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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

EMC TEST REPORT
For
Magicview Technology Co., Ltd.
USB HUB
Model No.: U3H342, 162296, 162302

Prepared for
Address

: Magicview Technology Co., Ltd.
: No. 27-3, Sec. 3, Xinyi Rd. Da-An Dist., Taipei City
10657 Taiwan

Prepared by
Address
Tel
Fax
Web
Mail

: Shenzhen LCS Compliance Testing Laboratory Ltd.
: 1/F., Xingyuan Industrial Park, Tongda Road, Bao’an
Avenue, Bao’an District, Shenzhen, Guangdong, China
: (+86)755-82591330
: (+86)755-82591332
: www.LCS-cert.com
: webmaster@LCS-cert.com

Date of receipt of test sample
Number of tested samples
Serial number
Date of Test
Date of Report

:
:
:
:
:

May 29, 2015
1
Prototype
May 29, 2015 – June 04, 2015
June 04, 2015

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
Page 1 of 29

SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

EMC TEST REPORT
EN 55022: 2010
Information technology equipment-Radio disturbance characteristics-Limits of measurement
EN 55024: 2010
Information technology equipment-Immunity characteristics-Limits and methods of measurement of
measurement
Report Reference No. .............. : LCS1506010003E
Date of Issue................................ : June 04, 2015
Testing Laboratory Name......... : Shenzhen LCS Compliance Testing Laboratory Ltd.
Address........................................ : 1/F., Xingyuan Industrial Park, Tongda Road, Bao’an Avenue,
Bao’an District, Shenzhen, Guangdong, China
Testing Location/ Procedure ....... : Full application of Harmonised standards ■
Partial application of Harmonised standards □
Other standard testing method □
Applicant’s Name ...................... : Magicview Technology Co., Ltd.
Address........................................ : No. 27-3, Sec. 3, Xinyi Rd. Da-An Dist., Taipei City 10657
Taiwan
Test Specification:
Standard ...................................... : EN 55022: 2010
EN 55024: 2010
Test Report Form No. ............... : LCSEMC-1.0
TRF Originator ............................ : Shenzhen LCS Compliance Testing Laboratory Ltd.
Master TRF ................................. : Dated 2011-03
SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD. All rights reserved.
This publication may be reproduced in whole or in part for non-commercial purposes as long as the
SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD. is acknowledged as copyright
owner and source of the material. SHENZHEN LCS COMPLIANCE TESTING LABORATORY
LTD. takes no responsibility for and will not assume liability for damages resulting from the reader's
interpretation of the reproduced material due to its placement and context.
Test Item Description. ............... : USB HUB
Trade Mark .................................. : N/A
Model/ Type Reference ............... : U3H342
Ratings ........................................ : DC 5V
Result ........................................ : Positive

Compiled by:

Supervised by:

Approved by:

Elan Liu/ File administrators

Danny Huang/ Technique principal

Gavin Liang/ Manager

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

EMC -- TEST REPORT
June 04, 2015

Test Report No. : LCS1506010003E

Date of issue

Type / Model........................... : U3H342
EUT......................................... : USB HUB
Applicant...............................
Address...................................
.
Telephone................................
Fax..........................................

: Magicview Technology Co., Ltd.
: No. 27-3, Sec. 3, Xinyi Rd. Da-An Dist., Taipei City 10657
Taiwan
: /
: /

Manufacturer......................... : Magicview Technology Co., Ltd.
Address................................... : No. 27-3, Sec. 3, Xinyi Rd. Da-An Dist., Taipei City 10657
Taiwan
Telephone................................ : /
Fax.......................................... : /
Factory................................... : Magicview Technology Co., Ltd.
Address................................... : No. 27-3, Sec. 3, Xinyi Rd. Da-An Dist., Taipei City 10657
Taiwan
Telephone................................ : /
Fax.......................................... : /

Test Result according to the standards on page 6:

Positive

The test report merely corresponds to the test sample.
It is not permitted to copy extracts of these test result without the written permission of the test
laboratory.

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

TABLE OF CONTENT
Test Report Description

Page

1. SUMMARY OF STANDARDS AND RESULTS .......................................................................................... 6
1.1.Description of Standards and Results ....................................................................................................... 6
1.2.Description of Performance Criteria ........................................................................................................ 7
2. GENERAL INFORMATION......................................................................................................................... 8
2.1.Description of Device (EUT) ................................................................................................................... 8
2.2.Description of Test Facility ...................................................................................................................... 8
2.3.Statement of the measurement uncertainty............................................................................................... 8
2.4.Measurement Uncertainty ........................................................................................................................ 9
3. measuring Devices and test equipment ....................................................................................................... 10
3.1.Conducted Disturbance .......................................................................................................................... 10
3.2.Disturbance Power ................................................................................................................................. 10
3.3.Radiated Electromagnetic Disturbance .................................................................................................. 10
3.4.Radiated Disturbance (Electric Field) .................................................................................................... 10
3.5.Harmonic Current................................................................................................................................... 10
3.6.Voltage fluctuation and Flicker .............................................................................................................. 10
3.7.Electrostatic Discharge ........................................................................................................................... 10
3.8.RF Field Strength Susceptibility ............................................................................................................ 11
3.9.Electrical Fast Transient/Burst ............................................................................................................... 11
3.10.Surge .................................................................................................................................................... 11
3.11.Conducted Susceptibility ...................................................................................................................... 11
3.12.Power Frequency Magnetic Field Susceptibility .................................................................................. 11
3.13.Voltage Dips ......................................................................................................................................... 11
3.14.Voltage Short Interruptions .................................................................................................................. 11
4. RADIATED EMISSION MEASUREMENT.............................................................................................. 12
4.1.Block Diagram of Test Setup ................................................................................................................. 12
4.2.Measuring Standard................................................................................................................................ 12
4.3.Radiated Emission Limits ...................................................................................................................... 12
4.4.EUT Configuration on Test .................................................................................................................... 13
4.5.Operating Condition of EUT .................................................................................................................. 13
4.6.Test Procedure ........................................................................................................................................ 13
4.7.Test Results ............................................................................................................................................ 13
5. ELECTROSTATIC DISCHARGE IMMUNITY TEST ............................................................................ 15
5.1.Block Diagram of Test Setup ................................................................................................................. 15
5.2.Test Standard .......................................................................................................................................... 15
5.3.Severity Levels and Performance Criterion ........................................................................................... 15
5.4.EUT Configuration on Test .................................................................................................................... 15
5.5.Operating Condition of EUT .................................................................................................................. 15
5.6.Test Procedure ........................................................................................................................................ 16
5.7.Test Results ............................................................................................................................................ 16
6. RF FIELD STRENGTH SUSCEPTIBILITY TEST.................................................................................. 18
6.1.Block Diagram of Test ........................................................................................................................... 18
6.2.Test Standard .......................................................................................................................................... 18
6.3.Severity Levels and Performance Criterion ........................................................................................... 18
6.4.EUT Configuration on Test .................................................................................................................... 19
6.5.Operating Condition of EUT .................................................................................................................. 19
6.6.Test Procedure ........................................................................................................................................ 19
6.7.Test Results ............................................................................................................................................ 19
7. MAGNETIC FIELD SUSCEPTIBILITY TEST ....................................................................................... 21
7.1.Block Diagram of Test Setup ................................................................................................................. 21
7.2.Test Standard .......................................................................................................................................... 21
7.3.Severity Levels and Performance Criterion ........................................................................................... 21
7.4.EUT Configuration on Test .................................................................................................................... 21
This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

7.5.Test Procedure ........................................................................................................................................ 22
7.6.Test Results ............................................................................................................................................ 22
8. PHOTOGRAPH............................................................................................................................................ 24
8.1.Photo of Radiated Measurement ............................................................................................................ 24
8.2.Photo of Electrostatic Discharge Test..................................................................................................... 24
8.3.Photo of Magnetic Field Immunity Test ................................................................................................. 25
9. EXTERNAL AND INTERNAL PHOTOS OF THE EUT ......................................................................... 26

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

1. SUMMARY OF STANDARDS AND RESULTS
1.1.Description of Standards and Results
The EUT have been tested according to the applicable standards as referenced below.
EMISSION (EN 55022: 2010)
Description of Test Item

Standard

Limits

Results

EN 55022: 2010

Class B

N/A

EN 55022: 2010

Class B

N/A

Radiated disturbance

EN 55022: 2010

Class B

PASS

Harmonic current emissions

EN 61000-3-2: 2014

Class A

N/A

Voltage fluctuations & flicker

EN 61000-3-3: 2012

--------

N/A

Conducted disturbance
at mains terminals
Conducted disturbance at
telecommunication port

IMMUNITY(EN 55024: 2010)
Description of Test Item
Electrostatic discharge (ESD)
Radio-frequency,
Continuous radiated disturbance

Performance
Results
Criteria

Basic Standard
EN 61000-4-2: 2009

B

PASS

EN 61000-4-3: 2006+A1: 2008+A2 2010

A

PASS

EN 61000-4-4: 2012

B

N/A

B

N/A

B

N/A

:

Electrical fast transient (EFT)
Surge (Input a.c. power ports)

EN 61000-4-5: 2014

Surge (Telecommunication ports)
Radio-frequency,
Continuous conducted disturbance

EN 61000-4-6: 2014

A

N/A

Power frequency magnetic field

EN 61000-4-8: 2010

A

PASS

B

N/A

B

N/A

C

N/A

Voltage dips, >95% reduction
Voltage dips, 30% reduction

EN 61000-4-11: 2004

Voltage interruptions
N/A is an abbreviation for Not Applicable.

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

1.2.Description of Performance Criteria
General Performance Criteria
Examples of functions defined by the manufacturer to be evaluated during testing
include, but are not limited to, the following:
─ essential operational modes and states;
─ tests of all peripheral access (hard disks, floppy disks, printers, keyboard,
mouse, etc.);
─ quality of software execution;
─ quality of data display and transmission;
─ quality of speech transmission.
1.2.1.Performance criterion A
The equipment shall continue to operate as intended without operator
intervention. No degradation of performance or loss of function is allowed below
a performance level specified by the manufacture when the equipment is used as
intended. The performance level may be replaced by a permissible loss of
performance. If the minimum performance level or the permissible performance
loss is not specified by the manufacturer, then either of these may be deriver
from the product description and documentation, and by what the user may
reasonably expect from the equipment if used as intended.
1.2.2.Performance criterion B
After the test, the equipment shall continue to operate as intended without
operator intervention. No degradation of performance or loss of function is
allowed, after the application of the phenomena below a performance level
specified by the manufacture, when the equipment is used as intended. The
performance level may be replaced by a permissible loss of performance.
During the test, degradation of performance is allowed. However, no change of
operation state or stored data is allowed to persist after the test.
If the minimum performance level (or the permissible performance loss) is not
specified by the manufacturer, then either of these may be deriver from the
product description and documentation, and by what the user may reasonably
expect from the equipment if used as intended.
1.2.3.Performance criterion C
Loss of function is allowed, provided the function is self-recoverable, or can be
restored by the operation of the controls by the user in accordance with the
manufacture’s instructions.
Functions, and/or information stored in non-volatile memory, or protected by a
battery backup, shall not be loss.

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

2. GENERAL INFORMATION
2.1.Description of Device (EUT)
EUT

: USB HUB

Model Number

: U3H342

Power Supply

: DC 5V

EUT Clock Frequency : ≤ 108MHz

2.2.Description of Test Facility
EMC Lab.

: CNAS Registration Number. is L4595.
FCC Registration Number. is 899208.
Industry Canada Registration Number. is 9642A-1.
VCCI Registration Number. is C-4260 and R-3804.
ESMD Registration Number. is ARCB0108.
UL Registration Number. is 100571-492.
TUV SUD Registration Number. is SCN1081.
TUV RH Registration Number. is UA 50296516-001

2.3.Statement of the measurement uncertainty
The data and results referenced in this document are true and accurate. The reader is
cautioned that there may be errors within the calibration limits of the equipment and
facilities. The measurement uncertainty was calculated for all measurements listed in this
test report acc. To CISPR 16 – 4 “Specification for radio disturbance and immunity
measuring apparatus and methods – Part 4: Uncertainty in EMC Measurements” and is
documented in the LCS quality system acc. To DIN EN ISO/IEC 17025. Furthermore,
component and process variability of devices similar to that tested may result in
additional deviation. The manufacturer has the sole responsibility of continued
compliance of the device.

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

2.4.Measurement Uncertainty
Test Item
Conducted Emission
Power disturbance
Electromagnetic
Radiated Emission
(3-loop)
Radiated Emission
Radiated Emission
Radiated Emission
Mains Harmonic
Voltage Fluctuations
& Flicker

Frequency Range

Expanded
uncertainty (Ulab)

Expanded
uncertainty (Ucispr)

(9kHz to 150kHz)

2.63 dB

4.0 dB

(150kHz to 30MHz)

2.35 dB

3.6 dB

(30MHz to 300MHz)

2.90dB

4.5 dB

(9kHz to 30MHz)

3.60 dB

N/A

(9kHz to 30MHz)
(30MHz to 1000MHz)
(above 1000MHz)
Voltage

3.68 dB
3.48 dB
3.90 dB
0.510%

N/A
5.2 dB
N/A
N/A

Voltage

0.510%

N/A

(1) Where relevant, the following measurement uncertainty levels have been estimated for tests

performed on the apparatus.
(2) The reported expanded uncertainty of measurement is stated as the standard uncertainty of
measurement multiplied by the coverage factor of k=2, which for a normal distribution
corresponds to a coverage probability of approximately 95%.

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

3. MEASURING DEVICES AND TEST EQUIPMENT
3.1.Conducted Disturbance
Item
1
2
3
4

Test Equipment
EMI Test Receiver
10dB Attenuator
Artificial Mains
EMI Test Software

Manufacturer
ROHDE & SCHWARZ
SCHWARZBECK
ROHDE & SCHWARZ
AUDIX

Model No.
ESCI
OSPAM236
ENV216
E3

Serial No.
101142
9729
101288
N/A

Last Cal.
2014/06/18
2014/06/18
2014/06/18
2014/06/18

Manufacturer
ROHDE & SCHWARZ
ROHDE & SCHWARZ
AUDIX

Model No.
ESCI
MDS 21
E3

Serial No.
101142
4033
N/A

Last Cal.
2014/06/18
2014/08/30
2014/06/18

Model No.
ESCI
LLA-2
ESPI
E3

Serial No.
1011423
11050003
101840
N/A

Last Cal.
2014/06/18
2014/06/18
2014/06/18
2014/06/18

Model No.
SAC-3M
ESPI
VULB9163
E3
MF-7082

Serial No.
03CH03-HY
101840
9163-470
N/A
/

Last Cal.
2015/02/04
2014/06/18
2014/06/18
2014/06/18
2014/06/18

Serial No.

Last Cal.

3.2.Disturbance Power
Item
1
2
3

Test Equipment
EMI Test Receiver
Absorbing clamp
EMI Test Software

3.3.Radiated Electromagnetic Disturbance
Item
1
2
3
4

Test Equipment
EMI Test Receiver
Triple-loop Antenna
EMI Test Receiver
EMI Test Software

Manufacturer
ROHDE & SCHWARZ
EVERFINE
ROHDE & SCHWARZ
AUDIX

3.4.Radiated Disturbance (Electric Field)
Item
Test Equipment
Manufacturer
1 3m Semi Anechoic Chamber SIDT FRANKONIA
2
EMI Test Receiver
ROHDE & SCHWARZ
3
Log per Antenna
SCHWARZBECK
4
EMI Test Software
AUDIX
5
Positioning Controller
MF

3.5.Harmonic Current
Item

Test Equipment

Manufacturer

Model No.

1

Power Analyzer Test System

Voltech

PM6000

20000670053 2014/06/18

3.6.Voltage fluctuation and Flicker
Item

Test Equipment

Manufacturer

Model No.

1

Power Analyzer Test System

Voltech

PM6000

Serial No.

Last Cal.

20000670053 2014/06/18

3.7.Electrostatic Discharge
Item
1

Test Equipment
ESD Simulator

Manufacturer
KIKUSUI

Model No.
KC001311

Serial No.
KES4021

Last Cal.
2014/09/02

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

3.8.RF Field Strength Susceptibility
Item
1
2
3
4
5
6
7
8

Test Equipment
SIGNAL GENERATOR
Amplifier
Amplifier
Isotropic Field Monitor
Isotropic Field Probe
Bi-conic Antenna
By-log-periodic Antenna
EMS Test Software

Manufacturer
Model No.
HP
8648A
AR
500A100
AR
100W/1000M1
AR
FM2000
AR
FP2000
EMCO
3108
AR
AT1080
ROHDE & SCHWARZ
ESK1

Serial No.
625U00573
17034
17028
16829
16755
9507-2534
16812
N/A

Last Cal.
2014/06/18
2014/06/18
2014/06/18
2014/06/18
2014/06/18
2014/06/18
2014/06/18
2014/06/18

3.9.Electrical Fast Transient/Burst
Item
1
2

Test Equipment
Electrical fast
transient(EFT)generator
Coupling Clamp

Manufacturer

Model No.

Serial No.

Last Cal.

3CTEST

EFT-4021

EC0461044

2015/01/20

3CTEST

EFTC

EC0441098

2014/06/18

3.10.Surge
Item

Test Equipment

Manufacturer

Model No.

Serial No.

Last Cal.

1

Surge test system

3CTEST

SG5006G

EC5581070

2014/06/18

2

Coupling/decoupling
network

3CTEST

SGN-5010G

CS5591033

2014/06/18

Manufacturer
EMTEST
EMTEST
EMTEST
EMTEST

Model No.
CIT-10
CDN-M2
CDN-M3
ATT6

Serial No.
A126A1195
A2210177
A2210177
50FP-006-H3B

Last Cal.
2014/06/18
2014/06/18
2014/06/18
2014/06/18

3.11.Conducted Susceptibility
Item
1
2
3
4

Test Equipment
Simulator
CDN
CDN
Attenuator

3.12.Power Frequency Magnetic Field Susceptibility
Item
1

Test Equipment
Power frequency
mag-field generator
System

Manufacturer

Model No.

Serial No.

Last Cal.

EVERFINE

EMS61000-8K

906003

2014/06/18

Manufacturer

Model No.

Serial No.

Last Cal.

3CTEST

VDG-1105G

EC0171014

2014/06/18

Manufacturer

Model No.

Serial No.

Last Cal.

3CTEST

VDG-1105G

EC0171014

2014/06/18

3.13.Voltage Dips
Item
1

Test Equipment
Voltage dips and up
generator

3.14.Voltage Short Interruptions
Item
1

Test Equipment
Voltage dips and up
generator

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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

4. RADIATED EMISSION MEASUREMENT
4.1.Block Diagram of Test Setup

1m ~ 4m
Coaxial Cable
EUT

0.8 m

3m
EMI
Receiver

Ground Plane

4.2.Measuring Standard
EN 55022: 2010

4.3.Radiated Emission Limits
EN 55022 Limits:
All emanations from a class B device or system, including any network of conductors and
apparatus connected thereto, shall not exceed the level of field strengths specified below:
FREQUENCY
DISTANCE
FIELD STRENGTHS LIMIT
(MHz)
(Meters)
(dBµV/m)
30 ~ 230
3
40
230 ~ 1000
3
47
Note: (1) The smaller limit shall apply at the combination point between two frequency
bands.
(2) Distance refers to the distance in meters between the measuring instrument
antenna and the closed point of any part of the EUT.

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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

4.4.EUT Configuration on Test
The EN 55022 regulations test method must be used to find the maximum emission
during radiated emission measurement.

4.5.Operating Condition of EUT
4.5.1 Turn on the power.
4.5.2 After that, let the EUT work in test mode (ON) and measure it.

4.6.Test Procedure
The EUT is placed on a turntable, which is 0.8 meter high above the ground. The
turntable can rotate 360 degrees to determine the position of the maximum emission
level. The EUT is set 3 meters away from the receiving antenna, which is mounted on a
antenna tower. The antenna can be moved up and down from 1 to 4 meters to find out
the maximum emission level. By-log antenna is used as a receiving antenna. Both
horizontal and vertical polarization of the antenna is set on test.
The bandwidth of the Receiver is set at 120kHz.
The frequency range from 30MHz to 1000MHz is investigated.

4.7.Test Results
PASS.
The test result please refer to the next page.

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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

Model No.
Environmental Conditions
Pol
Test Engineer

U3H342
24℃/ 56% RH
Vertical
Cherry Chen

Test Mode
Detector Function
Distance

ON
Quasi-peak
3m

Model No.
Environmental Conditions
Pol
Test Engineer

U3H342
24℃/ 56% RH
Horizontal
Cherry Chen

Test Mode
Detector Function
Distance

ON
Quasi-peak
3m

This report shall not be reproduced except in full, without the written approval of Shenzhen LCS Compliance Testing Laboratory Ltd.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

5. ELECTROSTATIC DISCHARGE IMMUNITY TEST
5.1.Block Diagram of Test Setup
10 cm

0.5 mm Thick
Insulator

VCP

470 k

EUT

0.8 m

HCP

Ω

470 k

Ω

Ground
5.2.Test Standard
EN 55024: 2010
Severity Level: 3 / Air Discharge: ±8KV, Level: 2 / Contact Discharge: ±4KV)

5.3.Severity Levels and Performance Criterion
5.3.1.Severity level
Level

Test Voltage
Contact Discharge (KV)

Test Voltage
Air Discharge (KV)

1.

±2

±2

2.

±4

±4

3.

±6

±8

4.

±8

±15

X

Special

Special

5.3.2.Performance Criterion: B

5.4.EUT Configuration on Test
The configuration of EUT is listed in Section 2.1.

5.5.Operating Condition of EUT
Same as conducted emission measurement, which is listed in Section 4.5, Except the
test set up replaced by Section 5.1.
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SHENZHEN LCS COMPLIANCE TESTING LABORATORY LTD.

Report No.: LCS1506010003E

5.6.Test Procedure
5.6.1.Air Discharge
This test is done on a non-conductive surface. The round discharge tip of the discharge
electrode shall be approached as fast as possible to touch the EUT.
After each discharge, the discharge electrode shall be removed from the EUT.
The generator is then re-triggered for a new single discharge and repeated 10
times for each pre-selected test point. This procedure shall be repeated until all
the air discharge completed
5.6.2.Contact Discharge
All the procedure shall be same as Section 5.6.1. Except that the tip of the discharge
electrode shall touch the EUT before the discharge switch is operated.
5.6.3.Indirect Discharge For Horizontal Coupling Plane
At least 10 single discharges (in the most sensitive polarity) shall be applied at the front
edge of each HCP opposite the center point of each unit (if applicable) of the EUT and
0.1m from the front of the EUT. The long axis of the discharge electrode shall be in the
plane of the HCP and perpendicular to its front edge during the discharge.
5.6.4.Indirect Discharge For Vertical Coupling Plane
At least 10 single discharge (in the most sensitive polarity) shall be applied to the center
of one vertical edge of the coupling plane. The coupling plane, of dimensions 0.5m X
0.5m, is placed parallel to, and positioned at a distance of 0.1m from the EUT.
Discharges shall be applied to the coupling plane, with this plane in sufficient different
positions that the four faces of the EUT are completely illuminated.

5.7.Test Results
PASS.
Please refer to the following pages

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Report No.: LCS1506010003E

Electrostatic Discharger Test Results
IEC 61000-4-2

Standard

EN 61000-4-2

Applicant

Magicview Technology Co., Ltd.

EUT

USB HUBUSB HUB

Temperature

24℃

M/N

U3H342

Humidity

53%

Criterion

B

Pressure

1021mbar

Test Mode

ON

Test Engineer

Cherry Chen

Air Discharge
Test Levels
Test Points

± 2kV

± 4kV

Results
± 8kV

Passed

Fail

Front
Back
Left
Right
Top
Bottom

Performance
Criterion
A
B
A
B
A
B
A
B
A
B
A
B

Contact Discharge
Test Levels
Test Points

± 2 kV

Results
±4 kV

Passed

Fail

Front
Back
Left
Right
Top
Bottom

Performance
Criterion
A
B
A
B
A
B
A
B
A
B
A
B

Discharge To Horizontal Coupling Plane
Test Levels
Side of EUT

± 2 kV

Results
± 4 kV

Passed

Fail

Front
Back
Left
Right

Performance
Criterion
A
B
A
B
A
B
A
B

Discharge To Vertical Coupling Plane
Test Levels
Side of EUT

± 2 kV

Results
± 4 kV

Passed

Front
Back
Left
Right

Fail

Performance
Criterion
A
B
A
B
A
B
A
B

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Report No.: LCS1506010003E

6. RF FIELD STRENGTH SUSCEPTIBILITY TEST
6.1.Block Diagram of Test
3 meter

9x6x6
EUT & Support
Units

1.5 meter
0.8m

Signal
Generator

Power Amp

PC Controller to
control S.G. & PA as
well as forward
power

EUT Monitoring by
using a camera

Control Room

6.2.Test Standard
EN 55024: 2010
(EN 61000-4-3: 2006+A1: 2008 Severity Level: 2, 3V / m)

6.3.Severity Levels and Performance Criterion
6.3.1.Severity Levels
Level

Field Strength (V/m)

1.

1

2.

3

3.

10

X.
6.3.2.Performance Criterion: A

Special

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Report No.: LCS1506010003E

6.4.EUT Configuration on Test
The configuration of the EUT is same as Section 2.1.

6.5.Operating Condition of EUT
Same as radiated emission measurement, which is listed in Section 4.5, except the test
setup replaced as Section 6.1.

6.6.Test Procedure
The EUT are placed on a table, which is 0.8 meter high above the ground. The EUT is set
3 meters away from the transmitting antenna, which is mounted on an antenna tower.
Both horizontal and vertical polarization of the antenna is set on test. Each of the four
sides of the EUT must be faced this transmitting antenna and measured individually.
In order to judge the EUT performance, a CCD Recording is used to monitor its screen.
All the scanning conditions are as following:
Condition of Test
Remark
-----------------------------------------------------------------------------------1. Fielded Strength
3V/m (Severity Level 2)
2. Radiated Signal
Unmodulated
3. Scanning Frequency
80-1000MHz
4. Sweep time of radiated
0.0015 Decade/s
5. Dwell Time
3 Sec.

6.7.Test Results
PASS.
Please refer to the following page.

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Report No.: LCS1506010003E

RF Field Strength Susceptibility Test Results
IEC 61000-4-3

Standard

EN 61000-4-3

Applicant

Magicview Technology Co., Ltd.

EUT

USB HUB

Temperature

24℃

M/N

U3H342

Humidity

53%

Field Strength

3 V/m

Criterion

A

Test Mode

ON

Test Engineer

Cherry Chen

Frequency Range

80 MHz to 1000 MHz

Modulation

None

Pulse

AM 1KHz 80%

1%

Steps

Horizontal

Vertical

Front

PASS

PASS

Right

PASS

PASS

Rear

PASS

PASS

Left

PASS

PASS

Test Equipment:
1. Signal Generator: 2031 (MARCONI)
2. Power Amplifier: 500A100 & 100W/1000M1 (A&R)
3. Power Antenna: 3108 (EMCO) & AT1080 (A&R)
4. Field Monitor: FM2000 (A&R)

Note:

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Report No.: LCS1506010003E

7. MAGNETIC FIELD SUSCEPTIBILITY TEST
7.1.Block Diagram of Test Setup
Induction Coil

EUT

Signal
Generator

Ground
7.2.Test Standard
EN 55024: 2010
(EN 61000-4-8: 2010, Severity Level: Level 1, 1A / m)

7.3.Severity Levels and Performance Criterion
7.3.1.Severity Levels
Level

Field Strength (A/m)

1

1

2

3

3

10

4

30

5

100

X

Special

7.3.2.Performance Criterion: A

7.4.EUT Configuration on Test
The configuration of the EUT is same as Section 2.1.

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Report No.: LCS1506010003E

7.5.Test Procedure
The EUT is placed in the middle of a induction coil (1*1m), under which is a 1*1*0.1m
(high) table, this small table is also placed on a larger table, 0.8 m above the ground.
Both horizontal and vertical polarization of the induction coil is set on test, so that each
side of the EUT is affected by the magnetic field. Also can reach the same aim by
change the position of the EUT.

7.6.Test Results
PASS.
Please refer to the following page.

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Report No.: LCS1506010003E

Magnetic Field Immunity Test Result
IEC 61000-4-8

Standard

EN 61000-4-8

Applicant

Magicview Technology Co., Ltd.

EUT

USB HUB

Temperature

24℃

M/N

U3H342

Humidity

53%

Test Mode

ON

Criterion

A

Test Engineer

Cherry Chen

Test Level
(A/M)

Testing
Duration

Coil Orientation

Criterion

Result

1

5 mins

X

A

PASS

1

5 mins

Y

A

PASS

1

5 mins

Z

A

PASS

Note:

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Report No.: LCS1506010003E

8. PHOTOGRAPH
8.1.Photo of Radiated Measurement

8.2.Photo of Electrostatic Discharge Test

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Report No.: LCS1506010003E

8.3.Photo of Magnetic Field Immunity Test

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Report No.: LCS1506010003E

9. EXTERNAL AND INTERNAL PHOTOS OF THE EUT

Fig 1

Fig 2

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Report No.: LCS1506010003E

Fig 3

Fig 4

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Report No.: LCS1506010003E

Fig 5

Fig 6

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Report No.: LCS1506010003E

Fig 7

Fig 8

-----------------THE END OF REPORT----------------

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