National Instruments Welding System 321645C 01 Users Manual NI DAQ Function Reference For PC Compatibles

2015-02-05

• NI-DAQ Function Reference Manual for PC Compatibl...
• Support
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• Important Information
  • Warranty
  • Copyright
  • Trademarks
  • WARNING REGARDING MEDICAL AND CLINICAL USE OF NATI...
• Contents
• About This Manual
  • How to Use the NIDAQ Manual Set
  • Organization of This Manual
  • Conventions Used in This Manual
    • MIO and AI Device Terminology
  • About the National Instruments Documentation Set
  • Related Documentation
  • Customer Communication
• Chapter 1 Using the NI-DAQ Functions
  • Status Codes, Device Numbers, and SCXI Chassis IDs...
  • Variable Data Types
    • Primary Types
    • Arrays
    • Multiple Types
  • Programming Language Considerations
    • Borland Delphi
    • Visual Basic for Windows
      • NIDAQ Constants Include File
  • NIDAQ for LabWindows/CVI
• Chapter 2 Function Reference
  • AI_Change_Parameter
  • AI_Check
  • AI_Clear
  • AI_Configure
  • AI_Mux_Config
  • AI_Read
  • AI_Read_Scan
  • AI_Setup
  • AI_VRead
  • AI_VRead_Scan
  • AI_VScale
  • Align_DMA_Buffer
  • AO_Calibrate
  • AO_Change_Parameter
  • AO_Configure
  • AO_Update
  • AO_VScale
  • AO_VWrite
  • AO_Write
  • Calibrate_1200
  • Config_Alarm_Deadband
  • Config_ATrig_Event_Message
  • Calibrate_DSA
  • Calibrate_E_Series
  • Config_DAQ_Event_Message
  • Configure_HW_Analog_Trigger
  • CTR_Config
  • CTR_EvCount
  • CTR_EvRead
  • CTR_FOUT_Config
  • CTR_Period
  • CTR_Pulse
  • CTR_Rate
  • CTR_Reset
  • CTR_Restart
  • CTR_Simul_Op
  • CTR_Square
  • CTR_State
  • CTR_Stop
  • DAQ_Check
  • DAQ_Clear
  • DAQ_Config
  • DAQ_DB_Config
  • DAQ_DB_HalfReady
  • DAQ_DB_Transfer
  • DAQ_Monitor
  • DAQ_Op
  • DAQ_Rate
  • DAQ_Set_Clock
  • DAQ_Start
  • DAQ_StopTrigger_Config
  • DAQ_to_Disk
  • DAQ_VScale
  • DIG_Block_Check
  • DIG_Block_Clear
  • DIG_Block_In
  • DIG_Block_Out
  • DIG_Block_PG_Config
  • DIG_DB_Config
  • DIG_DB_HalfReady
  • DIG_DB_Transfer
  • DIG_Grp_Config
  • DIG_Grp_Mode
  • DIG_Grp_Status
  • DIG_In_Grp
  • DIG_In_Line
  • DIG_In_Port
  • DIG_Line_Config
  • DIG_Out_Grp
  • DIG_Out_Line
  • DIG_Out_Port
  • DIG_Prt_Config
  • DIG_Prt_Status
  • DIG_SCAN_Setup
  • DIG_Trigger_Config
  • Get_DAQ_Device_Info
  • Get_NI_DAQ_Version
  • GPCTR_Change_Parameter
  • GPCTR_Config_Buffer
  • GPCTR_Control
  • GPCTR_Read_Buffer
  • GPCTR_Set_Application
  • GPCTR_Watch
  • ICTR_Read
  • ICTR_Reset
  • ICTR_Setup
  • Init_DA_Brds
  • Lab_ISCAN_Check
  • Lab_ISCAN_Op
  • Lab_ISCAN_Start
  • Lab_ISCAN_to_Disk
  • Line_Change_Attribute
  • LPM16_Calibrate
  • MIO_Calibrate
  • MIO_Config
  • RTSI_Clear
  • RTSI_Clock
  • RTSI_Conn
  • RTSI_DisConn
  • SC_2040_Config
  • SCAN_Demux
  • SCAN_Op
  • SCAN_Sequence_Demux
  • SCAN_Sequence_Retrieve
  • SCAN_Sequence_Setup
  • SCAN_Setup
  • SCAN_Start
  • SCAN_to_Disk
  • SCXI_AO_Write
  • SCXI_Cal_Constants
  • SCXI_Calibrate_Setup
  • SCXI_Change_Chan
  • SCXI_Configure_Filter
  • SCXI_Get_Chassis_Info
  • SCXI_Get_Module_Info
  • SCXI_Get_State
  • SCXI_Get_Status
  • SCXI_Load_Config
  • SCXI_ModuleID_Read
  • SCXI_MuxCtr_Setup
  • SCXI_Reset
  • SCXI_Scale
  • SCXI_SCAN_Setup
  • SCXI_Set_Config
  • SCXI_Set_Gain
  • SCXI_Set_Input_Mode
  • SCXI_Set_State
  • SCXI_Set_Threshold
  • SCXI_Single_Chan_Setup
  • SCXI_Track_Hold_Control
  • SCXI_Track_Hold_Setup
  • Select_Signal
  • Set_DAQ_Device_Info
  • Timeout_Config
  • WFM_Chan_Control
  • WFM_Check
  • WFM_ClockRate
  • WFM_DB_Config
  • WFM_DB_HalfReady
  • WFM_DB_Transfer
  • WFM_from_Disk
  • WFM_Group_Control
  • WFM_Group_Setup
  • WFM_Load
  • WFM_Op
  • WFM_Rate
  • WFM_Scale
  • WFM_Set_Clock
• Appendix A Status Codes
• Appendix B Analog Input Channel, Gain Settings, and Voltage C...
  • DAQ Device Analog Input Channel Settings
  • Valid Internal Analog Input Channels
  • DAQ Device Gain Settings
  • Voltage Calculation
  • Offset and Gain Adjustment
    • Measurement of Offset
    • Measurement of Gain Adjustment
• Appendix C NI-DAQ Function Support
• Appendix D Customer Communication
  • Electronic Services
  • Telephone and Fax Support
  • Technical Support Form
  • NI-DAQ for PC Compatibles Hardware and Software Co...
    • National Instruments Products
    • Other Products
  • Documentation Comment Form
• Glossary
  • Numbers/Symbols
  • A
  • B
  • C-D
  • E-H
  • I
  • K-M
  • N
  • O-P
  • R
  • S
  • T-U
  • V-X
• Index
  • Numbers
  • A
  • B
  • C
  • D
  • E
  • F-G
  • H-L
  • M
  • N-S
  • T-W
• Figures
  • Figure 2-1. High Alarm Deadband
  • Figure 2-2. Low Alarm Deadband
  • Figure 2-3. Analog Trigger Event
  • Figure 2-4. ND_BELOW_LOW_LEVEL
  • Figure 2-5. ND_ABOVE_HIGH_LEVEL
  • Figure 2-6. ND_INSIDE_REGION
  • Figure 2-7. ND_HIGH_HYSTERESIS
  • Figure 2-8. ND_LOW_HYSTERESIS
  • Figure 2-9. Pulse Generation Timing
  • Figure 2-10. Pulse Timing for pulseWidth = 0
  • Figure 2-11. Square Wave Timing
  • Figure 2-12. Digital Scanning Input Group Handshak...
  • Figure 2-13. Digital Scanning Output Group Handsha...
  • Figure 2-14. Simple Event Counting
  • Figure 2-15. Single Period Measurement
  • Figure 2-16. Single Pulse Width Measurement
  • Figure 2-17. Single Triggered Pulse Width Generati...
  • Figure 2-18. Start-Stop Measurement
  • Figure 2-19. Single Pulse Generation
  • Figure 2-20. Single Triggered Pulse Generation
  • Figure 2-21. Retriggerable Pulse Generation
  • Figure 2-22. Pulse Train Generation
  • Figure 2-23. Frequency Shift Keying
  • Figure 2-24. Buffered Event Counting
  • Figure 2-25. Buffered Period Measurement
  • Figure 2-26. Buffered Period Measurement when No S...
  • Figure 2-27. Buffered Semi-Period Measurement when...
  • Figure 2-28. Buffered Semi-Period Measurement when...
  • Figure 2-29. Buffered Pulse Width Measurement
  • Figure 2-30. Buffered Pulse Width when Gate Is Hig...
  • Figure 2-31. Buffered Two Signal Edge Separation M...
  • Figure 2-32. Mode 0 Timing Diagram
  • Figure 2-33. Mode 1 Timing Diagram
  • Figure 2-34. Mode 2 Timing Diagram
  • Figure 2-35. Mode 3 Timing Diagram
  • Figure 2-36. Mode 4 Timing Diagram
  • Figure 2-37. Mode 5 Timing Diagram
• Tables
  • Table 1. MIO and AI Devices
  • Table 1-1. Status Values
  • Table 1-2. Primary Type Names
  • Table 1-3. The LabWindows/CVI Function Tree for Da...
  • Table 2-1. Parameter Settings for AI_Configure
  • Table 2-2. Port 0 Digital I/O Lines Reserved
  • Table 2-3. Reglitching Parameters for Permissible ...
  • Table 2-4. Voltage or Current Output Parameters
  • Table 2-5. Parameter Values for FIFO Transfer Cond...
  • Table 2-6. Default Values for FIFO Transfer Condit...
  • Table 2-7. Parameter Setting Information for the A...
  • Table 2-8. Parameter Setting Information for the D...
  • Table 2-9. Parameter Setting Information for Outpu...
  • Table 2-10. Parameter Setting Information for Outp...
  • Table 2-11. Parameter Setting Information for Outp...
  • Table 2-12. Parameter Setting Information for Freq...
  • Table 2-13. Parameter Setting Information for the ...
  • Table 2-14. Parameter Setting Information for PLL ...
  • Table 2-15. Parameter Setting Information for the ...
  • Table 2-16. Possible Calibrate_1200 Parameter Valu...
  • Table 2-17. DAQEvent Messages
  • Table 2 -18. Valid Counters and External Timing Sig...
  • Table 2-19. Usable Parameters for Different DAQ Ev...
  • Table 2-20. Legal Values for gpctrNum Parameter
  • Table 2-21. Legal Values for paramValue when param...
  • Table 2-22. Definition of Other Counter for paramV...
  • Table 2-23. Default Source Selection for ND_SIMPLE...
  • Table 2-24. Legal Values for paramValue when param...
  • Table 2-25. Default Gate Selection
  • Table 2-26. Default Second Gate Selection
  • Table 2-27. Legal Values for paramValue when param...
  • Table 2-28. Legal Values for paramValue when param...
  • Table 2-29. Default Up/Down Selection
  • Table 2-30. Legal Values for the action Parameter
  • Table 2-31. Descriptions for application
  • Table 2-32. Terminal Count
  • Table 2-33. SCXI Module Scan List
  • Table 2-34. MIO or AI Scan List
  • Table 2-35. Possible Values for signal
  • Table 2-36. Legal Parameters for the 6602 Devices
  • Table 2-37. E Series Signal Name Equivalencies
  • Table 2-38. RTSI Bus Line and VXIbus Trigger Mappi...
  • Table 2-39. Data Ranges for the Buffer Parameter f...
  • Table 2-40. Mode Values for the Count Parameter fo...
  • Table 2-41. Mode Values for the Iterations Paramet...
  • Table 2-42. Array Structures for DDS Mode
  • Table 2-43. Array Structures for ARB Mode
  • Table A-1. Status Code Summary
  • Table B-1. Valid Analog Input Channel Settings
  • Table B-2. Valid Internal Analog Input Channels
  • Table B-3. Internal Channel Purposes for Analog In...
  • Table B-4. Valid Gain Settings
  • Table B-5. The Values of maxReading and maxVolt
  • Table C-1. MIO and AI Device Functions
  • Table C-2. Lab/516/DAQCard-500/700 Functions
  • Table C-3. DSA Device Functions
  • Table C-4. Analog Output Family Functions
  • Table C-5. Digital I/O Family Functions
  • Table C-6. Timing Device Functions
  • Table C-7. SCXI Functions