WT10093998 E Report EMC

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EMC TEST REPORT

WALTEK SERVICES

Reference No.: WT10093998-E-E-E

Reference No. : WT10093998-E-E-E

Applicant : Shenzhen Reflying Electronic Co., Ltd.

Address : 6 Bldg, Fuqiao No.1 Industry Zone, Fuyong Town, Bao`an District,

Shenzhen, Guangdong, China.

Equipment Under Test (EUT) :

Product Name : Earphone

Model No : AEarphone-31

Standards : EN 55022: 2006 +A1: 2007

EN 55024: 1998+A1: 2001+A2: 2003

Date of Test : Sep. 30, 2010

Project Engineer : Tenny.xu

Reviewed By :

Test Result : PASS *

Prepared By:

Waltek Services (Shenzhen) Co., Ltd.

1/F, Fukangtai Building, West Baima Rd., Songgang Street, Baoan District,

Shenzhen 518105, China

Tel :+86-755-27553488

Fax:+86-755-27553868

* The sample detailed above has been tested to the requirements of Council Directives 2004/108/EC. The

test results have been reviewed against the Directives above and found to meet their essential

requirements.

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

1 Test Summary

Test Test Requirement Test Method Class / Severity Result

Mains Terminal Disturbance

Voltage, 150kHz to 30MHz

EN55022:2006

+A1:2007

EN55022:2006

+A1:2007 Class B N/A

Radiation Emission, 30MHz

to 1000MHz

EN 55022:2006

+A1:2007

EN 55022:2006

+A1:2007 Class B PASS

ESD EN 55024 : 1998

+A1:2001+A2:2003 EN 61000-4-2: 2009 Contact

Air PASS

Radiated Immunity

(80MHz to 1GHz)

EN 55024 : 1998

+A1:2001+A2:2003 EN 61000-4-3:2006 3V/m, 80%, 1kHz,

Amp. Mod. PASS

Electrical Fast Transients

(EFT)

EN 55024 : 1998

+A1:2001+A2:2003 EN 61000-4-4:2004 AC±1.0kV

DC±0.5kV N/A

Surge Immunity EN 55024 : 1998

+A1:2001+A2:2003 EN 61000-4-5:2006 ±1kV D.M.†

±2kV C.M.‡ N/A

Injected Currents, 150kHz to

80MHz

EN 55024 : 1998

+A1:2001+A2:2003 EN61000-4-6:2009 3Vrms(emf), 80%,

1kHz Amp. Mod. N/A

Power-frequency magnetic

field

EN 55024 : 1998

+A1:2001+A2:2003

EN 61000-4-8:1993

+A1:2001 3A/m N/A

Voltage Dips and

Interruptions

EN 55024 : 1998

+A1:2001+A2:2003 EN 61000-4-11:2004

>95 % UT* for

0.5per

>95 % UT* for

250per

30 % UT* for 25per

N/A

Remark:

A.M. Amplitude Modulation.

P.M. Pulse Modulation.

† D.M. – Differential Mode

z UT is the nominal supply voltage

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

2 Contents

Page

1 TEST SUMMARY................................................................................................................................................... 2

2 CONTENTS.............................................................................................................................................................. 3

3 GENERAL INFORMATION................................................................................................................................. 4

3.1 CLIENT INFORMATION...........................................................................................................................................4

3.2 DETAILS OF E.U.T................................................................................................................................................. 4

3.3 DESCRIPTION OF SUPPORT UNITS..........................................................................................................................4

3.4 STANDARDS APPLICABLE FOR TESTING ................................................................................................................4

3.5 TEST FACILITY ......................................................................................................................................................5

3.6 TEST LOCATION ....................................................................................................................................................5

4 EQUIPMENT USED DURING TEST................................................................................................................... 6

5 RADIATION EMISSION TEST RESULTS......................................................................................................... 8

5.1 RADIATION EMISSION DATA .................................................................................................................................8

5.1.1 Measurement Uncertainty...........................................................................................................................8

5.1.2 Radiated Test Setup ....................................................................................................................................8

5.1.3 Spectrum Analyzer Setup ............................................................................................................................9

5.1.4 Test procedure ............................................................................................................................................ 9

5.1.5 Corrected Amplitude & Margin Calculation..............................................................................................9

5.1.6 Summary of Test Results.............................................................................................................................9

5.1.7 Radiated Emissions Test Data.................................................................................................................. 10

5.1.8 Photograph – Radiation Emission Test Setup ..........................................................................................12

6 IMMUNITY TEST RESULTS ............................................................................................................................. 13

6.1 PERFORMANCE CRITERIA DESCRIPTION ..............................................................................................................13

6.2 ESD ....................................................................................................................................................................13

6.2.1 E.U.T. Operation ......................................................................................................................................13

6.2.2 ESD Test Setup .........................................................................................................................................14

6.2.3 Direct Application Test Results ................................................................................................................14

6.2.4 Indirect Application Test Results..............................................................................................................15

6.2.5 Photograph - ESD Test Setup...................................................................................................................15

6.3 RADIATED IMMUNITY .........................................................................................................................................16

6.3.1 E.U.T. Operation ......................................................................................................................................16

6.3.2 Test Setup..................................................................................................................................................16

6.3.3 Test Results............................................................................................................................................... 17

6.3.4 Photograph - Radiated Immunity Test Setup............................................................................................17

7 PHOTOGRAPHS - CONSTRUCTIONAL DETAILS....................................................................................... 18

7.1 EUT–APPEARANCEVIEW....................................................................................................................................18

8 CE LABEL ............................................................................................................................................................ 19

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

3 General Information

3.1 Client Information

Applicant : Shenzhen Reflying Electronic Co., Ltd.

Address Of Applicant : 6 Bldg, Fuqiao No.1 Industry Zone, Fuyong Town, Bao`an

District, Shenzhen, Guangdong, China.

Manufacturer : Shenzhen Reflying Electronic Co., Ltd.

Address Of Manufacturer : 6 Bldg, Fuqiao No.1 Industry Zone, Fuyong Town, Bao`an

District, Shenzhen, Guangdong, China.

Product Name : Earphone

Model No. : AEarphone-31

3.2 Details of E.U.T.

Power supply : Audio Signal Input

3.3 Description of Support Units

The EUT has been tested as an independent unit.

3.4 Standards Applicable for Testing

The customer requested EMC tests for an Earphone. The standards used were EN55022 Class

B for emissions & EN55024 for immunity.

.Table 1 : Tests Carried Out Under EN 55022: 2006+A1:2007

Standard Status

EN 55022:2006+A1:2007 Radiation Emission, 30MHz to 1000MHz √

EN 55022:2006+A1:2007 Mains Terminal Disturbance Voltage,150KHz to 30MHz ×

Table 2 : Tests Carried Out Under EN 55024:1998+A1:2001+A2: 2003

Standard Status

EN 61000-4-2:2009 Electro-static discharge √

EN 61000-4-3:2006 Radio frequency EM fields (80MHz to 1GHz) √

EN 61000-4-4:2004 Fast transients ×

EN 61000-4-5:2006 Surges ×

EN 61000-4-6: 2009 Radio frequency continuous conducted (150kHz to 80MHz) ×

EN 61000-4-8:1993+A1:2001 Power-frequency magnetic field (50Hz) ×

EN 61000-4-11:2004 Voltage dips & interruptions ×

√ Indicates that the test is applicable

× Indicates that the test is not applicable

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

3.5 Test Facility

The test facility has a test site registered with the following organizations:

• IC – Registration No.: 7760A

Waltek Services(Shenzhen) Co., Ltd. has been registered and fully described in a report filed

with the Industry Canada. The acceptance letter from the Industry Canada is maintained in our

files. Registration 7760A, Aug. 3, 2010

• FCC – Registration No.: 880581

Waltek Services(Shenzhen) Co., Ltd. EMC Laboratory has been registered and fully

described in a report filed with the (FCC) Federal Communications Commission. The

acceptance letter from the FCC is maintained in our files. Registration 880581, June 24, 2008.

3.6 Test Location

All Emission test and some immunity tests were performed at:-

Waltek Services(Shenzhen) Co., Ltd. at 1/F, Fukangtai Building, West Baima Rd.,Songgang

Street, Baoan District, Shenzhen, China

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

4 Equipment Used during Test

Equipment Brand Name Model

Related

standards Cal.Intal

Months Last Cal.

Date Cert No Serial No

3m Anechoic chamber

EMC Analyzer Agilent E7405A ISO9001: 2000 12 Aug-10 1GA09003

547-0001 MY451149

43

Trilog Broadband

Antenne 30-3000

MHz

SCHWARZBE

CK MESS-

ELEKTROM VULB9163

EN/ISO/IEC

17025

DIN EN

ISO9001

12 Aug-10 336

Broad-band Horn

Antenna 1-18

GHz

SCHWARZBE

CK MESS-

ELEKTROM

BBHA

9120 D

EN/ISO/IEC

17025

DIN EN

ISO9001

12 Aug-10 667

Broadband

Preamplifier 0.5-

18 GHz

SCHWARZBE

CK MESS-

ELEKTROM BBV 9718

EN/ISO/IEC

17025

DIN EN

ISO9001

12 Aug-10 9718-148

10m Coaxial

Cable with N-

male Connectors

usable up to

18GHz,

SCHWARZBE

CK MESS-

ELEKTROM AK 9515 H

EN/ISO/IEC

17025

DIN EN

ISO9001

12 Aug-10 -

10m 50 Ohm

Coaxial Cable

with N-plug,

individual

length,usable up

to 3(5)GHz,

Connectors

SCHWARZBE

CK MESS-

ELEKTROM AK 9513

EN/ISO/IEC

17025

DIN EN

ISO9001

12 Aug-10 -

Positioning

Controller C&C LAB CC-C-IF ISO9001 12 Aug-10 MF7802108

Color Monitor SUNSPO SP-14C ISO9001 12 Aug-10 -

EMI Shielded Room

Test Receiver ROHDE&SCH

WARZ ESPI ISO9001 12 Aug-10

1GA09003

547-0002 101155

Two-Line V-

Network ROHDE&SCH

WARZ ENV216 ISO9001

EN/ISO/IEC

17025 12 Aug-10

1GA09003

547-0005 100115

V－LISN SCHWARZBE

CK MESS-

ELEKTRONIK

NSLK

8128

CISPR16-1-2

EN55016-1-2：

2004+A1:

2005+A2: 2006

12 Aug-10

1GA09003

547-0003 8128-259

Absorbing Clamp ROHDE&SCH

WARZ MDS-21 ISO9001

EN/ISO/IEC

17025 12 Aug-10

2GB09005

546-0002 100205

10m 50 Ohm

Coaxial Cable

with N-plug,

individual

length,usable up

to 3(5)GHz,

Connectors

SCHWARZBE

CK MESS-

ELEKTROM AK 9514

EN/ISO/IEC

17025

DIN EN

ISO9001

12 Aug-10 -

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

Harmonic & Flicker Test

Digital Power

Analyzer

Em Test

AG/Switzerlan

d DPA 500

EN/IEC JIS C

61000-3-2

EN/IEC 61000-

3-3

12 1GA09003

554-0005 V07451030

95

Power Source Em Test

AG/Switzerlan

d ACS 500 IEC 61000-3-3

IEC61000-3-2 12

Aug-10

1GA09003

554-0004 V07451030

96

Electrostatic Discharge Test

Electrostatic

Discharge

Simulator

Em Test

AG/Switzerlan

d DITO IEC 61000-4-2

ISO 10605 12 Aug-10

2GB09005

546-0001 V07451030

94

Radio-Frequency Conducted Immunity Test

RF Generator TESEQ GmbH NSG4070 IEC61000-4-6 12 Aug-10 1GA09003

554-0003 25781

CDN M-Type TESEQ GmbH CDN M016 IEC61000-4-6 12 Aug-10 25112

EM-Clamp TESEQ GmbH KEMZ 801 IEC61000-4-6 12 Aug-10 25453

Attenuator 6dB TESEQ GmbH ATN6050 IEC61000-4-6 12 Aug-10 1GA09003

547-0004 25365

Calibrated

Equipment TESEQ GmbH CAL 801 IEC61000-4-6 12 Aug-10 70348

Calibrated

Equipment TESEQ GmbH CAL

U100A IEC61000-4-6 12 Aug-10 25018

Calibrated

Equipment TESEQ GmbH TRA U150 IEC61000-4-6 12 Aug-10 25299

Fast Transient/Surges/Voltage Dips Short Interruptions and Voltage Variations Immunity Tests

All Modules

Generator SCHAFFNER 6150 IEC61000-4-4

IEC61000-4-5

IEC61000-4-11 12 Aug-10

1GA09003

554-0001 34579

Capacitive

Coupling Clamp SCHAFFNER CDN 8014 IEC61000-4-4 12 Aug-10 25311

Signal and Data

Line Coupling

Network SCHAFFNER CDN 117 IEC61000-4-5 12 Aug-10 25627

AC Power Supply TONGYUN DTDGC-4 12 Aug-10 1GA09003

554-0002 -

Electromagnetic Fields Radiation Exposure Test

Exposure Level

Tester ELT-400 Narda Safety

TEST Solutions 2304/03 ISO 9001

ISO 10012-1 12 M-0155

Magnetic Field

Probe 100cm2 Narda Safety

TEST Solutions 2300/90.1

0 ISO 9001

ISO 10012-1 12

Aug-10

M-1070

Low Frequency Radiation Test

Active Loop

Antenna Charger

10kHz-30MHz Beijing Dazhi ZN30900A ISO 9001

12 Aug-10 -

Large loop

antenna Laplace RF300 12 Aug-10 9057

Other

computer Acer AG1720

Mp3 iPod

A1285 5K85004U

3R0 - - N/A N/A -

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

5 Radiation Emission Test Results

5.1 Radiation Emission Data

Test Requirement: EN 55022 Class B

Test Method: EN 55022 Class B

Test Result: PASS

Frequency Range: 30MHz to 1000MHz

Class/Severity: Class B

Detector: Peak for pre-scan (120kHz Resolution Bandwidth)

Quasi-Peak & Average if maximised peak within 6dB of Average

Limit

5.1.1 Measurement Uncertainty

All measurements involve certain levels of uncertainties, especially in the field of EMC. The

factors contributing to uncertainties are spectrum analyzer, cable loss, antenna factor

calibration, antenna directivity, antenna factor variation with height, antenna phase center

variation, antenna factor frequency interpolation, measurement distance variation, site

imperfections, mismatch (average), and system repeatability.

Based on CISPR16-4-2, The Treatment of Uncertainty in EMC Measurements, the best

estimate of the uncertainty of a radiation emissions measurement at Waltek EMC Lab is

+5.03 dB.

5.1.2 Radiated Test Setup

The radiated emission tests were performed in the 3m Semi- Anechoic Chamber test site,

using the setup accordance with the EN 55022:2006+A1:2007, The specification used in this

report was the EN 55022:2006+A1:2007 Paragraph 6 limits.

Compliance test was performed in working mode connected with the PC.

Page:9 of 19

WALTEK SERVICES

Reference No.: WT10093998-E-E-E

5.1.3 Spectrum Analyzer Setup

According to EN55022 Class B Rules, the system was tested to 1000 MHz.

Start Frequency..............................................30 MHz

Stop Frequency..............................................1000 MHz

Sweep Speed Auto

IF Bandwidth.............................................120KHz

Video Bandwidth...........................................100KHz

Quasi-Peak Adapter Bandwidth ....................120 KHz

Quasi-Peak Adapter Mode ............................Normal

Resolution Bandwidth ...................................100KHz

5.1.4 Test procedure

For the radiated emissions test, maximizing procedure was performed on the six (6) highest

emissions to ensure EUT is compliant with all installation combinations.

All data was recorded in the peak detection mode. Quasi-peak readings was performed only

when an emission was found to be marginal (within +/-4 dBμV of specification limits), and

are distinguished with a "Qp" in the data table.

The EUT was under normal mode during the final qualification test and the configuration was

used to represent the worst case results.

5.1.5 Corrected Amplitude & Margin Calculation

The Corrected Amplitude is calculated by adding the Antenna Factor and Cable Factor, and

subtracting the Amplifier Gain from the Amplitude reading. The basic equation is as follows:

Corr. Ampl. = Indicated Reading + Antenna Factor + Cable Factor - Amplifier Gain

The “Margin” column of the following data tables indicates the degree of compliance with

the applicable limit. For example, a margin of -7dBμV means the emission is 7dBμV below

the maximum limit for Class B. The equation for margin calculation is as follows:

Margin = Corr. Ampl. – Class B Limit

5.1.6 Summary of Test Results

According to the data in section 5.1.7, the EUT complied with the EN55022 Class B

standards.

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

5.1.7 Radiated Emissions Test Data

Polarization: Vertical:

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

Polarization: Horizontal:

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

5.1.8 Photograph – Radiation Emission Test Setup

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

6 Immunity Test Results

6.1 Performance Criteria Description

Criterion A: The apparatus shall continue to operate as intended. No degradation of

performance or loss of function is allowed below a performance level specified by

the manufacturer, when the apparatus is used as intended.

Criterion B: The apparatus shall continue to operate as intended after the test. No degradation

of performance or loss of function is allowed below a performance level specified

by the manufacturer, when the apparatus is used as intended.

Criterion C: Temporary loss of function is allowed, provided the function is self recoverable or

can be restored by the operation of the controls.

For further details, please refer to EN55024.

6.2 ESD

Test Requirement: EN55024

Test Method: EN61000-4-2

Test Result: PASS

Discharge Impedance: 330 Ω / 150 pF

Discharge Voltage: Air Discharge: +/- 8 kV

Contact Discharge: +/- 4 kV

HCP & VCP: +/- 4 kV

Polarity: Positive & Negative

Number of Discharge: Minimum 10 times at each test point

Discharge Mode: Single Discharge

Discharge Period: 1 second minimum

6.2.1 E.U.T. Operation

Operating Environment:

Temperature : 25.5 °C

Humidity : 51 % RH

Barometric Pressure : 1012 mbar

EUT Operation:

Compliance test was performed in working mode connected with the PC.

Page:14 of 19

WALTEK SERVICES

Reference No.: WT10093998-E-E-E

6.2.2 ESD Test Setup

The ESD Test steup accordance with the EN 61000-4-2, The Specification

used in this report was the EN 55024 Paragraph 4.2 requirements

6.2.3 Direct Application Test Results

Observations : Test points : 1. All Exposed Surface & Seams;

2. All metallic part

Direct Application Test Results

Discharge Level (kV) Polarity (+/-) Test Point Contact Discharge Air Discharge

8 +/- 1 N/A B

4 +/- 2 B N/A

Results

B: Criterion B, please refers to clause 6.1 for more details.

N/A: Not applicable.

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

6.2.4 Indirect Application Test Results

Observations : Test points : 1. All sides.

Indirect Application Test Results

Discharge Level (kV) Polarity (+/-) Test Point Horizontal Coupling Vertical Coupling

4 +/- 1 B B

Results

B: Criterion B,please refers to clause 6.1 for more details.

6.2.5 Photograph - ESD Test Setup

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

6.3 Radiated Immunity

Test Requirement: EN55024

Test Method: EN61000-4-3

Frequency Range: 80MHz–1GHz

Face Under Test: Three Mutually Orthogonal Faces

Severity: 3V/m, 1kHz, 80% Amp. Mod. from 80MHz to 1GHz

Test Result: PASS

6.3.1 E.U.T. Operation

Operating Environment:

Temperature: 25.5 °C

Humidity: 51 % RH

Barometric Pressure: 1012 mbar

EUT Operation:

Compliance test was performed in working mode connected with the PC.

6.3.2 Test Setup

The Radiated Immunity test steup accordance with the EN 61000-4-3, The Specification

used in this report was the EN 55024 Paragraph 4.2.3 requirements.

Page:17 of 19

WALTEK SERVICES

Reference No.: WT10093998-E-E-E

6.3.3 Test Results

Frequency Level Modulation EUT Face Result / Observations

80MHz-

1GHz 3V/m 1kHz, 80%,

Amp. Mod.

X

Y

Z

During test and

after test, the EUT was normal (A).

Remarks:

AM : Amplitude Modulation.

PM : Pulse Modulation.

Y : EUT as per photograph in section 6.3.4 of this report.

X : As Y, but rotate EUT by 90° clockwise.

Z : As Y, but rotate EUT by 90° vertically.

Results

A : No degradation in the performance of the E.U.T. was observed.

6.3.4 Photograph - Radiated Immunity Test Setup

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

7 Photographs - Constructional Details

7.1 EUT–AppearanceView

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WALTEK SERVICES

Reference No.: WT10093998-E-E-E

8 CE Label

1. The CE conformity marking must consist of the initials‘CE’taking the following form:

If the CE marking is reduced or enlarged, the proportions given in the above graduated

drawing must be respected.

2. The CE marking must have a height of at least 5 mm except where this is not possible on

account of the nature of the apparatus.

3. The CE marking must be affixed to the product or to its data plate. Additionally it must be

affixed to the packaging, if any, and to the accompanying documents.

4. The CE marking must be affixed visibly, legibly and indelibly.

It must have the same height as the initials‘CE’

Proposed Label Location on EUT