Keysight_PNA X_Series_Microwave_Network_Analyzers_datasheet_5990 4592EN Keysight PNA X Series Microwave Network Analyzers Datasheet 5990

User Manual: Keysight_PNA-X_Series_Microwave_Network_Analyzers_datasheet_5990-4592EN

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Keysight Technologies

PNA-X Series

Microwave Network Analyzers

For more information:

Contact your NSCA & Tra-Cal Small Business Partner:

Email info@nscainc.com or call your local sales rep today at 301-527-9200.

Industry’s Most Advanced

RF Test Solution

Reach for unrivaled

excellence

All of the PNA-X’s powerful measurement

applications can be used for on-wafer devices.

– Conversion gain/loss

– True-differential stimulus

– Nonlinear waveform and

X-parameter* characterization

– Antenna test

Build your optimal test system by selecting the frequency range for your specific

device-test needs without paying for functionality you don’t need.

10 MHz to 13.5 GHz

10 MHz** to 26.5 GHz

10 MHz to 43.5 GHz

10 MHz to 50 GHz

N5241B

N5242B

N5244B

N5245B

10 MHz** to 67 GHz

N5247B

PNA-X with mm-wave modules

10 MHz to 1.5 THz

10 MHz to 8.5 GHz

N5249B

Choose the leader in network analysis

The PNA-X Series of microwave network analyzers are the culmination of Keysight

Technologies, Inc. 40-year legacy of technical leadership and innovation in radio

frequency (RF) network analysis. More than just a vector network analyzer, the PNA-X

is the world’s most integrated and flexible microwave test engine for measuring active

devices like amplifiers, mixers, and frequency converters.

The combination of two internal signal sources, a signal combiner, S-parameter and

noise receivers, pulse modulators and generators, and a flexible set of switches and RF

access points provide a powerful hardware core for a broad range of linear and nonlinear

measurements, all with a single set of connections to your device-under-test (DUT).

When you’re characterizing active devices, the right mix of speed and performance gives

you an edge. In R&D, the PNA family provides a level of measurement integrity that helps

you transform deeper understanding into better designs. On the production line, our

PNAs deliver the throughput and repeatability you need to transform great designs into

competitive products. Every Keysight VNA is the ultimate expression of our expertise in

linear and nonlinear device characterization. Choose a PNA --and reach for unrivaled

excellence in your measurements and your designs.

World´s widest range of measurement applications

PNA-X applications bring speed, accuracy, and ease-of-use to common RF

measurements, in coaxial, fixtured, and on-wafer environments. Applications include:

– S-parameters (CW and pulsed)

– Noise figure

– Gain compression

– Intermodulation and

harmonic distortion

Network analysis technology down to the nanoscale

The PNA-X is also compatible with these Keysight measurement solutions:

–Physical layer test system (PLTS) software to calibrate, measure, and analyze linear

passive interconnects, such as cables, connectors, backplanes, and printed circuit

boards.

–Materials test equipment and accessories to help determine how your materials

interact with electromagnetic fields, by calculating permittivity and permeability.

–Award-winning scanning microwave microscope to create a powerful and unique

combination for topography measurements of calibrated capacitance and dopant

densities at nanoscale dimensions.

The right frequency for your application

** Some configuration options allow operation down to 900 Hz

02 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Multiple measurements

with a single instrument

Replace racks and stacks

With its highly integrated and versatile hardware and

re-configurable measurement paths, the PNA-X replaces

racks and stacks of equipment – with a single instrument.

One PNA-X can take the place of the following test gear:

– Network analyzer

– Spectrum analyzer

– Two signal sources

– Noise figure meter/analyzer

– Power meters

– Switch matrix

– Digital voltmeter

Benefits of a PNA-X-based solution

–Simpler test systems for...

...lower hardware and software costs

...quicker development time and faster time to manufacturing

...less downtime and lower maintenance costs

...smaller size and lower power consumption

–Faster test times for...

. ..improved throughput

–Higher accuracy for...

...better yields and better specifications

–Flexible hardware for...

...greater adaptability to future test requirements

With a single set of connections to an amplifier or

frequency converter, the PNA-X can measure CW and pulsed

S-parameters, intermodulation distortion, gain and phase

compression versus frequency, noise figure, and more.

03 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Bottom Line

Results –

PNA-X Case

Studies Challenges

This customer manufacturers over 4600 RF components, with typically 1000 devices

in the manufacturing process at any given time. Devices included filters, multipliers,

amplifiers, and switches, from 10 MHz to 60 GHz. They needed to simplify the test

system for one particular multiport device, so they set out to develop an operator

independent automated test system (ATS). Key challenges included:

– Complicated and expensive test systems with multiple racks of equipment

and miles of test cables

– Multiple cable swaps and recalibrations required with extensive operator

intervention and downtime

– Significant retesting of devices and high system downtime

Results

The PNA-X’s ability to incorporate more active measurements into a single

instrument than any other product on the market provided:

–Faster test times: Reduced test times from four hours per temperature to 24 minutes

when compared to the prior ATS, resulting in a test-time reduction of 95%

–Reduced equipment count: Replaced nine racks of equipment with three, 12-port

PNA-X network analyzers

–Increased operator productivity: Enabled operators to monitor four test stations

simultaneously and eliminated the need for single-operator test stations

–Reduced re-testing and cable swaps

Case Study 1

Aerospace/defense component supplier reduces test time by 95%

Challenges

This aerospace company was conducting a specific panel-level test and wanted

to modernize its test systems and improve its test productivity and throughput.

Its legacy satellite payload test systems utilized a large amount of rack and stack

equipment accompanied by a big test overhead. The company was required to

exert a great deal of time and effort to program and maintain the test systems.

Results

Initially the aerospace company purchased four PNA-Xs (26.5 and 50 GHz

models). They were so impressed with the throughput and test productivity

results, that they purchased eight more analyzers. In one test case, the level

of improvement exceeded expectations—taking a 20-minute gain-transfer test

to just under a minute. Replacing their test system with the PNA-X effectively

modernized and simplified their test system which enabled:

–Faster test times: Complete test suite cut measurement times from three

hours to three minutes

–Reduced equipment count: Replaced a two-rack payload test system with a

single four-port PNA-X

–Smaller test system: Reduced the amount of equipment space and power

consumption

Case Study 2

Satellite designer and manufacturer reduces test time from

three hours to three minutes

“We selected Keysight’s

PNA-X because it eliminated

unnecessary cable swaps

between measurements and it

makes more active measurements

than any other network analyzer

out there. We used to make

S-parameter, vector-signal, and

noise-figure measurements with

separate test equipment—and

now with the PNA-X, we

can perform all of our active

measurements in one box.”

Test Engineering Manager

04 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Challenges

The manufacturer was developing a new broadband wireless network system and

needed a faster test system. Its existing test system consisted of two sources, a

spectrum analyzer, and power meters. Using this system, they estimated their new

product would take 30 minutes to test; however their speed goal was 15 minutes.

In addition to needing a faster test solution, the company also needed better

noise figure and distortion measurements, and it required single-connection

measurements on both up and down converters.

Results

Replacing their existing multi-instrument test system with a single four-port 50 GHz

PNA-X enabled the company to realize:

–Faster test times: Complete test suite cut test throughput from an estimated

30 minutes to under ten minutes

–Less downtime and reduced maintenance costs: Reducing the equipment

count reduced the setup time, as well as the headaches associated with

multiple equipment faults, and resulted in lowered annual calibration costs

–Cost savings on equipment: The cost of a four-port PNA-X was substantially

less expensive than the legacy multi-instrument test system.

Case Study 3

Wireless networking systems manufacturer reduces

throughput from 30 to 10 minutes

Challenges

The company needed to upgrade its legacy test systems, which consisted of

large switch matrices with network analyzers. They required technicians to keep

connecting and disconnecting the device-under-test (DUT) to multiple instruments

to make a range of different measurements. This approach was slow, costly, prone to

inaccuracy, and required a good deal of user intervention and additional hardware.

The company sought a solution that was easy to set up and use, decreased test time

and cost, minimized measurement inaccuracy, and offered a smaller footprint

Results

The company decided to purchase PNA-Xs rather than simply upgrade to newer,

code-compatible, drop-in instruments offered by the provider of its legacy test

equipment. This decision was made despite the fact that it meant significant rewrite

of legacy software. The company saved time over their existing test solutions and

realized:

–Easy setup and use: Technicians were able to easily connect to a DUT and

measure all different parameters in one pass—without additional hardware

–Faster and more accurate tests: Using just one instrument technicians were able

to conduct their required tests in significantly less time and improve accuracy

–Smaller test system: A single four-port PNA-X reduced their initial capital

expense, equipment count, floor space, and power consumption, which resulted

in lower overall test costs

Case Study 4

Global security company speeds test and improves

measurement accuracy

“We chose the PNA-X for its

unique single-connection,

multiple-measurement

capability. The PNA-X is also

the only solution we found

that can make accurate

nonlinear measurements by

using its extended NVNA

software option. This saves us

an amazing amount of design

time because it means we

can quickly and accurately

characterize the nonlinear

behavior of our devices even at

crazy high power levels.”

Test Engineering Manager

05 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Intuitive, Speed-Driven Features

Flexible, modern

user interface: front

panel keys, tabbed

soft panel, pulldown

menus, customizable

toolbar, right-click

shortcuts, drag-and-

drop operation, and

12.1” touch screen

Up to 15

markers

per trace

State-of-the-art

calibration

capabilities

Context

sensitive,

built-in help

200 measurement

channels and

unlimited traces

Configurable

test set available

on all models

Linear, log,

power, CW, phase, and

segment sweeps

Equation editor

and time-domain

analysis

Quick access

for ECal and

other USB

devices

Undo/Redo

cancels or

restores

previous

entries

06 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Hardware for Exceptional Flexibility

Second GPIB

interface for

controlling signal

sources, power

meters or other

instruments

Pulse I/O connector

for controlling

external modulators

or synchronizing

internal pulse

generators

Power I/O connector

provides analog

inputs and outputs

for PAE and other

measurements

Test set I/O for

controlling external

multiport and

millimeter-wave

test sets

RF jumpers for adding

signal-conditioning

hardware or other

test instruments

LAN and

device-side USB

interfaces provide

alternatives to

GPIB for remote

programming

Removable

hard drive

for secure

environments

Flexible triggers for

measurement control

and for synchronizing

external sources or

other instruments

Direct IF

access for

remote mixing in

antenna ranges

07 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

C

R3

Test port 1 Test port 3

R1

Test port 4

R4

A

D

Rear panel

Rear panel

1

2

3

4

Source 1

OUT 1 OUT 2

Pulse

modulator

Pulse

modulator

Source 2

OUT 1 OUT 2

Test port 2

R2

B

Noise receiver

8.5/

13.5/26.5

43.5/50 GHz

To

receivers

LO

+28 V

Signal

combiner

+

–

J9 J10 J11 J8 J7

J2 J1 J4 J3 3

6

4

5

1

2

3

Pulse

generators

Flexible

Architecture

1. Each test port includes test and reference couplers and receivers, source and

receiver attenuators, and a bias tee, for maximum accuracy and flexibility.

2. The built-in signal combiner greatly simplifies the setup for intermodulation

distortion and X-parameter measurements.

3. Internal pulse modulators enable integrated pulsed-RF testing over the full frequency

range of the instrument, eliminating expensive and bulky external modulators.

08 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

C

R3

Test port 1 Test port 3

R1

Test port 4

R4

A

D

Rear panel

Rear panel

1

2

3

4

Source 1

OUT 1 OUT 2

Pulse

modulator

Pulse

modulator

Source 2

OUT 1 OUT 2

Test port 2

R2

B

Noise receiver

8.5/

13.5/26.5

43.5/50 GHz

To

receivers

LO

+28 V

Signal

combiner

+

–

J9 J10 J11 J8 J7

J2 J1 J4 J3 3

6

4

5

1

2

3

Pulse

generators

4. Switchable rear-panel jumpers provide the flexibility to add signal-conditioning

hardware or route additional test equipment to the DUT without moving test

cables.

5. Setting up pulse timing for the pulse modulators and internal IF gates is easy

using the built-in pulse generators.

6. Internal low-noise receivers, along with advanced calibration and measurement

algorithms, provide the industry’s most accurate noise figure measurements.

09 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Pulsed-RF measurement challenges

– Pulse generators and modulators required for pulsed-RF measurements add

complexity in test setups

– For narrow pulses:

– Maximum IF bandwidth of analyzer is often too small for wideband detection

– Narrowband detection is slow, and measurements are noisy for low-duty-cycle

pulses

PNA-X pulsed-RF measurements provide:

– S93025A provides a simple user interface for full control of two internal pulse

modulators (Options 021 and 022), four internal independent pulse generators, and

point-in-pulse measurements with pulse widths as narrow as 200 ns, and pulse-

profile measurements with 50 ns minimum resolution

– S93026A adds point-in-pulse measurements with 20 ns minimum pulse width, and

pulse profile measurements with 10 ns minimum resolution

– Improved measurement speed and accuracy for narrowband detection using

hardware filters and patented spectral-nulling and software IF-gating techniques

– Measurements using wideband detection with pulse widths as narrow as 100 ns

– Pulse I/O connector on rear panel for synchronization

with external equipment and DUT

– Accurate active-component

characterization using unique

application measurement

classes for gain compression,

swept-frequency/power IMD,

and noise figure

Pulsed-RF measurement application automatically optimizes internal

hardware configuration for specified pulse conditions to dramatically

simplify test setups. Alternately, users can choose to manually set up the

hardware for unique test requirements.

Pulse profile measurement using narrowband detection technique allows

30 measurement points within 300 ns pulse, with 10 ns timing resolution.

Providing the first one-box pulsed-RF

test system, the PNA-X sets a new

standard for simplicity, speed, and

accuracy.

By the 1990s,

the HP 8510 was

the industry-

standard for

pulsed-RF

vector network

analyzers.

The PNA

Series replaced the

pulsed 8510 with a

bench-top solution.

Innovative

Applications

Simple, fast and

accurate pulsed-RF

measurements

(S93025/026A, Options 021, 022)

10 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X’s narrowband detection method used for narrow pulse widths

(< 267 ns) employs special hardware and patented software-gating

techniques to improve system dynamic range for low-duty-cycle

measurements by 40 dB compared to PNA-based pulsed-RF systems.

Using receiver leveling improves the pulsed-RF power

accuracy from ± 1 dB to less than 0.05 dB.

Above measurements compare the results with and without receiver

leveling in GCA measurements. Inaccurate stimulus causes large errors in

power-dependent measurements such as input and output power at the

compression point versus frequency.

The PNA-X accurately characterizes active devices under pulsed operation

with a single set of connections to the DUT—pulsed S-parameters, pulse

profile (input and output power in the time domain), gain compression

versus frequency, and swept-frequency IMD are measured in this example.

Tips from the experts

– Compared to sweep averaging, point averaging typically

provides faster results when averaging is needed to lower

noise and improve accuracy of measurements using

wideband detection.

– During source power calibrations, power sensors read the

average power, while the analyzer sets the peak power

of the pulsed stimulus. To compensate for the difference

between the peak and average power, use the power offset

feature with the value of 10 log (duty cycle).

– The minimum pulse width for point-in-pulse measurements

using wideband detection is determined by the number

of samples required for the IF bandwidth (IFBW). For

example, the minimum pulse width is 100 ns with

15 MHz IFBW, 300 ns with 5 MHz IFBW, and 1.44 μs with

1 MHz IFBW. When working at the minimum pulse width

for a particular IFBW, it is important to precisely set the

measurement delay (with 10 ns resolution) to align the

pulse modulation and the data acquisition period.

– In pulse mode, it is important to use receiver leveling

to maintain power-level accuracy for power-dependent

measurements, such as output power, compression, and

intermodulation distortion.

Freq (GHz)

dB

Output power

@ compression

Input power @ compression

R1 receiver leveling

Gain @ linear input power

Gain @

compression

Open loop

11 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Fast and accurate

noise figure

measurements

(S93029A, Option 029)

Noise figure measurement challenges with traditional,

Y-factor approach

– Multiple instruments and multiple connections

required to fully characterize DUT

– Measurement accuracy degrades in-fixture, on-wafer,

and automated-test environments, where noise

source cannot be connected directly to DUT

– Measurements are slow, often leading to

fewer measured data points and misleading

results due to under-sampling

PNA-X noise figure solution provides:

– Amplifier and frequency converter measurements with the highest accuracy

in the industry, using advanced error-correction methods

– Fast measurements: typically 4 to 10 times faster than Keysight’s NFA Series

noise figure analyzers

– Ultra-fast noise-parameter measurements when used with Maury Microwave

automated tuners, giving 200 to 300 times speed improvements

0

1

2

3

4

5

0 5 10 15 20 25

Frequency (GHz)

PNA-X method using source correction

Traditional Y-factor technique

Under-sampled data

Noise figure (dB)

On-wafer

automated-test

environment

Noise source

AUT

Wafer

probes

For Y-factor measurements, any electrical network connected between

the noise source and the DUT, such as cables, switch matrices, and wafer

probes, causes significant accuracy degradation.

For this 401 point measurement of an unmatched transistor, the PNA-X

exhibits much less ripple compared to the Y-factor method. The NFA

default of 11 trace points would give under-sampled and therefore

misleading results of the amplifier’s performance.

“I have several instruments in my equipment pool that can measure noise

figure — 8970s, NFAs, and spectrum analyzers. My biggest problem for noise figure

measurements was lack of correlation—I’d get different answers depending on

which instrument I used. Now, with the PNA-X’s high accuracy, I know I’ll get the

right answer every time, no matter which PNA-X I use.”

Test Engineering Manager

12 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Noise-parameter measurements in minutes rather than days

Noise figure measurement methods

Y-factor: The most prevalent method for measuring noise figure is the Y-factor technique.

It relies on a noise source connected to the input of the device under test (DUT). When

the noise source is turned off, it presents a room temperature (cold) source termination.

When the noise source is turned on, it creates excess noise, equivalent to a hot source

termination. Under these two conditions, noise power is measured at the output of the

DUT, and the scalar gain and noise figure of the amplifier is calculated. The Y-factor

method is used by Keysight’s NFA Series and by spectrum analyzers with preamplifiers

and a noise figure personality option.

Cold Source: An alternate method for measuring noise figure is the cold source or direct

noise technique. With this method, only one noise power measurement is made at the

output of the DUT, with the input of the amplifier terminated with a room temperature

source impedance. The cold source technique requires an independent measurement

of the amplifier’s gain. This technique is well suited for vector network analyzers (VNAs)

because VNAs can measure gain (S21) extremely accurately by utilizing vector error

correction. The other advantage of the cold source method is that both S-parameter and

noise figure measurements can be made with a single connection to the DUT.

Source

Noise parameters vs. frequency

Frequency: 0.80 to 8.00 GHz

Setting up and making noise-parameter measurements is simple and fast using a PNA-X and a Maury

Microwave automated tuner. Maury’s latest software dramatically improves both the speed and

accuracy of noise-parameter measurements, making them a practical option for all RF engineers.

Noise

receiver

DUT

Noise

receiver

DUT

13 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Frequency

Innovative

Applications

Fast and accurate

noise figure measurements

(S93029A, Option 029,

continued)

PNA-X’s unique source-corrected noise figure solution

– Uses modified cold-source method, eliminating need for noise source when

measuring DUT

– Corrects for imperfect system source match by using vector correction to remove

mismatch errors plus an ECal module used as an impedance tuner to remove

noise-parameter-induced errors

– Maintains high measurement accuracy in fixtured, on-wafer, or automated-test

environments

– Accurately measures differential devices using vector de-embedding of baluns or

hybrids

DUT

Measure differential devices by

de-embedding baluns or hybrids.

At each test frequency, four or more noise measurements

are made with known, non-50-ohm source impedances.

From these measurements, 50-ohm noise figure

is accurately calculated.

DUT

Test port 1

R1

Test port 2

R2

A B

To receivers

LO

Source 2

Output 1

Source 2

Output 2

Pulse generators

1

2

3

4

+28 V

Noise receivers

10 MHz to

3 GHz

3 to

26.5 GHz

Source 1

OUT 1 OUT 2

Pulse

modulator

Source 2

OUT 1 OUT 2

Pulse

modulator

Noise source used

for calibration only.

Alternately, a power

sensor can be used

to calibrate the noise

receivers.

J9 J10

J11 J8 J7 J2 J1

Impedance

tuner for

noise figure

measurements

+

–

Rear panel

Block diagram of a two-port N5242B PNA-X with test set option 224, and low-noise receiver option 029.

A standard ECal module is used as an impedance tuner to help remove the effects of imperfect system

source match. N5244/45/47B models include a built-in impedance tuner.

14 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Tips from the experts

– Noise figure measurements are best done in a screen room to eliminate

spurious interference from mobile phones, wireless LAN, handheld

transceivers, etc.

– Batteries are sometimes used instead of mains-based power supplies to

eliminate conducted interference from sensitive LNA measurements

– Overall measurement accuracy can be estimated by using Keysight’s

Monte-Carlo-based noise figure uncertainty calculator

Keysight’s PNA-X noise

figure uncertainty calculator

(www.keysight.com/find/nfcalc)

includes the effects of mismatch

and noise-parameter-induced

errors caused by imperfect

system source match.

Noise figure measurement

uncertainty example in an

automated test environment

(ATE). The PNA-X’s source

corrected technique is

considerably more accurate

than the Y-factor method.

15 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Fast and accurate gain

compression versus

frequency measurements

of amplifiers and

converters

(S93086A)

Gain compression measurement challenges

– Characterizing amplifier or frequency converter compression over its operating

frequency range requires measurements at many frequency and power points, so

setting up the measurements, calibration, and data manipulation takes a lot of time

and effort

– A variety of errors degrade measurement accuracy, such as mismatch between the

test port and the power sensor and DUT during absolute power measurements, and

using linear S-parameter error correction in nonlinear compression measurements

PNA-X gain compression application (GCA) provides:

– Fast and convenient measurements with SMART Sweep

– Highly accurate results using a guided calibration that provides power and mismatch

correction

– Complete device characterization with two-dimensional (2D) sweeps, with the

choice of sweeping power per frequency, or sweeping frequency per power

– Flexibility with a variety of compression methods—compression from linear gain,

maximum gain, X/Y compression, compression from back-off, or compression from

saturation

Pin

Frequency

Gain Compression

point

Pin

Frequency

Gain Compression point

Iteration point

A network analyzer is commonly used for gain compression

measurements by performing power sweeps at multiple CW frequencies.

The PNA-X’s GCA makes it easy to characterize compression over the

DUT’s operating frequency range with extreme speed and accuracy, and

a simple setup.

Instead of a linear power sweep with many points, GCA’s SMART Sweep

uses an adaptive algorithm to find the desired compression point at each

frequency with just a few power measurements, thus significantly reducing

test times.

Complete device response to 2D sweeps—gain versus frequency and

power—can be extracted for device modeling.

Using only power correction, incident

power at compression point exhibits

large ripple due to DUT mismatch

Measurement ripple is reduced with GCA

by using power and mismatch correction

16 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Tips from the experts

Pin

Freq.

Gain Compression

Pin

Freq.

Gain Compression

Available compression methods

– Use the safe mode in SMART

Sweep to increment the input

power first with coarse and then

with fine steps to prevent over

driving the DUT

– When the DUT’s hysteresis or

thermal effects are in doubt,

it is recommended to sweep

frequency per power rather than

power per frequency, or to add

dwell time to lower the effects

from previous measurements

– Compression analysis capability

extracts the DUT response over

the power range at a specified

frequency point on any of the

compression traces

– Use the CompAI1 and CompAI2

internal voltmeter readings

that are synchronized to the

compression point to measure

power-added efficiency (PAE) at

compression for each frequency

Measured background data in

SMART Sweep with Safe Mode

Off (above) and On (below)—

more iterations are used as

the gain becomes closer to the

1 dB compression point with

Safe Mode On, which minimizes

excess drive power.

Compression from linear gain The linear gain is measured using the

specified linear (input) power level. The

compression point is calculated as the linear

gain minus the specified compression level.

Compression from max gain The highest gain value that is found at each

frequency is used as the max gain. The

compression point is calculated as the max

gain minus the specified compression level.

Compression from back off The gains at two input powers that are

different with the specified back off level are

compared. The compression point is found

as the highest input power with the gain

difference of the specified compression level.

X/Y compression The output powers at two input powers that

are different with the specified delta X are

compared. The compression point is found as

the highest input power with the output power

difference of the specified delta Y.

Compression from saturation The compression point is found at the highest

output power minus the value specified as

“From Max Pout”.

Input power

Gain

Linear gain

Specified compression level

Compression

point

Input power

Gain

Specified compression level

Compression

point

Max gain

Input power

Gain

Back off level

Specified compression level Compression

point

Input power

Output power

Delta X

Compression point

Delta Y

Input power

Output power

From Max Pout

Highest output power

17 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Fast two-tone

intermodulation

distortion (IMD)

measurements

with simple setup

(S93087A)

IMD measurement challenges

– Two signal generators, a spectrum

analyzer, and an external combiner are

most commonly used, requiring manual

setup of all instruments and accessories

– Test times are slow when swept-frequency

or swept-power IMD is measured

– Instruments and test setups often

cause significant measurement errors

due to source-generated harmonics,

cross-modulation, and phase noise, plus

receiver compression and noise floor

PNA-X with IMD application

provides:

– Fast swept IMD measurements

of amplifiers and frequency

converters, using internal

combiner and two internal

The PNA-X with IMD application replaces two

signal generators and a spectrum analyzer in the

system rack, simplifying the system configuration

and increasing test throughput.

IMD application measures third order

IMD and IP3 at 201 frequency (or power)

points in a matter of seconds, compared to

several minutes using signal generators and a

spectrum analyzer.

Frequency-offset mode is commonly available

in VNA’s, but conventional IF filter responses

exhibit high side lobes. The IM Spectrum

mode employs an optimized digital IF filter

and provides true spectrum measurement

capability in the PNA-X. Two internal sources with high output power, wide ALC range, -60 dBc harmonics, and a

high-isolation combiner, make the PNA-X an ideal instrument to drive the DUT for two-tone

IMD measurements. Wide dynamic-range receivers with high compression points enable

accurate measurements of low-power IMD products while the higher power main tones are

present.

DUT

Test port 1

R1

Test port 2

R2

A B

To receivers

LO

Source 2

Output 1

Source 2

Output 2

Rear panel

Source 1

OUT 1 OUT 2

Pulse

modulator

Source 2

OUT 1 OUT 2

Pulse

modulator

J9 J10

J11 J8

J7

J2 J1

Swept-frequency IMD

Swept-power IMD

Frequency

offset mode

IM Spectrum

sources

– Quick and easy measurements with simplified hardware setup and intuitive user

interface

– Guided calibration that simplifies the calibration procedure and provides high

measurement accuracy

– Spectrum analyzer mode for troubleshooting or making spurious measurements,

eliminating the need for a separate spectrum analyzer

– Very clean internal sources and wide receiver dynamic range, minimizing the

measurement errors caused by other instruments

18 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Tips from the experts

Swept IMD sweep types

– Calibrate at all measurement frequencies or at center frequencies only,

trading off productivity and accuracy

– Let the PNA-X control external signal generators to greatly simplify

swept IMD measurements of mixers and converters

– Use the Marker to IM Spectrum feature to show the spectrum at a

specified point on the swept IMD trace

– Use point averaging with IM Spectrum, especially when using a wide

resolution bandwidth, to reduce the noise deviation of the noise floor

with minimum speed impact

Calibrating all frequencies is recommended for

wide tone spacing. Although the calibration takes

longer with “all frequencies”, measurement speed

is not affected.

The IM Spectrum in the lower window shows the spectrum

corresponding to the Swept IMD marker at the center of the trace in the

upper window. Point averaging is applied to the IM Spectrum to reduce

the noise deviation.

IMD and IP3 versus LO power yields maximum IP3 with lowest possible

LO drive power. This helps specify the mixer setup to achieve maximum

efficiency while minimizing power consumption.

Sweep fc Sweep Delta F Power Sweep CW LO Power Sweep Segments

Center

Frequency Swept Fixed Fixed Fixed Fixed Swept (as defined by

segment table)

Tone

Spacing Fixed Swept Fixed Fixed Fixed Fixed

Tone

Powers Fixed Fixed Swept (coupled or

uncoupled) Fixed Fixed Fixed

Diagram

Cal all frequencies

Cal center frequencies

Delta F

f1 f2

fc

Delta F

f1 f2

fc

Delta F

f1 f2

fc

Delta F

f1 f2

Delta F

f1 f2

fc

Delta F

f1 f2

fc f1LO f2

fc

Delta F

f1 f2

fc

Delta F

f1 f2

fc

19 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Accurate

characterization

of mixers and

converters

(S93082/083/084A)

Mixer and converter

measurement challenges

– Traditional approach with spectrum

analyzer and external signal sources

is cumbersome, slow, and does

not provide phase or group delay

information

– Conventional VNAs require an external

signal source, which degrades sweep

speed

– Conventional VNAs provide phase or

group delay data relative to a “golden”

device

– Attenuators are often used to

minimize ripple due to input and output

mismatch, at the expense of dynamic

range and calibration stability

S93083A’s Scalar Mixer/Converter plus Phase

(SMC+Phase) makes mixer and converter

measurements simple to set up since reference

and calibration mixers are not required. Calibration

is easy to perform using three broadband

standards: a power meter as a magnitude

standard, a comb generator as a phase standard,

and an S-parameter calibration kit (mechanical or

ECal module).

The Vector Mixer/Converter technique provides

measurements of match, conversion loss/gain,

delay, phase difference between multiple paths

or devices, and phase shifts within a device.

Keysight’s patented Vector Mixer/

Converter calibration method uses

open, short, and load standards

to create a characterized-mixer

through standard.

SMC+Phase

LO

IF

IF+

RF IF = RF-LO

OPEN

SHORT

LOAD

Calibration mixer/filter pair

--

--

PNA-X frequency converter applications provide:

– Simple setup using internal second signal source as a local oscillator (LO) signal

– Typical measurement time improvement of 100x compared to spectrum analyzer-

based approach

– High measurement accuracy using two patented techniques:

– Scalar Mixer/Converter (SMC) provides match and most accurate conversion

loss/gain measurements by combining two-port and power-meter calibrations

(S93082A), and with (S93083A), calibrated absolute group delay measurements

without a reference or calibration mixer

– Vector Mixer/Converter (VMC)

provides measurements of match,

conversion loss/gain, delay, phase

difference between multiple paths

or devices, and phase shifts within

a device, using a vector-calibrated

through mixer (S93083A)

– Input and output mismatch correction

reduces ripple and eliminates the need

for attenuators

– Embedded-LO feature (S93084A)

extends SMC and VMC measurements

to converters with embedded LOs

without access to internal time bases

DUT

Reference

mixer

Calibration

mixer/filter

VMC

20 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

With two internal signal sources, the PNA-X provides fast measurements of both fixed

and swept IF responses.

Time-domain gating can remove ripple by removing unwanted, time-delayed responses

due to spurious signals.

DUT

Both SMC and VMC can be used to measure

converters with embedded LOs, without need for

access to internal time bases.

Swept LO

Fixed IF

Fixed LO

Swept IF

Tips from the experts

– Narrowing the IF bandwidth helps

eliminate spikes on the measurement

trace that result from LO feed through

and other spurious signals from the DUT

– To prevent source-unleveled errors

when measuring devices with high-level

spurious outputs (such as unfiltered

mixers), it is often helpful to increase the

amount of source attenuation to provide

better isolation between the DUT and

the PNA-X

– When making VMC measurements

on multistage converters, it is best to

create a single “meta-LO” signal that

can be used to drive the reference and

calibration mixers

– When measuring unfiltered mixers,

time-domain gating can be a useful tool

to reduce ripple by removing undesired,

time-delayed responses due to spurious

signals

SMC’s match correction greatly reduces mismatch errors in

conversion loss/gain measurements, eliminating the need for

attenuators at the ends of the test cables.

VMC’s match correction greatly reduces mismatch errors in group

delay measurements, eliminating the need for attenuators at the

ends of the test cables.

8720 without attenuators 8720 with attenuators

PNA without attenuators using SMC

GHz

dB

Competitor’s

VNA with

attenuators

PNA with VMC (no attenuators)

RF frequency (Hz)

Group delay

21 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative Applications

Fast multi-channel

spectrum analyzer for

component characterization

(S93090x/093/094A)

Spectrum analysis challenges for component testing

– Measuring spurious performance is time consuming, especially

when searching for low-level spurs over a broad frequency

range

– Long measurement times may force insufficient test coverage

– Characterizing spurs over operating range of the DUT is tedious

to accomplish or requires external control software

PNA-X spectrum analyzer (SA) application provides:

– Fast spurious searches over broad frequency ranges

– A multi-channel SA with internal swept-signal generators for

efficient spurious analysis of mixers and converters

– In-fixture spectrum measurements using VNA calibration

and de-embedding techniques

– Fast band- and noise-power measurements

– SA capability to the PNA-X’s single-connection, multiple-

measurement suite

Spectrum analyzer option adds fast spur search capability to the PNA-X, replacing

a standalone spectrum analyzer and switch matrix in component-characterization

test systems.

Above plot shows -84 dBm spurious measurements in the presence of a +10 dBm

signal, with (from top to bottom) approximate S/N (at RBW) of 80 dB (300 kHz),

90 dB (30 kHz), 100 dB (3 kHz), and 110 dB (300 Hz)

Sweep time versus span with 12 GHz center frequency for -80 dBm and -90 dBm

noise floor. The receiver attenuator is set to avoid compression with a +10 dBm

signal.

10-2

10-1

100

101

102

Sweep

Time (s) -80 dBm Noise Floor ( dBm)

103

-90 dBm Noise Floor ( dBm)

1 GHz 10 GHz 20 GHz 1 GHz 10 GHz 20 GHz

Span

x8

x10 x10

x420

x500

x460

Modern SA PNA SA

22 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Tips from the experts

– Choose different levels of software-image rejection to

trade-off measurement speed with thoroughness, based

on the spectral density of the measurement

– For harmonics measurements, add a separate SA channel

for each harmonic with a narrow frequency span and

RBW to optimize speed and sensitivity, and with enough

receiver attenuation to avoid internally-generated

harmonics

– To help identify spurious signals that might be interfering

with a measurement, use the Marker-to-SA feature to

easily create a spectrum display with the same stimulus

conditions at the marker position in SMC, swept-IMD, or

standard channels

– When using de-embedding to measure in-fixture or

on-wafer devices, use the power-compensation feature

to overcome the loss of the fixture or probes, thereby

delivering a known stimulus power to the DUT

VNA calibration and fixture de-embedding remove cable and fixture effects and

correct receiver response errors, providing calibrated in-fixture spectrum analysis.

Unlock true performance

with VNA calibration

Having spectrum analyzers on all ports of a mixer

or converter provides unparalleled insight into

the performance of the device. With a single set

of connections, the spurious content emanating

from all ports is readily apparent during

operation with fixed or swept stimuli. Measured

spurs can include LO, RF, and IF feedthrough,

harmonics, intermodulation products, and other

higher-order mixing products. Conversion loss

and match versus frequency is easily seen in a

companion SMC channel (bottom).

Output spectrum on

IF port

Output spectrum on

RF port

Input spectrum on

RF port

Output spectrum on

LO port

Measurement

plane

Device

plane

Coaxial

interface

Coaxial

interface

Measurement

plane

Test fixture

LO

RF

IF

1 2

3 4

Providing multi-channel spectrum analysis

Pout at

measurement

plane

Pout at

device

plane

No error

correction

23 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications continued

Control relative

magnitude and phase

between two sources

for active output-load

control

(S93088A)

Amplifier load-pull measurement challenges

– Amplifier gain, output power, and power efficiency are commonly measured under

different output-load conditions to determine the optimum large-signal match

– Traditional approach uses mechanical tuners which can handle high power, but are

slow and cannot supply highly reflective loads

PNA-X with source-phase control provides

– Control of second source to electronically tune reflection coefficient at output of

amplifier

– Fast tuning speed and full reflection

– Match correction for accurate amplitude and phase control

– Measurements of amplifier output power, match, gain, and PAE under different load

conditions

Example of load circles generated by keeping the magnitude of Γ

L constant

while sweeping phase

Generate arbitrary

output-load impedances by

controlling the magnitude

and phase of the signal

coming out of port 3 while

the DUT is driven from port 1

Tips from the experts

– Measurement setups can use receiver (R3, C...) or

wave (a3, b3…) terminology

– Use the equation editor to calculate the power

delivered to the load (forward power - reverse power)

as sqrt(pow(mag(b3_3),2) - pow(mag(a3_3),2))

– Use mechanical tuners and external software for

hybrid load-pull systems that can handle high output

power and achieve full reflection

– When using external signal sources, connect

instruments to a common 10 MHz frequency

reference

24 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Simplified test

of I/Q converters and

modulators, and

differential mixers

(S93089A)

I/Q and differential converter measurement challenges

– Requires signals with 90° or 180° phase difference

– Traditional approach uses hybrid couplers and/or baluns which are:

– Inherently band-limited, requiring multiple components for broadband

measurements

– Limited to fixed phase offsets, preventing phase sweeps to determine optimum

alignment

– Lossy and inaccurate (+/- 3° to 12° typically)

– Difficult to use with on-wafer setups

PNA-X differential and I/Q devices application

– Provides accurate phase control of internal and external sources, eliminating the

need for hybrid couplers and baluns

– Tunes receivers to all user-specified output frequencies needed to fully characterize

the DUT

– Sweeps frequency to measure operating bandwidth or sweeps phase and power at a

fixed frequency to measure quadrature or differential imbalance

– Includes match-corrected power measurements for highest accuracy

The I/Q inputs of this modulator can

be directly driven with the internal

sources of the PNA-X, eliminating the

need for a 90° hybrid coupler

Tips from the experts

– Two additional external sources can be used to create differential I/Q drive

signals. The external sources must be routed through the PNA-X test set to

measurement receivers in order to achieve the desired phase offsets.

– For I/Q modulators, DC power supplies or source-measurement units

(SMUs) can be routed through the bias tees to the I/Q inputs of the DUT.

Voltage sweeps can then be performed to help find the optimum I/Q-

voltage offsets for the greatest amount of LO suppression.

– Measure harmonics and total-harmonic distortion (THD) of differential

amplifiers by establishing a true-differential drive and tuning the PNA-X

receivers to all desired harmonics

– Measure compression of differential mixers using power sweeps

25 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Testing differential

amplifiers under real

operating conditions

(S93460A)

Differential amplifier

measurement challenges

– Conventional two-port VNAs with

baluns do not provide common-mode,

differential to common-mode,

and common to differential-mode

responses

– Baluns are inherently band-limited

devices, which forces multiple test

setups for broad frequency coverage

– Phase errors of baluns provide

inaccurate differential responses

– Modern four-port VNAs provide mixed-

mode S-parameter measurements with

single-ended stimulus, but differential

amplifiers may respond differently

when in compression during real

operating environments

PNA-X integrated true-mode

stimulus application (iTMSA)

provides:

– Mixed-mode S-parameters of

differential amplifiers driven by true

differential and common-mode signals

– Mismatch correction at the DUT input

to minimize phase errors between two

sources

– Input-only drive mode that prevents

damage on amplifiers caused by

stimulus on the output port

– In-fixture arbitrary phase offset and

phase-offset sweeps to optimize

input matching network for maximum

amplifier gain

2

1

4

3

Differential

(180 out-of-phase)

Common

(in-phase)

Using the PNA-X’s two internal sources, iTMSA

drives the differential amplifier under real world

conditions, providing accurate mixed-mode

S-parameters in all operating environments.

Mixed-mode S-parameters.

Without mismatch correction, the delivered signals to the DUT

will not be truly differential due to reflection from the DUT

input and the subsequent re-reflection from the sources. The

reflected signals overlay the original signals, causing phase

and amplitude imbalance. This effect can be corrected with

mismatch correction.

iTMSA compensates for mismatch errors by measuring the

raw matches of the VNA and DUT, and precisely adjusting the

amplitude and phase of the two signals at the reference plane

to achieve ideal true-mode signals.

Phase error

Amplitude error

DUT

mismatch

Source

mismatch Phase after mismatch correction

Phase without mismatch correction

Frequency (Hz)

Phase Error (Deg)

26 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

2

1

4

3

Phase-offset sweeps change the phase-offset

value as if it were added in the fixture, enabling

input-matching circuit validation.

Power or Gain

Phase Offset

(degrees from perfect differential)

+10 -10

Actual Sdd21:

Peaked at -5 degree phase offset

Ideal Sdd21:

peaked at 0 degree phase offset

Differential

input power

-5 0

Various stimulus and sweep settings are available in the Balanced DUT Topology

dialog, allowing you to select the right configuration for all of your balanced devices.

Tips from the experts

– Input-only true-mode drive assumes a perfect match between the DUT output

and the VNA’s test ports, which is a good assumption when the DUT’s reverse

isolation is high. When the reverse isolation is low, adding attenuators on the

output port improves the system match and reduces mismatch errors.

– When comparing the test results between single-ended and true-mode drive

conditions with the same effective delivered differential power, the individual

port powers with true-differential drive must be set 6 dB lower than the port

powers used with single-ended drive.

Single-ended drive

0 dBm port power = -3 dBm differential power + -3 dBm common-mode power

True differential drive

-3 dBm port power = –6 dBm port 1 single-ended power + –6 dBm port

3 single-ended power

In-fixture phase-offset sweeps reveal the optimal phase offset to achieve

the highest amplifier gain, which is essential to the design of the input

matching circuit.

27 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Powerful, fast and

accurate automatic

fixture removal (AFR)

(S93007A)

Powerful AFR features can handle a variety of

measurement needs

– Single ended and differential devices

– Left and right side of fixture can be asymmetrical

– Through lengths can be specified or determined from open or short measurements

– Band-pass time-domain mode for band-limited devices

– Extrapolation to match DUT frequency range

– Power correction compensates for fixture loss versus frequency

– De-embed files can be saved in a variety of formats for later use in PNA, ADS, and

PLTS

AFR is the fastest way to de-embed a fixture from

the measurement

Measurement Challenge:

Many of today’s devices do

not have coaxial connectors

and are put in fixtures in

order to measure them in a

coaxial environment. Accurately

removing the effects of the

fixture is required to get a good

measurement of the device under

test (DUT).

A five-step wizard guides you through the process to characterize

your fixture and remove it from your measurement.

DUT and Fixture

Thru Standard Open or Short Standard

Coax

input

Coax

input

Coax

input

Coax

input

Coax

input

Coax

input

Right-half fixtureRight-half fixture

Right-half fixture

Left-half fixtureLeft-half fixture

Left-half fixture

Fixture A DUT Fixture B

Fixture A Fixture B Fixture A Fixture B

Yesterday without AFR

Complicated modeling in EM simulation software or multiple calibration

standards fabricated on board were needed to characterize and remove a

fixture.

Today with AFR

First calibrate in coax with the reference planes at the inputs to your fixture.

Then measure one or more standards designed as a replica of the fixture’s

2-port through, or fixture half terminated with an open or short.

Or, even faster: just measure the actual fixture itself before the DUT is installed

for the open standard. AFR automatically characterizes and removes your

fixture from the measurement.

28 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

AFR accuracy is comparable to on-board TRL calibration,

but much easier to accomplish.

Measurement example

In the plots below, the green trace is a measurement of a Beatty Standard DUT

before AFR fixture removal. The red trace is the DUT with AFR open-standard

fixture removal. The blue trace is the DUT with AFR thru-standard fixture

removal. The effects of fixture mismatch and length are removed from the

DUT measurements. Good correlation is shown between the AFR open- and

thru-standard fixture characterizations.

A relative comparison of various fixture error-correction methods

Fixture A DUT Fixture B

Beatty Standard DUT

S11 and S21 in frequency domain

29 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Extending the PNA-X

to millimeter-wave

frequencies

PNA-X’s unique hardware architecture provides:

– Single-sweep millimeter-wave network analyzer configurations with frequency

coverage from 900 Hz to 120 GHz

– Two- and four-port solutions for measurements on a wide variety of single-ended

and balanced millimeter-wave devices

– Differential and I/Q measurements at millimeter-wave frequencies using two, phase-

controlled internal sources

– Fully integrated solution for millimeter-wave pulsed-RF measurements using built-in

pulse modulators and pulse generators

– Accurate leveled power at millimeter-wave frequencies with advanced source-power

calibration methods

– Two internal sources allow direct connection of THz frequency-extender modules

Two- and four-port

broadband, single-sweep

solutions, 900 Hz to 120 GHz

Two-port direct connect

system architecture

Two- and four-port banded

configurations

N5290/91A PNA-X based 120 GHz

millimeter-wave network analyzers are only

available in four-port configurations. Two-port

solutions are available using a two-port PNA

network analyzer. N5290/91A broadband systems

provide test capability to fully characterize

passive, active, and frequency converting devices.

These systems are compact replacements for

N5251A systems, with superior performance and

wider frequency range.

Block diagram of a two-port millimeter-wave

system using a four-port PNA and two

millimeter-wave frequency extenders.

The N5262A millimeter-wave test-set

controller connects four millimeter-wave

test modules to the PNA-X. For two-port

measurements, the N5261A millimeter-wave

test-set controller is available.

Direct connection of VDI modules to a four-port PNA-X

enables S-parameter measurements to 1.5 THz.

Terahertz measurements

30 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Tips from the experts

Millimeter-wave

applications with

the PNA-X

Millimeter-wave spectrum

analysis

PNA-based millimeter-wave systems

can take full advantage of spectrum

analysis applications. This capability

enables high-order harmonic and spur

measurements at millimeter-wave

frequencies.

Scalar mixer measurements

Measure conversion loss or gain

plus input and output matches of

mixers and frequency converters at

millimeter-wave frequencies.

Multi-channel measurements at

millimeter-wave frequencies

Fully characterize active devices at

millimeter-wave frequencies using multiple

PNA software applications, with a single

set of connections or wafer touch-downs.

Calibration of multi-channel setups is easy

using the Cal All Channels feature.

Differential and I/Q measurements

at millimeter-wave frequencies

– Highest measurement accuracy in the

industry using advanced error-correction

methods

– Integrated phase sweeps with power control

The PNA’s spectrum analyzer application is used

to measure the harmonics of a millimeter-wave

amplifier.

A dual-source PNA with an N5292A four-port

controller and broadband frequency-extender

modules characterize mixers and converters at

millimeter wave frequencies. The PNA’s second

source can be used to provide an LO signal to a

mixer.

In addition to S-parameters, the spectrum analysis,

gain compression, and differential I/Q applications

are used to characterize a 10 MHz to 125 GHz

amplifier.

True-differential measurement of a balanced

trans-impedance amplifier using a four-port PNA,

the N5292A controller, and N5293A frequency

extenders.

– For repeatable calibrations, always

use a torque wrench for the 1.0

mm calibration standards along

with another wrench that prevents

rotation of the test-port or test-

cable connectors.

– For repeatable measurements,

ensure the cables between the

instrument and extender modules

are physically supported along

their length.

– Use Keysight’s downloadable

macro for easy configuration of

direct-connect, banded millimeter-

wave setups that don’t require a

test-set controller.

– For multi-channel setups, use the

Cal All Channels feature to simplify

the calibration process.

31 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Innovative

Applications

Nonlinear waveform

and X-parameter

characterization

(S94510/514/518/520/521A)

High-power design challenges

– Active devices are commonly driven into nonlinear regions, often by design to

increase power efficiency, information capacity, and output power

– Under large-signal drive conditions, active devices distort time-domain waveforms,

generating harmonics, intermodulation distortion, and spectral regrowth

– Current circuit simulation tools that rely on S-parameters and limited nonlinear

behavioral models are no longer sufficient to fully analyze and predict nonlinear

behavior of devices and systems

– Fewer design iterations are required to meet current time-to-market demands

S-parameters in a nonlinear world

In the past, when designing systems with high-power amplifiers (HPAs), designers

measured amplifier S-parameters using a vector network analyzer, loaded the results

into an RF simulator, added other measured or modeled circuit elements, and then ran

a simulation to predict system performance such as gain and power-efficiency under

various loads.

Since S-parameters assume that all elements in the system are linear, this approach

does not work well when attempting to simulate performance when the amplifier is in

compression or saturation, as real-world HPAs often are. The errors are particularly

apparent when simulating the combined performance of two cascaded devices that

exhibit nonlinear behavior. While engineers may live with this inaccuracy, it invariably

results in extensive and costly empirical-based iterations of the design, adding

substantial time and cost to the design and verification process.

32 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Keysight’s award-winning NVNA goes beyond S-parameters to:

– Efficiently and accurately analyze and design active devices and systems under

real-world operating conditions, to reduce design cycles by as much as 50%

– Gain valuable insight into device behavior with full nonlinear component

characterization (S94510A)

– Display calibrated time-domain waveforms of incident, reflected, and

transmitted waves of the DUT in coaxial, in-fixture, or on-wafer environments

– Show the amplitude and phase of all harmonic and distortion spectral

products to design optimal matching circuits

– Create user-defined displays such as dynamic load lines

– Measure with full traceability to the National Institute of Science and

Technology (NIST)

– Provide fast and powerful measurements of DUT nonlinear behavior using

X-parameters (S94514A)

– Extend linear S-parameters into nonlinear operating regions for accurate

predictions of cascaded nonlinear device behavior using measurement-based

data

– Easily import the NVNA’s X-parameters into Keysight’s Advanced Design

System (ADS) to quickly and accurately simulate and design nonlinear

components, modules and systems

– Measure memory effects such as self heating and signal-dependent bias

changes (S94518A)

– Adds load-dependent nonlinear component behavior to X-parameters from

external sources or external impedance tuners* (S94520A)

– Adds direct control of external sources or impedance tuners for load-dependent

nonlinear X-parameters (S94521A)

*Requires an additional load-control application.

Breakthrough technology accurately characterizes nonlinear

behaviors

Testing today’s high-power devices demands an alternate solution—one that quickly

and accurately measures and displays the device’s nonlinear behavior under large

signal conditions, and provides an accurate behavioral model that can be used

for linear and nonlinear circuit simulations. The Keysight nonlinear vector network

analyzer (NVNA) and X-parameters provide that solution.

Measure complete linear and nonlinear component behavior with the

Keysight NVNA, and then accurately perform simulations and optimizations

with Keysight’s Advanced Design System.

Keysight’s NVNA software applications and accessories convert a Keysight 4-port

PNA-X network analyzer into a high-performance nonlinear vector network analyzer.

33 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Gating

Isolation housing

Isolation housing

Simplified transceiver

LNA

Gating

Controller

RF cable

RF cable

RF cable

Customer

furnished

antenna

PA

TR

Innovative

Applications

Fast and accurate

RF subsystem for

antenna measurements

Challenges of antenna and radar cross-section (RCS) measurements

– Many data points must be collected, resulting in long test times

– In far-field and RCS measurements, signals can be close to the noise floor of the test

receiver, resulting in noisy measurements

– Large installed-software base exists for 8530A antenna receivers, which have been

discontinued and are no longer supported

PNA-X-based antenna solutions provide:

– Flexibility in system design: choose a standard PNA-X or an N5264B

low-cost dedicated measurement receiver based on PNA-X hardware

– Fast measurements: 400,000 data points per second simultaneously on five

receivers, yielding three to five times improvement in test times compared

to the 8530A

– Large data collections with 500 million-point circular FIFO data buffer

– Excellent measurement sensitivity via selectable IF bandwidths and point-

averaging mode

– Built-in 8530A code emulation for easy migration

AUT

Scanner controller

LAN

PNA-X

network analyzer

Source 2 out

B/R2

A/R2

Delta

elevation

Delta

Azimuth

Sum

R1/R2

PNA-X configured for radar

cross-section measurements.

PNA-X configured for near-field measurements.

34 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PSG, EXG, or MXG

signal

source 85309B

LO/IF

distribution

unit

85320B

reference mixer

85320A

test mixer

Source

antenna

Optional

amplifier

Trigger in/out

10 MHz

N5264B Option 108

7.606

MHz

LO out (Option 108)

Router hub

LO in

Trigger in/out

PNA-X measurement receiver configured for far-field measurements

(PNA-X Option 020 with IF inputs can also be used).

Why should I migrate my 8530A system to the new

PNA-X measurement receiver?

– 8530A is no longer supported, so maintaining existing systems is getting

harder and harder

– PNA-X measurement receiver…

– Offers built-in 8530A code emulation for full reuse of existing

measurement software

– Is fully compatible with your existing 8530A system components

– Features 80 times improvement in data acquisition time

– Contains an optional built-in high-output-power source (Option 108)

that can be used as an LO for remote mixers or frequency converters

What is the best choice for an antenna receiver?

Application N5264B

measurement

receiver

N524xB

PNA-X

Comments

Near-field No

(requires

external

source)

Yes Achieve faster measurement throughput

with internal source

Can use VNA for general-purpose component test

Compact

range

Yes Yes Choice depends on the size of the antenna range

Far-field Yes No

(higher cost)

Distributed approach increases measurement

sensitivity by strategic placement of system

components

Pulsed RF No Yes PNA-X offers built-in pulse generators and

modulators that simplify the system configuration

35 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Tips from the experts

GPS

receiver

10 MHz in

GPS

receiver

10 MHz in

Keysight N5181A Keysight N5264B

How do I get a common 10 MHz reference

signal to my source and PNA-X when it’s

too far to use BNC cables?

– Use low-cost GPS-based satellite

receivers to obtain high-accuracy 10 MHz

reference signals

– Place a GPS receiver near the transmit

source, and one near the PNA-X

– This approach works for arbitrary

distances, from 100’s of meters

to many kilometers

1. Connect PNA-X to source via LAN or GPIB

2. Use External Device Configuration feature

3. Under Properties section:

– Type name of external source, change Device Type to Source, and

choose appropriate driver

– Under Device Properties, choose between two trigger modes:

Software CW (trigger cables not needed, but slow), or Hardware

List (fast, but requires TTL triggers)

– When the distance between the PNA-X and source is too far to

use BNC trigger cables (> 40 meters), then a Keysight E5818A

trigger box with LAN hub offers a good alternative

Innovative

Applications

Fast and accurate

RF subsystem for

antenna measurements

(continued)

How can I control

external sources?

36 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

N5249B

N5241B

N5242B

N5244B

N5245B

N5247B

Frequency range 10 MHz to 8.5 GHz

10 MHz to 13.5 GHz

10 MHz to 26.5 GHz

1

10 MHz to 43.5 GHz

10 MHz to 50 GHz

10 MHz to 67 GHz1

System dynamic range

(at 20 GHz)

121 to 130 dB

depending on configuration

124 to 141 dB

with direct receiver access (typical)

121 to 125 dB

depending on configuration

133 to 137 dB

with direct receiver access (typical)

122 to 129 dB

depending on configuration 136 to 140

dB

with direct receiver access (typical)

Maximum output power

at test port (at 20 GHz)

+13 dBm (Option 201, 401)

+10 dBm (Option 21x, 41x)

+15 dBm (Option 22x)

+10 dBm (Option 42x)

+13 dBm (Option 201, 401)

+10 dBm (Option 21x, 41x)

+10 dBm (Option 22x, 42x)

+11 dBm (Option 201, 401)

+8 dBm (Option 219, 419)

+7 dBm (Option 224, 423)

Maximum power sweep

range 38 dB

Corrected

specifications2

(2-port cal, 3.5 mm)

Dir 44 to 48 dB

SM 31 to 40 dB

LM 44 to 48 dB

Refl trk ± 0.003 to 0.006 dB

Trans trk ± 0.015 to 0.104 dB

(2-port cal, 2.4 mm)

Dir 36 to 42 dB

SM 31 to 41 dB

LM 35 to 42 dB

Refl trk ± 0.001 to 0.027 dB

Trans trk ± 0.020 to 0.182 dB

(2-port cal, 1.85 mm)

Dir 34 to 41 dB

SM 34 to 44 dB

LM 33 to 41

Refl trk 0.01 to 0.33

Trans trk 0.061 to 0.17 dB

Trace noise

0.002 dB rms (1 kHz BW)

Harmonics (ports 1, 3)

10 MHz to 2 GHz

> 2 GHz

-51 dBc typical

-60 dBc typical

Bias tees, maximum

current, voltage ± 200 mA, ± 40 VDC

Dimensions, H x W x D

(with feet, handles) 280 x 459 x 578 mm 280 x 459 x 649 mm 280 x 459 x 649 mm

Weight (nominal net),

2-port

4-port

27 kg

37 kg

46 kg

49 kg

46 kg

49 kg

Specification and Feature Comparison

Outstanding Performance

1. The following model configurations work down to 900 Hz: N5242B Option 425 with or without Option 029, and N5247B Option 425 with Option 029.

2. Dir = directivity; SM = source match; LM = load match; Refl trk= reflection tracking; Trans trk = transmission tracking

37 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X Network Analyzers

PNA-X Configuration Information

Test set Description Additional information

Option 201 2-ports, single source, and configurable test set

Option 21722-ports, single source, configurable test set, and receiver

attenuators

Not available on N5247B

Option 219 2-ports, single source, configurable test set, receiver attenuators,

and bias tees

Option 22222-ports, dual sources, configurable test set, receiver attenuators,

combiner, and mechanical switches

Includes additional RF jumpers for maximum setup flexibility

Option 224 2-ports, dual sources, configurable test set, receiver attenuators,

combiner, mechanical switches, and bias tees

Includes additional RF jumpers for maximum setup flexibility

Option 40114-ports, dual sources, and configurable test set

Option 4171,2 4-ports, dual sources, configurable test set, and receiver attenuators Not available on N5247B

Option 41914-ports, dual sources, configurable test set, receiver attenuators,

and bias tees

Option 4221,2 4-ports, dual sources, configurable test set, receiver attenuators,

combiner, and mechanical switches

Includes additional RF jumpers for maximum setup flexibility

Option 42314-ports, dual sources, configurable test set, receiver attenuators,

combiner, mechanical switches, and bias tees

Includes additional RF jumpers for maximum setup flexibility

Option 42514-ports, dual sources, configurable test set, receiver attenuators,

combiner, mechanical switches, bias tees, and low-frequency

extension

Includes additional RF jumpers for maximum setup flexibility.

Only available for N5242B with or without low-noise receiver

Option 029, and for N5247B with Option 029.

Additional hardware

Option 020 Add IF inputs Used for antenna measurements and mm-wave extenders

Option 021 Add pulse modulator to first source

Option 022 Add pulse modulator to second source Requires one of Option 22x, 40x, 41x, or 42x

Option 029 Add low-noise receiver S93029A application software is needed to control the noise

receiver for noise figure and noise power measurements. For

N5241/42/49B, requires one of options 21x, 22x, 41x, or 42x.

For N5244/45/47B, requires one of options 22x or 42x. On

N5247B, noise receiver works up to 50 GHz only.

1. To independently control the frequency of the second internal source, one of the following software applications is required:

S93080/029/082/083/084/086/087/089/090x/093/094A

2. Recommended for high-power setups. The maximum power rating on the test port couplers is +43 dBm (additional attenuators or isolators are typically required to protect

other components inside the instrument).

Available options

38 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X Configuration Information (continued)

For PNA-X Series Description Additional Information

Application software1

S93007A Automatic fixture removal

S93010A Time domain analysis

S93025A Basic pulsed-RF measurements Includes control of internal pulse generators and provides pulse widths to

200 ns using wideband detection

S93026A Advanced pulsed-RF measurements Includes control of internal pulse generators, and provides pulse widths to

100 ns using wideband detection, and 20 ns using narrowband detection

S93029A Noise figure measurements with vector correction2Standard receivers are used if hardware option N524xB-029 is not

present

S93080A Frequency-offset measurements Provides ability to independently set the frequency of internal sources

and receivers, and to configure external sources. This functionality is

included with S93029/082/083/084/086/087/089/090x/093/094A.

S93082A Scalar mixer/converter measurements Provides SMC measurement class. S93082A is a subset of S93083A.

S93083A Vector and scalar mixer/converter measurements3 Provides SMC+Phase and VMC measurement classes

S93084A Embedded-LO capability Works with S93029/082/083/086/087A

S93086A Gain-compression measurements

S93087A Intermodulation distortion measurements4Not available with PNA test set options 200, 210, 400, and 410

S93088A Source phase control

S93089A Differential and I/Q device measurements Requires a 4-port test set option (4xx)

S930900A Spectrum analysis, up to 8.5 GHz5

S930901A Spectrum analysis, up to 13.5 GHz5

S930902A Spectrum analysis, up to 26.5 GHz 5

S930904A Spectrum analysis, up to 43.5 GHz5

S930905A Spectrum analysis, up to 50 GHz5

S930907A Spectrum analysis, up to 67 GHz5

S930909A Spectrum analysis, up to 90 GHz5

S93093A Spectrum analysis, up to 110 GHz

S93094A Spectrum analysis, beyond 110 GHz

S93118A Fast CW measurements

S93460A True-mode stimulus Requires a 4-port test set option (4xx)

S93551A N-port measurements6,7 Not available with test set options 200, 210, 400, and 410

1. Supported software license types: fixed-perpetual (1FP), transportable-perpetual (1TP), fixed-1-year (1FY), and transportable-1-year (1TY) (note: S93093A, S93094A, S93898A,

and S94510A have fixed-license types only).

2. For N522xB and N5241/42/49B, vector-noise-corrected measurements require an ECal for use as an impedance tuner. For N5244/45/47B with Option 029, an internal tuner is

included. Noise calibration requires a power meter when using a standard receiver. When using the low-noise receiver (Option 029), either a power meter or a 346-series noise

source is required (Keysight 346C or 346C-K01 recommended). A power meter is required for measuring mixers and converters.

3. A configurable test set is required for VMC measurements to connect a reference mixer, or for SMC+Phase measurements using the comb-generator-based calibration. When

ordered with PNA test set Options 200, 210, 400, or 410 (no front-panel jumpers), phase and delay measurements can only by done using SMC+Phase with a calibration mixer.

4. S93087A can be used without PNA-X Options 22x or 42x, but external equipment such as a signal generator and a combiner may be required.

5. A test set with internal receiver attenuators is recommended to avoid receiver compression when measuring large input signals.

6. When ordering a test set, select an appropriate interface kit.

7. When configured as a multiport analyzer using S93551A and a multiport test set, the combiner feature of Option 22x or 42x is temporarily disabled. When configured as a

standalone analyzer, the combiner feature is enabled.

39 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X Configuration Information (continued)

For PNA-X Series Description Additional Information

Nonlinear vector network analysis1

S94510A2Nonlinear component characterization Requires test set option 41x or 42x

S94511A2Nonlinear component characterization Export-control version. Requires test set option 41x or 42x

S94514A3Nonlinear X-parameters4,5 Requires test set option 42x and application software S94510A

S94518A Nonlinear pulse-envelope domain Requires hardware option 021 and application software S94510A, and

S93025A or S93026A

S94520A Arbitrary load-impedance X-parameters4,5 Requires application software S94514A

S94521A Arbitrary load-control X-parameters4,5 Requires application software S94520A

Required NVNA accessories

– U9391C 10 MHz to 26.5 GHz or U9391F 10 MHz to 50 GHz or U9391G 10 MHz to 67 GHz comb generator (two required for nonlinear measurements)

– Keysight power meter and sensor or USB power sensor

– Keysight calibration kit, mechanical or ECal

– Keysight signal generator, EXG, MXG, or PSG, used for X-parameter extraction (the PNA-X’s 10 MHz reference output can be used for 10 MHz tone

spacing applications)

Accessories, calibration options

For PNA-X Series Description Additional Information

Accessories

N524xB-1CM Rack mount kit for use without handles

N524xB-1CP Rack mount kit for use with handles

N1966A Pulse I/O adapter

U9391C/F/G Comb generator1

Calibration Software

S93898A Built-in performance test software for standard compliant

calibration6

Calibration Documentation

N524xB-1A7 ISO 17025 compliant calibration

N524xB-UK6 Commercial calibration certificate with test data

N524xB-A6J ANSI Z540 compliant calibration

Required NVNA accessories

–U9391C 10 MHz to 26.5 GHz or U9391F 10 MHz to 50 GHz or U9391G 10 MHz to 67 GHz comb generator (two required for nonlinear measurements)

–Keysight power meter and sensor or USB power sensor

–Keysight calibration kit, mechanical or ECal

–Keysight signal generator, MXG or PSG used for X-parameter extraction (internal 10 MHz reference output can be used for 10 MHz tone spacing

applications)

1. A fully configured NVNA system requires two comb generators with power supplies, Keysight calibration kits (mechanical or ECal), and a power meter and sensor or USB power

sensor.

2. Pulse capability requires option 021 and S93025A or S93026A.

3. Pulse capability requires option 021, 022 and S93025A or S93026A.

4. Requires EXG, MXG, or PSG signal generator for X-parameter extraction (the PNA-X’s 10 MHz reference output can be used for 10 MHz tone-spacing applications).

5. X-parameters is a trademark and registered trademark of Keysight Technologies in the U.S., Europe, Japan, and elsewhere. The X-parameters format and underlying equations are

open and documented. For more information, visit www.keysight.com/find/eesof-x-parameters-info.

6. Additional hardware required. Please refer to the analyzer’s service guide for required service-test equipment.

40 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Additional Information

Download the latest PNA-X application notes:

Bookmark this page to download the latest PNA-X application notes to gain in-depth

measurement knowledge.

Get answers online from factory experts:

Discuss calibration, applications, product, and programming topics at Keysight’s online

network analyzer discussion forum. Get answers to your toughest measurement and

design challenges and browse prior discussion topics.

www.keysight.com/find/pnaxapps

www.keysight.com/find/na_forum

41 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

42 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

For more information on Keysight

Technologies’ products, applications or

services, please contact your local Keysight

office. The complete list is available at:

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For other unlisted countries:

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(BP- 6 -20-17)

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ISO9001 Quality Management System

www.keysight.com/go/quality

Keysight Technologies, Inc.

DEKRA Certified ISO 9001:2015

Quality Management System

This information is subject to change without notice.

© Keysight Technologies, 2010 - 2015, 2017

Published in USA, June 29, 2017

5990-4592EN

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A personalized view into the information most relevant to you.

Keysight Services

www.keysight.com/find/service

Keysight Services can help from acquisition to renewal across your

instrument’s lifecycle. Our comprehensive service offerings—one-stop

calibration, repair, asset management, technology refresh, consulting,

training and more—helps you improve product quality and lower costs.

Three-Year Warranty

www.keysight.com/find/ThreeYearWarranty

Keysight’s committed to superior product quality and lower total cost

of ownership. Keysight is the only test and measurement company with

three-year warranty standard on all instruments, worldwide. And, we provide

a one-year warranty on many accessories, calibration devices, systems and

custom products.

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Up to ten years of protection and no budgetary surprises to ensure your

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Get the best of both worlds: Keysight’s measurement expertise and product

breadth, combined with channel partner convenience.

*X-parameters is a trademark and registered trademark of Keysight Technologies in the US, EU,

JP, and elsewhere. The X-parameter format and underlying equations are open and documented.

For more information, visit;

http://www.keysight.com/find/eesof-x-parameters-info

Protect your software investment:

Keysight protects your 8753, 8720 and 8510 software investment by

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Gain deeper confidence

Whether you’re testing active or passive devices, the right mix of speed and performance

gives you an edge. In R&D, our vector network analyzers provide a level of measurement

integrity that helps you transform deeper understanding into better designs. On the

production line, our cost-effective VNAs provide the throughput and repeatability you

need to transform parts into competitive components. In the field, our handheld analyzers

deliver high-quality measurements wherever you need to go. Every Keysight VNA is the

ultimate expression of our expertise in linear and nonlinear device characterization. On

the bench, in a rack or in the field, we can help you gain deeper confidence.