EMC Design Guide For ST Microcontrollers AN1709

• 1 EMC definitions
  • 1.1 EMC
  • 1.2 EMS
  • 1.3 EMI
• 2 EMC characterization of STMicroelectronics microcontrollers
  • 2.1 Electromagnetic susceptibility (EMS)
    • 2.1.1 Functional EMS test
      • Table 1. ESD standards
      • Table 2. FTB standards
      • Table 3. ST ESD severity levels
      • Table 4. ST behavior classes
      • Table 5. F_ESD / FTB target level & acceptance limit
      • Table 6. Example of F_ESD / FTB test results
    • 2.1.2 Latch-up (LU)
      • Table 7. Example of the LU test result on STM32L062K8
    • 2.1.3 Absolute electrical sensitivity
  • 2.2 Electromagnetic interference (EMI)
    • 2.2.1 EMI radiated test
      • Table 8. Spectrum analyzer resolution bandwidth versus frequency range (broadband EMI)
    • 2.2.2 EMI level classification
      • Table 9. Example of EMI results on STM32
• 3 ST MCU design strategy and EMC specific feature
  • 3.1 Susceptibility
    • 3.1.1 Brownout reset (BOR)
    • 3.1.2 Programmable voltage detector (PVD)
    • 3.1.3 I/O features and properties
  • 3.2 Emission
    • 3.2.1 Internal PLL
    • 3.2.2 Global low-power approach
    • 3.2.3 Output I/O current limitation and edge timing control
• 4 EMC guidelines for MCU based applications
  • 4.1 Hardware
    • 4.1.1 Optimized PCB layout
    • 4.1.2 Power supply filtering
    • 4.1.3 I/O configuration
    • 4.1.4 Shielding
  • 4.2 Handling precautions for ESD protection
  • 4.3 Firmware
  • 4.4 Web links to EMC related organization
• 5 Conclusion
• Appendix A EMI classification before December 14 2015
  • Table 10. Spectrum analyzer resolution bandwidth versus frequency range (narrowband EMI)
• Revision history
  • Table 11. Document revision history