SZ060424B02 ET海林 179072 Y 103 Report
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Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 EMC COMPLIANCE TEST REPORT For USB2.0 IDE/SATA ADAPTER Trade Name : UNITEK Model Number : Y-103 Serial Number Report Number Date : N/A : SZ060424B02-ET : August 01, 2006 Regulations : See below Standards EN 55022: 1998+A1: 2000+A2: 2003 EN 61000-3-2: 2000 EN 61000-3-3: 1995+A1:2001 EN 55024: 1998+A1: 2001+A2: 2003 - IEC 61000-4-2: 2001 - IEC 61000-4-3: 2002 - IEC 61000-4-4: 2001 - IEC 61000-4-5: 2001 - IEC 61000-4-6: 2001 - IEC 61000-4-11: 2001 Results (Pass/Fail) PASS PASS PASS PASS PASS PASS PASS PASS PASS Prepared for : TECH-TOP TECHNOLOGY LIMITED RM 1609/1611, METRO CENTRE II 21 LAM HING STREET, KOWLOON BAY KOWLOON, HONGKONG Prepared by : COMPLIANCE CERTIFICATION SERVICES (SHENZHEN) INC. NO.5 JINAO INDUSTRIAL PARK, NO.35 JUKENG ROAD, DASHUIKENG VILLAGE,GUANLAN TOWN, BAOAN DISTRICT, SHENZHEN, CHINA TEL: 86-755-28055000 FAX: 86-755-28055221 LAB CODE:200577-0 Note: This report shall not be reproduced except in full, without the written approval of Compliance Certification Service Inc. . This document may be altered or revised by Compliance Certification Service Inc. personnel only, and shall be noted in the revision section of the document. Page 1 of 39 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 TABLE OF CONTENTS DESCRIPTION PAGE TEST RESULT CERTIFICATION 4 GENERAL INFORMATION 5 SYSTEM DESCRIPTION 6 PRODUCT INFORMATION 7 SUPPORT EQUIPMENT 8 TEST FACILITY 9 TEST EQUIPMENT LIST 10 SECTION 1 EN 55022(LINE CONDUCTED & RADIATED EMISSION) MEASUREMENT PROCEDURE & LIMIT (LINE CONDUCTED EMISSION TEST) MEASUREMENT PROCEDURE & LIMIT (RADIATED EMISSION TEST) 12 BLOCK DIAGRAM OF TEST SETUP 18 SUMMARY DATA 19 SECTION 2 EN 61000-3-2 & EN 61000-3-3 (POWER HARMONICS & VOLTAGE FLUCTUATION/FLICKER) 21 RESULT 21 SECTION 3 IEC 61000-4-2 (ELECTROSTATIC DISCHARGE) 26 BLOCK DIAGRAM OF TEST SETUP 26 TEST PROCEDURE 27 PERFORMANCE & RESULT 28 SECTION 4 IEC 61000-4-3 (RADIATED ELECTROMAGNETIC FIELD) 29 BLOCK DIAGRAM OF TEST SETUP 29 TEST PROCEDURE 30 PERFORMANCE & RESULT 31 12 15 Page 2 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 DESCRIPTION SECTION 5 IEC 61000-4-4 (FAST TRANSIENTS/BURST) PAGE 32 BLOCK DIAGRAM OF TEST SETUP 32 TEST PROCEDURE 33 PERFORMANCE & RESULT SECTION 6 IEC 61000-4-5 (SURGE IMMUNITY) 33 34 BLOCK DIAGRAM OF TEST SETUP 34 TEST PROCEDURE 35 PERFORMANCE & RESULT 35 SECTION 7 36 IEC 61000-4-6 (CONDUCTED DISTURBANCE/ INDUCED BY RADIO-FREQUENCY FIELD) BLOCK DIAGRAM OF TEST SETUP 36 TEST PROCEDURE 37 PERFORMANCE & RESULT 37 SECTION 8 IEC 61000-4-11 (VOLTAGE DIPS,SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS) 38 BLOCK DIAGRAM OF TEST SETUP 38 TEST PROCEDURE 39 PERFORMANCE & RESULT 39 Page 3 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Date of Issue: August 01, 2006 Report No.: SZ060424B02-ET TEST RESULT CERTIFICATION Equipment Under Test: USB2.0 IDE/SATA ADAPTER Trade Name: UNITEK Model Number: Y-103 Serial Number: Applicant: N/A TECH-TOP TECHNOLOGY LIMITED RM 1609/1611, METRO CENTRE II 21 LAM HING STREET, KOWLOON BAY KOWLOON, HONGKONG Manufacturer: OCEAN COMPUTER TECHNOLOGY(SHENZHEN) CO., LTD 3/F, BLOCK 10, CHANG XIN IND. CITY, CHANG ZHEN VILLAGE, GONG MING TOWN, BAOAN, SHENZHEN Type of Test: Technical Standards: EMC Directive 89/336/EEC for CE Marking EN 55022: 1998+A1: 2000+A2: 2003 EN 61000-3-2: 2000 EN 61000-3-3: 1995+A1: 2001 EN 55024: 1998+A1: 2001+A2: 2003 (IEC 61000-4-2: 2001; IEC 61000-4-3: 2002; IEC 61000-4-4: 2001; IEC 61000-4-5: 2001; IEC 61000-4-6: 2001; IEC 61000-4-11: 2001) Report Number: SZ060424B02-ET Date of test: April 24~August 01, 2006 Deviation: None Condition of Test Sample: Normal The above equipment was tested by Compliance Certification Services (Shenzhen) Inc. for compliance with the requirements set forth in EMC Directive 89/336/EEC amended by 93/68/EEC and the Technical Standards mentioned above. This said equipment in the configuration described in this report shows the maximum emission levels emanating from equipment and the level of the immunity endurance of the equipment are within the compliance requirements. The test results of this report relate only to the tested sample identified in this report. Approved By: Tested By: Jason He Reviewed By: Harris Lai / General Manager COMPLIANCE CERTIFICATION SERVICES (SHENZHEN) INC. Villian Xu / Assistant manager COMPLIANCE CERTIFICATION SERVICES (SHENZHEN) INC. Page 4 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 GENERAL INFORMATION Applicant: TECH-TOP TECHNOLOGY LIMITED RM 1609/1611, METRO CENTRE II 21 LAM HING STREET, KOWLOON BAY KOWLOON, HONGKONG Manufacturer: OCEAN COMPUTER TECHNOLOGY(SHENZHEN) CO., LTD 3/F, BLOCK 10, CHANG XIN IND. CITY, CHANG ZHEN VILLAGE, GONG MING TOWN, BAOAN, SHENZHEN Report Number: SZ060424B02-ET Date of Test: April 24~August 01, 2006 Equipment Under Test: USB2.0 IDE/SATA ADAPTER Model Number: Y-103 Serial Number: N/A Type of Test: EMC Directive 89/336/EEC for CE Marking Technical Standards: EN 55022: 1998+A1: 2000+A2: 2003 EN 61000-3-2: 2000 EN 61000-3-3: 1995+A1: 2001 EN 55024: 1998+A1: 2001+A2: 2003 (IEC 61000-4-2: 2001; IEC 61000-4-3: 2002; IEC 61000-4-4: 2001; IEC 61000-4-5: 2001; IEC 61000-4-6: 2001; IEC 61000-4-11: 2001) Frequency Range (EN 55022): 150kHz to 30MHz for Line Conducted Test Test Site: Compliance Certification Services (Shenzhen) Inc. No. 5, Jinao industrial park, No.35 Jukeng Road, Dashuikeng Village, Guanlan Town, Baoan District, Shenzhen, China 30MHz to 1000MHz for Radiated Emission Test Page 5 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 SYSTEM DESCRIPTION EUT Test Program: 1. Set up the EUT with the related support equipments. 2. Run the Copy.bat program of transferring data from PC to hard disk in windows XP. 3. Make sure EUT work normally during the test. Page 6 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 PRODUCT INFORMATION Housing Type: Plastic EUT Power Rating: DC5V supplied by the adapter and PC Power during Test: DC5V supplied by the adapter and PC Adapter Manufacturer/Model No: USB Cable: FLYPOWER/ SPP34-12.0/5.0-2000 Cable in: Un-shielded, 1.90m Cable out: Un-shielded, 0.75m Shielded, 0.65m (with six cores) SATA Data Link Cable: Shielded, 0.10m DC Diffluent Cable: Shielded, 0.10m I/O Port of EUT: I/O Port Type Q’TY Tested with 1) AC Input Port (Adapter) 1 1 2) DC Output Port (Adapter) 1 1 3) DC Input Port (EUT) 1 1 4) UNITEK DC Input Port 1 1 1 1 5) SATA Input Port 6) IDE Input Port 1 1 7) ATC Input Port 1 1 8) USB Port 1 1 Difference between model numbers as below: 1. Model Number Trade Name N/A N/A Page 7 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 SUPPORT EQUIPMENT No. Equipment Model # Serial # Trade Name 1. PC DX6100MT CNG4470CNW HP 2. LCD MONITOR VP2016 A21050402549 VIEWSONIC 3. PRINTER P310B DLRE217030 EPSON 4. MODEM MODEN-1414 9013593 ACEEX 5. PS/2 KEYBOARD LG1M-K818 LGKL0308856 LG 6. PS/2 MOUSE M-BE58 LZA24503529 LOGITECH 7. IDE DISK 6L080PO BAJ41G20 MAXTOR 8. SATA DISK 6V080EO VA131610 MAXTOR Data Cable Power Cord Unshielded N/A 1.8m Shielded Unshielded 1.5 m 1.8m Shielded Unshielded 1.5 m 1.8m Shielded Unshielded 1.5m 1.8m Shielded N/A 1.8 m Shielded N/A 1.8 m N/A N/A N/A N/A **Note: All the above equipment/cables were placed in worse case positions to maximize emission signals during emission test. Grounding: Grounding was in accordance with the manufacturer’s requirements and conditions for the intended use. Page 8 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 TEST FACILITY Location: No. 5, Jinao industrial park, No.35 Jukeng Road, Dashuikeng Village, Guanlan Town, Baoan District Shenzhen, China. Description: There is one 3/10m open area test sites and one line conducted labs for final test. The Open Area Test Sites and the Line Conducted labs are constructed and calibrated to meet the FCC requirements in documents ANSI C63.4 and CISPR 22/EN 55022 requirements. Site Filing: A site description is on file with the Federal Communications Commission, 7435 Oakland Mills Road, Columbia, MD 21046. Site Accreditation: Accredited by Nemko ( Aut. No.: ELA106), VCCI(Registration No.: R-1996,C-2150), FCC ( Registration No.: 101879) and NVLAP(Lab code:200577-0) for EMC. Instrument Tolerance: All measuring equipment is in accord with ANSI C63.4 and CISPR 22 requirements that meet industry regulatory agency and accreditation agency requirement. Ground Plane: Two conductive reference ground planes were used during the Line Conducted Emission, one in vertical and the other in horizontal. The dimensions of these ground planes are as below. The vertical ground plane was placed distancing 40 cm to the rear of the wooden test table on where the EUT and the support equipment were placed during test. The horizontal ground plane projected 50 cm beyond the footprint of the EUT system and distanced 80 cm to the wooden test table. For Radiated Emission Test, one horizontal conductive ground plane extended at least 1m beyond the periphery of the EUT and the largest measuring antenna, and covered the entire area between the EUT and the antenna. It has no holes or gaps having longitudinal dimensions larger than one-tenth of a wavelength at the highest frequency of measurement up to 1GHz. Page 9 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 TEST EQUIPMENT LIST Instrumentation: The following list contains equipment used at Compliance Certification Services (Shenzhen) Inc. for testing. The equipment conforms to the CISPR 16-1 / ANSI C63.2 Specifications for Electromagnetic Interference and Field Strength Instrumentation from 10kHz to 1.0GHz or above. Equipment used during the tests: Open Area Test Site: G EQUIPMENT TYPE ESCI EMI TEST RECEIV.ESCI Amplifier Bi-log Antenna Cable System-Controller Turn Table Antenna Tower DECOUPLING NETWORK Open Area Test Site G MFR MODEL SERIAL NUMBER NUMBER ROHDE&SCH 1166.5950 03 100145 WARZ H.P. 8447D 2944A07999 EMCO 3142B 9910-1436 TIME LMR-400 N-TYPE04 MICROWAVE CT SC100 N/A EMCO 2081-1.21 N/A CT N/A N/A FISCHER F-201-DCN-5 12 CUSTOM -6MM LAST CAL. CAL. DUE 02/09/2006 02/08/2007 02/09/2006 02/08/2007 06/10/2006 06/09/2007 06/10/2006 06/09/2007 N/A N/A N/A N/A N/A N/A 06/10/2006 06/09/2007 Note: The measure uncertainty is less than +/-2.5078dB, which is evaluated as per the UKAS LAB34 and CISPR/A/291/CDV. Conducted Emission Test Site: G Conducted Emission Test Site G EQUIPMENT MFR MODEL SERIAL TYPE NUMBER NUMBER ESCI EMI TEST ROHDE&SCH 1166.5950 03 100088 RECEIV.ESCI WARZ LISN EMCO 3825/2 1371 LISN EMCO 3825/2 8901-1459 LAST CAL. CAL. DUE 02/09/2006 02/08/2007 02/09/2006 02/09/2006 02/08/2007 02/08/2007 Note: The measure uncertainty is less than +/-2.2318dB, which is evaluated as per the UKAS LAB34 and CISPR/A/291/CDV. The calibrations of the measuring instruments, including any accessories that may effect such calibration, are checked frequently to assure their accuracy. Adjustments are made and correction factors applied in accordance with instructions contained in the manual for the measuring instrument. Page 10 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 TEST EQUIPMENT LIST Power Harmonic & Voltage Fluctuation/Flicker Measurement (61000-3-2&-3-3) EQUIPMENT MFR MODEL NUMBER SERIAL NUMBER TYPE Harmonic & Flicker Tester Power Source SCHAFFNER SCHAFFNER EQUIPMENT MFR TYPE ESD 30 System MODEL NUMBER SERIAL NUMBER EM Test ESD 30C 1202-17 NSG 1007-5-400 NSG1007 LAST CAL. CAL DUE. 54789 02/09/2006 02/08/2007 54789 02/09/2006 02/08/2007 ESD test (61000-4-2) LAST CAL. CAL DUE. 10/18/2006 10/17/2007 Radiated Electromagnetic Field immunity Measurement (61000-4-3) EQUIPMENT MFR TYPE Signal Generator Power Amplifier MODEL NUMBER SERIAL NUMBER LAST CAL. CAL DUE. Maconi M2S 119246/003 9801-112 06/10/2006 06/09/2007 06/10/2006 06/09/2007 Power Amplifier M2S 9801-179 06/10/2006 06/09/2007 Power Antenna SCHAFFNER 2022D A00181-1000 AC8113/ 800-250A CBL6140A 1204 06/10/2006 06/09/2007 Fast Transients/Burst test (61000-4-4)/Surge(61000-4-5)/Voltage Dips &Interruptions(61000-4-11) EQUIPMENT TYPE Fast Transients/Burst Generator MFR MODEL NUMBER SCHAFFNER BEST EMC V2.7 SERIAL NUMBER LAST CAL. CAL DUE. 200126-012S 02/09/2006 02/08/2007 C CS test (61000-4-6) EQUIPMENT MFR TYPE Signal Generator Power Amplifier CDN MODEL NUMBER SERIAL NUMBER Maconi M2S MEB 2022D A00181-1000 M3-8016 119246/003 9801-112 003683 LAST CAL. CAL DUE. 06/10/2006 06/09/2007 06/10/2006 06/09/2007 06/10/2006 06/09/2007 Page 11 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 SECTION 1 EN 55022(LINE CONDUCTED AND RADIATED EMISSION) MEASUREMENT PROCEDURE (PRELIMINARY LINE CONDUCTED EMISSION TEST) 1) The equipment was set up as per the test configuration to simulate typical actual usage per the user’s manual. When the EUT is a tabletop system, a wooden table with a height of 0.8 meters is used and is placed on the ground plane as per EN55022 (see Test Facility for the dimensions of the ground plane used). When the EUT is a floor-standing equipment, it is placed on the ground plane which has a 3-12 mm non-conductive covering to insulate the EUT from the ground plane. 2) Support equipment, if needed, was placed as per EN55022. 3) All I/O cables were positioned to simulate typical actual usage as per EN55022. 4) The EUT received DC5V from the adapter and PC, then the adapter and PC received AC230V/50Hz power through a Line Impedance Stabilization Network (LISN) which supplied power source and was grounded to the ground plane. 5) All support equipments received power from a second LISN supplying power of AC 230V/50Hz, if any. 6) The EUT test program was started. Emissions were measured on each current carrying line of the EUT using a spectrum Analyzer / Receiver connected to the LISN powering the EUT. The LISN has two monitoring points: Line 1 (Hot Side) and Line 2 (Neutral Side). Two scans were taken: one with Line 1 connected to Analyzer / Receiver and Line 2 connected to a 50 ohm load; the second scan had Line 1 connected to a 50 ohm load and Line 2 connected to the Analyzer / Receiver. 7) Analyzer / Receiver scanned from 150kHz to 30MHz for emissions in each of the test modes. 8) During the above scans, the emissions were maximized by cable manipulation. 9) The following test mode(s) were scanned during the preliminary test: Preliminary Conducted Emission Test Frequency Range Investigated 150KHz TO 30 MHz Mode of operation Date Data Report No. SATA DISK 2006-07-28 Y-103_0(L, N) IDE DISK 2006-07-28 Y-103_1(L, N) Worst Mode Then, the EUT configuration and cable configuration of the above highest emission level were recorded for reference of final testing. Page 12 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 MEASUREMENT PROCEDURE (FINAL LINE CONDUCTED EMISSION TEST) 1) EUT and support equipment was set up on the test bench as per step 9 of the preliminary test. 2) A scan was taken on both power lines, Line 1 and Line 2, recording at least the six highest emissions. Emission frequency and amplitude were recorded into a computer in which correction factors were used to calculate the emission level and compare reading to the applicable limit. If EUT emission level was less –2dB to the A.V. limit in Peak mode, then the emission signal was re-checked using Q.P and Average detector. 3) The test data of the worst case condition(s) was reported on the Summary Data page. Data Sample: Freq. Peak MHz Raw dBuV 43.90 xx.xxx Freq. Raw dBuV Limit dBuV Margin dB Note “---“ Q.P. Raw dBuV --- Average Raw dBuV --- Q.P. Limit dBuV 56.00 Average Limit dBuV 46.00 Q.P. Margin dB --- Average Margin dB -2.10 Note L1 = Emission frequency in MHz = Uncorrected Analyzer/Receiver reading = Limit stated in standard = Reading in reference to limit = Current carrying line of reading = The emission level complied with the Average limits, with at least 2 dB margin, so no further recheck. Page 13 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 LINE CONDUCTED EMISSION LIMIT Frequency Maximum RF Line Voltage Q.P.( dBuV) AVERAGE( dBuV) 150kHz-500kHz 66-56 56-46 500kHz-5MHz 56 46 5MHz-30MHz 60 50 **Note: The lower limit shall apply at the transition frequency. Page 14 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 MEASUREMENT PROCEDURE (PRELIMINARY RADIATED EMISSION TEST) 1) The equipment was set up as per the test configuration to simulate typical actual usage per the user’s manual. When the EUT is a tabletop system, a wooden turntable with a height of 0.8 meters is used which is placed on the ground plane as per EN 55022 (see Test Facility for the dimensions of the ground plane used).When the EUT is a floor-standing equipment, it is placed on the ground plane which has a 3-12 mm non-conductive covering to insulate the EUT from the ground plane. 2) Support equipment, if needed, was placed as per EN 55022. 3) All I/O cables were positioned to simulate typical actual usage as per EN 55022. 4) The EUT received DC5V from the adapter and PC, then the adapter and PC received AC230V/50Hz power through the outlet socket under the turntable. All support equipments received AC230V/50Hz power from socket under the turntable, if any. 5) The antenna was placed at 10 meter away from the EUT as stated in EN 55022. The antenna connected to the Analyzer via a cable and at times a pre-amplifier would be used. 6) The Analyzer / Receiver quickly scanned from 30MHz to 1000MHz. The EUT test program was started. Emissions were scanned and measured rotating the EUT to 360 degrees and positioning the antenna 1 to 4 meters above the ground plane, in both the vertical and the horizontal polarization, to maximize the emission reading level. 7) The following test mode(s) were scanned during the preliminary test: Preliminary Radiated Emission Test Frequency Range Investigated 30 MHz TO 1000 MHz Mode of operation Date Data Report No. SATA DISK 2006-07-28 Y-103_0(H, V) IDE DISK 2006-07-28 Y-103_1(H, V) Worst Mode Then, the EUT and cable configuration, antenna position, polarization and turntable position of the above highest emission level were recorded for final testing. Page 15 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 MEASUREMENT PROCEDURE (FINAL RADIATED EMISSION TEST) 1) EUT and support equipment were set up on the turntable as per step 7 of the preliminary test. 2) The Analyzer / Receiver scanned from 30MHz to 1000MHz. Emissions were scanned and measured rotating the EUT to 360 degrees, varying cable placement and positioning the antenna 1 to 4 meters above the ground plane, in both the vertical and the horizontal polarization, to maximize the emission reading level. 3) Recorded at least the six highest emissions. Emission frequency, amplitude, antenna position, polarization and turntable position were recorded into a computer in which correction factors were used to calculate the emission level and compare reading to the applicable limit and Q.P./Peak reading is presented. 4) The test data of the worst case condition(s) was reported on the Summary Data page. Data Sample: ======================================================================== Freq. Raw Corr. Emiss. Limits Margin Reading Data Factor Level Type (MHz) (dBuV/m) (dB) ( dBuV/m ) (dB) P/Q ======================================================================== xx.xxx 14.03 12.25 26.28 30.00 -3.72 P ========================================================================= Freq. Raw Data (dBuV/m) Corr. Factor (dB) Emiss. Level Limit dBuV/m Margin dB P Q = Emission frequency in MHz = Uncorrected Analyzer / Receiver reading = Correction factors of antenna factor and cable loss = Raw reading converted to dBuV/m and CF added = Limit stated in standard = Reading in reference to limit =Peak Reading =Quasi-peak Page 16 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 RADIATED EMISSION LIMIT Frequency (MHz) Distance (m) Maximum Field Strength Limit (dBuV/m/ Q.P.) 30-230 10 30 230-1000 10 37 **Note: The lower limit shall apply at the transition frequency. Page 17 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 BLOCK DIAGRAM OF TEST SETUP System Diagram of Connections between EUT and Simulators EUT : USB2.0 IDE/SATA ADAPTER Trade Name : UNITEK Model Number : Y-103 PC PRINTER AC POWER IN MODEM SATA DISK ADAPTER USB2.0 IDE/SATA ADAPTER (EUT) LCD MONITOR PS/2 KEYBOARD PS/2 MOUSE Page 18 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 SUMMARY DATA (LINE CONDUCTED TEST) Model Number: Y-103 Location: Site G Test Mode: SATA DISK Test Results: Passed Temperature: 25oC Humidity: 55%RH FREQ PEAK Q .P. AVG Q .P. AVG Q .P. AVG MHz RAW RAW RAW Limit Limit M argin M argin dBuV dBuV ------------- ------------- dBuV 64.31 62.50 60.49 56.47 56.00 56.00 dBuV 54.31 52.50 50.49 46.47 46.00 46.00 dB 0.209 0.272 0.342 0.483 1.180 4.364 dBuV 42.94 40.87 41.88 43.67 39.37 41.20 dB -11.37 -11.63 -8.61 -2.80 -6.63 -4.80 L1 L1 L1 L1 L1 L1 -5.95 -2.20 -4.01 -4.40 -7.36 -31.38 L2 L2 L2 L2 L2 L2 ------------- 0.346 44.44 60.39 50.39 ------0.483 45.63 56.47 46.47 44.78 44.27 -11.69 1.184 43.25 56.00 46.00 42.57 41.99 -13.43 3.955 45.23 56.00 46.00 43.42 41.60 -12.58 4.517 46.12 56.00 46.00 42.52 38.64 -13.48 5.078 36.16 60.00 50.00 25.69 18.62 -34.31 (The chart below shows the highest readings taken from the final data) NO TE L1 = Line One (Hot side) / L2 = Line Two (Neutral side) **NOTE: “---” denotes the emission level was or more than 2dB below the Average limit, so no re-check anymore. Page 19 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 SUMMARY DATA (RADIATED EMISSION TEST) Model Number: Y-103 Location: Site G Test Mode: SATA DISK Polar: Vertical / Horizontal Test Results: Passed Test Distance: 10m Temperature: 25℃ Humidity: 55%RH (The chart below shows the highest readings taken from the final data) Freq (MHz) 44.740 150.021 180.000 210.030 602.784 659.053 119.104 180.037 210.222 225.012 240.006 658.980 Frequency Range Investigated (30 MHz TO 1000 MHz) Meter Corrected Reading Reading C.F. Reading Limits Margin Type (dBuV/m) (dBuV/m) (dBuV/m) (dBuV/ (dB) P/Q m) 42.08 -23.70 18.38 30.00 -11.62 Q 44.71 -21.39 23.32 30.00 -6.68 Q 43.91 -18.41 25.50 30.00 -4.50 Q 36.42 -18.24 18.18 30.00 -11.82 Q 32.76 -6.26 26.50 37.00 -10.50 Q 31.67 -7.58 24.09 37.00 -12.91 Q 44.61 39.29 45.62 44.61 47.92 38.72 -19.29 -20.49 -20.25 -16.72 -19.80 -6.09 25.32 18.80 25.37 27.89 28.12 32.63 30.00 30.00 30.00 30.00 37.00 37.00 -4.68 -11.20 -4.63 -2.11 -8.88 -4.37 P Q P P P P Pol. H/V V V V V V V H H H H H H C.F.(Correction Factor)=Antenna Factor + Cable Loss - Amplifier Gain ( + Attenuator 6dB) Corrected Reading = Metering Reading + C.F. Margin=Corrected Reading - Limits P=Peak Reading H=Horizontal Polarization/Antenna Q=Quasi-peak V=Vertical Polarization/Antenna Comments: N/A Page 20 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 SECTION 2 EN 61000-3-2 & EN 61000-3-3 (POWER HARMONICS & VOLTAGE FLUCTUATION / FLICKER) POWER HARMONICS MEASUREMENT Port : AC mains Basic Standard : EN 61000-3-2 :2000 Limits Temperature Humidity : V CLASS A ; : 25oC : 55% CLASS D VOLTAGE FLUCTUATION/FLICKER MEASUREMENT Port : AC mains Basic Standard : EN 61000-3-3 : 1995+A1:2001 Limits : §5 of EN 61000-3-3 Temperature : 25oC Humidity : 55% Block Diagram of Test Setup: Harmonics & Flicker Analyzer + Power Source Power cord EUT Support Units 0.8m Result: Please see the attached test data Page 21 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Harmonics – Class-A per A-14(Run time) EUT: USB2.0 IDE/SATA ADAPTER Tested by: Veason Test category: Class-A per A-14 (European limits) Test Margin: 100 Test date: 06-7-27 Start time: 15:43:25 End time: 15:46:07 Test duration (min): 2.5 Data file name: H-002430.cts_data Comment: Y-103 Customer: TECH-TOP TECHNOLOGY LIMITED Test Result: Pass Source qualification: Normal 1.5 300 1.0 200 0.5 100 0.0 0 -0.5 -100 -1.0 -200 -1.5 -300 Harmonics and Class A limit line Voltage (Volts) Current (Amps) Current & voltage waveforms European Limits Current RMS(Amps) 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 4 Test result: Pass 8 12 16 20 24 Harmonic # 28 32 36 40 Worst harmonic was #19 with 6.90 % of the limit. Page 22 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Current Test Result Summary (Run time) EUT: USB2.0 IDE/SATA ADAPTER Tested by: Veason Test category: Class-A per A-14 (European limits) Test Margin: 100 Test date: 06-7-27 Start time: 15:43:25 End time: 15:46:07 Test duration (min): 2.5 Data file name: H-002430.cts_data Comment: Y-103 Customer: TECH-TOP TECHNOLOGY LIMITED Test Result: Pass Source qualification: Highest parameter values during test: V_RMS (Volts): 230.22 I_Peak (Amps): 0.350 I_Fund (Amps): 0.032 Power (Watts): 5 Harm# 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 I_RMS (Amps): Crest Factor: Power Factor: Harms(avg) 100%Limit %of Limit 0.001 0.020 0.001 0.019 0.001 0.019 0.001 0.018 0.001 0.017 0.001 0.016 0.001 0.015 0.001 0.014 0.001 0.012 0.001 0.011 0.001 0.009 0.001 0.008 0.000 0.007 0.000 0.005 0.000 0.004 0.000 0.003 0.000 0.002 0.000 0.001 0.000 0.001 0.000 1.080 2.300 0.430 1.140 0.300 0.770 0.230 0.400 0.184 0.330 0.153 0.210 0.131 0.150 0.115 0.132 0.102 0.118 0.092 0.107 0.084 0.098 0.077 0.090 0.071 0.083 0.066 0.078 0.061 0.073 0.058 0.068 0.054 0.064 0.051 0.061 0.048 0.058 0.046 Normal 0.1 0.9 0.3 1.7 0.3 2.4 0.5 4.5 0.6 5.2 0.6 7.6 0.7 9.9 0.8 10.2 0.8 10.3 0.8 10.0 0.8 9.6 0.8 8.9 0.8 8.0 0.7 6.9 0.7 5.8 0.6 4.6 0.5 3.5 0.4 2.3 0.4 1.5 0.4 0.065 5.435 0.345 Harms(max) 150%Limit %of Limit 0.002 0.021 0.002 0.020 0.002 0.019 0.002 0.018 0.002 0.017 0.002 0.016 0.002 0.015 0.001 0.014 0.001 0.012 0.001 0.011 0.001 0.009 0.001 0.008 0.001 0.007 0.001 0.005 0.001 0.004 0.001 0.003 0.000 0.002 0.000 0.001 0.000 0.001 0.000 1.620 3.450 0.645 1.710 0.450 1.155 0.345 0.600 0.276 0.495 0.230 0.315 0.197 0.225 0.173 0.199 0.153 0.178 0.138 0.161 0.125 0.147 0.115 0.135 0.106 0.125 0.099 0.116 0.092 0.109 0.086 0.102 0.081 0.096 0.077 0.091 0.073 0.087 0.069 0.13 0.62 0.37 1.16 0.41 1.66 0.53 3.04 0.66 3.50 0.72 5.14 0.80 6.66 0.86 6.87 0.88 6.90 0.90 6.77 0.90 6.46 0.87 5.99 0.84 5.41 0.76 4.72 0.74 3.94 0.65 3.15 0.61 2.37 0.53 1.61 0.50 1.03 0.46 Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Page 23 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Voltage Source Verification Data (Run time) EUT: USB2.0 IDE/SATA ADAPTER Tested by: Veason Test category: Class-A per A-14 (European limits) Test Margin: 100 Test date: 06-7-27 Start time: 15:43:25 End time: 15:46:07 Test duration (min): 2.5 Data file name: H-002430.cts_data Comment: Y-103 Customer: TECH-TOP TECHNOLOGY LIMITED Test Result: Pass Source qualification: Normal Highest parameter values during test: Voltage (Vrms): 230.22 I_Peak (Amps): 0.350 I_Fund (Amps): 0.032 Power (Watts): 5 Harm# 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 I_RMS (Amps): Crest Factor: Power Factor: 0.065 5.435 0.345 Harmonics V-rms Limit V-rms % of Limit Status 0.184 0.481 0.093 0.043 0.046 0.030 0.031 0.012 0.029 0.021 0.019 0.017 0.010 0.015 0.016 0.021 0.017 0.016 0.012 0.016 0.010 0.015 0.008 0.012 0.012 0.012 0.011 0.007 0.010 0.009 0.007 0.008 0.006 0.007 0.004 0.002 0.004 0.006 0.005 0.460 2.072 0.460 0.921 0.460 0.690 0.460 0.460 0.460 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 0.230 39.93 23.21 20.26 4.66 9.90 4.40 6.63 2.55 6.27 9.30 8.41 7.47 4.42 6.63 7.10 9.27 7.58 6.74 5.28 6.96 4.36 6.60 3.56 5.33 5.30 5.38 4.64 3.14 4.47 3.87 3.06 3.50 2.53 2.91 1.78 0.90 1.67 2.45 2.05 OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK OK Page 24 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Flicker Test Summary (Run time) EUT: USB2.0 IDE/SATA ADAPTER Tested by: Veason Test category: All parameters (European limits) Test Margin: 100 Test date: 06-7-27 Start time: 15:48:35 End time: 15:58:48 Test duration (min): 10 Data file name: F-002431.cts_data Comment: Y-103 Customer: TECH-TOP TECHNOLOGY LIMITED Test Result: Pass Status: Test Completed Psti and limit line European Limits 1.00 Pst 0.75 0.50 0.25 0.00 15:58:47 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): Highest dc (%): Highest dmax (%): Highest Pst (10 min. period): Highest Plt (2 hr. period): 230.16 0.00 0.00 0.00 0.001 0.001 Test limit (%): Test limit (%): Test limit (%): Test limit: Test limit: 3.30 3.30 4.00 1.000 0.650 Pass Pass Pass Pass Pass Page 25 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET SECTION 3 Date of Issue: August 01, 2006 IEC 61000-4-2 (ELECTROSTATIC DISCHARGE) ELECTROSTATIC DISCHARGE (ESD) IMMUNITY TEST Port Basic Standard Test Level : Enclosure : IEC 61000-4-2: 2001 : ± 8 kV (Air Discharge) ± 4 kV (Contact Discharge) Performance Criteria : B ( Standard require ) Temperature/Humidity : 25oC/55% Block Diagram of Test Setup: ( The 470 k ohm resistors are installed per standard requirement ) VCP Support units >1m EUT & Support Units Wooden Table HCP 0.8m Ground Reference Plane Page 26 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Test Procedure: 1. The EUT was located 0.1 m minimum from all side of the HCP. 2. The support units were located 1 m minimum away from the EUT. 3. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from PC to hard disk in windows XP; Make sure EUT work normally during the test. 4. Active the communication function if the EUT with such port(s). 5. As per the requirement of EN 55024; applying direct contact discharge at the sides other than front of EUT at minimum 50 discharges (25 positive and 25 negative) if applicable, can’t be applied direct contact discharge side of EUT then the indirect discharge shall be applied. One of the test points shall be subjected to at least 50 indirect discharge (contact) to the front edge of horizontal coupling plane. 6. Other parts of EUT where it is not possible to perform contact discharge then selecting appropriate points of EUT for air discharge, a minimum of 10 single air discharges shall be applied. 7. The application of ESD to the contact of open connectors is not required. 8. Putting a mark on EUT to show tested points. The following test condition was followed during the tests. Note: As per the A2 to IEC 61000-4-2, a bleed resistor cable is connected between the EUT and HCP during the test. The electrostatic discharges were applied as follows: Amount of Discharges Mini 25 /Point Mini 25 /Point Mini 25 /Point Mini 25 /Point Mini 25 /Point Mini 10 /Point Voltage Coupling Contact Discharge ±2kV; ±4kV Indirect Discharge HCP (Front) ±2kV; ±4kV Indirect Discharge VCP (Left) ±2kV; ±4kV Indirect Discharge VCP (Back) ±2kV; ±4kV Indirect Discharge VCP (Right) ±2kV; ±4kV Air Discharge ±2kV; ±4kV; ±8kV Result (Pass/Fail) No discharge point Pass Pass Pass Pass No discharge point Page 27 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Performance & Result: V Criterion A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. Criterion B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. Criterion C: Temporary loss of function is allowed, provided the functions self-recoverable or can be restored by the operation of controls. V PASS FAILED Page 28 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET SECTION 4 Date of Issue: August 01, 2006 IEC 61000-4-3 (RADIATED ELECTROMAGNETIC FIELD ) RADIATED ELECTROMAGNETIC FIELD IMMUNITY TEST Port : Enclosure Basic Standard : IEC 61000-4-3:2002 Requirements : 3 V/m with 80% AM. 1kHz Modulation. Performance Criteria : A ( Standard require ) Temperature : 25oC Humidity : 55% Block Diagram of Test Setup: 3 meter 7X4X3 Chamber EUT & Support Units 1.5 meter 0.8m Power Amp Signal Generator EUT Monitoring by using a camera PC Controller to control S.G. & PA as well as forward power Control Room Page 29 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Test Procedure: 1. The EUT was located at the edge of supporting table keep 3 meter away from transmitting antenna, it just the calibrated square area of field uniformity. The support units were located outside of the uniformity area, but the cable(s) connected with EUT were exposed to the calibrated field as per IEC 61000-4-3. 2. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from PC to hard disk in windows XP; Make sure EUT work normally during the test. 3. Setting the testing parameters of RS test software per IEC 61000-4-3. 4. Performing the pre-test at each side of with double specified level (3V/m) at 1% steps. 5. From the result of pre-test in step 5, choose the worst side of EUT for final test from 80 MHz to 1000 MHz at 1% steps. 6. Recording the test result in following table. 7. It is not necessary to perform test as per annex A of EN 55024 if the EUT doesn’t belong to TTE product. IEC 61000-4-3 test conditions: Test level : 3V/m Steps : 1 % of fundamental Dwell Time : 1 sec Range (MHz) Field Modulation 80-1000 3V/m Yes 80-1000 3V/m Yes 80-1000 3V/m Yes 80-1000 3V/m Yes 80-1000 3V/m Yes 80-1000 3V/m Yes 80-1000 3V/m Yes 80-1000 3V/m Yes Polarity H V H V H V H V Position (°) Front Front Right Right Back Back Left Left Result (Pass/Fail) Pass Pass Pass Pass Pass Pass Pass Pass Page 30 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Performance & Result: V Criterion A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. Criterion B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. Criterion C: Temporary loss of function is allowed, provided the functions self-recoverable or can be restored by the operation of controls. V PASS FAILED Page 31 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 SECTION 5 IEC 61000-4-4 (FAST TRANSIENTS/BURST) FAST TRANSIENTS/BURST IMMUNITY TEST Port : On Power Supply Lines Basic Standard : IEC 61000-4-4: 2001 Requirements :+/-1KV for Power Supply Lines Performance Criteria : B ( Standard require ) Temperature : 25oC Humidity : 55% Block Diagram of Test Setup: EUT AC Line EFT/Burst/Surge Generator 80cm Support Units Non-Conductive Table Controller Computer Page 32 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Test Procedure: 1. The EUT and support units were located on a wooden table 0.8 m away from ground reference plane. 2. A 1.0 meter long power cord was attached to EUT during the test. 3. The length of communication cable between communication port and clamp was keeping within 1 meter. 4. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from PC to hard disk in windows XP; Make sure EUT work normally during the test. 5 .Related peripherals work during the test. 6. Recording the test result as shown in following table. Test conditions: Impulse Frequency: 5kHz Tr/Th: 5/50ns Burst Duration: 15ms Burst Period: 300ms Inject Line L N L+N Voltage kV +/- 1 +/- 1 +/- 1 Inject Method Direct Direct Direct Result (Pass/Fail) Pass Pass Pass Performance & Result: V Criterion A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. Criterion B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. Criterion C: Temporary loss of function is allowed, provided the functions self recoverable or can be restored by the operation of controls. V PASS FAILED Page 33 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 SECTION 6 IEC 61000-4-5 ( SURGE IMMUNITY ) SURGE IMMUNITY TEST Port : On Power Supply Lines Basic Standard : IEC 61000-4-5: 2001 Requirements : +/- 1kV (Line to Line) : +/- 2kV (Line to Ground) Performance Criteria :B ( Standard require ) Temperature : 25oC Humidity : 55% Block Diagram of Test Setup: To AC Source Surge Immunity Test EUT & Support Units 80 cm Controller Computer Page 34 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Test Procedure: 1. The EUT and support units were located on a wooden table 0.8 m away from ground floor. 2. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from PC to hard disk in windows XP; Make sure EUT work normally during the test. 3. Recording the test result as shown in following table. Test conditions: Voltage Waveform Current Waveform Polarity Phase angle Number of Test Coupling Line L1-L2 L1-L2 : 1.2/50 us : 8/20 us : Positive/Negative : 0o, 90o, 270o :5 Voltage (kV) 1 1 Polarity Positive Negative Coupling Method Capacitive Capacitive Result (Pass/Fail) Pass Pass Performance & Result: V Criterion A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. Criterion B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. Criterion C: Temporary loss of function is allowed, provided the functions self recoverable or can be restored by the operation of controls. V PASS FAILED Page 35 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET SECTION 7 Date of Issue: August 01, 2006 IEC 61000-4-6(CONDUCTED DISTURBANCE/INDUCED BY RADIO-FREQUENCY FIELD) Port Basic Standard Requirements Injection Method Performance Criteria Temperature Humidity : On Power Supply Lines : IEC 61000-4-6: 2001 : 3V with 80% AM. 1kHz Modulation : CDN : A (Standard require) : 25oC : 55% Block Diagram of Test Setup: Power Amplifier 10 cm isolation supporter PC Controller 0.1m< L <0.3m EUT and Support units CDN Page 36 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Test Procedure: 1. The EUT and support units were located at a ground reference plane with the interposition of a 0.1 m thickness insulating support and the CDN was located on GRP directly. 2. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from PC to hard disk in windows XP; Make sure EUT work normally during the test. 3. Related peripherals work during the test. 4. Setting the testing parameters of CS test software per IEC 61000-4-6. 5. Recording the test result in following table. Test conditions: Frequency Range Frequency Step Dwell Time : 0.15MHz-80MHz : 1% of fundamental : 1 sec Range (MHz) Field Modulation Result (Pass/Fail) 0.15-80 3V Yes Pass Performance & Result: V Criterion A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. Criterion B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. Criterion C: Temporary loss of function is allowed, provided the functions self-recoverable or can be restored by the operation of controls. V PASS FAILED Page 37 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET SECTION 8 Date of Issue: August 01, 2006 IEC 61000-4-11 (VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS ) VOLTAGE DIPS / SHORT INTERRUPTIONS Port : On Power Supply Lines Basic Standard : IEC 61000-4-11: 2001 Requirement : PHASE ANGLE 0, 45, 90, 135, 180, 225, 270, 315 degrees Voltage Dips Test Level % UT <5 70 Reduction (%) >95 30 Duration ( periods ) 0.5 25 Performance Criteria B C Voltage Interceptions Test Level % UT <5 Reduction (%) >95 Duration ( periods ) 250 Performance Criteria C Test Interval Temperature : Min. 10 sec. : 25oC Humidity : 55% Block Diagram of Test Setup: To AC Source EUT & Support Units Dips/Interruption and Variations Simulator 80 cm Controller Computer Page 38 Rev. 00 Compliance Certification Services(ShenZhen) Inc. Report No.: SZ060424B02-ET Date of Issue: August 01, 2006 Test Procedure: 1. The EUT and support units were located on a wooden table, 0.8 m away from ground floor. 2. Set up the EUT with the related support equipments; Run the Copy.bat program of transferring data from PC to hard disk in windows XP; Make sure EUT work normally during the test. 3. Setting the parameter of tests and then Perform the test software of test simulator. 4. Conditions changes to occur at 0 degree crossover point of the voltage waveform. 5. Recording the test result in test record form. Test conditions: The duration with a sequence of three dips/interruptions with interval of 10 s minimum ( Between each test event ) Voltage Dips: Test Level Reduction Duration Observation Meet Performance % UT (%) ( periods) Criteria EUT shut down, but can 0 100 0.5 B recover by itself EUT shut down, but can 70 30 25 B recover by itself Voltage Interruptions: Test Level Reduction % UT (%) 0 Duration ( periods) 100 250 Observation EUT shut down, but can recover by itself Meet Performance Criteria B Performance & Result: Criterion A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. Criterion B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. Criterion C: Temporary loss of function is allowed, provided the functions self recoverable or can be restored by the operation of controls. V PASS FAILED Page 39 Rev. 00
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