MMBT3906 PNP Switching Transistor Nxp

User Manual: Marking of electronic components, SMD Codes 7B, 7B-, 7BW, 7Bp, 7Bt. Datasheets MMBT3906, SMZ2515.

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DATA SHEET
Product data sheet
Supersedes data of 2000 Apr 11 2003 Mar 18
DISCRETE SEMICONDUCTORS
MMBT3906
PNP switching transistor
db
ook, halfpage
M3D088
2003 Mar 18 2
NXP Semiconductors Product data sheet
PNP switching transistor MMBT3906
FEATURES
Collector current capability IC = 200 mA
Collector-emitter voltage VCEO = 40 V.
APPLICATIONS
General switching and amplification.
DESCRIPTION
PNP switching transistor in a SOT23 plastic package.
NPN complement: MMBT3904.
MARKING
Note
1. = p: Made in Hong Kong.
= t: Made in Malaysia.
= W: Made in China.
TYPE NUMBER MARKING CODE(1)
MMBT3906 7B
PINNING
PIN DESCRIPTION
1base
2emitter
3collector
handbook, halfpage
21
3
MAM256
Top view
2
3
1
Fig.1 Simplified outline (SOT23) and symbol.
QUICK REFERENCE DATA
SYMBOL PARAMETER MAX. UNIT
VCEO collector-emitter voltage 40 V
ICcollector current (DC) 200 mA
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
Note
1. Transistor mounted on an FR4 printed-circuit board.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VCBO collector-base voltage open emitter − −40 V
VCEO collector-emitter voltage open base − −40 V
VEBO emitter-base voltage open collector − −6 V
ICcollector current (DC) − −200 mA
ICM peak collector current − −200 mA
IBM peak base current − −100 mA
Ptot total power dissipation Tamb 25 °C; note 1 250 mW
Tstg storage temperature 65 +150 °C
Tjjunction temperature 150 °C
Tamb operating ambient temperature 65 +150 °C
2003 Mar 18 3
NXP Semiconductors Product data sheet
PNP switching transistor MMBT3906
THERMAL CHARACTERISTICS
Note
1. Transistor mounted on an FR4 printed-circuit board.
CHARACTERISTICS
Tamb = 25 °C unless otherwise specified.
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to ambient note 1 500 K/W
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
ICBO collector cut-off current IE = 0; VCB = 30 V − −50 nA
IEBO emitter cut-off current IC = 0; VEB = 6 V − −50 nA
hFE DC current gain VCE = 1 V; see Fig.2
IC = 0.1 mA 60
IC = 1 mA 80
IC = 10 mA 100 300
IC = 50 mA 60
IC = 100 mA 30
VCEsat collector-emitter saturation
voltage
IC = 10 mA; IB = 1 mA − −250 mV
IC = 50 mA; IB = 5 mA − −400 mV
VBEsat base-emitter saturation voltage IC = 10 mA; IB = 1 mA − −850 mV
IC = 50 mA; IB = 5 mA − −950 mV
Cccollector capacitance IE = ie = 0; VCB = 5 V; f = 1 MHz 4.5 pF
Ceemitter capacitance IC = ic = 0; VEB = 500 mV;
f = 1 MHz
10 pF
fTtransition frequency IC = 10 mA; VCE = 20 V;
f = 100 MHz
250 MHz
Fnoise figure IC = 100 µA; VCE = 5 V;
RS = 1 k; f = 10 Hz to 15.7 kHz
4dB
Switching times (between 10% and 90% levels); see Fig.7
tddelay time ICon = 10 mA; IBon = 1 mA;
IBoff = 1 mA
35 ns
trrise time 35 ns
tsstorage time 225 ns
tffall time 75 ns
2003 Mar 18 4
NXP Semiconductors Product data sheet
PNP switching transistor MMBT3906
handbook, halfpage
0
400
600
200
MHC459
101110 IC (mA)
hFE
102103
(1)
(3)
(2)
Fig.2 DC current gain; typical values.
VCE = 1 V.
(1) Tamb = 150 °C.
(2) Tamb = 25 °C.
(3) Tamb = 55 °C.
handbook, halfpage
010
250
0
50
100
150
200
2VCE (V)
IC
(mA)
468
MHC460
(1)
(2)(3)
(9)
(7)
(10)
(8)
(6)
(5)
(4)
Fig.3 Collector current as a function of
collector-emitter voltage.
(1) IB = 1.5 mA.
(2) IB = 1.35 mA.
(3) IB = 1.2 mA.
(4) IB = 1.05 mA.
(5) IB = 0.9 mA.
(6) IB = 0.75 mA.
(7) IB = 0.6 mA.
(8) IB = 0.45 mA.
(9) IB = 0.3 mA.
(10) IB = 0.15 mA.
Tamb = 25 °C.
handbook, halfpage
200
1200
400
600
800
1000
MHC461
1101IC (mA)
VBE
(mV)
10 102103
(3)
(2)
(1)
Fig.4 Base-emitter voltage as a function of
collector current.
VCE = 1 V.
(1) Tamb = 55 °C.
(2) Tamb = 25 °C.
(3) Tamb = 150 °C.
handbook, halfpage
200
1200
400
600
800
1000
MHC462
1101IC (mA)
VBEsat
(mV)
10 102103
(1)
(3)
(2)
Fig.5 Base-emitter saturation voltage as a
function of collector current.
IC/IB = 10.
(1) Tamb = 55 °C.
(2) Tamb = 25 °C.
(3) Tamb = 150 °C.
2003 Mar 18 5
NXP Semiconductors Product data sheet
PNP switching transistor MMBT3906
handbook, halfpage
103
102
10
MHC463
101110 IC (mA)
VCEsat
(mV)
102103
(1)
(2)
(3)
Fig.6 Collector-emitter saturation voltage as a
function of collector current.
IC/IB = 10.
(1) Tamb = 25 °C.
(2) Tamb = 150 °C.
(3) Tamb = 55 °C.
handbook, full pagewidth
RC
R2
R1
DUT
MGD624
Vo
RB
(probe)
450
(probe)
450
oscilloscope oscilloscope
V
BB
Vi
V
CC
Fig.7 Test circuit for switching times.
Vi = 5 V; T = 500 µs; tp = 10 µs; tr = tf 3 ns.
R1 = 56 ; R2 = 2.5 k; RB = 3.9 k; RC = 270 .
VBB = 1.9 V; VCC = 3 V.
Oscilloscope: input impedance Zi = 50 .
2003 Mar 18 6
NXP Semiconductors Product data sheet
PNP switching transistor MMBT3906
PACKAGE OUTLINE
UNIT A1
max. bpcDE e1HELpQwv
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
97-02-28
99-09-13
IEC JEDEC EIAJ
mm 0.1 0.48
0.38 0.15
0.09 3.0
2.8 1.4
1.2 0.95
e
1.9 2.5
2.1 0.55
0.45 0.1
0.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
SOT23 TO-236AB
bp
D
e1
e
A
A1
Lp
Q
detail X
HE
E
wM
vMA
B
AB
0 1 2 mm
scale
A
1.1
0.9
c
X
12
3
Plastic surface mounted package; 3 leads SOT2
3
2003 Mar 18 7
NXP Semiconductors Product data sheet
PNP switching transistor MMBT3906
DATA SHEET STATUS
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product status of device(s) described in this document may have changed since this document was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for product
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production This document contains the product specification.
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published in this document, including without limitation
specifications and product descriptions, at any time and
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use without further testing or modification.
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratings only and
operation of the device at these or any other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick reference data The Quick reference data is an
extract of the product data given in the Limiting values and
Characteristics sections of this document, and as such is
not complete, exhaustive or legally binding.
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© NXP B.V. 2009
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
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Printed in The Netherlands 613514/02/pp8 Date of release: 2003 Mar 18 Document order number: 9397 750 10243

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