2 n UNIT nA 1~ ~~ 1.22 pF Copyright © 1986, Texas Instruments Incorporated TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 4-759 SN54ASC6132, SN74ASC6132 a·INPUT POSITIVE·AND GATES switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETERt tpLH tpHL tpLH tpHL AtpLH AtPHL FROM (INPUT) A thru H A thru H A thru H TO (OUTPUT) Y Y TEST CONDITIONS CL = 0 CL = 1 pF Y SN54ASC6132 Typt MAX MIN 0.9 2.2 5.3 0.8 1.9 3.9 1.9 4.2 9.8 1.1 2.5 5.4 0.9 2 4.6 0.2 0.6 1.6 SN74ASC6132 Typt MAX MIN 1 0.8 2.2 4.7 1.9 3.6 2 1.1 1 0.3 4.2 8.8 2.5 4.9 2 4.2 0.6 1.4 UNIT ns ns ns/pF t Propagation delay times are measured from the 44% point of VI to the 44% point of Vo with tr = tf = 3 ns 110% and 90%). tPLH '" propagation delay time, low-to-high-Ievel output tPHL '" propagation delay time, high-to-Iow-Ievel output AtPLH '" change in tpLH with load capacitance AtpHL '" change in tpHL with load capacitance iTypical values are at VCC = 5 V, TA =25°C. DESIGN CONSIDERATIONS • Refer to Section 7 . All inputs to this cell must be accounted for in the netlist used to generate the next level of an ASIC design, A tie-off cell is offered specifically for managing unused inputs. C DI pot. DI en ::r CD CD pot. til 4-760 TEXAS • INSTRUMENTS POST OFFICE BOX 655012 .. DALLAS. TEXAS 75265 Military 5-1 5-2 TEXAS INSTRUMENTS MILITARY-QUALIFIED STANDARD CELL PRODUCTS The System Cell"' product family offered by Texas Instruments has been designed to operate over the full military temperature range of - 55 DC to + 125 DC. All cells have been characterized for this extended temperature range performance and the military TI software library contains this information, allowing for engineering workstation simulation at both temperature extremes. For military and other high-reliability applications, these standard cells are manufaCtured in compliance with the requirements of JEDEC Publication 111 (JEDEC's rewrite of Method 50; 0 of MIL-STD-883). When required, full qualification processing is available in accordance with the standards set forth in MIL-STD-883. • The extensive Texas Instruments military semiconductor experience and resources are utilized to supply high-reliability military-qualified standard cell devices. All wafers are processed in facilities that have DESCcertified product flows. Prototypes are available in JEDEC-Standard ceramic packages and may be supplied after testing over the full military temperature range. When production devices are required, TI offers complete capabilities to fabricate, assemble, and test standard cell devices within the continental United States, allowing for compliance with complete-domestic program requirements. TI's offshore production facilities are also available to provide cost-effective military-processed devices. MILITARY HIGH-RELIABILITY STANDARD CELL INTEGRATED CIRCUITS The Texas Instruments military standard cell program offers several production options designed to meet system cost, reliability, leadtime, and contract requirements. The following are the key features of the options available for MIL-M-3851 0 and MIL-STD-883 Class B applications and can be produced either onor offshore. MIL-STD-883, Level B Screening • • • • • Produced under MIL-STD-883 guidelines with all chips manufactured in facilities with DESC-certified product flows All production devices assembled and tested in a certified facility Fully tested as per MIL-STD-883 Method 5004/5005 Electrical specification limits to be jointly agreed upon by the customer and TI Each lot shipment includes a Certificate of Conformance and Group A summary report 883/JEDEC Custom/Semicustom Screening • • • • • Produced under MIL-STD-883 guidelines with all chips manufactured in facilities with DESC-certified product flows All production devices assembled and tested in a certified facility Fully tested as per MIL-STD-883 Method 5010 or JEDEC Publication 111 Electrical specification limits to be jointly agreed upon by the customer and TI • ~ CO :i :2: Each lot shipment includes a Certificate of Conformance and Group A summary report TEXAS • INSTRUMENTS fJOST OFFICE BOX 655012 • DALLAS, TEXAS 76265 5-3 MILITARY SCRE!=NING AND LOT CONFORMANCE-CLASS B. SCREEN METHOD REQUIREMENT METHOD METHOD 5010 or 5004/5005 JEDEC 111 Internal Visual (Precap) 2010, Note 1 100% Backside· Symbol Diffusion lot identified by code year and week of seal 100% 100% Stabilization Bake 1008,24 Hr Min, 150°C Max, Condition C 100% 100% Temperature Cycle 1010, Condition C, Note 1 100% 100% COl1stant Acceleration 2001, V1 Only, Condition E, Note 2 100% 100% Overvoltage Test 100% As per device specification at manufacturer's option, may.be performed at Probe, Note 1 100% 100% As per device specification, 25°C 100% Burn-In 1015, 160 Hr at 125°C (Min). Condition A, Note 5 100% 100% 100% Post-Bum-In Test As per deyice specification, 25 oCr DC 100% 100% 100% 100% Pre-Burn-In Test Final Electrical Test Seal (A) Fine As per device specification, - 55°C, 125°C; and 25°C switching (BI Gross 1014, Note 2 Condition B Limit = 5 x 10 - 8 Condition C Quality Conformance 5005, Class B 100% 100% LTf>D (Note 6) Inspection Group A (Note 4) (A) Static (Subgroup 1) 2 3 (B) Switching 25°C (Subgroups 2 and 3) (Subgroup 9) (C) Functional 25°C (Subgroup 7) 2 5 Customer Customer (1) 25°C (2) Temp • Groups B, C, D, and E 2 (Note 3) Option , 5 7 5 Option (Note 7) S -. ;-< 5-4 External Visual Inspection NOTES: 100% 2009 100% 1. Overvoltage test conditions. limits, and application will be identified by Texas Instruments upon compleiion of design characterization and will apply when the alternate screening procedure of Method 5004, Paragraph 3.3, is performed. 2. For device packages with 84 pins or less. For" larger pa~kages, test condition may require modification. 3. Available options depend on package type and size. Details of Groups B, C, D, and E testing and sampling plan to be negotiated. 4. If lot size is too small to meet LTPD requirements, 100% testing is acceptable. 5. T A may need to be reduced to prevent "maximurT! junction temperature from being exceeded. 6. Group A may be performed on QA in-line monitor program. 7. Extensive use of process control and test circuits for reduced cost. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • OAi..L~S, TEXAS 75265 IEEE Symbols -6-1 m m m (J) -< 3 co 'fij 6-2 Explanation of Logic Symbols F. A. Mann Contents Title 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10.0 INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . SYMBOL COMPOSITION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . QUALIFYING SYMBOLS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.1 General Qualifying Symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.2 Qualifying Symbols for Inputs and Outputs . . . . . . . . . . . . . . . . . . . . . . . 3.3 Symbols Inside the Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . DEPENDENCY NOTATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.1 General Explanation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.2 G, AND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.3 Conventions for the Application of Dependency Notation in General .... 4.4 V, OR . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.5 N, Negate (Exclusive-OR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.6 Z, Interconnection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.7 X, Transmission . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.8 C, Control ............' . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.9 S, Set and R, Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.10 EN, Enable . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.11 M, Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.1 2 A, Address . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BISTABLE ELEMENTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CODERS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . USE OF A CODER TO PRODUCE AFFECTING INPUTS . . . . . . . . . . . . . . . . . . . . USE OF BINARY GROUPING TO PRODUCE AFFECTING INPUTS ............ SEQUENCE OF INPUT LABELS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . SEQUENCE OF OUTPUT LABELS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Page 6-5 6-5 6-7 6-7 6-7 6-11 6-11 6-11 6-12 6-13 6-14 6-14 6-15 6-16 6-17 6-18 6-18 6-19 6-21 6-23 6-24 6-26 6-26 6-27 6-28 en '0 .a E > tn W W W If you have questions on this Explanation of Logic Symbols, please contact: Texas Instruments Incorporated F.A. Mann, MS 49 P.O. Box 655012 Dallas, Texas 75265 IEEE Standards may be purchased from: Institute of Electrical and Electronics Engineers, Inc. IEEE Standards Office 345 East 47th Street New York, N.Y. 10017 ... I __ .... _~ ... _ _ L._: r-,... \ __ I ,... _ _ _ : __ : _ _ I I ••. , .............. , ... , . . . . . . . . , ..................................... ' ......... ' •• , ••• ,;,.;,0."" •• , ......... , I _ ... _~ _ _ ... : _ _ _ I Telephone (214) 995-2659 • publications may be purchased from: American National Standards Institute, Inc. 1430 Broadway New York, N.Y. 10018 Copyright © 1984, Texas Instruments Incorporated 6-3 List of Tables Table I II III IV Title General Qualifying Symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Qualifying Symbols for Inputs and Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Symbols Inside the Outline ......................................... Summary of Dependency Notation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Page 6-8 6-9 6-10 6-23 List of Illustrations Figure 1 2 3 4 - m m m C/) '< 3 0'" o 0' 5 6 7 8 9 10 11 12 13 14 1.5 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 6-4 Title Symbol Composition ............................................. Common-Control Block. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Common-Output Element . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. G Dependency Between Inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. G Dependency Between Outputs and Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . .. G Dependency with a Dynamic Input ... ; . . . . . . . . . . . . . . . . . . . . . . . . . . . .. ORed Affecting Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Substitution for Numbers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. V (OR) Dependency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. N (Negate/Exclusive-OR) Dependency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Z (Interconnection) Dependency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. X (Transmission) Dependency. . . . . ... . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. CMOS Transmission Gate Symbol and Schematic . . . . . . . . . . . . . . . . . . . . . . .. Analog Data Selector (Multiplexer/Demultiplexer) . . . . . . . . . . . . . . . . . . . . . . . .. C (Control) Dependency . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . .. S (Set) and R (Reset) Dependencies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. EN (Enable) Dependency ........................................... M (Mode) Dependency Affecting Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Type of Output Determined by Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. An Output of the Common-Control Block . . . . . . . . . . . . . .. . . . . . . . . . . . . . .. Determining an Output's Function ................................... Dependent Relationships Affected by Mode ............................ A (Address) Dependency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. AFray of 16 Sections of Four Transparent Latches with 3-State Outputs Comprising a 16~Word x 4-Bit Random-Access Memory. . . . . . . . . . . . . . . . . .. Four Types of Bistable Circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Coder .General Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. An X/V Code Converter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. An X/Octal Code Converter ........ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Producing Various Types of Dependencies ............................. Producing One Type of Dependency. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Use of Binary Grouping Symbol ..................................... Input Labels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Factoring Input Labels .... ~ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Placement of 3-State Symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Output Labels .................................................. Factoring Output Labels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. Page 6-6 6-6 6-7 6-12 6-13 6-13 6-13 6-14 6-14 6-1 5 6-1 5 6-16 6-16 6-16 6-17 6-18 6-19 6-20 6-20 6-21 6-21 6-21 6-22 6-23 6-24 6-24 6-25 6-26 6-26 6-26 6-27 6-27 6-28 6-28 6-28 6-29 1.0 INTRODUCTION The International Electrotechilical Commission (lEC) has been developing a very powerful symbolic language that can show the relationship of each input of a digital logic circuit to each output without showing explicitly the internal logic. At the heart of the system is dependency notation, which will be explained in Section 4. The system was introduced in the USA in a rudimentary form in IEEE/ANSI Standard Y32. 14-1973. Lacking at that time a complete development of dependency notation, it offered little more than a substitution of rectangular shapes for the familiar distinctive shapes for representing the basic functions of AND, OR, negation, etc. This is no longer the case. Internationally, Working Group 2 of IEC Technical Committee TC-3 has prepared a new document. (Publication 61 7 -1 2) that consolidates the original work started in the mid 1960's and published in 1972 (Publication 117-15) and the amendments and supplements that have followed. Similarly for the USA, IEEE Committee see 11.9 has revised the publication IEEE Std 91/ANSI Y32.14. Now numbered simply IEEE Std 91-1984, the IEEE standard contains all of the lEe work that has been approved, and also a small amount of material sti!1 under international consideration. Texas Instruments is participating in the work of both organizations and this document introduces new logic symbols in accordance with the neW standards. When changes are made as the standards develop, future editions will take those changes into account. tn "0 The following explanation of the new symbolic language is necessarily brief and greatly condensed from what the standards publications now contain. This is not intended· to be sufficient for those people who will be developing symbols for new devices. It is primarily intended to make possible the understanding of the symbols used in various data books and the comparison of the symbols with logic diagrams, functional block diagrams, and/or function tables to fur~her help that understanding. 2.0 .Q E r.n> ttl ~ SYMBOL COMPOSITION A symbol comprises an outline or a combination of outlines together with one or more qualifying symbols. The shape of the symbol is not significant. As shown in Figure 1, general qualifying symbols are used to tell exactly what logical operation is performed by the elements. Table I shows general qualifying symbols defined in the new standards. Input lines are pl§Ged on the ito; L clllU outPUt iines are placea on me ngnt. vvnen an exception is made to that convention, the direction of signal flow is indicated by an arrow as shown in Figure 11. All outputs of a single, unsubdivided element always have identical internal logic states determined by the function of the element except when otherwise indicated by an associated qualifying symbol or label inside the element. 6-5 OUTLINE GENERAL QUALIFYING SYMBOL I ··.. ..~ .. INPUT LINES OUTPUT LINES ·Possible positions for qualifving symbols relating to inputs and outputs Figure 1. Symbol Composition The outlines of elements may be abutted or embedded in which case the following conventions apply. There is no. logic connection between the elements when the line common to their outlines is in the direction of signal flow. There is at least one logic connection between the elements when the line common to their outlines is perpendicular to the direction of signal flow. The number of logic connections between elements will be clarified by the use of qualifying symbols and this is discussed further under that topic. If no indications are shown on either side of the common line, it is assumed there is only one connection . ..... m m m t/) < 3 When a circuit has one or more inputs that are common to more than one element of the circuit, the common-control block may be used. This is the only distinctively shaped outline used in the lEe system. Figure 2 shoWs that unless otherwise qualified by dependency notation, an input to the common-control block is an input to each of the elements below the commoncontrol block. Sen • COMMON~ONTROLBLOCK a a b b c d c d Figure 2. Common-Control Block 6-6 A common output depending on all elements of the array can be shown as the output of a common-output element. Its distinctive visual feature is the double line at its top. In addition the common-output element may have other inputs as shown in Figure 3. The function of the common-output element must be shown by use of a general qualifying symbol. COMMON-OUTPUT E L EME NT :§; _ a ----------. (must, like other elements, have a qualifying symbol to denote its logic function) f-~---d c b h-f-ot--- e g g c--~---i Figure 3. Common-Output Element 3.0 QUALIFYING SYMBOLS 3.1 General Qualifying Symbols Table I shows general qualifying symbols defined by IEEE Standard 91. These characters are placed near the top center or the geometric center of a symbol or symbol element to define the basic function of the device represented by the symbol or of the element. 3.2 General Qualifying Symbols for Inputs and Outputs I/) 15 ..c E > en w W Qualifying symbols for inputs and outputs are shown in Table II and many will be familiar to W most users, with the possible exception of the logic polarity and analog signal indicators. The . older logic negation indicator means that the external 0 state produces the internal 1 state. The internal 1 state means the active state. Logic negation may be used in pure logic diagrams; • in order to tie the external 1 and 0 logic states to the levels H (high) and L (low), a statement of whether positive logic (1 = H, 0 = L) or negative logic (1 = L,O "" H) is being used, is required or must be assumed. Logic polarity indicators eliminate the need for calling out the logic convention and are used in various data books in the symbology for actual devices. The presence of the triangular polarity indicator indicates that the L logic level will produce the produce the external L level. Note how the active direction of transition for a dynamic input is indicated in positive logic, negative logic, and with polarity indication. The internal connections between logic elements abutted together in a symbol may be indicated by the symbols shown in Table II. Each logic connection may be shown by the presence of qualifying symbols at one or both sides of the common line and if confusion can arise about the number of connections, use can be made of one of the internal connection symbols. 6-7 Table I. General Qualifying Symbols SYMBOL DESCRIPTION & AND gate or function. 2::1 OR gate ~r function. The symbol was chosen to indicate that at least one active input is needed to activate the output. =1 Exclusi)le OR. One and only one input must be active to activate the output. Logic identity. All inputs must stand at the same state. 2k 2k An even number of inputs must be active. + An odd number pf inputs must be active. 1 The one input must be active. I> or U) Input for digital signals (on an analog symbol) (see Figure 141. W Internal connection. 1 state on left produces 1 state on right. • #1 ----r-_. __9____ ----~- r-- Negated internal connection. 1 state on left produces 0 state on right. Dynamic internal connection. Transition from 0 to 1 on left produces transitory 1 state on right. Internal input (virtual input). It always stands at its internal 1 state unless affected by an overriding dependency relationship. W W Internal outout {virtual QutnutL Its effect on an internal inout to which it is connected is indicated bv dependency notation. The internal (virtual) input is an input originating somewhere else in the circuit and is not connected directly to a terminal. The internal (virtual) output is likewise not connected directly to a terminal. The application of internal inputs and outputs requires an understanding of dependency notation, which is explained in Section 4. 6-9 Table III. Symbols Inside the Outline -+- Postponed output lof a pulse-triggered flip-flop). The output changes when input initiating change le.g., a C input) returns to its initial external state or level. See § 5. ----1.lT Bi-threshold input !input with hYsteresis) ~f- N-P-N open-collector or similar output that can supply a relatively low-impedance L level when not turned off. Requires external pull-up. Capable of positive-logic wired-AND connection. ~f- Passive-pull-up output is similar to N-P-N open-collector output but is supplemented with a bUilt-in passive pull-up. 0~ N-P-N open-emitter or similar output that can supply a relatively low-impedance H level when not turned off. Requires external pulldown. Capable of positive-logic wired-OR connection. ~~ Passive-pull-down output is similar to N-P-N open-emitter output but is supplemented with a built-in passive pull-down. V'f- 3-state output. t>f- Output with more than usual output capability Isymbol is oriented in the direction of signal flow). -----j EN Enable input When at its internal 1-state, all outputs are enabled. When at its internal O-state, open-collector and open-emitter outputs are off, three-state outputs are in the high-impedance state, and all other outputs Ii.e., totem-poles) are at the ,internal O-state. -mm m (f) < 3 C'" 0 '{jj J, K, R, S ----I> Toggle input causes internal state of output to change to its complement. T -1 0 -1- -1-1m II D:} -j+m --1CT: 15 CT: 9f- WJ "1"~ 6-10 Usual meanings associated with flip-flops le.g., R = reset to 0, S = set to 1). Data input to a storage element equivalent to: m Shift right lIeft} inputs, m = 1, 2, 3, etc. If m = 1, it. is usually not shown. m Counting up Idown} inputs, m = 1, 2, 3, etc. If m = 1, it is usually not shown Binary grouping. m is highest power of 2. The contents"setting input, when active, causes the content of a register to take on the indicated value. The content output is active if the content of the register is as indicated. Input line grouping ... indicates two or more terminals used to implement a single logic input. e.g., The paired expander inputs of SN7450. ;=:jJE Fixed-state output always stands at its internal 1 state. For example, see SN74185. In an array of elements, if the same general qualifying symbol and the same qualifying symbols associated with inputs and outputs would appear inside each of the elements of the array, then these qualifying symbols are usually shown only in the first element. This is done to reduce clutter and to save time in recognition. Similarly, large identical elements that are subdivided into smaller elements may each be represented by an unsubdivided outline. The SN54HC242 or SN54LS440 symbol illustrates this principle. 3.3 Symbols Inside the Outline Table III shows some symbols used inside the outline. Note particularly that open-collector (open-drain), open-emitter (open-source), and 3-state outputs have distinctive symbols. An EN input affects all the external outputs of the element in which it is placed, plus the external outputs of any elements shown to be influenced by that element. It has no effect on inputs. When an enable input affects only certain outputs, affects outputs located outside the indicated influence of the element in which the enable input is placed, and/or affects one or more inputs, a form of dependency notation will indicate this (see 4.10). The effects of the EN input on the various types of outputs are shown. It is particularly important to note that a D input is always the data input of a storage element. At its internal 1 state, the D input sets the storage element to its 1 state, and at its internal o state it resets the storage element to its 0 state. The binary grouping symbol will be explained more fully in Section 8. Binary-weighted inputs are arranged in order and the binary weights of the least-significant and the most-significant lines are indicated by numbers. In this document weights of input and output lines will be represented by powers of two usually only when the binary grouping symbol is used, otherwise decimal numbers will be used. The grouped inputs generate an internal number on which a mathematical function can be performed or that can be an identifying number for dependency notation (Figure 28). A frequent use is in addresses for memories. en .c '0 E > o w w W Reversed in direction, the binary grouping symbol can be used with outputs. The concept is analogous to that for the inputs and the weighted outputs will indicate the internal n u m b e r . assumed to be developed within the circuit. • Other symbols are used inside the outlines in accordance with the IEC/IEEE standards but are not shown here. Generally these are associated with arithmetic operations and are selfexplanatory. \A!~,?n n0~C?,!?nt:f.?rt:li'74?'ti infnrrn~tinn ic: c:hn\l'tln inc:irl,:. ~n nlltlinj:!] it i~ 11~1I::IlIy 'Anr.:ln!=:p.ti in ~~IHUP. brackets [like thesel. The square brackets are omitted when associated with a nonlogic input, which is indicated by an X superimposed on the connection line outside the symbol. 4.0 DEPENDENCY NOTATION 4.1 General Explanation Dependency notation is the powerful tool that sets the lEG symbols apart from previous systems and makes compact, meaningful, symbols possible. It provides the means of denoting the relationship between inputs, outputs, or inputs and outputs without actually showing all the 6-11 elements and interconnections involved. The information provided by dependency notation supplements that provided by the qualifying symbols for an element's function. In the convention for the dependency notation, use will be made of the terms "affecting" and "affected." In cases where it is not evident which inputs must be considered as being the affecting or the affected ones (e.g., if they stand in an AND relationship), the choice may be made in any convenient way. So far, eleven types of dependency have been defined and all of these are used in various TI data books. X dependency is used mainly with CMOS circuits. They are listed below in the order in which they are presented and ~re summarized in Table IV· following 4.12. Section Dependency TYPe or Other Subject 4.2 G,AND General Rules for Dependency Notation 4.3 4.4 V,OR N, Negate (Exclusive-OR) 4.5 4.6 Z, Interconnection 4.7 X, Transmission 4.8 C, Control 4.9 S, Set and R, Reset 4.10 EN, Enable 4.11 M, Mode 4.12 A, Address - m m m en '< 3 C" o 0' II 4.2 G (AND) Dependency A common relationship between two signals is to have them ANDed together. This has traditionally been shown by explicitly drawing an AND gate with the signals connected to the inputs of the gate. The 1972 IEC publication and the 1973 IEEE/ANSI standard showed several ways to show this AND relationship using dependency notation. While ten other forms of dependency have since been defined, the ways to invoke AND dependency are now reduced to one .. In Figure 4 input b is ANDed with input a and the complement of b is ANDed with c. The letter G has been chosen to indicate AND relationships and is placed at input b, inside the symbol. A number considered appropriate by the symbol designer (1 has been used here) is placed after the letter G and also at each affected input. Note the bar over the 1 at input c. a b c ={ -1 Gl ,. ~=$I-- c~ Figure 4. G Dependency Between Inputs In Figure 5, output b affects input a with an AND relationship. The lower example shows that it is the internal logic state of b, unaffected by the negation sign, that is ANDed. Figure 6 shows input a to be ANDed with a dynamic input b. 6-12 ~---.L aLI __~T-b _' Bj&f_--_--_,1-r- b ~ _ a rD-{_--_r b ~ ~ b aE!--r b alGI b aru--}-rB-I --t---r---= - '= __ Figure 5. G Dependency Between Outputs and Inputs Figure 6. G Dependency with a Dynamic Input The rules for G dependency can be su":,marized thus: When a Gm input or output (m is a number) stands at its internal 1 state, all inputs and outputs affected by Gm stand at their normally defined internal logic states. When the Gm input or output stands at its 0 state, all inputs and outputs affected by Gm stand at their internal 0 states. II) 4.3 Conventions for the Application of Dependency Notation in "0 .Q ,~eneral E The rules for applying dependency relationships in general >lIow the same pattern as was illustrated for G dependency. w Application of dependency notation is accomplished by: 1) labeling the input (or output) affecting otherinputf',r outputs with the letter symbol 2) en> w w indicating the relationship involved (e.g., G for AND) /(lilowed by an identifying number, appropriately chosen, and labeling each input or output affected by that affecting input (or output) with that same number. II If it is the complement of the internal logic state of the affec',,;1g input or output that does ::::',::::::- !~::: ::!::::-;~;!'i;~ii ;-,i.,;;-ii~oi-~ t .. ~ ~:-I~ o;~'ca... \.t;;U ;11"'Ui.~ UJ UUlPU-(:S (Figure 4). thp ~ffp,.."tin~. "!:h~~ ~ ~~~ ~~ ~!~~:~ If two affecting inputs or outputs have the same letter and the same identifying number, they stand in an OR relationship to each other (Figure 7). b & a~1 c Figure 7. ORed Affecting Inputs 6-13 If the affected input or output requires a label to denote its function (e.g., "0"), this label will be prefixed by the identifying number of the affecting input (Figure 15). If an input or output is affected by more than one affecting input, the identifying numbers of each of the affecting inputs will appear in the label of the affected one, separated by commas. The normal reading order of these numbers is the same as the sequence of the affecting relationships (Figure 15). If the labels denoting the functions of affected inputs or outputs must be numbers (e.g., outputs of a coder), the identifying numbers to be associated with both affecting inputs and affected inputs or outputs will be replaced by another character selected to avoid ambiguity, e.g., Greek letters (Figure 8). a b c _=i 0 Go ;;; a b c ~1Gl -- T Figure 8. Substitution for Numbers 4.4 V (OR) Dependency The symbol denoting OR dependency is the letter V (Figure 9). -mm m tJ) < 3 C" o =t: = 3i}: - ~: Cii Figure 9. V (OR) Dependency When a Vm input or output stands at its internal 1 state, all inputs and outputs affected by Vm stand at their internal 1 states. When the Vm input or output stands at its internal 0 state, all inputs and outputs affected by Vm stand at their normally defined internal logic states. 4.5 N (Negate) (Exclusive-OR) Dependency The symbol denoting negate dependency is the letter N (Figure 10). Each input or output affected by an Nm input or output stands in an Exclusive-OR relationship with the Nm input or output. 6-14 If a ~ 0, then c ~ b If a ~ 1, then c ~ Ii Figure 10. N (Negate) (Exclusive-OR) Dependency When an Nm input or output stands at its internal 1 state, the internal logic state of each input and each output affected by Nm is the complement of what it would otherwise be. When an Nm input or output stands at its internal 0 state, all inputs and outputs affected by Nm stand at their normally defined internal logic states. 4.6 Z (Interconnection) Dependency The symbol denoting interconnection dependency is the letter Z. Interconnection dependency is used to indicate the existence of internal logic connections between inputs, outputs, internal inputs, and/or internal outputs. The internal logic state of an input or output affected by a Zm input or output will be the same as the internal logic state of the Zm input or output, unless modified by additional dependency notation (Figure 11). at~]-b E=z}--a - E~~a - a~lt-c bIll - 'W' W· where -B-- =-{>- tn '0 .c E >U) W W W - where -cJ-=-<}- II i[hft--a LcJj :~' Figure 11. Z (Interconnection) Dependency 6-15 4.7 X (Transmission) Dependency The symbol denoting transmission dependency is the letter X. Transmission dependency is used to indicate controlled bidirectional connections between affected input/output ports (Figure 12). t-+-+-- b 8- XI I/lt-+-+-It--+-+--d If a = 1. there is a bidirectional connection between band c. If a = 0, there is a bidirectional connection between c and d. Figure 12. X (Transmission) Dependency When an Xm input or output stands at its internal 1 state, all input-output ports affected by this Xm input or output are bidirectionallY connected together and stand at the same internal logic state or analog signal level. When an Xm input or output stands at its internal 0 state, the connection associated with this set of dependency notation does not exist. ~ a-1I I-b t.n -< I m 3 0" - o p Figure 13. CMOS Transmission Gate Symbol and Schematic ( I) # # MUXDMUX O} 0 I X3 011/2/3 Figure ,14: Analog Data Selector (Multiplexer/Demultiplexer) Although the transmission paths represented by X dependency are inherently bidirectional, use is not always made of this property. This is analogous to a piece of wire, which may be constrained to carry current in only one direction. If this is the case in a particular application, then the directional arrows shown in Figures 12, .13, and 14 are omitted. 6-16 4.8 C (Control) Dependency The symbol denoting control dependency is the letter C. Control inputs are usually used to enable or disable the data (0, J, K, R, or S) inputs of storage elements. They may take on their internal 1 states (be active) either statically or dynamically. In the latter case the dynamic input symbol is used as shown in the third example of Figure 15. a-fc7 b--r O a~l b C2 1.~ c / '= - af~ b lC2 20 - a~& sb & = c c . R - Note AND relationship of a and b ~ c a b - b & & S a~- Gl 1.20 C2 af c & R II) b 11.2D i'0 a~"1 _ & & S c Gl b d C2 d c & '0 ..0 E >(J) R - W W W Input c selects which of a or b is stored when d goes low. - Figure 15. C (Control) Dependency Whe':l a Cm input or output stands at its internal 1 state, the inputs affected by Cm have their normally defined effect on the function of the element, i.e., these inputs are enabled. When a Cm input or output stands at its internal 0 state, the inputs affected by Cm are disabled and have no effect on the function of the element. II 6-17 4.9 The symbol denoting set dependency is the letter S. The symbol denoting reset dependency is the letter R. Set and reset dependencies are used if it is necessary to specify the effect of the combination R =S = 1 on a bistable element. Case 1 in Figure 16 does not use S or R dependency. . When an Sm input is at its internal 1 state, outputs affected by the Sm input will react, regardless of the state of an R input, as they normally would react to the combination S = 1, R =O. See cases 2, 4, and 5 in Figure 16. iii m m CASE 1 S (Set) and R (Reset) Dependencies When an Am input is at its internal 1 state, outputs affected by the Rm input will react, regardless of the state of an S input, as they normally would react to the combination S =0, R = 1. See cases 3, 4, and 5 in Figure 16. s~: S 0 0 R 0 1 1 0 Q Q nc nc 1 0 1 0 1 ? ? s-Fl-: R-ti-O s-rl-o S 0 0 R 0 Q Q nc nc 1 0 1 1 1 0 1 1 1 0 0 S 0 0 R 0 Q Q nc nc 1 0 1 1 1 0 1 0 1 a 1 R-U-0 CASE 2 CASE 3 R-LJ-O CASE 4 s-Fl-: 3 g- en When an Sm or Rm input is at its internal o state, it has no effect. Note that the noncomplementary output patterns in cases 4 and 5 are only pseudo stable. The simultaneous return of the inputs to S = R = 0 produces an unforeseeable stable and complementary output pattern. S 0 0 R~O 1 1 R Q Q 0 nc nc 1 a 1 a 1 1 1 R Q Q a nc a nc 1 1 0 a 1 CASE 5 (I) -< 1 s-F1-:0 R-Uo = external nc 0 state = no change S 0 a 1 1 1 a 1 a a 1 = external 1 state ? = unspecified Figure 16. S (Set) and R (Reset) Dependencies 4.10 EN (Enable) Dependency The symbol denoting enable dependency is the combination of letters EN. An ENm input has the same effect on outputs as an EN input, see 3.3, but it affects only those outputs labeled with the identifying number m. It also affects those inputs labeled with the identifying number m. By contrast, an EN input affects all outputs and no inputs. The effect of an ENm input on an affected input is identical to that of a Cm input (Figure 17). 6-18 When an ENm input stands at its internal 1 state, the inputs affected by ENm have their normally defined effect on the function of the element and the outputs affected by this input stand at their normally defined internal logic states, i.e., these inputs and outputs are enabled. a_--~ d If a = 0, b is disabled and d = c If a = " c is disabled and d = b Figure 17. EN (Enable) Dependency When an ENm input stands at its internal 0 state, the inputs affected by ENm are disabled and have no effect on the function of the element, and the outputs affected by ENm are also disabled. Open-collector outputs are turned off, three-state outputs stand at their normally defined internal logic states by externally exhibit high impedance, and all other outputs (e.g., totem-pole outputs) stand at their internal 0 states. 4.11 M (MODE) Dependency en The symbol denoting mode dependency is the letter M. '0 Mode dependency is used to indicate that the effects of particular inputs and outputs of an element depend on the mode in which the element is operating. If an input or output has the same effect in different modes of operation, the identifying numbers of the relevant affecting Mm inputs will appear in the label of that affected input or output between parentheses and separated by solidi (Figure 22). .Q E > o w w w 4.11.1 M Dependency Affecting Inputs M dependency affects inputs the same as C dependency. When an Mm input or Mm output stands at its internal 1 state, the inputs affected by this Mm input or Mm output have their normally defined effect on the function of the element, i.e., the inputs are enabled. When an Mm input or Mm output stands at its internal 0 state, the inputs affected by this It.,., . . . . 1\..11_ : _ _ ..... I.U'6 __ "''' _ _ ..... _ ........... _ •• _ _ _ _ z.z, __ .... __ IV.", 1 1Il,0l v .... II ........ VII VI v"" ... ..,"" . . ,.'"'v . . ........ _ z. ...__ ... : __ _ L ... L _ _ 1 _ _ _ _ _ ... ........ lUI ,\,,0 ",.VI 1 VI ................. 111..." .... \A'L _ _ _ _ _ .1..1. _ _ ... _-1 " " ....... , "-III UII1Wii ....... u U input has several sets of labels separated by solidi (e.g., C4/2-/3+), any set in which the identifying number of the Mm input or Mm output appears has no effect and islo be ignored. This represents disabling of some of the functions of a multifunction input. 6-19 The circuit in Figure 18 has two inputs, band c, that control which one of four modes (0, 1, 2, or 3) will exist at any time. Inputs d, e, and fare D inputs subject to dynamic control (clocking) by the a input. The numbers 1 and 2 are in the series chosen to indicate the modes so inputs e and f are only enabled in mode 1 (for parallel loading) and input d is only enabled in mode 2 (for serial loading). Note that input a has three functions. It is the clock for entering data. In mode 2, it causes right shifting of data, which means a shift away from the control block. In mode 3, it causes the contents of the register to be incremented by one count. Note that all operations are synchronous. In MODE 0 (b = 0, c = 0), the outputs remain at their existing states as none of the inputs has an effect. In MODE 1 (b = 1, c = 0), parallel loading takes place thru inputs e and f. In MODE 2 (b = 0, c = 1), shifting down and serial loading thru input d take place. In MODE 3 (b = c = 1), counting up by increment of 1 per clock pulse takes place. Figure 18. M (Mode) Dependency Affecting Inputs 4.11.2 M Dependency Affecting Outputs m m m en -< 3 o C" When an Mm input or Mm output stands at its internal 1 state, the affected outputs stand at their normally defined internal logic states, i.e., the outputs are enabled. ° When an Mm input or Mm output stands at its internal state, at each affected output any set of labels containing the identifying number of that Mm input or Mm output has no effect and is to be ignored. When an output has several different sets of labels separated by solidi (e.g., 2,4/3,5), only those sets in which the identifying number of this Mm input or Mm output appears are to be ignored. Ui Figure 19 shows a symbol for a device whose output can behave as either a 3-state output or an open-collector output depending on the signal applied to input a. Mode 1 exists when input a stands at its internal 1 state and, in that case, the three-state symbol applies and the open-element symbol has no effect. When a = 0, mode 1 does not exist so the three-state symbol has no effect and the open-element symbol applies. 6-20 t> 'a M1 b EN 1'V/1Q d Figure 19. Type of Output Determined by Mode In Figure 20, if input a stands at its internal 1 state establishing mode 1 , output b will stand at its internal 1 state only when the content of the register equals 9. Since output b is located in the common-control block with no defined function outside of mode 1, the state of this output outside of mode 1 is not defined by the symbol. In Figure 21, if input a stands at its internal 1 state establishing mode 1, output b will stand at its internal 1 state only when the content of the register equals 15. If input a stands at its internal o state, output b will stand at its internal 1 state only when the content of the r.egister equals O. a-1Ml , lCT=9 ~b I I I I I ? ~ Figure 20. An Output of the Common-Control Block a l Ml ,, , ( I~T=15r-b lCT=O ,I I S Figure 21. Determining an Output's Function In Figure 22 inputs a and b are binary weighted to generate the numbers 0, 1, 2, or 3. This determines which one of the four modes exists. U) Figure 22. Dependent Relationships At output e the label set causing negation Affected by Mode (if c = 1) is effective only in modes 2 and 3. In modes 0 and 1 this output stands >at its normally defined state as if it had no labels. At output f the label set has W effect when the mode is not 0 so output W e is negated (if c = 1) in modes 1, 2, and 3. In mode 0 the label set has no effect so the output stands at its normally defined state. • In this example 0,4 is equivalent to (1/2/3)4. At output 9 there are two label sets. The first set, causing negation (if c = 1), is effective only in mode 2. The second set, subjecting 9 to • AND dependency on d, has effect only in mode 3. "0 E en !:!:! Note that in mode 0 none of the dependency relationships has any effect on the outputs, so e, f, and 9 will all stand at the same state. The symbol denoting address dependency is the letter A. Address dependency provides a clear representation of those elements, particularly memories, that use address controi inputs to select specified sections of a multildimen!!ional array. Such a section of a memory array is usually called a word. The purpose of address dependency is to allow a symbolic presentation of the entire array. An input of the array shown at a particular 6-21 element of this general section is common to the corresponding elements of all selected sections of the array. An output of the array shown at a particular element of this general section is the result of the OR function of the outputs of the corresponding elements of selected sections. Inputs that are not affected by any affecting address input have their normally defined effect on all sections of the array, whereas inputs affected by an address input have their normally defined effect only on the section selected by that address input. An affecting address input is labeled with th~ letter A followed by an identifying number that corresponds with the address of the particular section of the array selected by this input. Within the general section presented by the symbol, inputs and outputs affected by an Am input are labeled with the letter A, which stands for the identifying numbers, i.e., the addresses, of the particular sections. a b a AI A2 d e 9 c ENI EN2 EN3 d CA b c- A3 - CA f h e 9 -mm m t/) '< 3 0'" o 0' II h Figure 23. A (Address) Dependency Figure 23 shows a 3-word by 2-bit memory having a separate address line for each word and uses EN dependency to explain the operation. To select word 1, input a is taken to its 1 state, which establishes mode 1 . Data can now be clocked into the inputs marked" 1,40." Unless words 2 and 3 are also selected, data cannot be clocked in at the inputs marked "2,40" and "3,40." The outputs will be the OR functions of the selected outputs, i.e., only those enabled by the active EN functions. The identifying numbers of affecting address inputs correspond with the addresses of the sections selected by these inputs. They need not necessarily differ from those of other affecting dependency-inputs (e.g., G, V, N, ... ), because in the general section presented by the symbol they are replaced by the letter A. If there are several sets of affecting Am inputs for the purpose of independent and possibly simultaneous access to sections of the array, then the letter A is modified to 1A, 2A, .... Since they have access to the same sections of the array, these sets of A inputs may have the same identifying numbers. The symbols for 'HC170 or SN74LS170 make use of this. Figure 24 is another illustration of the concept. 6-22 RAM 16 X 4 EN :}A;\ Cl Figure 24. Array (If 16 Secti(lns (If F(lur Transparent Latches with 3-State Outputs Comprising a 16-Word x 4-Bit Random-Access Memory Table IV. Summary of Dependency Notation TYPE OF DEPENDENCY Address Control LETTER SYMBOL* A C AFFECTING INPUT AT ITS l-STATE Permits action (address selected) Permits action AFFECTING INPUT AT ITS O-STATE Prevents action (address not selected) Prevents action Prevents action of inputs outputs off \J outputs at external high impedance, no change in internal logic state Other outputs at internal 0 state Imposes 0 state Prevents action (mode not selected) No effect o Enable EN Permits action AND Mode Negate (Ex-OR) G M N Permits action Permits action (mode selected) Complements state Affected output reacts as it would to S = 0, R = 1 Affected output reacts as it would to S = 1, R = 0 Imposes 1 state Bidirectional connection exists Imposes 1 state Reset R Set S OR Transmission Interconnection X V Z II) '0 .Q e> No effect CJ) No effect W W W - • Permits action Bidirectional connection does not exist Imposes 0 state • These letter symbols appear at the AFFECTING input lor output) and are followed by a number. Each input lor outputl AFFECTED by that input is labeled with that same number. When the labels EN, R, and S appear at inputs without the following numbers, the descriptions above do not apply. The action of these inputs is described under "Symbols Inside the Outline," see 3.3. 5.0 BISTABLE ELEMENTS Thp. rlyn~mir. in!"lIt ~~/mhnl. thg :",n~T~0~'='~ ~':.~!~I-.!,!: ~~/~~':'!. ~~~ ~~~~~~e~~',' ~!::~::'!:::::!": ;:=-=",::== the tools to differentiate four main types of bistable elements and make synchronous and asynchronous inputs easily recognizable (Figure 25). The first column shows the essential distinguishing features; the other columns show examples. Transparent latches have a level-operated control input. The D input is active as long as the C input is at its internal 1 state. The outputs respond immediately. Edge-triggered elements accept data from D, J, K, R, or S inputs on the active transition of C. Pulse-triggered elements 6-23 require the setup of data before the start of the control pulse; the C input is considered static since the data must be maintained as long as C is at its 1 state. The output is postponed until C returns to its 0 state. The data-lock-out element is similar to the pulse-triggered version except that the C input is considered dynamic in that shortly after C goes through its active transition, the data inputs are disabled and data does not have to be held. However, the output is still postponed until the C input returns to its initial external level. Notice that synchronous inputs can be readily recognized by their dependency labels (1 D, 1J, 1 K, 15, 1 R) compared to the asynchronous inputs (5, R), which are not dependent on the C inputs. r- --, I I -1 r- Cm , I L __ .J TRANSPARENT LATCHES fl o Cl C2 2D 1/2 SN7475 r---' -t ~ cm J Cl lK R I ___ .JI L EDGE-TRIGGERED -mm 1/2 SN7474 r--., I I Cl lK R Cm en IL ___ JI -< 3 PULSE-TRIGGERED o -+cm~~ 1/2 SN74LS107 1J l -'r- m fi SN74L71 1/2 SN74107 SN74110 1/2 SN74111 r - --, 0- Cii I I L ___ .J DATA-LOCK·OUT Figure 25. Four Types of Bistable Circuits 6.0 CODERS The general symbol for a coder or code converter is shown in Figure 26. X and Y may be replaced by appropriate indications of the code used to represent the information at the inputs and at the outputs, respectively. 6-24 Figure 26. Coder General Symbol Indication of code conversion is based on the following rule: Depending on the input code, the internal logic states of the inputs determine an internal value. This value is reproduced by the internal logic states of the outputs, depending on the output code. The indication of the relationships between the internal logic states of the inputs and the internal value is accomplished by: 1) 2) labeling the inputs with numbers. In this case the internal value equals the sum of the weights associated with those inputs that stand at their internal 1-state, or by replacing X by an appropriate indication of the input code and labeling the inputs with characters that refer to this code. The relationships between the internal value and the internal logic states of the outputs . are indicated by: 1) 2) labeling each output with a list of numbers representing those internal values that lead to the internal 1-state of that output. These numbers shall be separated by solidi as in Figure 27. This labeling may also be applied when Y is replaced by a letter denoting a type of dependency (see Section 7). If a continuous range of internal values produces the internal 1 state of an output, this can be indicated by two numbers that are inclusively the beginning and the end of the range, with these two numbers separated by three dots (e.g., 4 ... 9 = 4/5/6/7/8/9) or by replacing Y by an appropriate indiction of the output code and labeling the outputs with characters that refer to this code as in Figure 28. Alternatively, the general symbol may be used together with an appropriate reference to a table in which the relationship between the inputs and outputs is indicated. This is a recommended way to symbolize a PROM after it has been programmed. TRUTH TABLE INPUTS XIV a b c 1 2 4 1/4 2J3 3/4 d e 9 c b 0 0 0 0 1 1 0 0 1 1 0 0 I; •0 1 0 1 0 1 • 0 0 0 0 0 0 OUTPUTS f 0 0 0 1 1 0 •0 0 1 1 0 0 d 0 1 0 0 1 0 II) '0 ..Q E > en W W !:!:! • ~I~~~~I Figure 27. An X/V Code Converter 6-25 TRUTH TABLE INPUTS XlGeT d e a b c Z 4 f 9 h c b 0 0 0 0 1 1 1 1 0 0 1 1 0 0 1 1 OUTPUTS •0 1 0 1 0 1 0 1 i I 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 0 h B f 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 1 0 0 0 0 1 0 0 • d 0 0 1 0 0 0 0 0 0 1 0 0 0 Q 0 0 Figure 28. An X/Octal Code Converter 7.0 USE OF A CODER TO PRODUCE AFFECTING INPUTS It often occurs that a set of affecting inputs for dependency notation is produced by decoding the signals on certain inputs to an element. In such a case use can be made of the symbol for a coder as an embedded symbol (Figure 29). -mm If all affecting inputs produced by a coder are of the same type as their identifying numbers shown at the outputs of the coder, V (in the qualifying symbol XIV) may be replaced by the letter denoting the type of dependency. The indications of the affecting inputs should then be omitted (Figure 30). m o < 3 cr o tii II 6-26 8.0 X/V o GI 1 GZ 2 V4 V3 N5 C3 Figure 29. Producing Various Types of Dependencies =[J IM I 2 -- 0 1 2 ,I D /V = I 2 -- 0 MO 1 MI 2 M2 , I Figure 30. Producing One Type of Dependency USE OF BINARY GROUPING TO PRODUCE AFFECTING INPUTS If all affecting inputs produced by a coder are of the same type and have consecutive identifying numbers not necessarily corresponding with the numbers that would have been shown"at the outputs of the coder, use can be made of the binary grouping symbol. k external lines effectively generate 2k internal inputs. The bracket is followed by the letter denoting the type of dependency followed by m 11m2. The m 1 is to be replaced by the smallest identifying number and the m2 by the largest one, as shown in Figure 31. x/v AO Al 2 A2 J AJ 4 A4 A5 A6 A7 0 I X/V G5 G6 G7 G8 Figure 31. Use of the Binary Grouping Symbol 9.0 SEQUENCE OF INPUT LABELS If an input having a single functional effect is affected by other inputs, the qualifying symbol (if there is any) for that functional effect is preceded by the labels corresponding to the affecting inputs. The left-to-right order of these preceding labels is the order in which the effects or modifications must be applied. The affected input has no functional effect on the element if the logic state of anyone of the affecting inputs, considered separately, would cause the affected input to have no effect, regardless of the logic states of other affecting inputs. If an input has several different functional effects or has several different sets of affecting inputs, depending on the mode of action, the input may be shown as often as required. However, there are cases in which this method of presentation is not advantageous. In those cases the input may be shown once with the different sets of labels separated by solidi (Figure 32). No meaning is attached to the order of these sets of labels. If one of the functional effects of an input is that of an unlabeled input to the element, a solidus will precede the first set of labels shown. If all inputs of a combinational element are disabled (caused to have no effect on the function of the element). the internal logic states of the outputs of the element are not specified by the symbol. If all inputs _z- ____ .. ___ VI U -'-~_I _1 _ _ _ • '" ••••• .;;n;;;"tU"'IILIQI ult:Olll'tiIIL a l e Ulo:)aUltllU, Lllt:\ii content of this element is not changed and the outputs remain at their existing internal logic states. Labels may be factored using algebraic techniques (Figure 33). 8=[1--b G2 c 1~/~.~~ 8 h =f ---- U) '0 .c E >w w w fn • G2 ')/rt [~--Figure 32. Input Labels 6-27 Figure 33. Factoring Input Labels 10.0 SEQUENCE OF OUTPUT LABELS If an output has a number of different labels, regardless of whether they are identifying numbers of affecting inputs or outputs or not, these labels are shown in the following order: 1) 2) 3) m m m en < 3 0" o ;- II If the postponed output symbol has to be shown, this comes first, if necessary preceded by the indications of the inputs to which it must be applied Followed by the labels indicating modifications of the internal logic state of the output, such that the left-to-right order of these labels corresponds with the order in which their effects must be applied Followed by the label indicating the effect of the output on inputs and other outputs of the element. Symbols for open-circuit or 3-state outputs, where applicable, are placed just inside the outside boundary of the symbol adjacent to the output line (Figure 34)~ If an output needs several different sets Figure 34. Placement of 3-State Symbols of labels that represent alternative functions (e.g., depending on the mode of action), these sets may be shown on different output lines that must be connected outside the outline. However, there are cases in which this method of presentation is not advantageous. In those cases the output may be shown once with the different sets of labels separated by solidi (Figure 35). Two adjacent identifying numbers of affecting inputs in a set of labels that are not already separated by a nonnumeric character should be separated by a comma. If a set of labels of an output not containing a solidus contains the identifying number of an affecting Mm input standing at its internal 0 state, this set of labels has no effect on that output. Labels may be factored using algebraic techniques (Figure 36). at~-_~~~=~~~~:tb = ai~~-~~~:~tb Figure 35. Output Labels Figure 36. Factoring Output Labels If you have questions on this Explanation of Logic Symbols, please contact: Texas Instruments Incorporated F.A. Mann, MS 49 P.O. Box 655012 Dallas, Texas 75265 Telephone (214) 995-2659 IEEE Standards may be purchased from: Institute of Electrical and Electronics Engineers, Inc. I EEE Standards Office 345 East 47th Street New York, N.Y. 10017 International Electrotechnical Commission (IEC) publications may be purchased from: American National Standards Institute, Inc. 1430 Broadway New York, N.Y. 10018 ri) (5 .c E en> w w w - • 6-29 ;;; m m en '< 3 o 0" 0' 6-30 n.o~i,..n _ _ _ _ ;::,_ _ (",.. .. ~ ... :...,. ..... -_ _ I..... .eo.:,..,.. _ . _ _ ....... loWI 7-1 c (1) UI cC' ::J n o ::J UI c.: ...I» (1) r+ 0' ::J UI 7-2 DESIGN CONSIDERATIONS DESIGN CONSIDERATIONS Logic Evaluation To begin your standard celilC design, you should prepare a functional description, a timing diagram, and a logic design. A complete definition of the circuit performance must be specified. Waveform diagrams or test vectors may be a TO GATES fI) C o "+0 -= ca ~ GND Figure 5. Schematic of Input Protection Q) "C "iii c o (.) c OJ "iii .. Q) C II!II TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 7-15 DESIGN CONSIDERATIONS Vee FROM GATE 0..--- OUTPUT PAD -= GND Figure 6. Schematic of Output Protection cCD fI) cEo :J (') o :J fI) a:CD ...m...ci" :J fI) • 7-16 TEXAS ~ IN STRUM ENTS POST OFFICE BOX 655012 • DALI.AS. TEXAS 76265 Mechanical Data 8-1 8-2 MECHANICAL DATA Electrical characteristics presented in this data book, unless otherwise noted, apply to standard cells prior to interconnect routing and packaging. Characteristics and effects of routing, cell layout, and interconnection of a completed ASIC design are covered in the. post-layout simulation software. The capacitive loading effects of the package bond wire(s) and terminals(s) are assumed to be a portion of the 15 pF or 50 pF switching-characteristics load shown for the output and 1/0 cells. Typically, the packaging bond-wire and terminal capacitance values range from 1 to 2 pF. Consult Tl's design-center personnel for further assistance in choosing and specifying ASIC packaging options. package selection Outline drawings presented in this section are for both conventional through-hole and surface-mount packages. The following classes of packages are covered. Dual-in-line (DIP), plastic and ceramic Pin-grid-array (PGA), ceramic Small-outline (SO), plastic Ceramic leadless chip carriers (LCC) Plastic leaded chip carriers (PLCC) Ceramic quad flatpacks These packages are recommended as a representative selection which satisfies a wide range of ASIC applications. TI will review and consider supplying package requirements other than those shown. ordering instructions Implementation of semiconductor solutions using SystemCell'" components normally results in an applicationspecific integrated circuit. Total specifications, including packaging and ordering instructions, are developed as a part of this Design Specification described in. Section 1. Contact your TI representative for further information on getting started with an ASIC design. ... CIS CIS C ca (,) '2 CIS .c (,) CD :E II TEXAS ~ INSTRUMENTS POST .OFFICE BOX 655012 • OALLAS, TEXAS 75265 8-3 8-4 MECHANICAL DATA o plastic "small outline" packages Each of these "small outline" packages consists of a circuit mounted on a lead frame and encapsulated within a plastic compound. The compound will withstand soldering temperature with no deformation, and circuit performance characteristics will remain stable when operated in high-humidity conditions. Leads require no additional cleaning or processing when used in soldered assembly. a·PIN D PACKAGE f 6,20 (0.2441 3,81 10.150) 4 -*--1jt;:.:;;li=j:r::nI F-L= r""P~ACESNOM 0,50 (0.020) 1,75 (0.0691 1.35 0.2510.010) ,4 0.20~J- 0,102 (0.0041 0,79 10.031) 0,2810.011) - j l "hi x 45"........ 5.21 10.205) 4,60 (0'181)J F 0.45710.0181 0.35610.0141 \~~ :1\.-..,. NOM0 4 PLACES 0,22910.0090) 0,190 10.0075) Lr 4° ± 4° 1,12 (0.044) 0,51 10.020) PIN SPACING 1.27 (0.050) (Sse Note A) ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTES: A. Body dimensions do not include mold flash or protrusion. B. Mold flash or protrusion shall not exceed 0,15 10.0061. Leads are within 0,25 (0.010) radius of true position at maximum material dimension. D. Lead tips to be planar within ±O,051 10:0021 exclusive of solder. c. ...co CO c 16 .~ s:: CO .s:: (J Q) :!: II TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 8-5 MECHANICAL DATA o plastic "small outline" packages Each of these "small outline" packages consists of a circuit mounted on a lead frame and encapsulated within a plastic compound. The compound will withstand soldering temperature with no deformation, and circuit performance characteristics will remain stable when operated in high-humidity conditions. Leads require no additional cleaning or processing when used in soldered assembly. 16-PIN D PACKAGE r 10'00(0'394)~ 9.80 (0.388) rot-----i1cn- _ _ _ _ r- 6.20 (0.2441 I 5.80 (0.2281 4.00 (0.1571 3.8iTo:15oi L-~t;::;:;:;:;::;::;:::::;:;=;::;:;:;Y 1.75 (0.0691 ' 1,35 (0.053) j '7"NOM 4 PLACES jl~ 0,356 (0.014) PIN SPACING 1.27 (0.0501 (See Note A) ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTES: A. B. C. D. Body dimensions do not include mold flash or protrusion. Mold flash or protrusion shall not exceed 0.15 (0.006), Leads are within 0,25 (O.010) radius of true position at maximum material dimension. Lead tips to be planar within ±0.051 10.002) exclusive of solder. II 8-6 TEXAS . " INSTRUMENlS pos-r: OFFICE BOX 655012 • DALLAS. TEXAS 76265 MECHANICAL DATA OW plastic "small outline" packages Each of these "small outline" packages consists of a circuit mounted on a lead frame and encapsulated within a plastic compound. The compound will withstand soldering temperature with no deformation, and circuit performance characteristics will remain stable when operated in high-humidity conditions. leads require no additional cleaning or processing when used in soldered assembly. 20-PlN OW PACKAGE r r=--:::~:::::---' rrm-A AA - AAAAI 10,6510.4191 10.1510.4001 20 " 7,55 (0.2971 7'~~~G)~1~;;~;;~~:;~~~~~1:0~ ~70NOM 4 PLACES '.27(0.1]601 I I O,'iii'iQ.ijiij-lt--"f 0,785 (0.0311 ~ ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTES: A. B. C. D. Body dimensions do not include mold flash or protrusion. Mold flash or protrusion shall not exceed 0,15 (0.0061. Leads are within 0,25 (0.010) radius of true position at maximum material dimension. Lead tips to be planar within ±0.051 (0.002) exclusive of solder. TEXAS • INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 ...co CO o 8-7 MECHANICAL DATA OW plastic "small outline" packages . Each of these "small outline" packages consists of a circuit mounted on a lead frame and encapsulated within a plastic compound. The compound will withstand soldering temperature with no deformation, and circuit performance characteristics will remain stable when operated in high-humidity conditions. Leads require no additional cleaning or processing when used in soldered assembly. 24·PIN DW PACKAGE 1S.51.0.610.';;;J 15,310.802} - - - - 13 0,78510.031\ ~ U 1,27(0.0501 TP ALL LINEAR DIMENSIDNS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTES: A. B. C. D. Body dimensions do not include mold flash or protrusion. Mold flash or protrusion shall not exceed 0,15 10.006), Leads are within 0,25 (0.0101 radius of true position at maximum material dimension. Lead tips to be planar within ±O,051 (O.002) exclusive of solder. II 8-8 TEXAS ~ INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 MECHANICAL DATA FK ceramic chip carrier packages Each of these hermetically sealed chip carrier packages has a three-layer ceramic base with a metal lid and braze seal. The packages are intended for surface mounting on solder lands on 1,27 (O.050-inch) centers. Terminals require no additional cleaning or processing when used in soldered assembly. FK package terminal assignments conform to JEDEC Standards 1, 2, and 11. FK CERAMIC CHIP CARRIER (28·terminal package shown) CERAMIC CHIP CARRIERS JEOEC OUTLINE DESIGNATION- MS004CB NO. OF TERMINALS 20 MSOO4CC 28 MSOO4CD 44 MSOO4CF 88 MSOO!1oCG 8' A C M'N MAX MAX M'N B,89 9.09 1,63 2.03 (0.342) '0.358) 9.09 (0,3581 '0.084) 10.080) ",23 '1,63 (0.458) 16,78 11.63 1,63 2.03 (0.458) 14.22 10.560) 21,89 (O.Q641 10.OBO) 3,05 10.1201 10.8&2) 1.75. (0.069) 2,08 (0.082) 27,06 11.0651 10.0821 CD.422) 16.26 10.640) 28,83 10.938) 28.83 11.1351 IO.6~1 24,43 10.9621 29.59 11.185) 2.0lf MAX ~.O5 10.1201 3,05 (0.120) • All dimensions and notes for the specified JEDEC outline apply. ....coCO C a; .~ ,.. C6 .s:::. (,) CD I I J+- 0.71 (0.0281 0,56 (0.0221 -+j :E ALL LINEAR DIMENSIONS ARE IN MILLIMETERS ANO PARENTHETICALlY IN INCHES TEXAS . " INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 75265 II 8-9 MECHANICAL DATA FN plastic chip carrier package Each of these chip carrier packages consists of a circuit mounted on a lead frame and encapsulated within an electrically nonconductive plastic compound. The compound withstands soldering temperatures with no deformation. and circuit performance characteristics remain stable when the devices are operated in high-humidity conditions. The packages are intended for surface mounting on solder lands on 1.27 (0.050) centers. Leads require no additional cleaning or processing when used in soldered assembly. FN PLASTic CHIP CARRIER (28-terminal packalie used for illustration) Ii' . 122 (0 048) X45° 1,07 (0.042) V 0 25 h 6 24 D 7 23 5 u~: 4 3 2 1 28 27 26 22 21 2. 19 12 13 14 15 16 17 I 18 .I~I' 0,25 (0.010) B 14-_ _ _ _ _ A_(S_e_e_N_o_te_A_)_~.. I!' JEDEC OUTLINE MO-047AA NO. OF TERMINALS 20 MO-047AB 28 MO·047AC 44 MO-047AE 68 Mb-047AF 84 3 PLACES C 8 A 9.78 10.3851 (0.3951 12.32 12.57 MIN 8.89 (0.3501 11.43 (0.4851 17.40 (0.6851 (0.4951 (0.4501 17.65 (0.6951 16.66 (0.6561 25.02 (0.9851 30.10 2 •• 27 (0.9951 30.35 16.51 (0.6501 24.13 (0.9501 (1.1851 11.1951 29.21 11.1501 29,41 MIN I MAX 10,03 SEATING PLANE (See Note C) R MAX MAX 9.04 (0.3561 11.58 (0.4561 24.33 (0.956) (1.1581 MIN MAX 7.87 (0.3101 10.41 (0.4101 15,49 (0.6101 8.38 (0.3301 23.11 (0.9101 27.69 11.0901 23.62 0.81 (O.032)--f'-+I 0.66 (0.026) ~T '1,52 (0.060) MIN 10.92 (0.4301 16.00 (0.6301 (0.9301 l.-l I ;;;64 (0.025) MIN 0,51 (0.020) ->I I ~ 0,36 (0.014) LEAD DETAIL I 28.70 11.1301 All dimensions and notes for the specified JEDEC outline apply. ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES A. Centerline of center pin each side is within 0,10 (0.004) of package centerline as determined by dimension B. B. Location of each pin is within 0,127 (0.005) of true position with respect to center pin on each side. C. The lead contact points are planar within 0,10 (0.004). 8-10 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TeXAS 76265 MECHANICAL DATA GB pin-grid-array ceramic package This is a hermetically sealed package with metal cap and gOld-plated pins. 58-PIN G8 r - 2 9 . S (1.1601 27.4 (1.0801 INDEX CORNERt I l 29.5 (1.1601 ~JM" 4 95 (0 1951 1.52 (0.0601 2:54(o:1001~1 I =====L-.-" jl.02(0.0401 2.54 (0.1001 T.P. (See Note A) ....coCO o ca .g CO .c u Q) II :iE 1 2 3 4 5 6 7 8 9 10 11 ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES L - - -_ _ _ _ _ - - - ' - ' t Index mark may appear on top or bottom depending on package vendor. :t Not featured on single level ceramic packages. NOTE A: Pins are located within 0,13 (0.005) radius of true position relative to each other at maximum material condition and within 0,25 10.010) radius relative to the center of the ceramic. TEXAS . " INSTRUMENlS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 8-11 •• MECHANICAL DATA GB pin-grid-array ceramic package (Form 1) This is a hermetically sealed package with metal cap and gold-plated pins. 84·PIN GB (FORM 1) r--. I FOR MILITARY PARTS ONLY 25.7 (1.010)-----, 25.2 (0.990) I INOEX CORNER 3 99 (0 157) 1.65 (0.065) ';"";''''rm=n=ni--"~~L'fUO""" j 3.30 ( 0 . 1 3 0 ) F l L 0 2 0 ) II 2.79 (0.110) 0.406 (0.016)--.J~ (84 PLACES) 2.54 (0.100) T.P., j . L 22.86 (0.900) REF C ... as I» II r-- 1.575 (0.062) 1.473 (0.058) 0 2.54 (0.100) T.P. K 0®®0®®0000 J DIA 0®0®®®00®®h H ®®®®®®00001 G 0®® F ® ® ® 000 0 0 0 E®00 0®® o ®0® 0®® I c®®000®®®®0 80®®000®0®0 A ®®®®®®®000 1 2 3 4 5 6 7 8 9 10 ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTE A: Pins are located within 0.13 (0.005) radius of true position relative to each other at maximum material condition and within 0.25 (0.010) radius relative to the center of the ceramic. 8-12 TEXAS .., INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXA.S 75265 MECHANICAL DATA GB pin-grid-array ceramic package (Form 2) This is a hermetically sealed package with metal cap and gold-plated pins. r 84-PIN GB IFORM 21 INDEX CORNER 30.0 11.1801----, 27.4 11.0801 I 4.95 10.195) 2'5410.100)~1 1.40 10.055) 11.1410.045) I .~"".it.llL~U ij ij ~tt,,,~.,,. 2.5410.100) 0.40610.016) (84 PLACES) DIA 14 PLACES) 2.54 10.100) T.P. 2.5410.100) T.P. ISee Note A) I~G LK 25.411.000) REF F L~ 00000000000 00000000000 00 000 00 00 00 000 000 000 000 ~8G 00 EXTRAPIN / 0®® 00 00(2f 000 00 00000000000 00000000000 1 2 3 4 5 6 7 8 9,10 11 ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTE A: Pins are located within 0.13 (0.005) radius of true position relative to each other at maximum material condition and within 0.25 (0.010) radius relative to the center of the ceramic. TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 ...asas o Cii .g... as .c (,) Q) :E • 8-13 MECHANICAL DATA GB pin-grid-array ceramic package This is a hermetically sealed package with metal cap and gold-plated pins. 100-PiN GB 35.1 (1.3801 32.5 (1.2801 I~ INDEX CORNER ... l 1 4.95 (0.1951 2.54 (0. 1001 - - I I 35.1 (1.3801 32.5 (1.2801 1.40 (0.0651 (0.0451 ~1.14 <~ ",~FL...a-vff~- V-C~0.1" " t~~.u"'---""-~ " "'8 ~ ~~~ -v->r'~tt·" "'~, ~. 2.54 (0.1001 2.54 (0.1001 T'P'1 I OIA (4 PLACESI 2.54 (0.1001 T.P. (So. Note Ai 0 -0-0"--0-0-0--0-0---:-0-0~0 N~: ri0-0+-0"""'0-00 00000000000001 00 000 00 00 00 00 00 30.5 (1.2001 REF H 000 0'00 G 00'0 000 F 000 000 E 00/EXTRAPIN 00 D 00 00 c00 0 000 00 80000000000000 "-----A ~00000000000e 1 2 3 4 5 6 7 8 9 10 11 12 13 ...C I» I» • I 0.406 (0.0161 (100 PLACESI ALL'LlNEAR D(MENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTE A: Pins are located within 0,13 (0.0051 radius of true position relative to each other at maximum material condition and within 0,25 (0.0101 radius relative to the center of the ceramic. 8-14 TEXAS ." INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 MECHANICAL DATA GB pin-grid-array ceramic package This is a hermetically sealed package with metal cap and gold-plated pins. 108-PIN G8 30.8 (1.2121----, 30.0 (1.1801 I INDEX CORNER ' 4.95 (0.1951 2.54 (0'1001~. I f J.50t"(~r-.0" 1+7,11 (0.280) 6,81 (0.2601 2,0 (O.080) NOM 0,25 fO.010) NOM -SEATING 20 PLACES - . \ \ - - : : : PlANE----I:--.-- ~:::~~: 20 PLACES (See Note HI J~~ ., ., (0.076' ~ 1,02 (0.040) 4 PLACes VIEW A Parts may be supplied in accordance with the alternate side view at the option of TI. European-manufactured parts may have pin 1 ilIlshown in view A. Altllrnate-side-view parts manufactured outside of the USA may have a maximum package length of 26,7 (1.050). ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTES: A. Each pin centerline is located within 0,25 (0.0101 of its true longitudinal position. B. This dimension does not apply for solder-dipped leads. C. When solder-dipped leads are specified, dipped area of the lead extends from the lead tip to at least 0,51 (0.0201 above seating plane. II 8-28 TEXAS .., INSTRUMENlS POST OFFICE BOX 655012 • DALLAS, TEXAS 76265 MECHANICAL DATA 24-PIN NT PLASTIC, 0.300-INCH ROW SPACING 31,8 (1.250) ~------------~28~,6~(1~.1~2~5Ii------------~ • '"~: :'.~" '~ i~: '::=i!:::: vvvvvV • I i<---->i-t--7,l (0.280) MAX I....., r---:-r 0,38 (0.015) CD 0 0 0 CD ~ f"6\ 0) CD fii\@t;";'I t;2\ ~ \:.:.I I..:.:J f---2,O (0.080) NOM r l M I N-01 1.--- 1,78 (0.070) 24 PLACES ~-~rT1~1__~l,_14_(~0_.0_4~5)____________________- , ~i ! =- O,25 10.010) NOM 5,08(0.200) MAX 105' -SEATING PLANE go' ~ 24 PLACES ir lV j T ~ I..--- 0,38 (0.014) 0.25 (0.010) 24 PLACES (See Not. B) 406 (0 160) 3'17 (0'125) • 16 (0 085) 0:71 (0:028) - ~ I I ~ --I ~ 1.14 (0.045) MIN 24 PLACES --I f.--- 0,533 (0.021) 2 4 PLACES PIN SPACING 2.54 (0.100) T.P. 0.381 (0.015) 24 PLACES (See Not. B) (See Note A) ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTES: A. Each pin centerline is located within 0,25 (0.0101 of its true longitudinal position. B. This dimension does not apply for solder-dipped leads. C. When solder-dipped leads are specified, dipped area of the lead extends from the lead tip to at least 0,51 10.020) above seating plane. ...co CO C iii () 'r; '" .c () II) :E II TEXAS " INSfRUMENTS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 8-29 MECHANICAL DATA NW PLASTIC (28-PIN PACKAGE SHOWN) 14------36.611.440) MAX------o{ ~ DIM 24 28 40 48 A ±0.25 15.24 15.24 15.24 15.24 (0.0101 (0.6001 (0.600) (0.6001 0.6001 8 (MAX) C ±0.51 (0.020) 32:8 36.6 .53.1 62.2 11.290) (1.440) (2.090) (2.451 1.91 1.27 1.91 1.40 (0.0751 (0.0501 (0.075) (0.055) ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTE A: Each pin centerline is located within 0.25 (0.010) of its true longitudinal position. C ... AS AS II 8-30 . TEXAS'" INSTRUMENlS POST OFFICE BOX 655012 • DALLAS. TEXAS 75265 MECHANICAL DATA P plastic dual-in-line package This dual-in-line package consists of a circuit mounted on an 8-lead frame and encapsulated within a plastic compound. The compound will withstand soldering temperature with no deformation and circuit performance characteristics remain stable when operated in high-humidity conditions. The package is intended for insertion in mounting-hole rows on 7,62-mm (0.300) centers (see Note A). Once the leads are compressed and inserted, sufficient tension is provided to secure the package in the board during soldering. Solder-plated leads require no additional cleaning or processing when used in soldered assembly. a·PIN P PLASTIC 'i. rII '62 (0,3001 T.P.]'i. (0000 (See Note AI rt7 6,36 ± 0.026 (0.250 ± 0.0101 1\1 MAX -*--SEATING PLANE~-~- ~ , . GAUGE PLANE I L0,76 (0.0301 0,00 (0.000) \ J~~ 0.28 ± I 0,08 (0.011 ± 0.003) 8 PLACES 3,17(0.12511 MIN ~ 2,54 (0.100) T.P. 6 PLACES (See Note AI ---l J.- 0,457 ± 0,076 (0.018 ± 0.003) 8 PLACES ALL LINEAR DIMENSIONS ARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES NOTE A: Each pin centerline is located within 0,25 (0.0101 of its true longitudinal position. ...caca o iii u '2 ca oJ: U Q) :E II TEXAS ", INSTRUMENTS POST OFFICE BOX 655012 • DALLAS, TEXAS 75265 8-31 C I» I» II 8-32 TI Sales Offices ALABAMA, Hunlaville (205)837-7530. TI Regional Techriology Centers ARIZONA: Phoenix (602) 995-1007; llIcson (602) 624-3276. CAUFORNIA: Irvine (714) 660-8187; Sacramento (916) 929-1521; San Diego (619) 278-9601; Santa Clara (408) 980-9000; Torrance (213) 217-7010; Woodland Hills (818) 704-n59. CAUFORNIA: Irvine (714) 660-8140, Santa Clara (408) 748-2220. GEORGIA: Norcross (404) 662-7945. ILLINOIS: Arlington Heights (312) 640-2909. COLORADO: Aurora (303) 368-8000. 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MICHIGAN: Farmington Hills (313) 553-1500; Grand Rapids (616) 957-4200. MINNESOTA: Eden Prairie (612) 828-9300. ::.S~~S~~1~~;~7~. (816) 523-2500; Customer Response Center NEW JERSEY: Iselin (201) 750-1050. NEW MEXICO: Albuquerque (505) 345-2555. TOLL FREE: (BOO) 232-3200 ~~~~:d7~~~~I~~:'1~11~ ~-)9l:J:S600; OUTSIDE USA: (214) 995-6611 (8:00 a.m.-5:00 p.m. CST) Plttaford (716) 385..f)770; Poughkeepsie (914) 473-2900. ~~Y;1~)~:2~~1~r;;.~W~r~~~II~~) 838-5422; ~~:n~~~r:I;~!7;:l_~~s6~53*; Wyle (916) 638--5282; San Diego: Arrow (619) 565-4800; Wyle (619) 565-9171; San Francisco Bay Area: Arrow (408) 745-6600,* (415) 487-4600; Santa Clara: Wyle (408) 727-2500.* COLORADO: Aurora: Arrow (303) 696-1111; Thornton: Wyle (303) 457-9953.* CONNECTICUT: Wallingford: Arrow (203) 265-7741. FLORIDA: Ft. lauderdale: ArroN (305) 429-8200; Orlando: Arrow (305) 725-1480; Tampa: Arrow (813) 57tMJ995. GEORGIA: Norcross: Arrow (404) 449-8252. NORTH CAROLINA: CharioUe (704) 527-0930; Raleigh (919) 876-2725. ILLINOIS: Schaumburg: Arrow (312) 397-3440. OHIO: Beachwood (216) 464-6100; Dayton (513) 258-3877. INDIANA: Indianapolis: Arrow (317) 243-9353. IOWA: Cedar Rapids: Arrow (319) 395-7230. OREGON: Beaverton (503) 643-6758. KANSAS: Kansas City: Arrow (913) 541-9542. PENNSYLVANIA: Ft. Washington (215) 643-6450; Coraopolis (412) 771·8550. MARYLAND: Columbia: Arrow (301) 995-0003. PUERTO RICO: Hato Ray (809) 753-8700 MASSACHUSETTS: Woburn: Arrow (617) 933-8130. TEXAS: Austin (512) 250-7655; Houston (713) 778-6592; Richardson (214) 680-5082; San Antonio (512) 496-1779. MICHIGAN: Detroit: Arrow (313) 971-8220; Grand Rapids: Arrow (616) 243-0912. MINNESOTA: Edina: Arrow (612) 830-1800. UTAH: Murray (801) 266-8972. MISSOURI: VIRGINIA: Fairfax (703) 849-1400. St. Louis: Arrow (314) 567-6BBB. ~:a~~~~PSHIRE: Manchester: ArrrY'N (603) WASHINGTON: Redmond (206) 881-3080. WISCONSIN: Brookfield (414) 785-7140. NEW JERSEY: Fairfield: Arrow (201) 575-5300; Marlton: (609) 596-8000. ~~:,~~~';:~~~~~6~6:l~~~11;970; NEW MEXICO: Albuquerque: Arrow (505) 243-4566. St. Laurent, Quebee (514) 335-8392. ~~;;V~!:~~:p~~:r:~:'oo~~516) 231-1000; Syracuse: Arrow (315) 652-1000; Melville: Arrow (516) 694-6800.* NORTH CAROLINA: Raleigh: Arrow (919) 876-3132; Winston Salem: (919) 725-8711OHIO: Cleveland: Arrow (216) 248-3990; Columbus: Arrow (614) 885-8362; Dayton: Arrow (513) 435-5563. OKLAHOMA: liIlsa: Arrow (918) 665-7700. ~l~~~~) ~~~~~~row (503) 684-1690; PENNSYLVANIA: Monroeville: Arrow (412) 856-7000; Marlton: (215) 928-1800. RHODE ISLAND: E. Providence: Arrow (401) 431-0980. TEXAS: Austin: Arrow (512) 835-4180; Wyle (512) 834-9957; Dallas: Arrow (214) 380-6464; Wyle (214) 235-9953*; Houston: Arrow (713) 530-4700; Wyle (713) 879-9953. UTAH: Sait lake City: Arrow (801) 972-0404; Wyle (801) 974·9953. WASHINGTON: Bellevue: Arrow (206) 643-4800; Wyle (206) 453-8300. WISCONSIN: Brookfield: Arrow (414) 792-0150, TEXAS INSTRUMENTS CANADA: Montreal: Arrow Canada (514) 735-5511; Ottawa: Arrow Canada (613) 226-6903; Quebec City: Arrow Canada (418) 687-4231; Toronto: Arrow Canada (416) 661-0220. • Design Center TI Worldwide Sales Offices ALABAMA: Hunl,vil": 500 Wynn Drive, Suite 514, Huntsville, AL 35805, (205) 837-7530. ARIZONA: Phoenix: 8825 N. 23rd Ave., Phoenix, AZ 85021, (602) 995·1007. CALIFORNIA: Irvine: 17891 cartwright Rd., Irvine. ~~~~~~::~~~P~t'1~~i~'t')~~W York Or., Coraopplls: 420 Rouser Rd., 3 Airport Office Park, CoraopoliS, PA 15108, (412) 771·8550. PUERTO RICO: Hato Ray: Mercantil Plaza Bldg., Suite 505, Hato Rey, PR 00919, (609) 753-8700, TEXA~: Austin: P.O. Box 2909, Austil), TX 78769, ~1~~ar~~~fkR~=IOn: 1001 E. Campbell Rd., (214) 680-5082; Houst~: 9100 Southwest Frwy., Suite 237, Houston, TX 77036, (713) 778-6592; San Antonio: 1000 Central Parkway South, San Antonio, TX 78232, (512) 496·1779. CA 92114, (714) 660-8187; Sacramento: 1900 Point ~~~~~,MJr"a~gr'(J,~u~9e;2~ ~J~~ 9~~~:lb~~"o~~..,~~~3 (~~e:) 2~~B:ote., VIRGINIA: Fairfax: 2750 Prosperity, Fairfax, VA 22031, (703) 849-1400. West Way. Suite 171, Sacramento, CA $5815, ~~,~~;: =-~~Vo~~:.~r6gga~~~~~~~, CA Torrance, CA 90502, (213) 217·7010; Woodland HIIII: 21220 Erwin St., Woodland 'HillS, CA 91367, (818) 704-7759. COLORADO: Aurora: 1400 S. Potomac Ave., Suite 101, Aurora, CO 80012, (303) 368-8000. CONNECTICUT: Wallingford: 9 Barnes Industrial Park Rd., Barnes Industrial Park, Wallingford, CT 06492, (203) 269-0074. ' FLORIDA: Ft. Lauderdale: 2765 N.W. 62nd St., Ft. Lauderdale, FL 33309, (305) 973-8502; Maitland: 2601 Maitland Center Parkway, Maitland, FL 32751, (305) 660-4600; Tampa: 5010 W. Kennedy Blvd., Suite 101, Tampa, FL 33609, (813) 870-8420. SE, Suite 200, WASHINGTON: Redmond: 5010 148th NE, Bldg B, Suite 107, Redmontt, WA 98052, (206) 881·3080. WISCONSIN: "'rook.lald: 450 N. Sunny Slope, Suite 150, BrOOkfield, WI 53005, (414) 785·7140. CANADA: Nepa.n: 301 Moodie Drive, Mallom Center, Nepean, Ontario, Canada, K2H9C4, (613) 726·1970. Richmond Hili: 280 Centre St. E., Richmond Hili L4C1B1, OntarlQ, Canada (416) 884·9181; St. Laurent: Ville SI. Laurent Quebec, ~~~aJ!a~:s~~nt~~1~)1~5~9~~urent, Quebec, ~~r:::n~~F~~t~~~I:f3~:~:~~~:Frasse 1, D.arH\O Frelsing, 8161 +80-4591; Kurtuerstendamm 1951196,0·1000 Bertin 15, 30+882·7365; III, Hagen 431Kibbelstrasse, .19, 0-4300 Essen, 201·24250; , Frankfurter Allee 6-8, 0-6236 Eschborm 1, 06196+8010; Hamburgerstrasse 11, 0·2000 Hamburg 76, 040+22().1154, Kirchhorsterstr~se 2, D'~ ~~~~vg~~11'd;!~ 2~~~~~~"~'~~~~~; ", ~~~~~:'~~:Ms, ~=t~sebu1rl. ~~+:~~I~~'; 261 +35044. HONG KONG (+ PEOPLES REPUBLIC OF CHINA): Texas Instruments Asia Ltd., 8th Floor, World Shipping Ctr., Harbour City, 7 Canton Rd., Kowloon, Ho~g Kdng, 3 + 722·1223. IRELAND: Texas Instruments (Ireland) Limited: Brewery Ad., Stillorgan, County Dublin, Eire, 1831311. ITALY: Texas Instruments Semiconduttorl Italia Spa: Viale Delle SClenze, 1,02015 Ciltaducale (Rleti), Italy, 746 694.1; Via Salarla KM 24 (Palazzo Cosma), Monte ), Italy, 6+9003241; Vlale no Monzese (Milano), 0100 Torino, limy, Cors Via J. Barozzi 6, 40100 Bologna, Italy, 51 355851, JAPAN: Texas Instruments Asia Ltd.: 4F Aoyama Full Bldg., 6·12, Kite Aoyama 3-Chome, Mlnato.ku, Tokyo, Japan 107, 3-498-2111; Osaka Branch, 5F, ~:~=~j!~~ 8~~~, ~~~~~i~:2~~';1; Nagoya Branch, 7F Dalnl Toyota West Bldg., 10-27, Meleki 4·Chome, Nakamura·ku Nagoya, Japan 450, 52·583-8691, GEORGIA: Norcross: 5515 Spalding Drive, Norcross, GA 30092, (404) 662-7900 ARGENTINA: Texas Instruments Argentina S.A.l.e,F.: E8mer~lda 130, 15th Floor, 1035 Buenos Aires, Argentina, 1 +394-3008. !:"r~il~g~~~: ~!\~t~~~LH=~: (~~:) ~t~R~~.qUin, AUSTRALIA (6 NEW ZEALAND): Texas Instruments Australia Ltd,: 6·10 Talavera Rd., North Ryde :~~~~: (~~'9~:J~~:~~ ~~d~~~1 ~~ 5~~u~~~~4~~ :t~S~~:~ ~~~: MEXICO: Texas Instruments de Mexico S.A.: Mexico g~~: ~f~~m5~!$oo~~ - 10th Floor, Mexico, 8 + 255-2066. MIDDLE EAST: Texas Instruments: No. 13, 1st Floor Inwood Or" Ft. Wayne: Indianapolis: 2346 S. Lynhurst, Suite J-400, Indianapolis, IN 46241, (317) 248-8555, IOWA: Cedar Rapids: 373 Collins Rd, NE, Suite 200, Cedar Rapids, IA 52402, (319) 395·9550. MARYLAND: aaltlmore: , Rutherford Pl., 7133 Rutherford Rd., Baltimore, MD 21207, (301) 944-8600. MASSACHUSETTS: Waltham: 504 Totten Pond Rd., Waltham, MA 02154, (61'7) 895·9100, Melbourne, Victoria, Australia 3004, 3 + 267-4677; 171 Philip Highway, Elizabeth, South Australia 5112, AUSTRIA: Texas Instruments Ges.m.b.H.: Industriestrabe B116, A·2345 8runnf(lebirge, 2236-846210, ~~~;J~Mde~~:~ ~~~~~rr::~~:R:18~u~ ~u~e, =~~':T~r,~~':d~~'~o':~~~ (~o~s: PB106, ~~~~~~~: ~~~I~t~~~I,I(1;i)7~~~5M. Mile Ad" DENMARK: Texas Instruments AlS, Mairelundvej 46E, DK·2730 Herlev, Denmark, 2 • 91 74 00. ~i\~~~R~:4~f:.ia~~1~3~yvard FINLAND: Texas Instruments Finland OY: Teollisuuskatu 19000511 Helsinki 51, Finland, (90) 701·3133. FRANCE: Texas Instruments France: Headquarters and Prod. Plant, BP 05, 06270 Vilieneuve·Loubet, ~~r:~~~~I;nr:rls Office, BP 67 8-10 Avenue ~~~I;~¥,1(5~~i~~;.g~&tP?iS~:c.~, ~~~~~~'St., Pittsford, NY 14534, ~'6) 385·6770; ~,=r,;(~':~)~i3-~~~ Rd., Poughkeepsie, NORTH CAROLlt;l4: Charlotte: 8 Woodlawn Green, Woodlawn Rd., Chartotte, NC 28210, (704) 527-0930; ~~aJ¥:~:'~~~iB~":'~7::' Blvd., Suite 100, Raleigh, OHIO: Beachwood: 23408 Commerce Pari< Rd., Beachwood, OH 44122, (216) 464-6100; g-:r':~~~(§f1)Y2:~\'7i.124 linden Ave., Dayton, OREGON: Beaverton: 6700 SW 105th St., Suite 110, Beaverton, OR 97005, (50;1) 643-6758. ~:!tl~~e~~~!~i~,d~hig~:rn::~f.. g;~f; PORTUGAL: Texas Instruments Equipamento G:~t~~~ (:~:W:IBaL~aala~~~7~n~.f!~~r~~~al, 2·948-1003. '~A~t:3:: 4:x=?~:tr~~~rse:!~~ ~:~~Sl~;ong Bak~ Batu, Unit 01·02, Kolam Ayer Industrial Estate, Republic of Singapore, 747·2255. SPAIN: Texas Instruments Espana, S.A.: CfJose Lazaro Galdiano No.6, Madrid 16, 1f458.14.58. ~~~A~~~~~u~~b~~U;~~~:, f:£"~4~~~~3~ent Pkwy ~:::CJ!!~~:ye;-;~~3~~~~9r;ollamer Dr., East, Endicott: 112 Nanticoke Ave., P.O. Box 618, Endicott, NY 13760, (607) 754·3900; Malvilla: 1 Huntington ~:~~aB~~r.?~~I~~~f~~ ~~~ :7~·+~~~~35, NETHERLANDS: Texas Instruments Holland B.V., P.O. Box 12995, (Bullewijk) 1100 CB Amsterdam, Zuid·Oost, Holland 20 + 5602911. PHILIPPINES: Texas Instruments Asia Ltd.: 14th MINNESOTA: Edan Pralrla: 11000 W, 78th $t., Eden Prairie, MN 55344' (612) 828·9300. NEW JERSEY: Isalln: 485E U.S, Route 1 South, Parkway Towers, Iselin, NJ 08830 (201) 750·1050 ~~g~~:?~O~~~S:4e~~fangnam.ku, 1130 Brussels, Belgium, 21720.80.00. BRAZIL: Texas Instruments Electronicos do Brasil Ltda.: Rua Paes Leme, 524·7 Andar Pinheiros, 05424 Sao Paulo, Brazil, 0815-6166. PkWY" Kansas St. Louis: 11816 Borman Drive, SI. Louis, MO 63148, (314) 589-7600. KOREA: Texas Instruments Supply Co.: 3rd Floor, 3, Quai Kleber, 67055 Strasbourg Cedex, SWEDEN: Texas Instruments InternationaJ Trade Corporation (Sverigefilialen): Box 39103, 10054 Stockholm, Sweden, 8 . 235480. Le Peripole-2, Chemin du Plgeonnler de la Caplere, 31100 Toulouse, (61) 44·18-19; Marseille Sales Office, ~~11~7~~38~s-146 Rue Paradis, 13006 Marseille, SWITZERLAND: Texas Instruments, Inc., Reidstrasse 6, CH·8953 Dielikon (ZueriCh) Switzerland, 1-7402220, ~s:l~2~:~6~s~~e~1'~:~; ~~I~~~u~:I~~?~~e, • TEXAS INSTRUMENTS ~~~~~~~:~SR~~¥~~~~~~~gl~~~~ ~~~,903, Taiwan, Republic of China, 2 + 521-9321 . UNITED KINGDOM: Texas Instruments limited: Manton Lane, Bedford, MK41 7PA, England, 0234 ~~:cs:~~~, JS~e~R~~Esn~I~~,Ii~~~~~'~~2~orth, 8M ." 986-100 Printed in U.S.A. TEXAS INSTRUMENTS SRSDOO1
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