80 Y0306 1 WIRELESS CONNECTIVITY S USER GUIDE

User Manual: Pdf

Open the PDF directly: View PDF PDF.
Page Count: 152

Download80 Y0306 1 WIRELESS CONNECTIVITY S USER GUIDE
Open PDF In BrowserView PDF
NOTICE REGARDING QUALCOMM ATHEROS, INC.

Effective June 2016, Qualcomm Atheros, Inc. (QCA) transferred certain of its assets, including
substantially all of its products and services, to its parent corporation, Qualcomm Technologies, Inc.
Qualcomm Technologies, Inc. is a wholly-owned subsidiary of Qualcomm Incorporated. Accordingly,
references in this document to Qualcomm Atheros, Inc., Qualcomm Atheros, Atheros, QCA or similar
references, should properly reference, and shall be read to reference, Qualcomm Technologies, Inc.

Wireless Connectivity Tests
User Guide
80-Y0306-1 Rev. L
October 1, 2014

Submit technical questions at:
https://support.cdmatech.com

Confidential and Proprietary – Qualcomm Atheros, Inc.
NO PUBLIC DISCLOSURE PERMITTED: Please report postings of this document on public servers or websites to:
DocCtrlAgent@qualcomm.com.
Restricted Distribution: Not to be distributed to anyone who is not an employee of either Qualcomm or its subsidiaries without
the express approval of Qualcomm’s Configuration Management.
Not to be used, copied, reproduced, or modified in whole or in part, nor its contents revealed in any manner to others without the
express written permission of Qualcomm Atheros, Inc.
Qualcomm is a registered trademark of QUALCOMM Incorporated. Atheros is a registered trademark of Qualcomm Atheros,
Inc. MSM is a trademark of QUALCOMM Incorporated, registered in the United States and other countries. Android is a
trademark of Google Inc. Bluetooth word mark and logos are registered trademarks owned by Bluetooth SIG, Inc. All other
registered and unregistered trademarks are the property of QUALCOMM Incorporated, Qualcomm Atheros, Inc., or their
respective owners and used with permission. Registered marks owned by QUALCOMM Incorporated and Qualcomm Atheros,
Inc. are registered in the United States and may be registered in other countries.
This technical data may be subject to U.S. and international export, re-export, or transfer (“export”) laws. Diversion contrary to
U.S. and international law is strictly prohibited.

Qualcomm Atheros, Inc.
1700 Technology Drive
San Jose, CA 95110
U.S.A.
© 2012-2014 Qualcomm Atheros, Inc.

Revision history

80-Y0306-1 Rev. L

Revision

Date

A

April 2012

Initial Release

B

June 2012

Added BT Low Energy, WLAN AR6003, Agilent N4010 WLAN
support.

C

October 2012

WLAN802.11ac support with IQxel and NI PXI5644R, Agilent
N4010A BT support, Station calibration support with
connectivity test box, default WCNTesterConfig.xml for each
test equipment.

D

January 2013

FM digital audio support, BT IQxel support, Test equipment
options updated.

E

March 2013

BT LE IQxel support, BT LE CMW support, Test equipment
options updated

F

July 2013

G

October 2013

H

November 2013

J

March 2014

K

July 2014

L

September 2014

Description

Added BT and WLAN AnritsuMT8870A support
QSPR Bluetooth tests moved to BTTestSuite.
Added BT AR3002 QSPR tests
Added QCA6174 test support
Added WLAN MIMO test description
Added ANT test description
Added BT standalone support
Added section 2.1.3 for WLAN MIMO test setup.
Updated section 9.1.4 for BT standalone configuration.
Added BT signaling test support
Added NFC functional test support for SoC and FFA targets
Added description for NFC tests utilizing IQNFC
Added UDT support for BT DUT

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

2

Contents

1 Introduction.................................................................................................... 15
1.1 Purpose........................................................................................................................ 15
1.2 Scope........................................................................................................................... 15
1.3 Conventions ................................................................................................................ 15
1.4 Related documentation................................................................................................ 16
1.4.1 Qualcomm documents ..................................................................................... 16
1.5 Technical assistance .................................................................................................... 16
1.6 Acronyms .................................................................................................................... 17

2 Hardware Setup and Requirements ............................................................. 18
2.1 RF test setup................................................................................................................ 18
2.1.1 BT/WLAN/FM RF test setup .......................................................................... 18
2.1.2 ANT RF test setup ........................................................................................... 19
2.1.3 WLAN MIMO test setup ................................................................................. 20
2.1.4 NFC parametric test setup ............................................................................... 21
2.2 Station calibration ....................................................................................................... 21
2.2.1 BT/WLAN/FM station calibration setup ......................................................... 21
2.3 Test equipment ............................................................................................................ 22
2.3.1 Supported BT, WLAN, NFC and FM test box ................................................ 23
2.3.2 Supported power supply .................................................................................. 23
2.3.3 Supported signal generator for ANT ............................................................... 24
2.3.4 Supported spectrum analyzer for ANT ............................................................ 24
2.4 Station calibration test equipment ............................................................................... 25
2.4.1 Supported power meter for station calibration ................................................ 25
2.4.2 Supported signal generator for station calibration ........................................... 25

3 Software Installation ..................................................................................... 27
3.1 SW requirements......................................................................................................... 27
3.2 QDART for non-FFA setup ........................................................................................ 27
3.3 NI GPIB setup ............................................................................................................. 28
3.3.1 NI GPIB software setup ................................................................................... 28
3.3.2 NI GPIB driver setup ....................................................................................... 29
3.4 Android debug bridge installation .............................................................................. 30
3.5 LitePoint software for running .................................................................................... 31
3.6 Agilent N4010A software installation ........................................................................ 32
3.7 LitePoint IQxel wave files installation ....................................................................... 32
3.8 NI PXI5644R software installation ............................................................................. 33
3.9 Agilent N5182A software and waveform files installation (ANT
only) ........................................................................................................................... 34
80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

3

Wireless Connectivity Tests User Guide

Contents

3.10 LitePoint IQNFC Software ....................................................................................... 34

4 Station Calibration ......................................................................................... 35
4.1 Station calibration data file ......................................................................................... 35
4.1.1 BT/WLAN/FM RF test station calibration data file ........................................ 35
4.2 Station calibration instrument config file.................................................................... 35
4.3 Station calibration procedure ...................................................................................... 42
4.3.1 BT/WLAN/FM RF test station calibration procedure ..................................... 42
4.3.2 NFC RF test station calibration procedure ...................................................... 43

5 Test Matrix...................................................................................................... 45
5.1 Bluetooth non-signaling production test matrix.......................................................... 45
5.2 WLAN production SISO test matrix........................................................................... 46
5.3 WLAN production MIMO test matrix ........................................................................ 46
5.4 FM production test matrix .......................................................................................... 46
5.5 ANT production test matrix ........................................................................................ 47
5.6 WLAN WCN36x0 CLPC calibration ......................................................................... 47
5.7 Bluetooth signaling production test matrix ................................................................. 47
5.8 NFC production functional test matrix ....................................................................... 48
5.9 NFC reference test matrix ........................................................................................... 49

6 Chipsets Supported ...................................................................................... 51
7 Setup Configuration ...................................................................................... 52
7.1 Power supply configuration ........................................................................................ 52
7.2 Bluetooth non-signaling tester configuration .............................................................. 53
7.3 WLAN tester configuration (SISO only) .................................................................... 58
7.4 WLAN Tester Configuration (MIMO only) ............................................................... 61
7.5 FM tester configuration............................................................................................... 62
7.6 Bluetooth signaling tester configuration ..................................................................... 63
7.7 NFC tester configuration............................................................................................. 65

8 QSPR Test Trees ........................................................................................... 66
8.1 Bluetooth non-signaling + Bluetooth LE production test tree .................................... 66
8.2 WLAN production test trees ....................................................................................... 67
8.3 FM production test trees ............................................................................................. 69
8.4 ANT production test tree ............................................................................................ 70
8.5 Bluetooth signaling + Bluetooth LE production test tree ........................................... 70
8.6 NFC production functional test tree ............................................................................ 72
8.7 NFC production reference test tree ............................................................................. 73

9 Test Setup Details ......................................................................................... 75
9.1 Bluetooth initialization and de-initialization tests ...................................................... 75
9.1.1 Bluetooth initialization .................................................................................... 75
9.1.2 Bluetooth configuration file details ................................................................. 76
9.1.3 Bluetooth de-initialization ............................................................................... 79
9.1.4 Bluetooth UART/USB test setup using BT DIAG BRIDGE .......................... 79
80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

4

Wireless Connectivity Tests User Guide

Contents

9.1.5 Bluetooth User Defined Transport (UDT) test setup using BT DIAG BRIDGE
.................................................................................................................................. 82
9.1.6 Additional configuration for remote DUT using User Defined Transport and
BT DIAG BRIDGE on remote PC. .......................................................................... 84
9.2 WLAN setup and initialization tests ........................................................................... 84
9.2.1 WLAN initialization ........................................................................................ 84
9.2.2 WLAN de-initialization ................................................................................... 86
9.3 FM setup and initialization tests ................................................................................. 87
9.3.1 FM initialization .............................................................................................. 87
9.3.2 FM RX initialization ........................................................................................ 88
9.3.3 FM TX initialization ........................................................................................ 89
9.3.4 FM de-initialization ......................................................................................... 89
9.4 ANT setup and initialization tests ............................................................................... 90
9.4.1 ANT initialization ............................................................................................ 90
9.4.2 ANT De-initialization ...................................................................................... 90
9.5 NFC initialization and deinitialization ........................................................................ 91
9.5.1 NFC setup config ............................................................................................. 91
9.5.2 NFC DUT configuration file details ................................................................ 91
9.5.3 NFC DUT Initialization ................................................................................... 93
9.5.4 NFC de-initialization ....................................................................................... 94

10 Wireless Connectivity Test Description .................................................... 95
10.1 Bluetooth non-signaling production test description ................................................ 95
10.1.1 Set Bluetooth ChipID .................................................................................... 95
10.1.2 BTDUT_FFA_DisableLegacyLogMode ....................................................... 95
10.1.3 Setup DUT for GFSK and EDR transmit tests .............................................. 96
10.1.4 Setup DUT for LE transmit tests ................................................................... 96
10.1.5 Measure Tx output power and initial carrier frequency tolerance ................. 97
10.1.6 Measure GFSK modulation DeltaF2 and CarrierDrift................................... 97
10.1.7 Measure GFSK modulation DeltaF1 ............................................................. 98
10.1.8 Measure EDR modulation ............................................................................. 98
10.1.9 Measure LE Tx output power ........................................................................ 99
10.1.10 Measure LE modulation DeltaF1................................................................. 99
10.1.11 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate
................................................................................................................................ 100
10.1.12 Measure Rx sensitivity/max input ............................................................. 100
10.1.13 Measure LE Rx sensitivity/max input ....................................................... 101
10.1.14 Set BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST ....... 102
10.1.15 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 .................................. 102
10.2 WLAN production test description (SISO Only) .................................................... 103
10.2.1 SetUpDutTx ................................................................................................. 103
10.2.2 WlanTxEvmTest .......................................................................................... 103
10.2.3 WlanTxVerifySpectrumTest........................................................................ 104
10.2.4 WlanTxVerifyPowerTest ............................................................................. 105
10.2.5 WlanTxVerifyMaskTest .............................................................................. 106
10.2.6 WlanPerTest ................................................................................................ 106
10.2.7 WlanPerSweepTest ...................................................................................... 107
10.2.8 WlanSendRxPacketsTest ............................................................................. 108
10.3 WLAN production test description (MIMO or SISO) ............................................ 109

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

5

Wireless Connectivity Tests User Guide

Contents

10.3.1 SetUpDutTxDetails...................................................................................... 109
10.3.2 WlanTxEvmTest_NxN ................................................................................ 110
10.3.3 WlanTxVerifyPowerTest_NxN ................................................................... 111
10.3.4 MeasureMask_NxN ..................................................................................... 112
10.3.5 MeasureSpectrum_NxN .............................................................................. 113
10.3.6 WlanPerTest_NxN ....................................................................................... 114
10.3.7 WlanPerSweepTest_NxN ............................................................................ 115
10.3.8 WlanSendRxPacketsTest_NxN ................................................................... 116
10.4 FM production test description ............................................................................... 116
10.4.1 FM RX tests ................................................................................................. 116
10.4.2 FM TX tests ................................................................................................. 122
10.5 ANT production test description ............................................................................. 123
10.5.1 Transmit channel power .............................................................................. 123
10.5.2 Receive sensitivity ....................................................................................... 125
10.6 Bluetooth signaling production test description...................................................... 126
10.6.1 BTDUT_FFA_DisableLegacyLogMode ..................................................... 126
10.6.2 BTDUT_EnableBT_DUTMode .................................................................. 126
10.6.3 Measure Tx GFSK power ............................................................................ 126
10.6.4 Measure Tx modulation characteristics ....................................................... 127
10.6.5 Measure GFSK initial carrier frequency tolerance ...................................... 128
10.6.6 Measure GFSK carrier frequency drift ........................................................ 128
10.6.7 Measure EDR relative transmit power......................................................... 129
10.6.8 Measure EDR modulation accuracy ............................................................ 129
10.6.9 Measure Rx sensitivity single slot packets .................................................. 130
10.6.10 Measure Rx sensitivity multiple slot packets ............................................ 131
10.6.11 Measure EDR Rx sensitivity...................................................................... 132
10.7 NFC production functional test description ............................................................ 134
10.7.1 NFCDUT_DetectTag ................................................................................... 134
10.7.2 NFCDUT_DetectField ................................................................................. 134
10.7.3 NFCDUT_SelfTest ...................................................................................... 135
10.8 NFC reference parametric test description.............................................................. 135
10.8.1 SetInstrumentConfigFile.............................................................................. 135
10.8.2 NFCDUT_SetConfigFile ............................................................................. 136
10.8.3 NFCDUT_Instantiate ................................................................................... 136
10.8.4 DUT_InitFramework ................................................................................... 136
10.8.5 EnableDUTPower ........................................................................................ 137
10.8.6 WaitForPortToExist ..................................................................................... 137
10.8.7 NFCDUT_RunTopLevelScript.................................................................... 137
10.8.8 NFCDUT_Connect ...................................................................................... 138
10.8.9 NFCDUT_PatchFirmwareUsingPatchFile .................................................. 138
10.8.10 InitializeNFCTester ................................................................................... 138
10.8.11 NFCTesterCalibrate ................................................................................... 139
10.8.12 NFCTesterLoadCalibration ....................................................................... 140
10.8.13 NFCDUT_CoreResetAndInit .................................................................... 140
10.8.14 NFCDUT_ConfigureDUT ......................................................................... 140
10.8.15 ConfigureNFCTester ................................................................................. 141
10.8.16 NFCDUT_FindResonance ......................................................................... 144
10.8.17 NFCDUT_TuneCapNVM ......................................................................... 146
10.8.18 InitiatorTest................................................................................................ 146
10.8.19 InitiatorRxTest ........................................................................................... 147
80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

6

Wireless Connectivity Tests User Guide

Contents

10.8.20 TargetTest .................................................................................................. 149
10.8.21 ResonanceTest ........................................................................................... 150
10.8.22 Disconnect ................................................................................................. 151
10.8.23 Shutdown ................................................................................................... 151

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

7

Wireless Connectivity Tests User Guide

Contents

Figures
Figure 2-1 BT/WLAN/FM RF test setup ................................................................................................... 18
Figure 2-2 ANT test setup.......................................................................................................................... 19
Figure 2-3 WLAN MIMO test setup.......................................................................................................... 20
Figure 2-4 NFC parametric test setup ......................................................................................................... 21
Figure 2-5 Station calibration setup ........................................................................................................... 22
Figure 3-1 Enable .NET Framework 4.0 Support on NI 488.2 for Windows Install ................................. 28
Figure 3-2 Signal generator supported by test solution ............................................................................. 29
Figure 3-3 NI GPIB hardware setup – step 2 ............................................................................................. 29
Figure 3-4 NI GPIB hardware setup – step 3 ............................................................................................. 30
Figure 3-5 Path system variable on environment variables ....................................................................... 30
Figure 3-6 Add ADB as part of the system path ........................................................................................ 31
Figure 3-7 Path system variable on environment variables ....................................................................... 32
Figure 3-8 LitePoint IQxel waveform location .......................................................................................... 33
Figure 3-9 Loading waveform files on Agilent N5182A ........................................................................... 34
Figure 4-1 Station calibration GPIB power meter configuration ............................................................... 36
Figure 4-2 Station calibration VISA power meter configuration............................................................... 37
Figure 4-3 Station calibration SG resource ID ........................................................................................... 37
Figure 4-4 Station calibration LP IQ2010 as signal generator ................................................................... 38
Figure 4-5 Station calibration R&S CMW500 as signal generator ............................................................ 39
Figure 4-6 Station calibration Agilent N4010A as signal generator .......................................................... 40
Figure 4-7 Station calibration LP IQxel as signal generator ...................................................................... 40
Figure 4-8 Station calibration NI PXI5644R as signal generator .............................................................. 41
Figure 4-9 Station calibration LP IQxel as signal generator ...................................................................... 42
Figure 4-10 Station calibration test tree ..................................................................................................... 43
Figure 4-11 NFC tester calibration test ....................................................................................................... 44
Figure 7-1 Power supply section on WCNTesterConfig.xml .................................................................... 53
Figure 7-2 Bluetooth LitePoint config section in WCNTesterConfig.xml ................................................ 54
Figure 7-3 BT R&S CMW500 GPIB settings in WCNTesterConfig.xml ................................................. 54
Figure 7-4 Bluetooth waveform address section in WCNTesterConfig.xml ............................................. 55
Figure 7-5 BT AgilentN4010A VISA settings in WCNTesterConfig.xml ................................................ 55
Figure 7-6 BT LitePoint IQxel settings in WCNTesterConfig.xml ........................................................... 56
Figure 7-7 BT Anritsu MT8870A settings in WCNTesterConfig.xml ...................................................... 57
Figure 7-8 WLAN LitePoint test box section on WCNTesterConfig.xml ................................................. 59
Figure 7-9 R&S CMW WLAN section on WCNTesterConfig.xml .......................................................... 59
Figure 7-10 Agilent N4010A WLAN section on WCNTesterConfig.xml ................................................ 59
Figure 7-11 NI PXI5644R WLAN section on WCNTesterConfig.xml ..................................................... 60
Figure 7-12 OptionalConfigInfoList section for Anritsu MT8870A on WCNTesterConfig.xml .............. 60
Figure 7-13 ITcpClient section for Anritsu MT8870A on WCNTesterConfig.xml .................................. 60
Figure 7-14 WLAN LitePoint Test Box section (MIMO only) on WCNTesterConfig.xml ...................... 61
Figure 7-15 NI PXI5644R WLAN Section (MIMO only) on WCNTesterConfig.xml ............................. 62
Figure 7-16 FM test box section on WCNTesterConfig.xml .................................................................... 63
Figure 7-17 Sample R&S CBT config section in WCNTesterConfig.xml ................................................. 64
80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

8

Wireless Connectivity Tests User Guide

Contents

Figure 7-18 AnritsuMT8852B config section in WCNTesterConfig.xml .................................................. 64
Figure 7-19 LitePoint IQNFC config section in NFCTesterConfig.xml .................................................... 65
Figure 8-1 Sample Bluetooth production test tree ..................................................................................... 66
Figure 8-2 Sample WLAN production test tree part I................................................................................ 67
Figure 8-3 Sample WLAN production test tree part II .............................................................................. 68
Figure 8-4 Sample FM production test tree ............................................................................................... 69
Figure 8-5 Sample ANT production test tree ............................................................................................. 70
Figure 8-6 Sample Bluetooth signaling test tree ......................................................................................... 71
Figure 8-7 NFC Functional test tree ........................................................................................................... 72
Figure 8-8 Sample NFC Reference Tree..................................................................................................... 74
Figure 9-1 Sample Bluetooth test initialization ......................................................................................... 75
Figure 9-2 Bluetooth DUT configuration file ............................................................................................ 77
Figure 9-3 Sample Bluetooth de-initialization ........................................................................................... 79
Figure 9-4 BT Diag Bridge - opening QPST ............................................................................................. 79
Figure 9-5 BT Diag Bridge - setup QPST IP address and port number ..................................................... 80
Figure 9-6 Running BT DIAG BRIDGE ................................................................................................... 81
Figure 9-7 BT Diag Bridge - QPST comport listing .................................................................................. 82
Figure 9-8 Connect DUT using DUT type and connection options............................................................ 83
Figure 9-9 Input parameters of ConnectDutUsingDutType ........................................................................ 83
Figure 9-10 Remote PC connects to DUT using UDT ............................................................................... 84
Figure 9-11 Sample WLAN test initialization ........................................................................................... 85
Figure 9-12 Sample WLAN test initialization with user Transport DLL .................................................. 85
Figure 9-13 Sample WLAN test de-initialization ...................................................................................... 86
Figure 9-14 Sample FM tester initialization .............................................................................................. 87
Figure 9-15 Sample FM RX initialization ................................................................................................. 88
Figure 9-16 Sample FM TX initialization.................................................................................................. 89
Figure 9-17 Sample FM de-initialization ................................................................................................... 89
Figure 9-18 Sample ANT test initialization ............................................................................................... 90
Figure 9-19 Sample ANT test de-initialization .......................................................................................... 90
Figure 9-20 NFC DUT Configuration file .................................................................................................. 92

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

9

Wireless Connectivity Tests User Guide

Contents

Tables
Table 1-1 References ................................................................................................................................. 16
Table 1-2 Acronyms .................................................................................................................................. 17
Table 2-1 Test equipment needed for BT, WLAN and FM tests ............................................................... 22
Table 2-2 Test box supported by test solution ........................................................................................... 23
Table 2-3 Power supply supported by test solution ................................................................................... 24
Table 2-4 Signal generator supported by ANT solutions........................................................................... 24
Table 2-5 Spectrum analyzer supported by ANT solutions ....................................................................... 24
Table 2-6 Test equipment needed for station calibration ........................................................................... 25
Table 2-7 Power meter supported by test solution ..................................................................................... 25
Table 2-8 Signal generator supported by test solution ............................................................................... 25
Table 5-1 Bluetooth non-signaling production test matrix ........................................................................ 45
Table 5-2 WLAN production test matrix ................................................................................................... 46
Table 5-3 WLAN production test matrix ................................................................................................... 46
Table 5-4 FM production test matrix ......................................................................................................... 46
Table 5-5 ANT production test matrix ....................................................................................................... 47
Table 5-6 Bluetooth signaling production test matrix................................................................................. 47
Table 5-7 NFC production functional tests ................................................................................................. 48
Table 5-8 NFC functional test tree nodes ................................................................................................... 48
Table 5-9 NFC reference tests .................................................................................................................... 49
Table 5-10 NFC reference test tree nodes ................................................................................................... 49
Table 6-1 Supported chipsets ..................................................................................................................... 51
Table 9-1 Initialize Wlan tester parameters ............................................................................................... 85
Table 9-2 Connect DUT parameters .......................................................................................................... 86
Table 9-3 Connect DUT with user transport DLL parameters .................................................................. 86
Table 9-4 WLAN DUT load ...................................................................................................................... 86
Table 10-1 Set Bluetooth ChipID input parameters................................................................................... 95
Table 10-2 Set Bluetooth ChipID output parameters................................................................................. 95
Table 10-3 BTDUT_FFA_DisableLegacyLogMode input parameters ...................................................... 95
Table 10-4 BTDUT_FFA_DisableLegacyLogMode output parameters ................................................... 96
Table 10-5 BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST input parameters ............... 96
Table 10-6 BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST output parameters ............. 96
Table 10-7 BTDUT_LE_TX_Command input parameters ....................................................................... 96
Table 10-8 BTDUT_LE_TX_Command output parameters ..................................................................... 97
Table 10-9 Measure Tx output power and initial carrier frequency tolerance input parameters ............... 97
Table 10-10 Measure output power and initial carrier frequency tolerance output parameters................. 97
Table 10-11 Measure GFSK modulation DeltaF2 and CarrierDrift input parameters ............................... 97
Table 10-12 Measure GFSK modulation DeltaF2 and CarrierDrift output parameters ............................. 98
Table 10-13 Measure GFSK modulation DeltaF1 input parameters.......................................................... 98
Table 10-14 Measure GFSK modulation DeltaF1 output parameters........................................................ 98
Table 10-15 Measure EDR modulation input parameters.......................................................................... 98
Table 10-16 Measure EDR modulation output parameters........................................................................ 98
Table 10-17 Measure LE Tx output power input parameters .................................................................... 99
80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

10

Wireless Connectivity Tests User Guide

Contents

Table 10-18 Measure LE Tx output power output parameters .................................................................. 99
Table 10-19 Measure LE modulation DeltaF1 input parameters ............................................................... 99
Table 10-20 Measure LE modulation DeltaF1 output parameters ............................................................. 99
Table 10-21 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate input parameters
.................................................................................................................................................................. 100
Table 10-22 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and MaxDriftRate output
parameters ................................................................................................................................................. 100
Table 10-23 Measure Rx sensitivity input parameters............................................................................. 100
Table 10-24 Measure RxSensitivity output parameters ........................................................................... 101
Table 10-25 Measure LE Rx sensitivity input parameters ....................................................................... 101
Table 10-26 Measure LE Rx sensitivity output parameters ..................................................................... 102
Table 10-27 BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST input parameters ........... 102
Table 10-28 BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST output parameters ......... 102
Table10-29 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 input parameters.................................. 103
Table 10-30 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 output parameters............................... 103
Table 10-31 SetUpDutTx parameters ...................................................................................................... 103
Table 10-32 TX EVM test input parameters ............................................................................................ 104
Table 10-33 TX EVM test output parameters .......................................................................................... 104
Table 10-34 TxVerifySpectrum test input parameters ............................................................................. 104
Table 10-35 TxVerifySpectrum test output parameters ........................................................................... 105
Table 10-36 Tx verify power test input parameters ................................................................................. 105
Table 10-37 TX verify power test output parameters .............................................................................. 105
Table 10-38 TxVerifyMask test input parameters ................................................................................... 106
Table 10-39 TxVerifyMask output parameters ........................................................................................ 106
Table 10-40 WLAN Per test input parameters......................................................................................... 107
Table 10-41 WLAN Per test output parameters ....................................................................................... 107
Table 10-42 WLAN PerSweepTest input parameters .............................................................................. 107
Table 10-43 WLAN PerSweepTest output parameters ............................................................................ 108
Table 10-44 WLAN PerSweepTest input parameters .............................................................................. 108
Table 10-45 SetUpDutTxDetails parameters ........................................................................................... 109
Table 10-46 TX EVM Test NxN input parameters.................................................................................. 110
Table 10-47 TX EVM Test NxN output parameters ................................................................................ 111
Table 10-48 Tx verify power test NxN input parameters ........................................................................ 111
Table 10-49 TX verify power Test NxN output parameters .................................................................... 111
Table 10-50 MeasureMask_NxN test input parameters........................................................................... 112
Table 10-51 MeasureMask_NxN test output parameters......................................................................... 112
Table 10-52 MeasureSpectrum_NxN test input parameters .................................................................... 113
Table 10-53 MeasureSpectrum_NxN test output parameters .................................................................. 113
Table 10-54 WLAN Per NxN test input parameters ................................................................................ 114
Table 10-55 WLAN Per NxN test output parameters .............................................................................. 114
Table 10-56 WLAN PerSweepTest_NxN input parameters .................................................................... 115
Table 10-57 WLAN PerSweepTest_NxN output parameters .................................................................. 115
Table 10-58 WLAN PerSweepTest input parameters .............................................................................. 116
Table 10-59 Sensitivity GONOGO input parameters .............................................................................. 116

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

11

Wireless Connectivity Tests User Guide

Contents

Table 10-60 Sensitivity GONOGO output parameters ............................................................................ 117
Table 10-61 Sensitivity characterization input parameters ...................................................................... 117
Table 10-62 Sensitivity characterization output parameters .................................................................... 117
Table 10-63 Max SNR input parameters ................................................................................................. 118
Table 10-64 Max SNR output parameters ............................................................................................... 118
Table 10-65 Intermediate SNR input parameters..................................................................................... 119
Table 10-66 Intermediate SNR output parameters................................................................................... 119
Table 10-67 THD input parameters ......................................................................................................... 120
Table 10-68 THD output parameters ....................................................................................................... 120
Table 10-69 RDS BLER input parameters .............................................................................................. 121
Table 10-70 RDS BLER output parameters ............................................................................................ 121
Table 10-71 TX output power input parameters ...................................................................................... 122
Table 10-72 TX output power output parameters .................................................................................... 122
Table 10-73 FM deviation input parameters ............................................................................................ 122
Table 10-74 FM deviation output parameters .......................................................................................... 122
Table 10-75 TX stereo audio SNR input parameters ............................................................................... 123
Table 10-76 TX stereo audio SNR output parameters ............................................................................. 123
Table 10-77 TX channel power input parameters .................................................................................... 123
Table 10-78 TX channel power output parameters .................................................................................. 124
Table 10-79 Receive sensitivity input parameters ................................................................................... 125
Table 10-80 Receive sensitivity output parameters ................................................................................. 125
Table 10-81 BTDUT_FFA_DisableLegacyLogMode input parameters .................................................. 126
Table 10-82 BTDUT_FFA_DisableLegacyLogMode output parameters ............................................... 126
Table 10-83 TRM/CA/01 TX Power GFSK input parameters ................................................................. 127
Table 10-84 TRM/CA/01 TX Power GFSK output parameters ............................................................... 127
Table 10-85 TRM/CA/07 modulation characteristics input parameters .................................................. 127
Table 10-86 TRM/CA/07 modulation characteristics output parameters ................................................ 127
Table 10-87 TRM/CA/08 initial carrier frequency tolerance input parameters ....................................... 128
Table 10-88 TRM/CA/08 initial carrier frequency tolerance output parameters ..................................... 128
Table 10-89 TRM/CA/09 carrier frequency drift input parameters ......................................................... 128
Table 10-90 TRM/CA/09 Carrier Frequency Drift output parameters .................................................... 129
Table 10-91 TRM/CA/10/C EDRRelativeTransmitPower input parameters .......................................... 129
Table 10-92 TRM/CA/10/C EDRRelativeTransmitPower output parameters ........................................ 129
Table 10-93 TRM/CA/11 EDR modulation accuracy input parameters .................................................. 130
Table 10-94 TRM/CA/11 EDR modulation accuracy output parameters ................................................ 130
Table 10-95 RCV/CA/01 sensitivity – single slot packets input parameters ........................................... 130
Table 10-96 RCV/CA/01 sensitivity – single slot packets output parameters ......................................... 131
Table 10-97 RCV/CA/02 sensitivity – multiple slot packets input parameters ....................................... 131
Table 10-98 RCV/CA/02 Sensitivity – multiple slot packets output parameters ..................................... 132
Table 10-99 RCV/CA/07 EDR sensitivity input parameters ................................................................... 132
Table 10-100 RCV/CA/07 EDR sensitivity output parameters ............................................................... 133
Table 10-101 NFCDUT_DetectTag input parameters .............................................................................. 134
Table 10-102 NFCDUT_DetectTag output parameters ............................................................................ 134
Table 10-103 NFCDUT_DetectField input parameters ............................................................................ 134

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

12

Wireless Connectivity Tests User Guide

Contents

Table 10-104 NFCDUT_DetectField output parameters .......................................................................... 134
Table 10-105 NFCDUT_SelfTest input parameters ................................................................................. 135
Table 10-106 NFCDUT_SelfTest output parameters ............................................................................... 135
Table 10-107 SetInstrumentConfigFile input parameters ......................................................................... 135
Table 10-108 SetInstrumentConfigFile output parameters ....................................................................... 135
Table 10-109 NFCDUT_SetConfigFile input parameters ........................................................................ 136
Table 10-110 NFCDUT_SetCOnfigFile output parameters ..................................................................... 136
Table 10-111 NFCDUT_Instantiate output parameters ............................................................................ 136
Table 10-112 DUT_InitFramework input parameters .............................................................................. 136
Table 10-113 InitFramework output parameters....................................................................................... 136
Table 10-114 EnableDUTPower input parameters ................................................................................... 137
Table 10-115 EnableDUTPower output parameters ................................................................................. 137
Table 10-116 WaitForPortToExist input parameters ................................................................................ 137
Table 10-117 WaitForPortToExist output parameters .............................................................................. 137
Table 10-118 NFCDUT_RunTopLevelScript input parameters ............................................................... 137
Table 10-119 NFCDUT_RunTopLevelScript output parameters ............................................................. 138
Table 10-120 NFCDUT_Connect output parameters ............................................................................... 138
Table 10-121 NFCDUT_PatchFirmwareUsingPatchFile input parameters.............................................. 138
Table 10-122 NFCDUT_PatchFirmwareUsingPatchFile output parameters............................................ 138
Table 10-123 InitializeNFCTester input parameters................................................................................. 139
Table 10-124 NFCDUT_DetectTag output parameters ............................................................................ 139
Table 10-125 NFCTesterCalibrate input parameters ................................................................................ 139
Table 10-126 NFCTesterCalibrate output parameters .............................................................................. 140
Table 10-127 NFCTesterLoadCalibration input parameters..................................................................... 140
Table 10-128 NFCTesterLoadCalibration output parameters................................................................... 140
Table 10-129 NFCDUT_CoreResetAndInit output parameters ............................................................... 140
Table 10-130 NFCDUT_ConfigureDUT input parameters ...................................................................... 140
Table 10-131 NFCDUT_ConfigureDUT output parameters .................................................................... 141
Table 10-132 ConfigureNFCTester input parameters............................................................................... 141
Table 10-133 ConfigureNFCTester .......................................................................................................... 142
Table 10-134 Type A initiator test default tester configuration ................................................................ 142
Table 10-135 Type B initiator test default tester configuration ................................................................ 142
Table 10-136 Type F initiator test default tester configuration ................................................................ 142
Table 10-137 Type A target test default tester configuration ................................................................... 143
Table 10-138 Type B target test default tester configuration ................................................................... 143
Table 10-139 Type F target test default tester configuration .................................................................... 143
Table 10-140 Resonance test default tester configuration ........................................................................ 144
Table 10-141 NFCDUT_FindResonance input parameters ...................................................................... 145
Table 10-142 NFCDUT_FindResonance output parameters .................................................................... 145
Table 10-143 NFCDUT_TuneCapNVM input parameters....................................................................... 146
Table 10-144 NFCDUT_TuneCapNVM output parameters..................................................................... 146
Table 10-145 InitiatorTest input parameters ............................................................................................. 146
Table 10-146 InitiatorTest output parameters ........................................................................................... 147
Table 10-147 Initiator Rx test input parameters ....................................................................................... 148

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

13

Wireless Connectivity Tests User Guide

Contents

Table 10-148 Initiator Rx test output parameters ..................................................................................... 149
Table 10-149 TargetTest input parameters ............................................................................................... 149
Table 10-150 TargetTest output parameters ............................................................................................. 149
Table 10-151 ResonanceTest output parameters ...................................................................................... 150
Table 10-152 Disconnect output parameters............................................................................................. 151
Table 10-153 Shutdown output parameters .............................................................................................. 151

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

14

1 Introduction

1.1 Purpose
This document provides the procedures to perform wireless connectivity non-signaling RF tests
and BT signaling tests using the Qualcomm® Sequence Profiling Resource (QSPR) and factory
test mode (FTM) commands.

1.2 Scope
This document is intended for use by test engineers and test equipment companies that need to
control Qualcomm connectivity chipsets that are mated with Qualcomm processors (MSM™ or
MDM or APQ) and standalone SoC based targets. This document contains non signaling tests for
WCN2243, WCN36x0, AR3002, AR6003, AR6005 and QCA6174 Qualcomm devices.

1.3 Conventions
Function declarations, function names, type declarations, and code samples appear in a different
font, e.g., #include.
Button and key names appear in bold font, e.g., click Save or press Enter.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

15

Wireless Connectivity Tests User Guide

Introduction

1.4 Related documentation
Reference documents, which may include Qualcomm, standards, and resource documents, are
listed in section 1.4.1.

1.4.1 Qualcomm documents
Table 1-1 References
Reference

Document

DCN

Qualcomm
Q1

Factory Test Mode Procedure for WLAN
RF Test (WCN131X/WCN3660/WCN3680)

80-WL300-18

Q2

Factory Test Mode Procedure for FM RF
Test

80-WL300-17

Q3

Factory Test Mode Procedure for Bluetooth
RF Test

80-WL024-12

Q4

Qualcomm Sequence Profiling Resource
QSPR User guide

80-VB987-1

Q5

Qualcomm Sequence Profiling Resource
(QSPR) Tester Configuration User Guide

80-VB987-3

Q6

Qualcomm Product Support Tool (QPST)
2.7 User Guide

80-V1400-3

Q7

How to Install Qualcomm 64-Bit Windows 7
USB Host Driver User Guide

80-N2328-2

Q8

Application Note: Software Glossary for
Customers

CL93-V3077-1

Q9

WCN36x0 Training WLAN Tx CLPC
Characterization Using QSPR Tools

80-WL300-25

Q10

QCA61X4, QCA937X, QCA65X4 QDART
USER GUIDE

80-WL400-24

R1

IEEE

IEEE Std 802.11-2007

R2

IEEE

IEEE Std_80211N_2009

R3

Bluetooth SIG

RF-PHY.TS/4.0.1

R4

Bluetooth SIG

BLUETOOTH SPECIFICATION
Version 4.0

References

1.5 Technical assistance
For assistance or clarification on information in this guide, submit a case to Qualcomm CDMA
Technologies at https://support.cdmatech.com/.
If you do not have access to the CDMATech Support Service website, register for access or send
email to support.cdmatech@qualcomm.com.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

16

Wireless Connectivity Tests User Guide

Introduction

1.6 Acronyms
The following terms are used in this document. Some elements are identified by more than one
term.
Table 1-2 Acronyms
Term

80-Y0306-1 Rev. L

Definition

APQ

Applications-Only Processor QUALCOMM

ARB

Arbitrary

BER

Bit Error Rate

BR

Basic Rate

BT

Bluetooth

CW

Continuous Wave

DPSK

Differential Phase Shift Keying

DQPSK

Differential Quaternary Phase Shift Keying

DUT

Device Under Test

EDR

Enhanced Data Rate

EUT

Equipment Under Test

EVM

Error Vector Magnitude

FFA

Form Factor Accurate

FTM

Field Test Mode

GFSK

Gaussian Frequency Shift Keying

GPIB

General Purpose Interface Bus

LE

Low Energy

MDM

Mobile Data Modem

MIMO

Multiple-Input and Multiple Output

MSM

Mobile Station Modem

NFC

Near Field Communication

PER

Packet Error Rate

QSPR

Qualcomm Sequence Profiling Resource

RF

Radio Frequency

R&S

Rohde & Schwarz

SG

Signal Generator

SoC

System on a Chipset

SRS

System Requirement Specification

SW

Software

UART

Universal Asynchronous Receiver-Transmitter

UDT

User Defined Transport

USB

Universal Serial Bus

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

17

2 Hardware Setup and Requirements

This section covers the hardware installation pieces required for BT, WLAN and FM production
tests for connectivity chipsets that are mated with Qualcomm processors (MSM or MDM or
APQ) or standalone SoC connectivity chipsets. The test solutions utilize FTM features integrated
on Qualcomm processors to communicate with connectivity chipsets for testing.

2.1 RF test setup
2.1.1 BT/WLAN/FM RF test setup
Figure 2-1 shows the test setup needed for performing BT, WLAN and FM RF functional tests.
DUT in Figure 2-1 refers to an FFA device that contains Qualcomm processors (MSM or MDM
or APQ) mated with supported connectivity chipset.
BT/WLAN/FM Test setup
USB

Power supply
1
2
Default GPIB Addr:5
5

USB - GPIB
FM Audio
Digitizer

USB

`

Default: Litepoint
AIM Module

USB/
GPIB

RIGHT IN
LEFT IN

DUT

MSM or
MDM or
APQ

4
BT/WLAN/FM WLAN/BT
Tester
RF Port
FM port
Default: Litepoint IQ2010

Connectivity
Chipset

Battery connector
3

Recommended
path loss 3dB to
7dB(max)

RF Combiner

FM Headset
Antenna port

FM PWB
Antenna
port

BT/WLAN RF port

Figure 2-1 BT/WLAN/FM RF test setup
The following cables are required in the test setup:
1. A Power supply or battery emulator cable (cable#1)
2. An USB cable (cable #2)
3. A RF cable for FM headset and PWB paths using RF combiner from DUT to test box (cable
#3)
4. A RF cable for BT and WLAN path from DUT to test box (cable #4)

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

18

Wireless Connectivity Tests User Guide

Hardware Setup and Requirements

5. A Stereo to L-R/RCA audio cable from DUT stereo audio jack to FM audio interface module
(cable #5). Note: the FM Audio Digitizer and its related audio and USB cabling is not
required when FM audio is digitally captured directly from the DUT.

2.1.2 ANT RF test setup
ANT RF functional tests are performed using the test setup shown below.
ANT Test setup
USB

Power supply
1
2
Default GPIB Addr:5

USB - GPIB
USB – GPIB

`

Spectrum
analyzer
RF Input

USB/
GPIB

3

DUT

Default: Agilent E4402B
Signal
Generator

RF Combiner

MSM or
MDM or
APQ

Connectivity
Chipset

RF Output
Default: Agilent E4443A

Battery connector
ANT/BT/WLAN RF
port

Figure 2-2 ANT test setup
The following cables are required in the test setup:
6. A Power supply or battery emulator cable
7. An USB cable
8. A RF cable for ANT path using RF directional coupler from DUT to ARB signal generator
and spectrum analyzer

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

19

Wireless Connectivity Tests User Guide

Hardware Setup and Requirements

2.1.3 WLAN MIMO test setup
While not recommended for production, full WLAN MIMO characterization can be done with
multi-chain setup show below.
WLAN MIMO Test setup
USB

Power supply
1
2
Default GPIB Addr:5

USB - GPIB
USB – GPIB

`

USB/
GPIB

DUT
WLAN 2 chain
MIMO Tester WLAN RF
Ports

3
MSM or
MDM or
APQ

Connectivity
Chipset

Default: Litepoint IQXel 2x2

Battery connector

WLAN MIMO chain
connections

Figure 2-3 WLAN MIMO test setup
The following cables are required in the test setup:
9. A Power supply or battery emulator cable
10. An USB cable (for standalone PCIe DUT, the DUT would be directly connected to the PC via
a PCIe extender connection)
11. Two RF cables for both chains of the WLAN path from DUT to test box (cables #3)

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

20

Wireless Connectivity Tests User Guide

Hardware Setup and Requirements

2.1.4 NFC parametric test setup
Figure 2-4 shows the test setup needed for performing NFC parametric tests. DUT in Figure 2-4
refers to an FFA device that contains Qualcomm processors (MSM or MDM or APQ) mated with
supported NFC connectivity chipset. NFC Testing is performed in a radiated fashion. The NFC
DUT antenna and the NFC Tester antenna should be placed in close proximity, similar to a NFC
tag.

Figure 2-4 NFC parametric test setup

2.2 Station calibration
2.2.1 BT/WLAN/FM station calibration setup
Setup in Figure 2-5 is utilized to perform station calibration on various RF paths.
The following paths are required to be calibrated for performing BT, WLAN, FM and ANT tests:


A Bluetooth path (default path name = BTPath)



A WLAN path (default path name = WCD)



A FM headset path (default path name = FM_HS_RX)



A FM pwb path (default path name = FM_PWB_RXTX)



An ANT Transmit path (transmit path name = SAPath)



An ANT Receive path (default path name = ARBPath)

A signal generator is connected on the DUT end in order to calibrate the path losses on the above
listed RF paths from DUT to power meter.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

21

Wireless Connectivity Tests User Guide

Hardware Setup and Requirements

BT/WLAN/FM Station Calibration setup
USB - GPIB
USB

`

Signal generator
Default GPIB Addr: 19

RF out

Power meter
RF in
Default GPIB Addr: 9

Figure 2-5 Station calibration setup

2.3 Test equipment
The list of test equipment needed to perform BT, WLAN and FM tests are mentioned in
Table 2-1. If test equipment is GPIB controlled, GPIB address is configurable based on an
external configuration file. Please follow the instructions in Chapter 7 to update the GPIB address
for respective test equipment.
Table 2-1 Test equipment needed for BT, WLAN and FM tests
Manufacturer / Model

80-Y0306-1 Rev. L

Description

Quantity

Default GPIB
Address

Supported test box

Refer to 2.3.1 for supported connectivity test
box

1

20 (if GPIB
based)

Supported power
supply

Refer to section 2.3.2for supported power
supply

1

5

Supported signal
generator for ANT

Refer to 2.3.3 for supported signal generator for
ANT

1

19

Supported spectrum
analyzer for ANT

Refer to 2.3.4 for supported spectrum analyzer
for ANT

1

18

Supported BT signaling
test box

Refer to 2.3.1 for supported BT signaling test
box

1

27

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

22

Wireless Connectivity Tests User Guide

Hardware Setup and Requirements

2.3.1 Supported BT, WLAN, NFC and FM test box
To perform connectivity tests one of supported test boxes on Table 2-2 should be used.
Table 2-2 Test box supported by test solution
Manufacturer / Model

Description

Required Options

LitePoint IQ2010

Non-signaling
connectivity test box
(WLAN(SISO)/BT/FM)

FM Software License: 0300-20XX-002
FM AUDIO Analysis Option: 0300-20XX-003
Refer to section 3.3 for SW details

R&S CMW500

Non-signaling
connectivity test box
(WLAN(SISO)/BT no
FM)

BT/WLAN RF generator (prerequisite: CMW-B110A)
BT Measurements (CMW-KM610)
BT Low Energy (CMW-KM611)
WLAN ABG RF analyzer (CMW-KM650)
WLAN N RF analyzer (CMW-KM651)

Agilent N4010A

Non-signaling
connectivity test box
(WLAN(SISO)/BT no
FM)

2.4 GHz and 5 GHz WLAN Tx/Rx analysis: N4010A-103
802.11n MIMO modulation analysis: N4010A-108
Bluetooth: N4010A-101
Bluetooth EDR – transmit and receive:N4010A-105
Bluetooth LE Tx/Rx: N4010A-109
Refer to Section 3.5 for SW details

LitePoint IQxel

Non-signaling
connectivity test box
(WLAN(SISO+MIMO)/BT
no FM)

Bluetooth 1,2,3,4(LE) SW License : 0300-IXEL-001
Iqxel80 Test System,802.11a,b,g,n,ac(80MHz) : 0100IXEL-002
Refer to section 3.6 for SW details

NI PXI5644R

Non-signaling
connectivity test box
(WLAN(SISO+MIMO)
only)

Refer to section 3.7 for SW details

Anritsu 8870A

Non-signaling
connectivity test box
(WLAN(SISO) + BT +
FM)

MU887000A
MU887000A-001
MV887030A
MV887031A
MX887030A
MX887031A
MV887040A
MX887040A
MX887050A

R&S CBT

BT Signaling test box
(Bluetooth only)

CBT-K55 “Enhanced Data Rate”
CBT-K57 “Low Energy”

Anritsu MT8852B

BT Signaling test box
(Bluetooth only)

Option 27 “Low Energy”

LitePoint IQNFC

NFC test box

Advanced Software License

2.3.2 Supported power supply
In order to perform RF tests one of the power supplies mentioned in Table 2-3 should be used.
The model string on the config file column refers to the model number information that can be
specified on the configuration file to switch to other equipment than default.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

23

Wireless Connectivity Tests User Guide

Hardware Setup and Requirements

Table 2-3 Power supply supported by test solution
Manufacturer / Model

Description

Model String on Config File

Keithley2303 (Default)

Keithley 2303 power supply

PS_KEITHLEY2303

Fluke 2812 /2813

Fluke 2812/2813 power supply

PS_FlukePM2812/
PS_FlukePM2813

Agilent E3640A/
Agilent E3641A/
Agilent E3642A/
Agilent E3643A/
Agilent E3644A/
Agilent E3645A/
Agilent E3646A/
Agilent E3647A/
Agilent E3648A/
Agilent E3649A

Agilent E364xA power supply

PS_AgilentE3640A/
PS_AgilentE3641A/
PS_AgilentE3642A/
PS_AgilentE3643A/
PS_AgilentE3644A/
PS_AgilentE3645A/
PS_AgilentE3646A/
PS_AgilentE3647A/
PS_AgilentE3648A/
PS_AgilentE3649A/

INSTEK 3202

Instek 3202 power supply

PS_PST3202

XantrexXDL355T

Xantrek XDL 355T power supply

PS_XDL355T

2.3.3 Supported signal generator for ANT
Table 2-4 Signal generator supported by ANT solutions
Manufacturer / Model
AgilentN5182A

Description
Agilent N5182A RF Vector Signal Generator
with option 506 for 6GHz

Model String on Config File
SG_AgilentN5182A

2.3.4 Supported spectrum analyzer for ANT
Table 2-5 Spectrum analyzer supported by ANT solutions
Manufacturer / Model
AgilentE4443A
AgilentE4402B
AgilentE4403B
AgilentE4404B
AgilentE4405B
AgilentE4407B
AgilentE4408B

80-Y0306-1 Rev. L

Description
Agilent E4443A PSA Spectrum Analyzer
Agilent E440xB ESA Spectrum Analyzer

Model String on Config File
SA_ AgilentE4443A

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

24

Wireless Connectivity Tests User Guide

Hardware Setup and Requirements

2.4 Station calibration test equipment
This section lists the test equipment required for station calibration. Station calibration is meant to
update the RF path losses on various RF paths on a station calibration data file in the local PC. It
is recommended to run an automated station calibration, but this file could be updated manually
as well.
Table 2-6 Test equipment needed for station calibration
Manufacturer / Model

Description

Quantity

Default

Supported signal
generator

Refer to Section 2.4.2 for supported signal
generators

1

LitePoint
IQ2010

Supported power meter

Refer to Section 2.4.1 for supported power
meters

1

Giga-tronics
8541C

2.4.1 Supported power meter for station calibration
To perform station calibration one of supported power meters in Table 2-7 should be used.
Additional power meters from the same vendors may work if the GPIB command set is the same.
The model string on the config file column refers to the model number information that can be
specified on the configuration file to switch to other equipment rather than the default.
Table 2-7 Power meter supported by test solution
Manufacturer / Model

Description

Model String on Config File

Agilent 4418B (Default)

Agilent 4418B

PM_HPE4418B

Giga-tronics 8651A

Giga-tronics 8651A

PM_GIG8651A

Giga-tronics 8541C

Giga-tronics 8541C

PM_GIG8541C

Agilent 437B

Agilent 437B

PM_HP437B

Rhode & Schwartz

NRP-Z11

PM_RSNRPZ11

2.4.2 Supported signal generator for station calibration
To perform station calibration one of supported signal generator mentioned in Table 2-8 should
be used. Please note that the signal generators listed on Table 2-8 are the supported signal
generators that go at least to 6GHz or more.
Table 2-8 Signal generator supported by test solution
Manufacturer / Model

80-Y0306-1 Rev. L

Description

Model String on Config File

LitePoint IQ2010
(Default)

LitePoint IQ2010 with IQMeasure SW

SG_LitepointIQ2010

Agilent N4010A

Agilent N4010A - Test Suite version 6.53.0

SG_AgilentN4010A

R&S CMW500

Rohde and Schwarz CMW500

SG_CMW500

LitePoint IQxel

LitePoint IQxel

SG_LitePointIQxel

NI PXI5644R

National Instrument PXI5644R

SG_NITrident

Anritsu MT8870A

Anritsu MT8870A

SG_AnritsuMT8870A

Agilent 83712B

Agilent 83712B Synthesized CW Generator,
10 MHz to 20 GHz

SG_Agilent83712B

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

25

Wireless Connectivity Tests User Guide

Hardware Setup and Requirements

Manufacturer / Model

80-Y0306-1 Rev. L

Description

Model String on Config File

Agilent 8665B

Agilent 8665B High-Performance Signal
Generator, 6GHz

SG_Agilent8665B

AgilentE8257D

Agilent E8257D PSD Signal Generator

SG_AgilentE8257D

AgilentN5182A

Agilent N5182A RF Vector Signal Generator
with option 506 for 6GHz

SG_AgilentN5182A

Keithley2920

Keithley 2920 RF Vector Signal Generator

SG_Keithley2920

Anritsu MT8870A

Anritsu MT8870A

SG_AnritsuMT8870A

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

26

3 Software Installation

3.1 SW requirements
The following are software requirements for a PC that would run Wireless Connectivity test
solutions on a Qualcomm based target. Appropriate version numbers are included against
software packages where a specific version is required:


Windows XP with Service Pack 3 or Windows 7



Qualcomm SW tools


QDART installation with Manufacturing tool kit for QSPR option checked
–



QDART 4.8.05 or above



QPST installer – Refer to [Q6] in Qualcomm documents of section 1.4.1



Qualcomm Windows XP/7 USB composite drivers – [Q7]

3rd Party tools


NI 488.2 GPIB 2.73 version or later (See Section 3.3 for details)



LitePoint IQ2010 software (See Section 3.5 for details)



Agilent N4010A software (See Section 3.6 for details)



LitePoint IQxel wave files (See Section 3.7 for details)



National Instrument NI PXI5644R (See Section 3.8 for details)



LitePoint IQNFC software(See Section 3.10 for details)



Android debug bridge (adb) installed / available on system path (See Section 3.4 for
details)
–



Included as part of Android SDK from Google


Adb.exe (Android debug bridge executable)



Adbwinapi.dll (ADB Windows API DLL)

Android Windows XP/7 USB drivers
–

Obtain drivers from SW team usually drivers are included with the Android build

–

Install the USB drivers on boot up of the DUT

3.2 QDART for non-FFA setup
Please see [Q10], QDART Users Guide for more information.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

27

Wireless Connectivity Tests User Guide

Software Installation

3.3 NI GPIB setup
National Instruments’ GPIB software and drivers are used to control the power supply, power
meter, signal generator and GPIB controlled connectivity test box connected to the PC to perform
the automated testing.

3.3.1 NI GPIB software setup
The NI 488.2 software can be downloaded from the NI website at http://www.ni.com.
NOTE:

NI 488.2 3.02 version or later is required to be compatible with test software. Also, “.NET
framework 4.0 Languages support” must be selected as part of installation as listed below:
To setup NI GPIB software:
1. Navigate to the latest NI GPIB software and run the setup.exe
2. Follow the on-screen prompts to install the NI 488.2 drivers and software
3. Please select Custom on the select installation option window
4. On the features to install window, please ensure that “.NET Framework 4.0 Languages
support” is selected to install this feature

Figure 3-1 Enable .NET Framework 4.0 Support on NI 488.2 for Windows Install
5. The installer installs several parts of the package and then prompts for the addition of GPIB
hardware. The wizard may be cancelled as the addition can be done when the hardware is
plugged in.
6. Complete the installation by rebooting the computer.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

28

Wireless Connectivity Tests User Guide

Software Installation

3.3.2 NI GPIB driver setup
When the USB to GPIB controller is connected to the USB port on the PC, Windows starts to
install the hardware driver for GPIB-USB controller. The following steps need to be followed for
installing the driver properly:
1. Windows will prompt the “Found New Hardware Wizard.” Make sure that “Yes, this time
only” is selected for windows update to search for drivers.

Figure 3-2 Signal generator supported by test solution
2. Windows prompts for automatic or manual installation of the driver. Make sure that the
automatic installation is selected.

Figure 3-3 NI GPIB hardware setup – step 2
3. Windows will install the driver for the USB to GPIB controller and completes the hardware
driver installation procedure.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

29

Wireless Connectivity Tests User Guide

Software Installation

Figure 3-4 NI GPIB hardware setup – step 3

3.4 Android debug bridge installation
NOTE:

These steps are specific based on HLOS on the embedded side. Skip them for non-Android
HLOS.
The following steps will install adb and will add it to the system path:
1. Install the Android SDK from Google or obtain the SDK files from the software team.
2. Copy the following two Android SDK files into a local directory such as C:\Android_tools.


Android debug bridge executable (Adb.exe)



Adb Windows API dll (Adbwinapi.dll)

3. Navigate to system properties on the computer. On Advanced tab, click on “Environment
Variables…” and scroll to the Path variable on System variables section.

Figure 3-5 Path system variable on environment variables

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

30

Wireless Connectivity Tests User Guide

Software Installation

4. Click on “Edit…” and add C:\Android_tools or the local directory where the files are as
shown in Figure 3-6.

Figure 3-6 Add ADB as part of the system path

3.5 LitePoint software for running
NOTE:

These steps are specific to LitePoint IQ2010 software installation.
The following software programs are needed for LitePoint IQ2010. Please contact LitePoint to
obtain this software.


Drivers for IQ2010 installed on the PC (only required for LitePoint IQ2010)




NOTE:

Should be available as part of the disk that came with LitePoint

IQmeasure package 3.0.8.3 or above – Available from LitePoint

Test solutions are validated with IQMeasure package 3.0.8.3


Bin folder of IQMeasure is required to be added to Windows system “Path”
–

80-Y0306-1 Rev. L

Navigate to system properties on the computer. On Advanced tab, click on
“Environment Variables…” and scroll to the Path variable on System variables
section.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

31

Wireless Connectivity Tests User Guide

Software Installation

Figure 3-7 Path system variable on environment variables
–

Click on Edit... and add “C:\LitePoint\IQmeasure\IQmeasure_3.0.8.3”

3.6 Agilent N4010A software installation
An Agilent IO library 14.2 is required to be installed for Agilent N4010A testing.


Agilent WLAN test software suite version A.06.53.00 and Agilent drivers are required to be
installed before running the test.



For downloading WLAN and custom Bluetooth waveforms, please contact Agilent
Technologies N4010A Technical Support Team to get a website link and password: JIANNDER SHAW jiann-der_shaw@agilent.com, LEI YANG lei_yang@agilent.com, GRACE HU
grace_hu@agilent.com

3.7 LitePoint IQxel wave files installation

80-Y0306-1 Rev. L



Obtain wave files with iqvsg extensions from LitePoint and copy to tester PC.



Add the path location of the wave files to the config file WCNTesterConfig.xml under the
IQxel WLAN and BT section in info item name “WaveFilePath”.



If the wave file names differ from the default file names in WCNTesterConfig.xml under the
IQxel WLAN and BT section, enter the correct wave file names to be associated with each
rate.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

32

Wireless Connectivity Tests User Guide

Software Installation

Figure 3-8 LitePoint IQxel waveform location

3.8 NI PXI5644R software installation
The following software programs are needed for NI PXI5644R. Please contact National
Instruments to obtain this software.






80-Y0306-1 Rev. L

Drivers for NI WLAN, NI Spectral Measurement Tool, NI-VST and NI-RIO installed on
the PC. This is available as part of the disk that comes with National Instruments
NIDotNetWrappersClassLibrary.dll and QDART NI client server modules are required. –
Available from NI. Please note that the remote servers from NI needs to be running while
QSPR is communicating with the NI PXI 5644R
Generally, when the software is installed, it will reside in C:/Program Files/National
Instruments and the DLLs for toolkits and drivers will reside in C:/Program Files/IVI
Foundation

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

33

Wireless Connectivity Tests User Guide

Software Installation

To obtain further information on the system requirements and setup please contact
qct_FTTL@ni.com, reference part number 862003-01.

3.9 Agilent N5182A software and waveform files installation
(ANT only)
Agilent N7622B Signal Studio for Toolkit is required to copy ANT waveform files to Agilent
N5182A (or equivalent Agilent) ARB signal generator. This software is available for download
from Agilent technologies website for free. After installation, use the settings shown below to
download the waveform files.

Figure 3-9 Loading waveform files on Agilent N5182A

3.10 LitePoint IQNFC Software
NOTE:

These steps are specific to LitePoint IQNFC software installation. Skip this section if LitePoint
IQNFC is not used at test box.
The following software programs are needed for LitePoint IQNFC. Please contact LitePoint to
obtain this software.


Drivers + Software for IQNFC installed on the PC


80-Y0306-1 Rev. L

Should be available as part of the disk that came with LitePoint

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

34

4 Station Calibration

This section describes the station calibration test tree procedure. This test tree provides a way to
perform station calibration and update the files using an automation environment.

4.1 Station calibration data file
4.1.1 BT/WLAN/FM RF test station calibration data file
Path loss on the RF path between the antenna test ports on DUT to the power meter is stored in
the station calibration data file. Station calibration data file is present in:
C:\QUALCOMM\WCN\ProdTests\StationCal\QTA_CalDataFile.xml.
The following paths are required to be calibrated for performing BT, WLAN, FM and ANT tests:


Bluetooth path (default path name = BTPath)



WLAN path (default path name = WCD)



FM





FM headset path (default path name = FM_HS_RX)



FM pwb path (default path name = FM_PWB_RXTX)

ANT


ANT transmit path (default path name = SAPath)



ANT receive path (default path name = ARBPath)

The data list main tag contains various data elements that contain the frequency at which loss
(value) was measured. Delta indicates the difference between the current measurement to the
previous measurement.

2400
11.35
0


4.2 Station calibration instrument config file
Signal generator and power meter equipment to be utilized to perform station calibration is
indicated by the instrument config file for station calibration.
StationCalInstrumentConfigFile.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles
controls this configuration. The following XML tag can be changed by the user for power meter
and signal generator:
80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

35

Wireless Connectivity Tests User Guide



Station Calibration

Model tag needs to reflect the model number of power meter and signal generator on their
respective sections. Please use the model string config information specified in section 2.4.1
and 2.4.2 for changing the test equipment model if they are different from defaults. GPIB
primary address for both types of equipment is specified in  tag.
SG_Agilent83712B
PM_GIG8541C



Power meter configuration


Make sure  tag contains “CALPM”  tag.



GPIB based power meter configuration.
–

Use  tag as “NIGPIB”.

–

Configure  tag with BoardID , PrimAddress and ScndAddress

Figure 4-1 Station calibration GPIB power meter configuration

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

36

Wireless Connectivity Tests User Guide



Station Calibration

VISA based power meter configuration (R&S NRPZ11 only)
–

Use  tag as “Visa32”.

–

Configure  tag with VISA instrument string or VISA instrument alias.

Figure 4-2 Station calibration VISA power meter configuration


Signal generator configuration:
In order to use the certain test equipment for station calibration, find the section of the test
equipment, set CALSG tag to
“CALSG”, and change other equipment tag to something else.

Figure 4-3 Station calibration SG resource ID


80-Y0306-1 Rev. L

LitePoint IQ2010 as signal generator
–

Under  tag configure  tag as “CALSG”

–

Model – SG_LitepointIQ2010

–

Under OptionalConfigInfoList, check the ServerExeFullLocation path to ensure that
the StartLitepointConnectivityServer.exe is available. Set IPAddress, set RFPort to
“LEFT” to use left RF port, “RIGHT” to use right RF port or “FM” to use FM port.
Check the installation required for LitePoint software in section 3.3.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

37

Wireless Connectivity Tests User Guide

Station Calibration

Figure 4-4 Station calibration LP IQ2010 as signal generator

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

38

Wireless Connectivity Tests User Guide



Station Calibration

R&S CMW500 as signal generator
–

Under  tag configure  tag as “CALSG”

–

Model – SG_CMW500

–

Specify GPIB primary address specified in 

Figure 4-5 Station calibration R&S CMW500 as signal generator


80-Y0306-1 Rev. L

Agilent N4010A as signal generator
–

Under  tag configure  tag as “CALSG”

–

Model – SG_AgilentN4010A

–

Set Partial Class Name to Visa32

–

Specify Visa instrument string or Visa instrument alias for  tag

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

39

Wireless Connectivity Tests User Guide

Station Calibration

Figure 4-6 Station calibration Agilent N4010A as signal generator


LitePoint IQxel as signal generator
–

Under  tag configure  tag as “CALSG”

–

Model – SG_LitePointIQxel

–

Under OptionalConfigInfoList. Set RFPort to “LEFT” to use left RF port or “RIGHT”
to use right RF port, set host IP address and port number.

Figure 4-7 Station calibration LP IQxel as signal generator

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

40

Wireless Connectivity Tests User Guide



Station Calibration

NI PXI5644R as signal generator
–

Under  tag configure  tag as “CALSG”

–

Model – SG_NITrident

–

Under OptionalConfigInfoList. Check the NIWrapperDLLPath and
NIWrapperDLLName.

Figure 4-8 Station calibration NI PXI5644R as signal generator


80-Y0306-1 Rev. L

Anritsu MT8870A as signal generator
–

Under  tag configure  tag as “CALSG”

–

Model – SG_AnritsuMT8870A

–

Under OptionalConfigInfoList. Set RFPort to “1” to use left RF port or “2” to use
right RF port, set host IP address and port number.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

41

Wireless Connectivity Tests User Guide

Station Calibration

Figure 4-9 Station calibration LP IQxel as signal generator

4.3 Station calibration procedure
4.3.1 BT/WLAN/FM RF test station calibration procedure
1. From the Windows Start menu, select Start  All Programs  QDART  QSPR
2. From QSPR, open the Test Tree by selecting File  Open 
C:\QUALCOMM\WCN\ProdTests\TestTrees\StationalCalibration.xtt
3. Click the Go/No-Go button on the QSPR menu (the right arrow represented as a green-circle
on Figure 4-10).

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

42

Wireless Connectivity Tests User Guide

Station Calibration

Figure 4-10 Station calibration test tree
4. Ignore the warning messages as the test tree is meant for updating the local files
5. While performing the station calibration if messages pop up to merge the paths for WLAN
path, select “Yes” to merge path for WLAN 2.4 GHz and 5 GHz path
6. At the end of successful test tree execution, the data file in this location:
C:\QUALCOMM\WCN\ProdTests\StationCal will be updated

4.3.2 NFC RF test station calibration procedure
NFC Tester Calibration is required if using LitePoint IQNFC tester. The calibration data is used
by the tester while performing frequency sweep tests (NFCResonanceTest and
NFCDUT_FindResonance tests). Please run the ‘NFCTesterCalibrate’ test once manually with
the complete fixture but with no DUT on the NFCTester Antenna. This test will save the
calibration file to local disk which can be used every time the tree is run on that particular station.
The calibration file is unique to the Field Strength Level, Start Freq, Step Frequency and Stop
Frequency which was used to run the calibrate function. ConfigureNFCTester test used to
configure for Frequency Sweep and FindResonance tests should use the same parameters as the
Calibration Test.
This test is part of NFC_Test_Reference.xtt

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

43

Wireless Connectivity Tests User Guide

Station Calibration

Figure 4-11 NFC tester calibration test

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

44

5 Test Matrix

The following matrices present the type of tests and brief description of various tests that are
performed in production environments. Detailed explanation and test settings are covered in later
sections.

5.1 Bluetooth non-signaling production test matrix
Table 5-1 lists the tests that are covered under this document for testing Bluetooth devices in
production environment.
Table 5-1 Bluetooth non-signaling production test matrix
Rate

80-Y0306-1 Rev. L

Test Name

Description

BR

Measure_OutputPower_InitialCarrierFr
equencyTolerance

This test measures average transmitter
output power and transmitter initial carrier
frequency tolerance.

BR

Measure_GFSK_Modulation_DeltaF2_
CarrierDrift

This test measures Delta F2 and carrier
frequency drift of the BT transmitter

BR

Measure_GFSK_Modulation_DeltaF1

This test measures Delta F1 of the BT
transmitter

BR

GFSK RX Sensitivity

This test verifies minimum sensitivity at a
given power and measures BER %.

BR

GFSK Max Input Power

This test verifies maximum input power at a
given power and measures BER %.

EDR

Measure_EDRModulation

This test verifies the transmitter carrier
frequency stability and modulation accuracy

EDR

EDR Sensitivity

This test verifies sensitivity at a given power
and measures BER %.

EDR

EDR Max Input Power

This test measure maximum input power for
given maximum BER %.

BLE

Measure_LE_TxOutputPower

This test measures average transmitter
output power

BLE

Measure_LE_Modulation_DeltaF1

This test measure modulation parameters
like DeltaF1

BLE

Measure_LE_Modulation_DeltaF2_Fre
qOffset_FreqDrift_MaxDriftRate

This test measures delta F2, frequency
offset, carrier drift and max drift rate of LE
transmitter

BLE

LE RX Sensitivity

This test measure LE receiver sensitivity

BLE

LE Max Input Power

This test measure max input power for given
maximum PER%

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

45

Wireless Connectivity Tests User Guide

Test Matrix

5.2 WLAN production SISO test matrix
Table 5-2 lists the tests that are covered under this document for testing WLAN devices in
production environment.
Table 5-2 WLAN production test matrix
Test Name

Description

SetUpDutTx

Sets up the DUT for TX testing

WlanTxEVMTest

Transmit Modulation Accuracy Test; Measures EVM

WlanTxVerifySpectrumTest

Transmit Spectrum Verification Test; Measures center
frequency leakage and spectral flatness

WlanTxVerifyMaskTest

Transmit Spectrum Mask Verification Test

WlanTxVerifyPowerTest

Transmit Power Verification Test; Measures maximum,
minimum average TX power and maximum, minimum,
average Peak TX Power

WlanPerTest

Receiver Minimum Input Sensitivity Test; Measures PER

5.3 WLAN production MIMO test matrix
Table 5-3 lists the tests that are covered under this document for testing MIMO and SISO WLAN
devices in production environment.
Table 5-3 WLAN production test matrix
Test Name

Description

SetUpDutTxDetails

Sets up the DUT for TX testing (QCA6174)

WlanTxEvmTest_NxN

Transmit Modulation Accuracy Test for MIMO/SISO modulation rate;
Measures EVM, Power Freq_err etc.

MeasureSpectrum_NxN

Transmit Spectrum Verification Test for MIMO/SISO modulation rate;
Measures center frequency leakage and spectral flatness

WlanTxVerifyPowerTest_NxN

Transmit Power Verification Test for MIMO/SISO modulation rate;
Measures maximum, minimum average TX power and maximum,
minimum, average Peak TX Power

WlanPerTest_NxN

Receiver Minimum Input Sensitivity Test for MIMO/SISO modulation
rate; Measures PER

5.4 FM production test matrix
Table 5-4 lists the tests that are covered under this document for testing FM devices in production
environment.
Table 5-4 FM production test matrix
Test Name

80-Y0306-1 Rev. L

Description

RX Sensitivity GONOGO

This test verifies sensitivity at a given power and
measures SNR

RX Sensitivity Characterization

This test finds the minimum sensitivity level with an
iterative search

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

46

Wireless Connectivity Tests User Guide

Test Matrix

Test Name

NOTE:

Description

RX Max SNR

This test measures SNR at a strong input signal
level

RX Intermediate SNR

This test measures SNR at an intermediate input
signal level with AM distortion added to the FM
signal

RX THD

This test measures Total Harmonic Distortion

RX RDS Block Error Rate

This test measures RDS Block Error Rate (BLER)

TX Output Power

This test measures TX output power

TX FM Deviation

This test measures FM deviation on the TX signal

TX Stereo Audio SNR

This test measures audio SNR for Left & Right
channels on the TX signal

All FM tests are not supported with WCN2243. Tests listed in bold in Table 5-4 are not
supported for WCN2243. Tests that are supported by WCN2243 are only supported for default
headset path.

5.5 ANT production test matrix
Table 5-5 lists the tests that are covered under this document for testing ANT devices in
production environment.
Table 5-5 ANT production test matrix
Test Name

Description

RX Sensitivity

This test finds the minimum sensitivity level with an
iterative search

TX Channel Power

This test measures TX channel output power

5.6 WLAN WCN36x0 CLPC calibration
Refer to [Q9] for WLAN closed loop power control calibration for WCN36x0.

5.7 Bluetooth signaling production test matrix
Table 5-6 lists the tests that are covered under this document for testing Bluetooth devices in
signaling environment.
Table 5-6 Bluetooth signaling production test matrix
Rate

80-Y0306-1 Rev. L

Test Name

Description

BR

TRM/CA/01
TX Output Power

Verification of the maximum peak and average RF-output
power.

BR

TRM/CA/07 Modulation
Characteristics

Verification of the modulation index.

BR

TRM/CA/08 Initial Carrier
Frequency Tolerance

Verification of the transmitter carrier frequency accuracy

BR

TRM/CA/09 Carrier
Frequency Drift

Verification of the transmitter center frequency drift within a
packet.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

47

Wireless Connectivity Tests User Guide

Rate

Test Matrix

Test Name

Description

EDR

TRM/CA/10 EDR Relative
Transmit Power

This test ensures the difference in average transmit power
during frequency modulated [GFSK] and phase modulated
[DPSK] portions of a packet is within an acceptable range.

EDR

TRM/CA/11
EDR Carrier Frequency
Stability and Modulation
Accuracy

This test verifies the transmitter carrier frequency stability
and modulation accuracy.

BR

RCV/CA/01 Sensitivity –
single slot packets

The sensitivity is tested using a non-ideal transmitter (oneslot packet).

BR

RCV/CA/02 Sensitivity –
multiple slot packets

Multi-slot packets are sent to the EUT at the sensitivity level.

EDR

RCV/CA/07
EDR Sensitivity

Verification of the receiver sensitivity for the 10-4 bit error
rate using a non-ideal transmitter.

BLE

TRM-LE/CA/01/02 LE TX
Output Power

This test verifies the maximum peak and average power
emitted from the EUT.

BLE

TRM-LE/CA/05
LE Modulation DeltaF1

This test verifies that the modulation characteristics (delta
F1) of the transmitted signal are correct.

BLE

TRM-LE/CA/05/06/07 LE
Modulation Delta F2 and
Frequency Offset and Drift

This test verifies that the modulation characteristics (delta
F2) of the transmitted signal are correct. This test verifies
that the carrier frequency offset and carrier drift of the
transmitted signal is within specified limits.

BLE

RCV-LE/CA/01/02 LE
Receiver Sensitivity

This test verifies that the receiver sensitivity is within limits
for non-ideal signals.

5.8 NFC production functional test matrix
Table 5-7 lists the tests that are covered under this document for testing NFC device functionality.
Table 5-7 NFC production functional tests
Test

Description

Detect Tag

This test verifies the DUT is able to detect a NFC
tag.

Detect Field

This test verifies the DUT is able to detect an
externally generated NFC field.

NFCDUT_SelfTest

This test is based on the NFC chip’s built in Self
Test Function

Table 5-8 NFC functional test tree nodes
Test

80-Y0306-1 Rev. L

Applicable to Phone

Applicable to SoC

SetInstrumentConfigFile

Yes

Yes

NFCDUT_SetConfigFile

Yes

Yes

NFCDUT_Instantiate

Yes

Yes

DUT_InitFramework

Yes

Yes

NFCDUT_RunTopLevelScript

No

Yes

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

48

Wireless Connectivity Tests User Guide

Test Matrix

Test

NOTE:

Applicable to Phone

Applicable to SoC

NFCDUT_Connect

Yes

Yes

NFCDUT_CoreResetAndInit

Yes

Yes

NFCDUT_PatchFirmwareUsingPatchFile

No

Yes

DialogBox_DetectTAG

Yes

Yes

NFCDUT_DetectTAG

Yes

Yes

NFCDUT_SelfTest

Yes

No

DialogBox_EnableField

Yes

Yes

NFCDUT_DetectField

Yes

Yes

NFCDUT_Disconnect

Yes

Yes

NFCDUT_Shutdown

Yes

Yes

NFC Test nodes that are not applicable for a particular DUT type will be ignored and just exit
true.

5.9 NFC reference test matrix
Table 5-9 lists the tests that are covered under this document for testing NFC device functionality.
Table 5-9 NFC reference tests
Test

Description

Initiator Test

This test measures the different RF characteristics
of the DUT Initiator Tx waveform

InitiatorRx Test

This test verifies the functionality of the DUT
Initiator Rx block.

Target Test

This test measures the different RF characteristics
of the DUT Target Tx waveform

NFC Resonance Test

This test measures the resonance frequency which
the DUT is tuned to.

Detect Tag

This test verifies the DUT is able to detect a NFC
tag.

Detect Field

This test verifies the DUT is able to detect an
externally generated NFC field.

NFCDUT_SelfTest

This test is based on the NFC chip’s built in Self
Test Function

Table 5-10 NFC reference test tree nodes
Test

80-Y0306-1 Rev. L

Applicable to Phone

Applicable to SoC

SetInstrumentConfigFile

Yes

Yes

NFCDUT_SetConfigFile

Yes

Yes

NFCDUT_Instantiate

Yes

Yes

DUT_InitFramework

Yes

Yes

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

49

Wireless Connectivity Tests User Guide

Test Matrix

Test

NOTE:

80-Y0306-1 Rev. L

Applicable to Phone

Applicable to SoC

NFCDUT_RunTopLevelScript

No

Yes

NFCDUT_Connect

Yes

Yes

NFCDUT_CoreResetAndInit

Yes

Yes

NFCDUT_PatchFirmwareUsingPatchFile

No

Yes

NFCDUT_FindResonance

No

Yes

NFCDUT_TuneCapNVM

No

Yes

InitiatorTest

Yes

Yes

InitiatorRxTest

Yes

Yes

TargetTest

Yes

Yes

ResonanceTest

Yes

Yes

DialogBox_DetectTAG

Yes

Yes

NFCDUT_DetectTAG

Yes

Yes

DialogBox_EnableField

Yes

Yes

NFCDUT_DetectField

Yes

Yes

NFCDUT_SelfTest

Yes

No

NFCDUT_Disconnect

Yes

Yes

NFCDUT_Shutdown

Yes

Yes

NFC Test nodes that are not applicable for a particular DUT type will be ignored and just exit
true.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

50

6 Chipsets Supported

Table 6-1 lists supported Wireless Connectivity chipsets. These chipsets are supported as long as
they are mated to Qualcomm applications processor targets with appropriate FTM test support.
Table 6-1 Supported chipsets
Chipset

Bluetooth

WLAN

FM

ANT

NFC

WCN2243

Yes

No

Yes

No

No

WCN36x0

Yes

Yes

Yes

Yes

No

AR6003

No

Yes

No

No

No

AR6004

No

Yes

No

No

No

AR6005

No

Yes

No

No

No

Yes

No

No

No

No

Yes

Yes

No

Yes

No

No

No

No

No

Yes

AR3002
QCA6174
QCA1990

NOTE:

80-Y0306-1 Rev. L

*

QCA6174 and QCA1990 can also run in standalone mode connected directly to PC.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

51

7 Setup Configuration

Navigate to C:\Qualcomm\ WCN\ProdTests \ConfigFiles\Sample. Based on the type of test box
used, copy and rename the appropriate xxx--WCNTesterConfig.xml to WCNTesterConfig.xml
under C:\Qualcomm\ WCN\ProdTests \ConfigFiles. Open WCNTesterConfig.xml. Verify the test
equipment model types, settings and GPIB addresses match the setup on the test station. Make
changes and save as required.

7.1 Power supply configuration
1. Instrument configuration file: Test instrument to be utilized to perform power supply tests is
indicated by the instrument config file. WCNTesterConfig.xml present in
C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration.
a. To select a GPIB based power supply specified in section 2.3.2, check the following
XML tags:
ResourceID should be selected as “PowerSupply” on the Item

i


PowerSupply

ii

80-Y0306-1 Rev. L

Ensure that the GPIB address mentioned on the config file has the right information.
This is specified on  tag

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

52

Wireless Connectivity Tests User Guide

Setup Configuration

Figure 7-1 Power supply section on WCNTesterConfig.xml

7.2 Bluetooth non-signaling tester configuration
1. Test instrument to be utilized to perform BT tests is indicated by the instrument config file.
WCNTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls
this configuration
a. For BTTestBoxes specified in Table 2-2 check the following XML tags
ResourceID should be selected as “BTTesterNS” on the Item

i


BTTesterNS

ii

80-Y0306-1 Rev. L

LitePoint IQ2010 only: Under OptionalConfigInfoList, check the
ServerExeFullLocation Path to ensure that the StartLitepointConnectivityServer.exe
is available. Check the installation required for LitePoint in section 3.3.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

53

Wireless Connectivity Tests User Guide

Setup Configuration

Figure 7-2 Bluetooth LitePoint config section in WCNTesterConfig.xml
iii R&S CMW500 only: Ensure that the GPIB address mentioned in the config file has
the right information. This is specified on  tag.

Figure 7-3 BT R&S CMW500 GPIB settings in WCNTesterConfig.xml

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

54

Wireless Connectivity Tests User Guide

Setup Configuration

iv Under OptionalConfigInfoList, check the EntireARBLocation_xDHx to ensure the
location of ARB waveforms. For LitePoint and AgilentN4010A
EntireARBLocation_xDHx is the location on local PC and for CMW it is the location
on the test box hard drive.
v

Under OptionalConfigInfoList, check the “WaveformBluetoothAddress” provided by
test equipment vendors. Bluetooth address listed in the config file should match the
Bluetooth address used for creating the ARB waveform files. This is a requirement
for BT Rx testing.

Figure 7-4 Bluetooth waveform address section in WCNTesterConfig.xml
vi For BT Low Energy receiver test waveform name and location needs to be listed in
OptionalConfigInfoList. Make sure the “InfoItem Name=” matches the one used in
QSPR test tree parameter “WaveformKey” for LE Rx Sensitivity. “Value=” is the
entire location and filename of the waveform file.
vii For AgilentN4010A only: Please verify the VISA instrument string or VISA
instrument alias in the test PC. Default VISA alias set in config file is “N4010A”.

Figure 7-5 BT AgilentN4010A VISA settings in WCNTesterConfig.xml
viii For LitePoint IQxel only: Please verify the RF port, host IP address and port number
in the config file.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

55

Wireless Connectivity Tests User Guide

Setup Configuration

Figure 7-6 BT LitePoint IQxel settings in WCNTesterConfig.xml
ix For Anritsu MT8870A only: Please verify the RF port, host IP address and port
number in the config file.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

56

Wireless Connectivity Tests User Guide

Setup Configuration

Figure 7-7 BT Anritsu MT8870A settings in WCNTesterConfig.xml

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

57

Wireless Connectivity Tests User Guide

Setup Configuration

7.3 WLAN tester configuration (SISO only)
1. Instrument configuration file: Test instrument to be utilized to perform WLAN tests is
indicated by the instrument config file. WCNTesterConfig.xml present in
C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration
a. For WLANTestBoxes specified on Table 2-2 check the following XML tags.
ResourceID should be selected as “WLANTester” on the Item

i


WLANTester

ii

LitePoint IQ2010 only: Under LitePoint IQ2010 on OptionalConfigInfoList, check
the ServerExeFullLocation Path to ensure that the
StartLitepointConnectivityServer.exe is available. Check the installation required for
LitePoint on 3.3.

iii GPIB based testers only, ensure that the GPIB address mentioned on the config file
has the right information. This is specified on  tag.
iv For LitePoint and CMW500 on OptionalConfigInfoList, check the WaveFilePath to
ensure the location of ARB waveforms. For LitePoint WaveformFilePath is the
location on local PC and for CMW500 it is the location on the test box hard driver.
v

NI PXI5644R only: On OptionalConfigInfoList, check the NIWrapperDLLPath has
the correct path information and also ensures that the dll is available at that path. On
OptionalConfigInfoList NIWrapperDLLName is the name of the dll provided by NI
that is mostly NIDotNetWrappersClassLibrary.dll.

vi Agilent N4010 for WLAN only: Under Agilent N4010A (See Figure 7-10).
(a) "InstrumentVisaString": This string value must be set to identify the Instrument’s
Visa String. The string could identify a USB, GPIB, or WLAN connection to the
N4010A. It is recommended to use a USB connection to the N4010A with the
rsrcName value in specified in the “InstrumentVisaString” value field. Default
value used in config file is “N4010A”.
(b) "UseAutoRange": This item tells the instrument whether or not to use the
AutoRange function. The value should be set to either 0 or 1. AutoRange will set
the instrument PowerRange, TriggerLevel, MaxPacketLength, and
MaxSymbolsUsed parameters which are used on TX measurements. Default
value is 0
(c) "UseIncreasedDynamicRangeFor11bSpectralMask": This item tells the
instrument whether or not to use an increased dynamic range for 802.11b spectral
mask measurements. The value should be set to either 0 or 1. Default value is 0.
(d) "WaveformSampleRate_11N_HT20": This specifies the sample rate of 20 MHz
802.11n waveforms. The default value is 40000000. The units are Hz. If 20 MHz
802.11n waveforms are created with another sample rate, then specify that rate
here.
(e) "WaveformSampleRate_11N_HT40": This specifies the sample rate of 40 MHz
802.11n waveforms. The default value is 80000000. The units are Hz. If 40 MHz

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

58

Wireless Connectivity Tests User Guide

Setup Configuration

802.11n waveforms are created with another sample rate, then specify that rate
here.
vii For Anritsu 8870A on OptionalConfigInfoList, check the WaveFilePath to ensure the
location of ARB waveforms. The WaveFilePath is the location on the test box for
Anritsu 8870A. Also make sure that the IP address and port number for tester is
properly set in ITcpClient as shown in Figure 7-12.

Figure 7-8 WLAN LitePoint test box section on WCNTesterConfig.xml

Figure 7-9 R&S CMW WLAN section on WCNTesterConfig.xml

Figure 7-10 Agilent N4010A WLAN section on WCNTesterConfig.xml

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

59

Wireless Connectivity Tests User Guide

Setup Configuration

Figure 7-11 NI PXI5644R WLAN section on WCNTesterConfig.xml

Figure 7-12 OptionalConfigInfoList section for Anritsu MT8870A on
WCNTesterConfig.xml

Figure 7-13 ITcpClient section for Anritsu MT8870A on WCNTesterConfig.xml

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

60

Wireless Connectivity Tests User Guide

Setup Configuration

7.4 WLAN Tester Configuration (MIMO only)
1. Instrument configuration file: Test instrument to be utilized to perform WLAN tests is
indicated by the instrument config file. WCNTesterConfig.xml present in
C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration
a. For WLANTestBoxes specified on Table 2-2 check the following XML tags
ResourceID should be selected as “WLANTester” on the Item

i


WLANTester

ii

LitePoint IQxel, make sure IQmeasure_3.0.6\Bin is in your system path
For this release it release IQmeasure_3.0.6 up.

iii For LitePoint on OptionalConfigInfoList, check the WaveFilePath to ensure the
location of ARB waveforms. For LitePoint WaveformFilePath is the location on local
PC.
iv NI PXI5644R only: On OptionalConfigInfoList, check the NIWrapperDLLPath has
the correct path information and also ensures that the dll is available at that path. On
OptionalConfigInfoList NIWrapperDLLName is the name of the dll provided by NI
that is mostly NIDotNetWrappersClassLibrary.dll

Figure 7-14 WLAN LitePoint Test Box section (MIMO only) on
WCNTesterConfig.xml

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

61

Wireless Connectivity Tests User Guide

Setup Configuration

Figure 7-15 NI PXI5644R WLAN Section (MIMO only) on WCNTesterConfig.xml

7.5 FM tester configuration
1. Instrument configuration file: Test instrument to be utilized to perform FM tests is indicated
by the instrument config file. WCNTesterConfig.xml present in
C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls this configuration.
a. For FMTestBoxes specified in Table 2-2 check the following XML tags:
ResourceID should be selected as “FMTester” on the Item

i


FMTester

ii

For LitePoint on OptionalConfigInfoList, check the ServerExeFullLocation path to
ensure that the StartLitepointConnectivityServer.exe is available. Check the
installation required for LitePoint on 3.3.

iii For LitePoint on OptionalConfigInfoList, check the FmAudioWaveFilePath path to
ensure where the .wav audio files (audio from DUT captured with LitePoint AIM
module) are to be written. These files are used for FM RX audio measurements.
NOTE:

Please ensure FmAudioWaveFilePath path is physically available on the local PC.
iv For LitePoint on OptionalConfigInfoList, check the FmAudioCaptureSource value. A
value of 0 specifies to digitize analog audio with the LitePoint AIM. A value of 1
specifies to capture digital FM audio directly from the DUT. Currently this is only
supported on WCN3660. If this tag is omitted, then a default value of 0 is used.
v

For LitePoint on OptionalConfigInfoList, check the FmAudioCaptureSampleRate
value in Hz specifies the sample rate of the LitePoint AIM module. (default =
48000).

vi For LitePoint on OptionalConfigInfoList, check the FmExpectedMaxTxPower value
to Zero. This affects the gain in the FM VSA. Set this to a value that is guaranteed
not to be exceeded at the FM VSA input. Allow some safety margin so that the signal
to the ADC in the VSA is never over range. Excessive margin however, may degrade
80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

62

Wireless Connectivity Tests User Guide

Setup Configuration

the TX Audio SNR measurements. The range of valid values is -40 dBm to +10
dBm. (default = 0.0).
vii For LitePoint on OptionalConfigInfoList, check the FmVsaCaptureDuration. This
value in milliseconds sets the capture duration for the FM VSA. This VSA capture is
used for all TX RF, TX Demod, and TX Audio measurements. (default = 500).
viii For LitePoint on OptionalConfigInfoList, check the FmAudioCaptureDuration. This
value in milliseconds sets the capture duration for FM RX audio from the DUT.
Audio capture is performed with the LitePoint AIM module. (default = 500).

Figure 7-16 FM test box section on WCNTesterConfig.xml

7.6 Bluetooth signaling tester configuration
1. Test instrument to be utilized to perform BT tests is indicated by the instrument config file.
WCNTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls
this configuration
a. For BTTestBoxes specified on 2.3.1 check the following XML tags
ResourceID should be selected as “BTTester” on the Item

i


BTTester

ii

80-Y0306-1 Rev. L

Sample R&S CBT:

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

63

Wireless Connectivity Tests User Guide

Setup Configuration

Figure 7-17 Sample R&S CBT config section in WCNTesterConfig.xml
iii Sample AnritsuMT8852B:

Figure 7-18 AnritsuMT8852B config section in WCNTesterConfig.xml

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

64

Wireless Connectivity Tests User Guide

Setup Configuration

7.7 NFC tester configuration
Sample NFC Tester file is present in C:\Qualcomm\WCN\ProdTests\ConfigFiles\Sample\ LPIQNFC--NFCTesterConfig.xml.
NOTE:

Please copy and rename the appropriate NFC Tester sample (e.g. LP-IQNFC-NFCTesterConfig.xml) to C:\Qualcomm\WCN\ProdTests\ConfigFiles\ NFCTesterConfig.xml
before running QSPR NFC reference tree tests.
2. Test instrument to be utilized to perform NFC tests is indicated by the instrument config file.
NFCTesterConfig.xml present in C:\QUALCOMM\WCN\ProdTests\ConfigFiles controls
this configuration.
a. For NFC TestBoxes specified on 2.3.1 check the following XML tags
ResourceID should be selected as “NFCTester” on the Item

i


NFCTester

ii

Sample LitePoint IQNFC config item entry:

Figure 7-19 LitePoint IQNFC config section in NFCTesterConfig.xml

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

65

8 QSPR Test Trees

The following section contains sample wireless connectivity production test trees.

8.1 Bluetooth non-signaling + Bluetooth LE production test
tree
Figure 8-1 shows Bluetooth test tree. BT_xx(TYPE))_xx(TestMode)_Reference.xtt test tree is
located on the local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\BT

Figure 8-1 Sample Bluetooth production test tree

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

66

Wireless Connectivity Tests User Guide

QSPR Test Trees

8.2 WLAN production test trees
Figure 8-2 and Figure 8-3show a WLAN test tree. The WLAN_xx(chipset)_Production.xtt test
tree is located on the local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\WLAN

Figure 8-2 Sample WLAN production test tree part I

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

67

Wireless Connectivity Tests User Guide

QSPR Test Trees

Figure 8-3 Sample WLAN production test tree part II

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

68

Wireless Connectivity Tests User Guide

QSPR Test Trees

8.3 FM production test trees
Figure 8-4 shows a WLAN test tree. FM_xx(chipset)_Production.xtt test tree is located on the local PC at
C:\QUALCOMM\WCN\ProdTests\TestTrees\FM

Figure 8-4 Sample FM production test tree

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

69

Wireless Connectivity Tests User Guide

QSPR Test Trees

8.4 ANT production test tree
Figure 8-5 shows an ANT test tree. ANT_xx(chipset)_Production.xtt test tree is located on the
local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\ANT

Figure 8-5 Sample ANT production test tree

8.5 Bluetooth signaling + Bluetooth LE production test tree
Figure 8-6 shows Bluetooth test tree. BT_xx(TYPE))_xx(TestMode)_Reference.xtt test tree is
located on the local PC at C:\QUALCOMM\WCN\ProdTests\TestTrees\BT

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

70

Wireless Connectivity Tests User Guide

QSPR Test Trees

Figure 8-6 Sample Bluetooth signaling test tree

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

71

Wireless Connectivity Tests User Guide

QSPR Test Trees

8.6 NFC production functional test tree
Figure 8-7 shows the NFC Functional test tree. NFC_Functional.xtt test tree is located on the
local PC at C:\QUALCOMM\WCN\ProdTests\Test Trees\NFC

Figure 8-7 NFC Functional test tree

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

72

Wireless Connectivity Tests User Guide

QSPR Test Trees

8.7 NFC production reference test tree
Figure 8-8 shows the NFC reference test tree. NFC_Test_Reference.xtt test tree is located on the
local PC at C:\QUALCOMM\WCN\ProdTests\Test Trees\NFC

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

73

Wireless Connectivity Tests User Guide

QSPR Test Trees

Figure 8-8 Sample NFC Reference Tree

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

74

9 Test Setup Details

This section lists the initialization tests required for wireless connectivity tests. These tests are
“setup tests” that are performed to setup the device under test and test equipment before actual
functional tests are performed.

9.1 Bluetooth initialization and de-initialization tests
This section applies to Bluetooth and Bluetooth Low energy setup tests that are done before
performing core non-signaling functional tests as described in section 10.1.
Sample section of Bluetooth DUT and tester initialization test tree looks like as shown in
Figure 9-1. A sample section of Bluetooth shutdown test tree is shown in Figure 9-2.

9.1.1 Bluetooth initialization

Figure 9-1 Sample Bluetooth test initialization


BTDUT_SetBTConfigFile
This test sets the path of Bluetooth configuration file. Refer to section 9.1.2 for details.



BTDUT_Connect
This test connect to the device under test. HCI reset after successfully connection is optional
(This test requires Bluetooth FTM running).



BTDUT_LoadNVMFile (only applicable to standalone device, if required by chipset)
This test sets NVM file location and downloads NVM to the device under test.



BTDUT_PatchFirmware (only applicable to standalone device, if required by chipset)
This test sets firmware patch file location and downloads firmware patch to the device under
test.



BTDUT_ FFA_DisableLegacyLogMode(only applicable to FFA/MTP based device)
This test sets disables legacy DIAG log for Bluetooth



SetStationCalibrationFile
This test sets the location of station calibration file used for testing

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

75

Wireless Connectivity Tests User Guide



Test Setup Details

SetInstrumentConfigFile
This test sets the tester configuration file path



InitializeBTTester_NonSignaling
This test initializes Bluetooth non-signaling test box based on the ResourceID listed in
instrument configuration file.



InitializeBTTester_Signaling
This test initializes Bluetooth signaling test box based on the ResourceID listed in instrument
configuration file.

9.1.2 Bluetooth configuration file details
Bluetooth configuration section is listed in
C:\Qualcomm\WCN\ProdTests\ConfigFiles\Sample\BluetoothDUTConfig_Sample.xml.
NOTE:

80-Y0306-1 Rev. L

Please copy and rename BluetoothDUTConfig_Sample.xml to
C:\Qualcomm\WCN\ProdTests\ConfigFiles\BluetoothDUTConfig.xml before running QSPR
Bluetooth tests.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

76

Wireless Connectivity Tests User Guide

Test Setup Details

Figure 9-2 Bluetooth DUT configuration file


ConnectionType
This field configures the transport/protocol type for device under test. Valid options:





DIAG – MSM/MDM or APQ based targets



SERIAL – UART based devices



USB – USB based devices

TargetType
This option is only valid when ConnectionType is DIAG. Valid options:

80-Y0306-1 Rev. L



MSM/MDM – when target type is MSM or MDM



APQ – when target type is APQ

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

77

Wireless Connectivity Tests User Guide



Test Setup Details

PhoneComport
This option is only valid when ConnectionType is DIAG. Valid options:





AUTO – auto detects the first available connected device



COMx – (example: COM23)

useQPST
This option is only valid when ConnectionType is DIAG. Valid options:





Yes



No

PhoneAutoDetectTimeoutMs
This option is only valid when ConnectionType is DIAG. This timeout is used for auto
detecting the COM port.



Comport
This option is only valid when ConnectionType is SERIAL.




COMx (example: COM9)

BaudRate
This option is only valid when ConnectionType is SERIAL.




Device and PC support baud rate. Example : 115200

USBConnectionInfo
This option is only valid when ConnectionType is USB.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

78

Wireless Connectivity Tests User Guide

Test Setup Details

9.1.3 Bluetooth de-initialization

Figure 9-3 Sample Bluetooth de-initialization


DisconnectBTester_NonSignaling
This test disconnects to the non-signaling tester and releases any resources used by the tester



DisconnectBTester_Signaling
This test disconnects to the signaling tester and releases any resources used by the tester



BTDUT_Disconnect
This test disconnects to the Bluetooth DUT

9.1.4 Bluetooth UART/USB test setup using BT DIAG BRIDGE
NOTE:

This mode requires QPST running
This section summarizes setup details for running QSPR/QRCT tests in UART/ USB mode for
standalone devices.
QC.BT.DIAG.BRIDGE.exe application gets installed on PC at C:\Program Files
(x86)\Qualcomm\QDART\bin
To set up BT DIAG BRIDGE, use the following sequence.

QPST configuration
1. Open QPST configuration

Figure 9-4 BT Diag Bridge - opening QPST

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

79

Wireless Connectivity Tests User Guide

Test Setup Details

2. Navigate to “IP Server” tab
3. Under “IP Address” select “Use PC IP Address” to connect to local machine
4. Under Server Port select “Use specified port number”, example 2500
5. Check “Accept Client connections”

Figure 9-5 BT Diag Bridge - setup QPST IP address and port number
6. Open a command line
7. Navigate to C:\Program Files (x.86)\Qualcomm\QDART\bin.
8. Run QC.BT.DIAG.BRIDGE.exe with various command line arguments.
Note: No spaces are allowed in between ‘=’. Command line arguments are not case sensitive.
Refer to the following example, arguments in bold are mandatory.
QC.BT.DIAG.BRIDGE.exe IPAddress=192.168.1.1 Port=2500 IOType=SERIAL
ConnectionDetails=COM13 Handshake=none Baudrate=115200 Patch=C:\xxx.img
NVM=c:\xxx.nvm

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

80

Wireless Connectivity Tests User Guide

Test Setup Details

Figure 9-6 Running BT DIAG BRIDGE
Command line arguments


IPAddress (optional, default = localhost)
Use same ipaddress listed in QPST as shown in Figure 9-5, QPST is running on the same
machine one can use “localhost” too.



Port (optional, default = 2500)
Use the same port number listed in QPST as shown in Figure 9-5.







IOType
–

SERIAL (for UART based devices)

–

USB (for USB based devices)

ConnectionDetails
–

COMxx (applicable in UART/SERIAL connection type, example COM96)

–

\\.\ATH0 (applicable for USB connection type only)

Baudrate (optional, only applicable in SERIAL mode)
–



80-Y0306-1 Rev. L

115200 (default)

Handshaking (optional, only applicable in SERIAL mode)
–

NONE (default)

–

XONXOFF

–

RequestToSend

–

RequestToSendXONXOFF

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

81

Wireless Connectivity Tests User Guide



Patch (optional, only applicable in SERIAL mode)
–



Test Setup Details

Location for patch file on PC

NVM (optional, only applicable in SERIAL mode)
–

Location of NVM file on PC

9. After QC.BT.DIAG.BRIDGE.exe is successfully started, QSPT will list a COM3000x
comport as shown in Figure 9-7.

Figure 9-7 BT Diag Bridge - QPST comport listing
10. The comport listed in Figure 9-7 can be used to configure QSPR Bluetooth test or
QRCT/QMSL DUT connection.


Configuring QSPR tests in this mode.
–

Update BluetoothDUTConfig.xml as shown in section 9.1.2.

–

Confirm “ConnectionType” in config file is “DIAG.”

–

Confirm “PhoneComport” lists the same comport as shown in Figure 9-7, e.g.,
“COM30001.”

9.1.5 Bluetooth User Defined Transport (UDT) test setup using BT
DIAG BRIDGE
This section summarizes setup details for running QSPR tests in UDT mode for standalone
devices.
QMSL_BT_Transport.dll gets installed on C:\Program Files (x86)\Qualcomm\QDART\BIN
QC.BT.DIAG.BRIDGE.exe application gets installed on C:\Program Files
(x86)\Qualcomm\QDART\bin
NOTE:

80-Y0306-1 Rev. L

For testing DUT connected to remote PC, the two files are in the same location in remote PC.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

82

Wireless Connectivity Tests User Guide

Test Setup Details

Figure 9-8 Connect DUT using DUT type and connection options

Figure 9-9 Input parameters of ConnectDutUsingDutType

Input parameters to use for UDT mode:
TargetType
This field configures the target type for device under test. Valid options:


0 QLIB_TARGET_TYPE_MSM_MDM– MSM/MDM based targets



1 QLIB_TARGET_TYPE_APQ– APQ based devices



2 QLIB_TARGET_TYPE_X86_STANDALONE – Standalone/SoC based devices

resourceID
This field configures the unique target resource ID for different DUTs.


For MSM/MDM and APQ based devices, it can be AUTO or exact comport of the device.
AUTO mode will pick up first device in QPST list



For Standalone devices, its resourceID is formed by several parameters. As an example:
iotype=serial,connectiondetails=com8,port=2390,ipaddress=127.0.0.1


iotype:
serial – UART based devices
usb – USB based devices



connectiondetails:
comx – This option is the physical comport that DUT connects to the PC, it is only valid
when iotype is SERIAL
\\.\ATHx – This option is the physical usb port that DUT connects to the PC, it is only
valid when iotype is USB



port:
TCP IP port of the PC or remote PC (if applicable).



ipaddress:
TCP IP address of the local PC, ipaddress. If DUT is connected to the same PC one can
either ignore this or set it 127.0.0.1.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

83

Wireless Connectivity Tests User Guide

Test Setup Details

For running in remote PC, TCP IP address cannot be omitted and is required to provide
IP address of the remote PC.
NOTE:

No spaces are allowed in the resourceID. Command line arguments are not case sensitive. Refer
example, arguments in bold are mandatory and each argument is separated by coma.
UseQPST




True means DUT connection uses QPST, QPST installer – Refer to [Q6] in Qualcomm
documents of section 1.4.1
False means DUT connection uses UDT as the dll is defined below.

userDefinedTransport


User Defined transport dll name; used only on Standalone configuration.

9.1.6 Additional configuration for remote DUT using User Defined
Transport and BT DIAG BRIDGE on remote PC.



BT DIAG BRIDGE must be executed in remote PC before running QSPR on local machine.
Command line for BT DIAG BRIDGE must add one additional parameter “udt=yes,
iotype=serial,connectiondetails=com8,port=2390,ipaddress=127.0.0.1” before other
command line arguments. As shown in Figure 9-10.

Figure 9-10 Remote PC connects to DUT using UDT

9.2 WLAN setup and initialization tests
There are three initialization tests that need to be executed before running WLAN Production
Tests described in section 10.1.12.
These three tests are grouped under the folder “Init WLAN” as shown in Figure 9-11 and deinitialization is shown in Figure 9-12.

9.2.1 WLAN initialization

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

84

Wireless Connectivity Tests User Guide

Test Setup Details

Figure 9-11 Sample WLAN test initialization

Figure 9-12 Sample WLAN test initialization with user Transport DLL


InitializeWlanTester


This test makes the connection with the Wlan Tester and initializes the Wlan Tester
specified by “WlanTesterResourceID”



WlanTesterResourceID must match the item value described in Section 7.3.
WLANTester

Table 9-1 Initialize Wlan tester parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

testerConfigFileName

C:\Qualcomm\WCN\ProdTests\
ConfigFiles\WCNTesterConfig.xml

Full path name of configuration
file

stationCalFileName

C:\Qualcomm\WCN\ProdTests\
StationCal\ QTA_CalDataFile.xml

Full path name of station
calibration file

WlanTesterResoureID

WLANTester

WLAN Tester resource name as
it appears in config file

TxStationCalPathName

WCD

Tx Station cal path name as it
appears in station cal file

RxStationCalPathName

WCD

Rx Station cal path name as it
appears in station cal file

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

85

Wireless Connectivity Tests User Guide



Test Setup Details

ConnectDut




This test makes the connection to the DUT specified by “wlanId” through COM port via
QPST.
DUT must be set up for WLAN FTM communication before this test can run

Table 9-2 Connect DUT parameters
Parameter Name

Value

Unit

Description

Type

0 QLIB_TARGET_TYPE_MSM_MDM

Select target type MSM or APQ

wlanId

3680

WLAN ID.

comPort

AUTO

Com port number or “AUTO”

useQPST

True

True: Use QPST, False: talk
directly to com port

Table 9-3 Connect DUT with user transport DLL parameters
Parameter Name

Value

Unit

Description

Type

1 QLIB_TARGET_TYPE_APQ

Select target type MSM or APQ

wlanId

6174

WLAN ID.

comPort

127.0.0.1

IP or 127.0.0.1 for user
TransportDLL

userTransPortDll

QMSL_WLAN_Transport.dll

User Defined Transport DLL
name with folder path, or dll
name only with default path at
where QMSL_MSVC DLL is
located.

Table 9-4 WLAN DUT load
Parameter
Name

Value

Unit

Description

DevDLLName

QC6174

Device dll name (less than 30
characters)

refDesign

QC6174

refDesign

eepFName

C:\QUALCOMM\WCN\ProdTests\
refDesigns\BoardData\
fakeBoardData_AR6320.bin

eep file name with path (less
than 250 characters)

iNVMemOption

3 DataOtp

NV memory Option

ssid

0x3e

Device ID

9.2.2 WLAN de-initialization

Figure 9-13 Sample WLAN test de-initialization

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

86

Wireless Connectivity Tests User Guide



Test Setup Details

DisconnectWlanTester
This test disconnects to the tester and releases any resources used by the tester.



DisconnectPhone
This test disconnects to the DUT and closes QPST server.

9.3 FM setup and initialization tests
9.3.1 FM initialization

Figure 9-14 Sample FM tester initialization


SetInstrumentConfigFile
This test sets the FM tester configuration file path.



SetStationCalibrationFile
This test sets the location of station calibration file used for FM testing.



SetFmStationCalPathname
This sets the default name of station calibration path name specified in station calibration
path loss file to be used for FM tests. This may be reset later on in the test tree.



ConnectToFmTester
This test makes the connection with the FMTester and initialize the FM tester specified by the
“FMResourceID”. The FMTesterResourceID must match the  value specified by
 described in section 7.4.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

87

Wireless Connectivity Tests User Guide

Test Setup Details

9.3.2 FM RX initialization

Figure 9-15 Sample FM RX initialization


ConnectPhone






FM_Rx_InitReceiver


This test disables FM TX, if it was enabled. It then calls FTM command
FTM_FM_RX_ENABLE_RECEIVER with input parameters RadioBand, Emphasis,
ChSpacing, RdsStd, UserDefinedBandFreqMin, and UserDefinedBandFreqMax. If this
command completes successfully, it then waits some delay (see parameter
DelayAfterEnable) and then exits.



If the Enable command returns an error status, the test then tries FTM command
FTM_FM_RX_CONFIGURE_RECEIVER with the same 6 parameters. This is done
because on WCN2243 platforms, the Enable command can only be done once.
Subsequent calls of the Enable command do no harm, but they return a bad status. So in
order to determine if the FM receiver is ready for test, the Configure command is called
after bad status is returned by the Enable command.

FTM_FM_Rx_ConfigureReceiver




This calls FTM command FTM_FM_RX_SET_SOFTMUTE to disable soft muting. Soft
mute is disabled because it makes it more difficult to perform accurate audio
measurements at low RF signal levels.

FTM_FM_AUDIO_SetPath


80-Y0306-1 Rev. L

This calls FTM command FTM_FM_RX_SET_STATION to set an initial frequency.

FTM_FM_Rx_SetSoftMuteMode




This calls FTM command FTM_FM_RX_SET_ANTENNA to select either the headset
FM antenna or the PWB FM antenna.

FTM_FM_Rx_SetStation




This calls FTM command FTM_FM_RX_CONFIGURE_RECEIVER.

FTM_FM_Rx_SetAntenna




This test connects to the phone DIAG port. The COM port can be specified or auto
detection can be used.

This calls FTM command FTM_AUDIO_SET_PATH with a path value that directs FM
RX audio to the headset port.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

88

Wireless Connectivity Tests User Guide

Test Setup Details

9.3.3 FM TX initialization
This folder contains items to configure the DUT and tester for testing FM TX on the PWB
antenna port.

Figure 9-16 Sample FM TX initialization


SetFmStationCalPathname






FM_Tx_InitTransmitter


This test disables FM RX, if it was enabled. It then calls FTM command
FTM_FM_TX_ENABLE_TRANSMITTER with input parameters RadioBand,
Emphasis, ChSpacing, RdsStd, UserDefinedBandFreqMin, and
UserDefinedBandFreqMax. If this command completes successfully it waits some delay
(see parameter DelayAfterEnable) and exits



If the Enable command returns an error status, the test then tries FTM command
FTM_FM_TX_CONFIGURE_TRANSMITTER with the same 6 parameters. This is
done because on WCN2243 platforms the Enable command can only be done once.
Subsequent calls of the Enable command do no harm but they return a bad status. In
order to determine if the FM transmitter is ready for test, the Configure command is
called after bad status is returned by the Enable command

FTM_FM_Tx_SetStation




This test sets the name of station calibration path name specified in station calibration
path loss file to be used for FM TX tests

This calls FTM command FTM_FM_TX_SET_STATION to set an initial frequency

FTM_FM_Tx_SetInternalTone


This calls FTM command FTM_FM_TX_SET_INTERNAL_TONE to select an audio
tone for modulating TX. The tone used is 1 kHz at full scale (0 dBFS) with Left=Right

9.3.4 FM de-initialization

Figure 9-17 Sample FM de-initialization


DisconnectPhone




80-Y0306-1 Rev. L

This test disconnects to the Bluetooth DUT and closes QPST server

DisconnectFmTester
MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

89

Wireless Connectivity Tests User Guide



Test Setup Details

This test disconnects to the tester and releases any resources used by the tester

9.4 ANT setup and initialization tests
9.4.1 ANT initialization

Figure 9-18 Sample ANT test initialization


SetInstrumentConfigFileName
This test sets the ANT tester configuration file path



SetCalibrationFileName
This test sets the location of station calibration file used for ANT testing



SetResourceForISpectrumAnalyzer_OneButtonMeasurement
This test initializes the spectrum analyzer specified by the parameter “ResourceID”.



SetResourceForISignalGenerator_arb
This test initializes the signal generator specified by the parameter “ResourceID”.



ConnectPhone
This test connects to the device under test.

9.4.2 ANT De-initialization

Figure 9-19 Sample ANT test de-initialization


DisconnectPhone
This test disconnects from the DUT and closes QPST server

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

90

Wireless Connectivity Tests User Guide

Test Setup Details

9.5 NFC initialization and deinitialization
This section describes the setup and initialization tests that need to be run before running any
functional tests.
This is a screen shot of the initialization section of the tree.

9.5.1 NFC setup config



SetInstrumentConfigFile
This test sets the path for the NFC tester/equipment config file and loads it. NFC testers (if
applicable) and power supply (if applicable)will be set by this config file.



NFCDUT_SetConfigFile
This test sets the path for the DUT configuration file and loads it. Config items related to the
DUT type (SoC/phone) and connection related parameters

9.5.2 NFC DUT configuration file details
NFC configuration file is installed at the following location
C:\Qualcomm\WCN\ProdTests\ConfigFiles\Sample\NFCDUTConfig.xml.
Copy NFCDUTConfig.xml to C:\Qualcomm\WCN\ProdTests\ConfigFiles\NFCDUTConfig.xml
before running QSPR NFC tests.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

91

Wireless Connectivity Tests User Guide

Test Setup Details

Figure 9-20 NFC DUT Configuration file



ConnectionType
This field configures the transport/protocol type for device under test. Valid options:





DIAG – MSM/MDM or APQ based targets



SERIAL – UART based devices (standalone EVK/EVB etc)

TargetType (Phone type DUT)
This option is only valid when ConnectionType is DIAG. Valid options:





MSM/MDM – when target type is MSM or MDM



APQ – when target type is APQ

PhoneComport (Phone type DUT)
This option is only valid when ConnectionType is DIAG. Valid options:





AUTO – auto detects the first available connected device



COMx – (example: COM23)

useQPST
This option is only valid when ConnectionType is DIAG. Valid options:

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

92

Wireless Connectivity Tests User Guide





Yes



No

Test Setup Details

PhoneAutoDetectTimeoutMs
This option is only valid when ConnectionType is DIAG. This timeout is used for auto
detecting the COM port.



Comport (SoC only)
This option is only valid when ConnectionType is SERIAL. This port will be used to open
the NFC port on the device.




COMx (example: COM9)

BaudRate
This option is only valid when ConnectionType is SERIAL.




Device and PC support baud rate. Example : 57600

Slave1_Address_NCI
This option is only valid when ConnectionType is SERIAL. This is the I2C slave address (in
hex) used to send the NCI commands.




Device and PC support baud rate. Example : 2C

Slave0_Address_TopLevel
This option is only valid when ConnectionType is SERIAL. This is the I2C slave address in
hex used for I2C writes and for bring up script.


Device and PC support baud rate. Example : 0E

9.5.3 NFC DUT Initialization



NFCDUT_Instantiate
This test instantiates the DUT type as set in the config file.



DUT_InitFramework
This test starts up the test framework. This test also sets the path for the folder that contains
installed TCL files/binaries.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

93

Wireless Connectivity Tests User Guide



Test Setup Details

NFCDUT_RunTopLevelScript (only applicable to standalone device, if required by chipset)
This test runs the initialization TCL script to start up the development board.



NFCDUT_Connect
This test connect to the device under test using the connection details specified in the NFC
DUT config file.



NFCDUT_CoreResetAndInit
This test sends a NFC core reset command followed by a core init command. For phone type
DUT, NFC FTM daemon needs to be running for this test.



NFCDUT_PatchFirmwareUsingPatchFile (only applicable to standalone device, if required
by chipset)
This test sets firmware patch file location and downloads firmware patch to the device under
test.

9.5.4 NFC de-initialization



NFCDUT_Disconnect
This test disconnects the DUT and releases all the COM ports used by the test.



NFCDUT_Shutdown
This test releases all the resources used by the test suite framework.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

94

10 Wireless Connectivity Test Description

10.1 Bluetooth non-signaling production test description
This section summarizes limits and parameters captured for Bluetooth RF functional tests in
operations. All the productions Bluetooth tests are performed at three channels 0, 39, 78.

10.1.1 Set Bluetooth ChipID
This test is performed for configuring BT chip ID.
Table 10-1 and Table 10-2 list the input and output parameters for this test.
Test Name: BTDUT_SetBluetoothChipID
Test Condition: None
Table 10-1 Set Bluetooth ChipID input parameters
Parameter Name

Value

BluetoothChipID

0

Unit

Description
Bluetooth Chip ID = 0, for WCN2243 and
WCN36xx , = 3002, for AR3002 chipset

Table 10-2 Set Bluetooth ChipID output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

NA

Description
error messages

10.1.2 BTDUT_FFA_DisableLegacyLogMode
This test is performed for supporting Bluetooth legacy log.
Table 10-3 and Table 10-4 list the input and output parameters for this test.
Test Name: BTDUT_FFA_DisableLegacyLogMode
Test Condition: None
Table 10-3 BTDUT_FFA_DisableLegacyLogMode input parameters

80-Y0306-1 Rev. L

Parameter Name

Value

disableLegacyLogMode

True

Unit

Description
Disable legacy log mode = true, Enable
legacy log mode = false

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

95

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-4 BTDUT_FFA_DisableLegacyLogMode output parameters
Parameter Name

Lower Limit

Upper Limit

errorMessage

Unit
NA

Description
error messages

10.1.3 Setup DUT for GFSK and EDR transmit tests
This test is performed for configuring device under test for GFSK and EDR transmit tests.
Table 10-5 and Table 10-6 list the input and output parameters for this test.
Test Name: BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST
Test Condition: Normal
Table 10-5 BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST input
parameters
Parameter Name

Value

Unit

Description

TxChannel

0

NA

Channel range (0-78)

PacketType

BT_DH1

NA

Bluetooth packet type

TransmitPattern

PSEUDO_RANDOM

NA

Bluetooth transmit pattern

PowerLevel

9

NA

Bluetooth Power Level
(WCN36x0/WCN2243 = 0-9, AR3002 =
0-7

BluetoothAddress

BD,35,9C,BD,35,9C

NA

Bluetooth Address, comma separated,
example = BD,35,9C,BD,35,9C

Table 10-6 BTDUT_PROD_TEST_SUBCOMMAND_TEST_TX_BURST output
parameters
Parameter Name

Lower Limit

Upper Limit

errorMessage

Unit

Description

NA

error messages

10.1.4 Setup DUT for LE transmit tests
This test is performed for configuring device under test for LE transmit tests. Table 10-7 and
Table 10-8 list the input and output parameters for this test.
Test Name: BTDUT_LE_TX_Command
Test Condition: Normal
Table 10-7 BTDUT_LE_TX_Command input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

TxChannel

0

NA

Tx Channel (Range - 0-78, even only)

PayloadLength

37

Byte(s)

Payload length

TransmitPattern

PN_9

NA

TransmitPattern

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

96

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-8 BTDUT_LE_TX_Command output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

errorMessage

Error message

10.1.5 Measure Tx output power and initial carrier frequency tolerance
This test verifies and measures transmitter power and carrier frequency tolerance. Table 10-9 and
Table 10-10 list the input and output parameters for this test.
Test Name: Measure_OutputPower_InitialCarrierFrequencyTolerance
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-9 Measure Tx output power and initial carrier frequency tolerance input
parameters
Parameter name

Value

Unit

Description

TxChannel

78

NA

TX channel (0-78)

PacketType

BT_DH1

NA

Bluetooth Packet Type

Table 10-10 Measure output power and initial carrier frequency tolerance output
parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
error message from test

Power

-4

13

dBm

Transmit power in dBm

FrequencyDeviation

-75

75

KHz

Frequency deviation KHz

10.1.6 Measure GFSK modulation DeltaF2 and CarrierDrift
This test verifies and measures transmitter delta F2 and carrier frequency drift. Table 10-11 and
Table 10-12 list the input and output parameters for this test.
Test Name: Measure_GFSK_Modulation_DeltaF2_CarrierDrift
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-11 Measure GFSK modulation DeltaF2 and CarrierDrift input parameters
Parameter Name
TxChannel

80-Y0306-1 Rev. L

Value
78

Unit
NA

Description
Bluetooth Tx Channel
(0-78)

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

97

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-12 Measure GFSK modulation DeltaF2 and CarrierDrift output
parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
error message from test

DeltaF2Max

115

300

KHz

Delta F2 Max in KHz

FrequencyDrift

-40

45

KHz

Frequency drift in KHz

10.1.7 Measure GFSK modulation DeltaF1
This test verifies and measures transmitter delta F1. Table 10-13 and Table 10-14 list the input
and output parameters for this test.
Test Name: Measure_GFSK_Modulation_DeltaF1
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-13 Measure GFSK modulation DeltaF1 input parameters
Parameter Name

Value

TxChannel

Unit

78

Description

NA

Bluetooth Tx Channel (0-78)

Table 10-14 Measure GFSK modulation DeltaF1 output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage
DeltaF1Average

Description
error message from test

140

175

KHz

Delta F1 in KHz

10.1.8 Measure EDR modulation
This test verifies and measures transmitter average and peak DEVM. Table 10-15 and Table 1016 list the input and output parameters for this test.
Test Name: Measure_EDRModulation
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-15 Measure EDR modulation input parameters
Parameter Name

Value

Unit

Description

TxChannel

0

NA

Bluetooth Tx Channel (0-78)

PacketType

BT_2_DH5

NA

Bluetooth Packet Type
This test is only valid for EDR packet types.

Table 10-16 Measure EDR modulation output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

98

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Lower Limit

Upper Limit

EDRAverageDEVM

0

0.2

EDRPeakDEVM

0

0.35

Unit

10.1.9 Measure LE Tx output power
This test verifies and measures LE transmitter power. Table 10-17 and Table 10-18 list the input
and output parameters for this test.
Test Name: Measure_LE_TxOutputPower
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-17 Measure LE Tx output power input parameters
Parameter Name

Value

TxChannel

0

Unit
NA

Description
TX Channel, only even channel in BLE

Table 10-18 Measure LE Tx output power output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage
AvgPower

Description
error message from test

-4

15

dBm

Average LE Power in dBm

10.1.10 Measure LE modulation DeltaF1
This test verifies and measures LE transmitter delta F1. Table 10-19 and Table 10-20 list the
input and output parameters for this test.
Test Name: Measure_LE_Modulation_DeltaF1
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-19 Measure LE modulation DeltaF1 input parameters
Parameter Name

Value

TxChannel

0

Unit
NA

Description
TX Channel, only even channel in BLE

Table 10-20 Measure LE modulation DeltaF1 output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage
DeltaF1Average

80-Y0306-1 Rev. L

Description
error message from test

225

275

KHz

Delta F1 average in KHz

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

99

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.1.11 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and
MaxDriftRate
This test verifies and measures LE transmitter delta F2, frequency offset, frequency drift and max
drift rate. Table 10-21 and Table 10-22 list the input and output parameters for this test.
Test Name: Measure_LE_Modulation_DeltaF2_FreqOffset_FreqDrift_MaxDriftRate
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-21 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and
MaxDriftRate input parameters
Parameter Name

Value

TxChannel

Unit

0

Description

NA

TX Channel, only even channel in BLE

Table 10-22 Measure LE modulation DeltaF2, FreqOffset, FreqDrift and
MaxDriftRate output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
error message from test

DeltaF2

185

500

kHz

Delta F2 in kHz

FrequencyOffset

-150

150

kHz

FrequencyOffset

FrequencyDrift

-50

50

kHz

Frequency drift

MaxDriftRate

0

20

kHz/μs

Max drift rate

10.1.12 Measure Rx sensitivity/max input
This test verifies sensitivity/Max Input at a given power and measures BER %. Table 10-23 and
Table 10-24 list the input and output parameters for this test.
Test Name: Measure_RxSensitivity
Test Condition: Normal
Loop Condition: Rx Channel
Table 10-23 Measure Rx sensitivity input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

RxChannel

0

StartPowerdBm

-70

dBm

RX channel (0-78)
Start Test RX power from VSG,
if Start and Stop are same it acts
like GoNoGo

StopPowerdBm

-70

dBm

Stop Test RX power from VSG, if
Start and Stop are same it acts
like GoNoGo

PacketType

BT_DH5

NA

Bluetooth Packet Type

MinimumCoarseNumberOfPackets

100

NA

Minimum coarse number of
packets required for test

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

100

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Value

Unit

Description

MinimumFineNumberOfPackets

1000

NA

Minimum fine number of packets
required for test

fineStepSize

0.5

dB

step size for BER fine search
loop

coarseStepSize

1

dB

step size for BER coarse search
loop

ReceiverTestType

Sensitivity

NA

RX Test Type:
 Sensitivity
 MaxInput

Table 10-24 Measure RxSensitivity output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
Error message

BER

0

0.1

%

BER in percent

RxSensitivityPowerdBm

-70

-70

dBm

Sensitivity level

10.1.13 Measure LE Rx sensitivity/max input
This test verifies sensitivity/Max input at a given power and measures PER %. Table 10-25 and
Table 10-26 list the input and output parameters for this test.
Test Name: Measure_LE_RxSensitivity
Test Condition: Normal
Loop Condition: Rx Channel
Table 10-25 Measure LE Rx sensitivity input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

RxChannel

0

RX channel (0-78),only even
channels in BLE

StartPowerdBm

-70

dBm

Start Test RX power from VSG,
if Start and Stop are same it acts
like GoNoGo

StopPowerdBm

-70

dBm

Stop Test RX power from VSG, if
Start and Stop are same it acts
like GoNoGo

CoarseNumberOfPackets

500

Minimum coarse number of
packets required for test

FineNumberOfPackets

2000

Minimum fine number of packets
required for test

fineStepSize

0.5

dB

step size for PER fine search
loop

coarseStepSize

2.0

dB

step size for PER coarse search
loop

WaveformKey

LE1a

NA

Waveform key in the tester
config XML file

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

101

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Value

Unit

Description

PacketIntegrity

False

LE packet integrity is on or off,
not valid if using waveforms

ReceiverTestType

Sensitivity

RX Test Type: :
 Sensitivity
 MaxInput

Dirty

0

Dirty mode, not valid if using
waveforms

Table 10-26 Measure LE Rx sensitivity output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

errorMessage

Error message

BER

0

0.1

%

BER in percent

RxSensitivityPower

-70

-70

dBm

Rx Sensitivity in dBm

10.1.14 Set BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST
This test configures the device under tests in receive mode for performing non-signaling Rx tests.
Table 10-27 and Table 10-28 list the input and output parameters for this test., if tests can be used
to configure AR3002 receiver.
Test Name: BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST
Test Condition: Normal
Table 10-27 BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST input
parameters
Parameter Name

Value

Unit

Description

RxChannel

0

NA

Channel range (0-78))

BluetoothAddress

BD,35,9C,BD,35,
9C

NA

Bluetooth Address, comma
separated, example =
BD,35,9C,BD,35,9C

PacketType

15

NA

Bluetooth packet type

LTAddress

0

NA

Bluetooth LT/AM Address

Table 10-28 BTDUT_PROD_TEST_SUBCOMMAND_TEST_RX_BURST output
parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
Error message

10.1.15 BTDUT_PROD_TEST_HCI_GET_PER_AR3002
NOTE:

This test is only valid when ChipID = 3002
This test verifies gets receiver statistics from device under tests. Table10-29 and Table 10-30 list
the input and output parameters for this test.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

102

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Test Name: BTDUT_PROD_TEST_HCI_GET_PER_AR3002
Test Condition: Normal
Table10-29 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 input parameters
Parameter Name

Value

PacketType

Unit

BT_DH5

Description
Bluetooth packet type

Table 10-30 BTDUT_PROD_TEST_HCI_GET_PER_AR3002 output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
error message
from test

PacketsReceived

NA

Total packets
received

PacketsWithCRCErrors

NA

Total CRC
packets received

10.2 WLAN production test description (SISO Only)
10.2.1 SetUpDutTx
Table 10-31 SetUpDutTx parameters
Parameter Name

Value

Unit

Description

channel

1

WLAN Channel

cbState

0 none

Channel Bonding State 0:HT20, 1-3:HT40, 410:VHT80

Rate

3
RATE_11MBs

TX Data Rate

Short11b_nGuard

False

pwrMode

2 SCPC

powerLevel

10.0

dBm

TX Power Level

gain

2

unitless

RF Gain (open loop power control mode only)

digitalGain

0

unitless

Digital Gain (open loop power control mode
only)

dpdMode

False

boolean

True: Enable DPD (WCN36x0 targets only)

payloadSize

500

bytes

Payload size in bytes

txChain

1

boolean

True: 11b short or 11n/11ac short guard
TX Power Control Mode

TX Chain to transmit on

10.2.2 WlanTxEvmTest
This test measures transmit modulation accuracy. Table 10-32 and Table 10-33 list the input and
output parameters for this test.
Test Name: WlanTxEvmTest
Test Condition: Normal

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

103

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Loop Condition: Channel, Rate
Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI
PXI5644R”, Agilent 4010A”
Table 10-32 TX EVM test input parameters
Parameter Name

Value

Unit

Description

channel

1

powerLevel

10.0

dBm

WLAN Channel
TX Power Level

wlanRate

16

WLAN_RATE

WLAN Rate Enums

chEstimationMethod

preambleOnly

numOfMIMOStream

1

numAverages

3

vsaTriggerLevel

-20

ChannelEstimationOption Enums
unitless

Number of MIMO steams
number of averages

dB

VSA trigger Level

Table 10-33 TX EVM test output parameters
Parameter Name

Lower Limit

evm

-100

Upper Limit
-25

amplErr
dataRateMB

1

135

symbolClockError
freqErr

Unit

Description

dBm

TX EVM

dB

TX Amplitude Error

Mbs

TX Data Rate

PPM

TX Symbol Clock Error

PPM

TX Frequency Error

-20

20

PPM

TX Phase Error

avgTxPower

7

13

dBm

Average TX Power

avgTxPowerDelta

-2

2

dB

TX Power Accuracy

loLeakage

-120

-15

dB

LO Leakage

phaseErr

10.2.3 WlanTxVerifySpectrumTest
This test measures transmit spectrum in terms of carrier center frequency leakage and spectral
flatness. Table 10-34 and Table 10-35 list the input and output parameters for this test.
Test Name: WlanTxVerifySpectrumTest
Test Condition: Normal
Loop Condition: Channel, Rate
Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI
PXI5644R”, Agilent 4010A”
Table 10-34 TxVerifySpectrum test input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

channel

1

WLAN Channel

powerLevel

10.0

dBm

TX Power Level

wlanRate

16

WLAN_RATE

WLAN Rate Enums

chEstimationMethod

preambleOnly

ChannelEstimationOption Enums

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

104

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Value

numOfMIMOStream

1

vsaTriggerLevel

-20

Unit

Description
Number of MIMO steams

dB

VSA trigger Level

Table 10-35 TxVerifySpectrum test output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

carrierNumber

-52

52

Number of Carriers

flatnessMargin

-4

2

dB

Average Power Flatness over
spectrum

loLeakage

-120

-15

dBm

LO Leakage

avgTxPower

7

13

dBm

Average TX Power

10.2.4 WlanTxVerifyPowerTest
This test measures transmit power levels. It measures the maximum, minimum and average TX
power and maximum, minimum and average peak Tx power. Table 10-36 and Table 10-37 list
the input and output parameters for this test.
Test Name: WlanTxVerifyPowerTest
Test Condition: Normal
Loop Condition: Channel, Rate
Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI
PXI5644R”, Agilent 4010A”
Table 10-36 Tx verify power test input parameters
Parameter Name

Value

Unit

Description

channel

1

WLAN Channel

powerLevel

10.0

dBm

TX Power Level

wlanRate

16

WLAN_RATE

WLAN Rate Enums

numOfMIMOStream

1

unitless

Number of MIMO steams

vsaTriggerLevel

-20

dB

VSA trigger Level

Table 10-37 TX verify power test output parameters
Parameter Name

Lower Limit

Upper Limit

txPowerAvg

Description

dBm

Average TX Power

dB

TX Power Accuracy

txPowerMax

dBm

Maximum TX Power

txPowerMin

dBm

Minimum TX Power

txPowerPeak

dBm

Average Peak TX Power

txPowerPeakMax

dBm

Maximum Peak TX Power

txPowerPeakMin

dBm

Minimum Peak TX Power

cableLoss

dBm

Path loss (from cable)

txPowerAvgDelta

80-Y0306-1 Rev. L

Unit

-2

2

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

105

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.2.5 WlanTxVerifyMaskTest
This test measures transmit spectrum mask; it reports whether the WLAN transmit spectrum
complies or fails with the standard WLAN mask. It will also output the worst failure margins and
their associated frequencies. Table 10-38 and Table 10-39 list the input and output parameters for
this test. Note: This test generates a lot of data. “Out of Memory” errors can occur in QSPR if this
test is executed excessively in a loop.
Test Name: WlanTxVerifySpectrumTest
Test Condition: None
Loop condition: Channel, Rate
Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI
PXI5644R”, Agilent 4010A”
Table 10-38 TxVerifyMask test input parameters
Parameter Name

Value

Unit

Description

channel

1

powerLevel

10.0

dBm

WLAN Channel
TX Power Level

wlanRate

16

WLAN_RATE

WLAN Rate Enums

numOfMIMOStream

1

unitless

Number of MIMO steams

vsaTriggerLevel

-25

dB

VSA trigger Level

Table 10-39 TxVerifyMask output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

maskPass

Pass/Fail WLAN Mask

violationPct

Percentage of the mask that
fails

avgTxPower

7

13

dBm

Average TX Power

spectrum

Spectrum Magnitude Array

spectrumFreqs

Spectrum Frequency Array

Mask

Mask Magnitude Array

MaskFreqs

Mask Frequency Array

10.2.6 WlanPerTest
This test measures receiver minimum input sensitivity. It measures the PER of the receiver at the
minimum input sensitivity level: -69 dBm for 2.4GHz; -65 dBm for 5GHz. Table 10-40 and
Table 10-41 list the input and output parameters for this test.
Test Name: WlanPerTest
Test Condition: None
Loop Condition: Channel
Test Equipment: “LitePoint IQ2010, “LitePoint IQxel”, Rohde & Schwarz CMW500”, “NI
PXI5644R”, Agilent 4010A”
80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

106

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-40 WLAN Per test input parameters
Parameter Name

Value

Unit

Description

startPower

-69

dBm

PER Search Start Power

stopPower

-69

dBm

PER Search Stop Power

channel

7

rate

RATE_11N_HT20_MCS7

WLAN_RATE

WLAN Rate Enums

wlanMode

2

WLAN_MODE

WLAN Mode Enums

coursePktCount

2000

number of packets for PER
coarse search loop

finePktCount

10000

number of packets for PER
fine search loop

coarseStepSize

2.0

dB

step size for PER coarse
search loop

fineStepSize

0.5

dB

step size for PER fine search
loop

rxChain

1

WLAN Channel

Rx Chain to test

Table 10-41 WLAN Per test output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

PER

0

10

%

PER at Per Power; must define
Upper Limit

PerPower

-100

0

dBm

Power at which reported PER is
measured

Rssi

-100

0

dBm

Received Signal Strength Indicator

10.2.7 WlanPerSweepTest
This test sweeps receiver’s power with a specified step, measures receiver PER at each input
power steps.
Table 10-42 and Table 10-43 list the input and output parameters for this test.
Test Name: WlanPerSweepTest
Test Condition: None
Loop Condition: Channel
Test Equipment: LitePoint IQ2010 “,“LitePoint IQxel”, “NI PXI5644R”
Table 10-42 WLAN PerSweepTest input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

startPower

-50

dBm

PER Search Start Power

stopPower

-90

dBm

PER Search Stop Power

channel

7

rate

RATE_11N_HT20_MCS7

WLAN_RATE

WLAN Rate Enums

channelBonding

2

WLAN_MODE

WLAN Mode Enums

WLAN Channel number or
FreqMHz

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

107

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Value

Unit

Description

pktCount

200

number of packets for PER
sweep

stepSize

-2.0

rxChain

1

Rx ChainMask to test

perLimit

10

PER limit to compute min and
max passed power

dB

step size for PER sweep

Table 10-43 WLAN PerSweepTest output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

allMeasuredPERs

0

10

%

PER at Per Power; must define
Upper Limit

allPerPowers

-110

0

dBm

Power at which reported PER is
measured

allMeasuredRssis

-100

0

dBm

Received Signal Strength Indicator

minPassPerPower

-100 (rate
dependent)

0

dBm

Min power for PER within upperLimit

maxPassPerPower

-100

0

dBm

Max power for PER within upperLimit

10.2.8 WlanSendRxPacketsTest
This test set VSG to Tx number of packets (numPackets) at specified power level
Table 10-44 list the input parameters for this test.
Test Name: WlanSendRxPacketsTest
Test Condition: None
Loop Condition: Channel
Test Equipment: LitePoint IQ2010 “,“LitePoint IQxel”, “NI PXI5644R”
Table 10-44 WLAN PerSweepTest input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit
dBm

Description

Power

-60

numPackets

1000

Number of packets to send

channel

5210

WLAN Channel number or
FreqMHz

rate

RATE_11N_HT20_MCS7

WLAN_RATE

VSG Tx Power level

WLAN Rate Enums

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

108

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.3 WLAN production test description (MIMO or SISO)
10.3.1 SetUpDutTxDetails
Only applicable to QC98xx, QCA6174
Table 10-45 SetUpDutTxDetails parameters
Parameter Name

Value

Unit

Description

channel

1

WLAN Channel

cbState

0 none

Channel Bonding State 0:HT20, 13:HT40, 4-10:VHT80

Rate

3 RATE_11MBs

TX Data Rate

pwrMode

2 SCPC

TX Power Control Mode

txMode

3 ContTx99

Tx Mode

txChainMask

3 WLAN_CHAIN_12

powerLevel

10.0

dBm

TX Power Level dBm, only for pwrMode
set as one of TxPowerForce

gain

2

unitless

gain index only for pwrMode set as
ForcedGain or ForcedDesiredGain

digitalGain

0

unitless

Digital Gain (open loop power control
mode only) dacGain only for pwrMode
set as ForcedGain or
ForcedDesiredGain

PAcfg

0

payloadSize

1500

bytes

Payload size in bytes

Short11b_nGuard

False

boolean

True: 11b short or 11n/11ac short guard

ldpcRate

False

boolean

True if this is an 11n or 11ac LDPC rate

stbcMode

False

boolean

True if this is an 11n or 11ac stbc mode

aggregation

1

1 to 31

aggregation

dpdMode

Disable

boolean

Enable/Disable PA predistortion

Ifs

1

byte

Interframe space

dutyCycle

10

byte

dutyCycle percentage (not programmed
in this release)

nPattern

4

byte

data frame data pattern enum. If >=6,
data frame will be user defined in pattern
with length of nPattern
(nPattern>=6 not programmed in this
release)

Pattern

1

byte

Used when nPattern >=6, user defined
data pattern with length of nPattern

nPacket

0

byte

0 for continuous Tx
>0 for number of packets Tx send

broadcastMode

True

boolean

True: BroadCastMode

Tx ChainMask to turn on

PA configuration only for QCA6174

pwrMode
ForcedGain 0

80-Y0306-1 Rev. L



TPC_FORCED_GAINIDX = 4

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

109

Wireless Connectivity Tests User Guide

OpenLoopSearch 1

Wireless Connectivity Test Description



not used

TxPowerAuto 2



TPC_TGT_PWR = 1

TxPowerForce_CLPC 3



TPC_TX_PWR = 0

TxPowerForce_SCPC 4



TPC_TX_PWR = 0

TxPowerForce_OLPC 5



TPC_TX_PWR = 0

ForcedDesiredGain 6



TPC_FORCED_GAINIDX = 4

txMode
DisablingContinuousMode = 0,
EnablingContinuousUnmodulatedTX = 1,
EnablingContinuousModulatedTX = 2,
ContTx99 = 3,
ContTx100 = 4,
txChainMask
WLAN_CHAIN_1 = 1,
WLAN_CHAIN_2 = 2,
WLAN_CHAIN_12 = 3,
WLAN_CHAIN_3 = 4,
WLAN_CHAIN_13 = 5,
WLAN_CHAIN_123 = 7,

10.3.2 WlanTxEvmTest_NxN
This test measures transmit modulation accuracy. Table 10-46 and Table 10-47 list the input and
output parameters for this test.
Test Name: WlanTxEvmTest_NxN
Test Condition: Normal
Loop Condition: Channel, Rate
Test Equipment: “LitePoint IQxel”, “NI PXI5644R”
Table 10-46 TX EVM Test NxN input parameters
Parameter Name
rate

Value

Unit
WLAN_RATE

channel

80-Y0306-1 Rev. L

Description
WLAN_DataRate Enums
Center Frequency of Tx Signal

powerLevel

dBm

TX Power Level

vsaTriggerLevel

dBm

VSA trigger Level

chEstimationMethod

ChannelEstimationOption Enums

chainStreamSelection

Chain or stream EVM Selection ( 0 for
chain; 1 for stream )

numAverages

number of samples for averaging

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

110

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-47 TX EVM Test NxN output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

evm[]

-100

-25

dB

TX EVM

evmDataMb

-999

999

Mbs

TX Data Rate

dB

TX Amplitude Error

PPM

TX Symbol Clock Error

PPM

TX Frequency Error

PPM

TX Phase Error

amplErr[]
symbolClockError[]

m

freqErr[]

-20

20

phaseErr[]

Description

avgTxPower[]

7

13

dBm

Average TX Power

avgTxPowerDelta

-2

2

dB

Delta Between Requested And
Measured Tx Power

loLeakage[]

-120

-15

dB

LO Leakage

10.3.3 WlanTxVerifyPowerTest_NxN
This test measures transmit power levels. It measures the maximum, minimum and average TX
power and maximum, minimum and average peak Tx power. Table 10-48 and Table 10-49 list
the input and output parameters for this test.
Test Name: WlanTxVerifyPowerTest_NxN
Test Condition: Normal
Loop Condition: Channel, Rate
Test Equipment: “LitePoint IQxel”, “NI PXI5644R”
Table 10-48 Tx verify power test NxN input parameters
Parameter Name

Value

Unit

Description

rate

Wi-Fi Rate of Tx Signal

channel

MHz

Center Frequency of Tx Signal

powerLevel

dBm

TX Power Level

vsaTriggerLevel

dB

VSA trigger Level

Table 10-49 TX verify power Test NxN output parameters
Parameter Name

Lower Limit

Upper Limit

-2

2

txPowerAvg[]

Description

dBm

Average TX Power

dB

TX Power Accuracy

txPowerMax[]

dBm

Maximum TX Power

txPowerMin[]

dBm

Minimum TX Power

txPowerPeak[]

dBm

Average Peak TX Power

txPowerPeakMax[]

dBm

Maximum Peak TX Power

txPowerPeakMin[]

dBm

Minimum Peak TX Power

cableLoss[]

dBm

Path loss (from cable)

txPowerAvgDelta[]

80-Y0306-1 Rev. L

Unit

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

111

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.3.4 MeasureMask_NxN
This test measures transmit spectral mask; it reports whether the WLAN transmit spectrum
complies or fails with the standard WLAN mask. Table 10-50 and Table 10-51 list the input and
output parameters for this test.
Test Name: MeasureMask_NxN
Test Condition: Normal
Loop Condition: Channel, Rate
Test Equipment: “LitePoint IQxel”, “NI PXI5644R”
Table 10-50 MeasureMask_NxN test input parameters
Parameter Name

Value

Unit

rate

Description
WLAN Rate Enums

channel

MHz

Center Frequency of Tx Singal

powerLevel

dBm

TX Power Level

vsaTriggerLevel[]

dBm

VSA trigger Level

Table 10-51 MeasureMask_NxN test output parameters
Parameter Name

Lower Limit

Upper Limit

maskPass[]

Description

dBm

Pass/Fail WLAN Mask

dB

Percentage of the mask that
fails

freq_at_margin_positive[]

Hz

Frequency At Margin Positive

freq_at_margin_negative[]

Hz

Frequency At Margin Negative

margin_db_positive[]

dB

Margin at Positive

margin_db_negative[]

dB

Margin at Negative

spectrumTrace_1

dB

Spectral Trace Chain 1

spectrumMaskTrace_1

dB

Spectral Mask Trace Chain 1

frequencyList_1

Hz

Frequency List Chain 1

spectrumTrace_2

dB

Spectral Trace Chain 2

spectrumMaskTrace_2

dB

Spectral Mask Trace Chain 2

frequencyList_2

Hz

Frequency List Chain 2

spectrumTrace_3

dB

Spectral Trace Chain 3

spectrumMaskTrace_3

dB

Spectral Mask Trace Chain 3

frequencyList_3

Hz

Frequency List Chain 3

spectrumTrace_4

dB

Spectral Trace Chain 4

spectrumMaskTrace_4

dB

Spectral Mask Trace Chain 4

frequencyList_4

Hz

Frequency List Chain 4

violationPct[]

80-Y0306-1 Rev. L

Unit

-2

2

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

112

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.3.5 MeasureSpectrum_NxN
This test measures transmit spectrum in terms of carrier center frequency leakage and spectral
flatness. Table 10-52 and Table 10-53 list the input and output parameters for this test.
Test Name: MeasureSpectrum_NxN
Test Condition: Normal
Loop Condition: Channel, Rate
Test Equipment: “LitePoint IQxel”, “NI PXI5644R”
Table 10-52 MeasureSpectrum_NxN test input parameters
Parameter Name

Value

Unit

Description

rate

WLAN Rate Enums

channel

1

MHz

Center Frequency of Tx Singal

powerLevel

10.0

dBm

TX Power Level

vsaTriggerLevel[]

-25

dBm

VSA trigger Level

chEstimationMethod

ChannelEstimationOption Enums

Table 10-53 MeasureSpectrum_NxN test output parameters
Parameter Name
spectrumPower[]

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit
dBm

Description
Spectrum Power

carrierNumber_1[]

Carrier Number for Chain 1

carrierNumber_2[]

Carrier Number for Chain 2

carrierNumber_3[]

Carrier Number for Chain 3

carrierNumber_4[]

Carrier Number for Chain 4

flatnessMargin_1[]

dB

Average Power Flatness over
spectrum for chain 1

flatnessMargin_2[]

dB

Average Power Flatness over
spectrum for chain 2

flatnessMargin_3[]

dB

Average Power Flatness over
spectrum for chain 3

flatnessMargin_4[]

dB

Average Power Flatness over
spectrum for chain 4

loLeakage[]

dBm

LO Leakage

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

113

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.3.6 WlanPerTest_NxN
This test measures receiver minimum input sensitivity. It measures the PER of the receiver at the
minimum input sensitivity level: -69 dBm for 2.4GHz; -65 dBm for 5GHz. Table 10-54 and
Table 10-55 list the input and output parameters for this test.
Test Name: WlanPerTest_NxN
Test Condition: None
Loop Condition: Channel
Test Equipment: “LitePoint IQxel”, “NI PXI5644R”
Table 10-54 WLAN Per NxN test input parameters
Parameter Name

Value

Unit

Description

startPower

-69

dBm

PER Search Start Power

stopPower

-69

dBm

PER Search Stop Power

channel

5180

rate

RATE_11N_HT20_MCS7

WLAN_RATE

WLAN 11n/11ac Rate Enums

channelBonding

2

WLAN_MODE

WLAN Mode Enums

coursePktCount

2000

number of packets for PER coarse
search loop

finePktCount

10000

number of packets for PER fine
search loop

coarseStepSize

2.0

dB

step size for PER coarse search
loop

fineStepSize

0.5

dB

step size for PER fine search loop

rxChain

1

WLAN Channel number or FreqMHz

Rx ChainMask

Table 10-55 WLAN Per NxN test output parameters

80-Y0306-1 Rev. L

Parameter Name

Lower Limit

Upper Limit

Unit

Description

PER

0

10

%

PER at Per Power; must define Upper
Limit

PerPower

-100

0

dBm

Power at which reported PER is
measured

Rssi

-100

0

dBm

Received Signal Strength Indicator

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

114

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.3.7 WlanPerSweepTest_NxN
This test sweeps receiver’s power with a specified step, measures receiver PER at each input
power steps.
Table 10-56 and Table 10-57 list the input and output parameters for this test.
Test Name: WlanPerSweepTest_NxN
Test Condition: None
Loop Condition: Channel
Test Equipment: “LitePoint IQxel”, “NI PXI5644R”
Table 10-56 WLAN PerSweepTest_NxN input parameters
Parameter Name

Value

Unit

Description

startPower

-50

dBm

PER Search Start Power

stopPower

-90

dBm

PER Search Stop Power

channel

7

rate

RATE_11N_HT20_MCS7

WLAN_RATE

WLAN 11n/11ac Rate Enums

channelBonding

2

WLAN_MODE

WLAN Mode Enums

pktCount

200

stepSize

-2.0

rxChain

3

Rx ChainMask to test

perLimit

10

PER limit to compute min and
max passed power

WLAN Channel number or
FreqMHz

number of packets for PER
sweep
dB

step size for PER sweep

Table 10-57 WLAN PerSweepTest_NxN output parameters

80-Y0306-1 Rev. L

Parameter Name

Lower Limit

Upper Limit

Unit

Description

allMeasuredPERs

0

10

%

PER at Per Power; must define
Upper Limit

allPerPowers

-110

0

dBm

Power at which reported PER is
measured

allMeasuredRssis

-100

0

dBm

Received Signal Strength Indicator

minPassPerPower

-100 (rate
dependent)

0

dBm

Min power for PER within upperLimit

maxPassPerPower

-100

0

dBm

Max power for PER within
upperLimit

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

115

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.3.8 WlanSendRxPacketsTest_NxN
This test set VSG to Tx number of packets (numPackets) at specified power level
Table 10-58 list the input parameters for this test.
Test Name: WlanSendRxPacketsTest_NxN
Test Condition: None
Loop Condition: Channel
Test Equipment: “LitePoint IQxel”, “NI PXI5644R”
Table 10-58 WLAN PerSweepTest input parameters
Parameter Name

Value

Unit
dBm

Description

Power

-60

numPackets

1000

Number of packets to send

channel

5210

WLAN Channel number or
FreqMHz

rate

RATE_11N_HT20_MCS7

WLAN_RATE

VSG Tx Power level

WLAN 11n/11AC Rate
Enums

10.4 FM production test description
10.4.1 FM RX tests
10.4.1.1 Sensitivity GONOGO
This test verifies that the minimum sensitivity is met. But it does NOT find the sensitivity level,
defined as the input power level where SNR=26 dB. Table 10-59 and Table 10-60 list the input
and output parameters for this test.
Test Name: FmRxTest_Sensitivity_GONOGO
Test Condition: Normal
Loop Condition: FM Frequency
Test Equipment: “LitePoint IQ2010”
Table 10-59 Sensitivity GONOGO input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

carrierPowerdBm

-102.0

dBm

Input Power Level at DUT

carrierFreqKHz

Set by loop

kHz

RF Frequency

audioToneFreqHz

1000

Hz

Audio Frequency

MaxRetries

3

Max # of measurement retry attempts. Retries
happen if SNR < lower limit, or L&R
measurements are unbalanced by more than
1 dB

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

116

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-60 Sensitivity GONOGO output parameters
Parameter Name

Lower Limit

SNR

26

Upper Limit
99

Unit
dB

Description
Audio SNR; lower limit must be
specified in test tree

10.4.1.2 Sensitivity characterization
This test finds the minimum FM sensitivity level with an iterative search. FM Sensitivity is
defined as the input power level where SNR=26 dB. Table 10-61 and Table 10-62 list the input
and output parameters for this test.
Test Name: FmRxTest_Sensitivity_Characterization
Test Condition: Normal
Loop Condition: FM Frequency
Test Equipment: “LitePoint IQ2010”
Table 10-61 Sensitivity characterization input parameters
Parameter Name

Value

Unit

Description

PowerStart

-108.0

dBm

Start power for iterative search

PowerStep

1.0

dB

Step size for iterative search

PowerMax

-90.0

dBm

Max power for iterative search

PowerMin

-114.0

dBm

Min power for iterative search

SNRTarget

26.0

dB

SNR target for iterative search

carrierFreqKHz

Set by loop

kHz

RF Frequency

audioToneFreqHz

1000

Hz

Audio Frequency

MaxRetries

3

Max # of measurement retry attempts.
Retries happen if SNR < 10 dB, or L&R
measurements are unbalanced by more than
1 dB

Table 10-62 Sensitivity characterization output parameters
Parameter Name
FmSens

80-Y0306-1 Rev. L

Lower Limit
-115

Upper Limit
-102

Unit
dBm

Description
FM Sensitivity; RF input level
where audio SNR = 26 dB

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

117

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.4.1.3 Max SNR
This test finds the maximum SNR. Table 10-63 and Table 10-64 list the input and output
parameters for this test.
Test Name: FmRxTest_MaxSNR
Test Condition: Normal
Loop Condition: FM Frequency
Test Equipment: “LitePoint IQ2010”
Table 10-63 Max SNR input parameters
Parameter Name

Value

Unit

Description

carrierPowerdBm

-47.0

dBm

Input Power Level at DUT

carrierFreqKHz

Set by loop

kHz

RF Frequency

stereo

True or False

Boolean

Flag to Enable Stereo Pilot &
Modulation

pilotDeviationHz

6750

Hz

Pilot Deviation; Only relevant if
stereo=True

totalFmDeviationHz

22500 (if mono)
75000 (if stereo)

Hz

Total FM Deviation

audioToneFreqHz

1000

Hz

Audio Frequency

MaxRetries

3

3

Max # of measurement retry attempts.
Retries happen if SNR < lower limit, or
L&R measurements are unbalanced by
more than 1 dB

Table 10-64 Max SNR output parameters
Parameter Name
SNR

80-Y0306-1 Rev. L

Lower Limit
57 (if mono)
53 (if stereo)

Upper Limit
99

Unit
dB

Description
Audio SNR;
lower limit must be
specified in test tree

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

118

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.4.1.4 Intermediate SNR
This test finds the SNR at an intermediate power level with AM distortion added to the FM
signal. Table 10-65 and Table 10-66 list the input and output parameters for this test.
Test Name: FmRxTest_ IntermediateSNR
Test Condition: Normal
Loop Condition: FM Frequency
Test Equipment: “LitePoint IQ2010”
Table 10-65 Intermediate SNR input parameters
Parameter Name

Value

Unit

Description

carrierPowerdBm

-90.0

dBm

Input Power Level at DUT

carrierFreqKHz

Set by loop

kHz

RF Frequency

audioToneFreqHz

1000

Hz

Audio FM Frequency

amFreqHz

400

Hz

AM Frequency

amDepthPercent

30

%

AM Depth

MaxRetries

3

Max # of measurement retry attempts. Retries
happen if SNR < lower limit, or L&R
measurements are unbalanced by more than
1 dB

Table 10-66 Intermediate SNR output parameters
Parameter Name
SNR

80-Y0306-1 Rev. L

Lower Limit
45

Upper Limit
99

Unit
dB

Description
Audio SNR; lower limit must be
specified in test tree

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

119

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.4.1.5 THD
This test finds the Total Harmonic Distortion (THD). Table 10-67 and Table 10-68 list the input
and output parameters for this test.
Test Name: FmRxTest_THD
Test Condition: Normal
Loop Condition: FM Frequency, Audio Frequency, and mono|stereo state
Test Equipment: “LitePoint IQ2010”
Table 10-67 THD input parameters
Parameter Name

Value

Unit

Description

carrierPowerdBm

-47.0

dBm

Input Power Level at DUT

carrierFreqKHz

Set by loop

kHz

RF Frequency

stereo

True or False

Boolean

Flag to Enable Stereo Pilot &
Modulation

pilotDeviationHz

6750

Hz

Pilot Deviation; Only relevant if
stereo=True

75000

Hz

Hz

Audio Frequency

totalFmDeviationHz
audioToneFreqHz

mono: 400, 1000, &
3000
stereo: 3000

MaxRetries

3

Max # of measurement retry attempts.
Retries happen if THD > upper limit, or
L&R measurements are unbalanced
by more than 1 dB

Table 10-68 THD output parameters

80-Y0306-1 Rev. L

Parameter Name

Lower Limit

THD

0

Upper Limit
0.8 (if mono)
1.5 (if stereo)

Unit
%

Description
Audio THD; upper limit must be
specified in test tree

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

120

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.4.1.6 RDS block error rate
This test finds the RDS Block Error Rate (BLER). Table 10-69 and Table 10-70 list the input and
output parameters for this test.
Test Name: FmRxTest_RDS_BLER
Test Condition: Normal
Loop Condition: FM Frequency
Test Equipment: “LitePoint IQ2010”
Table 10-69 RDS BLER input parameters
Parameter Name

NOTE:

Value

Unit

Description

carrierPowerdBm

-86.0*

dBm

Input Power Level at DUT

carrierFreqKHz

Set by loop

kHz

RF Frequency

pilotDeviationHz

6750

Hz

Pilot Deviation

rdsDeviationHz

2000

Hz

RDS Deviation

totalFmDeviationHz

75000

Hz

Total FM Deviation

preEmphasis

PRE_EMPHASIS_75US

enum

Time Constant of Pre-emphasis filter

rdsTransmitString

QCOM-RDS

audioToneFreqHz

1000

Hz

Audio Frequency

MinNumBlocks

5000*

Sec

Min # of Blocks for BLER calculation

DelayBeforeMeasurement

1

Sec

Delay between enabling RDS signal
and measuring BLER

TimeOutPercent

110.0

%

Percentage of expected time to wait
for MinNumBlocks before aborting
the test

ExitEarlyIfFailing

True

Boolean

Flag to exit test early if
TotalRdsBlockErrors guarantees the
test is going to fail

RDS Transmit String

The value for carrierPowerdBm is not fixed by chip specifications. Choose an appropriate value.
The value for MinNumBlocks is a tradeoff of test time vs. statistical confidence. Choose an
appropriate value.
Table 10-70 RDS BLER output parameters
Parameter Name
BLER_percent

Upper Limit

0.0

5.0

Unit
%

Description
Block Error Rate; upper limit must be
specified in test tree

TotalRdsBlockErrors

# of RDS Block Errors

TotalRdsBlocks

# of RDS Blocks

TotalRdsGroups

# of RDS Groups

ElapsedTime

80-Y0306-1 Rev. L

Lower Limit

seconds

time duration of the BLER
measurement

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

121

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.4.2 FM TX tests
10.4.2.1 TX output power
This test measures the TX output power. Table 10-71 and Table 10-72 list the input and output
parameters for this test.
Test Name: FmTxTest_TxOutputPower
Test Condition: Normal
Loop Condition: FM Frequency
Test Equipment: “LitePoint IQ2010”
Table 10-71 TX output power input parameters
Parameter Name

Value

carrierFreqKHz

Unit

Set by loop

Description

kHz

RF Frequency

Table 10-72 TX output power output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

TxOutputPower

dBm

Description
Tx Output Power

10.4.2.2 FM deviation
This test measures FM Deviation. Table 10-73 and Table 10-74 list the input and output
parameters for this test.
Test Name: FmTxTest_TxOutputPower
Test Condition: Normal
Loop Condition: FM Frequency
Test Equipment: “LitePoint IQ2010”
Table 10-73 FM deviation input parameters
Parameter Name
carrierFreqKHz

Value
Set by loop

Unit
kHz

Description
RF Frequency

Table 10-74 FM deviation output parameters
Parameter Name

Upper Limit

Unit

Description

PlusPeakDev

Hz

Positive Peak Dev

MinusPeakDev

Hz

Negative Peak Dev

AvgPeakDev

80-Y0306-1 Rev. L

Lower Limit

Hz

Average Peak Dev

RmsPeakDev

70000

80000

Hz

RMS Peak Dev

Cfo

Hz

Center Frequency Offset

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

122

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.4.2.3 TX stereo audio SNR
This test measures TX stereo audio SNR. Table 10-75 and Table 10-76 list the input and output
parameters for this test.
Test Name: FmTxTest_TxOutputPower
Test Condition: Normal
Loop Condition: FM Frequency
Test Equipment: “LitePoint IQ2010”
Table 10-75 TX stereo audio SNR input parameters
Parameter
Name

Value

Unit

Description

carrierFreqKHz

Set by loop

kHz

RF Frequency

deEmphasis

DE_EMPHASIS_75US

Enum

analysis de-emphasis setting; set this
to match DUT pre-emphasis setting

Table 10-76 TX stereo audio SNR output parameters
Parameter name

Lower limit

Upper limit

Unit

Description

TxLeftSNR

60

99

dB

Left Channel SNR

TxRightSNR

60

99

dB

Right Channel SNR

10.5 ANT production test description
10.5.1 Transmit channel power
This test measures the TX output power over the channel bandwidth.
Test Name: ChannelPower
Test Condition: Normal
Loop Condition: ANT Frequency
Test Equipment: “Agilent E4443A/E440xB”
Table 10-77 TX channel power input parameters
Parameter Name
Bandwidth
FrequencyOffset
Packets

80-Y0306-1 Rev. L

Value

Unit

1

MHz

Channel bandwidth

Set by loop

MHz

Transmit frequency offset from 2400
MHz

0

Description

Total number of packets for Tx/Rx. 0
indicates continuous test

PacketRate

100

Hz

Packet rate per second

DeviceNumber

55

Device number field of device
address

DeviceType

11

Device type field of device address

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

123

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Value

TransmissionType

Unit

208

Description
Transmission type field of device
address

DataPayload

5555555555555555

TxPathName

SAPath

Data payload in the expected packet
in hex format
Transmit path name

Table 10-78 TX channel power output parameters

80-Y0306-1 Rev. L

Parameter
Name

Lower Limit

Upper Limit

Unit

channelPower

-2

2

dBm

Description
Channel power

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

124

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.5.2 Receive sensitivity
This test measures the RX sensitivity defined as minimum power level at which BER is less than
1%.
Test Name: Sensitivity
Test Condition: Normal
Loop Condition: ANT Frequency
Test Equipment: “Agilent N5182A”
Table 10-79 Receive sensitivity input parameters
Parameter Name

Value

Unit

Description

ArbFileName

ANT_NET5B25PAT55PER10

ARB file name on signal
generator

StartPower

-85

dBm

Power value at which search
starts

StopPower

-100

dBm

Power value at which search
stops

CoarsePowerStep

1

dBm

Initial power step

FinePowerStep

0.1

dBm

Final power step

FrequencyOffset

Set by loop

MHz

Transmit frequency offset from
2400 MHz

CoarsePackets

1000

Total number of packets for
Tx/Rx for initial search with
coarse step size

Packets

10000

Total number of packets for
Tx/Rx. 0 indicates continuous
test

PacketRate

100

DeviceNumber

55

Device number field of device
address

DeviceType

11

Device type field of device
address

TransmissionType

208

Transmission type field of device
address

DataPayload

5555555555555555

Data payload in the expected
packet in hex format

RxPathName

ARBPath

Receive path name

Hz

Packet rate per second

Table 10-80 Receive sensitivity output parameters
Parameter Name

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit
dBm

Description

sensitivity

-98

-85

lostPacketRate

0

50

Sensitivity
LPR

crcErrorRate

0

50

CRC Error rate

packetErrorRate

0

50

PER

bitErrorRate

0

0.1

BER

packetsReceived

0

10000

No. of packets received

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

125

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Lower Limit

Upper Limit

Unit

Description

packetsLost

0

5000

No. of packets lost

packetsWithBadHeader

0

5000

No. of packets with bad
header

packetsWithBadCRC

0

5000

No. of packets with bad
CRC

totalBitErrors

0

12000

Total bit errors

syncLosses

No. of sync losses

10.6 Bluetooth signaling production test description
LE production tests are covered in Section 10.1.

10.6.1 BTDUT_FFA_DisableLegacyLogMode
This test is performed for supporting Bluetooth legacy log.
Table 10-81 and Table 10-82 list the input and output parameters for this test.
Test Name: BTDUT_FFA_DisableLegacyLogMode
Test Condition: None
Table 10-81 BTDUT_FFA_DisableLegacyLogMode input parameters
Parameter Name

Value

disableLegacyLogMode

True

Unit

Description
Disable legacy log mode = true, Enable
legacy log mode = false

Table 10-82 BTDUT_FFA_DisableLegacyLogMode output parameters
Parameter Name

Lower Limit

Upper Limit

errorMessage

Unit
NA

Description
error messages

10.6.2 BTDUT_EnableBT_DUTMode
This test is performed to enable BT DUT mode.
Test Name: BTDUT_EnableBT_DUTMode
Test Condition: None

10.6.3 Measure Tx GFSK power
This test is performed for configuring device under test for GFSK transmit tests.
Table 10-83 and Table 10-84 list the input and output parameters for this test.
Test Name: TRM/CA/01 TX Power GFSK
Test Condition: Normal

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

126

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-83 TRM/CA/01 TX Power GFSK input parameters
Parameter Name

Value

Unit

Description

TxChannel

0

NA

TX Channel (0-78)

RxChannel

78

NA

RX Channel (0-78)

PacketType

BT_DH1

NA

Bluetooth packet type

Hopping

No

NA

Channel Hopping mode

DefaultTxPower

-40

dBm

Default TX Power Level

NumOfPackets

1

NA

Number of packets (0-10000)

Table 10-84 TRM/CA/01 TX Power GFSK output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

2

16

dBm

errorMessage

NA

AvgPowerdBm

Description
error messages
Average Bluetooth power

10.6.4 Measure Tx modulation characteristics
This test verifies and measures modulation characteristics. Table 10-85 and Table 10-86 list the
input and output parameters for this test.
Test Name: TRM/CA/07 Modulation Characteristics
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-85 TRM/CA/07 modulation characteristics input parameters
Parameter name

Value

Unit

Description

TxChannel

78

NA

TX channel (0-78)

RxChannel

0

NA

RX channel (0-78)

PacketType

BT_DH5

NA

Bluetooth Packet Type

TestType

Loopback

NA

Test Type

DefaultTxPower

-40

dBm

Default TX Power Level

NumOfPackets

1

NA

Number of packets (0-10000)

Table 10-86 TRM/CA/07 modulation characteristics output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

80-Y0306-1 Rev. L

Description
error message from test

DeltaF1Avg

140

175

KHz

Delta F1 average deviation
KHz

DeltaF2Max

115

250

KHz

Delta F2 maximum deviation
KHz

DeltaF2byF1

0.8

2

NA

Delta F2 by F1

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

127

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.6.5 Measure GFSK initial carrier frequency tolerance
This test verifies and measures initial carrier frequency tolerance. Table 10-87 and Table 10-88
list the input and output parameters for this test.
Test Name: TRM/CA/08 Initial Carrier Frequency Tolerance
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-87 TRM/CA/08 initial carrier frequency tolerance input parameters
Parameter name

Value

Unit

Description

TxChannel

78

NA

TX channel (0-78)

RxChannel

0

NA

RX channel (0-78)

PacketType

BT_DH1

NA

Bluetooth Packet Type

TestType

Loopback

NA

Test Type

DefaultTxPower

-40

dBm

Default TX Power Level

NumOfPackets

1

NA

Number of packets (0-10000)

Table 10-88 TRM/CA/08 initial carrier frequency tolerance output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage
FrequencyTolerance

Description
error message from test

-75

75

KHz

Frequency Tolerance in
KHz

10.6.6 Measure GFSK carrier frequency drift
This test verifies and measures carrier frequency drift and frequency drift rate. Table 10-89 and
Table 10-90 list the input and output parameters for this test.
Test Name: TRM/CA/09 Carrier Frequency Drift
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-89 TRM/CA/09 carrier frequency drift input parameters
Parameter name

80-Y0306-1 Rev. L

Value

Unit

Description

TxChannel

78

NA

TX channel (0-78)

RxChannel

0

NA

RX channel (0-78)

PacketType

BT_DH1

NA

Bluetooth Packet Type

TestType

Loopback

NA

Test Type

DefaultTxPower

-40

dBm

Default TX Power Level

NumOfPackets

1

NA

Number of packets (0-10000)

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

128

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-90 TRM/CA/09 Carrier Frequency Drift output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
error message from test

MaxDrift

-25

25

KHz

Max drift in kHz, limit for
DH1= +- 25, for DH3 and
DH5 limit = +-40

MaxDriftRate

-20

20

KHz/50us

Max drift rate

10.6.7 Measure EDR relative transmit power
This test verifies and measures EDR relative transmit power. Table 10-91 and Table 10-92 list the
input and output parameters for this test.
Test Name: TRM/CA/10/C EDRRelativeTransmitPower
Test Condition: Normal
Loop Condition: Tx Channel
Table 10-91 TRM/CA/10/C EDRRelativeTransmitPower input parameters
Parameter name

Value

Unit

Description

TxChannel

78

NA

TX channel (0-78)

RxChannel

0

NA

RX channel (0-78)

PacketType

BT_2DH5

NA

Bluetooth Packet Type

Hopping

No

NA

Channel Hopping mode

TestType

Loopback

NA

Test Type

DefaultTxPower

-40

dBm

Default TX Power Level

NumOfPackets

1

NA

Number of packets (0-10000)

Table 10-92 TRM/CA/10/C EDRRelativeTransmitPower output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
error message from test

GFSKPower

3

12

dBm

GFSK absolute power

DPSKPower

3

12

dBm

DPSK absolute power

RelativePower

-4

1

dB

Relative power

10.6.8 Measure EDR modulation accuracy
This test verifies and measures EDR modulation accuracy. Table 10-93 and Table 10-94 list the
input and output parameters for this test.
Test Name: TRM/CA/11 EDR Modulation Accuracy
Test Condition: Normal
Loop Condition: Tx Channel

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

129

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-93 TRM/CA/11 EDR modulation accuracy input parameters
Parameter name

Value

Unit

Description

TxChannel

78

NA

TX channel (0-78)

RxChannel

0

NA

RX channel (0-78)

PacketType

BT_2DH5

NA

Bluetooth Packet Type

Hopping

No

NA

Channel Hopping mode

TestType

Loopback

NA

Test Type

DefaultTxPower

-40

dBm

Default TX Power Level

NumOfPackets

1

NA

Number of packets (0-10000)

Table 10-94 TRM/CA/11 EDR modulation accuracy output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
error message from test

InitialFreqError

-75

75

KHz

Initial Frequency Error

FreqError

-10

10

KHz

Frequency Error

BlockFreqError

-75

75

KHz

Block Freuqency Error

DEVMRMS

0

0.2

NA

DEVMRMS Limit for 2DHx limit =
0.20 and for 3DHx limit = 0.13

DEVMPeak

0

0.35

NA

DEVMPeak Limit for 2DHx limit =
0.35 and for 3DHx limit = 0.25

DEVM99Percent

99

100

%

DEVM 99%

10.6.9 Measure Rx sensitivity single slot packets
This test verifies sensitivity at a given power and measures BER %. Table 10-95 and Table 10-96
list the input and output parameters for this test.
Test Name: RCV/CA/01 Sensitivity – single slot packets
Test Condition: Normal
Loop Condition: Rx Channel
Table 10-95 RCV/CA/01 sensitivity – single slot packets input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

RxChannel

0

RX channel (0-78)

TxChannel

78

TX channel (0-78)

Dirty

Yes

Dirty mode

StartPowerdBm

-70

dBm

Start Test RX power from VSG,
if Start and Stop are same it acts
like GoNoGo

StopPowerdBm

-70

dBm

Stop Test RX power from VSG, if
Start and Stop are same it acts
like GoNoGo

fineStepSize

0.5

dB

step size for BER fine search
loop

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

130

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Value

Unit

Description

coarseStepSize

1

dB

step size for BER coarse search
loop

PacketType

BT_DH1

NA

Bluetooth Packet Type

Hopping

No

NA

Channel Hopping mode

DefaultTxPower

-40

NA

Default Tx Power for test

CoarseNumberOfPackets

100

NA

Minimum coarse number of
packets required for test

FineNumberOfPackets

5000

NA

Minimum fine number of packets
required for test

ReceiverTestType

Sensitivity

NA

RX Test type

Table 10-96 RCV/CA/01 sensitivity – single slot packets output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
Error message

BERPercent

0

0.1

%

BER in percent

FERPercent

0

50

%

FER in percent

RxSensitivityPowerdBm

-70

-70

dBm

Sensitivity level

LPR

0

50

%

LPR in percent

10.6.10 Measure Rx sensitivity multiple slot packets
This test verifies sensitivity at a given power and measures BER %. Table 10-97 and Table 10-98
list the input and output parameters for this test.
Test Name: RCV/CA/02 Sensitivity – multiple slot packets
Test Condition: Normal
Loop Condition: Rx Channel
Table 10-97 RCV/CA/02 sensitivity – multiple slot packets input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

RxChannel

0

RX channel (0-78)

TxChannel

78

TX channel (0-78)

Dirty

Yes

Dirty mode

StartPowerdBm

-70

dBm

Start Test RX power from VSG,
if Start and Stop are same it acts
like GoNoGo

StopPowerdBm

-70

dBm

Stop Test RX power from VSG, if
Start and Stop are same it acts
like GoNoGo

fineStepSize

0.5

dB

step size for BER fine search
loop

coarseStepSize

1

dB

step size for BER coarse search
loop

PacketType

BT_DH5

NA

Bluetooth Packet Type

Hopping

No

NA

Channel Hopping mode

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

131

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Value

Unit

Description

DefaultTxPower

-40

NA

Default Tx Power for test

CoarseNumberOfPackets

100

NA

Minimum coarse number of
packets required for test

FineNumberOfPackets

589

NA

Minimum fine number of packets
required for test

ReceiverTestType

Sensitivity

NA

RX Test type

Table 10-98 RCV/CA/02 Sensitivity – multiple slot packets output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

Description
Error message

BERPercent

0

0.1

%

BER in percent

FERPercent

0

50

%

FER in percent

RxSensitivityPowerdBm

-70

-70

dBm

Sensitivity level

LPR

0

50

%

LPR in percent

10.6.11 Measure EDR Rx sensitivity
This test verifies sensitivity at a given power and measures BER %. Table 10-99 and Table 10100 list the input and output parameters for this test.
Test Name: RCV/CA/07 EDR Sensitivity
Test Condition: Normal
Loop Condition: Rx Channel
Table 10-99 RCV/CA/07 EDR sensitivity input parameters
Parameter Name

80-Y0306-1 Rev. L

Value

Unit

Description

RxChannel

0

RX channel (0-78)

TxChannel

78

TX channel (0-78)

Dirty

Yes

StartPowerdBm

-70

dBm

Start Test RX power from VSG,
if Start and Stop are same it acts
like GoNoGo

StopPowerdBm

-70

dBm

Stop Test RX power from VSG, if
Start and Stop are same it acts
like GoNoGo

fineStepSize

0.5

dB

step size for BER fine search
loop

coarseStepSize

1

dB

step size for BER coarse search
loop

PacketType

BT_2DH5

NA

Bluetooth Packet Type

Hopping

No

NA

Channel Hopping mode

DefaultTxPower

-40

NA

Default Tx Power for test

CoarseNumberOfPackets

100

NA

Minimum coarse number of
packets required for test

Dirty mode

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

132

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Value

Unit

Description

FineNumberOfPackets

294

NA

Minimum fine number of packets
required for test

ReceiverTestType

Sensitivity

NA

RX Test type

Table 10-100 RCV/CA/07 EDR sensitivity output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

errorMessage

80-Y0306-1 Rev. L

Description
Error message

BERPercent

0

0.1

%

BER in percent

PERPercent

0

50

%

PER in percent

RxSensitivityPowerdBm

-70

-70

dBm

Sensitivity level

LPR

0

50

%

LPR in percent

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

133

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.7 NFC production functional test description
10.7.1 NFCDUT_DetectTag
This test verifies that the DUT is able to detect a NFC tag.
Table 10-101 NFCDUT_DetectTag input parameters
Parameter name

Value

Unit

Description

SelectNFCTech

3 ALL

NA

Select the NFC Polling Protocol.

timeoutMs

5000

ms

Specify the time the test waits for the RF
Interface activated notification from the
DUT to arrive. This parameter only applies
for standalone DUT.

RetryCount

3

Number of times to rerun the test in case
the test fails.

Table 10-102 NFCDUT_DetectTag output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

errorMessage

Error message

ErrorCode

Value is 0 if no error, 1 is any error

10.7.2 NFCDUT_DetectField
This test verifies the DUT is able to detect an externally generated NFC field. The DUT is setup
to listen for all the three protocols – POLLA, POLLB and POLLF
Table 10-103 NFCDUT_DetectField input parameters
Parameter name

Value

timeoutMs

5000

RetryCount

3

Unit
ms

Description
Specify the time the tests waits for the RF
Field info notification to arrive from the
DUT. This parameter only applies for
standalone DUT.
Number of times to rerun the test in case
the test fails.

Table 10-104 NFCDUT_DetectField output parameters
Parameter Name

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit

Description

errorMessage

Error message

ErrorCode

Value is 0 if no error, 1 is any error

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

134

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.7.3 NFCDUT_SelfTest
This test verifies executes the firmware based SelfTest function and reports the results. The
firmware test limits for RFOsc count can be set using input parameters.
Table 10-105 NFCDUT_SelfTest input parameters
Parameter name

Value

Unit

Description

CheckSWP1

1

N.A

Enter 1 to enable SWP1 check, 0 to
disable

CheckSWP2

1

N.A

Enter 1 to enable SWP2 check, 0 to
disable

iRfOscLL

109936

N.A

Enter the lower limit RF Oscillator count
value to check for pass/fail

iRfOscUL

132800

N.A

Enter the upper limit RF Oscillator count
value to check for pass/fail

Table 10-106 NFCDUT_SelfTest output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

ErrorCodeNFCEE

N.A

0= PASS, 1 = FAIL, 2= TIMEOUT,
3 = ERROR

ErrorCodeRfOsc

N.A

0= PASS, 1 = FAIL, 2= TIMEOUT,
3 = ERROR

ErrorCodeCarrierDet

N.A

0= PASS, 1 = FAIL, 2= TIMEOUT,
3 = ERROR

NFCEE

N.A

Read NFCEE value

RfOsc

N.A

RfOsc Count value

CarrierDet

N.A

Carrier Detect value

errorMessage

N.A

Error message

10.8 NFC reference parametric test description
10.8.1 SetInstrumentConfigFile
This test sets the instrument config xml file for the test suite. The instrument config file contains
details about the NFC Tester to be used and the power supply being used.
Table 10-107 SetInstrumentConfigFile input parameters
Parameter name

Value

Unit

InstrumentConfigFilename

C:\Qualcomm\WCN\ProdTests\
ConfigFiles\NFCTesterConfig.xml

N.A

Description
Full path and name for
the instrument config file.

Table 10-108 SetInstrumentConfigFile output parameters
Parameter Name
ErrorMessage

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit
N.A

Description
Error message

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

135

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.8.2 NFCDUT_SetConfigFile
This test sets the DUT config xml file for the test suite. The instrument config file contains details
about the DUT Type and the connection details for the DUT.
Table 10-109 NFCDUT_SetConfigFile input parameters
Parameter name

Value

NFCDUTConfigFilename

Unit

C:\Qualcomm\WCN\ProdTests\
ConfigFiles\NFCDUTConfig.xml

N.A

Description
Full path and name for
the DUT config file.

Table 10-110 NFCDUT_SetCOnfigFile output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit

Description

N.A

Error message

10.8.3 NFCDUT_Instantiate
This test reads the loaded DUTconfig file and sets the DUT type for the Test Suite – Serial/SoC
or MTP/Phone. The two possible DUT interface strings are
QC.CTE.NFCTestSuite.NFCDUT_SoC and QC.CTE.NFCTestSuite.NFCDUT_MTP.
Table 10-111 NFCDUT_Instantiate output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

DUTInterface

N.A

This parameter displays the DUT
interface type set in the config file.

ErrorMessage

N.A

Error message

10.8.4 DUT_InitFramework
This test starts up the test framework. This test also sets the path for the folder that contains
installed TCL files/binaries.
Table 10-112 DUT_InitFramework input parameters
Parameter name
tclInstallPath

Value

Unit

C:\Qualcomm\WCN\ProdTests\bin\TCL\

N.A

Description
Provide the directory path
for the tcl installation
folder

Table 10-113 InitFramework output parameters
Parameter Name
ErrorMessage

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit
N.A

Description
Error message

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

136

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.8.5 EnableDUTPower
This test turns ON the power supply specified in the instrument config file.
Table 10-114 EnableDUTPower input parameters
Parameter name

Value

Unit

voltage

Volts

Description
The voltage for the power
supply

Table 10-115 EnableDUTPower output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit

Description

N.A

Error message

10.8.6 WaitForPortToExist
This test waits for the port to be available until the specified timeout.
Table 10-116 WaitForPortToExist input parameters
Parameter name
portName

Value

Unit

COM37

timeoutMs

Description

N.A

Specify the port name to
be checked for availability

millisec

Time in milliseconds to
wait before failing the
test.

Table 10-117 WaitForPortToExist output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit

Description

N.A

Error message

10.8.7 NFCDUT_RunTopLevelScript
This test only applies to standalone/SoC type DUT.
Qualcomm NFC EVK/EVB boards need to be initialized by a tcl script to initialize all the clocks
and voltages on the board. This test runs the specified top level script.
Table 10-118 NFCDUT_RunTopLevelScript input parameters
Parameter name

80-Y0306-1 Rev. L

Value

Unit

Description

filename

N.A

Specify the path to the
top level tcl script

workingDirectory

N.A

The directory path of the
tcl file

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

137

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter name
TopLevelI2C_API

Value

Unit

None_ScriptOpensPort,
TopLevelI2C_API_FM,
TopLevelI2C_API_NFC

Dropdown
Selection

Description
Select which type of port
access API’s the script
uses – NFC API’s, FM
API’s or None(Script will
open and close the
correct ports)

Table 10-119 NFCDUT_RunTopLevelScript output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.8 NFCDUT_Connect
This test will try to open the port and connect to the DUT.
Table 10-120 NFCDUT_Connect output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.9 NFCDUT_PatchFirmwareUsingPatchFile
This test only applies to Standalone/SoC type DUT. This test will download the tcl based patch to
the DUT.
Table 10-121 NFCDUT_PatchFirmwareUsingPatchFile input parameters
Parameter name

Value

FileName

Unit
NA

Description
Specify the file path to the patch
file (signedtclpatch.out file)

Table 10-122 NFCDUT_PatchFirmwareUsingPatchFile output parameters
Parameter Name

Lower Limit

ErrorMessage

Upper Limit

Unit
N.A

Description
Error message

10.8.10 InitializeNFCTester
This test initializes the NFC Tester. This test has to be run before any other NFC Tester based
tests. If using LitePoint IQNFC, please start the LitePoint SCPI server before running this test.
Refer to Section 3.10 for LitePoint software installation.
Supported Test Box: LitePoint IQNFC

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

138

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-123 InitializeNFCTester input parameters
Parameter name

Value

Unit

Description

testerConfigFileName

C:\Qualcomm\WCN\
ProdTests\ConfigFiles\
NFCTesterConfig.xml

NA

Provide the path to the tester
config xml file for NFC

NFCTesterResourceID

NFCTester

NA

Specify the Equipment resource
ID

Table 10-124 NFCDUT_DetectTag output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.11 NFCTesterCalibrate
NOTE:

Calibration is required to capture the baseline (no DUT) return loss values for the NFC Tester.
NFCTesterCalibrate should be run in the actual test setup/fixture but without the DUT. Since the
procedure is sensitive to external electromagnetic interference and proximity to metal, it is
recommended that the test be performed without any NFC coils, electronic equipment, metal
object etc. in the close vicinity of the NFC Tester antenna. One feet or more of clearance is
recommended.

NOTE:

Please run this test once manually without the DUT to set up the calibration.
This test is disabled by default so it won’t run automatically every time the tree is run. The
calibration file will be saved on the local machine with the name provided in the input
parameters. The file path is always fixed and does not need to be specified. This same file name
then needs to be loaded in the subsequent test ‘NFCTesterLoadCalibration’ which is run every
time the tree is run.
This test only needs to be rerun if the configuration of the test fixture changes.
Supported Test Box: LitePoint IQNFC
Pre-requisite Test: InitializeNFCTester has to be run before this test.
Table 10-125 NFCTesterCalibrate input parameters
Parameter name

80-Y0306-1 Rev. L

Value

Unit

Description

FileName

NFCTesterCalibration1

NA

FS

0

dBvpeak

Field Strength to use for
calibration

FreqStart

12

MHz

Start frequency for calibration

FreqStep

0.005

MHz

Frequency step/resolution for
calibration

FreqStop

16

MHz

End frequency for calibration

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

139

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-126 NFCTesterCalibrate output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.12 NFCTesterLoadCalibration
This test loads the previously saved calibration file. This test needs to be run before any
resonance sweep or Resonance Find tests are run.
Supported Test Box: LitePoint IQNFC
Table 10-127 NFCTesterLoadCalibration input parameters
Parameter name
FileName

Value

Unit

NFCTesterCalibration1

Description

NA

Specify the file name for the
previously saved calibration file.

Table 10-128 NFCTesterLoadCalibration output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.13 NFCDUT_CoreResetAndInit
This test sends a core reset followed by a core init command to the chip. This applies to both SoC
and phone type DUT.
Table 10-129 NFCDUT_CoreResetAndInit output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.14 NFCDUT_ConfigureDUT
This test sets up the DUT for a specific test. The test type and the NFC protocol type needs to be
selected.
Table 10-130 NFCDUT_ConfigureDUT input parameters
Parameter name

80-Y0306-1 Rev. L

Value

Unit

Description

SelectTestType

Frequency Sweep Test,
Initiator test,
Target test or
P2P tests

Dropdown
selection

Select one of the test type to set
up the DUT for. P2P test is not
supported currently.

SelectNFCTech

A,
B,
F,
All

Dropdown
selection

Selects the NFC technology type

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

140

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-131 NFCDUT_ConfigureDUT output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

ErrorMessage

N.A

Description
Error message

10.8.15 ConfigureNFCTester
This test sets up and configures the NFC tester. The NFC tester needs to be configured prior to
the test being performed. The three types of tests supported are Frequency Sweep Test, Initiator
Tests and Target Tests. P2P tests are not currently supported.
Supported Test Box: LitePoint IQNFC
Table 10-132 ConfigureNFCTester input parameters
Parameter name

Value

Description

SelectTestType

Frequency Sweep Test,
Initiator test,
Target test or
P2P tests

Dropdown
selection

Select one of the test type to set
up the NFC Tester for. P2P test is
not supported currently.

SelectNFCTech

A,
B,
F,
All

Dropdown
selection

Selects the NFC technology type

ResonatorType

OFF,
RES_13_56MHZ,
RES_15MHZ,
RES_16_1MHZ

Dropdown
selection

Selector the coupling resonance
for the NFC Tester

s

Specify the capture length for the
NFC captures in seconds

Dropdown
selection

Select the data rate for the NFC
tester transceiver

Dropdown
selection

Select the modulation depth for
the NFC Tester Initiator mode

CaptureLength
DataRate

RATE_R106,
RATE_R212,
RATE_R424

ModDepth

80-Y0306-1 Rev. L

Unit

FieldStrength

Allowed range -30 to 24

dBVp

Specifies the field strength for
initiator mode in dBv peak. This
field Strength will be used for
Initiator mode tests and
Resonance Sweep tests.

FreqStart

12

MHz

Starting frequency for Resonance
Sweep tests

FreqStop

16

MHz

End Frequency for Resonance
Sweep Tests

FreqStep

0.005

MHz

Frequency step/resolution for
Resonance Tests

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

141

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-133 ConfigureNFCTester
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.15.1 Default Settings for Configure NFC Tester
Table 10-134 Type A initiator test default tester configuration
Parameter name

Value

SelectTestType

INITIATOR TEST

SelectNFCTech

A

ResonatorType

RES_13_56MHZ,

CaptureLength

0.1

DataRate

RATE_R106

ModDepth

M100

FieldStrength

6

FreqStart

12 (not applicable for this test mode)

FreqStop

16 (not applicable for this test mode)

FreqStep

0.005 (not applicable for this test mode)

Table 10-135 Type B initiator test default tester configuration
Parameter name

Value

SelectTestType

INITIATOR TEST

SelectNFCTech

B

ResonatorType

RES_13_56MHZ,

CaptureLength

0.1

DataRate

RATE_R106

ModDepth

M10

FieldStrength

6

FreqStart

12 (not applicable for this test mode)

FreqStop

16 (not applicable for this test mode)

FreqStep

0.005 (not applicable for this test mode)

Table 10-136 Type F initiator test default tester configuration
Parameter name

80-Y0306-1 Rev. L

Value

SelectTestType

INITIATOR TEST

SelectNFCTech

F

ResonatorType

RES_13_56MHZ,

CaptureLength

0.1

DataRate

RATE_R212

ModDepth

M100

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

142

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter name

Value

FieldStrength

6

FreqStart

12 (not applicable for this test mode)

FreqStop

16 (not applicable for this test mode)

FreqStep

0.005 (not applicable for this test mode)

Table 10-137 Type A target test default tester configuration
Parameter name

Value

SelectTestType

TARGET_TEST

SelectNFCTech

A

ResonatorType

RES_13_56MHZ,

CaptureLength

0.1

DataRate

RATE_R106

ModDepth

M100

FieldStrength

6

FreqStart

12 (not applicable for this test mode)

FreqStop

16 (not applicable for this test mode)

FreqStep

0.005 (not applicable for this test mode)

Table 10-138 Type B target test default tester configuration
Parameter name

Value

SelectTestType

TARGET_TEST

SelectNFCTech

B

ResonatorType

RES_13_56MHZ,

CaptureLength

0.1

DataRate

RATE_R106

ModDepth

M10

FieldStrength

6

FreqStart

12 (not applicable for this test mode)

FreqStop

16 (not applicable for this test mode)

FreqStep

0.005 (not applicable for this test mode)

Table 10-139 Type F target test default tester configuration
Parameter name

80-Y0306-1 Rev. L

Value

SelectTestType

TARGET_TEST

SelectNFCTech

F

ResonatorType

RES_13_56MHZ,

CaptureLength

0.1

DataRate

RATE_R212

ModDepth

M100

FieldStrength

6

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

143

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter name

Value

FreqStart

12 (not applicable for this test mode)

FreqStop

16 (not applicable for this test mode)

FreqStep

0.005 (not applicable for this test mode)

Table 10-140 Resonance test default tester configuration
Parameter name

Value

SelectTestType

FREQ_SWEEP_TEST

SelectNFCTech

A (not applicable for this test mode)

ResonatorType

OFF

CaptureLength

0.1 (not applicable for this test mode)

DataRate

RATE_R212 (not applicable for this test mode)

ModDepth

M100 (not applicable for this test mode)

FieldStrength

0

FreqStart

12

FreqStop

16

FreqStep

0.005

10.8.16 NFCDUT_FindResonance
This test is applicable to SoC/Standalone type DUT. The main purpose of this test is to find the
cap code to calibrate the DUT matching for fixture specific impedance variations.
This test finds the cap code corresponding to the required resonance frequency using the NFC
Tester. Cap codes are written to specific NVM registers specified by the Payload Format
parameter to tune the resonance frequency. Maximum and minimum possible Cap Codes are
taken as input parameters. These values set the boundaries for the test to sweep the Cap Code.
The test uses an iterative algorithm to find the cap code corresponding to the target resonance
frequency within the specified tolerance. Initial estimation for the cap code is calculated by
interpolating from the measured maximum and minimum possible resonance frequency.
The algorithm halts and exits if any of the following situations are encountered:
1. Resonance frequency within the specified tolerance has been attained.
2. Maximum or Minimum Cap Code reached. The target frequency is probably out of range.
3. Minimum Cap Code resolution reached. Finer tuning using Cap Code is not possible.
It is recommended that QSPR output parameter limits should be set on ‘FreqError’ parameter to
enable a pass/fail condition for this test. The final achieved Cap Code will be copied to a QSPR
global variable which will be used in the tests that follow.
Supported Test Box: LitePoint IQNFC

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

144

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-141 NFCDUT_FindResonance input parameters
Parameter name
PayloadFormat

Value

Unit

00 00 00 02 00 82 02 00

TargetTuneFreq

Description

N.A

This is the format for the NCI
command to be used for setting
the NVM. It contains the public
register address for the Target Rx
Cap NVM

MHz

The required Resonance
frequency

Tolerance

0.02

MHz

Target tolerance for the achieved
frequency.

MinCapCode

00

N.A

Minimum valid Cap Code

MaxCapCode

1F

N.A

Maximum valid Cap Code

Table 10-142 NFCDUT_FindResonance output parameters
Parameter Name

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit

Description

CapCode

N.A

Final achieved Cap Code by the
test

AchievedFreq

MHz

Final Achieved frequency
corresponding to the achieved Cap
Code

FreqError

MHz

Frequency difference between
Target and actual achieved
frequency. It is recommended that
the FreqError test limits be set
higher than the input parameter
‘Tolerance’.

ErrorCode

N.A

Status code explaining the
algorithm status:
0 = no error,
1 = generic error,
2 = max/min cap code reached,
3 = max iteration count of 8 reache
d
4 = accuracy limited by cap code
tuning resolution.

ErrorMessage

N.A

Error message

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

145

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.8.17 NFCDUT_TuneCapNVM
This test updates the NVM with the provided CapCode and the payload format. It uses the
provided payload format to generate the NCI command string. The payload format also contains
the public address for the NVM register.
Table 10-143 NFCDUT_TuneCapNVM input parameters
Parameter name

Value

PayloadFormat

Unit

00 00 00 02 00 82 02 00

CapCode

Description

N.A

This is the format for the NCI
command to be used for setting
the NVM. It contains the public
register address for the Target Rx
Cap NVM

N.A

The CapCode to be written.

Table 10-144 NFCDUT_TuneCapNVM output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.18 InitiatorTest
This test measures RF parametric of the DUT Initiator Tx signal. This test will capture and report
details of the first poll signal within the capture length specified in the ConfigureNFCTester test.
The ConfigureNFCTester and ConfigureDUT should be run every time before this test so that
the DUT and the NFC tester have been configured to the correct NFC protocols, test type
(initiator test) and other setup details.
Supported Test Box: LitePoint IQNFC
Pre-requisite setup tests:


NFCDUT_ConfigureDUT (please select Initiator test for test type and the required NFC
protocol type)



ConfigureNFCTester (please select Initiator test for test type and the required NFC protocol
type and other details to match the protocol type. Refer to section 10.8.15.1 for more details
regarding default for each protocol)

Test Scenario: The NFC Tester is configured to be a target and the DUT as an initiator.
Table 10-145 InitiatorTest input parameters
Parameter name

80-Y0306-1 Rev. L

Value

Unit

Description

NfcType

NFCA,
NFCB,
NFCF,
NFCP2P

Dropdown
selection

Select the NFC protocol type.
Only the selected NFC initiator
signal parametric data will be
reported. Other NFC types if
present will be ignored.
NFCP2P is currently not
supported.

RetryCount

3

N.A

This is the number of times the
test will retry, if it fails to find the
Polling signal.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

146

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-146 InitiatorTest output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

Meas_FS

mA/m

This is the measured Field
Strength in mA/m for the DUT
Initiator field

Meas_DataRate

Kbps

Measured data rate for the initiator
signal

Mod_Index

%

Modulation index. Applicable for
NFC B and F

Mod_Depth

%

Modulation depth. Applicable for
NFC A

Carrier_Freq_Offset

Hz

Measured Carrier frequency offset
in Hz

Rise_Time

μs

Applicable to NFC B and F

Fall_Time

μs

Applicable to NFC B and F

Rise_Overshoot

%

Applicable to NFC B and F

Rise_Undershoot

%

Applicable to NFC B and F

Fall_Overshoot

%

Applicable to NFC B and F

Fall_Undershoot

%

Applicable to NFC B and F

Bits

Comma separated string of
decoded bits

CRC

bool

CRC check result

t1

μs

Applicable to NFC A

t2

μs

Applicable to NFC A

t3

μs

Applicable to NFC A

t4

μs

Applicable to NFC A

t5

μs

Applicable to NFC A

ErrorMessage

Error message

10.8.19 InitiatorRxTest
This test checks the functionality of the Initiator Rx block. The test methodology is shown in the
figure. The NFC tester responds to the polling from the DUT with SENS_RES. The DUT upon
successfully receiving SENS_RES, will send the next Poll in accordance with the NFC protocol.
This test checks for this second poll to verify that the DUT Initiator Rx is functional.
The ConfigureNFCTester and ConfigureDUT should be run every time before this test so that the
DUT and the NFC tester have been configured to the correct NFC protocols, test type (initiator
test) and other setup details.

80-Y0306-1 Rev. L

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

147

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Supported Test Box: LitePoint IQNFC
Pre-requisite setup tests:


NFCDUT_ConfigureDUT (select Initiator test for test type and the required NFC protocol
type)



ConfigureNFCTester (select Initiator test for test type and the required NFC protocol type
and other details to match the protocol type. Refer to section 10.8.15.1 for more details
regarding default for each protocol)

Test Scenario: The NFC Tester is configured to be a target and the DUT as an initiator.
Table 10-147 Initiator Rx test input parameters
Parameter name

80-Y0306-1 Rev. L

Value

Unit

Description

NfcType

NFCA,
NFCB,
NFCF,
NFCP2P

Dropdown
selection

Select the NFC protocol type.
Only the selected NFC initiator
signal parametric data will be
reported. Other NFC types if
present will be ignored.
NFCP2P is currently not
supported.

RetryCount

3

N.A

This is the number of times the
test will retry, if it fails to find the
Polling signal.

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

148

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Table 10-148 Initiator Rx test output parameters
Parameter Name

Lower Limit

Upper Limit

Unit

Description

Poll1Bits

Comma separated string of
decoded bits for 1st POLL

Poll2Bits

Comma separated string of
nd
decoded bits for 2 POLL

ErrorCode

0

0

0 if no error(Test passed) and 1 if
any error(Test Failed)

ErrorMessage

Error message

10.8.20 TargetTest
This test measures RF parametric of the DUT target Tx signal. This test will capture and report
details of the first target response signal within the capture length specified in the
ConfigureNFCTester test. The ConfigureNFCTester and ConfigureDUT should be run every time
before this test so that the DUT and the NFC tester have been configured to the correct NFC
protocols, test type (set as target test) and other setup details.
Supported Test Box: LitePoint IQNFC
Pre-requisite setup tests:


NFCDUT_ConfigureDUT (please select target test for test type and the required NFC
protocol type),



ConfigureNFCTester (please select target test for test type and the required NFC protocol
type and other details to match the protocol type. Refer to section 10.8.15.1 for more details
regarding default for each protocol)

Test Scenario: The NFC Tester is configured to be an initiator and the DUT as a target.
Table 10-149 TargetTest input parameters
Parameter name

Value

Unit

Description

NfcType

NFCA,
NFCB,
NFCF,
NFCP2P

Dropdown
selection

Select the NFC protocol type.
Only the selected NFC initiator
signal parametric data will be
reported. Other NFC types if
present will be ignored.
NFCP2P is currently not
supported.

RetryCount

3

N.A

This is the number of times the
test will retry, if it fails to find the
Polling signal.

Table 10-150 TargetTest output parameters
Parameter Name

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit

Description

Meas_DataRate

Kbps

Measured data rate for the target
response

Frame_Delay_Time

μs

Frame delay time in sec

Load_Modulation

mA/m

measured load modulation in volts

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

149

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

Parameter Name

Lower Limit

Upper Limit

Unit

Description

Mod_Index

%

Not used

Mod_Depth

%

Not used

Volt_Peak_to_Peak

mA/m

Peak to peak measurement for the
RF envelop

SubCarrierFrequency

kHz

Measured sub carrier frequency for
load modulation

Bits

Comma separated string of
decoded data bits in the target
response

CRC

bool

ErrorMessage

CRC check
Error message

10.8.21 ResonanceTest
This test measures resonance of the DUT NFC antenna system. This test will capture and report
the Measured resonance frequency, the associated Q and the Bandwidth of the resonance
network. The ConfigureNFCTester and ConfigureDUT should be run every time before this test
so that the DUT and the NFC tester have been configured to the correct mode and test type
(Frequency Sweep test).
Supported Test Box: LitePoint IQNFC
Pre-requisite setup tests:
NFCDUT_ConfigureDUT (please select target test for test type. This will put the DUT in listen
mode. Other modes like CoreResetAndInit can be selected depending on the user requirement)
ConfigureNFCTester (please select FREQ_SWEEP_TEST for test type other details to match the
protocol type. Refer to section 10.8.15.1 for more details regarding default for each protocol)
The Frequency Start, Stop, and the FS Level set during the creation of the Calibration file should
match the settings in ConfigureTester test. Loading the matching calibration file is required for
this test.
Test Scenario: The NFC Tester is configured for Resonance sweep and the DUT can be
configured in a mode deemed appropriate by the user.
Table 10-151 ResonanceTest output parameters
Parameter Name

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit

Description

Freq

MHz

Measured resonance frequency in
MHz. Calculated using geometric
mean of the 3dB points

Q

N.A

Q of the resonance network

BW_3dB

kHz

3dB Bandwidth

ErrorMessage

N.A

Error message

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

150

Wireless Connectivity Tests User Guide

Wireless Connectivity Test Description

10.8.22 Disconnect
This test disconnects all the open ports.
Table 10-152 Disconnect output parameters
Parameter Name

Lower Limit

Upper Limit

ErrorMessage

Unit
N.A

Description
Error message

10.8.23 Shutdown
This test shuts down the test suite framework and releases all the resources.
Table 10-153 Shutdown output parameters
Parameter Name
ErrorMessage

80-Y0306-1 Rev. L

Lower Limit

Upper Limit

Unit
N.A

Description
Error message

MAY CONTAIN U.S. AND INTERNATIONAL EXPORT CONTROLLED INFORMATION
Confidential and Proprietary – Qualcomm Atheros, Inc.

151



Source Exif Data:
File Type                       : PDF
File Type Extension             : pdf
MIME Type                       : application/pdf
PDF Version                     : 1.5
Linearized                      : No
Encryption                      : Standard V2.3 (128-bit)
User Access                     : Print, Modify, Copy, Annotate, Fill forms, Print high-res
Modify Date                     : 2017:07:18 19:59:14-07:00
Creator                         : ýýMicrosoftý Word 2010
Create Date                     : 2014:10:03 12:11:01-07:00
Producer                        : Gnostice PDFOne (for Java) v4.0.0; modified using iText® 5.4.0 ©2000-2012 1T3XT BVBA (AGPL-version)
Author                          : 
Page Mode                       : UseNone
Page Layout                     : OneColumn
Language                        : en-US
Tagged PDF                      : Yes
Page Count                      : 152
EXIF Metadata provided by EXIF.tools

Navigation menu