Keysight_PNA X_Series_Microwave_Network_Analyzers_datasheet_5990 4592EN Keysight PNA X Series Microwave Network Analyzers Datasheet 5990

User Manual: Keysight_PNA-X_Series_Microwave_Network_Analyzers_datasheet_5990-4592EN

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Keysight Technologies
PNA-X Series
Microwave Network Analyzers

For more information:
Contact your NSCA & Tra-Cal Small Business Partner:
Email info@nscainc.com or call your local sales rep today at 301-527-9200.

02 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Industry’s Most Advanced
RF Test Solution
Reach for unrivaled
excellence

Choose the leader in network analysis
The PNA-X Series of microwave network analyzers are the culmination of Keysight
Technologies, Inc. 40-year legacy of technical leadership and innovation in radio
frequency (RF) network analysis. More than just a vector network analyzer, the PNA-X
is the world’s most integrated and flexible microwave test engine for measuring active
devices like amplifiers, mixers, and frequency converters.
The combination of two internal signal sources, a signal combiner, S-parameter and
noise receivers, pulse modulators and generators, and a flexible set of switches and RF
access points provide a powerful hardware core for a broad range of linear and nonlinear
measurements, all with a single set of connections to your device-under-test (DUT).
When you’re characterizing active devices, the right mix of speed and performance gives
you an edge. In R&D, the PNA family provides a level of measurement integrity that helps
you transform deeper understanding into better designs. On the production line, our
PNAs deliver the throughput and repeatability you need to transform great designs into
competitive products. Every Keysight VNA is the ultimate expression of our expertise in
linear and nonlinear device characterization. Choose a PNA --and reach for unrivaled
excellence in your measurements and your designs.

World´s widest range of measurement applications
PNA-X applications bring speed, accuracy, and ease-of-use to common RF
measurements, in coaxial, fixtured, and on-wafer environments. Applications include:
–– S-parameters (CW and pulsed)
–– Noise figure
–– Gain compression
–– Intermodulation and
harmonic distortion

–– Conversion gain/loss
–– True-differential stimulus
–– Nonlinear waveform and
X-parameter* characterization
–– Antenna test

Network analysis technology down to the nanoscale
The PNA-X is also compatible with these Keysight measurement solutions:

All of the PNA-X’s powerful measurement
applications can be used for on-wafer devices.

–– Physical layer test system (PLTS) software to calibrate, measure, and analyze linear
passive interconnects, such as cables, connectors, backplanes, and printed circuit
boards.
–– Materials test equipment and accessories to help determine how your materials
interact with electromagnetic fields, by calculating permittivity and permeability.
–– Award-winning scanning microwave microscope to create a powerful and unique
combination for topography measurements of calibrated capacitance and dopant
densities at nanoscale dimensions.

The right frequency for your application
N5249B 10 MHz to 8.5 GHz
N5241B
N5242B
N5244B

10 MHz to 13.5 GHz
10 MHz** to 26.5 GHz
10 MHz to 43.5 GHz

N5245B
N5247B

10 MHz to 50 GHz
10 MHz** to 67 GHz

PNA-X with mm-wave modules

10 MHz to 1.5 THz

** Some configuration options allow operation down to 900 Hz

Build your optimal test system by selecting the frequency range for your specific
device-test needs without paying for functionality you don’t need.

03 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Multiple measurements
with a single instrument

Replace racks and stacks
With its highly integrated and versatile hardware and
re-configurable measurement paths, the PNA-X replaces
racks and stacks of equipment – with a single instrument.
One PNA-X can take the place of the following test gear:
–– Network analyzer
–– Spectrum analyzer
–– Two signal sources
–– Noise figure meter/analyzer
–– Power meters
–– Switch matrix
–– Digital voltmeter

Benefits of a PNA-X-based solution
–– Simpler test systems for...
...lower hardware and software costs
...quicker development time and faster time to manufacturing
...less downtime and lower maintenance costs
...smaller size and lower power consumption
–– Faster test times for...
.
..improved throughput
–– Higher accuracy for...
...better yields and better specifications
–– Flexible hardware for...
...greater adaptability to future test requirements

With a single set of connections to an amplifier or
frequency converter, the PNA-X can measure CW and pulsed
S-parameters, intermodulation distortion, gain and phase
compression versus frequency, noise figure, and more.

04 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Bottom Line
Results –
PNA-X Case
Studies

“We selected Keysight’s
PNA-X because it eliminated
unnecessary cable swaps
between measurements and it
makes more active measurements
than any other network analyzer
out there. We used to make
S-parameter, vector-signal, and
noise-figure measurements with
separate test equipment—and
now with the PNA-X, we
can perform all of our active
measurements in one box.”
Test Engineering Manager

Case Study 1
Aerospace/defense component supplier reduces test time by 95%
Challenges
This customer manufacturers over 4600 RF components, with typically 1000 devices
in the manufacturing process at any given time. Devices included filters, multipliers,
amplifiers, and switches, from 10 MHz to 60 GHz. They needed to simplify the test
system for one particular multiport device, so they set out to develop an operator
independent automated test system (ATS). Key challenges included:
–– Complicated and expensive test systems with multiple racks of equipment
and miles of test cables
–– Multiple cable swaps and recalibrations required with extensive operator
intervention and downtime
–– Significant retesting of devices and high system downtime

Results
The PNA-X’s ability to incorporate more active measurements into a single
instrument than any other product on the market provided:
–– Faster test times: Reduced test times from four hours per temperature to 24 minutes
when compared to the prior ATS, resulting in a test-time reduction of 95%
–– Reduced equipment count: Replaced nine racks of equipment with three, 12-port
PNA-X network analyzers
–– Increased operator productivity: Enabled operators to monitor four test stations
simultaneously and eliminated the need for single-operator test stations
–– Reduced re-testing and cable swaps

Case Study 2
Satellite designer and manufacturer reduces test time from
three hours to three minutes
Challenges
This aerospace company was conducting a specific panel-level test and wanted
to modernize its test systems and improve its test productivity and throughput.
Its legacy satellite payload test systems utilized a large amount of rack and stack
equipment accompanied by a big test overhead. The company was required to
exert a great deal of time and effort to program and maintain the test systems.

Results
Initially the aerospace company purchased four PNA-Xs (26.5 and 50 GHz
models). They were so impressed with the throughput and test productivity
results, that they purchased eight more analyzers. In one test case, the level
of improvement exceeded expectations—taking a 20-minute gain-transfer test
to just under a minute. Replacing their test system with the PNA-X effectively
modernized and simplified their test system which enabled:
–– Faster test times: Complete test suite cut measurement times from three
hours to three minutes
–– Reduced equipment count: Replaced a two-rack payload test system with a
single four-port PNA-X
–– Smaller test system: Reduced the amount of equipment space and power
consumption

05 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Case Study 3
Wireless networking systems manufacturer reduces
throughput from 30 to 10 minutes
Challenges
The manufacturer was developing a new broadband wireless network system and
needed a faster test system. Its existing test system consisted of two sources, a
spectrum analyzer, and power meters. Using this system, they estimated their new
product would take 30 minutes to test; however their speed goal was 15 minutes.
In addition to needing a faster test solution, the company also needed better
noise figure and distortion measurements, and it required single-connection
measurements on both up and down converters.

Results
Replacing their existing multi-instrument test system with a single four-port 50 GHz
PNA-X enabled the company to realize:
–– Faster test times: Complete test suite cut test throughput from an estimated
30 minutes to under ten minutes
–– Less downtime and reduced maintenance costs: Reducing the equipment
count reduced the setup time, as well as the headaches associated with
multiple equipment faults, and resulted in lowered annual calibration costs
–– Cost savings on equipment: The cost of a four-port PNA-X was substantially
less expensive than the legacy multi-instrument test system.

Case Study 4
“We chose the PNA-X for its
unique single-connection,
multiple-measurement
capability. The PNA-X is also
the only solution we found
that can make accurate
nonlinear measurements by
using its extended NVNA
software option. This saves us
an amazing amount of design
time because it means we
can quickly and accurately
characterize the nonlinear
behavior of our devices even at
crazy high power levels.”
Test Engineering Manager

Global security company speeds test and improves
measurement accuracy
Challenges
The company needed to upgrade its legacy test systems, which consisted of
large switch matrices with network analyzers. They required technicians to keep
connecting and disconnecting the device-under-test (DUT) to multiple instruments
to make a range of different measurements. This approach was slow, costly, prone to
inaccuracy, and required a good deal of user intervention and additional hardware.
The company sought a solution that was easy to set up and use, decreased test time
and cost, minimized measurement inaccuracy, and offered a smaller footprint

Results
The company decided to purchase PNA-Xs rather than simply upgrade to newer,
code-compatible, drop-in instruments offered by the provider of its legacy test
equipment. This decision was made despite the fact that it meant significant rewrite
of legacy software. The company saved time over their existing test solutions and
realized:
–– Easy setup and use: Technicians were able to easily connect to a DUT and
measure all different parameters in one pass—without additional hardware
–– Faster and more accurate tests: Using just one instrument technicians were able
to conduct their required tests in significantly less time and improve accuracy
–– Smaller test system: A single four-port PNA-X reduced their initial capital
expense, equipment count, floor space, and power consumption, which resulted
in lower overall test costs

06 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Intuitive, Speed-Driven Features

Flexible, modern
user interface: front
panel keys, tabbed
soft panel, pulldown
menus, customizable
toolbar, right-click
shortcuts, drag-anddrop operation, and
12.1” touch screen

Undo/Redo
cancels or
restores
previous
entries

State-of-the-art
calibration
capabilities
Up to 15
markers
per trace

Configurable
test set available
on all models
Linear, log,
power, CW, phase, and
segment sweeps

200 measurement
channels and
unlimited traces

Equation editor
and time-domain
analysis

Context
sensitive,
built-in help

Quick access
for ECal and
other USB
devices

07 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Hardware for Exceptional Flexibility

Second GPIB
interface for
controlling signal
sources, power
meters or other
instruments

Pulse I/O connector
for controlling
external modulators
or synchronizing
internal pulse
generators

RF jumpers for adding
signal-conditioning
hardware or other
test instruments

Direct IF
access for
remote mixing in
antenna ranges

Test set I/O for
controlling external
multiport and
millimeter-wave
test sets

LAN and
device-side USB
interfaces provide
alternatives to
GPIB for remote
programming

Flexible triggers for
measurement control
and for synchronizing
external sources or
other instruments

Removable
hard drive
for secure
environments

Power I/O connector
provides analog
inputs and outputs
for PAE and other
measurements

08 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Flexible
Architecture

+28 V

J11

J10

Each test port includes test and reference couplers and receivers, source and
receiver attenuators, and a bias tee, for maximum accuracy and flexibility.

2.

The built-in signal combiner greatly simplifies the setup for intermodulation
distortion and X-parameter measurements.

3.

Internal pulse modulators enable integrated pulsed-RF testing over the full frequency
range of the instrument, eliminating expensive and bulky external modulators.

J9

J8

Rear panel

J7

Signal
combiner

+
–

2

OUT 1

R1

1.

3

Source 1

OUT 1
OUT 2

Pulse
modulator

Pulse
modulator

A

Test port 1

Source 2

R3

C

1

Test port 3

OUT 2

09 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

4.

5.
6.

J4

Switchable rear-panel jumpers provide the flexibility to add signal-conditioning
hardware or route additional test equipment to the DUT without moving test
cables.
Setting up pulse timing for the pulse modulators and internal IF gates is easy
using the built-in pulse generators.
Internal low-noise receivers, along with advanced calibration and measurement
algorithms, provide the industry’s most accurate noise figure measurements.

Rear panel

J3

3

Pulse
generators

J2

J1

4

1
2
3

5

4

LO

Noise receiver

To
receivers

R4

6

8.5/13.5/26.5
43.5/50 GHz

R2
D

B

Test port 4

Test port 2

10 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Simple, fast and
accurate pulsed-RF
measurements
(S93025/026A, Options 021, 022)

Pulsed-RF measurement challenges
–– Pulse generators and modulators required for pulsed-RF measurements add
complexity in test setups
–– For narrow pulses:
–– Maximum IF bandwidth of analyzer is often too small for wideband detection
–– Narrowband detection is slow, and measurements are noisy for low-duty-cycle
pulses

PNA-X pulsed-RF measurements provide:
–– S93025A provides a simple user interface for full control of two internal pulse
modulators (Options 021 and 022), four internal independent pulse generators, and
point-in-pulse measurements with pulse widths as narrow as 200 ns, and pulseprofile measurements with 50 ns minimum resolution
–– S93026A adds point-in-pulse measurements with 20 ns minimum pulse width, and
pulse profile measurements with 10 ns minimum resolution

By the 1990s,
the HP 8510 was
the industrystandard for
pulsed-RF
vector network
analyzers.

The PNA
Series replaced the
pulsed 8510 with a
bench-top solution.

–– Improved measurement speed and accuracy for narrowband detection using
hardware filters and patented spectral-nulling and software IF-gating techniques
–– Measurements using wideband detection with pulse widths as narrow as 100 ns
–– Pulse I/O connector on rear panel for synchronization
with external equipment and DUT
–– Accurate active-component
characterization using unique
application measurement
classes for gain compression,
swept-frequency/power IMD,
and noise figure

Providing the first one-box pulsed-RF
test system, the PNA-X sets a new
standard for simplicity, speed, and
accuracy.

Pulsed-RF measurement application automatically optimizes internal
hardware configuration for specified pulse conditions to dramatically
simplify test setups. Alternately, users can choose to manually set up the
hardware for unique test requirements.

Pulse profile measurement using narrowband detection technique allows
30 measurement points within 300 ns pulse, with 10 ns timing resolution.

11 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Tips from the experts
of samples required for the IF bandwidth (IFBW). For
example, the minimum pulse width is 100 ns with
15 MHz IFBW, 300 ns with 5 MHz IFBW, and 1.44 μs with
1 MHz IFBW. When working at the minimum pulse width
for a particular IFBW, it is important to precisely set the
measurement delay (with 10 ns resolution) to align the
pulse modulation and the data acquisition period.
–– In pulse mode, it is important to use receiver leveling
to maintain power-level accuracy for power-dependent
measurements, such as output power, compression, and
intermodulation distortion.

dB

–– Compared to sweep averaging, point averaging typically
provides faster results when averaging is needed to lower
noise and improve accuracy of measurements using
wideband detection.
–– During source power calibrations, power sensors read the
average power, while the analyzer sets the peak power
of the pulsed stimulus. To compensate for the difference
between the peak and average power, use the power offset
feature with the value of 10 log (duty cycle).
–– The minimum pulse width for point-in-pulse measurements
using wideband detection is determined by the number

Freq (GHz)

PNA-X’s narrowband detection method used for narrow pulse widths
(< 267 ns) employs special hardware and patented software-gating
techniques to improve system dynamic range for low-duty-cycle
measurements by 40 dB compared to PNA-based pulsed-RF systems.

The PNA-X accurately characterizes active devices under pulsed operation
with a single set of connections to the DUT—pulsed S-parameters, pulse
profile (input and output power in the time domain), gain compression
versus frequency, and swept-frequency IMD are measured in this example.

Output power
@ compression

Gain @ linear input power

Open loop
Gain @
compression

R1 receiver leveling
Input power @ compression

Using receiver leveling improves the pulsed-RF power
accuracy from ± 1 dB to less than 0.05 dB.

Above measurements compare the results with and without receiver
leveling in GCA measurements. Inaccurate stimulus causes large errors in
power-dependent measurements such as input and output power at the
compression point versus frequency.

12 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications

Noise figure measurement challenges with traditional,
Y-factor approach
–– Multiple instruments and multiple connections
required to fully characterize DUT
–– Measurement accuracy degrades in-fixture, on-wafer,
and automated-test environments, where noise
source cannot be connected directly to DUT
–– Measurements are slow, often leading to
fewer measured data points and misleading
results due to under-sampling

Fast and accurate
noise figure
measurements
(S93029A, Option 029)

PNA-X noise figure solution provides:
–– Amplifier and frequency converter measurements with the highest accuracy
in the industry, using advanced error-correction methods
–– Fast measurements: typically 4 to 10 times faster than Keysight’s NFA Series
noise figure analyzers
–– Ultra-fast noise-parameter measurements when used with Maury Microwave
automated tuners, giving 200 to 300 times speed improvements
5

On-wafer
automated-test
environment

Noise figure (dB)

4

PNA-X method using source correction
3

2

Under-sampled data
1

Wafer
probes

Traditional Y-factor technique

AUT

0
0

5

10
15
Frequency (GHz)

20

25

For this 401 point measurement of an unmatched transistor, the PNA-X
exhibits much less ripple compared to the Y-factor method. The NFA
default of 11 trace points would give under-sampled and therefore
misleading results of the amplifier’s performance.

Noise source
For Y-factor measurements, any electrical network connected between
the noise source and the DUT, such as cables, switch matrices, and wafer
probes, causes significant accuracy degradation.

“I have several instruments in my equipment pool that can measure noise
figure­— 8970s, NFAs, and spectrum analyzers. My biggest problem for noise figure
measurements was lack of correlation—I’d get different answers depending on
which instrument I used. Now, with the PNA-X’s high accuracy, I know I’ll get the
right answer every time, no matter which PNA-X I use.”

Test Engineering Manager

13 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Noise-parameter measurements in minutes rather than days
Noise parameters vs. frequency

Source

Frequency: 0.80 to 8.00 GHz

Setting up and making noise-parameter measurements is simple and fast using a PNA-X and a Maury
Microwave automated tuner. Maury’s latest software dramatically improves both the speed and
accuracy of noise-parameter measurements, making them a practical option for all RF engineers.

Noise figure measurement methods
DUT

Noise
receiver

DUT

Noise
receiver

Y-factor: The most prevalent method for measuring noise figure is the Y-factor technique.
It relies on a noise source connected to the input of the device under test (DUT). When
the noise source is turned off, it presents a room temperature (cold) source termination.
When the noise source is turned on, it creates excess noise, equivalent to a hot source
termination. Under these two conditions, noise power is measured at the output of the
DUT, and the scalar gain and noise figure of the amplifier is calculated. The Y-factor
method is used by Keysight’s NFA Series and by spectrum analyzers with preamplifiers
and a noise figure personality option.
Cold Source: An alternate method for measuring noise figure is the cold source or direct
noise technique. With this method, only one noise power measurement is made at the
output of the DUT, with the input of the amplifier terminated with a room temperature
source impedance. The cold source technique requires an independent measurement
of the amplifier’s gain. This technique is well suited for vector network analyzers (VNAs)
because VNAs can measure gain (S21) extremely accurately by utilizing vector error
correction. The other advantage of the cold source method is that both S-parameter and
noise figure measurements can be made with a single connection to the DUT.

14 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications

PNA-X’s unique source-corrected noise figure solution

Fast and accurate
noise figure measurements
(S93029A, Option 029,
continued)

–– Uses modified cold-source method, eliminating need for noise source when
measuring DUT
–– Corrects for imperfect system source match by using vector correction to remove
mismatch errors plus an ECal module used as an impedance tuner to remove
noise-parameter-induced errors
–– Maintains high measurement accuracy in fixtured, on-wafer, or automated-test
environments
–– Accurately measures differential devices using vector de-embedding of baluns or
hybrids

Frequency

DUT

Measure differential devices by
de-embedding baluns or hybrids.

+28 V

J11

J10

J9

J8

At each test frequency, four or more noise measurements
are made with known, non-50-ohm source impedances.
From these measurements, 50-ohm noise figure
is accurately calculated.

Rear panel

J7

+
–

J2

J1

LO
Source 2
OUT 1

Source 1
OUT 1

R1

OUT 2

Noise receivers

To receivers

Pulse
modulator

OUT 2

10 MHz to
3 GHz

3 to
26.5 GHz

Pulse
modulator

R2

Pulse generators

A

B

1
2
3
4

Noise source used
for calibration only.
Alternately, a power
sensor can be used
to calibrate the noise
receivers.

Test port 1

Impedance
tuner for
noise figure
measurements

Source 2
Output 1

Source 2
Output 2

Test port 2

DUT
Block diagram of a two-port N5242B PNA-X with test set option 224, and low-noise receiver option 029.
A standard ECal module is used as an impedance tuner to help remove the effects of imperfect system
source match. N5244/45/47B models include a built-in impedance tuner.

15 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Tips from the experts
–– Noise figure measurements are best done in a screen room to eliminate
spurious interference from mobile phones, wireless LAN, handheld
transceivers, etc.
–– Batteries are sometimes used instead of mains-based power supplies to
eliminate conducted interference from sensitive LNA measurements
–– Overall measurement accuracy can be estimated by using Keysight’s
Monte-Carlo-based noise figure uncertainty calculator

Keysight’s PNA-X noise
figure uncertainty calculator
(www.keysight.com/find/nfcalc)
includes the effects of mismatch
and noise-parameter-induced
errors caused by imperfect
system source match.

Noise figure measurement
uncertainty example in an
automated test environment
(ATE). The PNA-X’s source
corrected technique is
considerably more accurate
than the Y-factor method.

16 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications

Gain compression measurement challenges
–– Characterizing amplifier or frequency converter compression over its operating
frequency range requires measurements at many frequency and power points, so
setting up the measurements, calibration, and data manipulation takes a lot of time
and effort
–– A variety of errors degrade measurement accuracy, such as mismatch between the
test port and the power sensor and DUT during absolute power measurements, and
using linear S-parameter error correction in nonlinear compression measurements

Fast and accurate gain
compression versus
frequency measurements
of amplifiers and
converters

PNA-X gain compression application (GCA) provides:
–– Fast and convenient measurements with SMART Sweep
–– Highly accurate results using a guided calibration that provides power and mismatch
correction
–– Complete device characterization with two-dimensional (2D) sweeps, with the
choice of sweeping power per frequency, or sweeping frequency per power
–– Flexibility with a variety of compression methods—compression from linear gain,
maximum gain, X/Y compression, compression from back-off, or compression from
saturation

(S93086A)

Gain

Compression
point

Gain

Pin
Frequency
A network analyzer is commonly used for gain compression
measurements by performing power sweeps at multiple CW frequencies.
The PNA-X’s GCA makes it easy to characterize compression over the
DUT’s operating frequency range with extreme speed and accuracy, and
a simple setup.

Iteration point
Compression point

Pin
Frequency
Instead of a linear power sweep with many points, GCA’s SMART Sweep
uses an adaptive algorithm to find the desired compression point at each
frequency with just a few power measurements, thus significantly reducing
test times.

Using only power correction, incident
power at compression point exhibits
large ripple due to DUT mismatch

Measurement ripple is reduced with GCA
by using power and mismatch correction

Complete device response to 2D sweeps—gain versus frequency and
power—can be extracted for device modeling.

17 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Available compression methods
The linear gain is measured using the
specified linear (input) power level. The
compression point is calculated as the linear
gain minus the specified compression level.

Linear gain

Compression
point

Specified compression level
Gain

Compression from linear gain

Input power

Compression from saturation

The output powers at two input powers that
are different with the specified delta X are
compared. The compression point is found as
the highest input power with the output power
difference of the specified delta Y.
The compression point is found at the highest
output power minus the value specified as
“From Max Pout”.

Compression
point

Gain

Specified compression level

Input power

Gain

Specified compression level

Compression
point

Back off level
Input power

Compression point
Delta Y

X/Y compression

The gains at two input powers that are
different with the specified back off level are
compared. The compression point is found
as the highest input power with the gain
difference of the specified compression level.

Max gain

Output power

Compression from back off

The highest gain value that is found at each
frequency is used as the max gain. The
compression point is calculated as the max
gain minus the specified compression level.

Output power

Compression from max gain

Delta X

Input power

Highest output power
From Max Pout
Input power

q.

Fre

Pin

Measured background data in
SMART Sweep with Safe Mode
Off (above) and On (below)—
more iterations are used as
the gain becomes closer to the
1 dB compression point with
Safe Mode On, which minimizes
excess drive power.

Gain Compression

–– Use the safe mode in SMART
Sweep to increment the input
power first with coarse and then
with fine steps to prevent over
driving the DUT
–– When the DUT’s hysteresis or
thermal effects are in doubt,
it is recommended to sweep
frequency per power rather than
power per frequency, or to add
dwell time to lower the effects
from previous measurements
–– Compression analysis capability
extracts the DUT response over
the power range at a specified
frequency point on any of the
compression traces
–– Use the CompAI1 and CompAI2
internal voltmeter readings
that are synchronized to the
compression point to measure
power-added efficiency (PAE) at
compression for each frequency

Gain Compression

Tips from the experts

Pin

q.

Fre

18 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Fast two-tone
intermodulation
distortion (IMD)
measurements
with simple setup
(S93087A)

IMD measurement challenges
–– Two signal generators, a spectrum
analyzer, and an external combiner are
most commonly used, requiring manual
setup of all instruments and accessories
–– Test times are slow when swept-frequency
or swept-power IMD is measured
–– Instruments and test setups often
cause significant measurement errors
due to source-generated harmonics,
cross-modulation, and phase noise, plus
receiver compression and noise floor

PNA-X with IMD application
provides:

Swept-frequency IMD

Swept-power IMD

IMD application measures third order
IMD and IP3 at 201 frequency (or power)
points in a matter of seconds, compared to
several minutes using signal generators and a
spectrum analyzer.

The PNA-X with IMD application replaces two

signal generators and a spectrum analyzer in the
–– Fast swept IMD measurements
system rack, simplifying the system configuration
of amplifiers and frequency
and increasing test throughput.
converters, using internal
combiner and two internal
sources
–– Quick and easy measurements with simplified hardware setup and intuitive user
interface
–– Guided calibration that simplifies the calibration procedure and provides high
measurement accuracy
–– Spectrum analyzer mode for troubleshooting or making spurious measurements,
eliminating the need for a separate spectrum analyzer
–– Very clean internal sources and wide receiver dynamic range, minimizing the
measurement errors caused by other instruments
Rear panel

J11

J10

J9

J8

J2

J7

J1

LO
Source 2

Frequency
offset mode

OUT 1

OUT 1

R1
IM Spectrum

Frequency-offset mode is commonly available
in VNA’s, but conventional IF filter responses
exhibit high side lobes. The IM Spectrum
mode employs an optimized digital IF filter
and provides true spectrum measurement
capability in the PNA-X.

OUT 2

To receivers

Pulse
modulator

Source 1
OUT 2

Pulse
modulator

R2

B

A

Test port 1

Source 2
Output 1

Source 2
Output 2

Test port 2

DUT
Two internal sources with high output power, wide ALC range, -60 dBc harmonics, and a
high-isolation combiner, make the PNA-X an ideal instrument to drive the DUT for two-tone
IMD measurements. Wide dynamic-range receivers with high compression points enable
accurate measurements of low-power IMD products while the higher power main tones are
present.

19 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Swept IMD sweep types
Sweep fc

Sweep Delta F

Power Sweep

CW

LO Power Sweep

Segments

Center
Frequency

Swept

Fixed

Fixed

Fixed

Fixed

Swept (as defined by
segment table)

Tone
Spacing

Fixed

Swept

Fixed

Fixed

Fixed

Fixed

Tone
Powers

Fixed

Fixed

Swept (coupled or
uncoupled)

Fixed

Fixed

Fixed

Diagram

Delta F
f1

fc

Delta F

Delta F
f2

f1

fc

f2

f1

f1

fc

Delta F

Delta F

Delta F
f2

f2

f1

fc

f2

f1

fc

Delta F

f2

LO

f1 fc f2

f1

fc

Delta F
f2

f1

fc

f2

Tips from the experts

Cal all frequencies

Cal center frequencies

–– Calibrate at all measurement frequencies or at center frequencies only,
trading off productivity and accuracy
–– Let the PNA-X control external signal generators to greatly simplify
swept IMD measurements of mixers and converters
–– Use the Marker to IM Spectrum feature to show the spectrum at a
specified point on the swept IMD trace
–– Use point averaging with IM Spectrum, especially when using a wide
resolution bandwidth, to reduce the noise deviation of the noise floor
with minimum speed impact
Calibrating all frequencies is recommended for
wide tone spacing. Although the calibration takes
longer with “all frequencies”, measurement speed
is not affected.

The IM Spectrum in the lower window shows the spectrum
corresponding to the Swept IMD marker at the center of the trace in the
upper window. Point averaging is applied to the IM Spectrum to reduce
the noise deviation.

IMD and IP3 versus LO power yields maximum IP3 with lowest possible
LO drive power. This helps specify the mixer setup to achieve maximum
efficiency while minimizing power consumption.

20 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Accurate
characterization
of mixers and
converters
(S93082/083/084A)

Mixer and converter
measurement challenges

SMC+Phase

–– Traditional approach with spectrum
analyzer and external signal sources
is cumbersome, slow, and does
not provide phase or group delay
information
–– Conventional VNAs require an external
signal source, which degrades sweep
speed
–– Conventional VNAs provide phase or
group delay data relative to a “golden”
device
–– Attenuators are often used to
minimize ripple due to input and output
mismatch, at the expense of dynamic
range and calibration stability

S93083A’s Scalar Mixer/Converter plus Phase
(SMC+Phase) makes mixer and converter
measurements simple to set up since reference
and calibration mixers are not required. Calibration
is easy to perform using three broadband
standards: a power meter as a magnitude
standard, a comb generator as a phase standard,
and an S-parameter calibration kit (mechanical or
ECal module).

PNA-X frequency converter applications provide:
–– Simple setup using internal second signal source as a local oscillator (LO) signal
–– Typical measurement time improvement of 100x compared to spectrum analyzerbased approach
–– High measurement accuracy using two patented techniques:
–– Scalar Mixer/Converter (SMC) provides match and most accurate conversion
loss/gain measurements by combining two-port and power-meter calibrations
(S93082A), and with (S93083A), calibrated absolute group delay measurements
without a reference or calibration mixer
VMC
–– Vector Mixer/Converter (VMC)
provides measurements of match,
conversion loss/gain, delay, phase
difference between multiple paths
or devices, and phase shifts within
a device, using a vector-calibrated
Reference
through mixer (S93083A)
mixer
–– Input and output mismatch correction
Calibration
mixer/filter
reduces ripple and eliminates the need
for attenuators
DUT
–– Embedded-LO feature (S93084A)
extends SMC and VMC measurements
The Vector Mixer/Converter technique provides
to converters with embedded LOs
measurements of match, conversion loss/gain,
without access to internal time bases
delay, phase difference between multiple paths
or devices, and phase shifts within a device.

Calibration mixer/filter pair

Keysight’s patented Vector Mixer/
Converter calibration method uses
open, short, and load standards
to create a characterized-mixer
through standard.

OPEN

IF--

SHORT

LOAD

RF

IF +
LO

IF--= RF-LO

21 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Swept LO
Fixed IF

Fixed LO
Swept IF

DUT
Both SMC and VMC can be used to measure
converters with embedded LOs, without need for
access to internal time bases.
With two internal signal sources, the PNA-X provides fast measurements of both fixed
and swept IF responses.

8720 with attenuators

PNA with VMC (no attenuators)

dB

Group delay

8720 without attenuators

Competitor’s
VNA with
attenuators

PNA without attenuators using SMC
GHz

SMC’s match correction greatly reduces mismatch errors in
conversion loss/gain measurements, eliminating the need for
attenuators at the ends of the test cables.

RF frequency (Hz)

VMC’s match correction greatly reduces mismatch errors in group
delay measurements, eliminating the need for attenuators at the
ends of the test cables.

Tips from the experts
–– Narrowing the IF bandwidth helps
eliminate spikes on the measurement
trace that result from LO feed through
and other spurious signals from the DUT
–– To prevent source-unleveled errors
when measuring devices with high-level
spurious outputs (such as unfiltered
mixers), it is often helpful to increase the
amount of source attenuation to provide
better isolation between the DUT and
the PNA-X
–– When making VMC measurements
on multistage converters, it is best to
create a single “meta-LO” signal that
can be used to drive the reference and
calibration mixers
–– When measuring unfiltered mixers,
time-domain gating can be a useful tool
to reduce ripple by removing undesired,
time-delayed responses due to spurious
signals

Time-domain gating can remove ripple by removing unwanted, time-delayed responses
due to spurious signals.

22 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative Applications
Fast multi-channel
spectrum analyzer for
component characterization
(S93090x/093/094A)

Spectrum analysis challenges for component testing
–– Measuring spurious performance is time consuming, especially
when searching for low-level spurs over a broad frequency
range
–– Long measurement times may force insufficient test coverage
–– Characterizing spurs over operating range of the DUT is tedious
to accomplish or requires external control software

PNA-X spectrum analyzer (SA) application provides:

Spectrum analyzer option adds fast spur search capability to the PNA-X, replacing
a standalone spectrum analyzer and switch matrix in component-characterization
test systems.

Sweep
Time (s)
103

-80 dBm Noise Floor ( dBm)

Modern SA

–– Fast spurious searches over broad frequency ranges
–– A multi-channel SA with internal swept-signal generators for
efficient spurious analysis of mixers and converters
–– In-fixture spectrum measurements using VNA calibration
and de-embedding techniques
–– Fast band- and noise-power measurements
–– SA capability to the PNA-X’s single-connection, multiplemeasurement suite

-90 dBm Noise Floor ( dBm)

PNA SA

102
101
x500

100
x10
10-1
10-2

x460

x10
x420

x8

1 GHz

10 GHz

20 GHz

1 GHz

10 GHz

20 GHz

Span

Sweep time versus span with 12 GHz center frequency for -80 dBm and -90 dBm
noise floor. The receiver attenuator is set to avoid compression with a +10 dBm
signal.

Above plot shows -84 dBm spurious measurements in the presence of a +10 dBm
signal, with (from top to bottom) approximate S/N (at RBW) of 80 dB (300 kHz),
90 dB (30 kHz), 100 dB (3 kHz), and 110 dB (300 Hz)

23 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Providing multi-channel spectrum analysis
1

2

3

4

Having spectrum analyzers on all ports of a mixer
or converter provides unparalleled insight into
the performance of the device. With a single set
of connections, the spurious content emanating
from all ports is readily apparent during
operation with fixed or swept stimuli. Measured
spurs can include LO, RF, and IF feedthrough,
harmonics, intermodulation products, and other
higher-order mixing products. Conversion loss
and match versus frequency is easily seen in a
companion SMC channel (bottom).

Output spectrum on
LO port

LO

Output spectrum on
IF port

IF
RF

Input spectrum on
RF port

Unlock true performance
with VNA calibration
Measurement
plane

Device
plane

Measurement
plane

Coaxial
interface

Coaxial
interface

Test fixture

Tips from the experts

Pout at
device
plane
Pout at
measurement
plane

Output spectrum on
RF port

No error
correction

VNA calibration and fixture de-embedding remove cable and fixture effects and
correct receiver response errors, providing calibrated in-fixture spectrum analysis.

–– Choose different levels of software-image rejection to
trade-off measurement speed with thoroughness, based
on the spectral density of the measurement
–– For harmonics measurements, add a separate SA channel
for each harmonic with a narrow frequency span and
RBW to optimize speed and sensitivity, and with enough
receiver attenuation to avoid internally-generated
harmonics
–– To help identify spurious signals that might be interfering
with a measurement, use the Marker-to-SA feature to
easily create a spectrum display with the same stimulus
conditions at the marker position in SMC, swept-IMD, or
standard channels
–– When using de-embedding to measure in-fixture or
on-wafer devices, use the power-compensation feature
to overcome the loss of the fixture or probes, thereby
delivering a known stimulus power to the DUT

24 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications continued
Control relative
magnitude and phase
between two sources
for active output-load
control
(S93088A)

Amplifier load-pull measurement challenges
–– Amplifier gain, output power, and power efficiency are commonly measured under
different output-load conditions to determine the optimum large-signal match
–– Traditional approach uses mechanical tuners which can handle high power, but are
slow and cannot supply highly reflective loads

PNA-X with source-phase control provides
–– Control of second source to electronically tune reflection coefficient at output of
amplifier
–– Fast tuning speed and full reflection
–– Match correction for accurate amplitude and phase control
–– Measurements of amplifier output power, match, gain, and PAE under different load
conditions

Generate arbitrary
output-load impedances by
controlling the magnitude
and phase of the signal
coming out of port 3 while
the DUT is driven from port 1

Tips from the experts
–– Measurement setups can use receiver (R3, C...) or
wave (a3, b3…) terminology
–– Use the equation editor to calculate the power
delivered to the load (forward power - reverse power)
as sqrt(pow(mag(b3_3),2) - pow(mag(a3_3),2))
–– Use mechanical tuners and external software for
hybrid load-pull systems that can handle high output
power and achieve full reflection
–– When using external signal sources, connect
instruments to a common 10 MHz frequency
reference
Example of load circles generated by keeping the magnitude of ΓL constant
while sweeping phase

25 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Simplified test
of I/Q converters and
modulators, and
differential mixers
(S93089A)

I/Q and differential converter measurement challenges
–– Requires signals with 90° or 180° phase difference
–– Traditional approach uses hybrid couplers and/or baluns which are:
–– Inherently band-limited, requiring multiple components for broadband
measurements
–– Limited to fixed phase offsets, preventing phase sweeps to determine optimum
alignment
–– Lossy and inaccurate (+/- 3° to 12° typically)
–– Difficult to use with on-wafer setups

PNA-X differential and I/Q devices application
–– Provides accurate phase control of internal and external sources, eliminating the
need for hybrid couplers and baluns
–– Tunes receivers to all user-specified output frequencies needed to fully characterize
the DUT
–– Sweeps frequency to measure operating bandwidth or sweeps phase and power at a
fixed frequency to measure quadrature or differential imbalance
–– Includes match-corrected power measurements for highest accuracy

The I/Q inputs of this modulator can
be directly driven with the internal
sources of the PNA-X, eliminating the
need for a 90° hybrid coupler

Tips from the experts
–– Two additional external sources can be used to create differential I/Q drive
signals. The external sources must be routed through the PNA-X test set to
measurement receivers in order to achieve the desired phase offsets.
–– For I/Q modulators, DC power supplies or source-measurement units
(SMUs) can be routed through the bias tees to the I/Q inputs of the DUT.
Voltage sweeps can then be performed to help find the optimum I/Qvoltage offsets for the greatest amount of LO suppression.
–– Measure harmonics and total-harmonic distortion (THD) of differential
amplifiers by establishing a true-differential drive and tuning the PNA-X
receivers to all desired harmonics
–– Measure compression of differential mixers using power sweeps

26 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Testing differential
amplifiers under real
operating conditions
(S93460A)

Differential amplifier
measurement challenges
–– Conventional two-port VNAs with
baluns do not provide common-mode,
differential to common-mode,
and common to differential-mode
responses
–– Baluns are inherently band-limited
devices, which forces multiple test
setups for broad frequency coverage
–– Phase errors of baluns provide
inaccurate differential responses
–– Modern four-port VNAs provide mixedmode S-parameter measurements with
single-ended stimulus, but differential
amplifiers may respond differently
when in compression during real
operating environments

Differential
(180 out-of-phase)

Common
(in-phase)

3

4

1

2

Using the PNA-X’s two internal sources, iTMSA
drives the differential amplifier under real world
conditions, providing accurate mixed-mode
S-parameters in all operating environments.

PNA-X integrated true-mode
stimulus application (iTMSA)
provides:
–– Mixed-mode S-parameters of
differential amplifiers driven by true
differential and common-mode signals
–– Mismatch correction at the DUT input
to minimize phase errors between two
sources
–– Input-only drive mode that prevents
damage on amplifiers caused by
stimulus on the output port
–– In-fixture arbitrary phase offset and
phase-offset sweeps to optimize
input matching network for maximum
amplifier gain
DUT
mismatch

Amplitude error

Phase error

Without mismatch correction, the delivered signals to the DUT
will not be truly differential due to reflection from the DUT
input and the subsequent re-reflection from the sources. The
reflected signals overlay the original signals, causing phase
and amplitude imbalance. This effect can be corrected with
mismatch correction.

Phase after mismatch correction
Phase without mismatch correction

Phase Error (Deg)

Source
mismatch

Mixed-mode S-parameters.

Frequency (Hz)
iTMSA compensates for mismatch errors by measuring the
raw matches of the VNA and DUT, and precisely adjusting the
amplitude and phase of the two signals at the reference plane
to achieve ideal true-mode signals.

27 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Actual Sdd21:
Peaked at -5 degree phase offset

4

Power or Gain

3

Ideal Sdd21:
peaked at 0 degree phase offset

Differential
-5
-10 input power
1

2

Phase-offset sweeps change the phase-offset
value as if it were added in the fixture, enabling
input-matching circuit validation.

0

+10

Phase Offset(degrees from perfect differential)
In-fixture phase-offset sweeps reveal the optimal phase offset to achieve
the highest amplifier gain, which is essential to the design of the input
matching circuit.

Various stimulus and sweep settings are available in the Balanced DUT Topology
dialog, allowing you to select the right configuration for all of your balanced devices.

Tips from the experts
–– Input-only true-mode drive assumes a perfect match between the DUT output
and the VNA’s test ports, which is a good assumption when the DUT’s reverse
isolation is high. When the reverse isolation is low, adding attenuators on the
output port improves the system match and reduces mismatch errors.
–– When comparing the test results between single-ended and true-mode drive
conditions with the same effective delivered differential power, the individual
port powers with true-differential drive must be set 6 dB lower than the port
powers used with single-ended drive.
Single-ended drive
0 dBm port power = -3 dBm differential power + -3 dBm common-mode power
True differential drive
-3 dBm port power = –6 dBm port 1 single-ended power + –6 dBm port
3 single-ended power

28 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Powerful, fast and
accurate automatic
fixture removal (AFR)
(S93007A)

Powerful AFR features can handle a variety of
measurement needs
–– Single ended and differential devices
–– Left and right side of fixture can be asymmetrical
–– Through lengths can be specified or determined from open or short measurements
–– Band-pass time-domain mode for band-limited devices
–– Extrapolation to match DUT frequency range
–– Power correction compensates for fixture loss versus frequency
–– De-embed files can be saved in a variety of formats for later use in PNA, ADS, and
PLTS

AFR is the fastest way to de-embed a fixture from
the measurement

Measurement Challenge:
Many of today’s devices do
not have coaxial connectors
and are put in fixtures in
order to measure them in a
coaxial environment. Accurately
removing the effects of the
fixture is required to get a good
measurement of the device under
test (DUT).

A five-step wizard guides you through the process to characterize
your fixture and remove it from your measurement.

Yesterday without AFR
Complicated modeling in EM simulation software or multiple calibration
standards fabricated on board were needed to characterize and remove a
fixture.

Today with AFR
First calibrate in coax with the reference planes at the inputs to your fixture.
Then measure one or more standards designed as a replica of the fixture’s
2-port through, or fixture half terminated with an open or short.
Or, even faster: just measure the actual fixture itself before the DUT is installed
for the open standard. AFR automatically characterizes and removes your
fixture from the measurement.
DUT and Fixture
Coax
input

Fixture A

DUT

Left-half fixture

Right-half fixture

Open or Short Standard

Thru Standard
Coax
input

Fixture A

Fixture B

Left-half fixture Right-half fixture

Coax
input

Fixture B

Coax
input

Coax
input

Fixture A
Left-half fixture

Fixture B
Right-half fixture

Coax
input

29 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

AFR accuracy is comparable to on-board TRL calibration,
but much easier to accomplish.

A relative comparison of various fixture error-correction methods

Measurement example

Fixture A
Beatty Standard DUT

DUT

Fixture B

In the plots below, the green trace is a measurement of a Beatty Standard DUT
before AFR fixture removal. The red trace is the DUT with AFR open-standard
fixture removal. The blue trace is the DUT with AFR thru-standard fixture
removal. The effects of fixture mismatch and length are removed from the
DUT measurements. Good correlation is shown between the AFR open- and
thru-standard fixture characterizations.

S11 and S21 in frequency domain

30 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Extending the PNA-X
to millimeter-wave
frequencies

PNA-X’s unique hardware architecture provides:
–– Single-sweep millimeter-wave network analyzer configurations with frequency
coverage from 900 Hz to 120 GHz
–– Two- and four-port solutions for measurements on a wide variety of single-ended
and balanced millimeter-wave devices
–– Differential and I/Q measurements at millimeter-wave frequencies using two, phasecontrolled internal sources
–– Fully integrated solution for millimeter-wave pulsed-RF measurements using built-in
pulse modulators and pulse generators
–– Accurate leveled power at millimeter-wave frequencies with advanced source-power
calibration methods
–– Two internal sources allow direct connection of THz frequency-extender modules

Two- and four-port
broadband, single-sweep
solutions, 900 Hz to 120 GHz

N5290/91A PNA-X based 120 GHz
millimeter-wave network analyzers are only
available in four-port configurations. Two-port
solutions are available using a two-port PNA
network analyzer. N5290/91A broadband systems
provide test capability to fully characterize
passive, active, and frequency converting devices.
These systems are compact replacements for
N5251A systems, with superior performance and
wider frequency range.

Two- and four-port banded
configurations

The N5262A millimeter-wave test-set
controller connects four millimeter-wave
test modules to the PNA-X. For two-port
measurements, the N5261A millimeter-wave
test-set controller is available.

Terahertz measurements

Two-port direct connect
system architecture

Direct connection of VDI modules to a four-port PNA-X
enables S-parameter measurements to 1.5 THz.

Block diagram of a two-port millimeter-wave
system using a four-port PNA and two
millimeter-wave frequency extenders.

31 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Millimeter-wave
applications with
the PNA-X
Tips from the experts
–– For repeatable calibrations, always
use a torque wrench for the 1.0
mm calibration standards along
with another wrench that prevents
rotation of the test-port or testcable connectors.
–– For repeatable measurements,
ensure the cables between the
instrument and extender modules
are physically supported along
their length.
–– Use Keysight’s downloadable
macro for easy configuration of
direct-connect, banded millimeterwave setups that don’t require a
test-set controller.
–– For multi-channel setups, use the
Cal All Channels feature to simplify
the calibration process.

Millimeter-wave spectrum
analysis

Multi-channel measurements at
millimeter-wave frequencies

PNA-based millimeter-wave systems
can take full advantage of spectrum
analysis applications. This capability
enables high-order harmonic and spur
measurements at millimeter-wave
frequencies.

Fully characterize active devices at
millimeter-wave frequencies using multiple
PNA software applications, with a single
set of connections or wafer touch-downs.
Calibration of multi-channel setups is easy
using the Cal All Channels feature.

The PNA’s spectrum analyzer application is used
to measure the harmonics of a millimeter-wave
amplifier.

In addition to S-parameters, the spectrum analysis,
gain compression, and differential I/Q applications
are used to characterize a 10 MHz to 125 GHz
amplifier.

Scalar mixer measurements

Differential and I/Q measurements
at millimeter-wave frequencies

Measure conversion loss or gain
plus input and output matches of
mixers and frequency converters at
millimeter-wave frequencies.

A dual-source PNA with an N5292A four-port
controller and broadband frequency-extender
modules characterize mixers and converters at
millimeter wave frequencies. The PNA’s second
source can be used to provide an LO signal to a
mixer.

–– Highest measurement accuracy in the
industry using advanced error-correction
methods
–– Integrated phase sweeps with power control

True-differential measurement of a balanced
trans-impedance amplifier using a four-port PNA,
the N5292A controller, and N5293A frequency
extenders.

32 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Nonlinear waveform
and X-parameter
characterization
(S94510/514/518/520/521A)

High-power design challenges
–– Active devices are commonly driven into nonlinear regions, often by design to
increase power efficiency, information capacity, and output power
–– Under large-signal drive conditions, active devices distort time-domain waveforms,
generating harmonics, intermodulation distortion, and spectral regrowth
–– Current circuit simulation tools that rely on S-parameters and limited nonlinear
behavioral models are no longer sufficient to fully analyze and predict nonlinear
behavior of devices and systems
–– Fewer design iterations are required to meet current time-to-market demands

S-parameters in a nonlinear world
In the past, when designing systems with high-power amplifiers (HPAs), designers
measured amplifier S-parameters using a vector network analyzer, loaded the results
into an RF simulator, added other measured or modeled circuit elements, and then ran
a simulation to predict system performance such as gain and power-efficiency under
various loads.
Since S-parameters assume that all elements in the system are linear, this approach
does not work well when attempting to simulate performance when the amplifier is in
compression or saturation, as real-world HPAs often are. The errors are particularly
apparent when simulating the combined performance of two cascaded devices that
exhibit nonlinear behavior. While engineers may live with this inaccuracy, it invariably
results in extensive and costly empirical-based iterations of the design, adding
substantial time and cost to the design and verification process.

33 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Breakthrough technology accurately characterizes nonlinear
behaviors
Testing today’s high-power devices demands an alternate solution—one that quickly
and accurately measures and displays the device’s nonlinear behavior under large
signal conditions, and provides an accurate behavioral model that can be used
for linear and nonlinear circuit simulations. The Keysight nonlinear vector network
analyzer (NVNA) and X-parameters provide that solution.

Keysight’s award-winning NVNA goes beyond S-parameters to:
–– Efficiently and accurately analyze and design active devices and systems under
real-world operating conditions, to reduce design cycles by as much as 50%
–– Gain valuable insight into device behavior with full nonlinear component
characterization (S94510A)
–– Display calibrated time-domain waveforms of incident, reflected, and
transmitted waves of the DUT in coaxial, in-fixture, or on-wafer environments
–– Show the amplitude and phase of all harmonic and distortion spectral
products to design optimal matching circuits
–– Create user-defined displays such as dynamic load lines
–– Measure with full traceability to the National Institute of Science and
Technology (NIST)
–– Provide fast and powerful measurements of DUT nonlinear behavior using
X-parameters (S94514A)
–– Extend linear S-parameters into nonlinear operating regions for accurate
predictions of cascaded nonlinear device behavior using measurement-based
data
–– Easily import the NVNA’s X-parameters into Keysight’s Advanced Design
System (ADS) to quickly and accurately simulate and design nonlinear
components, modules and systems
–– Measure memory effects such as self heating and signal-dependent bias
changes (S94518A)
–– Adds load-dependent nonlinear component behavior to X-parameters from
external sources or external impedance tuners* (S94520A)
–– Adds direct control of external sources or impedance tuners for load-dependent
nonlinear X-parameters (S94521A)
*Requires an additional load-control application.

Measure complete linear and nonlinear component behavior with the
Keysight NVNA, and then accurately perform simulations and optimizations
with Keysight’s Advanced Design System.

Keysight’s NVNA software applications and accessories convert a Keysight 4-port
PNA-X network analyzer into a high-performance nonlinear vector network analyzer.

34 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications
Fast and accurate
RF subsystem for
antenna measurements

Challenges of antenna and radar cross-section (RCS) measurements
–– Many data points must be collected, resulting in long test times
–– In far-field and RCS measurements, signals can be close to the noise floor of the test
receiver, resulting in noisy measurements
–– Large installed-software base exists for 8530A antenna receivers, which have been
discontinued and are no longer supported

AUT
Delta
elevation
Sum

Delta
Azimuth
Scanner controller

B/R2
Source 2 out

A/R2
R1/R2

LAN

PNA-X
network analyzer

PNA-X configured for near-field measurements.

PNA-X-based antenna solutions provide:
–– Flexibility in system design: choose a standard PNA-X or an N5264B
low-cost dedicated measurement receiver based on PNA-X hardware
–– Fast measurements: 400,000 data points per second simultaneously on five
receivers, yielding three to five times improvement in test times compared
to the 8530A
–– Large data collections with 500 million-point circular FIFO data buffer
–– Excellent measurement sensitivity via selectable IF bandwidths and pointaveraging mode
–– Built-in 8530A code emulation for easy migration

Controller

Simplified transceiver
Isolation housing

RF cable

Gating PA

TR
Isolation housing

RF cable
PNA-X configured for radar
cross-section measurements.

Gating LNA

Customer
furnished
antenna
RF cable

35 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Why should I migrate my 8530A system to the new
PNA-X measurement receiver?
–– 8530A is no longer supported, so maintaining existing systems is getting
harder and harder
–– PNA-X measurement receiver…
–– Offers built-in 8530A code emulation for full reuse of existing
measurement software
–– Is fully compatible with your existing 8530A system components
–– Features 80 times improvement in data acquisition time
–– Contains an optional built-in high-output-power source (Option 108)
that can be used as an LO for remote mixers or frequency converters

What is the best choice for an antenna receiver?
Application

N5264B
measurement
receiver

N524xB
PNA-X

Comments

Near-field

No
(requires
external
source)

Yes

Achieve faster measurement throughput
with internal source
Can use VNA for general-purpose component test

Compact
range

Yes

Yes

Choice depends on the size of the antenna range

Far-field

Yes

No
(higher cost)

Distributed approach increases measurement
sensitivity by strategic placement of system
components

Pulsed RF

No

Yes

PNA-X offers built-in pulse generators and
modulators that simplify the system configuration

Optional
amplifier

Source
antenna
85320A
test mixer

Trigger in/out

PSG, EXG, or MXG
signal
source

85320B
reference mixer
LO in

LO out (Option 108)

7.606
MHz

Router hub
10 MHz
Trigger in/out
PNA-X measurement receiver configured for far-field measurements
(PNA-X Option 020 with IF inputs can also be used).

N5264B Option108

85309B
LO/IF
distribution
unit

36 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative
Applications

Tips from the experts

Fast and accurate
RF subsystem for
antenna measurements
(continued)

How can I control
external sources?
1. Connect PNA-X to source via LAN or GPIB
2. Use External Device Configuration feature
3. Under Properties section:
–– Type name of external source, change Device Type to Source, and
choose appropriate driver
–– Under Device Properties, choose between two trigger modes:
Software CW (trigger cables not needed, but slow), or Hardware
List (fast, but requires TTL triggers)
–– When the distance between the PNA-X and source is too far to
use BNC trigger cables (> 40 meters), then a Keysight E5818A
trigger box with LAN hub offers a good alternative

How do I get a common 10 MHz reference
signal to my source and PNA-X when it’s
too far to use BNC cables?
–– Use low-cost GPS-based satellite
receivers to obtain high-accuracy 10 MHz
reference signals
–– Place a GPS receiver near the transmit
source, and one near the PNA-X
–– This approach works for arbitrary
distances, from 100’s of meters
to many kilometers

GPS
receiver

GPS
receiver
10 MHz in

10 MHz in

Keysight N5181A

Keysight N5264B

37 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Outstanding Performance
Specification and Feature Comparison
N5249B
N5241B
N5242B

N5244B
N5245B

N5247B

Frequency range

10 MHz to 8.5 GHz
10 MHz to 13.5 GHz
10 MHz to 26.5 GHz1

10 MHz to 43.5 GHz
10 MHz to 50 GHz

10 MHz to 67 GHz1

System dynamic range
(at 20 GHz)

121 to 130 dB
depending on configuration
124 to 141 dB
with direct receiver access (typical)

121 to 125 dB
depending on configuration
133 to 137 dB
with direct receiver access (typical)

122 to 129 dB
depending on configuration 136 to 140
dB
with direct receiver access (typical)

Maximum output power
at test port (at 20 GHz)

+13 dBm (Option 201, 401)
+10 dBm (Option 21x, 41x)
+15 dBm (Option 22x)
+10 dBm (Option 42x)

+13 dBm (Option 201, 401)
+10 dBm (Option 21x, 41x)
+10 dBm (Option 22x, 42x)

+11 dBm (Option 201, 401)
+8 dBm (Option 219, 419)
+7 dBm (Option 224, 423)

Maximum power sweep
range
Corrected
specifications2

38 dB
(2-port cal, 3.5 mm)
Dir 44 to 48 dB
SM 31 to 40 dB
LM 44 to 48 dB
Refl trk ± 0.003 to 0.006 dB
Trans trk ± 0.015 to 0.104 dB

Trace noise

(2-port cal, 2.4 mm)
Dir 36 to 42 dB
SM 31 to 41 dB
LM 35 to 42 dB
Refl trk ± 0.001 to 0.027 dB
Trans trk ± 0.020 to 0.182 dB

(2-port cal, 1.85 mm)
Dir 34 to 41 dB
SM 34 to 44 dB
LM 33 to 41
Refl trk 0.01 to 0.33
Trans trk 0.061 to 0.17 dB

0.002 dB rms (1 kHz BW)

Harmonics (ports 1, 3)

10 MHz to 2 GHz
> 2 GHz

-51 dBc typical
-60 dBc typical

Bias tees, maximum
current, voltage
Dimensions, H x W x D
(with feet, handles)
Weight (nominal net),
2-port
4-port

± 200 mA, ± 40 VDC
280 x 459 x 578 mm

280 x 459 x 649 mm

280 x 459 x 649 mm

27 kg
37 kg

46 kg
49 kg

46 kg
49 kg

1. The following model configurations work down to 900 Hz: N5242B Option 425 with or without Option 029, and N5247B Option 425 with Option 029.
2. Dir = directivity; SM = source match; LM = load match; Refl trk= reflection tracking; Trans trk = transmission tracking

38 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X Configuration Information
PNA-X Network Analyzers
Available options
Test set

Description

Option 201

2-ports, single source, and configurable test set

Option

2172

2-ports, single source, configurable test set, and receiver
attenuators

Additional information
Not available on N5247B

Option 219

2-ports, single source, configurable test set, receiver attenuators,
and bias tees

Option 2222

2-ports, dual sources, configurable test set, receiver attenuators,
combiner, and mechanical switches

Includes additional RF jumpers for maximum setup flexibility

Option 224

2-ports, dual sources, configurable test set, receiver attenuators,
combiner, mechanical switches, and bias tees
4-ports, dual sources, and configurable test set
4-ports, dual sources, configurable test set, and receiver attenuators
4-ports, dual sources, configurable test set, receiver attenuators,
and bias tees
4-ports, dual sources, configurable test set, receiver attenuators,
combiner, and mechanical switches
4-ports, dual sources, configurable test set, receiver attenuators,
combiner, mechanical switches, and bias tees
4-ports, dual sources, configurable test set, receiver attenuators,
combiner, mechanical switches, bias tees, and low-frequency
extension

Includes additional RF jumpers for maximum setup flexibility

Add IF inputs
Add pulse modulator to first source
Add pulse modulator to second source
Add low-noise receiver

Used for antenna measurements and mm-wave extenders

Option 4011
Option 4171,2
Option 4191
Option 4221,2
Option 4231
Option 4251

Not available on N5247B

Includes additional RF jumpers for maximum setup flexibility
Includes additional RF jumpers for maximum setup flexibility
Includes additional RF jumpers for maximum setup flexibility.
Only available for N5242B with or without low-noise receiver
Option 029, and for N5247B with Option 029.

Additional hardware
Option 020
Option 021
Option 022
Option 029

Requires one of Option 22x, 40x, 41x, or 42x
S93029A application software is needed to control the noise
receiver for noise figure and noise power measurements. For
N5241/42/49B, requires one of options 21x, 22x, 41x, or 42x.
For N5244/45/47B, requires one of options 22x or 42x. On
N5247B, noise receiver works up to 50 GHz only.

1. To independently control the frequency of the second internal source, one of the following software applications is required:
S93080/029/082/083/084/086/087/089/090x/093/094A
2. Recommended for high-power setups. The maximum power rating on the test port couplers is +43 dBm (additional attenuators or isolators are typically required to protect
other components inside the instrument).

39 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X Configuration Information (continued)
For PNA-X Series
Application

Description

Additional Information

software1

S93007A

Automatic fixture removal

S93010A
S93025A

Time domain analysis
Basic pulsed-RF measurements

S93026A

Advanced pulsed-RF measurements

Includes control of internal pulse generators, and provides pulse widths to
100 ns using wideband detection, and 20 ns using narrowband detection

S93029A

Noise figure measurements with vector correction2

Standard receivers are used if hardware option N524xB-029 is not
present

S93080A

Frequency-offset measurements

Provides ability to independently set the frequency of internal sources
and receivers, and to configure external sources. This functionality is
included with S93029/082/083/084/086/087/089/090x/093/094A.

S93082A

Scalar mixer/converter measurements

Includes control of internal pulse generators and provides pulse widths to
200 ns using wideband detection

measurements 3

S93083A

Vector and scalar mixer/converter

S93084A

Embedded-LO capability

S93086A

Gain-compression measurements

S93087A

Intermodulation distortion measurements 4

S93088A

Source phase control

S93089A

Differential and I/Q device measurements
Spectrum analysis, up to 8.5

Spectrum analysis, up to 13.5 GHz5

S930902A

Spectrum analysis, up to 26.5 GHz 5

S930904A

Spectrum analysis, up to 43.5 GHz5

S930905A

Spectrum analysis, up to 50 GHz5

S930907A

Spectrum analysis, up to 67 GHz5

S930909A

Spectrum analysis, up to 90 GHz5

S93093A

Spectrum analysis, up to 110 GHz

S93094A

Spectrum analysis, beyond 110 GHz

S93118A

Fast CW measurements

S93460A

True-mode stimulus

1.
2.
3.
4.
5.
6.
7.

N-port

Not available with PNA test set options 200, 210, 400, and 410
Requires a 4-port test set option (4xx)

GHz5

S930901A

S93551A

Provides SMC+Phase and VMC measurement classes
Works with S93029/082/083/086/087A

S930900A

measurements6,7

Provides SMC measurement class. S93082A is a subset of S93083A.

Requires a 4-port test set option (4xx)
Not available with test set options 200, 210, 400, and 410

Supported software license types: fixed-perpetual (1FP), transportable-perpetual (1TP), fixed-1-year (1FY), and transportable-1-year (1TY) (note: S93093A, S93094A, S93898A,
and S94510A have fixed-license types only).
For N522xB and N5241/42/49B, vector-noise-corrected measurements require an ECal for use as an impedance tuner. For N5244/45/47B with Option 029, an internal tuner is
included. Noise calibration requires a power meter when using a standard receiver. When using the low-noise receiver (Option 029), either a power meter or a 346-series noise
source is required (Keysight 346C or 346C-K01 recommended). A power meter is required for measuring mixers and converters.
A configurable test set is required for VMC measurements to connect a reference mixer, or for SMC+Phase measurements using the comb-generator-based calibration. When
ordered with PNA test set Options 200, 210, 400, or 410 (no front-panel jumpers), phase and delay measurements can only by done using SMC+Phase with a calibration mixer.
S93087A can be used without PNA-X Options 22x or 42x, but external equipment such as a signal generator and a combiner may be required.
A test set with internal receiver attenuators is recommended to avoid receiver compression when measuring large input signals.
When ordering a test set, select an appropriate interface kit.
When configured as a multiport analyzer using S93551A and a multiport test set, the combiner feature of Option 22x or 42x is temporarily disabled. When configured as a
standalone analyzer, the combiner feature is enabled.

40 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X Configuration Information (continued)
For PNA-X Series

Description

Nonlinear vector network

Additional Information

analysis1

S94510A 2

Nonlinear component characterization

Requires test set option 41x or 42x

S94511A 2

Nonlinear component characterization

Export-control version. Requires test set option 41x or 42x

S94514A 3

Nonlinear X-parameters4,5

Requires test set option 42x and application software S94510A

S94518A

Nonlinear pulse-envelope domain

Requires hardware option 021 and application software S94510A, and
S93025A or S93026A

S94520A

Arbitrary load-impedance X-parameters 4,5

Requires application software S94514A

S94521A

Arbitrary load-control X-parameters 4,5

Requires application software S94520A

Required NVNA accessories
––
––
––
––

U9391C 10 MHz to 26.5 GHz or U9391F 10 MHz to 50 GHz or U9391G 10 MHz to 67 GHz comb generator (two required for nonlinear measurements)
Keysight power meter and sensor or USB power sensor
Keysight calibration kit, mechanical or ECal
Keysight signal generator, EXG, MXG, or PSG, used for X-parameter extraction (the PNA-X’s 10 MHz reference output can be used for 10 MHz tone
spacing applications)

Accessories, calibration options
For PNA-X Series

Description

Additional Information

Accessories
N524xB-1CM

Rack mount kit for use without handles

N524xB-1CP

Rack mount kit for use with handles

N1966A

Pulse I/O adapter

U9391C/F/G

Comb generator1

Calibration Software
S93898A

Built-in performance test software for standard compliant
calibration6

Calibration Documentation
N524xB-1A7

ISO 17025 compliant calibration

N524xB-UK6

Commercial calibration certificate with test data

N524xB-A6J

ANSI Z540 compliant calibration

Required NVNA accessories
–– U9391C 10 MHz to 26.5 GHz or U9391F 10 MHz to 50 GHz or U9391G 10 MHz to 67 GHz comb generator (two required for nonlinear measurements)
–– Keysight power meter and sensor or USB power sensor
–– Keysight calibration kit, mechanical or ECal
–– Keysight signal generator, MXG or PSG used for X-parameter extraction (internal 10 MHz reference output can be used for 10 MHz tone spacing
applications)
1.
2.
3.
4.
5.
6.

A fully configured NVNA system requires two comb generators with power supplies, Keysight calibration kits (mechanical or ECal), and a power meter and sensor or USB power
sensor.
Pulse capability requires option 021 and S93025A or S93026A.
Pulse capability requires option 021, 022 and S93025A or S93026A.
Requires EXG, MXG, or PSG signal generator for X-parameter extraction (the PNA-X’s 10 MHz reference output can be used for 10 MHz tone-spacing applications).
X-parameters is a trademark and registered trademark of Keysight Technologies in the U.S., Europe, Japan, and elsewhere. The X-parameters format and underlying equations are
open and documented. For more information, visit www.keysight.com/find/eesof-x-parameters-info.
Additional hardware required. Please refer to the analyzer’s service guide for required service-test equipment.

41 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Additional Information
Download the latest PNA-X application notes:
Bookmark this page to download the latest PNA-X application notes to gain in-depth
measurement knowledge.

www.keysight.com/find/pnaxapps

Get answers online from factory experts:
Discuss calibration, applications, product, and programming topics at Keysight’s online
network analyzer discussion forum. Get answers to your toughest measurement and
design challenges and browse prior discussion topics.

www.keysight.com/find/na_forum

42 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Gain deeper confidence
Whether you’re testing active or passive devices, the right mix of speed and performance
gives you an edge. In R&D, our vector network analyzers provide a level of measurement
integrity that helps you transform deeper understanding into better designs. On the
production line, our cost-effective VNAs provide the throughput and repeatability you
need to transform parts into competitive components. In the field, our handheld analyzers
deliver high-quality measurements wherever you need to go. Every Keysight VNA is the
ultimate expression of our expertise in linear and nonlinear device characterization. On
the bench, in a rack or in the field, we can help you gain deeper confidence.

myKeysight
www.keysight.com/find/mykeysight
A personalized view into the information most relevant to you.
Keysight Services
www.keysight.com/find/service
Keysight Services can help from acquisition to renewal across your
instrument’s lifecycle. Our comprehensive service offerings—one-stop
calibration, repair, asset management, technology refresh, consulting,
training and more—helps you improve product quality and lower costs.
Three-Year Warranty
www.keysight.com/find/ThreeYearWarranty
Keysight’s committed to superior product quality and lower total cost
of ownership. Keysight is the only test and measurement company with
three-year warranty standard on all instruments, worldwide. And, we provide
a one-year warranty on many accessories, calibration devices, systems and
custom products.
Keysight Assurance Plans
www.keysight.com/find/AssurancePlans
Up to ten years of protection and no budgetary surprises to ensure your
instruments are operating to specification, so you can rely on accurate
measurements.
Keysight Channel Partners
www.keysight.com/find/channelpartners
Get the best of both worlds: Keysight’s measurement expertise and product
breadth, combined with channel partner convenience.

www.keysight.com/find/pna
www.keysight.com/find/na_forum

For more information on Keysight
Technologies’ products, applications or
services, please contact your local Keysight
office. The complete list is available at:
www.keysight.com/find/contactus
Americas
Canada
Brazil
Mexico
United States

(877) 894 4414
55 11 3351 7010
001 800 254 2440
(800) 829 4444

Asia Pacific
Australia
China
Hong Kong
India
Japan
Korea
Malaysia
Singapore
Taiwan
Other AP Countries

1 800 629 485
800 810 0189
800 938 693
1 800 11 2626
0120 (421) 345
080 769 0800
1 800 888 848
1 800 375 8100
0800 047 866
(65) 6375 8100

Europe & Middle East
Austria
Belgium
Finland
France
Germany
Ireland
Israel
Italy
Luxembourg
Netherlands
Russia
Spain
Sweden
Switzerland

United Kingdom

0800 001122
0800 58580
0800 523252
0805 980333
0800 6270999
1800 832700
1 809 343051
800 599100
+32 800 58580
0800 0233200
8800 5009286
800 000154
0200 882255
0800 805353
Opt. 1 (DE)
Opt. 2 (FR)
Opt. 3 (IT)
0800 0260637

For other unlisted countries:
www.keysight.com/find/contactus
(BP-6-20-17)

*X-parameters is a trademark and registered trademark of Keysight Technologies in the US, EU,
JP, and elsewhere. The X-parameter format and underlying equations are open and documented.
For more information, visit; http://www.keysight.com/find/eesof-x-parameters-info

Protect your software investment:
Keysight protects your 8753, 8720 and 8510 software investment by
providing migration tools to reduce your code-conversion effort.
www.keysight.com/find/nadisco

DEKRA Certified
ISO9001 Quality Management System

www.keysight.com/go/quality
Keysight Technologies, Inc.
DEKRA Certified ISO 9001:2015
Quality Management System
This information is subject to change without notice.
© Keysight Technologies, 2010 - 2015, 2017
Published in USA, June 29, 2017
5990-4592EN
www.keysight.com



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