Hp 8517B Users Manual

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HP 8517B

S-Parameter Test Set

Operating and

Service Manual

PrintedinUSA

12 August 1998

HP part number 08517-90054

ii

HP 8517B S-Parameter Test Set Manual

Notice

The information contained in this document is subject to change without

notice.

Hewlett-Packard makes no warranty of any kind with regard to this material,

including, but not limited to, the implied warranties of merchantability and

fitness for a particular purpose. Hewlett-Packard shall not be liable for errors

contained herein or for incidental or consequential damages in connection

with the furnishing, performance, or use of this material.

Hewlett-Packard assumes no responsibility for the use or reliability of its

software on equipment that is not furnished by Hewlett-Packard.

This document contains proprietary information which is protected by

copyright. All rights are reserved. No part of this document may be

photocopied, reproduced, or translated to another language without prior

written consent of Hewlett-Packard Company.

Restricted Rights Legend

Use, duplication, or disclosure by the U.S. Government is subject to

restrictions as set forth in subparagraph (c)(1)(ii) of the Rights in Technical

Data and Computer Software clause at DFARS 252.227-7013 for DOD

agencies, and subparagraphs (c)(1) and (c)(2) of the Commercial Computer

Software Restricted Rights clause at FAR 52.227-19 for other agencies.

Hewlett-Packard Company

Santa Rosa Systems Division

1400 Fountaingrove Parkway

Santa Rosa, CA 95403-1799, U.S.A.

© Copyright Hewlett-Packard Company 1997, 1998

HP 8517B S-Parameter Test Set Manual

iii

What You’ll Find in This Manual…

HP 8517B S-Parameter Test Set

Chapters 1 and 2 •Test set description and installation information

Chapters 3 and 4 •Principles of operation and specifications

Chapters 5, 6, and 7 •Troubleshooting, replacement procedures, and replaceable parts

information

iv

HP 8517B S-Parameter Test Set Manual

Warranty

Certification Hewlett-Packard Company certifies that this product met its published

specifications at the time of shipment from the factory. Hewlett-Packard

further certifies that its calibration measurements are traceable to the

United States National Institute of Standards and Technology (NIST,

formerly NBS), to the extent allowed by the Institute’s calibration facility,

and to the calibration facilities of other International Standards

Organization members.

Warranty This Hewlett-Packard system product is warranted against defects in

materials and workmanship for a period corresponding to the individual

warranty periods of its component products. Instruments are warranted for a

period of one year. During the warranty period, Hewlett-Packard Company

will, at its option, either repair or replace products that prove to be defective.

Warranty service for products installed by HP and certain other products

designated by HP will be performed at Buyer’s facility at no charge within

HP service travel areas. Outside HP service travel areas, warranty service

will be performed at Buyer’s facility only upon HP’s prior agreement and

Buyer shall pay HP’s round trip travel expenses. In all other areas, products

must be returned to a service facility designated by HP.

For products returned to HP for warranty service, Buyer shall prepay

shipping charges to HP and HP shall pay shipping charges to return the

product to Buyer. However, Buyer shall pay all shipping charges, duties, and

taxes for products returned to HP from another country.

HP warrants that its software and firmware designated by HP for use with an

instrument will execute its programming instructions when properly

installed on that instrument. HP does not warrant that the operation of the

instrument, or software, or firmware will be uninterrupted or error free.

LIMITATION OF WARRANTY. The foregoing warranty shall not apply

to defects resulting from improper or inadequate maintenance by Buyer,

Buyer-supplied software or interfacing, unauthorized modification or

misuse, operation outside of the environmental specifications for the

product, or improper site preparation or maintenance.

NO OTHER WARRANTY IS EXPRESSED OR IMPLIED. HP

SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OR

MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE.

EXCLUSIVE REMEDIES. THE REMEDIES PROVIDED HEREIN ARE

BUYER’S SOLE AND EXCLUSIVE REMEDIES. HP SHALL NOT BE

LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL, INCIDENTAL, OR

HP 8517B S-Parameter Test Set Manual

v

CONSEQUENTIAL DAMAGES, WHETHER BASED ON CONTRACT,

TORT, OR ANY OTHER LEGAL THEORY.

Assistance Product maintenance agreements and other customer assistance agreements

are available for Hewlett-Packard products.

For assistance, call your local Hewlett-Packard Sales and Service Office

(refer to “Service and Support”).

vi

HP 8517B S-Parameter Test Set Manual

Service and Support

Any adjustment, maintenance, or repair of this product must be performed

by qualified personnel. Contact your customer engineer through your local

HP Service Center. You can find a list of HP Service Centers on the web at

http://www.hp.com/go/tmdir.

If you do not have access to the Internet, one of these HP centers can direct

you to your nearest HP representative:

United States: Hewlett-Packard Company

Test and Measurement Call Center

PO Box 4026

Englewood, CO 80155-4026

(800) 452 4844 (toll-free in US)

Canada: Hewlett-Packard Canada Ltd.

5150 Spectrum Way

Mississauga, Ontario L4W 5G1

(905) 206 4725

Europe: Hewlett-Packard European Marketing Centre

Postbox 999

1180 AZ Amstelveen

The Netherlands

(31 20) 547 9900

Japan: Hewlett-Packard Ltd.

Measurement Assistance Center

9-1, Takakura-Cho, Hachioji-Shi

Tokyo 192, Japan

(81) 426 56 7832

(81) 426 56 7840 (FAX)

Latin America: Hewlett-Packard Latin American Region Headquarters

5200 Blue Lagoon Drive, 9th Floor

Miami, Florida 33126, U.S.A.

(305) 267 4245, (305) 267-4220

(305) 267 4288 (FAX)

Australia/New Zealand: Hewlett-Packard Australia Ltd.

31-41 Joseph Street

Blackburn, Victoria 3130

Australia

1 800 629 485 (Australia)

0800 738 378 (New Zealand)

(61 3) 9210 5489 (FAX)

Asia-Pacific: Hewlett-Packard Asia Pacific Ltd.

17-21/F Shell Tower, Times Square

1 Matheson Street, Causeway Bay

Hong Kong

(852) 2599 7777

(852) 2506 9285 (FAX)

HP 8517B S-Parameter Test Set Manual

vii

Safety and Regulatory Information

Review this product and related documentation to familiarize yourself with

safety markings and instructions before you operate the instrument. This

product has been designed and tested in accordance with international

standards.

WARNING

The WARNING notice denotes a hazard. It calls attention to a procedure,

practice, or the like, that, if not correctly performed or adhered to, could result

in personal injury. Do not proceed beyond a WARNING notice until the

indicated conditions are fully understood and met.

CAUTION

The CAUTION notice denotes a hazard. It calls attention to an operating

procedure, practice, or the like, which, if not correctly performed or adhered

to, could result in damage to the product or loss of important data. Do not

proceed beyond a CAUTION notice until the indicated conditions are fully

understood and met.

Instrument Markings

When you see this symbol on your instrument, you should refer to the instrument’s

instruction manual for important information.

This symbol indicates hazardous voltages.

The laser radiation symbol is marked on products that have a laser output.

This symbol indicates that the instrument requires alternating current (ac) input.

The CE mark is a registered trademark of the European Community. If it is

accompanied by a year, it indicates the year the design was proven.

The CSA mark is a registered trademark of the Canadian Standards Association.

1SM1-A This text indicates that the instrument is an Industrial Scientific and Medical Group 1

Class A product (CISPER 11, Clause 4).

This symbol indicates that the power line switch is ON.

This symbol indicates that the power line switch is OFF or in STANDBY position.

!

viii

HP 8517B S-Parameter Test Set Manual

Safety Earth

Ground

This is a Safety Class I product (provided with a protective earthing

terminal). An uninterruptible safety earth ground must be provided from the

main power source to the product input wiring terminals, power cord, or

supplied power cord set. Whenever it is likely that the protection has been

impaired, the product must be made inoperative and secured against any

unintended operation.

Before Applying Power Verify that the product is configured to match the available main power

source as described in the input power configuration instructions in this

manual. If this product is to be powered by auto-transformer, make sure the

common terminal is connected to the neutral (grounded) side of the ac power

supply.

HP 8517B S-Parameter Test Set Manual

ix

Typeface Conventions

Not all of the following conventions may appear within this manual,

however, refer to this listing whenever you encounter on of the special font

characters.

Italics •Used to emphasize important information:

Use this software only with the HP 8517B Test Set.

•Used for the title of a publication:

Refer to the HP 8517B S-Parameter Test Set Manual

•Used to indicate a variable:

Type LOAD BIN filename.

Instrument Display •Used to show on-screen prompts and messages that you will see on the

display of an instrument:

The HP 8517B will display the message CAL1 SAVED.

Keycap

•Used for labeled keys on the front panel of an instrument or on a

computer keyboard:

Press

[Return]

.

Softkey

•Used for simulated keys that appear on an instrument display:

Press

{Prior Menu}

.

User Entry •Used to indicate text that you will enter using the computer keyboard;

text shown in this typeface must be typed exactly as printed:

Type LOAD PARMFILE

•Used for examples of programming code:

#endif // ifndef NO_CLASS

Path Name

•Used for a subdirectory name or file path:

Edit the file

usr/local/bin/sample.txt

Computer Display

•Used to show messages, prompts, and window labels that appear on a

computer monitor:

The

Edit Parameters

window will appear on the screen.

•Used for menus, lists, dialog boxes, and button boxes on a computer

monitor from which you make selections using the mouse or keyboard:

Double-click

EXIT

to quit the program.

x

HP 8517B S-Parameter Test Set Manual

Contents

HP 8517B S-Parameter Test Set Manual

Contents-1

Notice ..................................................... ii

RestrictedRightsLegend................................ ii

WhatYou’llFindinThisManual…..............................iii

HP8517BS-ParameterTestSet ..........................iii

Warranty ...................................................iv

Certification .............................................iv

Warranty ................................................iv

Assistance............................................... v

Service and Support . .........................................vi

SafetyandRegulatoryInformation.............................. vii

Safety Earth Ground . . . ...................................viii

BeforeApplyingPower ...................................viii

Typeface Conventions ........................................ix

1. Getting Started

HowtoUseThisManual .....................................1-1

TestSetDescription .........................................1-2

Figure 1-1. Standard HP 8517B Test Set Block Diagram .........1-2

Figure 1-2. Option 004, HP 8517B Test Set Block Diagram .......1-3

Figure 1-3. Option 007, HP 8517B Test Set Block Diagram .......1-3

HP8517BTestSetOptions ...................................1-4

Table 1-1. HP 8517B Options and Descriptions ................1-4

VerifyingTestSetOperation ..................................1-5

Table 1-2. Test Set Operation Verification .....................1-5

CheckingSystemOperation.............................1-5

CheckingSpecifications................................1-5

Troubleshooting the Test Set . . ..........................1-5

MaintainingMeasurementAccuracy ............................1-6

InstrumentsSupportedbyThisManual ..........................1-7

Figure 1-4. Instrument Serial-Number Label Example ...........1-7

InstrumentFirmwareCompatibility .............................1-8

Table 1-3. Source Firmware Revision Compatibility Matrix .......1-8

Service and Support Options Available ..........................1-9

Table 1-4. Service and Support Options ......................1-9

Accessories ...............................................1-10

RecommendedTestEquipment ...............................1-12

Table 1-6. Recommended Test Equipment ....................1-12

OperatingandSafetyPrecautions..............................1-13

Table 1-7. Maximum Input Power Levels ....................1-13

SafetyPrecautions ......................................1-13

Contents-2

HP 8517B S-Parameter Test Set Manual

2. Installation

InitialInspection ........................................... 2-2

OperatingEnvironment................................... 2-2

StoringtheTestSet ...................................... 2-2

AccessoriesSupplied .................................... 2-2

Figure 2-1. Accessories Supplied with the HP 8517B Test Set .... 2-3

Table 2-1. Accessories in Figure 2-1 ........................ 2-3

InstallingtheTestSetIntoaSystemRack ....................... 2-4

InstallingtheTestSetonaBench........................... 2-4

Figure 2-2. Recommended Static-Free Workstation Configuration .2-4

ConfiguringtheTestSetinaSystem ........................... 2-5

Figure 2-3. Configuring an HP 8517B Test Set in a System ...... 2-5

ConnectingtheSystemCables ............................. 2-6

Table 2-2. Connection Instructions and Connector Descriptions .. 2-6

ConnectSystemPower................................ 2-6

andControlCables ................................... 2-6

Signal Path Connections . .............................. 2-6

TestPortConnectors.................................. 2-6

Anti-RotationClamp.................................. 2-6

ReplacingO-RingsinAnti-RotationClamps .................. 2-6

PackagingtheTestSet....................................... 2-7

3. Operating the HP 8517B Test Set

Front-PanelFeatures ........................................ 3-1

Figure 3-1. Front-Panel Features of the HP 8517B Test Set ...... 3-1

Table 3-1. Front-Panel Description ......................... 3-1

Rear-PanelFeatures......................................... 3-2

Figure 3-2. Rear-Panel Features of the HP 8517B Test Set ....... 3-2

Table 3-2. Rear-Panel Descriptions ......................... 3-2

ControllingMultipleTestSets ................................ 3-3

Figure 3-3. RF and IF Switching with Two Test Sets ............ 3-4

Table 3-3. RF and IF Switch Settings in Figure 3-3, Above ....... 3-4

Multiple Test-Set Connections . . .............................. 3-5

InitializationatPower-Up................................. 3-5

SelectingaTestSet ...................................... 3-5

Table 3-4. Selecting a Test Set When Multiple Units are Configured 3-6

TestSetIFSwitching ................................. 3-6

TestSetAddressing................................... 3-6

RFSwitchDriverControl.............................. 3-6

Figure3-4. RFandIFSwitchingwithFourTestSets........ 3-7

Table 3-5. Coaxial Switch Settings for Figure 3-4, Above ........ 3-7

MeasurementCalibration .................................... 3-8

MeasuringHigh-PowerDeviceswithOption004 ................. 3-9

ChangingSignalPathStatesAfterSystemCalibration............. 3-10

ChangingtheTestPortAttenuators ........................ 3-10

StoringTraceMemories ................................. 3-11

ViewingNormalizedParameters........................... 3-11

HP 8517B S-Parameter Test Set Manual

Contents-3

MakingOperationalChecks ..................................3-13

PerformanceVerification ....................................3-14

UsingAnti-RotationClamps .................................3-15

Attachthefirstclamp.................................3-15

Figure 3-5. Using a Torque Wrench Correctly ................3-16

Positioningthethumb-screw ...........................3-16

Figure 3-6. Visually Aligning Clamp and Nut Flats ............3-17

Positioning the connector .............................3-17

Figure 3-7. Mating the Clamp and Nut Flats .................3-17

Aligningthethumb-screw .............................3-18

Figure 3-8. Aligning the Thumbscrew With the Counter-Sink Hole 3-18

Attachingthesecondclamp............................3-18

4. Specifications

MechanicalSpecifications ....................................4-1

SupplementalCharacteristics ..................................4-1

Table 4-1. HP 8510/HP 8517B Mechanical Specifications .......4-1

Table 4-2. HP 8510/HP 8517B Supplemental Characteristics .....4-1

5. Troubleshooting the Test Set

TheoryofOperation .........................................5-2

Figure 5-1. Standard HP 8517B RF Block Diagram ............5-2

TheRFSourcePower.....................................5-2

TheReferenceSignalPath .................................5-3

TheTestSignalPath......................................5-3

The S11 and S21 Measurements .............................5-3

TheSamplerControlSwitching.............................5-3

TheLOSignalControl....................................5-4

Troubleshooting Sequence . ...................................5-5

Figure 5-2. Troubleshooting Flowchart ......................5-5

Equipment Needed But Not Supplied . . ......................5-6

Table 5-1. Equipment Required, But Not Supplied ..............5-6

Troubleshooting Procedures ...................................5-7

Table 5-2. Power Supply Voltages to A15 .....................5-7

Table 5-3. Power Supply Voltages to A27 .....................5-7

Figure 5-3. Power Supply Fuses and Test Points ...............5-8

HP-IBAddressSwitch ....................................5-8

Figure 5-4. Instrument HP-IB Switch Setting ..................5-9

FuseLocation ...........................................5-9

Figure 5-5. Fuse and Voltage Cam Location ...................5-9

Figure 5-6. The ACTIVE LED Location .....................5-10

IftheSelf-TestFailstoRunProperly ....................5-10

Figure 5-7. HP 8518B Test Set, A4 Board Assembly LEDs .......5-11

Table 5-4. Instrument Self-Test Indicator State Definitions ......5-11

Figure 5-8. Service Adapter Connections ....................5-12

UsingtheServiceAdapter.............................5-12

ServiceAdapterConclusions...........................5-13

Table 5-5. Results Observations ...........................5-13

Contents-4

HP 8517B S-Parameter Test Set Manual

UnratioedPowerTest................................ 5-14

Figure 5-9. Diagram of IF Signal Path ..................... 5-14

IsolatingSignalPathProblems ............................ 5-14

TestingSignalPaths1-4.............................. 5-14

TestingPaths5and6 ................................ 5-16

Figure 5-10. RF Path 1 and Path 2, HP 8517B Standard Test Set .5-17

Figure 5-11. RF Path 3 and Path 4, HP 8517B Standard Test Set .5-18

Figure 5-12. RF Path 5 and Path 6, HP 8517B Standard Test Set .5-19

Figure 5-13. RF Path 1 through Path 4,

HP 8517B Option 007 Test Set ......................... 5-20

Figure 5-14. RF Signal for Path 1 through Path 4,

HP 8517B Option 007 ............................... 5-21

Figure 5-15. RF Path 5 and Path 6, HP 8517B Option 007 ...... 5-22

Table 5-6. Test Results for Path 1 through Path 6 ............. 5-23

SampleDiagnostics..................................... 5-23

Table 5-7. Most Probable Failures

(B indicates Bad; — indicates Good) .................... 5-23

6. HP 8517B Test Set Replacement Procedures

Figure 6-1. ESD-Safe Workstation Configuration .............. 6-2

PerformanceTests .......................................... 6-2

Adjustments............................................... 6-2

Equipment Needed But Not Supplied . .......................... 6-3

Table 6-1. Replacement-Procedure Tools Needed .............. 6-3

Figure 6-2. HP 8517B Major Assembly Location Diagram ...... 6-4

AssemblyReplacementProcedures............................. 6-5

InitialPrecautions ....................................... 6-5

Switch/SplitterReplacement............................... 6-5

A18Switch/SplitterAssembly .......................... 6-5

FrequencyConverterReplacement .......................... 6-5

A14,A10toA13FrequencyConverterAssembly .......... 6-5

RegulatorBoardReplacement ............................. 6-6

A15RegulatorBoardAssembly......................... 6-6

FilterCapacitorReplacement .............................. 6-6

C1toC4FilterCapacitors ............................. 6-6

TestPortConnectorReplacement........................... 6-7

2.4mmTestPortConnectors ........................... 6-7

Figure 6-3. Diagram of 2.4 mm Test Port Connector ............ 6-7

FanAssemblyReplacement ............................... 6-8

B1FanAssembly .................................... 6-8

PowerTransformerReplacement ........................... 6-8

T1PowerTransformer ................................ 6-8

Figure 6-4. Wire Connections to FL1 Line Module ............. 6-9

O-RingReplacement.................................... 6-10

Figure 6-5. Positioning the O-Ring Within the Clamp .......... 6-10

FrontPanelandInterfaceBoardReplacement ................ 6-10

A1FrontPanelandInterfaceBoardAssembly ............ 6-10

HP 8517B S-Parameter Test Set Manual

Contents-5

BiasTeesReplacement...................................6-11

A7andA9BiasTees .................................6-11

TestPortCouplerReplacement ............................6-11

A6andA8TestPortCouplers..........................6-11

TestPortAttenuatorReplacement ..........................6-11

A16orA17PortAttenuators...........................6-11

Input Amplifier Replacement ..............................6-12

A22InputAmplifierAssembly .........................6-12

BufferAmplifierReplacement.............................6-12

A23toA26BufferAmplifiers..........................6-12

PostRegulatorBoardReplacement .........................6-13

A27PostRegulatorBoardAssembly ....................6-13

7. HP 8517B Replaceable Parts

Introduction................................................7-1

Rebuilt-ExchangeAssemblies ..............................7-1

ReplaceablePartsList ....................................7-1

OrderingInformation..................................7-2

ToOrderParts....Fast!...............................7-2

Table 7-1. Reference Designation Abbreviations ..............7-2

Table 7-2. Manufacturer Names and Addresses ................7-3

Table 7-3. Standard Abbreviations ..........................7-4

Table 7-4. Multipliers, Abbreviation and Description ...........7-10

Figure 7-1. Power Cable and Plug Part Numbers ..............7-11

Table 7-5. Instrument Fuses ..............................7-12

Figure 7-2. The Low Cost Rebuilt-Exchange Procedure .........7-13

Table 7-6. Major Assembly Reference Designator and Parts Information

7-14

Figure 7-3. Major Assembly Locations in the Standard

HP 8517B Test Set ...................................7-15

Table 7-7. Semi-Rigid Cable Assemblies in the Standard

HP 8517B Test Set ...................................7-16

Table 7-8. Flexible Cable Assemblies in the Standard

HP 8517B Test Set ...................................7-17

Table 7-9. Miscellaneous Parts, Front Panel HP 8517B Test Set ..7-19

Table 7-10. Test Port Connector Assembly Components .........7-20

Table 7-11. Miscellaneous Parts, Rear Panel HP 8517B Test Set ..7-21

Figure 7-4. Detailed Views of Hardware Stack-Ups ............7-23

Table 7-12. Miscellaneous Parts, Top Internal View ............7-24

Table 7-13. Miscellaneous Parts, Motherboard ...............7-25

Table 7-14. Parts Unique to HP 8517B Option 001 Test Set ......7-27

Table 7-15. Parts Unique to HP 8417B Option 002 Test Set ......7-29

Table 7-16. Parts Unique to HP 8517B Option 004 Test Set ......7-30

Table 7-17. Parts Unique to HP 8517B Option 007 Test Set ......7-31

Table 7-18. Parts Unique to Option 002 “plus” Option 007 .....7-33

Table 7-19. Parts Unique to Option 004 “plus” Option 007 .....7-34

Table 7-20. Instrument Chassis Replaceable Parts .............7-35

Contents-6

HP 8517B S-Parameter Test Set Manual

HP 8517B S-Parameter Test Set Manual

1-1

1

Getting Started

This is the operating and service manual for the HP 8517B S-parameter test

set. It is to be used in conjunction with the HP 8510C Network Analyzer

Operating and Service Manual. Together, these manuals provide

information needed to configure the system and make measurements.

How to Use This Manual

Step 1. Review Chapter 1, “Getting Started” and Chapter 2, “Installation” of this manual to

learn about:

• Using this test set

• Using options of the test set

• Preparing the site for operation

• Understanding safety considerations

• Unpacking the instrument and checking it for shipment damages

• Configuring the HP 8517B test set with the HP 8510C Network Analyzer

Step 2. Insert the contents of this manual into the HP 8510C Test Sets and Accessories

binder behind the tab labeled “Test Sets.”

Step 3. Review the

Connector Care Quick Reference Card

(HP part number 08510-90360)

supplied with the HP 8510C manuals set.

Refer to the calibration kit documentation for complete information about care,

cleaning, gaging, and connecting precision devices. Knowledge and application of

proper connector care is essential to achieving good connections and maintaining

maximum performance quality with your precision calibration devices.

Step 4. Read Chapter 3, “Operation,” to learn about test set front- and rear-panel features.

This chapter also has information about controlling multiple test sets, measuring

high power devices, using the anti-rotation clamps on the cables, and connecting

devices to the test set.

Step 5. Refer to Chapters 4 through 7 for reference information about specifications,

troubleshooting, replacement procedures, and replacement parts information.

1-2

HP 8517B S-Parameter Test Set Manual

Getting Started

Test Set Description

Test Set Description

The HP 8517B test set configured with an HP 8510B/C network analyzer

and an HP 8360 series source, creates a system capable of making

S-parameter measurements from 45 MHz to 50 GHz. The system is

particularly suited for making two-port device measurements. You can

measure all four S-parameters without physically reversing the DUT (device

under test).

The system is also designed for making measurements on non-reciprocal

devices or components like transistors, amplifiers or isolators where S12

measurements are required.

Two directional couplers are used for signal separation. The configuration is

illustrated in the following figures:

•Figure 1-1, “Standard HP 8517B Test Set Block Diagram"

•Figure 1-2, “Option 004, HP 8517B Test Set Block Diagram"

•Figure 1-3, “Option 007, HP 8517B Test Set Block Diagram"

For active-device measurements, two bias tees apply external DC bias to

both test port center conductors.

Figure 1-1 Standard HP 8517B Test Set Block Diagram

HP 8517B S-Parameter Test Set Manual

1-3

Getting Started

Test Set Description

Figure 1-2 Option 004, HP 8517B Test Set Block Diagram

Figure 1-3 Option 007, HP 8517B Test Set Block Diagram

1-4

HP 8517B S-Parameter Test Set Manual

Getting Started

HP 8517B Test Set Options

HP 8517B Test Set Options

Options for the HP 8517B test set are described in Table 1-1, below.

Table 1-1 HP 8517B Options and Descriptions

Options HP 8517B Test Set Option Description

Option 001 Adds IF switching capability for up to four test set connections to the HP 8510C Network

Analyzer.

The test set used is selected from the network analyzer. Refer to “Controlling Multiple Test

Sets” in Chapter 3, “Operation” of this manual for more information.

Option 002 Deletes the programmable attenuators and bias tees.

Note:

If bias is required but attenuation is not, the bias can be applied externally by using an

HP 11612B bias tee.

Option 004 Moves Port 2 attenuator in front of the b2 sampler, allowing devices with output power up to 30

dBm (1 W) to be measured. Adds a 3 dB attenuator which protects the switch splitter from high

power into Port 2.

Option 007 Adds five amplifiers, two 10 dB attenuators, two 6 dB attenuators, and two tapered attenuators.

These components increase the available power and dynamic range of the test set.

Option 908 Supplies the hardware required for rack mounting the test set when its handles are removed.

Refer to Chapter 2, “Installation” for more information.

Option 910 Adds a duplicate copy of this manual to the shipment.

Option 913 Supplies the hardware required for rack mounting the test set with its handles attached. Refer

to Chapter 2, “Installation” for more information.

Option 002 “plus” 007 Removes the bias tee, and retains the high dynamic range capability in the test set.

Option 004 “plus” 007 Adds high-dynamic range and high power measurement capability to Port 2.

HP 8517B S-Parameter Test Set Manual

1-5

Getting Started

Verifying Test Set Operation

Verifying Test Set Operation

The test set is designed to operate with an HP 8510C network analyzer. You

canverifyitsoperationby:

Table 1-2 Test Set Operation Verification

Checking System Operation Perform a system calibration as described in the

HP 8510C Operating and

Programming Manual

. A successful calibration indicates that the system, and

therefore the test set, are operating properly.

Checking Specifications Specifications for the test set, and the system, can be determined by running

the specification and performance verification software described in the

HP

8510C On-Site Service Manual

, Chapter 8, “Specification and Performance

Verification”. Additional mechanical specifications and supplemental

characteristics are in Chapter 4, “Specifications” of this manual.

Troubleshooting the Test Set To troubleshoot the test set, refer to the

HP 8510C On-Site Service Manual

.

Use the information in that manual to determine if the test set is at fault. If the

test set is at fault, refer to Chapter 5, “Troubleshooting the Test Set” in this

manual to isolate the trouble.

1-6

HP 8517B S-Parameter Test Set Manual

Getting Started

Maintaining Measurement Accuracy

Maintaining Measurement Accuracy

Precision measurements rely on a precision calibration of the network

analyzer. As a general rule, the shorter the time lapse between a calibration

and a device measurement, the more precise the measurement results will be

(within the limitations of your system).

Hewlett-Packard recommends calibrating your system every few hours, or at

least re-verifying your system’s calibration this frequently. Doing so helps

retain measurement precision.

The frequency of calibrations is determined by both the location of the

system and the ambient temperature stability in its operating area.

HP 8517B S-Parameter Test Set Manual

1-7

Getting Started

Instruments Supported by This Manual

Instruments Supported by This Manual

A serial number label is attached to the rear panel of the test set. There are

two parts to the serial number: a prefix, and a suffix. See Figure 1-4, and

read the following descriptions:

•The prefix includes the first four digits of the serial number, plus the

letter. The contents of this manual apply directly to test sets with the

same serial number prefix as the one(s) on the title page.

•The suffix includes the last five digits of the serial number, which is

sequential and unique to each test set. You will need this part of the

number to report test-set problems to an HP sales and service engineer.

Figure 1-4 Instrument Serial-Number Label Example

serial.tif

1-8

HP 8517B S-Parameter Test Set Manual

Getting Started

Instrument Firmware Compatibility

Instrument Firmware Compatibility

To use the HP 8517B test set at frequencies up to 50 GHz, use an

HP 83650B or HP 83651B source.

If your network analyzer or source do not meet the required frequency

ranges for your measurement needs, you need to upgrade your system.

Please contact an HP Sales and Service representative for information. These

offices are listed in “Service and Support” on page vi at the front of this

manual

Table 1-3 Source Firmware Revision Compatibility Matrix

Instrument Model

Number and Name Compatible With Model: Firmware Revision Compatible With HP

8340 Series

Sources?

Compatible With

HP 8350 Series

Sources?

HP 8517B Test Set HP 8510B Network Analyzer

HP 8510C Network Analyzer

B.06.00 and higher

C.06.00 and higher

Yes, up to the higher

frequency limits.

Yes, up to the higher

frequency limits.

HP 8517B,

Option 007 Test Set

HP 8510C Network Analyzer 7.0 or higher, only Yes, up to the higher

frequency limits.

No, not compatible

HP 8517B S-Parameter Test Set Manual

1-9

Getting Started

Service and Support Options Available

Service and Support Options Available

A variety of service and support products are available for coverage of

repair, calibration, and verification issues. Contact your HP sales and service

engineer for details. Their office addresses and phone numbers are listed in

the front of this document.

The purchase of an HP 8517B includes a one year on-site service warranty.

In the event of failure, Hewlett-Packard provides service for the system.

NOTE

System installation is not included.

Table 1-4 Service and Support Options

Option Number Option Description

Option W30 Adds a three year customer return-repair coverage warranty to the instrument.

Customers may return the instrument to HP within that three year period for repair.

Option W31 Adds a three year on-site repair coverage warranty for next-day on-site repair of the

instrument. Customers may return the instrument to HP within that three year period for

repair and get next-day service on their instrument.

Option 1BN Adds to the instrument a MIL-STD 45662A Certificate of Calibration.

This option must be

ordered when the instrument order is placed

.

Option 1BP Adds to the instrument a MIL-STD 45662A Certificate of Calibration and the

corresponding calibration data.

This option must be ordered when the instrument order is

placed

.

Option UK6 Adds a certificate of calibration (rather than the MIL-STD certificate) and the

corresponding calibration data to the instrument.

This option must be ordered when the

instrument order is placed.

1-10

HP 8517B S-Parameter Test Set Manual

Getting Started

Accessories

Accessories

The accessories supplied with the test set, including part numbers, are listed

in “Accessories Supplied” in this section and in the “Replaceable Parts List”

of this manual.

Accessories Available Table 1-5 describes accessories available for the HP 8517B test set. For

additional HP 8510C system accessories information, refer to the HP 8510C

manual set.

Table 1-5 HP 8517B Test Set Accessories Available

Accessory Type Accessory Model Number Contents or Description

Calibration Kit1HP 85056A 2.4 mm Calibration Kit Contains open and short circuits

Fixed and sliding loads (2)

2.4 mm to 2.4 mm adapters

2.4 mm connector tools and gauges

Verification Kit1HP 85057S 2.4 mm Verification Kit Contains precision airline, mismatched airline,

20 dB and 40 dB attenuators

Cables HP 85133C 2.4 mm Test Port Return

Cable

Used when measuring a 2.4 mm-ported device connected directly to

Port 1 of the test set. The test port return cable is connected

between the device under test and Port 2.

HP 85133D 2.4 mm Test Port Return

Cable Set

Used when measuring a 2.4 mm-ported device connected between

the cable ends.

HP 85133E 2.4 mm Flexible Test Port

Return Cable

Used when measuring a 2.4 mm-ported device connected directly to

Port 1 of the test set. The test port return cable is connected

between the device under test and Port 2.

HP 85133F 2.4 mm Flexible Test Port

Return Cable Set

Used when measuring a 2.4 mm-ported device connected between

the cable ends.

HP 85134D 3.5 mm Test Port Return

Cable Set

Used when measuring a 3.5 mm device under test connected

between the cable ends.

HP 85134E 3.5 mm Flexible Test Port

Return Cable

Used when measuring one end of a 3.5 mm device connected

directly to an HP 85130F adapter at Port 1. The test-port return

cable is connected between the device and Port 2.

HP 85134F 3.5 mm Flexible Test Port

Return Cable Set

Used when measuring a 3.5 mm device connected between the

cable ends.

HP 85135C 7 mm Test Port Return

Cable

Used when measuring one end of a 7 mm device connected

directly to an HP 85130E adapter at Port 1. The test port return

cable is connected between the device and Port 2.

Cables (Continued) HP 85135D 7 mm Test Port Return

Cable Set

Used when measuring a 7 mm device connected between the cable

ends.

HP 8517B S-Parameter Test Set Manual

1-11

Getting Started

Accessories

NOTE

For more information about other 2.4 mm adapters, refer to the “2.4 mm

Adapters and Calibration Accessories,” Operating Note, (HP part number

11900-90003).

HP 85135E 7 mm Flexible Test Port

Return Cable

Used when measuring one end of a 7 mm device connected directly

to an HP 85130E adapter at Port 1. The test port return cable is

connected between the device and Port 2.

HP 85135F 7 mm Flexible Test Port

Return Cable Set

Used when measuring a 7 mm device connected between the cable

ends.

Adapters HP 85130E Special 2.4 mm to 7 mm

Adapter Set

Used to convert special 2.4 mm test set ports into a 7 mm connector

interface (m or f).

HP 85130F Special 2.4 mm to 3.5 mm

Adapter Set

Used to convert special 2.4 mm ports of the test set into a 3.5 mm

connector interface (m or f).

HP 85130G Special 2.4 mm to 2.4 mm

Adapter Set

Used to convert special 2.4 mm ports of the test set into a standard

2.4 mm connector interface (m or f). These adapters function as

“test port savers.”

HP 11904S 2.4 mm to K-2.9 mm2

Adapter Kit

Used to calibrate the test set using 2.4 mm devices, then to change

the test ports to 2.92 mm and perform fully error corrected

measurements. The kit contains (2) 2.4 mm to 2.92 mm (m)

adapters and (2) 2.4 mm to 2.92 (f) adapters.

Test Fixture Kit HP 85041A Transistor Test Fixture Kit

(TTF)

A comprehensive measurement system for testing and

characterizing stripline packaged microwave transistors. Although

the fixture contains 7 mm connectors and its frequency limit is

18 GHz, the kit may be adapted for use with the test set. Use

HP 85135C or HP 85135E cables with the HP 85130E adapter set.

Please consult your HP Sales and Service representative for

recommendations.

1. NIST traceable data and uncertainties are available.

2. The K-connector is developed and manufactured by the Wiltron Company (Morgan Hill, California).

Table 1-5 HP 8517B Test Set Accessories Available (Continued)

Accessory Type Accessory Model Number Contents or Description

1-12

HP 8517B S-Parameter Test Set Manual

Getting Started

Recommended Test Equipment

Recommended Test Equipment

Additional equipment and accessories required for use with the test set are

listed in Table 1-6. The table lists which items are required to verify the

performance of the test set and which are required to operate it. Other

equipment may be substituted if their specifications meet or exceed those

listed in the critical specifications column

O = Operation; P = Performance Test; T = Troubleshooting

Table 1-6 Recommended Test Equipment

Item Critical

Specifications Recommended Model Use

Network Analyzer no substitute HP 8510B or HP 8510C O, P, T

Source no substitute HP 83651B O, P, T

Controller no substitute HP 9000 Series 200 or 300 with 3 Mbyte RAM and

HP BASIC 3.0 or higher or PCC-305 or PC-308

HP BASIC Controller with 3 Mbyte Basic Language

Processor RAM

N/A

Disk Drive is compatible with the

controller

is compatible with the controller P

Multimeter range: 0 to 50 V HP 3456A T

Oscilloscope 50 MHz bandwidth HP 1740A T

HP 8517B S-Parameter Test Set Manual

1-13

Getting Started

Operating and Safety Precautions

Operating and Safety Precautions

CAUTION

ESD Sensitive Assemblies

Test set assemblies are very sensitive to damage from electrostatic discharge.

They may or may not continue to function if subjected to electrostatic

discharge. Their reliability, however, will be impaired. Handle the

instrument devices at static-safe work stations, only.

Operating Precautions Observe the following normal precautions when handling and operating the

test set:

•Do not exceed the input power levels listed below:

•Do not exceed +15 dBm into the test set with the source RF input.

•Never apply a dc voltage to the source RF input of the test set.

•Do not torque any connection at the test port connectors to more than

90 N-cm (8 in-lb). The wrench supplied with your accessory kit is

calibrated for 90 N-cm (8 in-lb) torque.

•Do not torque any connection to more than 90 N-cm (8 in-lb) at the

source RF input or on the back of your test set.

Safety Precautions The voltages inside this test set warrant normal caution for operator safety.

Nevertheless, service should be performed by qualified personnel, only.

Service strategy, troubleshooting procedures, replaceable parts, and other

information about the test set are provided in this manual or the HP 8510C

On-Site Service Manual.

Table 1-7 Maximum Input Power Levels

Power Level Test Port

+17 dBm Port 1

+17 dBm Port 2

+30 dBm1

1. This is the maximum input power allowed with HP 8517B Option 004, or

Option 004 “plus” Option 007, when the attenuator is set to

≤

20 dB. Without

attenuation, the maximum input power allowed is +17 dBm.

Port 2 (Option 004, or Option 004 “plus” 007)

1-14

HP 8517B S-Parameter Test Set Manual

Getting Started

Operating and Safety Precautions

HP 8517B S-Parameter Test Set Manual

2-1

2

Installation

This chapter contains installation information. Topics include initial

inspection, environmental considerations, test set location when using it with

the HP 8510C network analyzer, and making connections to the test set.

Refer to “Installation” in the HP 8510C On-Site Service Manual for

complete system connection and turn-on instructions.

Refer to “Packaging the Test Set” for information about shipping the

instrument.

2-2

HP 8517B S-Parameter Test Set Manual

Installation

Initial Inspection

Initial Inspection

Inspect the shipping container and cushioning materials for damage. If there

is damage, keep the container until you have checked the contents for

completeness.

If shipping materials are damaged, complete the performance tests outlined

in the HP 8510C On-Site Service Manual. If the test set fails the

performance tests, or is damaged or defective, keep the shipping materials.

Notify both the carrier and the nearest Hewlett-Packard Sales and Service

Office (listed in “Service and Support” at the front of this manual).

The office can arrange for repair or replacement of the test set without

waiting for the claim settlement.

Operating

Environment

For the HP 8517B to operate within specifications, the ambient temperature

must remain between 0° Cand+55° C. Keep relative humidity to less than

95% (at 40° C dry bulb temperature, maximum). The instrument can be

operated at altitudes up to 4,500 meters (15,000 feet).

Storing the Test Set Acceptable storage temperatures range from –40° Cto+75° C, with relative

humidity ≤90% at +65° C (maximum dry bulb temperature) and at altitudes

up to 15,240 meters (50,000 feet).

Accessories Supplied Figure 2-1 illustrates accessories supplied with the test set. If you did not

receive one of these accessories with the test set, notify your nearest HP

Sales and Service Office so that the missing parts can be sent to you.

HP 8517B S-Parameter Test Set Manual

2-3

Installation

Initial Inspection

Figure 2-1 Accessories Supplied with the HP 8517B Test Set

CAUTION

Assemblies in the test set are extremely sensitive to damage by static

electricity. They may or may not continue to function if subjected to an

electrostatic discharge. Their reliability, however, will be impaired.

CAUTION

Always use an anti-static wrist strap when calibrating or verifying the test set

or while using the test set to measure devices. Never touch test port center

conductors. Use a wrist strap when connecting the extended center

conductor of a sliding load termination.

Table 2-1 Accessories in Figure 2-1

(1) Power Cord U.S.A. only (6) Female 2.4 mm to Female 2.4 mm Adapter

(2) Test Set Interconnect Cable (7) 20 mm, 98 N-cm (8 in-lb) Torque Wrench

(3) HP-IB Cable (8) 1/2” x 9/16” Open End Wrench

(4) Specification and Performance Verification Software (9) RF Source Cable, Bench-top Configuration

(5) Anti-rotation Clamps (10) RF Source Cable, Rack Configuration

2-4

HP 8517B S-Parameter Test Set Manual

Installation

Installing the Test Set Into a System Rack

Installing the Test Set Into a System Rack

The HP 85043C system rack is the recommended model to use. To

rack-mount the test set into a system configured with the HP 8510C, refer to

the “Installation” chapter of the HP 8510C On-Site Service Manual and to

the HP 85043C System Rack Manual.

Installing the Test Set

on a Bench

When installing the test set for use on a bench, place it on a grounded

anti-static work surface to reduce the chance of ESD damage. The antistatic

surface should extend far enough in front of the test set to provide effective

protection for the test ports and cable ends. See Figure 2-2.

A grounding receptacle is provided on the test set as an alternate grounding

point for your anti-static wrist-strap.

Figure 2-2 Recommended Static-Free Workstation Configuration

HP 8517B S-Parameter Test Set Manual

2-5

Installation

Configuring the Test Set in a System

Configuring the Test Set in a System

Figure 2-3 illustrates the cable connections for installing an HP 8517B in a

system. Refer to the information that follows to install the test set.

Figure 2-3 Configuring an HP 8517B Test Set in a System

2-6

HP 8517B S-Parameter Test Set Manual

Installation

Configuring the Test Set in a System

Connecting the System

Cables

Replacing O-Rings in

Anti-Rotation Clamps

The anti-rotation clamp’s internal O-ring is a field-replaceable part. There is

no need to disassemble the anti-rotation clamp.

When the O-ring no longer holds the RF cable securely, replace it by

following the instructions in Chapter 6, “Replacement Procedures.”

Table 2-2 Connection Instructions and Connector Descriptions

Connect System Power

and Control Cables

Check the test-set line module (see item (1) in Chapter 3, Figure 3-2 of this manual). It must be set for

the correct voltage in your region. Refer to Chapter 5, “Troubleshooting” of this manual for information

about changing the voltage selection or replacing the line fuse.

• After setting or confirming the line-voltage module, connect the test set power cord to an electrical

outlet.

• Attach the HP 8517B IF-interconnect cable from J11 TEST SET INTERCONNECT (on the test set’s

rear panel) to J1 TEST SET INTERCONNECT on the rear panel of the HP 85102 IF detector.

• Attach the system bus cable from HP 8517B J12 HP 8510 SYSTEM BUS connector to HP 8510C

INTERCONNECT on the HP 85101 display/processor.

The test set IF interconnect cable and the system bus cable transmit control signals between the test

set and the network analyzer.

Signal Path Connections The IF interconnect cable transmits IF signals from the test set to the HP 85102 IF detector.

• Attach one end of the 2.4 mm RF cable (item 9 or 10, Figure 2-1) to the RF output on the rear panel

of the HP 83651 Synthesized Sweeper.

• Attach the other end of the RF cable to the RF input on the HP 8517B Test Set.

Test Port Connectors Port 1 and Port 2 are male, NMD-2.4 mm connectors, and mate to female 2.4 mm connectors.

Anti-Rotation Clamps Use the anti-rotation clamps (item 5, Figure 2-1) to stabilize the test port or RF cable at the

connection, or to stabilize an adapter at the connection.

• Connect test port cables or adapters to the test ports.

• Torque the connections to 90 N-cm (8 in lb).

• Loosen the anti-rotation clamp thumb screw enough to slip the clamp over the cable and up to the

front panel. The clamp end with the flats should come to rest on the flats of the test port shoulder.

• Finger-tighten the thumb screws to prevent further loosening or tightening of the test port/RF cable

connection. Refer to Chapter 3, “Operation” of this manual for additional information.

HP 8517B S-Parameter Test Set Manual

2-7

Installation

Packaging the Test Set

Packaging the Test Set

To repackage the test set, use its original factory packaging.

Refer to the test set using its complete model and serial numbers in any

correspondence to an HP Sales and Service Office.

Containers and materials identical to those used in the original shipment by

the factory are available through Hewlett-Packard Sales and Service Offices.

However, commercially available, comparable packaging materials may be

used, also.

1. Wrap the test set in heavy paper or anti-static plastic.

2. If you are shipping the test set to an HP Sales or Service office, complete

and attach a service tag (located in the HP 8510C manual set).

3. Use sufficient shock absorbing material on all sides of the test set to

provide a thick, firm cushion and prevent movement.

4. Seal the shipping container securely and mark it “FRAGILE.”

2-8

HP 8517B S-Parameter Test Set Manual

Installation

Packaging the Test Set

HP 8517B S-Parameter Test Set Manual

3-1

3

Operating the HP 8517B Test Set

This chapter contains illustrations and descriptions of the HP 8517B front-

and rear-panel features. Information about operating multiple test sets

(Option 001) is also provided.

Front-Panel Features

Figure 3-1 Front-Panel Features of the HP 8517B Test Set

Table 3-1 Front-Panel Description

(1) Line Switch This switch turns the test set on or off. When the side of the switch labeled “0” is depressed, the

test set is OFF; when the side labeled “1” is depressed, the test set is ON.

(2) Line LED This LED is lit when the test set line switch is ON and not lit when the test set line switch is OFF.

(3) Active LED This LED lights about two seconds after power is turned on, following the successful conclusion of

the self-test. If the test set is used with other test sets (Option 001) and is not addressed by the HP

8510C, then this light remains off.

(4) Port 1 This test port transmits RF energy from the source to the DUT and receives reflected or transmitted

RF energy from the DUT. The reflected RF energy is coupled to a sampler within the instrument.

Connections made to this input must be torqued to 90 N-cm (8 in-lb), and no more.

(5) Bias Fuse The fuses that limit bias applied to Port 1 and Port 2 are located in these holders (see the

instrument front panel or the replaceable parts list for the fuse values).

HP 8517B S-Parameter Test Set Manual

3-2

Rear-Panel Features

Figure 3-2 Rear-Panel Features of the HP 8517B Test Set

(6) a1 LED This LED indicates that the test set is internally switched to the S11 or S21 mode and source power

is switched to Port 1.

(7) a2 LED This LED indicates that the test set is internally switched to the S22 or S12 mode and source power

is switched to Port 2.

(8) Port 2 This test port transmits RF energy from the source to the DUT and receives reflected or transmitted

RF energy from the DUT.

Table 3-2 Rear-Panel Descriptions

(1) Line Module Houses the line cord connector, line fuse and line voltage selector. Pull out the right side

of the line module cover to replace or change the fuse or to change the voltage selection.

Remove the voltage selector drum to rotate it to a different voltage setting. Recommended

fuse values are printed on the rear panel.

(2) RF Input A 2.4 mm connector that receives RF energy from the source. Connections made to this

input must be torqued no more than 90 N-cm (8 in-lb).

(3) J10 Test Set Interconnect Used only in test sets with Option 001. It allows connecting another test set to the option

001 test set. Up to four test sets can be serially connected to the analyzer. The HP 8510C

system automatically selects the IF output from the chosen test set for processing and

display. Refer to “Controlling Multiple Test Sets” in this chapter for more information.

(4) J11 Test Set Interconnect Transmits the IF signal from the test set to the HP 85102 IF detector. It also transmits

control signals bi-directionally.

(5) HP 8510 System Bus Address Switch A five-pole binary-weighted switch sets the test-set’s system bus address. The binary

weight of each pole is indicated on the rear panel. So are the On and Off positions. The

default setting is decimal twenty (off-off-on-off-on, from left to right).

Table 3-1 Front-Panel Description (Continued)

HP 8517B S-Parameter Test Set Manual

3-3

Controlling Multiple Test Sets

HP 851X Series, Option 001 test sets allow an HP 8510C to alternately

control up to four test sets connected to it. For example:

•While a measurement is underway on test set number 1 (equipped with

Option 001), a test device can be connected to test set number 2 (which

does not need Option 001).

•When the measurement on test set number 1 is complete, the HP 8510C

can then control test set number 2.

In a standard test set, the 20 MHz IF and control signals are applied directly

to J11 TEST SET INTERCONNECT, which is attached to the HP 8510C.

Option 001 adds a set of IF switches, control switches, and the J10 TEST

SET INTERCONNECT attachment. This configuration allows the selection

of the 20 MHz test set IF signal.

As shown in Figure 3-3 on page 3-4, test set number 1 can:

•apply its IF signal to the HP 8510C, or it can

•switch to pass the IF signal from test set number 2, through J10 TEST

SET INTERCONNECT, and into the HP 8510C.

(6) J12 8510 System Bus Connector Used for HP-IB communications with the HP 85101 display/processor.

(7) Port 2 Bias A female BNC connector used to supply bias through the center conductor of Port 2 to

active devices under test.

(8) Port 1 Bias A female BNC connector used to supply bias through the center conductor of Port 1 to

active devices under test.

Table 3-2 Rear-Panel Descriptions (Continued)

HP 8517B S-Parameter Test Set Manual

3-4

Figure 3-3 RF and IF Switching with Two Test Sets

Table 3-3 RF and IF Switch Settings in Figure 3-3, Above

New ADDRESS of

Test Set

1,

2

1. Not all system connections are illustrated.

2. In dual source configurations, the second source may be multiplexed in a similar manner. If only one

dual source test set is used, the second source may be connected directly to the appropriate test

set.

Test Set Number

Selected Coaxial Switch Port Selected

20 Number 1 Port 1

21 Number 2 Port 2

HP 8517B S-Parameter Test Set Manual

3-5

Multiple Test-Set Connections

For dual test-set configurations, set each rear panel address switch on each

test set to the address shown in Figure 3-3. Refer to Figure 3-4 on page 3-7

for the configuration of two or more test sets.

•Use the supplied test set interconnect cable to attach test set number 1,

J11 to the network analyzer.

•Use the supplied test set interconnect cable to attach test set number 2,

J11 to test set number 1, J10.

You may connect up to four test sets in a series if the total length of all test

set interconnect cables does not exceed 13 meters (about 40 feet). The last

test set connected in the chain does not require Option 001.

If the RF coaxial switch is not incorporated into the system, the RF input to

the test set must be manually switched to the active test set.

Initialization at

Power-Up

At power-up, configure the IF switches so that only one system test set is

active. To verify which test set is active, use the following steps:

1. Verify that all system test set LEDs are lit.

2. View the network analyzer’s test set address by pressing the

INSTRUMENT STATE,

[LOCAL]

key, then press

{TEST SET}

.

The HP-IB

address of the test set is displayed on the screen.

The address displayed must match the address of the test set selected. If

not, enter the correct address using the network analyzer’s key pad.

3. If an unselected test set’s LEDs are lit, deactivate it. Do this by entering

its address, pressing

[x1]

, then entering the address of the test set desired,

followed by

[x1]

.

Selecting a Test Set To select another test set, follow the procedure in Table 3-4 on page 3-6 of

this chapter.

HP 8517B S-Parameter Test Set Manual

3-6

Table 3-4 Selecting a Test Set When Multiple Units are Configured

Test Set IF Switching A test set is selected via the built-in capability of the analyzer to generate an addressed

command to each test set. Each time you change the

{HP-IB ADDRESS}

{TEST SET}

function (refer to LOCAL [MENU] in the

HP 8510C Operation and Service Manual

), the

network analyzer does the following:

• switches the IF signal of the previously addressed test set to external

• switches the IF signal of the newly addressed test set to internal

• sets the test set’s front panel ACTIVE LED to indicate test-set status

• applies the active test set’s IF signals directly to J11 TEST SET INTERCONNECT

• passes the inactive test set’s IF signals at J10 through to J11 and on to the next

test set or to the network analyzer

Test Set Addressing You can change the test set address via program control, or via the network analyzer front

panel keys. You must also change the mechanical switches on the test-set’s rear panel.

Here’s how:

1. Change the test set address via the network analyzer keys;

a. On the analyzer’s front panel, press the INSTRUMENT STATE [LOCAL] key, then

press

{TEST SET}

. The test set’s address appears on the display.

b. Using the key pad, enter the desired address for the test set, then press [x1]. The new

HP-IB address appears on the display.

2. Change the test set address via the HP-IB command:

From the controller, enter the HP-IB ADDRESS; command, followed by the

address value. Refer to the command reference for programming details.

3. Reset the mechanical switches on the test-set’s rear panel. Set the switches to match the

new HP-IB address displayed on the network analyzer screen.

RF Switch Driver Control When the

{HP-IB ADDRESS}

{TEST SET}

function is changed, the network analyzer

generates a code sequence. The code sequence is automatically issued across the

HP 8510C system bus to the device at the ADDRESS of RF SWITCH .

In the recommended configuration, the device is an HP 11713A attenuator/switch driver. The

switch/driver in turn controls one or more coaxial switches. These switches, (shown in a

Figure 3-3, and Figure 3-4) are used to choose which test set receives the RF output from the

network analyzer source.

The exact command issued depends upon the new value of the

{HP-IB ADDRESS}

{TEST SET}

value, also shown in shown in a Figure 3-3 and Figure 3-4.

HP 8517B S-Parameter Test Set Manual

3-7

Figure 3-4 RF and IF Switching with Four Test Sets

Table 3-5 Coaxial Switch Settings for Figure 3-4, Above

New ADDRESS

of Test Set

1,

2, 3

1. Not all system connections are shown.

2. In dual source configurations, the second source can be multiplexed in a similar manner.

3. If only one dual source test set is used, the second source can be directly connected to the

appropriate test set.

Test Set Selected

1, 2, 3

Coaxial Port Selected

with Switch #1 Coaxial Port Selected

with Switch #2

20 1 Port 1 Port 1

21 2 Port 1 Port 2

22 3 Port 2 Port 1

23 4 Port 2 Port 2

HP 8517B S-Parameter Test Set Manual

3-8

Measurement Calibration

After selecting the active test set, complete the system calibration procedure

as usual. When you select a different test set, make sure that you recall the

cal set that applies to that test set.

NOTE

Since the cal-set limited instrument state does not include the number of the

active test set, a cal set which does not apply to the current test set can be

turned on without displaying the HP 8510C caution messages. However, this

causes errors in the data displayed because incorrect error coefficients are

applied to the measured data.

For convenience, store a hardware-state file and an instrument-state file for

each combination of test set to cal set. You may also store your hardware

state file on a tape or disk for future use.

To change the configuration, recall the appropriate hardware state file. The

hardware state file:

•sets the address of test set

•issues the RF switch command, then

•recalls the appropriate instrument state file which

•recalls the cal set

HP 8517B S-Parameter Test Set Manual

3-9

Measuring High-Power Devices with Option 004

The HP 8517B, Option 004 test set enables devices with output power up to

30 dBm (1 watt) to be measured at Port 2, without adding external

attenuators. Reverse dynamic range (S12) degrades by approximately 3 dB.

When measuring devices having greater than +17 dBm output power, you

must use the Port 2 step attenuator to decrease the power to ≤+17 dBm.

The step attenuator has to be set during calibration for the value needed

during device measurements. However, this setting may cause inadequate

power level during calibration. Refer to “Changing Signal Path States After

System Calibration” on page 3-10 for additional information.

HP 8517B S-Parameter Test Set Manual

3-10

Changing Signal Path States After System

Calibration

Changing an internal attenuator or any external equipment after completing

the calibration means the measurement results cannot be specified. You must

use your own estimation of the potential error contribution due to the

change.

For example, when the port attenuation is changed with correction ON, the

message CAUTION: CORRECTION MAY BE INVALID displays. You must judge

whether the error is tolerable in the particular application and how to

compensate for the change.

The application question is: “Does increasing the signal level during

calibration improve the calibration enough to risk a possible increase in error

contributions when you change the setup?”

The only reason for changing an internal attenuator or external equipment

between calibrations and measurements is to maximize the signal level

under both conditions, thus minimizing uncertainty due to noise.

Many factors enter into a setup-change decision, for example:

•is it more accurate to calibrate at a low signal level without changing the

setup, or

•is it more accurate to change the setup to optimize levels for both the

calibration and measurement

Changing attenuators at Port 1 or Port 2 does not change the test set

mismatch, directivity, or isolation characteristics severely. It does change the

frequency response magnitude and phase, however. The difference between

frequency response calibration and measurement can be normalized by using

HP 8510C trace memories.

Changing the Test Port

Attenuators

If only the attenuators at Port 1 or Port 2 are changed, use the following

procedure to minimize errors:

1. Connect a short, or a thru, and set Port 1 and Port 2 attenuators for the

best IF signal levels during calibration.

2. Perform the appropriate measurement calibration.

3. Connect the correct calibration standard, set Port 1 and Port 2

attenuators to the value required for operating the test device.

HP 8517B S-Parameter Test Set Manual

3-11

If you view the response of a short circuit, notice that:

•Changing Port 1 attenuator has negligible effect on S11 marker reading

•Changing Port 2 attenuator has negligible effect on S22 marker reading

This is due to the way the attenuators are paired. Both the reference and the

test signal are changed by approximately equal amounts.

When viewing S21 or S12, however, changing Port 1 or Port 2 attenuators

offsets the marker reading by the difference value between Port 1 attenuator

and Port 2 attenuator.

Storing Trace

Memories

To compensate for the main frequency response effects due to changing

the attenuators, use the HP 8510C trace memories and trace mathematics

function, as explained below:

1. Connect the thru used for calibration and set the port attenuators to the

value used for device measurement.

2. Recheck the user parameter levels, then press PARAMETER [

S21

].

3. Press MENUS

[DISPLAY]

,then

{DATA AND MEMORIES}

.

Press DISPLAY:

{DATA-->MEMORY n}

to store the S21 trace in default trace

memory 1. This trace represents the frequency response difference

between the S21 signal path calibration and the measurement.

4. Press PARAMETER

[S12]

, then press the following DISPLAY: menu keys:

{SELECT DEFAULTS}

{DEFAULT to MEMORY: 2}

{DATA-->MEMORY 2}

The S12 trace is now stored in trace memory 2. This trace is the

frequency response difference of the S12 signal path between calibration

and measurement.

Viewing Normalized

Parameters

Use the traces stored in memory 1 and memory 2 to normalize the corrected

data to the new levels after the attenuation is changed. The next example

uses normalization for S21 or S12, only. To view the corrected parameters:

1. Press MENUS

[DISPLAY]

,then

{DATA AND MEMORIES}

2. Press PARAMETER

[S11]

and view the S11 measurement.

3. Press PARAMETER

[S22]

and view the S22 measurement.

4. Press PARAMETER

[S21]

, then the following DISPLAY: menu keys:

{SELECT DEFAULTS}

{DEFAULT to MEMORY: 1}

{MATH ( / ) }

HP 8517B S-Parameter Test Set Manual

3-12

5. View the S21 measurement. If the thru is connected, the transmission

coefficient should be 1 ∠0°.

6. Press PARAMETER

[S12]

, then press the following DISPLAY: menu keys:

{SELECT DEFAULTS}

{DEFAULT to MEMORY: 2}

7. Press PARAMETER

[S12]

to view the S12 measurement. If the thru is

connected, the transmission coefficient should be 1 ∠0°.

Normalization is turned OFF for S11 and S22 measurements. Then the

appropriate memory is selected and normalization is turned on to view S21

and S12.

Since these are accurate, repeatable attenuators, this sequence may be

effective in your application. If other parts of the test must be changed,

especially components connected to the test ports, this procedure may

require additional steps to adequately compensate for the changes.

HP 8517B S-Parameter Test Set Manual

3-13

Making Operational Checks

To check the operation of multiple test-set configurations, do the following:

1. Connect a device with a known response to test set number 1. Press the

following HP 8510C front-panel keys:

INSTRUMENT STATE

[LOCAL]

AUXILIARY MENUS

[SYSTEM]

{HP-IB ADDRESSES}

{TEST SET}

2. When the message TEST SET HP-IB ADDRESS appears, enter

[20]

,the

address of test set number 1, then press

[x1]

. The measurement trace from

test-set number 1 should display.

3. Store the trace in memory by pressing the following keys:

MENU

[DISPLAY]

{DATA AND MEMORIES}

{DATA --> MEMORY n}

DISPLAY

: {DATA and MEMORY]

4. Next, enter the HP-IB address of test set number 2, followed by

[x1]

,then

re-enter the address of test set number 1 followed by

[x1]

.

5. Repeat the above procedure for each of the other test sets in the system.

Observe any difference in the response between the stored trace and the

results trace by switching back and forth between the test sets.

Any differences in data that you suspect are due to the IF switch (Option

001) or to RF switching, must be checked out. Refer to Chapter 5,

“Troubleshooting the Test Set” in this manual.

HP 8517B S-Parameter Test Set Manual

3-14

Performance Verification

Standard system performance verification procedures verify the operation of

an Option 001 test set used as test set number 1.

To verify the performance of a different test set in the configuration, enter its

HP-IB address (as explained in “Making Operational Checks” on page 3-13)

to select it, then continue with this procedure.

Refer to the HP 8510C On-Site Service Manual for its performance

verification procedure.

HP 8517B S-Parameter Test Set Manual

3-15

Using Anti-Rotation Clamps

During the performance verification procedure, use anti-rotation clamps to

secure RF connections at the test ports of each test set. While installed, each

clamp stabilizes the connector on RF cable to the large nut on the test set’s

RF test port. If an adapter is used, the clamp stabilizes the adapter to the

front panel RF port connector.

Without these clamps, the test port connections can loosen when a device

under test is moved. As a result, the loosening can invalidate calibrations and

measurements.

NOTE

These instructions refer to an installation using HP RF cables. However, the

anti-rotation clamps may also be used with front panel adapters. Adapter

installations are similar. There are two anti-rotation clamps included in the

test set accessories box.

Attach the first clamp

Remove one anti-rotation clamp from the accessories box. Loosen its

thumb-screw until it is nearly freed from the counter-sink socket in the

clamp body. The clamp is shown as item (5) in Figure 2-1, “Accessories

Supplied with the HP 8517B Test Set.”

1. Gently push the clamp (round-hole end first) over and past the RF cable

connector to be used.

2. Fit the rubber O-ring in the round end of the clamp over the connector.

NOTE

If the O-ring is not snug or is damaged, refer to the Chapter 6, “Replacement

Procedures” for instructions about replacing the internal O-ring.

3. Wiggle the clamp to ease it over the connector.

4. Attach the cable to the test port and tighten it as specified in the cable

manual.

NOTE

Do not twist the cable as you attach it to the test port.

Use the torque wrench supplied with your calibration kit to tighten the cable

to 90 N-cm (8 in-lb). Do not over-torque the connection. See Figure 3-5.

HP 8517B S-Parameter Test Set Manual

3-16

CAUTION

Important! The test set RF connector becomes loosened easily. Hold the RF

cable securely throughout the remainder of this procedure. Do not allow the

cable to rotate.

Figure 3-5 Using a Torque Wrench Correctly

Positioning the thumb-screw

See Figure 3-6. Position the clamp so the thumb-screw is positioned at the

top of the clamp.

•Turn the clamp to visually align the clamp flats with the flats on the test

port connector nut.

•This positioning minimizes rotating the connector in the procedure step.

HP 8517B S-Parameter Test Set Manual

3-17

NOTE

The flats may actually be in any orientation, with respect to the front panel.

Figure 3-6 Visually Aligning Clamp and Nut Flats

Positioning the connector

See Figure 3-7. Maneuver the clamp over the RF connector and onto the test

port connector.

1. Hold the test cable with one hand. Use the other hand to press the clamp

gently and steadily, as you wiggle it into position straight over the RF

connector and onto the test port connector nut.

NOTE

Be sure to loosen the clamp when you are slipping it over the connector.

2. Fit the internal flats in the clamp over the flats on the test port connector

nut.

3. Avoid rotating the clamp as you position it so the RF connection remains

tight (remember it loosens easily).

Figure 3-7 Mating the Clamp and Nut Flats

3-18

HP 8517B S-Parameter Test Set Manual

Operating the HP 8517B Test Set

Using Anti-Rotation Clamps

Aligning the thumb-screw

See Figure 3-8. Ensure that the thumb-screw is aligned with the counter-sink

hole on the clamp’s body.

1. Push the clamp toward the test set front panel.

2. Finger-tighten the thumb-screw. The cable cannot be damaged if the

thumb-screw is tightened too tightly.

Figure 3-8 Aligning the Thumbscrew With the Counter-Sink Hole

Attaching the second clamp

To complete the anti-rotation clamp installation, repeat the steps above,

beginning at step 1 to attach the second clamp.

HP 8517B S-Parameter Test Set Manual

-1

HP 8517B S-Parameter Test Set Manual

4-2

Specifications

4

Specifications

Specifications describe the warranted performance of the instrument. The

electrical specifications of the test set when used with an HP 8510 network

analyzer, are defined in the HP 8510C On-Site Service Manual.

Mechanical Specifications

Supplemental Characteristics

Supplemental characteristics listed in Table 4-2 provide useful information

by giving typical, but non-warranted, performance parameters.

Table 4-1 HP 8510/HP 8517B Mechanical Specifications

Test Port Description Specification

Connector Type:

Precision, rugged male test-port connector

2.4 mm1

1. Precision rugged make test-port connector.

Center Pin Recession2

2. Refer to the calibration kit manual to learn about measuring the pin depth.

+0.00254 mm to +0.0178 mm

+0.0001 inches to +0.007 inches

Table 4-2 HP 8510/HP 8517B Supplemental Characteristics

Front Panel Test Ports

Connector type precision 2.4 mm, male

Connector torque 90 N-cm (8 in-lb), maximum

Impedance 50

Ω,

nominal

Damage-input level

At Port 1 and Port 2

: +17 dBm CW, RF

At Port 2 with Option 004:

30 dBm CW (1 watt) CW, RF

DC bias 500 mA, 40 Vdc, maximum

Nominal source operating power level

+

2 dBm to –20 dBm,

with flatness correction off, depending on frequency

Nominal connector-nut size 20 mm

4-3

HP 8517B S-Parameter Test Set Manual

Specifications

Rear Panel RF Connectors

Connector type precision 2.4 mm female

Recommended connection torque 90 N-cm (8 in-lb), maximum for precision-2.4 mm hardware

Damage input level 15 dBm1

Nominal connector-nut size 8 mm

User 1 Power Levels for Reference Channel Phase Lock

Minimum power level –45 dBm

Maximum power level –10 dBm to –20 dBm, depending on frequency

HP 8517B Power Requirements and Physical Characteristics

Operating temperature range 0

°

C to 55

°

C

Input Power (AC) 110, 120, 220, or 240 Vac, ±10%

Line frequency from 47 to 66 Hz

Dimensions 460 mm (High)

×

133 mm (Wide)

×

609 mm (Deep)

(18.1 inches H

×

5.25 inches W

×

24 inches D)

Weight 15 kg (35 lb), net

1. This must be AC coupled.

Table 4-2 HP 8510/HP 8517B Supplemental Characteristics (Continued)

HP 8517B S-Parameter Test Set Manual

4-4

Specifications

HP 8517B S-Parameter Test Set Manual

5-1

5

Troubleshooting the Test Set

The troubleshooting strategy for the HP 8517B S-Parameter test set is a

systematic sequence of procedures. The information may be used after

system-level troubleshooting has identified the test set as the problem

instrument.

Use the troubleshooting flowchart in Figure 5-2 to help isolate the faulty

assembly. Notice procedure numbers within some of the flow diagram

blocks. These are keyed to troubleshooting procedures. Perform the

numbered procedure associated with each block as you progress through the

chart.

Refer to the block diagrams, located at the end of this section, to help you

understand the test set’s operation.

5-2

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Theory of Operation

Theory of Operation

RF paths for Port 1 and Port 2 are similar. This section discusses in detail the

source power signal, as it is routed via the RF IN connector, through the test

set, and to Port 1 for S11 and S21 measurements.

Figure 5-1 Standard HP 8517B RF Block Diagram

TheRFSourcePower •RF source power enters the test set through the rear panel. The RF power

is applied to the switch/splitter (A18).

•At the switch/splitter, the power is attenuated by approximately 7 to

14 dB, depending upon frequency.

•The switch/splitter receives its control signals from the attenuator/switch

driver board (A5).

•The switch part of the switch/splitter, which is a combination of two

power splitters and a solid-state switch, selects the power splitter to use

and, therefore, the test port to receive the RF power.

•LEDs on the front panel and on the attenuator/switch driver board (A5)

indicate which test port is active.

HP 8517B S-Parameter Test Set Manual

5-3

Troubleshooting the Test Set

Theory of Operation

The Reference Signal

Path •The reference signal is routed from the switch/splitter through the

20-7 dB tapered pad (AT1) to attenuate any VTO feed-through signals.

•The signal is then applied to A10, the a1 sampler assembly, where it is

down-converted to a 20 MHz IF (intermediate frequency).

•Because the RF power is being routed to Port 1, the a1 IF signal is used

to phase lock the network analyzer. Had the RF power been routed to

Port2,thea2IFsignalwouldhavebeenusedtophaselockthenetwork

analyzer.

The Test Signal Path •The test signal is routed from the switch/splitter (A18) to the 60 dB

programmable attenuator (A16) for Port 1.

•The signal may then be attenuated in 10 dB steps or passed through

without attenuation to Port 1 bias tee (A7).

•A bias supply to provide dc voltage to Port 1 bias tee can be connected

to J8 on the rear panel of the test set, also.

•The RF signal rides this dc level which is used to turn active devices on

(bias ON) so their S-parameters can be measured.

•Beyond the bias tee, the test signal travels to the directional coupler

(A6).

•At the coupler, the incident RF power is applied to the device under test.

The S11 and S21

Measurements •The signal reflected from the DUT is separated from the signal incident

to the DUT by the Port 1 coupler (A6).

•The reflected signal exits the coupler and is applied to b1 sampler (A12),

then is down-converted to a 20 MHz IF signal.

•The S11 measurement is the ratio of the two IF signals from a1 and b1

samplers.

•The incident signal is transmitted through the DUT, through Port 2

coupler, then into b2 sampler (A13).

•The incident signal is down-converted to a 20 MHz IF so S21 can be

measured. S21 is the ratio of the two IF signals from samplers a1 and b2.

The Sampler Control

Switching •The samplers may be turned on and off, depending upon the parameter

being measured.

•Sampler switching is controlled by a microprocessor on the HP-IB board

assembly (A4). The default condition (test set power ON and no HP-IB

commands sent by the network analyzer) is for the test set to be active

with the RF signal applied to Port 1.

5-4

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Theory of Operation

•If the test set is equipped with Option 001 (multiple test set capability),

its begin state is inactive. That is, rather than using the test set’s internal

IF, a switch is set in the test set to accept an IF from another test set.

The LO Signal Control The LO, generated by A14 VTO/driver, is phase locked to the source so the

desired VTO harmonic is 20 MHz greater than the source frequency.

The phase-locked loop includes:

•Portions of the test set, such as the VTO summing-amp board (A3), the

VTO/driver (A14), and the a1 sampler assembly (A10), and

•The HP 8510C Network Analyzer

The VTO summing-amp board (A3) provides control voltages to tune the

VTOtothecorrectLOfrequency.

The VTO also has an output LENDRA (Low END of RAnge) which is

routed via the test set interconnect cable, to the HP 85102.

The LENDRA provides an indication to the network analyzer about whether

or not the VTO is operating within its normal frequency range.

If the VTO exceeds its normal frequency range, the network analyzer

displays the running error message VTO OVER RANGE.

CAUTION

Electrostatic Discharge Sensitive (ESD) Assemblies

Assemblies you might handle in these troubleshooting procedures are

extremely sensitive to damage from static electricity. They may or may not

continue to function if they are subjected to electrostatic discharge. Their

reliability, however, will be impaired.

HP 8517B S-Parameter Test Set Manual

5-5

Troubleshooting the Test Set

Troubleshooting Sequence

Troubleshooting Sequence

Use this troubleshooting flowchart, along with the procedures in the

following section, to help isolate faulty assemblies.

Figure 5-2 Troubleshooting Flowchart

5-6

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Sequence

Equipment Needed

But Not Supplied

Gather the equipment listed in Table 5-1 to use for troubleshooting the test

set (these items are not supplied with the instrument at shipment).

Table 5-1 Equipment Required, But Not Supplied

Equipment Type HP Part Number

1-point, Pozidriv screwdriver 8710-0899

2-point, Pozidriv screwdriver 8710-0900

Service adapter 85105-60210

5/16-inch torque wrench 8710-1655

Oscilloscope HP 1740A

HP 8517B S-Parameter Test Set Manual

5-7

Troubleshooting the Test Set

Troubleshooting Procedures

Troubleshooting Procedures

The troubleshooting procedures in this chapter are listed below:

•“A15 Primary Regulator Board Assembly” on page 5-7

•“A27 Post-Regulator Board Assembly” on page 5-7

•“Self-Test Indicators” on page 5-9

•“HP 85102 IF Amplifier Test” on page 5-12

•“Unratioed Power Test” on page 5-14

•“HP 8517B, Option 007 Unratioed Power Test” on page 5-20

•“Finding the Faulty Assembly” on page 5-23

A15 Primary Regulator

Board Assembly Use a digital voltmeter to check the voltages and an oscilloscope to check for

a maximum ripple level as listed in Table 5-2.

A27 Post-Regulator Board

Assembly (Option 007, Only) Use a digital voltmeter to check the voltages and an

oscilloscope to check for a maximum ripple level as listed in Table 5-3.

Table 5-2 Power Supply Voltages to A15

Nominal Voltage Test Point Voltage Range Maximum Ripple

Peak-to-Peak

+5.05 Vdc A15TP1 +4.75 to +5.25 2 mv

–5.20 Vdc A15TP2 –4.90 to –5.50 2 mv

+14.85 Vdc A15TP3 +14.10 to +15.60 2 mv

–14.85 Vdc A15TP6 –14.10 to –15.60 2 mv

Table 5-3 Power Supply Voltages to A27

Nominal Voltage Test Point Voltage Range Maximum Ripple

Peak-to-Peak

+5.0 Vdc A27TP1 +4.75 to +5.25 2 mv

–3.50 Vdc A27TP2 –3.26 to –3.75 2 mv

5-8

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-3 Power Supply Fuses and Test Points

HP-IB Address Switch The HP-IB address switch is located on the rear-panel of the instrument. It is

easy to access, but unnecessary to change unless the error message SYSTEM

BUS ADDRESS ERROR appears on the system display.

To set the HP-IB address switch, position the switches as illustrated in

Figure 5-4 (the LSB is on the left-hand side; the MSB is on the right-hand

side). The default setting is decimal twenty, or binary 10100 as read from

right-to-left (on, off, on, off, off). In the drawing, the dark-side is selected.

HP 8517B S-Parameter Test Set Manual

5-9

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-4 Instrument HP-IB Switch Setting

Fuse Location The fuse is located inside the line module at the rear panel of the test set. The

value rating and part number of the fuse is listed in Chapter 7, “Replaceable

Parts” of this manual. Review the information in Figure 5-5 to replace the

line fuse or to set the voltage selector cam.

Figure 5-5 Fuse and Voltage Cam Location

Self-Test Indicators If the front-panel ACTIVE LED (shown in Figure 5-6) fails to light within

five seconds after turning the power on, or if it lights immediately, the

instrument has failed self-test.

To determine the portion of the self-test that failed, note which LEDs on A4

board assembly are turned on. Figure 5-7 shows the location of the LEDs.

See Table 5-4 for the condition description of the LED status indicators.

5-10

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-6 The ACTIVE LED Location

If the Self-Test Fails to Run Properly

If the portion of memory holding the self-test program is faulty, the self-test

will not run properly. If any of the following conditions occur, it indicates

thattheA4HP-IBboardislikelytobefaulty.

•All LEDs flash briefly, then turn off

•All LEDs flash briefly and stay on

•The ACTIVE LED turns on too quickly after power on

•The ACTIVE LED does not turn on at all

HP 8517B S-Parameter Test Set Manual

5-11

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-7 HP 8518B Test Set, A4 Board Assembly LEDs

Table 5-4 Instrument Self-Test Indicator State Definitions

Self-Test Indication LSN TLK SRQ REM Time (Following Power-On)

PWON ON ON ON ON 0 to 0.5 seconds

Start ROM Test OFF ON ON ON on briefly (a flash)

5-12

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

HP 85102 IF

Amplifier Test The service adapter can substitute as a test set by returning the 20 MHz IF

signal from the HP 85102 to the amplifier on the HP 85102. Doing this

determines whether a fault is in the test set or is in the HP 85102.

Figure 5-8 Service Adapter Connections

Using the Service Adapter

1. Connect the service adapter as shown in Figure 5-8. On the network

analyzer, press:

INSTRUMENT STATE

[PRESET]

MENUS

[MARKER]

STIMULUS

[MENU]

{STEP}

PARAMETER

[MENU]

2. Examine each user parameter by pressing the

{USER 1 a1}

through

{USER 4 b1}

softkeys to observe unratioed power level traces at each

channel.

3. The traces should be flat lines, quite close to one another, as indicated by

the marker value (typically about –28 dB, ±5dB).

Pass ROM Test OFF OFF ON ON 0.5 to 0.2 seconds

Start RAM Test OFF OFF OFF ON N/A

Pass RAM Test OFF OFF OFF OFF after 2 seconds

Table 5-4 Instrument Self-Test Indicator State Definitions

Self-Test Indication LSN TLK SRQ REM Time (Following Power-On)

HP 8517B S-Parameter Test Set Manual

5-13

Troubleshooting the Test Set

Troubleshooting Procedures

Service Adapter Conclusions

Table 5-5 Results Observations

If all channels look good The HP 85102 is working properly. The problem is

most likely in the source or the test set. Refer to

Procedure 4, “Unratioed Power Tests” in this chapter.

If one or more channels look bad The problem is most likely in the HP 85102. Refer to

the HP 8510C On-Site Service Manual for information

about troubleshooting the HP 85102.

5-14

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Unratioed Power Test

We will examine six RF signal paths in the test set by observing their

associated IF signals. Figure 5-10 through Figure 5-15 show the test set

traces (and simplified block diagrams) that are typical for RF paths 1

through 6.

Figure 5-9 Diagram of IF Signal Path

Isolating Signal Path

Problems

Determining the RF component in the test set that is most likely the cause of

a failure can be accomplished within four steps:

1. Run the signal-path tests on paths 1 through 6 using the procedures on

the following pages.

2. Record your test results in Table 5-6 for each path.

3. Compare the results in Table 5-6 with those in Table 5-7.

4. Investigate the most probable cause, based on the information in

Table 5-7.

Testing Signal Paths 1-4

1. Set the network analyzer to its factory default settings by pushing the

front-panel TEST switch.

2. Set the source for step mode. Press the network analyzer keys:

INSTRUMENT STATE

[PRESET]

STIMULUS

[MENU]

{STEP}

HP 8517B S-Parameter Test Set Manual

5-15

Troubleshooting the Test Set

Troubleshooting Procedures

3. To examine each sampler’s IF signal, redefine which port and sampler

the network analyzer uses for the phase lock. Use the following steps:

a. Redefining to Port 2, sampler a2, press:

PARAMETER

[MENU]

{USER 3 a2}

then

{REDEFINE PARAMETER}

{DRIVE}

DRIVE:

{PORT 2}

{PHASE LOCK}

{a2}

{REDEFINE DONE}

Observe the resulting a2 IF trace on the display.

b. Redefining to Port 2, sampler b2, press:

{USER 2 b2}

then

{REDEFINE PARAMETER}

{DRIVE}

DRIVE:

{PORT 2}

{PHASE LOCK}

{a2}

{REDEFINE DONE}

Observe the resulting b2 IF trace on the display.

4. Connect an open (or short) to Port 1 and Port 2. Power is reflected back

to b1 and b2 samplers through the coupler.

To check each sampler trace, press:

{USER 1 a1}

{USER 2 b2}

{USER 3 a2}

{USER 4 b1}

5. Record your results for paths 1 thru 4 (

{USER 1}

to

{USER 4}

)inTable5-6.

NOTE

See Figure 5-10 for an RF signal-path 1 trace example. For Option 007, see

Figure 5-13.

5-16

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

TestingPaths5and6

1. Connect a cable between Port 1 and Port 2.

2. To observe the b1 power-level trace through path 5, press:

PARAMETER

[MENU]

{USER 4 b1}

then

{REDEFINE PARAMETER}

{DRIVE}

DRIVE:

{PORT 2}

{PHASE LOCK}

{a2}

{REDEFINE DONE}

The b1 path signal is illustrated in Figure 5-12. Typically, each trace

should resemble the examples in Figure 5-12, (±5dB).

3. Record your results in Figure 5-6.

4. To observe the b2 power level trace through path 6, press:

PARAMETER

[MENU]

{USER 2 b2}

then

{REDEFINE PARAMETER}

{DRIVE}

DRIVE:

{PORT 1}

{PHASELOCK}

{a1}

{REDEFINE DONE}

The b2 path signal is illustrated in Figure 5-12. Typically, each trace

should resemble the examples in Figure 5-12, (±5dB).

5. Record your results in Figure 5-6.

NOTE

Be sure that you return the parameters to their original conditions for a1, b1,

a2, and b2. Use the redefine function to achieve this, or push the instrument

TEST switch to restore factory default conditions.

HP 8517B S-Parameter Test Set Manual

5-17

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-10 RF Path 1 and Path 2, HP 8517B Standard Test Set

5-18

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-11 RF Path 3 and Path 4, HP 8517B Standard Test Set

HP 8517B S-Parameter Test Set Manual

5-19

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-12 RF Path 5 and Path 6, HP 8517B Standard Test Set

5-20

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

HP 8517B, Option 007

Unratioed Power Test Figure 5-13 through Figure 5-15 illustrate the signal path and trace display

for the unratioed power tests on HP 8517B, Option 007 model test sets.

Figure 5-13 RF Path 1 through Path 4, HP 8517B Option 007 Test Set

HP 8517B S-Parameter Test Set Manual

5-21

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-14 RF Signal for Path 1 through Path 4, HP 8517B Option 007

5-22

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

Figure 5-15 RF Path 5 and Path 6, HP 8517B Option 007

HP 8517B S-Parameter Test Set Manual

5-23

Troubleshooting the Test Set

Troubleshooting Procedures

Finding the Faulty

Assembly Compare the results recorded in Table 5-6 with the matrix in Table 5-7.

There are 32 possible combinations, twelve of which point to probable

failures. These are shown in Table 5-7.

Sample Diagnostics Suppose you have determined that paths 3 and 5 are bad. Paths 1, 2, 4, and 6

are good. Refer to Table 5-7. Notice that the most likely cause for the failure

is the b1 sampler.

Table 5-6 Test Results for Path 1 through Path 6

a1

Path1 a2

Path2 b1

Path 3 b2

Path 4 b1 thru

Path5 b2 thru

Path6

Table 5-7 Most Probable Failures (

B

indicates Bad;

—

indicates Good)

Path Most Probable Failure

a1

Path1

a2

Path2

b1

Path 3

b2

Path 4

b1 thru

Path5

b2 thru

Path6

Assembly, or Description of Condition

——————The HP 8517B test set is not the problem

B B B B B B The source, source cable, VTO, cables from rear

panel to switch splitter

— B — B B — The switch splitter

B—B——BThe switch splitter

——B—B—b1 sampler

B —————a1 sampler

— B ————a2 sampler

——— B — Bb2 sampler

— — B — B B Port 1 connector or directional coupler

—— B — B BA1, T1

——— B B —A2, T2

— — — B B B Port 2 connector or directional coupler

5-24

HP 8517B S-Parameter Test Set Manual

Troubleshooting the Test Set

Troubleshooting Procedures

HP 8517B S-Parameter Test Set Manual

6-1

6

HP 8517B Test Set Replacement Procedures

The replacement procedures in this chapter are listed below:

1“A18 Switch/Splitter Assembly” on page 6-5

2“A14, A10 to A13 Frequency Converter Assembly” on page 6-5

3“A15 Regulator Board Assembly” on page 6-6

4“C1 to C4 Filter Capacitors” on page 6-6

5“2.4 mm Test Port Connectors” on page 6-7

6“Fan Assembly Replacement” on page 6-8

7“T1 Power Transformer” on page 6-8

8“Anti-Rotation Clamp O-Ring Replacement” on page 6-10

9“A1 Front Panel and Interface Board Assembly” on page 6-10

10 “A7andA9BiasTees”onpage6-11

11 “A6 and A8 Test Port Couplers” on page 6-11

12 “A16 or A17 Port Attenuators” on page 6-11

13 “A22 Input Amplifier Assembly” on page 6-12

14 “A23 to A26 Buffer Amplifiers” on page 6-12

15 “A27 Post Regulator Board Assembly” on page 6-13

CAUTION

To prevent electrostatic discharge (ESD) damage, earth ground the work area

and yourself. Some of the assemblies being handled in the following

procedures are very sensitive to damage resulting from static discharges.

Assemblies exposed to ESD may or may not continue to operate properly.

Their reliability, however, will be degraded. Refer to Figure 6-1 for

ESD-safe workstation recommendations.

6-2

HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

Figure 6-1 ESD-Safe Workstation Configuration

Performance Tests

Performance test information and procedures are located in Chapter 8 of the

HP 8510C On-Site Service Manual.

Note that the HP 8510C performance test software (shipped with the test set)

is required to test the test set. The results generated during the HP 8517B

performance-test are based on its operation as part of the HP 8510C system.

The HP 8510C includes the test set, cables, calibration kit, and so forth.

Adjustments

The HP 8517B Test Set has no adjustments. Specifically, no attempt should

be made to adjust the samplers.

HP 8517B S-Parameter Test Set Manual

6-3

HP 8517B Test Set Replacement Procedures

Equipment Needed But Not Supplied

Table 6-1 lists the equipment needed to replace the assemblies documented

in the following procedures. See Figure 6-2 to locate the test set assemblies.

Table 6-1 Replacement-Procedure Tools Needed

Tools Used for Procedure: HP Part Number

2 point Pozidriv screwdriver all components 8710-0900

1 point Pozidriv screwdriver all components 8710-0899

5/16 inch torque wrench, 90 N-cm (8 in-lb) all components and 3.5 mm semi-rigid cables, 2.4/1.85

mm cables

8710-1765

5/16 inch torque wrench, 112 N-cm (10 in-lb) HP 8516A 2.4 mm semi-rigid cables 8710-1655

1/2 inch torque wrench, 280 N-cm (25 in-lb) 7 mm, 2.4 mm, 1.85 mm test port connectors 8710-1581

9/16 inch torque wrench, 470 N-cm (42 in-lb) HP 8517B rear panel 2.4 mm connectors 8710-1580

20 mm torque wrench, 90 N-cm (8 in-lb) 2.4 mm and 1.85 mm test port connectors 8710-1764

2.9 mm gage kit port connectors Part of HP 85056A Cal Kit

anti-static mat all components 9300-0797

wrist strap all components 9300-1257

clip lead C1-C4 capacitors any supplier

needle nose pliers couplers any supplier

wire cutters couplers, B1 fan any supplier

T-10 Torx screwdriver all components 8710-1623

T-15 Torx screwdriver all components 8710-1622

9/16 inch 50 in-lb torque wrench test ports 8710-1948

9/16 inch nut driver connector repair 8720-0008

1/2 inch torque wrench, 280 N-cm (25 in-lb) connector repair 8710-1581

100

Ω

, 20 watt resistor C1-C4 capacitor removal 0819-0019

1 inch torque wrench, 800 N-cm (72 in-lb) coupler removal and test port connector flange removal MTB 100 72 lb-in E1

5/16 inch open end wrench fan replacement and test port connector removal any supplier

1/2 inch open-end wrench RF input connector any supplier

1/2 x 9/16 inch thin wrench, fixed Test port connector removal 8710-1770

5/16 inch thin wrench 3.5 mm, 2.4 mm, 1.85 mm semi-rigid connector

removal

8710-2079

1. Order from Mountz Company, 1080 North 11th Street, San Jose, CA 95112, phone (408) 292-2214, or contact Mountz through the

internet at http://www.mountztorque.com/html/home.htm

6-4

HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

Figure 6-2 HP 8517B Major Assembly Location Diagram

HP 8517B S-Parameter Test Set Manual

6-5

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Assembly Replacement Procedures

Initial Precautions Before beginning any of the procedures in this chapter, do the following:

1. Turn off the HP 8517B test set.

2. Disconnect the test set’s power cord.

3. Remove the top- and side-covers, trim strips, and handles.

4. Do not exceed the maximum torque necessary to secure a connector.

Refer to Table 6-1 for torque specifications.

5. Exercise caution with semi-rigid cables; they can be bent very easily.

6. Reverse an assembly’s removal procedure for reinstallation, unless

otherwise instructed.

Switch/Splitter

Replacement

A18 Switch/Splitter Assembly

1. See Table 6-2 for component locations.

2. Remove the five semi-rigid cables and the three flexible cables from the

switch/splitter. (Reposition cables as required to ease removal.)

3. Remove the two fixed attenuators from the switch/splitter (note that

there are three fixed attenuators in Option 007, and in Option 004 “plus”

007).

4. Remove the two screws that attach the switch/splitter to the bracket.

5. Remove the switch/splitter from the test set.

Frequency Converter

Replacement

A14, A10 to A13 Frequency Converter Assembly

The frequency converter consists of the A14 VTO (voltage-tuned oscillator)

assembly and four samplers, A10 through A13. See Figure 6-2 for

component locations.

1. Remove the semi-rigid cable attached to each of the four samplers.

2. Remove the four in-line attenuators from the samplers (only in Options

007, Option 002 “plus” 007, and Option 004 “plus” 007).

3. Remove the six flexible cables from the frequency converter by pulling

gently on the gold connector.

4. Remove the four frequency converter mounting plate screws and the

bracket screw that fastens the frequency converter to the chassis.

5. Unplug the ribbon cable near the front panel.

6-6

HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

6. Unplug the four harnessed (multi-colored) wire and socket assemblies.

7. Lift the frequency converter out of the test set.

8. Remove the frequency converter bracket by removing the two Pozidriv

screws.

Regulator Board

Replacement

A15 Regulator Board Assembly

1. See Figure 6-2 for component locations.

2. Unplug the transformer socket from the regulator board.

3. Unplug the amplifier socket from the regulator board (only in Options

007, Option 002 “plus” 007, and Option 004 “plus” 007).

4. Remove the three mounting screws from the top edge of the regulator

board.

5. Remove the regulator board. (You may need to partially back out one of

the transformer mounting screws for clearance.)

Filter Capacitor

Replacement

C1 to C4 Filter Capacitors

1. With the test set in an upright position, pull the metal and plastic cover

off the 4 capacitors. See Figure 6-2 for the location of the filter

capacitors.

2. Turn the test set over and remove the bottom cover.

3. To discharge the capacitors, do the following:

a. Attach one end of an insulated clip lead to the chassis of the

instrument.

b. Attach the other end of the clip lead to a 100 ÞΩ20-watt resistor.

c. Use the resistor to discharge each capacitor terminal (the large

Pozidriv screw on the bottom side of the test set). Each capacitor has

two terminals.

d. Discharge all capacitor terminals. It takes approximately six seconds

per capacitor to discharge.

4. To remove a capacitor, remove the corresponding pair of screws and pull

the capacitor out of the test set.

HP 8517B S-Parameter Test Set Manual

6-7

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Test Port Connector

Replacement

2.4 mm Test Port Connectors

1. Incline the rear of the test set approximately four inches and support it

with a stable, solid object (such as a thick book).

2. Using a 9/16-inch open-end wrench, unscrew the test port connector nut.

3. Pull out the center conductor assembly and replace it with a new

assembly. Do not touch either end of the new assembly. Part numbers for

the test port connector components are located on page 7-16.

4. Replace the test port connector nut and torque it to 562 N-cm (50 in-lb).

5. Measure the pin depth of each port using a 2.4 mm female pin-depth

gage. Refer to the connector care information in the calibration kit

manual for more information about using the gage.

NOTE

If the center pin protrudes, or if the depth is less than 0.0001 inch, remove

the connector assembly and increase or decrease shims to adjust the pin

depth to between 0.0001 and 0.0007 inch. When measuring the pin depth be

sure to include the uncertainty calculation of your gage.

6. If you added or removed shims, regage the test port connector assembly.

Figure 6-3 Diagram of 2.4 mm Test Port Connector

6-8

HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Fan Assembly

Replacement

B1 Fan Assembly

Turn off the test set and disconnect the power cord from the ac-power mains.

WARNING

Electrocution can result if ac power remains connected to the test set during

this procedure. Disconnect the ac power cord before starting.

To replace the B1 fan assembly, remove T1 transformer to expose the ends of

the fan wires which must be de-soldered from the line module, FL1. Refer to

Chapter 7, “Replaceable Parts” in this manual for a detailed view of the fan

and transformer hardware.

1. See Figure 6-2 for component locations.

2. Position the test set on its right-hand side.

3. Using a 5/16-inch open-end wrench, remove the hard-line cables

connected between the couplers A7 and A9 and the bulkhead connectors

J2 and J5.

4. Unplug the transformer connector at J2 on the A15 regulator board.

5. Using a large Pozidriv screwdriver, remove the four screws and washers

that hold the transformer onto the rear panel.

6. Using a large Pozidriv screwdriver, remove the screw that holds the

transformer angle bracket to the main deck.

NOTE

The transformer wires soldered to the line module are short, so do not pull

the transformer out too far.

7. Carefully remove the transformer from the test set and place it on the

bench near the test set.

8. Strip the heat shrink tubing off the two fan wires, then de-solder the

wires from the line module. Cut any cable ties restraining the fan wires.

9. Using a small Pozidriv screwdriver, remove the screw and lockwasher

that secure the green/yellow fan ground wire to the top of the rear panel

frame.

10. Using a small Pozidriv screwdriver, remove the four screws that hold the

fan to the rear panel. Remove the fan assembly.

Power Transformer

Replacement

T1 Power Transformer

Turn off the test set and disconnect the power cord from the mains.

HP 8517B S-Parameter Test Set Manual

6-9

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

WARNING

Electrocution can result if ac power remains connected to the test set during

this procedure. Disconnect the ac power cord before starting.

1. See Figure 6-2 for component locations.

2. Position the test set onto its right-hand side.

3. Using a 5/16-inch open-end wrench, remove the hard-line cables

connected between the coupler A7 and the bulkhead connector J2.

4. Unplug the transformer connector from J2 on the A15 regulator board.

5. Using a large Pozidriv screwdriver, remove the four screws and washers

that hold the transformer onto the rear panel.

6. Using a large Pozidriv screwdriver, remove the screw that holds the

transformer angle bracket to the main deck.

NOTE

The transformer wires soldered to the line module are short, so do not pull

the transformer out too far.

7. Carefully remove the transformer from the test set and place it on the

bench near the test set.

8. Strip the heat shrink tubing off the transformer wires that are soldered to

the line module, and de-solder the wires.

9. De-solder the transformer ground wire connected to the chassis side rail.

10. Remove the transformer. When you replace the transformer, refer to

Figure 6-4 for the location of wires connected to the line module.

Figure 6-4 Wire Connections to FL1 Line Module

6-10

HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

O-Ring Replacement Anti-Rotation Clamp O-Ring Replacement

1. Pry the O-ring out of the clamp with fine tweezers or a similar tool.

2. To insert the new O-ring (HP part number 0900-0007), engage one side

of the ring in the slot of the phenolic clamp donut (shown in Figure 6-5).

3. Use your fingers to seat the O-ring into the groove within the clamp.

Figure 6-5 Positioning the O-Ring Within the Clamp

Front Panel and

Interface Board

Replacement

A1 Front Panel and Interface Board Assembly

1. See Figure 6-2 for component locations.

2. Remove the four semi-rigid cables that connect to the coupler on the

front panel.

3. Remove the ten screws that secure the front panel assembly to the front

frame.

4. Grasp the test ports and pull the front panel assembly out, tilting the top

of the assembly toward you.

5. Unplug the ribbon cable attached to the board assembly on the front

panel.

6. Grasp the cable attached to the line switch and carefully pull it toward

the front of the instrument. This provides enough cable length for you to

tilt the front panel assembly the rest of the way out of the test set frame.

7. Carefully remove the front panel assembly.

8. Lay the front panel assembly face down on the work surface.

HP 8517B S-Parameter Test Set Manual

6-11

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Bias Tees Replacement A7 and A9 Bias Tees

1. See Figure 6-2 for component locations.

2. Remove the two semi-rigid cables attached to the bias tee to be replaced.

3. De-solder the wires attached to the bias tee.

4. Remove the two screws that secure the bias tee to the bias-tee bracket.

5. Remove the bias tee.

NOTE

This procedure does not apply to Option 002 or Option 002 “plus” 007.

Test Port Coupler

Replacement

A6 and A8 Test Port Couplers

1. See Figure 6-2 for component locations.

2. Remove the front panel assembly as described in the procedure “A1

Front Panel and Interface Board Assembly”.

3. Remove the test port connector nut with a 1-inch wrench.

4. Remove the test port washer.

5. Remove the coupler from the front panel.

Test Port Attenuator

Replacement

A16 or A17 Port Attenuators

NOTE

This procedure does not apply to Option 002 or Option 002 “plus” 007.

1. See Figure 6-2 for component locations.

2. Remove the two semi-rigid cables attached to the attenuator.

3. Unplug the ribbon cable from the attenuator.

4. Remove the two screws that secure the attenuator bracket to the

amplifier bracket.

5. Remove the attenuator/attenuator bracket from the instrument.

6. Remove the two screws that secure the attenuator to the attenuator

bracket.

6-12

HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Input Amplifier

Replacement

A22 Input Amplifier Assembly

NOTE

This procedure is for Option 007, Option 002 “plus” 007, and Option 004

“plus” 007, only.

1. See the figure in Chapter 7, Table 7-17 for the location of the A22

amplifier.

2. Without disconnecting AT1 and AT2 fixed attenuators, remove the other

five semi-rigid cables attached to the A18 switch/splitter.

3. Remove the W45 semi-rigid cable between the A22 input amplifier and

J7 rear-panel RF input connector.

4. Remove the two screws holding the switch/splitter to the amplifier

mount bracket.

5. Remove the switch/splitter from the amplifier mount bracket.

6. Remove the four screws that secure the A22 input amplifier to the

amplifier-mount bracket.

Buffer Amplifier

Replacement

A23 to A26 Buffer Amplifiers

NOTE

This procedure is for Option 007, Option 002 “plus” 007, and Option 004

“plus” 007, only.

1. See the figure in Chapter 7, Table 7-17 for the location of the buffer

amplifiers.

2. Remove the two semi-rigid cables from the buffer amplifier to be

replaced.

3. Remove the four screws securing the buffer amplifier to the amplifier

mount bracket.

4. Remove the buffer amplifier.

HP 8517B S-Parameter Test Set Manual

6-13

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

Post Regulator Board

Replacement

A27 Post Regulator Board Assembly

NOTE

This procedure is for Option 007, Option 002 “plus” 007, and Option 004

“plus” 007, only.

1. See the figure in Chapter 7, Table 7-17 for the location of the A22

amplifier bracket. The A27 board assembly is located beneath the A22

amplifier bracket.

2. Without removing the step attenuator from the bracket (this step is not

applicable to Option 002 “plus” 007), remove the four semi-rigid cables

attached to the attenuators at Port 1 and Port 2.

3. Remove the four buffer amplifiers from the bracket (refer to “A23 to

A26 Buffer Amplifiers”).

4. Remove the A18 switch/splitter assembly (refer to “A18 Switch/Splitter

Assembly”).

5. Remove the A22 input amplifier (refer to “A22 Input Amplifier

Assembly”).

6. Remove the four screws attaching the amplifier bracket to the test set.

7. Flip the amplifier bracket over. Note the A27 board assembly mounted

to the underside of the bracket.

8. De-solder the two pins from the regulator to remove the A27 amplifier

regulator board assembly.

9. Remove the five screws holding the board assembly to the bracket.

10. Remove the two screws holding the voltage regulator to the bracket.

11. Remove the regulator board assembly from the amplifier mount bracket.

NOTE

Do not loosen the grommets (HP part number 3050-0003) located on the

regulator board assembly.

12. For reassembly, install two grommets on the underside of the mount

bracket. There are two cut-outs on the sheet metal for these grommet

insulators.

6-14

HP 8517B S-Parameter Test Set Manual

HP 8517B Test Set Replacement Procedures

Assembly Replacement Procedures

HP 8517B S-Parameter Test Set Manual

7-1

7

HP 8517B Replaceable Parts

Introduction

This section provides information about ordering replacement parts. Parts

that can be replaced include major assemblies and chassis hardware, but not

individual pieces of major assemblies. Table 7-1 lists the major assembly

reference designations and abbreviations used in the parts lists.

Rebuilt-Exchange

Assemblies

Rebuilt-exchange assemblies (R-E assemblies) cost less than new

assemblies. They are available through the rebuilt-exchange program.

Factory rebuilt (repaired and tested) assemblies meet all factory

specifications required of a new assembly. They are available on an

exchange (trade-in) basis only. Defective assemblies must be returned for

credit. Figure 7-2 illustrates the rebuilt-exchange procedure. The rest of the

figures in this chapter provide parts information. If you have any questions,

contact the HP Sales and Service office in your region.

Replaceable Parts List Use the illustrations in this chapter to help locate and identify HP 8517B

replaceable parts. Each illustration is accompanied by a replaceable parts list

that includes the following information:

•Hewlett-Packard part number.

•Part quantity as shown in the corresponding figure. (There may or may

not be more of the same part located elsewhere in the instrument.)

•Part description, using the abbreviations found in Table 7-3.

NOTE

A typical manufacturer of the part is identified by a five-digit code (refer to

the Manufacturers Code list in Table 7-2) and given only if a part is available

from an alternate supplier (other than Hewlett-Packard).

.

7-2

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Ordering Information

To order parts listed in the replaceable parts table, record the following

information, then address the order to the nearest Hewlett-Packard Sales and

Service Office:

the Hewlett-Packard part number

the quantity required

To order parts not listed in the replaceable parts lists, record the following

information:

the instrument model number

the complete instrument serial number

the description and function of the part, and

the number of parts required

Address the order to the nearest Hewlett-Packard Sales and Service Office.

The office addresses are provided in “Service and Support” of this manual.

ToOrderParts....Fast!

•Telephone 1-(800) 227-8164

•Monday through Friday, 6 am to 5 pm (Pacific Standard Time)

Hewlett-Packard Parts specialists have direct on-line access to replacement

parts inventory corresponding to the replaceable parts list in this manual.

There is a charge for one day delivery service. The standard delivery time is

four days.

For after hours and holidays, phone (415) 968-2347. The fast-service applies

to United States customers, only. Outside the United States, contact your

nearest Hewlett-Packard Sales and Service Office.

Table 7-1 Reference Designation Abbreviations

AAssembly FFuse SSwitch

AT Attenuator, Isolator, Limiter,

Termination

FL Filter T Transformer

B Fan, Motor HY Circulator TB Terminal Block

BT Battery J Electrical Connector

(Stationary Portion),

Jack

TC Thermocouple

C Capacitor K Relay TP Test Point

CP Coupler L Coil, Inductor U Integrated Circuit,

Microcircuit

CR Diode, Diode Thyristor, Step

Recovery Diode, Varactor

M Meter V Electron Tube

HP 8517B S-Parameter Test Set Manual

7-3

HP 8517B Replaceable Parts

DC Directional Coupler MP Miscellaneous

Mechanical Part

VR Breakdown Diode

(Zener), Voltage

Regulator

DL Delay Line P Electrical Connector

(Movable Portion), Plug

W Cable, Wire, Jumper

DS Annunciator, Lamp, Light

Emitting Diode (LED),

Signaling Device (visible)

Q Silicon Controlled

Rectifier (SCR),

Transistor, Triode

Thyristor

XSocket

E Miscellaneous Electrical Part R Resistor Y Crystal Unit

(Piezoelectric, Quartz)

RT Thermistor Z Tuned Cavity, Tuned

Circuit

Table 7-1 Reference Designation Abbreviations (Continued)

Table 7-2 Manufacturer Names and Addresses

Manufacturer

Code

Manufacturer Name Manufacturer Address

00000 Any satisfactory supplier N/A

00853 Sangamo Elec Co. S. Carolina Div Pickens, SC 29671

24546 Corning Glass Works (Bradford) Bradford, PA 16701

28480 Hewlett-Packard Co. Corporate HQ Palo Alto, CA 94304

56289 Sprague Electric Company North Adams, MA 01247

7-4

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Table 7-3 Standard Abbreviations

A

A Across Flats, Acrylic, Air (Dry Method), Ampere

ADJ Adjust, Adjustment

ANSI American National Standards Institute (formerly USASI-ASA)

ASSY Assembly

AWG American Wire Gage

B

BCD Binary Coded Decimal

BD Board, Bundle

BE-CU Beryllium Copper

BNC Type of Connector

BRG Bearing, Boring

BRS Brass

BSC Basic

BTN Button

C

C Capacitance, Capacitor, Cold, Center Tapped, Cermet, Compression

CCP Carbon Composition Plastic

CD Cadmium, Card, Cord

CER Ceramic

CHAM Chamfer

CHAR Character, Characteristic, Charcoal

CMOS Complementary Metal Oxide Semi-conductor

CNDCT Conducting, Conductive, Conductivity, Conductor

CONT Contact, Continuous, Control, Controller

CONV Converter

CPRSN Compression

CUP-PT Cup point

D

D Deep, Depletion, Depth, Diameter, Direct Current

DA Darlington

DAP-GL Diallyl Phthalate Glass

DBL Double

HP 8517B S-Parameter Test Set Manual

7-5

HP 8517B Replaceable Parts

DCDR Decoder

DEG Degree

D-HOLE D-Shaped hole

DIA Diameter

DIP Dual In-Line Package

DIP-SLDR DIP Solder

DO Package Type Designation

DP Deep, Depth, Diametric Pitch, Dip

D-MODE Depletion Mode

DP3T Double Pole Triple Throw

DPDT Double Pole Double

Throw

DWL Dowel

E

E-R E-Ring

EXT Extended, Extension, External, Extinguish

F

F Fahrenheit, Farad, Female, Fixed, Flange, Frequency, Film (Resistor)

FC Carbon Film/Composition, Edge of Cut-off Frequency, Face

FDTHRU Feed-through

FEM Female

FIL-HD Fillister Head

FL Flash, Flat, Fluid

FLAT-PT Flat Point

FR Front

RFEQ Frequency

FT Current Gain Bandwidth Product (Transition Frequency), Feet, Foot

FXD Fixed

G

GEN General, Generator

GND Ground

GP General Purpose, Group

H

H Henry

Table 7-3 Standard Abbreviations (Continued)

7-6

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

HDW Hardware

HEX Hexadecimal, Hexagon, Hexagonal

HLCL Helical

HP Hewlett-Packard Company, High Pass

I

IIC Collector Current, Integrated Circuit

ID Identification, Inside Diameter

IF Intermediate Frequency, Forward Current

IN Inch

INCL Including

INT Integral, Intensity, Internal

J

J-FET Junction Field Effect Transistor

JFET Junction Field Effect Transistor

K

K Kelvin, Key, Kilo, Potassium

KNRLD Knurled

KVDC Kilovolts Direct Current

L

LED Light Emitting Diode

LG Length, Long

LIN Linear, Linearity

LK Link, Lock

LKG Leakage, Locking

LUM Luminous

M

M Male, Maximum, Mega, Mi, Milli, Mode

MA Milliampere

MACH Machined

MAX Maximum

MC Molded Carbon Composition

MET Metal, Metallized

MHZ Mega Hertz

Table 7-3 Standard Abbreviations (Continued)

HP 8517B S-Parameter Test Set Manual

7-7

HP 8517B Replaceable Parts

MINTR Miniature

MIT Miter

MLD Mold, Molded

MM Magnetized Material, Millimeter

MOM Momentary

MTG Mounting

MTLC Metallic

MW Milliwatt

N

N Nano, None

N_CHAN N-Channel

NH Nano Henry

NM Nanometer, nonmetallic

NO Normally Open, Number

NOM Nominal

NPN Negative Positive Negative (Transistor)

NS Nanosecond, Non-Shorting, Nose

NUM Numeric

NYL Nylon (Polyamide)

O

OA Over-All

OD Outside Diameter

OP AMP Operational Amplifier

Opt Optical, Option, Optional

P

PA Picoampere, Power Amplifier

PAN-HD Pan Head

PAR Parallel, Parity

PB Lead (Metal), Push-button

PC Printed Circuit

PCB Printed Circuit Board

P-CHAN P-Channel

PD Pad, Power Dissipation

Table 7-3 Standard Abbreviations (Continued)

7-8

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

PF Pico Farad, Power Factor

PKG Package

PLSTC Plastic

PNL Panel

PNP Positive Negative Positive (Transistor)

POLYC Polycarbonate

POLYE Polyester

POT Potentiometer

POZI Pozidriv Recess

PREC Precision

PRP Purple, Purpose

PSTN Piston

PT Part, Point, Pulse Time

PW Pulse Width

Q

Q Figure of Merit

R

R Range, Red, Resistance, Resistor, Right, Ring

REF Reference

RES Resistance, Resistor

RF Radio Frequency

RGD Rigid

RND Round

RR Rear

RVT Rivet, Riveted

S

SAWR Surface Acoustic Wave Resonator

SEG Segment

SGL Single

SI Silicon, Square Inch

SL Slide Slow

SLT Slot, Slotted

SMA Subminiature, A-Type (Threaded Connector)

Table 7-3 Standard Abbreviations (Continued)

HP 8517B S-Parameter Test Set Manual

7-9

HP 8517B Replaceable Parts

SMB Subminiature, B-Type (Slip-on Connector)

SMC Subminiature, C-Type (Threaded Connector)

SPCG Spacing

SPDT Single Pole Double Throw

SPST Single Pole SIngle Throw

SQ Square

SST Stainless Steel

STL Steel

SUBMIN Subminiature

SZ Size

T

T Teeth, temperature, Thickness, Time, Timed, Tooth, Typical

TA Ambient Temperature, Tantalum

TC Temperature Coefficient

THD Thread, Threaded

THK Thick

TO Package Type Designation

TPG Tapping

TR-HD Truss Head

TRMR Trimmer

TRN Turn, Turns

TRSN Torsion

U

UCD

(or

µ

CD)

Microcandela

UF

(or

µ

F)

Micro Farad

UH

(or

µ

H)

Micro Henry

UL

(or

µ

CD)

Microliter, Underwriters’ Laboratories, Inc.

UNHDND Unhardened

V

V Variable, Violet, Volt, Voltage

VAC Vacuum, Volt—Alternating Current

Table 7-3 Standard Abbreviations (Continued)

7-10

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

VAR Variable

VDC Volts—Direct Current

W

W Watt, Wattage, White, Wide, Width

W/SW With, Switch

WW Wire Wound

X

X By (as used with dimensions), Reactance

Y

YIG Yttrium-Iron-Garnet

Z

ZNR Zener Diode

Table 7-3 Standard Abbreviations (Continued)

Table 7-4 Multipliers, Abbreviation and Description

Abbreviation Prefix Multiple

Ttera 10

12

Ggiga 10

9

M mega 106

kkilo 10

3

da deka 102

d deci 10-1

c centi 10-2

m milli 10-3

µ

micro 10-6

n nano 10-9

ppico 10

-12

f femto 10-15

a atto 10-18

HP 8517B S-Parameter Test Set Manual

7-11

HP 8517B Replaceable Parts

Figure 7-1 Power Cable and Plug Part Numbers

7-12

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Table 7-5 Instrument Fuses

Fuse Name Location Amps for 100 to 120 Vac

(part number) Amps for 220 to 250 Vac

(part number)

ac Line F1 Rear Panel 2.0 2110-0002 1.0 2110-0001

+5 Vdc F1 Regulator Board 1.5 2110-0043 1.5 2110-0043

- 5 Vdc F2 Regulator Board 1.0 2110-0001 1.0 2110-0001

+15 Vdc F3 Regulator Board 1.5 2110-0043 1.5 2110-0043

- 15 Vdc F4 Regulator Board 1.0 2110-0001 1.0 2110-0001

Bias Bias Fuses Front Panel 0.5 2110-0012 0.5 2110-0012

HP 8517B S-Parameter Test Set Manual

7-13

HP 8517B Replaceable Parts

Figure 7-2 The Low Cost Rebuilt-Exchange Procedure

Use this fast, efficient economical

method to keep your Hewlett-

Packard instrument in service.

*Hewlett-Packard pays postage on boxes mailed in the U.S.A.

7-14

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Table 7-6 Major Assembly Reference Designator and Parts Information

Ref Des HP Part Number QTY Description

A1 08513-60005 1 Front Panel Interface Board Assembly

A6, A8 5086-7518

5086-6518

2 50 GHz Coupler, (NEW)

50 GHz Coupler, (R-E)

A7, A9 5086-7484

5086-6484

2 Bias Tee (NEW)

Bias Tee (R-E)

A16, A17 33325-60004

33325-69004

2 60 dB Step Attenuator (NEW)

60 dB Step Attenuator (R-E)

A18 5086-7570

5086-6570

1 Switch/Splitter (NEW)

Switch/Splitter (R-E)

AT1, AT2 33340-60006 2 20-7 dB Tapered Pad

AT3 5063-0691 1 DC Return

A2 08513-60004

08513-69004

1 IF-MUX Used for Option 001 (NEW) See Table 7-14

IF-MUX Used for Option 001 (R-E)

A3 08517-60002

08517-69002

1 VTO Summing Amplifier Board Assembly (NEW)

VTO Summing Amplifier Board Assembly (R-E)

A4 08517-60003 1 HP-IB Board Assembly (NEW)

A5 08517-60001 1 Attenuator/Switch Driver Board Assembly

A10, A11, A12,

and A13

5086-6501 4 Frequency Converter Assembly

A14 5086-7501

5086-6501

1 Frequency Converter 50 GHz (Samplers and VTO) (NEW)

Frequency Converter 50 GHz (Samplers and VTO) (R-E)

A15 08516-60002 1 Regulator Board Assembly

A19 08513-60001 1 Motherboard Assembly

A20 08513-60006 1 HP-IB Interface Board Assembly

A27 08517-60044 1 Post Regulator Board Assembly

B1 08513-20031 1 Fan-TBAX 34-CFM 115 V 50/60 Hz 1.5kV DIEL

T1 9100-4723 1 Power Transformer

HP 8517B S-Parameter Test Set Manual

7-15

HP 8517B Replaceable Parts

Figure 7-3 Major Assembly Locations in the Standard HP 8517B Test Set

7-16

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Table 7-7 Semi-Rigid Cable Assemblies in the Standard HP 8517B Test Set

Ref Des HP Part Number Quantity Description

W10 08517-20039 1 Cable Assembly AT1 to A10J2

W31 08517-20042 1 Cable Assembly A8J3 to A11J2

W32 08517-20041 1 Cable Assembly A6J3 to A12J2

W33 08517-20038 1 Cable Assembly A8J2 to A9J2

W34 08517-20038 1 Cable Assembly A6J2 to A7J2

W35 08517-20028 1 Cable Assembly A17J2 to A18J7

W36 08517-20031 1 Cable Assembly A7J1 to A16J1

W37 08517-20027 1 Cable Assembly A16J2 to A18J1

W38 08517-20032 1 Cable Assembly A9J1 to A17J1

W39 08517-20056 1 Cable Assembly AT3 to Rear Panel J7

W40 08517-20040 1 Cable Assembly AT2 to A13J2

*Components not visible

HP 8517B S-Parameter Test Set Manual

7-17

HP 8517B Replaceable Parts

Table 7-8 Flexible Cable Assemblies in the Standard HP 8517B Test Set

Ref Des HP Part Number Quantity Description

W1 08513-60121 1 Cable Assembly A12J3 to A1J11

W2 08513-60122 1 Cable Assembly A13J3 to A4J11

W3 08513-60123 1 Cable Assembly A10J3 to A2J11

W4 08513-60124 1 Cable Assembly A11J3 to A3J11

W13 08513-60133 1 Cable Assembly A3J1 to A14J1

W14 08513-60134 1 Cable Assembly A3J2 to A7J11

W16 08513-60136 1 Cable Assembly A3J5 to A5J11

W18 08513-60138 1 Cable Assembly A3J7 to A6J11

7-18

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

W20 08513-60140 1 Cable Assembly A3J4 to A14J2

W21 08513-60141 1 Cable Assembly A5J2 to A18J4

W22 08513-60142 1 Cable Assembly A5J1 to A18J3

W23 08513-60143 1 Cable Assembly A5J3 to A18J6

W28 08517-60014 1 Ribbon Cable Assembly A16 through A19

W29 85102-60226 1 Cable Assembly Line Switch

W30 08513-60014 1 Cable Assembly J10 to J11

W42 08513-60036 1 Cable Assembly A4 to A20

W43 08513-60013 1 Cable Assembly A1 to A19

W44 08517-60015 1 Cable Assembly A17 through A19

Table 7-8 Flexible Cable Assemblies in the Standard HP 8517B Test Set (Continued)

HP 8517B S-Parameter Test Set Manual

7-19

HP 8517B Replaceable Parts

Table 7-9 Miscellaneous Parts, Front Panel HP 8517B Test Set

Ref Des HP Part Number Quantity Description

DS1,DS2 1990-0858 2 LED Lamp 25 MA, Maximum

E33,E34 2110-0797 2 Fuse Holder

F1,F2 2110-0012 2 Fuse 0.5 A 250 V

J13,J141 – 1 ea See Table 7-10

43 5021-8747 1 Front Bezel

48 1450-0615 2 Retainer LED

65 08340-40002 2 Mount LED

75 08517-00002 1 Front Dress Panel

76 08517-00003 1 Front Sub-Panel

1. See Table 7-10 for parts detail.

7-20

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Table 7-10 Test Port Connector Assembly Components

Item HP Part Number Quantity Description

1 5062-7274 1 Test Port Connector

2 5001-3930

5001-3904

5001-3905

5001-3906

.0002 IN SHIM

.0005 IN SHIM

.001 IN SHIM

.002 IN SHIM

3 5062-7276 1 Test Port Center Conductor

4 5021-3428 2 Test Port Connector Nut

5 5021-3427 2 Test Port Washer

HP 8517B S-Parameter Test Set Manual

7-21

HP 8517B Replaceable Parts

Table 7-11 Miscellaneous Parts, Rear Panel HP 8517B Test Set

Ref Des HP Part Number Quantity Description

E10 5062-7243 1 2.4 mm RF Connector Assembly

FL1 9135-0217 1 Line Module-Filtered

J10 1251-2197 1 Connector R&P 24F (Part of W30)

J11 1251-2204 1 Connector R&P 24M (Part of W30)

1 0380-0643 2 Standoff-Hex 0.255-IN-LG 6-32 THD

210400-0010 4 Grommet-Round 0.188-IN-ID .312-IN-GRV-OD

310380-0926 4 Threaded Insert-STDF 6-32 0.188-IN-LG SST

421251-7812 6 Connector Jackscrew

610380-0002 4 Screw-Mach 6-32 0.625-IN-LG PAN-HD-POZI

712510-0322 4 Nut-HEX-W/LKWR 6-32-THD 0.109-IN-THK

1032510-0270 4 Screw-Mach 8-32 3.25-IN-LG PAN-HD-POZI

1233050-0139 12 Washer-FL MTLC NO.8 0.172-IN-ID

1313050-0152 4 Washer-Shoulder NO.8 0.172-IN-ID .438-IN-OD

1413050-0227 4 Washer-FL MTLC NO.6 0.149-IN-ID

16 3160-0309 1 Finger Guard

17 08517-00001 1 Rear Panel

2132190-0017 4 Washer-LK INTL NO. 10 0.195-IN-ID

36108513-00002 1 Transformer Bracket

7-22

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

49 5021-0906 14 Teflon™ Cable Sleeve

50 5001-3907 2 Line Module Retainer Clips

51 2190-0016 2 Washer-LK INTL T 3/8 IN 0.377-IN-ID

52 2190-0104 1 Washer-LK INTL T 7/16 IN 0.439-IN-ID

5932950-0001 2 Nut-HEX-DBL-CHAM 3/8-32-THD 0.094-IN-THK

60 2950-0132 1 Nut-HEX-DBL-CHAM 7/16-28-THD 0.094-IN-THK

61 7121-2380 1 Serial Number Label

93308513-20032 2 Transformer Support Bracket

9620590-0663 6 Nut-HEX 4/40

1. See Figure 7-4, item 2 for detail.

2. See Figure 7-4, item 3 for detail.

3. See Figure 7-4, item 1 for detail.

Table 7-11 Miscellaneous Parts, Rear Panel HP 8517B Test Set

HP 8517B S-Parameter Test Set Manual

7-23

HP 8517B Replaceable Parts

Figure 7-4 Detailed Views of Hardware Stack-Ups

7-24

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Table 7-12 Miscellaneous Parts, Top Internal View

Item HP Part Number Quantity Description

1 0360-0031 1 Terminal Crimp

2 2360-0115 5 Machine Screw

3 08512-20005 1 RFI Gasket

4 08513-00001 1 Top Deck

5 08513-00002 1 Transformer Bracket

6 08513-00015 1 Capacitor Plate

7 2200-0109 2 Machine Screw

8 08514-00007 1 Mounting Plate

9 See Table 7-13 for all part

numbers and locations

– C1 through C4 and R1 through R4

10 0513-00037 1 Enclosure Bracket

HP 8517B S-Parameter Test Set Manual

7-25

HP 8517B Replaceable Parts

11 2200-0107 3 Machine Screws

Table 7-12 Miscellaneous Parts, Top Internal View

Table 7-13 Miscellaneous Parts, Motherboard

Ref Des HP Part Number Quantity Description Manufacturer

Code

Manufacturer Part

Number

C1 - C4 0180-2671 4 Capacitor-FXD .012F+75-10% 30VDC AL 00853 500123U030AC2A

bottom.pcx

7-26

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

C5 - C6 0160-4834 2 Capacitor-FXD .047

µ

F ±10% 100VDC CER

J1 1251-574 Connector 20-PIN M Post Type

(A19J1) DOES NOT INCLUDE A19MP1 and

A19MP2

Ref Des HP Part Number Quantity Description Manufacturer

Code

Manufacturer Part

Number

J2 1251-6868 4 Connector 5-PIN M Post Type

J3 1251-7939 1 Connector - Post Type 0.100-PIN-SPCG 14-CONT

(A19J3 DOES NOT INCLUDE A19MP3)

J4, J5, and J6 1251-6868 Connector 5-PIN M Post Type

J7 1251-3825 1 Connector 5-PIN M Post Type

J8 and J9 1200-0508 1 ea. Socket - IC 14-CONT DIP-SLDR

R1 and R2 0764-0015 1 ea. Resistor 560

Ω

5% 2W MO TC = 0±200

R3 and R4 0764-0016 1 ea. Resistor 1 k

Ω

5% 2W MO TC = 0±200

R5 and R6 0757-0394 1 ea. Resistor 51.1

Ω

1% 0.125W F TC = 0±100 24546 C4-1/8-T0-51R1-F

XA2, XA3, XA4,

and XA5

1251-7882 1 ea. Connector-PC Edge 2-Rows

XA6 to XA14 Not Assigned

XA15 1251-7882 1 Connector-PC Edge 2-Rows

Table 7-13 Miscellaneous Parts, Motherboard (Continued)

HP 8517B S-Parameter Test Set Manual

7-27

HP 8517B Replaceable Parts

Table 7-14 Parts Unique to HP 8517B Option 001 Test Set

Ref Des HP Part Number Quantity Description

A2 08513-60004 1 Board Assembly, IF Multiplexer (NEW)

08513-69004 Board Assembly, IF Multiplexer (R-E)

Cable Assemblies Unique to Option 001

W5 08513-60125 1 Cable Assembly, A2J2 to J11A1

W6 08513-60126 1 Cable Assembly, A2J8 to J11A4

W7 08513-60127 1 Cable Assembly, A2J5 to J11A2

W8 08513-60128 1 Cable Assembly, A2J11 to J11A3

W9 08513-60129 1 Cable Assembly, A2J3 to J10A1

7-28

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

W10 08513-60130 1 Cable Assembly, A2J9 to J10A4

Ref Des HP Part Number Quantity Description

W11 08513-60131 1 Cable Assembly, A2J6 to J10A2

W12 08513-60132 1 Cable Assembly, A2J12 to J10A3

W15 08513-60135 1 Cable Assembly, A3J3 to J10A7

W17 08513-60137 Cable Assembly, A3J6 to J10A5

W19 08513-60139 1 Cable Assembly, A3J8 to J10A6

W24 08513-60144 1 Cable Assembly, A12J3 to A2J1

W25 08513-60145 1 Cable Assembly, A13J3 to A2J7

W26 08513-60146 1 Cable Assembly, A10J3 to A2J4

W27 08513-60147 1 Cable Assembly, A11J3 to A2J10

W45 08517-20017 1 Cable Assembly, A8 to A18

W46 08517-20018 1 Cable Assembly, A6 to A18

Table 7-14 Parts Unique to HP 8517B Option 001 Test Set

HP 8517B S-Parameter Test Set Manual

7-29

HP 8517B Replaceable Parts

Table 7-15 Parts Unique to HP 8417B Option 002 Test Set

Ref Des HP Part Number Quantity Description

W59 08517-20743 1 Cable Assembly, A12J3 to Port 1 J13

W60 08517-20737 1 Cable Assembly, A13J3 to Port 2J14

7-30

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Table 7-16 Parts Unique to HP 8517B Option 004 Test Set

Ref Des HP Part Number Quantity Description

W55 08517-20051 1 Cable Assembly, AT7 to A9J1

W57 08517-20052 1 Cable Assembly, A8J3 to A17J2

W58 08517-20050 1 Cable Assembly, A17J1 to A11J2

AT7 08517-60020 1 3 dB Attenuator

HP 8517B S-Parameter Test Set Manual

7-31

HP 8517B Replaceable Parts

Table 7-17 Parts Unique to HP 8517B Option 007 Test Set

Ref Des HP Part Number Quantity Description

AT8 and AT9 08516-60021 2 3 dB Attenuators

A22 5086-7650 1 Input Amplifier

A23, A24,

A25, and A26

5086-7649 4 Buffer Amplifiers

A27 08517-60045 1 Post Regulator Board Assembly (Beneath A22 Input Amplifier)

7-32

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Ref Des HP Part Number Quantity Description

Cable Assemblies Unique to Option 007

W45 08517-20023 1 Front Panel J7 to A22 Input Amplifier

W46 08517-20024 1 A22 Input Amplifier to A18J5

W47 08517-2003 1 A6 Coupler to A23

W48 08517-20061 1 AT1 to A24

W49 08517-20036 1 A8 Coupler to A25

W50 08517-20062 1 AT2 to A26

W51 08517-20034 1 A23 to AT3

W52 08517-20029 1 A24 to AT4

W53 08517-20034 1 A25 to AT5

W54 08517-20030 1 AT6 to A26

AT3 33340-60004 1 13 dB to 5 dB Attenuator

AT4 08516-60004 1 10 dB Attenuator

AT5 33340-60004 1 13 dB to 5 dB Attenuator

AT6 08516-60007 1 10 dB Attenuator

Table 7-17 Parts Unique to HP 8517B Option 007 Test Set (Continued)

HP 8517B S-Parameter Test Set Manual

7-33

HP 8517B Replaceable Parts

Table 7-18 Parts Unique to Option 002 “plus” Option 007

There are no unique parts to Option 002 “plus” Option 007. All other parts are included in Option 002 or Option 007.

7-34

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

Table 7-19 Parts Unique to Option 004 “plus” Option 007

Ref Des HP Part Number Quantity Description

W56 08517-20049 1 A17J1 to A25

All other parts are included in Option 004 or Option 007.

HP 8517B S-Parameter Test Set Manual

7-35

HP 8517B Replaceable Parts

Table 7-20 Instrument Chassis Replaceable Parts

Item Number HP Part Number Quantity Description

1 08513-00040 1 Top Cover

2 08513-00041 1 Side Cover, Perforated

3 5021-8403 1 Front Frame

4 5062-3747 1 Bottom Cover

5 5062-3799 1 Handle Assembly

6 5021-8496 1 Trim, Front Handle

7-36

HP 8517B S-Parameter Test Set Manual

HP 8517B Replaceable Parts

7 5041-8821 4 Bottom Foot

8 5062-3757 1 Side Cover

Item Number HP Part Number Quantity Description

9 5021-5837 1 18-inch Corner Strut

10 5021-5804 1 Rear Frame

11 5041-8802 1 Trim Strip

12 5041-8821 2 Back Panel Foot

13 5021-8538 1 Lock Foot

14 5021-8540 1 Lock Foot

Table 7-20 Instrument Chassis Replaceable Parts (Continued)

Index

HP 8517B S-Parameter Test Set Manual

Index-1

A

abbreviations used in parts descriptions, 7-4

accessories descriptions, 2-3

active LED location, 3-1

adapter part numbers, 1-11

addressing a test set, 3-6

altering signal path conditions, 3-10

attaching anti-rotation clamps, 3-15

B

bias supply connector, 3-3

bias tees replacement, 6-11

bias tees usage, 1-2

block diagram, Option 004 HP 8517B, 1-3

block diagram, Option 007 HP 8517B, 1-3

block diagram, standard HP 8517B, 1-2

buffer amplifier replacement, 6-12

C

cable assemblies, flexible, 7-17

cable assemblies, semi-rigid, 7-16

cable descriptions and part numbers, 1-10

cabling the test set, 2-5

calibration cycle frequency, 1-6

calibration kit part number, 1-10

calibration procedure, 3-8

capacitor (filter capacitor) replacement, 6-6

CAUTION: CORRECTION MAY BE INVALID, 3-10

characteristics, 4-1, 4-2

characteristics of test set, 4-1

checking test set operation, 3-13

checking test-system operation, 1-5

checking test-system specifications, 1-5

choosing a test set from multiple test sets, 3-6

commands, switch driver, 3-6

configuration, 2-5

connection instructions, 2-6

connector-type descriptions, 2-6

D

definitions of prefixes used, 7-10

description of test set, 1-2

E

environmental requirements, 2-2

equipment requirements for replacing components, 6-3

ESD information, 6-1

ESD precaution, 1-13

F

fan assembly replacement, 6-8

features, front panel, 3-1

firmware compatibility matrix, 1-8

fixture kit part number, 1-11

frequency converter replacement, 6-5

front panel boards replacement, 6-10

front panel test ports, 4-1

front-panel parts ID, 7-19

fuse part numbers, 7-12

H

hardware stacking sequence, 7-23

high-power device measurement, 3-9

I

IF switching in the test set, 3-6

initializing a test set, 3-5

input amplifier replacement, 6-12

installing anti-rotation clamps, 3-15

J

J10 and J10 interconnect locations, 3-2

L

LED descriptions, 3-2

line module location, 3-2

M

manufacturer addresses (other than HP), 7-3

measurement accuracy maintenance, 1-6

measurement capabilities, 1-2

mechanical specifications, test set, 4-1

multiple test set configuration, 3-3, 3-7

Index-2

HP 8517B S-Parameter Test Set Manual

N

network analyzer compatibility matrix, 1-8

normalizing parameters, viewing, 3-11

O

operation precautions, 1-13

operation verification, 1-5

option descriptions, 1-4

options for service and support, 1-9

ordering information, 7-2

O-ring replacement, 2-6, 6-10

P

parts ID, front panel, 7-19

parts ID, instrument chassis, 7-35

parts ID, internal top view, 7-24

parts ID, major assemblies, 7-15

parts ID, motherboard, 7-25

parts ID, rear panel, 7-21

parts ID, test port components, 7-20

parts ID, unique to option 002, 7-27

parts ID, unique to option 002 "plus" 007, 7-33

parts ID, unique to option 004, 7-30

parts ID, unique to option 004 "plus" 007, 7-34

parts ID, unique to option 007, 7-31

phase lock, 4-2

phone-ordering parts, 7-2

physical characteristics, 4-2

plug assembly part numbers, 7-11

port attenuators replacement, 6-11

post-regulator board replacement, 6-13

power level input limits, 1-13

power requirements, 4-2

power transformer replacement, 6-9

powering up, 3-5

R

racking the test set, 2-4

R-E (rebuilt exchange assemblies) defined, 7-1

R-E process, 7-13

rear panel RF connector, 4-2

rear-panel parts ID, 7-21

reference channel phase lock power level, 4-2

reference designation, major assemblies, 7-14

reference designator abbreviations, 7-2

regulator board replacement, 6-6

replacement procedure basics, 6-5

revision information, 1-8

RF input damage level, 4-2

S

safety precautions, 1-13

sales and service internet address, vi

sales and service office locations, vi

selecting a test set, 3-5

serial prefix location and description, 1-7

service and support options, 1-9

shipping the test set, 2-7

source compatibility matrix, 1-8

static discharge precautions, 6-1

storage temperature, 2-2

switch/splitter replacement, 6-5

switch-driver control, 3-6

T

temperature and humidity requirements, 2-2

test equipment model requirements, 1-12

test port attenuator modifications, 3-10

test port characteristics, 4-1

test port couplers replacement, 6-11

test set, 4-2

test set accessories identification, 2-3

test set adapters, 1-11

test set connections, for two or more, 3-5

test set options, 1-4

test set specifications, 4-1

test set switching, two test sets, 3-4

test set test-fixture kit, 1-11

test set troubleshooting, 1-5

test-port connector replacement, 6-7

test-port parts ID, 7-20

trace memory storage, 3-11

U

user 1 power levels for reference channel, 4-2

using bias tees, 1-2

using multiple test-set configurations, 3-5

using the test set at a bench, 2-4

V

verification kit part number, 1-10

verifying test set performance, 3-14

viewing S11 to S22 parameters, 3-12

W

what to do with damaged shipments, 2-2