WT10093998 E Report EMC
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Page: 1 of 19 EMC TEST REPORT Reference No. : WT10093998-E-E-E Applicant : Shenzhen Reflying Electronic Co., Ltd. Address : 6 Bldg, Fuqiao No.1 Industry Zone, Fuyong Town, Bao`an District, Shenzhen, Guangdong, China. Equipment Under Test (EUT) : Product Name : Earphone Model No : AEarphone-31 Standards : EN 55022: 2006 +A1: 2007 EN 55024: 1998+A1: 2001+A2: 2003 Date of Test : Sep. 30, 2010 Project Engineer : Tenny.xu Reviewed By : Test Result : PASS * Prepared By: Waltek Services (Shenzhen) Co., Ltd. 1/F, Fukangtai Building, West Baima Rd., Songgang Street, Baoan District, Shenzhen 518105, China Tel :+86-755-27553488 Fax:+86-755-27553868 * The sample detailed above has been tested to the requirements of Council Directives 2004/108/EC. The test results have been reviewed against the Directives above and found to meet their essential requirements. WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:2 of 19 1 Test Summary Test Test Requirement Test Method Mains Terminal Disturbance Voltage, 150kHz to 30MHz EN55022:2006 EN55022:2006 +A1:2007 +A1:2007 Radiation Emission, 30MHz to 1000MHz EN 55022:2006 EN 55022:2006 +A1:2007 +A1:2007 ESD Radiated Immunity (80MHz to 1GHz) Electrical Fast Transients (EFT) Surge Immunity EN 55024 : 1998 +A1:2001+A2:2003 EN 55024 : 1998 +A1:2001+A2:2003 EN 55024 : 1998 Class / Severity Result Class B N/A Class B PASS EN 61000-4-2: 2009 Contact Air PASS EN 61000-4-3:2006 3V/m, 80%, 1kHz, Amp. Mod. PASS AC±1.0kV DC±0.5kV N/A ±1kV D.M.† ±2kV C.M.‡ N/A 3Vrms(emf), 80%, 1kHz Amp. Mod. N/A EN 61000-4-8:1993 +A1:2001 3A/m N/A EN 61000-4-11:2004 >95 % UT* for 0.5per >95 % UT* for 250per 30 % UT* for 25per N/A EN 61000-4-4:2004 +A1:2001+A2:2003 EN 55024 : 1998 EN 61000-4-5:2006 +A1:2001+A2:2003 Injected Currents, 150kHz to 80MHz Power-frequency magnetic field Voltage Dips and Interruptions EN 55024 : 1998 EN61000-4-6:2009 +A1:2001+A2:2003 EN 55024 : 1998 +A1:2001+A2:2003 EN 55024 : 1998 +A1:2001+A2:2003 Remark: A.M. Amplitude Modulation. P.M. Pulse Modulation. † D.M. – Differential Mode z UT is the nominal supply voltage WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:3 of 19 2 Contents Page 1 TEST SUMMARY ................................................................................................................................................... 2 2 CONTENTS.............................................................................................................................................................. 3 3 GENERAL INFORMATION ................................................................................................................................. 4 3.1 3.2 3.3 3.4 3.5 3.6 CLIENT INFORMATION ........................................................................................................................................... 4 DETAILS OF E.U.T................................................................................................................................................. 4 DESCRIPTION OF SUPPORT UNITS .......................................................................................................................... 4 STANDARDS APPLICABLE FOR TESTING ................................................................................................................ 4 TEST FACILITY ...................................................................................................................................................... 5 TEST LOCATION .................................................................................................................................................... 5 4 EQUIPMENT USED DURING TEST ................................................................................................................... 6 5 RADIATION EMISSION TEST RESULTS ......................................................................................................... 8 5.1 RADIATION EMISSION DATA ................................................................................................................................. 8 5.1.1 Measurement Uncertainty........................................................................................................................... 8 5.1.2 Radiated Test Setup .................................................................................................................................... 8 5.1.3 Spectrum Analyzer Setup ............................................................................................................................ 9 5.1.4 Test procedure ............................................................................................................................................ 9 5.1.5 Corrected Amplitude & Margin Calculation .............................................................................................. 9 5.1.6 Summary of Test Results ............................................................................................................................. 9 5.1.7 Radiated Emissions Test Data .................................................................................................................. 10 5.1.8 Photograph – Radiation Emission Test Setup .......................................................................................... 12 6 IMMUNITY TEST RESULTS ............................................................................................................................. 13 6.1 PERFORMANCE CRITERIA DESCRIPTION .............................................................................................................. 13 6.2 ESD .................................................................................................................................................................... 13 6.2.1 E.U.T. Operation ...................................................................................................................................... 13 6.2.2 ESD Test Setup ......................................................................................................................................... 14 6.2.3 Direct Application Test Results ................................................................................................................ 14 6.2.4 Indirect Application Test Results .............................................................................................................. 15 6.2.5 Photograph - ESD Test Setup ................................................................................................................... 15 6.3 RADIATED IMMUNITY ......................................................................................................................................... 16 6.3.1 E.U.T. Operation ...................................................................................................................................... 16 6.3.2 Test Setup.................................................................................................................................................. 16 6.3.3 Test Results ............................................................................................................................................... 17 6.3.4 Photograph - Radiated Immunity Test Setup............................................................................................ 17 7 PHOTOGRAPHS - CONSTRUCTIONAL DETAILS....................................................................................... 18 7.1 8 EUT–APPEARANCEVIEW .................................................................................................................................... 18 CE LABEL ............................................................................................................................................................ 19 WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:4 of 19 3 General Information 3.1 Client Information Applicant : Shenzhen Reflying Electronic Co., Ltd. Address Of Applicant : 6 Bldg, Fuqiao No.1 Industry Zone, Fuyong Town, Bao`an District, Shenzhen, Guangdong, China. Manufacturer : Shenzhen Reflying Electronic Co., Ltd. Address Of Manufacturer : 6 Bldg, Fuqiao No.1 Industry Zone, Fuyong Town, Bao`an District, Shenzhen, Guangdong, China. 3.2 Product Name : Earphone Model No. AEarphone-31 : Details of E.U.T. Power supply : 3.3 Audio Signal Input Description of Support Units The EUT has been tested as an independent unit. 3.4 Standards Applicable for Testing The customer requested EMC tests for an Earphone. The standards used were EN55022 Class B for emissions & EN55024 for immunity. .Table 1 : Tests Carried Out Under EN 55022: 2006+A1:2007 Standard Status EN 55022:2006+A1:2007 Radiation Emission, 30MHz to 1000MHz √ EN 55022:2006+A1:2007 Mains Terminal Disturbance Voltage,150KHz to 30MHz × Table 2 : Tests Carried Out Under EN 55024:1998+A1:2001+A2: 2003 Standard Status EN 61000-4-2:2009 Electro-static discharge √ EN 61000-4-3:2006 Radio frequency EM fields (80MHz to 1GHz) √ EN 61000-4-4:2004 Fast transients × EN 61000-4-5:2006 Surges × EN 61000-4-6: 2009 Radio frequency continuous conducted (150kHz to 80MHz) × EN 61000-4-8:1993+A1:2001 Power-frequency magnetic field (50Hz) × EN 61000-4-11:2004 Voltage dips & interruptions × √ × Indicates that the test is applicable Indicates that the test is not applicable WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:5 of 19 3.5 Test Facility The test facility has a test site registered with the following organizations: • IC – Registration No.: 7760A Waltek Services(Shenzhen) Co., Ltd. has been registered and fully described in a report filed with the Industry Canada. The acceptance letter from the Industry Canada is maintained in our files. Registration 7760A, Aug. 3, 2010 • FCC – Registration No.: 880581 Waltek Services(Shenzhen) Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance letter from the FCC is maintained in our files. Registration 880581, June 24, 2008. 3.6 Test Location All Emission test and some immunity tests were performed at:Waltek Services(Shenzhen) Co., Ltd. at 1/F, Fukangtai Building, West Baima Rd.,Songgang Street, Baoan District, Shenzhen, China WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:6 of 19 4 Equipment Used during Test Equipment Brand Name Model Related standards Cal.Intal Months Last Cal. Date Cert No Serial No E7405A ISO9001: 2000 12 Aug-10 1GA09003 547-0001 MY451149 43 12 Aug-10 336 12 Aug-10 667 12 Aug-10 9718-148 AK 9515 H EN/ISO/IEC 17025 DIN EN ISO9001 12 Aug-10 - AK 9513 EN/ISO/IEC 17025 DIN EN ISO9001 12 Aug-10 - CC-C-IF ISO9001 12 Aug-10 MF7802108 SP-14C ISO9001 12 Aug-10 - ESPI ISO9001 12 Aug-10 1GA09003 547-0002 101155 12 Aug-10 1GA09003 547-0005 100115 12 Aug-10 1GA09003 547-0003 8128-259 12 Aug-10 2GB09005 546-0002 100205 12 Aug-10 3m Anechoic chamber EMC Analyzer Agilent Trilog Broadband Antenne 30-3000 MHz SCHWARZBE CK MESSELEKTROM VULB9163 Broad-band Horn Antenna 1-18 GHz SCHWARZBE CK MESSELEKTROM BBHA 9120 D Broadband Preamplifier 0.518 GHz SCHWARZBE CK MESSELEKTROM BBV 9718 10m Coaxial Cable with NSCHWARZBE male Connectors CK MESSusable up to ELEKTROM 18GHz, 10m 50 Ohm Coaxial Cable with N-plug, SCHWARZBE individual CK MESSlength,usable up ELEKTROM to 3(5)GHz, Connectors Positioning C&C LAB Controller Color Monitor SUNSPO EMI Shielded Room ROHDE&SCH Test Receiver WARZ Two-Line VNetwork ROHDE&SCH WARZ ENV216 V－LISN SCHWARZBE CK MESSELEKTRONIK NSLK 8128 Absorbing Clamp ROHDE&SCH WARZ MDS-21 10m 50 Ohm Coaxial Cable with N-plug, individual length,usable up to 3(5)GHz, Connectors SCHWARZBE CK MESSELEKTROM AK 9514 WALTEK SERVICES Reference No.: WT10093998-E-E-E EN/ISO/IEC 17025 DIN EN ISO9001 EN/ISO/IEC 17025 DIN EN ISO9001 EN/ISO/IEC 17025 DIN EN ISO9001 ISO9001 EN/ISO/IEC 17025 CISPR16-1-2 EN55016-1-2： 2004+A1: 2005+A2: 2006 ISO9001 EN/ISO/IEC 17025 EN/ISO/IEC 17025 DIN EN ISO9001 - Page:7 of 19 Harmonic & Flicker Test Digital Power Analyzer Em Test AG/Switzerlan d DPA 500 Em Test Power Source AG/Switzerlan ACS 500 d Electrostatic Discharge Test Electrostatic Em Test Discharge AG/Switzerlan DITO Simulator d Radio-Frequency Conducted Immunity Test EN/IEC JIS C 61000-3-2 EN/IEC 610003-3 IEC 61000-3-3 IEC61000-3-2 12 1GA09003 554-0005 V07451030 95 1GA09003 554-0004 V07451030 96 Aug-10 12 IEC 61000-4-2 ISO 10605 12 Aug-10 2GB09005 546-0001 V07451030 94 1GA09003 554-0003 25781 RF Generator TESEQ GmbH NSG4070 IEC61000-4-6 12 Aug-10 CDN M-Type EM-Clamp TESEQ GmbH TESEQ GmbH CDN M016 KEMZ 801 IEC61000-4-6 IEC61000-4-6 12 12 Aug-10 Aug-10 Attenuator 6dB TESEQ GmbH ATN6050 IEC61000-4-6 12 Aug-10 25112 25453 1GA09003 547-0004 Calibrated TESEQ GmbH CAL 801 IEC61000-4-6 12 Aug-10 Equipment Calibrated CAL TESEQ GmbH IEC61000-4-6 12 Aug-10 Equipment U100A Calibrated TESEQ GmbH TRA U150 IEC61000-4-6 12 Aug-10 Equipment Fast Transient/Surges/Voltage Dips Short Interruptions and Voltage Variations Immunity Tests IEC61000-4-4 All Modules 1GA09003 SCHAFFNER 6150 IEC61000-4-5 12 Aug-10 Generator 554-0001 IEC61000-4-11 Capacitive SCHAFFNER CDN 8014 IEC61000-4-4 12 Aug-10 Coupling Clamp Signal and Data Line Coupling SCHAFFNER CDN 117 IEC61000-4-5 12 Aug-10 Network 1GA09003 AC Power Supply TONGYUN DTDGC-4 12 Aug-10 554-0002 Electromagnetic Fields Radiation Exposure Test Exposure Level Narda Safety ISO 9001 2304/03 12 Tester ELT-400 TEST Solutions ISO 10012-1 Aug-10 Magnetic Field Narda Safety 2300/90.1 ISO 9001 12 Probe 100cm2 TEST Solutions 0 ISO 10012-1 Low Frequency Radiation Test Active Loop ISO 9001 Antenna Charger Beijing Dazhi ZN30900A 12 Aug-10 10kHz-30MHz Large loop Laplace RF300 12 Aug-10 antenna Other computer Acer AG1720 Mp3 iPod 5K85004U N/A N/A A1285 3R0 WALTEK SERVICES Reference No.: WT10093998-E-E-E 25365 70348 25018 25299 34579 25311 25627 - M-0155 M-1070 9057 - Page:8 of 19 5 Radiation Emission Test Results 5.1 Radiation Emission Data Test Requirement: Test Method: Test Result: Frequency Range: Class/Severity: Detector: EN 55022 Class B EN 55022 Class B PASS 30MHz to 1000MHz Class B Peak for pre-scan (120kHz Resolution Bandwidth) Quasi-Peak & Average if maximised peak within 6dB of Average Limit 5.1.1 Measurement Uncertainty All measurements involve certain levels of uncertainties, especially in the field of EMC. The factors contributing to uncertainties are spectrum analyzer, cable loss, antenna factor calibration, antenna directivity, antenna factor variation with height, antenna phase center variation, antenna factor frequency interpolation, measurement distance variation, site imperfections, mismatch (average), and system repeatability. Based on CISPR16-4-2, The Treatment of Uncertainty in EMC Measurements, the best estimate of the uncertainty of a radiation emissions measurement at Waltek EMC Lab is +5.03 dB. 5.1.2 Radiated Test Setup The radiated emission tests were performed in the 3m Semi- Anechoic Chamber test site, using the setup accordance with the EN 55022:2006+A1:2007, The specification used in this report was the EN 55022:2006+A1:2007 Paragraph 6 limits. Compliance test was performed in working mode connected with the PC. WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:9 of 19 5.1.3 Spectrum Analyzer Setup According to EN55022 Class B Rules, the system was tested to 1000 MHz. Start Frequency.............................................. 30 MHz Stop Frequency..............................................1000 MHz Sweep Speed Auto IF Bandwidth .............................................120KHz Video Bandwidth...........................................100KHz Quasi-Peak Adapter Bandwidth .................... 120 KHz Quasi-Peak Adapter Mode ............................Normal Resolution Bandwidth ...................................100KHz 5.1.4 Test procedure For the radiated emissions test, maximizing procedure was performed on the six (6) highest emissions to ensure EUT is compliant with all installation combinations. All data was recorded in the peak detection mode. Quasi-peak readings was performed only when an emission was found to be marginal (within +/-4 dBμV of specification limits), and are distinguished with a "Qp" in the data table. The EUT was under normal mode during the final qualification test and the configuration was used to represent the worst case results. 5.1.5 Corrected Amplitude & Margin Calculation The Corrected Amplitude is calculated by adding the Antenna Factor and Cable Factor, and subtracting the Amplifier Gain from the Amplitude reading. The basic equation is as follows: Corr. Ampl. = Indicated Reading + Antenna Factor + Cable Factor - Amplifier Gain The “Margin” column of the following data tables indicates the degree of compliance with the applicable limit. For example, a margin of -7dBμV means the emission is 7dBμV below the maximum limit for Class B. The equation for margin calculation is as follows: Margin = Corr. Ampl. – Class B Limit 5.1.6 Summary of Test Results According to the data in section 5.1.7, the EUT complied with the EN55022 Class B standards. WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:10 of 19 5.1.7 Radiated Emissions Test Data Polarization: Vertical: WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:11 of 19 Polarization: Horizontal: WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:12 of 19 5.1.8 Photograph – Radiation Emission Test Setup WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:13 of 19 6 Immunity Test Results 6.1 Performance Criteria Description Criterion A: The apparatus shall continue to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. Criterion B: The apparatus shall continue to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. Criterion C: Temporary loss of function is allowed, provided the function is self recoverable or can be restored by the operation of the controls. For further details, please refer to EN55024. 6.2 ESD Test Requirement: Test Method: Test Result: Discharge Impedance: Discharge Voltage: Polarity: Number of Discharge: Discharge Mode: Discharge Period: EN55024 EN61000-4-2 PASS 330 Ω / 150 pF Air Discharge: +/- 8 kV Contact Discharge: +/- 4 kV HCP & VCP: +/- 4 kV Positive & Negative Minimum 10 times at each test point Single Discharge 1 second minimum 6.2.1 E.U.T. Operation Operating Environment: Temperature : 25.5 °C Humidity : 51 % RH Barometric Pressure : 1012 mbar EUT Operation: Compliance test was performed in working mode connected with the PC. WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:14 of 19 6.2.2 ESD Test Setup The ESD Test steup accordance with the EN 61000-4-2, The Specification used in this report was the EN 55024 Paragraph 4.2 requirements 6.2.3 Direct Application Test Results Observations : Test points : 1. All Exposed Surface & Seams; 2. All metallic part Direct Application Test Results Discharge Level (kV) Polarity (+/-) Test Point Contact Discharge Air Discharge 8 +/- 1 N/A B 4 +/- 2 B N/A Results B: N/A: Criterion B, please refers to clause 6.1 for more details. Not applicable. WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:15 of 19 6.2.4 Indirect Application Test Results Observations : Test points : 1. All sides. Indirect Application Test Results Discharge Level (kV) Polarity (+/-) Test Point Horizontal Coupling Vertical Coupling 4 +/- 1 B B Results B: Criterion B,please refers to clause 6.1 for more details. 6.2.5 Photograph - ESD Test Setup WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:16 of 19 6.3 Radiated Immunity Test Requirement: Test Method: Frequency Range: Face Under Test: Severity: Test Result: EN55024 EN61000-4-3 80MHz–1GHz Three Mutually Orthogonal Faces 3V/m, 1kHz, 80% Amp. Mod. from 80MHz to 1GHz PASS 6.3.1 E.U.T. Operation Operating Environment: Temperature: 25.5 °C Humidity: 51 % RH Barometric Pressure: 1012 mbar EUT Operation: Compliance test was performed in working mode connected with the PC. 6.3.2 Test Setup The Radiated Immunity test steup accordance with the EN 61000-4-3, The Specification used in this report was the EN 55024 Paragraph 4.2.3 requirements. WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:17 of 19 6.3.3 Test Results Frequency Level Modulation EUT Face Result / Observations 80MHz1GHz 3V/m 1kHz, 80%, Amp. Mod. X Y Z During test and after test, the EUT was normal (A). Remarks: AM : Amplitude Modulation. PM : Pulse Modulation. Y : EUT as per photograph in section 6.3.4 of this report. X : As Y, but rotate EUT by 90° clockwise. Z : As Y, but rotate EUT by 90° vertically. Results A : No degradation in the performance of the E.U.T. was observed. 6.3.4 Photograph - Radiated Immunity Test Setup WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:18 of 19 7 Photographs - Constructional Details 7.1 EUT–AppearanceView WALTEK SERVICES Reference No.: WT10093998-E-E-E Page:19 of 19 8 CE Label 1. The CE conformity marking must consist of the initials‘CE’taking the following form: If the CE marking is reduced or enlarged, the proportions given in the above graduated drawing must be respected. 2. The CE marking must have a height of at least 5 mm except where this is not possible on account of the nature of the apparatus. 3. The CE marking must be affixed to the product or to its data plate. Additionally it must be affixed to the packaging, if any, and to the accompanying documents. 4. The CE marking must be affixed visibly, legibly and indelibly. It must have the same height as the initials‘CE’ Proposed Label Location on EUT WALTEK SERVICES Reference No.: WT10093998-E-E-E
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