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Shenzhen BST Technology Co., Ltd.

Report No.: BST09081531321R-1

KAIWIN ELECTRONICS CO., LTD

EMC REPORT
Prepared For :

KAIWIN ELECTRONICS CO., LTD
NanFang Industrial Area, Beizha, Humen, Dongguan City,
Guangdong Province, China

Product Name:

USB Active Cable

Model :

KWUU001P

Prepared By :

Shenzhen BST Technology Co., Ltd.
3F,Weames Technology Building,No. 10 Kefa Road,
Science Park,Nanshan District,Shenzhen,Guangdong,China

Test Date:

Aug. 19-20, 2009

Date of Report :

Aug. 21, 2009

Report No.:

BST09081531321R-1

3F,Weames Technology Building, No. 10 Kefa Road, Science Park, Nanshan District, Shenzhen, Guangdong, China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 1 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

TABLE OF CONTENTS
TEST REPORT DECLARATION........................................................................................................5
1. TEST RESULTS SUMMARY.........................................................................................................6
2. GENERAL INFORMATION ..........................................................................................................7
2.1. Report information ..................................................................................................................................7
2.2. Measurement Uncertainty .......................................................................................................................7

3. PRODUCT DESCRIPTION ............................................................................................................8
3.1.
3.2.
3.3.
3.4.
3.5.
3.6.
3.7.

EUT Description......................................................................................................................................8
Block Diagram of EUT Configuration ....................................................................................................8
Operating Condition of EUT ...................................................................................................................8
Test Conditions........................................................................................................................................8
Modifications...........................................................................................................................................8
Abbreviations ..........................................................................................................................................9
Performance Criterion .............................................................................................................................9

4. TEST EQUIPMENT USED ...........................................................................................................10
4.1.
4.2.
4.3.
4.4.
4.5.
4.6.
4.7.
4.8.
4.9.
4.10.

For Conducted Emission Test ...............................................................................................................10
For Radiated Emission Measurement....................................................................................................10
For Harmonic / Flicker Test ..................................................................................................................10
For Electrostatic Discharge Immunity Test...........................................................................................10
For RF Strength Susceptibility Test ......................................................................................................10
For Electrical Fast Transient/Burst Immunity Test ...............................................................................11
For Surge Test .......................................................................................................................................11
For Injected Currents Susceptibility Test ..............................................................................................11
For Magnetic Field Immunity Test........................................................................................................11
For Voltage Dips and Interruptions Test ...............................................................................................11

5. POWER LINE CONDUCTED EMISSION TEST......................................................................12
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.

Block Diagram of Test Setup ................................................................................................................12
Test Standard.........................................................................................................................................12
Power Line Conducted Emission Limit ................................................................................................12
EUT Configuration on Test ...................................................................................................................12
Operating Condition of EUT .................................................................................................................13
Test Procedure.......................................................................................................................................13
Test Result.............................................................................................................................................13

6. RADIATED EMISSION TEST .....................................................................................................14
6.1.
6.2.
6.3.
6.4.
6.5.
6.6.
6.7.

Open Site Setup Diagram ......................................................................................................................14
Test Standard.........................................................................................................................................14
Radiated Emission Limit .......................................................................................................................14
EUT Configuration on Test ...................................................................................................................14
Operating Condition of EUT .................................................................................................................15
Test Procedure.......................................................................................................................................15
Test Results ...........................................................................................................................................15

7. HARMONIC CURRENT EMISSION TEST ..............................................................................16
7.1.
7.2.
7.3.
7.4.

Block Diagram of Test Setup ................................................................................................................16
Test Standard and Limit ........................................................................................................................16
Test Procedure.......................................................................................................................................17
Test Results ...........................................................................................................................................17

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 2 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

8. VOLTAGE FLUCTUATIONS & FLICKER TEST ...................................................................18
8.1.
8.2.
8.3.
8.4.

Block Diagram of Test Setup ................................................................................................................18
Test Standard.........................................................................................................................................18
Operating Condition of EUT .................................................................................................................18
Test Results ...........................................................................................................................................18

9. ELECTROSTATIC DISCHARGE TEST....................................................................................19
9.1.
9.2.
9.3.
9.4.
9.5.
9.6.
9.7.

Block Diagram of ESD Test Setup........................................................................................................19
Test Standard.........................................................................................................................................19
Severity Levels and Performance Criterion...........................................................................................19
EUT Configuration on Test ...................................................................................................................19
Operating Condition of EUT .................................................................................................................19
Test Procedure.......................................................................................................................................20
Test Results ...........................................................................................................................................20

10. RF FIELD STRENGTH SUSCEPTIBILITY TEST ...................................................................22
10.1.
10.2.
10.3.
10.4.
10.5.
10.6.
10.7.

R/S Test Setup .......................................................................................................................................22
Test Standard.........................................................................................................................................22
Severity Levels and Performance Criterion...........................................................................................22
EUT Configuration on Test ...................................................................................................................23
Operating Condition of EUT .................................................................................................................23
Test Procedure.......................................................................................................................................23
Test Results ...........................................................................................................................................23

11. ELECTRICAL FAST TRANSIENT/BURST TEST...................................................................25
11.1.
11.2.
11.3.
11.4.
11.5.
11.6.
11.7.

EFT Test Setup......................................................................................................................................25
Test Standard.........................................................................................................................................25
Severity Levels and Performance Criterion...........................................................................................25
EUT Configuration on Test ...................................................................................................................25
Operating Condition of EUT .................................................................................................................25
Test Procedure.......................................................................................................................................26
Test Results ...........................................................................................................................................26

12. SURGE TEST .................................................................................................................................28
12.1.
12.2.
12.3.
12.4.
12.5.
12.6.
12.7.

Surge Test Setup....................................................................................................................................28
Test Standard.........................................................................................................................................28
Severity Levels and Performance Criterion...........................................................................................28
EUT Configuration on Test ...................................................................................................................28
Operating Condition of EUT .................................................................................................................28
Test Procedure.......................................................................................................................................29
Test Results ...........................................................................................................................................29

13. INJECTED CURRENTS SUSCEPTIBILITY TEST .................................................................31
13.1.
13.2.
13.3.
13.4.
13.5.
13.6.
13.7.

Block Diagram of Test AC Mains Setup...............................................................................................31
Test Standard.........................................................................................................................................31
Severity Levels and Performance Criterion...........................................................................................31
EUT Configuration on Test ...................................................................................................................31
Operating Condition of EUT .................................................................................................................31
Test Procedure.......................................................................................................................................32
Test Results ...........................................................................................................................................32

14. VOLTAGE DIPS AND INTERRUPTIONS TEST .....................................................................34
14.1. Voltage Dips and Interruptions Test Setup ...........................................................................................34
3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 3 of 42

Shenzhen BST Technology Co.,Ltd.

14.2.
14.3.
14.4.
14.5.
14.6.
14.7.

Report No.: BST09081531321R-1

Test Standard.........................................................................................................................................34
Severity Levels and Performance Criterion...........................................................................................34
EUT Configuration on Test ...................................................................................................................34
Operating Condition of EUT .................................................................................................................34
Test Procedure.......................................................................................................................................35
Test Result.............................................................................................................................................35

APPENDIX I .........................................................................................................................................37
APPENDIX II........................................................................................................................................40

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 4 of 42

Shenzhen BST Technology Co., Ltd.

Report No.: BST09081531321R-1

TEST REPORT DECLARATION
Applicant
Address

EUT Description
Model Number

: KAIWIN ELECTRONICS CO., LTD
:
NanFang Industrial Area, Beizha, Humen, Dongguan City,
Guangdong Province, China
: USB Active Cable
: KWUU001P

Test Standards:
EN 55022:2006+A1:2007, EN61000-3-2: 2006 & EN61000-3-3:2008
EN 55024:1998+ A2:2003
(EN61000-4-2:1995+A2:2001, EN61000-4-3:2006+A1:2008
EN61000-4-4:2004, EN61000-4-5:2006,
EN61000-4-6:2007, EN61000-4-8:1993+A1:2001,EN61000-4-11:2004)
The EUT described above is tested by BST Technology Co., Ltd. EMC Laboratory to determine the
maximum emissions from the EUT and ensure the EUT to be compliance with the immunity
requirements of the EUT. BST Technology Co., Ltd. EMC Laboratory is assumed full responsibility
for the accuracy of the test results. Also, this report shows that the EUT technically complies with the
2004/108/EC directive and its amendment requirements.
The test report is valid for above tested sample only and shall not be reproduced in part without
written approval of the laboratory.

Prepared by :
Assistant

Reviewer :
Supervisor

Approved & Authorized Signer :
Christina / Manager

Shenzhen BST Technology Co., Ltd.

Report No.: BST09081531321R-1

1. TEST RESULTS SUMMARY
Table 1 Test Results Summary
Test Items
Radiated Emission

Test Results
PASS

Conducted Disturbance

N/A

Harmonic Current

N/A

Voltage Fluctuation and Flicker

N/A

Electrostatic Discharge Immunity

PASS

Radiated Electromagnetic Fields Immunity

PASS

Electric Fast Transient Burst Immunity

N/A

Surge Immunity

N/A

Injected currents susceptibility test

N/A

Voltage dips and interruptions Immunity

N/A

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

2. GENERAL INFORMATION
2.1. Report information
2.1.1.This report is not a certificate of quality; it only applies to the sample of the specific
product/equipment given at the time of its testing. The results are not used to indicate or
imply that they are application to the similar items. In addition, such results must not be
used to indicate or imply that BST approves recommends or endorses the manufacture,
supplier or use of such product/equipment, or that BST in any way guarantees the later
performance of the product/equipment.
2.1.2.The sample/s mentioned in this report is/are supplied by Applicant, BST therefore
assumes no responsibility for the accuracy of information on the brand name, model
number, origin of manufacture or any information supplied.
2.1.3.Additional copies of the report are available to the Applicant at an additional fee. No third
part can obtain a copy of this report through BST, unless the applicant has authorized BST
in writing to do so.

2.2. Measurement Uncertainty
Available upon request.

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 7 of 42

Shenzhen BST Technology Co., Ltd.

Report No.: BST09081531321R-1

3. PRODUCT DESCRIPTION
3.1. EUT Description
Description

Applicant

:
:

Manufacturer
Model Number

USB Active Cable
KAIWIN ELECTRONICS CO., LTD
NanFang Industrial Area, Beizha, Humen, Dongguan City,
Guangdong Province, China
KAIWIN ELECTRONICS CO., LTD
NanFang Industrial Area, Beizha, Humen, Dongguan City,
Guangdong Province, China
KWUU001P

3.2. Block Diagram of EUT Configuration

EUT

3.3. Operating Condition of EUT
Test mode 1: TX

3.4. Test Conditions
Temperature: 23-26℃
Relative Humidity: 55-68 %

3.5. Modifications
No modification was made.

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

3.6. Abbreviations
AC
AMN
DC
EM
EMC
EUT
IF
RF
rms
EMI
EMS

Alternating Current
Artificial Mains Network
Direct Current
ElectroMagnetic
ElectroMagnetic Compatibility
Equipment Under Test
Intermediate Frequency
Radio Frequency
root mean square
Electromagnetic Interference
Electromagnetic Susceptibility

3.7. Performance Criterion
Criterion A: The equipment shall continue to operate as intended without operator
intervention. No degradation of performance of loss of function is allowed below a
performance level specified by the manufacturer when the equipment is used as intended.
Criterion B: After the test, the equipment shall continue to operate as intended without
operator intervention. No degradation of performance or loss of function is allowed, after the
application of the phenomena below a performance level specified by the manufacturer,
when the equipment is used as intended.
Criterion C: Loss of function is allowed, provided the function is self-recoverable, or can be
restored by the operation of the controls by the user in accordance with the manufacturer’s
instructions.

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 9 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

4. TEST EQUIPMENT USED
4.1. For Conducted Emission Test
Item
1.
2.
3.
4.
5.
6.

Equipment
Test Receiver
Pulse Limiter
L.I.S.N.
Conical
Voltage Probe
Coaxial Switch

Manufacturer
Rohde & Schwarz
Rohde & Schwarz
Rohde & Schwarz
Emtek
Schwarzbeck
Anritsu

Model No.
ESHS30
ESH3-Z2
ESH2-Z5
N/A
TK9416
MP59B

Serial No.
828985/018
100006
834549/005
N/A
N/A
6100214550

Last Cal.
Jun. 01, 09
Jun. 01, 09
Jun. 01, 09
N/A
Jun. 01.09
Jun. 01, 09

Cal. Interval
1 Year
1 Year
1 Year
N/A
1 Year
1 Year

4.2. For Radiated Emission Measurement
Item
Equipment
1.
Spectrum Analyzer
2.
Test Receiver
3.
4.
5.
6.
7.
8.
9.

Bilog Antenna
50 Coaxial Switch
Cable
Cable
Cable
Cable
Signal Generator

Manufacturer
ANRITSU
Rohde&Schwar
z
Schwarzbeck
Anritsu Corp
Schwarzbeck
Rosenberger
Schwarzbeck
Schwarzbeck
HP

Model No.
MS2661C
ESC830

Serial No.
Last Cal.
6200140915 Jun 01,09
828982/018 Jun 01,09

Cal. Interval
1 Year
1 Year

VULB9163
MP59B
AK9513
N/A
AK9513
AK9513
864A

142
6100237248
ACRX1
FR2RX2
CRRX2
CRRX2
3625U00573

1 Year
1 Year
1 Year
1 Year
1 Year
1 Year
1 Year

Jun 01,09
Jun 01,09
Jun 01,09
Jun 01,09
Jun 01,09
Jun 01,09
Jun 01,09

4.3. For Harmonic / Flicker Test
Item Equipment
Manufacturer
1.
Power Frequency test HAEFELY
system

Model No.
PHF555

Serial No.
080419-03

Last Cal.
Jun. 01, 09

Cal. Interval
1 Year

Last Cal.
Jun. 02, 09

Cal. Interval
1 Year

4.4. For Electrostatic Discharge Immunity Test
Item Equipment
1.
ESD Tester

Manufacturer
HAEFELY

Model No.
PSD 1600

Serial No.
H911’292

4.5. For RF Strength Susceptibility Test
Item
1.
2.
3.
4.
5.
6.
7.
8.

Equipment
Signal Generator
Amplifier
Amplifier
Isotropic Field Monitor
Isotropic Field Probe
Biconic Antenna
Log-periodic Antenna
PC

Manufacturer
HP
A&R
A&R
A&R
A&R
EMCO
A&R
N/A

Model No.
8648A
500A100
100W/1000M1
FM2000
FLW220100
3108
AT1080
486DX2

Serial No.
3633A02081
17034
17028
16829
16755
9507-2534
16812
N/A

Last Cal.
Cal. Interval
Jun. 03, 09 1 Year
NCR
NCR
NCR
NCR
NCR
NCR
Jun. 03, 09 1 Year
NCR
NCR
NCR
NCR
N/A
N/A

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 10 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

4.6. For Electrical Fast Transient/Burst Immunity Test
Item Equipment
1.
Burst Tester

Manufacturer
HAEFELY

Model No.
PEFT 4010

Serial No.
080981-16

Last Cal.
Cal. Interval
Jun. 01, 09 1 Year

Serial No.
080107-04

Last Cal.
Jun. 01, 09

Cal. Interval
1 Year

Serial No.
0900-12
510010010010
0900-11
368
0010222a

Last Cal.
Jun. 01, 09
Jun. 01, 09
Jun. 01, 09
Jun. 01, 09
Jun. 01, 09

Cal. Interval
1 Year
1 Year
1 Year
1 Year
1 Year

4.7. For Surge Test
Item
Equipment
1.
Surge Tester

Manufacturer
Model No.
HAEFELY
PSURGE4.1

4.8. For Injected Currents Susceptibility Test
Item
1.
2.
3.
4.
5.

Equipment
Simulator
CDN
VDN
Injection Clamp
Attenuator

Manufacturer
EMTEST
EMTEST
EMTEST
EMTEST
EMTEST

Model No.
CWS 500C
CDN-M2
CDN-M3
F-2031-23MM
ATT6

4.9. For Magnetic Field Immunity Test
Item
Equipment
1.
Magnetic Field Tester

Manufacturer
Model No.
HEAFELY
MAG100.1

Serial No.
Last Cal.
083858-10 Jun. 01, 09

Cal. Interval
1 Year

Serial No.
Last Cal.
083732-18 Jun. 01, 09

Cal. Interval
1 Year

4.10.For Voltage Dips and Interruptions Test
Item
Equipment
2.
Dips Tester

Manufacturer
Model No.
HEAFELY
PLINE 1610

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 11 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

5. POWER LINE CONDUCTED EMISSION TEST
5.1.Block Diagram of Test Setup

Test Receiver

AC Mains

L.I.S.N. #1

EUT

5.2. Test Standard
EN 55022:2006+A1:2007

5.3. Power Line Conducted Emission Limit
Limits dB(µV)

Frequency
0.15
0.50
5.00

MHz
~
0.50
~
5.00
~ 30.00

Quasi-peak Level
66 ~ 56*
56
60

Average Level
56 ~ 46*
46
50

Notes: 1. *Decreasing linearly with logarithm of frequency.
2. The lower limit shall apply at the transition frequencies.

5.4. EUT Configuration on Test
The following equipments are installed on conducted emission test to meet EN55022
requirement and operating in a manner, which tends to maximize its emission characteristics
in a normal application.
5.4.1.EUT Information
Model Number
Serial Number
Manufacturer

: KWUU001P
: N/A
: KAIWIN ELECTRONICS CO., LTD

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 12 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

5.5. Operating Condition of EUT
5.5.1.Setup the EUT and simulators as shown in Section 5.1.
5.5.2.Turn on the power of all equipments.
5.5.3.Let the EUT work in test modes (EUT WORKING) and test it.

5.6. Test Procedure
The EUT is put on the ground and connected to the AC mains through a Artificial Mains
Network (AMN). This provided 50ohm-coupling impedance for the tested equipments.
Both sides of AC line are checked to find out the maximum conducted emission levels
according to the EN55022 regulations during conducted emission test.
The bandwidth of the test receiver (R&S Test Receiver ESHS30) is set at 10KHz.
The frequency range from 150 KHz to 30 MHz is investigated.

5.7. Test Result
N/A

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 13 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

6. RADIATED EMISSION TEST
6.1. Open Site Setup Diagram
ANTENNA TOWER
ANTENNA ELEVATION VARIES FROM 1 TO 4 METERS

3 METERS
EUT

TURN TABLE

0.8 METER

GROUND PLANE

6.2. Test Standard
EN 55022:2006+A1:2007

6.3. Radiated Emission Limit
All emanations from a Class B computing devices or system, including any network of
conductors and apparatus connected thereto, shall not exceed the level of field strengths
specified below:
FREQUENCY
DISTANCE
FIELD STRENGTHS LIMITS
(MHz)
(Meters)
(dBµV/m)
30 ~ 230
3
40
230 ~ 1000
3
47
Note:(1) The tighter limit shall apply at the edge between two frequency bands.
(2) Distance refers to the distance in meters between the measuring instruments
antenna and the closed point of any part of the EUT.

6.4. EUT Configuration on Test
The EN55022 Class B regulations test method must be used to find the maximum emission
during radiated emission test.
3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 14 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

6.5. Operating Condition of EUT
6.5.1.Setup the EUT as shown on Section 5.1.
6.5.2.Turn on the power of all equipments.
6.5.3.Let the EUT work in test mode and measure it.

6.6. Test Procedure
The EUT is placed on a turn table which is 0.8 meter above ground. The turn table can
rotate 360 degrees to determine the position of the maximum emission level. The EUT is
set 3 meters away from the receiving antenna which is mounted on a antenna tower. The
antenna can move up and down between 1 to 4 meters to find out the maximum emission
level. Broadband antenna (calibrated by dipole antenna) are used as a receiving antenna.
Both horizontal and vertical polarization of the antenna are set on test.
The bandwidth setting on the test receiver (R&S TEST RECEIVER ESCS20) is 120 KHz.
The EUT is tested in Anechoic Chamber. and all the scanning waveform is put in
Appendix I.

6.7. Test Results
PASS.

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 15 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

7. HARMONIC CURRENT EMISSION TEST
7.1.Block Diagram of Test Setup

AC Mains
Power Analyzer

AC Source

EUT

7.2. Test Standard and Limit
7.2.1.Test Standard
EN61000-3-2:2006
7.2.2.Limits
Table 12 Harmonic Current Test Limit (Class A)
Harmonic order
Maximum permissible harmonic current
(n)
(A)
Odd harmonics
3
5
7
9
11
13
15≤n≤39

2.30
1.14
0.77
0.40
0.33
0.21
0.15×15/n
Even harmonics

1.08

0.43

0.30

8≤n≤40

0.23×8/n

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 16 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

7.3. Test Procedure
The power cord of the EUT is connected to the output of the test system. Turn on the Power
of the EUT and use the test system to test the harmonic current level.

7.4. Test Results
N/A

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 17 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

8. VOLTAGE FLUCTUATIONS & FLICKER TEST
8.1. Block Diagram of Test Setup
Same as Section 7.1..

8.2. Test Standard
EN61000-3-3:2008

8.3. Operating Condition of EUT
Same as Section7.3.. The power cord of the EUT is connected to the output of the test system.
Turn on the power of the EUT and use the test system to test the harmonic current level.
Flicker Test Limit
Test items
Limits
Pst
1.0
dc
3.3%
dmax
4.0%
dt
Not exceed 3.3% for 500ms

8.4. Test Results
N/A

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 18 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

9. ELECTROSTATIC DISCHARGE TEST
9.1. Block Diagram of ESD Test Setup
ESD
Tester

EUT

AC Mains

0.8 m

AC Mains
Remark:

is Discharge Electrode

9.2. Test Standard
EN 55024:1998+ A2:2003 (EN61000-4-2:1995+A2:2001)
Severity Level 3 for Air Discharge at 8KV
Severity Level 2 for Contact Discharge at 4KV

9.3. Severity Levels and Performance Criterion
9.3.1.Severity level
Level
1.

Test Voltage
Contact Discharge (KV)
2

Test Voltage
Air Discharge (KV)
2

Special

9.3.2.Performance criterion: B

9.4. EUT Configuration on Test
The configuration of EUT are listed in Section 3.2.

9.5. Operating Condition of EUT
9.5.1.Setup the EUT as shown in Section 9.1.
9.5.2.Turn on the power of all equipments.
9.5.3.Let the EUT work in test mode (full load) and test it.
3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
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Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

9.6. Test Procedure
9.6.1.Air Discharge:
This test is done on a non-conductive surfaces. The round discharge tip of the discharge
electrode shall be approached as fast as possible to touch the EUT.
After each discharge, the discharge electrode shall be removed from the EUT.
The generator is then re-triggered for a new single discharge and repeated 10 times
for each pre-selected test point. This procedure shall be repeated until all the air discharge
completed.
9.6.2.Contact Discharge:
All the procedure shall be same as Section 9.6.1. except that the tip of the discharge electrode
shall touch the EUT before the discharge switch is operated.
9.6.3.Indirect discharge for horizontal coupling plane
At least 20 single discharges shall be applied to the horizontal coupling plane, at points on
each side of the EUT. The discharge electrode positions vertically at a distance of 0.1m from
the EUT and with the discharge electrode touching the coupling plane.
9.6.4.Indirect discharge for vertical coupling plane
At least 20 single discharge shall be applied to the center of one vertical edge of the coupling
plane. The coupling plane, of dimensions 0.5m X 0.5m, is placed parallel to, and positioned
at a distance of 0.1m from the EUT. Discharges shall be applied to the coupling plane, with
this plane in sufficient different positions that the four faces of the EUT are completely
illuminated.

9.7. Test Results
PASS.
Please refer to the following page.

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 20 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

Electrostatic Discharge Test Results
Shenzhen BST Technology Co., Ltd.
Date :08/20/2009
Applicant

: KAIWIN ELECTRONICS CO., LTD

Test Date

Aug.20,2009

EUT

: USB Active Cable

Temperature

22℃

M/N

: KWUU001P

Humidity

50％

Power Supply

: -

Test Mode

Full load

Test Engineer

: Deng Yong

Air Discharge: ±8KV

For each point positive 10 times and negative 10 times discharge.

Contact Discharge: ±4KV
Kind
A-Air Discharge
C-Contact Discharge

Location

Result

Slots

10 points

PASS

Metal parts

4 points

PASS

Port

2 points

PASS

HCP

8 points

PASS

VCP

8 points

PASS

Discharge should be considered on Contact and Air and Horizontal Coupling Plane (HCP) and Vertical
Coupling Plane (VCP).

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 21 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

10. RF FIELD STRENGTH SUSCEPTIBILITY TEST
10.1.R/S Test Setup
3 Meters

EUT and
Simulators System

Anechoic
Chamber

0.8 Meter

Measurement
Room
Power Amp

Signal
Generator

10.2.Test Standard
EN 55024:1998+ A2:2003 (EN61000-4-3:2006+A1:2008)
Severity Level 2 at 3V / m

10.3.Severity Levels and Performance Criterion
10.3.1.Severity level
Level

Field Strength V/m

Special

10.3.2.Performance criterion : A
3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 22 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

10.4.EUT Configuration on Test
The configuration of EUT are listed in Section 3.2

10.5.Operating Condition of EUT
Setup the EUT as shown in Section 10.1.. The operating condition of EUT are listed in
section 3.3.

10.6.Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above the ground.
The EUT is set 3 meters away from the transmitting antenna which is mounted on an antenna
tower. Both horizontal and vertical polarization of the antenna are set on test. Each of the
four sides of EUT must be faced this transmitting antenna and measured individually.
In order to judge the EUT performance, a CCD camera is used to monitor the EUT.
All the scanning conditions are as follows :
Condition of Test
---------------------------------------------1. Fielded Strength
2. Radiated Signal
3. Scanning Frequency
4. Sweeping time of radiated
5. Dwell Time

Remarks
---------------------------------3 V/m (Severity Level 2)
Modulated
80 - 1000 MHz
0.0015 decade/s
1 Sec.

10.7.Test Results
PASS.
Please refer to the following page.

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 23 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

RF Field Strength Susceptibility Test Results
Shenzhen BST Technology Co., Ltd.
Date :08/20/2009
Applicant

: KAIWIN ELECTRONICS CO., LTD

Test Date

Aug.20,2009

EUT

: USB Active Cable

Temperature

22℃

M/N

: KWUU001P

Humidity

50％

Power Supply

: -

Test Mode

Test Engineer

: Deng Yong

Frequency Range :

Modulation:

; AM

Pulse

Full load
80 MHz to 1000 MHz

none 1 KHz 80%

Criterion : A
Frequency Rang :
80-1000
Steps

Horizontal

Vertical

Front

Pass

Right

Pass

Rear

Pass

Left

Pass

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 24 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

11. ELECTRICAL FAST TRANSIENT/BURST TEST
11.1.EFT Test Setup
AC Mains
EUT

EFT/B Tester

AC Mains

0.8 m

11.2.Test Standard
EN 55024:1998+ A2:2003 (EN61000-4-4:2004)
Severity Level 2 at 1KV

11.3.Severity Levels and Performance Criterion
11.3.1.Severity level
Level
1.
2.
3.
4.
X

Open Circuit Output Test Voltage ±10％
On Power Supply Lines
On I/O (Input/Output) Signal
data and control lines
0.5 KV
0.25 KV
1 KV
0.5 KV
2 KV
1 KV
4 KV
2 KV
Special
Special

11.3.2.Performance criterion : B

11.4.EUT Configuration on Test
The configuration of EUT are listed in Section 3.2..

11.5.Operating Condition of EUT
Setup the EUT as shown in Section 11.1.. The operating condition of EUT are listed in
section 3.3.
3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 25 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

11.6.Test Procedure
The EUT is put on the table which is 0.8 meter high above the ground. This reference
ground plane shall project beyond the EUT by at least 0.1m on all sides and the minimum
distance between the EUT and all other conductive structure, except the ground plane
beneath the EUT, shall be more than 0.5m.
11.6.1.For input and output AC power ports:
The EUT is connected to the power mains by using a coupling device which couples the EFT
interference signal to AC power lines. Both polarities of the test voltage should be applied
during compliance test and the duration of the test is 2 mins.
11.6.2.For signal lines and control lines ports:
It’s necessary to test.
11.6.3.For DC output line ports:
It’s unnecessary to test.

11.7.Test Results
N/A

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 26 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

Electrical Fast Transient/Burst Test Results
Shenzhen BST Technology Co., Ltd.
Date :08/20/2009
Applicant

: KAIWIN ELECTRONICS CO., LTD

Test Date

Aug.20,2009

EUT

: USB Active Cable

Temperature

22℃

M/N

: KWUU001P

Humidity

50％

Power Supply

: -

Test Mode

Full load

Test Engineer

: Deng Yong

Inject Place : AC Mains
Inject Line

Inject
Time(s)
120

Inject
Method
Direct

Results

Voltage
KV
±1

±1

120

Direct

L N

±1

120

Direct

Inject
Line

Voltage
KV

Inject
Time(s)

Inject
Method

Results

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 27 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

12. SURGE TEST
12.1.Surge Test Setup
AC Mains
EUT

Test Generator

AC Mains

0.8 m

12.2.Test Standard
EN 55024:1998+ A2:2003 (EN61000-4-5:2006)
Severity Level 2 for Line to Neutral at 1.0KV

12.3.Severity Levels and Performance Criterion
12.3.1.Severity level
Severity Level
1
2
3
4
*

Open-Circuit Test Voltage
KV
0.5
1.0
2.0
4.0
Special

Performance criterion : C

12.4.EUT Configuration on Test
The configuration of EUT are listed in Section 3.2.

12.5.Operating Condition of EUT
12.5.1.Setup the EUT as shown in Section 12.1..
12.5.2.Turn on the power of all equipments.
12.5.3.Let the EUT work in test mode (Full load) and test it.
3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 28 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

12.6.Test Procedure
1) Setup the EUT and test generator as shown on Section 12.1.
2) For line to line coupling mode, provide a 0.5KV 1.2/50us voltage surge (at open-circuit
condition) and 8/20us current surge to EUT selected points.
3) At least 5 positive and 5 negative (polarity) tests with a maximum 1/min repetition rate are
conducted during test.
4) Different phase angles are done individually.
5) Record the EUT operating situation during compliance test and decide the EUT immunity
criterion for above each test.

12.7.Test Results
N/A

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 29 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

Surge Immunity Test Results
Shenzhen BST Technology Co., Ltd.
Date :08/20/2009
Applicant

: KAIWIN ELECTRONICS CO., LTD

Test Date

Aug.20,2009

EUT

: USB Active Cable

Temperature

22℃

M/N

: KWUU001P

Humidity

50％

Power Supply

: -

Test Mode

Full load

Test Engineer

: Deng Yong

Location

Polarity

Phase
Angle

No of Pulse Pulse Voltage (KV)

Result

L-N

1.0

180

1.0

270

1.0

180

1.0

270

1.0

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 30 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

13. INJECTED CURRENTS SUSCEPTIBILITY TEST
13.1.Block Diagram of Test AC Mains Setup

EUT

CDN

AC Mains

0.1 m
Ground Reference Support
Power
Amplifier

Signal
Generator

Personal Computer Control System

13.2.Test Standard
EN 55024:1998+ A2:2003 (EN61000-4-6:2007)
Severity Level 2 at 3 V (rms), 0.15MHz ~ 80MHz

13.3.Severity Levels and Performance Criterion
13.3.1.Severity level
Level

Field Strength V/m

10
Special

13.3.2.Performance criterion: A

13.4.EUT Configuration on Test
The configuration of EUT are listed in Section 3.2

13.5.Operating Condition of EUT
Setup the EUT as shown in Section 13.1.. The operating condition of EUT are listed in
section 3.3
3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 31 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

13.6.Test Procedure
1) Set up the EUT, CDN and test generators as shown on Section 13.1.
2) Let the EUT work in test mode and test it.
3) The EUT are placed on an insulating support 0.8m high above a ground reference plane.
CDN (coupling and decoupling device) is placed on the ground plane about 0.3m from
EUT. Cables between CDN and EUT are as short as possible, and their height above the
ground reference plane shall be between 30 and 50 mm (where possible).
4) The disturbance signal described below is injected to EUT through CDN.
5) The EUT operates within its operational mode(s) under intended climatic conditions after
power on.
6) The frequency range is swept from 150KHz to 80MHz using 3V signal level, and with the
disturbance signal 80% amplitude modulated with a 1KHz sine wave.
7) The rate of sweep shall not exceed 1.5*10-3decades/s. Where the frequency is swept
incrementally, the step size shall not exceed 1% of the start and thereafter 1% of the
preceding frequency value.
8) Recording the EUT operating situation during compliance testing and decide the EUT
immunity criterion.

13.7.Test Results
N/A

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 32 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

Injected Currents Susceptibility Test Results
Shenzhen BST Technology Co., Ltd.
Date :08/20/2009
Applicant

: KAIWIN ELECTRONICS CO., LTD

Test Date

Aug.20,2009

EUT

: USB Active Cable

Temperature

22℃

M/N

: KWUU001P

Humidity

50％

Power Supply

: -

Test Mode

Full load

Test Engineer

: Deng Yong

Frequency Range
(MHz)

Injected Position

Strength

Criterion

Result

0.15 ~ 20

AC Line

3V(rms),
Unmodulated

20 ~ 80

AC Line

3V(rms),
Unmodulated

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 33 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

14. VOLTAGE DIPS AND INTERRUPTIONS TEST
14.1.Voltage Dips and Interruptions Test Setup
AC Mains
Main Interference
Simulator

EUT

AC Mains

0.8 m

Remark: Combination wave generator and decoupling network are included in test
generator.

14.2.Test Standard
EN 55024:1998+ A2:2003 (EN61000-4-11:2004)

14.3.Severity Levels and Performance Criterion
14.3.1.Severity level
Test Level
%UT

Voltage dip and short
interruptions
%UT

Duration
(in period)

100

250p

0.5p

14.3.2.Performance criterion : C & B

14.4.EUT Configuration on Test
The configuration of EUT are listed in Section 3.2.

14.5.Operating Condition of EUT
14.5.1.Setup the EUT as shown in Section 14.1.
14.5.2.Turn on the power of all equipments.
14.5.3.Let the EUT work in test mode (SPEAKERS Playing) and test it.
3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 34 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

14.6.Test Procedure
1) Set up the EUT and test generator as shown on Section 14.1.
2) The interruptions is introduced at selected phase angles with specified duration.
3) Record any degradation of performance.

14.7.Test Result
N/A

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 35 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

Voltage Dips And Interruptions Test Results
Shenzhen BST Technology Co., Ltd
Date :08/20/2009
Applicant

: KAIWIN ELECTRONICS CO., LTD

Test Date

Aug.20,2009

EUT

: USB Active Cable

Temperature

22℃

M/N

: KWUU001P

Humidity

50％

Power Supply

: -

Test Mode

Test Engineer

: Deng Yong
Duration (in
period)

% UT

Voltage Dips &
Short Interruptions
% UT

100

250P

0 ~360

0.5P

0 ~360

Test Level

Phase Angle

。

Full load

Criterion

Result

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 36 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

APPENDIX I

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 37 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 38 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 39 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

APPENDIX II

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 40 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

Photo 1 General Appearance of the EUT

Photo 2 General Appearance of the EUT

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 41 of 42

Shenzhen BST Technology Co.,Ltd.

Report No.: BST09081531321R-1

Photo 3 General Appearance of the EUT

3F,Weames Technology Building,No. 10 Kefa Road,Science Park,Nanshan District,Shenzhen,Guangdong,China
Tel:86-755- 26747751~3（100 lines） Fax:86-755-26504032
http://www.bst-lab.com
Page 42 of 42

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