Intel Computer Accessories 845 Users Manual .
845 to the manual a0214cf2-bdad-4bad-a7c2-db305c5118c3
2015-02-02
: Intel Intel-Intel-Computer-Accessories-845-Users-Manual-432127 intel-intel-computer-accessories-845-users-manual-432127 intel pdf
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Page Count: 148 [warning: Documents this large are best viewed by clicking the View PDF Link!]
- Title Page
- Contents
- Revision History
- Introduction
- Signal Description
- Register Description
- Register Terminology
- I/O Mapped Registers
- Memory-Mapped Register Space
- DRAMWIDTH—DRAM Width Register
- DQCMDSTR—Strength Control Register (SDQ and CMD Signal Groups)
- CKESTR—Strength Control Register (SCKE Signal Group)
- CSBSTR—Strength Control Register (SCS# Signal Group)
- CKSTR—Strength Control Register (Clock Signal Group)
- RCVENSTR—Strength Control Register (RCVENOUT Signal Group)
- Host-Hub Interface Bridge Device Registers (Device 0)
- VID—Vendor Identification Register (Device 0)
- DID—Device Identification Register (Device 0)
- PCICMD—PCI Command Register (Device 0)
- PCISTS—PCI Status Register (Device 0)
- RID—Revision Identification Register (Device 0)
- SUBC—Sub-Class Code Register (Device 0)
- BCC—Base Class Code Register (Device 0)
- MLT—Master Latency Timer Register (Device 0)
- HDR—Header Type Register (Device 0)
- APBASE—Aperture Base Configuration Register (Device 0)
- SVID—Subsystem Vendor Identification (Device 0)
- SID—Subsystem Identification (Device 0)
- CAPPTR—Capabilities Pointer (Device 0)
- AGPM—AGP Miscellaneous Configuration Register (Device 0)
- DRB[0:7]—DRAM Row Boundary Registers (Device 0)
- DRA—DRAM Row Attribute Registers (Device 0)
- DRT—DRAM Timing Register (Device 0)
- DRC—DRAM Controller Mode Register (Device 0)
- DERRSYN—DRAM Error Syndrome Register (Device 0)
- EAP—Error Address Pointer Register (Device 0)
- PAM[0:6]—Programmable Attribute Map Registers (Device 0)
- FDHC—Fixed DRAM Hole Control Register (Device 0)
- SMRAM—System Management RAM Control Register (Device 0)
- ESMRAMC—Extended System Mgmt RAM Control Register (Device 0)
- ACAPID—AGP Capability Identifier Register (Device 0)
- AGPSTAT—AGP Status Register (Device 0)
- AGPCMD—AGP Command Register (Device 0)
- AGPCTRL—AGP Control Register (Device 0)
- APSIZE—Aperture Size (Device 0)
- ATTBASE—Aperture Translation Table Base Register (Device 0)
- AMTT—AGP Interface Multi-Transaction Timer Register (Device 0)
- LPTT—AGP Low Priority Transaction Timer Register (Device 0)
- TOM—Top of Low Memory Register (Device 0)
- MCHCFG—MCH Configuration Register (Device 0)
- ERRSTS—Error Status Register (Device 0)
- ERRCMD—Error Command Register (Device 0)
- SMICMD—SMI Command Register (Device 0)
- SCICMD—SCI Command Register (Device 0)
- SKPD—Scratchpad Data Register (Device 0)
- CAPID—Product Specific Capability Identifier Register (Device 0)
- Bridge Registers (Device 1)
- VID1—Vendor Identification Register (Device 1)
- DID1—Device Identification Register (Device 1)
- PCICMD1—PCI-PCI Command Register (Device 1)
- PCISTS1—PCI-PCI Status Register (Device 1)
- RID1—Revision Identification Register (Device 1)
- SUBC1—Sub-Class Code Register (Device 1)
- BCC1—Base Class Code Register (Device 1)
- MLT1—Master Latency Timer Register (Device 1)
- HDR1—Header Type Register (Device 1)
- PBUSN1—Primary Bus Number Register (Device 1)
- SBUSN1—Secondary Bus Number Register (Device 1)
- SUBUSN1—Subordinate Bus Number Register (Device 1)
- SMLT1—Secondary Master Latency Timer Register (Device 1)
- IOBASE1—I/O Base Address Register (Device 1)
- IOLIMIT1—I/O Limit Address Register (Device 1)
- SSTS1—Secondary PCI-PCI Status Register (Device 1)
- MBASE1—Memory Base Address Register (Device 1)
- MLIMIT1—Memory Limit Address Register (Device 1)
- PMBASE1—Prefetchable Memory Base Address Register (Device 1)
- PMLIMIT1—Prefetchable Memory Limit Address Register (Device 1)
- BCTRL1—PCI-PCI Bridge Control Register (Device 1)
- ERRCMD1—Error Command Register (Device 1)
- DWTC—DRAM Write Thermal Management Control Register (Device 1)
- DRTC—DRAM Read Thermal Management Control Register (Device 1)
- System Address Map
- Functional Description
- Electrical Characteristics
- Ballout and Package Information
- Testability