027L031 E Rpt.... _V8420_ V8420 /Deluxe /128M V8420Deluxe ALL
User Manual: V8420 /Deluxe /128M EMC Safety certificates
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ReportNo. 027L031E
Appendix Report
Product Name : VGA Card
Model No
: V8420/Deluxe/128M
Applicant ASUSTeK COMPUTER INC.
Address
4Fl., No. 150, Li-Te Rd., Peitou, Taipei, Taiwan, R.O.C.
Date of Receipt Jul 10, 2002
Date of Test
Jul 10, 2002
Report No.
027L031E
The test results relate only to the samples tested.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Page : 1 of 28
Version:1.0
Declaration of Conformity
The following products is herewith confirmed to comply with the requirements set out in the Council
Directive on the Approximation of the laws of the Member States relating to Electromagnetic
Compatibility Directive (89/336/EEC). The listed standard as below were applied:
The following Equipment:
Product
Trade Name
Model Number
: VGA Card
: ASUS
: V8420/Deluxe/128M
This product is herewith confirmed to comply with the requirements set out in the Council
Directive on the Approximation of the laws of the Member States relating to Electromagnetic
Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following
standards were applied:
RFI Emission:
EN 55022:1998 Class B
: Product family standard
EN 61000-3-2:1995 Class D : Limits for harmonic current emission
Amendment 1:1998
Amendment 2:1998
Amendment 14:2000
EN 61000-3-3:1995
: Limitation of voltage fluctuation and flicker in low-voltage supply system
Immunity :
EN 55024:1998
Product family standard
The following importer/manufacturer is responsible for this declaration:
Company Name
:
Company Address
:
Telephone
:
Facsimile :
Person is responsible for marking this declaration:
Name (Full Name)
Position/ Title
Date
Legal Signature
ReportNo. 027L031E
TA B L E O F C O N T E N T S
Description
1.
1.1.
1.2.
1.3.
1.4.
1.5.
2.
2.1.
2.2.
2.3.
2.4.
2.5.
2.6.
3.
3.1.
3.2.
3.3.
3.4.
3.5.
3.6.
4.
4.1.
4.2.
4.3.
4.4.
4.5.
4.6.
5.
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
6.
7.
7.1.
7.2.
7.3.
Page
General Information ...................................................................................................................5
EUT Description............................................................................................................................5
Tested System Details....................................................................................................................6
Configuration of tested System .....................................................................................................7
EUT Exercise Software .................................................................................................................8
Test Facility ...................................................................................................................................8
Conducted Emission....................................................................................................................9
Test Equipment List.......................................................................................................................9
Test Setup ......................................................................................................................................9
Limits ..........................................................................................................................................10
Test Procedure .............................................................................................................................10
Test Specification ........................................................................................................................10
Test Result ...................................................................................................................................10
Radiated Emission.....................................................................................................................11
Test Equipment............................................................................................................................11
Test Setup ....................................................................................................................................11
Limits ..........................................................................................................................................12
Test Procedure .............................................................................................................................12
Test Specification ........................................................................................................................12
Test Result ...................................................................................................................................12
Power Harmonics and Voltage Fluctuation ............................................................................13
Power Harmonics and Voltage Fluctuation Test Equipment List ................................................13
Test Setup ....................................................................................................................................13
Limits ..........................................................................................................................................13
Test Procedure .............................................................................................................................14
Test Specification ........................................................................................................................14
Test Result ...................................................................................................................................14
Electrostatic Discharge (ESD) ..................................................................................................15
Test Equipment............................................................................................................................15
Test Setup ....................................................................................................................................15
Test Level ....................................................................................................................................15
Test Procedure .............................................................................................................................16
Test Specification ........................................................................................................................16
Test Result ...................................................................................................................................16
EMC Reduction Method During Compliance Testing ...........................................................17
Test Result ..................................................................................................................................18
Test Data of Conducted Emission ...............................................................................................19
Test Data of Radiated Emission ..................................................................................................21
Test Data of Electrostatic Discharge ...........................................................................................25
ATTACHMENT 1:
EUT TEST PHOTOGRAPHS
ATTACHMENT 2:
EUT DETAILED PHOTOGRAPHS
REFERENCE
LABORATORY OF LICENSE
:
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ReportNo. 027L031E
1.
General Information
1.1.
EUT Description
Product Name
VGA Card
Trade Name
ASUS
Model No.
V8420/Deluxe/128M
EUT Voltage
Power by PC
Note:
1. The EUT have one D-sub port, one DVI port, one 3D glasses port, one S-video-out port
,one AV-video-out port, one S-video-in port, ,one AV-video-in port.
2.
This appendix report was based on Quietek report No.025L011E.
3.
The EUT have three models, the different between them as below:
V8420/Deluxe/128M, GPU: nvidia’s Geforce4 Ti4200
V8460/Deluxe;V8460/TDV, GPU: nvidia’s Geforce4 Ti4600
V8440/Deluxe;V8440/TDV, GPU: nvidia’s Geforce4 Ti4400
4.
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined as:
EMI
Test
Mode 1: 1920*1440/75Hz, D-sub+DVI
Mode 2: 1600*1200/85Hz, D-sub+S-video+AV
EMS
Test
Mode 1: 1920*1440/75Hz, D-sub+DVI
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ReportNo. 027L031E
1.2.
Tested System Details
The types for all equipment, plus descriptions of all cables used in the tested system (including
inserted cards ) are:
Product
Manufacturer
Model No.
Serial No.
FCC ID
PC
N/A
N/A
N/A
N/A
PC Case
Chenbro
B6251-200
N/A
N/A
Mother Board
Asus
P4S333-M
N/A
N/A
CPU
Intel Pentium-4 2.2GHz/100MHz
H.D.D.
Quantum
KX20A011
N/A
N/A
CD-ROM
LITE-ON
LTN-485S
N/A
N/A
F.D.D.
NEC
FD1231H
N/A
N/A
VGA Card
EUT
EUT
N/A
N/A
Sound Card
On Board
Lan Card
On Board
S.P.S.
Seven team
ST-250BLP
N/A
(2)
Monitor
SONY
CPD-G500
2737939
FCC DOC
(3)
Printer
EPSON
Color 680
015999
N/A
(4)
Modem
ACEEX
DM-1414
0102027548
IFAXDM1414
(5)
Joystick
GENIUS
MAXFIRE FORCE
CJ0100200517 FSUGG09
(1)
G-09D
(6)
Cassette
AIWA
HS-TA164
N/A
FCC DC
(7)
3D glasses
EUT
N/A
N/A
N/A
(8)
PS/2 Keyboard
HP
SK-2506
C00083358
FCC DOC
(9)
Microphone&
TOKTO
SX-MI
N/A
FCC DOC
(10) PS/2 Mouse
SYNNES
MW3-P
000120549
FCC DOC
(11) USB Mouse
Logitech
LZE20852001
FCC DOC
(12) USB Mouse
Logitech
M-BE58
M-BE58
(13) Color Monitor
SONY
PVM-14M2U
105742
FCC DOC
(14) DVI Monitor
TATUNG
L5TDS
N/A
FCC DOC
(15) DVD
Mustek
V560
N/A
FCC DOC
(16) D8
SONY
DCR-TRV5250
1081754
FCC DOC
Earphone
LZE20806612 FCC DOC
Note: 1. The power cord of the device 1, 2, 3, 4, 14and 15 are non-shielded power cord.
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ReportNo. 027L031E
Signal Cable Type
Signal cable Description
A.
RS232 cable
Shielded, 1.5m
B.
Joystick cable
Shielded, 1.8m
C.
Audio cable
Non-Shielded, 1.2m
D.
3D glasses cable
Non-Shielded, 1.5m
E.
VGA cable
Shielded, 1.8m with core*2
F.
Earphone & Microphone cable
Non-Shielded, 1.8m
G.
PS/2 Keyboard cable
Shielded, 1.8m
H.
S-video cable
Shielded, 1.5m
I.
PS/2 mouse cable
Shielded, 1m
J.
DVI cable
Shielded, 1.8m
K.
USB mouse cable
Shielded, 1.5m
L.
USB mouse cable
Shielded, 1.5m
M. AV (RCA) cable
Non-Shielded, 1.2m
N.
S-video cable
Shielded, 1.5m
O.
AV (RCA) cable
Non-Shielded, 1.2m
P.
Printer cable
Shielded, 1.5m
Q.
LAN cable
Non-Shielded, 7m
1.3.
Configuration of tested System
LAN
Q
A
P
E
Modem
(4)
Monitor
(2)
PC (1)
B
D
G
O
L
EUT:VGA Card
C
Printer
(3)
N
K
F
M
H
DVD
(15)
J
Joystick
(5)
Cassette
(6)
3D
glasses
(7)
Earphone &
Microphone
(9)
D8
(16)
I
P S/2 Keyboard
(8)
Color Monitor
(13)
DVI Monitor
(14)
P S/2
M ouse
(10)
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USB
M ouse
(11)
USB
M ouse
(12)
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ReportNo. 027L031E
1.4.
EUT Exercise Software
1. Setup the EUT and simulators as shown on 1.3.
2. Turn on the power of all equipment.
3. Adjust to appropriate video resolution and run Windows.
4. Run “EMI-TEST、“Media Player” test program and play Audio.
5. EUT will sends “H” pattern to monitor, the monitor will show “H” pattern on the screen.
6. EUT sends “H” pattern to printer, the printer will print “H” pattern on paper.
7. EUT Connect another simulation PC through LAN port and carry out Read/Write work each other.
8. Repeat the above procedure (3) to (7).
1.5.
Test Facility
Ambient conditions in the laboratory:
Items
Test Item
Required (IEC 68-1) Actual
15-35
20-35
30-60
50-60
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
20-35
10-75
50-65
860-1060
950-1000
15-35
20-35
25-75
50-65
860-1060
950-1000
Temperature (°C)
IEC 61000-4-2
Humidity (%RH)
IEC 61000-4-5
Humidity (%RH)
Barometric pressure (mbar)
Temperature (°C)
Humidity (%RH)
Barometric pressure (mbar)
IEC 61000-4-4
IEC 61000-4-8
IEC 61000-4-11
Site Description:
June 30, 2002 Accreditation on NVLAP
NVLAP Lab Code: 200533-0
June 11, 2001 Accreditation on DNV
Statement No. : 413-99-LAB11
May 03, 2001 Accreditation on TUV Rheinland
Certificate No.: I9865712-9901
April 24, 2001 Accreditation on Nemko
Certificate No.: ELA 165
Certificate No.: ELA 162
Site Name:
Site Address:
Quietek Corporation
No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen,
Lin-Kou Shiang, Taipei,
Taiwa, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
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2.
Conducted Emission
2.1.
Test Equipment List
The following test equipment are used during the conducted emission test:
Item Instrument
Manufacturer
Type No./Serial No
Last Cal..
Remark
1
Test Receiver
R&S
ESCS 30/838251/0001
May, 2002
2
L.I.S.N.
R&S
ESH3-Z5/836679/0023 May, 2002
EUT
3
L.I.S.N.
R&S
ENV 4200/833209/0023 May, 2002
Peripherals
4
Pulse Limiter
R&S
ESH3-Z2
5
N0.4 Shielded Room
May, 2002
N/A
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
2.2.
Test Setup
Shielded Room
≧0.8m
40cm
Peripheral
( EUT )
80cm
AMN for
Peripheral
AMN for EUT
50 ohm Terminator
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Test Receiver
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ReportNo. 027L031E
2.3.
Limits
EN 55022 Limits (dBuV)
Frequency
Class A
MHz
QP
AV
QP
AV
0.15 - 0.50
79
66
66-56
56-46
0.50-5.0
73
60
56
46
5.0 - 30
73
60
60
50
Remarks :
2.4.
Class B
In the above table, the tighter limit applies at the band edges.
Test Procedure
The EUT and simulators are connected to the main power through a line impedance stabilization
network (L.I.S.N.).
This provides a 50 ohm /50uH coupling impedance for the measuring
equipment. The peripheral devices are also connected to the main power through a LISN that
provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please refers to the block
diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must be
changed according to EN 55022:1998 on conducted measurement.
Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a
receiver bandwidth of 9kHz.
2.5.
Test Specification
According to EN 55022:1998
2.6.
Test Result
The emission from the EUT was below the specified limits. The worst-case emissions are shown in
section 13. The acceptance criterion was met and the EUT passed the test.
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3.
Radiated Emission
3.1.
Test Equipment
The following test equipment are used during the radiated emission test:
Test Site
Equipment
Site # 1
Site # 2
Site # 3
3.2.
Manufacturer
Model No./Serial No.
Last Cal.
Test Receiver
R&S
ESVS 10 / 834468/003
July, 2002
Spectrum Analyzer
Advantest
R3162/ 00803480
May, 2002
Pre-Amplifier
Advantest
BB525C/ 3307A01812
May, 2002
Bilog Antenna
SCHAFFNER
CBL6112B / 2697
Nov., 2001
Test Receiver
R&S
ESCS 30 / 836858 / 022
Nov., 2001
Spectrum Analyzer
Advantest
3162 / 100803466
May, 2002
Pre-Amplifier
Advantest
BB525C/3307A01814
May, 2002
Bilog Antenna
SCHAFFNER
CBL6112B / 2705
Oct., 2001
Test Receiver
R&S
ESI 26 / 838786 / 004
May, 2002
Spectrum Analyzer
Advantest
3162 / 100803480
May, 2002
Pre-Amplifier
QTK
QTK-AMP-03 / 0003
May, 2002
Bilog Antenna
SCHAFFNER
CBL6112B / 2697
May, 2002
Horn Antenna
ETS
3115 / 0005-6160
July, 2002
Pre-Amplifier
QTK
QTK-AMP-01 / 0001
July, 2002
Test Setup
10m
FRP Dome
Non-Conducted Table
1m to 4m
Antenna Mast
Broadband or Dipole
Antenna
Antenna height can be
moved from 1m to 4m.
EUT
80cm
Test
Receiver
Fully Metal Mesh Ground Plane
Page : 11 of 28
To Controller
To Receiver
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ReportNo. 027L031E
3.3.
Limits
EN 55022 Limits (dBuV/m)
Frequency
3.4.
Class A
Class B
MHz
Distance
(m)
dBuV/m
Distance
(m)
dBuV/m
30 – 230
10
40
10
30
230 – 1000
10
47
10
37
Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn
table can rotate 360 degrees to determine the position of the maximum emission level. The EUT
was positioned such that the distance from antenna to the EUT was 10 meters.
The antenna can move up and down between 1 meter and 4 meters to find out the maximum
emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order to find
the maximum emission, all of the interface cables must be manipulated according to
EN55022:1998 on radiated measurement.
Radiated emissions were invested over the frequency range from 30MHz to1GHz using a
receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10
meters.
3.5.
Test Specification
According to EN 55022:1998
3.6.
Test Result
The emission from the EUT was below the specified limits. The worst-case emissions are shown in
section 13. The acceptance criterion was met and the EUT passed the test.
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4.
Power Harmonics and Voltage Fluctuation
4.1.
Power Harmonics and Voltage Fluctuation Test Equipment List
Item
Instrument
Manufacturer
1
Power Harmonics Tester SCHAFFNER
Type No/Serial No.
Last Calibration
Profline 2105-400
Jun., 2002
S/N: HK54148
2
Analyzer
3
No.3 Shielded Room
SCHAFFNER
CCN 1000-1/X71887
Jun., 2002
N/A
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
4.2.
Test Setup
Controller
PC
Power Analyzer
Impedance Network
EUT
Power Source
Load
Non-Conducted
4.3.
Limits
¾Limits of Harmonics Currents
Harmonics
Order
Maximum Permissible
harmonic current
(in amperes)
Harmonics
Order
Odd harmonics
Maximum Permissible
harmonic current
(in amperes)
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
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4.4.
Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same normal
voltage and frequency as the rated supply voltage and the equipment under test. And the rated
voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.
4.5.
Test Specification
According to EN 61000-3-2:1995, , Amendment 1:1998, Amendment 2:1998, Amendment 14:2000
and EN 61000-3-3:1995
4.6.
Test Result
The measurement of the power harmonics, which test at the extremes of EUT’s supply range, was
investigated and test result was shown in section 13. The acceptance criterion was met and the
EUT passed the test.
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5.
Electrostatic Discharge (ESD)
5.1.
Test Equipment
Item
Instrument
Manufacturer
Type No/Serial No.
Last Calibration
1
ESD Simulator System
KeyTek
MZ-15/EC
S/N:0112372
Jun., 2002
2
Horizontal Coupling
Plane(HCP)
QuieTek
HCP AL50
N/A
3
Vertical Coupling
Plane(VCP)
QuieTek
4
No.3 Shielded Room
VCP AL50
N/A
N/A
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
5.2.
Test Setup
Vertical Coupling Plane
EUT
Insulation
Loads:
Active
Horizontal Coupling Plane
80cm
470K ohm
Resistor
ESD
Simulator
Non-Conducted table
Metal Ground Plane
470K ohm Resistor
5.3.
Test Level
Item
Environmental Phenomena Units
Test Specification
Performance Criteria
Enclosure Port
Electrostatic Discharge
kV(Charge Voltage)
± 8 Air Discharge
B
± 4 Contact Discharge
Remark:
The Contact discharges were applied – at least total 200 discharges at a minimum of four test points.
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5.4.
Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge time
between successive single discharges will be keep longer 1 second. It was at least ten single
discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked on the
red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a
distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at least ten
single discharges with positive and negative at the same selected point.
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned vertically
at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling
plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at least ten
single discharges with positive and negative at the same selected point.
5.5.
Test Specification
According to IEC 61000-4-2:1995
5.6.
Test Result
The measurement of the electrostatic discharge was investigated and test result was shown in
section 13. The acceptance criterion was met and the EUT passed the test.
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6.
EMC Reduction Method During Compliance Testing
No modification was made during testing.
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7.
Test Result
The test results in the emission and the immunity were performed according to the requirements of
measurement standard and process. Quietek Corporation is assumed full responsibility for the
accuracy and completeness of these measurements. The test data of the emission is listed as below.
All the tests were carried out with the EUT in normal operation, which was defined as:
EMI
Test
Mode 1: 1920*1440/75Hz, D-sub+DVI
Mode 2: 1600*1200/85Hz, D-sub+S-video+AV
EMS
Test
Mode 1: 1920*1440/75Hz, D-sub+DVI
Note :
No Deviation from standard procedure
Deviations from standard procedure
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7.1.
Test Data of Conducted Emission
Date of Test
Jul 10, 2002
Test Room No.4 Shielded Room
Test Mode
Mode 1: 1920*1440/75Hz, D-sub+DVI
Product
Test Condition Line1 & Line2
Frequency
VGA Card
Test Range 0.15MHz – 30MHz
Measurement Level (dBuV)
Limits (dBuV)
MHz
Line1 QP
Line1 AV
Line2 QP
Line2 AV
QP
AV
0.166
45.43
43.61
--
--
65.16
55.16
0.166
--
--
50.18
46.51
65.17
55.17
0.201
--
--
40.61
38.31
63.58
53.58
0.232
37.29
35.01
--
--
62.38
52.38
0.232
--
--
37.84
32.11
62.38
52.38
0.299
35.89
32.21
--
--
60.26
50.26
0.301
--
--
39.62
35.61
60.21
50.21
9.472
33.95
33.53
--
--
60.00
50.00
10.590
36.00
35.45
--
--
60.00
50.00
11.727
--
--
38.42
37.61
60.00
50.00
16.539
35.70
34.93
--
--
60.00
50.00
17.313
--
--
38.63
38.21
60.00
50.00
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. Measurement Level = Reading Level + LISN Factor + Cable loss.
3. “--“, means the average measurement was not performed when the Quasi-peak measured data
under the limit of average detection.
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Date of Test
Jul 10, 2002
Test Room
No.4 Shielded Room
Test Mode
Mode 2: 1600*1200/85Hz, D-sub+S-video+AV
Product
VGA Card
Test Range
0.15MHz – 30MHz
Test Condition Line1 & Line2
Frequency
Measurement Level (dBuV)
Limits (dBuV)
MHz
Line1 QP
Line1 AV
Line2 QP
Line2 AV
QP
AV
0.166
42.42
39.91
--
--
65.18
55.18
0.166
--
--
47.91
44.51
65.18
55.18
0.201
--
--
39.47
37.71
63.58
53.58
0.233
37.67
35.81
--
--
62.33
52.33
0.233
--
--
40.27
35.31
62.33
52.33
0.300
31.92
29.41
--
--
60.24
50.24
0.302
--
--
38.33
34.11
60.18
50.18
0.366
--
--
30.83
26.71
58.59
48.59
0.369
27.29
25.41
--
--
58.53
48.53
17.242
--
--
35.12
34.81
60.00
50.00
17.269
35.43
34.91
--
--
60.00
50.00
18.376
32.06
31.78
--
--
60.00
50.00
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. Measurement Level = Reading Level + LISN Factor + Cable loss.
3. “--“, means the average measurement was not performed when the Quasi-peak measured data
under the limit of average detection.
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ReportNo. 027L031E
7.2.
Test Data of Radiated Emission
Date of Test
Jul 10, 2002
Test Site
No.3 OATS
Test Mode
Mode 1: 1920*1440/75Hz, D-sub+DVI
Product
VGA Card
Test Range
30MHz – 1GHz
Test Condition 10m & Horizontal
Frequency
Cable
Probe
Pre-Amp
Reading
Emission
Margin
Limit
Loss
Factor
Factor
Level
Level
MHz
(dB)
(dB/m)
(dB)
(dBuV/m)
(dBuV/m)
(dB)
(dBuV/m)
67.354
1.06
5.99
0.00
12.34
19.39
-10.61
30
130.063
1.38
11.59
0.00
11.43
24.40
-5.60
30
173.424
1.61
8.69
0.00
15.38
25.68
-4.32
30
231.191
1.9
9.57
0.00
18.02
29.49
-7.51
37
289.059
2.2
11.94
0.00
16.02
30.16
-6.84
37
390.188
2.73
14.12
0.00
12.38
29.23
-7.77
37
520.250
3.40
16.52
0.00
9.02
28.94
-8.06
37
750.800
4.58
18.49
0.00
5.28
28.35
-8.65
37
900.479
5.35
19.59
0.00
6.64
31.58
-5.42
37
Note:
1. All Reading Levels below 1GHz are Quasi-Peak.
2. Emission Level = Reading Level + Probe Factor + Cable loss – Preamp.
3. Margin = Limit - Emission Level
Radiation Measurement data
50
Field Strength(dBuV/m)
Emission Level
40
Limit
30
20
10
0
10
100
Frequency(MHz)
Page : 21 of 28
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Date of Test
Jul 10, 2002
Test Site
No.3 OATS
Test Mode
Mode 1: 1920*1440/75Hz, D-sub+DVI
Product
VGA Card
Test Range
30MHz – 1GHz
Test Condition 10m & Vertical
Frequency
Cable
Probe
Pre-Amp
Reading
Emission
Margin
Limit
Loss
Factor
Factor
Level
Level
MHz
(dB)
(dB/m)
(dB)
(dBuV/m)
(dBuV/m)
(dB)
(dBuV/m)
56.004
1.00
5.60
0.00
10.03
16.63
-13.37
30
130.062
1.38
10.59
0.00
12.12
24.09
-5.91
30
151.743
1.49
9.28
0.00
13.27
24.04
-5.96
30
173.421
1.61
8.39
0.00
12.76
22.76
-7.24
30
231.191
1.90
9.87
0.00
15.78
27.55
-9.45
37
289.010
2.20
12.29
0.00
17.76
32.25
-4.75
37
361.302
2.58
14.38
0.00
10.95
27.91
-9.09
37
520.253
3.40
16.66
0.00
8.88
28.94
-8.06
37
780.377
4.73
19.88
0.00
7.14
31.75
-5.25
37
900.424
5.35
20.90
0.00
5.81
32.06
-4.94
37
ZNote:
1. All Reading Levels below 1GHz are Quasi-Peak.
2. Emission Level = Reading Level + Probe Factor + Cable loss – Preamp.
3. Margin = Limit - Emission Level
Radiation Measurement data
50
Field Strength(dBuV/m)
Emission Level
40
Limit
30
20
10
0
10
100
Frequency(MHz)
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Date of Test
Jul 10, 2002
Test Site
No.3 OATS
Test Mode
Mode 2: 1600*1200/85Hz, D-sub+S-video+AV
Product
VGA Card
Test Range
30MHz – 1GHz
Test Condition 10m & Horizontal
Frequency
Cable
Probe
Pre-Amp
Reading
Emission
Margin
Limit
Loss
Factor
Factor
Level
Level
MHz
(dB)
(dB/m)
(dB)
(dBuV/m)
(dBuV/m)
(dB)
(dBuV/m)
67.299
1.06
5.96
0.00
13.38
20.40
-9.60
30
126.256
1.36
11.57
0.00
12.72
25.65
-4.35
30
176.284
1.62
8.43
0.00
14.12
24.17
-5.83
30
227.140
1.88
9.08
0.00
15.70
26.66
-3.34
30
341.782
2.48
12.95
0.00
14.68
30.11
-6.89
37
383.986
2.69
14.01
0.00
12.32
29.02
-7.98
37
520.250
3.40
16.52
0.00
8.23
28.15
-8.85
37
687.314
4.25
18.60
0.00
10.26
33.11
-3.89
37
940.050
5.55
19.95
0.00
5.29
30.79
-6.21
37
Note:
1. All Reading Levels below 1GHz are Quasi-Peak.
2. Emission Level = Reading Level + Probe Factor + Cable loss – Preamp.
3. Margin = Limit - Emission Level
Radiation Measurement data
50
Field Strength(dBuV/m)
Emission Level
40
Limit
30
20
10
0
10
100
Frequency(MHz)
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ReportNo. 027L031E
Date of Test
Jul 10, 2002
Test Site
No.3 OATS
Test Mode
Mode 2: 1600*1200/85Hz, D-sub+S-video+AV
Product
VGA Card
Test Range
30MHz – 1GHz
Test Condition 10m & Vertical
Frequency
Cable
Probe
Pre-Amp
Reading
Emission
Margin
Limit
Loss
Factor
Factor
Level
Level
MHz
(dB)
(dB/m)
(dB)
(dBuV/m)
(dBuV/m)
(dB)
(dBuV/m)
67.300
1.06
5.96
0.00
15.90
22.92
-7.08
30
140.859
1.44
9.95
0.00
11.44
22.83
-7.17
30
176.282
1.62
8.35
0.00
13.33
23.30
-6.70
30
229.107
1.89
9.73
0.00
14.50
26.12
-3.88
30
270.001
2.11
12.50
0.00
12.18
26.79
-10.21
37
343.655
2.48
13.02
0.00
12.64
28.14
-8.86
37
465.194
3.11
16.42
0.00
13.30
32.83
-4.17
37
619.450
3.90
19.27
0.00
6.01
29.18
-7.82
37
858.005
5.13
19.15
0.00
5.90
30.18
-6.82
37
Note:
1. All Reading Levels below 1GHz are Quasi-Peak.
2. Emission Level = Reading Level + Probe Factor + Cable loss – Preamp.
3. Margin = Limit - Emission Level
Radiation Measurement data
50
Field Strength(dBuV/m)
Emission Level
40
Limit
30
20
10
0
10
100
Frequency(MHz)
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ReportNo. 027L031E
7.3.
Test Data of Electrostatic Discharge
Date of Test
Jul 10, 2002
Test Room No.3 Shielded Room
Test Mode
Mode 1: 1920*1440/75Hz, D-sub+DVI
Product
VGA Card
Test Condition Electrostatic Discharge (Performance Criteria: B)
Test point
Polarity
Number of Discharges
Complied To Criteria
Result
(A,B,C)
Seams
+/-8kV Air
10
B
PASS
Switch
+/-8kV Air
10
B
PASS
Knobs
+/-4kV Con
50
B
PASS
Metal Plate
+/-4kV Con
50
B
PASS
Screws
+/-4kV Con
50
B
PASS
H.C.P.
+/-4kV
50
B
PASS
V.C.P.
+/-4kV
50
B
PASS
Criteria judgment of Test result:
Meet criteria A: No abnormalities were observed during and directly after the test.
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
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ReportNo. 027L031E
Attachment 1 : EUT Test Photographs
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Attachment 1 : EUT Test Photographs
Front View of Conducted Test (Mode 1)
Back View of Conducted Test (Mode 1)
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Front View of Conducted Test (Mode 2)
Back View of Conducted Test (Mode 2)
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Front View of Conducted Test (Mode 3 )
Back View of Conducted Test (Mode 3)
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Front View of Conducted Test (Mode 4 )
Back View of Conducted Test (Mode 4)
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Front View of Conducted Test (Mode 5 )
Back View of Conducted Test (Mode 5)
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Front View of Radiated Test (Mode 1)
Back View of Radiated Test (Mode 1)
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Front View of Radiated Test (Mode 2)
Back View of Radiated Test (Mode 2)
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Front View of Radiated Test (Mode 3)
Back View of Radiated Test (Mode 3)
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Front View of Radiated Test (Mode 4)
Back View of Radiated Test (Mode 4)
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Front View of Radiated Test (Mode 5)
Back View of Radiated Test (Mode 5)
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Harmonics Test Setup (Mode 1)
Harmonics Test Setup (Mode 2)
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Harmonics Test Setup (Mode 3)
Harmonics Test Setup (Mode 4)
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Harmonics Test Setup (Mode 5)
ESD Test Setup
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RS Test Setup
EFT/B Test Setup
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Surge Test Setup
CS Test Setup
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Power Frequency Magnetic Field Test Setup
Dips Test Setup
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Attachment 2 : EUT Detailed Photographs
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Attachment 2 : EUT Detailed Photographs
(1) EUT Photo
(2) EUT Photo
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(3) EUT Photo
(4) EUT Photo (V8440 /Deluxe)
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(5) EUT Photo (V8440/Deluxe)
(6) EUT Photo (V8440/TDV)
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(7) EUT Photo (V8440/TDV)
(8) EUT Photo(V8460 Deluxe)
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(9) EUT Photo(V8460 Deluxe)
(10) EUT Photo(V8460/TDV)
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(11) EUT Photo(V8460/TDV)
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Reference : Laboratory of License
Page : 28 of 28
Version:1.0
Source Exif Data:
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