LG Electronics USA 3G1XINBTS STAREX-IS 1900 Indoor BTS User Manual STAREX IS User s Manual
LG Electronics USA STAREX-IS 1900 Indoor BTS STAREX IS User s Manual
Contents
Users Manual Part C

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Fig. 4.4-24 Result of SLPA BLOCK Command 
4.4.4.8. SLPA UNBLOCK Command 
Function to unblock SLPA. 
Command : UBLK-SLPA:BSC=a,SMP=b,SLPA=c,[SLV=d]; 
a : BSC Number(00~11) 
b : SMP Number(00~04) 
c : SLPA Number(00~17) 
d : SLV Number(00~03) 
Input : UBLK-SLPA:BSC=0,SMP=0,SLPA=0,SLV=0; 
Fig. 4.4-25 Result of SLPA UNBLOCK Command 
4.4.4.9. VCPA BLOCK Command 
Function to block VCPA. 
Command : BLK-VCPA:BSC=a,VMP=b,VCPA=c,[SLV=d],[DSP=e]; 
a : BSC Number(00~11) 

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b : VMP Number(00~07) 
c : VCPA Number(00~15) 
d : SLV Number(00~01) 
e : DSP Number(00~03) 
Input : BLK-VCPA:BSC=0,VMP=0,VCPA=0,SLV=0,DSP=0; 
Fig. 4.4-26 Result of VCPA BLOCK Command 
4.4.4.10. VCPA UNBLOCK Command 
Function to unblock VCPA 
Command : UBLK-VCPA:BSC=a,VMP=b,VCPA=c,[SLV=d],[DSP=e]; 
a : BSC Number(00~11) 
b : VMP Number(00~07) 
c : VCPA Number(00~15) 
d : SLV Number(00~01) 
e : DSP Number(00~03) 
Input : UBLK-VCPA:BSC=0,VMP=0,VCPA=0,SLV=0,DSP=0; 

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Fig. 4.4-27 Result of VCPA UNBLOCK Command 
4.4.4.11. VLIA BLOCK Command 
Function to block VLIA. 
Command : BLK-VLIA:BSC=0,VMP=0,VLIA=0,[E1=0],[TS=1]; 
a : BSC Number(00~11) 
b : VMP Number(00~07) 
c : VLIA Number(0~1) 
d : E1 Number(00~15) 
e : TS Number(00~31) 
Input : BLK-VLIA:BSC=0,VMP=0,VLIA=0,E1=0,TS=1; 
Fig. 4.4-28 Result of VLIA BLOCK Command 
4.4.4.12. VLIA UNBLOCK Command 
Function to unblock VLIA 
Command : UBLK-VLIA:BSC=0,VMP=0,VLIA=0,[E1=0],[TS=1]; 
a : BSC Number(00~11) 
b : VMP Number(00~07) 

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c : VLIA Number(0~1) 
d : E1 Number(00~15) 
e : TS Number(00~31) 
Input : UBLK-VLIA:BSC=0,VMP=0,VLIA=0,E1=0,TS=1; 
Fig. 4.4-29 Result of VLIA UNBLOCK Command 
4.4.4.13. H/W RESET BSC Device Command 
Function to reset BSC Device on H/W Level. 
Command : RMT-BSC-DEV:BSC=a,PROC=b,DEV=c,ID=d,[SUBID=e],CLS=f; 
a : BSC Number(00~11) 
b : Processor Name(NCP,SCP,ALP,SMP(00~05),VMP(00~07)) 
c : Device Name(SLPA,VCPA,VLIA,STIA,ASCA,ASIA,AOTA,ATSA,ALMA) 
d : Device ID(00~17) 
e : Sub_id(A_SIDE,B_SIDE) 
f : Class(HARDRST,ISOLAT,UNISOL) 
Input : RMT-BSC-DEV:BSC=0,PROC=SMP00,DEV=SLPA,ID=0,CLS=HARDRST; 

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Fig. 4.4-30 Result of BSC Device H/W Reset Command 
4.4.4.14.   H/W RESET ALPA Command 
Function to reset ALPA on H/W Level. 
Command : RMT-ALPA:BSC=0,ALMA=0,ALPA=0,CLS=HARDRST; 
a : BSC Number(00~11) 
b : ALMA ID(0~1) 
c : ALPA ID(0~4) 
d : Class(HARDRST,ISOLAT,UNISOL) 
Input : RMT-ALPA:BSC=0,ALMA=0,ALPA=0,CLS=HARDRST; 
Fig. 4.4-31 Result of H/W RESET ALPA Command 
4.4.5. Bts Device Status Control 
4.4.5.1. BTS Device Status Display Command 
Function to display the BTS Device status 
Command : DIS-BTS-DEV:BSC=a,BTS=b,PROC=c; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : Processor Name(BSP,BPP,CRP,RCP(00~06) 

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Input : DIS-BTS-DEV:BSC=0,BTS=0,PROC=CRP; 
Fig. 4.4-32 Result of BTS Device Status Display Command 
4.4.5.2. FA Status Display Command 
Function to display FA Status. 
Command : DIS-FA-STS:BSC=a,BTS=bFA=c; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : FA Number(0~7) 
Input : DIS-FA-STS:BSC=0,BTS=0,FA=0; 

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Fig. 4.4-33 Result of FA Status Display Command 
4.4.5.3. BLOCK DBPA Command 
Function to block DBPA. 
Command : BLK-DBPA:BSC=a,BTS=b,RCP=c,DBPA=d,[CHIP=e],[CONDITION=f]; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : RCP Number(0~5) 

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d : DBPA Number(0~9) 
e : CHIP Number(0~1) 
f : Select Option(conditional, unconditional) 
Conditional : If there is call connected, wait until it is disconnected during timeout and 
then block it. If it is not disconnected until timeout, do not block it. 
Unconditional : block a call regardless of their presence unconditionally. (The existing 
call is disconnected) 
Reference : If an OverHead Channel is allocated, do not block a call unconditionally. 
Input : BLK-DBPA:BSC=0,BTS=0,RCP=0,DBPA=1,CHIP=1,CONDITION=CONDITION; 
Fig. 4.4-34 Result of BLOCK DBPA Command 
4.4.5.4.   UNBLOCK DBPA Command 
Function to unblock DBPA 
Command : UBLK-DBPA:BSC=a,BTS=b,RCP=c,DBPA=d,[CHIP=e],[CONDITION=f]; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : RCP Number(0~5) 
d : DBPA Number(0~9) 
e : CHIP Number(0~1) 
Input : UBLK-DBPA:BSC=0,BTS=0,RCP=0,DBPA=1,CHIP=1; 

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Fig. 4.4-35 Result of UNBLOCK DBPA Command 
4.4.5.5.   BLOCK OverHead Channel Element Display Command 
Function to block OverHead Channel Element   
Command : BLK-OVHD-CE:BSC=a,BTS=b,SECTOR=c,FA=d; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : SECTOR(ALPHA,BETA,GAMMA,DELTA,EPSILON,ZETA) 
d : FA Number(0~5) 
Input : BLK-OVHD-CE:BSC=0,BTS=0,SECTOR=ALPHA,FA=0; 
Fig. 4.4-36 Result of BLOCK OverHead Channel Element Display 
4.4.5.6.   UNBLOCK OverHead Channel Element 
Function to unblock OverHead Channel Element 

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Command : UBLK-OVHD-CE:BSC=a,BTS=b,SECTOR=c,FA=d; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : SECTOR(ALPHA,BETA,GAMMA,DELTA,EPSILON,ZETA) 
d : FA Number(0~5) 
Input : UBLK-OVHD-CE:BSC=0,BTS=0,SECTOR=ALPHA,FA=0; 
Fig. 4.4-37 Result of UNBLOCK OverHead Channel Element 
4.4.5.7. H/W RESET BTS Device Command 
Function to reset BTS Device on H/W.Level 
Command : RMT-BTS-DEV:BSC=a,BTS=b,PROC=c,DEV=d,[ID=e],CLS=f; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : Processor Name(BSP,BPP,CRP,RCP(00~05) 
d : Device Name(ARIA,DBPA,BUDA,HPA,PACA,BADA,RISA,BOTA,LICA) 
e : Device ID(0~9) 
f : Class(HARDRST,ISOLAT,UNISOL) 
Input : RMT-BTS-DEV:BSC=0,BTS=0,PROC=CRP,DEV=LICA,ID=0,CLS=HARDRST; 

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Fig. 4.4-38 Result of H/W RESET BTS Device Command 
4.4.5.8.   H/W RESET LPA Device Command 
Function to reset LPA Device on H/W.Level 
Command : RMT-LPA:BSC=a,BTS=b,SECTOR=c,LPA=d,CLS=e; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : SECTOR(ALPHA,BETA,GAMMA,DELTA,EPSILON,ZETA) 
d : LPA Number(0~5) 
e : Class(HARDRST,ISOLAT,UNISOL) 
Input : RMT-LPA:BSC=0,BTS=0,SECTOR=ALPHA,LPA=0,CLS=HARDRST; 
Fig. 4.4-39 Result of H/W RESET LPA Device Command 

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4.4.5.9.   H/W RESET LPA Combiner Command 
Function to reset the LPA Combiner on H/W Level 
Command : RMT-LPA-COM:BSC=a,BTS=b,SHELF=c,COM=d,CLS=e; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : SHELF Number(0~5) 
d : Combiner Number(0~2) 
e : Class(HARDRST,ISOLAT,UNISOL) 
Input : RMT-LPA-COM:BSC=0,BTS=0,SHELF=0,COM=0,CLS=HARDRST; 
Fig. 4.4-40 Result of LPA Combiner H/W RESET Command 
4.4.5.10.   BTS SHELF POWER H/W RESET Command 
Function to reset BTS SHELF POWER on H/W Level 
Command : RMT-BTS-SHF:BSC=a,BTS=b,SHF=c,CLS=d; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : SHELF Name(BANU,RCBU(00~05) 
d : Class(HARDRST,ISOLAT,UNISOL) 
Input : RMT-BTS-SHF:BSC=0,BTS=0,SHF=RCBU00,CLS=HARDRST; 

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Fig. 4.4-41 Result of BTS SHELF POWER H/W RESET Command 
4.4.6. Status Message Control 
Table 4.4-5 Status Message LIST 
Codes  Definition  Description 
S3002 CAN CNP/PNP Status Change 
Display 
When Processor Status changes, it occurs. 
S3003  AMP Status Change Display  When Processor Status changes, it occurs. 
S3004  ALP Status Change Display  When Processor Status changes, it occurs. 
S3005  CCP Status Change Display  When Processor Status changes, it occurs. 
S3006  SMP Status Change Display  When Processor Status changes, it occurs. 
S3007  VMP Status Change Display  When Processor Status changes, it occurs. 
S3008  PCP Status Change Display  When Processor Status changes, it occurs. 
S3009  BSC-NCP Status Change Display  When Processor Status changes, it occurs. 
S3010  BSP Status Change Display  When Processor Status changes, it occurs. 
S3011  SCP Status Change Display  When Processor Status changes, it occurs. 
S3012  BPP Status Change Display  When Processor Status changes, it occurs. 
S3013  RCP Status Change Display  When Processor Status changes, it occurs. 
S3017  CRP Status Change Display  When Processor Status changes, it occurs. 
S3020  PMP Status Change Display  When Processor Status changes, it occurs. 
S3201  CNP ASIA Status Change Display Displayed upon device status change 
S3202 CNP ASCA Status Change 
Display 
Displayed upon device status change 
S3205  PNP ASIA Status Change Display Displayed upon device status change 
S3206 PNP ASCA Status Change 
Display 
Displayed upon device status change 

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S3209 PCP BCRA Status Change 
Display 
Displayed upon device status change 
S3210 PMP BCRA Status Change 
Display 
Displayed upon device status change 
S3211  AMP GPSR Status Change 
Display 
Displayed upon device status change 
S3220  NCP ASIA Status Change Display Displayed upon device status change 
S3221 NCP ASCA Status Change 
Display 
Displayed upon device status change 
S3222 NCP ATSA Status Change 
Display 
Displayed upon device status change 
S3224 ALP ALMA Status Change 
Display 
Displayed upon device status change 
S3230  BSP GPS Status Change Display  Displayed upon device status change 
S3501 CCP Overload State Change 
Display 
Displayed  when  overload  status  is  generated, 
released  and  changed  owing  to  load  change  in 
CCP 
S3502 BSP Overload State Change 
Display 
Displayed  when  overload  status  is  generated, 
released  and  changed  owing  to  load  change  in 
BSP 

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4.4.6.1.   Inhibited Status Message Display Command 
Function to display Status Message whose display to Outterm is inhibited 
Command : DIS-INH-STS; 
Input : DIS-INH-STS; 
Fig. 4.4-42 Result    Inhibited Status Message Display Command 
4.4.6.2.   Status Message Display Inhibition Command 
Function to inhibit Status Message display 
Command : INH-STS-MSG:SN=a; 
a: SN Number(ALL,S3002~S3020,S3201~S3230, S3501,S3502) 
Input : INH-STS-MSG:SN=S3002; 
Fig. 4.4-43 Result of Status Message Display Inhibition Command 

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4.4.6.3.   Allow Inhibited Message Command 
Function to allow display of Status Message whose display to Outterm is inhibited   
Command : ALW-STS-MSG:SN=a; 
a: SN Number(ALL,S3002~S3020, S3201~S3230, S3501,S3502) 
Input : ALW-STS-MSG:SN=S3002; 
Fig. 4.4-44 Result of Inhibited Message Display Allow Command 
4.4.7. Overload Status Control 
4.4.7.1.   Processor Overload Status Display Command 
Function to display processor Overload Status 
Command : DIS-OVLD-STS:[BSC=a],[BTS=b],PROC=c; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : Processor Name(CCP,BSP) 
Input : DIS-OVLD-STS:BSC=0,BTS=0,PROC=BSP; 

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Fig. 4.4-45 Result of Processor Overload Status Display Command 
4.4.7.2.   Overload Threshold Value Display Command 
Function to display Overload Threshold Value 
Command : DIS-OVLD-THR:BSC=a,[BTS=b],PROC=c; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : Processor Name(CCP,BSP) 
Input : DIS-OVLD-THR:BSC=0,BTS=0,PROC=BSP; 

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Fig. 4.4-46 Result of Overload Threshold Value Display Command 
4.4.7.3.   Overload Threshold Value Change Command 
Function to change Overload Threshold Value. 
Command: 
CHG-OVLD-THR:BSC:a,[BTS=b],LEVEL=c,[LOAD=d], [ORG_PER=e],[TER_PER=f]; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c : LEVEL(0~100) 
d : LOAD(0~100) 
e : ORG_PER(0~100) 
f : TER_PER(0~100) 
Input : 
CHG-OVLD-THR:BSC:0,BTS=0,LEVEL=0,LOAD=100, ORG_PER=97,TER_PER=100; 

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Fig. 4.4-47 Result of Overload Threshold Value Change Command 
4.4.7.4.   Overload Generation Test Command 
Function to generate Overload threshold value 
Command : STRT-OVLD-GEN:BSC=a,[BTS=b],PROC=c,LEVEL=d; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c: Processor Name(CCP,BSP) 
d: LEVEL(0~24) 
Input : STRT-OVLD-GEN:BSC=0,BTS=0,PROC=BSP,LEVEL=0; 
Fig. 4.4-48 Result of Overload Generation Test Command 
4.4.7.5.   Overload Generation Test STOP Command 

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Function to stop the Overload Generation Test 
Command : STOP-OVLD-GEN:BSC=a,[BTS=b],PROC=c,LEVEL=d; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c: Processor Name(CCP,BSP) 
d: LEVEL(0~24) 
Input : STOP-OVLD-GEN:BSC=0,BTS=0,PROC=BSP,LEVEL=0; 
Fig. 4.4-49 Result of Overload Generation Test STOP Command   
4.4.7.6. Command to Display Whether or not the Overload Generation 
Test is performed 
Function to find out whether the Overload Display Test is performed 
Command : DIS-OVLD-GEN:BSC=a,[BTS=b],PROC=c,LEVEL=d; 
a : BSC Number(00~11) 
b : BTS Number(00~47) 
c: Processor Name(CCP,BSP) 
d: LEVEL(0~24) 
Input : DIS-OVLD-GEN:BSC=0,BTS=0,PROC=BSP,LEVEL=0; 

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Fig. 4.4-50 Command to Determine Whether to Perform the Overload Generation Test   

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4.5.   Test Command 
4.5.1. On-Line Test-related Command 
On-Line Test is a function that allows a test to be performed automatically  at  a 
specific time on a specific day and includes the following: Vocoder, CE, BTS Markov 
test and VSWR test. The tests of CE, BTS Markov and VSWR find out  presence  of 
faults in  hardware of Channel Elements in BTS and the test function  for  radio 
environment,  and  the  Vocoder  test  finds  out  presence  of  faults  in    hardware  of 
Vocoder in BSC. Because the tests of CE, Vocoder, BTS Markov, and VSWR seize call 
resources, the user designates the specific time (idlest time) during the time that only 
a test is allowed. The tests of CE, BTS Markov, and VSWR are conducted under  the 
supervision of BSP while the Vocoder test is conducted under the supervision of CCP. 
If  the  user  designates  the  day  and  start/ending  time  for  the  Online test, and the ID 
scope of the board to be tested, BSM becomes the designated time of the designated 
day and if the test is in the ALLOW status, it commands    the corresponding Processor 
to start/end the test. 
The performance of the On-Line test is decided by Command INH-ONL-TEST (Inhibit 
Test), ALW-ONL-TEST(Allow Test). Only when the status is designated as “ALLOW” 
by  ALW-ONL-TEST  Command,  On-Line  test  is  performed.  The  Command of INH-
ONL-TEST inhibits the test. Besides these two Commands, there is a command to stop 
the test by each Test(CE : STS-CE-ONL, Vocoder : STS-VCE-ONL,  BTS Markov : 
STS-MKV-ONL,  VSWR  :  STS-VSWR-ONL).  If  the  test  was  stopped  by  INHIBIT 
Command,  the  On-Line  Test  is  not  performed  even  if  the  designated time of the 
designated  day  of  the  week  arrives  because  inhibit/allow  status  is  changed  to 
“INHIBIT”. ,. However,  if the Test  was stopped  by the above  listed STOP  Command, 
the  On-Line  Test  that  was  performed  on  that  day  only  comes  to  a  halt  and  at  the 
designated  time  of  the  next  designated  day  of  the  week  the  On-Line  Test  is  to  be 
performed  normally  because DB Flag  that  indicates  the  status  of  INHIBIT/ALLOW  is 
not changed 
.   
4.5.1.1. On-Line Test Inhibit Command 
It is the    function that inhibits On Line Test for CE, Vocoder, BTS Markov, and VSWR 
test. In the cases of CE, BTS Markov, and VSWR test, input the corresponding  BTS 
number and in the case of Vocoder test, input the corresponding  BSC number. 
• Command  INH-ONL-TEST:EXE=a, BSC=b,[BTS=c]; 
  a: VCE/CE/MKV/VSWR 

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  b: BSC number (0~11) 
  c: BTS number (0~47) 
• Input/Output 
Fig. 4.5-1 Result of Test Inhibit Command Execution 
4.5.1.2. On-Line Test Allow Command 
Function that allows Online Test for CE, Vocoder, BTS Markov, and VSWR test 
For  CE,  BTS  Markov  and  VSWR  test,  input  the  corresponding  BTS  number and for 
Vocoder test, input corresponding BSC number. 
• Command ALW-ONL-TEST:EXE=a,BSC=b[BTS=c]; 
  a: VCE/CE/MKV/VSWR 
  b: BSC number (0~11) 
  c: BTS number (0~47) 
• Input/Output 

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Fig. 4.5-2 Result of Test Allow Command Execution 
4.5.1.3. On-Line Test Inhibit Item Display Function 
Function to display the inhibit of the on line test for the specific tests among the on-
line tests by BSC and BTS. For Vocoder test, it displays Inhibit status. In case of CE, 
BTS Markov and in case of the VSWR test, it displays the status by BTS. 
 • Command  DIS-INH-ONL:EXE=a,BSC=b[BTS=c]; 
  a: VCE/CE/MKV/VSWR 
  b: BSC number (0~11) 
  c: BTS number (0~47) 
 • Input/Output 

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Fig. 4.5-3 Result of Test Inhibit/Allow List Display Command Execution 

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4.5.2. Test-related to Channel Element   
Channel Element Test  is performed in  BIT(Built In Test)  for each chip. The  types of 
BIT Test are as follows: 
- Bus Interrupt Test 
- ChipX16 Test 
- PP2S Test 
- PCG Test 
This BIT Test is normally performed on Chip with OVHD channel and Chip seized with 
a call and the result is reported to BSM. 
Table 4.5-1CE Test Result Message 
On-Demand    DESCRIPTION 
BIT_OK 
BIT_BUS_FAIL 
BIT_INT_FAIL 
BIT_CHIPX16_FAIL    BIT_PP2S_FAIL 
BIT_PCG_FAIL 
BIT_RAM_FAIL 
BIT_PROGRESS_FAIL 
NORMAL 
BUS INTERFACE TEST FAIL 
INTERNAL INTERRUPT TEST FAIL 
CHIPX16 TEST FAIL 
PCG TEST FAIL 
MEMORY TEST FAIL 
TEST PERFORMING FAIL 
4.5.2.1. Channel Element Test Function 
Function to perform BIT test by CHC and CHIP unit. 
• Command TEST-CE :BSC=a ,BTS=b ,PROC=c [,CHC=d] [,CHIP=e]; 
  a: BSC number (0~11) 
  b: BTS number (0~47) 
  c: RCP number (0~9) 
  d: Channel Card Number (0~9) 
  e: Chip Number (0~1) 
• Input/Output 

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Fig. 4.5-4 Result of CE BIT Test Execution 

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4.5.3. Vocoder Test Function 
The types of Vocoder Tests are as follows: 
      o DSP H/W Test  
          -  Determines  the  presence  of  problems  in  ROM,  RAM,  ALU  of  DSP  in 
Vocoder   
          - Diagnosis the presence of problems by checking Checksum,  Read/Write, 
Flag Set, etc. 
          - Caused by defective DSP Chip 
o Timing Module Test (Channel Test) 
-  VCP generates Vocoder and Tx.Rx Timing by using MFP(Multiple-
Function Processor) in order to exchange voice data with SLP every 
20ms.   
         -  It judges the presence of problems in Vocoder counter  by  checking  the 
generated Rx.Tx timing. 
      o Loopback Test (Channel Test) 
-  It is a test to decide whether or not the status of Loop used in  Qcelp 
Algorithm test is normal and its Loop section has VLIA, VCMA and VCPA. 
All  of them  should  be  normal  to  execute the  Qcelp  Algorithm test.  VCP 
generates Test Pattern and by checking the Loopbacked result, it decides 
an absence of failure. 
      o QCELP Algorithm Test (Channel Test) 
-  Due to intermittent problems in Vocoder and VCPA Card H/W, a 
phenomenon that a call is not heard bi-directionally occurs. In order to 
prevent this from happening, Qcelp Algorithm is tested. This test 
determines  whether  Vocoder  is  normal  by  testing  whether  status 
transition of Qcelp Algorithm is normally performed by the state. .   
Table 4.5-2  Vocoder Test Result 
On-Demand / On-Line Message  Description 

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FLT_DSP_HW 
FLT_CLK 
FLT_VCPA_LOOPBACK 
FLT_VCMA_LOOPBACK 
FLT_VLIA_LOOPBACK 
FLT_QCELP_ST0 
FLT_QCELP_ST1 
FLT_QCELP_ST2 
FLT_QCELP_ST3 
DSP HW test Fault 
Timing Module test Fault 
Vocoder Processor Loopback test Fault 
Vocoder Master board Loopback test Fault 
Vocoder Line interface Loopback test Fault 
Qcelp Algorithm test Fault state0 
Qcelp Algorithm test Fault state1 
Qcelp Algorithm test Fault state2 
Qcelp Algorithm test Fault state3 
4.5.3.1. On-Demand Vocoder Test Function 
Function to test Vocoder DSP or Channel by VCP/SLAVE/CHIP unit. 
• Command TEST-VCE: BSC=a ,VMP=b ,S_VCP=c [,E_VCP=d] [,SLAVE=e] [,CHIP=f] 
[,VCE=g] ,TYPE=h [,OPTION=i] [,WAIT_T=j] 
  a: BSC number (0~11) 
  b: VMP number (0~7) 
  c, d: VCP number (0~15) 
  e: SLAVE number (0~1) 
  f : CHIP number (0 ~ 3) 
  h: Test Type(DSP, Channel) 
  i:  Test  Option(SKIP,  RELEASE,  WAIT_THEN)  =>  These  are  options 
used to test channels when a call is seized, and SKIP does not perform a test 
when a call is seized but skips. With option RELEASE, it disconnects  a  call 
when  a  call  is  seized  and  then  performs  a  test.  With  option  WAIT_THEN,  it 
waits as long as j time is allowed and if a call is released within the designated 
time, then it goes on with    a test. However, if a call is not released, it skips.   
J: Wait Time(5~300 sec)    
• Input/Output 

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Fig. 4.5-5 Result of On-Demand Vocoder Test(Channel Type) Execution 

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Fig. 4.5-6 Result of On-Demand Vocoder Test(DSP Type) Execution 
4.5.3.2. Parameter Change Command Related to On-Line Vocoder Test     
Function to change On-Line Vocoder test start/ending time, test day and the scope of 
VMP/VCP to be tested. 
•  Command  CHG-VCE-PARA  :BSC=a  ,S_VMP=b  [,E_VMP=c]  ,S_VCP=d  [,E_VCP=e] 
[,STI ME=f] [,ETIME=g] ,WDAY=h; 
  a: BSC number (0~11) 
  b,c: VMP number(0~7) 
  d,e: VCP number(0~15) 
  f: On-Line test Start Time (0~23 Hour) 
  g: On-Line test End Time (1~24 Hour) 
  h: Test Day(Month ~ Day, Daily) 
• Input/Output 

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Fig. 4.5-7 Result of On-Line Vocoder Test parameter Change Command Execution 
Fig. 4.5-8 Result of On-Line Test at the time of On-Line Vocoder Test Execution 

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Parameter Change 
4.5.3.3. Parameter Display Command related to On-Line Vocoder Test   
Function to display On-Line Vocoder test start/ending time, test day, and the scope of 
VMP/VCPto be tested.   
• Command DIS-VCE-PARA:BSC=a; 
  a: BSC number (0~11) 
• Input/Output 
Fig. 4.5-9 Result of On-Line Vocoder Test Parameter Display Command Execution 
4.5.3.4. Display Command of On-Line Vocoder Test Result 
Function to display the On-Line Vocoder Test Results which are stored in CCP to BSM 
by the VMP unit 
 • Command DIS-VCE-RSLT:BSC=a,VMP=b; 
  a: BSC number (0~11) 
  b: VMP number (0~7) 

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 • Input/Output 
Fig. 4.5-10 On-Line Vocoder Test Result Display Command 
4.5.3.5.   Display Command of On-Line Vocoder Test Status 
Function to display the On-Line Vocoder Test performance status and to stop the test. 
If  Item Field  is  designated as  “DISPLAY”, it  displays On-Line  Vocoder  test status of 
the present corresponding BSC, and if it is designated as "END_ONL", it stops current 
On-Line test.   
 • Command STS-VCE-ONL:BSC=a,ITEM=b; 
  a: BSC number (0~11) 
  b: Execution ITEM (DISPLAY/END-ONL) 
 • Input/Output 

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Fig. 4.5-11 On-Line Vocoder Test End Command, Status Display Command Execution Result 

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4.5.4. Link Test Function 
Link test is divided into PING test, IPC test, ATM Path test, and Trunk BER test. PING 
test checks the Link status of Application Level by using Ping command from Master 
Processor to each Target Processor. IPC test checks the presence  of  problems  in 
LINK by conducting IPC Test to the mounted processors/devices. ATM  Path  test 
checks presence of faults in ATM LINK Level by conducting ATM Layer Test on the 
mounted Processor/Devices. Trunk BER test sends/receives the designated number of 
ATM Cells to the operator designated BTS Link to get Error Rate. 
4.5.4.1. Trunk BER Test Function 
Function  to check  the  presence of  problems  in  Trunk(16 E1)  Link  between BTS and 
BSC. Trunk BER Test analyzes performance per Link of each ALPA and LICA and the 
analyzed result is displayed in a certain format to BMS. One link is selected and while 
exchanging  as  many  as  the  designated  number  of  ATM  Cells,  test  is  conducted  and 
Data Error Rate is displayed. 
 • Command TEST-LINK :BSC=a ,ALPA=b [,CNT=c] [,RATE=d]; 
  a: BSC number (0~11) 
  b: ALPA number(0~9) 
  c: Send Cell Count(1 ~ 1,000,000) 
  d: Data Rate(1 ~ 90: Number of Cells transferred per a second) 
 • Input/Output 

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Fig. 4.5-12 Result of Trunk BER Test Performance 
4.5.4.2. PING Test Function 
Function to check Link Status for the Target Processor by the Master Processor that 
was input to MMI of BSM by using the Ping command 
Ping test is divided into Point To Point Test and Point To Multi Test. 
• Command TEST-PING:SRC=a,DST=b[,BSC=c][,BTS=d][,SMP=e][,VMP=f][,PCF=g]; 
  a: Source Processor 
  b: Destination Processor(If there is input, it is PTP, if not, it is PTM) 
  c: BSC number(0~11) 
  d: BTS number(0~47) 

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  e: SMP number(0~5) 
  f: VMP number(0~7) 
  g: PCF number(0~2) 
 • Input/Output 
Fig. 4.5-13 Result of PING Test Performance 
4.5.4.3. IPC Test Function 
Function  to  check  the  presence  of  problems  in  the  Link  status  between 
Processor/Device by executing IPC command of Application Level . 
IPC Test is divided into PTP test and PTM test. 
 •  Command  TEST-IPC  :SRC=a  [,DST=b]  [,BSC=c]  [,BTS=d]  [,SMP=e]  [,VMP=f] 
[,PCF=g]; 
  a: Source Processor 
  b: Destination Processor(If input does exist, it is PTP and if not, it is PTM) 
  c: BSC number(0~11) 
  d: BTS number(0~47) 

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  e: SMP number(0~5) 
  f: VMP number(0~7) 
  g: PCF number(0~2) 
 • Input/Output 
Fig. 4.5-14 Result of IPC Test Performance 
4.5.4.4. ATM Path Test Function 
Function to check presence of problems in Link Status between Processor and Device 
by executing ATM CC, LB, PM command. 
It is divided into PTP Test and PTM Test. 
 • Command TEST-
TM:SRC=a[,DST=b],CLASS=c,LEVEL=d[,BSC=e][,BTS=f][,SMP=g] [,VMP=h] [,PCF=i]; 
  a: Source Processor 
  b: Destination Processor(If input does exist, it is PTP, and if not, it is PTM) 
  c: Test class(CC: Continuity Check, LB: Loop Back, PM: Execution Monitor) 

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  d: Test Level(F4: VPC, F5: VCC) 
  e: BSC number(0~11) 
  f: BTS number(0~47) 
  g: SMP number(0~5) 
  h: VMP number(0~7) 
  i: PCF number(0~2) 
 • Input/Output 
Fig. 4.5-15 Result of ATM Path(PM) Test Performance 

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Fig. 4.5-16 Result of ATM Path(CC) Test Performance 

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Fig. 4.5-17 Result of ATM Path(LB) Test Execution 

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4.5.5. Command related to BSC Virtual Call Test 
General mobile call is  ㅡmade by MS, BSS(BSC, BTS), switching system interworking. 
Because the section  between MS  and BSS is  the place  where call  environment setup 
function and modulation and demodulation of voice data are made including allocation 
of call resource necessary for radio communication, it is responsible  for  essential 
function in the mobile communication system. Testing call is the function to check the 
following: 1) the presence of faults    in call processing made between BSS and MS that 
excludes the MSC function in the course of mobile call processing, and 2) the quality 
of voice. Since it excludes the MS function to, mutual calls such as M2L, L2M, or M2M 
cannot  be  made;  however,  ,  but  cantest  can  be  perfomed  by  selecting  one  between 
originating and terminating call. When a testing call was set up, BSS and MS generate 
markov data and exchange them and by checking if there is any loss of markov data, 
they calculate quality of voice. Terminating call inputs IMSI value of MS to be tested in 
BSM and trys paging to set up  a call. And  Originating call sets up a call by selecting 
testing call function of MS. (Originating call is not related to BSM function.) 
• BSC Testing Call   
It checks the following: 1) if there is any faults in call processing that is carried out 
between BSC(SLP) – BTS(CE) - MSs and 2) the quality of voice. If a Call is attempted 
in BSM by inputting the the information (i.e., the number of MS,  BSC  number,  BTS 
number, sector, frequency resource, MS call setup data (Station Class Mark, Slot Cycle 
Index), Service Option(13K Markov, 8K Markov, 13K LoopBack, 8K LoopBack),  and 
voice  packet  data  rate(Full,  half,  Quarter,  Eighth  ,  Variable  rate)), then Call Link 
between SLP-CE-MS is set up (setup of testing call) according to the data input. Once 
a Call is set up, SLP and MS calculate Frame Error Rate while exchanging markov data. 
When a Call is set up and a Call is released, BSM displays data of call resource, FER, 
and reason for release. 
• Service Option   
Service Options of present use for Testing call at BSC include 8K Markov, 13K Markov, 
8K loopback, 13K loopback . 
• Markov   
Once Testing Call is set up, SLP and MS synchronizes their time,  and  generate 
identical data in sequence by Markov Algorithm. SLP and MS receive each other’s data 
and  compare  them  with  their  own  to  detect  errors  in  the  data  frame.  It  can  obtain 
Forward FER(measured at MS) and Reverse FER(measured at SLP). 
LoopBack: When Testing Call is set up, SLP generates voice data and sends them to 
MS. MS performs lookback on this data as it is and SLP compares returned data with 

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the original data to validate the quality of voice. (FER measured at SLP) 
• Data Rate 
User can designate voice data rate to be used for testing call. The data rate is divided 
into the following: Full rate, Half rate, Quarter rate, Eighth rate, and Variable rate.   
4.5.5.1. BSC Virtual Call Setup Function 
Function to designate various options and setting up Call to a specific  MS  or  all  the 
MSs MS to be tested should be entered to BSM DB with INS-TEST-MS command. 
When  TEST_KEY  is  not  input,  testing calls  are  set  up  for  all  the  MSs  stored  in  DB. 
Testing  Call  is  attempted  for  60  minutes  at  a  maximum.  Once  a  Call is set up, it is 
maintained for 60 minutes. If a call is disconnected due to the occurrence of faults, or 
when a user released the call at random, a message for the reason of call release is 
displayed. 
 • Command SET-TEST-CALL :BSC=a ,BTS=b ,SECTOR=c ,CDMA=d ,SCI=e ,SCM=f , 
OPTI=g ,DTYPE=h ,TIME=i [,TEST_KEY=j]; 
  a: BSC number (0~11) 
  b: BTS number (0~47) 
  c: sector (ALPHA/BETA/GAMMA/DELTA/ZETA/EPSILON) 
  d: CDMA number (0~11) 
  e: SLOT CYCLE Index (0~7) 
  f: SLOT mode (SLOT_M, NON_SLT_M) 
g: option (MKV_13K/MKV_8K/LB_13K/LB_8K) 
  h: Data Rate (VARIABLE/FULL/HALF/QUART/EIGHT ) 
  i: TIME(1~60min) 
  j: Test Key(1 ~ 100) 
 • Input/Output 

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Fig. 4.5-18 BSC Virtual Call Setup Command INTERM Display 
Fig. 4.5-19 Console Window Display at the setup of BSC Virtual Call   

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Fig. 4.5-20 Display at the Termination of BSC Virtual Call 
4.5.5.2. Virtual Call Release Function 
Function to release a call for a specific MS or all the MSs where a virtual call set up.   
The output resulting from virtual call release is displayed by "Release by MMC". 
 • Command REL-TEST-CALL :BSC=a ,BTS=b [,TEST_KEY=c]; 
  a: BSC number (0~11) 
  b: BTS number (0~15) 
  c: TEST KEY(1~100) 
 • Input/Output 
Fig. 4.5-21 Result of BSC Virtual Call Release Command Execution 
4.5.5.3. Testing MS Display Function 
Function to display MSs to be used for the BSC Virtual Call test.   
• Command DIS-TEST-MS :BSC=a ,BTS=b; 
a: BSC number (0~11) 
b: BTS number (0~47) 
• Input/Output 

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Fig. 4.5-22 Presently registered Testing MS Display 
4.5.5.4. MS Supplementary Function 
Function to register MS to be used for the BSC Virtual test.   
For a test of virtual call, first register MS.   
• Command INS-TEST-MS :BSC=a ,BTS=b ,TEST_KEY=c [,MSIN=d]; 
  a: BSC number (0~11) 
  b: BTS number (0~47) 
  c: TEST KEY(1~100) 
  d: IMSI of MS 
• Input/Output 

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Fig. 4.5-23 Testing MS Insert Result Display 
4.5.5.5. MS Delete Function 
Function to delete MS registered on the test list of BSC Virtual Call   
• Command DEL-TEST-MS :TEST_KEY=a; 
   a: TEST_KEY of Mobile to be deleted 
• Insert/Output 
Fig. 4.5-24 Delete MS Execution Result 

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4.5.6.   TRAFFIC PATH TESTING FUNCTION 
it is  a test  enabling to decide if there is  presence of failure with designated  traffic 
path by setting a traffic path for BSC virtual call for    a specific MS with the designated 
call resources and then measuring PER.. The kinds of virtual call include Markov and 
Loop Back., There are 8K and 13K respectively by service option. Call resources that 
the  user  can  designate  are  as  follows:  Selector  Slave  Processor, Trunk, and BTS 
channel  Chip.  In  one  BSC,  100  virtual  calls  can  be  set  up  simultaneously  separated 
from  testing  function  of  virtual  call.  Once  a  call  is  set  up,  a message type which is 
identical to the message type coming from BSC virtual call setup process is displayed. 
4.5.6.1. Traffic Path Testing Setup Function 
Function to set up a Call for the designated Traffic Path 
• Command SET-PATH-CALL : IMSI=a , BSC=b , SMP=c , SLP=d , SLPSLV = e [,TRK = 
f], BTS= g ,SECTOR = h ,CDMA = i ,RCP= j , MCPA=k , CHIP=l , SCI=m , SCM=n , 
OPTI=o , DTYPE=p [,TIME=q]; 
a : IMSI 
b : BSC_Number(0~11) 
c : SMP_Number(0~4) 
d : SLP_Number(0~19) 
e : SLP_Slave_Number(0~3) 
f : Trunk_Number(0~19) 
g : BTS_Number(0~47) 
h : Sector_Id(0~5) 
i : CDMA_Channel_Number(0~11) 
j : RCP_Number(0~9) 
k : MCPA_Number(0~9) 
l : CHIP_Number(0~1) 
m : Slot_Cycle_Index(0~7) 
n : Station_Class_Mark(SLOT_M, NON_SLT_M) 
o : Service_Option(MKV_13K, MKV_8K, LB_13k, LB_8K) 
p : Test_data_Type(VARIABLE, RATE_FULL, RATE_HALF, RATE_QUAR, RATE_EIGHT) 
q : TRACE_TIME(1~60min) 
• Input/Output 

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Fig. 4.5-25 Traffic Path Setup Command Execution Result Display(Interm Window) 
Fig. 4.5-26 Traffic Path Setup Command Execution Result Display(Console Window) 
4.5.6.2. Traffic Path Release Function 
Function to release a Call to MS of a specific BSC, BTS where a virtual call is set up.   
 • Command REL-PATH-CALL :BSC=a ,BTS=b; 
  a: BSC number (0~11) 
  b: BTS number (0~15) 
• Input/Output 

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Fig. 4.5-27 Traffic Path Release Command Execution Result Display(Interm Window) 
Fig. 4.5-28 Traffic Path Release Command Execution Result Display(Console Window)