EMC Design Guide For ST Microcontrollers

• INTRODUCTION
• 1 EMC DEFINITIONS
  • 1.1 EMC
  • 1.2 EMS
  • 1.3 EMI
• 2 EMC characterization OF ST microcontrollerS
  • 2.1 electromagnetic susceptibility (ems)
    • 2.1.1 Functional EMS test
      • 2.1.1.1 Functional ElectroStatic Discharge Test (F_ESD Test)
      • 2.1.1.2 Fast Transient Burst (FTB)
      • 2.1.1.3 ST Severity Level & Behavior Class
    • 2.1.2 Latch-Up (LU)
      • 2.1.2.1 Static Latch-Up (LU) test:
      • 2.1.2.2 Dynamic Latch-Up (DLU) test:
    • 2.1.3 Absolute Electrical Sensitivity
      • 2.1.3.1 Human Body Model Test Sequence
      • 2.1.3.2 Machine Model Test Sequence
  • 2.2 electromagnetic Interference (emi)
    • 2.2.1 EMI radiated test
    • 2.2.2 EMI level classification
• 3 ST MCU DESIGN STRATEGY & EMC specific feature
  • 3.1 SUSCEPTIBILITY
    • 3.1.1 Low Voltage Detector (LVD)
    • 3.1.2 Auxiliary Voltage Detector (AVD)
    • 3.1.3 I/O Features & properties
      • 3.1.3.1 Electrostatic Discharge and Latch-up
      • 3.1.3.2 Protective Interface
      • 3.1.3.3 Internal Circuitry: Digital I/O pin
      • 3.1.3.4 Internal Circuitry: Analog Input pin
    • 3.1.4 Multiple VDD & VSS.
  • 3.2 EMISSION
    • 3.2.1 Internal PLL
    • 3.2.2 Global low power approach
      • 3.2.2.1 Low powered oscillator
      • 3.2.2.2 Internal Voltage Regulators (for MCUs with low power core).
    • 3.2.3 Output I/O Current limitation & edge timing control
• 4 EMC GUIDelines for mcu based applications
  • 4.1 Hardware
  • 4.2 HANDLING PRECAUTIONS FOR ESD PROTECTION.
  • 4.3 Firmware
  • 4.4 WEB LINKS TO EMC RELATED ORGANISATIONS
• 5 CONCLUSION