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16700 Series
Logic Analysis System
Catalog

Debugging today's digital systems
is tougher than ever. Increased
product requirements, complex
software, and innovative hardware
technologies make it difficult to
meet your time-to-market goals.

The Agilent Technologies
16700 Series logic analysis systems
provide the simplicity and power you
need to conquer complex systems
by combining state/timing analysis,
oscilloscopes, pattern generators,
post-processing tool sets, and
emulation in one integrated system.

2

Table of Contents

System Overview
Modular Design
Features and Benefits
Selecting the Right System

page 4
page 5
page 7

Mainframes
Display
Back Panel
System Screens
IntuiLink

page 8
page 9
page 10
page 13

Probing Solutions
Criteria for Selection
Technologies

page 14
page 15

Data Acquisition and Stimulus
State/Timing Modules
Oscilloscope Modules
Pattern Generation Modules
Emulation Modules

page 18
page 31
page 34
page 38

Post-Processing and Analysis Tool Sets
Software Tool Sets
Source Correlation
Data Communications
System Performance Analysis
Serial Analysis
Tool Development Kit
Licensing Information

page 40
page 42
page 47
page 55
page 62
page 68
page 74

Time Correlation with Agilent Infiniium Oscilloscopes
E5850A Logic Analyzer - Oscilloscope Time Correlation Fixture

page 75

Technical Specifications and Characteristics
Mainframe
Probing Solutions
State/Timing Modules
Oscilloscope Modules
Pattern Generation Modules

page 76
page 83
page 85
page 108
page 111

Trade-In, Trade-Up

page 122

Ordering Information

page 123

Third-Party Solutions

page 130

Support, Warranty and Related Literature

page 131

Sales Offices Information

page 132

3

System Overview
Modular Design

Modular Design Protects Your
Long-Term Investment
Modularity is the key to the Agilent
16700 Series logic analysis systems'
long term value. You purchase only
the capability you need now, then
expand as your needs evolve. All
modules are tightly integrated to
provide time-correlated, cross
domain measurements.

Module Choices

User Benefits

State/Timing

Agilent offers a wide variety of state/timing modules for a range
of applications, from high-speed glitch capture to multi-channel
bus analysis.

Oscilloscopes

Identify signal integrity issues and characterize signals quickly
with automatic measurements of rise time, voltage, pulse width,
and frequency.

Pattern Generation

Use stimulus to substitute for missing system components or to
provide a stimulus-response test environment.

Emulation

An emulation module connects to the debug port (BDM or JTAG)
on your target. You have full access to processor execution
control features of the module through the built-in emulation
control interface or a third-party debugger.

External Ports
Target Control Port

Use the target control port to force a reset of your target or
activate a target interrupt.

Port-in/Port-out

A BNC connector allows you to trigger or arm external devices
or to receive signals that can be used to arm acquisition
modules within your logic analyzer.

Help
enables you to
access the online
user’s guide and
measurement
examples.

Figure 1.1. The system boot up screen shows you
what modules are configured into your logic
analysis system.
4

System Overview
Features and Benefits

System Capability
Touch Screen Interface

The Agilent 16702B mainframe supports a large, 12.1 inch LCD touch screen and redesigned front panel
controls for an easy-to-operate, self-contained unit requiring minimal bench space and offering simple
portability.

Multiframe Configuration

By connecting up to eight mainframes and expanders you can simultaneously view 8,160 time-correlated traces
for buses in a large channel count, multibus system.

Enhanced Mainframe Hardware

Mainframe now includes a 40X CD-ROM drive, a 18 GB hard disk drive, 100BaseT-X LAN, and 128 MB of
internal system RAM (optional 256 MB total).

Scalable System
• State/timing analyzers
• Oscilloscopes
• Pattern generators
• Post-processing tool sets
• Emulation modules

• Select the optimum combination of performance, features, and price that you need for your specific
application today, with the flexibility to add to your system as your measurement needs change.
• View system activity from signals to source code.

Measurement Modules/Interfaces
The Agilent 16760A
State/Timing Module

With up to 1.5 Gb/s state speed, the 16760A lets you debug today’s and tomorrow’s ultra-high-speed
digital buses. NEW Eye scan gives a rapid comprehensive overview of signal integrity on hundreds of
channels simultaneously

NEW The Agilent 16750 Series
State/Timing Modules

With up to 600 MHz state speed and up to 64 MBytes of trace depth these modules help you address today’s
high-performance measurement requirements. (See page 20)

The Agilent 16720A
Pattern Generator

With up to 16 MVectors depth and 300 MVectors/sec operation and up to 240 channels[1] of stimulus, the
16720A provides a new level of capability that makes complex device substitution a reality. Supports TTL,
CMOS, 3.3V, 1.8V, LVDS, 3-state, ECL, PECL, and LVPECL.

High-Speed Bus Measurements
Made Simple with Eye Finder
Technology

Agilent’s eye finder technology automatically adjusts the setup and hold on every channel, eliminating the
need for manual adjustment and ensuring accurate state measurements on high-speed buses.

Timing Zoom Technology

Simultaneously acquire data at up to 4 GHz timing and 600 MHz state through the same connection. Timing
Zoom is available across all channels, all the time. (See page 24)

VisiTrigger Technology

• Use graphical views and sentence-like structure to help you define a trace event.
• Select trigger functions as individual trigger conditions or as building blocks to easily customize a trigger
for your specific task.

Processor and Bus Support

• Get control over your microprocessor’s internal and external data.
• Quickly and reliably connect to the device under test. (See page 38)

Direct Links to Industry Standard
Debuggers and High-Level
Language Tools

• Debuggers provide visibility into software execution for systems running software written in C and C++ as
well as active microprocessor execution control (run control).
• Import symbol files created by your language tool. Symbols allow you to set up trigger conditions and review
waveform and state listings in easily recognized terms that relate directly to the names used for signals on
your target and the functions and variables in your code.

Direct Links to EDA Tools

• Use captured logic analysis waveforms to generate simulation test vectors.
• Easily find problems by comparing captured waveforms with simulated waveforms.

[1] 240 channel system consists of five 16720A pattern generator modules with 48 channels per module. Full channel mode runs at 180 MVectors/s and 8 MVectors depth.
300 MVectors/s and 16 MVectors depth are offered in half channel mode.

5

System Overview
Features and Benefits

Data Transfer, Documentation, and Remote Programming
Direct Link to Microsoft® Excel via
Agilent IntuiLink

• Automatically move your data from the logic analyzer into Microsoft Excel with just a click of the mouse.
(See page 13)
• Use Microsoft Excel’s powerful functions to post-process captured trace data to get the insight you need.

Transfer Data for Offline Analysis Data Export

• Fast binary (compressed binary) from the FileOut tool provides highest performance transfer rate.
• ASCII format provides same format as listing display, including inverse-assembled data.

Transparent File System Access

• Access, transfer, and archive files.
• Stay synchronized with your source code by mapping shared directories and file systems from your
Windows 95/98/NT/2000/XP-based PC directly onto the logic analyzer and vice versa.
• Move data files to and from the logic analyzer for archiving or use elsewhere.

Documentation Capability

• Save graphics in standard TIFF, PCX, and EPS formats.
• Print screen shots and trace listings to a local or networked printer.
• Save your lab notes and trace data in the same file by entering relevant information in the Comments tab of
the display.

Remote Programming with
Microsoft’s COM Using
Microsoft Visual Basic or
Visual C++

• Perform pass/fail analysis, stimulus response tests, data acquisition for offline analysis, and system
verification and characterization tests.
• Powerful-yet-efficient command set focuses on your programming tasks, resulting in a shorter learning
curve while maintaining necessary functionality.

System Software Features
Post-Processing Analysis Tools

Rapidly consolidate large amounts of data into displays that provide insight into your system’s behavior.
(See page 40)

Setup Assistant

Quickly configure the logic analysis system for your target microprocessor. (See page 10)

Tabbed Interface

• Groups like tasks together so you can quickly find and complete the task you want to perform.
• Spend your time solving problems, not setting up a measurement.

Multi-Windowed View of
Target System Activity

• View your cross-domain measurements, time-corrected on the same screen. (See page 11)
• Debug faster because you can view system activity at a glance.

Global Markers

Track a symptom in one domain (e.g., timing) to its cause in another domain (e.g., analog).

Resizable Windows and Data Views

• Magnify your view or zoom in on a boxed area of interest.
• Resize waveforms and data or quickly change colors to highlight areas of interest.

Web-Enabled System

• Directly access the instrument’s web page from your web browser. (See page 12)
• Remotely check the instrument’s measurement status without disturbing the acquisition.
• Remotely access, monitor and control your logic analysis system.

Network Security

• Protect your networked assets and comply with your company’s security requirements with individual user
logins that provide system integrity.

NEW Time Correlation with
Infiniium 54800 Series Oscilloscopes

• Make time-correlated measurements using an Agilent 16700 Series logic analyzer and an
Agilent Infiniium 54800 Series oscilloscope.
• View Infiniium oscilloscope waveforms in the 16700 logic analyzer’s waveform display.
• Use the 16700 logic analyzer’s global markers to measure time between any domain in the 16700 and voltage
waveforms acquired by the Infiniium oscilloscope.

6

System Overview
Selecting the Right System

Selecting a system for your application

Select a mainframe (page 8)
Choose a system based on your needs:
• Self-contained unit or a unit with
external mouse, keyboard, and monitor
• Expander frame for large channel count
requirements

Determine your probing requirements (page 14)
• Are you analyzing a microprocessor?
• Do you need to probe a specific package type?

Select the measurement modules to meet your
application needs
•
•
•
•

State/Timing Logic Analyzers (page 18)
Oscilloscopes (page 31)
Pattern Generation (page 34)
Emulation (page 38)

Add post-processing tool sets for analysis and
insight (page 40)
•
•
•
•
•

Source correlation
Data communications
System performance analysis
Serial analysis
Tool development kit

Support, services, and assistance (page 131)
•
•
•
•

Training classes
Consulting
On-line support
Warranty extension
7

Mainframes
Display

12.1" LCD display with touch screen on
the 16702B makes it easy to view a large
number of waveforms or states.

Select a modifiable variable by touching
it, then turn the knob to quickly step
through values for the variable.

Dedicated hot keys give instant access to
the most frequently used menus, displays,
and on-line help.

Dedicated knobs for horizontal and vertical
scaling and scrolling. Adjust the display to
get just the information you need to solve
your problem.

"Touch Off" button disables the touch
screen and allows you to point out
anomalies to a colleague without altering
the display settings.

Dedicated knobs for global markers help
track down tough problems. A symptom
seen in one domain (e.g., timing) can be
tied to its cause in another domain
(e.g., analog).

Figure 2.1. The Agilent 16702B quickly tracks down problems in your design while saving precious bench space.

8

Mainframes
Back Panel

Five slots for
measurement
modules

Connection for optional monitor.
(Up to 1600x1200 video
resolution with option 003)

Expander frame connection provides an
additional five slots for measurement
modules.

Parallel printer port
10/100BaseT LAN - autosensing

Built-in 40x CD-ROM drive makes it easy
to install or update system software,
processor support, or tool sets.

SCSI-II connection for an
external 18 GByte data drive or
external removable hard drive

Option slot for an emulation module or
for a multiframe module. Multiframe
option allows up to eight mainframes
and expanders to be combined so that
you can see all the buses in a complex
target system.

Figure 2.2. The mainframe and expander frame provide advanced capabilities for debugging complex target systems.
9

Mainframes
System Screens

Figure 2.3. Icons in the power-up screen give you
quick access to common tasks.

System Admin
allows you to quickly set up the instrument on your network, configure
print servers, set up
user accounts for
security or install
software updates.

Setup Assistant
is a guided menu
system that helps
you configure the
logic analysis system for your target
microprocessor or
bus. Online information guides you
through the setup.
(See figure 2.4)

Demo Center
provides simple
demos of the most
commonly used
features.

Figure 2.4. Setup Assistant gets you up and
running quickly.

10

Mainframes
System Screens

See the Big Picture of Your
Prototype System's Behavior
A large external display (option 001)
with multiple, resizable windows
allows you to see at a glance more of
your target system's operation. A
built-in, flat-panel display in the
16702B fits in environments with
limited space. Color lets you highlight
critical information so you can find
it quickly.
Use one system to examine target
operation from different perspectives. Multiple time-correlated views
of data let you confirm both signal
integrity and software execution
flow. These views are invaluable in
solving cross-domain problems.

Figure 2.5. You can quickly isolate the root cause of system problems by examining target operation across a wide
analysis domain, from signals to source code.

11

Mainframes
System Screens

Expanding Possibilities with
Network Connectivity
Web-enabled instrumentation gives
you the freedom to access the
system—anywhere, anytime. Have
you ever needed to check on a
measurement's status while you were
in a remote location? Now you can.

With a Web Enabled Logic
Analysis System You Can...

...install Agilent IntuiLink to seamlessly
transfer data from the system to a PC

...access Agilent's Web site for the latest
online manuals and technical information

...access the logic analysis
system's Web page from
your browser by using the
instrument's hostname as
a URL

...access the system’s user
interface directly from within your browser, giving you
full control of all analysis
functions

...remotely check current
measurement status to find
out if the system has
triggered

...quickly check instrument
status to determine if the
system is available for use
Figure 2.6. Your logic analyzer is its own web site. From the Home Page, you can perform multiple remote functions.

12

Mainframes
IntuiLink

Agilent IntuiLink Moves Your
Data Automatically into
Microsoft® Excel for
Advanced Offline Analysis
IntuiLink is shipped with each logic
analysis system and can be downloaded to your PC from the system’s
own web page. Use the Agilent
IntuiLink tool bar to connect to a
logic analysis system. Select from
the available labels and specify
the destination cell location in
Microsoft Excel.
Use Microsoft Excel's powerful
functions to post-process captured
trace data for the insight you need.
Import data from a current
acquisition or data previously saved
to a file via the File Out tool.

Figure 2.7. Transfer data into Microsoft Excel with just a click of the mouse.

Programming
IntuiLink also includes an Active-X
automation server to provide
programmatic control of the logic
analysis system from an external
environment, such as LabVIEW or the
Microsoft VisualStudio environment
of Visual Basic and Visual C++ tools.
The instrument's Remote
Programming Interface (or RPI) also
allows you to write Perl or other
scripts to control the logic analyzer.
Use the sample programs provided
to assist you in creating your own
custom programs.

13

Probing Solutions
Criteria for Selection

Why is Probing Important?
Your debugging tools perform three
important tasks: probing your target
system, acquiring data, and analyzing
data. Data acquisition and analysis
tools are only as effective as the
physical interface to your target
system. Use the following criteria to
see how your probing measures up.

How to Determine Your
Requirements
To determine what probing method
is best to use you need to take the
following into consideration:
• The number of signals to be
probed
• The ability to design probing
connectors on the target PC board
itself
• Mechanical probing clearance
requirements
• Signal loading effects
• Ease of attachment
• Package type to be probed
DIP
Dual In-line Package
PGA
Pin Grid Array
BGA
Ball Grid Array
PLCC Plastic Leaded Chip
Carrier
PQFP Plastic Quad Flat Pack
TQFP Thin Quad Flat Pack
SOP
Small Outline Package
TSOP
Thin Small Outline
Package
• Package Pin Pitch (distance
between pin centers)

14

Figure 3.1. A rugged connection lets you focus on debugging your target, not your probe.

Immunity to Noise

EMF noise is everywhere and can corrupt your data. Active
attenuator probing can be particularly susceptible to noise effects.
Agilent Technologies designs probing solutions with high immunity to
transient noise.

Impedance

High input impedance will minimize the effect of probing on your
circuit. Although many probes are acceptable for lower frequencies,
capacitive loading dominates at higher frequencies.

Ruggedness

A flimsy probe will give you unintended open circuits. Agilent
Technologies' probes are mechanically designed to relieve strain and
ensure a rugged and reliable connection.

Connectivity

A multitude of device packages exist in the digital electronics industry.
Check our large selection of probing solutions designed for specific
chip packages or buses. As an alternative, we offer reliable
termination adapters that work with standard on-target connectors.

Probing Solutions
Technologies

Choose the Optimum Probing
Strategy for Your Application
Connecting to individual test
points with flying leads

Figure 3.2.

Advantages

Limitations

Most flexible method.
Flying-lead probes are included with logic
analyzer module (except 16760A).

Can be time-consuming to connect a large
number of channels. Least space-efficient
method.

NEW Figure 3.3. The E5381A (differential) and
E5382A (single-ended) flying lead probe sets provide
connections for 17 channels of the 16753A, 16754A,
16755A, 16756A and 16760A logic analyzers.

Figure 3.4. Surface mount IC clip.
5090-4356 (20 clips).

Figure 3.5. 0.5 mm IC clip.
10467-68701 (4 clips).

Connecting to all the pins of a
quad flat pack (QFP) package

Figure 3.6. Wedge adapters connect to multiple
pins of 0.5 mm or 0.65 mm QFP ICs. Refer to
“Probing Solutions for Agilent Technologies
Logic Analysis Systems,” publication number
5968-4632E, for specific part numbers.
Figure 3.7.

Advantages

Limitations

Rapid access to all pins of fine-pitch
QFP package.
Very reliable connections.

Requires minimal keepout area.

Refer to “Probing Solutions for
Agilent Technologies Logic Analysis
Systems,” publication number
5968-4632E, for specific solutions.
15

Probing Solutions
Technologies

Designing connections
into the target system

Figure 3.8. NEW Agilent’s soft-touch
connectorless probes provide high-density,
low capacitive loading, and high reliability,
without requiring a connector.

Advantages

Limitations

Very reliable connections.
Saves time in making multiple connections.

Requires advance planning in the design stage.
Requires some dedicated board space.
Moderate incremental cost.

High-density probing solutions
Model
number

Description

Requires kit of 5
connectors and 5 shrouds

Usable with
logic analyzers

E5385A

100-pin probe with built-in isolation networks
for the logic analyzer

16760-68701

All that use 40-pin 3M-style
mid-cable connector

E5346A

34-channel, 38-pin probe with built-in
isolation networks for the logic analyzer.

E5346-68701

All that use 40-pin 3M-style
mid-cable connector

E5351A

34-channel 38-pin adapter cable, requires logic
analyzer isolation networks on the target.

E5346-68701

All that use 40-pin 3M-style
mid-cable connector

E5339A

34-channel 38-pin low-voltage probe with built-in
isolation networks for the logic analyzer. Designed for
signals with peak-to-peak amplitude as small as 250 mV.

E5346-68701

All that use 40-pin 3M-style
mid-cable connector

E5378A

34-channel 100-pin single-ended probe

16760-68701

All that use 90-pin high-density
mid-cable connector

E5379A

17-channel 100-pin differential probe

16760-68701

All that use 90-pin high-density
mid-cable connector

E5380A

34-channel 38-pin single-ended probe

E5346-68701

All that use 90-pin high-density
mid-cable connector

E5387A

17-channel differential soft touch connectorless probe

Kit of 5 retention modules
supplied with probe. Part number
for additional kit of 5: E5387-68701

All that use 90-pin high-density
mid-cable connector

E5390A

34-channel single-ended soft touch connectorless probe

Kit of 5 retention modules
supplied with probe. Part number
for additional kit of 5: E5387-68701

All that use 90-pin high-density
mid-cable connector

16

Probing Solutions
Technologies

Moderate-density probing solutions

Figure 3.9. 01650-63203 termination adapter.

The Agilent 01650-63203 isolation
adapter contains the termination
networks for the logic analyzer. The
01650-63203 connects to a 3M 20-pin
connector on the target PC board.
Refer to "Probing Solutions for
Agilent Technologies Logic Analysis
Systems," publication number
5968-4632E, for design guidelines
and part numbers for mating
connectors.

You may also add the isolation
networks to the target PC board and
connect the logic analyzer cable
directly to a 40-pin 3M connector on
the PC board. Refer to "Probing
Solutions for Agilent Technologies
Logic Analysis Systems," publication
number 5968-4632E, for design
guidelines in addition to part
numbers for mating connectors
and isolation networks.

Using a processor- or bus-specific
analysis probe

Figure 3.10.

Advantages

Limitations

Easiest and fastest connection to supported
processors and buses.

Moderate to significant incremental cost.
Only useable for the specific processor or bus.
May require moderate clearance around
processor or bus.

Refer to “Processor and Bus Support
for Agilent Technologies Logic
Analyzers,” publication number
5966-4365E, for specific solutions.

17

Data Acquisition and Stimulus
State/Timing Modules

Selecting the Correct Modules
to Meet Your Needs
Selecting the proper logic analyzer
modules for your needs requires a
series of choices concerning

performance, cost, and the amount of
data you will be able to capture. The
following table explains these factors
in greater detail.

Considerations for Choosing Modules
Microprocessor/
Bus Support

Will you be using an analysis probe for a particular processor or bus? If so, a good starting point is the document Processor
and Bus Support for Agilent Technologies Logic Analyzers, publication number 5966-4365E, available on the worldwide web
at www.agilent.com/find/logicanalyzer. This document provides the number of channels and state speed required for any
particular analysis probe. It also indicates which analysis modules are supported and how many are required.

Timing Resolution

Timing analysis uses the logic analyzer's internal clock to determine when to sample. Since timing analysis samples
asynchronously to the system under test, you should consider what accuracy you will need to verify your system.
Accuracy is made up of two elements: sample speed and channel-to-channel skew. Remember to evaluate both of these
elements and be careful of logic analyzers that have a fast sample speed with a large channel-to-channel skew.

State Speed

• State analysis uses a clock or strobe signal from your system under test to determine when to sample. Because state
analysis samples are synchronous with the system under test, they provide a view of how your system is executing. You can
use state analysis to capture bus cycles from a microprocessor or I/0 bus and convert the data into processor mnemonics
or bus transactions using an Agilent Technologies inverse assembler.
• Select a state acquisition system that provides the speed and headroom you need without breaking your budget. Remember
that a microprocessor will have an internal core frequency that is normally 2X-5X the speed of the external bus.

Headroom

You may realize a better return on your investment if you consider possible future needs when purchasing analysis modules.
The things to consider are primarily state speed and memory depth.

Setup/Hold

• Logic analyzers require time for the data at the inputs to become valid (setup time), and time to capture the data (hold time).
A lengthy setup and hold can make the difference between capturing valid data or data in transition.
• Your device under test will ensure that data is valid on the bus for a defined length of time. This is known as the data valid
window. Your target's data valid window must be large enough to meet the setup/hold specifications of the logic analyzer.
The data valid window of most devices is generally less than half of the clock period. Don't be fooled by "typical" setup and
hold specifications for logic analyzers.
• As bus speeds increase, the time window during which data is stable decreases. Jitter, skew, and pattern-dependent ISI
add more uncertainty and consume a greater portion of the data-valid window at high speeds. A logic analyzer with eye finder
technology to automatically adjust the sampling position on each channel to the center of the data valid window provides
unparalleled measurement accuracy at high frequencies.

Transitional Timing

If your system has bursts of activity followed by times with little activity, you can use transitional timing to capture a longer
trace. In transitional timing, the analyzer samples data at regular intervals, but only stores the data when there is a transition
on one of the signals.

18

Data Acquisition and Stimulus
State/Timing Modules

Considerations for Choosing Modules (continued)
Channel Count

Determine the number of signals you want to analyze on your system under test. You will need this number of channels in
your logic analyzer. Even if you have enough channels to view all the signals in your system today, you should consider logic
analysis systems that allow you to add more channels for your future application needs.

Memory Depth

• Complex architectures and bus protocols make your debugging job increasingly challenging. Split transactions, multiple
outstanding transactions, pipelining, out-of-order execution, and deep FIFOs, all mean that the flow of data related to a
problem can be distributed over thousands or millions of bus cycles.
• The keys to useful insight are the combination of deep memory with responsive display refresh, search, rescaling, and
scrolling to help you find information and answers quickly. Hardware-assisted memory management in the Agilent 16740 Series
and 16750 Series state and timing analysis modules makes quick work of refreshing the display, rescaling, scrolling, and searching. It takes only a few seconds to refresh, rescale, or scroll a 64M sample record. Agilent Technologies offers a range of state
and timing analyzer modules with memory depths up to 128M samples, at prices to meet your budget.

Triggering

• The logic analyzer memory system is similar to a circular buffer. When the acquisition is started, the analyzer continuously
gathers data samples and stores them in memory. When memory becomes full, it simply wraps around and stores each new
sample in the place of the sample that has been in memory the longest. This process will continue until the logic analyzer
finds the trigger point. The logic analyzer trigger stops the acquisition at the point you specify and provides a view into the
system under test. The primary responsibility of the trigger is to stop the acquisition, but it can also be used to control the
selective storage of data. Consider a logic analyzer with the trigger resources you need to quickly set up your
measurements.
• After memory depth, triggering is the most important aspect of a logic analyzer to consider. On the one hand, powerful
triggering resources and algorithms will allow you to focus on potential problem sources without using up valuable memory.
On the other hand, to be useful, the trigger must be easy to set up.

Other
Measurements

In addition to the measurements made with an analysis probe, consider whether you need to monitor other signals. Be sure to
allow enough channels to make those measurements. For state measurements, the state speed of the analyzer must be at least
as high as the clock speed of your circuit. You may want to test the margin in your circuit by operating it at higher than the
nominal clock speed to determine if the analyzer has sufficient clock speed. For timing measurements, the timing analyzer rate
should be from 2-10X the clock speed of your target.

19

Data Acquisition and Stimulus
State/Timing Modules

Key Features of Agilent’s
State/Timing Modules

Multichannel
Eye measurements

Eye scan allows you to make eye diagram measurements, quickly and easily,
on hundreds of channels simultaneously (Available on 16753/54/55/56A and
16760A modules)

• Memory depth up to 128M
samples at a price to meet your
budget
• State analysis up to 1.5 Gb/s
• Timing Zoom 4-GHz (250ps)
timing on all channels
• VisiTrigger combines powerful
functionality with an intuitive
user interface
• Eye finder for automatic setup
and hold on all channels
• Eye scan for rapid insight into
signal integrity

High-speed
timing on
all channels

Timing Zoom provides up to 250ps timing resolution at 64K depth on all
channels simultaneous with state through the same probe.

Triggering for the
most elusive
problems

VisiTrigger combines powerful trigger functionality with a user interface
that is easy to understand and use. Capturing complex sequences of
events is as simple as pointing to the function you want to use and filling in
the blanks to customize it to your specific situation.

Reliable
measurements
on high-speed
buses

Eye finder automatically adjusts the setup and hold on every channel,
eliminating the need for manual adjustment and ensuring the highest
confidence in accurate state measurements on high-speed buses.

Choose the Logic Analyzer and Measurement Modules that Best Fit Your Application
State/Timing
Modules

Generalpurpose
hardware
debug

8/16 Bit
processor
debug

16710A/11A/12A

√

√

Highspeed
bus
analysis

Timing
margin
analysis or
characterize
setup/hold

√

16715A
16716A

32/64 Bit
processor
debug or
channel
intensive
systems

√

√

√

Deep trace
capture
with timing
or state
analysis

Highspeed
computer
debug

√

√

√

Analysis of
data intensive
systems and
performance

√

16717A

√

√

√

√

√

16740A/41A/42A

√

√

√

√

√

√

16750B/51B/52B/
53A/54A/55A/56A

√

√

√

√

√

√

√

√

16760A

√

A variety of measurement modules allow you to select the optimum combination of performance, features, and price to meet your specific needs now and in the future.

20

Data Acquisition and Stimulus
State/Timing Modules

Improve Your Productivity with an
Intuitive User Interface
Agilent Technologies has made the
user interface easy to understand
and use. Now you can spend more
time making measurements and less
time setting up the logic analyzer.

Format allows you to
group signals into buses.
Sampling defines how the logic
analyzer will acquire the data.

Trigger defines what
data is acquired.

Timing Zoom provides up to 4 GHz
timing analysis simultaneous with
state or conventional timing analysis
on all channels. (16716A, 16717A,
16740 Series, and 16750 Series only).

Measurement configuration and
data files can be loaded directly into
the logic analyzer

Menu tabs provide a logical
progression through the setup of
your measurement.

State and timing mode selections
specify how data is sampled.

Single location for access to all state
acquisition options.

Convenient color coding helps you
identify the signals in the interface
with the physical connection to your
device under test.
Figure 4.1. Setting up your logic analyzer has never been this easy.

Clocking for state measurements
can be quickly defined using the
clock setup menu.

21

Data Acquisition and Stimulus
State/Timing Modules

VisiTrigger Quickly Locates
Your Most Elusive Problems
VisiTrigger technology is a breakthrough in logic analysis usability. It
combines increased trigger functionality with a user interface that is easy
to understand and use. Now with
VisiTrigger, capturing complex events
is as simple as pointing to the trigger
function and filling-in-the-blanks.

Features and Applications
VisiTrigger
(available in the
16715A, 16716A, 16717A,
16740 Series, 16750 Series
and 16760A state/timing
modules)

• Use graphical views and sentence-like structures to help you
define a trace event.
• Select trigger functions as individual trigger conditions or as
building blocks to easily customize a trigger for your specific task.
• Set global counters to count events such as the number of times a
function executes, or the number of accesses to an l/O port.
• Set, clear or evaluate flags by any module in the frame. Flags allow
you to set up a trigger that is dependent on activity from more than
one bus in the system.
• Specify four-way arbitrary IF/THEN/ELSE branching.

Examples of Problems that Can be Captured Easily with VisiTrigger
Description

Typical Applications

Pulse too narrow or too wide

• Line hangs at wrong level (high or low).
• Asynchronous input (for example, an interrupt) persists too long.
• Strobe width is too narrow or too wide.

Graphic
Min width

Max width
OR
Pulse too wide

Pulse too narrow
Time between two edges is
longer than specified

• Excessive delay in responding to a bus grant request.
• Excessive delay in responding to a data valid with a data
acknowledged.

edge 1

edge 2
time

Pattern lasts longer than a
specified time

• A bus hangs up at a given value.

pattern
time

Pattern two exists within a
specified time after pattern
one is detected

• An incorrect response to a read or write.
• An incorrect output from a FIFO or bridge.

pattern 1
time
pattern 2

A pattern exists for less
than a specified time

• A driver is not holding a bus value long enough for a receiver to
respond.

pattern
time

22

Data Acquisition and Stimulus
State/Timing Modules

VisiTrigger
Your most commonly used triggers are
just a mouse click away with the built-in
trigger functions. VisiTrigger’s graphical
representation shows you how the
trigger condition will be defined. You can
use trigger functions as building blocks
to easily customize a trigger for your
specific task.

View current information on the state of
the timers, counters, flags, and the trigger
sequence level.

Save and recall up to ten of your
custom trigger setups without loading
a new configuration file.

Sequence levels allow you to develop a
sequence of analyzer instructions to
specify a trigger point or to qualify data
and store only the information that
interests you. Each step in the sequence
contains an "IF/THEN/ELSE" structure
that can evaluate up to four logic
events. Each event can specify a
combination of actions such as: store
sample, increment counters, reset
timers, trigger, or go to another step
in the sequence level.
Ranges provide a way to monitor
program and data accesses within a
specified area in memory.
Global counters can count events such
as the number of times a function
executes or accesses an I/O port.
Timers can be set up to evaluate when
one event happens too late or too soon
with respect to another event.
In timing mode, edge terms let you
trigger on a rising edge, falling edge,
either edge, or a glitch.
Patterns and their logical combinations
let you identify which states to store,
when to branch and when to trigger.

Flags can be set, cleared and evaluated by
any 16715A/16A/17A/16740 Series/
16750 Series/16760A module in the frame.
This allows you to set up a trigger that
is dependent on activity from more than
one bus in the system.

Values can be easily entered directly into
the trigger description.

Figure 4.2. Set up your trigger in terms of the measurements you want to make.

23

Data Acquisition and Stimulus
State/Timing Modules

4 GHz Timing Zoom Provides
High-Speed Timing Analysis
Across All Channels, All the Time
When you're pushing the speed
envelope, you may run into elusive
hardware problems. Capturing
glitches and verifying that your
design meets critical setup/hold
times can be difficult without the
proper tools. With Timing Zoom you
have access to the industry's most
powerful tool for high-speed
digital debug.

Features and Applications
Timing Zoom
(available in the
16716A, 16717A,
16740 Series and
16750 Series
state/timing modules)

• Simultaneously acquire up to 64K of data at 4 GHz timing and
600 MHz state across all channels, all the time, through the same
connection (16753/54/55/56A)
• Vary the placement of Timing Zoom data around the trigger point
• Efficiently characterize hardware with 250 ps resolution

Now it’s easy to capture simultaneous
4 GHz timing and high-speed state
information through a single connection.

Use the global
markers to
time-correlate
events across
multiple displays.

Timing Zoom labels are automatically
created and marked with an _TZ extension.
Figure 4.3. Verifying critical edge timing in your system is easy with Agilent Technologies' 4 GHz Timing Zoom technology.

24

Data Acquisition and Stimulus
State/Timing Modules

Eye Finder
Agilent’s eye finder examines the
signals coming from the circuit under
test and automatically adjusts the
logic analyzer’s setup and hold
window on each channel. Eye finder,
combined with 100 ps adjustment
resolution (10 ps on 16760A) on
Agilent’s logic analyzer modules,
yields the highest confidence in
accurate state measurements on
high-speed buses.

It takes less than a minute to run
eye finder. No special setup or
additional equipment is required.
You only need to run eye finder
once, when the logic analyzer is set
up and connected to the target.

Gray shading indicates
regions where
transitions are detected.

Blue bars indicate
the sampling point
selected by eye finder.

Figure 4.4. The eye finder display.

The eye finder display shows:
• Regions of transitions that were
discovered on all channels
selected
• The sampling point selected by eye
finder

Times in the eye finder display are
referenced to the incoming clock
transitions. The center of the display
(labeled "0 ns") corresponds to the
clock transitions.

If you want to select a different
sample point on any individual
channel, just drag and drop the blue
"sample" bar at the desired point.
25

Data Acquisition and Stimulus
State/Timing Modules

Eye Finder as an Analytical Tool

Examples of When to Run Eye Finder

Eye finder is very useful as a firstpass screening test for data valid
windows. Because eye finder quickly
examines all channels, it is
considerably faster than examining
each channel with an oscilloscope.
After running eye finder, you may
want to use an oscilloscope to
examine only those signals that are
close to your desired specifications
for setup and hold.

You should use eye finder in the
following situations:

Eye finder also can quickly provide
useful diagnostic or troubleshooting
information. If a channel has an
unexpectedly small data valid
window, or an anomalous offset
relative to clock, this could be an
indication of a problem, or could be
used to validate the cause of an
intermittent timing problem.
Differences in the position of the
stable region from one signal to
another on a bus indicate skew. An
indication of excessive skew on eye
finder can help isolate which
channels you want to check with an
oscilloscope, or with the Timing
Zoom 4 GHz timing analysis mode
in your logic analyzer.

When Do You Need Eye Finder?
Eye finder becomes critical when
the data valid window is <2.5 ns. If
you’re unsure where your clock edge
is relative to the data valid window,
you can run eye finder for maximum
confidence. If the clock in your
system runs at 100 MHz or slower,
and the clock transitions are
approximately centered in the data
valid window, you may not see any
transition zones indicated in the eye
finder display. This is because eye
finder only examines a time span of
10 ns (16760A: 6 ns) centered about
the clock.

26

Probing a new target, or probing
different signals in the same target
• Because eye finder examines the
actual signals in the circuit under
test, you should run it whenever
you probe a different bus or a
different target.
Significant change of target
temperature
• The propagation delays and
signal levels in your target system
may vary with temperature. If,
for example, you place your
target system in a controlled
temperature chamber to evaluate
its operation over a range of
temperatures or to trouble-shoot
a problem that only occurs at high
or low temperatures, you should
run eye finder after the target
system stabilizes at the new
ambient temperature.

Data Acquisition and Stimulus
State/Timing Modules

Features Supported in Agilent State and Timing Analysis Modules
Agilent Module Number

16710A, 16711A,
16712A

16715A

16716A, 16717A,
16740A, 16741A,
16742A, 16750B
16751B, 16752B

16760A

16753A, 16754A,
16755A, 16756A

Eye finder

√

√

√

√

VisiTrigger

√

√

√

√

√

Timing Zoom
Transitional timing

√

Context Store

√

√

√

Eye Scan
Single-ended inputs
Differential inputs

√

√

√

√
√

√

√

√

√

√

√

√

27

Data Acquisition and Stimulus
State/Timing Modules

Agilent 16760A: Extending Logic
Analysis to New Realms
• Differential inputs (single-ended
probes also available).
• State analysis up to 1.5 Gb/s.
• Setup-and-hold time of 500 ps.
• Input signal amplitude as low as
200 mV p-p.
Logic analysis at state speeds up to
1.5 Gb/s imposes a stringent set of
criteria for a logic analyzer.
• Probing
Agilent’s 16760A uses an innovative
probing system with only 1.5 pF of
probe tip capacitance, including the
connector. The connector is a joint
design between Agilent and Samtec,
optimized especially for logic analysis
measurements.
Ground pins located between every
pair of signal pins provide excellent
channel-to-channel isolation at high
speeds.

• Setup and hold

• Differential signals

As state speeds go up, the data valid
window shrinks. To make reliable
measurements, a logic analyzer’s
combined setup and hold window
must be smaller than the data valid
window of the signals it is acquiring.
Agilent’s 16760A has a combined
setup and hold time of 500 ps to
match the data valid window of
very high-speed buses.

Many high-speed designs use differential signaling to minimize simultaneous switching noise and to provide
immunity to crosstalk and noise. The
Agilent 16760A has differential inputs
to allow you to acquire differential
signals with complete confidence.
Single-ended probes are also available.

To position the analyzer’s setup-andhold window inside the data valid
window requires very fine adjustment resolution. The 16760A gives
you the ability to position the setupand-hold window with 10 ps resolution.

To probe high-speed signals with a
logic analyzer, you need to design the
probe in when you are designing your
PC board. The following document
from Agilent will help you design your
system to take maximum advantage
of the capabilities of the 16760A logic
analyzer:

Agilent helps you get started in the
design stage.

• Small-amplitude signals
Many high-speed designs use small
signal amplitudes to limit slew rates
and reduce power. Agilent’s 16760A
can make reliable measurements on
signals as small as 200 mV p-p.

• Logic signal standards supported
TTL
LVTTL
HSTL Class I & II HSTL CLass III & IV
SSTL2
SSTL3
AGP-2X
LVCMOS 1.5V
LVCMOS 1.8V
LVCMOS 2.5V
LVCMOS3.3V
CMOS 5V
ECL
LVPECL
PECL
User defined from -3V to +5V in 10mV
increments

Publication Title

Description

Publication Number

User’s Guide, Agilent Technologies E5378A, E5379A,
E5380A, and E5386A Probes for the 16760A Logic Analyzer

Mechanical drawings, electrical models,
general information on probes for the 16760A

16760-97010

Designing High-Speed Digital Systems for
Logic Analyzer Probing

Guidelines and design examples for designing
logic analyzers probing into your target system

5988-2989EN

28

Data Acquisition and Stimulus
State/Timing Modules

Eye scan
In the eye scan mode, the Agilent
16753A, 16754A, 16755A, 16756A,
and 16760A scans all incoming
signals for activity in a time range
centered on the clock and over the
entire voltage range of the signal.
The results are displayed in a graph
similar to an eye diagram as seen
on an oscilloscope.
As timing and voltage margins
continue to shrink, confidence in
signal integrity becomes an
increasingly vital requirement of
the design verification process.
Eye scan lets you acquire comprehensive signal integrity information on
all the buses in your design, under a
wide variety of operating conditions,
in minimum time.
Qualified eye scan
In the qualified eye scan mode
(16760A only), a single qualifier
input defines what clock cycles are
to be acquired and what cycles are
to be ignored in the eye scan
acquisition. For example, you may
wish to examine the eye diagram
for read cycles only, ignoring
write cycles.
Cursors
Two manually positioned cursors
are available. The readout indicates
the time and voltage coordinates of
each cursor.
Eye limit
The eye limit tool is a single point
cursor that can be positioned manually. The readout indicates the inner
eye limits detected at the time and
voltage coordinates of the cursor.
Histogram
The histogram tool indicates the relative number of transitions along a
selected line. The time range and
voltage levels of the histogram are
selected by manually positioning a
pair of cursors. The cursors indicate
the voltage level and the beginning
and end times of the histogram.

Polygon
A 4-point or 6-point polygon can be
defined manually.
Slope
The slope tool indicates DV/DT
between two manually - positions
cursors.
Eye scan allows the user to set the
following variables:

Results can be viewed for each
individual channel. A composite
display of multiple channels and/
or multiple labels is also available.
Individual channels can be
highlighted in the composite view.
Eye scan data can be stored
and recalled for later comparison
or analysis.

• The number of clock cycles to be
evaluated at each time and voltage
region
• The display mode
• Color graded
• Intensity shaded
• Solid color
• Aspect ratio of the display
• Time/division
• Time offset
• Volts/division
• Voltage offset
• Time resolution of measurement
• Voltage resolution of
measurement

29

Data Acquisition and Stimulus
State/Timing Modules

Probing solutions to match the
measurement capabilities

the model number and the
option number.

Multiple probing options are
available for the Agilent 16753A,
16754A, 16755A, 16756A, and
16760A. Each probe can be ordered
by its individual model number.
Some probes are also available as an
option to the logic analyzer module.
The following table indicates both

Probes are not supplied as part of
the standard logic analyzer module.
Probes must be ordered separately,
either as options to the logic analyzer
module or individually by their
respective model numbers.

Agilent Model Number

Module Option Number

Description

Notes

E5378A

010

100-pin single-ended probe

Requires a kit of mating connectors and shrouds
(see the next table) to connect to target system.

E5379A

011

100-pin differential probe

Requires a kit of mating connectors and shrouds
(see the next table) to connect to target system.

E5380A

012

38-pin single-ended probe, compatible
with target systems designed for the
Agilent E5346A Mictor adapter cable

Maximum state analysis speed is 600 Mb/s.
Minimum input amplitude is 300 mV p-p.
Requires a kit of mating connectors and shrouds
(see the next table) to connect to target system.

E5382A

013

17-channel, single-ended flying lead
probe set

E5381A

17-channel, differential flying lead
probe set

E5387A

17-channel, differential soft touch
connectorless probe

Includes 5 retention modules

E5390A

34-channel single-ended soft touch
connectorless probe

Includes 5 retention modules

Connector and shroud kits for probes
For probe model number

For PC board thickness

Probing connector kit part number
(each contains 5 mating connectors and 5 support shrouds)

E5378A

Up to 1.57 mm (0.062")
Up to 3.05 mm (0.120")

16760-68702
16760-68703

E5379A

Up to 1.57 mm (0.062")
Up to 3.05 mm (0.120")

16760-68702
16760-68703

E5380A

Up to 1.57 mm (0.062")
Up to 3.18 mm (0.125")

E5346-68701
E5346-68700

30

Data Acquisition and Stimulus
Oscilloscope Modules

When integrated into the
16700 Series logic analysis systems,
the oscilloscope modules make
powerful measurement and analysis
more accessible, so you can find the
answers to tough debugging problems
in less time. Oscilloscope controls are
easy to find and use.

Multiple Views of Target Behavior
Isolate Problems Quicker
Frequently a problem is detected in
one measurement domain, while the
clues to the cause of the problem are
found in another. That’s why the ability to view your prototype's behavior
from all angles simultaneously—from
software execution to analog signals—
is essential for quickly gaining insight
into problems.

For example, using a state analyzer
you may observe a failed bus cycle. A
timing problem caused by a reflection
on an incorrectly terminated line
may be causing the bus cycle to fail.
By triggering an oscilloscope from the
state analyzer, you can quickly identify the cause. The ability to cross-trigger and time-correlate state, timing,
and analog measurements can help
you in solving these tough problems.

Scope controls
and waveform
display are integrated into a
single window,
making interactive adjustment
easy.

Trigger icon
indicates trigger
level, making it
easy for you to
adjust trigger
level.

Time and voltage
markers allow you
to measure signal
details precisely.

Ground icon
always shows
you where ground
is relative
to signal.

Figure 4.5. All primary oscilloscope control settings, including scale factors and trigger settings, are visible
simultaneously.

31

Data Acquisition and Stimulus
Oscilloscope Modules

Automatic Measurements Quickly
Characterize Signals

Markers Easily Set Up Timing and
Voltage Margin Measurements

The Agilent Technologies 16534A
oscilloscope modules quickly
characterize signals with automatic
measurements of rise time, voltage,
pulse width, and frequency.

Four independent voltage markers
and two local time markers are available to quickly set up measurements
of voltage and timing margins.

The global time markers of the
16700 Series logic analysis systems
let you correlate state, timing, and
oscilloscope measurements to
track problems across multiple
measurement domains.

Automatic measurements
save time in characterizing
signal parameters.

Figure 4.6. Automatic measurements and markers let you make faster analysis.

32

Data Acquisition and Stimulus
Oscilloscope Modules

More Channels When You Need Them
You can combine up to four 16534A
oscilloscope modules to provide up
to eight channels on a single time
base. When you operate in this
mode, you can use the master module
for triggering.

External trigger input and output are
used to connect up to four oscilloscope
modules, providing up to eight channels
on a single time base.
Calibrator output used
for operational accuracy
calibration

Probe power output provides power
for 1145A dual active probe or two
1141A active probes

Channel 1 input
Channel 2 input

! CHAN 1 & 2
1MW = 7pF
250V MAX OR
50W 5Vrms MAX

CHAN
1

IN

AC/DC CAL

ECL EXT
TRIG
!
!

OUT

! PROBE POWER

CHAN
2

16534A
2 GSa / s

OSCILLOSCOPE

SN US35021924
16534A MADE IN THE USA

Figure 4.7. Connector panel of the 16534A oscilloscope module.

33

Data Acquisition and Stimulus
Pattern Generation Modules

Digital Stimulus and Response in a
Single Instrument

Parallel Testing of Subsystems
Reduces Time to Market

Configure the logic analysis system to
provide both stimulus and response
in a single instrument. For example,
the pattern generator can simulate a
circuit initialization sequence and
then signal the state or timing analyzer to begin measurements. Use the
compare mode on the state analyzer
to determine if the circuit or subsystem is functioning as expected. An
oscilloscope module can help locate
the source of timing problems or
troubleshoot signal problems due to
noise, ringing, overshoot, crosstalk,
or simultaneous switching.

By testing system subcomponents
before they are complete, you can fix
problems earlier in the development
process. Use the Agilent 16720A as a
substitute for missing boards,
integrated circuits (ICs), or buses
instead of waiting for the missing
pieces. Software engineers can create
infrequently encountered test
conditions and verify that their code
works—before complete hardware is
available. Hardware engineers can
generate the patterns necessary to
put their circuit in the desired state,
operate the circuit at full speed or
step the circuit through a series
of states.

Key Characteristics
Agilent Model 16720A
Maximum clock (full/half channel)

180/300 MHz

Number of data channels (full/half channel)

48/24 Channels

Memory depth (full/half channels)

8/16 MVectors

Maximum vector width
(5 module system, full/half channel)

240/120 Bits

Logic levels supported

5V TTL, 3-state TTL, 3-state TTL/CMOS,
3-state 1.8V, 3-state 2.5V, 3-state 3.3V, ECL, 5V PECL,
3.3V LVPECL, LVDS

Maximum binary vector set size

16 MVectors (24 channels)

Editable ASCII vector set size

1 MVectors

34

Data Acquisition and Stimulus
Pattern Generation Modules

Vectors Up To 240 Bits Wide

Depth Up to 16 MVectors

Vectors are defined as a "row" of
labeled data values, with each data
value from one to 32 bits wide. Each
vector is output on the rising edge of
the clock.

With the 16720A pattern generator,
you can load and run up to
16 MVectors of stimulus. Depth on
this scale is most useful when coupled with powerful stimulus
generated by electronic design
automation tools, such as
SynaptiCAD's WaveFormer and
VeriLogger. These tools create
stimulus using a combination of
graphically drawn signals, timing
parameters that constrain edges,
clock signals, and temporal and
Boolean equations for describing
complex signal behavior. The
stimulus also can be created from
design simulation waveforms. To take
advantage of the full depth of the
16720A pattern generator, data must
be loaded into the module in the
Pattern Generator Binary (.PGB) format. The SynaptiCAD tools allow you
to convert .VCD files into .PGB files
directly, offering you an integrated
solution that saves you time.

Up to five, 48-channel 16720A modules can be interconnected within a
16700 Series mainframe or expansion
frame. This configuration supports
vectors of any width up to 240 bits
with excellent channel-to-channel
skew characteristics (see specific
data pod characteristics in Pattern
Generation Modules Specifications
starting on page 112). The modules
operate as one time-base with one
master clock pod. Multiple modules
also can be configured to operate
independently with individual clocks
controlling each module.

Synchronized Clock Output
You can output data synchronized
to either an internal or external
clock. The external clock is input
via a clock pod, and has no
minimum frequency (other than a
2 ns minimum high time).
The internal clock is selectable
between 1 MHz and 300 MHz in
1 MHz steps. A Clock Out signal is
available from the clock pod and can
be used as an edge strobe with a
variable delay of up to 8 ns.

Initialize (INIT) Block for
Repetitive Runs
When running repetitively, the vectors in the initialize (init) sequence
are output only once, while the main
sequence is output as a continually
repeating sequence. This "init"
sequence is very useful when the
circuit or subsystem needs to be
initialized. The repetitive run capability is especially helpful when operating the stimulus module independent
of the other modules in the logic
analysis system.

"Signal IMB" Coordinates System
Module Activity
A "Signal IMB" (intermodule bus)
instruction acts as a trigger arming
event for other logic analysis modules
to begin measurements. IMB setup
and trigger setup of the other logic
analysis modules determine the
action initiated by "Signal IMB".

"Wait" for Input Pattern
The clock pod also accepts a 3-bit
input pattern. These inputs are levelsensed so that any number of "Wait"
instructions can be inserted into a
stimulus program. Up to four pattern
conditions can be defined from the
OR-ing of the eight possible 3-bit
input patterns. A "Wait" also can be
defined to wait for an intermodule
bus event. This intermodule bus
event signal can come from any other
module in the logic analysis system.

35

Data Acquisition and Stimulus
Pattern Generation Modules

Figure 4.8. Stimulus vectors are defined in the
Sequence menu tab. In this example, vector output
halts until the WAIT UNTIL condition is satisfied.

Figure 4.9. To fill the 16720A pattern generator's 8 MVector
deep memory (16 MVector in half channel mode) with data,
the stimulus must be in 'pattern generator binary' format.
Stimulus files in .PGB format can be loaded directly from
the user interface.
36

Data Acquisition and Stimulus
Pattern Generation Modules

"User Macro" and "Loop" Simplify
Creation of Stimulus Programs

ASCII Input File Format: Your Design
Tool Connection

Direct Connection to Your Target
System

User macros permit you to define a
pattern sequence once, then insert
the macro by name wherever it is
needed. Passing parameters to the
macro will allow you to create a more
generic macro. For each call to the
macro you can specify unique values
for the parameters. Each macro can
have up to 10 parameters. Up to 100
different macros can be defined for
use in a single stimulus program.

The 16720A supports an ASCII file
format to facilitate connectivity to
other tools in your design environment. Because the ASCII format does
not support the instructions listed
earlier, they cannot be edited into the
ASCII file. User macros and loops
also are not supported, so the vectors
need to be fully expanded in the
ASCII file. Many design tools will
generate ASCII files and output the
vectors in this linear sequence. Data
must be in Hex format, and each label
must represent a set of contiguous
output channels. Data in this ASCII
format is limited to 1 MVectors in
the 16720A.

The pattern generator pods can be
directly connected to a standard
connector on your target system. Use
a 3M brand #2520 Series, or similar
connector. The 16720A clock or data
pods will plug right in. Short, flat
cable jumpers can be used if the
clearance around the connector is
limited. Use a 3M #3365/20, or equivalent, ribbon cable; a 3M #4620
Series, or equivalent, connector on
the 16720A pod end of the cable; and
a 3M #3421 Series, or equivalent,
connector at your target system end
of the cable.

Loops enable you to repeat a defined
block of vectors for a specified
number of times. The repeat counter
can be any value from 1 to 20,000.
Loops and macros can be nested,
except that a macro can not be nested
within another macro. When nested,
each invocation of a loop or a macro
is counted towards the 1,000 invocation limit. At compile time, loops and
macros are expanded in memory to a
linear sequence.

Convenient Data Entry and Editing
Feature
You can conveniently enter patterns
in hex, octal, binary, decimal, and
two's complement bases. The data
associated with an individual label
can be viewed with multiple radixes
to simplify data entry. Delete, Insert,
Copy, and Merge commands are
provided for easy editing. Fast and
convenient Pattern Fills give the
programmer useful test patterns with
a few key strokes. Fixed, Count,
Rotate, Toggle, and Random are
available to quickly create a test
pattern, such as "walking ones".
Pattern parameters, such as Step
Size and Repeat Frequency, can be
specified in the pattern setup.

Configuration
The 16720A pattern generators
require a single slot in a logic
analysis system frame. The pattern
generator operates with the clock
pods, data pods, and lead sets
described later in this section. At
least one clock pod and one data pod
must be selected to configure a functional system. Users can select from a
variety of pods to provide the signal
source needed for their logic devices.
The data pods, clock pods and data
cables use standard connectors. The
electrical characteristics of the data
cables also are described for users
with specialized applications who
want to avoid the use of a data pod.
The 16720A can be configured in
systems with up to five cards for a
total of 240 channels of stimulus.

Probing Accessories
The probe tips of the Agilent 10474A,
10347A, and 10498A lead sets plug
directly into any 0.1 inch grid with
0.026 inch to 0.033 inch diameter
round pins or 0.025 inch square pins.
These probe tips work with the
Agilent 5090-4356 surface mount
grabbers and with the Agilent
5959-0288 through-hole grabbers.
Other compatible probing accessories
are listed in ordering information on
page 129.

37

Data Acquisition and Stimulus
Emulation Modules

Speed Problem Solving With
Off-the-Shelf Solutions for Many
Common Microprocessors
To help you design and debug your
microprocessor-based target systems,
Agilent offers different microprocessor specific products that let you get
control and visibility over your
microprocessor’s internal and
external data.
An analysis probe allows you to
quickly connect an Agilent logic
analyzer to your target system. The
analysis probe provides non-intrusive
capture and disassembly of microprocessor and bus activity
Analysis probes are available for over
200 microprocessors and microcontrollers. Bus probes allow probing of
popular bus architectures such as
PCI, AGP, USB, VXI, SCSI, and many
others.
Flexible physical probing schemes
give quick and reliable connections to
almost any device on your prototype.

On-Chip Emulation Tools Make Fixing
Bugs Easier
For specific microprocessor families
that feature on-chip emulation, you
can add a processor emulation
module to your system to connect
the on-board debugging resources
of the microprocessor to the logic
analysis system.
The microprocessor’s BDM or JTAG
technology provides control over
processor operation even if there is
no software monitor on the target
system. This feature is particularly
helpful during the development of
your target system’s boot code.

38

Figure 4.10. Agilent analysis probes make it easy to connect a logic analyzer to your target system.

Data Acquisition and Stimulus
Emulation Modules

Emulation Control Interface
The emulation control interface is
accessed from the power up screen of
the Agilent 16700 Series system. The
interface is included with the Agilent
E5901A/B emulation modules.
Designed for hardware engineers,
this graphical user interface provides
the following features:
• Control over processor execution:
run/break/reset/step.
• Register display/modification.
• Memory display/modification in
various formats including disassembly for code visualization.
Memory modification or memory
block fill can be done to check
processor memory access or to
reinitialize memory areas.
• Multiple breakpoint configuration:
hardware, software, and processor
internal breakpoint registers.
• Code download to the target.
• Command scripts to reproduce
test sequences.
• The ability to trigger a measurement module on a processor break
or to receive a trigger from the
logic analysis system’s measurement modules.

Integrated Debugger Support
When the hardware turn-on phase is
completed, the same Agilent emulation module can be connected to
high-level debuggers for C or C++
software development.
You can achieve the functionality of
a full-featured emulator by using a
third-party debugger to drive the
installed Agilent emulation module.
This gives you complete microprocessor execution control (run control).

Figure 4.11. Emulation control interface.

39

Post-Processing and Analysis Tool Sets
Software Tool Sets

Once the data is acquired, you can
rely on the post-processing tools to
rapidly consolidate data into displays
that provide insight into your system's behavior. The tool sets
described in the following pages are
optional, post-processing software
packages for the 16700 Series logic
analysis systems.

Selecting the Right Tool Set
Take a look at the tool set descriptions below to see if they meet your
needs. If you don't immediately see
what you need there is also the
option of writing your own analysis
application using the tool development kit. Best of all, you can try out
any one of these tool sets with no
obligation to buy.

Application

Product Name

Model Number

Detailed Information

Debug your real-time code at the source level
Correlate a logic analyzer trace with the high-level source
code that produced it. Set up the logic analyzer trace by
simply pointing and clicking on a line of source code.

Source Correlation
Tool Set

B4620B

Page 42

Debug your parallel data communication buses
Display logic analyzer trace information at a protocol level.
Powerful trigger macros allow triggering on standard or
custom protocol fields. Data bus width is limited only by
the number of available channels.

Data Communications
Tool Set

B4640B

Page 47

Optimize your target system's performance
Profile your target system's performance to identify system
bottlenecks and to identify areas needing optimization.

System Performance
Analysis Tool Set

B4600B

Page 55

Solve your serial communication problems
Convert serial bit streams to parallel format for easy viewing
and analysis. Supports serial data with or without an external
clock reference and protocols that use bit stuffing to maintain
clock synchronization. Works at speeds up to 1.5 Gbits/s.

Serial Analysis
Tool Set

B4601B

Page 62

Customize your trace for greater insight
Create custom tools using the C programming language.
Custom tools can analyze captured data and present it in
a form that makes sense to you. Analysis systems do not
require the tool development kit to run generated tools.

Tool Development
Kit

B4605B

Page 68

40

Post-Processing and Analysis Tool Sets
Software Tool Sets

Free Tool Set Evaluation
To see which tool sets best fit your
needs, Agilent Technologies offers a
free 21-day trial period that lets you
evaluate any tool set as your work
schedule permits. Once you receive
your tool, you obtain a password that
temporarily enables the tool.

Figure 5.1. For a free, one-time, 21-day trial of any tool set, simply type “demo” in the password field for the product
you want to evaluate.

41

Post-Processing and Analysis Tool Sets
Source Correlation

Debug Your Source Code
The Agilent B4620B source correlation tool set correlates a microprocessor execution trace window with a
corresponding high-level source code
window. The source correlation tool
set enhances your software development environment by providing multiple views of code execution and
variable content under severe realtime constraints.
Using the B4620B you can obtain
answers to many of your questions
concerning software code execution,
data tracking, and software-hardware
integration.

Obtain Answers to the Following
Questions:
Software Code Execution
• What happened just before the
target system crashed?
• What source code was executed at
a specific point in time?

• What is the exact time between
two user-defined system events?
• What is the execution history
leading up to or occurring after an
area of interest?
Data Tracking
• What is the exact history of a
variable's value over time?
• Which routine(s) corrupted the
data?
Software-Hardware Integration
• What is the root cause of a system
failure—hardware or software?
• Are timing anomalies found by the
hardware engineer the cause of
software problems?
• Is the software engineer working
on the same problem as the hardware engineer?
• What portion of the source code
correlates to the problem the
hardware engineer reported?

Product Description
The tool set's main advantage is its
ability to allow you to observe software execution without halting the
system or adding instructions to the
code. The tool set uses information
provided in your compiler's object file
to build a database of source files,
line numbers and symbol information
to reference to logic analyzer traces.
The tool set can also be used to set up
the logic analyzer trace by simply
pointing and clicking on a source
line.
Once the tool set is enabled on your
16700 Series system, you can support
new processors by changing analysis
probes and verifying object file compatibility. Multiple-processor systems
are also supported.

Your Development Environment
Source
Analyzer
Trace

Compile
Relocatable
Object Code
Link
Absolute
Object Code

Symbol File

Download
Edit
Source File

Debug

Figure 5.2. The source correlation tool set allows you to observe software execution without halting the system or
adding instructions to the code.
42

Post-Processing and Analysis Tool Sets
Source Correlation

When You Want
to Trace . . .
...on a variable to see what caused data
corruption.
...on a function to determine where it is being
called from in order to understand the context
of a system error.
...on a line number to determine if a
specific code segment is ever executed.

Simply Click . . .
... to trace about a variable, function, or
line number.
... to halt processor execution with an
integrated emulation module when the trace
event occurs.
...to use text search to quickly navigate
through hundreds of symbols. To recall
previous entries when rotating through debug
tests.
...to specify alignment conditions for
processors that don’t include lower address
bits on the bus. This is necessary if your
processor uses bursting or byte enables when
fetching instructions.
...to use address offsets for code that is
dynamically loaded or moved from ROM to
RAM during a boot-up sequence.

Figure 5.3.
43

Post-Processing and Analysis Tool Sets
Source Correlation

Once You Acquire
the Trace . . .
...“step” through the
trace at the sourcecode level or the
assembly level.
Locate the cause of a
problem by “stepping
backward” from the
point where you see
a problem to its root
cause.

...quickly locate a
specific function,
variable, or text
string. The system
maintains a history
of previous text
searches for quick
recall.

...click the source line
which you want to
trace about on your
next acquisition.

...set the data type to
“Symbols” to view
file and symbol
names or ”line #s” to
view file name and
line number.

...filter out unexecuted code fetches
from the inverse
assembled trace to
view executed code
only, using Agilent’s
advanced inverse
assembly filtering for
popular processors.

...scroll or step through
the time-correlated
source code (left) or
inverse assembled trace
listing (right)

Also...
Analyze a function’s behavior without viewing
calls to subroutines or interrupts by using the
analyzer’s filtering capabilities to focus on a
specific part of the executed software.
Figure 5.4.
44

Post-Processing and Analysis Tool Sets
Source Correlation

Product Characteristics
Data Sources
All state and timing measurement
modules supported by the 16700
Series logic analysis systems (except
the 16517A/518A) serve as data
sources for the source correlation
tool set.

Microprocessor Support
The source correlation tool set supports many of the most popular
embedded microprocessors Nonintrusive analysis probes for the
16700 Series systems provide reliable, fast and convenient connections
to your target system.
New microprocessors are constantly
being added to the list of supported
CPUs. For the most current information about supported microprocessors, please contact your Agilent
Technologies sales representative
or visit our web site:
http://www.agilent.com/find/logicanalyzer.

Object File Format Compatibility
The 16700 Series logic analysis systems quickly and reliably read your
specific object file format. Agilent
Technologies' extensive experience
with different file formats and symbol representations ensures that your
source code files are accurately correlated and your system is precisely
characterized.
Source correlation and system performance measurements do not
require any change in your software
generation process. No modification
or recompilation of your source code
is required.

You can load multiple object files.
Address offsets are also supported,
enabling system performance measurements and source-code level views
of dynamically loaded software execution or code moved from ROM to
RAM during a boot-up sequence.
High-level language tools that produce the following file formats are
supported:
•
•
•
•
•
•
•
•
•

Agilent(HP)/MRI IEEE696
ELF/DWARF*
ELF/Stabs*
TI_COFF
COFF/Stabs*
Intel OMF86
Intel OMF96
Intel OMF 286
Intel OMF 386 (which supports
Intel80486 and Pentium Language)

*Supports C++ name de-mangling
If your language system does not
generate output in one of the listed
formats, a generic ASCII file format
is also supported.
For the most current information
about supported compiler file formats and processor support, please
contact your Agilent Technologies
sales representative.

Source File Access
The source correlation tool set must
be able to access source files to provide source line referencing.
Source files can reside in multiple
directories on the hard drive of your
workstation, PC, or on the 16700
Series mainframe's internal hard
disk. You can access the files via NFSmounted disks or CIFS mounted
disks. To display the source file, the
tool set first looks for the source path
name in the object file, follows the
path to access the source file and, if
not found, looks for the source file in
alternate user-defined directories.
The 16700 Series logic analysis
systems automatically place the
following in the directory search
path:
• NFS mounted directories
• Directory paths specified in
loaded symbol files
• Directory paths specified in
loaded source files

Source Correlation Functionality
• Source code and inverse
assembled trace listing are timecorrelated.
• User can alternate between source
viewer and browsing of other
source files.
• Trace specification can be set up
from the source viewer or file
browser.
• For multiple-processor systems,
each trace window can be
time-correlated to a source viewer.

45

Post-Processing and Analysis Tool Sets
Data Communications

Monitor Packet Information on
Parallel Data Buses
The data communications tool set
shows parallel bus data at a protocol
level on the logic analyzer. Developers
have the capability to find complex,
system-level bus interaction problems
in applications such as a switching or
routing system.

Obtain Answers to the Following
Questions:
• What is the time difference
between two or more data paths
and/or a microprocessor?
• Did a packet make it through the
switch or router?
• Why did a packet take so long to
go through the switch or router?
• Where did an illegal packet come
from?
• What is the latency on packet
information?
• What is corrupting packets?

Product Description
The Agilent Technologies B4640B
data communications tool set adds
protocol analysis capabilities to the
logic analyzer for viewing parallel
data buses (e.g, UTOPIA or a proprietary data bus) in a switching or
routing system. Each protocol layer is
displayed with a different color in the
logic analyzer lister display to allow
easy viewing of the protocol data.
Payload information is included after
the header in a raw hex format.
Filters are included to allow many
different views of the data. Protocol
layers can be collapsed or expanded
to create a custom view of the data
acquired in the logic analyzer.
With the filters, you can concentrate
on the data of interest for a
particular measurement.

46

The powerful protocol trigger macro
allows easy trigger setup by eliminating the need to manually configure
the trigger sequencer for complex
measurements. All custom-defined
protocol fields or layers are supported in the trigger macro.
All packets or cells are time-stamped
in the logic analyzer for time-correlation measurements with other system
buses, such as a microprocessor,
memory interface, PCI bus, or other
UTOPIA bus. All state listing and
waveform displays in the logic analyzer are time-correlated with global
markers for a complete view of the
system. With this tool, it is possible
to trigger the logic analyzer with a
microprocessor event and see what is
happening on a parallel data bus with
protocol information.
By monitoring multiple time-correlated data buses, you can monitor a
packet entering one ASIC and see
how long it takes for the packet to
reach another part of the system. The
powerful trigger can also monitor a
packet entering one port and trigger
if the packet has not reached another
port by a designated time.

Post-Processing and Analysis Tool Sets
Data Communications

Theory of Operation
Use a logic analyzer to probe the
system’s parallel data buses (e.g.,
UTOPIA).

UTOPIA Level 2

CPU

Custom/UTOPIA

The analyzer needs access to:
•
•
•
•

Data signals
Qualifying signals
Start of cell or packet bit
Synchronous clock for the bus

The synchronous bus clock samples
data into the logic analyzer.
Qualifiers such as "Data Valid" allow
the logic analyzer to sample only on
events of interest instead of all
cycles.
With access to the "Start of Cell" or
"Start of Packet" bit on the data bus,
the analyzer starts looking at the
beginning of a cell or packet. With the
protocol definition set up by the user,
the logic analyzer can sequence down
into the cell or packet to find the
desired protocol field to trigger on.

PHY

PHY
ATM
Layer

ATM
Layer

PHY

PHY
Switch
Fabric
PHY

ATM
Layer

ATM
Layer

PHY

PHY

UTOPIA Level 1
Figure 5.5. Typical ATM Switch Design.

47

Post-Processing and Analysis Tool Sets
Data Communications

Product Characteristics

Additional Information

Requires

16700 Series logic analysis system with
system software version A.01.50.00 or higher

Applications

Trigger on a processor event and see what
is happening on a parallel data bus with
protocol information or vice versa.

Supported Measurement Modules

16715A, 16716A, 16717A, 16718A, 16719A,
16750A/B, 16751A/B, 16752A/B, 16740A, 16741A,
16742A, 16753A, 16754A, 16755A, 16756A, 16760A

Protocols Supported

•
•
•
•

Trigger Macro

All custom-defined protocol fields or layers
are supported in the trigger macro

Maximum Parallel Bus Width

Limited only by the number of available channels

Display Features

• Color

Ethernet
ATM
TCP/IP Stack
Custom

• Filters and preferences

• Payload information
• Protocol layers

48

• Example files for these protocols are provided with the
product. These standard files can be edited to include
any custom protocol "wrapper" layers or fields.
• Custom protocols are supported by entering the protocol
setup information via the logic analyzer interface or a text
file. Custom protocol definitions are used in both the
trigger definition and packet display.

• Each protocol layer is displayed with a different color in
the analyzer’s lister display to allow easy viewing of
protocol data.
• Specific protocol layers and fields can be selected for
viewing in the trace. Provides many different views of the
data. Allows you to concentrate on the data of interest
for a particular measurement.
• Included after the header in a raw hex format
• Can be collapsed or expanded to create a custom view of
the acquired data

Post-Processing and Analysis Tool Sets
Data Communications

Edit or create a
protocol using the
logic analyzer
user interface.
Select a known
protocol and add
proprietary fields.

Insert custom
wrapper or
field here.
Insert name, number of bits and
format for trigger
and
display.
Define any symbols for both
trigger and
display of
packets.

Edit or create a
protocol using a
text file.
Start with standard protocol
definition and add
custom fields with
text file.
Insert protocol
layer name.
Define protocol
fields, number of
bits, and format
for trigger and
display.
Define any user
symbols to make
triggering and display easier to use.
Figure 5.6.
49

Post-Processing and Analysis Tool Sets
Data Communications

New packet
trigger macros.

Choose from a list
of buses.
Trigger on simple
IP address instead
of setting up trigger sequencer.
Specify what
action to perform
once a packet is
found.

Specify protocol
layer to trigger on.
Use any defined
protocol fields as
a trigger, such as
source address,
destination
address, etc.

Physical representation of bit fields to be triggered on.
This window is automatically updated when fields are edited.
Figure 5.7.
50

Post-Processing and Analysis Tool Sets
Data Communications

Use the bus editor feature to specify
what protocol runs on your bus.
This is helpful when probing more
than one bus with a single state/
timing module.

Figure 5.8.

51

Post-Processing and Analysis Tool Sets
Data Communications

Protocol Filters and Viewing
Preferences

Filter captured data to
only view key data for
measurement.

Choose to view payload
data with header
information.
Select which protocol
layers and fields to
view in trace.

Figure 5.9.

52

Post-Processing and Analysis Tool Sets
Data Communications

Display of
protocol levels.

Protocol view of
data acquired in
logic analyzer.

Figure 5.10.

Time tags for system level correlation of other data
buses, memory interfaces, microprocessors, etc.

53

Post-Processing and Analysis Tool Sets
Data Communications

Global markers measure time intervals between
packets on separate parallel interfaces or timing
between the data path and a microprocessor.

Collapsed view
of protocol information using preferences.

Raw packet
header
information.

Raw payload
information.

Figure 5.11.

54

Post-Processing and Analysis Tool Sets
System Performance Analysis

Optimize System Performance
Your design has to meet consistent
performance requirements over a
range of operating conditions and
over a specific time period. Using the
system performance analysis tool set,
you can obtain answers to many of
your questions concerning performance and responsiveness, software
execution coverage, debug and
system parameter analysis, etc.

Obtain Answers to the Following
Questions:
Performance and Responsiveness
• What functions monopolize microprocessor bandwidth?
• What functions are never executed? What is the relative workload
of each processor in a multipleprocessor system?
• What is the minimum, maximum,
and average execution time of a
function (including calls)?
• How many interrupts does the
system receive per consecutive
time slice?
• What is the response time of the
target system to an external
event?
Software Execution Coverage
• Do test suites provide thorough
coverage of the application?
• Is this function or variable
accessed by the application?

Debug and System Parameter
Analysis
• Does this pointer address the right
memory buffer?
• How does the system react when it
receives too many simultaneous
interrupts?
• Is the stack size adequate?
• Is the cache size adequate?
Analog, Timing, and Bus
Measurements
• What is the setup/hold time of this
signal or group of signals?
• Is the distribution of voltages for
this analog signal acceptable?
• Is this signal spending too much
time in the switching region?
• What bus states occur most often?
• What is the bus loading?
• How does the bus affect overall
system performance?
• How much time is spent in bus
arbitration?
• What is the histogram of bus
transfer times?

Product Description
The Agilent Technologies B4600B system performance analysis (SPA) tool
set profiles an entire target system at
all levels of abstraction—from signals
to high-level source code. It clearly
identifies the components that affect
the behavior of your system. In addition to performance analysis, it can
be used at any time to test and document many other characteristics,
such as memory coverage and
response time.
The SPA tool set generates statistical
representations of the captured data.
It shows the amount and percent of
time spent in each of the targeted
functions or data locations. Data is
conveniently displayed in histograms
and bar charts, reducing the time you
spend analyzing results and identifying system bottlenecks.

Processor/Cache Measurements
• Which microprocessor bus states
occur most often?
• Which peripherals are used most
often?
• What is the profile of load sharing
in a multiple-processor system?
• How does the cache size affect
system performance?

55

Post-Processing and Analysis Tool Sets
System Performance Analysis

Product Characteristics
SPA Tools
State Interval Display

Time Interval Display

Time Overview Display

State Overview Display

Generates

Statistical representations of the captured data
Shows the amount and percent of time spent in each of the targeted functions or data locations.

Provides

Histogram of event
activity. Display shows
the percentage of hits
for each procedure,
function, or event
(states). Events are
defined as patterns or
ranges associated with
any set of data (labels,
symbols).

Histogram of event times.
Display shows a
distribution of the
execution time of a
specific function or of
the time between two
user-defined events.

Overview of occurrence
rates over time.
Measurements of the
occurrence rate of any
event, including
interrupts, over time.

Overview of bus/memory
activity. Display shows the
number of hits for each
possible bus state.

Usage

Helps prioritize functions
that are candidates for
duration measurements
using the time interval tool.

Determines a specific
routine’s execution times
and verifies signal timing
specifications

Views the frequency of
events over time.

First step of analysis or
optimization process to
identify which events occur
most frequently.

Applications

Cache hit and miss
analysis. Bus headroom
analysis can be made by
examining ratio of active
to idle status states.
Examines workload of
each processor in a
multi-processor system
to determine if system
is balanced.

Measures setup and hold
times, the jitter between
two edges, or the
variation between two
bus states.

Displays Include

Ability to be viewed simultaneously
Filtering capabilities for removing portions of a trace that are not applicable to the analysis

Maximum Number of Events

No theoretical limit.
Up to 10,000 events tested with a standard configuration

56

Isolates defects such as
invalid pointers (filtering).
Distribution of signal
voltages can tell whether a
digital signal is spending too
much time in the switching
region. Evaluates the
linearity of the output of a
D/A converter.

Number of events limited by size of the window
(e.g. pixels on the screen)

Post-Processing and Analysis Tool Sets
System Performance Analysis

Product Characteristics (continued)
SPA Tools
State Interval Display

Time Interval Display

Time Overview Display

State Overview Display
Number of hits
State bucket width

Supplemental Information

Number of hits

Minimum time
Maximum time
Average time
Standard deviation

Number of hits
Time bucket width

Display Modes

Sort by number of hits
Sort alphabetically by
event name

Sort by time
Sort alphabetically by
event name

Autoscale zoom

Accumulate Mode

No theoretical limit to the number of acquisitions in accumulate mode.
Any modification of the display will cause the display to revert back to the last data acquisition.

Object File Format
Compatibility

Object file formats are identical for SPA and the source correlation tool sets. See page 45.

Off-Line Analysis and
Post-Processing

All measurements can be saved using the file out tool.
Data can be recalled at any time for later analysis using any SPA or other tool.
Performance measurements can be exported to your host computer as histograms or as tabular formatted text files.

Processor Support

Supports any analysis probe listed in Processor and Bus Support for Agilent Technologies Logic Analyzers
(pub no. 5966-4365E)

Data Sources

All measurement modules supported by the 16700 Series logic analysis systems serve without modification as data
sources for the B4600B.
The particular module determines time resolution and accuracy.
Sample rate, channel count, memory depth and triggering are controlled by the user independent of the SPA tool set.

57

Post-Processing and Analysis Tool Sets
System Performance Analysis

State Overview Tool

Narrow in on an area of interest
using built-in qualification and zoom
functions.

Pinpoint regions of high memory activity to
determine which routines or operations are
responsible for throughput bottlenecks.

Measure memory coverage or stack
usage by observing whether memory
locations are accessed. You can also
detect which peripherals are most frequently used.

Figure 5.12. Identify which events occur most frequently.

58

Post-Processing and Analysis
System Performance Analysis

State Interval Tool

Sort and display symbols alphabetically by event
name or by the number of hits.

Display just the symbols you
want to evaluate by using the
symbol-navigation utility. The utility automatically configures the
tool for the selected function and
variable names from large symbol
files created by complex software
projects.

To help simplify your display,
delete all functions below a
selected point with a single
mouse click.

Pass the mouse over a histogram bar and
bucket information gives you detailed
information for each event.
Figure 5.13. Determine which functions use the most CPU cycles.

59

Post-Processing and Analysis
System Performance Analysis

Time Interval Tool

Because time interval measurements often
depend upon hardware-software interaction,
the event definition can be a combination
of symbolics and hardware events. Data
qualification can be used to define the
specific hardware context in which the
analysis will be made.

Data is displayed in histograms, which
can be exported to your host computer
either as histograms or as tabular
formatted text files.
Statistics such as maximum time,
minimum time, standard deviation and
mean help you document system behavior. Use “accumulate mode” to analyze
the behavior of your system over a long
period of time.

Figure 5.14. Determine a specific routine's execution times.

60

Post-Processing and Analysis Tool Sets
System Performance Analysis

Time Overview Tool

Use “Comments” to document your trace. The
“Comments” field contents are saved with the
configuration and data.

Use the markers in this window to correlate
interrupts to a state listing or timing waveform.

Elusive system crashes are often
caused by too many interrupts occurring over a short period of time. If the
software cannot handle all simultaneous service requests, the system can
exhibit random defects while leaving
no clues as to their cause. In this situation, you need a tool that can measure and display interrupt loading.

Figure 5.15. View the frequency of events over time.

61

Post-Processing and Analysis Tool Sets
Serial Analysis

Solve Serial Communication Problems

Product Description

Your system may use serial buses to
communicate between ICs and to
transfer data to and from peripheral
devices. Sifting through thousands of
serial bits by looking at long vertical
columns of captured 1's and 0's can
be very tedious, time-consuming, and
error-prone.

The Agilent Technologies B460lB
serial analysis tool set is a generalpurpose tool that allows easy viewing
and analysis of serial data.

Obtain Answers to the Following
Questions:
• Is the software sending the correct
message?
• Is the communication hardware
acting as expected?
• When multiple messages are
involved, in what order is data
being transmitted?
• How does the serial bus activity
correlate to the target system
processor?
• What is causing the data corruption in the target system?

62

The tool set enables you to:
• Convert acquired serial bit
streams into readable parallel
word formats
• Time-correlate real-time serial
traces to system activity
• Remove stuffed bits from the data
block
• Process frame and data portions
separately
• Process serial data from a signal
with or without an external clock
reference
• Capture and analyze high-speed
(1.5 Gbits/s) serial buses

Post-Processing and Analysis Tool Sets
Serial Analysis

When You Want to Analyze Serial
Bit Streams . . .
...specify which signal you want to
convert to parallel format by
selecting a specific bit of any
available label.

...accept the default output
label“Parallel” or modify the
label name for easy recognition.

...set the output parallel word
width (up to 32 bits).

...select the specific state in
the trace where conversion
begins.

...specify the order in which
the bits occur in the serial
data stream
MSB = Most Significant
Bit first
LSB = Least Significant
Bit first.

...enable frame processing to
extract all instances of a
defined frame.

...maintain or invert the
input serial bit stream.

...capture serial data with or without an external clock reference.
Enable clock recovery for an
incoming serial bit stream that has
no external clock reference.
(RS-232 is an example of a bus
with clocking embedded within the
serial bit stream).

Figure 5.16.

63

Post-Processing and Analysis Tool Sets
Serial Analysis

To Separate Frame Information
from the Data Block . . .

...accept the default
start of frame label
“Start” or modify the
label to a name of your
choosing.

...specify the pattern
that designates the start
of a frame.

...get immediate feedback as you configure
the tool set for your
data. This diagram
changes as you make
your framing and data
block selections.
...remove stuffed 0s or
0/1s from the trace
before other serial
analysis functions are
performed. Some protocols use bit stuffing to
maintain clock
synchronization.
...specify the portion of
the data block for the
serial-to-parallel
conversion.

...specify whether the
end of frame occurs at
the end of a data block
of X bits or on a specified pattern.

...accept the default
end of frame label
“End” or enter a
different name.

64

Figure 5.17.

Post-Processing and Analysis Tool Sets
Serial Analysis

To Acquire a Serial Bit Stream
without an External Clock
Reference . . .
...set the sample period of
your timing analyzer to take
four or more samples for
each serial bit.

...accept the “Samples”
default label or enter a new
label name.
...specify the embedded bit
time of the serial bit
stream.
...specify the incoming
signal’s data encoding
method, normal or NRZI.
Figure 5.18.

Clock Recovery Algorithm
1. For analysis purposes the data is
captured in conventional timing
mode using the internal timing
analyzer clock as the clock reference. Set the sample period of the
timing analyzer to take four or
more samples for each serial bit.

2. The timing analyzer data is sampled in the middle of each bit
according to the serial bit rate
defined in the clock recovery
window.

3. Data edges (transitions from 0 to 1
or 1 to 0 in the timing analyzer
trace) are used to resynchronize
the sampling.

How Clock Recovery Works
Embedded bit time

Resynchronize on edge

Incoming serial
bit stream

Timing analyzer samples
(with timing analyzer set
to take five samples for
each serial bit)
New “Samples”serial data

0000000000000000000001111111111111111111111111111

0

0

0

0

1

1

1

1

1

Figure 5.19.
65

Post-Processing and Analysis Tool Sets
Serial Analysis

Once the Serial Bit Stream is
Acquired . . .
This example shows the conversion of an
RS-232 serial bit stream. The data sent to
the printer includes the column header
”MACHINE”.
...configure the
serial tool once for
your specific bus,
then save the configuration for
future uses.

...view the serial-to-parallel
conversion in the format that
is easiest for you — waveform or listing.

...display the parallel data in binary, hex, octal, decimal, ASCII or Twos Complement.

...use the global markers and time tags to correlate
real-time serial traces to other system activity.

...synchronize the start of the serial-to-parallel conversion to the start of the frame pattern for your specific bus.

...convert the data block into parallel words, in this
case 8-bit words.

...find the Nth occurrence of specific frames or data
relative to the trigger, other markers, or the beginning or end of the trace. Markers allow you to quickly search from frame to frame in the data.

...view the data in the order in which the bits occur
in the serial stream, in this case LSB.
Figure 5.20.

66

Post-Processing and Analysis Tool Sets
Serial Analysis

Product Characteristics
Data Sources
All state and timing measurement
modules supported by the 16700
Series logic analysis systems serve
without modification as data sources
for the B4601B serial analysis tool
set. The particular measurement
module used determines time resolution and accuracy. Sample rate, channel count, memory depth and triggering are controlled by the user independent of the serial analysis tool.

Because every trace is non-intrusive,
and every event captured in the trace
is time-stamped, you can correlate
activity from your serial bus with
other events in the target system.
The Agilent Technologies 16720A and
16522A pattern generator modules
can be used to generate your own
serial test data.

Parallel Data Display Types
Binary, Octal, Hex, Decimal, ASCII,
Twos Complement

Off-line Analysis and Post-Processing
All measurements can be saved using
the file out tool. Data can be recalled
at any time for later analysis using
any analysis or display tool. Serial
measurement data can be exported to
your host computer as ASCII files.

Maximum Parallel Word Width
32 bits

Serial Measurement Characteristics

Maximum
serial
trace depth

Maximum
serial bus
frequency

Minimum
serial bus
frequency

16517A/
18A

16710A/
11A/12A

16715A

16716A

16717A/
18A/19A

16750A/B/
51A/B/
52A/B

16753A/
54A/55A/
56A

16760A

Clocked
data [1]

64 Kbits

2 Mbits

512 Mbits

1 Mbit

256 Mbit

4 Mbits/
16 Mbits/
32 Mbits
2 Mbits/
8 Mbits/
16 Mbits

64 Mbits

16-32 Kbits

2 Mbits/
8 Mbits/
32 Mbits
1 Mbit/
4 Mbits/
16 Mbits

1 Mbit/4 Mbits/
16 Mbits/32 Mbits

Unclocked
data [2]

8 Kbits/
32 Kbits/
128 Kbits
4 Kbits/
16Kbits/
64 Kbits

500Kbits/2 Mbits/
8 Mbits/32 Mbits

32 Mbits

Clocked
data [3]

1 Gbit/s

100 Mbits/s

167 Mbits/s

167 Mbits/s

333 Mbits/s

400 Mbits/s

600 Mbits/s

1.5 Gbits/s

Unclocked
data [4]

1 Gbit/s

125 Mbits/s

167 Mbits/s

167 Mbits/s

167 Mbits/s

200 Mbits/s

300 Mbits/s

200 Mbits/s

Clocked
data

20 Mbit/s

No limit

No limit

No limit

No limit

No limit

No limit

No limit

Unclocked
data [5]

765 Mbits/s

5 Kbits/s

50 bits/s

50 bits/s

50 bits/s

50 bits/s

50 bits/s

50 bits/s

Information in Table above calculated according to notes [1] to [5]
[1] =Maximum State Memory Depth
[2] =Maximum Timing Memory Depth/4
[3] =Maximum State Frequency
[4] =Maximum Timing Frequency/4
[5] =1/(Maximum sample period x 20)

67

Post-Processing and Analysis Tool Sets
Tool Development Kit

Customize Your Measurements
The ability to interpret and display
information is vital to your project.
At times the information you need
can be buried in the raw data of your
measurement. This might be due to
one of several reasons:
• The use of a protocol, encoded
data, or proprietary bus
• Events that happen only under
certain conditions
• The need to analyze system
performance
• The need to analyze data across
a large number of repetitive
measurements

Product Description
The Agilent Technologies B4605B tool
development kit provides a complete
environment for creating custom
tools that process data using the
powerful search and filtering capabilities of the logic analysis system.
Features of the tool kit include:
• Fast, compiled and optimized
C code
• Push button compiling, no make
files
• A rich library of functions that
speeds development
• Extensive examples of code
• The creation of installable tools
Data is processed quickly by the custom tools, because they consist of
compiled, optimized C code. A C language programming background is
highly recommended. A tutorial,
extensive examples, and a rich
library of functions are provided that
help you easily access analyzer data
and the tool's interface.

68

The custom tools can be used on any
16700 Series logic analysis system.
This allows you to purchase just one
or two copies of the development kit
and develop custom tools to support
a large number of analyzers.
Enhance Data Displays
• Color-code specific states of your
trace.
• Display some of your trace data in
engineering units.
• Convert the raw trace of a proprietary bus to a transaction-level
trace of that bus.
Manipulate Data
• Unravel interleaved data into two
or more columns of data.
• Combine the traces of two different analyzers into one trace, with
each column being combined or
separately displayed as prescribed
by you.
• Modify your scope trace using an
algorithm developed by you, such
as an analog filter, beat frequency,
or DSP algorithm.
Read or Write External Files
• Accumulate information from
repetitive traces taken by the analyzer in a file on your PC or UNIX
workstation.
• Write specific types of states or
trace data that have been analyzed
to an Excel consumable ASCII file
on your PC or UNIX workstation.
• Use information read from a file
on your PC or UNIX workstation
to modify the display of an
analyzer trace.

Post-Processing and Analysis Tool Sets
Tool Development Kit

Custom Tool Example, Added Text in
Trace
This example shows how a custom
tool can convert data to text to
present information in an easy-tounderstand form.
The original trace comes from a
control unit in an automobile.
Embedded in the data is information
about the engine and transmission.
When MODE = 0, DATA represents
engine information, including RPM,
fuel level, fuel to air ratio, and manifold pressure. When MODE = 1,
DATA represents transmission information, including gear position and
temperature.

Output of Custom Tool

Original Trace

This custom tool allows the user to
specify Fahrenheit or Centigrade for
the engine temperature data.
Figure 5.21.

Parameter Interface of Custom Tool
69

Post-Processing and Analysis Tool Sets
Tool Development Kit

Custom Tool Example, Microprocessor
Code Reconstruction
The original trace came from the bus
of a MPC 555 processor. As you can
see, no data was placed on the bus at
the time of the trace because cache
memory was turned on. Normally, it
would not be possible to inverse
assemble this trace.

Original Trace

The output of the custom tool in this
example is shown. Notice that there
is now data in the DATA column. The
custom tool was able to reconstruct
the code flow after the trace was
taken. The code was reconstructed by
using the branch trace messages and
information in the SRecord file creat-

Output of Custom Tool

By entering information here, users can direct
the tool to the correct SRecord file and control
how much of the data the tool is to operate on.
They can also indicate if the AT2 pin of the MPC
555 processor is in use.

Figure 5.22. Code reconstruction
70

Parameter Window of Custom Tool

ed when the code was compiled. The
tool took the address of the appropriate states in the trace data and found
the corresponding code (data) in the
SRecord file. This created a trace that
the MPC 555 inverse assembler could
operate on properly.

Post-Processing and Analysis Tool Sets
Tool Development Kit

Custom Tool Example, Multiplex Data
Custom tools can combine several
lines of data acquired sequentially
under one label into one line of data.
However the data to be combined
does not have to come from the same
label, it can come from different
labels. The labels can even come from
different analyzers.

Output of Custom Tool

Original Trace
At left are the parameter window and
message display created by the custom
tool in this example. Parameters allow the
user to control different aspects of what
the tool does to the acquired trace. The
user can change the parameters and hit
the execute button to change the output
of the tool. The output dialog to the
left displays information generated by
the tool.

Figure 5.23.

Parameter and Output Windows

71

Post-Processing and Analysis Tool Sets
Tool Development Kit

Custom Tool Development
Environment

Select this button to cause the compiled code
to operate on the acquired data.

This is the main window for
developing code with the tool
development kit.

Select this button to compile the
code displayed in the “Source
Code” tab.

Load a file created on another
system or create your code here
using the “Source Code” editor.

Compilation status is shown
at the bottom of the tool
development kit Display window.

Runtime errors are displayed in
the “Runtime” tab.

Errors generated
during a compile
are displayed in
the “Buildtime”
tab.

Figure 5.24. TDK development environment
72

Output generated
during the tool’s
execution are
displayed in the
“Output” tab.

Post-Processing and Analysis Tool Sets
Tool Development Kit

Product Characteristics

Provided Functions

Analyzer compatible custom tools
will run on any 16700 Series analyzer
running version A.01.40.00 or
greater. In some rare instances,
changes in the operating system can
require that your tools be recompiled
in order to run on that version of the
operating system.

Agilent Technologies provides a rich
library of functions that allow you to
copy data sets, create new data sets
with new labels, and to reorganize
the acquired data under these new
labels or to include data or text
derived from the acquired data.
The functions allow:

Analysis and Stimulus Modules
The tool development kit supports
the following Agilent Technologies
measurement modules:
• 16715A, 16716A, 16717A, 16718A,
16719A, 16750A/B, 16751A/B,
16752A/B
• 16710A, 16711A, 16712A
• 16557D
• 16556A/D, 16555A/D
• 16554A
• 16550A
• 16534A, 16533A
• 16517A, 16518A
• 16522A, 16720A
• 16740A, 16741A, 16742A
• 16753A, 16754A, 16755A, 16756A
• 16760A

•
•
•
•
•
•
•
•
•

Stopping a repetitive run
Filtering of the data
Randomly accessing the data
Searching the data
Displaying the data in one of eight
colors
Accessing the trigger point
Accessing the acquired time or
state of the data
Outputting text strings to the
tool's display window
Outputting errors to the runtime
window

By using two of the provided functions, a simple user interface can easily be created that consists of label
strings and input fields. This allows
the input of parameters during the
tool's execution.

C Compiler
The libraries provided with the C
compiler allow you to perform standard operations such as creating
ASCII or binary files, reading from
these files, writing or appending to
these files, and IEEE 764 floating
point operations.

73

Post-Processing and Analysis Tool Sets
Licensing Information

Licensing and Miscellaneous
Description
System Configuration Requirements

• 16700 Series logic analysis system
• Desired tool set(s)
• Supported and compatible measurement hardware

Tool Set Control

• Locally control and view tool set measurements
• Remotely access any tool set from a PC or workstation through a web browser or X-window emulation
software.

File Access

• Access source files or other development environment applications (compiler, debugger) from the logic
analyzer via Telnet, NFS, or mapped file systems, and X-Windows client/server protocols.
• Save or access files via the standard network capabilities of the logic analyzer, such as FTP, NFS, or CIFS
(Common Internet File System for Windows 95/98/NT/2000/XP-based PCs).

Ordering and Shipment

• When a tool set is ordered with a 16700 Series mainframe, the tool set is shipped installed and ready to
run (Unless option 0D4 is ordered.)
• Tool set proof-of-receipt is provided by the entitlement certificate.
See page 129 for ordering information.

Tool Set Licensing Information
License Policy

The 16700 Series logic analysis systems’ tool set software is licensed for single-unit use only. Licenses
are valid for the life of the tool set. Software updates do not affect the license.

Nodelock Mode

• Tool set licenses are shipped or first installed as nodelocked applications. Nodelocked means that use of
the tool set license is only allowed on the single node (16700 Series analyzer on which it is installed). Tool
sets ordered with a 16700 Series mainframe will be installed with a permanent password and are ready to
run.
• For tool sets purchased as upgrades to existing 16700 Series mainframes, you must access the Agilent
password redemption web site to obtain a password. Your entitlement certificate provides the web URL
and alternate contact information. Password turnaround is generally the same business day.

Free Tool Set Evaluation
(Temporary Demo License)

A single temporary license is available for any tool set type not previously licensed on a node. The
temporary password for any node on any tool set is "demo". The temporary license is valid for 21 calendar
days from first entry of the password in the license management window of the 16700 Series logic
analysis system.

License Management

Licenses are managed from ‘Licensing…’ in the Admin tab of System Admin. Licenses are reserved at the
start of a measurement session. They remain in use until the measurement session is terminated.

Password Backup

Passwords can be backed up to a floppy disk or network file. Should the passwords on your 16700 Series
logic analysis system hard drive become corrupted, the tool set passwords can be reinstated by copying
your backed up password file to: /system/licensing/license.dat

74

Time Correlation with Agilent Infiniium Oscilloscopes
E5850A Logic Analyzer - Oscilloscope Time Correlation Fixture

E5850A Logic Analyzer – Oscilloscope
Time Correlation Fixture
The Agilent E5850A time correlation
fixture allows you to make timecorrelated measurements between a
16700 logic analyzer and an Agilent
548XX Series Infiniium oscilloscope
to solve the following types of problems more effectively:
• Verifying signal integrity
• Tracking down problems caused
by signal integrity
• Verifying correct operation of A/D
and D/A converters
• Verifying correct logical and temporal relationships between the
analog and digital portions of a
design
Agilent’s E5850A time correlation
fixture works in conjunction with
software in the 16700 family logic
analyzers, and any Agilent Infiniium
54800 Series oscilloscope, to deliver
the following features:

• Automatic de-skew.
Measurements between the logic
analyzer and Infiniium oscilloscope are automatically de-skewed
in time. This saves you time and
gives you confidence in the measurement results.
• Combined waveform display.
The Infiniium oscilloscope waveforms are displayed in the waveform display window on the 16700
logic analyzer, along with timing
analyzer waveforms. This allows
you to instantly visualize time
relationships among oscilloscope
and timing measurements.
• Global markers.
The global markers in the 16700
may be used to measure time
among all measurements made in
the logic analyzer and Infiniium
oscilloscope measurements.

• Tracking markers.
The Infiniium oscilloscope’s time
markers track the global markers
in the 16700 logic analyzer. If you
wish to view a waveform in
greater detail on the oscilloscope’s
display, or measure a voltage level
using the oscilloscope’s voltage
markers, this feature allows you to
relate information on the oscilloscope’s display precisely to corresponding information on the logic
analyzer display.

Figure 5.26. E5850A time correlation fixture.

Compatibility

Figure 5.25. Infiniium oscilloscope waveforms are displayed in the 16700 logic
analyzer waveform display window along with logic analyzer timing waveforms, accurately time-correlated.

For Infiniium
oscilloscope
model number
54810A
54815A
54820A
54825A
54835A
54845A
54846A
54830B
54831B
54832B
54845B
54846B
54830B
54831B
54832B
54854A
54855A

Software version
for 16700 series
logic analyzer
A.02.20.00 or higher

Software version for
Infiniium oscilloscope

A.02.50.00 or higher

A.01.00 or higher

A.02.50.00 or higher

A.04.35 or higher

A.02.50.00 or higher

A.02.10 or higher

A.02.70.00 or higher

A.03.00 or higher

A.04.00 or higher

The E5850A requires the versions of operating software indicated in the table

75

Mainframe Specifications and
Characteristics

Agilent 16700 Series Technical
Information

Mass Storage
Hard Disk Drive

18 GB formatted disk drive

System Software

Floppy Disk Drive
• Capacity
• Media
• Formats

1.44 MB formatted
3.5 inch floppy
MS-D0S (Read, write, format), LIF (Read only)

All features and functionality
described in this document are
available with system software
version A.02.70.00 or higher.

Internal System RAM
Standard

128 MB

Option 003 (Must be ordered at
time of frame purchase)

256 MB total

Supported Monitor Resolutions
Standard

640 x 480 through 1280 x 1024
(The 16702B has a built-in 800 x 600, 12.1”
(26.2mm) diagonal monitor.)

Option 003 (Must be ordered at
time of frame purchase)

Adds support for up to 1600 x 1200

LAN, IEEE 802.3
Physical Connectors

16700B Series:
10BaseT/100BaseT-X (ethertwist): RJ-45
16700A Series:
10BaseT (ethertwist): RJ-45; 10Base2: BNC

Protocols Supported

TCP/IP
NFS
CIFS (Windows® 95/98/NT/2000/XP) [1]
FTP
NTP
PCNFS

X-Window Support

X Window system version 11, release 6, as a client and
server

[1] User and share level control supported for Windows NT® 4.0. Share level control only supported for
Windows 95/98.

76

Mainframe Specifications and
Characteristics

Agilent 16700 Series Technical
Information (continued)

Web Server
Supported from Instrument
Web Page

Measurement status check,remote display, installation
of PC application software, link to Agilent’s Test and
Measurement site

PC Requirements

Pentium® (family) PC (200 MHz, 32 MB RAM) running
Windows 95, Windows 98, Windows NT 4.0 with
service pack 3 or higher, Windows 2000 or Windows XP

Supported Web Browsers
(on Your PC or Workstation)

Internet Explorer 4.0 or higher,
Netscape 4.0 or higher

IntuiLink Support
Installation of PC Application Software

Directly from instrument web page

MS Excel

Excel 97 Version 7.0 or later. Excel limits maximum trace
depth to 64K per sheet.

Available Data Formats
Fast Binary (Compressed
Binary Format)

High performance transfer rate. Includes source code to
parse data. Available via File Out.

Uncompressed Binary

Includes utility routines. Available via RPI.

ASCII

Provides same format as listing display, including
inverse-assembled data. Available via RPI and File Out.

Pattern Generator Binary

Used to load large amount of stimulus (> 1M) into the
16720A pattern generator

Intermodule Bus (IMB)
Time Correlation Resolution

2 ns

Port In/Out
Connectors

BNC

77

Mainframe Specifications and
Characteristics

Agilent 16700 Series Technical
Information (continued)

Port In
Levels

TTL, ECL, or user defined

Input Resistance

4 KΩ

Input Voltage

–6V at –1.5 mA to +6V at 1.6 mA

Port Out
Levels

3V TTL compatible into 50 Ω

Functions

Latched (latch operation is module dependent)
Pulsed, width from 66 ns to 143 ns

Target Control Port
Number of signals

8

Levels

3V TTL compatible

Connector

2 rows of 5 pins, 0.1-inch centers

Operating Environment
Temperature
• Instrument
• Disk Media
• Probes/Cables

0°C to 50°C (32°F to 122°F)
10°C to 40°C (50°F to 104°F)
O°C to 65°C (32°F to 149°F)

Altitude

To 3000m (10,000 ft)

Humidity

8 to 80% relative humidity at 40°C (104°F)

Printing

78

Printer Interface

Parallel interface for Centronics compatible printers

Printers Supported

PostScript printers and printers which support the
HP Printer Control Language (PCL)

Graphics

Graphics can be printed directly to the printer or to a file.
Graphic files can be created in black-and-white or color
TIFF format, PostScript, PCX, or XWD formats

Mainframe Specifications and
Characteristics

Remote Programming Interface (RPI)
RPI Overview
Typical Applications

Manufacturing Test
Data Acquisition for Offline Analysis
System Verification and Characterization
Pass/Fail Analysis
Stimulus Response Tests

Remote Programming
Steps

1.Set up the logic analyzer and save the test configuration.
2.Create a program that remotely:
Loads a test configuration
Starts the acquisition process
Checks measurement status (verifies completion)
Acts on the results of the data acquisition
• Saves configuration and captured data
• Exports data
• Executes a compare
• Modifies the trigger setup or trigger value for the next
acquisition
• Accesses the oscilloscope’s automatic measurements

Physical Connection

Remote programming is done via the LAN connection

Requirements
16700B Series
Analysis Systems

RPI is standard with system software version A.02.00.00 or
higher

PC

Programming is done via Microsoft® ActiveX/COM
automation
Pentium (family) PC with one of the following:
• Windows 95
• Windows 98
• Windows NT 4.0 with Service Pack 3 or higher
• Windows 2000
• Windows XP
Visual Basic or Visual C++ (Version 5.0 or higher)

UNIX®

Programming is done via TCP/IP socket based
ASCII commands

79

Mainframe Specifications and
Characteristics

Remote Programming Interface (RPI) (continued)
Command Set Summary - Commands available on both UNIX and PC
System

System Configuration Query
Load/Save Configuration and Data
Start/Stop Measurement
Current Run Status
Start/Stop/Query a Session

Logic Analysis Modules

Load/Save Configuration and Data
Trigger Setup
Acquisition Data and Parameters
Set/Query Acquisition Mode
Set/Query Acquisition Depth
Set/Query Pod Assignment
Add/Delete/Load/Query Labels
Set/Query Trigger Position
Modify Occurrence Count

Oscilloscope Modules

Load/Save Configuration and Data
Acquisition Data / Parameters
Query Automatic Measurements
Trigger Setup

Pattern Generator

Load/Save Configuration and Data
Load ASCII file (vectors) or PGB (pattern generator binary)
files (16720A only)
Modify Vector
Set/Query Clock Frequency
Set/Query Clock Out Delay
Insert New Vector at Specific Position
Delete Specific Vector

Emulation Module

Reset Processor
Run Processor
Break Processor
Single Step

Listing Tool

Status
Acquisition Data and Parameters
Transfer Data (includes inverse assembled information)

Compare Tool

Execute Compare
Set Compare Mask
Query Compare Result
Specify Range to Compare
Abort Compare After Specified Number of Differences
Return Labels and Values Where Differences Occur

File Out Tool

Transfer Data to File
Select Range to Expert

Additional Information
Instrument Online Help

Programming Information in instrument online help

Web Sites

Full remote programming documentation (pdf) available on
the hard drive. Sample programs are provided

80

Mainframe Specifications and
Characteristics

IntuiLink
Programming Examples Provided with IntuiLink
Visual Basic

Examples have been included for use with Visual Basic 5.0
or higher. These examples perform simple functions such
as: system checks, oscilloscope measurements, pass/fail
tests using stored configuration and pattern generator
stimulus files, and stimulus/response tests. They also can
capture and retrieve data for off-line analysis.

Visual C++

Examples have been included for use with Visual C++ 5.0 or
higher to perform simple functions such as: system check,
capturing and retrieving data for off-line analysis.

LabVIEW

An instrument library has been included for use with
LabVIEW 5.1 or higher. This library contains five LabVIEW
samples that provide a starting point for creating your own
LabVIEW programs.
• Load/Run/Save - loads a configuration, runs a
measurement, then saves results to a file
• Analyzer Listing - runs the logic analyzer and displays
data in a table
• Pass/Fail - runs the logic analyzer and compares the
measurement data against a standard
• Scope Waveform - runs the oscilloscope module and
displays waveform data
• Scope Measurements - runs the oscilloscope module
and displays a number of oscilloscope measurements

HP VEE

An instrument library has been included for use with
HP VEE 5.0 or higher that provides a starting point for
creating your own application.
• Load/Run/Save - loads a configuration, runs a
measurement, then saves results to a file

81

Mainframe Specifications and
Characteristics

Agilent 16700B Series Physical
Characteristics

12.1” Built-in LCD
Display with Touch
Screen

3.5 Inch Floppy
Disk Drive

Power
16700B
16701B
16702B

115/230 V, 48 to 66 Hz, 610 W max
115/230 V, 48 to 66 Hz, 545 W max
115/230 V, 48 to 66 Hz, 610 W max

On/Off
Power Switch
Touch Screen On/Off

Weight*
Figure 6.1. Agilent 16702B front panel.

16700B
16701B
16702B

Max Net
12.7 kg (27.0 lb)
10.4 kg (23.0 lb)
15.2 kg (32.4 lb)

Max Shipping
34.2 kg (75.4 lbs)
32.0 kg (70.6 lbs)
36.7 kg (80.8 lbs)

Parallel Port

LAN 10BaseT/100BaseT-X
SCSI-2 Single Ended

Monitor
RS-232

* Weight of modules ordered with mainframes will add
0.9 kg (2.0 lb) per module.

Five Slots for
Measurement
Modules

A
B
C
D
E

One Slot for
Emulation or
Multiframe
Module

Target Control Port
Port IN
Port OUT

Keyboard
Mouse
Expansion Frame Cable Connector

Figure 6.2. Back panel for Agilent models 16700B and 16702B.

551.2 (21.7”)

425.7 (16.75”)

234.2
(9.22”)

Figure 6.3. Exterior dimensions for the 16700B Series mainframe.
82

Dimensions: mm (inches)

40x CD-ROM
Drive

Probing Solutions Specifications and
Characteristics

Probing Technical Specifications

POWER GND 2
SIGNAL GND 4
SIGNAL GND 6
SIGNAL GND 8
SIGNAL GND 10
SIGNAL GND 12
SIGNAL GND 14
SIGNAL GND 16
SIGNAL GND 18
SIGNAL GND 20
SIGNAL GND 22
SIGNAL GND 24
SIGNAL GND 26
SIGNAL GND 28
SIGNAL GND 30
SIGNAL GND 32
SIGNAL GND 34
SIGNAL GND 36
SIGNAL GND 38
POWER GND 40

+5V
CLK1
CLK2
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
+5V

1
3
5
7
9
11
13
15
17
19
21
23
25
27
29
31
33
35
37
39

2
4
6
8
10
12
14
16
18
20
22
24
26
28
30
32
34
36
38
40

1 +5V
3 CLK1
5 CLK2
7 D15
9 D14
11 D13
13 D12
15 D11
17 D10
19 D9
21 D8
23 D7
25 D6
27 D5
29 D4
31 D3
33 D2
35 D1
37 D0
39 +5V

CLK 2 2
D15 4
D13 6
D11 8
D9 10
D7 12
D5 14
D3 16
D1 18
GND 20

POWER GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
SIGNAL GND
POWER GND

1
3
5
7
9
11
13
15
17
19

+5V
CLK 1
D14
D12
D10
D8
D6
D4
D2
D0

Figure 6.4. Pinout for state/timing module pod cable and 100 KΩ isolation adapter. (Agilent 01650-63203)

+5V 1
CLK1 3
D14 5
D12 7
D10 9
D8 11
D6 13
D4 15
D2 17
D0 19

2
4
6
8
10
12
14
16
18
20

CLK2
D15
D13
D11
D9
D7
D5
D3
D1
GND

Figure 6.5. Pinout for 20-pin connector. (Agilent 1251-8106)
83

Probing Solutions Specifications and
Characteristics

Isolation Adapters
Isolation adapters that connect to
the end of the probe cable are
designed to perform two functions.
The first is to reduce the number of
pins required for the header on the
target board. This process reduces
the board area dedicated to the
probing connection. The second
function is to provide the proper
RC isolation networks in a very
convenient package.

Adapter RC Network
250
ohm

90.9k
ohm

Signal
8.2pF
Ground

To Logic
Analyzer
Pod

01650-63203 20-pin Probe
Equivalent Load
370
ohm
Signal
4.6pF

7.4pF

100k
ohm

Ground
Includes logic analyzer
Figure 6.6. 01650-63203 Termination adapter and equivalent load.

E5346A 38-pin Probe

370 ohm
Signal
3pF

9pF

100k
ohm

18pF

50.5k
ohm

Ground
Figure 6.7. E5346A equivalent load.

E5339A 38-pin Low Voltage Probe

220 ohm
Signal
3pF
Ground

84

Figure 6.8. E5339A equivalent load.

State/Timing Modules Specifications and
Characteristics

Key Specifications* and Characteristics
Agilent Model Number

16715A, 16716A, 16717A

16740A, 16741A, 16742A

16750B, 16751B, 16752B

16760A

Maximum state acquisition rate on
each channel

16715A, 16716A: 167 Mb/s
16717A, 333 Mb/s [1]

200 Mb/s

400 Mb/s [1]

Full channel: 800 Mb/s
Half channel: 1.5 Gb/s

Maximum timing sample rate
(half/full channel)

Timing Zoom: 2 GHz (16716A,
16717A only)
Conventional: 667/333 MHz
Transitional: 333 MHz

Timing Zoom: 2 GHz
Conventional: 800/400 MHz
Transitional: 400 MHz

Timing Zoom: 2 GHz
Conventional: 800/400 MHz
Transitional: 400 MHz

Conventional: 800 MHz
Transitional: 400 MHz

Channels/module

68

68

68

34

Maximum channels on a
single time base and trigger

340 (5 modules)

340 (5 modules)

340 (5 modules)

170 (5 modules)

Memory depth
(half/full channel)

16715A, 16717A: 4/2M [2]
16716A: 1M/512K [2]

16740A: 2/1 M [2]
16741A: 8/4 M [2]
16742A 32/16 M [2]

16750B: 8/4M [2]
16751B: 32/16M [2]
16752B: 64/32M [2]

128/64M [5]

Trigger resources

Patterns: 16
Ranges: 15
Edge & Glitch: 2
Timers: (2 per module) -1
Occurrence Counter: [4]
Global Counters: 2
Flags: 4

Pattern: 16
Ranges: 15
Edge & Glitch: 2
Timers: (2 per module) -1
Occurrence Counter: 2
Global Counter: 2
Flags: 4

Patterns: 16
Ranges: 15
Edge & Glitch: 2
Timers: (2 per module) -1
Occurrence Counter: [4]
Global Counters: 2
Flags: 4

At 800 Mb/s: 4 patterns or
2 ranges, 4 flags, arm in
At 200 Mb/s: same as
16750B/51B/52B
Other speeds: refer to
synchronous state analysis
(page 97) and asynchronous
timing analysis (page 100)

Maximum trigger sequence levels

16

16

16

1.5 Gb/s: 2
800 Mb/s: 4
200 or 400 Mb/s: 16

Maximum trigger sequence speed

16715A, 16716A: 167 MHz
16717A: 333 MHz

200 MHz

400 MHz

1.5 GHz

Trigger sequence level branching

4-way arbitrary “IF/THEN/ELSE”
branching

4-way arbitrary
“IF/THEN/ELSE”
branching

4-way arbitrary “IF/THEN/ELSE”
branching

800 or 1.5 Gb/s: none
200 Mb/s: arbitrary
“IF/THEN/ELSE” branching
400 Mb/s: dedicated nextstate branch or reset

Number of state clocks/qualifiers

4

4

4

1 (state clock only)

Setup/hold time*

2.5 ns window adjustable from
4.5/-2.0 ns to -2.0/4.5 ns in 100 ps
increments per channel [3]

2.5 ns windows adjustable from
4.5/2.0 ns to -2.0/4.5 ns in 100 ps
increments per channel [3]

2.5 ns window adjustable from
4.5/-2.0 ns to -2.0/4.5 ns in 100 ps
increments per channel [3]

1 ns window adjustable from
2.5/-1.5 ns to -1.5/2.5 ns
10 ps increments per channel

Threshold range

TTL, ECL, user-definable ±6.0 V
adjustable in 10-mV increments

TTL, ECL, user-definable ±6.0 V
adjustable in 10-mV increments

TTL, ECL, user-definable ±6.0 V
adjustable in 10-mV increments

-3.0 V to 5.0 V adjustable in
10-mV increments

* All specifications noted by an asterisk are the performance standards against which the product is tested.
[1] State speeds greater than 167 MHz (16717A) or 200 MHz (16750B, 16751B, 16752B, 16760A) require a trade-off in features.
Refer to “Supplemental Specifications and Characteristics” on page 93 for more information.
[2] Memory depth doubles in half-channel timing mode only.
[3] Minimum setup/hold time specified for a single clock, single edge acquisition. Multi-clock, multi-edge setup/hold window add 0.5 ns.
[4] There is one occurrence counter per trigger sequence level.
[5] Memory depth doubles in half-channel 1.25 Gb/s and 1.5 Gb/s modes only.

85

State/Timing Modules Specifications and
Characteristics

Key Specifications* and Characteristics (continued)
Agilent Model Number

16710A, 16711A, 16712A

16753A, 16754A, 16755A, 16756A

Maximum state acquisition rate on
each channel

100 Mb/s

600 Mb/s

Maximum timing sample rate
(half/full channel)

Conventional: 500/250 MHz
Transitional: 125 MHz

Timing Zoom: 4 GHz
Conventional: 1200/600 MHz
Transitional: 600 MHz

Channels/module

102

68

Maximum channel count on a
single time base and trigger

204 (2 modules)

340 (5 modules)

Memory depth
(half/full channel)

16710A: 16/8K [1]
16711A: 64/32K [1]
16712A: 256/128k [1]

16753A:
16754A:
16755A:
16756A:

Trigger resources

Patterns: 10
Ranges: 2
Edge & Glitch: 2
Timers: 2

Patterns: 16
Ranges: 15
Edge & Glitch: 2
Timers: (2 per module) -1
Occurrence Counter: [3]
Global Counters: 2
Flags: 4

Maximum trigger sequence levels

State mode: 12
Timing mode: 10

Patterns: 16
Ranges: 15
Edge & Glitch: 2
Timers: (2 per module) -1
Occurrence Counter: [3]
Global Counters: 2
Flags: 4

Maximum trigger sequence speed

125 MHz

600 MHz

Trigger sequence level branching

Dedicated next state or
single arbitrary branching

4-way arbitrary
“IF/THEN/ELSE” branching

Number of state clocks/qualifiers

6

4

Setup/hold time*

4.0 ns window adjustable from
4.0/0 ns to 0/4.0 ns in 500 ps
increments [2] per 34 channels

1 ns window (600ps typical) adjustable
in 80ps increments

Threshold range

TTL, ECL, user-definable ±6.0 V
adjustable in 50 mV increments

-3.0 V to +5.0 V adjustable in
10-mV increments

2/1M [1]
8/4M [1]
32/16M [1]
128/64M [1]

* All specifications noted by an asterisk are the performance standards against which the product is tested.
[1] Memory depth doubles in half-channel timing mode only.
[2] Minimum setup/hold time specified for single-clock, single-edge acquisition. Single-clock, multi-edge setup/hold add 0.5 ns.
Multi-clock, multi-edge setup/hold window add 1.0 ns.
[3] There is one occurrence counter per trigger sequence level.

86

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16710A, 16711A, 16712A
Supplemental Specifications* and Characteristics

370 ohms

Probes (general-purpose lead set)
1.5pF
Input resistance

100 KΩ, ±2%

Parasitic tip capacitance

1.5 pF

Minimum voltage swing

500 mV, peak-to-peak

Threshold accuracy*

±(100 mV + 3% of threshold setting)

Maximum input voltage

±40 V peak

7.4pF

100K
ohm

GROUND
Figure 6.9. Equivalent probe load for the
Agilent 16710A, 16711A and 16712A, generalpurpose lead set.

State Analysis
Minimum state clock pulse width

3.5 ns

Time tag resolution [1]

8 ns

Maximum time count between states

34 seconds

Maximum state tag
count between states [1]

4.29 x 109 states

Minimum master to master clock time*

16710A, 16711A, 16712A: 10 ns

Minimum master to slave clock time

0.0 ns

Minimum slave to master clock time

4.0 ns

Context store block sizes
16710A/11A/12A only

16, 32, 64 states

Timing Analysis
Sample period accuracy

0.01% of sample period

Channel-to-channel skew

2 ns, typical

Time interval accuracy

± (sample period + channel-to-channel
skew + 0.01% of time interval reading)

Minimum detectable glitch

3.5 ns

* All specifications noted by an asterisk are the performance standards against which the product is tested.
[1] Time or state tags halve the acquisition memory when there are no unassigned pods.

87

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16710A, 16711A, 16712A
Supplemental Specifications* and Characteristics (continued)
Triggering
Maximum trigger sequence speed

125 MHz, maximum

Maximum occurrence counter

1,048,575

Range width

32 bits each

Timer value range

400 ns to 500 seconds

Timer resolution

16 ns or 0.1% whichever is greater

Timer accuracy

±32 ns or ±0.1% whichever is greater

Operating Environment
Temperature

Agilent 16700 Series mainframes:
• Instrument 0˚C to 50˚C (+32˚F to 122˚F)
• Probe lead sets and cables, 0˚C to 65˚C (+32˚F to 149˚F)

Humidity

80% relative humidity at +40˚C

Altitude

Operating 4600m (15,000ft)
Nonoperating 15,300m (50,000ft)

* All specifications noted by an asterisk are the performance standards against which the product is tested.

88

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16715A, 16716A, 16717A, 16740A, 16741A,
16742A, 16750B, 16751B, 16752B Supplemental Specifications*
and Characteristics

370 ohms

1.5pF

Probes (general-purpose lead set)
Input resistance

100 KΩ, ± 2%

Parasitic tip capacitance

1.5 pF

Minimum voltage swing

500 mV, peak-to-peak

Minimum input overdrive

250 mV

Threshold range

-6V to +6V in 10 mV increments

Threshold accuracy*

± (65 mV + 1.5% of settings)

Input dynamic range

± 10V about threshold

Maximum input voltage

± 40V peak

+5V Accessory current

1/3 amp maximum per pod

Channel assignment

Each group of 34 channels can be assigned to
Analyzer 1, Analyzer 2 or remain unassigned

7.4pF

100K
ohm

GROUND
Figure 6.10. Equivalent probe load for the
Agilent 16715A, 16716A, 16717A, 16718A,
16719A, 16750B, 16751B, 16752B generalpurpose lead set.

2 GHz Timing Zoom (Agilent 16716A, 16717A, 16740A, 16741A, 16742A, 16750B, 16751B, 16752B only)
Timing analysis sample rate

2 GHz/1 GHz/500 MHz/250 MHz

Sample period accuracy

± 50 ps

Channel-to-channel skew

< 1.0 ns

Time interval accuracy

± (sample period + channel-to-channel skew + 0.01% of
time interval reading)

Memory depth

16 K

Trigger position

Start, center, end, or user defined

Operating Environment
Temperature

Agilent 16700 Series frame: 0˚C to 50˚C (+32˚F to 122˚F)
Probe lead sets and cables: 0˚C to 65˚C (+32˚F to 149˚F)

Humidity

80% relative humidity at + 40˚C

Altitude

Operating 4600 m (15,000 ft)
Non-operating 15,300 m (50,000 ft)

* All specifications noted by an asterisk are the performance standards against which the product is tested.

89

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16715A, 16716A, 16717A, 16740A, 16741A, 16742A,
16750B, 16751B, 16752B Supplemental Specifications* and Characteristics
State Mode

16715A, 16716A, 16717A
167 Mb/s State Mode

16740A, 16741A, 16742A
16750B, 16751B, 16752B
200 Mb/s State Mode

Maximum state acquisition rate on
each channel

167 Mb/s

200 Mb/s

Channel count

68 per module

68 per module

Maximum channels on a single
time base and trigger

340

340

Number of independent analyzers

2, can be set up in state or timing modes

2, can be set up in state or timing modes

Minimum master to
master clock time* [1]

5.988 ns

5 ns

Minimum master to slave clock time

2 ns

2 ns

Minimum slave to master clock time

2 ns

2 ns

Minimum slave to slave clock time

5.988 ns

5 ns

Setup/hold time* [1]
(single-clock, single-edge)

2.5 ns window adjustable from 4.5/-2.0 ns to
-2.0/4.5 ns in 100 ps increments per channel

2.5 ns window adjustable from 4.5/-2.0 ns to
-2.0/4.5 ns in 100 ps increments per channel

Setup/hold time* [1]
(multi-clock, multi-edge)

3.0 ns window adjustable from 5.0/-2.0 ns to
-1.5/4.5 ns in 100 ps increments per channel

3.0 ns window adjustable from 5.0/-2.0 ns to
-1.5/4.5 ns in 100 ps increments per channel

Setup/hold time (on individual channels,
after running eye finder)

1.25 ns window

1.25 ns window

Minimum state clock pulse width

1.2 ns

1.2 ns

Time tag resolution [2]

4 ns

4 ns

Maximum time count between states

17 seconds

17 seconds

Maximum state tag count
between states [2]

232

232

Number of state clocks/qualifiers

4

4

Maximum memory depth

16716A: 512K
16715A, 16717A: 2M

16740A: 1M
16741A: 4M
16742A: 16M

Maximum trigger sequence speed

167 MHz

200 MHz

Maximum trigger sequence levels

16

16

* All specifications noted by an asterisk are the performance standards against which the product is tested.
[1] Tested at input signal VH=-0.9V, VL=-1.7V, Slew rate=1V/ns, and threshold=-1.3V.
[2] Time or state tags halve the acquisition memory when there are no unassigned pods.

90

16750B: 4M
16751B: 16M
16752B: 32M

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16715A, 16716A, 16717A, 16740A, 16741A, 16742A,
16750B, 16751B, 16752B Supplemental Specifications* and Characteristics (continued)
State Mode

16715A, 16716A, 16717A
167 Mb/s State Mode

16740A, 16741A, 16742A
16750B, 16751B, 16752B
200 Mb/s State Mode

Trigger sequence level branching

4 way arbitrary “IF/THEN/ELSE” branching

4 way arbitrary “IF/THEN/ELSE” branching

Trigger position

Start, center, end, or user defined

Start, center, end, or user defined

Trigger resources

16 Patterns evaluated as =, ≠, >, <, ≥, ≤
15 Ranges evaluated as in range, not in range
(2 Timers per module) -1
2 Global counters
1 Occurrence counter per sequence level
4 Flags

16 Patterns evaluated as =, ≠, >, <, ≥, ≤
15 Ranges evaluated as in range, not in range
(2 Timers per module) -1
2 Global counters
1 Occurrence counter per sequence level
4 Flags

Trigger resource conditions

Arbitrary Boolean combinations

Arbitrary Boolean combinations

Trigger actions

Goto
Trigger and fill memory
Trigger and goto
Store/don’t store sample
Turn on/off default storing
Timer start/stop/pause/resume
Global counter increment/reset
Occurrence counter reset
Flag set/clear

Goto
Trigger and fill memory
Trigger and goto
Store/don’t store sample
Turn on/off default storing
Timer start/stop/pause/resume
Global counter increment/reset
Occurrence counter reset
Flag set/clear

Store qualification

Default and per sequence level

Default and per sequence level

Maximum global counter

16,777,215

16,777,215

Maximum occurrence counter

16,777,215

16,777,215

Maximum pattern/range width

32 bits

32 bits

Timers value range

100 ns to 5497 seconds

100 ns to 5497 seconds

Timer resolution

5 ns

5 ns

Timer accuracy

10 ns + .01%

10 ns + .01%

Timer reset latency

70 ns

70 ns

Data in to trigger out (BNC port)

150 ns, typical

150 ns, typical

Flag set/reset to evaluation

110 ns, typical

110 ns, typical

* All specifications noted by an asterisk are the performance standards against which the product is tested.

91

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16715A, 16716A, 16717A, 16740A, 16741A, 16742A,
16750B, 16751B, 16752B Supplemental Specifications* and Characteristics (continued)
State Mode

16717A
333 Mb/s State Mode

16750B, 16751B, 16752B
400 Mb/s State Mode

Maximum state acquisition rate
on each channel

333 Mb/s

400 Mb/s

Channel count

(Number of modules x 68) - 34

(Number of modules x 68) - 34

Maximum channels on a single
time base and trigger

306

306

Number of independent analyzers

1, when 333 MHz state mode is selected
the second analyzer is turned off

1, when 400 MHz state mode is selected
the second analyzer is turned off

Minimum master to master clock time* [1]

3.003 ns

2.5 ns

Setup/hold time* [1]
(single-clock, single-edge)

2.5 ns window adjustable from 4.5/-2.0 ns to
-2.0/4.5 ns in 100 ps increments per channel

2.5 ns window adjustable from 4.5/-2.0 ns to
-2.0/4.5 ns in 100 ps increments per channel

Setup/hold time* [1]
(single-clock, multi-edge)

3.0 ns window adjustable from 5.0/-2.0 ns to
-1.5/4.5 ns in 100 ps increments per channel

3.0 ns window adjustable from 5.0/-2.0 ns to
-1.5/4.5 ns in 100 ps increments per channel

Setup/hold time (on individual channels
after running eye finder)

1.25 ns window

1.25 ns window

Minimum state clock pulse width

1.2 ns

1.2 ns

Time tag resolution [2]

4 ns

4 ns

Maximum time count between states

17 seconds

17 seconds

Number of state clocks

1

1

Maximum memory depth

16717A: 2M

16750B: 4M
16751B: 16M
16752B: 32M

Maximum trigger sequence speed

333 MHz

400 MHz

Maximum trigger sequence levels

15

15

Trigger sequence level branching

Dedicated next state branch or reset

Dedicated next state branch or reset

Trigger position

Start, center, end, or user defined

Start, center, end, or user defined

* All specifications noted by an asterisk are the performance standards against which the product is tested.
[1] Tested at input signal VH=-0.9V, VL=-1.7V, Slew rate=1V/ns, and threshold=-1.3V.
[2] Time or state tags halve the acquisition memory when there are no unassigned pods.

92

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16715A, 16716A, 16717A, 16740A, 16741A, 16742A,
16750B, 16751B, 16752B Supplemental Specifications* and Characteristics (continued)
State Mode

16717A
333 Mb/s State Mode

16750B, 16751B, 16752B
400 Mb/s State Mode

Trigger resources

8 Patterns evaluated as =, ≠, >, <, ≥, ≤
4 Ranges evaluated as in range, not in range
2 Occurrence counters
4 Flags

8 Patterns evaluated as =, ≠, >, <, ≥, ≤
4 Ranges evaluated as in range, not in range
2 Occurrence counters
4 Flags

Trigger resource conditions

Arbitrary Boolean combinations

Arbitrary Boolean combinations

Trigger actions

Goto
Trigger and fill memory

Goto
Trigger and fill memory

Store qualification

Default

Default

Maximum occurrence counter

16,777,215

16,777,215

Maximum pattern/range width

32 bits

32 bits

Data in to trigger out (BNC port)

150 ns, typical

150 ns, typical

Flag set/reset to evaluation

110 ns, typical

110 ns, typical

Timing Mode

16715A, 16716A, 16717A

16740A, 16741A, 16742A, 16750B, 16751B, 16752B

Timing analysis sample rate
(half/full channel)

667/333 MHz

800/400 MHz

Channel count

68 per module

68 per module

Maximum channels on
a single time base and trigger

340

340

Number of independent analyzers

2, can be setup in state or timing modes

2, can be setup in state or timing modes

Sample period (full channel)

3 ns to 1 ms

2.5 ns to 1 ms

Sample period (half channel)

1.5 ns

1.25 ns

Minimum data pulse width
for data capture
Conventional timing
Transitional timing
For trigger sequencing

1.75 ns
3.9 ns
6.1 ns

1.5 ns
3.8 ns
5.1 ns

Sample period accuracy

±(100 ps + .01% of sample period)

±(100 ps + .01% of sample period)

Channel-to-channel skew

< 1.5 ns

< 1.5 ns

Time interval accuracy

± (sample period + channel-to-channel
skew + .01% of time interval reading)

± (sample period + channel-to-channel
skew + .01% of time interval reading)

Minimum detectable glitch

1.5 ns

1.5 ns

Memory depth (half/full channel)

16716A: 1M/512K
16715A, 16717A: 4/2M

16750B: 8/4M
16751B: 32/16M
16752B: 64/32M

* All specifications noted by an asterisk are the performance standards against which the product is tested.
93

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16715A, 16716A, 16717A, 16740A, 16741A, 16742A, 16750B,
16751B, 16752B Supplemental Specifications* and Characteristics (continued)
Timing Mode (continued)

16715A, 16716A, 16717A

16740A, 16741A, 16742A
16750B, 16751B, 16752B

Maximum trigger sequence speed

167 MHz

200 MHz

Maximum trigger sequence levels

16

16

Trigger sequence level branching

4 way arbitrary “IF/THEN/ELSE” branching

4 way arbitrary “IF/THEN/ELSE” branching

Trigger position

Start, center, end, or user defined

Start, center, end, or user defined

Trigger resources

16 Patterns evaluated as =, ≠, >, <, ≥, ≤
15 Ranges evaluated as in range, not in range
2 Edge/glitch
(2 Timers per module) -1
2 Global counters
1 Occurrence counter per sequence level
4 Flags

16 Patterns evaluated as =, ≠, >, <, ≥, ≤
15 Ranges evaluated as in range, not in range
2 Edge/glitch
(2 Timers per module) -1
2 Global counters
1 Occurrence counter per sequence level
4 Flags

Trigger resource conditions

Arbitrary Boolean combinations

Arbitrary Boolean combinations

Trigger actions

Goto
Trigger and fill memory
Trigger and goto
Timer start/stop/pause/resume
Global counter increment/reset
Occurrence counter reset
Flag set/clear

Goto
Trigger and fill memory
Trigger and goto
Timer start/stop/pause/resume
Global counter increment/reset
Occurrence counter reset
Flag set/clear

Maximum global counter

16,777,215

16,777,215

Maximum occurrence counter

16,777,215

16,777,215

Maximum pattern/range width

32 bits

32 bits

Timer value range

100 ns to 5497 seconds

100 ns to 5497 seconds

Timer resolution

5 ns

5 ns

Timer accuracy

±10 ns + .01%

±10 ns + .01%

Greater than duration

6 ns to 100 ms in 6 ns increments

6 ns to 100 ms in 6 ns increments

Less than duration

12 ns to 100 ms in 6 ns increments

12 ns to 100 ms in 6 ns increments

Timer reset latency

70 ns

70 ns

Data in to trigger out (BNC port)

150 ns, typical

150 ns, typical

Flag set/reset to evaluation

110 ns, typical

110 ns, typical

* All specifications noted by an asterisk are the performance standards against which the product is tested.

94

State/Timing Modules Specifications and
Characteristics
Probes for 16753A, 16754A, 16755A, 16756A, 16760A
Supplemental Specifications* and Characteristics
Probes

E5378A 100-pin Single-ended

E5379A 100-pin Differential

E5380A 35-pin Single-ended

E5382A Single-Ended Flying Leads

Input resistance and
capacitance

Refer to figure 6.11

Refer to figure 6.11

Refer to figure 6.11

Refer to figure 6.12

Maximum state data
rate supported

1.5 Gb/s

1.5 Gb/s

600 Mb/s

1.5 Gb/s

Mating connector

Agilent part number
1253-3620 [1]

Agilent part number
1253-3620 [1]

Amp Mictor 38 [2]

None required

Minimum voltage swing

250 mV p-p

Vin+ - Vin- >= 200 mV p-p

300 mV p-p

250 mV p-p

Input dynamic range

-3 Vdc to +5 Vdc

-3 Vdc to +5 Vdc

-3 Vdc to +5 Vdc

-3 Vdc to +5 Vdc

Threshold accuracy

+/- (30 mV + 1% of setting)*

+/- (30 mV + 1% of setting) [3]

+/- (30 mV + 1% of setting)

+/- (30 mV + 1% of setting)

Threshold range

-3.0 V to +5.0 V

-3.0 V to +5.0 V

-3.0 V to +5.0 V

-3.0 V to +5.0 V

User-supplied threshold
input range

-3.0 V to +5.0 V

N/A

N/A

N/A

User-supplied threshold
input resistance

>= 100K ohms

N/A

N/A

N/A

Threshold control options

• User-provided input
• Adjustable from user
interface

If operated single-ended
(minus inputs grounded),
the threshold can be adjusted
from the user interface

Adjustable from user
interface

Adjustable from user
interface

Maximum nondestructive
input voltage

+/-40 Vdc

+/-40 Vdc

+/-40 Vdc

+/-40 Vdc

Maximum input slew rate

5 V/ns

5 V/ns

5 V/ns

5 V/ns

Clock input

Differential

Differential

Single-ended

Differential

Number of inputs [4]

34 (32 data and 2 clock/data)

17 (16 data and 1 clock/data)

34 (32 data and 2 clock/data) 17 (16 data and 1 clock/data)

* All specifications noted by an asterisk are the performance standards against which the product is tested.
[1] A support shroud, Agilent part number 16760-02302 (for boards up to 0.062" thick) or 16760-02303 (for boards up to 0.120" thick) is recommended.
A kit of 5 shrouds and 5 connectors is available as Agilent part number 16760-68702 (for boards up to 0.062" thick) or 16760-68703 (for boards up to 0.120" thick).
[2] A kit of 5 Amp Mictor connectors and 5 support shrouds is available, Agilent part number E5346-68701.
A support shroud is available separately, Agilent part number E5346-44701.
[3] If operated single-ended (minus inputs grounded), the threshold can be adjusted from the user interface.
[4] Refer to specifications on specific modes of operation for details on how inputs can be used.
[5] Soft touch probes use a retention module attached to the target PC board. A kit of 5 retention modules is included with each probe. Additional kits of 5 retention modules
can be ordered using Agilent part number E5387-68701.
150

215

1.5pF

0.7pF

20k

121

1pF

20k

0.6pF
30

+0.75 V

+0.75 V

Model Number

C1

R1

R2

E5378A, E5379A

1.5pF

120

30

E5380A

3pF

120

60

Figure 6.11. E5378A, E5379A, E5380A input
equivalent probe load.

Figure 6.12. E5382A input equivalent probe load, with
5cm damped wire (see user’s guide for load models
with other accessories).

95

State/Timing Modules Specifications and
Characteristics
Probes for 16753A, 16754A, 16755A, 16756A, 16760A
Supplemental Specifications* and Characteristics (continued)
Probes

E5387A Differential Soft Touch E5390A Single-Ended Soft Touch

Input resistance and
capacitance

Refer to figure 6.13

Refer to figure 6.13

Maximum state data
rate supported

1.5 Gb/s

1.5 Gb/s

Mating connector

None required [5]

None required [5]

Minimum voltage swing

Vin+ - Vin- >= 200 mV p-p

250 mV p-p

Input dynamic range

-3 Vdc to +5 Vdc

-3 Vdc to +5 Vdc

Threshold accuracy

+/- (30 mV + 2% of setting)*

+/- (30 mV + 2% of setting) [3]

Threshold range

-3.0 V to +5.0 V

-3.0 V to +5.0 V

User-supplied threshold
input range

N/A

-3.0 V to +5.0 V

User-supplied threshold
input resistance

N/A

>= 100K ohms

Threshold control options

If operated single-ended
• User-provided input
(minus inputs grounded),
• Adjustable from user
the threshold can be adjusted interface
from the user interface

Maximum nondestructive
input voltage

+/-40 Vdc

+/-40 Vdc

Maximum input slew rate

5 V/ns

5 V/ns

Clock input

Differential

Differential

Number of inputs [4]

17 (16 data and 1 clock/data) 34 (32 data and 2 clock/data)

* All specifications noted by an asterisk are the performance standards against which the product is tested.
[1] A support shroud, Agilent part number 16760-02302 (for boards up to 0.062" thick) or 16760-02303 (for boards up to 0.120" thick) is recommended.
A kit of 5 shrouds and 5 connectors is available as Agilent part number 16760-68702 (for boards up to 0.062" thick) or 16760-68703 (for boards up to 0.120" thick).
[2] A kit of 5 Amp Mictor connectors and 5 support shrouds is available, Agilent part number E5346-68701. A support shroud is available separately, Agilent part number E5346-44701.
[3] If operated single-ended (minus inputs grounded), the threshold can be adjusted from the user interface.
[4] Refer to specifications on specific modes of operation for details on how inputs can be used.
[5] Soft touch probes use a retention module attached to the target PC board. A kit of 5 retention modules is included with each probe. Additional kits of 5 retention modules
can be ordered using Agilent part number E5387-68701.

Figure 6.13. E5387A and E5390A Probe Load Model.

96

State/Timing Modules Specifications and
Characteristics
Agilent 16753A, 16754A, 16755A, 16756A
Supplemental Specifications* and Characteristics
Timing Zoom
Timing analysis sample rate

4 GHz

Time interval accuracy, within a pod pair

+/- (750 ps + 0.01% of time interval reading)

Time interval accuracy, between pod pairs

+/- (1.5 ns + 0.01% of time interval reading)

Memory depth

64 K samples

Trigger position

Start, center, end, or user defined

Minimum data pulse width

750 ps

tWidth
Figure 6.14. Data Sampling.

Individual
Data Channel

vHeight

Data Eye

tSetup tHold

vThreshold*
—0V—

Sampling
Position

*User Adjustable

tSample*

Clock Channel

Note (1)

State (synchronous) analysis mode

300 Mb/s State Mode

600 Mb/s State Mode

tWidth*[1,2] with E5378A, E5379A, E5387A,
or E5390A probes

1 ns*, 600 ps typical

1 ns*, 600 ps typical

tWidth[1] with E5380A or E5382A probes

1.5 ns, 1 ns typical

1.5 ns, 1 ns typical

tSetup

0.5 tWidth

0.5 tWidth

tHold

0.5 tWidth

0.5 tWidth

tSample range [3]

-4 ns to +4 ns

-4 ns to +4 ns

tSample adjustment resolution

80 ps (typical)

80 ps (typical)

tSample accuracy, manual adjustment

+/- 300 ps

+/- 300 ps [4]

[1] Minimum eye width in system under test
[2] The choice of probe can limit system performance. Select a probe rated at 600 Mb/s or greater to maintain system bandwidth.
[3] Sample positions are independently adjustable for each data channel input. A negative sample position causes the input to be synchronously sampled by that amount before
each active clock edge. A positive sample position causes the input to be synchronously sampled by that amount after each active clock edge. A sampling position of zero
causes the input to be synchronously sampled coincident with each clock edge.
[4] Use of eye finder is recommended in 600 Mb/s mode
Items marked with an asterisk * are specifications. All others are characteristics.
"Typical" represents the average or median value of the parameter based on measurements from a significant number of units.

97

State/Timing Modules Specifications and
Characteristics
Agilent 16753A, 16754A, 16755A, 16756A
Supplemental Specifications* and Characteristics (continued)
State (synchronous) analysis mode (continued) 300 Mb/s State Mode

600 Mb/s State Mode

Maximum state acquisition rate on each channel

300 Mb/s

600 Mb/s

Number of channels with time tags
on at full memory depth [5]

68 * (number of modules) (number of clocks) - 34

68 * (number of modules) - 35

Number of data channels with time tags off

68 * (number of modules) (number of clocks)

68 * (number of modules) - 1

Maximum channels on a single time base and trigger 340

340

Memory depth [5]

16753A: 1 M samples
16754A: 4 M samples
16755A: 16 M samples
16756A: 64 M samples

16753A: 1 M samples
16754A: 4 M samples
16755A: 16 M samples
16756A: 64 M samples

Number of independent analyzers [6]

2

1

Number of clocks [7]

4

1

Number of clock qualifiers [7]

4

N/A

Minimum master to master clock time* [6]

3.33 ns

1.67 ns

Minimum master to slave clock time

1 ns

N/A

Minimum slave to master clock time

1 ns

N/A

Minimum slave to slave clock time

3.33 ns

N/A

Minimum state clock pulse width, single edge

1 ns

500 ps

Minimum state clock pulse width, multiple edge

1 ns

1.67 ns

Clock qualifier setup time

500 ps

N/A

Clock qualifier hold time

0

N/A

Time tag resolution

2 ns

1.5 ns

Maximum time count between stored states

32 days

32 days

Maximum state count

2E+32

2E+32

[1] Minimum eye width in system under test
[2] The choice of probe can limit system performance. Select a probe rated at 600 Mb/s or greater to maintain system bandwidth.
[3] Sample positions are independently adjustable for each data channel input. A negative sample position causes the input to be synchronously sampled by that amount before
each active clock edge. A positive sample position causes the input to be synchronously sampled by that amount after each active clock edge. A sampling position of zero
causes the input to be synchronously sampled coincident with each clock edge.
[4] Use of eye finder is recommended in 600 Mb/s mode
[5] With time or state tags on and all pods assigned, memory depth is half the maximum memory depth. With time or state tags on and one pod (34 channels) unassigned, the
memory depth is full.
[6] Independent analyzers may be either state or timing. When the 600 Mb/s state mode is selected, only one analyzer may be used.
[7] In the 300 Mb/s state mode, the total number of clocks and qualifiers is 4. All clock and qualifier inputs must be on the master module.
[8] Tested with input signal Vh = 0.9 V, Vl = -1.7 V, slew rate = 1 V/ns, threshold = -1.3 V
[9] Calculated from rise time
Items marked with an asterisk * are specifications. All others are characteristics.
"Typical" represents the average or median value of the parameter based on measurements from a significant number of units.
98

State/Timing Modules Specifications and
Characteristics
Agilent 16753A, 16754A, 16755A, 16756A
Supplemental Specifications* and Characteristics (continued)
State (synchronous) analysis mode (continued) 300 Mb/s State Mode

600 Mb/s State Mode

Maximum trigger sequence speed

300 MHz

600 MHz

Maximum trigger sequence levels

16

16

Trigger sequence level branching

Arbitrary 4-way "IF/THEN/ELSE"

2-way "IF/THEN/ELSE"

Trigger position

Start, center, end, or user -defined

Start, center, end, or user -defined

Trigger resources

16 patterns evaluated as =, =/, >, >=, <, <=
14 double-bounded ranges evaluated as in range,
not in range
2 timers per module
2 global counters
1 occurrence counter per sequence level
4 flags

14 patterns evaluated as =, =/, >, >=, <, <=
7 double-bounded ranges evaluated as in range,
not in range
1 occurrence counter per sequence level
4 flags

Trigger resource conditions

Arbitrary Boolean combinations

Arbitrary Boolean combinations

Trigger actions

Goto
Trigger and fill memory
Trigger and Goto
Store/don't store sample
Turn on/off default storing
Timer start/stop/pause/resume
Global counter increment/decrement/reset
Occurrence counter reset
Flag set/clear

Goto
Trigger and fill memory

Store qualification

Default (global) and per sequence level

Default (global)

Maximum global counter

2E+24

N/A

Maximum occurrence counter

2E+24

2E+24

Maximum pattern/range width

32 bits

32 bits

Timers range

40 ns to 2199 seconds

N/A

Timer resolution

2 ns

N/A

Timer accuracy

+/- (5 ns +0.01%)

N/A

Timer reset latency

40 ns

N/A

[1] Minimum eye width in system under test
[2] The choice of probe can limit system performance. Select a probe rated at 600 Mb/s or greater to maintain system bandwidth.
[3] Sample positions are independently adjustable for each data channel input. A negative sample position causes the input to be synchronously sampled by that amount before
each active clock edge. A positive sample position causes the input to be synchronously sampled by that amount after each active clock edge. A sampling position of zero
causes the input to be synchronously sampled coincident with each clock edge.
[4] Use of eye finder is recommended in 600 Mb/s mode
[5] With time or state tags on and all pods assigned, memory depth is half the maximum memory depth. With time or state tags on and one pod (34 channels) unassigned, the
memory depth is full.
[6] Independent analyzers may be either state or timing. When the 600 Mb/s state mode is selected, only one analyzer may be used.
[7] In the 300 Mb/s state mode, the total number of clocks and qualifiers is 4. All clock and qualifier inputs must be on the master module.
[8] Tested with input signal Vh = 0.9 V, Vl = -1.7 V, slew rate = 1 V/ns, threshold = -1.3 V
[9] Calculated from rise time
Items marked with an asterisk * are specifications. All others are characteristics.
"Typical" represents the average or median value of the parameter based on measurements from a significant number of units.
99

State/Timing Modules Specifications and
Characteristics
Agilent 16753A, 16754A, 16755A, 16756A
Supplemental Specifications* and Characteristics (continued)
Timing (asynchronous) analysis mode

Conventional timing

Transitional timing

Sample rate on all channels

600 MHz

600 MHz

Sample rate in half channel mode

1200 MHz

N/A

Number of channels

68 x (number of modules)

For sample rates <600 MHz:
68 x (number of modules)
For 600 MHz sample rate:
68 x (number of modules) - 34

Maximum channels on a single time base and trigger 340

340

Number of independent analyzers [6]

2

2

Sample period (half channel)

833 ps

N/A

Sample period (full channel)

1.67 ns

1.67 ns

Minimum data pulse width

1 sample period + 500 ps

1 sample period + 500 ps

Time interval accuracy

+/- (1 sample period + 1.25 ns +
0.01% of time interval reading)

+/- (1 sample period + 1.25 ns +
0.01% of time interval reading)

Memory depth in full channel mode

16753A: 1 M
16754A: 4 M
16755A: 16 M
16756A: 64 M

16753A: 1 M
16754A: 4 M
16755A: 16 M
16756A: 64 M

Memory depth in half channel mode

16753A: 2 M
16754A: 8 M
16755A: 32 M
16756A: 128 M

N/A

Maximum trigger sequence speed

300 MHz

300 MHz

Maximum trigger sequence levels

16

16

Trigger sequence level branching

Arbitrary 4-way "IF/THEN/ELSE"

Arbitrary 4-way "IF/THEN/ELSE"

Trigger position

Start, center, end, or user -defined

Start, center, end, or user -defined

[1] Minimum eye width in system under test
[2] The choice of probe can limit system performance. Select a probe rated at 600 Mb/s or greater to maintain system bandwidth.
[3] Sample positions are independently adjustable for each data channel input. A negative sample position causes the input to be synchronously sampled by that amount before
each active clock edge. A positive sample position causes the input to be synchronously sampled by that amount after each active clock edge. A sampling position of zero
causes the input to be synchronously sampled coincident with each clock edge.
[4] Use of eye finder is recommended in 600 Mb/s mode
[5] With time or state tags on and all pods assigned, memory depth is half the maximum memory depth. With time or state tags on and one pod (34 channels) unassigned, the
memory depth is full.
[6] Independent analyzers may be either state or timing. When the 600 Mb/s state mode is selected, only one analyzer may be used.
[7] In the 300 Mb/s state mode, the total number of clocks and qualifiers is 4. All clock and qualifier inputs must be on the master module.
[8] Tested with input signal Vh = 0.9 V, Vl = -1.7 V, slew rate = 1 V/ns, threshold = -1.3 V
[9] Calculated from rise time
Items marked with an asterisk * are specifications. All others are characteristics.
"Typical" represents the average or median value of the parameter based on measurements from a significant number of units.

100

State/Timing Modules Specifications and
Characteristics
Agilent 16753A, 16754A, 16755A, 16756A
Supplemental Specifications* and Characteristics (continued)
Timing (asynchronous) analysis mode

Conventional timing

Transitional timing

Trigger resources

16 patterns evaluated as =, =/, >, >=, <, <=
14 double-bounded ranges evaluated as in range,
not in range
3 edge/glitch — per pod pair
2 timers per module
2 global counters
1 occurrence counter per sequence level
4 flags

16 patterns evaluated as =, =/, >, >=, <, <=
14 double-bounded ranges evaluated as in range,
not in range
3 edge/glitch — per pod pair
2 timers per module
2 global counters
1 occurrence counter per sequence level
4 flags

Trigger resource conditions

Arbitrary Boolean combinations

Arbitrary Boolean combinations

Trigger actions

Goto
Trigger and fill memory
Trigger and Goto
Turn on/off default storing
Timer start/stop/pause/resume
Global counter increment/decrement/reset
Occurrence counter reset
Flag set/clear

Goto
Trigger and fill memory
Trigger and Goto
Turn on/off default storing
Timer start/stop/pause/resume
Global counter increment/decrement/reset
Occurrence counter reset
Flag set/clear

Maximum global counter

2E+24

2E+24

Maximum occurrence counter

2E+24

2E+24

Maximum pattern/range width

32 bits

32 bits

Timer value range

40 ns to 2199 seconds

40 ns to 2199 seconds

Timer resolution

2 ns

2 ns

Timer accuracy

+/- (5 ns +0.01%)

+/- (5 ns +0.01%)

Greater than duration

3.33 ns to 55 ms in 3.3 ns increments

3.33 ns to 55 ms in 3.3 ns increments

Less that duration

6.67 ns to 55 ms in 3.3 ns increments

6.67 ns to 55 ms in 3.3 ns increments

Timer reset latency

40 ns

40 ns

[1] Minimum eye width in system under test
[2] The choice of probe can limit system performance. Select a probe rated at 600 Mb/s or greater to maintain system bandwidth.
[3] Sample positions are independently adjustable for each data channel input. A negative sample position causes the input to be synchronously sampled by that amount before
each active clock edge. A positive sample position causes the input to be synchronously sampled by that amount after each active clock edge. A sampling position of zero
causes the input to be synchronously sampled coincident with each clock edge.
[4] Use of eye finder is recommended in 600 Mb/s mode
[5] With time or state tags on and all pods assigned, memory depth is half the maximum memory depth. With time or state tags on and one pod (34 channels) unassigned, the
memory depth is full.
[6] Independent analyzers may be either state or timing. When the 600 Mb/s state mode is selected, only one analyzer may be used.
[7] In the 300 Mb/s state mode, the total number of clocks and qualifiers is 4. All clock and qualifier inputs must be on the master module.
[8] Tested with input signal Vh = 0.9 V, Vl = -1.7 V, slew rate = 1 V/ns, threshold = -1.3 V
[9] Calculated from rise time
Items marked with an asterisk * are specifications. All others are characteristics.
"Typical" represents the average or median value of the parameter based on measurements from a significant number of units.

101

State/Timing Modules Specifications and
Characteristics
Agilent 16753A, 16754A, 16755A, 16756A
Supplemental Specifications* and Characteristics (continued)
Eye scan mode
Equivalent rise time

150 ps

Equivalent bandwidth [9]

2.33 GHz

Sample position range relative to clock

-5 ns to +5 ns

Sample (time) position resolution

10 ps

Sample (time) position accuracy

+/- (50 ps + 0.01 * sample position)

Number of channels

68 * (number of modules) - 1

Input dynamic range

-3.0 Vdc to +5.0 Vdc

Threshold range

-3.0 Vdc to +5.0 Vdc

Threshold resolution

1 mV

Threshold accuracy

+/- (30 mV + 2% of setting)

Minimum detectable pulse width at
minimum signal amplitude

600 ps

Jitter

40 ps RMS

Noise floor

40 mV p-p

Channel-to-channel skew,
maximum between any two channels

100 ps

[1] Minimum eye width in system under test
[2] The choice of probe can limit system performance. Select a probe rated at 600 Mb/s or greater to maintain system bandwidth.
[3] Sample positions are independently adjustable for each data channel input. A negative sample position causes the input to be synchronously sampled by that amount before
each active clock edge. A positive sample position causes the input to be synchronously sampled by that amount after each active clock edge. A sampling position of zero
causes the input to be synchronously sampled coincident with each clock edge.
[4] Use of eye finder is recommended in 600 Mb/s mode
[5] With time or state tags on and all pods assigned, memory depth is half the maximum memory depth. With time or state tags on and one pod (34 channels) unassigned, the
memory depth is full.
[6] Independent analyzers may be either state or timing. When the 600 Mb/s state mode is selected, only one analyzer may be used.
[7] In the 300 Mb/s state mode, the total number of clocks and qualifiers is 4. All clock and qualifier inputs must be on the master module.
[8] Tested with input signal Vh = 0.9 V, Vl = -1.7 V, slew rate = 1 V/ns, threshold = -1.3 V
[9] Calculated from rise time
Items marked with an asterisk * are specifications. All others are characteristics.
"Typical" represents the average or median value of the parameter based on measurements from a significant number of units.

102

State/Timing Modules Specifications and
Characteristics
Agilent Technologies 16760A
Supplemental Specifications* and Characteristics (continued)
Synchronous Data Sampling

tWidth
Figure 6.15. Data Sampling.

Individual
Data Channel

vHeight

Data Eye

tSetup tHold

vThreshold*
—0V—

Sampling
Position

*User Adjustable

tSample*

Clock Channel

Note (1)

Specifications for Each Input
Parameter

Minimum

Description/Notes

800, 1250, 1500 Mb/s modes

200, 400 Mb/s modes

Data
tWidth
to Clock tSetup
tHold

500 ps
250 ps
250 ps

1.25 ns
625 ps
625 ps

Eye width in system under test [2]
Data setup time required before tSample
Data hold time required after tSample

All
Inputs

100mV
250 mV

100mV
250 mV

300mV

300mV

E5379A 100-pin differential probe [3]
E5378A 100-pin single-ended probe [4],
E5382A single-ended flying-lead probe set
E5380A 38-pin single-ended probe

vHeight [1]

User Adjustable Settings for Each Input
Parameter

Adjustment Range

1500 Mb/s mode

1250 Mb/s mode

800 Mb/s mode

400 Mb/s mode

200 Mb/s mode

Data
to Clock

Adjustment Resolution
tSample [5]

10 ps
0 to +4 ns

10 ps
-2.5 to +2.5 ns

10 ps
-2.5 to +2.5 ns

100 ps
-3.2 to +3.2 ns

100 ps
-3.5 to +3 ns

All
Inputs

vThreshold [6]

10 mV resolution
-3 to +5 V

10 mV resolution
-3 to +5 V

10 mV resolution
-3 to +5 V

10 mV resolution
-3 to +5 V

10 mV resolution
-3 to +5 V

* All specifications noted by an asterisk in the table are the performance standards against which the product is tested.
[1] The analyzer can be configured to sample on the rising edge, the falling edge, or both edges of the clock. If both edges are used with a single ended clock input, take care to set the
clock threshold accurately to avoid phase error.
[2] Eye width and height are specified at the probe tip. Eye width as measured by eye finder in the analyzer may be less, and still sample reliably.
[3] For each side of a differential signal.

pSignal
nSignal

vHeight

vHeight

⌺

——0V——

2X vHeight

[4] The clock inputs in the E5378A and the E5382A may be connected differentially or single ended. Use the E5379A vHeight spec for clock channel(s) connected differentially.
[5] Sample positions are independently adjustable for each data channel input. A negative sample position causes the input to be synchronously sampled by that amount before each
active clock edge. A positive sample position causes the input to be synchronously sampled by that amount after each active clock edge. A sampling position of zero causes synchronous sampling coincident with each active clock edge.
[6] Threshold applies to single-ended input signals. Thresholds are independently adjustable for the clock input of each pod and for each set of 16 data inputs for each pod. Threshold limits apply to both the internal reference and to the external reference input on the E5378A.
103

State/Timing Modules Specifications and
Characteristics
Agilent Technologies 16760A
Supplemental Specifications* and Characteristics (continued)
Synchronous state analysis
Maximum data rate
on each channel [3]

1.5 Gb/s mode
1.5 Gb/s

1.25 Gb/s mode

800 Mb/s mode

400 Mb/s mode

200 Mb/s mode

1.25 Gb/s

800 Mb/s

400 Mb/s

200 Mb/s

Minimum clock interval,
active edge to active edge* [3]

667 ps

800 ps

1.25 ns

2.5 ns

5 ns

Minimum state clock pulse
width with clock polarity
rising or falling [3]

N/A

N/A

600 ps

1.5 ns

1.5 ns

Clock periodicity

Clock must be periodic

Clock must be periodic

Periodic or aperiodic

Periodic or aperiodic

Periodic or aperiodic

Number of clocks

1

1

1

1

1

Clock polarity

Both edges

Both edges

Rising, falling, or both

Rising, falling, or both

Rising, falling, or both

Minimum data pulse width*

600 ps

750 ps

E5378A, E5379A, E5382A
probes: 750 ps
E5380A probe: 1.5 ns

1.5 ns

1.5 ns

• With time tags

16 x (number of modules) -8

16 x (number of modules) -8

34 x (number of modules) -16

34 x (number of modules) -16

34 x (number of modules)

• Without time tags

16 x (number of modules)

16 x (number of modules)

34 x (number of modules) -1

34 x (number of modules)

34 x (number of modules)

Maximum channels on a
single time base and trigger

80 (5 modules)

80 (5 modules)

170 (5 modules)

153 (5 modules)

170 (5 modules)

Maximum memory depth

128M samples

128M samples

64M samples

32M samples

32M samples

Time tag resolution

4 ns [2]

4 ns [2]

4 ns [2]

4 ns [2]

4 ns

Maximum time count
between states

17 seconds

17 seconds

17 seconds

17 seconds

17 seconds

Trigger resources

3 Patterns on each pod
evaluated as =, ≠, >, <,
≥, ≤ on one pod; or
evaluated as =, ≠ across
multiple pods; or
1 range on each pod
4 Flags
Arm in

3 Patterns on each pod
evaluated as =, ≠, >, <,
≥, ≤ on one pod; or
evaluated as =, ≠ across
multiple pods; or
1 range on each pod
4 Flags
Arm in

4 Patterns on each pod
evaluated as =, ≠, >, <,
≥, ≤ on one pod; or
evaluated as =, ≠ across
multiple pods; or
2 ranges on each pod
4 Flags
Arm in

8 Patterns evaluated as
=, ≠, >, <, ≥, ≤
4 Ranges evaluated as
in range, not in range
2 Occurrence counters
4 Flags
Arm in

16 Patterns evaluated as
=, ≠, >, <, ≥, ≤
15 Ranges evaluated as
in range, not in range
Timers: 2 x (number of
modules) – 1
2 Global counters
1 Occurrence counter per
sequence level
4 Flags
Arm in

Trigger actions

Trigger and fill memory

Trigger and fill memory

Trigger and fill memory

Goto
Trigger and fill memory

Goto
Trigger and fill memory
Trigger and goto
Store/don’t store sample
Turn default storing on/off
Timer start/stop/pause/resume
Global counter increment/reset
Occurrence counter reset
Flag set/clear

Number of channels [1]

* All specifications noted by an asterisk are the performance standards against which the product is tested.
[1] In 1.25 Gb/s and 1.5 Gb/s modes, only the even-numbered channels (0, 2, 4, etc.) are acquired.
[2] The resolution of the hardware used to assign time tags is 4 ns. Times of intermediate states are calculated.
[3] The choice of probe can limit system performance. Select a probe rated at the speed of the selected mode (or greater) to maintain system bandwidth.

104

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16760A
Supplemental Specifications and Characteristics (continued)
Synchronous state
analysis (continued) [4]

1.5 Gb/s mode

1.25 Gb/s mode

800 Mb/s mode

400 Mb/s mode

200 Mb/s mode

Maximum trigger
sequence levels

2

2

4

16

16

Maximum trigger
sequencer speed

1.5 Gb/s

1.25 Gb/s

800 MHz

400 MHz

200 MHz

Store qualification

Default

Default

Default

Default

Default and per
sequence level

Maximum global counter

N/A

N/A

N/A

N/A

16,777,215

Maximum occurrence
counter

N/A

N/A

N/A

N/A

16,777,215

Maximum pattern/range
term width

32 bits [3]

32 bits [3]

32 bits [3]

32 bits [3]

32 bits [3]

Timer value range

N/A

N/A

N/A

N/A

100 ns to 4397 seconds

Timer resolution

N/A

N/A

N/A

N/A

4 ns

Timer accuracy

N/A

N/A

N/A

N/A

±(10 ns + 0.01% of value)

Timer reset latency

N/A

N/A

N/A

N/A

65 ns

Data in to BNC port out
latency

150 ns

150 ns

150 ns

150 ns

150 ns

Flag set/reset to evaluation
latency

N/A

N/A

N/A

N/A

110 ns

[1] In 1.25 Gb/s and 1.5 Gb/s modes, only the even-numbered channels (0, 2, 4, etc.) are acquired.
[2] The resolution of the hardware used to assign time tags is 4 ns. Times of intermediate states are calculated.
[3] Maximum label width is 32 bits. Wider patterns can be created by “Anding” multiple labels together.
[4] The choice of probe can limit system performance. Select a probe rated at the speed of the selected mode (or greater) to maintain system bandwidth.

Asynchronous Timing Analysis

Conventional Timing Analysis

Transitional Timing Analysis

Maximum timing analysis sample rate

800 MHz

400 MHz

Number of channels

34 x (number of modules)

Sampling rates < 400 MHz: 34 x (number of modules)
Sampling rates = 400 MHz:
34 x (number of modules) - 17 [1]

Maximum channels on a
single time base and trigger

170 (5 modules)

170 (5 modules)

Sample period

1.25 ns

2.5 ns to 1 ms [1]

Memory Depth

64 M Samples

32 M Samples [1]

[1] With all pods assigned in transitional/store qualified timing, minimum sample period is 5 ns and maximum memory depth is 16 M samples.

105

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16760A
Supplemental Specifications and Characteristics (continued)
Asynchronous Timing Analysis
(continued)

Conventional Timing Analysis

Transitional Timing Analysis

Sample period accuracy

±(250 ps + 0.01% of sample period)

±(250 ps + 0.01% of sample period)

Channel-to-channel skew

< 1.5 ns

< 1.5 ns

Time interval accuracy

±[sample period + (channel-to-channel skew) +
(0.01% of time interval)]

±[sample period + (channel-to-channel skew) +
(0.01% of time interval)]

Minimum data pulse width

1.5 ns for data capture
5.1 ns for trigger sequencing

3.8 ns for data capture
5.1 ns for trigger sequencing

Maximum trigger sequencer speed

200 MHz

200 MHz

Trigger resources

16 Patterns evaluated as =, ≠, >, <, ≥, ≤
15 Ranges evaluated as in range, not in range
2 Edge/glitch
(2 Timers per module) -1
2 Global counters
1 Occurrence counter per sequence level
4 Flags, Arm In

16 Patterns evaluated as =, ≠, >, <, ≥, ≤
15 Ranges evaluated as in range, not in range
2 Edge/glitch
(2 Timers per module) -1
2 Global counters
1 Occurrence counter per sequence level
4 Flags, Arm In

Trigger resource conditions

Arbitrary Boolean combinations

Arbitrary Boolean combinations

Trigger actions

Goto
Trigger and fill memory
Trigger and goto
Timer start/stop/pause/resume
Global counter increment/reset
Occurrence counter reset

Goto
Trigger and fill memory
Trigger and goto
Timer/start/stop/pause/resume
Global counter increment/reset
Occurrence counter reset

Maximum global counter

16,777,215

16,777,215

Maximum occurrence counter

16,777,215

16,777,215

Timer value range

100 ns to 4397 seconds

100 ns to 4397 seconds

Timer resolution

4 ns

4 ns

Timer accuracy

±(10 ns + 0.01%)

±(10 ns + 0.01%)

Greater than duration

5 ns to 83 ms in 5 ns increments

5 ns to 83 ms in 5 ns increments

Less than duration

10 ns to 83 ms in 5 ns increments

10 ns to 83 ms in 5 ns increments

Timer reset latency

60 ns

60 ns

Data in to BNC port out delay latency

150 ns

150 ns

Flag set/reset to evaluation latency

110 ns

110 ns

Environmental
Operating temperature
106

0 deg C to 45 deg C

State/Timing Modules Specifications and
Characteristics

Agilent Technologies 16760A
Supplemental Specifications and Characteristics (continued)
Eye scan mode

1.5 Gb/s mode

800 Mb/s mode

Maximum clock rate

1.5 Gb/s

800 Mb/s

Sample position range relative
to clock

+5ns to 10 ns

-4 ns to +4 ns

Sample (time) position resolution

12 ps

12 ps

Sample position (time) accuracy

+/- (50 ps + 0.01 * sample position)

+/- (50 ps + 0.01 * sample position)

Number of channels

16*(number of modules)

34*(number of modules)-1

Input dynamic range

-3.0 Vdc to +5.0 Vdc

-3.0 Vdc to +5.0 Vdc

Threshold range

-3.0 Vdc to +5.0 Vdc

-3.0 Vdc to +5.0 Vdc

Threshold resolution

1 mV

1 mV

Threshold accuracy

+/-(30 mV + 1% of setting)

+/-(30 mV + 1% of setting)

Equivalent rise time [1]

150 ps

150 ps

Equivalent bandwidth [1]

2.33 GHz

2.33 GHz

Minimum detectable pulse width
at minimum signal amplitude [1]

500 ps

750 ps

Jitter

10 ps RMS

10 ps RMS

Noise floor

25 mV p-p

25 mV p-p

Channel-to-channel skew, maximum
between any two channels

100 ps

100 ps

[1] E5378A, E5379A, and E5382A probes only.

Qualified eye scan mode

Channels available

Timing

In the qualified eye scan mode, a
single qualifier input defines what
clock cycles are to be acquired and
what cycles are to be ignored in eye
scan acquisition.

The following channels are not
available for qualified eye scan
measurements.

The analyzer samples the qualification signal at the beginning of each
clock cycle (i.e. at the first of each
pair of data transfers). The analyzer
can be configured to treat either the
rising edge or the falling edge of the
clock as the first edge of each clock
cycle. The qualifier should remain
stable for the entire duration of
each burst.

Qualified eye scan is supported in
the 16760A in 800 Mb/s eye scan
mode only. Qualified eye scan is
only available for double-edged clock
(double-data-rate).

Master module, Pod 1
Master module, Pod 2, Bit 0, Bit 14,
Bit 1, Bit 15, Bit 2, K-clock
(the qualifier input itself).
All channels on all boards other than
the master board are available for
qualified eye scans.

The qualifier must be pipelined
(delayed) by one clock cycle before
transmittal to the analyzer.
107

Oscilloscope Modules Specifications and
Characteristics

16534A Specifications*

Bandwidth

dc to 500 MHz

dc offset accuracy

±(1% of offset + 2% of full scale)

dc voltage measurement accuracy

±(1.5% of full scale + offset accuracy)

Time interval measurement
accuracy at maximum sampling rate,
on a single scope card, on a single
acquisition

±[(0.005% of D T) + (2E–6 x delay setting) + 100 ps]

Trigger sensitivity (See notes)
• dc to 50 MHz
• 50 MHz to 500 MHz

• 0.06 full scale
• 0.13 full scale

Input resistance

1 MΩ ±1%

50 Ω ±1%

* Specifications refer to the input to the BNC connector
Notes:
• Specifications apply only within ± 10° C of the temperature at which the most recent calibration was performed.
• Specifications apply only after operational accuracy calibration is performed in the frame in which the
oscilloscope module is installed.
• Display magnification is used below 56 mV full scale. For sensitivities from 16 mV to 56 mV full scale, full scale is
defined as 56 mV.

Characteristics
General
Maximum sampling rate

2 GSa/s

Number of channels

• 2 to 8 using the same
time base and trigger.
• Up to 10 channels may be installed in a single
16700 frame, or up to 20 in a single system using a
16701 expansion frame.

Waveform record length

32768 points

108

Oscilloscope Modules Specifications and
Characteristics

16534A Characteristics*
Vertical (Voltage)
Vertical sensitivity range

16 mV full scale to 40 V full scale

Vertical resolution

8 bits full scale

Rise time (calculated from bandwidth)

700 ps

dc gain accuracy

±(1.25% of full scale + 0.08% per °C difference from
calibration temperature)

dc offset range
Vertical sensitivity
• 16 mV full scale to 400 mV full scale
• 400 mV full scale to 2.0 V full scale
• 2.0 V full scale to 10 V full scale
• 10 V full scale to 40 V full scale

Offset range
• ±2 V
• ±10 V
• ±50 V
• ±250 V

Probe attenuation

Any ratio from 1:1E-9 to 1:1E+6

Channel-to-channel isolation (with channel sensitivities equal)
• dc–50 MHz
• 40 dB
• 50 MHz–500 MHz
• 30 dB
Maximum safe input voltage
• 1 MΩ
• 50 Ω

• ±250 V dc + peak ac (<10 kHz)
• 5 Vrms

* Characteristics refer to the input at the BNC connector

109

Oscilloscope Modules Specifications and
Characteristics

16534A Characteristics
Horizontal (Time)
Time base ranges

0.5 ns/div to 5 s/div

Time base resolution

10 ps

Delay range
• pretrigger
• posttrigger

• -32 K x sample period
• 320 ms or 1.6E7 x sample period, whichever is greater

Time interval measurement accuracy
for sampling rates other than maximum,
for bandwidth-limited signals [signal
rise time > 1.4/(sampling rate)], on a
single card, on a single acquisition

±{(0.005% of ∆ T) + (2E–6 x delay setting)
+ [0.15/(sample rate)]}

Time interval measurement accuracy
for 2, 3, or 4 Agilent 16533As or 16534As
operating on a single time base, for
measurements made between channels
on different cards, at maximum
sampling rate

± [(0.005% of ∆T) + (2E–6 x delay setting) + 300 ps

Trigger
Trigger level range (See notes)
Trigger modes
• Immediate
• Edge
• Pattern
• Auto condition
• Events delay
• Intermodule

±1.5 x full scale from center of screen

• Triggers immediately after arming condition is met
• Triggers on rising or falling edge on channel 1 or
channel 2
• Triggers on entering or exiting a specified pattern
across both channels
• Self-triggers if trigger is not satisfied within
approximately 50 ms after arming
• The trigger can be set to occur on the nth occurrence
of an edge or pattern, n ≤ 32000
• Arms another measurement module or activates the
port out BNC connector when the trigger condition is
met

Notes:
• Specifications apply only within ± 10° C of the temperature at which the most recent calibration was performed.
• Specifications apply only after operational accuracy calibration is performed in the frame in which the
oscilloscope module is installed.
• Display magnification is used below 56 mV full scale. For sensitivities from 16 mV to 56 mV full scale, full scale is
defined as 56 mV.

110

Pattern Generation Modules Specifications
and Characteristics

16720A Pattern Generator Characteristics
Maximum memory depth

16 MVectors

Number of output channels at ≤ 300 MHz clock

24

Number of output channels at ≤ 180 MHz clock

48

Number of output channels at ≤ 200 MHz clock

24

Number of output channels at ≤ 100 MHz clock

48

Number of different macros

100

Maximum number of lines in a macro

1024

Maximum number of parameters in a macro

10

Maximum number of macro invocations

1000

Maximum loop count in a repeat loop

20000

Maximum number of repeat loop invocations

1000

Maximum number of "Wait" event patterns

4

Number of input lines to define a pattern

3

Maximum number of modules in a system

5

Maximum width of a vector (in a 5 module system)

240 bits

Maximum width of a label

32 bits

Maximum number of labels

126

Maximum number of vectors in binary format

16 MVectors

Minimum number of vectors in binary format

4096

Lead Set Characteristics
Agilent 10474A 8-channel
probe lead set

Provides most cost effective lead set for the 16522A and
16720A clock and data pods. Grabbers are not included.
Lead wire length is 12 inches.

Agilent 10347A 8-channel
probe lead set

Provides 50 Ω coaxial lead set for unterminated signals,
required for 10465A ECL Data Pod (unterminated).
Grabbers are not included.

Agilent 10498A 8-channel
probe lead set

Provides most cost effective lead set for the 16522A and
16720A clock and data pods. Grabbers are not included.
Lead wire length is 6 inches.

111

Pattern Generation Modules Specifications
and Characteristics

Data Pod Characteristics
Note: Data Pod output parametrics depend on the output driver and the impedance load of the target
system. Check the device data book for the specific drivers listed for each pod.

Agilent 10461A TTL Data Pod
Output type

10H125 with 100 Ω series

Maximum clock

200 MHz

Skew [1]

typical < 2 ns; worst case = 4 ns

Recommended lead set

Agilent 10474A

ECL/TTL
10H125

100 Ω

Agilent 10462A 3-State TTL/CMOS Data Pod
Output type

74ACT11244 with 100 Ω series; 10H125 on non 3-state channel 7 [2]

3-state enable

negative true, 100 KΩ to GND, enabled on no connect

Maximum clock

100 MHz

Skew [1]

typical < 4 ns; worst case = 12 ns

Recommended lead set

Agilent 10474A

74ACT11244

100 Ω

Agilent 10464A ECL Data Pod (terminated)
Output type

10H115 with 330 Ω pulldown, 47 Ω series

Maximum clock

300 MHz

Skew [1]

typical < 1 ns; worst case = 2 ns

Recommended lead set

Agilent 10474A

42 Ω
10H115
348 Ω
– 5.2 V
112

Pattern Generation Modules Specifications
and Characteristics

Agilent 10465A ECL Data Pod (unterminated)
Output type

10H115 (no termination)

Maximum clock

300 MHz

Skew [1]

typical < 1 ns; worst case = 2 ns

Recommended lead set

Agilent 10347A

10H115

Agilent 10466A 3-State TTL/3.3 volt Data Pod
Output type

74LVT244 with 100 Ω series; 10H125 on non 3-state channel 7 [2]

3-state enable

negative true, 100 KΩ to GND, enabled on no connect

Maximum clock

200 MHz

Skew [1]

typical < 3 ns; worst case = 7 ns

Recommended lead set

Agilent 10474A

100 Ω
74LVT244

[1] Typical skew measurements made at pod connector with approximately 10 pF/50 KΩ load to GND; worst case
skew numbers are a calculation of worst case conditions through circuits. Both numbers apply to any channel
within a single or multiple module system.
[2] Channel 7 on the 3-state pods has been brought out in parallel as a non 3-state signal. By looping this output back
into the 3-state enable line, the channel can be used as a 3-state enable.

113

Pattern Generation Modules Specifications
and Characteristics

Agilent 10469A 5 volt PECL Data Pod
Output type

100EL90 (5V) with 348 ohm pulldown to ground and 42 ohm in series

Maximum clock

300 MHz

Skew [1]

typical < 500 ps; worst case = 1 ns

Recommended lead set

Agilent 10498A

42 Ω

100EL90
348 Ω

Agilent 10471A 3.3 volt LVPECL Data Pod
Output type

100LVEL90 (3.3V) with 215 ohm pulldown to ground and
42 ohm in series

Maximum clock

300 MHz

Skew [1]

typical < 500 ps; worst case = 1 ns

Recommended lead set

Agilent 10498A

42 Ω

100LVEL90
215 Ω

Agilent 10473A 3-State 2.5 Volt Data Pod
Output type

74AVC16244

3-state enable

negative true, 38 KΩ to GND, enabled on no connect

Maximum clock

300 MHz

Skew [1]

typical < 1.5 ns; worst case = 2 ns

Recommended lead set

Agilent 10498A

74AVC16244

[1] Typical skew measurements made at pod connector with approximately 10 pF/50 KΩ load to GND; worst case
skew numbers are a calculation of worst case conditions through circuits. Both numbers apply to any channel
within a single or multiple module system.
[2] Channel 7 on the 3-state pods has been brought out in parallel as a non 3-state signal. By looping this output back
into the 3-state enable line, the channel can be used as a 3-state enable.
114

Pattern Generation Modules Specifications
and Characteristics

Agilent 10476A 3-State 1.8 Volt Data Pod
Output type

74AVC16244

3-state enable

negative true, 38 KΩ to GND, enabled on no connect

Maximum clock

300 MHz

Skew [1]

typical < 1.5 ns; worst case = 2 ns

Recommended lead set

Agilent 10498A

74AVC16244
Agilent 10483A 3-State 3.3 Volt Data Pod
Output type

74AVC16244

3-state enable

negative true, 38 KΩ to GND, enabled on no connect

Maximum clock

300 MHz

Skew [1]

typical < 1.5 ns; worst case = 2 ns

Recommended lead set

Agilent 10498A

74AVC16244
Agilent E8141A LVDS Data Pod
Output type

65LVDS389 (LVDS data lines)
10H125 (TTL non-3-state channel 7)

3-state enable

positive true TTL; no connect=enabled

Maximum clock

300 MHz

Skew

typical < 1 ns; worst case = 2 ns

Recommended lead set:

E8142A

Recommended lead set

Agilent 10498A

65LVDS389
ENABLE

°

LVDS DATA OUT

10 KΩ
3.3 V

3-STATE IN TTL

[1] Typical skew measurements made at pod connector with approximately 10 pF/50 KΩ load to GND; worst case
skew numbers are a calculation of worst case conditions through circuits. Both numbers apply to any channel
within a single or multiple module system.

115

Pattern Generation Modules Specifications
and Characteristics

Data Cable Characteristics Without a Data Pod

The Agilent 16720A and 16522A data cables without a data pod provide an ECL terminated (1 KΩ to
–5.2V) differential signal (from a type 10E156 or 10E154 driver). These are usable when received by
a differential receiver, preferably with a 100 Ω termination across the lines. These signals should
not be used single ended due to the slow fall time and shifted voltage threshold (they are not ECL
compatible).

16720A

–3.25 V
470 Ω

10E156
or
10E154

Differential
Output

470 Ω

–3.25 V

16522A

–5.2 V

1 kΩ
10E156
or
10E154

Differential
Output

1 kΩ

–5.2 V

116

Pattern Generation Modules Specifications
and Characteristics

Clock Cable Characteristics Without a Clock Pod

The Agilent 16720A and 16522A clock cables without a clock pod provide an ECL terminated
(1 KΩ to –5.2V) differential signal (from a type 10E164 driver). These are usable when received by a
differential receiver, preferably with a 100 Ω termination across the lines. These signals should not be
used single ended due to the slow fall time and shifted voltage threshold (they are not ECL compatible).

7

10E116

100 Ω

Clock In
8

11, 13, 15

10H125

100 Ω

Wait 1, 2, 3 IN
12, 14, 16

–3.25 V
215 Ω

10E164

Clock Out

215 Ω

–3.25 V

117

Pattern Generation Modules Specifications
and Characteristics

Clock Pod Characteristics
10460A TTL Clock Pod
Clock output type

10H125 with 47 Ω series; true & inverted

Clock output rate

100 MHz maximum

Clock out delay

approximately 8 ns total in 14 steps (16720A
only); 11 ns maximum in 9 steps (16522A only)

Clock input type

TTL – 10H124

Clock input rate

dc to 100 MHz

Pattern input type

TTL – 10H124 (no connect is logic 1)

Clock-in to clock-out

approximately 30 ns

Pattern-in to recognition

approximately 15 ns + 1 clk period

Recommended lead set

Agilent 10474A

47Ω

CLKout

10H125

WAIT

10H124

CLKin

10463A ECL Clock Pod
Clock output type

10H116 differential unterminated; and differential with 330 Ω to –5.2V and 47 Ω series

Clock output rate

300 MHz maximum

Clock out delay

approximately 8 ns total in 14 steps (16720A
only); 11 ns maximum in 9 steps (16522A only)

Clock input type

ECL – 10H116 with 50 KΩ to –5.2v

Clock input rate

dc to 300 MHz

Pattern input type

ECL – 10H116 with 50 KΩ (no connect is
logic 0)

Clock-in to clock-out

approximately 30 ns

Pattern-in to recognition

approximately 15 ns + 1 clk period

Recommended lead set

Agilent 10474A

CLKin

10H116

50 kΩ

VBB

–5.2 V

–5.2 V
330 Ω
10H116

118

47 Ω

CLKout

Pattern Generation Modules Specifications
and Characteristics

10468A 5 volt PECL Clock Pod
Clock output type

100EL90 (5V) with 348 ohm pulldown to
ground and 42 ohm in series

Clock output rate

300 MHz maximum

Clock out delay

approximately 8 ns total in 14 steps (16720A
only); 11 ns maximum in 9 steps (16522A only)

Clock input type

100EL91 PECL (5V), no termination

Clock input rate

dc to 300 MHz

Pattern input type

100EL91 PECL (5V), no termination (no
connect is logic 0)

Clock-in to clock-out

approximately 30 ns

Pattern-in to recognition

approximately 15 ns + 1 clk period

Recommended lead set

Agilent 10498A

42 Ω

100EL90

CLKout

348 Ω

CLKin

100EL91

10470A 3.3 volt LVPECL Clock Pod
Clock output type

100LVEL90 (3.3V) with 215 ohm pulldown to
ground and 42 ohm in series

Clock output rate

300 MHz maximum

Clock out delay

approximately 8 ns total in 14 steps (16720A
only); 11 ns maximum in 9 steps (16522A only)

Clock input type

100LVEL91 LVPECL (3.3V), no termination

Clock input rate

dc to 300 MHz

Pattern input type

100LVEL91 LVPECL (3.3V), no termination
(no connect is logic 0)

Clock-in to clock-out

approximately 30 ns

Pattern-in to recognition

approximately 15 ns + 1 clk period

Recommended lead set

Agilent 10498A

42 Ω

100LVEL90

CLKout

215 Ω

100LVEL91

CLKin

119

Pattern Generation Modules Specifications
and Characteristics

10472A 2.5 volt Clock Pod
Clock output type

74AVC16244

Clock output rate

200 MHz maximum

Clock out delay

approximately 8 ns total in 14 steps (16720A
only); 11 ns maximum in 9 steps (16522A only)

Clock input type

74AVC16244 (3.6V max)

Clock input rate

dc to 200 MHz

Pattern input type

74AVC16244 (3.6V max; no connect is logic 0)

Clock-in to clock-out

approximately 30 ns

Pattern-in to recognition

approximately 15 ns + 1 clk period

Recommended lead set

Agilent 10498A

CLKout
74AVC16244

WAIT
74AVC16244

CLKin

10475A 1.8 volt Clock Pod
Clock output type

74AVC16244

Clock output rate

200 MHz maximum

Clock out delay

approximately 8 ns total in 14 steps (16720A
only); 11 ns maximum in 9 steps (16522A only)

Clock input type

74AVC16244 (3.6V max)

Clock input rate

dc to 200 MHz

Pattern input type

74AVC16244 (3.6V max; no connect is logic 0)

Clock-in to clock-out

approximately 30 ns

Pattern-in to recognition

approximately 15 ns + 1 clk period

Recommended lead set

Agilent 10498A

CLKout
74AVC16244

WAIT
74AVC16244

120

CLKin

Pattern Generation Modules Specifications
and Characteristics
10477A 3.3 volt Clock Pod
Clock output type

74AVC16244

Clock output rate

200 MHz maximum

Clock out delay

approximately 8 ns total in 14 steps (16720A
only); 11 ns maximum in 9 steps (16522A only)

Clock input type

74AVC16244 (3.6V max)

Clock input rate

dc to 200 MHz

Pattern input type

74AVC16244 (3.6V max; no connect is logic 0)

CLKout
74AVC16244

Clock-in to clock-out

approximately 30 ns

Pattern-in to recognition

approximately 15 ns + 1 clk period

Recommended lead set

Agilent 10498A

WAIT
74AVC16244

CLKin

E8140A LVDS Clock Pod
Clock output type

65LVDS179 (LVDS) and 10H125 (TTL)

Clock output rate

200 MHz maximum (LVDS and TTL)

Clock out delay

approximately 8 ns total in 14 steps

Clock input type

65LVDS179 (LVDS with 100 ohm)

Clock input rate

dc to 150 MHz (LVDS)

Pattern input type

10H124 (TTL) (no connect = logic 1)

Clock-in to clock-out

approximately 30 ns

Pattern-in to recognition

approximately 15 ns + 1 clk period

Recommended lead set

Agilent 10498A

10H125

CLK OUT TTL

65LBDS179

CLK OUT LVDS

°

CLK IN LVDS
65LVDS179

100 Ω

°
10H124

CLK IN LVDS

WAIT IN TTL

121

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Terms and Conditions
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and equipment brokers are excluded.
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or $100,000 (U.S. dollars) in tradein credit.
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exceed 100% of the cost of the eligible new product(s). Any credit in
excess of that amount may not be
applied toward a later purchase.
• Trade-in credit amounts and product eligibility are subject to change
at any time without advance
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122

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not eligible for purchase under
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interior, exterior, or performance
modifications.
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information.

Ordering Information

Mainframes and Mainframe Accessories
Product Number

Description

Includes

16700B

Modular mainframe with five measurement
module slots and one emulation or multiframe
module slot

•
•
•
•
•
•

16702B

Modular frame with built-in 800x600 LCD display
with touchscreen. Includes five measurement
slots and one emulation or multiframe
module slot

Same as 16700B plus:
• 12.1” touchscreen display
• Display knobs
• Dedicated hot keys

16701B

Expansion frame with five measurement module
slots and two emulation module slots. Requires a
16700A/B or 16702A/B

1 ft. and 3 ft. interface cables

1184A Testmobile

4 wheeled equipment cart specifically designed
to carry the 16700 Series logic analyzer,
expansion frame, and monitor

Drawer, keyboard tray, mouse tray, strap for
stabilizing monitor

One DIN keyboard
One three-button DIN mouse
One ten-conductor, flying lead cable for target control port
Training kit
One internal CD ROM drive
One internal 3.5" floppy drive

Mainframe Options
Option
Number

Description

16700B or
16702B

16701B

001

Add 17-inch 1280x1024 monitor

√

003

Performance option. Up to 256 MBytes total system
RAM, 4 MBytes total video RAM.

√
(256 MB)

008

External, auxiliary 18 GByte hard disk drive

√

009

Removable internal hard disk

√

012

Multiframe option

√

0B3

Add service guide

1CM

Add rack-mount kit (all but 16702B)

√

AXC

Equipment shelf (16702B only)

√

ABJ

Japanese localization

W17

Convert standard warranty to one year on-site warranty

√

√

W30

Extend standard warranty to three year return-to-Agilent warranty

√

√

W50

Extend standard warranty to five year return-to-Agilent warranty

√

√

√

123

Ordering Information

E5850A Logic Analyzer - Infiniium Oscilloscope Correlation Time Fixture
Product Number

Description

Includes

E5850A

Logic analyzer - Infiniium oscilloscope time
correlation fixture

All BNC cables needed to connect to logic analyzer and
oscilloscope

Agilent 1184A Testmobile
The Agilent 1184A testmobile gives
you a convenient means of organizing
and transporting your logic analysis
system mainframes and accessories.
The testmobile includes the following:
• Drawer for accessories (probes,
cables, power cords)

• Keyboard tray with adjustable tilt
and height
• Mouse extension on keyboard
tray for either right or left hand
operation
• Locking casters for stability on
uneven surfaces
• Strap to stabilize the monitor
• Load limits: Top tray: 68.2 kg
(150.0 lb.) Lower tray: 68.2 kg
(150.0 lb.) Total: 136.4 kg
(300.0 lb.)

Weight

Figure 7.1. Agilent 1184A testmobile cart.

1184A

Max Net
Max Shipping
48.0 kg (106.0 lb) 59.0 kg (130.0 lbs)

584.2
(23.0)

469.9
(18.5)

774.7
(30.5)

243.8
(9.6)

190.5
(7.5)

772.2
(30.4)

482.6
(19.0)

652.8
(25.7)

594.4
(23.4)
Dimensions: mm (inches)

Figure 7.2. Agilent 1184A testmobile cart dimensions.

124

866.1
(34.1)

254
(10.0)

116.8
(4.6)

Ordering Information

Measurement Module Compatibility Table
Measurement
Module Category

Model
Number

Description

State and Timing

16510A*
16510B*

16700
Series

16600A*
Series

16500C*

16500A/B*

25 MHz State; 100 MHz Timing; 1 K memory depth

√

√

35 MHz State; 100 MHz Timing; 1 K memory depth

√

√

16540A/16541A* 100 MHz State; 100 MHz Timing; 4 K memory depth

√

√

16540D/16541D* 100 MHz State; 100 MHz Timing; 16 K memory depth

√

√

16542A*

100 MHz State; 100 MHz Timing; 1 M memory depth

√

√

16550A*

100 MHz State; 500 MHz Timing; 4/8 K memory depth

√

√

√

√

16554A*

100 MHz State; 250 MHz Timing; 512 K/1 M memory depth

√

√

√

16555A/16555D* 110 MHz State; 500 MHz Timing; 2/4 M memory depth

√

√

√

16556A/16556D* 100 MHz State; 400 MHz Timing; 2/4 M memory depth

√

√

√

16557D*

140 MHz State; 500 MHz Timing; 2/4 M memory depth

√

√

√

16710A

100 MHz State; 500 MHz Timing; 8 K memory depth

√

√

16711A

100 MHz State; 500 MHz Timing; 32 K memory depth

√

√

16712A

100 MHz State; 500 MHz Timing; 128 K memory depth

√

√

16715A

167 MHz State; 667 MHz Timing; 2/4 M memory depth

√

16716A

167 MHz State; 667 MHz Timing; 2 GHz Timing Zoom;
512 K/1 M memory depth

√

16717A

333 MHz State; 667 MHz Timing; 2 GHz Timing Zoom;
2/4 M memory depth

√

16718A*

333 MHz State; 667 MHz Timing; 2 GHz Timing Zoom;
8/16 M memory depth

√

16719A*

333 MHz State; 667 MHz Timing; 2 GHz Timing Zoom;
32/64 M memory depth

√

16740A

200 MHz State; 800 MHz Timing; 2 GHz Timing Zoom
2/1 M memory depth

√

16741A

200 MHz State; 800 MHz Timing; 2 GHz Timing Zoom
8/4 M memory depth

√

16742A

200 MHz State; 800 MHz Timing; 2 GHz Timing Zoom
32/16 M memory depth

√

16750A/B

400 MHz State; 800 MHz Timing; 2 GHz Timing Zoom;
4/8 M memory depth

√

16751A/B

400 MHz State; 800 MHz Timing; 2 GHz Timing Zoom;
16/32 M memory depth

√

16752A/B

400 MHz State; 800 MHz Timing; 2 GHz Timing Zoom;
32/64 M memory depth

√

16753A

600 MHz State; 1200 MHz Timing; 4 GHz Timing Zoom;
1 M memory depth

√

* Discontinued products.
125

Ordering Information

Measurement Module Compatibility Table (continued)
Measurement
Module Category

Model
Number

Description

16700
Series

State and Timing
(continued)

16754A

600 MHz State; 1200 MHz Timing; 4 GHz Timing Zoom;
4 M memory depth

√

16755A

600 MHz State; 1200 MHz Timing; 4 GHz Timing Zoom;
16 M memory depth

√

16756A

600 MHz State; 1200 MHz Timing; 4 GHz Timing Zoom;
64 M memory depth

√

16760A

1.5 Gb/s State; 800 MHz Timing; 34 channel;
64 M memory depth

√

Oscilloscope

High Speed Timing

16500C*

16500A/B*

16530A/16531A* 2 Channel; 100 MHz Bandwidth; 400 MSa/s;
4 K memory depth

√

√

16532A*

2 Channel; 250 MHz Bandwidth; 1 GSa/s;
8 K memory depth

√

√

16533A*

2 Channel; 250 MHz Bandwidth; 1 GSa/s;
32 K memory depth

√

√

√

16534A

2 Channel; 500 MHz Bandwidth; 2 GSa/s;
32 K memory depth

√

√

√

16515A/16516A* 1 GHz Timing; 8 K memory depth
16517A/16518A* 4 GHz Timing; 1GHz Synchronous State;
64 K memory depth

Pattern Generator

Emulation

√

√

16520A/16521A* 50 MV/s; 4 K memory; 12 Channel
16522A*

200 MV/s; 258 K memory; 100 MHz in 40 Channel;
200 MHz in 20 Channel

√

16720A

300 MV/s; 180 MHz in 48 Channel, 16 MV memory;
300 MHz in 24 Channel, 8 MV memory

√

E5901A

Emulation Module Products

√

E5901B

Emulation Module Products

√

* Discontinued products.

126

16600
Series

√

√

√

√

√

√

√

√

√

Ordering Information
Options for Agilent 16700 Series State/Timing Modules
Agilent Module Product Numbers

Option

Option Description

16710A
16711A
16712A
16715A
16716A
16717A
16750A/B
16751A/B
16752A/B

0B3
1BP
W17

Add service manual
MIL-STD-45662A calibration with test data
Convert standard warranty to one-year on-site warranty

16760A
16753A
16754A
16755A
16756A

010
011
012
013
0B3
A6J
W17

add one E5378A, single-ended, 34-channel probe
add one E5379A, differential, 17-channel probe
add one E5380A, Mictor-compatible probe
add one E5382A, single-ended flying lead probe set
Add service manual
MIL-STD-45662A calibration with test data
Convert standard warranty to one-year on-site warranty

Agilent Wedge Probe Adapters
IC Leg Spacing

Number of
Signals

Quantity of
Probes Shipped

Probe Model
Number

0.5 mm

3

1

E2613A

0.5 mm

3

2

E2613B

0.5 mm

8

1

E2614A

0.5 mm

16

1

E2643A

0.65 mm

3

1

E2615A

0.65 mm

3

2

E2615B

0.65 mm

8

1

E2616A

0.65 mm

16

1

E26144A

Agilent Elastomeric Probing Solutions
Package Type

IC Leg Spacing

Probe Model Number

240-pin PQFP/CQFP

0.5 mm

E5363A Probe. E5371A 1/4 flexible cable

208-pin PQFP/CQFP

0.5 mm

E5374A Probe. E5371A 1/4 flexible cable

176-pin PQFP

0.5 mm

E5348A Probe. E5349A 1/4 flexible cable

160-pin QFP

0.5 mm

E5377A Probe. E5349A 1/4 flexible cable

160-pin PQFP/CQFP

0.65 mm

E5373A Probe. E5349A 1/4 flexible cable

144-pin PQFP/CQFP

0.65 mm

E5361A Probe. E5340A 1/4 flexible cable

144-pin TQFP

0.65 mm

E5336A Probe. E5340A 1/4 flexible cable

127

Ordering Information

Options and Accessories for Agilent 16534A Oscilloscope Modules
Agilent Option

Option Description

•
•
•
•
•
•
•
•

•
•
•
•
•
•
•
•

001
ABJ
0B0
1BP
0B3
0BF
W17
W03

Add one Agilent 1145A, dual, active 750 MHz probe
Japanese user's reference
Delete manuals
MIL-STD 45662A calibration with test data
Add service manual
Add programming manual set for a 16500 (not required for a 16700)
Convert standard warranty to one-year-on-site warranty
Convert standard warranty to 90-day-on-site warranty

Agilent Model Number

Accessory Description

1144A

800 MHz active probe (power for two Agilent 1144A active probes is provided by the
Agilent 16533A and 16534A) (requires 01144-61604 power splitter to operate two 1144As)

01144-61604

Power splitter. Allows operation of two Agilent 1144A active probes from one Agilent 16533A or 16534A

1145A

750-MHz dual, active probe (power for Agilent 1145A active probes is provided by the Agilent 16533A and 16534A)

1141A

200 MHz differential probe (requires an Agilent 1142A power supply)

1142A

Probe power supply

10442A

10:1, 500-ohm 1.2pF oscilloscope probe

10443A

20:1, 1000-ohm, 1.2pF oscilloscope probe

Options for Agilent 16720A Pattern Generator Modules
Agilent Option

Option Description

•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•

•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•

011
013
014
015
016
017
018
021
022
023
031
032
033
034
041
042
051
052
0B3
W17
W30
W50

128

TTL clock pod and 6” lead set (10460A and 10498A)
3-state TTL/CMOS data pod and 6” lead set (10462A and 10498A)
TTL data pod and 6” lead set (10461A and 10498A)
2.5 V clock pod and 6” lead set (10472A and 10498A)
2.5 V 3-state data pod and 6” lead set (10473A and 10498A)
3.3 V clock pod and 6” lead set (10477A and 10498A)
3-state TTL/3.3 V data pod and 6” lead set (10483A and 10498A)
ECL clock pod and 6” lead set (10463A and 10498A)
ECL terminated pod and 6” lead set (10464A and 10498A)
ECL unterminated pod and 50 Ω shield coaxial lead set (10465A and 10347A)
5 V PECL clock pod and 6” lead set (10468A and 10498A)
5 V PECL data pod and 6” lead set (10469A and 10498A)
3.3 V LVPECL clock pod and 6” lead set (10470A and 10498A)
3.3 V LVPECL data pod and 6” lead set (10471A and 10498A)
1.8 V clock pod and 6” lead set (10475 and 10498A)
1.8 V 3-state data pod and 6” lead set (10476 and 10498A)
LVDS clock pod and 6” LVDS lead set (E8140A and E8142A)
LVDS data pod and 6” LVDS lead set (E8141A and E8142A)
Add service manual
Convert to one-year on-site warranty
3 years return for repair service
5 years return for repair service

Ordering Information

Accessories for Agilent 16720A Pattern Generator Modules
Accessories
Model Number

Description

Accessories
Model Number

Description

10460A

TTL clock pod

10476A

3-state 1.8 volt data pod

10461A

TTL data pod

10477A

3.3 volt clock pod

10462A

3-state TTL/CMOS data pod

10483A

3-state TTL/3.3 volt data pod

10463A

10463A ECL clock pod

10498A

8-channel probe lead set, 6" long

10464A

ECL data pod (terminated)

10347A

8-channel 50-ohm shielded coaxial probe lead set

10465A

ECL data pod (unterminated)

5090-4356

Grabbers, surface mount, package of 20

10466A

3-state TTL/3.3V data pod

5959-0288

Grabbers, through hole, package of 20

10468A

5 volt PECL clock pod

10211A

IC probe clip, 24-pin dual in-line package

10469A

5 volt PECL data pod

10024A

IC probe clip, 16 pin dual in-line package

10470A

3.3 volt LVPECL clock pod

E2421A

SOIC clip adapter test kit (Pomona 5514)

10471A

3.3 volt LVPECL data pod

E2422A

Quad clip adapter test kit (Pomona 5515)

10472A

2.5 volt clock pod

E8140A

LVDS clock pod

10473A

3-state 2.5 volt data pod

E8141A

LVDS data pod

10474A

8-channel probe lead set, 12" long

E8142A

LVDS lead set

10475A

1.8 volt clock pod

Product Numbers and Option(s) for Agilent 16700 Series
Post-Processing Tool Sets
Product or Option Number

Description

B4600B
B4601B
B4605B
B4620B
B4640B

•
•
•
•
•

System Performance Analysis (SPA) Tool Set
Serial Analysis Tool Set
Tool Development Kit
Source Correlation Tool Set
Data Communications Tool Set

Available for all Tool Sets
#0D4

Do not install tool set (instructs factory to ship tool set
separately from any 16700 Series system on the order)

129

Third-Party Solutions

Our solutions partners offer a wide
array of accessory products for the
Agilent Technologies logic analysis
systems. Agilent's solution partners
offer complementary products covering probing clips, specialized analysis
probes for over 200 microprocessors,
and software tools for ASIC emulation and test system design.

Solutions Partner

Application Focus

Contact Information

Advanced Logic Design (ALD)

Product design services (digital)

www.ald.com

Aptix

ASIC emulation

www.aptix.com

JM Engineering (JME)

Probing (solutions for
SMT parts)

www.jmecorp.com

American Arium

Intel emulators and probes

www.arium.com

See the Processor and Bus Support
For Agilent Technologies Logic
Analyzers (p/n 5966-4365) document
for contact information concerning
these vendors.

Advanced RISC Machines
(ARM)

Microprocessor core IP

www.arm.com

CAD-UL

Software programming tools

www.cadul.com

Corelis

Analysis probes for various
microprocessors and buses

www.corelis.com

Diagonal

Manufacturing test suite
software

www.diagonal.com

Emulation Technologies (ET)

Probing

www.emulation.com

Europe Technologies

Embedded system design
tools and services

www.europe-technologies.com

FuturePlus Systems

Analysis probes for computer
buses

www.futureplus.com

Green Hills Software, Inc
(GHS)

Debugger and compiler
software for Motorola
microprocessors

www.ghs.com

Ironwood

High-density VLSI
interconnect solutions

www.ironwoodelectronics.com

Lital Electronics, Inc.

Mil-spec computer boards

www.lital.com

Microtec (Mentor Graphics
Embedded Software Division)

Debuggers and compilers

www.mentor.com/embedded

Pomona Electronics

Supplier of accessories for
electronic test instruments

www.pomonaelectronics.com

DIAB-SDS

Debuggers, compilers

www.diabsds.com

SynaptiCAD

Waveform simulation
analysis software

www.syncad.com

WindRiver

Embedded RTOS
development tools

www.windriver.com

130

Support, Warranty and Related Literature

Support and Services

Warranty

Agilent's support services complement your logic analysis system
to provide a complete solution to
your digital design and debug
problems. By taking advantage
of Agilent's expertise you can
concentrate on your particular
design projects and applications,
rather than your debug tools,
resulting in increased productivity.

Agilent hardware products are warranted against defects in materials
and workmanship for a period of one
year from date of shipment. Some
newly manufactured Agilent products
may contain remanufactured parts,
which are equivalent to new in performance. If you send us a notice of
such defects during the warranty
period, we will either repair or
replace hardware products that prove
to be defective.

Agilent software and firmware products that are designated by Agilent
for use with a hardware product are
warranted for a period of one year
from date of shipment to execute
their programming instructions when
properly installed. If you send us
notice of defects in materials or
workmanship during the warranty
period, we will repair or replace
these products, so long as the defect
does not result from buyer supplied
hardware or interfacing. The
warranty period is controlled by the
warranty statement included with
the product and begins on the date
of shipment.

Related Literature
Publication Title

Publication Type

Publication Number

Processor and Bus Support For
Agilent Technologies Logic Analyzers

Configuration Guide

5966-4365E

Probing Solutions for
Agilent Technologies Logic Analysis Systems

Product Overview

5968-4632E

www.agilent.com/find/la-systems

131

www.agilent.com

Agilent Technologies’ Test and Measurement Support, Services, and Assistance
Agilent Technologies aims to maximize the value you receive, while minimizing your risk and
problems. We strive to ensure that you get the test and measurement capabilities you paid
for and obtain the support you need. Our extensive support resources and services can help
you choose the right Agilent products for your applications and apply them successfully.
Every instrument and system we sell has a global warranty. Support is available for at least
five years beyond the production life of the product. Two concepts underlie Agilent's overall
support policy: "Our Promise" and "Your Advantage."

By internet, phone, or fax, get assistance with
all your test & measurement needs

Our Promise
Our Promise means your Agilent test and measurement equipment will meet its advertised
performance and functionality. When you are choosing new equipment, we will help you
with product information, including realistic performance specifications and practical
recommendations from experienced test engineers. When you use Agilent equipment, we
can verify that it works properly, help with product operation, and provide basic measurement
assistance for the use of specified capabilities, at no extra cost upon request. Many self-help
tools are available.

Canada:
(tel) 877 894 4414
(fax) 905 282 6495

Your Advantage
Your Advantage means that Agilent offers a wide range of additional expert test and
measurement services, which you can purchase according to your unique technical and
business needs. Solve problems efficiently and gain a competitive edge by contracting with
us for calibration, extra-cost upgrades, out-of-warranty repairs, and on-site education and
training, as well as design, system integration, project management, and other professional
engineering services. Experienced Agilent engineers and technicians worldwide can help
you maximize your productivity, optimize the return on investment of your Agilent
instruments and systems, and obtain dependable measurement accuracy for the life of
those products.

Online assistance:
www.agilent.com/find/assist
Phone or Fax
United States:
(tel) 800 452 4844

China:
(tel) 800 810 0189
(fax) 800 820 2816
Europe:
(tel) (31 20) 547 2323
(fax) (31 20) 547 2390
Japan:
(tel) (81) 426 56 7832
(fax) (81) 426 56 7840
Korea:
(tel) (82 2) 2004 5004
(fax) (82 2) 2004 5115
Latin America:
(tel) (305) 269 7500
(fax) (305) 269 7599
Taiwan:
(tel) 0800 047 866
(fax) 0800 286 331

www.agilent.com/find/emailupdates
Get the latest information on the products and applications you select.

Agilent T&M Software and Connectivity
Agilent's Test and Measurement software and connectivity products, solutions and
developer network allows you to take time out of connecting your instruments to your
computer with tools based on PC standards, so you can focus on your tasks, not on your
connections. Visit www.agilent.com/find/connectivity for more information.

Other Asia Pacific Countries:
(tel) (65) 6375 8100
(fax) (65) 6836 0252
Email: tm_asia@agilent.com
Product specifications and descriptions in this
document subject to change without notice.
© Agilent Technologies, Inc. 2003
Printed in USA July 11, 2003

5968-9661E



Source Exif Data:
File Type                       : PDF
File Type Extension             : pdf
MIME Type                       : application/pdf
PDF Version                     : 1.3
Linearized                      : Yes
Create Date                     : 2003:07:11 15:24:33
Producer                        : Acrobat Distiller 4.0 for Macintosh
Author                          : Vicki Thorson
Creator                         : QuarkXPressª 4.1: LaserWriter 8 8.7
Title                           : 5968-9661E 7-03
Modify Date                     : 2003:07:11 15:35:33-06:00
Page Count                      : 132
Page Mode                       : UseOutlines
EXIF Metadata provided by EXIF.tools

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