80 Y0306 1 WIRELESS CONNECTIVITY S USER GUIDE
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NOTICE REGARDING QUALCOMM ATHEROS, INC. Effective June 2016, Qualcomm Atheros, Inc. (QCA) transferred certain of its assets, including substantially all of its products and services, to its parent corporation, Qualcomm Technologies, Inc. Qualcomm Technologies, Inc. is a wholly-owned subsidiary of Qualcomm Incorporated. Accordingly, references in this document to Qualcomm Atheros, Inc., Qualcomm Atheros, Atheros, QCA or similar references, should properly reference, and shall be read to reference, Qualcomm Technologies, Inc. Wireless Connectivity Tests User Guide 80-Y0306-1 Rev. L October 1, 2014 Submit technical questions at: https://support.cdmatech.com Confidential and Proprietary – Qualcomm Atheros, Inc. NO PUBLIC DISCLOSURE PERMITTED: Please report postings of this document on public servers or websites to: DocCtrlAgent@qualcomm.com. Restricted Distribution: Not to be distributed to anyone who is not an employee of either Qualcomm or its subsidiaries without the express approval of Qualcomm’s Configuration Management. Not to be used, copied, reproduced, or modified in whole or in part, nor its contents revealed in any manner to others without the express written permission of Qualcomm Atheros, Inc. Qualcomm is a registered trademark of QUALCOMM Incorporated. Atheros is a registered trademark of Qualcomm Atheros, Inc. MSM is a trademark of QUALCOMM Incorporated, registered in the United States and other countries. Android is a trademark of Google Inc. Bluetooth word mark and logos are registered trademarks owned by Bluetooth SIG, Inc. All other registered and unregistered trademarks are the property of QUALCOMM Incorporated, Qualcomm Atheros, Inc., or their respective owners and used with permission. Registered marks owned by QUALCOMM Incorporated and Qualcomm Atheros, Inc. are registered in the United States and may be registered in other countries. This technical data may be subject to U.S. and international export, re-export, or transfer (“export”) laws. Diversion contrary to U.S. and international law is strictly prohibited. Qualcomm Atheros, Inc. 1700 Technology Drive San Jose, CA 95110 U.S.A. © 2012-2014 Qualcomm Atheros, Inc. Revision history 80-Y0306-1 Rev. L Revision Date A April 2012 Initial Release B June 2012 Added BT Low Energy, WLAN AR6003, Agilent N4010 WLAN support. C October 2012 WLAN802.11ac support with IQxel and NI PXI5644R, Agilent N4010A BT support, Station calibration support with connectivity test box, default WCNTesterConfig.xml for each test equipment. D January 2013 FM digital audio support, BT IQxel support, Test equipment options updated. E March 2013 BT LE IQxel support, BT LE CMW support, Test equipment options updated F July 2013 G October 2013 H November 2013 J March 2014 K July 2014 L September 2014 Description Added BT and WLAN AnritsuMT8870A support QSPR Bluetooth tests moved to BTTestSuite. Added BT AR3002 QSPR tests Added QCA6174 test support Added WLAN MIMO test description Added ANT test description Added BT standalone support Added section 2.1.3 for WLAN MIMO test setup. Updated section 9.1.4 for BT standalone configuration. Added BT signaling test support Added NFC functional test support for SoC and FFA targets Added description for NFC tests utilizing IQNFC Added UDT support for BT DUT MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 2 Contents 1 Introduction.................................................................................................... 15 1.1 Purpose........................................................................................................................ 15 1.2 Scope........................................................................................................................... 15 1.3 Conventions ................................................................................................................ 15 1.4 Related documentation................................................................................................ 16 1.4.1 Qualcomm documents ..................................................................................... 16 1.5 Technical assistance .................................................................................................... 16 1.6 Acronyms .................................................................................................................... 17 2 Hardware Setup and Requirements ............................................................. 18 2.1 RF test setup................................................................................................................ 18 2.1.1 BT/WLAN/FM RF test setup .......................................................................... 18 2.1.2 ANT RF test setup ........................................................................................... 19 2.1.3 WLAN MIMO test setup ................................................................................. 20 2.1.4 NFC parametric test setup ............................................................................... 21 2.2 Station calibration ....................................................................................................... 21 2.2.1 BT/WLAN/FM station calibration setup ......................................................... 21 2.3 Test equipment ............................................................................................................ 22 2.3.1 Supported BT, WLAN, NFC and FM test box ................................................ 23 2.3.2 Supported power supply .................................................................................. 23 2.3.3 Supported signal generator for ANT ............................................................... 24 2.3.4 Supported spectrum analyzer for ANT ............................................................ 24 2.4 Station calibration test equipment ............................................................................... 25 2.4.1 Supported power meter for station calibration ................................................ 25 2.4.2 Supported signal generator for station calibration ........................................... 25 3 Software Installation ..................................................................................... 27 3.1 SW requirements......................................................................................................... 27 3.2 QDART for non-FFA setup ........................................................................................ 27 3.3 NI GPIB setup ............................................................................................................. 28 3.3.1 NI GPIB software setup ................................................................................... 28 3.3.2 NI GPIB driver setup ....................................................................................... 29 3.4 Android debug bridge installation .............................................................................. 30 3.5 LitePoint software for running .................................................................................... 31 3.6 Agilent N4010A software installation ........................................................................ 32 3.7 LitePoint IQxel wave files installation ....................................................................... 32 3.8 NI PXI5644R software installation ............................................................................. 33 3.9 Agilent N5182A software and waveform files installation (ANT only) ........................................................................................................................... 34 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 3 Wireless Connectivity Tests User Guide Contents 3.10 LitePoint IQNFC Software ....................................................................................... 34 4 Station Calibration ......................................................................................... 35 4.1 Station calibration data file ......................................................................................... 35 4.1.1 BT/WLAN/FM RF test station calibration data file ........................................ 35 4.2 Station calibration instrument config file.................................................................... 35 4.3 Station calibration procedure ...................................................................................... 42 4.3.1 BT/WLAN/FM RF test station calibration procedure ..................................... 42 4.3.2 NFC RF test station calibration procedure ...................................................... 43 5 Test Matrix...................................................................................................... 45 5.1 Bluetooth non-signaling production test matrix.......................................................... 45 5.2 WLAN production SISO test matrix........................................................................... 46 5.3 WLAN production MIMO test matrix ........................................................................ 46 5.4 FM production test matrix .......................................................................................... 46 5.5 ANT production test matrix ........................................................................................ 47 5.6 WLAN WCN36x0 CLPC calibration ......................................................................... 47 5.7 Bluetooth signaling production test matrix ................................................................. 47 5.8 NFC production functional test matrix ....................................................................... 48 5.9 NFC reference test matrix ........................................................................................... 49 6 Chipsets Supported ...................................................................................... 51 7 Setup Configuration ...................................................................................... 52 7.1 Power supply configuration ........................................................................................ 52 7.2 Bluetooth non-signaling tester configuration .............................................................. 53 7.3 WLAN tester configuration (SISO only) .................................................................... 58 7.4 WLAN Tester Configuration (MIMO only) ............................................................... 61 7.5 FM tester configuration............................................................................................... 62 7.6 Bluetooth signaling tester configuration ..................................................................... 63 7.7 NFC tester configuration............................................................................................. 65 8 QSPR Test Trees ........................................................................................... 66 8.1 Bluetooth non-signaling + Bluetooth LE production test tree .................................... 66 8.2 WLAN production test trees ....................................................................................... 67 8.3 FM production test trees ............................................................................................. 69 8.4 ANT production test tree ............................................................................................ 70 8.5 Bluetooth signaling + Bluetooth LE production test tree ........................................... 70 8.6 NFC production functional test tree ............................................................................ 72 8.7 NFC production reference test tree ............................................................................. 73 9 Test Setup Details ......................................................................................... 75 9.1 Bluetooth initialization and de-initialization tests ...................................................... 75 9.1.1 Bluetooth initialization .................................................................................... 75 9.1.2 Bluetooth configuration file details ................................................................. 76 9.1.3 Bluetooth de-initialization ............................................................................... 79 9.1.4 Bluetooth UART/USB test setup using BT DIAG BRIDGE .......................... 79 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 4 Wireless Connectivity Tests User Guide Contents 9.1.5 Bluetooth User Defined Transport (UDT) test setup using BT DIAG BRIDGE .................................................................................................................................. 82 9.1.6 Additional configuration for remote DUT using User Defined Transport and BT DIAG BRIDGE on remote PC. .......................................................................... 84 9.2 WLAN setup and initialization tests ........................................................................... 84 9.2.1 WLAN initialization ........................................................................................ 84 9.2.2 WLAN de-initialization ................................................................................... 86 9.3 FM setup and initialization tests ................................................................................. 87 9.3.1 FM initialization .............................................................................................. 87 9.3.2 FM RX initialization ........................................................................................ 88 9.3.3 FM TX initialization ........................................................................................ 89 9.3.4 FM de-initialization ......................................................................................... 89 9.4 ANT setup and initialization tests ............................................................................... 90 9.4.1 ANT initialization ............................................................................................ 90 9.4.2 ANT De-initialization ...................................................................................... 90 9.5 NFC initialization and deinitialization ........................................................................ 91 9.5.1 NFC setup config ............................................................................................. 91 9.5.2 NFC DUT configuration file details ................................................................ 91 9.5.3 NFC DUT Initialization ................................................................................... 93 9.5.4 NFC de-initialization ....................................................................................... 94 10 Wireless Connectivity Test Description .................................................... 95 10.1 Bluetooth non-signaling production test description ................................................ 95 10.1.1 Set Bluetooth ChipID .................................................................................... 95 10.1.2 BTDUT_FFA_DisableLegacyLogMode ....................................................... 95 10.1.3 Setup DUT for GFSK and EDR transmit tests .............................................. 96 10.1.4 Setup DUT for LE transmit tests ................................................................... 96 10.1.5 Measure Tx output power and initial carrier frequency tolerance ................. 97 10.1.6 Measure GFSK modulation DeltaF2 and CarrierDrift................................... 97 10.1.7 Measure GFSK modulation DeltaF1 ............................................................. 98 10.1.8 Measure EDR modulation ............................................................................. 98 10.1.9 Measure LE Tx output power ........................................................................ 99 10.1.10 Measure LE modulation DeltaF1................................................................. 99 10.1.11 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate ................................................................................................................................ 100 10.1.12 Measure Rx sensitivity/max input ............................................................. 100 10.1.13 Measure LE Rx sensitivity/max input ....................................................... 101 10.1.14 Set BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST ....... 102 10.1.15 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 .................................. 102 10.2 WLAN production test description (SISO Only) .................................................... 103 10.2.1 SetUpDutTx ................................................................................................. 103 10.2.2 WlanTxEvmTest .......................................................................................... 103 10.2.3 WlanTxVerifySpectrumTest........................................................................ 104 10.2.4 WlanTxVerifyPowerTest ............................................................................. 105 10.2.5 WlanTxVerifyMaskTest .............................................................................. 106 10.2.6 WlanPerTest ................................................................................................ 106 10.2.7 WlanPerSweepTest ...................................................................................... 107 10.2.8 WlanSendRxPacketsTest ............................................................................. 108 10.3 WLAN production test description (MIMO or SISO) ............................................ 109 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 5 Wireless Connectivity Tests User Guide Contents 10.3.1 SetUpDutTxDetails...................................................................................... 109 10.3.2 WlanTxEvmTest_NxN ................................................................................ 110 10.3.3 WlanTxVerifyPowerTest_NxN ................................................................... 111 10.3.4 MeasureMask_NxN ..................................................................................... 112 10.3.5 MeasureSpectrum_NxN .............................................................................. 113 10.3.6 WlanPerTest_NxN ....................................................................................... 114 10.3.7 WlanPerSweepTest_NxN ............................................................................ 115 10.3.8 WlanSendRxPacketsTest_NxN ................................................................... 116 10.4 FM production test description ............................................................................... 116 10.4.1 FM RX tests ................................................................................................. 116 10.4.2 FM TX tests ................................................................................................. 122 10.5 ANT production test description ............................................................................. 123 10.5.1 Transmit channel power .............................................................................. 123 10.5.2 Receive sensitivity ....................................................................................... 125 10.6 Bluetooth signaling production test description...................................................... 126 10.6.1 BTDUT_FFA_DisableLegacyLogMode ..................................................... 126 10.6.2 BTDUT_EnableBT_DUTMode .................................................................. 126 10.6.3 Measure Tx GFSK power ............................................................................ 126 10.6.4 Measure Tx modulation characteristics ....................................................... 127 10.6.5 Measure GFSK initial carrier frequency tolerance ...................................... 128 10.6.6 Measure GFSK carrier frequency drift ........................................................ 128 10.6.7 Measure EDR relative transmit power......................................................... 129 10.6.8 Measure EDR modulation accuracy ............................................................ 129 10.6.9 Measure Rx sensitivity single slot packets .................................................. 130 10.6.10 Measure Rx sensitivity multiple slot packets ............................................ 131 10.6.11 Measure EDR Rx sensitivity...................................................................... 132 10.7 NFC production functional test description ............................................................ 134 10.7.1 NFCDUT_DetectTag ................................................................................... 134 10.7.2 NFCDUT_DetectField ................................................................................. 134 10.7.3 NFCDUT_SelfTest ...................................................................................... 135 10.8 NFC reference parametric test description.............................................................. 135 10.8.1 SetInstrumentConfigFile.............................................................................. 135 10.8.2 NFCDUT_SetConfigFile ............................................................................. 136 10.8.3 NFCDUT_Instantiate ................................................................................... 136 10.8.4 DUT_InitFramework ................................................................................... 136 10.8.5 EnableDUTPower ........................................................................................ 137 10.8.6 WaitForPortToExist ..................................................................................... 137 10.8.7 NFCDUT_RunTopLevelScript.................................................................... 137 10.8.8 NFCDUT_Connect ...................................................................................... 138 10.8.9 NFCDUT_PatchFirmwareUsingPatchFile .................................................. 138 10.8.10 InitializeNFCTester ................................................................................... 138 10.8.11 NFCTesterCalibrate ................................................................................... 139 10.8.12 NFCTesterLoadCalibration ....................................................................... 140 10.8.13 NFCDUT_CoreResetAndInit .................................................................... 140 10.8.14 NFCDUT_ConfigureDUT ......................................................................... 140 10.8.15 ConfigureNFCTester ................................................................................. 141 10.8.16 NFCDUT_FindResonance ......................................................................... 144 10.8.17 NFCDUT_TuneCapNVM ......................................................................... 146 10.8.18 InitiatorTest................................................................................................ 146 10.8.19 InitiatorRxTest ........................................................................................... 147 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 6 Wireless Connectivity Tests User Guide Contents 10.8.20 TargetTest .................................................................................................. 149 10.8.21 ResonanceTest ........................................................................................... 150 10.8.22 Disconnect ................................................................................................. 151 10.8.23 Shutdown ................................................................................................... 151 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 7 Wireless Connectivity Tests User Guide Contents Figures Figure 2-1 BT/WLAN/FM RF test setup ................................................................................................... 18 Figure 2-2 ANT test setup.......................................................................................................................... 19 Figure 2-3 WLAN MIMO test setup.......................................................................................................... 20 Figure 2-4 NFC parametric test setup ......................................................................................................... 21 Figure 2-5 Station calibration setup ........................................................................................................... 22 Figure 3-1 Enable .NET Framework 4.0 Support on NI 488.2 for Windows Install ................................. 28 Figure 3-2 Signal generator supported by test solution ............................................................................. 29 Figure 3-3 NI GPIB hardware setup – step 2 ............................................................................................. 29 Figure 3-4 NI GPIB hardware setup – step 3 ............................................................................................. 30 Figure 3-5 Path system variable on environment variables ....................................................................... 30 Figure 3-6 Add ADB as part of the system path ........................................................................................ 31 Figure 3-7 Path system variable on environment variables ....................................................................... 32 Figure 3-8 LitePoint IQxel waveform location .......................................................................................... 33 Figure 3-9 Loading waveform files on Agilent N5182A ........................................................................... 34 Figure 4-1 Station calibration GPIB power meter configuration ............................................................... 36 Figure 4-2 Station calibration VISA power meter configuration............................................................... 37 Figure 4-3 Station calibration SG resource ID ........................................................................................... 37 Figure 4-4 Station calibration LP IQ2010 as signal generator ................................................................... 38 Figure 4-5 Station calibration R&S CMW500 as signal generator ............................................................ 39 Figure 4-6 Station calibration Agilent N4010A as signal generator .......................................................... 40 Figure 4-7 Station calibration LP IQxel as signal generator ...................................................................... 40 Figure 4-8 Station calibration NI PXI5644R as signal generator .............................................................. 41 Figure 4-9 Station calibration LP IQxel as signal generator ...................................................................... 42 Figure 4-10 Station calibration test tree ..................................................................................................... 43 Figure 4-11 NFC tester calibration test ....................................................................................................... 44 Figure 7-1 Power supply section on WCNTesterConfig.xml .................................................................... 53 Figure 7-2 Bluetooth LitePoint config section in WCNTesterConfig.xml ................................................ 54 Figure 7-3 BT R&S CMW500 GPIB settings in WCNTesterConfig.xml ................................................. 54 Figure 7-4 Bluetooth waveform address section in WCNTesterConfig.xml ............................................. 55 Figure 7-5 BT AgilentN4010A VISA settings in WCNTesterConfig.xml ................................................ 55 Figure 7-6 BT LitePoint IQxel settings in WCNTesterConfig.xml ........................................................... 56 Figure 7-7 BT Anritsu MT8870A settings in WCNTesterConfig.xml ...................................................... 57 Figure 7-8 WLAN LitePoint test box section on WCNTesterConfig.xml ................................................. 59 Figure 7-9 R&S CMW WLAN section on WCNTesterConfig.xml .......................................................... 59 Figure 7-10 Agilent N4010A WLAN section on WCNTesterConfig.xml ................................................ 59 Figure 7-11 NI PXI5644R WLAN section on WCNTesterConfig.xml ..................................................... 60 Figure 7-12 OptionalConfigInfoList section for Anritsu MT8870A on WCNTesterConfig.xml .............. 60 Figure 7-13 ITcpClient section for Anritsu MT8870A on WCNTesterConfig.xml .................................. 60 Figure 7-14 WLAN LitePoint Test Box section (MIMO only) on WCNTesterConfig.xml ...................... 61 Figure 7-15 NI PXI5644R WLAN Section (MIMO only) on WCNTesterConfig.xml ............................. 62 Figure 7-16 FM test box section on WCNTesterConfig.xml .................................................................... 63 Figure 7-17 Sample R&S CBT config section in WCNTesterConfig.xml ................................................. 64 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 8 Wireless Connectivity Tests User Guide Contents Figure 7-18 AnritsuMT8852B config section in WCNTesterConfig.xml .................................................. 64 Figure 7-19 LitePoint IQNFC config section in NFCTesterConfig.xml .................................................... 65 Figure 8-1 Sample Bluetooth production test tree ..................................................................................... 66 Figure 8-2 Sample WLAN production test tree part I................................................................................ 67 Figure 8-3 Sample WLAN production test tree part II .............................................................................. 68 Figure 8-4 Sample FM production test tree ............................................................................................... 69 Figure 8-5 Sample ANT production test tree ............................................................................................. 70 Figure 8-6 Sample Bluetooth signaling test tree ......................................................................................... 71 Figure 8-7 NFC Functional test tree ........................................................................................................... 72 Figure 8-8 Sample NFC Reference Tree..................................................................................................... 74 Figure 9-1 Sample Bluetooth test initialization ......................................................................................... 75 Figure 9-2 Bluetooth DUT configuration file ............................................................................................ 77 Figure 9-3 Sample Bluetooth de-initialization ........................................................................................... 79 Figure 9-4 BT Diag Bridge - opening QPST ............................................................................................. 79 Figure 9-5 BT Diag Bridge - setup QPST IP address and port number ..................................................... 80 Figure 9-6 Running BT DIAG BRIDGE ................................................................................................... 81 Figure 9-7 BT Diag Bridge - QPST comport listing .................................................................................. 82 Figure 9-8 Connect DUT using DUT type and connection options............................................................ 83 Figure 9-9 Input parameters of ConnectDutUsingDutType ........................................................................ 83 Figure 9-10 Remote PC connects to DUT using UDT ............................................................................... 84 Figure 9-11 Sample WLAN test initialization ........................................................................................... 85 Figure 9-12 Sample WLAN test initialization with user Transport DLL .................................................. 85 Figure 9-13 Sample WLAN test de-initialization ...................................................................................... 86 Figure 9-14 Sample FM tester initialization .............................................................................................. 87 Figure 9-15 Sample FM RX initialization ................................................................................................. 88 Figure 9-16 Sample FM TX initialization.................................................................................................. 89 Figure 9-17 Sample FM de-initialization ................................................................................................... 89 Figure 9-18 Sample ANT test initialization ............................................................................................... 90 Figure 9-19 Sample ANT test de-initialization .......................................................................................... 90 Figure 9-20 NFC DUT Configuration file .................................................................................................. 92 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 9 Wireless Connectivity Tests User Guide Contents Tables Table 1-1 References ................................................................................................................................. 16 Table 1-2 Acronyms .................................................................................................................................. 17 Table 2-1 Test equipment needed for BT, WLAN and FM tests ............................................................... 22 Table 2-2 Test box supported by test solution ........................................................................................... 23 Table 2-3 Power supply supported by test solution ................................................................................... 24 Table 2-4 Signal generator supported by ANT solutions........................................................................... 24 Table 2-5 Spectrum analyzer supported by ANT solutions ....................................................................... 24 Table 2-6 Test equipment needed for station calibration ........................................................................... 25 Table 2-7 Power meter supported by test solution ..................................................................................... 25 Table 2-8 Signal generator supported by test solution ............................................................................... 25 Table 5-1 Bluetooth non-signaling production test matrix ........................................................................ 45 Table 5-2 WLAN production test matrix ................................................................................................... 46 Table 5-3 WLAN production test matrix ................................................................................................... 46 Table 5-4 FM production test matrix ......................................................................................................... 46 Table 5-5 ANT production test matrix ....................................................................................................... 47 Table 5-6 Bluetooth signaling production test matrix................................................................................. 47 Table 5-7 NFC production functional tests ................................................................................................. 48 Table 5-8 NFC functional test tree nodes ................................................................................................... 48 Table 5-9 NFC reference tests .................................................................................................................... 49 Table 5-10 NFC reference test tree nodes ................................................................................................... 49 Table 6-1 Supported chipsets ..................................................................................................................... 51 Table 9-1 Initialize Wlan tester parameters ............................................................................................... 85 Table 9-2 Connect DUT parameters .......................................................................................................... 86 Table 9-3 Connect DUT with user transport DLL parameters .................................................................. 86 Table 9-4 WLAN DUT load ...................................................................................................................... 86 Table 10-1 Set Bluetooth ChipID input parameters................................................................................... 95 Table 10-2 Set Bluetooth ChipID output parameters................................................................................. 95 Table 10-3 BTDUT_FFA_DisableLegacyLogMode input parameters ...................................................... 95 Table 10-4 BTDUT_FFA_DisableLegacyLogMode output parameters ................................................... 96 Table 10-5 BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST input parameters ............... 96 Table 10-6 BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST output parameters ............. 96 Table 10-7 BTDUT_LE_TX_Command input parameters ....................................................................... 96 Table 10-8 BTDUT_LE_TX_Command output parameters ..................................................................... 97 Table 10-9 Measure Tx output power and initial carrier frequency tolerance input parameters ............... 97 Table 10-10 Measure output power and initial carrier frequency tolerance output parameters................. 97 Table 10-11 Measure GFSK modulation DeltaF2 and CarrierDrift input parameters ............................... 97 Table 10-12 Measure GFSK modulation DeltaF2 and CarrierDrift output parameters ............................. 98 Table 10-13 Measure GFSK modulation DeltaF1 input parameters.......................................................... 98 Table 10-14 Measure GFSK modulation DeltaF1 output parameters........................................................ 98 Table 10-15 Measure EDR modulation input parameters.......................................................................... 98 Table 10-16 Measure EDR modulation output parameters........................................................................ 98 Table 10-17 Measure LE Tx output power input parameters .................................................................... 99 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 10 Wireless Connectivity Tests User Guide Contents Table 10-18 Measure LE Tx output power output parameters .................................................................. 99 Table 10-19 Measure LE modulation DeltaF1 input parameters ............................................................... 99 Table 10-20 Measure LE modulation DeltaF1 output parameters ............................................................. 99 Table 10-21 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate input parameters .................................................................................................................................................................. 100 Table 10-22 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate output parameters ................................................................................................................................................. 100 Table 10-23 Measure Rx sensitivity input parameters............................................................................. 100 Table 10-24 Measure RxSensitivity output parameters ........................................................................... 101 Table 10-25 Measure LE Rx sensitivity input parameters ....................................................................... 101 Table 10-26 Measure LE Rx sensitivity output parameters ..................................................................... 102 Table 10-27 BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST input parameters ........... 102 Table 10-28 BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST output parameters ......... 102 Table10-29 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 input parameters.................................. 103 Table 10-30 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 output parameters............................... 103 Table 10-31 SetUpDutTx parameters ...................................................................................................... 103 Table 10-32 TX EVM test input parameters ............................................................................................ 104 Table 10-33 TX EVM test output parameters .......................................................................................... 104 Table 10-34 TxVerifySpectrum test input parameters ............................................................................. 104 Table 10-35 TxVerifySpectrum test output parameters ........................................................................... 105 Table 10-36 Tx verify power test input parameters ................................................................................. 105 Table 10-37 TX verify power test output parameters .............................................................................. 105 Table 10-38 TxVerifyMask test input parameters ................................................................................... 106 Table 10-39 TxVerifyMask output parameters ........................................................................................ 106 Table 10-40 WLAN Per test input parameters......................................................................................... 107 Table 10-41 WLAN Per test output parameters ....................................................................................... 107 Table 10-42 WLAN PerSweepTest input parameters .............................................................................. 107 Table 10-43 WLAN PerSweepTest output parameters ............................................................................ 108 Table 10-44 WLAN PerSweepTest input parameters .............................................................................. 108 Table 10-45 SetUpDutTxDetails parameters ........................................................................................... 109 Table 10-46 TX EVM Test NxN input parameters.................................................................................. 110 Table 10-47 TX EVM Test NxN output parameters ................................................................................ 111 Table 10-48 Tx verify power test NxN input parameters ........................................................................ 111 Table 10-49 TX verify power Test NxN output parameters .................................................................... 111 Table 10-50 MeasureMask_NxN test input parameters........................................................................... 112 Table 10-51 MeasureMask_NxN test output parameters......................................................................... 112 Table 10-52 MeasureSpectrum_NxN test input parameters .................................................................... 113 Table 10-53 MeasureSpectrum_NxN test output parameters .................................................................. 113 Table 10-54 WLAN Per NxN test input parameters ................................................................................ 114 Table 10-55 WLAN Per NxN test output parameters .............................................................................. 114 Table 10-56 WLAN PerSweepTest_NxN input parameters .................................................................... 115 Table 10-57 WLAN PerSweepTest_NxN output parameters .................................................................. 115 Table 10-58 WLAN PerSweepTest input parameters .............................................................................. 116 Table 10-59 Sensitivity GONOGO input parameters .............................................................................. 116 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 11 Wireless Connectivity Tests User Guide Contents Table 10-60 Sensitivity GONOGO output parameters ............................................................................ 117 Table 10-61 Sensitivity characterization input parameters ...................................................................... 117 Table 10-62 Sensitivity characterization output parameters .................................................................... 117 Table 10-63 Max SNR input parameters ................................................................................................. 118 Table 10-64 Max SNR output parameters ............................................................................................... 118 Table 10-65 Intermediate SNR input parameters..................................................................................... 119 Table 10-66 Intermediate SNR output parameters................................................................................... 119 Table 10-67 THD input parameters ......................................................................................................... 120 Table 10-68 THD output parameters ....................................................................................................... 120 Table 10-69 RDS BLER input parameters .............................................................................................. 121 Table 10-70 RDS BLER output parameters ............................................................................................ 121 Table 10-71 TX output power input parameters ...................................................................................... 122 Table 10-72 TX output power output parameters .................................................................................... 122 Table 10-73 FM deviation input parameters ............................................................................................ 122 Table 10-74 FM deviation output parameters .......................................................................................... 122 Table 10-75 TX stereo audio SNR input parameters ............................................................................... 123 Table 10-76 TX stereo audio SNR output parameters ............................................................................. 123 Table 10-77 TX channel power input parameters .................................................................................... 123 Table 10-78 TX channel power output parameters .................................................................................. 124 Table 10-79 Receive sensitivity input parameters ................................................................................... 125 Table 10-80 Receive sensitivity output parameters ................................................................................. 125 Table 10-81 BTDUT_FFA_DisableLegacyLogMode input parameters .................................................. 126 Table 10-82 BTDUT_FFA_DisableLegacyLogMode output parameters ............................................... 126 Table 10-83 TRM/CA/01 TX Power GFSK input parameters ................................................................. 127 Table 10-84 TRM/CA/01 TX Power GFSK output parameters ............................................................... 127 Table 10-85 TRM/CA/07 modulation characteristics input parameters .................................................. 127 Table 10-86 TRM/CA/07 modulation characteristics output parameters ................................................ 127 Table 10-87 TRM/CA/08 initial carrier frequency tolerance input parameters ....................................... 128 Table 10-88 TRM/CA/08 initial carrier frequency tolerance output parameters ..................................... 128 Table 10-89 TRM/CA/09 carrier frequency drift input parameters ......................................................... 128 Table 10-90 TRM/CA/09 Carrier Frequency Drift output parameters .................................................... 129 Table 10-91 TRM/CA/10/C EDRRelativeTransmitPower input parameters .......................................... 129 Table 10-92 TRM/CA/10/C EDRRelativeTransmitPower output parameters ........................................ 129 Table 10-93 TRM/CA/11 EDR modulation accuracy input parameters .................................................. 130 Table 10-94 TRM/CA/11 EDR modulation accuracy output parameters ................................................ 130 Table 10-95 RCV/CA/01 sensitivity – single slot packets input parameters ........................................... 130 Table 10-96 RCV/CA/01 sensitivity – single slot packets output parameters ......................................... 131 Table 10-97 RCV/CA/02 sensitivity – multiple slot packets input parameters ....................................... 131 Table 10-98 RCV/CA/02 Sensitivity – multiple slot packets output parameters ..................................... 132 Table 10-99 RCV/CA/07 EDR sensitivity input parameters ................................................................... 132 Table 10-100 RCV/CA/07 EDR sensitivity output parameters ............................................................... 133 Table 10-101 NFCDUT_DetectTag input parameters .............................................................................. 134 Table 10-102 NFCDUT_DetectTag output parameters ............................................................................ 134 Table 10-103 NFCDUT_DetectField input parameters ............................................................................ 134 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 12 Wireless Connectivity Tests User Guide Contents Table 10-104 NFCDUT_DetectField output parameters .......................................................................... 134 Table 10-105 NFCDUT_SelfTest input parameters ................................................................................. 135 Table 10-106 NFCDUT_SelfTest output parameters ............................................................................... 135 Table 10-107 SetInstrumentConfigFile input parameters ......................................................................... 135 Table 10-108 SetInstrumentConfigFile output parameters ....................................................................... 135 Table 10-109 NFCDUT_SetConfigFile input parameters ........................................................................ 136 Table 10-110 NFCDUT_SetCOnfigFile output parameters ..................................................................... 136 Table 10-111 NFCDUT_Instantiate output parameters ............................................................................ 136 Table 10-112 DUT_InitFramework input parameters .............................................................................. 136 Table 10-113 InitFramework output parameters....................................................................................... 136 Table 10-114 EnableDUTPower input parameters ................................................................................... 137 Table 10-115 EnableDUTPower output parameters ................................................................................. 137 Table 10-116 WaitForPortToExist input parameters ................................................................................ 137 Table 10-117 WaitForPortToExist output parameters .............................................................................. 137 Table 10-118 NFCDUT_RunTopLevelScript input parameters ............................................................... 137 Table 10-119 NFCDUT_RunTopLevelScript output parameters ............................................................. 138 Table 10-120 NFCDUT_Connect output parameters ............................................................................... 138 Table 10-121 NFCDUT_PatchFirmwareUsingPatchFile input parameters.............................................. 138 Table 10-122 NFCDUT_PatchFirmwareUsingPatchFile output parameters............................................ 138 Table 10-123 InitializeNFCTester input parameters................................................................................. 139 Table 10-124 NFCDUT_DetectTag output parameters ............................................................................ 139 Table 10-125 NFCTesterCalibrate input parameters ................................................................................ 139 Table 10-126 NFCTesterCalibrate output parameters .............................................................................. 140 Table 10-127 NFCTesterLoadCalibration input parameters..................................................................... 140 Table 10-128 NFCTesterLoadCalibration output parameters................................................................... 140 Table 10-129 NFCDUT_CoreResetAndInit output parameters ............................................................... 140 Table 10-130 NFCDUT_ConfigureDUT input parameters ...................................................................... 140 Table 10-131 NFCDUT_ConfigureDUT output parameters .................................................................... 141 Table 10-132 ConfigureNFCTester input parameters............................................................................... 141 Table 10-133 ConfigureNFCTester .......................................................................................................... 142 Table 10-134 Type A initiator test default tester configuration ................................................................ 142 Table 10-135 Type B initiator test default tester configuration ................................................................ 142 Table 10-136 Type F initiator test default tester configuration ................................................................ 142 Table 10-137 Type A target test default tester configuration ................................................................... 143 Table 10-138 Type B target test default tester configuration ................................................................... 143 Table 10-139 Type F target test default tester configuration .................................................................... 143 Table 10-140 Resonance test default tester configuration ........................................................................ 144 Table 10-141 NFCDUT_FindResonance input parameters ...................................................................... 145 Table 10-142 NFCDUT_FindResonance output parameters .................................................................... 145 Table 10-143 NFCDUT_TuneCapNVM input parameters....................................................................... 146 Table 10-144 NFCDUT_TuneCapNVM output parameters..................................................................... 146 Table 10-145 InitiatorTest input parameters ............................................................................................. 146 Table 10-146 InitiatorTest output parameters ........................................................................................... 147 Table 10-147 Initiator Rx test input parameters ....................................................................................... 148 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 13 Wireless Connectivity Tests User Guide Contents Table 10-148 Initiator Rx test output parameters ..................................................................................... 149 Table 10-149 TargetTest input parameters ............................................................................................... 149 Table 10-150 TargetTest output parameters ............................................................................................. 149 Table 10-151 ResonanceTest output parameters ...................................................................................... 150 Table 10-152 Disconnect output parameters............................................................................................. 151 Table 10-153 Shutdown output parameters .............................................................................................. 151 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 14 1 Introduction 1.1 Purpose This document provides the procedures to perform wireless connectivity non-signaling RF tests and BT signaling tests using the Qualcomm® Sequence Profiling Resource (QSPR) and factory test mode (FTM) commands. 1.2 Scope This document is intended for use by test engineers and test equipment companies that need to control Qualcomm connectivity chipsets that are mated with Qualcomm processors (MSM™ or MDM or APQ) and standalone SoC based targets. This document contains non signaling tests for WCN2243, WCN36x0, AR3002, AR6003, AR6005 and QCA6174 Qualcomm devices. 1.3 Conventions Function declarations, function names, type declarations, and code samples appear in a different font, e.g., #include. Button and key names appear in bold font, e.g., click Save or press Enter. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 15 Wireless Connectivity Tests User Guide Introduction 1.4 Related documentation Reference documents, which may include Qualcomm, standards, and resource documents, are listed in section 1.4.1. 1.4.1 Qualcomm documents Table 1-1 References Reference Document DCN Qualcomm Q1 Factory Test Mode Procedure for WLAN RF Test (WCN131X/WCN3660/WCN3680) 80-WL300-18 Q2 Factory Test Mode Procedure for FM RF Test 80-WL300-17 Q3 Factory Test Mode Procedure for Bluetooth RF Test 80-WL024-12 Q4 Qualcomm Sequence Profiling Resource QSPR User guide 80-VB987-1 Q5 Qualcomm Sequence Profiling Resource (QSPR) Tester Configuration User Guide 80-VB987-3 Q6 Qualcomm Product Support Tool (QPST) 2.7 User Guide 80-V1400-3 Q7 How to Install Qualcomm 64-Bit Windows 7 USB Host Driver User Guide 80-N2328-2 Q8 Application Note: Software Glossary for Customers CL93-V3077-1 Q9 WCN36x0 Training WLAN Tx CLPC Characterization Using QSPR Tools 80-WL300-25 Q10 QCA61X4, QCA937X, QCA65X4 QDART USER GUIDE 80-WL400-24 R1 IEEE IEEE Std 802.11-2007 R2 IEEE IEEE Std_80211N_2009 R3 Bluetooth SIG RF-PHY.TS/4.0.1 R4 Bluetooth SIG BLUETOOTH SPECIFICATION Version 4.0 References 1.5 Technical assistance For assistance or clarification on information in this guide, submit a case to Qualcomm CDMA Technologies at https://support.cdmatech.com/. If you do not have access to the CDMATech Support Service website, register for access or send email to support.cdmatech@qualcomm.com. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 16 Wireless Connectivity Tests User Guide Introduction 1.6 Acronyms The following terms are used in this document. Some elements are identified by more than one term. Table 1-2 Acronyms Term 80-Y0306-1 Rev. L Definition APQ Applications-Only Processor QUALCOMM ARB Arbitrary BER Bit Error Rate BR Basic Rate BT Bluetooth CW Continuous Wave DPSK Differential Phase Shift Keying DQPSK Differential Quaternary Phase Shift Keying DUT Device Under Test EDR Enhanced Data Rate EUT Equipment Under Test EVM Error Vector Magnitude FFA Form Factor Accurate FTM Field Test Mode GFSK Gaussian Frequency Shift Keying GPIB General Purpose Interface Bus LE Low Energy MDM Mobile Data Modem MIMO Multiple-Input and Multiple Output MSM Mobile Station Modem NFC Near Field Communication PER Packet Error Rate QSPR Qualcomm Sequence Profiling Resource RF Radio Frequency R&S Rohde & Schwarz SG Signal Generator SoC System on a Chipset SRS System Requirement Specification SW Software UART Universal Asynchronous Receiver-Transmitter UDT User Defined Transport USB Universal Serial Bus MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 17 2 Hardware Setup and Requirements This section covers the hardware installation pieces required for BT, WLAN and FM production tests for connectivity chipsets that are mated with Qualcomm processors (MSM or MDM or APQ) or standalone SoC connectivity chipsets. The test solutions utilize FTM features integrated on Qualcomm processors to communicate with connectivity chipsets for testing. 2.1 RF test setup 2.1.1 BT/WLAN/FM RF test setup Figure 2-1 shows the test setup needed for performing BT, WLAN and FM RF functional tests. DUT in Figure 2-1 refers to an FFA device that contains Qualcomm processors (MSM or MDM or APQ) mated with supported connectivity chipset. BT/WLAN/FM Test setup USB Power supply 1 2 Default GPIB Addr:5 5 USB - GPIB FM Audio Digitizer USB ` Default: Litepoint AIM Module USB/ GPIB RIGHT IN LEFT IN DUT MSM or MDM or APQ 4 BT/WLAN/FM WLAN/BT Tester RF Port FM port Default: Litepoint IQ2010 Connectivity Chipset Battery connector 3 Recommended path loss 3dB to 7dB(max) RF Combiner FM Headset Antenna port FM PWB Antenna port BT/WLAN RF port Figure 2-1 BT/WLAN/FM RF test setup The following cables are required in the test setup: 1. A Power supply or battery emulator cable (cable#1) 2. An USB cable (cable #2) 3. A RF cable for FM headset and PWB paths using RF combiner from DUT to test box (cable #3) 4. A RF cable for BT and WLAN path from DUT to test box (cable #4) 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 18 Wireless Connectivity Tests User Guide Hardware Setup and Requirements 5. A Stereo to L-R/RCA audio cable from DUT stereo audio jack to FM audio interface module (cable #5). Note: the FM Audio Digitizer and its related audio and USB cabling is not required when FM audio is digitally captured directly from the DUT. 2.1.2 ANT RF test setup ANT RF functional tests are performed using the test setup shown below. ANT Test setup USB Power supply 1 2 Default GPIB Addr:5 USB - GPIB USB – GPIB ` Spectrum analyzer RF Input USB/ GPIB 3 DUT Default: Agilent E4402B Signal Generator RF Combiner MSM or MDM or APQ Connectivity Chipset RF Output Default: Agilent E4443A Battery connector ANT/BT/WLAN RF port Figure 2-2 ANT test setup The following cables are required in the test setup: 6. A Power supply or battery emulator cable 7. An USB cable 8. A RF cable for ANT path using RF directional coupler from DUT to ARB signal generator and spectrum analyzer 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 19 Wireless Connectivity Tests User Guide Hardware Setup and Requirements 2.1.3 WLAN MIMO test setup While not recommended for production, full WLAN MIMO characterization can be done with multi-chain setup show below. WLAN MIMO Test setup USB Power supply 1 2 Default GPIB Addr:5 USB - GPIB USB – GPIB ` USB/ GPIB DUT WLAN 2 chain MIMO Tester WLAN RF Ports 3 MSM or MDM or APQ Connectivity Chipset Default: Litepoint IQXel 2x2 Battery connector WLAN MIMO chain connections Figure 2-3 WLAN MIMO test setup The following cables are required in the test setup: 9. A Power supply or battery emulator cable 10. An USB cable (for standalone PCIe DUT, the DUT would be directly connected to the PC via a PCIe extender connection) 11. Two RF cables for both chains of the WLAN path from DUT to test box (cables #3) 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 20 Wireless Connectivity Tests User Guide Hardware Setup and Requirements 2.1.4 NFC parametric test setup Figure 2-4 shows the test setup needed for performing NFC parametric tests. DUT in Figure 2-4 refers to an FFA device that contains Qualcomm processors (MSM or MDM or APQ) mated with supported NFC connectivity chipset. NFC Testing is performed in a radiated fashion. The NFC DUT antenna and the NFC Tester antenna should be placed in close proximity, similar to a NFC tag. Figure 2-4 NFC parametric test setup 2.2 Station calibration 2.2.1 BT/WLAN/FM station calibration setup Setup in Figure 2-5 is utilized to perform station calibration on various RF paths. The following paths are required to be calibrated for performing BT, WLAN, FM and ANT tests: A Bluetooth path (default path name = BTPath) A WLAN path (default path name = WCD) A FM headset path (default path name = FM_HS_RX) A FM pwb path (default path name = FM_PWB_RXTX) An ANT Transmit path (transmit path name = SAPath) An ANT Receive path (default path name = ARBPath) A signal generator is connected on the DUT end in order to calibrate the path losses on the above listed RF paths from DUT to power meter. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 21 Wireless Connectivity Tests User Guide Hardware Setup and Requirements BT/WLAN/FM Station Calibration setup USB - GPIB USB ` Signal generator Default GPIB Addr: 19 RF out Power meter RF in Default GPIB Addr: 9 Figure 2-5 Station calibration setup 2.3 Test equipment The list of test equipment needed to perform BT, WLAN and FM tests are mentioned in Table 2-1. If test equipment is GPIB controlled, GPIB address is configurable based on an external configuration file. Please follow the instructions in Chapter 7 to update the GPIB address for respective test equipment. Table 2-1 Test equipment needed for BT, WLAN and FM tests Manufacturer / Model 80-Y0306-1 Rev. L Description Quantity Default GPIB Address Supported test box Refer to 2.3.1 for supported connectivity test box 1 20 (if GPIB based) Supported power supply Refer to section 2.3.2for supported power supply 1 5 Supported signal generator for ANT Refer to 2.3.3 for supported signal generator for ANT 1 19 Supported spectrum analyzer for ANT Refer to 2.3.4 for supported spectrum analyzer for ANT 1 18 Supported BT signaling test box Refer to 2.3.1 for supported BT signaling test box 1 27 MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 22 Wireless Connectivity Tests User Guide Hardware Setup and Requirements 2.3.1 Supported BT, WLAN, NFC and FM test box To perform connectivity tests one of supported test boxes on Table 2-2 should be used. Table 2-2 Test box supported by test solution Manufacturer / Model Description Required Options LitePoint IQ2010 Non-signaling connectivity test box (WLAN(SISO)/BT/FM) FM Software License: 0300-20XX-002 FM AUDIO Analysis Option: 0300-20XX-003 Refer to section 3.3 for SW details R&S CMW500 Non-signaling connectivity test box (WLAN(SISO)/BT no FM) BT/WLAN RF generator (prerequisite: CMW-B110A) BT Measurements (CMW-KM610) BT Low Energy (CMW-KM611) WLAN ABG RF analyzer (CMW-KM650) WLAN N RF analyzer (CMW-KM651) Agilent N4010A Non-signaling connectivity test box (WLAN(SISO)/BT no FM) 2.4 GHz and 5 GHz WLAN Tx/Rx analysis: N4010A-103 802.11n MIMO modulation analysis: N4010A-108 Bluetooth: N4010A-101 Bluetooth EDR – transmit and receive:N4010A-105 Bluetooth LE Tx/Rx: N4010A-109 Refer to Section 3.5 for SW details LitePoint IQxel Non-signaling connectivity test box (WLAN(SISO+MIMO)/BT no FM) Bluetooth 1,2,3,4(LE) SW License : 0300-IXEL-001 Iqxel80 Test System,802.11a,b,g,n,ac(80MHz) : 0100IXEL-002 Refer to section 3.6 for SW details NI PXI5644R Non-signaling connectivity test box (WLAN(SISO+MIMO) only) Refer to section 3.7 for SW details Anritsu 8870A Non-signaling connectivity test box (WLAN(SISO) + BT + FM) MU887000A MU887000A-001 MV887030A MV887031A MX887030A MX887031A MV887040A MX887040A MX887050A R&S CBT BT Signaling test box (Bluetooth only) CBT-K55 “Enhanced Data Rate” CBT-K57 “Low Energy” Anritsu MT8852B BT Signaling test box (Bluetooth only) Option 27 “Low Energy” LitePoint IQNFC NFC test box Advanced Software License 2.3.2 Supported power supply In order to perform RF tests one of the power supplies mentioned in Table 2-3 should be used. The model string on the config file column refers to the model number information that can be specified on the configuration file to switch to other equipment than default. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 23 Wireless Connectivity Tests User Guide Hardware Setup and Requirements Table 2-3 Power supply supported by test solution Manufacturer / Model Description Model String on Config File Keithley2303 (Default) Keithley 2303 power supply PS_KEITHLEY2303 Fluke 2812 /2813 Fluke 2812/2813 power supply PS_FlukePM2812/ PS_FlukePM2813 Agilent E3640A/ Agilent E3641A/ Agilent E3642A/ Agilent E3643A/ Agilent E3644A/ Agilent E3645A/ Agilent E3646A/ Agilent E3647A/ Agilent E3648A/ Agilent E3649A Agilent E364xA power supply PS_AgilentE3640A/ PS_AgilentE3641A/ PS_AgilentE3642A/ PS_AgilentE3643A/ PS_AgilentE3644A/ PS_AgilentE3645A/ PS_AgilentE3646A/ PS_AgilentE3647A/ PS_AgilentE3648A/ PS_AgilentE3649A/ INSTEK 3202 Instek 3202 power supply PS_PST3202 XantrexXDL355T Xantrek XDL 355T power supply PS_XDL355T 2.3.3 Supported signal generator for ANT Table 2-4 Signal generator supported by ANT solutions Manufacturer / Model AgilentN5182A Description Agilent N5182A RF Vector Signal Generator with option 506 for 6GHz Model String on Config File SG_AgilentN5182A 2.3.4 Supported spectrum analyzer for ANT Table 2-5 Spectrum analyzer supported by ANT solutions Manufacturer / Model AgilentE4443A AgilentE4402B AgilentE4403B AgilentE4404B AgilentE4405B AgilentE4407B AgilentE4408B 80-Y0306-1 Rev. L Description Agilent E4443A PSA Spectrum Analyzer Agilent E440xB ESA Spectrum Analyzer Model String on Config File SA_ AgilentE4443A MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 24 Wireless Connectivity Tests User Guide Hardware Setup and Requirements 2.4 Station calibration test equipment This section lists the test equipment required for station calibration. Station calibration is meant to update the RF path losses on various RF paths on a station calibration data file in the local PC. It is recommended to run an automated station calibration, but this file could be updated manually as well. Table 2-6 Test equipment needed for station calibration Manufacturer / Model Description Quantity Default Supported signal generator Refer to Section 2.4.2 for supported signal generators 1 LitePoint IQ2010 Supported power meter Refer to Section 2.4.1 for supported power meters 1 Giga-tronics 8541C 2.4.1 Supported power meter for station calibration To perform station calibration one of supported power meters in Table 2-7 should be used. Additional power meters from the same vendors may work if the GPIB command set is the same. The model string on the config file column refers to the model number information that can be specified on the configuration file to switch to other equipment rather than the default. Table 2-7 Power meter supported by test solution Manufacturer / Model Description Model String on Config File Agilent 4418B (Default) Agilent 4418B PM_HPE4418B Giga-tronics 8651A Giga-tronics 8651A PM_GIG8651A Giga-tronics 8541C Giga-tronics 8541C PM_GIG8541C Agilent 437B Agilent 437B PM_HP437B Rhode & Schwartz NRP-Z11 PM_RSNRPZ11 2.4.2 Supported signal generator for station calibration To perform station calibration one of supported signal generator mentioned in Table 2-8 should be used. Please note that the signal generators listed on Table 2-8 are the supported signal generators that go at least to 6GHz or more. Table 2-8 Signal generator supported by test solution Manufacturer / Model 80-Y0306-1 Rev. L Description Model String on Config File LitePoint IQ2010 (Default) LitePoint IQ2010 with IQMeasure SW SG_LitepointIQ2010 Agilent N4010A Agilent N4010A - Test Suite version 6.53.0 SG_AgilentN4010A R&S CMW500 Rohde and Schwarz CMW500 SG_CMW500 LitePoint IQxel LitePoint IQxel SG_LitePointIQxel NI PXI5644R National Instrument PXI5644R SG_NITrident Anritsu MT8870A Anritsu MT8870A SG_AnritsuMT8870A Agilent 83712B Agilent 83712B Synthesized CW Generator, 10 MHz to 20 GHz SG_Agilent83712B MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 25 Wireless Connectivity Tests User Guide Hardware Setup and Requirements Manufacturer / Model 80-Y0306-1 Rev. L Description Model String on Config File Agilent 8665B Agilent 8665B High-Performance Signal Generator, 6GHz SG_Agilent8665B AgilentE8257D Agilent E8257D PSD Signal Generator SG_AgilentE8257D AgilentN5182A Agilent N5182A RF Vector Signal Generator with option 506 for 6GHz SG_AgilentN5182A Keithley2920 Keithley 2920 RF Vector Signal Generator SG_Keithley2920 Anritsu MT8870A Anritsu MT8870A SG_AnritsuMT8870A MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 26 3 Software Installation 3.1 SW requirements The following are software requirements for a PC that would run Wireless Connectivity test solutions on a Qualcomm based target. Appropriate version numbers are included against software packages where a specific version is required: Windows XP with Service Pack 3 or Windows 7 Qualcomm SW tools QDART installation with Manufacturing tool kit for QSPR option checked – QDART 4.8.05 or above QPST installer – Refer to [Q6] in Qualcomm documents of section 1.4.1 Qualcomm Windows XP/7 USB composite drivers – [Q7] 3rd Party tools NI 488.2 GPIB 2.73 version or later (See Section 3.3 for details) LitePoint IQ2010 software (See Section 3.5 for details) Agilent N4010A software (See Section 3.6 for details) LitePoint IQxel wave files (See Section 3.7 for details) National Instrument NI PXI5644R (See Section 3.8 for details) LitePoint IQNFC software(See Section 3.10 for details) Android debug bridge (adb) installed / available on system path (See Section 3.4 for details) – Included as part of Android SDK from Google Adb.exe (Android debug bridge executable) Adbwinapi.dll (ADB Windows API DLL) Android Windows XP/7 USB drivers – Obtain drivers from SW team usually drivers are included with the Android build – Install the USB drivers on boot up of the DUT 3.2 QDART for non-FFA setup Please see [Q10], QDART Users Guide for more information. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 27 Wireless Connectivity Tests User Guide Software Installation 3.3 NI GPIB setup National Instruments’ GPIB software and drivers are used to control the power supply, power meter, signal generator and GPIB controlled connectivity test box connected to the PC to perform the automated testing. 3.3.1 NI GPIB software setup The NI 488.2 software can be downloaded from the NI website at http://www.ni.com. NOTE: NI 488.2 3.02 version or later is required to be compatible with test software. Also, “.NET framework 4.0 Languages support” must be selected as part of installation as listed below: To setup NI GPIB software: 1. Navigate to the latest NI GPIB software and run the setup.exe 2. Follow the on-screen prompts to install the NI 488.2 drivers and software 3. Please select Custom on the select installation option window 4. On the features to install window, please ensure that “.NET Framework 4.0 Languages support” is selected to install this feature Figure 3-1 Enable .NET Framework 4.0 Support on NI 488.2 for Windows Install 5. The installer installs several parts of the package and then prompts for the addition of GPIB hardware. The wizard may be cancelled as the addition can be done when the hardware is plugged in. 6. Complete the installation by rebooting the computer. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 28 Wireless Connectivity Tests User Guide Software Installation 3.3.2 NI GPIB driver setup When the USB to GPIB controller is connected to the USB port on the PC, Windows starts to install the hardware driver for GPIB-USB controller. The following steps need to be followed for installing the driver properly: 1. Windows will prompt the “Found New Hardware Wizard.” Make sure that “Yes, this time only” is selected for windows update to search for drivers. Figure 3-2 Signal generator supported by test solution 2. Windows prompts for automatic or manual installation of the driver. Make sure that the automatic installation is selected. Figure 3-3 NI GPIB hardware setup – step 2 3. Windows will install the driver for the USB to GPIB controller and completes the hardware driver installation procedure. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 29 Wireless Connectivity Tests User Guide Software Installation Figure 3-4 NI GPIB hardware setup – step 3 3.4 Android debug bridge installation NOTE: These steps are specific based on HLOS on the embedded side. Skip them for non-Android HLOS. The following steps will install adb and will add it to the system path: 1. Install the Android SDK from Google or obtain the SDK files from the software team. 2. Copy the following two Android SDK files into a local directory such as C:\Android_tools. Android debug bridge executable (Adb.exe) Adb Windows API dll (Adbwinapi.dll) 3. Navigate to system properties on the computer. On Advanced tab, click on “Environment Variables…” and scroll to the Path variable on System variables section. Figure 3-5 Path system variable on environment variables 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 30 Wireless Connectivity Tests User Guide Software Installation 4. Click on “Edit…” and add C:\Android_tools or the local directory where the files are as shown in Figure 3-6. Figure 3-6 Add ADB as part of the system path 3.5 LitePoint software for running NOTE: These steps are specific to LitePoint IQ2010 software installation. The following software programs are needed for LitePoint IQ2010. Please contact LitePoint to obtain this software. Drivers for IQ2010 installed on the PC (only required for LitePoint IQ2010) NOTE: Should be available as part of the disk that came with LitePoint IQmeasure package 3.0.8.3 or above – Available from LitePoint Test solutions are validated with IQMeasure package 3.0.8.3 Bin folder of IQMeasure is required to be added to Windows system “Path” – 80-Y0306-1 Rev. L Navigate to system properties on the computer. On Advanced tab, click on “Environment Variables…” and scroll to the Path variable on System variables section. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 31 Wireless Connectivity Tests User Guide Software Installation Figure 3-7 Path system variable on environment variables – Click on Edit... and add “C:\LitePoint\IQmeasure\IQmeasure_3.0.8.3” 3.6 Agilent N4010A software installation An Agilent IO library 14.2 is required to be installed for Agilent N4010A testing. Agilent WLAN test software suite version A.06.53.00 and Agilent drivers are required to be installed before running the test. For downloading WLAN and custom Bluetooth waveforms, please contact Agilent Technologies N4010A Technical Support Team to get a website link and password: JIANNDER SHAW jiann-der_shaw@agilent.com, LEI YANG lei_yang@agilent.com, GRACE HU grace_hu@agilent.com 3.7 LitePoint IQxel wave files installation 80-Y0306-1 Rev. L Obtain wave files with iqvsg extensions from LitePoint and copy to tester PC. Add the path location of the wave files to the config file WCNTesterConfig.xml under the IQxel WLAN and BT section in info item name “WaveFilePath”. If the wave file names differ from the default file names in WCNTesterConfig.xml under the IQxel WLAN and BT section, enter the correct wave file names to be associated with each rate. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 32 Wireless Connectivity Tests User Guide Software Installation Figure 3-8 LitePoint IQxel waveform location 3.8 NI PXI5644R software installation The following software programs are needed for NI PXI5644R. Please contact National Instruments to obtain this software. 80-Y0306-1 Rev. L Drivers for NI WLAN, NI Spectral Measurement Tool, NI-VST and NI-RIO installed on the PC. This is available as part of the disk that comes with National Instruments NIDotNetWrappersClassLibrary.dll and QDART NI client server modules are required. – Available from NI. Please note that the remote servers from NI needs to be running while QSPR is communicating with the NI PXI 5644R Generally, when the software is installed, it will reside in C:/Program Files/National Instruments and the DLLs for toolkits and drivers will reside in C:/Program Files/IVI Foundation MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 33 Wireless Connectivity Tests User Guide Software Installation To obtain further information on the system requirements and setup please contact qct_FTTL@ni.com, reference part number 862003-01. 3.9 Agilent N5182A software and waveform files installation (ANT only) Agilent N7622B Signal Studio for Toolkit is required to copy ANT waveform files to Agilent N5182A (or equivalent Agilent) ARB signal generator. This software is available for download from Agilent technologies website for free. After installation, use the settings shown below to download the waveform files. Figure 3-9 Loading waveform files on Agilent N5182A 3.10 LitePoint IQNFC Software NOTE: These steps are specific to LitePoint IQNFC software installation. Skip this section if LitePoint IQNFC is not used at test box. The following software programs are needed for LitePoint IQNFC. Please contact LitePoint to obtain this software. Drivers + Software for IQNFC installed on the PC 80-Y0306-1 Rev. L Should be available as part of the disk that came with LitePoint MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 34 4 Station Calibration This section describes the station calibration test tree procedure. This test tree provides a way to perform station calibration and update the files using an automation environment. 4.1 Station calibration data file 4.1.1 BT/WLAN/FM RF test station calibration data file Path loss on the RF path between the antenna test ports on DUT to the power meter is stored in the station calibration data file. Station calibration data file is present in: C:\QUALCOMM\WCN\ProdTests\StationCal\QTA_CalDataFile.xml. The following paths are required to be calibrated for performing BT, WLAN, FM and ANT tests: Bluetooth path (default path name = BTPath) WLAN path (default path name = WCD) FM FM headset path (default path name = FM_HS_RX) FM pwb path (default path name = FM_PWB_RXTX) ANT ANT transmit path (default path name = SAPath) ANT receive path (default path name = ARBPath) The data list main tag contains various data elements that contain the frequency at which loss (value) was measured. Delta indicates the difference between the current measurement to the previous measurement.2400 11.35 0 4.2 Station calibration instrument config file Signal generator and power meter equipment to be utilized to perform station calibration is indicated by the instrument config file for station calibration. StationCalInstrumentConfigFile.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration. The following XML tag can be changed by the user for power meter and signal generator: 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 35 Wireless Connectivity Tests User Guide Station Calibration Model tag needs to reflect the model number of power meter and signal generator on their respective sections. Please use the model string config information specified in section 2.4.1 and 2.4.2 for changing the test equipment model if they are different from defaults. GPIB primary address for both types of equipment is specified intag. SG_Agilent83712B PM_GIG8541C Power meter configuration Make suretag contains “CALPM” - tag. GPIB based power meter configuration. – Use
tag as “NIGPIB”. – Configure tag with BoardID , PrimAddress and ScndAddress Figure 4-1 Station calibration GPIB power meter configuration 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 36 Wireless Connectivity Tests User Guide Station Calibration VISA based power meter configuration (R&S NRPZ11 only) – Use tag as “Visa32”. – Configure tag with VISA instrument string or VISA instrument alias. Figure 4-2 Station calibration VISA power meter configuration Signal generator configuration: In order to use the certain test equipment for station calibration, find the section of the test equipment, set tag to “CALSG”, and change other equipment tag to something else. Figure 4-3 Station calibration SG resource ID 80-Y0306-1 Rev. L LitePoint IQ2010 as signal generator – Under - CALSG
tag configure - tag as “CALSG” – Model – SG_LitepointIQ2010 – Under OptionalConfigInfoList, check the ServerExeFullLocation path to ensure that the StartLitepointConnectivityServer.exe is available. Set IPAddress, set RFPort to “LEFT” to use left RF port, “RIGHT” to use right RF port or “FM” to use FM port. Check the installation required for LitePoint software in section 3.3. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 37 Wireless Connectivity Tests User Guide Station Calibration Figure 4-4 Station calibration LP IQ2010 as signal generator 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 38 Wireless Connectivity Tests User Guide Station Calibration R&S CMW500 as signal generator – Under
tag configure - tag as “CALSG” – Model – SG_CMW500 – Specify GPIB primary address specified in
Figure 4-5 Station calibration R&S CMW500 as signal generator 80-Y0306-1 Rev. L Agilent N4010A as signal generator – Under tag configure - tag as “CALSG” – Model – SG_AgilentN4010A – Set Partial Class Name to Visa32 – Specify Visa instrument string or Visa instrument alias for
tag MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 39 Wireless Connectivity Tests User Guide Station Calibration Figure 4-6 Station calibration Agilent N4010A as signal generator LitePoint IQxel as signal generator – Under tag configure - tag as “CALSG” – Model – SG_LitePointIQxel – Under OptionalConfigInfoList. Set RFPort to “LEFT” to use left RF port or “RIGHT” to use right RF port, set host IP address and port number. Figure 4-7 Station calibration LP IQxel as signal generator 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 40 Wireless Connectivity Tests User Guide Station Calibration NI PXI5644R as signal generator – Under
tag configure - tag as “CALSG” – Model – SG_NITrident – Under OptionalConfigInfoList. Check the NIWrapperDLLPath and NIWrapperDLLName. Figure 4-8 Station calibration NI PXI5644R as signal generator 80-Y0306-1 Rev. L Anritsu MT8870A as signal generator – Under
tag configure - tag as “CALSG” – Model – SG_AnritsuMT8870A – Under OptionalConfigInfoList. Set RFPort to “1” to use left RF port or “2” to use right RF port, set host IP address and port number. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 41 Wireless Connectivity Tests User Guide Station Calibration Figure 4-9 Station calibration LP IQxel as signal generator 4.3 Station calibration procedure 4.3.1 BT/WLAN/FM RF test station calibration procedure 1. From the Windows Start menu, select Start All Programs QDART QSPR 2. From QSPR, open the Test Tree by selecting File Open C:\QUALCOMM\WCN\ProdTests\TestTrees\StationalCalibration.xtt 3. Click the Go/No-Go button on the QSPR menu (the right arrow represented as a green-circle on Figure 4-10). 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 42 Wireless Connectivity Tests User Guide Station Calibration Figure 4-10 Station calibration test tree 4. Ignore the warning messages as the test tree is meant for updating the local files 5. While performing the station calibration if messages pop up to merge the paths for WLAN path, select “Yes” to merge path for WLAN 2.4 GHz and 5 GHz path 6. At the end of successful test tree execution, the data file in this location: C:\QUALCOMM\WCN\ProdTests\StationCal will be updated 4.3.2 NFC RF test station calibration procedure NFC Tester Calibration is required if using LitePoint IQNFC tester. The calibration data is used by the tester while performing frequency sweep tests (NFCResonanceTest and NFCDUT_FindResonance tests). Please run the ‘NFCTesterCalibrate’ test once manually with the complete fixture but with no DUT on the NFCTester Antenna. This test will save the calibration file to local disk which can be used every time the tree is run on that particular station. The calibration file is unique to the Field Strength Level, Start Freq, Step Frequency and Stop Frequency which was used to run the calibrate function. ConfigureNFCTester test used to configure for Frequency Sweep and FindResonance tests should use the same parameters as the Calibration Test. This test is part of NFC_Test_Reference.xtt 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 43 Wireless Connectivity Tests User Guide Station Calibration Figure 4-11 NFC tester calibration test 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 44 5 Test Matrix The following matrices present the type of tests and brief description of various tests that are performed in production environments. Detailed explanation and test settings are covered in later sections. 5.1 Bluetooth non-signaling production test matrix Table 5-1 lists the tests that are covered under this document for testing Bluetooth devices in production environment. Table 5-1 Bluetooth non-signaling production test matrix Rate 80-Y0306-1 Rev. L Test Name Description BR Measure_OutputPower_InitialCarrierFr equencyTolerance This test measures average transmitter output power and transmitter initial carrier frequency tolerance. BR Measure_GFSK_Modulation_DeltaF2_ CarrierDrift This test measures Delta F2 and carrier frequency drift of the BT transmitter BR Measure_GFSK_Modulation_DeltaF1 This test measures Delta F1 of the BT transmitter BR GFSK RX Sensitivity This test verifies minimum sensitivity at a given power and measures BER %. BR GFSK Max Input Power This test verifies maximum input power at a given power and measures BER %. EDR Measure_EDRModulation This test verifies the transmitter carrier frequency stability and modulation accuracy EDR EDR Sensitivity This test verifies sensitivity at a given power and measures BER %. EDR EDR Max Input Power This test measure maximum input power for given maximum BER %. BLE Measure_LE_TxOutputPower This test measures average transmitter output power BLE Measure_LE_Modulation_DeltaF1 This test measure modulation parameters like DeltaF1 BLE Measure_LE_Modulation_DeltaF2_Fre qOffset_FreqDrift_MaxDriftRate This test measures delta F2, frequency offset, carrier drift and max drift rate of LE transmitter BLE LE RX Sensitivity This test measure LE receiver sensitivity BLE LE Max Input Power This test measure max input power for given maximum PER% MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 45 Wireless Connectivity Tests User Guide Test Matrix 5.2 WLAN production SISO test matrix Table 5-2 lists the tests that are covered under this document for testing WLAN devices in production environment. Table 5-2 WLAN production test matrix Test Name Description SetUpDutTx Sets up the DUT for TX testing WlanTxEVMTest Transmit Modulation Accuracy Test; Measures EVM WlanTxVerifySpectrumTest Transmit Spectrum Verification Test; Measures center frequency leakage and spectral flatness WlanTxVerifyMaskTest Transmit Spectrum Mask Verification Test WlanTxVerifyPowerTest Transmit Power Verification Test; Measures maximum, minimum average TX power and maximum, minimum, average Peak TX Power WlanPerTest Receiver Minimum Input Sensitivity Test; Measures PER 5.3 WLAN production MIMO test matrix Table 5-3 lists the tests that are covered under this document for testing MIMO and SISO WLAN devices in production environment. Table 5-3 WLAN production test matrix Test Name Description SetUpDutTxDetails Sets up the DUT for TX testing (QCA6174) WlanTxEvmTest_NxN Transmit Modulation Accuracy Test for MIMO/SISO modulation rate; Measures EVM, Power Freq_err etc. MeasureSpectrum_NxN Transmit Spectrum Verification Test for MIMO/SISO modulation rate; Measures center frequency leakage and spectral flatness WlanTxVerifyPowerTest_NxN Transmit Power Verification Test for MIMO/SISO modulation rate; Measures maximum, minimum average TX power and maximum, minimum, average Peak TX Power WlanPerTest_NxN Receiver Minimum Input Sensitivity Test for MIMO/SISO modulation rate; Measures PER 5.4 FM production test matrix Table 5-4 lists the tests that are covered under this document for testing FM devices in production environment. Table 5-4 FM production test matrix Test Name 80-Y0306-1 Rev. L Description RX Sensitivity GONOGO This test verifies sensitivity at a given power and measures SNR RX Sensitivity Characterization This test finds the minimum sensitivity level with an iterative search MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 46 Wireless Connectivity Tests User Guide Test Matrix Test Name NOTE: Description RX Max SNR This test measures SNR at a strong input signal level RX Intermediate SNR This test measures SNR at an intermediate input signal level with AM distortion added to the FM signal RX THD This test measures Total Harmonic Distortion RX RDS Block Error Rate This test measures RDS Block Error Rate (BLER) TX Output Power This test measures TX output power TX FM Deviation This test measures FM deviation on the TX signal TX Stereo Audio SNR This test measures audio SNR for Left & Right channels on the TX signal All FM tests are not supported with WCN2243. Tests listed in bold in Table 5-4 are not supported for WCN2243. Tests that are supported by WCN2243 are only supported for default headset path. 5.5 ANT production test matrix Table 5-5 lists the tests that are covered under this document for testing ANT devices in production environment. Table 5-5 ANT production test matrix Test Name Description RX Sensitivity This test finds the minimum sensitivity level with an iterative search TX Channel Power This test measures TX channel output power 5.6 WLAN WCN36x0 CLPC calibration Refer to [Q9] for WLAN closed loop power control calibration for WCN36x0. 5.7 Bluetooth signaling production test matrix Table 5-6 lists the tests that are covered under this document for testing Bluetooth devices in signaling environment. Table 5-6 Bluetooth signaling production test matrix Rate 80-Y0306-1 Rev. L Test Name Description BR TRM/CA/01 TX Output Power Verification of the maximum peak and average RF-output power. BR TRM/CA/07 Modulation Characteristics Verification of the modulation index. BR TRM/CA/08 Initial Carrier Frequency Tolerance Verification of the transmitter carrier frequency accuracy BR TRM/CA/09 Carrier Frequency Drift Verification of the transmitter center frequency drift within a packet. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 47 Wireless Connectivity Tests User Guide Rate Test Matrix Test Name Description EDR TRM/CA/10 EDR Relative Transmit Power This test ensures the difference in average transmit power during frequency modulated [GFSK] and phase modulated [DPSK] portions of a packet is within an acceptable range. EDR TRM/CA/11 EDR Carrier Frequency Stability and Modulation Accuracy This test verifies the transmitter carrier frequency stability and modulation accuracy. BR RCV/CA/01 Sensitivity – single slot packets The sensitivity is tested using a non-ideal transmitter (oneslot packet). BR RCV/CA/02 Sensitivity – multiple slot packets Multi-slot packets are sent to the EUT at the sensitivity level. EDR RCV/CA/07 EDR Sensitivity Verification of the receiver sensitivity for the 10-4 bit error rate using a non-ideal transmitter. BLE TRM-LE/CA/01/02 LE TX Output Power This test verifies the maximum peak and average power emitted from the EUT. BLE TRM-LE/CA/05 LE Modulation DeltaF1 This test verifies that the modulation characteristics (delta F1) of the transmitted signal are correct. BLE TRM-LE/CA/05/06/07 LE Modulation Delta F2 and Frequency Offset and Drift This test verifies that the modulation characteristics (delta F2) of the transmitted signal are correct. This test verifies that the carrier frequency offset and carrier drift of the transmitted signal is within specified limits. BLE RCV-LE/CA/01/02 LE Receiver Sensitivity This test verifies that the receiver sensitivity is within limits for non-ideal signals. 5.8 NFC production functional test matrix Table 5-7 lists the tests that are covered under this document for testing NFC device functionality. Table 5-7 NFC production functional tests Test Description Detect Tag This test verifies the DUT is able to detect a NFC tag. Detect Field This test verifies the DUT is able to detect an externally generated NFC field. NFCDUT_SelfTest This test is based on the NFC chip’s built in Self Test Function Table 5-8 NFC functional test tree nodes Test 80-Y0306-1 Rev. L Applicable to Phone Applicable to SoC SetInstrumentConfigFile Yes Yes NFCDUT_SetConfigFile Yes Yes NFCDUT_Instantiate Yes Yes DUT_InitFramework Yes Yes NFCDUT_RunTopLevelScript No Yes MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 48 Wireless Connectivity Tests User Guide Test Matrix Test NOTE: Applicable to Phone Applicable to SoC NFCDUT_Connect Yes Yes NFCDUT_CoreResetAndInit Yes Yes NFCDUT_PatchFirmwareUsingPatchFile No Yes DialogBox_DetectTAG Yes Yes NFCDUT_DetectTAG Yes Yes NFCDUT_SelfTest Yes No DialogBox_EnableField Yes Yes NFCDUT_DetectField Yes Yes NFCDUT_Disconnect Yes Yes NFCDUT_Shutdown Yes Yes NFC Test nodes that are not applicable for a particular DUT type will be ignored and just exit true. 5.9 NFC reference test matrix Table 5-9 lists the tests that are covered under this document for testing NFC device functionality. Table 5-9 NFC reference tests Test Description Initiator Test This test measures the different RF characteristics of the DUT Initiator Tx waveform InitiatorRx Test This test verifies the functionality of the DUT Initiator Rx block. Target Test This test measures the different RF characteristics of the DUT Target Tx waveform NFC Resonance Test This test measures the resonance frequency which the DUT is tuned to. Detect Tag This test verifies the DUT is able to detect a NFC tag. Detect Field This test verifies the DUT is able to detect an externally generated NFC field. NFCDUT_SelfTest This test is based on the NFC chip’s built in Self Test Function Table 5-10 NFC reference test tree nodes Test 80-Y0306-1 Rev. L Applicable to Phone Applicable to SoC SetInstrumentConfigFile Yes Yes NFCDUT_SetConfigFile Yes Yes NFCDUT_Instantiate Yes Yes DUT_InitFramework Yes Yes MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 49 Wireless Connectivity Tests User Guide Test Matrix Test NOTE: 80-Y0306-1 Rev. L Applicable to Phone Applicable to SoC NFCDUT_RunTopLevelScript No Yes NFCDUT_Connect Yes Yes NFCDUT_CoreResetAndInit Yes Yes NFCDUT_PatchFirmwareUsingPatchFile No Yes NFCDUT_FindResonance No Yes NFCDUT_TuneCapNVM No Yes InitiatorTest Yes Yes InitiatorRxTest Yes Yes TargetTest Yes Yes ResonanceTest Yes Yes DialogBox_DetectTAG Yes Yes NFCDUT_DetectTAG Yes Yes DialogBox_EnableField Yes Yes NFCDUT_DetectField Yes Yes NFCDUT_SelfTest Yes No NFCDUT_Disconnect Yes Yes NFCDUT_Shutdown Yes Yes NFC Test nodes that are not applicable for a particular DUT type will be ignored and just exit true. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 50 6 Chipsets Supported Table 6-1 lists supported Wireless Connectivity chipsets. These chipsets are supported as long as they are mated to Qualcomm applications processor targets with appropriate FTM test support. Table 6-1 Supported chipsets Chipset Bluetooth WLAN FM ANT NFC WCN2243 Yes No Yes No No WCN36x0 Yes Yes Yes Yes No AR6003 No Yes No No No AR6004 No Yes No No No AR6005 No Yes No No No Yes No No No No Yes Yes No Yes No No No No No Yes AR3002 QCA6174 QCA1990 NOTE: 80-Y0306-1 Rev. L * QCA6174 and QCA1990 can also run in standalone mode connected directly to PC. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 51 7 Setup Configuration Navigate to C:\Qualcomm\ WCN\ProdTests \ConfigFiles\Sample. Based on the type of test box used, copy and rename the appropriate xxx--WCNTesterConfig.xml to WCNTesterConfig.xml under C:\Qualcomm\ WCN\ProdTests \ConfigFiles. Open WCNTesterConfig.xml. Verify the test equipment model types, settings and GPIB addresses match the setup on the test station. Make changes and save as required. 7.1 Power supply configuration 1. Instrument configuration file: Test instrument to be utilized to perform power supply tests is indicated by the instrument config file. WCNTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration. a. To select a GPIB based power supply specified in section 2.3.2, check the following XML tags: ResourceID should be selected as “PowerSupply” on the Item i
ii 80-Y0306-1 Rev. L Ensure that the GPIB address mentioned on the config file has the right information. This is specified on - PowerSupply
tag MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 52 Wireless Connectivity Tests User Guide Setup Configuration Figure 7-1 Power supply section on WCNTesterConfig.xml 7.2 Bluetooth non-signaling tester configuration 1. Test instrument to be utilized to perform BT tests is indicated by the instrument config file. WCNTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration a. For BTTestBoxes specified in Table 2-2 check the following XML tags ResourceID should be selected as “BTTesterNS” on the Item i ii 80-Y0306-1 Rev. L LitePoint IQ2010 only: Under OptionalConfigInfoList, check the ServerExeFullLocation Path to ensure that the StartLitepointConnectivityServer.exe is available. Check the installation required for LitePoint in section 3.3. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 53 Wireless Connectivity Tests User Guide Setup Configuration Figure 7-2 Bluetooth LitePoint config section in WCNTesterConfig.xml iii R&S CMW500 only: Ensure that the GPIB address mentioned in the config file has the right information. This is specified on - BTTesterNS
tag. Figure 7-3 BT R&S CMW500 GPIB settings in WCNTesterConfig.xml 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 54 Wireless Connectivity Tests User Guide Setup Configuration iv Under OptionalConfigInfoList, check the EntireARBLocation_xDHx to ensure the location of ARB waveforms. For LitePoint and AgilentN4010A EntireARBLocation_xDHx is the location on local PC and for CMW it is the location on the test box hard drive. v Under OptionalConfigInfoList, check the “WaveformBluetoothAddress” provided by test equipment vendors. Bluetooth address listed in the config file should match the Bluetooth address used for creating the ARB waveform files. This is a requirement for BT Rx testing. Figure 7-4 Bluetooth waveform address section in WCNTesterConfig.xml vi For BT Low Energy receiver test waveform name and location needs to be listed in OptionalConfigInfoList. Make sure the “InfoItem Name=” matches the one used in QSPR test tree parameter “WaveformKey” for LE Rx Sensitivity. “Value=” is the entire location and filename of the waveform file. vii For AgilentN4010A only: Please verify the VISA instrument string or VISA instrument alias in the test PC. Default VISA alias set in config file is “N4010A”. Figure 7-5 BT AgilentN4010A VISA settings in WCNTesterConfig.xml viii For LitePoint IQxel only: Please verify the RF port, host IP address and port number in the config file. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 55 Wireless Connectivity Tests User Guide Setup Configuration Figure 7-6 BT LitePoint IQxel settings in WCNTesterConfig.xml ix For Anritsu MT8870A only: Please verify the RF port, host IP address and port number in the config file. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 56 Wireless Connectivity Tests User Guide Setup Configuration Figure 7-7 BT Anritsu MT8870A settings in WCNTesterConfig.xml 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 57 Wireless Connectivity Tests User Guide Setup Configuration 7.3 WLAN tester configuration (SISO only) 1. Instrument configuration file: Test instrument to be utilized to perform WLAN tests is indicated by the instrument config file. WCNTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration a. For WLANTestBoxes specified on Table 2-2 check the following XML tags. ResourceID should be selected as “WLANTester” on the Item i ii LitePoint IQ2010 only: Under LitePoint IQ2010 on OptionalConfigInfoList, check the ServerExeFullLocation Path to ensure that the StartLitepointConnectivityServer.exe is available. Check the installation required for LitePoint on 3.3. iii GPIB based testers only, ensure that the GPIB address mentioned on the config file has the right information. This is specified on - WLANTester
tag. iv For LitePoint and CMW500 on OptionalConfigInfoList, check the WaveFilePath to ensure the location of ARB waveforms. For LitePoint WaveformFilePath is the location on local PC and for CMW500 it is the location on the test box hard driver. v NI PXI5644R only: On OptionalConfigInfoList, check the NIWrapperDLLPath has the correct path information and also ensures that the dll is available at that path. On OptionalConfigInfoList NIWrapperDLLName is the name of the dll provided by NI that is mostly NIDotNetWrappersClassLibrary.dll. vi Agilent N4010 for WLAN only: Under Agilent N4010A (See Figure 7-10). (a) "InstrumentVisaString": This string value must be set to identify the Instrument’s Visa String. The string could identify a USB, GPIB, or WLAN connection to the N4010A. It is recommended to use a USB connection to the N4010A with the rsrcName value in specified in the “InstrumentVisaString” value field. Default value used in config file is “N4010A”. (b) "UseAutoRange": This item tells the instrument whether or not to use the AutoRange function. The value should be set to either 0 or 1. AutoRange will set the instrument PowerRange, TriggerLevel, MaxPacketLength, and MaxSymbolsUsed parameters which are used on TX measurements. Default value is 0 (c) "UseIncreasedDynamicRangeFor11bSpectralMask": This item tells the instrument whether or not to use an increased dynamic range for 802.11b spectral mask measurements. The value should be set to either 0 or 1. Default value is 0. (d) "WaveformSampleRate_11N_HT20": This specifies the sample rate of 20 MHz 802.11n waveforms. The default value is 40000000. The units are Hz. If 20 MHz 802.11n waveforms are created with another sample rate, then specify that rate here. (e) "WaveformSampleRate_11N_HT40": This specifies the sample rate of 40 MHz 802.11n waveforms. The default value is 80000000. The units are Hz. If 40 MHz 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 58 Wireless Connectivity Tests User Guide Setup Configuration 802.11n waveforms are created with another sample rate, then specify that rate here. vii For Anritsu 8870A on OptionalConfigInfoList, check the WaveFilePath to ensure the location of ARB waveforms. The WaveFilePath is the location on the test box for Anritsu 8870A. Also make sure that the IP address and port number for tester is properly set in ITcpClient as shown in Figure 7-12. Figure 7-8 WLAN LitePoint test box section on WCNTesterConfig.xml Figure 7-9 R&S CMW WLAN section on WCNTesterConfig.xml Figure 7-10 Agilent N4010A WLAN section on WCNTesterConfig.xml 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 59 Wireless Connectivity Tests User Guide Setup Configuration Figure 7-11 NI PXI5644R WLAN section on WCNTesterConfig.xml Figure 7-12 OptionalConfigInfoList section for Anritsu MT8870A on WCNTesterConfig.xml Figure 7-13 ITcpClient section for Anritsu MT8870A on WCNTesterConfig.xml 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 60 Wireless Connectivity Tests User Guide Setup Configuration 7.4 WLAN Tester Configuration (MIMO only) 1. Instrument configuration file: Test instrument to be utilized to perform WLAN tests is indicated by the instrument config file. WCNTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration a. For WLANTestBoxes specified on Table 2-2 check the following XML tags ResourceID should be selected as “WLANTester” on the Item i ii LitePoint IQxel, make sure IQmeasure_3.0.6\Bin is in your system path For this release it release IQmeasure_3.0.6 up. iii For LitePoint on OptionalConfigInfoList, check the WaveFilePath to ensure the location of ARB waveforms. For LitePoint WaveformFilePath is the location on local PC. iv NI PXI5644R only: On OptionalConfigInfoList, check the NIWrapperDLLPath has the correct path information and also ensures that the dll is available at that path. On OptionalConfigInfoList NIWrapperDLLName is the name of the dll provided by NI that is mostly NIDotNetWrappersClassLibrary.dll Figure 7-14 WLAN LitePoint Test Box section (MIMO only) on WCNTesterConfig.xml 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 61 Wireless Connectivity Tests User Guide Setup Configuration Figure 7-15 NI PXI5644R WLAN Section (MIMO only) on WCNTesterConfig.xml 7.5 FM tester configuration 1. Instrument configuration file: Test instrument to be utilized to perform FM tests is indicated by the instrument config file. WCNTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration. a. For FMTestBoxes specified in Table 2-2 check the following XML tags: ResourceID should be selected as “FMTester” on the Item i - WLANTester
ii For LitePoint on OptionalConfigInfoList, check the ServerExeFullLocation path to ensure that the StartLitepointConnectivityServer.exe is available. Check the installation required for LitePoint on 3.3. iii For LitePoint on OptionalConfigInfoList, check the FmAudioWaveFilePath path to ensure where the .wav audio files (audio from DUT captured with LitePoint AIM module) are to be written. These files are used for FM RX audio measurements. NOTE: Please ensure FmAudioWaveFilePath path is physically available on the local PC. iv For LitePoint on OptionalConfigInfoList, check the FmAudioCaptureSource value. A value of 0 specifies to digitize analog audio with the LitePoint AIM. A value of 1 specifies to capture digital FM audio directly from the DUT. Currently this is only supported on WCN3660. If this tag is omitted, then a default value of 0 is used. v For LitePoint on OptionalConfigInfoList, check the FmAudioCaptureSampleRate value in Hz specifies the sample rate of the LitePoint AIM module. (default = 48000). vi For LitePoint on OptionalConfigInfoList, check the FmExpectedMaxTxPower value to Zero. This affects the gain in the FM VSA. Set this to a value that is guaranteed not to be exceeded at the FM VSA input. Allow some safety margin so that the signal to the ADC in the VSA is never over range. Excessive margin however, may degrade 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 62 Wireless Connectivity Tests User Guide Setup Configuration the TX Audio SNR measurements. The range of valid values is -40 dBm to +10 dBm. (default = 0.0). vii For LitePoint on OptionalConfigInfoList, check the FmVsaCaptureDuration. This value in milliseconds sets the capture duration for the FM VSA. This VSA capture is used for all TX RF, TX Demod, and TX Audio measurements. (default = 500). viii For LitePoint on OptionalConfigInfoList, check the FmAudioCaptureDuration. This value in milliseconds sets the capture duration for FM RX audio from the DUT. Audio capture is performed with the LitePoint AIM module. (default = 500). Figure 7-16 FM test box section on WCNTesterConfig.xml 7.6 Bluetooth signaling tester configuration 1. Test instrument to be utilized to perform BT tests is indicated by the instrument config file. WCNTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration a. For BTTestBoxes specified on 2.3.1 check the following XML tags ResourceID should be selected as “BTTester” on the Item i - FMTester
ii 80-Y0306-1 Rev. L Sample R&S CBT: MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 63 Wireless Connectivity Tests User Guide Setup Configuration Figure 7-17 Sample R&S CBT config section in WCNTesterConfig.xml iii Sample AnritsuMT8852B: Figure 7-18 AnritsuMT8852B config section in WCNTesterConfig.xml 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 64 Wireless Connectivity Tests User Guide Setup Configuration 7.7 NFC tester configuration Sample NFC Tester file is present in C:\Qualcomm\WCN\ProdTests\ConfigFiles\Sample\ LPIQNFC--NFCTesterConfig.xml. NOTE: Please copy and rename the appropriate NFC Tester sample (e.g. LP-IQNFC-NFCTesterConfig.xml) to C:\Qualcomm\WCN\ProdTests\ConfigFiles\ NFCTesterConfig.xml before running QSPR NFC reference tree tests. 2. Test instrument to be utilized to perform NFC tests is indicated by the instrument config file. NFCTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration. a. For NFC TestBoxes specified on 2.3.1 check the following XML tags ResourceID should be selected as “NFCTester” on the Item i - BTTester
ii Sample LitePoint IQNFC config item entry: Figure 7-19 LitePoint IQNFC config section in NFCTesterConfig.xml 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 65 8 QSPR Test Trees The following section contains sample wireless connectivity production test trees. 8.1 Bluetooth non-signaling + Bluetooth LE production test tree Figure 8-1 shows Bluetooth test tree. BT_xx(TYPE))_xx(TestMode)_Reference.xtt test tree is located on the local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\BT Figure 8-1 Sample Bluetooth production test tree 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 66 Wireless Connectivity Tests User Guide QSPR Test Trees 8.2 WLAN production test trees Figure 8-2 and Figure 8-3show a WLAN test tree. The WLAN_xx(chipset)_Production.xtt test tree is located on the local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\WLAN Figure 8-2 Sample WLAN production test tree part I 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 67 Wireless Connectivity Tests User Guide QSPR Test Trees Figure 8-3 Sample WLAN production test tree part II 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 68 Wireless Connectivity Tests User Guide QSPR Test Trees 8.3 FM production test trees Figure 8-4 shows a WLAN test tree. FM_xx(chipset)_Production.xtt test tree is located on the local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\FM Figure 8-4 Sample FM production test tree 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 69 Wireless Connectivity Tests User Guide QSPR Test Trees 8.4 ANT production test tree Figure 8-5 shows an ANT test tree. ANT_xx(chipset)_Production.xtt test tree is located on the local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\ANT Figure 8-5 Sample ANT production test tree 8.5 Bluetooth signaling + Bluetooth LE production test tree Figure 8-6 shows Bluetooth test tree. BT_xx(TYPE))_xx(TestMode)_Reference.xtt test tree is located on the local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\BT 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 70 Wireless Connectivity Tests User Guide QSPR Test Trees Figure 8-6 Sample Bluetooth signaling test tree 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 71 Wireless Connectivity Tests User Guide QSPR Test Trees 8.6 NFC production functional test tree Figure 8-7 shows the NFC Functional test tree. NFC_Functional.xtt test tree is located on the local PC at C:\QUALCOMM\WCN\ProdTests\Test Trees\NFC Figure 8-7 NFC Functional test tree 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 72 Wireless Connectivity Tests User Guide QSPR Test Trees 8.7 NFC production reference test tree Figure 8-8 shows the NFC reference test tree. NFC_Test_Reference.xtt test tree is located on the local PC at C:\QUALCOMM\WCN\ProdTests\Test Trees\NFC 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 73 Wireless Connectivity Tests User Guide QSPR Test Trees Figure 8-8 Sample NFC Reference Tree 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 74 9 Test Setup Details This section lists the initialization tests required for wireless connectivity tests. These tests are “setup tests” that are performed to setup the device under test and test equipment before actual functional tests are performed. 9.1 Bluetooth initialization and de-initialization tests This section applies to Bluetooth and Bluetooth Low energy setup tests that are done before performing core non-signaling functional tests as described in section 10.1. Sample section of Bluetooth DUT and tester initialization test tree looks like as shown in Figure 9-1. A sample section of Bluetooth shutdown test tree is shown in Figure 9-2. 9.1.1 Bluetooth initialization Figure 9-1 Sample Bluetooth test initialization BTDUT_SetBTConfigFile This test sets the path of Bluetooth configuration file. Refer to section 9.1.2 for details. BTDUT_Connect This test connect to the device under test. HCI reset after successfully connection is optional (This test requires Bluetooth FTM running). BTDUT_LoadNVMFile (only applicable to standalone device, if required by chipset) This test sets NVM file location and downloads NVM to the device under test. BTDUT_PatchFirmware (only applicable to standalone device, if required by chipset) This test sets firmware patch file location and downloads firmware patch to the device under test. BTDUT_ FFA_DisableLegacyLogMode(only applicable to FFA/MTP based device) This test sets disables legacy DIAG log for Bluetooth SetStationCalibrationFile This test sets the location of station calibration file used for testing 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 75 Wireless Connectivity Tests User Guide Test Setup Details SetInstrumentConfigFile This test sets the tester configuration file path InitializeBTTester_NonSignaling This test initializes Bluetooth non-signaling test box based on the ResourceID listed in instrument configuration file. InitializeBTTester_Signaling This test initializes Bluetooth signaling test box based on the ResourceID listed in instrument configuration file. 9.1.2 Bluetooth configuration file details Bluetooth configuration section is listed in C:\Qualcomm\WCN\ProdTests\ConfigFiles\Sample\BluetoothDUTConfig_Sample.xml. NOTE: 80-Y0306-1 Rev. L Please copy and rename BluetoothDUTConfig_Sample.xml to C:\Qualcomm\WCN\ProdTests\ConfigFiles\BluetoothDUTConfig.xml before running QSPR Bluetooth tests. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 76 Wireless Connectivity Tests User Guide Test Setup Details Figure 9-2 Bluetooth DUT configuration file ConnectionType This field configures the transport/protocol type for device under test. Valid options: DIAG – MSM/MDM or APQ based targets SERIAL – UART based devices USB – USB based devices TargetType This option is only valid when ConnectionType is DIAG. Valid options: 80-Y0306-1 Rev. L MSM/MDM – when target type is MSM or MDM APQ – when target type is APQ MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 77 Wireless Connectivity Tests User Guide Test Setup Details PhoneComport This option is only valid when ConnectionType is DIAG. Valid options: AUTO – auto detects the first available connected device COMx – (example: COM23) useQPST This option is only valid when ConnectionType is DIAG. Valid options: Yes No PhoneAutoDetectTimeoutMs This option is only valid when ConnectionType is DIAG. This timeout is used for auto detecting the COM port. Comport This option is only valid when ConnectionType is SERIAL. COMx (example: COM9) BaudRate This option is only valid when ConnectionType is SERIAL. Device and PC support baud rate. Example : 115200 USBConnectionInfo This option is only valid when ConnectionType is USB. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 78 Wireless Connectivity Tests User Guide Test Setup Details 9.1.3 Bluetooth de-initialization Figure 9-3 Sample Bluetooth de-initialization DisconnectBTester_NonSignaling This test disconnects to the non-signaling tester and releases any resources used by the tester DisconnectBTester_Signaling This test disconnects to the signaling tester and releases any resources used by the tester BTDUT_Disconnect This test disconnects to the Bluetooth DUT 9.1.4 Bluetooth UART/USB test setup using BT DIAG BRIDGE NOTE: This mode requires QPST running This section summarizes setup details for running QSPR/QRCT tests in UART/ USB mode for standalone devices. QC.BT.DIAG.BRIDGE.exe application gets installed on PC at C:\Program Files (x86)\Qualcomm\QDART\bin To set up BT DIAG BRIDGE, use the following sequence. QPST configuration 1. Open QPST configuration Figure 9-4 BT Diag Bridge - opening QPST 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 79 Wireless Connectivity Tests User Guide Test Setup Details 2. Navigate to “IP Server” tab 3. Under “IP Address” select “Use PC IP Address” to connect to local machine 4. Under Server Port select “Use specified port number”, example 2500 5. Check “Accept Client connections” Figure 9-5 BT Diag Bridge - setup QPST IP address and port number 6. Open a command line 7. Navigate to C:\Program Files (x.86)\Qualcomm\QDART\bin. 8. Run QC.BT.DIAG.BRIDGE.exe with various command line arguments. Note: No spaces are allowed in between ‘=’. Command line arguments are not case sensitive. Refer to the following example, arguments in bold are mandatory. QC.BT.DIAG.BRIDGE.exe IPAddress=192.168.1.1 Port=2500 IOType=SERIAL ConnectionDetails=COM13 Handshake=none Baudrate=115200 Patch=C:\xxx.img NVM=c:\xxx.nvm 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 80 Wireless Connectivity Tests User Guide Test Setup Details Figure 9-6 Running BT DIAG BRIDGE Command line arguments IPAddress (optional, default = localhost) Use same ipaddress listed in QPST as shown in Figure 9-5, QPST is running on the same machine one can use “localhost” too. Port (optional, default = 2500) Use the same port number listed in QPST as shown in Figure 9-5. IOType – SERIAL (for UART based devices) – USB (for USB based devices) ConnectionDetails – COMxx (applicable in UART/SERIAL connection type, example COM96) – \\.\ATH0 (applicable for USB connection type only) Baudrate (optional, only applicable in SERIAL mode) – 80-Y0306-1 Rev. L 115200 (default) Handshaking (optional, only applicable in SERIAL mode) – NONE (default) – XONXOFF – RequestToSend – RequestToSendXONXOFF MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 81 Wireless Connectivity Tests User Guide Patch (optional, only applicable in SERIAL mode) – Test Setup Details Location for patch file on PC NVM (optional, only applicable in SERIAL mode) – Location of NVM file on PC 9. After QC.BT.DIAG.BRIDGE.exe is successfully started, QSPT will list a COM3000x comport as shown in Figure 9-7. Figure 9-7 BT Diag Bridge - QPST comport listing 10. The comport listed in Figure 9-7 can be used to configure QSPR Bluetooth test or QRCT/QMSL DUT connection. Configuring QSPR tests in this mode. – Update BluetoothDUTConfig.xml as shown in section 9.1.2. – Confirm “ConnectionType” in config file is “DIAG.” – Confirm “PhoneComport” lists the same comport as shown in Figure 9-7, e.g., “COM30001.” 9.1.5 Bluetooth User Defined Transport (UDT) test setup using BT DIAG BRIDGE This section summarizes setup details for running QSPR tests in UDT mode for standalone devices. QMSL_BT_Transport.dll gets installed on C:\Program Files (x86)\Qualcomm\QDART\BIN QC.BT.DIAG.BRIDGE.exe application gets installed on C:\Program Files (x86)\Qualcomm\QDART\bin NOTE: 80-Y0306-1 Rev. L For testing DUT connected to remote PC, the two files are in the same location in remote PC. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 82 Wireless Connectivity Tests User Guide Test Setup Details Figure 9-8 Connect DUT using DUT type and connection options Figure 9-9 Input parameters of ConnectDutUsingDutType Input parameters to use for UDT mode: TargetType This field configures the target type for device under test. Valid options: 0 QLIB_TARGET_TYPE_MSM_MDM– MSM/MDM based targets 1 QLIB_TARGET_TYPE_APQ– APQ based devices 2 QLIB_TARGET_TYPE_X86_STANDALONE – Standalone/SoC based devices resourceID This field configures the unique target resource ID for different DUTs. For MSM/MDM and APQ based devices, it can be AUTO or exact comport of the device. AUTO mode will pick up first device in QPST list For Standalone devices, its resourceID is formed by several parameters. As an example: iotype=serial,connectiondetails=com8,port=2390,ipaddress=127.0.0.1 iotype: serial – UART based devices usb – USB based devices connectiondetails: comx – This option is the physical comport that DUT connects to the PC, it is only valid when iotype is SERIAL \\.\ATHx – This option is the physical usb port that DUT connects to the PC, it is only valid when iotype is USB port: TCP IP port of the PC or remote PC (if applicable). ipaddress: TCP IP address of the local PC, ipaddress. If DUT is connected to the same PC one can either ignore this or set it 127.0.0.1. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 83 Wireless Connectivity Tests User Guide Test Setup Details For running in remote PC, TCP IP address cannot be omitted and is required to provide IP address of the remote PC. NOTE: No spaces are allowed in the resourceID. Command line arguments are not case sensitive. Refer example, arguments in bold are mandatory and each argument is separated by coma. UseQPST True means DUT connection uses QPST, QPST installer – Refer to [Q6] in Qualcomm documents of section 1.4.1 False means DUT connection uses UDT as the dll is defined below. userDefinedTransport User Defined transport dll name; used only on Standalone configuration. 9.1.6 Additional configuration for remote DUT using User Defined Transport and BT DIAG BRIDGE on remote PC. BT DIAG BRIDGE must be executed in remote PC before running QSPR on local machine. Command line for BT DIAG BRIDGE must add one additional parameter “udt=yes, iotype=serial,connectiondetails=com8,port=2390,ipaddress=127.0.0.1” before other command line arguments. As shown in Figure 9-10. Figure 9-10 Remote PC connects to DUT using UDT 9.2 WLAN setup and initialization tests There are three initialization tests that need to be executed before running WLAN Production Tests described in section 10.1.12. These three tests are grouped under the folder “Init WLAN” as shown in Figure 9-11 and deinitialization is shown in Figure 9-12. 9.2.1 WLAN initialization 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 84 Wireless Connectivity Tests User Guide Test Setup Details Figure 9-11 Sample WLAN test initialization Figure 9-12 Sample WLAN test initialization with user Transport DLL InitializeWlanTester This test makes the connection with the Wlan Tester and initializes the Wlan Tester specified by “WlanTesterResourceID” WlanTesterResourceID must match the item value described in Section 7.3. - NFCTester
- WLANTester
Table 9-1 Initialize Wlan tester parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description testerConfigFileName C:\Qualcomm\WCN\ProdTests\ ConfigFiles\WCNTesterConfig.xml Full path name of configuration file stationCalFileName C:\Qualcomm\WCN\ProdTests\ StationCal\ QTA_CalDataFile.xml Full path name of station calibration file WlanTesterResoureID WLANTester WLAN Tester resource name as it appears in config file TxStationCalPathName WCD Tx Station cal path name as it appears in station cal file RxStationCalPathName WCD Rx Station cal path name as it appears in station cal file MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 85 Wireless Connectivity Tests User Guide Test Setup Details ConnectDut This test makes the connection to the DUT specified by “wlanId” through COM port via QPST. DUT must be set up for WLAN FTM communication before this test can run Table 9-2 Connect DUT parameters Parameter Name Value Unit Description Type 0 QLIB_TARGET_TYPE_MSM_MDM Select target type MSM or APQ wlanId 3680 WLAN ID. comPort AUTO Com port number or “AUTO” useQPST True True: Use QPST, False: talk directly to com port Table 9-3 Connect DUT with user transport DLL parameters Parameter Name Value Unit Description Type 1 QLIB_TARGET_TYPE_APQ Select target type MSM or APQ wlanId 6174 WLAN ID. comPort 127.0.0.1 IP or 127.0.0.1 for user TransportDLL userTransPortDll QMSL_WLAN_Transport.dll User Defined Transport DLL name with folder path, or dll name only with default path at where QMSL_MSVC DLL is located. Table 9-4 WLAN DUT load Parameter Name Value Unit Description DevDLLName QC6174 Device dll name (less than 30 characters) refDesign QC6174 refDesign eepFName C:\QUALCOMM\WCN\ProdTests\ refDesigns\BoardData\ fakeBoardData_AR6320.bin eep file name with path (less than 250 characters) iNVMemOption 3 DataOtp NV memory Option ssid 0x3e Device ID 9.2.2 WLAN de-initialization Figure 9-13 Sample WLAN test de-initialization 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 86 Wireless Connectivity Tests User Guide Test Setup Details DisconnectWlanTester This test disconnects to the tester and releases any resources used by the tester. DisconnectPhone This test disconnects to the DUT and closes QPST server. 9.3 FM setup and initialization tests 9.3.1 FM initialization Figure 9-14 Sample FM tester initialization SetInstrumentConfigFile This test sets the FM tester configuration file path. SetStationCalibrationFile This test sets the location of station calibration file used for FM testing. SetFmStationCalPathname This sets the default name of station calibration path name specified in station calibration path loss file to be used for FM tests. This may be reset later on in the test tree. ConnectToFmTester This test makes the connection with the FMTester and initialize the FM tester specified by the “FMResourceID”. The FMTesterResourceID must match the- value specified by
described in section 7.4. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 87 Wireless Connectivity Tests User Guide Test Setup Details 9.3.2 FM RX initialization Figure 9-15 Sample FM RX initialization ConnectPhone FM_Rx_InitReceiver This test disables FM TX, if it was enabled. It then calls FTM command FTM_FM_RX_ENABLE_RECEIVER with input parameters RadioBand, Emphasis, ChSpacing, RdsStd, UserDefinedBandFreqMin, and UserDefinedBandFreqMax. If this command completes successfully, it then waits some delay (see parameter DelayAfterEnable) and then exits. If the Enable command returns an error status, the test then tries FTM command FTM_FM_RX_CONFIGURE_RECEIVER with the same 6 parameters. This is done because on WCN2243 platforms, the Enable command can only be done once. Subsequent calls of the Enable command do no harm, but they return a bad status. So in order to determine if the FM receiver is ready for test, the Configure command is called after bad status is returned by the Enable command. FTM_FM_Rx_ConfigureReceiver This calls FTM command FTM_FM_RX_SET_SOFTMUTE to disable soft muting. Soft mute is disabled because it makes it more difficult to perform accurate audio measurements at low RF signal levels. FTM_FM_AUDIO_SetPath 80-Y0306-1 Rev. L This calls FTM command FTM_FM_RX_SET_STATION to set an initial frequency. FTM_FM_Rx_SetSoftMuteMode This calls FTM command FTM_FM_RX_SET_ANTENNA to select either the headset FM antenna or the PWB FM antenna. FTM_FM_Rx_SetStation This calls FTM command FTM_FM_RX_CONFIGURE_RECEIVER. FTM_FM_Rx_SetAntenna This test connects to the phone DIAG port. The COM port can be specified or auto detection can be used. This calls FTM command FTM_AUDIO_SET_PATH with a path value that directs FM RX audio to the headset port. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 88 Wireless Connectivity Tests User Guide Test Setup Details 9.3.3 FM TX initialization This folder contains items to configure the DUT and tester for testing FM TX on the PWB antenna port. Figure 9-16 Sample FM TX initialization SetFmStationCalPathname FM_Tx_InitTransmitter This test disables FM RX, if it was enabled. It then calls FTM command FTM_FM_TX_ENABLE_TRANSMITTER with input parameters RadioBand, Emphasis, ChSpacing, RdsStd, UserDefinedBandFreqMin, and UserDefinedBandFreqMax. If this command completes successfully it waits some delay (see parameter DelayAfterEnable) and exits If the Enable command returns an error status, the test then tries FTM command FTM_FM_TX_CONFIGURE_TRANSMITTER with the same 6 parameters. This is done because on WCN2243 platforms the Enable command can only be done once. Subsequent calls of the Enable command do no harm but they return a bad status. In order to determine if the FM transmitter is ready for test, the Configure command is called after bad status is returned by the Enable command FTM_FM_Tx_SetStation This test sets the name of station calibration path name specified in station calibration path loss file to be used for FM TX tests This calls FTM command FTM_FM_TX_SET_STATION to set an initial frequency FTM_FM_Tx_SetInternalTone This calls FTM command FTM_FM_TX_SET_INTERNAL_TONE to select an audio tone for modulating TX. The tone used is 1 kHz at full scale (0 dBFS) with Left=Right 9.3.4 FM de-initialization Figure 9-17 Sample FM de-initialization DisconnectPhone 80-Y0306-1 Rev. L This test disconnects to the Bluetooth DUT and closes QPST server DisconnectFmTester MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 89 Wireless Connectivity Tests User Guide Test Setup Details This test disconnects to the tester and releases any resources used by the tester 9.4 ANT setup and initialization tests 9.4.1 ANT initialization Figure 9-18 Sample ANT test initialization SetInstrumentConfigFileName This test sets the ANT tester configuration file path SetCalibrationFileName This test sets the location of station calibration file used for ANT testing SetResourceForISpectrumAnalyzer_OneButtonMeasurement This test initializes the spectrum analyzer specified by the parameter “ResourceID”. SetResourceForISignalGenerator_arb This test initializes the signal generator specified by the parameter “ResourceID”. ConnectPhone This test connects to the device under test. 9.4.2 ANT De-initialization Figure 9-19 Sample ANT test de-initialization DisconnectPhone This test disconnects from the DUT and closes QPST server 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 90 Wireless Connectivity Tests User Guide Test Setup Details 9.5 NFC initialization and deinitialization This section describes the setup and initialization tests that need to be run before running any functional tests. This is a screen shot of the initialization section of the tree. 9.5.1 NFC setup config SetInstrumentConfigFile This test sets the path for the NFC tester/equipment config file and loads it. NFC testers (if applicable) and power supply (if applicable)will be set by this config file. NFCDUT_SetConfigFile This test sets the path for the DUT configuration file and loads it. Config items related to the DUT type (SoC/phone) and connection related parameters 9.5.2 NFC DUT configuration file details NFC configuration file is installed at the following location C:\Qualcomm\WCN\ProdTests\ConfigFiles\Sample\NFCDUTConfig.xml. Copy NFCDUTConfig.xml to C:\Qualcomm\WCN\ProdTests\ConfigFiles\NFCDUTConfig.xml before running QSPR NFC tests. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 91 Wireless Connectivity Tests User Guide Test Setup Details Figure 9-20 NFC DUT Configuration file ConnectionType This field configures the transport/protocol type for device under test. Valid options: DIAG – MSM/MDM or APQ based targets SERIAL – UART based devices (standalone EVK/EVB etc) TargetType (Phone type DUT) This option is only valid when ConnectionType is DIAG. Valid options: MSM/MDM – when target type is MSM or MDM APQ – when target type is APQ PhoneComport (Phone type DUT) This option is only valid when ConnectionType is DIAG. Valid options: AUTO – auto detects the first available connected device COMx – (example: COM23) useQPST This option is only valid when ConnectionType is DIAG. Valid options: 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 92 Wireless Connectivity Tests User Guide Yes No Test Setup Details PhoneAutoDetectTimeoutMs This option is only valid when ConnectionType is DIAG. This timeout is used for auto detecting the COM port. Comport (SoC only) This option is only valid when ConnectionType is SERIAL. This port will be used to open the NFC port on the device. COMx (example: COM9) BaudRate This option is only valid when ConnectionType is SERIAL. Device and PC support baud rate. Example : 57600 Slave1_Address_NCI This option is only valid when ConnectionType is SERIAL. This is the I2C slave address (in hex) used to send the NCI commands. Device and PC support baud rate. Example : 2C Slave0_Address_TopLevel This option is only valid when ConnectionType is SERIAL. This is the I2C slave address in hex used for I2C writes and for bring up script. Device and PC support baud rate. Example : 0E 9.5.3 NFC DUT Initialization NFCDUT_Instantiate This test instantiates the DUT type as set in the config file. DUT_InitFramework This test starts up the test framework. This test also sets the path for the folder that contains installed TCL files/binaries. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 93 Wireless Connectivity Tests User Guide Test Setup Details NFCDUT_RunTopLevelScript (only applicable to standalone device, if required by chipset) This test runs the initialization TCL script to start up the development board. NFCDUT_Connect This test connect to the device under test using the connection details specified in the NFC DUT config file. NFCDUT_CoreResetAndInit This test sends a NFC core reset command followed by a core init command. For phone type DUT, NFC FTM daemon needs to be running for this test. NFCDUT_PatchFirmwareUsingPatchFile (only applicable to standalone device, if required by chipset) This test sets firmware patch file location and downloads firmware patch to the device under test. 9.5.4 NFC de-initialization NFCDUT_Disconnect This test disconnects the DUT and releases all the COM ports used by the test. NFCDUT_Shutdown This test releases all the resources used by the test suite framework. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 94 10 Wireless Connectivity Test Description 10.1 Bluetooth non-signaling production test description This section summarizes limits and parameters captured for Bluetooth RF functional tests in operations. All the productions Bluetooth tests are performed at three channels 0, 39, 78. 10.1.1 Set Bluetooth ChipID This test is performed for configuring BT chip ID. Table 10-1 and Table 10-2 list the input and output parameters for this test. Test Name: BTDUT_SetBluetoothChipID Test Condition: None Table 10-1 Set Bluetooth ChipID input parameters Parameter Name Value BluetoothChipID 0 Unit Description Bluetooth Chip ID = 0, for WCN2243 and WCN36xx , = 3002, for AR3002 chipset Table 10-2 Set Bluetooth ChipID output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage NA Description error messages 10.1.2 BTDUT_FFA_DisableLegacyLogMode This test is performed for supporting Bluetooth legacy log. Table 10-3 and Table 10-4 list the input and output parameters for this test. Test Name: BTDUT_FFA_DisableLegacyLogMode Test Condition: None Table 10-3 BTDUT_FFA_DisableLegacyLogMode input parameters 80-Y0306-1 Rev. L Parameter Name Value disableLegacyLogMode True Unit Description Disable legacy log mode = true, Enable legacy log mode = false MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 95 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-4 BTDUT_FFA_DisableLegacyLogMode output parameters Parameter Name Lower Limit Upper Limit errorMessage Unit NA Description error messages 10.1.3 Setup DUT for GFSK and EDR transmit tests This test is performed for configuring device under test for GFSK and EDR transmit tests. Table 10-5 and Table 10-6 list the input and output parameters for this test. Test Name: BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST Test Condition: Normal Table 10-5 BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST input parameters Parameter Name Value Unit Description TxChannel 0 NA Channel range (0-78) PacketType BT_DH1 NA Bluetooth packet type TransmitPattern PSEUDO_RANDOM NA Bluetooth transmit pattern PowerLevel 9 NA Bluetooth Power Level (WCN36x0/WCN2243 = 0-9, AR3002 = 0-7 BluetoothAddress BD,35,9C,BD,35,9C NA Bluetooth Address, comma separated, example = BD,35,9C,BD,35,9C Table 10-6 BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST output parameters Parameter Name Lower Limit Upper Limit errorMessage Unit Description NA error messages 10.1.4 Setup DUT for LE transmit tests This test is performed for configuring device under test for LE transmit tests. Table 10-7 and Table 10-8 list the input and output parameters for this test. Test Name: BTDUT_LE_TX_Command Test Condition: Normal Table 10-7 BTDUT_LE_TX_Command input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description TxChannel 0 NA Tx Channel (Range - 0-78, even only) PayloadLength 37 Byte(s) Payload length TransmitPattern PN_9 NA TransmitPattern MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 96 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-8 BTDUT_LE_TX_Command output parameters Parameter Name Lower Limit Upper Limit Unit Description errorMessage Error message 10.1.5 Measure Tx output power and initial carrier frequency tolerance This test verifies and measures transmitter power and carrier frequency tolerance. Table 10-9 and Table 10-10 list the input and output parameters for this test. Test Name: Measure_OutputPower_InitialCarrierFrequencyTolerance Test Condition: Normal Loop Condition: Tx Channel Table 10-9 Measure Tx output power and initial carrier frequency tolerance input parameters Parameter name Value Unit Description TxChannel 78 NA TX channel (0-78) PacketType BT_DH1 NA Bluetooth Packet Type Table 10-10 Measure output power and initial carrier frequency tolerance output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description error message from test Power -4 13 dBm Transmit power in dBm FrequencyDeviation -75 75 KHz Frequency deviation KHz 10.1.6 Measure GFSK modulation DeltaF2 and CarrierDrift This test verifies and measures transmitter delta F2 and carrier frequency drift. Table 10-11 and Table 10-12 list the input and output parameters for this test. Test Name: Measure_GFSK_Modulation_DeltaF2_CarrierDrift Test Condition: Normal Loop Condition: Tx Channel Table 10-11 Measure GFSK modulation DeltaF2 and CarrierDrift input parameters Parameter Name TxChannel 80-Y0306-1 Rev. L Value 78 Unit NA Description Bluetooth Tx Channel (0-78) MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 97 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-12 Measure GFSK modulation DeltaF2 and CarrierDrift output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description error message from test DeltaF2Max 115 300 KHz Delta F2 Max in KHz FrequencyDrift -40 45 KHz Frequency drift in KHz 10.1.7 Measure GFSK modulation DeltaF1 This test verifies and measures transmitter delta F1. Table 10-13 and Table 10-14 list the input and output parameters for this test. Test Name: Measure_GFSK_Modulation_DeltaF1 Test Condition: Normal Loop Condition: Tx Channel Table 10-13 Measure GFSK modulation DeltaF1 input parameters Parameter Name Value TxChannel Unit 78 Description NA Bluetooth Tx Channel (0-78) Table 10-14 Measure GFSK modulation DeltaF1 output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage DeltaF1Average Description error message from test 140 175 KHz Delta F1 in KHz 10.1.8 Measure EDR modulation This test verifies and measures transmitter average and peak DEVM. Table 10-15 and Table 1016 list the input and output parameters for this test. Test Name: Measure_EDRModulation Test Condition: Normal Loop Condition: Tx Channel Table 10-15 Measure EDR modulation input parameters Parameter Name Value Unit Description TxChannel 0 NA Bluetooth Tx Channel (0-78) PacketType BT_2_DH5 NA Bluetooth Packet Type This test is only valid for EDR packet types. Table 10-16 Measure EDR modulation output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 98 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Lower Limit Upper Limit EDRAverageDEVM 0 0.2 EDRPeakDEVM 0 0.35 Unit 10.1.9 Measure LE Tx output power This test verifies and measures LE transmitter power. Table 10-17 and Table 10-18 list the input and output parameters for this test. Test Name: Measure_LE_TxOutputPower Test Condition: Normal Loop Condition: Tx Channel Table 10-17 Measure LE Tx output power input parameters Parameter Name Value TxChannel 0 Unit NA Description TX Channel, only even channel in BLE Table 10-18 Measure LE Tx output power output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage AvgPower Description error message from test -4 15 dBm Average LE Power in dBm 10.1.10 Measure LE modulation DeltaF1 This test verifies and measures LE transmitter delta F1. Table 10-19 and Table 10-20 list the input and output parameters for this test. Test Name: Measure_LE_Modulation_DeltaF1 Test Condition: Normal Loop Condition: Tx Channel Table 10-19 Measure LE modulation DeltaF1 input parameters Parameter Name Value TxChannel 0 Unit NA Description TX Channel, only even channel in BLE Table 10-20 Measure LE modulation DeltaF1 output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage DeltaF1Average 80-Y0306-1 Rev. L Description error message from test 225 275 KHz Delta F1 average in KHz MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 99 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.1.11 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate This test verifies and measures LE transmitter delta F2, frequency offset, frequency drift and max drift rate. Table 10-21 and Table 10-22 list the input and output parameters for this test. Test Name: Measure_LE_Modulation_DeltaF2_FreqOffset_FreqDrift_MaxDriftRate Test Condition: Normal Loop Condition: Tx Channel Table 10-21 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate input parameters Parameter Name Value TxChannel Unit 0 Description NA TX Channel, only even channel in BLE Table 10-22 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description error message from test DeltaF2 185 500 kHz Delta F2 in kHz FrequencyOffset -150 150 kHz FrequencyOffset FrequencyDrift -50 50 kHz Frequency drift MaxDriftRate 0 20 kHz/μs Max drift rate 10.1.12 Measure Rx sensitivity/max input This test verifies sensitivity/Max Input at a given power and measures BER %. Table 10-23 and Table 10-24 list the input and output parameters for this test. Test Name: Measure_RxSensitivity Test Condition: Normal Loop Condition: Rx Channel Table 10-23 Measure Rx sensitivity input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description RxChannel 0 StartPowerdBm -70 dBm RX channel (0-78) Start Test RX power from VSG, if Start and Stop are same it acts like GoNoGo StopPowerdBm -70 dBm Stop Test RX power from VSG, if Start and Stop are same it acts like GoNoGo PacketType BT_DH5 NA Bluetooth Packet Type MinimumCoarseNumberOfPackets 100 NA Minimum coarse number of packets required for test MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 100 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Value Unit Description MinimumFineNumberOfPackets 1000 NA Minimum fine number of packets required for test fineStepSize 0.5 dB step size for BER fine search loop coarseStepSize 1 dB step size for BER coarse search loop ReceiverTestType Sensitivity NA RX Test Type: Sensitivity MaxInput Table 10-24 Measure RxSensitivity output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description Error message BER 0 0.1 % BER in percent RxSensitivityPowerdBm -70 -70 dBm Sensitivity level 10.1.13 Measure LE Rx sensitivity/max input This test verifies sensitivity/Max input at a given power and measures PER %. Table 10-25 and Table 10-26 list the input and output parameters for this test. Test Name: Measure_LE_RxSensitivity Test Condition: Normal Loop Condition: Rx Channel Table 10-25 Measure LE Rx sensitivity input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description RxChannel 0 RX channel (0-78),only even channels in BLE StartPowerdBm -70 dBm Start Test RX power from VSG, if Start and Stop are same it acts like GoNoGo StopPowerdBm -70 dBm Stop Test RX power from VSG, if Start and Stop are same it acts like GoNoGo CoarseNumberOfPackets 500 Minimum coarse number of packets required for test FineNumberOfPackets 2000 Minimum fine number of packets required for test fineStepSize 0.5 dB step size for PER fine search loop coarseStepSize 2.0 dB step size for PER coarse search loop WaveformKey LE1a NA Waveform key in the tester config XML file MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 101 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Value Unit Description PacketIntegrity False LE packet integrity is on or off, not valid if using waveforms ReceiverTestType Sensitivity RX Test Type: : Sensitivity MaxInput Dirty 0 Dirty mode, not valid if using waveforms Table 10-26 Measure LE Rx sensitivity output parameters Parameter Name Lower Limit Upper Limit Unit Description errorMessage Error message BER 0 0.1 % BER in percent RxSensitivityPower -70 -70 dBm Rx Sensitivity in dBm 10.1.14 Set BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST This test configures the device under tests in receive mode for performing non-signaling Rx tests. Table 10-27 and Table 10-28 list the input and output parameters for this test., if tests can be used to configure AR3002 receiver. Test Name: BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST Test Condition: Normal Table 10-27 BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST input parameters Parameter Name Value Unit Description RxChannel 0 NA Channel range (0-78)) BluetoothAddress BD,35,9C,BD,35, 9C NA Bluetooth Address, comma separated, example = BD,35,9C,BD,35,9C PacketType 15 NA Bluetooth packet type LTAddress 0 NA Bluetooth LT/AM Address Table 10-28 BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description Error message 10.1.15 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 NOTE: This test is only valid when ChipID = 3002 This test verifies gets receiver statistics from device under tests. Table10-29 and Table 10-30 list the input and output parameters for this test. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 102 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Test Name: BTDUT_PROD_TEST_HCI_GET_PER_AR3002 Test Condition: Normal Table10-29 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 input parameters Parameter Name Value PacketType Unit BT_DH5 Description Bluetooth packet type Table 10-30 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description error message from test PacketsReceived NA Total packets received PacketsWithCRCErrors NA Total CRC packets received 10.2 WLAN production test description (SISO Only) 10.2.1 SetUpDutTx Table 10-31 SetUpDutTx parameters Parameter Name Value Unit Description channel 1 WLAN Channel cbState 0 none Channel Bonding State 0:HT20, 1-3:HT40, 410:VHT80 Rate 3 RATE_11MBs TX Data Rate Short11b_nGuard False pwrMode 2 SCPC powerLevel 10.0 dBm TX Power Level gain 2 unitless RF Gain (open loop power control mode only) digitalGain 0 unitless Digital Gain (open loop power control mode only) dpdMode False boolean True: Enable DPD (WCN36x0 targets only) payloadSize 500 bytes Payload size in bytes txChain 1 boolean True: 11b short or 11n/11ac short guard TX Power Control Mode TX Chain to transmit on 10.2.2 WlanTxEvmTest This test measures transmit modulation accuracy. Table 10-32 and Table 10-33 list the input and output parameters for this test. Test Name: WlanTxEvmTest Test Condition: Normal 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 103 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Loop Condition: Channel, Rate Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI PXI5644R”, Agilent 4010A” Table 10-32 TX EVM test input parameters Parameter Name Value Unit Description channel 1 powerLevel 10.0 dBm WLAN Channel TX Power Level wlanRate 16 WLAN_RATE WLAN Rate Enums chEstimationMethod preambleOnly numOfMIMOStream 1 numAverages 3 vsaTriggerLevel -20 ChannelEstimationOption Enums unitless Number of MIMO steams number of averages dB VSA trigger Level Table 10-33 TX EVM test output parameters Parameter Name Lower Limit evm -100 Upper Limit -25 amplErr dataRateMB 1 135 symbolClockError freqErr Unit Description dBm TX EVM dB TX Amplitude Error Mbs TX Data Rate PPM TX Symbol Clock Error PPM TX Frequency Error -20 20 PPM TX Phase Error avgTxPower 7 13 dBm Average TX Power avgTxPowerDelta -2 2 dB TX Power Accuracy loLeakage -120 -15 dB LO Leakage phaseErr 10.2.3 WlanTxVerifySpectrumTest This test measures transmit spectrum in terms of carrier center frequency leakage and spectral flatness. Table 10-34 and Table 10-35 list the input and output parameters for this test. Test Name: WlanTxVerifySpectrumTest Test Condition: Normal Loop Condition: Channel, Rate Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI PXI5644R”, Agilent 4010A” Table 10-34 TxVerifySpectrum test input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description channel 1 WLAN Channel powerLevel 10.0 dBm TX Power Level wlanRate 16 WLAN_RATE WLAN Rate Enums chEstimationMethod preambleOnly ChannelEstimationOption Enums MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 104 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Value numOfMIMOStream 1 vsaTriggerLevel -20 Unit Description Number of MIMO steams dB VSA trigger Level Table 10-35 TxVerifySpectrum test output parameters Parameter Name Lower Limit Upper Limit Unit Description carrierNumber -52 52 Number of Carriers flatnessMargin -4 2 dB Average Power Flatness over spectrum loLeakage -120 -15 dBm LO Leakage avgTxPower 7 13 dBm Average TX Power 10.2.4 WlanTxVerifyPowerTest This test measures transmit power levels. It measures the maximum, minimum and average TX power and maximum, minimum and average peak Tx power. Table 10-36 and Table 10-37 list the input and output parameters for this test. Test Name: WlanTxVerifyPowerTest Test Condition: Normal Loop Condition: Channel, Rate Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI PXI5644R”, Agilent 4010A” Table 10-36 Tx verify power test input parameters Parameter Name Value Unit Description channel 1 WLAN Channel powerLevel 10.0 dBm TX Power Level wlanRate 16 WLAN_RATE WLAN Rate Enums numOfMIMOStream 1 unitless Number of MIMO steams vsaTriggerLevel -20 dB VSA trigger Level Table 10-37 TX verify power test output parameters Parameter Name Lower Limit Upper Limit txPowerAvg Description dBm Average TX Power dB TX Power Accuracy txPowerMax dBm Maximum TX Power txPowerMin dBm Minimum TX Power txPowerPeak dBm Average Peak TX Power txPowerPeakMax dBm Maximum Peak TX Power txPowerPeakMin dBm Minimum Peak TX Power cableLoss dBm Path loss (from cable) txPowerAvgDelta 80-Y0306-1 Rev. L Unit -2 2 MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 105 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.2.5 WlanTxVerifyMaskTest This test measures transmit spectrum mask; it reports whether the WLAN transmit spectrum complies or fails with the standard WLAN mask. It will also output the worst failure margins and their associated frequencies. Table 10-38 and Table 10-39 list the input and output parameters for this test. Note: This test generates a lot of data. “Out of Memory” errors can occur in QSPR if this test is executed excessively in a loop. Test Name: WlanTxVerifySpectrumTest Test Condition: None Loop condition: Channel, Rate Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI PXI5644R”, Agilent 4010A” Table 10-38 TxVerifyMask test input parameters Parameter Name Value Unit Description channel 1 powerLevel 10.0 dBm WLAN Channel TX Power Level wlanRate 16 WLAN_RATE WLAN Rate Enums numOfMIMOStream 1 unitless Number of MIMO steams vsaTriggerLevel -25 dB VSA trigger Level Table 10-39 TxVerifyMask output parameters Parameter Name Lower Limit Upper Limit Unit Description maskPass Pass/Fail WLAN Mask violationPct Percentage of the mask that fails avgTxPower 7 13 dBm Average TX Power spectrum Spectrum Magnitude Array spectrumFreqs Spectrum Frequency Array Mask Mask Magnitude Array MaskFreqs Mask Frequency Array 10.2.6 WlanPerTest This test measures receiver minimum input sensitivity. It measures the PER of the receiver at the minimum input sensitivity level: -69 dBm for 2.4GHz; -65 dBm for 5GHz. Table 10-40 and Table 10-41 list the input and output parameters for this test. Test Name: WlanPerTest Test Condition: None Loop Condition: Channel Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI PXI5644R”, Agilent 4010A” 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 106 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-40 WLAN Per test input parameters Parameter Name Value Unit Description startPower -69 dBm PER Search Start Power stopPower -69 dBm PER Search Stop Power channel 7 rate RATE_11N_HT20_MCS7 WLAN_RATE WLAN Rate Enums wlanMode 2 WLAN_MODE WLAN Mode Enums coursePktCount 2000 number of packets for PER coarse search loop finePktCount 10000 number of packets for PER fine search loop coarseStepSize 2.0 dB step size for PER coarse search loop fineStepSize 0.5 dB step size for PER fine search loop rxChain 1 WLAN Channel Rx Chain to test Table 10-41 WLAN Per test output parameters Parameter Name Lower Limit Upper Limit Unit Description PER 0 10 % PER at Per Power; must define Upper Limit PerPower -100 0 dBm Power at which reported PER is measured Rssi -100 0 dBm Received Signal Strength Indicator 10.2.7 WlanPerSweepTest This test sweeps receiver’s power with a specified step, measures receiver PER at each input power steps. Table 10-42 and Table 10-43 list the input and output parameters for this test. Test Name: WlanPerSweepTest Test Condition: None Loop Condition: Channel Test Equipment: LitePoint IQ2010 “,“LitePoint IQxel”, “NI PXI5644R” Table 10-42 WLAN PerSweepTest input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description startPower -50 dBm PER Search Start Power stopPower -90 dBm PER Search Stop Power channel 7 rate RATE_11N_HT20_MCS7 WLAN_RATE WLAN Rate Enums channelBonding 2 WLAN_MODE WLAN Mode Enums WLAN Channel number or FreqMHz MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 107 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Value Unit Description pktCount 200 number of packets for PER sweep stepSize -2.0 rxChain 1 Rx ChainMask to test perLimit 10 PER limit to compute min and max passed power dB step size for PER sweep Table 10-43 WLAN PerSweepTest output parameters Parameter Name Lower Limit Upper Limit Unit Description allMeasuredPERs 0 10 % PER at Per Power; must define Upper Limit allPerPowers -110 0 dBm Power at which reported PER is measured allMeasuredRssis -100 0 dBm Received Signal Strength Indicator minPassPerPower -100 (rate dependent) 0 dBm Min power for PER within upperLimit maxPassPerPower -100 0 dBm Max power for PER within upperLimit 10.2.8 WlanSendRxPacketsTest This test set VSG to Tx number of packets (numPackets) at specified power level Table 10-44 list the input parameters for this test. Test Name: WlanSendRxPacketsTest Test Condition: None Loop Condition: Channel Test Equipment: LitePoint IQ2010 “,“LitePoint IQxel”, “NI PXI5644R” Table 10-44 WLAN PerSweepTest input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit dBm Description Power -60 numPackets 1000 Number of packets to send channel 5210 WLAN Channel number or FreqMHz rate RATE_11N_HT20_MCS7 WLAN_RATE VSG Tx Power level WLAN Rate Enums MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 108 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.3 WLAN production test description (MIMO or SISO) 10.3.1 SetUpDutTxDetails Only applicable to QC98xx, QCA6174 Table 10-45 SetUpDutTxDetails parameters Parameter Name Value Unit Description channel 1 WLAN Channel cbState 0 none Channel Bonding State 0:HT20, 13:HT40, 4-10:VHT80 Rate 3 RATE_11MBs TX Data Rate pwrMode 2 SCPC TX Power Control Mode txMode 3 ContTx99 Tx Mode txChainMask 3 WLAN_CHAIN_12 powerLevel 10.0 dBm TX Power Level dBm, only for pwrMode set as one of TxPowerForce gain 2 unitless gain index only for pwrMode set as ForcedGain or ForcedDesiredGain digitalGain 0 unitless Digital Gain (open loop power control mode only) dacGain only for pwrMode set as ForcedGain or ForcedDesiredGain PAcfg 0 payloadSize 1500 bytes Payload size in bytes Short11b_nGuard False boolean True: 11b short or 11n/11ac short guard ldpcRate False boolean True if this is an 11n or 11ac LDPC rate stbcMode False boolean True if this is an 11n or 11ac stbc mode aggregation 1 1 to 31 aggregation dpdMode Disable boolean Enable/Disable PA predistortion Ifs 1 byte Interframe space dutyCycle 10 byte dutyCycle percentage (not programmed in this release) nPattern 4 byte data frame data pattern enum. If >=6, data frame will be user defined in pattern with length of nPattern (nPattern>=6 not programmed in this release) Pattern 1 byte Used when nPattern >=6, user defined data pattern with length of nPattern nPacket 0 byte 0 for continuous Tx >0 for number of packets Tx send broadcastMode True boolean True: BroadCastMode Tx ChainMask to turn on PA configuration only for QCA6174 pwrMode ForcedGain 0 80-Y0306-1 Rev. L TPC_FORCED_GAINIDX = 4 MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 109 Wireless Connectivity Tests User Guide OpenLoopSearch 1 Wireless Connectivity Test Description not used TxPowerAuto 2 TPC_TGT_PWR = 1 TxPowerForce_CLPC 3 TPC_TX_PWR = 0 TxPowerForce_SCPC 4 TPC_TX_PWR = 0 TxPowerForce_OLPC 5 TPC_TX_PWR = 0 ForcedDesiredGain 6 TPC_FORCED_GAINIDX = 4 txMode DisablingContinuousMode = 0, EnablingContinuousUnmodulatedTX = 1, EnablingContinuousModulatedTX = 2, ContTx99 = 3, ContTx100 = 4, txChainMask WLAN_CHAIN_1 = 1, WLAN_CHAIN_2 = 2, WLAN_CHAIN_12 = 3, WLAN_CHAIN_3 = 4, WLAN_CHAIN_13 = 5, WLAN_CHAIN_123 = 7, 10.3.2 WlanTxEvmTest_NxN This test measures transmit modulation accuracy. Table 10-46 and Table 10-47 list the input and output parameters for this test. Test Name: WlanTxEvmTest_NxN Test Condition: Normal Loop Condition: Channel, Rate Test Equipment: “LitePoint IQxel”, “NI PXI5644R” Table 10-46 TX EVM Test NxN input parameters Parameter Name rate Value Unit WLAN_RATE channel 80-Y0306-1 Rev. L Description WLAN_DataRate Enums Center Frequency of Tx Signal powerLevel dBm TX Power Level vsaTriggerLevel dBm VSA trigger Level chEstimationMethod ChannelEstimationOption Enums chainStreamSelection Chain or stream EVM Selection ( 0 for chain; 1 for stream ) numAverages number of samples for averaging MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 110 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-47 TX EVM Test NxN output parameters Parameter Name Lower Limit Upper Limit Unit evm[] -100 -25 dB TX EVM evmDataMb -999 999 Mbs TX Data Rate dB TX Amplitude Error PPM TX Symbol Clock Error PPM TX Frequency Error PPM TX Phase Error amplErr[] symbolClockError[] m freqErr[] -20 20 phaseErr[] Description avgTxPower[] 7 13 dBm Average TX Power avgTxPowerDelta -2 2 dB Delta Between Requested And Measured Tx Power loLeakage[] -120 -15 dB LO Leakage 10.3.3 WlanTxVerifyPowerTest_NxN This test measures transmit power levels. It measures the maximum, minimum and average TX power and maximum, minimum and average peak Tx power. Table 10-48 and Table 10-49 list the input and output parameters for this test. Test Name: WlanTxVerifyPowerTest_NxN Test Condition: Normal Loop Condition: Channel, Rate Test Equipment: “LitePoint IQxel”, “NI PXI5644R” Table 10-48 Tx verify power test NxN input parameters Parameter Name Value Unit Description rate Wi-Fi Rate of Tx Signal channel MHz Center Frequency of Tx Signal powerLevel dBm TX Power Level vsaTriggerLevel dB VSA trigger Level Table 10-49 TX verify power Test NxN output parameters Parameter Name Lower Limit Upper Limit -2 2 txPowerAvg[] Description dBm Average TX Power dB TX Power Accuracy txPowerMax[] dBm Maximum TX Power txPowerMin[] dBm Minimum TX Power txPowerPeak[] dBm Average Peak TX Power txPowerPeakMax[] dBm Maximum Peak TX Power txPowerPeakMin[] dBm Minimum Peak TX Power cableLoss[] dBm Path loss (from cable) txPowerAvgDelta[] 80-Y0306-1 Rev. L Unit MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 111 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.3.4 MeasureMask_NxN This test measures transmit spectral mask; it reports whether the WLAN transmit spectrum complies or fails with the standard WLAN mask. Table 10-50 and Table 10-51 list the input and output parameters for this test. Test Name: MeasureMask_NxN Test Condition: Normal Loop Condition: Channel, Rate Test Equipment: “LitePoint IQxel”, “NI PXI5644R” Table 10-50 MeasureMask_NxN test input parameters Parameter Name Value Unit rate Description WLAN Rate Enums channel MHz Center Frequency of Tx Singal powerLevel dBm TX Power Level vsaTriggerLevel[] dBm VSA trigger Level Table 10-51 MeasureMask_NxN test output parameters Parameter Name Lower Limit Upper Limit maskPass[] Description dBm Pass/Fail WLAN Mask dB Percentage of the mask that fails freq_at_margin_positive[] Hz Frequency At Margin Positive freq_at_margin_negative[] Hz Frequency At Margin Negative margin_db_positive[] dB Margin at Positive margin_db_negative[] dB Margin at Negative spectrumTrace_1 dB Spectral Trace Chain 1 spectrumMaskTrace_1 dB Spectral Mask Trace Chain 1 frequencyList_1 Hz Frequency List Chain 1 spectrumTrace_2 dB Spectral Trace Chain 2 spectrumMaskTrace_2 dB Spectral Mask Trace Chain 2 frequencyList_2 Hz Frequency List Chain 2 spectrumTrace_3 dB Spectral Trace Chain 3 spectrumMaskTrace_3 dB Spectral Mask Trace Chain 3 frequencyList_3 Hz Frequency List Chain 3 spectrumTrace_4 dB Spectral Trace Chain 4 spectrumMaskTrace_4 dB Spectral Mask Trace Chain 4 frequencyList_4 Hz Frequency List Chain 4 violationPct[] 80-Y0306-1 Rev. L Unit -2 2 MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 112 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.3.5 MeasureSpectrum_NxN This test measures transmit spectrum in terms of carrier center frequency leakage and spectral flatness. Table 10-52 and Table 10-53 list the input and output parameters for this test. Test Name: MeasureSpectrum_NxN Test Condition: Normal Loop Condition: Channel, Rate Test Equipment: “LitePoint IQxel”, “NI PXI5644R” Table 10-52 MeasureSpectrum_NxN test input parameters Parameter Name Value Unit Description rate WLAN Rate Enums channel 1 MHz Center Frequency of Tx Singal powerLevel 10.0 dBm TX Power Level vsaTriggerLevel[] -25 dBm VSA trigger Level chEstimationMethod ChannelEstimationOption Enums Table 10-53 MeasureSpectrum_NxN test output parameters Parameter Name spectrumPower[] 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit dBm Description Spectrum Power carrierNumber_1[] Carrier Number for Chain 1 carrierNumber_2[] Carrier Number for Chain 2 carrierNumber_3[] Carrier Number for Chain 3 carrierNumber_4[] Carrier Number for Chain 4 flatnessMargin_1[] dB Average Power Flatness over spectrum for chain 1 flatnessMargin_2[] dB Average Power Flatness over spectrum for chain 2 flatnessMargin_3[] dB Average Power Flatness over spectrum for chain 3 flatnessMargin_4[] dB Average Power Flatness over spectrum for chain 4 loLeakage[] dBm LO Leakage MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 113 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.3.6 WlanPerTest_NxN This test measures receiver minimum input sensitivity. It measures the PER of the receiver at the minimum input sensitivity level: -69 dBm for 2.4GHz; -65 dBm for 5GHz. Table 10-54 and Table 10-55 list the input and output parameters for this test. Test Name: WlanPerTest_NxN Test Condition: None Loop Condition: Channel Test Equipment: “LitePoint IQxel”, “NI PXI5644R” Table 10-54 WLAN Per NxN test input parameters Parameter Name Value Unit Description startPower -69 dBm PER Search Start Power stopPower -69 dBm PER Search Stop Power channel 5180 rate RATE_11N_HT20_MCS7 WLAN_RATE WLAN 11n/11ac Rate Enums channelBonding 2 WLAN_MODE WLAN Mode Enums coursePktCount 2000 number of packets for PER coarse search loop finePktCount 10000 number of packets for PER fine search loop coarseStepSize 2.0 dB step size for PER coarse search loop fineStepSize 0.5 dB step size for PER fine search loop rxChain 1 WLAN Channel number or FreqMHz Rx ChainMask Table 10-55 WLAN Per NxN test output parameters 80-Y0306-1 Rev. L Parameter Name Lower Limit Upper Limit Unit Description PER 0 10 % PER at Per Power; must define Upper Limit PerPower -100 0 dBm Power at which reported PER is measured Rssi -100 0 dBm Received Signal Strength Indicator MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 114 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.3.7 WlanPerSweepTest_NxN This test sweeps receiver’s power with a specified step, measures receiver PER at each input power steps. Table 10-56 and Table 10-57 list the input and output parameters for this test. Test Name: WlanPerSweepTest_NxN Test Condition: None Loop Condition: Channel Test Equipment: “LitePoint IQxel”, “NI PXI5644R” Table 10-56 WLAN PerSweepTest_NxN input parameters Parameter Name Value Unit Description startPower -50 dBm PER Search Start Power stopPower -90 dBm PER Search Stop Power channel 7 rate RATE_11N_HT20_MCS7 WLAN_RATE WLAN 11n/11ac Rate Enums channelBonding 2 WLAN_MODE WLAN Mode Enums pktCount 200 stepSize -2.0 rxChain 3 Rx ChainMask to test perLimit 10 PER limit to compute min and max passed power WLAN Channel number or FreqMHz number of packets for PER sweep dB step size for PER sweep Table 10-57 WLAN PerSweepTest_NxN output parameters 80-Y0306-1 Rev. L Parameter Name Lower Limit Upper Limit Unit Description allMeasuredPERs 0 10 % PER at Per Power; must define Upper Limit allPerPowers -110 0 dBm Power at which reported PER is measured allMeasuredRssis -100 0 dBm Received Signal Strength Indicator minPassPerPower -100 (rate dependent) 0 dBm Min power for PER within upperLimit maxPassPerPower -100 0 dBm Max power for PER within upperLimit MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 115 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.3.8 WlanSendRxPacketsTest_NxN This test set VSG to Tx number of packets (numPackets) at specified power level Table 10-58 list the input parameters for this test. Test Name: WlanSendRxPacketsTest_NxN Test Condition: None Loop Condition: Channel Test Equipment: “LitePoint IQxel”, “NI PXI5644R” Table 10-58 WLAN PerSweepTest input parameters Parameter Name Value Unit dBm Description Power -60 numPackets 1000 Number of packets to send channel 5210 WLAN Channel number or FreqMHz rate RATE_11N_HT20_MCS7 WLAN_RATE VSG Tx Power level WLAN 11n/11AC Rate Enums 10.4 FM production test description 10.4.1 FM RX tests 10.4.1.1 Sensitivity GONOGO This test verifies that the minimum sensitivity is met. But it does NOT find the sensitivity level, defined as the input power level where SNR=26 dB. Table 10-59 and Table 10-60 list the input and output parameters for this test. Test Name: FmRxTest_Sensitivity_GONOGO Test Condition: Normal Loop Condition: FM Frequency Test Equipment: “LitePoint IQ2010” Table 10-59 Sensitivity GONOGO input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description carrierPowerdBm -102.0 dBm Input Power Level at DUT carrierFreqKHz Set by loop kHz RF Frequency audioToneFreqHz 1000 Hz Audio Frequency MaxRetries 3 Max # of measurement retry attempts. Retries happen if SNR < lower limit, or L&R measurements are unbalanced by more than 1 dB MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 116 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-60 Sensitivity GONOGO output parameters Parameter Name Lower Limit SNR 26 Upper Limit 99 Unit dB Description Audio SNR; lower limit must be specified in test tree 10.4.1.2 Sensitivity characterization This test finds the minimum FM sensitivity level with an iterative search. FM Sensitivity is defined as the input power level where SNR=26 dB. Table 10-61 and Table 10-62 list the input and output parameters for this test. Test Name: FmRxTest_Sensitivity_Characterization Test Condition: Normal Loop Condition: FM Frequency Test Equipment: “LitePoint IQ2010” Table 10-61 Sensitivity characterization input parameters Parameter Name Value Unit Description PowerStart -108.0 dBm Start power for iterative search PowerStep 1.0 dB Step size for iterative search PowerMax -90.0 dBm Max power for iterative search PowerMin -114.0 dBm Min power for iterative search SNRTarget 26.0 dB SNR target for iterative search carrierFreqKHz Set by loop kHz RF Frequency audioToneFreqHz 1000 Hz Audio Frequency MaxRetries 3 Max # of measurement retry attempts. Retries happen if SNR < 10 dB, or L&R measurements are unbalanced by more than 1 dB Table 10-62 Sensitivity characterization output parameters Parameter Name FmSens 80-Y0306-1 Rev. L Lower Limit -115 Upper Limit -102 Unit dBm Description FM Sensitivity; RF input level where audio SNR = 26 dB MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 117 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.4.1.3 Max SNR This test finds the maximum SNR. Table 10-63 and Table 10-64 list the input and output parameters for this test. Test Name: FmRxTest_MaxSNR Test Condition: Normal Loop Condition: FM Frequency Test Equipment: “LitePoint IQ2010” Table 10-63 Max SNR input parameters Parameter Name Value Unit Description carrierPowerdBm -47.0 dBm Input Power Level at DUT carrierFreqKHz Set by loop kHz RF Frequency stereo True or False Boolean Flag to Enable Stereo Pilot & Modulation pilotDeviationHz 6750 Hz Pilot Deviation; Only relevant if stereo=True totalFmDeviationHz 22500 (if mono) 75000 (if stereo) Hz Total FM Deviation audioToneFreqHz 1000 Hz Audio Frequency MaxRetries 3 3 Max # of measurement retry attempts. Retries happen if SNR < lower limit, or L&R measurements are unbalanced by more than 1 dB Table 10-64 Max SNR output parameters Parameter Name SNR 80-Y0306-1 Rev. L Lower Limit 57 (if mono) 53 (if stereo) Upper Limit 99 Unit dB Description Audio SNR; lower limit must be specified in test tree MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 118 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.4.1.4 Intermediate SNR This test finds the SNR at an intermediate power level with AM distortion added to the FM signal. Table 10-65 and Table 10-66 list the input and output parameters for this test. Test Name: FmRxTest_ IntermediateSNR Test Condition: Normal Loop Condition: FM Frequency Test Equipment: “LitePoint IQ2010” Table 10-65 Intermediate SNR input parameters Parameter Name Value Unit Description carrierPowerdBm -90.0 dBm Input Power Level at DUT carrierFreqKHz Set by loop kHz RF Frequency audioToneFreqHz 1000 Hz Audio FM Frequency amFreqHz 400 Hz AM Frequency amDepthPercent 30 % AM Depth MaxRetries 3 Max # of measurement retry attempts. Retries happen if SNR < lower limit, or L&R measurements are unbalanced by more than 1 dB Table 10-66 Intermediate SNR output parameters Parameter Name SNR 80-Y0306-1 Rev. L Lower Limit 45 Upper Limit 99 Unit dB Description Audio SNR; lower limit must be specified in test tree MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 119 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.4.1.5 THD This test finds the Total Harmonic Distortion (THD). Table 10-67 and Table 10-68 list the input and output parameters for this test. Test Name: FmRxTest_THD Test Condition: Normal Loop Condition: FM Frequency, Audio Frequency, and mono|stereo state Test Equipment: “LitePoint IQ2010” Table 10-67 THD input parameters Parameter Name Value Unit Description carrierPowerdBm -47.0 dBm Input Power Level at DUT carrierFreqKHz Set by loop kHz RF Frequency stereo True or False Boolean Flag to Enable Stereo Pilot & Modulation pilotDeviationHz 6750 Hz Pilot Deviation; Only relevant if stereo=True 75000 Hz Hz Audio Frequency totalFmDeviationHz audioToneFreqHz mono: 400, 1000, & 3000 stereo: 3000 MaxRetries 3 Max # of measurement retry attempts. Retries happen if THD > upper limit, or L&R measurements are unbalanced by more than 1 dB Table 10-68 THD output parameters 80-Y0306-1 Rev. L Parameter Name Lower Limit THD 0 Upper Limit 0.8 (if mono) 1.5 (if stereo) Unit % Description Audio THD; upper limit must be specified in test tree MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 120 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.4.1.6 RDS block error rate This test finds the RDS Block Error Rate (BLER). Table 10-69 and Table 10-70 list the input and output parameters for this test. Test Name: FmRxTest_RDS_BLER Test Condition: Normal Loop Condition: FM Frequency Test Equipment: “LitePoint IQ2010” Table 10-69 RDS BLER input parameters Parameter Name NOTE: Value Unit Description carrierPowerdBm -86.0* dBm Input Power Level at DUT carrierFreqKHz Set by loop kHz RF Frequency pilotDeviationHz 6750 Hz Pilot Deviation rdsDeviationHz 2000 Hz RDS Deviation totalFmDeviationHz 75000 Hz Total FM Deviation preEmphasis PRE_EMPHASIS_75US enum Time Constant of Pre-emphasis filter rdsTransmitString QCOM-RDS audioToneFreqHz 1000 Hz Audio Frequency MinNumBlocks 5000* Sec Min # of Blocks for BLER calculation DelayBeforeMeasurement 1 Sec Delay between enabling RDS signal and measuring BLER TimeOutPercent 110.0 % Percentage of expected time to wait for MinNumBlocks before aborting the test ExitEarlyIfFailing True Boolean Flag to exit test early if TotalRdsBlockErrors guarantees the test is going to fail RDS Transmit String The value for carrierPowerdBm is not fixed by chip specifications. Choose an appropriate value. The value for MinNumBlocks is a tradeoff of test time vs. statistical confidence. Choose an appropriate value. Table 10-70 RDS BLER output parameters Parameter Name BLER_percent Upper Limit 0.0 5.0 Unit % Description Block Error Rate; upper limit must be specified in test tree TotalRdsBlockErrors # of RDS Block Errors TotalRdsBlocks # of RDS Blocks TotalRdsGroups # of RDS Groups ElapsedTime 80-Y0306-1 Rev. L Lower Limit seconds time duration of the BLER measurement MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 121 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.4.2 FM TX tests 10.4.2.1 TX output power This test measures the TX output power. Table 10-71 and Table 10-72 list the input and output parameters for this test. Test Name: FmTxTest_TxOutputPower Test Condition: Normal Loop Condition: FM Frequency Test Equipment: “LitePoint IQ2010” Table 10-71 TX output power input parameters Parameter Name Value carrierFreqKHz Unit Set by loop Description kHz RF Frequency Table 10-72 TX output power output parameters Parameter Name Lower Limit Upper Limit Unit TxOutputPower dBm Description Tx Output Power 10.4.2.2 FM deviation This test measures FM Deviation. Table 10-73 and Table 10-74 list the input and output parameters for this test. Test Name: FmTxTest_TxOutputPower Test Condition: Normal Loop Condition: FM Frequency Test Equipment: “LitePoint IQ2010” Table 10-73 FM deviation input parameters Parameter Name carrierFreqKHz Value Set by loop Unit kHz Description RF Frequency Table 10-74 FM deviation output parameters Parameter Name Upper Limit Unit Description PlusPeakDev Hz Positive Peak Dev MinusPeakDev Hz Negative Peak Dev AvgPeakDev 80-Y0306-1 Rev. L Lower Limit Hz Average Peak Dev RmsPeakDev 70000 80000 Hz RMS Peak Dev Cfo Hz Center Frequency Offset MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 122 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.4.2.3 TX stereo audio SNR This test measures TX stereo audio SNR. Table 10-75 and Table 10-76 list the input and output parameters for this test. Test Name: FmTxTest_TxOutputPower Test Condition: Normal Loop Condition: FM Frequency Test Equipment: “LitePoint IQ2010” Table 10-75 TX stereo audio SNR input parameters Parameter Name Value Unit Description carrierFreqKHz Set by loop kHz RF Frequency deEmphasis DE_EMPHASIS_75US Enum analysis de-emphasis setting; set this to match DUT pre-emphasis setting Table 10-76 TX stereo audio SNR output parameters Parameter name Lower limit Upper limit Unit Description TxLeftSNR 60 99 dB Left Channel SNR TxRightSNR 60 99 dB Right Channel SNR 10.5 ANT production test description 10.5.1 Transmit channel power This test measures the TX output power over the channel bandwidth. Test Name: ChannelPower Test Condition: Normal Loop Condition: ANT Frequency Test Equipment: “Agilent E4443A/E440xB” Table 10-77 TX channel power input parameters Parameter Name Bandwidth FrequencyOffset Packets 80-Y0306-1 Rev. L Value Unit 1 MHz Channel bandwidth Set by loop MHz Transmit frequency offset from 2400 MHz 0 Description Total number of packets for Tx/Rx. 0 indicates continuous test PacketRate 100 Hz Packet rate per second DeviceNumber 55 Device number field of device address DeviceType 11 Device type field of device address MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 123 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Value TransmissionType Unit 208 Description Transmission type field of device address DataPayload 5555555555555555 TxPathName SAPath Data payload in the expected packet in hex format Transmit path name Table 10-78 TX channel power output parameters 80-Y0306-1 Rev. L Parameter Name Lower Limit Upper Limit Unit channelPower -2 2 dBm Description Channel power MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 124 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.5.2 Receive sensitivity This test measures the RX sensitivity defined as minimum power level at which BER is less than 1%. Test Name: Sensitivity Test Condition: Normal Loop Condition: ANT Frequency Test Equipment: “Agilent N5182A” Table 10-79 Receive sensitivity input parameters Parameter Name Value Unit Description ArbFileName ANT_NET5B25PAT55PER10 ARB file name on signal generator StartPower -85 dBm Power value at which search starts StopPower -100 dBm Power value at which search stops CoarsePowerStep 1 dBm Initial power step FinePowerStep 0.1 dBm Final power step FrequencyOffset Set by loop MHz Transmit frequency offset from 2400 MHz CoarsePackets 1000 Total number of packets for Tx/Rx for initial search with coarse step size Packets 10000 Total number of packets for Tx/Rx. 0 indicates continuous test PacketRate 100 DeviceNumber 55 Device number field of device address DeviceType 11 Device type field of device address TransmissionType 208 Transmission type field of device address DataPayload 5555555555555555 Data payload in the expected packet in hex format RxPathName ARBPath Receive path name Hz Packet rate per second Table 10-80 Receive sensitivity output parameters Parameter Name 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit dBm Description sensitivity -98 -85 lostPacketRate 0 50 Sensitivity LPR crcErrorRate 0 50 CRC Error rate packetErrorRate 0 50 PER bitErrorRate 0 0.1 BER packetsReceived 0 10000 No. of packets received MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 125 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Lower Limit Upper Limit Unit Description packetsLost 0 5000 No. of packets lost packetsWithBadHeader 0 5000 No. of packets with bad header packetsWithBadCRC 0 5000 No. of packets with bad CRC totalBitErrors 0 12000 Total bit errors syncLosses No. of sync losses 10.6 Bluetooth signaling production test description LE production tests are covered in Section 10.1. 10.6.1 BTDUT_FFA_DisableLegacyLogMode This test is performed for supporting Bluetooth legacy log. Table 10-81 and Table 10-82 list the input and output parameters for this test. Test Name: BTDUT_FFA_DisableLegacyLogMode Test Condition: None Table 10-81 BTDUT_FFA_DisableLegacyLogMode input parameters Parameter Name Value disableLegacyLogMode True Unit Description Disable legacy log mode = true, Enable legacy log mode = false Table 10-82 BTDUT_FFA_DisableLegacyLogMode output parameters Parameter Name Lower Limit Upper Limit errorMessage Unit NA Description error messages 10.6.2 BTDUT_EnableBT_DUTMode This test is performed to enable BT DUT mode. Test Name: BTDUT_EnableBT_DUTMode Test Condition: None 10.6.3 Measure Tx GFSK power This test is performed for configuring device under test for GFSK transmit tests. Table 10-83 and Table 10-84 list the input and output parameters for this test. Test Name: TRM/CA/01 TX Power GFSK Test Condition: Normal 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 126 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-83 TRM/CA/01 TX Power GFSK input parameters Parameter Name Value Unit Description TxChannel 0 NA TX Channel (0-78) RxChannel 78 NA RX Channel (0-78) PacketType BT_DH1 NA Bluetooth packet type Hopping No NA Channel Hopping mode DefaultTxPower -40 dBm Default TX Power Level NumOfPackets 1 NA Number of packets (0-10000) Table 10-84 TRM/CA/01 TX Power GFSK output parameters Parameter Name Lower Limit Upper Limit Unit 2 16 dBm errorMessage NA AvgPowerdBm Description error messages Average Bluetooth power 10.6.4 Measure Tx modulation characteristics This test verifies and measures modulation characteristics. Table 10-85 and Table 10-86 list the input and output parameters for this test. Test Name: TRM/CA/07 Modulation Characteristics Test Condition: Normal Loop Condition: Tx Channel Table 10-85 TRM/CA/07 modulation characteristics input parameters Parameter name Value Unit Description TxChannel 78 NA TX channel (0-78) RxChannel 0 NA RX channel (0-78) PacketType BT_DH5 NA Bluetooth Packet Type TestType Loopback NA Test Type DefaultTxPower -40 dBm Default TX Power Level NumOfPackets 1 NA Number of packets (0-10000) Table 10-86 TRM/CA/07 modulation characteristics output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage 80-Y0306-1 Rev. L Description error message from test DeltaF1Avg 140 175 KHz Delta F1 average deviation KHz DeltaF2Max 115 250 KHz Delta F2 maximum deviation KHz DeltaF2byF1 0.8 2 NA Delta F2 by F1 MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 127 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.6.5 Measure GFSK initial carrier frequency tolerance This test verifies and measures initial carrier frequency tolerance. Table 10-87 and Table 10-88 list the input and output parameters for this test. Test Name: TRM/CA/08 Initial Carrier Frequency Tolerance Test Condition: Normal Loop Condition: Tx Channel Table 10-87 TRM/CA/08 initial carrier frequency tolerance input parameters Parameter name Value Unit Description TxChannel 78 NA TX channel (0-78) RxChannel 0 NA RX channel (0-78) PacketType BT_DH1 NA Bluetooth Packet Type TestType Loopback NA Test Type DefaultTxPower -40 dBm Default TX Power Level NumOfPackets 1 NA Number of packets (0-10000) Table 10-88 TRM/CA/08 initial carrier frequency tolerance output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage FrequencyTolerance Description error message from test -75 75 KHz Frequency Tolerance in KHz 10.6.6 Measure GFSK carrier frequency drift This test verifies and measures carrier frequency drift and frequency drift rate. Table 10-89 and Table 10-90 list the input and output parameters for this test. Test Name: TRM/CA/09 Carrier Frequency Drift Test Condition: Normal Loop Condition: Tx Channel Table 10-89 TRM/CA/09 carrier frequency drift input parameters Parameter name 80-Y0306-1 Rev. L Value Unit Description TxChannel 78 NA TX channel (0-78) RxChannel 0 NA RX channel (0-78) PacketType BT_DH1 NA Bluetooth Packet Type TestType Loopback NA Test Type DefaultTxPower -40 dBm Default TX Power Level NumOfPackets 1 NA Number of packets (0-10000) MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 128 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-90 TRM/CA/09 Carrier Frequency Drift output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description error message from test MaxDrift -25 25 KHz Max drift in kHz, limit for DH1= +- 25, for DH3 and DH5 limit = +-40 MaxDriftRate -20 20 KHz/50us Max drift rate 10.6.7 Measure EDR relative transmit power This test verifies and measures EDR relative transmit power. Table 10-91 and Table 10-92 list the input and output parameters for this test. Test Name: TRM/CA/10/C EDRRelativeTransmitPower Test Condition: Normal Loop Condition: Tx Channel Table 10-91 TRM/CA/10/C EDRRelativeTransmitPower input parameters Parameter name Value Unit Description TxChannel 78 NA TX channel (0-78) RxChannel 0 NA RX channel (0-78) PacketType BT_2DH5 NA Bluetooth Packet Type Hopping No NA Channel Hopping mode TestType Loopback NA Test Type DefaultTxPower -40 dBm Default TX Power Level NumOfPackets 1 NA Number of packets (0-10000) Table 10-92 TRM/CA/10/C EDRRelativeTransmitPower output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description error message from test GFSKPower 3 12 dBm GFSK absolute power DPSKPower 3 12 dBm DPSK absolute power RelativePower -4 1 dB Relative power 10.6.8 Measure EDR modulation accuracy This test verifies and measures EDR modulation accuracy. Table 10-93 and Table 10-94 list the input and output parameters for this test. Test Name: TRM/CA/11 EDR Modulation Accuracy Test Condition: Normal Loop Condition: Tx Channel 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 129 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-93 TRM/CA/11 EDR modulation accuracy input parameters Parameter name Value Unit Description TxChannel 78 NA TX channel (0-78) RxChannel 0 NA RX channel (0-78) PacketType BT_2DH5 NA Bluetooth Packet Type Hopping No NA Channel Hopping mode TestType Loopback NA Test Type DefaultTxPower -40 dBm Default TX Power Level NumOfPackets 1 NA Number of packets (0-10000) Table 10-94 TRM/CA/11 EDR modulation accuracy output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description error message from test InitialFreqError -75 75 KHz Initial Frequency Error FreqError -10 10 KHz Frequency Error BlockFreqError -75 75 KHz Block Freuqency Error DEVMRMS 0 0.2 NA DEVMRMS Limit for 2DHx limit = 0.20 and for 3DHx limit = 0.13 DEVMPeak 0 0.35 NA DEVMPeak Limit for 2DHx limit = 0.35 and for 3DHx limit = 0.25 DEVM99Percent 99 100 % DEVM 99% 10.6.9 Measure Rx sensitivity single slot packets This test verifies sensitivity at a given power and measures BER %. Table 10-95 and Table 10-96 list the input and output parameters for this test. Test Name: RCV/CA/01 Sensitivity – single slot packets Test Condition: Normal Loop Condition: Rx Channel Table 10-95 RCV/CA/01 sensitivity – single slot packets input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description RxChannel 0 RX channel (0-78) TxChannel 78 TX channel (0-78) Dirty Yes Dirty mode StartPowerdBm -70 dBm Start Test RX power from VSG, if Start and Stop are same it acts like GoNoGo StopPowerdBm -70 dBm Stop Test RX power from VSG, if Start and Stop are same it acts like GoNoGo fineStepSize 0.5 dB step size for BER fine search loop MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 130 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Value Unit Description coarseStepSize 1 dB step size for BER coarse search loop PacketType BT_DH1 NA Bluetooth Packet Type Hopping No NA Channel Hopping mode DefaultTxPower -40 NA Default Tx Power for test CoarseNumberOfPackets 100 NA Minimum coarse number of packets required for test FineNumberOfPackets 5000 NA Minimum fine number of packets required for test ReceiverTestType Sensitivity NA RX Test type Table 10-96 RCV/CA/01 sensitivity – single slot packets output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description Error message BERPercent 0 0.1 % BER in percent FERPercent 0 50 % FER in percent RxSensitivityPowerdBm -70 -70 dBm Sensitivity level LPR 0 50 % LPR in percent 10.6.10 Measure Rx sensitivity multiple slot packets This test verifies sensitivity at a given power and measures BER %. Table 10-97 and Table 10-98 list the input and output parameters for this test. Test Name: RCV/CA/02 Sensitivity – multiple slot packets Test Condition: Normal Loop Condition: Rx Channel Table 10-97 RCV/CA/02 sensitivity – multiple slot packets input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description RxChannel 0 RX channel (0-78) TxChannel 78 TX channel (0-78) Dirty Yes Dirty mode StartPowerdBm -70 dBm Start Test RX power from VSG, if Start and Stop are same it acts like GoNoGo StopPowerdBm -70 dBm Stop Test RX power from VSG, if Start and Stop are same it acts like GoNoGo fineStepSize 0.5 dB step size for BER fine search loop coarseStepSize 1 dB step size for BER coarse search loop PacketType BT_DH5 NA Bluetooth Packet Type Hopping No NA Channel Hopping mode MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 131 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Value Unit Description DefaultTxPower -40 NA Default Tx Power for test CoarseNumberOfPackets 100 NA Minimum coarse number of packets required for test FineNumberOfPackets 589 NA Minimum fine number of packets required for test ReceiverTestType Sensitivity NA RX Test type Table 10-98 RCV/CA/02 Sensitivity – multiple slot packets output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage Description Error message BERPercent 0 0.1 % BER in percent FERPercent 0 50 % FER in percent RxSensitivityPowerdBm -70 -70 dBm Sensitivity level LPR 0 50 % LPR in percent 10.6.11 Measure EDR Rx sensitivity This test verifies sensitivity at a given power and measures BER %. Table 10-99 and Table 10100 list the input and output parameters for this test. Test Name: RCV/CA/07 EDR Sensitivity Test Condition: Normal Loop Condition: Rx Channel Table 10-99 RCV/CA/07 EDR sensitivity input parameters Parameter Name 80-Y0306-1 Rev. L Value Unit Description RxChannel 0 RX channel (0-78) TxChannel 78 TX channel (0-78) Dirty Yes StartPowerdBm -70 dBm Start Test RX power from VSG, if Start and Stop are same it acts like GoNoGo StopPowerdBm -70 dBm Stop Test RX power from VSG, if Start and Stop are same it acts like GoNoGo fineStepSize 0.5 dB step size for BER fine search loop coarseStepSize 1 dB step size for BER coarse search loop PacketType BT_2DH5 NA Bluetooth Packet Type Hopping No NA Channel Hopping mode DefaultTxPower -40 NA Default Tx Power for test CoarseNumberOfPackets 100 NA Minimum coarse number of packets required for test Dirty mode MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 132 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Value Unit Description FineNumberOfPackets 294 NA Minimum fine number of packets required for test ReceiverTestType Sensitivity NA RX Test type Table 10-100 RCV/CA/07 EDR sensitivity output parameters Parameter Name Lower Limit Upper Limit Unit errorMessage 80-Y0306-1 Rev. L Description Error message BERPercent 0 0.1 % BER in percent PERPercent 0 50 % PER in percent RxSensitivityPowerdBm -70 -70 dBm Sensitivity level LPR 0 50 % LPR in percent MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 133 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.7 NFC production functional test description 10.7.1 NFCDUT_DetectTag This test verifies that the DUT is able to detect a NFC tag. Table 10-101 NFCDUT_DetectTag input parameters Parameter name Value Unit Description SelectNFCTech 3 ALL NA Select the NFC Polling Protocol. timeoutMs 5000 ms Specify the time the test waits for the RF Interface activated notification from the DUT to arrive. This parameter only applies for standalone DUT. RetryCount 3 Number of times to rerun the test in case the test fails. Table 10-102 NFCDUT_DetectTag output parameters Parameter Name Lower Limit Upper Limit Unit Description errorMessage Error message ErrorCode Value is 0 if no error, 1 is any error 10.7.2 NFCDUT_DetectField This test verifies the DUT is able to detect an externally generated NFC field. The DUT is setup to listen for all the three protocols – POLLA, POLLB and POLLF Table 10-103 NFCDUT_DetectField input parameters Parameter name Value timeoutMs 5000 RetryCount 3 Unit ms Description Specify the time the tests waits for the RF Field info notification to arrive from the DUT. This parameter only applies for standalone DUT. Number of times to rerun the test in case the test fails. Table 10-104 NFCDUT_DetectField output parameters Parameter Name 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit Description errorMessage Error message ErrorCode Value is 0 if no error, 1 is any error MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 134 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.7.3 NFCDUT_SelfTest This test verifies executes the firmware based SelfTest function and reports the results. The firmware test limits for RFOsc count can be set using input parameters. Table 10-105 NFCDUT_SelfTest input parameters Parameter name Value Unit Description CheckSWP1 1 N.A Enter 1 to enable SWP1 check, 0 to disable CheckSWP2 1 N.A Enter 1 to enable SWP2 check, 0 to disable iRfOscLL 109936 N.A Enter the lower limit RF Oscillator count value to check for pass/fail iRfOscUL 132800 N.A Enter the upper limit RF Oscillator count value to check for pass/fail Table 10-106 NFCDUT_SelfTest output parameters Parameter Name Lower Limit Upper Limit Unit Description ErrorCodeNFCEE N.A 0= PASS, 1 = FAIL, 2= TIMEOUT, 3 = ERROR ErrorCodeRfOsc N.A 0= PASS, 1 = FAIL, 2= TIMEOUT, 3 = ERROR ErrorCodeCarrierDet N.A 0= PASS, 1 = FAIL, 2= TIMEOUT, 3 = ERROR NFCEE N.A Read NFCEE value RfOsc N.A RfOsc Count value CarrierDet N.A Carrier Detect value errorMessage N.A Error message 10.8 NFC reference parametric test description 10.8.1 SetInstrumentConfigFile This test sets the instrument config xml file for the test suite. The instrument config file contains details about the NFC Tester to be used and the power supply being used. Table 10-107 SetInstrumentConfigFile input parameters Parameter name Value Unit InstrumentConfigFilename C:\Qualcomm\WCN\ProdTests\ ConfigFiles\NFCTesterConfig.xml N.A Description Full path and name for the instrument config file. Table 10-108 SetInstrumentConfigFile output parameters Parameter Name ErrorMessage 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit N.A Description Error message MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 135 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.8.2 NFCDUT_SetConfigFile This test sets the DUT config xml file for the test suite. The instrument config file contains details about the DUT Type and the connection details for the DUT. Table 10-109 NFCDUT_SetConfigFile input parameters Parameter name Value NFCDUTConfigFilename Unit C:\Qualcomm\WCN\ProdTests\ ConfigFiles\NFCDUTConfig.xml N.A Description Full path and name for the DUT config file. Table 10-110 NFCDUT_SetCOnfigFile output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit Description N.A Error message 10.8.3 NFCDUT_Instantiate This test reads the loaded DUTconfig file and sets the DUT type for the Test Suite – Serial/SoC or MTP/Phone. The two possible DUT interface strings are QC.CTE.NFCTestSuite.NFCDUT_SoC and QC.CTE.NFCTestSuite.NFCDUT_MTP. Table 10-111 NFCDUT_Instantiate output parameters Parameter Name Lower Limit Upper Limit Unit Description DUTInterface N.A This parameter displays the DUT interface type set in the config file. ErrorMessage N.A Error message 10.8.4 DUT_InitFramework This test starts up the test framework. This test also sets the path for the folder that contains installed TCL files/binaries. Table 10-112 DUT_InitFramework input parameters Parameter name tclInstallPath Value Unit C:\Qualcomm\WCN\ProdTests\bin\TCL\ N.A Description Provide the directory path for the tcl installation folder Table 10-113 InitFramework output parameters Parameter Name ErrorMessage 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit N.A Description Error message MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 136 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.8.5 EnableDUTPower This test turns ON the power supply specified in the instrument config file. Table 10-114 EnableDUTPower input parameters Parameter name Value Unit voltage Volts Description The voltage for the power supply Table 10-115 EnableDUTPower output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit Description N.A Error message 10.8.6 WaitForPortToExist This test waits for the port to be available until the specified timeout. Table 10-116 WaitForPortToExist input parameters Parameter name portName Value Unit COM37 timeoutMs Description N.A Specify the port name to be checked for availability millisec Time in milliseconds to wait before failing the test. Table 10-117 WaitForPortToExist output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit Description N.A Error message 10.8.7 NFCDUT_RunTopLevelScript This test only applies to standalone/SoC type DUT. Qualcomm NFC EVK/EVB boards need to be initialized by a tcl script to initialize all the clocks and voltages on the board. This test runs the specified top level script. Table 10-118 NFCDUT_RunTopLevelScript input parameters Parameter name 80-Y0306-1 Rev. L Value Unit Description filename N.A Specify the path to the top level tcl script workingDirectory N.A The directory path of the tcl file MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 137 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter name TopLevelI2C_API Value Unit None_ScriptOpensPort, TopLevelI2C_API_FM, TopLevelI2C_API_NFC Dropdown Selection Description Select which type of port access API’s the script uses – NFC API’s, FM API’s or None(Script will open and close the correct ports) Table 10-119 NFCDUT_RunTopLevelScript output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.8 NFCDUT_Connect This test will try to open the port and connect to the DUT. Table 10-120 NFCDUT_Connect output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.9 NFCDUT_PatchFirmwareUsingPatchFile This test only applies to Standalone/SoC type DUT. This test will download the tcl based patch to the DUT. Table 10-121 NFCDUT_PatchFirmwareUsingPatchFile input parameters Parameter name Value FileName Unit NA Description Specify the file path to the patch file (signedtclpatch.out file) Table 10-122 NFCDUT_PatchFirmwareUsingPatchFile output parameters Parameter Name Lower Limit ErrorMessage Upper Limit Unit N.A Description Error message 10.8.10 InitializeNFCTester This test initializes the NFC Tester. This test has to be run before any other NFC Tester based tests. If using LitePoint IQNFC, please start the LitePoint SCPI server before running this test. Refer to Section 3.10 for LitePoint software installation. Supported Test Box: LitePoint IQNFC 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 138 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-123 InitializeNFCTester input parameters Parameter name Value Unit Description testerConfigFileName C:\Qualcomm\WCN\ ProdTests\ConfigFiles\ NFCTesterConfig.xml NA Provide the path to the tester config xml file for NFC NFCTesterResourceID NFCTester NA Specify the Equipment resource ID Table 10-124 NFCDUT_DetectTag output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.11 NFCTesterCalibrate NOTE: Calibration is required to capture the baseline (no DUT) return loss values for the NFC Tester. NFCTesterCalibrate should be run in the actual test setup/fixture but without the DUT. Since the procedure is sensitive to external electromagnetic interference and proximity to metal, it is recommended that the test be performed without any NFC coils, electronic equipment, metal object etc. in the close vicinity of the NFC Tester antenna. One feet or more of clearance is recommended. NOTE: Please run this test once manually without the DUT to set up the calibration. This test is disabled by default so it won’t run automatically every time the tree is run. The calibration file will be saved on the local machine with the name provided in the input parameters. The file path is always fixed and does not need to be specified. This same file name then needs to be loaded in the subsequent test ‘NFCTesterLoadCalibration’ which is run every time the tree is run. This test only needs to be rerun if the configuration of the test fixture changes. Supported Test Box: LitePoint IQNFC Pre-requisite Test: InitializeNFCTester has to be run before this test. Table 10-125 NFCTesterCalibrate input parameters Parameter name 80-Y0306-1 Rev. L Value Unit Description FileName NFCTesterCalibration1 NA FS 0 dBvpeak Field Strength to use for calibration FreqStart 12 MHz Start frequency for calibration FreqStep 0.005 MHz Frequency step/resolution for calibration FreqStop 16 MHz End frequency for calibration MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 139 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-126 NFCTesterCalibrate output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.12 NFCTesterLoadCalibration This test loads the previously saved calibration file. This test needs to be run before any resonance sweep or Resonance Find tests are run. Supported Test Box: LitePoint IQNFC Table 10-127 NFCTesterLoadCalibration input parameters Parameter name FileName Value Unit NFCTesterCalibration1 Description NA Specify the file name for the previously saved calibration file. Table 10-128 NFCTesterLoadCalibration output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.13 NFCDUT_CoreResetAndInit This test sends a core reset followed by a core init command to the chip. This applies to both SoC and phone type DUT. Table 10-129 NFCDUT_CoreResetAndInit output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.14 NFCDUT_ConfigureDUT This test sets up the DUT for a specific test. The test type and the NFC protocol type needs to be selected. Table 10-130 NFCDUT_ConfigureDUT input parameters Parameter name 80-Y0306-1 Rev. L Value Unit Description SelectTestType Frequency Sweep Test, Initiator test, Target test or P2P tests Dropdown selection Select one of the test type to set up the DUT for. P2P test is not supported currently. SelectNFCTech A, B, F, All Dropdown selection Selects the NFC technology type MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 140 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-131 NFCDUT_ConfigureDUT output parameters Parameter Name Lower Limit Upper Limit Unit ErrorMessage N.A Description Error message 10.8.15 ConfigureNFCTester This test sets up and configures the NFC tester. The NFC tester needs to be configured prior to the test being performed. The three types of tests supported are Frequency Sweep Test, Initiator Tests and Target Tests. P2P tests are not currently supported. Supported Test Box: LitePoint IQNFC Table 10-132 ConfigureNFCTester input parameters Parameter name Value Description SelectTestType Frequency Sweep Test, Initiator test, Target test or P2P tests Dropdown selection Select one of the test type to set up the NFC Tester for. P2P test is not supported currently. SelectNFCTech A, B, F, All Dropdown selection Selects the NFC technology type ResonatorType OFF, RES_13_56MHZ, RES_15MHZ, RES_16_1MHZ Dropdown selection Selector the coupling resonance for the NFC Tester s Specify the capture length for the NFC captures in seconds Dropdown selection Select the data rate for the NFC tester transceiver Dropdown selection Select the modulation depth for the NFC Tester Initiator mode CaptureLength DataRate RATE_R106, RATE_R212, RATE_R424 ModDepth 80-Y0306-1 Rev. L Unit FieldStrength Allowed range -30 to 24 dBVp Specifies the field strength for initiator mode in dBv peak. This field Strength will be used for Initiator mode tests and Resonance Sweep tests. FreqStart 12 MHz Starting frequency for Resonance Sweep tests FreqStop 16 MHz End Frequency for Resonance Sweep Tests FreqStep 0.005 MHz Frequency step/resolution for Resonance Tests MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 141 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-133 ConfigureNFCTester Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.15.1 Default Settings for Configure NFC Tester Table 10-134 Type A initiator test default tester configuration Parameter name Value SelectTestType INITIATOR TEST SelectNFCTech A ResonatorType RES_13_56MHZ, CaptureLength 0.1 DataRate RATE_R106 ModDepth M100 FieldStrength 6 FreqStart 12 (not applicable for this test mode) FreqStop 16 (not applicable for this test mode) FreqStep 0.005 (not applicable for this test mode) Table 10-135 Type B initiator test default tester configuration Parameter name Value SelectTestType INITIATOR TEST SelectNFCTech B ResonatorType RES_13_56MHZ, CaptureLength 0.1 DataRate RATE_R106 ModDepth M10 FieldStrength 6 FreqStart 12 (not applicable for this test mode) FreqStop 16 (not applicable for this test mode) FreqStep 0.005 (not applicable for this test mode) Table 10-136 Type F initiator test default tester configuration Parameter name 80-Y0306-1 Rev. L Value SelectTestType INITIATOR TEST SelectNFCTech F ResonatorType RES_13_56MHZ, CaptureLength 0.1 DataRate RATE_R212 ModDepth M100 MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 142 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter name Value FieldStrength 6 FreqStart 12 (not applicable for this test mode) FreqStop 16 (not applicable for this test mode) FreqStep 0.005 (not applicable for this test mode) Table 10-137 Type A target test default tester configuration Parameter name Value SelectTestType TARGET_TEST SelectNFCTech A ResonatorType RES_13_56MHZ, CaptureLength 0.1 DataRate RATE_R106 ModDepth M100 FieldStrength 6 FreqStart 12 (not applicable for this test mode) FreqStop 16 (not applicable for this test mode) FreqStep 0.005 (not applicable for this test mode) Table 10-138 Type B target test default tester configuration Parameter name Value SelectTestType TARGET_TEST SelectNFCTech B ResonatorType RES_13_56MHZ, CaptureLength 0.1 DataRate RATE_R106 ModDepth M10 FieldStrength 6 FreqStart 12 (not applicable for this test mode) FreqStop 16 (not applicable for this test mode) FreqStep 0.005 (not applicable for this test mode) Table 10-139 Type F target test default tester configuration Parameter name 80-Y0306-1 Rev. L Value SelectTestType TARGET_TEST SelectNFCTech F ResonatorType RES_13_56MHZ, CaptureLength 0.1 DataRate RATE_R212 ModDepth M100 FieldStrength 6 MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 143 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter name Value FreqStart 12 (not applicable for this test mode) FreqStop 16 (not applicable for this test mode) FreqStep 0.005 (not applicable for this test mode) Table 10-140 Resonance test default tester configuration Parameter name Value SelectTestType FREQ_SWEEP_TEST SelectNFCTech A (not applicable for this test mode) ResonatorType OFF CaptureLength 0.1 (not applicable for this test mode) DataRate RATE_R212 (not applicable for this test mode) ModDepth M100 (not applicable for this test mode) FieldStrength 0 FreqStart 12 FreqStop 16 FreqStep 0.005 10.8.16 NFCDUT_FindResonance This test is applicable to SoC/Standalone type DUT. The main purpose of this test is to find the cap code to calibrate the DUT matching for fixture specific impedance variations. This test finds the cap code corresponding to the required resonance frequency using the NFC Tester. Cap codes are written to specific NVM registers specified by the Payload Format parameter to tune the resonance frequency. Maximum and minimum possible Cap Codes are taken as input parameters. These values set the boundaries for the test to sweep the Cap Code. The test uses an iterative algorithm to find the cap code corresponding to the target resonance frequency within the specified tolerance. Initial estimation for the cap code is calculated by interpolating from the measured maximum and minimum possible resonance frequency. The algorithm halts and exits if any of the following situations are encountered: 1. Resonance frequency within the specified tolerance has been attained. 2. Maximum or Minimum Cap Code reached. The target frequency is probably out of range. 3. Minimum Cap Code resolution reached. Finer tuning using Cap Code is not possible. It is recommended that QSPR output parameter limits should be set on ‘FreqError’ parameter to enable a pass/fail condition for this test. The final achieved Cap Code will be copied to a QSPR global variable which will be used in the tests that follow. Supported Test Box: LitePoint IQNFC 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 144 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-141 NFCDUT_FindResonance input parameters Parameter name PayloadFormat Value Unit 00 00 00 02 00 82 02 00 TargetTuneFreq Description N.A This is the format for the NCI command to be used for setting the NVM. It contains the public register address for the Target Rx Cap NVM MHz The required Resonance frequency Tolerance 0.02 MHz Target tolerance for the achieved frequency. MinCapCode 00 N.A Minimum valid Cap Code MaxCapCode 1F N.A Maximum valid Cap Code Table 10-142 NFCDUT_FindResonance output parameters Parameter Name 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit Description CapCode N.A Final achieved Cap Code by the test AchievedFreq MHz Final Achieved frequency corresponding to the achieved Cap Code FreqError MHz Frequency difference between Target and actual achieved frequency. It is recommended that the FreqError test limits be set higher than the input parameter ‘Tolerance’. ErrorCode N.A Status code explaining the algorithm status: 0 = no error, 1 = generic error, 2 = max/min cap code reached, 3 = max iteration count of 8 reache d 4 = accuracy limited by cap code tuning resolution. ErrorMessage N.A Error message MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 145 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.8.17 NFCDUT_TuneCapNVM This test updates the NVM with the provided CapCode and the payload format. It uses the provided payload format to generate the NCI command string. The payload format also contains the public address for the NVM register. Table 10-143 NFCDUT_TuneCapNVM input parameters Parameter name Value PayloadFormat Unit 00 00 00 02 00 82 02 00 CapCode Description N.A This is the format for the NCI command to be used for setting the NVM. It contains the public register address for the Target Rx Cap NVM N.A The CapCode to be written. Table 10-144 NFCDUT_TuneCapNVM output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.18 InitiatorTest This test measures RF parametric of the DUT Initiator Tx signal. This test will capture and report details of the first poll signal within the capture length specified in the ConfigureNFCTester test. The ConfigureNFCTester and ConfigureDUT should be run every time before this test so that the DUT and the NFC tester have been configured to the correct NFC protocols, test type (initiator test) and other setup details. Supported Test Box: LitePoint IQNFC Pre-requisite setup tests: NFCDUT_ConfigureDUT (please select Initiator test for test type and the required NFC protocol type) ConfigureNFCTester (please select Initiator test for test type and the required NFC protocol type and other details to match the protocol type. Refer to section 10.8.15.1 for more details regarding default for each protocol) Test Scenario: The NFC Tester is configured to be a target and the DUT as an initiator. Table 10-145 InitiatorTest input parameters Parameter name 80-Y0306-1 Rev. L Value Unit Description NfcType NFCA, NFCB, NFCF, NFCP2P Dropdown selection Select the NFC protocol type. Only the selected NFC initiator signal parametric data will be reported. Other NFC types if present will be ignored. NFCP2P is currently not supported. RetryCount 3 N.A This is the number of times the test will retry, if it fails to find the Polling signal. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 146 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-146 InitiatorTest output parameters Parameter Name Lower Limit Upper Limit Unit Description Meas_FS mA/m This is the measured Field Strength in mA/m for the DUT Initiator field Meas_DataRate Kbps Measured data rate for the initiator signal Mod_Index % Modulation index. Applicable for NFC B and F Mod_Depth % Modulation depth. Applicable for NFC A Carrier_Freq_Offset Hz Measured Carrier frequency offset in Hz Rise_Time μs Applicable to NFC B and F Fall_Time μs Applicable to NFC B and F Rise_Overshoot % Applicable to NFC B and F Rise_Undershoot % Applicable to NFC B and F Fall_Overshoot % Applicable to NFC B and F Fall_Undershoot % Applicable to NFC B and F Bits Comma separated string of decoded bits CRC bool CRC check result t1 μs Applicable to NFC A t2 μs Applicable to NFC A t3 μs Applicable to NFC A t4 μs Applicable to NFC A t5 μs Applicable to NFC A ErrorMessage Error message 10.8.19 InitiatorRxTest This test checks the functionality of the Initiator Rx block. The test methodology is shown in the figure. The NFC tester responds to the polling from the DUT with SENS_RES. The DUT upon successfully receiving SENS_RES, will send the next Poll in accordance with the NFC protocol. This test checks for this second poll to verify that the DUT Initiator Rx is functional. The ConfigureNFCTester and ConfigureDUT should be run every time before this test so that the DUT and the NFC tester have been configured to the correct NFC protocols, test type (initiator test) and other setup details. 80-Y0306-1 Rev. L MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 147 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Supported Test Box: LitePoint IQNFC Pre-requisite setup tests: NFCDUT_ConfigureDUT (select Initiator test for test type and the required NFC protocol type) ConfigureNFCTester (select Initiator test for test type and the required NFC protocol type and other details to match the protocol type. Refer to section 10.8.15.1 for more details regarding default for each protocol) Test Scenario: The NFC Tester is configured to be a target and the DUT as an initiator. Table 10-147 Initiator Rx test input parameters Parameter name 80-Y0306-1 Rev. L Value Unit Description NfcType NFCA, NFCB, NFCF, NFCP2P Dropdown selection Select the NFC protocol type. Only the selected NFC initiator signal parametric data will be reported. Other NFC types if present will be ignored. NFCP2P is currently not supported. RetryCount 3 N.A This is the number of times the test will retry, if it fails to find the Polling signal. MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 148 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Table 10-148 Initiator Rx test output parameters Parameter Name Lower Limit Upper Limit Unit Description Poll1Bits Comma separated string of decoded bits for 1st POLL Poll2Bits Comma separated string of nd decoded bits for 2 POLL ErrorCode 0 0 0 if no error(Test passed) and 1 if any error(Test Failed) ErrorMessage Error message 10.8.20 TargetTest This test measures RF parametric of the DUT target Tx signal. This test will capture and report details of the first target response signal within the capture length specified in the ConfigureNFCTester test. The ConfigureNFCTester and ConfigureDUT should be run every time before this test so that the DUT and the NFC tester have been configured to the correct NFC protocols, test type (set as target test) and other setup details. Supported Test Box: LitePoint IQNFC Pre-requisite setup tests: NFCDUT_ConfigureDUT (please select target test for test type and the required NFC protocol type), ConfigureNFCTester (please select target test for test type and the required NFC protocol type and other details to match the protocol type. Refer to section 10.8.15.1 for more details regarding default for each protocol) Test Scenario: The NFC Tester is configured to be an initiator and the DUT as a target. Table 10-149 TargetTest input parameters Parameter name Value Unit Description NfcType NFCA, NFCB, NFCF, NFCP2P Dropdown selection Select the NFC protocol type. Only the selected NFC initiator signal parametric data will be reported. Other NFC types if present will be ignored. NFCP2P is currently not supported. RetryCount 3 N.A This is the number of times the test will retry, if it fails to find the Polling signal. Table 10-150 TargetTest output parameters Parameter Name 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit Description Meas_DataRate Kbps Measured data rate for the target response Frame_Delay_Time μs Frame delay time in sec Load_Modulation mA/m measured load modulation in volts MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 149 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description Parameter Name Lower Limit Upper Limit Unit Description Mod_Index % Not used Mod_Depth % Not used Volt_Peak_to_Peak mA/m Peak to peak measurement for the RF envelop SubCarrierFrequency kHz Measured sub carrier frequency for load modulation Bits Comma separated string of decoded data bits in the target response CRC bool ErrorMessage CRC check Error message 10.8.21 ResonanceTest This test measures resonance of the DUT NFC antenna system. This test will capture and report the Measured resonance frequency, the associated Q and the Bandwidth of the resonance network. The ConfigureNFCTester and ConfigureDUT should be run every time before this test so that the DUT and the NFC tester have been configured to the correct mode and test type (Frequency Sweep test). Supported Test Box: LitePoint IQNFC Pre-requisite setup tests: NFCDUT_ConfigureDUT (please select target test for test type. This will put the DUT in listen mode. Other modes like CoreResetAndInit can be selected depending on the user requirement) ConfigureNFCTester (please select FREQ_SWEEP_TEST for test type other details to match the protocol type. Refer to section 10.8.15.1 for more details regarding default for each protocol) The Frequency Start, Stop, and the FS Level set during the creation of the Calibration file should match the settings in ConfigureTester test. Loading the matching calibration file is required for this test. Test Scenario: The NFC Tester is configured for Resonance sweep and the DUT can be configured in a mode deemed appropriate by the user. Table 10-151 ResonanceTest output parameters Parameter Name 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit Description Freq MHz Measured resonance frequency in MHz. Calculated using geometric mean of the 3dB points Q N.A Q of the resonance network BW_3dB kHz 3dB Bandwidth ErrorMessage N.A Error message MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 150 Wireless Connectivity Tests User Guide Wireless Connectivity Test Description 10.8.22 Disconnect This test disconnects all the open ports. Table 10-152 Disconnect output parameters Parameter Name Lower Limit Upper Limit ErrorMessage Unit N.A Description Error message 10.8.23 Shutdown This test shuts down the test suite framework and releases all the resources. Table 10-153 Shutdown output parameters Parameter Name ErrorMessage 80-Y0306-1 Rev. L Lower Limit Upper Limit Unit N.A Description Error message MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION Confidential and Proprietary – Qualcomm Atheros, Inc. 151
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